ZA200306221B - Novel medicament compositions on the basis of anti-cholinergics and PDE IV inhibitors. - Google Patents

Novel medicament compositions on the basis of anti-cholinergics and PDE IV inhibitors. Download PDF

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Publication number
ZA200306221B
ZA200306221B ZA200306221A ZA200306221A ZA200306221B ZA 200306221 B ZA200306221 B ZA 200306221B ZA 200306221 A ZA200306221 A ZA 200306221A ZA 200306221 A ZA200306221 A ZA 200306221A ZA 200306221 B ZA200306221 B ZA 200306221B
Authority
ZA
South Africa
Prior art keywords
acid
inhalable
pharmaceutical composition
propellant
solution
Prior art date
Application number
ZA200306221A
Other languages
English (en)
Inventor
Meade Christopher Joh Montague
Michel Pairet
Pieper Michael Paul
Original Assignee
Boehringer Ingelheim Pharma
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boehringer Ingelheim Pharma filed Critical Boehringer Ingelheim Pharma
Publication of ZA200306221B publication Critical patent/ZA200306221B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/31813Test pattern generators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
ZA200306221A 2001-03-07 2003-08-12 Novel medicament compositions on the basis of anti-cholinergics and PDE IV inhibitors. ZA200306221B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10110777A DE10110777A1 (de) 2001-03-07 2001-03-07 Anordnung und Verfahren zum Testen von integrierten Schaltkreisen

Publications (1)

Publication Number Publication Date
ZA200306221B true ZA200306221B (en) 2004-07-22

Family

ID=7676496

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200306221A ZA200306221B (en) 2001-03-07 2003-08-12 Novel medicament compositions on the basis of anti-cholinergics and PDE IV inhibitors.

Country Status (5)

Country Link
US (1) US6768292B2 (ja)
EP (1) EP1239293B1 (ja)
JP (1) JP2002333466A (ja)
DE (2) DE10110777A1 (ja)
ZA (1) ZA200306221B (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1231608A1 (en) * 2001-02-07 2002-08-14 STMicroelectronics Limited Built-in test circuit and method for an integrated circuit
DE10110777A1 (de) * 2001-03-07 2002-09-12 Philips Corp Intellectual Pty Anordnung und Verfahren zum Testen von integrierten Schaltkreisen
WO2002073225A1 (en) * 2001-03-13 2002-09-19 Koninklijke Philips Electronics N.V. Integrated circuit testing device with improved reliability
KR20060103961A (ko) * 2001-07-17 2006-10-04 주식회사 아도반테스토 입출력 회로, 및 시험 장치
JP2008505310A (ja) 2004-06-30 2008-02-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 回路装置、及び、前記回路装置に設けられたアプリケーション回路の試験方法
FR2962809B1 (fr) * 2010-07-19 2013-03-15 Thales Sa Procédé et dispositif pour le test automatique embarque d'un circuit intégré

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3887869A (en) * 1972-07-25 1975-06-03 Tau Tron Inc Method and apparatus for high speed digital circuit testing
GB8411733D0 (en) * 1984-05-09 1984-06-13 Gen Electric Co Plc Integrated circuit testing arrangements
JPS6170777U (ja) * 1984-10-15 1986-05-14
DE69114183T2 (de) * 1990-06-07 1996-05-30 Ibm System zur Reduzierung von Prüfdatenspeichern.
JPH04139850A (ja) * 1990-10-01 1992-05-13 Matsushita Electric Ind Co Ltd 半導体集積回路装置及びその検査方法
US5166604A (en) * 1990-11-13 1992-11-24 Altera Corporation Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
US5528600A (en) * 1991-01-28 1996-06-18 Actel Corporation Testability circuits for logic arrays
US5488612A (en) * 1993-10-04 1996-01-30 International Business Machines, Corporation Method and apparatus for field testing field programmable logic arrays
US5617531A (en) * 1993-11-02 1997-04-01 Motorola, Inc. Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
US6057679A (en) * 1998-06-12 2000-05-02 Credence Systems Corporation Integrated circuit tester having amorphous logic for real-time data analysis
US6411124B2 (en) * 2000-04-28 2002-06-25 Altera Corporation Programmable logic device logic modules with shift register capabilities
DE10110777A1 (de) * 2001-03-07 2002-09-12 Philips Corp Intellectual Pty Anordnung und Verfahren zum Testen von integrierten Schaltkreisen

Also Published As

Publication number Publication date
DE50204985D1 (de) 2005-12-29
EP1239293A2 (de) 2002-09-11
EP1239293A3 (de) 2004-03-10
EP1239293B1 (de) 2005-11-23
JP2002333466A (ja) 2002-11-22
US6768292B2 (en) 2004-07-27
DE10110777A1 (de) 2002-09-12
US20020144202A1 (en) 2002-10-03

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