ZA200004074B - Radiograph control of an object having a crystal lattice. - Google Patents

Radiograph control of an object having a crystal lattice.

Info

Publication number
ZA200004074B
ZA200004074B ZA200004074A ZA200004074A ZA200004074B ZA 200004074 B ZA200004074 B ZA 200004074B ZA 200004074 A ZA200004074 A ZA 200004074A ZA 200004074 A ZA200004074 A ZA 200004074A ZA 200004074 B ZA200004074 B ZA 200004074B
Authority
ZA
South Africa
Prior art keywords
radiograph
control
crystal lattice
lattice
crystal
Prior art date
Application number
ZA200004074A
Other languages
English (en)
Inventor
Serge Cossard
Original Assignee
Monteurs D Aviat Snecma Soc Na
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Monteurs D Aviat Snecma Soc Na filed Critical Monteurs D Aviat Snecma Soc Na
Publication of ZA200004074B publication Critical patent/ZA200004074B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/603—Specific applications or type of materials superlattices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiography Using Non-Light Waves (AREA)
ZA200004074A 1998-12-17 2000-08-10 Radiograph control of an object having a crystal lattice. ZA200004074B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9815914A FR2787573B1 (fr) 1998-12-17 1998-12-17 Controle par radiographie d'un objet possedant un reseau cristallin

Publications (1)

Publication Number Publication Date
ZA200004074B true ZA200004074B (en) 2001-02-13

Family

ID=9534061

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200004074A ZA200004074B (en) 1998-12-17 2000-08-10 Radiograph control of an object having a crystal lattice.

Country Status (8)

Country Link
US (1) US6295335B1 (ko)
EP (1) EP1014078B8 (ko)
JP (1) JP3880033B2 (ko)
KR (1) KR100781393B1 (ko)
FR (1) FR2787573B1 (ko)
PL (1) PL342346A1 (ko)
WO (1) WO2000036404A1 (ko)
ZA (1) ZA200004074B (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008008829B4 (de) 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
EP2348221B1 (de) * 2010-01-25 2012-10-24 Grundfos Management A/S Kreiselpumpenaggregat
FR2960642B1 (fr) * 2010-05-28 2012-07-13 Snecma Procede de controle non destructif et dispositif de mise en oeuvre du procede
JP5469653B2 (ja) * 2011-12-12 2014-04-16 本田技研工業株式会社 非破壊検査システム
US8902428B2 (en) * 2012-03-15 2014-12-02 Applied Materials, Inc. Process and apparatus for measuring the crystal fraction of crystalline silicon casted mono wafers
US10255671B1 (en) * 2015-03-06 2019-04-09 Assembly Guidance Systems, Inc. System and method for capture of high resolution/high magnification images

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2452166A1 (de) * 1974-11-02 1976-05-13 Philips Patentverwaltung Anordnung zum verringern des streustrahleneinflusses
US4433427A (en) * 1982-01-26 1984-02-21 Elscint, Inc. Method and apparatus for examining a body by means of penetrating radiation such as X-rays
JPS60181638A (ja) * 1984-02-29 1985-09-17 Toshiba Corp 放射線像撮影装置
JPH05113416A (ja) * 1990-07-23 1993-05-07 Stiftung Deutsche Elektronen Synchrotron Desy 単結晶材料の異質相の析出を検査する方法
RU2098797C1 (ru) * 1994-11-30 1997-12-10 Алексей Владиславович Курбатов Способ получения проекции объекта с помощью проникающего излучения и устройство для его осуществления
WO1998016817A1 (en) * 1996-10-16 1998-04-23 Illinois Institute Of Technology Method for detecting an image of an object

Also Published As

Publication number Publication date
KR100781393B1 (ko) 2007-11-30
EP1014078B8 (fr) 2012-08-22
EP1014078A3 (fr) 2002-12-18
EP1014078A2 (fr) 2000-06-28
KR20010040897A (ko) 2001-05-15
US6295335B1 (en) 2001-09-25
EP1014078B1 (fr) 2012-07-11
JP3880033B2 (ja) 2007-02-14
PL342346A1 (en) 2001-06-04
FR2787573A1 (fr) 2000-06-23
JP2002532713A (ja) 2002-10-02
FR2787573B1 (fr) 2001-01-19
WO2000036404A1 (fr) 2000-06-22

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