Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J3/28—Investigating the spectrum
  • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M3/00—Investigating fluid-tightness of structures
  • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
  • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Definitions

• the present invention relates to a detection device.
• Gases such as ammonia and methane emit infrared light of specific wavelengths, and because gases also absorb infrared light emitted by other objects, the presence of gas can be detected by capturing infrared light in the area where the gas is present. For this reason, infrared cameras are sometimes used to detect gas leaks in plants and other facilities.
• Infrared light (infrared light) received by an infrared camera includes not only infrared light of a wavelength related to the gas being detected, such as a gas leak (target infrared light), but also infrared light of different wavelengths.
• a filter that transmits light of the target wavelength is used (see Patent Document 1). Using such a filter for capturing images allows target infrared light to be captured efficiently, enabling effective detection of gas leaks and other issues.
• the target infrared rays when there is ambient light containing infrared rays with a wide range of frequencies, such as sunlight, the target infrared rays will be affected by the ambient light even when captured using a filter. In other words, ambient light containing infrared rays with the same wavelength as the target infrared rays will be captured superimposed on the target infrared rays, which may result in gas leaks and other issues not being properly detected.
• the present invention aims to provide a detection device that can reduce the effects of ambient light and improve the accuracy of measuring target infrared rays.
• the detection device of the present invention is a detection device that detects target infrared rays of a predetermined wavelength, and includes a detection unit that detects infrared rays and a determination unit that estimates the amount of target infrared rays based on the infrared rays detected by the detection unit.
• the detection unit includes a first infrared detection unit and a second infrared detection unit.
• the first infrared detection unit includes a first incident unit that receives light containing infrared rays, a first detection unit that detects infrared rays contained in the first incident light that is incident from the first incident unit, and a bandpass filter that transmits the first target infrared rays and is arranged between the first detection unit and the first incident unit.
• the second infrared detection unit includes a bandpass filter that transmits the first target infrared rays.
• the incident light adjusting unit is provided with a second incident unit that receives light containing infrared rays; a second detection unit that detects infrared rays contained in the second incident light that is incident from the second incident unit; and an incident light adjusting unit that is disposed between the second detection unit and the second incident unit, wherein the incident light adjusting unit is provided with a total light supply unit that supplies all of the second incident light to the second detection unit; a second target infrared supply unit that supplies second target infrared rays contained in the second incident light to the second detection unit; and a movement mechanism that moves the total light supply unit and the second target infrared supply unit between a supply position located on the optical axis of the second incident light and a retracted position retracted from the optical axis of the second incident light.
• the first and second target infrared rays can be detected simultaneously, making it possible to simultaneously detect two substances present in the object being measured. Furthermore, if all of the second incident infrared rays are incident on the second detection unit, the effects of ambient light can be detected, improving the accuracy of detecting substances present in the object being measured based on the first and second target infrared rays.
• FIG. 1A and 1B are schematic explanatory diagrams of a detection device 1 of the present embodiment, in which (A) is a front view and (B) is a schematic cross-sectional view taken along line BB of FIG. 1A.
• 1A is a schematic cross-sectional view taken along line IIA-IIA in FIG. 1B
• FIG. 1B is a schematic cross-sectional view taken along line IIB-IIB in FIG. 1B.
• 10A and 10B are schematic explanatory diagrams of the incident light adjustment unit 25 in which the movable member 29 moves linearly, where (A) is a schematic explanatory diagram of the incident light adjustment unit 25 viewed from above with the first reflecting mirror 26 positioned at the reflecting position, (B) is a view taken along the arrow B-B of (A), (C) is a schematic explanatory diagram of the incident light adjustment unit 25 viewed from above with the second reflecting mirror 27 positioned at the reflecting position, and (D) is a schematic explanatory diagram viewed along the arrow D-D of (C).
• 10A and 10B are schematic explanatory diagrams of the incident light adjustment unit 25 in which the movable member 29 rotates and moves, in which (A) is a schematic explanatory diagram of the incident light adjustment unit 25 viewed from above in a state in which the first reflecting mirror 26 is positioned at the reflecting position, (B) is a view taken along the arrow B-B of (A), (C) is a schematic explanatory diagram of the incident light adjustment unit 25 viewed from above in a state in which the second reflecting mirror 27 is positioned at the reflecting position, (D) is a view taken along the arrow D-D of (C), and (E) is a view taken along the arrow E-E of (A).
• FIG. 1A is a cross-sectional view of the detection device 1 of this embodiment provided with a laser light source 35, taken along line BB of FIG. 1A
• FIG. 1B is a cross-sectional view of the detection device 1 of this embodiment taken along line BB of FIG. 1A.
• FIG. 10A is a front view of the detection device 1 of this embodiment equipped with a visible light imaging unit 60
• (B) is a schematic front view of the incident light adjustment unit 25 when a transparent window 28 is provided on a linearly moving movable member 29
• (C) is a schematic front view of the incident light adjustment unit 25 when a transparent window 28 is provided on a rotationally moving movable member 29.
• 10A and 10B are schematic explanatory diagrams of a detection device 1 according to another embodiment, in which (A) is a front view, and (B) is a schematic cross-sectional view taken along line BB of (A).
• 9A is a schematic cross-sectional view taken along line IXA-IXA in FIG. 9B, and FIG.
• FIG. 9B is a schematic cross-sectional view taken along line IXB-IXB in FIG. 9B.
• (A) is a schematic explanatory diagram of another embodiment of the detection device 1 equipped with a laser light source 35
• (B) is a view taken along the line B-B in (A)
• (C) is a view taken along the line C-C in (B).
• 1A and 1B are schematic diagrams illustrating data obtained based on infrared rays detected by the first detection unit 13 and the second detection unit 23, where (A) is a schematic diagram illustrating spectral characteristics obtained by point measurement, and (B) is a schematic diagram illustrating a two-dimensional image obtained by area measurement.
• FIG. 1A and 1B are explanatory diagrams of a method for removing the influence of ambient light, in which FIG. 1A is a schematic explanatory diagram for point measurement, and FIG. 1B is a schematic explanatory diagram for area measurement.
• FIG. 1A and 1B are diagrams illustrating changes in measurement data when laser light is irradiated, where FIG. 1A is a schematic explanatory diagram when point measurement is performed, and FIG. 1B is a schematic explanatory diagram when area measurement is performed.
• the detection device of this embodiment is a detection device that detects infrared rays, and can identify substances present in a detection target by detecting infrared rays of a specific wavelength.
• the substances present in a detection target that can be identified by the detection device of this embodiment are not particularly limited, but are suitable for detecting invisible gases.
• substances present in a detection target can include ammonia and hydrocarbon gases such as methane gas, propane gas, and propylene.
• the detection device 1 of this embodiment includes a detection unit 10 that detects infrared rays, a determination unit 30 that estimates the amount of target infrared rays based on the infrared rays detected by the detection unit 10, and a recognition unit 40 that determines the target to be detected based on the amount of target infrared rays estimated by the determination unit 30.
• the detection device 1 of this embodiment may be configured so that the detection unit 10 is housed within the case 2, and the determination unit 30 and recognition unit 40 are also provided within the case 2 (see FIG. 1(B)), or so that the detection unit 10 and determination unit 30 are housed within the case 2, and the recognition unit 40 is provided outside the case 2.
• the detection unit 10 may be provided within the case 2
• the determination unit 30 and recognition unit 40 may be provided outside the case 2. If the determination unit 30 and recognition unit 40 are provided outside the case 2, the determination unit 30 and recognition unit 40 may be electrically connected by wire, or data may be transmitted wirelessly.
• the detection unit 10 includes a first infrared detection unit 11 and a second infrared detection unit 20 .
• the first infrared detection unit 11 includes a first incident unit 12 that converts light from the outside (hereinafter simply referred to as "external light") into light (hereinafter simply referred to as "first incident light") that is incident toward the first detection unit 13.
• the first incident unit 12 includes, for example, a lens that collimates or focuses the first incident light.
• the first incident light includes light of various wavelengths contained in the external light and is light that includes infrared light of a target wavelength to be detected by the first infrared detection unit 11.
• the first incident unit 12 does not necessarily need to be provided with a lens or the like having the above-described function.
• a separate lens or the like having the above-described function may be provided between the bandpass filter 14 and the first incident unit 12.
• a bandpass filter 14 is provided between the first incident portion 12 and the first detection portion 13.
• This bandpass filter 14 has the function of passing infrared light of a specified wavelength (hereinafter simply referred to as "first target infrared light").
• the first detection unit 13 has the function of detecting infrared rays. As shown in FIG. 1(B), the first detection unit 13 is subjected to primary target infrared rays that have passed through the bandpass filter 14. This allows the first detection unit 13 to detect the primary target infrared rays contained in the primary incident light. In other words, the first detection unit 13 can detect the amount of primary target infrared rays contained in the primary incident light.
• the first detection unit 13 may be, for example, a general infrared camera or infrared sensor, but is not limited to any device capable of detecting the amount of primary target infrared rays.
• the first detection unit 13 may also be equipped with a lens that focuses the primary target infrared rays that have passed through the bandpass filter 14. If the first detection unit 13 does not have a lens that focuses the primary target infrared rays, a separate lens that focuses the primary target infrared rays may be provided between the bandpass filter 14 and the first detection unit 13.
• the first incident portion 12, bandpass filter 14, and first detection portion 13 are arranged so that they are aligned in a straight line.
• the first incident portion 12, bandpass filter 14, and first detection portion 13 are arranged so that the optical axis 12s of the first incident light entering from the first incident portion 12, the optical axis 14s of the bandpass filter 14, and the light receiving axis 13s of the first detection portion 13 are coaxial.
• the second infrared detection unit 20 includes a second incident unit 22 that converts external light into light incident on the second detection unit 23 (hereinafter simply referred to as “second incident light”).
• the second incident unit 22 includes, for example, a lens that collimates or focuses the second incident light.
• the second incident light includes light of various wavelengths contained in the external light, and is light that includes infrared light of a target wavelength to be detected by the second infrared detection unit 20.
• the second incident unit 22 does not necessarily need to be provided with a lens or the like having the above-described function.
• the second incident unit 22 does not include a lens or the like having the above-described function
• a lens or the like having the above-described function of collimating the second incident light may be separately provided between the incident light adjustment unit 25 and the second incident unit 22.
• an incident light adjustment unit 25 is provided between the second incident unit 22 and the second detection unit 23.
• This incident light adjustment unit 25 has the function of reflecting the second incident light and supplying the reflected light to the second detection unit 23.
• This incident light adjustment unit 25 has a first reflecting mirror 26, a second reflecting mirror 27, a moving member 29 on which the first reflecting mirror 26 and the second reflecting mirror 27 are provided, and a moving mechanism that moves the moving member 29 (see Figure 3). Note that the moving mechanism also has the function of a position adjustment mechanism as defined in the claims.
• the first reflecting mirror 26 has a reflecting surface 26a that reflects the second incident light incident from the second incident portion 22 and supplies the reflected light to the second detecting portion 23.
• the first reflecting mirror 26 has a reflecting surface 26a that reflects light of all wavelengths (or infrared rays of all wavelengths) of the second incident light incident from the second incident portion 22.
• the second reflecting mirror 27 has a reflecting surface 27a that supplies only reflected light of a predetermined wavelength out of the second incident light that is incident from the second incident portion 22 to the second detecting portion 23.
• the second reflecting mirror 27 has a reflecting surface 27a that supplies only infrared light of a predetermined wavelength out of the infrared light included in the second incident light (hereinafter simply referred to as "second target infrared light") to the second detecting portion 23.
• second target infrared light only infrared light of a predetermined wavelength out of the infrared light included in the second incident light
• the first reflecting mirror 26 and the second reflecting mirror 27 are mounted on a movable member 29, and when the movable member 29 is moved by a moving mechanism, the first reflecting mirror 26 and the second reflecting mirror 27 move between a reflecting position and a retracted position. Specifically, when the movable member 29 moves and the first reflecting mirror 26 is positioned at the reflecting position, the second reflecting mirror 27 is positioned at the retracted position, and when the first reflecting mirror 26 is positioned at the retracted position, the second reflecting mirror 27 is positioned at the reflecting position.
• the reflection position is a position where the first reflection mirror 26 and the second reflection mirror 27 are disposed on the optical axis 22s of the second incident light beam incident from the second incident portion 22.
• the reflection position is a position where the angles ⁇ 1 and ⁇ 2 (see FIG. 2B ) formed by the reflection surfaces 26a and 27a with respect to the optical axis 22s of the second incident light beam are 45°.
• the retracted position is a position where the first reflecting mirror 26 and the second reflecting mirror 27 are retracted from the optical axis 22s of the second incident light incident from the second incident portion 22. In other words, when the first reflecting mirror 26 and the second reflecting mirror 27 are disposed at this position, the retracted position is a position where the second incident light is not incident on the reflecting surface 26a and the reflecting surface 27a.
• the movable member 29 moves linearly as shown in FIG. 3, the movable member 29 is installed so that its direction of movement is perpendicular to the optical axis 22s of the second incident light.
• the first reflecting mirror 26 and the second reflecting mirror 27 are arranged so that they are aligned along the direction of movement of the movable member 29 (the left-right direction in FIGS. 3(B) and 3(D)).
• the first reflecting mirror 26 and the second reflecting mirror 27 are installed on the movable member 29 so that their reflective surfaces 26a and 27a are flush with each other and the angles ⁇ 1 and ⁇ 2 relative to the optical axis 22s of the second incident light are 45° (see FIG. 2(B)). Note that in FIGS.
• the rotation axis 29s of the movable member 29 is installed so that the angle ⁇ 3 between its center axis and the optical axis 22s of the second incident light is 45° (see FIG. 4(E)).
• the first reflecting mirror 26 and the second reflecting mirror 27 are arranged side by side along the direction of rotation of the movable member 29 (i.e., the circumferential direction) (see FIGS. 3(A) to (D)).
• FIGS. 4(A), (B), and (E) show the state in which the first reflecting mirror 26 is in the reflecting position and the second reflecting mirror 27 is in the retracted position
• FIGS. 4(C) and (D) show the state in which the second reflecting mirror 27 is in the reflecting position and the first reflecting mirror 26 is in the retracted position.
• the second detection unit 23 has the function of detecting infrared rays. As shown in FIG. 2(B), light reflected by the first reflecting mirror 26 or the second reflecting mirror 27 of the incident light adjustment unit 25 is incident on the second detection unit 23, and therefore the second detection unit 23 can detect the infrared rays contained in the second incident light.
• This second detection unit 23 may be, for example, a general infrared camera or infrared sensor, but is not particularly limited as long as it can detect the amount of infrared light contained in the second incident light.
• the second detection unit 23 may be equipped with a lens that focuses the light incident from the incident light adjustment unit 25. If the second detection unit 23 does not have a lens that focuses the light incident from the incident light adjustment unit 25, a lens that focuses the light incident from the incident light adjustment unit 25 may be separately provided between the incident light adjustment unit 25 and the second detection unit 23.
• the second incident portion 22, the incident light adjustment portion 25, and the second detection portion 23 are arranged in a substantially L-shape. That is, the second incident portion 22, the incident light adjustment portion 25, and the second detection portion 23 are arranged so that the optical axis 22s of the second incident light incident from the second incident portion 22 and the light receiving axis 23s of the second detection portion 23 are perpendicular to each other at the position of the incident light adjustment portion 25 (specifically, the reflecting surface 26a of the first reflecting mirror 26 and the reflecting surface 27a of the second reflecting mirror 27 when the mirror is disposed at the reflecting position).
• the second incident section 22, the incident light adjustment section 25, and the second detection section 23 do not necessarily have to be approximately L-shaped (i.e., the optical axis 22s of the second incident light and the light receiving axis 23s of the second detection section 23 are perpendicular to each other) as long as the optical axis of the light reflected by the first reflection mirror 26 or the second reflection mirror 27 of the incident light adjustment section 25 can be reflected so as to coincide with the light receiving axis 23s of the second detection section 23.
• the second infrared detection unit 20 is configured to be able to detect infrared rays from the same object to be measured A (see Figure 5) as the first infrared detection unit 11. Specifically, if the first incident portion 12 of the first infrared detection unit 11 and the second incident portion 22 of the second infrared detection unit 20 are both condensing lenses, they are arranged so that the positions of their focal points F are in the same position. Furthermore, the optical path length L1 from the position of focal point F to the first detection unit 13 of the first infrared detection unit 11 and the optical path length L2 from the position of focal point F to the second detection unit 13 of the second infrared detection unit 21 are configured to be the same length.
• the first infrared detection unit 11 and the second infrared detection unit 20 may be configured to detect infrared rays from the position of the focal point F, i.e., a single point in space, or they may be configured to detect infrared rays from a range having a certain extent in space, i.e., an area having a predetermined area or volume. Detecting infrared rays from an area having a predetermined area or volume makes it possible to detect the two-dimensional or three-dimensional extent of the object to be measured A (see Figure 11(B), etc.).
• the determination unit 30 is electrically connected to the second detection unit 13 of the first infrared detection unit 11 of the detection unit 10 and the second detection unit 23 of the second infrared detection unit 20.
• the determination unit 30 estimates the signals from the second detection unit 13 and the second detection unit 23, i.e., the amount of infrared light detected by the second detection unit 13 and the second detection unit 23.
• the determination unit 30 has a function of estimating the amount of first target infrared light based on the signal from the second detection unit 13 of the first infrared detection unit 11 of the detection unit 10.
• the determination unit 30 has a function of estimating the amount of incident infrared light, i.e., the total amount of infrared light of all wavelengths, based on the signal from the second detection unit 23 of the second infrared detection unit 20 of the detection unit 10. Furthermore, when the second reflecting mirror 27 is positioned in the reflecting position, the judgment unit 30 has the function of estimating the light intensity of the second target infrared ray based on the signal from the second detection unit 23 of the second infrared detection unit 20 of the detection unit 10.
• the method by which the determination unit 30 determines whether the first reflecting mirror 26 or the second reflecting mirror 27 is positioned at the reflecting position is not particularly limited. For example, it can be determined by detecting the amount of movement of the movable member 29 and the position of the reference part using a sensor or the like.
• the recognition unit 40 is electrically connected to the determination unit 30.
• This recognition unit 40 has a function of determining the detection target based on the amount of infrared light estimated by the determination unit 30. For example, if the amount of first target infrared light estimated by the determination unit 30 is equal to or greater than a certain level, the recognition unit 40 has a function of determining that a predetermined substance (first substance) is present in the measurement target. Also, if the amount of second target infrared light estimated by the determination unit 30 is equal to or greater than a certain level, the recognition unit 40 has a function of determining that another substance (second substance) is present in the measurement target.
• the recognition unit 40 can determine the wavelength dependency of the light intensity of the target infrared ray by comparing the light intensity of the first target infrared ray with the light intensity of the second target infrared ray.
• the light intensity of all incident infrared rays it becomes easier to obtain a light intensity from which the effects of ambient light, such as sunlight, have been removed.
• the light intensity of the first target infrared rays, the light intensity of the second target infrared rays, and the light intensity of all infrared rays supplied from the judgment unit 30 it becomes easier to obtain the light intensity of the first target infrared rays and the light intensity of the second target infrared rays from which the effects of ambient light have been removed in the recognition unit 40.
• the second detection unit 23 can detect infrared light from ambient light, including sunlight, from a lower limit wavelength IR1 to an upper limit wavelength IR2.
• the lower limit and upper limit of the wavelength range transmitted by the bandpass filter 14 are A1 and A2, respectively.
• the lower limit and upper limit of the wavelength range reflected by the second reflecting mirror 27 are B1 and B2, respectively.
• the spectrum of infrared light detected by the first detection unit 13 at a certain time T1 is T1
• wavelength X is due to a change in the state of the object being measured in addition to fluctuations in ambient light.
• the actual fluctuation in the light intensity of wavelength X can be estimated. If wavelength Y is the amount of second target infrared light reflected by second reflecting mirror 27 (see FIG.
• the influence of ambient light can be estimated using changes in the light intensity of wavelength Y (or the average value of the amount of infrared light reflected by second reflecting mirror 27 (e.g., the value obtained by dividing the total amount of light reflected by second reflecting mirror 27 by the wavelength range of second reflecting mirror 27), i.e., the amount of second target infrared light), as described above, to estimate the influence of ambient light and estimate the actual fluctuation in the light intensity of a specific wavelength X (the amount of first target infrared light).
• the detection unit 10 has a first infrared detection unit 11 and a second infrared detection unit 20, and the first infrared detection unit 11 and the second infrared detection unit 20 can grasp the light intensity of different target infrared rays (first target infrared rays and second target infrared rays) at the same position (the position of focal point F in Figure 5), making it possible to simultaneously detect two detection targets present in the object to be measured (see Figure 11). Furthermore, by using the light intensity of the first target infrared rays and the light intensity of the second target infrared rays, it is also possible to determine the wavelength dependency of the light intensity of the target infrared rays.
• the first reflecting mirror 26 of the incident light adjustment unit 25 of the second infrared detection unit 20 is positioned at the reflecting position, it is possible to obtain the light intensity of all incident infrared rays, making it easier to obtain the light intensity of the first target infrared rays and the second target infrared rays with the effects of ambient light removed. This improves the detection accuracy of the target A that is present based on the first target infrared rays and the second target infrared rays.
• the first target infrared ray detected by the first infrared detection unit 11 and the second target infrared ray detected by the second infrared detection unit 20 have different wavelengths.
• the wavelengths of the first target infrared ray and the second target infrared ray may be the same. In this case, if the first target infrared ray and the second target infrared ray are detected within a certain range (area), it may be possible to detect or estimate the three-dimensional presence state of the measured object in that area.
• the temporal variation in the three-dimensional presence state of the measured object can be obtained, it may be possible to grasp the movement of the measured object in the optical axis direction (i.e., the direction of the optical axis 12s of the first incident light and the optical axis 22s of the second incident light), where it is difficult to detect the movement of the measured object.
• the optical axis direction i.e., the direction of the optical axis 12s of the first incident light and the optical axis 22s of the second incident light
• the bandpass filter 14 may be installed with its surface tilted relative to the light-receiving axis 13s of the first detection unit 13. This can suppress the influence of infrared rays caused by the heat of the first detection unit 13. That is, the first detection unit 13 generates heat when it operates, and radiates infrared rays caused by that heat. For example, if the surface of the bandpass filter 14 and the light-receiving axis 13s of the first detection unit 13 are positioned perpendicular to each other, infrared rays caused by the heat of the first detection unit 13 may be reflected by the surface of the bandpass filter 14 and enter the first detection unit 13.
• the amount of light of the first target infrared rays estimated by the determination unit 30 will be an amount of light that includes the influence of the first target infrared rays caused by the heat of the first detection unit 13, making it impossible to properly determine the presence of a target object in the measurement target.
• the surface of the bandpass filter 14 is installed with its surface tilted relative to the light-receiving axis 13s of the first detection unit 13, infrared rays caused by the heat of the first detection unit 13 can be suppressed from entering the first detection unit 13.
• the detection device 1 of this embodiment can also be manufactured inexpensively.
• the laser light source 35 In order to improve the accuracy of detecting substances present in a measured object from infrared light obtained from the measured object, it is desirable to increase the amount of infrared light detected.
• One method for increasing the amount of infrared light detected is to irradiate the measured object with infrared light from a light source.
• the measured object can be irradiated with infrared light from a light source by the following method.
• a laser light source 35 that emits infrared laser light or visible laser light (hereinafter simply referred to as "infrared laser light, etc.") is provided so that the incident light adjustment unit 25 is sandwiched between it and the second incident portion 22 of the second infrared detection unit 20.
• the laser light source 35 is provided so that the optical axis 35s of the infrared laser light, etc. emitted from the laser light source 35 is coaxial with the optical axis 22s of the second incident portion 22, i.e., the optical axis of the second incident light.
• the movable member 29 of the incident light adjustment unit 25 is provided with a transmission window 28 that transmits infrared laser light and the like emitted from the laser light source 35.
• the transmission window 28 is capable of transmitting infrared laser light and the like.
• the transmission window 28 may be a member such as glass that transmits infrared laser light and the like, or a through-hole provided in the movable member 29.
• the transmission window 28 is provided in the movable member 29 so that it moves between the transmission position and the retracted position when the movable member 29 is moved by the movement mechanism.
• the transmission window 28 is positioned at the retracted position, and when both the first reflecting mirror 26 and the second reflecting mirror 27 are positioned at the retracted position, the transmission window 28 is positioned at the transmission position.
• the movement mechanism has the function of a position adjustment mechanism as defined in the claims.
• the transmission position is a position where the transmission window 28 is arranged on the optical axis 35s of the infrared laser light or the like emitted from the laser light source 35 (in other words, on the optical axis of the second incident light incident from the second incident portion 22).
• the transmission window 28 is arranged at this position, the infrared laser light or the like emitted from the laser light source 35 passes through the transmission window 28 and the second incident portion 22 and is irradiated onto the object to be measured.
• the transmission position of the transmission window 28 may be the same position as the reflection positions of the first reflecting mirror 26 and the second reflecting mirror 27.
• the retracted position is a position where the transmission window 28 is retracted from the optical axis 35s of the infrared laser light or the like emitted from the laser light source 35 (in other words, from the optical axis of the second incident light incident from the second incident portion 22).
• the retracted position is a position where the infrared laser light or the like emitted from the laser light source 35 is not incident on the second incident portion 22.
• the transparent window 28 is arranged so as to be aligned with the first reflecting mirror 26 and the second reflecting mirror 27 along the movement direction of the movable member 29 (the left-right direction in Figure 7 (B)).
• the transparent window 28 is arranged so as to be aligned with the first reflecting mirror 26 and the second reflecting mirror 27 along the rotation direction (i.e., the circumferential direction) of the movable member 29.
• the amount of first target infrared light detected by the first detection unit 13 of the first infrared detection unit 11 can be increased. This improves the accuracy of detecting substances present in the object to be measured from the first target infrared light detected by the first detection unit 13.
• placing the transmission window 28 in the transmission position, irradiating the object to be measured with infrared laser light from the laser light source 35, and then placing the second reflection mirror 27 in the reflection position can increase the amount of second target infrared light detected by the second detection unit 23 of the second infrared detection unit 20. This can also improve the accuracy of detecting substances present in the object to be measured from the second target infrared light detected by the second detection unit 23.
• irradiating the laser light may increase the range of increase or decrease, potentially improving the detection accuracy of the object to be measured.
• the area irradiated with the laser light emitted from the laser light source 35 has a certain degree of spread, it becomes possible to grasp a wide range of the object to be measured that exists with a certain degree of spread.
• laser light is irradiated to a predetermined area (LA in Figure 13(B)) in the area where the object to be measured is expected to exist.
• LA in Figure 13(B)
• the object to be measured can be detected in area AT4, which is wider than area AT3 in which the object to be measured is detected when laser light is not irradiated, so the presence of the object to be measured can be confirmed over a wider area.
• irradiating laser light can improve the detection accuracy of the object to be measured compared to when laser light is not irradiated.
• the laser light source 35 may be capable of emitting infrared light of a single wavelength, or may be capable of emitting infrared light of multiple wavelengths. Furthermore, the laser light source 35 may be equipped with multiple laser light sources of different wavelengths capable of emitting infrared light of a single wavelength. This allows for the emission of laser light appropriate for the object being measured, and simultaneous emission of laser light of multiple wavelengths can improve the detection accuracy of multiple objects being measured.
• the detection device 1 of this embodiment may be equipped with a visible light imaging unit 60 that captures visible light (see FIG. 7A).
• the inclusion of the visible light imaging unit 60 allows the status of the area where the object to be measured exists to be captured.
• the status of the object to be measured in the area where the object to be measured A exists can be visually grasped (see FIGS. 11B, 12B, and 13B).
• the movement of the object to be measured i.e., changes in the direction of movement and concentration of the object to be measured, can be grasped.
• the location where the visible light laser light is being irradiated can be determined by irradiating visible light laser light from the laser light source 35.
• the visible light laser light emitted from the laser light source 35 passes through the second incident portion 22 and is irradiated onto the object to be measured, so the location where the visible light laser light is irradiated indicates the location where the infrared light detected by the second detection portion 23 through the second incident portion 22 is emitted, i.e., the location of the substance that detects the target infrared light. Therefore, if the visible light imaging unit 60 that captures visible light is provided, it becomes easier to determine the location where the target infrared light is detected, i.e., the location where the substance is present.
• the incident light adjustment unit 25 has been described as having a configuration in which the second incident light or the second target infrared ray is reflected by the first reflecting mirror 26 or the second reflecting mirror 27 and made incident on the second detection unit 23.
• the incident light adjustment unit 25 may also be configured to make the second incident light or the second target infrared ray incident on the second detection unit 23 without reflecting it.
• the second infrared detection unit 20 is installed so that the optical axis 22s of the second incident light entering from the second incident portion 22 and the optical axis 23s of the second detection unit 23 are coaxial.
• a window member 26b that transmits all wavelengths (or all wavelengths of infrared light) is installed on the movable member 29b instead of the first reflecting mirror 26, and a bandpass filter 27b that transmits only the second target infrared light is installed on the movable member 29b instead of the second reflecting mirror 27.
• the movable member 29b holds the window member 26b and the bandpass filter 27b so that the optical axis 26s of the window member 26b and the optical axis 27s of the bandpass filter 27b are parallel to the optical axis 23s of the second detection unit 23 (in other words, the optical axis 22s of the second incident light). Then, by moving the movable member 29b so that the window member 26b is positioned between the second incident portion 22 and the second detection unit 23, the second detection unit 23 can detect all infrared light of the second incident light. On the other hand, if the movable member 29b is moved so that the bandpass filter 27b is positioned between the second incident portion 22 and the second detection portion 23, the second detection portion 23 can detect the amount of second target infrared light in a specified wavelength range.
• the aforementioned window member 26b corresponds to the all-light supply section in the claims
• the aforementioned bandpass filter 27b corresponds to the second target infrared supply section in the claims.
• the position where the window member 26b or the bandpass filter 27b is located between the second incident section 22 and the second detection section 23 is the supply position in the claims, and the position where one of the window member 26b or the bandpass filter 27b is located while the other is located in the supply position is the retracted position in the claims.
• the laser light source 35 is provided> As shown in Figures 8 and 9, even when the second infrared detection unit 20 is configured so that the second incident portion 22, the incident light adjustment unit 25, and the second detection unit 23 are linearly aligned, the same effect as described above can be achieved by providing a laser light source 35. In this case, since the laser light source 35 cannot be positioned as shown in Figure 6, the laser light source 35 may be positioned to the side (or above or below) of the incident light adjustment unit 25 as shown in Figure 10.
• a reflection mirror 28b that reflects laser light is provided on the movable member 29 of the incident light adjustment unit 25, and the laser light source 35 is positioned so that the optical axis 35s of the laser light reflected by the reflection mirror 28b is coaxial with the optical axis 22s of the second incident light.
• the laser light source 35 can irradiate the object to be measured with laser light or the like.
• the laser light source 35 may be detachably attached to the case 2. In this case, if the laser light source 35 is not needed, the laser light source 35 can be removed, making the detection device 1 of this embodiment more compact. Furthermore, since the attached laser light source 35 can be changed, it becomes possible to use an appropriate laser light source 35 depending on the object to be measured.
• the method for determining the detection target based on the detected infrared light of a predetermined wavelength is not particularly limited, and various known methods can be adopted.
• the infrared light to be detected is in a wavelength range with a certain width
• an interference light forming mechanism is provided between the bandpass filter 14 of the detection unit 10 and the first detection unit 13, or between the incident light adjustment unit 25 and the second detection unit 23.
• the determination unit 30 is also provided with a function to analyze the optical path length difference of the interference light generated by the interference light forming mechanism and the signals related to the light intensity of the interference light detected by the first detection unit 13 and the second detection unit 23, and to identify and distinguish between substances.
• the determination unit 30 is provided with a function to form an interferogram based on the signals related to the light intensity of the interference light supplied from the first detection unit 13 and the second detection unit 23, and to Fourier transform this interferogram to obtain spectroscopic characteristics (spectral characteristics shown in Figure 11(A), etc.), and to identify and distinguish between the object to be measured and the substances contained in the object to be measured based on these spectroscopic characteristics.
• spectroscopic characteristics spectral characteristics shown in Figure 11(A), etc.
• the interference light forming mechanism provided in the detection unit 10 is not particularly limited, and various interference light forming mechanisms can be employed. It is also possible to provide an interference light forming mechanism in place of the bandpass filter 14 and incident light adjusting unit 25 of the detection unit 10. In this case, spectroscopic analysis can be performed using all light (all infrared light) in the first and second incident lights, thereby improving the accuracy of the spectroscopic analysis. In this case, if the bandpass filter 14 and incident light adjusting unit 25 are made detachable and the interference light forming mechanism is freely replaceable, measurements can be performed according to the purpose.
• the measured object and the substances contained in the measured object can be identified from the amount of infrared light in a specified wavelength range in the first and second incident lights.
• the measured object and the substances contained in the measured object can be identified by spectroscopic analysis of the first and second incident lights.
• the detection device of the present invention is suitable for detecting gas leaking from pipes in plants, etc., or from pipes in daily life infrastructure during disasters or normal daily life.
• detection device 10 detection unit 11 first infrared detection unit 12 first incident unit 13 first detection unit 14 bandpass filter 20 second infrared detection unit 22 second incident unit 23 second detection unit 25 incident light adjustment unit 26 first reflecting mirror 27 second reflecting mirror 28 transmission window 29 moving member 27b transmission window 28b bandpass filter 29b moving member 30 determination unit 35 laser light source

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• 2025
  • 2025-05-15 JP JP2025550227A patent/JPWO2025239427A1/ja active Pending
  • 2025-05-15 WO PCT/JP2025/017741 patent/WO2025239427A1/ja active Pending

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