WO2024069209A1

WO2024069209A1 - System and method of cycling testing of samples

Info

Publication number: WO2024069209A1
Application number: PCT/IB2022/059231
Authority: WO
Inventors: Georg Robert Eitelhuber; Raed Lafi ALAHMDI
Original assignee: Nomadd Desert Solar Solutions Limited Company
Priority date: 2022-09-28
Filing date: 2022-09-28
Publication date: 2024-04-04

Abstract

A system for cyclic testing of a sample is disclosed. The system may include a testing-platform which may include a plurality of sample holders. Each of the plurality of sample holders may be configured to receive a sample to be tested. In some embodiments, the testing-platform may be rotatable about an axis, such that during its rotation, the plurality of sample holders are displaced along a common trajectory. The system may further include a plurality of testing-stations positioned in proximity to the testing-platform and the common trajectory. Each of the plurality of sample holders may be docked at each of the plurality of testing-stations for a predetermined docking time-duration, and may perform a testing operation on the sample to be tested, when an associated sample holder is docked at or is transitioning via a respective testing-station of the plurality of testing-stations.

Description

PATENT APPLICATION

FOR

SYSTEM AND METHOD OF CYCLING TESTING OF SAMPLES

BY

GEORG ROBERT EITELHUBER

AND

RAED LAFI ALAHMDI

DESCRIPTION

Technical Field

[001] This disclosure relates generally to a testing apparatus, and particularly to a method and system for cyclic testing of samples, and in particularly, for cyclic testing of solar panel samples and other components associated with solar energy harnessing equipment.

Background

[002] There has lately been a steep rise in the adoption of the solar-based technology as an alternative to energy production technologies. This has led to installation of large number of solar power plants, which use solar panels. The solar panels, once installed, are typically used for a life-span of around 20 years. During this period, the solar panels are exposed to a variety of environmental conditions, including high day-time temperatures, humidity, dust, wind, etc. Further, the solar panels regular cleaning, for example, to remove dust, for efficient working of the solar panel samples. The solar panels may be cleaned by robotic device using large-sized brush assemblies. For example, the brush assembly may include a cleaning brush mounted on a robot which may regularly move across each solar panels while a cylindrical brush is rotating about its axis to thereby clean the solar panels. As such, the surface, usually glass surface, of the solar panel is subject to multitude environmental conditions and intervening actions (like robotic cleaning actions) that may continuously cause abrasions on the surface.

[003] It, therefore, becomes important to track the abrasions by testing the solar panels over time to better understand the effects of the environmental conditions and intervening conditions on the abrasion on the surface and further the effects on the efficiency of the solar panels. The testing may require periodically inspecting the solar panel samples, for example, by obtaining images of the surface and comparing and analyzing the images obtained at different points in time. However, if the testing process is performed over the life-span of the solar panel sample, the overall process becomes too lengthy, and the faults are detected late in time by which the faults may have already settled in.

[004] Therefore, there is a need to reduce the time period of performing accelerated lifetime cyclic testing of the solar panel samples, or any other type of a sample (including panels of building windows, automobile components, etc.), for example, by performing cyclic testing of the sample by simulating various environmental conditions and intervening actions and cyclically inspecting the samples, at accelerated frequency over time to determine the efficacy, resiliency, and wear of the samples.

SUMMARY

[005] In an embodiment, a system for cyclic testing of a sample is disclosed. The system may include a testing-platform, which may include a plurality of sample holders. Each of the plurality of sample holders may be configured to receive a sample to be tested. The testing-platform may be rotatable about an axis. During rotation of the testing-platform, the plurality of sample holders may be displaced along a common trajectory. The system may further include a plurality of testing-stations positioned in proximity to the testing-platform and the common trajectory. Each of the plurality of sample holders may be docked at each of the plurality of testing-stations for a predetermined or programmable docking time-duration. Each of the plurality of testing- stations may be configured to perform a testing operation on the sample to be tested, when an associated sample holder is docked at or is transitioning via a respective testingstation of the plurality of testing-stations.

[001] In some embodiments, the plurality of testing-stations may include one or more of a set of simulated environment testing-stations. The set of simulated environment testing-stations may include at least one testing-station configured to create a simulated condensate deposition environment, at least one testing-station configured to create a simulated wind-borne dust deposition environment, at least one testing-station configured to create a simulated dusty environment, and at least one testing-station configured to create a simulated hot environment. The set of simulated environment testing-stations further includes at least one cleaning testing-station configured to clean the sample under test, using a robotic cleaning brush. The testing-stations may further include at least one inspection testing-station which may be configured to inspect the effects of the simulated environments to which the sample is exposed to. To this end, the at least one inspection testing-station may be configured to obtain an image of the sample under test using an imaging device, or determine an amount of obscuring on the sample caused by dust and/or scratches and any other applied factors over time, using a transmissivity sensor.

[002] In another embodiment, a method of cycling testing of a solar panel sample is disclosed. The method may include receiving a solar panel sample on an associated solar panel sample holder of a plurality of solar panel sample holders. Each of the plurality of solar panel sample holders may be disposed on a testing-platform 104, and each of the solar panel sample holders may be configured to receive the respective solar panel sample to be tested. The testing-platform 104 may be rotatable about an axis. During rotation of the testing-platform 104, the plurality of solar panel sample holders may be displaced along a common trajectory. A plurality of testing-stations may be positioned in proximity to the testing-platform 104 and the common trajectory. The method may further include rotating the testing-platform 104 about the axis by a predetermined angular displacement, to dock each of the plurality of solar panel sample holders at each of the plurality of testing-stations for a predetermined docking time-duration. The method may further include triggering each of the plurality of testing-stations to cyclically perform a testing operation on the solar panel sample to be tested, when an associated solar panel sample holder is docked at a respective testing-station of the plurality of testing-stations.

[003] The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate exemplary embodiments and, together with the description, serve to explain the disclosed principles.

BRIEF DESCRIPTION OF THE DRAWINGS

[004] The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate exemplary embodiments and, together with the description, serve to explain the disclosed principles.

[005] FIG. 1 illustrates a perspective view of a system for cycling testing of one or more samples, in accordance with an embodiment of the present disclosure.

[006] FIG. 2 illustrates a top view of the system for cycling testing of one or more samples of FIG. 1 , in accordance with an embodiment. [007] FIG. 3 illustrates a top view of a system for cycling testing of one or more samples with adjacent testing stations having a common wall, in accordance with another embodiment.

[008] FIG. 4 illustrates a perspective view of a system for cycling testing of one or more samples with a common second support base, in accordance with another embodiment.

[009] FIG. 5 illustrates a top view of the system of FIG. 4 with the common second support base, in accordance with another embodiment.

[010] FIG. 6 illustrates a perspective view of a system for cycling testing of one or more samples with the testing stations configured as cantilever structures, in accordance with another embodiment.

[011] FIG. 7 illustrates a top view of a system of FIG. 6 with the testing stations configured as cantilever structures, in accordance with another embodiment.

[012] FIG. 8 is a block diagram of an analyzing system, in accordance with another embodiment.

[013] FIG. 9 is a schematic diagram of system for cyclic testing of a sample implementing a track and a carriage, in accordance with some alternate embodiments.

[014] FIG. 10 is a flowchart of a method of cycling testing of a solar panel sample, in accordance with some embodiment of the present disclosure.

DETAILED DESCRIPTION

[015] Exemplary embodiments are described with reference to the accompanying drawings. Wherever convenient, the same reference numbers are used throughout the drawings to refer to the same or like parts. While examples and features of disclosed principles are described herein, modifications, adaptations, and other implementations are possible without departing from the spirit and scope of the disclosed embodiments. It is intended that the following detailed description be considered as exemplary only, with the true scope and spirit being indicated by the following claims.

[016] Solar panels are one of the largest cost aspects of a large solar array, and if the solar panels fail to perform in the long term, the entire economic model of the solar power-based plant may be at risk. The solar panels are cleaned regularly using cleansing brushes and sometimes using robotic cleaning brushes. Currently there is a gap in knowledge around the interaction between solar panels and the cleaning robots over long periods of time. Since the robotic cleaning brush (or simply the robot) will run over the solar panels thousands of times during the lifetime of the array, the robot presents a substantial risk and uncertainty around the solar panel’s performance over time. Therefore, it becomes crucial that risks are identified, measured, and mitigated at the earliest stages of a plant development. Until there is a simple cost-effective reliable and repeatable set of standard tests to measure the interaction and potential for damage between robots and panels, this gap in knowledge will continue to put the long-term commercial viability of desert solar at risk.

[017] There are two primary damage modes that occur between a robot and solar panels in desert environments. The first is broadly due to weight loading of the robot on the solar panel surface or the frame, and the second is broadly due to abrasive effects of a brush or cleaning material on the panel surface over time. These damage modes are mostly a result of various site conditions and environmental factors including humidity, temperature cycling, dust particulate characteristics, deposition rates, weather conditions, and the presence of additional particulate matter including biological matter and pollution. These conditions and factors may be different for different site locations. Further, these conditions and factors interact in unique and complex manners over 24 hours and seasonal periods, to create soiling deposits on the panels. Different combinations result in soiling that is easier or harder to get off the panels. For example, in coastal desert regions, humidity condenses on the solar panels, dust is blown on the solar panels, and in the early hours, water evaporates and leaves the dust “baked” on the solar panels. Additionally, the solar panels may be exposed to salt deposits and possible pollution sources. As such, it is a challenge to remove these deposits on a daily basis without damaging the panels. Given that it takes a number of hours (or days) to create these conditions, it is very hard to simulate them in a shorter space of time.

[018] The cleaning may be performed using a cleaning brush, and particularly, a robotic cleaning brush. When the brush is run over these deposits, abrasion may occur. Further, robot operating parameters such as brush type, robot speed, brush rotation rates, regularity of cleaning, can all be theoretically set to minimize any damage and maximize cleaning for a particular site. Therefore, the site-specific conditions and the robot operating parameters significantly determine the chance of abrasive damage to a solar panel from cleaning, over time. Therefore, a tunable, repeatable, time-efficient testing technique is required that reduces the time period of performing test actions of the solar panel samples (or any other type of a sample) by performing cyclic testing of the sample. The cyclic testing of the sample, for example, may be performed by simulating various environmental conditions and intervening actions and cyclically inspecting the samples, at accelerated frequency over time to determine the efficacy, resiliency, and wear of the samples. In other words, it is desired to perform accelerated lifetime cyclic testing by performing testing cycles that mimic real condition to be performed at a much reduced time-frame, so as to allow testing to generate data quickly enough to inform decisions prior to large scale deployments and high potential risk.

[019] To this end, a system for cyclic testing of a sample is disclosed. The system may include a testing-platform which may include a plurality of sample holders, each of the plurality of sample holders being configured to receive a sample to be tested. The testing-platform may such that it may cause the movement of the samples mounted thereto across a common trajectory. For example, the testing-platform may be rotatable about an axis, and during rotation of the testing-platform, the plurality of sample holders are displaced along the common trajectory. Alternately, the testing-platform may be movable on a specific path, for example a closed-loop (rail) track thereby causing the movement of the samples along the trajectory defined of this closed-loop track.

[020] The system may further include a plurality of testing-stations positioned in proximity to the testing-platform and the common trajectory. The plurality of testingstations may include simulated environment testing-stations. For example, the different simulated environment testing-stations may be configured to create a simulated environment conditions including that of a simulated condensate deposition environment, a simulated wind-borne dust deposition environment, a simulated dusty environment, and a simulated hot environment., etc. Further, one of the testing-stations may be configured to clean the sample under test, using a robotic cleaning brush, and at least one inspection testing-station may be configured to inspect the sample under test, such as by obtaining data of the sample under test.

[021] In order to perform the testing, each of the plurality of sample holders may be docked at each of the plurality of testing-stations for a predetermined or a programmable docking time-duration. Each of the plurality of testing-stations may perform a testing operation on the sample to be tested, when an associated sample holder is docked at or is transitioning via a respective testing-station of the plurality of testingstations. Therefore, the sample under test is cyclically subjected to the simulated environment conditions. In each cycle, the sample under test is subjected to the simulated condensate deposition environment, the simulated wind-borne dust deposition environment, the simulated dusty environment, or the simulated hot environment, etc. Further, the sample under test is subjected to the cleaning action by the robotic cleaning brush. Furthermore, the sample under test may be inspected by obtaining data about the sample under test. The results of the inspection, for example a plurality of images of the sample from the at least one inspection testing-station are then analyzed to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne dust deposition environment, the simulated dusty environment, or the simulated hot environment on the sample under test. The cyclic testing may be repeated over as many as multiple cycles (e.g. 5,000-20,000 cycles) to thereby simulate the testing over the life-span of the solar panel sample. In this way, the overall duration of the multiple testing cycles corresponding to the 20 years life-span is brought down to a few weeks. [022] Referring now to FIGs. 1-2, a top view and a perspective view, respectively, of a system 100 for cycling testing of one or more samples is illustrated, in accordance with some embodiments. In some embodiments, the system 100 may include a testing-platform 104. In some embodiments, as illustrated in FIGs. 1 -2, the testingplatform 104 may have a circular-shaped profile, and in particularly a disc-shaped profile defining a central void section at the center 108. It should be noted that the shape of the testing-platform 104 may not be restricted to the specific circular-shaped profile or the disc-shaped profile, and any other shape, for example, a polygonal shape, an ovular shape, etc. may be possible as well. In some embodiments, the testing-platform 104 may have a substantially flat upper surface. However, it should be noted that the upper surface of the testing-platform 104 may not necessary be flat and may include protrusions or depressions.

[023] The testing-platform 104 include a plurality of sample holders 106-1 , 106- 2,... and so on. In some embodiments, as shown in the FIGs. 1 -2, the testing-platform 104 may include eight sample holders 106-1 , 106-2, ...106-8 (hereinafter, collectively or individually referred to as plurality of sample holders 106). The plurality of sample holders 106-1 may be spaced equally from each other. Further, the plurality of sample holders 106 may be oriented so as be facing the axis Y-Y’. In other words, each of the plurality of sample holders 106 may be positioned radially away from the axis Y-Y’ at equal angular gap. As such, each of the eight sample holders 106 may be spaced at 45° to its adjacent sample holders 106.

[024] Each of the plurality of sample holders 106 may be configured to receive an associated sample 102 to be tested. In particular, each of the plurality of sample holders 106 may be configured to receive and fix thereto a sample 102 which is to be tested. The sample 102, for example, may include a solar panel sample. In other examples, the sample 102 may include a panel meant for any other application, such as a glass panel for a window for a building, a glass panel for an automobile, etc. The sample holders 106 may be affixed to the testing-platform 104, and may include attaching means to hold the sample 102 to be tested. By way of some other examples, the attaching means may include a mechanical clamp of a magnetic clamp. By way of some other examples, the attaching means may include a slot or a socket into which the sample 102 to be tested may be temporarily fixed.

[025] The testing-platform 104 may be rotatable about an axis Y-Y’. During the rotation of the testing-platform 104, the plurality of sample holders 106 may be displaced along a common trajectory T. In other words, as the testing-platform 104 rotates, the plurality of sample holders 106 may also rotate about the same axis Y-Y’.

[026] In order to rotate the testing-platform 104, the system may include a motor 110. For example, the motor 110 may be an electrically power stepper motor. Further, the motor 110 may be coupled with the testing-platform 104 via a friction wheel 112 and a friction surface 114. The friction wheel 112 may be attached to the electric motor 110 and is rotatable by the electric motor 110. As shown in FIG. 1 , the friction surface 114 may be defined along an edge of the testing-platform 104. As such, the friction wheel 112 may be pressed against the friction surface 114 in order to drive the rotation of the testing-platform 104. The system 100 may further include at least two idle wheels 1 16-1 , 116-2 configured to support testing-platform 104 against wobbling. In some example embodiments, the at least two idle wheels 116-1 , 116-may be positioned at 120° to the friction wheel 112, to properly balance against the pressing force of the friction wheel 112. Additionally, the testing-platform 104 may include bottom supports (not shown in FIGs. 1 -2) which may provide support to the testing-platform 104 from underneath to avoid any planar deformation or wobbling of the testing-platform 104 during the testing. The bottom supports, for example, may include a set of wheels positioned at multiple location (equally spaced from each other) underneath the surface of the testing-platform 104.

[027] The system 100 may further include a plurality of testing-stations 118-1 , 118-2, ... and so on. In some embodiments, as shown in FIGs. 1 -2, the system 100 may include eight testing-stations 118-1 , 118-2, ... 118-8 (hereinafter, collectively or individually referred to as plurality of testing-stations 118). Each of the plurality of testingstations 118 may be positioned in proximity to the testing-platform 104 and the common trajectory T. The plurality of testing-stations 118 may be spaced equally from each other. Further, the plurality of testing-stations 118 may be oriented so as be facing the axis Y- Y’. In other words, each of the plurality of testing-stations 118 may be positioned radially away from the axis Y-Y’ at equal angular gap. As such, each of the eight sample holders 106 may be spaced at 45° to its adjacent sample holders 106.

[028] The plurality of testing-stations 118 may include one or more of a set of simulated environment testing-stations. The set of simulated environment testing-stations may include at least one first testing-station 118-1 configured to create a simulated condensate deposition environment, at least one second testing-station 118-2 configured to create a simulated wind-borne deposition environment, at least one third testing-station 118-3 configured to create a simulated dusty environment, and at least one fourth testingstation 118-4 configured to create a simulated hot environment. Additionally, the set of simulated environment testing-stations may include at least one fifth testing-station 1 18-

5 configured to create a pressure environment and at least one sixth testing-station 118-

6 configured to create a sun-lit environment. It should be noted that the above sequence of the above set of simulated environment testing-stations 118-1 to 118-6 is merely exemplary, and set of simulated environment testing-stations may be positioned with respect to each other in any other sequence as well. For example, in some scenarios, the fifth testing-station 118-5 (pressure environment) and the at least one sixth testing-station 118-6 (sun-lit environment) may be positioned between the third testing-station 118-3 (dusty environment) and the at least one fourth testing-station 118-4 (hot environment).

[029] The plurality of testing-stations 118 may further include at least one cleaning testing-station 118-7 configured to clean the sample 102 under test. In some embodiments, the cleaning testing-station 1 18-7 may include a cleaning brush, as shown in FIGs. 1 -2. This cleaning brush may include cleaning bristles along its length and may be configured to rotate on its own axis X-X’, in order to remove the various depositions formed on the surface of the sample due to the exposure to the above set of simulated environment testing-stations 118-1 to 118-6. In order to rotate the cleaning brush on its axis X-X’, the cleaning brush may be provided with a motor, e.g. an electric motor. Further, the cleaning brush may be appropriately positioned with respect to the anticipated position of sample, so that the bristles of the cleaning brush sufficiently touch the surface of the sample to perform the cleaning operation.

[030] Further, the cleaning brush may perform the respective cleaning operation on the sample 102 when the associated sample holder 104 is transitioning through the cleaning testing-station 118-7. This is because while the testing operations of the testing- stations 118-1 to 118-6 and 118-8 and may be performed while the sample is stationary, the cleaning testing-station 1 18-7 (cleaning brush) may require a relative movement between the cleaning brush and the sample 102 to simulate the actual condition. It should be noted that the actual cleaning operation may be performed by moving the cleaning brush (while the cleaning brush is also rotating about its axis X-X’) relative to the sample 102.

[031] The plurality of testing-stations 118 may further include at least one inspection testing-station 118-8 configured to obtain data (e.g. using one or more different types of sensors like image sensors and transmissivity sensor) about the sample 102 under test. As such, the plurality of testing-stations 118-1 to 118-8 may be configured to simulate various environmental conditions and perform intervening actions (like cleaning) and cyclically inspecting the samples, at accelerated frequency.

[032] As the testing-platform 104 rotates and the plurality of sample holders 106 are displaced along the common trajectory T, the testing-platform 104 may be stopped at a predefined frequency so as to dock each of the plurality of sample holders 106 at each of the plurality of testing-stations. Each of the plurality of sample holders 106 may be docked at each of the plurality of testing-stations 104 for a predetermined docking timeduration.

[033] When an associated sample holder is docked at or is transitioning via a respective testing-station of the plurality of testing-stations 118, each of the plurality of testing-stations 104 may perform a testing operation on the sample to be tested. For example, each of the testing-stations 1 18-1 to 118-6 and 118-8 may perform a respective testing operation on the sample 102 when the associated sample holder is docked at the testing-station. Upon docking of a sample holder of the plurality of sample holders 106 at a test-station of the test-stations 118-1 to 118-6 and 118-8, the respective test-station may perform the testing operation for an associated testing-station time-duration. However, the testing-stations 118-7 (cleaning brush) may perform the respective cleaning operation on the sample 102 when the associated sample holder is transitioning through the cleaning testing-station 118-7. This is because while the testing operations of the testing-stations 118-1 to 1 18-6 and 1 18-8 may be performed while the sample 102 is stationary, the cleaning testing-stations 118-7 (cleaning brush) may require a relative movement between the cleaning brush and the sample 102 to simulate the actual condition. It should be noted that the actual cleaning operation may be performed by moving the cleaning brush (while the cleaning brush is also rotating about its axis X-X’) relative to the sample to be tested.

[034] In some example embodiments, the first testing-station 118-1 may be configured to create the simulated condensate deposition environment, for example, by spraying a predetermined quantity of the water on the sample 102. To this end, in some embodiments, a spray nozzle may be used to generate fine droplets of liquid that are sprayed and deposited on the surface of the sample 102. The spraying operation may be performed until the surface of the sample 102 is uniformly covered with droplets. The second testing-station 118-2 may be configured to create the simulated wind-borne deposition environment, for example, by blowing air at a predetermined speed at the sample 102. In some embodiments, a blower or fan may be used to blow air at a predetermined speed at the sample 102. [035] The third testing-station 118-3 may be configured to create the simulated dusty environment, for example, by dispensing on the sample 102 a predetermined quantity of particulate matter via a sieve. For example, the particulate matter may be natural sand or any synthetic particulate matter resembling the qualities of the actual dust to which the sample may have been exposed to in the actual scenario.

[036] The fourth testing-station 118-4 may be configured to create the simulated hot environment, for example, by applying heat to the sample 102 under test, via one of convection-based heating and radiation-based heating process. In some embodiment, a heating element may be used to heat the sample 102. In alternate embodiments, a heating element with a blower may be used to and apply hot air to the sample 102. The heating may be a time-based heating in which the heating of the sample 102 may be performed for a predetermined time. Alternatively, the heating may be a temperaturebased heating in which the extent of heat applied to the sample 102 is controllable, for example, using a thermostat or any other type of temperature sensor. In other words, in order to simulate the variation in actual heating of the sample (i.e. due to the movement of the sun), the fourth testing-station 118-4 may control the intensity of the simulated heating by either increasing or decreasing the duration for which the sample 102 is subjected to heat, or by changing the amount of heat applied to the sample 102 within a fixed time duration.

[037] The fifth testing-station 118-5 may be configured to create the pressure environment, for example, by pressing a surface of the sample 102 under test using a pressure-wheel. It should be noted that the pressure environment may correspond to the pressure applied by the cleaning brush during the actual cleaning operation. However, in some embodiments, the pressure environment may be simulated by the cleaning testingstation 118-7 using the cleaning brush, and therefore, the fifth testing-station 118-5 may not be required.

[038] The sixth testing-station 118-6 may be configured to create the sun-lit environment by projecting a light beam on a surface of the sample 102 under test. In some embodiments, the sixth testing-station 118-6 may be left partially enclosed, being exposed directly to the outside environment for receiving illumination or solar radiation for creating hot environment. Alternately, the sun-lit environment may be simulated using a light source, such as light emitting diode (LED), or an incandescent bulb.

[039] The cleaning testing-station 118-7 may include a robotic cleaning brush configured to clean the sample 102 under test. For example, this robotic cleaning brush may be the same robotic cleaning brush as is used in the actual scenario. Alternatively, a modified robotic cleaning brush may be used that may be capable of reproducing the actual effects of the cleaning in a relatively much shorter time period.

[040] In some embodiments, the inspection testing-station 118-8 may be configured to obtain data associated with the sample 102 after each cycle of the sample being exposed to the set of simulated environment testing-stations 118-1 to 118-6. For example, the inspection testing-station 118-8 may include a microscope-based imaging device (i.e. a camera) to obtain an image of the sample 102 under test. Or, the inspection testing-station 118-8 may include a transmissivity sensor which may determine an extent of obscuring of the surface of the sample due to scratching of the surface by the cleaning brush or by the dust. [041] Further, in some embodiments, the inspection testing-station 118-8 may be communicatively coupled with an analyzing device. The analyzing device may include a processor and a memory communicatively coupled with the processor and storing processor-executable instructions. The processor-executable instructions on execution by the processor may cause the processor to receive a plurality of images of the sample from the at least one inspection testing-station. The plurality of images may be obtained over a plurality of cycles of the sample docking at the at least one inspection testingstation 118-8. The processor-executable instructions on execution by the processor may cause the processor to analyze the plurality of images of the sample 102 to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne deposition environment, the simulated dusty environment, and the simulated hot environment, as created by the respective testingstations. The analyzing device is further explained in conjunction with FIG. 8.

[042] Referring now to FIG. 8, a block diagram of an analyzing system 800 for analyzing the data associated with the samples under test is illustrated, in accordance with some embodiments of the present disclosure. By way of an example, the sample may include a glass panel, and in particularly, a solar panel sample for which cyclic testing is to be performed to understand the effects of the abrasion on the solar panel sample due to cleaning action or due environmental factors.

[043] The analyzing system 800 may include an analyzing device 802. The analyzing system 800 may further include one or more inspection testing-station 804. The analyzing device 802 may be communicatively coupled with the inspection testing-station 804 (corresponding to inspection testing-station 118-8) over a communication network 806. The communication network 806 may be a wired or a wireless network or both, and the examples may include, but are not limited to the Internet, Wireless Local Area Network (WLAN), Wi-Fi, Long Term Evolution (LTE), Worldwide Interoperability for Microwave Access (WiMAX), and General Packet Radio Service (GPRS).

[044] The analyzing device 802 may be a computing device having various processing capabilities, such as image processing capability, etc. Examples of the analyzing device 802 may include, but are not limited to a desktop, a laptop, a notebook, a netbook, a tablet, a smartphone, a mobile phone, an application server, a web server, or the like. In particular, the analyzing device 802 may have capability to facilitate analysis of the data obtained by the inspection testing-station 804 so as to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne deposition environment, the simulated dusty environment, the simulated hot environment, the simulated pressure environment, the simulated sun-lit environment, etc. as created by the respective testing-stations.

[045] In order to carry out the above processing, as mentioned above, the analyzing system 800 may include a processor 808 and a memory 810. The memory 810 may be communicatively coupled with the processor 808 and may store instructions that, when executed by the processor 808, cause the processor 808 to perform one or more actions, as mentioned above. The memory 810 may be a non-volatile memory or a volatile memory. Examples of non-volatile memory may include, but are not limited to a flash memory, a Read Only Memory (ROM), a Programmable ROM (PROM), Erasable PROM (EPROM), and Electrically EPROM (EEPROM) memory. Examples of volatile memory may include but are not limited to Dynamic Random Access Memory (DRAM), and Static Random-Access memory (SRAM). The memory 810 may also store various sample data (e.g. sample identification ID) that may be captured, processed, and/or required by the analyzing system 800. The analyzing system 100 may further include a display 812. The system 100 may interact with a user via a user interface 814 accessible via the display 812.

[046] Referring back to FIGs. 1 -2, it should be noted that predetermined docking time-duration may be the longest of the test-station time durations associated with the plurality of test-stations 118. For example, if the sample is subjected to the testing operation of heating for longest time-duration (e.g. 2 minutes) as compared to the timeduration for other testing-stations (which are less than 2 minutes), then the predetermined docking time-duration may be this longest time-duration (i.e. 2 minutes) for which the sample 102 is subjected to the testing operation of heating. As will be understood, the sample 102 may be docked at each testing-station for the same period of time.

[047] Further, in some embodiments, the size of at least one of the testing stations 118 may be extendable. For example, when the sample 102 is required to be subjected to heat at the third testing station 118-3 for a longer duration as compared to testing-station time duration associated with the other testing-stations like the third testing-station 1 18-3 (dusty environment), then in such cases, instead of increasing the time duration associated with the fourth testing-station 118-4 (heating environment), the size of the fourth testing-station 118-4 may be increased (e.g. make the size of the fourth testing station 118-4 as much as double of the third testing station 118-3), to thereby increase the overall testing speed. Alternately, the intensity of heat applied at the fourth testing-station 118-4 may be increased instead of duration or which the heat is applied. [048] Further, it should be noted that the simulated environments created by the testing-stations 118-1 to 1 18-6 may be tunable, for example to simulate the change in seasons. As will be understood, since the sample (e.g. solar panel samples) may be subjected to different environmental conditions in different seasons over the year, the testing-stations 118-1 to 118-6 may be tuned to replicate the change in seasons. As such, for example, a certain number of cycles may be performed based on the actual conditions corresponding to summer season, and after that, a certain number of cycles may be performed based on the actual conditions corresponding to spring season, winter season, autumn season, and so on.

[049] In some embodiments, as shown in FIGs. 1 -2, each of the plurality of testing-stations 118 may be configured as a beam structure 120. The beam structure 120 may include a first support base 122 positioned away from the testing-platform 104 and a second support base 124 positioned at the center 108 of the testing-platform 104. For example, first support base 122 and the second support base 124 may include vertical members supporting on which the respective testing-station can be supported. To this end, one or more horizontal members may also be used attached to the first support base 122 and the second support base 124, to form a platform over which the respective testing-station can be supported.

[050] In alternate embodiments, as later shown in and explained via FIGs. 4-5, each of the plurality of testing-stations 118 may be configured as a beam structure which may include a first support base positioned away from the testing-platform 104 and a second support base 124 positioned at the center 108 of the testing-platform 104. However, the second support base 124 in these embodiments may act as a common second support base 124, through which all the testing-stations are supported.

[051] In some other alternate embodiments, as later shown and explained via in FIGs. 6-7, each of the plurality of testing-stations 118 may be configured as a cantilever structure which may include a first support base positioned away from the testing-platform 104. However, there is no second support base in these embodiments.

[052] In some embodiments, each of the testing-stations 118-1 to 118-8 may be attached to each of its adjacent testing-platform via an associated wall 126. Further, each associated wall 126 may include a passage 128 configured to allow transitioning of the sample 102 mounted on the respective solar panel sample holder 106 therethrough. Further, in some embodiments, the passage 128 may include a door 130. Each of the testing-stations 118-1 to 118-8 may further include a ceiling, and as such the ceiling along with the wall 126 and the door 130 may form a controlled-environment space.

[053] The door 130 may be configured to close to confine the sample 102 mounted on the respective solar panel sample holder 106 within the controlled- environment of the respective testing-station 118, when the associated sample holder 106 is docked at the respective testing-station 118 to perform the testing operation. Further, the door 130 may be configured to open to allow the transitioning of the sample 102 mounted on the respective solar panel sample holder 106, once the testing operation is completed on the sample 102. To this end, the door 130 may be hinged to the wall 126 along the passage 128, such that the door 130 may rotate about the hinge to assume the open or closed position. [054] In some embodiments, as shown in FIG. 3, each of the plurality of testingstations may be attached to each of their adjacent testing-station. In other words, every two adjacent testing-stations of the testing-stations may have a wall in common. As such, these adjacent testing-stations may also have a passage and door in common. This embodiment, therefore, may allow to reduce the number of components, thereby making the overall structure simpler.

[055] Referring now to FIG. 3, a top view of a system 300 for cycling testing of one or more samples is illustrated, in accordance with some embodiments. In some embodiments, the system 300 may include a testing-platform 304 similar to the testingplatform 104 which is already explained in detail via FIGs. 1 -2. The testing-platform 304 may further include a plurality of sample holders 306 (hereinafter, collectively or individually referred to as plurality of sample holders 306). In some embodiments, as shown in FIG. 3, the testing-platform 304 may include eight sample holders 306 (as represented by one sample holder 306) which may be equally spaced from each other and oriented to be facing the axis Y-Y’.

[056] Each of the plurality of sample holders 306 may be configured to receive an associated sample 302 to be tested. The sample 302, for example, may include a solar panel sample. The testing-platform 304 may be rotatable about an axis Y-Y’. During the rotation of the testing-platform 304, the plurality of sample holders 306 may be displaced along a common trajectory T. In other words, as the testing-platform 304 rotates, the plurality of sample holders 306 may also rotate about the same axis Y-Y’. In order to rotate the testing-platform 304, the system may include a motor 310 which may be coupled with the testing-platform 304 via a friction wheel 312 and a friction surface 314. The system 300 may further include at least two idle wheels (not shown in FIG. 3) similar to the idle wheels 116-1 , 1 16-2 configured to support testing-platform 304 against wobbling.

[057] The system 300 may further include a plurality of testing-stations 318-1 , 318-2, ... and so on. In some embodiments, as shown in FIG. 3, the system 300 may include eight testing-stations 318-1 , 318-2, ... 318-8 (hereinafter, collectively or individually referred to as plurality of testing-stations 318). Each of the plurality of testingstations 318 may be positioned in proximity to the testing-platform 304 and the common trajectory T. The plurality of testing-stations 318 may be spaced equally from each other. Further, the plurality of testing-stations 318 may be oriented so as be facing the axis Y- Y’.

[058] As mentioned above, the plurality of testing-stations 318 may include one or more of a set of simulated environment testing-stations (corresponding to the set of simulated environment testing-stations 1 18-1 to 118-6). The set of simulated environment testing-stations may include at least one testing-station 318-1 configured to create a simulated condensate deposition environment, at least one testing-station 318-2 configured to create a simulated wind-borne dust deposition environment, at least one testing-station 318-3 configured to create a simulated dusty environment, and at least one testing-station 318-4 configured to create a simulated hot environment. Additionally, the set of simulated environment testing-stations may further include at least one testingstation 318-5 configured to create a pressure environment and at least one testing-station 318-6 configured to create a sun-lit environment. For example, the at least one testingstation 318-6 configured to create the sun-lit environment may subject the sample 302 to different types of radiations mimicking the solar radiations including ultra-violet (UV) radiations, infra-red (IR)radiations, etc.

[059] The plurality of testing-stations 318 may further include at least one cleaning testing-station 318-7 configured to clean the sample 302 and at least one inspection testing-station 318-8 configured to obtain data associated with the sample 302. The at least one cleaning testing-station 318-7 may include, for example, a cleaning brush, and in particularly, a robotic cleaning brush. The cleaning brush may to rotate on its axis (X-X’) as the sample 302 moves underneath it. The inspection testing-station 318- 8 may obtain image of the sample 302 using an imaging device, or determine an amount of obscuring of the sample 302 caused by dust and/or scratches over time, using a transmissivity sensor. As such, the plurality of testing-stations 318 may be configured to simulate various environmental conditions and intervening actions (like cleaning and inspecting) and cyclically inspecting the samples, at accelerated frequency.

[060] When an associated sample holder is docked at or is transitioning via a respective testing-station of the plurality of testing-stations, each of the plurality of testingstations may perform a testing operation on the sample to be tested. For example, each of the testing-stations 318-1 to 318-6 and 318-8 may perform a respective testing operation on the sample to be tested when the associated sample holder is docked at the testing-stations. Upon docking of a sample holder of the plurality of sample holders 306 at a test-station of the test-stations 318-1 to 318-6 and 318-8, the respective test-station may perform the testing operation for an associated testing-station time-duration. However, the testing-stations 318-7 (cleaning brush) may perform the respective cleaning operation on the sample to be tested when the associated sample holder is transitioning through the testing-stations 318-7. This is because while the testing operations of the testing-stations 318-1 to 318-6 and 318-8 may be performed while the sample is stationary, the testing-stations 318-7 (cleaning brush) may require a relative movement between the cleaning brush and the sample to be tested to simulate the actual condition.

[061] In some embodiments, as shown in FIG. 3, each of the testing-stations 318-1 to 318-8 may be attached to each of its adjacent testing-platform via an associated wall 326. Further, each associated wall 326 include a passage (not shown in FIG. 3) configured to allow transition of the sample 302 mounted on the respective solar panel sample holder 306 therethrough. Further, in some embodiments, the passage may include a door 330. Each of the testing-stations 318-1 to 318-8 may further include a ceiling, and as such the ceiling along with the wall 326 and the door 330 may form a controlled-environment space.

[062] The door 330 may be configured to close to confine the sample 302 mounted on the respective solar panel sample holder 306 within the controlled- environment of the respective testing-station 318, when the associated sample holder 306 may be is docked at the respective testing-station 318 to perform the testing operation. Further, the door 330 may be configured to open to allow the transitioning of the sample 302 mounted on the respective solar panel sample holder 306, once the testing operation is completed on the sample 302 under test. To this end, the door 330 may be hinged to the wall 326 along the passage, such that the door 330 may rotate about the hinge to assume the open or closed position. In some alternate embodiments, the door 330 may be attached to the wall 326 via two sliders which form the two ends (for example, one at the top and one at the bottom), and as such that the closing and opening of the door 330 may be performed by way of sliding of the door 330 relative to the two sliders.

[063] In some embodiments, each of the testing-stations 318-1 to 318-8 may be attached to each to their adjacent testing-station. In other words, every two adjacent testing-stations of the testing-stations 318-1 to 318-8 may have a wall 326 in common. As such, these adjacent testing-stations may also have a passage and door 330 in common. This embodiment, therefore, may allow to reduce the number of components (i.e. walls 326 and doors 330), thereby making the overall structure simpler.

[064] Referring now to FIGs. 4-5, a perspective view and a top view, respectively, of a system 400 for cycling testing of one or more samples with a common second support base is illustrated, in accordance with another embodiment. As already mentioned above, the system 400 may include a circular testing-platform 404, in particularly a disc-shaped testing-platform 404 defining a central void section at the center 408. The testing-platform 404 may include a plurality of sample holders 406, and in particularly, eight sample holders 406. As already mentioned above, the testing-platform 404 may be rotatable about an axis Y-Y’, by a motor 410 which may be coupled with the testing-platform 404 via a friction wheel 412 and a friction surface 414. The system 400 may further include at least two idle wheels 416-1 , 416-2 configured to support testingplatform 404 against wobbling. The at least two idle wheels 416-1 , 416-2 may be positioned at 120° to the friction wheel 412, to properly balance against the pressing force of the friction wheel 412.

[065] The system 400 may further include a plurality of testing-stations 418, similar to those explained in conjunction with FIGs. 1 -3. Each of the plurality of testing- stations 418 may be configured as a beam structure 420. The beam structure 420 may include a first support base 422 positioned away from the testing-platform 404 and a second support base 424 positioned at the center 408 of the testing-platform 404. The second support base 424 may act as a common second support base, through which all the testing-stations 418 are supported. The second support base 424 may include a single vertical member at the center and may include supporting means to hold and support the plurality of testing-stations 418. In some embodiments, a plurality of slots 432 may be provided on circumferential surface of the common second support base 424 (vertical member) to support beam structure 420. Alternatively, a supporting protrusion may be provided like a collar around the circumferential surface of this common second support base 424 (vertical member), which may act as a second support for respective testing stations 418.

[066] In some embodiments, each of the testing-stations 418-1 to 418-8 may be separated from its adjacent testing-platform by a gap, as shown in FIGs. 4-5. However, in some alternate embodiments, each of the testing-stations 418-1 to 418-8 may be attached to each of its adjacent testing-platform via an associated wall 426. Further, each associated wall 426 may include a passage 428 configured to allow transition of the sample 402 mounted on the respective solar panel sample holder 106 therethrough. Further, in some embodiments, the passage 428 may include a door 430. The door 430 may be configured to close to confine the sample 402 mounted on the respective sample holder 406 within the controlled-environment of the respective testing-station 418, when the associated sample holder 406 is docked at the respective testing-station 418 to perform the testing operation. Further, the door 430 may be configured to open to allow the transitioning of the sample 402 mounted on the respective solar panel sample holder 406, once the testing operation is completed on the sample 402.

[067] Referring now to FIGs. 6-7, a perspective view and a top view, respectively, of a system 600 for cycling testing of one or more sample is illustrated, in accordance with another embodiment. The system 600 may include a circular testingplatform 604. The circular testing-platform 604 may be configured in either like a discshaped testing-platform defining a central void section at the center, or like a solid circular surface (i.e. without any central void section). The testing-platform 604 may include a plurality of sample holders 606, and in particularly, eight sample holders 606. Each of the plurality of sample holders 606 may be configured to receive a sample 602 to be tested. The testing-platform 604 may be rotatable about an axis Y-Y’, by a motor 610 which may be coupled with the testing-platform 604 via a friction wheel 612 and a friction surface 614. At least two idle wheels 616-1 , 616-2 may be provided to support the testing-platform 604 against wobbling.

[068] The system 600 may further include a plurality of testing-stations 618, similar to those explained in conjunction with FIGs. 1 -5. Each of the plurality of testingstations 618 may be configured as a cantilever beam structure 620 which may only include a first support base 622 positioned away from the testing-platform 604. The beam structure 620 is not supported at another end. In some embodiments, the length of the testing station may be within a range of 2 meters to 2.5 meters. As will be understood, the cantilever beam structure 620 is compatible with both the configurations of the rotating platform 604, i.e. one having the central void section at the center and the one having the solid circular surface (i.e. without any central void section). [069] In some embodiments, as explained in FIGs. 1 -2, each of the testingstations 618-1 to 618-8 may be separated from its adjacent testing-platforms by a gap. Further, in some embodiments, as explained in FIG. 3, each of the testing-stations 618- 1 to 618-8 may be attached to each of its adjacent testing-platform via an associated wall 626.

[070] It should be noted that in some alternate embodiments, the system for cyclic testing of a sample may be implemented by a track and carriage system instead of the rotating testing-platform. For example, referring now to FIG. 9, a schematic diagram of a system 900 for cyclic testing of a sample is illustrated, in accordance with some alternate embodiments. The system 900 may include a track 902 and a carriage 904, such that the carriage 904 is configured to the travel on the track 902. The carriage 904 may include at least one sample holders 906 which may be configured to receive a sample 908 to be tested. The sample 908, as mentioned above, may include a solar panel sample. The carriage 904 may move over the track 902 to be thereby displaced over a periphery defined by the track 902.

[071] The system 900 may further include a plurality of testing-stations 910 positioned in proximity to the track 902 and the periphery defined by the track 902. The plurality of testing-stations 910 may be similar to the plurality of testing-stations 118 as explained above. During movement of the carriage 904, the carriage 904 may dock at each of the plurality of testing-stations 910 for a predetermined docking time-duration. Further, each of the plurality of testing-stations 910 may be configured to perform a testing operation on the sample to be tested, when the carriage 904 (and therefore the sample holder 906) is docked at or is transitioning via a respective testing-station of the plurality of testing-stations 910.

[072] The track 902 may be configured in a circular profile, as is illustrated in FIG. 9. However, alternate configurations of the track 902 may be possible as well. For example, the track 902 may be configured in a polygonal, ovular, or any random closed loop configuration. As will be appreciated, it may be desirable to have a closed loop configuration of the track 902 so as to allow effective and easy repeatability of the movement of the carriage 904 relative to the plurality of testing-stations 910 and cyclic testing of the sample 908.

[073] Further, in some embodiments, multiple carriages 904 may be implemented at the same time, each of the multiple carriages 904 configured to carry a sample 908. For example, as shown in FIG. 9, the system 900 may include eight testingstations 910 and one carriage 904. However, the system 900 may include eight testingstations 910 as many as eight carriages 904 at the same time. The multiple carriages 904 may move in synchronization with each other.

[074] Referring now to FIG. 10, a flowchart of a method 1000 of cycling testing of a solar panel sample is illustrated, in accordance with some embodiment of the present disclosure. The method is explained in conjunction with FIGs. 1 -8.

[075] At step 1002, the solar panel sample 102 may be received on an associated solar panel sample holder of the plurality of solar panel sample holders 106. Each of the plurality of solar panel sample holders 106 may be disposed on the testingplatform 104, and each of the solar panel sample holders 106 may be configured to receive the respective solar panel sample 102 to be tested. The testing-platform 104 may be rotatable about the axis Y-Y’, and during rotation of the testing-platform 104, the plurality of solar panel sample holders 106 are displaced along a common trajectory T. The plurality of testing-stations 118 are positioned in proximity to the testing-platform 104 and the common trajectory T. The plurality of testing-stations 118 as already explained above.

[076] At step 1004, the testing-platform 104 may be rotated about the axis Y-Y’ by a predetermined angular displacement to dock each of the plurality of solar panel sample holders 106 at each of the plurality of testing-stations 118 for a predetermined docking time-duration. For example, the predetermined docking time-duration may be the longest of the test-station time durations associated with the plurality of test-stations 1 18. At step 1006, each of the plurality of testing-stations 118 may be triggered to perform a testing operation on the solar panel sample 102 to be tested, when an associated solar panel sample holder 106 is docked at a respective testing-station of the plurality of testingstations 1 18. Upon docking of a solar panel sample holder of the plurality of solar panel sample holders 106 at a test-station of the plurality of test-stations 118, the test station may be triggered to perform the testing operation for an associated testing-station timeduration.

[077] At step 1008, data associated with the solar panel sample under test may be received by the at least one inspection testing-station. The data may be obtained over a plurality of cycles of the solar panel sample docking at the at least one inspection testing-station. At step 1010, the plurality of images of the solar panel sample may be analyzed to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne deposition environment, the simulated dusty environment, the simulated hot environment, the simulated pressure environment, the simulated sun-lit environment.

[078] It is intended that the disclosure and examples be considered as exemplary only, with a true scope and spirit of disclosed embodiments being indicated by the following claims.

[079] It is intended that the disclosure and examples be considered as exemplary only, with a true scope and spirit of disclosed embodiments being indicated by the following claims.

Claims

CLAIMS WHAT IS CLAIMED IS:

1 . A system for cyclic testing of a sample, the system comprising: a testing-platform, comprising: a plurality of sample holders, each of the plurality of sample holders configured to receive a sample to be tested; wherein the testing-platform is rotatable about an axis, and wherein during rotation of the testing-platform, the plurality of sample holders are displaced along a common trajectory; and a plurality of testing-stations positioned in proximity to the testing-platform and the common trajectory, wherein each of the plurality of sample holders is docked at each of the plurality of testing-stations for a predetermined docking time-duration, and wherein each of the plurality of testing-stations is configured to perform a testing operation on the sample to be tested, when an associated sample holder is docked at or is transitioning via a respective testing-station of the plurality of testing-stations.

2. The system of claim 1 , wherein, upon docking of a sample holder of the plurality of sample holders at a test-station of the plurality of test-stations, the test station performs the testing operation for an associated testing-station time-duration, and wherein the predetermined docking time-duration is the longest of a plurality of test-station time durations associated with the plurality of test-stations.

3. The system of claim 1 , wherein the testing-platform comprises: a top surface having a circular profile, wherein the plurality of sample holders are positioned on the top surface, each of the plurality of sample holders being configured to receive a sample.

4. The system of claim 1 , wherein the plurality of testing-stations comprises: one or more of a set of simulated environment testing-stations, wherein the set of simulated environment testing-stations comprises: at least one testing-station configured to create a simulated condensate deposition environment; at least one testing-station configured to create a simulated wind-borne deposition environment; at least one testing-station configured to create a simulated dusty environment; at least one testing-station configured to create a simulated hot environment; at least one testing-station configured to create a simulated pressure environment; and at least one testing-station configured to create a simulated sun-lit environment; at least one cleaning testing-station configured to clean the sample under test, using a robotic cleaning brush; and at least one inspection testing-station configured to obtain data associated with the sample under test.

5. The system of claim 4, wherein the at least one testing-station configured to create the simulated condensate deposition environment is to spray a predetermined quantity of the water on the sample under test.

6. The system of claim 4, wherein the at least one testing-station configured to create the simulated wind-borne deposition environment is to blow air at a predetermined speed at the sample under test.

7. The system of claim 4, wherein the at least one testing-station configured to create the simulated hot environment is to apply heat to the sample under test, via one of convection-based heating and radiation-based heating process.

8. The system of claim 4, wherein the at least one testing-station configured to create the simulated dusty environment is to dispense on the sample under test a predetermined quantity of particulate matter, via a sieve.

9. The system of claim 4, wherein the at least one inspection testing-station is configured to obtain data associated with the sample under test by one of: obtaining an image of the sample under test, using a microscope-based imaging device, or detecting obscuring of the sample caused by dust or scratches, using a transmissivity sensor.

10. The system of claim 4, further comprising: an analyzing device communicatively coupled with the at least one inspection testing-station, the analyzing device comprising: a processor; and a memory communicatively coupled with the processor and storing processor-executable instructions, which on execution by the processor, cause the processor to: receive the data associated with the sample from the at least one inspection testing-station, wherein the data is obtained over a plurality of cycles of the sample docking at the at least one inspection testing-station; and analyze the data associated with the sample to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne deposition environment, the simulated dusty environment, the simulated hot environment, the simulated pressure environment, and the simulated sun-lit environment.

11 . The system of claim 1 , wherein the testing-platform rotates about the axis at a predefined frequency corresponding to a number of testing stations.

12. The system of claim 1 , wherein each of the plurality of testing-platforms is attached to each of its adjacent testing-platform via an associated wall, and wherein each associated wall comprises a passage configured to allow transition of the sample mounted on the respective sample holder therethrough, and wherein the passage comprises a door.

13. The system of claim 12, wherein the door is configured to close to confine the sample mounted on the respective sample holder within a controlled-environment of the respective testing station, when the associated sample holder is docked at the respective testing-station to perform the testing operation, and wherein the door is configured to open to allow the transition of the sample mounted on the respective sample holder, once the testing operation is completed on the sample under test.

14. The system of claim 12, wherein each of the plurality of testing-stations is configured as a beam structure comprising: a first support base positioned away from the testing-platform; and a second support base positioned at the center of the testing-platform, wherein the testing-platform is configured in a disc shape defining a central hole.

15. The system of claim 12, wherein each of the plurality of testing-stations is configured as a cantilever structure comprising: a first support base positioned away from the testing-platform, wherein the testing station extends towards the center of the testing-platform.

16. The system of claim 1 , wherein the testing-platform comprises: an electric motor coupled to the testing-platform via a friction wheel attached to the electric motor and a friction surface defined along an edge of the testing-platform; and at least two idle wheels configured to support testing-platform against wobbling.

17. A method of cycling testing of a solar panel sample, the method comprising: receiving a solar panel sample on an associated solar panel sample holder of a plurality of solar panel sample holders, each of the plurality of solar panel sample holders being disposed on a testing-platform, and each of the solar panel sample holders being configured to receive the respective solar panel sample to be tested, wherein the testing-platform is rotatable about an axis, and wherein during rotation of the testing-platform, the plurality of solar panel sample holders are displaced along a common trajectory, and wherein a plurality of testing-stations are positioned in proximity to the testing-platform and the common trajectory, rotating the testing-platform about the axis by a predetermined angular displacement, to dock each of the plurality of solar panel sample holders at each of the plurality of testing-stations for a predetermined docking time-duration; and triggering each of the plurality of testing-stations is to cyclically perform a testing operation on the solar panel sample to be tested, when an associated solar panel sample holder is docked at a respective testing-station of the plurality of testing-stations.

18. The method of claim 17, wherein, upon docking of a solar panel sample holder of the plurality of solar panel sample holders at a test-station of the plurality of test-stations, the test-station is triggered to perform the testing operation for an associated testing-station time-duration, and wherein the predetermined docking time-duration is the longest of a plurality of test-station time durations associated with the plurality of test-stations.

19. The method of claim 17, wherein the plurality of testing-stations comprises: one or more of a set of simulated environment testing-stations, wherein the set of simulated environment testing-stations comprises: at least one testing-station configured to create a simulated condensate deposition environment; at least one testing-station configured to create a simulated wind-borne deposition environment; at least one testing-station configured to create a simulated dusty environment; at least one testing-station configured to create a simulated hot environment; at least one testing-station configured to create a simulated pressure environment; and at least one testing-station configured to create a simulated sun-lit environment; at least one cleaning testing-station configured to clean the sample under test, using a robotic cleaning brush; and at least one inspection testing-station configured to obtain data associated with the sample under test.

20. The method of claim 17, further comprising: receiving data associated with the sample from the at least one inspection testing-station, wherein the data is obtained over a plurality of cycles of the sample docking at the at least one inspection testing-station; and analyzing the data associated with the sample to determine an effect of the cleaning action and at least one of: the simulated condensate deposition environment, the simulated wind-borne deposition environment, the simulated dusty environment, the simulated hot environment, the simulated pressure environment, and the simulated sunlit environment.