ZA200004515B - Method and device for analysing the three-dimensional distribution of a component in a sample. - Google Patents
Method and device for analysing the three-dimensional distribution of a component in a sample.Info
- Publication number
- ZA200004515B ZA200004515B ZA200004515A ZA200004515A ZA200004515B ZA 200004515 B ZA200004515 B ZA 200004515B ZA 200004515 A ZA200004515 A ZA 200004515A ZA 200004515 A ZA200004515 A ZA 200004515A ZA 200004515 B ZA200004515 B ZA 200004515B
- Authority
- ZA
- South Africa
- Prior art keywords
- sample
- unit
- analysing
- component
- dimensional distribution
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000003384 imaging method Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 230000005670 electromagnetic radiation Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/15—Medicinal preparations ; Physical properties thereof, e.g. dissolubility
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE9800965A SE9800965D0 (sv) | 1998-03-23 | 1998-03-23 | Analysing Device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA200004515B true ZA200004515B (en) | 2001-05-30 |
Family
ID=20410652
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA200004515A ZA200004515B (en) | 1998-03-23 | 2000-08-30 | Method and device for analysing the three-dimensional distribution of a component in a sample. |
Country Status (17)
| Country | Link |
|---|---|
| US (1) | US6275294B1 (de) |
| EP (1) | EP1066514B1 (de) |
| JP (1) | JP2002507747A (de) |
| KR (1) | KR100573641B1 (de) |
| CN (1) | CN1218178C (de) |
| AT (1) | ATE473429T1 (de) |
| AU (1) | AU764535B2 (de) |
| BR (1) | BR9909005A (de) |
| CA (1) | CA2324955C (de) |
| DE (1) | DE69942560D1 (de) |
| ES (1) | ES2346727T3 (de) |
| IL (1) | IL138392A (de) |
| NO (1) | NO20004759L (de) |
| NZ (1) | NZ506812A (de) |
| SE (1) | SE9800965D0 (de) |
| WO (1) | WO1999049312A1 (de) |
| ZA (1) | ZA200004515B (de) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7328059B2 (en) | 1996-08-23 | 2008-02-05 | The Texas A & M University System | Imaging of light scattering tissues with fluorescent contrast agents |
| US7865230B1 (en) | 1997-02-07 | 2011-01-04 | Texas A&M University System | Method and system for detecting sentinel lymph nodes |
| US7054002B1 (en) | 1999-10-08 | 2006-05-30 | The Texas A&M University System | Characterization of luminescence in a scattering medium |
| SE0000314D0 (sv) * | 2000-01-31 | 2000-01-31 | Astrazeneca Ab | Apparatus and method for analysing |
| US6625181B1 (en) * | 2000-10-23 | 2003-09-23 | U.C. Laser Ltd. | Method and apparatus for multi-beam laser machining |
| SE0101004D0 (sv) | 2001-03-21 | 2001-03-21 | Astrazeneca Ab | New measuring technique |
| US6771370B2 (en) | 2001-10-22 | 2004-08-03 | The Texas A&M University System | Characterizing powders using frequency-domain photon migration |
| JP2003250047A (ja) * | 2002-02-22 | 2003-09-05 | Konica Corp | 画像処理方法、記憶媒体、画像処理装置、及び画像記録装置 |
| US7706583B2 (en) * | 2002-11-11 | 2010-04-27 | Canon Kabushiki Kaisha | Image processing apparatus and method |
| US20040156539A1 (en) * | 2003-02-10 | 2004-08-12 | Asm Assembly Automation Ltd | Inspecting an array of electronic components |
| US7599732B2 (en) | 2003-06-20 | 2009-10-06 | The Texas A&M University System | Method and system for near-infrared fluorescence contrast-enhanced imaging with area illumination and area detection |
| EP1812079A4 (de) | 2004-10-15 | 2012-07-25 | Spectral Dimensions Inc | Beurteilung eines pharmazeutischen gemisches |
| GB2475635B (en) * | 2007-01-29 | 2011-08-31 | Teraview Ltd | A pharmaceutical analysis method and apparatus |
| KR100988471B1 (ko) * | 2007-07-06 | 2010-10-18 | 전자부품연구원 | 실시간 세포 분석 장치 및 이를 이용한 세포의 대사 측정방법 |
| EP2841926B1 (de) | 2012-04-23 | 2017-07-26 | Siemens Healthcare Diagnostics Inc. | Probenanalysevorrichtung für biologische tests |
| CN105067511A (zh) * | 2015-09-02 | 2015-11-18 | 浙江大学城市学院 | 一种透明土模型桩试验测试装置及其使用方法 |
| CN107449736A (zh) * | 2017-09-29 | 2017-12-08 | 南京科兴新材料科技有限公司 | 一种用于治疗肿瘤的药物分析仪 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2950780A1 (de) * | 1979-12-17 | 1981-06-25 | Siemens AG, 1000 Berlin und 8000 München | Schichtgeraet zur herstellung von transversalschichtbildern |
| GB2194962A (en) * | 1986-09-04 | 1988-03-23 | Tian Der Mao | Cathodic protection of metal surfaces |
| US5126569A (en) | 1989-03-10 | 1992-06-30 | Massachusetts Institute Of Technology | Apparatus for measuring optical properties of materials |
| GB9313036D0 (en) * | 1993-06-24 | 1993-08-11 | Pfizer Ltd | Spectrophotometric analysis |
| DE4340072C2 (de) * | 1993-11-24 | 1996-05-15 | Siemens Ag | Vorrichtung zur Untersuchung von Gewebe mit Licht |
| US5760399A (en) | 1995-10-02 | 1998-06-02 | Foss Nirsystems, Inc. | Measurement of transmission spectra of pharmaceutical tablets |
| GB2328016B (en) * | 1997-08-08 | 2001-04-25 | Pfizer Ltd | Spectrophotometric analysis |
-
1998
- 1998-03-23 SE SE9800965A patent/SE9800965D0/xx unknown
-
1999
- 1999-03-23 DE DE69942560T patent/DE69942560D1/de not_active Expired - Lifetime
- 1999-03-23 BR BR9909005-8A patent/BR9909005A/pt not_active IP Right Cessation
- 1999-03-23 ES ES99913801T patent/ES2346727T3/es not_active Expired - Lifetime
- 1999-03-23 US US09/308,146 patent/US6275294B1/en not_active Expired - Fee Related
- 1999-03-23 KR KR1020007010523A patent/KR100573641B1/ko not_active IP Right Cessation
- 1999-03-23 AT AT99913801T patent/ATE473429T1/de not_active IP Right Cessation
- 1999-03-23 WO PCT/SE1999/000463 patent/WO1999049312A1/en not_active Application Discontinuation
- 1999-03-23 JP JP2000538231A patent/JP2002507747A/ja active Pending
- 1999-03-23 IL IL13839299A patent/IL138392A/en not_active IP Right Cessation
- 1999-03-23 NZ NZ506812A patent/NZ506812A/xx unknown
- 1999-03-23 EP EP99913801A patent/EP1066514B1/de not_active Expired - Lifetime
- 1999-03-23 CN CN998065420A patent/CN1218178C/zh not_active Expired - Fee Related
- 1999-03-23 CA CA2324955A patent/CA2324955C/en not_active Expired - Fee Related
- 1999-03-23 AU AU31792/99A patent/AU764535B2/en not_active Ceased
-
2000
- 2000-08-30 ZA ZA200004515A patent/ZA200004515B/xx unknown
- 2000-09-22 NO NO20004759A patent/NO20004759L/no not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| CA2324955A1 (en) | 1999-09-30 |
| JP2002507747A (ja) | 2002-03-12 |
| AU764535B2 (en) | 2003-08-21 |
| CN1302377A (zh) | 2001-07-04 |
| EP1066514B1 (de) | 2010-07-07 |
| KR20010074457A (ko) | 2001-08-04 |
| CN1218178C (zh) | 2005-09-07 |
| BR9909005A (pt) | 2000-11-28 |
| AU3179299A (en) | 1999-10-18 |
| CA2324955C (en) | 2011-10-18 |
| KR100573641B1 (ko) | 2006-04-25 |
| NO20004759D0 (no) | 2000-09-22 |
| NO20004759L (no) | 2000-11-21 |
| WO1999049312A1 (en) | 1999-09-30 |
| DE69942560D1 (de) | 2010-08-19 |
| IL138392A (en) | 2004-01-04 |
| NZ506812A (en) | 2002-09-27 |
| ES2346727T3 (es) | 2010-10-19 |
| SE9800965D0 (sv) | 1998-03-23 |
| ATE473429T1 (de) | 2010-07-15 |
| IL138392A0 (en) | 2001-10-31 |
| US6275294B1 (en) | 2001-08-14 |
| EP1066514A1 (de) | 2001-01-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ZA200004515B (en) | Method and device for analysing the three-dimensional distribution of a component in a sample. | |
| DE60144026D1 (en) | Off-center-tomosynthese | |
| WO1999039189A3 (en) | Gated transmission and scatter detection for x-ray imaging | |
| CA2301160A1 (en) | Material discrimination using single-energy x-ray imaging system | |
| WO1999064893A3 (en) | A low noise, high resolution image detection system and method | |
| WO2000022566A8 (en) | Method and apparatus for extended depth of field imaging | |
| CA2233074A1 (en) | Container fill level and pressurization inspection using multi-dimensional images | |
| IL113496A (en) | Apparatus and method for recreating and manipulating a 3d object based on a 2d projection thereof | |
| EP0784202A3 (de) | Phasenkontrast-Röntgen-Computertomograph | |
| WO2003102518A3 (en) | Terahertz imaging system and method | |
| CA2113752A1 (en) | Inspection System for Cross-Sectional Imaging | |
| WO2000033250A3 (en) | Computerized adaptive imaging | |
| WO2004031809A3 (en) | Optical tomography of small moving objects using time delay and integration imaging | |
| WO2000019901A8 (en) | X-ray system | |
| EP0856728A3 (de) | Optisches Verfahren und Vorrichtung zum Erkennen von Fehlstellen | |
| EP0761166A3 (de) | Dichtemessung von Knochen mittels Röntgenstrahlung | |
| MY120808A (en) | Method and apparatus for visually inspecting an object | |
| EP1114993A3 (de) | Verfahren und Vorrichtung zur Untersuchung von Oberflächen | |
| EP1052522A3 (de) | Verfahren und System zur Erzeugung einer maximalen Intensitätsprojektion eines nicht-ebenen Bildes | |
| EP0982659A3 (de) | Verfahren und Vorrichtung zur Fehlersuche von einem scalierbareren Vielschicht-Abbildungssystem | |
| AU2001237462A1 (en) | Method for cephalometric imaging | |
| GB9807982D0 (en) | Multiple beam scanning system for an imaging device | |
| AU2001237461A1 (en) | Method for imaging the head area | |
| EP0971318A3 (de) | Vorrichtung zur Extrapolierung von Kegelstrahlprojektionsdaten | |
| WO2001001333A3 (en) | Aligning a locally-reconstructed three-dimensional object to a global coordinate system |