WO2024146382A1

WO2024146382A1 - High-speed quantum regulation magnetic measurement method and system

Info

Publication number: WO2024146382A1
Application number: PCT/CN2023/140339
Authority: WO
Inventors: 周峰; 李小飞; 聂琪; 雷民; 殷小东; 胡浩亮; 黄俊昌; 刘京; 杜新纲; 郭贤珊; 葛得辉; 张民; 彭楚宁; 陈争光
Original assignee: 中国电力科学研究院有限公司; 中国电力科学研究院有限公司武汉分院; 国家电网有限公司
Priority date: 2023-01-03
Filing date: 2023-12-20
Publication date: 2024-07-11
Also published as: CN116593949A; CN116593949B

Abstract

Disclosed in the embodiments of the present application are a high-speed quantum regulation magnetic measurement method and system. The method comprises: a laser source emitting a laser to a diamond NV center, such that the diamond NV center transmits a fluorescence intensity signal; a regional frequency positioning component performing measurement to obtain the current magnetic field intensity to be measured, obtaining a preliminary positioning frequency on the basis of said current magnetic field intensity, and sending the preliminary positioning frequency to a microwave modulator; the microwave modulator expanding a frequency range by taking the preliminary positioning frequency as the center, and performing cyclic frequency sweeping by taking the expanded frequency range as a cycle; and a data collection and processing system collecting fluorescence intensity signals under different scanning frequencies, parsing the fluorescence intensity signals under different scanning frequencies to obtain frequency values at different wave troughs, and obtaining different magnetic field intensities according to the frequency values at different wave troughs and a central frequency value.

Description

A quantum high-speed control magnetic measurement method and system

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is based on the Chinese patent application with application number 202310003901.5, application date January 3, 2023, and application name “Quantum high-speed control magnetic measurement method and system”, and claims the priority of the Chinese patent application. The entire content of the Chinese patent application is hereby introduced into this disclosure as a reference.

Technical Field

The present application relates to the field of electrical quantum sensing technology, and more specifically, to a quantum high-speed control magnetic measurement method and system.

Background technique

Quantum precision measurement technology uses quantum control technology to break through many limitations of traditional measurement technology and greatly improve measurement performance. It has become a hot research area internationally. Quantum precision measurement is an important research direction in the field of quantum information science, aiming to use quantum resources and effects to achieve measurement performance that exceeds classical methods. Cold atomic magnetic quantum sensors have ultra-high magnetic field measurement sensitivity and stability, and the sensitivity of magnetic field detection reaches The maximum operating temperature can reach 400K. Since quantum precision measurement builds a relative measurement system, it can effectively eliminate the influence of common-mode signals generated by the environment and has good temperature adaptability and stability.

Diamond nitrogen vacancy (NV) color center is a defect structure in diamond with good and stable optical properties. The electron spin in the center of diamond NV color center can be manipulated by optical detection magnetic resonance technology. The spin state of the electron can be obtained by detecting the fluorescence intensity of diamond NV color center, and the sensitivity of the single electron spin system to the outside world can be used to obtain the relevant properties of the external environment.

At present, in order to detect the resonance frequency or zero-field splitting size of the ground state energy level of the NV color center, continuous wave optically detected magnetic resonance (CW-ODMR) is a widely used method. Continuous wave optically detected magnetic resonance technology generally uses a certain The difference between the trough and the center frequency is measured by scanning the microwave frequency within a range. Since this method involves multi-frequency microwave modulation, the sampling rate is generally low and cannot meet the sampling rate requirements of 4k or even 10kHz in the power system.

Summary of the invention

In view of this, the present application proposes a quantum high-speed control magnetic measurement method and system, aiming to solve the problem that the existing continuous light detection magnetic resonance technology has a low sampling rate and cannot meet the sampling rate requirements of 4k or even 10kHz in the power system.

In the first aspect, an embodiment of the present application provides a quantum high-speed control magnetic measurement method, the method comprising: a laser source emits a laser to a diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal; a regional frequency positioning component measures the current magnetic field strength to be measured, obtains a preliminary positioning frequency based on the current magnetic field strength to be measured, and sends the preliminary positioning frequency to a microwave modulator; the microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs cyclic frequency scanning with the expanded frequency range as a cycle; a data acquisition and processing system collects fluorescence intensity signals at different scanning frequencies, analyzes the fluorescence intensity signals at different scanning frequencies, obtains frequency values at different troughs, and obtains different magnetic field intensities based on the frequency values at the different troughs and the center frequency value.

In some embodiments, the regional frequency positioning component obtains a preliminary positioning frequency based on the current magnetic field strength to be measured, including: the regional frequency positioning component obtains a theoretical value of the frequency at the trough as the preliminary positioning frequency through a theoretical formula of the frequency at the trough and the center frequency based on the current magnetic field strength to be measured.

In some embodiments, the expanded frequency range includes: a range from f _d1 =f _d ×(1+a)+5×f ₀ to f _d2 =f _d ×(1-a)-5×f ₀ ; the time of one frequency sweep cycle is T ₂ =t ₀ ×(2×a×f _d /f ₀ +10); wherein f _d is the preliminary positioning frequency, a is the measurement accuracy of the regional frequency positioning component, f ₀ is the step length of the frequency sweep, and t ₀ is the time required for each step length.

In some embodiments, the data acquisition and processing system obtains different magnetic field intensities according to the frequency values and the center frequency values at the different troughs, including: the data acquisition and processing system calculates the different The difference between the frequency value at the same trough and the center frequency value results in different magnetic field intensities.

In some embodiments, the regional frequency positioning component includes a magnetic measurement device for measuring the current magnetic field strength to be measured.

In some embodiments, the magnetic measurement device includes at least one of the following: a Hall device, a tunneling magnetoresistive device, and a giant magnetoresistive device.

In the second aspect, the embodiments of the present application also provide a quantum high-speed control magnetic measurement system, the system comprising: a laser source, used to emit laser to the diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal; a regional frequency positioning component, used to measure the current magnetic field strength to be measured, obtain a preliminary positioning frequency based on the current magnetic field strength to be measured, and send the preliminary positioning frequency to a microwave modulator; a microwave modulator, used to expand the frequency range with the preliminary positioning frequency as the center, and perform cyclic frequency scanning with the expanded frequency range as a cycle; a data acquisition and processing system, used to collect fluorescence intensity signals at different scanning frequencies, analyze the fluorescence intensity signals at different scanning frequencies, obtain frequency values at different troughs, and obtain different magnetic field intensities according to the frequency values at different troughs and the center frequency value.

In some embodiments, the data acquisition and processing system obtains different magnetic field strengths according to the frequency values at different troughs and the center frequency values, including: the data acquisition and processing system calculates the difference between the frequency values at different troughs and the center frequency values to obtain different magnetic field strengths.

In some embodiments, the regional frequency positioning component includes a magnetic measurement device for measuring to the current magnetic field strength to be measured.

The quantum high-speed control magnetic measurement method and system provided in the embodiment of the present application obtain the current magnetic field strength to be measured by measuring through the regional frequency positioning component, and obtain the preliminary positioning frequency based on the current magnetic field strength to be measured. The microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs cyclic frequency scanning with the expanded frequency range as a cycle. A method for regional positioning frequency scanning is proposed. By using a frequency range that is initially determined to be a trough frequency range, the time required for frequency scanning is reduced, thereby improving the sampling rate of the entire quantum measurement. Without increasing the hardware cost, the sampling rate is expected to be increased to above 10kHz.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG1 shows an exemplary flow chart of a quantum high-speed control magnetic measurement method according to an embodiment of the present application;

FIG2 shows a fluorescence signal curve graph shown by an oscilloscope according to an embodiment of the present application;

FIG3 shows a microwave modulation time comparison data diagram according to an embodiment of the present application;

FIG4 shows a schematic structural diagram of a quantum high-speed control magnetic measurement system according to an embodiment of the present application;

FIG5 shows a schematic structural diagram of a quantum high-speed control magnetic measurement system according to another embodiment of the present application.

Detailed ways

Now, exemplary embodiments of the present application are introduced with reference to the accompanying drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are provided to disclose the present application in detail and completely and to fully convey the scope of the present application to those skilled in the art. The terms in the exemplary embodiments shown in the accompanying drawings are not intended to limit the present application. In the accompanying drawings, the same units/elements are marked with the same reference numerals.

Unless otherwise specified, the terms (including technical and scientific terms) used herein have the same meaning as those used in the art. In addition, it is understood that the terms defined in commonly used dictionaries should be understood to have the same meaning as the context of the relevant field, and should not be understood as idealized or overly formal meanings.

FIG1 shows an exemplary flow chart of a quantum high-speed control magnetic measurement method according to an embodiment of the present application. As shown in FIG1 , the quantum high-speed control magnetic measurement method includes:

Step S101: a laser source emits laser light to a diamond NV color center to cause the diamond NV color center to emit a fluorescence intensity signal.

Spin excitation stage: In this stage, a laser with a wavelength of 532nm is emitted from a 532nm laser source and irradiated on the diamond. In the process of laser transmission, polarization or non-polarization can be used. The time of this stage is _T1 .

Step S102: The regional frequency positioning component measures the current magnetic field strength to be measured, obtains a preliminary positioning frequency based on the current magnetic field strength to be measured, and sends the preliminary positioning frequency to the microwave modulator.

A low-cost magnetic measuring device can be installed near each diamond probe. The magnetic measuring device includes but is not limited to a Hall device, a tunneling magnetoresistive device, and a giant magnetoresistive device. The measurement accuracy of the magnetic measuring device is a. The magnetic field value B is measured by the magnetic measuring device. The theoretical value f _d of the corresponding frequency of the trough is calculated by the theoretical formula (1) of the frequency at the trough and the center frequency, and is used as the preliminary positioning frequency:
ω＝2.87GHz±2.8MHz/Gs×B×cos θ Formula (1);

In the above formula (1), ω is the microwave resonance frequency of the NV color center, that is, the center frequency, B is the external magnetic field strength, and θ is the angle between the external magnetic field and the sensitive direction of the NV color center. When the angle between the external magnetic field and the sensitive direction of the NV color center coincides, a magnetic field strength of 100Gs corresponds to a frequency splitting of 280MHz.

Step S103: The microwave modulator expands the frequency range with the initial positioning frequency as the center, and performs cyclic frequency sweep with the expanded frequency range as a cycle.

Microwave modulation stage: In this stage, the microwave source performs cyclic frequency sweeping in a certain microwave frequency range f _n near the center frequency f _c as a working cycle, where f _n is related to the maximum value of the magnetic field to be measured, the step length of the frequency sweep is f ₀ , and the time required for each step length is t _0. The time to complete a frequency sweeping working cycle is T ₂ = t ₀ × (f _n - f _c )/f ₀ .

FIG2 shows a fluorescence signal curve graph shown by an oscilloscope according to an embodiment of the present application. As shown in FIG2 , combined with the error of the magnetic sensor and a valley frequency fitting requirement, the regional frequency sweep range is from f _d1 =f _d ×(1+a)+5×f ₀ to f _d2 =f _d ×(1-a)-5×f ₀ , then the time of the microwave modulation stage becomes formula (2):
T2' = _t0 × ( _fd1 - _fd2 ) / f0 = _t0 × (2 × a × _fd / _f0 + 10) Formula (2);

Step S104: The data acquisition and processing system acquires the fluorescence intensity signals at different scanning frequencies, analyzes the fluorescence intensity signals at different scanning frequencies, obtains the frequency values at different troughs, and obtains different magnetic field intensities according to the frequency values at different troughs and the center frequency value.

Fluorescence collection and analysis phase: This part collects and analyzes the fluorescence intensity signals corresponding to different frequencies to obtain the frequency values of different troughs. The difference between the frequency value and the center frequency can directly obtain the corresponding magnetic field intensity. This part takes T ₃ .

By analyzing this process, the total time T of a magnetic measurement can be expressed as formula (3):
T = T ₁ + T ₂ + T ₃ formula (3);

Generally, _T1 and _T3 can be ignored compared to _T2 . During the frequency sweeping process, the time required for a step and frequency switching is in the order of tens of us, and the number of steps required for a frequency sweep is thousands of times. Therefore, the sampling rate of the frequency sweeping method is generally tens of Hz, which cannot meet the needs of high-speed sampling.

From the analysis of the microwave modulation stage, it can be seen that the actual useful signal value is only related to the frequency value of the trough, and a large number of frequency sweeping steps can be omitted. Therefore, if the frequency range of the trough is preliminarily determined by Hall devices before sweeping, and the feedback modulation circuit is used, and a certain expansion frequency is considered, the output frequency of the microwave source is controlled to be only in this extremely narrow frequency range, the time consumption of the microwave modulation stage can be greatly compressed, thereby improving the sampling rate.

In the above embodiment, the current magnetic field strength to be measured is measured by the regional frequency positioning component, and the preliminary positioning frequency is obtained based on the current magnetic field strength to be measured. The microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs cyclic frequency sweeping with the expanded frequency range as a cycle. A method for regional positioning frequency sweeping is proposed. By using a frequency range that is initially determined to be a trough frequency range, the time required for frequency sweeping is reduced, thereby improving the sampling rate of the entire quantum measurement. Without increasing the hardware cost, the sampling rate is reduced. The frequency is expected to increase to above 10kHz.

Example 1

Assuming that the variation range of the magnetic field to be measured is 0-100Gs, taking t ₀ =10us, f ₀ =10kHz, according to the general modulation scheme, the measurement time of one microwave stage is formula (4):
T ₂ =t ₀ ×(f _n -f _c )/f ₀ =10 us×2.8 MHz/Gs×100 Gs/10 kHz=280 ms Formula (4);

Among them, 2.8MHz/Gs means that when the angle between the external magnetic field and the sensitive direction of the NV color center coincides, the magnetic field intensity of 1Gs corresponds to a frequency splitting of 2.8MHz.

That is, the sampling rate is 3 Hz, a=0.5% is taken in this application, and the magnetic field to be measured is 100 Gs, then the measurement time of one microwave stage is formula (5):
T2'= _t0 ×(2×a× _fd / _f0 +10)=10us×(2×0.5%×2.8MHz/Gs×100Gs/10kHz+10)=2.9ms Formula (5);

That is, the sampling rate is 300 Hz, and as the magnetic field to be measured further decreases, the measurement time of one microwave stage can be further reduced. When the magnetic field strength measured by the magnetic sensor device is 10 Gs, the measurement time of one microwave stage is formula (6):
T2' = _t0 × (2 × a × _fd / _f0 + 10) = 10 us × (2 × 0.5% × 2.8 MHz/Gs × 10 Gs/10 kHz + 10) = 0.28 ms Formula (6);

That is, the sampling rate is 3.57kHz. Under different actual measurement magnetic fields, the time distribution of a microwave stage and the time percentage compared with the traditional microwave stage are shown in Figure 3. It can be seen that when the magnetic field is within 1Gs, the sampling rate is as high as 10kHz, which is ¹⁰³ times higher than the general modulation method.

FIG4 shows a schematic diagram of the structure of a quantum high-speed control magnetic measurement system according to an embodiment of the present application. As shown in FIG4 , the high-speed control magnetic measurement system 400 includes:

The laser source 401 is used to emit laser light to the diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal.

The regional frequency positioning component 402 is used to measure the current magnetic field strength to be measured. The preliminary positioning frequency is obtained based on the magnetic field strength and sent to the microwave modulator.

FIG5 shows a schematic diagram of the structure of a quantum high-speed control magnetic measurement system according to another embodiment of the present application. As shown in FIG5 , in the quantum high-speed control magnetic measurement system 500, a low-cost magnetic measurement device 520 (Hall chip) can be installed near each diamond probe 510. Magnetic measurement devices include but are not limited to Hall devices, tunneling magnetoresistive devices, and giant magnetoresistive devices. The measurement accuracy of the magnetic measurement device is a, and the magnetic field value B is measured by the magnetic measurement device. The theoretical value f _d of the corresponding frequency of the trough is calculated by the theoretical formula (7) of the frequency at the trough and the center frequency, and it is used as the preliminary positioning frequency:
ω＝2.87GHz±2.8MHz/Gs×B×cos θ Formula (7);

In the above formula, ω is the microwave resonance frequency and center frequency of the NV color center, B is the external magnetic field strength, and θ is the angle between the external magnetic field and the sensitive direction of the NV color center. When the angle between the external magnetic field and the sensitive direction of the NV color center coincides, a magnetic field strength of 100Gs corresponds to a frequency splitting of 280MHz.

The microwave modulator 403 is used to expand the frequency range with the preliminary positioning frequency as the center, and perform cyclic frequency sweep with the expanded frequency range as a cycle.

Microwave modulation stage: In this stage, the microwave source performs cyclic frequency sweeping within a certain microwave frequency range f _n near the center frequency f _c as a working cycle, where f _n is related to the maximum value of the magnetic field to be measured, the step length of the frequency sweeping is f ₀ , and the time required for each step length is t _0. The time to complete a frequency sweeping working cycle is T ₂ =t ₀ ×(f _n -f _c )/f ₀ .

FIG2 shows a fluorescence signal curve graph shown by an oscilloscope according to an embodiment of the present application. As shown in FIG2 , combined with the error of the magnetic sensor and a valley frequency fitting requirement, the regional frequency sweep range is from f _d1 =f _d ×(1+a)+5×f ₀ to f _d2 =f _d ×(1-a)-5×f ₀ , then the time of the microwave modulation stage becomes formula (8):
T2' = _t0 × ( _fd1 - _fd2 ) / f0 = _t0 × (2 × a × _fd / _f0 + 10) Formula (8);

The data acquisition and processing system 404 is used to acquire fluorescence intensity signals at different scanning frequencies, analyze the fluorescence intensity signals at different scanning frequencies, obtain frequency values at different troughs, and obtain different magnetic field intensities according to the frequency values at different troughs and the center frequency value.

Fluorescence acquisition and analysis phase: This part collects fluorescence intensity signals corresponding to different frequencies. The frequency values of different troughs are obtained by analysis. The difference between the frequency value and the center frequency can be used to directly obtain the corresponding magnetic field strength. The time required for this part is T ₃ .

Through the analysis of this process, the total time T of a magnetic measurement is expressed as formula (9):
T = T ₁ + T ₂ + T ₃ formula (9);

In the above embodiment, the current magnetic field strength to be measured is measured by the regional frequency positioning component, and a preliminary positioning frequency is obtained based on the current magnetic field strength to be measured. The microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs cyclic frequency sweeping with the expanded frequency range as a cycle. A method for regional positioning frequency sweeping is proposed. By preliminarily determining a frequency range as a trough frequency, the time required for frequency sweeping is reduced, thereby improving the sampling rate of the entire quantum measurement. Without increasing the hardware cost, the sampling rate is expected to be increased to above 10kHz.

Example 2

Assuming that the variation range of the magnetic field to be measured is 0-100Gs, taking t ₀ =10us, f ₀ =10kHz, according to the general modulation scheme, the measurement time of one microwave stage is formula (10):
T ₂ =t ₀ ×(f _n -f _c )/f ₀ =10 us×2.8 MHz/Gs×100 Gs/10 kHz=280 ms Formula (10);

That is, the sampling rate is 3 Hz, a=0.5% is taken in this application, and the magnetic field to be measured is 100 Gs, then the measurement time of one microwave stage is formula (11):
T2'= _t0 ×(2×a× _fd / _f0 +10)=10us×(2×0.5%×2.8MHz/Gs×100Gs/10kHz+10)=2.9ms Formula (11);

That is, the sampling rate is 300 Hz, and as the magnetic field to be measured further decreases, the measurement of a microwave stage The measurement time can be further reduced. When the magnetic field strength measured by the magnetic sensor device is 10Gs, the measurement time of one microwave stage is as follows:
T2' = _t0 × (2 × a × _fd / _f0 + 10) = 10us × (2 × 0.5% × 2.8MHz/Gs × 10Gs/10kHz + 10) = 0.28ms Formula (12);

The present application has been described with reference to a small number of embodiments. However, it is known to those skilled in the art that other embodiments than those disclosed above are equally within the scope of the present application, as defined by the appended patent claims.

Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the technical field, unless explicitly defined otherwise herein. All references to "a/said/the [means, components, etc.]" are to be openly interpreted as at least one instance of said means, components, etc., unless explicitly stated otherwise. The steps of any method disclosed herein do not necessarily have to be performed in the exact order disclosed, unless explicitly stated otherwise.

Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

The present application is described with reference to the flowcharts and/or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and/or block in the flowchart and/or block diagram, as well as the combination of the processes and/or blocks in the flowchart and/or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the process in the flow chart. A flowchart may include one process or multiple processes and/or a block diagram may include one block or multiple blocks that specify functions.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory produce a manufactured product including an instruction device that implements the functions specified in one or more processes in the flowchart and/or one or more boxes in the block diagram.

These computer program instructions may also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, whereby the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one or more processes in the flowchart and/or one or more boxes in the block diagram.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present application rather than to limit it. Although the present application has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or replaced by equivalents, and any modifications or equivalent replacements that do not depart from the spirit and scope of the present application should be included in the scope of protection of the claims of the present application.

Industrial Applicability

The embodiment of the present application provides a quantum high-speed control magnetic measurement method and system, the method comprising: a laser source emits a laser to the diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal; the regional frequency positioning component measures the current magnetic field intensity to be measured, obtains a preliminary positioning frequency based on the current magnetic field intensity to be measured, and sends the preliminary positioning frequency to the microwave modulator; the microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs a cyclic frequency sweep with the expanded frequency range as a cycle; the data acquisition and processing system collects the fluorescence intensity signal at different scanning frequencies, analyzes the fluorescence intensity signal at different scanning frequencies, obtains the frequency value at different troughs, and obtains different magnetic field intensities according to the frequency value at different troughs and the center frequency value. Through the method and system provided by the embodiment of the present invention, the time required for frequency sweeping can be reduced, thereby improving the sampling rate of the entire quantum measurement, and the sampling rate is expected to be increased to more than 10kHz.

Claims

A quantum high-speed control magnetic measurement method, the method comprising:

The laser source emits laser light to the diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal;

The regional frequency positioning component measures and obtains the current magnetic field strength to be measured, obtains a preliminary positioning frequency based on the current magnetic field strength to be measured, and sends the preliminary positioning frequency to the microwave modulator;

The microwave modulator expands the frequency range with the preliminary positioning frequency as the center, and performs cyclic frequency sweep with the expanded frequency range as a cycle;

The data acquisition and processing system acquires fluorescence intensity signals at different scanning frequencies, analyzes the fluorescence intensity signals at different scanning frequencies, obtains frequency values at different troughs, and obtains different magnetic field intensities according to the frequency values at different troughs and the center frequency value.
The method according to claim 1, wherein the regional frequency positioning component obtains the preliminary positioning frequency based on the current magnetic field strength to be measured, comprising:

The regional frequency positioning component obtains the theoretical value of the frequency at the trough as the preliminary positioning frequency through a theoretical formula of the frequency at the trough and the center frequency based on the current magnetic field strength to be measured.
The method according to claim 1, wherein the extended frequency range includes: a range from f d1 = f d × (1 + a) + 5 × f 0 to f d2 = f d × (1 - a) - 5 × f 0 ;

The time of one frequency sweep cycle is T 2 =t 0 ×(2×a×f d /f 0 +10);

Among them, fd is the preliminary positioning frequency, a is the measurement accuracy of the regional frequency positioning component, f0 is the step size of the frequency sweep, and t0 is the time required for each step size.
The method according to claim 1, wherein the data acquisition and processing system obtains different magnetic field intensities according to the frequency values and the center frequency values at the different troughs, including:

The data acquisition and processing system calculates the difference between the frequency value at the different troughs and the central frequency value to obtain different magnetic field intensities.
The method according to any one of claims 1 to 4, wherein the regional frequency positioning component includes a magnetic measurement device for measuring the current magnetic field strength to be measured.
The method according to claim 5, wherein the magnetic measurement device comprises at least one of the following: a Hall device, a tunneling magnetoresistive device, and a giant magnetoresistive device.
A quantum high-speed control magnetic measurement system, the system comprising:

A laser source, used to emit laser light to the diamond NV color center so that the diamond NV color center emits a fluorescence intensity signal;

A regional frequency positioning component, used to measure the current magnetic field strength to be measured, obtain a preliminary positioning frequency based on the current magnetic field strength to be measured, and send the preliminary positioning frequency to the microwave modulator;

A microwave modulator is used to expand the frequency range with the preliminary positioning frequency as the center, and perform cyclic frequency sweep with the expanded frequency range as a cycle;

The data acquisition and processing system is used to collect fluorescence intensity signals at different scanning frequencies, analyze the fluorescence intensity signals at different scanning frequencies, obtain frequency values at different troughs, and obtain different magnetic field intensities according to the frequency values at different troughs and the center frequency value.
The system according to claim 7, wherein the extended frequency range includes: a range from f d1 =f d ×(1+a)+5×f 0 to f d2 =f d ×(1-a)-5×f 0 ;

The time of one frequency sweep cycle is T 2 =t 0 ×(2×a×f d /f 0 +10);

Among them, fd is the preliminary positioning frequency, a is the measurement accuracy of the regional frequency positioning component, f0 is the step size of the frequency sweep, and t0 is the time required for each step size.
The system according to claim 7 or 8, wherein the regional frequency positioning component includes a magnetic measurement device for measuring the current magnetic field strength to be measured.
The system according to claim 9, wherein the magnetic measurement device comprises at least one of the following: a Hall device, a tunneling magnetoresistive device, and a giant magnetoresistive device.