WO2024053722A1 - Polymer, composition, cured product, and display element - Google Patents
Polymer, composition, cured product, and display element Download PDFInfo
- Publication number
- WO2024053722A1 WO2024053722A1 PCT/JP2023/032771 JP2023032771W WO2024053722A1 WO 2024053722 A1 WO2024053722 A1 WO 2024053722A1 JP 2023032771 W JP2023032771 W JP 2023032771W WO 2024053722 A1 WO2024053722 A1 WO 2024053722A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- independently
- group
- alkali
- integer
- formula
- Prior art date
Links
- 239000000203 mixture Substances 0.000 title claims abstract description 106
- 229920000642 polymer Polymers 0.000 title claims abstract description 77
- 125000003118 aryl group Chemical group 0.000 claims abstract description 39
- 150000001875 compounds Chemical class 0.000 claims description 140
- 125000000962 organic group Chemical group 0.000 claims description 95
- 229910052731 fluorine Inorganic materials 0.000 claims description 42
- 125000001153 fluoro group Chemical group F* 0.000 claims description 42
- 125000000217 alkyl group Chemical group 0.000 claims description 35
- 125000004430 oxygen atom Chemical group O* 0.000 claims description 32
- 239000002253 acid Substances 0.000 claims description 27
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 22
- 125000004434 sulfur atom Chemical group 0.000 claims description 22
- 229910052717 sulfur Inorganic materials 0.000 claims description 21
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 17
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims description 10
- 239000003513 alkali Substances 0.000 claims description 8
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 8
- 125000004433 nitrogen atom Chemical group N* 0.000 claims description 8
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 4
- 125000006615 aromatic heterocyclic group Chemical group 0.000 abstract 2
- 239000010408 film Substances 0.000 description 98
- -1 alkali metal bicarbonates Chemical class 0.000 description 54
- 125000004432 carbon atom Chemical group C* 0.000 description 52
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 43
- 239000002904 solvent Substances 0.000 description 32
- 150000002430 hydrocarbons Chemical group 0.000 description 31
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 27
- 238000000034 method Methods 0.000 description 27
- 239000000758 substrate Substances 0.000 description 26
- 239000000243 solution Substances 0.000 description 25
- 239000000047 product Substances 0.000 description 24
- 229920005989 resin Polymers 0.000 description 24
- 239000011347 resin Substances 0.000 description 24
- 238000011156 evaluation Methods 0.000 description 20
- 229910052757 nitrogen Inorganic materials 0.000 description 19
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 18
- 238000000576 coating method Methods 0.000 description 17
- 239000003431 cross linking reagent Substances 0.000 description 17
- 230000035945 sensitivity Effects 0.000 description 17
- 230000015572 biosynthetic process Effects 0.000 description 16
- 239000011248 coating agent Substances 0.000 description 15
- 239000000178 monomer Substances 0.000 description 15
- 238000003786 synthesis reaction Methods 0.000 description 15
- 125000005843 halogen group Chemical group 0.000 description 14
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 13
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 13
- 239000007864 aqueous solution Substances 0.000 description 12
- 239000007787 solid Substances 0.000 description 12
- 125000003710 aryl alkyl group Chemical group 0.000 description 10
- 125000002102 aryl alkyloxo group Chemical group 0.000 description 10
- 125000004104 aryloxy group Chemical group 0.000 description 10
- 238000005452 bending Methods 0.000 description 10
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 10
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 9
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 9
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 239000000654 additive Substances 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 9
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 9
- 239000003999 initiator Substances 0.000 description 9
- 239000004094 surface-active agent Substances 0.000 description 9
- 238000002834 transmittance Methods 0.000 description 9
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 8
- KYQCOXFCLRTKLS-UHFFFAOYSA-N Pyrazine Chemical compound C1=CN=CC=N1 KYQCOXFCLRTKLS-UHFFFAOYSA-N 0.000 description 8
- 125000002252 acyl group Chemical group 0.000 description 8
- 125000004423 acyloxy group Chemical group 0.000 description 8
- 125000002723 alicyclic group Chemical group 0.000 description 8
- 125000003545 alkoxy group Chemical group 0.000 description 8
- 125000003277 amino group Chemical group 0.000 description 8
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 8
- 125000004093 cyano group Chemical group *C#N 0.000 description 8
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 8
- 238000011161 development Methods 0.000 description 8
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 8
- 238000006116 polymerization reaction Methods 0.000 description 8
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 125000001424 substituent group Chemical group 0.000 description 7
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229920001721 polyimide Polymers 0.000 description 6
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 5
- WTQZSMDDRMKJRI-UHFFFAOYSA-N 4-diazoniophenolate Chemical group [O-]C1=CC=C([N+]#N)C=C1 WTQZSMDDRMKJRI-UHFFFAOYSA-N 0.000 description 5
- GZVHEAJQGPRDLQ-UHFFFAOYSA-N 6-phenyl-1,3,5-triazine-2,4-diamine Chemical group NC1=NC(N)=NC(C=2C=CC=CC=2)=N1 GZVHEAJQGPRDLQ-UHFFFAOYSA-N 0.000 description 5
- 239000004642 Polyimide Substances 0.000 description 5
- 125000001931 aliphatic group Chemical group 0.000 description 5
- 150000001339 alkali metal compounds Chemical class 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 125000005842 heteroatom Chemical group 0.000 description 5
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical group NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 5
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 5
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 4
- XJPZKYIHCLDXST-UHFFFAOYSA-N 4,6-dichloropyrimidine Chemical compound ClC1=CC(Cl)=NC=N1 XJPZKYIHCLDXST-UHFFFAOYSA-N 0.000 description 4
- WFCQTAXSWSWIHS-UHFFFAOYSA-N 4-[bis(4-hydroxyphenyl)methyl]phenol Chemical compound C1=CC(O)=CC=C1C(C=1C=CC(O)=CC=1)C1=CC=C(O)C=C1 WFCQTAXSWSWIHS-UHFFFAOYSA-N 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 4
- PCNDJXKNXGMECE-UHFFFAOYSA-N Phenazine Natural products C1=CC=CC2=NC3=CC=CC=C3N=C21 PCNDJXKNXGMECE-UHFFFAOYSA-N 0.000 description 4
- CZPWVGJYEJSRLH-UHFFFAOYSA-N Pyrimidine Chemical compound C1=CN=CN=C1 CZPWVGJYEJSRLH-UHFFFAOYSA-N 0.000 description 4
- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 4
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 4
- 229910052783 alkali metal Inorganic materials 0.000 description 4
- XJHCXCQVJFPJIK-UHFFFAOYSA-M caesium fluoride Chemical compound [F-].[Cs+] XJHCXCQVJFPJIK-UHFFFAOYSA-M 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- 238000001914 filtration Methods 0.000 description 4
- 125000000524 functional group Chemical group 0.000 description 4
- 229910052736 halogen Inorganic materials 0.000 description 4
- 150000002367 halogens Chemical class 0.000 description 4
- 125000002950 monocyclic group Chemical group 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 229920005575 poly(amic acid) Polymers 0.000 description 4
- 125000003367 polycyclic group Chemical group 0.000 description 4
- SCVFZCLFOSHCOH-UHFFFAOYSA-M potassium acetate Chemical compound [K+].CC([O-])=O SCVFZCLFOSHCOH-UHFFFAOYSA-M 0.000 description 4
- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 4
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 4
- LWIHDJKSTIGBAC-UHFFFAOYSA-K tripotassium phosphate Chemical compound [K+].[K+].[K+].[O-]P([O-])([O-])=O LWIHDJKSTIGBAC-UHFFFAOYSA-K 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- RFFLAFLAYFXFSW-UHFFFAOYSA-N 1,2-dichlorobenzene Chemical compound ClC1=CC=CC=C1Cl RFFLAFLAYFXFSW-UHFFFAOYSA-N 0.000 description 3
- BTTNYQZNBZNDOR-UHFFFAOYSA-N 2,4-dichloropyrimidine Chemical compound ClC1=CC=NC(Cl)=N1 BTTNYQZNBZNDOR-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- 101100322581 Caenorhabditis elegans add-1 gene Proteins 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical compound C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 3
- 229920000877 Melamine resin Polymers 0.000 description 3
- WTKZEGDFNFYCGP-UHFFFAOYSA-N Pyrazole Chemical compound C=1C=NNC=1 WTKZEGDFNFYCGP-UHFFFAOYSA-N 0.000 description 3
- 239000007822 coupling agent Substances 0.000 description 3
- 238000004132 cross linking Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 239000011148 porous material Substances 0.000 description 3
- 229910000027 potassium carbonate Inorganic materials 0.000 description 3
- 235000011181 potassium carbonates Nutrition 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000011343 solid material Substances 0.000 description 3
- 229910021642 ultra pure water Inorganic materials 0.000 description 3
- 239000012498 ultrapure water Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- CNJRPYFBORAQAU-UHFFFAOYSA-N 1-ethoxy-2-(2-methoxyethoxy)ethane Chemical compound CCOCCOCCOC CNJRPYFBORAQAU-UHFFFAOYSA-N 0.000 description 2
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 2
- OMRXVBREYFZQHU-UHFFFAOYSA-N 2,4-dichloro-1,3,5-triazine Chemical compound ClC1=NC=NC(Cl)=N1 OMRXVBREYFZQHU-UHFFFAOYSA-N 0.000 description 2
- AMEVJOWOWQPPJQ-UHFFFAOYSA-N 2,4-dichloro-6-phenyl-1,3,5-triazine Chemical compound ClC1=NC(Cl)=NC(C=2C=CC=CC=2)=N1 AMEVJOWOWQPPJQ-UHFFFAOYSA-N 0.000 description 2
- LSEAAPGIZCDEEH-UHFFFAOYSA-N 2,6-dichloropyrazine Chemical compound ClC1=CN=CC(Cl)=N1 LSEAAPGIZCDEEH-UHFFFAOYSA-N 0.000 description 2
- FZXRXKLUIMKDEL-UHFFFAOYSA-N 2-Methylpropyl propanoate Chemical compound CCC(=O)OCC(C)C FZXRXKLUIMKDEL-UHFFFAOYSA-N 0.000 description 2
- UHIDYCYNRPVZCK-UHFFFAOYSA-N 2-amino-4-[2-(3-amino-4-hydroxyphenyl)propan-2-yl]phenol Chemical compound C=1C=C(O)C(N)=CC=1C(C)(C)C1=CC=C(O)C(N)=C1 UHIDYCYNRPVZCK-UHFFFAOYSA-N 0.000 description 2
- UYEMGAFJOZZIFP-UHFFFAOYSA-N 3,5-dihydroxybenzoic acid Chemical compound OC(=O)C1=CC(O)=CC(O)=C1 UYEMGAFJOZZIFP-UHFFFAOYSA-N 0.000 description 2
- HCFAJYNVAYBARA-UHFFFAOYSA-N 4-heptanone Chemical compound CCCC(=O)CCC HCFAJYNVAYBARA-UHFFFAOYSA-N 0.000 description 2
- 125000004203 4-hydroxyphenyl group Chemical group [H]OC1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 229930185605 Bisphenol Natural products 0.000 description 2
- GIXXQTYGFOHYPT-UHFFFAOYSA-N Bisphenol P Chemical compound C=1C=C(C(C)(C)C=2C=CC(O)=CC=2)C=CC=1C(C)(C)C1=CC=C(O)C=C1 GIXXQTYGFOHYPT-UHFFFAOYSA-N 0.000 description 2
- 101100322583 Caenorhabditis elegans add-2 gene Proteins 0.000 description 2
- YXHKONLOYHBTNS-UHFFFAOYSA-N Diazomethane Chemical class C=[N+]=[N-] YXHKONLOYHBTNS-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- KWYHDKDOAIKMQN-UHFFFAOYSA-N N,N,N',N'-tetramethylethylenediamine Chemical compound CN(C)CCN(C)C KWYHDKDOAIKMQN-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- VMHLLURERBWHNL-UHFFFAOYSA-M Sodium acetate Chemical compound [Na+].CC([O-])=O VMHLLURERBWHNL-UHFFFAOYSA-M 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 2
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- MTHSVFCYNBDYFN-UHFFFAOYSA-N anhydrous diethylene glycol Natural products OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 2
- 239000003963 antioxidant agent Substances 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- ZFVMWEVVKGLCIJ-UHFFFAOYSA-N bisphenol AF Chemical compound C1=CC(O)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(O)C=C1 ZFVMWEVVKGLCIJ-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 239000002981 blocking agent Substances 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N butyl acetate Chemical compound CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- JHRWWRDRBPCWTF-OLQVQODUSA-N captafol Chemical class C1C=CC[C@H]2C(=O)N(SC(Cl)(Cl)C(Cl)Cl)C(=O)[C@H]21 JHRWWRDRBPCWTF-OLQVQODUSA-N 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 125000001309 chloro group Chemical group Cl* 0.000 description 2
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 2
- 230000018044 dehydration Effects 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N ethylene glycol monomethyl ether acetate Natural products COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- 125000000219 ethylidene group Chemical group [H]C(=[*])C([H])([H])[H] 0.000 description 2
- 239000000706 filtrate Substances 0.000 description 2
- 125000001188 haloalkyl group Chemical group 0.000 description 2
- 230000026030 halogenation Effects 0.000 description 2
- 238000005658 halogenation reaction Methods 0.000 description 2
- CATSNJVOTSVZJV-UHFFFAOYSA-N heptan-2-one Chemical compound CCCCCC(C)=O CATSNJVOTSVZJV-UHFFFAOYSA-N 0.000 description 2
- NGAZZOYFWWSOGK-UHFFFAOYSA-N heptan-3-one Chemical compound CCCCC(=O)CC NGAZZOYFWWSOGK-UHFFFAOYSA-N 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- MLFHJEHSLIIPHL-UHFFFAOYSA-N isoamyl acetate Chemical compound CC(C)CCOC(C)=O MLFHJEHSLIIPHL-UHFFFAOYSA-N 0.000 description 2
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 2
- XGZVUEUWXADBQD-UHFFFAOYSA-L lithium carbonate Chemical compound [Li+].[Li+].[O-]C([O-])=O XGZVUEUWXADBQD-UHFFFAOYSA-L 0.000 description 2
- 229910052808 lithium carbonate Inorganic materials 0.000 description 2
- FUJCRWPEOMXPAD-UHFFFAOYSA-N lithium oxide Chemical compound [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 description 2
- 229910001947 lithium oxide Inorganic materials 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- PQIOSYKVBBWRRI-UHFFFAOYSA-N methylphosphonyl difluoride Chemical group CP(F)(F)=O PQIOSYKVBBWRRI-UHFFFAOYSA-N 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 2
- HCZKYJDFEPMADG-UHFFFAOYSA-N nordihydroguaiaretic acid Chemical compound C=1C=C(O)C(O)=CC=1CC(C)C(C)CC1=CC=C(O)C(O)=C1 HCZKYJDFEPMADG-UHFFFAOYSA-N 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- PGMYKACGEOXYJE-UHFFFAOYSA-N pentyl acetate Chemical compound CCCCCOC(C)=O PGMYKACGEOXYJE-UHFFFAOYSA-N 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 239000002685 polymerization catalyst Substances 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 235000011056 potassium acetate Nutrition 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- YKYONYBAUNKHLG-UHFFFAOYSA-N propyl acetate Chemical compound CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 239000011342 resin composition Substances 0.000 description 2
- 238000007363 ring formation reaction Methods 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 238000007086 side reaction Methods 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000001632 sodium acetate Substances 0.000 description 2
- 235000017281 sodium acetate Nutrition 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- QDRKDTQENPPHOJ-UHFFFAOYSA-N sodium ethoxide Chemical compound [Na+].CC[O-] QDRKDTQENPPHOJ-UHFFFAOYSA-N 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 150000003460 sulfonic acids Chemical class 0.000 description 2
- TWQULNDIKKJZPH-UHFFFAOYSA-K trilithium;phosphate Chemical compound [Li+].[Li+].[Li+].[O-]P([O-])([O-])=O TWQULNDIKKJZPH-UHFFFAOYSA-K 0.000 description 2
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 2
- 229910000404 tripotassium phosphate Inorganic materials 0.000 description 2
- 235000019798 tripotassium phosphate Nutrition 0.000 description 2
- 230000004580 weight loss Effects 0.000 description 2
- GYXAHUXQRATWDV-UHFFFAOYSA-N (1,3-dioxoisoindol-2-yl) trifluoromethanesulfonate Chemical compound C1=CC=C2C(=O)N(OS(=O)(=O)C(F)(F)F)C(=O)C2=C1 GYXAHUXQRATWDV-UHFFFAOYSA-N 0.000 description 1
- GBQZZLQKUYLGFT-UHFFFAOYSA-N (2,4-dihydroxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound OC1=CC(O)=CC=C1C(=O)C1=CC=C(O)C(O)=C1O GBQZZLQKUYLGFT-UHFFFAOYSA-N 0.000 description 1
- RLLFCCPTQOZGOL-UHFFFAOYSA-N (2,5-dioxo-3,4-diphenylpyrrol-1-yl) trifluoromethanesulfonate Chemical compound O=C1N(OS(=O)(=O)C(F)(F)F)C(=O)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 RLLFCCPTQOZGOL-UHFFFAOYSA-N 0.000 description 1
- OKRLWHAZMUFONP-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) trifluoromethanesulfonate Chemical compound FC(F)(F)S(=O)(=O)ON1C(=O)CCC1=O OKRLWHAZMUFONP-UHFFFAOYSA-N 0.000 description 1
- MCVVDMSWCQUKEV-UHFFFAOYSA-N (2-nitrophenyl)methyl 4-methylbenzenesulfonate Chemical compound C1=CC(C)=CC=C1S(=O)(=O)OCC1=CC=CC=C1[N+]([O-])=O MCVVDMSWCQUKEV-UHFFFAOYSA-N 0.000 description 1
- UJMXMRBISVKKOI-UHFFFAOYSA-N (2-nitrophenyl)methyl trifluoromethanesulfonate Chemical compound [O-][N+](=O)C1=CC=CC=C1COS(=O)(=O)C(F)(F)F UJMXMRBISVKKOI-UHFFFAOYSA-N 0.000 description 1
- DLDWUFCUUXXYTB-UHFFFAOYSA-N (2-oxo-1,2-diphenylethyl) 4-methylbenzenesulfonate Chemical compound C1=CC(C)=CC=C1S(=O)(=O)OC(C=1C=CC=CC=1)C(=O)C1=CC=CC=C1 DLDWUFCUUXXYTB-UHFFFAOYSA-N 0.000 description 1
- ZRDYULMDEGRWRC-UHFFFAOYSA-N (4-hydroxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound C1=CC(O)=CC=C1C(=O)C1=CC=C(O)C(O)=C1O ZRDYULMDEGRWRC-UHFFFAOYSA-N 0.000 description 1
- FERZIJWEXHCCFD-UHFFFAOYSA-M (4-tert-butylphenyl)-diphenylsulfanium;4-methylbenzenesulfonate Chemical compound CC1=CC=C(S([O-])(=O)=O)C=C1.C1=CC(C(C)(C)C)=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 FERZIJWEXHCCFD-UHFFFAOYSA-M 0.000 description 1
- RLAWXWSZTKMPQQ-UHFFFAOYSA-M (4-tert-butylphenyl)-diphenylsulfanium;trifluoromethanesulfonate Chemical compound [O-]S(=O)(=O)C(F)(F)F.C1=CC(C(C)(C)C)=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 RLAWXWSZTKMPQQ-UHFFFAOYSA-M 0.000 description 1
- POFMQEVZKZVAPQ-UHFFFAOYSA-N 1,1,1',1'-tetramethyl-3,3'-spirobi[2h-indene]-5,5',6,6'-tetrol Chemical compound C12=CC(O)=C(O)C=C2C(C)(C)CC11C2=CC(O)=C(O)C=C2C(C)(C)C1 POFMQEVZKZVAPQ-UHFFFAOYSA-N 0.000 description 1
- GTQHJCOHNAFHRE-UHFFFAOYSA-N 1,10-dibromodecane Chemical compound BrCCCCCCCCCCBr GTQHJCOHNAFHRE-UHFFFAOYSA-N 0.000 description 1
- VPBZZPOGZPKYKX-UHFFFAOYSA-N 1,2-diethoxypropane Chemical compound CCOCC(C)OCC VPBZZPOGZPKYKX-UHFFFAOYSA-N 0.000 description 1
- LEEANUDEDHYDTG-UHFFFAOYSA-N 1,2-dimethoxypropane Chemical compound COCC(C)OC LEEANUDEDHYDTG-UHFFFAOYSA-N 0.000 description 1
- PVMMVWNXKOSPRB-UHFFFAOYSA-N 1,2-dipropoxypropane Chemical compound CCCOCC(C)OCCC PVMMVWNXKOSPRB-UHFFFAOYSA-N 0.000 description 1
- JIHQDMXYYFUGFV-UHFFFAOYSA-N 1,3,5-triazine Chemical class C1=NC=NC=N1 JIHQDMXYYFUGFV-UHFFFAOYSA-N 0.000 description 1
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- ZPQOPVIELGIULI-UHFFFAOYSA-N 1,3-dichlorobenzene Chemical compound ClC1=CC=CC(Cl)=C1 ZPQOPVIELGIULI-UHFFFAOYSA-N 0.000 description 1
- OCJBOOLMMGQPQU-UHFFFAOYSA-N 1,4-dichlorobenzene Chemical compound ClC1=CC=C(Cl)C=C1 OCJBOOLMMGQPQU-UHFFFAOYSA-N 0.000 description 1
- CUVLMZNMSPJDON-UHFFFAOYSA-N 1-(1-butoxypropan-2-yloxy)propan-2-ol Chemical compound CCCCOCC(C)OCC(C)O CUVLMZNMSPJDON-UHFFFAOYSA-N 0.000 description 1
- QMGJMGFZLXYHCR-UHFFFAOYSA-N 1-(2-butoxypropoxy)butane Chemical compound CCCCOCC(C)OCCCC QMGJMGFZLXYHCR-UHFFFAOYSA-N 0.000 description 1
- QWOZZTWBWQMEPD-UHFFFAOYSA-N 1-(2-ethoxypropoxy)propan-2-ol Chemical compound CCOC(C)COCC(C)O QWOZZTWBWQMEPD-UHFFFAOYSA-N 0.000 description 1
- RWNUSVWFHDHRCJ-UHFFFAOYSA-N 1-butoxypropan-2-ol Chemical compound CCCCOCC(C)O RWNUSVWFHDHRCJ-UHFFFAOYSA-N 0.000 description 1
- FUWDFGKRNIDKAE-UHFFFAOYSA-N 1-butoxypropan-2-yl acetate Chemical compound CCCCOCC(C)OC(C)=O FUWDFGKRNIDKAE-UHFFFAOYSA-N 0.000 description 1
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 1
- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 1
- LIPRQQHINVWJCH-UHFFFAOYSA-N 1-ethoxypropan-2-yl acetate Chemical compound CCOCC(C)OC(C)=O LIPRQQHINVWJCH-UHFFFAOYSA-N 0.000 description 1
- PLVUIVUKKJTSDM-UHFFFAOYSA-N 1-fluoro-4-(4-fluorophenyl)sulfonylbenzene Chemical compound C1=CC(F)=CC=C1S(=O)(=O)C1=CC=C(F)C=C1 PLVUIVUKKJTSDM-UHFFFAOYSA-N 0.000 description 1
- ILMDJKLKHFJJMZ-UHFFFAOYSA-N 1-phenyl-2-(2,4,6-trimethylphenyl)sulfonylethanone Chemical compound CC1=CC(C)=CC(C)=C1S(=O)(=O)CC(=O)C1=CC=CC=C1 ILMDJKLKHFJJMZ-UHFFFAOYSA-N 0.000 description 1
- MLCNOCRGSBCAGH-UHFFFAOYSA-N 2,3-dichloropyrazine Chemical compound ClC1=NC=CN=C1Cl MLCNOCRGSBCAGH-UHFFFAOYSA-N 0.000 description 1
- MAKFMOSBBNKPMS-UHFFFAOYSA-N 2,3-dichloropyridine Chemical compound ClC1=CC=CN=C1Cl MAKFMOSBBNKPMS-UHFFFAOYSA-N 0.000 description 1
- ICETWLGKJXCIDX-UHFFFAOYSA-N 2,4-dichloro-1,3-thiazole Chemical compound ClC1=CSC(Cl)=N1 ICETWLGKJXCIDX-UHFFFAOYSA-N 0.000 description 1
- NYHAEAOEIVHXBI-UHFFFAOYSA-N 2,4-dichloro-1h-pyrrole Chemical compound ClC1=CNC(Cl)=C1 NYHAEAOEIVHXBI-UHFFFAOYSA-N 0.000 description 1
- LRDLVPORISMMKL-UHFFFAOYSA-N 2,5-dichloro-1h-imidazole Chemical compound ClC1=CNC(Cl)=N1 LRDLVPORISMMKL-UHFFFAOYSA-N 0.000 description 1
- AJJCRRLRSVMJEJ-UHFFFAOYSA-N 2,5-dichloro-1h-pyrrole Chemical compound ClC1=CC=C(Cl)N1 AJJCRRLRSVMJEJ-UHFFFAOYSA-N 0.000 description 1
- UWWPONFLTBNRKY-UHFFFAOYSA-N 2,5-dichlorofuran Chemical compound ClC1=CC=C(Cl)O1 UWWPONFLTBNRKY-UHFFFAOYSA-N 0.000 description 1
- FGYBDASKYMSNCX-UHFFFAOYSA-N 2,5-dichlorothiophene Chemical compound ClC1=CC=C(Cl)S1 FGYBDASKYMSNCX-UHFFFAOYSA-N 0.000 description 1
- FILKGCRCWDMBKA-UHFFFAOYSA-N 2,6-dichloropyridine Chemical compound ClC1=CC=CC(Cl)=N1 FILKGCRCWDMBKA-UHFFFAOYSA-N 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- DQMOHZLFVGYNAN-UHFFFAOYSA-N 2-(2-phenylethenyl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound ClC(Cl)(Cl)C1=NC(C(Cl)(Cl)Cl)=NC(C=CC=2C=CC=CC=2)=N1 DQMOHZLFVGYNAN-UHFFFAOYSA-N 0.000 description 1
- XYVAYAJYLWYJJN-UHFFFAOYSA-N 2-(2-propoxypropoxy)propan-1-ol Chemical compound CCCOC(C)COC(C)CO XYVAYAJYLWYJJN-UHFFFAOYSA-N 0.000 description 1
- QRHHZFRCJDAUNA-UHFFFAOYSA-N 2-(4-methoxyphenyl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound C1=CC(OC)=CC=C1C1=NC(C(Cl)(Cl)Cl)=NC(C(Cl)(Cl)Cl)=N1 QRHHZFRCJDAUNA-UHFFFAOYSA-N 0.000 description 1
- SRGLKPPFAKCEHV-UHFFFAOYSA-N 2-(phenacylsulfonylmethylsulfonyl)-1-phenylethanone Chemical compound C=1C=CC=CC=1C(=O)CS(=O)(=O)CS(=O)(=O)CC(=O)C1=CC=CC=C1 SRGLKPPFAKCEHV-UHFFFAOYSA-N 0.000 description 1
- WYGWHHGCAGTUCH-UHFFFAOYSA-N 2-[(2-cyano-4-methylpentan-2-yl)diazenyl]-2,4-dimethylpentanenitrile Chemical compound CC(C)CC(C)(C#N)N=NC(C)(C#N)CC(C)C WYGWHHGCAGTUCH-UHFFFAOYSA-N 0.000 description 1
- FDSUVTROAWLVJA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OCC(CO)(CO)COCC(CO)(CO)CO FDSUVTROAWLVJA-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- HAZQZUFYRLFOLC-UHFFFAOYSA-N 2-phenyl-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound ClC(Cl)(Cl)C1=NC(C(Cl)(Cl)Cl)=NC(C=2C=CC=CC=2)=N1 HAZQZUFYRLFOLC-UHFFFAOYSA-N 0.000 description 1
- WYYQKWASBLTRIW-UHFFFAOYSA-N 2-trimethoxysilylbenzoic acid Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1C(O)=O WYYQKWASBLTRIW-UHFFFAOYSA-N 0.000 description 1
- PFRKGGQLYAMPST-UHFFFAOYSA-N 3,4-dichloro-1h-pyrrole Chemical compound ClC1=CNC=C1Cl PFRKGGQLYAMPST-UHFFFAOYSA-N 0.000 description 1
- MYCIGSPXIAEGLA-UHFFFAOYSA-N 3,4-dichlorofuran Chemical compound ClC1=COC=C1Cl MYCIGSPXIAEGLA-UHFFFAOYSA-N 0.000 description 1
- QVFXSOFIEKYPOE-UHFFFAOYSA-N 3,4-dichlorothiophene Chemical compound ClC1=CSC=C1Cl QVFXSOFIEKYPOE-UHFFFAOYSA-N 0.000 description 1
- WAFQHKYFSGWXQS-UHFFFAOYSA-N 3,5-dichloro-1h-pyrazole Chemical compound ClC=1C=C(Cl)NN=1 WAFQHKYFSGWXQS-UHFFFAOYSA-N 0.000 description 1
- WPGHPGAUFIJVJF-UHFFFAOYSA-N 3,5-dichloropyridine Chemical compound ClC1=CN=CC(Cl)=C1 WPGHPGAUFIJVJF-UHFFFAOYSA-N 0.000 description 1
- GUSWJGOYDXFJSI-UHFFFAOYSA-N 3,6-dichloropyridazine Chemical compound ClC1=CC=C(Cl)N=N1 GUSWJGOYDXFJSI-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- LDMRLRNXHLPZJN-UHFFFAOYSA-N 3-propoxypropan-1-ol Chemical compound CCCOCCCO LDMRLRNXHLPZJN-UHFFFAOYSA-N 0.000 description 1
- GPIUUMROPXDNRH-UHFFFAOYSA-N 3647-74-3 Chemical compound C1C2C3C(=O)NC(=O)C3C1C=C2 GPIUUMROPXDNRH-UHFFFAOYSA-N 0.000 description 1
- TWFRMOJOOVEFCI-UHFFFAOYSA-N 4,5-dichloro-1,3-thiazole Chemical compound ClC=1N=CSC=1Cl TWFRMOJOOVEFCI-UHFFFAOYSA-N 0.000 description 1
- QAJJXHRQPLATMK-UHFFFAOYSA-N 4,5-dichloro-1h-imidazole Chemical compound ClC=1N=CNC=1Cl QAJJXHRQPLATMK-UHFFFAOYSA-N 0.000 description 1
- IOSUEOLOSZOHDE-UHFFFAOYSA-N 4,5-dichloropyridazine Chemical compound ClC1=CN=NC=C1Cl IOSUEOLOSZOHDE-UHFFFAOYSA-N 0.000 description 1
- SGJZXXPWUDGJSV-UHFFFAOYSA-N 4,6-bis[2-(4-hydroxyphenyl)propan-2-yl]benzene-1,3-diol Chemical compound C=1C(C(C)(C)C=2C=CC(O)=CC=2)=C(O)C=C(O)C=1C(C)(C)C1=CC=C(O)C=C1 SGJZXXPWUDGJSV-UHFFFAOYSA-N 0.000 description 1
- BRPSWMCDEYMRPE-UHFFFAOYSA-N 4-[1,1-bis(4-hydroxyphenyl)ethyl]phenol Chemical compound C=1C=C(O)C=CC=1C(C=1C=CC(O)=CC=1)(C)C1=CC=C(O)C=C1 BRPSWMCDEYMRPE-UHFFFAOYSA-N 0.000 description 1
- HDPBBNNDDQOWPJ-UHFFFAOYSA-N 4-[1,2,2-tris(4-hydroxyphenyl)ethyl]phenol Chemical compound C1=CC(O)=CC=C1C(C=1C=CC(O)=CC=1)C(C=1C=CC(O)=CC=1)C1=CC=C(O)C=C1 HDPBBNNDDQOWPJ-UHFFFAOYSA-N 0.000 description 1
- UMPGNGRIGSEMTC-UHFFFAOYSA-N 4-[1-(4-hydroxyphenyl)-3,3,5-trimethylcyclohexyl]phenol Chemical compound C1C(C)CC(C)(C)CC1(C=1C=CC(O)=CC=1)C1=CC=C(O)C=C1 UMPGNGRIGSEMTC-UHFFFAOYSA-N 0.000 description 1
- PVFQHGDIOXNKIC-UHFFFAOYSA-N 4-[2-[3-[2-(4-hydroxyphenyl)propan-2-yl]phenyl]propan-2-yl]phenol Chemical compound C=1C=CC(C(C)(C)C=2C=CC(O)=CC=2)=CC=1C(C)(C)C1=CC=C(O)C=C1 PVFQHGDIOXNKIC-UHFFFAOYSA-N 0.000 description 1
- WXYSZTISEJBRHW-UHFFFAOYSA-N 4-[2-[4-[1,1-bis(4-hydroxyphenyl)ethyl]phenyl]propan-2-yl]phenol Chemical compound C=1C=C(C(C)(C=2C=CC(O)=CC=2)C=2C=CC(O)=CC=2)C=CC=1C(C)(C)C1=CC=C(O)C=C1 WXYSZTISEJBRHW-UHFFFAOYSA-N 0.000 description 1
- YXZXRYDYTRYFAF-UHFFFAOYSA-M 4-methylbenzenesulfonate;triphenylsulfanium Chemical compound CC1=CC=C(S([O-])(=O)=O)C=C1.C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 YXZXRYDYTRYFAF-UHFFFAOYSA-M 0.000 description 1
- LPEKGGXMPWTOCB-UHFFFAOYSA-N 8beta-(2,3-epoxy-2-methylbutyryloxy)-14-acetoxytithifolin Natural products COC(=O)C(C)O LPEKGGXMPWTOCB-UHFFFAOYSA-N 0.000 description 1
- YWFPGFJLYRKYJZ-UHFFFAOYSA-N 9,9-bis(4-hydroxyphenyl)fluorene Chemical compound C1=CC(O)=CC=C1C1(C=2C=CC(O)=CC=2)C2=CC=CC=C2C2=CC=CC=C21 YWFPGFJLYRKYJZ-UHFFFAOYSA-N 0.000 description 1
- 244000198134 Agave sisalana Species 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- VOWWYDCFAISREI-UHFFFAOYSA-N Bisphenol AP Chemical compound C=1C=C(O)C=CC=1C(C=1C=CC(O)=CC=1)(C)C1=CC=CC=C1 VOWWYDCFAISREI-UHFFFAOYSA-N 0.000 description 1
- OGPXCRRHNLGYQJ-UHFFFAOYSA-N C1(=CSCS1)C1=CC=CC=C1C(=O)O Chemical compound C1(=CSCS1)C1=CC=CC=C1C(=O)O OGPXCRRHNLGYQJ-UHFFFAOYSA-N 0.000 description 1
- 244000025254 Cannabis sativa Species 0.000 description 1
- 235000012766 Cannabis sativa ssp. sativa var. sativa Nutrition 0.000 description 1
- 235000012765 Cannabis sativa ssp. sativa var. spontanea Nutrition 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- YVGGHNCTFXOJCH-UHFFFAOYSA-N DDT Chemical compound C1=CC(Cl)=CC=C1C(C(Cl)(Cl)Cl)C1=CC=C(Cl)C=C1 YVGGHNCTFXOJCH-UHFFFAOYSA-N 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical class S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 1
- VKOUCJUTMGHNOR-UHFFFAOYSA-N Diphenolic acid Chemical compound C=1C=C(O)C=CC=1C(CCC(O)=O)(C)C1=CC=C(O)C=C1 VKOUCJUTMGHNOR-UHFFFAOYSA-N 0.000 description 1
- XXRCUYVCPSWGCC-UHFFFAOYSA-N Ethyl pyruvate Chemical compound CCOC(=O)C(C)=O XXRCUYVCPSWGCC-UHFFFAOYSA-N 0.000 description 1
- 101000652482 Homo sapiens TBC1 domain family member 8 Proteins 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- IJMWOMHMDSDKGK-UHFFFAOYSA-N Isopropyl propionate Chemical compound CCC(=O)OC(C)C IJMWOMHMDSDKGK-UHFFFAOYSA-N 0.000 description 1
- XOBKSJJDNFUZPF-UHFFFAOYSA-N Methoxyethane Chemical compound CCOC XOBKSJJDNFUZPF-UHFFFAOYSA-N 0.000 description 1
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 1
- OHLUUHNLEMFGTQ-UHFFFAOYSA-N N-methylacetamide Chemical compound CNC(C)=O OHLUUHNLEMFGTQ-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- JPYHHZQJCSQRJY-UHFFFAOYSA-N Phloroglucinol Natural products CCC=CCC=CCC=CCC=CCCCCC(=O)C1=C(O)C=C(O)C=C1O JPYHHZQJCSQRJY-UHFFFAOYSA-N 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical group OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- KEAYESYHFKHZAL-UHFFFAOYSA-N Sodium Chemical compound [Na] KEAYESYHFKHZAL-UHFFFAOYSA-N 0.000 description 1
- UIIMBOGNXHQVGW-DEQYMQKBSA-M Sodium bicarbonate-14C Chemical compound [Na+].O[14C]([O-])=O UIIMBOGNXHQVGW-DEQYMQKBSA-M 0.000 description 1
- 102100030302 TBC1 domain family member 8 Human genes 0.000 description 1
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 1
- QFKJMDYQKVPGNM-UHFFFAOYSA-N [benzenesulfonyl(diazo)methyl]sulfonylbenzene Chemical compound C=1C=CC=CC=1S(=O)(=O)C(=[N+]=[N-])S(=O)(=O)C1=CC=CC=C1 QFKJMDYQKVPGNM-UHFFFAOYSA-N 0.000 description 1
- GLGXSTXZLFQYKJ-UHFFFAOYSA-N [cyclohexylsulfonyl(diazo)methyl]sulfonylcyclohexane Chemical compound C1CCCCC1S(=O)(=O)C(=[N+]=[N-])S(=O)(=O)C1CCCCC1 GLGXSTXZLFQYKJ-UHFFFAOYSA-N 0.000 description 1
- NOZAQBYNLKNDRT-UHFFFAOYSA-N [diacetyloxy(ethenyl)silyl] acetate Chemical compound CC(=O)O[Si](OC(C)=O)(OC(C)=O)C=C NOZAQBYNLKNDRT-UHFFFAOYSA-N 0.000 description 1
- FDTRPMUFAMGRNM-UHFFFAOYSA-N [diazo(trifluoromethylsulfonyl)methyl]sulfonyl-trifluoromethane Chemical compound FC(F)(F)S(=O)(=O)C(=[N+]=[N-])S(=O)(=O)C(F)(F)F FDTRPMUFAMGRNM-UHFFFAOYSA-N 0.000 description 1
- IPSOQTFPIWIGJT-UHFFFAOYSA-N acetic acid;1-propoxypropane Chemical compound CC(O)=O.CCCOCCC IPSOQTFPIWIGJT-UHFFFAOYSA-N 0.000 description 1
- 125000004018 acid anhydride group Chemical group 0.000 description 1
- 150000008065 acid anhydrides Chemical class 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 125000000641 acridinyl group Chemical class C1(=CC=CC2=NC3=CC=CC=C3C=C12)* 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000001476 alcoholic effect Effects 0.000 description 1
- 150000007933 aliphatic carboxylic acids Chemical class 0.000 description 1
- 229910000288 alkali metal carbonate Inorganic materials 0.000 description 1
- 150000008041 alkali metal carbonates Chemical class 0.000 description 1
- 229910001515 alkali metal fluoride Inorganic materials 0.000 description 1
- 229910000102 alkali metal hydride Inorganic materials 0.000 description 1
- 150000008046 alkali metal hydrides Chemical class 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 1
- 229910000272 alkali metal oxide Inorganic materials 0.000 description 1
- 229910000318 alkali metal phosphate Inorganic materials 0.000 description 1
- 125000004849 alkoxymethyl group Chemical group 0.000 description 1
- 125000002947 alkylene group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000000010 aprotic solvent Substances 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 125000000751 azo group Chemical group [*]N=N[*] 0.000 description 1
- 238000007611 bar coating method Methods 0.000 description 1
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical class C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical class OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- BTMVHUNTONAYDX-UHFFFAOYSA-N butyl propionate Chemical compound CCCCOC(=O)CC BTMVHUNTONAYDX-UHFFFAOYSA-N 0.000 description 1
- 235000009120 camo Nutrition 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 description 1
- 150000001728 carbonyl compounds Chemical class 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 235000005607 chanvre indien Nutrition 0.000 description 1
- OEYIOHPDSNJKLS-UHFFFAOYSA-N choline Chemical compound C[N+](C)(C)CCO OEYIOHPDSNJKLS-UHFFFAOYSA-N 0.000 description 1
- 229960001231 choline Drugs 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 150000004775 coumarins Chemical class 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 239000012954 diazonium Substances 0.000 description 1
- 150000001989 diazonium salts Chemical class 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- OWZDULOODZHVCQ-UHFFFAOYSA-N diphenyl-(4-phenylsulfanylphenyl)sulfanium Chemical compound C=1C=C([S+](C=2C=CC=CC=2)C=2C=CC=CC=2)C=CC=1SC1=CC=CC=C1 OWZDULOODZHVCQ-UHFFFAOYSA-N 0.000 description 1
- UMIKAXKFQJWKCV-UHFFFAOYSA-M diphenyliodanium;4-methylbenzenesulfonate Chemical compound CC1=CC=C(S([O-])(=O)=O)C=C1.C=1C=CC=CC=1[I+]C1=CC=CC=C1 UMIKAXKFQJWKCV-UHFFFAOYSA-M 0.000 description 1
- SBQIJPBUMNWUKN-UHFFFAOYSA-M diphenyliodanium;trifluoromethanesulfonate Chemical compound [O-]S(=O)(=O)C(F)(F)F.C=1C=CC=CC=1[I+]C1=CC=CC=C1 SBQIJPBUMNWUKN-UHFFFAOYSA-M 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- ODQWQRRAPPTVAG-GZTJUZNOSA-N doxepin Chemical compound C1OC2=CC=CC=C2C(=C/CCN(C)C)/C2=CC=CC=C21 ODQWQRRAPPTVAG-GZTJUZNOSA-N 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 1
- BHXIWUJLHYHGSJ-UHFFFAOYSA-N ethyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OCC BHXIWUJLHYHGSJ-UHFFFAOYSA-N 0.000 description 1
- IJUHLFUALMUWOM-UHFFFAOYSA-N ethyl 3-methoxypropanoate Chemical compound CCOC(=O)CCOC IJUHLFUALMUWOM-UHFFFAOYSA-N 0.000 description 1
- 229940117360 ethyl pyruvate Drugs 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- VPVSTMAPERLKKM-UHFFFAOYSA-N glycoluril Chemical compound N1C(=O)NC2NC(=O)NC21 VPVSTMAPERLKKM-UHFFFAOYSA-N 0.000 description 1
- 238000007646 gravure printing Methods 0.000 description 1
- 239000011487 hemp Substances 0.000 description 1
- 150000002391 heterocyclic compounds Chemical class 0.000 description 1
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 1
- 229920006158 high molecular weight polymer Polymers 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical class I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000011256 inorganic filler Substances 0.000 description 1
- 229910003475 inorganic filler Inorganic materials 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- GJRQTCIYDGXPES-UHFFFAOYSA-N iso-butyl acetate Natural products CC(C)COC(C)=O GJRQTCIYDGXPES-UHFFFAOYSA-N 0.000 description 1
- 229940117955 isoamyl acetate Drugs 0.000 description 1
- FGKJLKRYENPLQH-UHFFFAOYSA-M isocaproate Chemical compound CC(C)CCC([O-])=O FGKJLKRYENPLQH-UHFFFAOYSA-M 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- JMMWKPVZQRWMSS-UHFFFAOYSA-N isopropanol acetate Natural products CC(C)OC(C)=O JMMWKPVZQRWMSS-UHFFFAOYSA-N 0.000 description 1
- 229940011051 isopropyl acetate Drugs 0.000 description 1
- GWYFCOCPABKNJV-UHFFFAOYSA-M isovalerate Chemical compound CC(C)CC([O-])=O GWYFCOCPABKNJV-UHFFFAOYSA-M 0.000 description 1
- OQAGVSWESNCJJT-UHFFFAOYSA-N isovaleric acid methyl ester Natural products COC(=O)CC(C)C OQAGVSWESNCJJT-UHFFFAOYSA-N 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 150000003903 lactic acid esters Chemical class 0.000 description 1
- 150000002596 lactones Chemical class 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910000103 lithium hydride Inorganic materials 0.000 description 1
- HQRPHMAXFVUBJX-UHFFFAOYSA-M lithium;hydrogen carbonate Chemical compound [Li+].OC([O-])=O HQRPHMAXFVUBJX-UHFFFAOYSA-M 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- HSDFKDZBJMDHFF-UHFFFAOYSA-N methyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OC HSDFKDZBJMDHFF-UHFFFAOYSA-N 0.000 description 1
- BDJSOPWXYLFTNW-UHFFFAOYSA-N methyl 3-methoxypropanoate Chemical compound COCCC(=O)OC BDJSOPWXYLFTNW-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 229940057867 methyl lactate Drugs 0.000 description 1
- CWKLZLBVOJRSOM-UHFFFAOYSA-N methyl pyruvate Chemical compound COC(=O)C(C)=O CWKLZLBVOJRSOM-UHFFFAOYSA-N 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- MUMVIYLVHVCYGI-UHFFFAOYSA-N n,n,n',n',n",n"-hexamethylmethanetriamine Chemical compound CN(C)C(N(C)C)N(C)C MUMVIYLVHVCYGI-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 238000010534 nucleophilic substitution reaction Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 125000003566 oxetanyl group Chemical group 0.000 description 1
- MPQXHAGKBWFSNV-UHFFFAOYSA-N oxidophosphanium Chemical group [PH3]=O MPQXHAGKBWFSNV-UHFFFAOYSA-N 0.000 description 1
- 125000000466 oxiranyl group Chemical group 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- QCDYQQDYXPDABM-UHFFFAOYSA-N phloroglucinol Chemical compound OC1=CC(O)=CC(O)=C1 QCDYQQDYXPDABM-UHFFFAOYSA-N 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- 125000004437 phosphorous atom Chemical group 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920001690 polydopamine Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 229920000193 polymethacrylate Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229910000028 potassium bicarbonate Inorganic materials 0.000 description 1
- 235000015497 potassium bicarbonate Nutrition 0.000 description 1
- 239000011736 potassium bicarbonate Substances 0.000 description 1
- NTTOTNSKUYCDAV-UHFFFAOYSA-N potassium hydride Chemical compound [KH] NTTOTNSKUYCDAV-UHFFFAOYSA-N 0.000 description 1
- 229910000105 potassium hydride Inorganic materials 0.000 description 1
- TYJJADVDDVDEDZ-UHFFFAOYSA-M potassium hydrogencarbonate Chemical compound [K+].OC([O-])=O TYJJADVDDVDEDZ-UHFFFAOYSA-M 0.000 description 1
- KIWATKANDHUUOB-UHFFFAOYSA-N propan-2-yl 2-hydroxypropanoate Chemical compound CC(C)OC(=O)C(C)O KIWATKANDHUUOB-UHFFFAOYSA-N 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- ILVGAIQLOCKNQA-UHFFFAOYSA-N propyl 2-hydroxypropanoate Chemical compound CCCOC(=O)C(C)O ILVGAIQLOCKNQA-UHFFFAOYSA-N 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- 239000003586 protic polar solvent Substances 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000007870 radical polymerization initiator Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- 235000017557 sodium bicarbonate Nutrition 0.000 description 1
- 239000012312 sodium hydride Substances 0.000 description 1
- 229910000104 sodium hydride Inorganic materials 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000010421 standard material Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- UWIVZLWKBOZJFG-UHFFFAOYSA-N thiolan-1-ium trifluoromethanesulfonate Chemical compound C1CC[SH+]C1.[O-]S(=O)(=O)C(F)(F)F UWIVZLWKBOZJFG-UHFFFAOYSA-N 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 1
- FRGPKMWIYVTFIQ-UHFFFAOYSA-N triethoxy(3-isocyanatopropyl)silane Chemical compound CCO[Si](OCC)(OCC)CCCN=C=O FRGPKMWIYVTFIQ-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- JFZKOODUSFUFIZ-UHFFFAOYSA-N trifluoro phosphate Chemical compound FOP(=O)(OF)OF JFZKOODUSFUFIZ-UHFFFAOYSA-N 0.000 description 1
- FAYMLNNRGCYLSR-UHFFFAOYSA-M triphenylsulfonium triflate Chemical compound [O-]S(=O)(=O)C(F)(F)F.C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 FAYMLNNRGCYLSR-UHFFFAOYSA-M 0.000 description 1
- 239000001226 triphosphate Substances 0.000 description 1
- 235000011178 triphosphate Nutrition 0.000 description 1
- UNXRWKVEANCORM-UHFFFAOYSA-N triphosphoric acid Chemical compound OP(O)(=O)OP(O)(=O)OP(O)(O)=O UNXRWKVEANCORM-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 229910000406 trisodium phosphate Inorganic materials 0.000 description 1
- 235000019801 trisodium phosphate Nutrition 0.000 description 1
- 238000000870 ultraviolet spectroscopy Methods 0.000 description 1
- XSQUKJJJFZCRTK-UHFFFAOYSA-N urea group Chemical group NC(=O)N XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 1
- 238000001291 vacuum drying Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G65/00—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
- C08G65/34—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from hydroxy compounds or their metallic derivatives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L101/00—Compositions of unspecified macromolecular compounds
- C08L101/02—Compositions of unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
Definitions
- One embodiment of the present invention relates to a polymer, a composition, a cured product, or a display element.
- a composition for forming a resin film such as an insulating film having such a pattern is required to have photolithographic properties that allow patterning by exposure, development, and the like.
- compositions having photolithographic properties particularly compositions with excellent sensitivity and resolution (see, for example, Patent Documents 1 to 3).
- An embodiment of the present invention can form a cured product (cured film) that is excellent in sensitivity, transparency of light with a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low coefficient of linear expansion, and bending resistance in a well-balanced manner.
- the present invention provides compositions and polymers.
- a configuration example of the present invention is as follows.
- A is a divalent group having an aromatic heterocycle
- B is a divalent group having an aromatic ring or an aromatic heterocycle and having an alkali-soluble group
- X is independently -O-, -NH- or -S-.
- composition according to [1], wherein the aromatic heterocycle in A is a nitrogen-containing aromatic ring.
- C 1 is a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, and Y 1 and Y 2 are each Each of Z 1 and Z 2 is independently an alkali-soluble group, Z 1 and Z 2 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and Z 1 and Z 2 are each independently C 1 may be combined with to form a ring, n1 and n3 are each independently an integer of 0 to 2, provided that n1+n3 is an integer of 1 to 4, and n2 and n4 are each independently an integer of 1 to 4. It is an integer from 0 to 4, and * indicates a bond with X. ]
- D 1 is a trivalent organic group containing no alkali-soluble group
- Y 3 is independently an alkali-soluble group
- Z 3 to Z 5 are each independently an alkali-soluble group. It is a monovalent organic group or a fluorine atom that does not contain a soluble group, and at least one selected from Z 3 and Y 3 may be combined with D 1 to form a ring
- n5 is 1 to 2 of is an integer
- n6 to n8 are each independently an integer of 0 to 4, and * indicates a bond with X.
- E 1 is a tetravalent organic group containing no alkali-soluble group
- Y 4 and Y 5 are each independently an alkali-soluble group
- Z 6 to Z 9 are each independently an alkali-soluble group.
- n9 and n11 are each independently an integer of 1 to 2
- n10 and n12 to n14 are each independently an integer of 0 to 4. is an integer
- * indicates the bond with X.
- C 2 and C 3 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 6 and Y 7 are each independently an alkali-soluble group, Z 10 and Z 11 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and n15 and n16 are each They are independently 0 or 1, provided that n15+n16 is 1 or 2, n17 and n18 are each independently an integer of 0 to 3, and * indicates a bond with X. ]
- D 2 is a trivalent organic group containing no alkali-soluble group
- Z 12 and Z 13 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom.
- n19 and n20 are each independently an integer of 0 to 4, and * indicates a bond with X.
- D 3 and D 4 are each independently a trivalent organic group containing no alkali-soluble group
- Y 8 to Y 10 are each independently an alkali-soluble group
- Z 14 to Z 17 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom
- n21, n23 and n25 are each independently an integer of 0 to 1, provided that n21+n23+n25 is is an integer from 1 to 3
- n22 and n24 are each independently an integer from 0 to 5
- n26 and n27 are each independently an integer from 0 to 4, and * indicates the bond with X. show.
- * indicates the bond with X. show.
- C 4 and C 5 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 11 to Y 13 are each independently an alkali-soluble group, Z 18 to Z 20 are each independently a monovalent organic group or fluorine atom containing no alkali-soluble group, and n28 and n32 are each n30 is independently an integer of 1 to 2, n29 and n33 are each independently an integer of 0 to 4, and n31 is independently an integer of 0 to 2. is an integer of 3, m is an integer of 1 to 3, and * indicates a bond with X. ]
- Y 14 is independently an alkali-soluble group
- Z 21 is independently a monovalent organic group or fluorine atom containing no alkali-soluble group
- n34 is 1 to 2 of is an integer
- n35 is an integer from 0 to 3
- * indicates a bond with X.
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 , n1 in formula (B1), Synonymous with n3 and *, R 6 is each independently a hydrogen atom or an alkyl group, G 1 is each independently a single bond or an oxygen atom, n is each independently 0 to 3 is an integer. ]
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3, n4 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 in formula (B1), Synonymous with n1, n3, n4 and *, R 6 is each independently a hydrogen atom or an alkyl group, R 7 is a hydrogen atom or an organic group, R 6 each other, R 7 each other or adjacent R 6 and R 7 may be combined to form a ring, G 1 is a single bond or an oxygen atom, and n is an integer of 0 to 3. ]
- composition according to [8] The composition according to [7], wherein the photosensitive compound is a photosensitive acid generator.
- the cured product according to [9] which is an insulating film, a surface protection film, or a planarization film.
- a display element comprising the cured product according to [9] or [10].
- A is a divalent group having a nitrogen-containing aromatic ring
- B is a divalent group represented by any of the following formulas (B1) to (B10)
- X is independently -O-, -NH- or -S-.
- C 1 is a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, and Y 1 and Y 2 are each Each of Z 1 and Z 2 is independently an alkali-soluble group, Z 1 and Z 2 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and Z 1 and Z 2 are each independently C 1 may be combined with to form a ring, n1 and n3 are each independently an integer of 0 to 2, provided that n1+n3 is an integer of 1 to 4, and n2 and n4 are each independently an integer of 1 to 4. It is an integer from 0 to 4, and * indicates a bond with X. ]
- D 1 is a trivalent organic group containing no alkali-soluble group
- Y 3 is independently an alkali-soluble group
- Z 3 to Z 5 are each independently an alkali-soluble group. It is a monovalent organic group or a fluorine atom that does not contain a soluble group, and at least one selected from Z 3 and Y 3 may be combined with D 1 to form a ring
- n5 is 1 to 2 of is an integer
- n6 to n8 are each independently an integer of 0 to 4, and * indicates a bond with X.
- E 1 is a tetravalent organic group containing no alkali-soluble group
- Y 4 and Y 5 are each independently an alkali-soluble group
- Z 6 to Z 9 are each independently an alkali-soluble group.
- n9 and n11 are each independently an integer of 1 to 2
- n10 and n12 to n14 are each independently an integer of 0 to 4. is an integer
- * indicates the bond with X.
- C 2 and C 3 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 6 and Y 7 are each independently an alkali-soluble group, Z 10 and Z 11 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and n15 and n16 are each They are independently 0 or 1, provided that n15+n16 is 1 or 2, n17 and n18 are each independently an integer of 0 to 3, and * indicates a bond with X. ]
- D 2 is a trivalent organic group containing no alkali-soluble group
- Z 12 and Z 13 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom.
- n19 and n20 are each independently an integer of 0 to 4, and * indicates a bond with X.
- D 3 and D 4 are each independently a trivalent organic group containing no alkali-soluble group
- Y 8 to Y 10 are each independently an alkali-soluble group
- Z 14 to Z 17 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom
- n21, n23 and n25 are each independently an integer of 0 to 1, provided that n21+n23+n25 is is an integer from 1 to 3
- n22 and n24 are each independently an integer from 0 to 5
- n26 and n27 are each independently an integer from 0 to 4, and * indicates the bond with X. show.
- * indicates the bond with X. show.
- C 4 and C 5 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 11 to Y 13 are each independently an alkali-soluble group, Z 18 to Z 20 are each independently a monovalent organic group or fluorine atom containing no alkali-soluble group, and n28 and n32 are each n30 is independently an integer of 1 to 2, n29 and n33 are each independently an integer of 0 to 4, and n31 is independently an integer of 0 to 2. is an integer of 3, m is an integer of 1 to 3, and * indicates a bond with X. ]
- Y 14 is independently an alkali-soluble group
- Z 21 is independently a monovalent organic group or fluorine atom containing no alkali-soluble group
- n34 is 1 to 2 of is an integer
- n35 is an integer from 0 to 3
- * indicates a bond with X.
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 , n1 in formula (B1), Synonymous with n3 and *, R 6 is each independently a hydrogen atom or an alkyl group, G 1 is each independently a single bond or an oxygen atom, n is each independently 0 to 3 is an integer. ]
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3, n4 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 in formula (B1), Synonymous with n1, n3, n4 and *, R 6 is each independently a hydrogen atom or an alkyl group, R 7 is a hydrogen atom or an organic group, R 6 each other, R 7 each other or adjacent R 6 and R 7 may be combined to form a ring, G 1 is a single bond or an oxygen atom, and n is an integer of 0 to 3. ]
- a cured product that is excellent in sensitivity, transparency of light with a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low coefficient of linear expansion, and bending resistance in a well-balanced manner is produced. can be formed.
- compositions and polymers are a polymer having a structural unit represented by the following formula (1) (hereinafter also referred to as “polymer (1)”). )including.
- the number of polymers (1) contained in this composition may be one or two or more.
- polymer (2) has a structural unit represented by the following formula (2).
- polymers (1) and (2) are also collectively referred to as “the present polymer.”
- the structural unit represented by the following formula (1) and the structural unit represented by the following formula (2) may be combined with other structural units below, for example. In other words, even if polymer (1) and polymer (2) have structural units other than the structural unit represented by the following formula (1) or the structural unit represented by the following formula (2), good.
- the polymer (1) is a polymer having a structural unit represented by the following formula (1)
- the polymer (2) is a polymer having a structural unit represented by the following formula (2). be. Since this polymer has a structural unit represented by the following formula (1) or (2), it exhibits the above-mentioned effects, and in particular has a low dielectric constant and excellent alkali solubility.
- the parameter (HSP) values dP and dH become high, and the polymer becomes easily soluble in an alkaline aqueous solution.
- the present polymer has better alkali solubility than expected compared to other polymers containing the same amount of alkali-soluble groups.
- the number of structural units represented by the following formula (1) contained in the polymer (1) may be one type or two or more types.
- the number of structural units represented by the following formula (2) contained in the polymer (2) may be one type or two or more types.
- the structural unit represented by the formula (1) is preferably a structural unit represented by the formula (2).
- the content of the structural units represented by formulas (1) and (2) in the present polymer is preferably 20 to 100% by mass, more preferably is 40 to 100% by weight, more preferably 50 to 100% by weight, particularly preferably 70 to 100% by weight.
- this polymer contains structural units other than the structural unit represented by the above formula (1) and the above formula (2), the above formula (1) and The upper limit of the content of the structural unit represented by (2) is preferably 99% by mass, more preferably 95% by mass, based on 100% by mass of all structural units constituting the present polymer.
- A is a divalent group having an aromatic heterocycle
- B is a divalent group having an aromatic ring or an aromatic heterocycle and having an alkali-soluble group
- X is independently -O-, -NH- or -S-.
- A is a divalent group having a nitrogen-containing aromatic ring
- B is a divalent group represented by any of the following formulas (B1) to (B10)
- X is independently -O-, -NH- or -S-.
- the above A is preferably a divalent group derived from a dihalogen compound (a) represented by the following formula (a).
- a dihalogen compound represented by the following formula (a).
- the structural units represented by formulas (1) and (2) contain a plurality of A's, the plural A's may be the same or different.
- the aromatic heterocycle in A is preferably a five-membered or six-membered aromatic heterocycle from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine. , pyridazine, triazine, furan, thiophene, and thiazole.
- the nitrogen-containing aromatic ring in A is preferably a five-membered or six-membered nitrogen-containing aromatic ring from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine.
- pyridazine triazine
- thiazole as the aromatic heterocycle and nitrogen-containing aromatic ring in A, imidazole is used because it is easy to obtain a high molecular weight polymer due to high nucleophilic substitution reactivity and side reactions due to basicity can be suppressed.
- pyrazole, pyridine, pyrazine, pyrimidine, pyridazine, and triazine are preferred, and pyrazine, pyrimidine, pyridazine, and triazine are more preferred.
- the number of carbon atoms in A is preferably 3 to 48, more preferably 3 to 24.
- the above A may have an alkali-soluble group, but preferably does not have an alkali-soluble group.
- the alkali-soluble group in this specification is not particularly limited and includes carboxy groups, hydroxyl groups, sulfo groups, phosphoric acid groups, acid anhydride groups, etc. Among these, carboxy groups and phenolic hydroxyl groups are preferred.
- the aromatic heterocycle in A has the above-mentioned effects, and in particular, can easily obtain a cured product (cured film) with excellent alkali solubility, and can easily synthesize a desired polymer. From this point of view, a nitrogen-containing aromatic ring is preferred.
- the nitrogen-containing aromatic ring is more preferably an aromatic ring having two or more nitrogen atoms, particularly preferably an aromatic ring having two or three nitrogen atoms.
- the above A is any group of the following group (A1).
- R in group (A1) is an organic group having 1 to 12 carbon atoms, preferably a hydrocarbon group having 1 to 12 carbon atoms.
- a bond in group (A1) where one bond destination is not defined (“-”) does not indicate a methyl group but a bond that is bonded to X or the like.
- the above-mentioned X is preferably -O- or -NH- from the viewpoint of easily forming a cured product (cured film) that is excellent in the above-mentioned effects in a well-balanced manner, and has low transmittance to light with a wavelength of 400 nm.
- -O- is more preferred because it can easily form a cured product (cured film) with better dielectric constant.
- polyethers in which X is -O- often have poor solubility in alkaline aqueous solutions, etc., but this polymer has poor solubility in alkaline aqueous solutions, etc. even if X is -O-. It is an excellent polymer.
- the plurality of Xs contained in the structural units represented by formulas (1) and (2) may be the same or different, but it is preferable that they be the same from the viewpoint of ease of synthesis.
- Said B is preferably a divalent group derived from the alkali-soluble group-containing compound (b) represented by the following formula (b).
- the structural units represented by formulas (1) and (2) contain a plurality of Bs, the plurality of Bs may be the same or different.
- B in the formula (1) is preferably a divalent group having an aromatic ring and an alkali-soluble group.
- the number of carbon atoms in B is preferably 5 to 48, more preferably 6 to 36.
- B in the formula (1) is preferably a group represented by any of the following formulas (B1) to (B10).
- B in the above formulas (1) and (2) is more preferably a group represented by any of the following formulas (B1) to (B7); ) to (B3) and (B5) are more preferable.
- C 1 is a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, and Y 1 and Y 2 are each Each of Z 1 and Z 2 is independently an alkali-soluble group, Z 1 and Z 2 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and Z 1 and Z 2 are each independently C 1 may be combined with to form a ring, n1 and n3 are each independently an integer of 0 to 2, provided that n1+n3 is an integer of 1 to 4, and n2 and n4 are each independently an integer of 1 to 4. It is an integer from 0 to 4, and * indicates a bond with X. ]
- C 1 are a single bond, an oxygen atom, a sulfur atom, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, -CH(CH 2 OH)-;
- a divalent organic group having 1 to 15 carbon atoms or a divalent halogenated group having 1 to 15 carbon atoms, which may contain these groups other than a single bond hereinafter also referred to as "heteroatom-containing substituent"
- An organic group more preferably a divalent hydrocarbon group having 1 to 15 carbon atoms.
- Examples of the organic group (organic group before containing a heteroatom-containing substituent and before halogenation) and the hydrocarbon group include a linear or branched alkyl group, a hydrocarbon group containing an alicyclic ring, or an aromatic ring. It will be done.
- the following C 2 to C 5 organic groups (organic groups before containing a hetero atom-containing substituent and before halogenation) include similar groups.
- the linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
- the alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms.
- the alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
- Y 1 and Y 2 are -OH and -COOH, with -OH being more preferred.
- Z 1 and Z 2 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- the number of carbon atoms in the alkyl group and R' is preferably 1 to 12, more preferably 1 to 8, and still more preferably 1 to 6. The same applies to the number of carbon atoms in the alkyl group and R' of Z 3 to Z 21 below.
- the number of carbon atoms in the aryl group and aryloxy group is preferably 6 to 20, more preferably 6 to 14. The same applies to the carbon numbers in the aryl groups and aryloxy groups Z 3 to Z 21 below.
- the number of carbon atoms in the aralkyl group and aralkyloxy group is preferably 7 to 32, more preferably 7 to 20. The same applies to the number of carbon atoms in the aralkyl group and aralkyloxy group of Z 3 to Z 21 below.
- n1 and n3 are preferably 1.
- n2 and n4 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- D 1 is a trivalent organic group containing no alkali-soluble group
- Y 3 is independently an alkali-soluble group
- Z 3 to Z 5 are each independently an alkali-soluble group. It is a monovalent organic group or a fluorine atom that does not contain a soluble group, and at least one selected from Z 3 and Y 3 may be combined with D 1 to form a ring
- n5 is 1 to 2 of is an integer
- n6 to n8 are each independently an integer of 0 to 4, and * indicates a bond with X.
- D 1 are a hydrocarbon group having 1 to 24 carbon atoms, a group in which part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom or halogen atom, a phosphorus atom or a phosphine oxide group, A hydrocarbon group having 1 to 12 carbon atoms is more preferred.
- Preferred examples of Y 3 are -OH and -COOH, with -OH being more preferred.
- Z 3 to Z 5 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n5 is preferably 1.
- n6 to n8 are preferably integers of 0 to 3, more preferably integers of 0 to 2, still more preferably 0 or 1, and particularly preferably 0.
- E 1 is a tetravalent organic group containing no alkali-soluble group
- Y 4 and Y 5 are each independently an alkali-soluble group
- Z 6 to Z 9 are each independently an alkali-soluble group.
- n9 and n11 are each independently an integer of 1 to 2
- n10 and n12 to n14 are each independently an integer of 0 to 4. is an integer
- * indicates the bond with X.
- a preferred example of E 1 is a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom, or halogen atom, and a group having 1 to 24 carbon atoms.
- the hydrocarbon group is more preferred.
- Examples of the hydrocarbon group include a hydrocarbon group containing a linear or branched alkyl group, an alicyclic ring, or an aromatic ring.
- the linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
- the alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms.
- the alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
- Y 4 and Y 5 are -OH and -COOH, with -OH being more preferred.
- Z 6 to Z 9 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n9 and n11 are preferably 1.
- n10 and n12 to n14 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- C 2 and C 3 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 6 and Y 7 are each independently an alkali-soluble group, Z 10 and Z 11 are each independently a monovalent organic group or a fluorine atom containing no alkali-soluble group, and n15 and n16 are each They are independently 0 or 1, provided that n15+n16 is 1 or 2, n17 and n18 are each independently an integer of 0 to 3, and * indicates a bond with X. ]
- C 2 and C 3 are a single bond, an oxygen atom or a sulfur atom, and a single bond is more preferable.
- Divalent organic groups not containing alkali-soluble groups at C 2 and C 3 include -O-, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, - CH(CH 2 OH)-; divalent organic group having 1 to 15 carbon atoms or divalent halogenated organic group having 1 to 15 carbon atoms, which may contain these groups (heteroatom-containing substituent) ; can be mentioned.
- Y 6 and Y 7 are -OH and -COOH, with -OH being more preferred.
- Suitable examples of Z 10 and Z 11 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n15 and n16 are preferably 1.
- n17 and n18 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- D 2 is a trivalent organic group containing no alkali-soluble group
- Z 12 and Z 13 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom.
- n19 and n20 are each independently an integer of 0 to 4, and * indicates a bond with X.
- D 2 is a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom, or halogen atom, and a group having 1 to 12 carbon atoms.
- the hydrocarbon group is more preferred.
- Z 12 and Z 13 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n19 and n20 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- D 3 and D 4 are each independently a trivalent organic group containing no alkali-soluble group
- Y 8 to Y 10 are each independently an alkali-soluble group
- Z 14 to Z 17 are each independently a monovalent organic group containing no alkali-soluble group or a fluorine atom
- n21, n23 and n25 are each independently an integer of 0 to 1, provided that n21+n23+n25 is is an integer from 1 to 3
- n22 and n24 are each independently an integer from 0 to 5
- n26 and n27 are each independently an integer from 0 to 4, and * indicates the bond with X. show.
- * indicates the bond with X. show.
- D 3 and D 4 are a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, a nitrogen atom, a sulfur atom, or a halogen atom; 1 to 12 hydrocarbon groups are more preferred.
- Y 8 to Y 10 are -OH and -COOH, with -OH being more preferred.
- Z 14 to Z 17 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n21, n23 and n25 are preferably 1.
- n22, n24, n26 and n27 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- C 4 and C 5 are each independently a divalent organic group not containing an alkali-soluble group, a single bond, an oxygen atom, a sulfur atom, -SO- or -SO 2 -, Y 11 to Y 13 are each independently an alkali-soluble group, Z 18 to Z 20 are each independently a monovalent organic group or fluorine atom containing no alkali-soluble group, and n28 and n32 are each n30 is independently an integer of 1 to 2, n29 and n33 are each independently an integer of 0 to 4, and n31 is independently an integer of 0 to 2. is an integer of 3, m is an integer of 1 to 3, and * indicates a bond with X. ]
- C 4 and C 5 are single bonds, oxygen atoms, sulfur atoms, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, -CH(CH 2 OH )-;
- Y 11 to Y 13 are -OH and -COOH, with -OH being more preferred.
- Z 18 to Z 20 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group.
- a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n28 and n32 are preferably 0 or 1.
- n30 is preferably 1.
- n29, n31 and n33 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- m is preferably 1 or 2.
- Y 14 is independently an alkali-soluble group
- Z 21 is independently a monovalent organic group or fluorine atom containing no alkali-soluble group
- n34 is 1 to 2 is an integer
- n35 is an integer from 0 to 3
- * indicates a bond with X.
- Preferred examples of Y 14 are -OH and -COOH, with -OH being more preferred.
- Z 21 are alkyl groups, alkoxy groups (-OR'), acyl groups (-OCR'), acyloxy groups (-OOCR'), aryl groups, aryloxy groups, aralkyl groups, aralkyloxy groups, and halogen atoms. , a nitro group, a cyano group, and an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
- n34 is preferably 1.
- n35 is preferably an integer of 0 to 2, more preferably 0 or 1, and even more preferably 0.
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 , n1 in formula (B1), Synonymous with n3 and *, R 6 is each independently a hydrogen atom or an alkyl group, preferably an alkyl group having 1 to 10 carbon atoms, G 1 is each independently a single bond or an oxygen atom, preferably a single bond, Each n is independently an integer of 0 to 3, preferably 0 or 1, and more preferably 0. ]
- Y 1 , Y 2 , Z 1 , Z 2 , n1, n3, n4 and * each independently represent Y 1 , Y 2 , Z 1 , Z 2 in formula (B1), Synonymous with n1, n3, n4 and *,
- R 6 is each independently a hydrogen atom or an alkyl group, preferably an alkyl group having 1 to 10 carbon atoms
- R 7 is a hydrogen atom or an organic group, preferably a hydrogen atom or an organic group having 10 or less carbon atoms, more preferably a hydrogen atom or an alkyl group having 1 to 10 carbon atoms
- R 6 and R 7 or adjacent R 6 and R 7 may be combined to form a ring, preferably a 5- or 6-membered ring
- G 1 is a single bond or an oxygen atom, preferably a single bond
- n is an integer from 0 to 3, preferably 0 or 1, and more preferably 0.
- the present polymer may have one or more types of structural units other than the structural unit represented by the formula (1) or the structural unit represented by the formula (2).
- the other structural units include a structural unit represented by the following formula (3), a structural unit represented by the following formula (4), and a terminal structure.
- the terminal structure may be a structure derived from a raw material (e.g., a compound represented by the following formulas (a) to (d)) constituting the structural unit represented by the following formulas (1) or (2), or the following terminal structure. Examples include structures derived from sealants.
- the content of the other structural units in the present polymer is preferably 60% by mass or less based on 100% by mass of all structural units constituting the present polymer, and the cured product has excellent flatness and a low coefficient of linear expansion. From the viewpoint of being able to easily form a cured film, the content is more preferably 1 to 30% by mass.
- a and X each independently have the same meaning as A and X in formula (1), and B' has an aromatic ring or aromatic heterocycle, and an alkali-soluble group It is a divalent group having no . ]
- a preferred example of B' is a group obtained by removing the alkali-soluble group from the group described as B above.
- the B' is preferably a group represented by the formula (B1) above, and a group in which n1 and n3 in the formula (B1) are 0.
- the B' is preferably a divalent group derived from the compound (c) represented by the following formula (c).
- A' is a divalent group having an aromatic ring (excluding aromatic heterocycles), and B and X each independently represent B and X in formula (1). are synonymous. ]
- a preferred example of A' is a phenylenediyl group or a phenylenediyl group having a substituent.
- substituent include organic groups having 1 to 12 carbon atoms, preferably hydrocarbon groups having 1 to 12 carbon atoms.
- the above A' is preferably a divalent group derived from the compound (d) represented by the following formula (d).
- the method for synthesizing the present polymer is not particularly limited, and conventionally known methods may be used.
- a method including a reaction step of reacting with compound (b) is preferred.
- one type of compound (a) may be used, two or more types of compounds (a) may be used, one type of compound (b) may be used, or two types of compounds (b) may be used.
- the above compound (b) may also be used.
- dihalogen compound (a) examples include 2,5-dichloropyrrole, 3,4-dichloropyrrole, 2,4-dichloroimidazole, 4,5-dichloroimidazole, 3,5-dichloropyrazole, and 2,4-dichloropyrrole.
- alkali-soluble group-containing compound (b) examples include compounds in which "-*" is replaced with "-M" in the above formulas (B1) to (B10).
- the above M is preferably -OH.
- Specific examples of the alkali-soluble group-containing compound (b) include compounds described in the following groups (b1) to (b8).
- a compound (c) represented by the following formula (c), a compound (d) represented by the following formula (d), and a terminal capping agent may be used. good.
- one type of compound (c) may be used, two or more types of compounds (c) may be used, one type of compound (d) may be used, two or more types of compounds (d) may be used, one type of terminal blocking agent may be used, or two or more types of terminal blocking agents may be used.
- the alkali-soluble group in the formulas (B1) to (B10) is hydrogen.
- examples include compounds in which atoms are used as atoms.
- the above M is preferably -OH.
- Specific examples of the compound (c) include compounds in which an alkali-soluble group other than M of the compounds described in the groups (b1) to (b8) is a hydrogen atom, and preferred examples include the following group (c1). ).
- the compound (d) examples include 1,2-dichlorobenzene, 1,3-dichlorobenzene, 1,4-dichlorobenzene, difluoro compounds in which the chlorine atom of these compounds is replaced with a fluorine atom, and these compounds.
- Examples include substituted compounds in which at least one hydrogen atom of is substituted with an organic group having 1 to 12 carbon atoms, preferably a hydrocarbon group having 1 to 12 carbon atoms.
- terminal capping agent examples include a monohalide in which one of the two L's in the compounds (a) and (d) is a hydrogen atom, and one of the compounds (b) and (c).
- Other examples include compounds in which M is a hydrogen atom (eg, monohydroxy compound).
- the reaction step can be synthesized by polymerizing monomers such as the compound (a) and the compound (b) in an appropriate solvent in the presence of an alkali metal compound such as potassium carbonate.
- an alkali metal compound such as potassium carbonate.
- the present polymer obtained in the above reaction step may be purified by a known method. For example, a method may be mentioned in which, after removing inorganic salts from the resulting polymer solution by filtration, the filtered solution is poured into an aqueous methanol solution or the like to precipitate the polymer.
- the reaction temperature in the reaction step is not particularly limited as long as the polymerization reaction proceeds, but from the viewpoint of suppressing side reactions, it is preferably 30 to 250°C, more preferably 40 to 180°C, and the reaction time is , preferably 0.5 to 100 hours, more preferably 1 to 24 hours.
- the amount of compound (a) used is preferably 40 to 60 mol%, more preferably 45 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
- the amount of compound (b) used is preferably 20 to 60 mol%, more preferably 30 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
- the compounds (a) and (d) and the compounds (b) and (c) The molar ratio of the amount used [(compounds (a) and (d))/(compounds (b) and (c))] is preferably 0.8 to 1.2, more preferably 0.9 to It is 1.1.
- the amount of compound (c) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
- the amount of compound (d) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
- alkali metal compound examples include alkali metals such as lithium, potassium, and sodium; alkali metal hydrides such as lithium hydride, potassium hydride, and sodium hydride; lithium hydroxide, potassium hydroxide, and sodium hydroxide; Alkali metal hydroxide; alkali metal carbonates such as lithium carbonate, potassium carbonate, and sodium carbonate; alkali metal bicarbonates such as lithium bicarbonate, potassium bicarbonate, and sodium bicarbonate; alkali metal alkoxides such as sodium ethoxide; sodium acetate , alkali metal acetates such as potassium acetate; alkali metal oxides such as lithium oxide; alkali metal phosphates such as trilithium phosphate, trisodium phosphate, tripotassium phosphate; alkali metal fluorides such as cesium fluoride.
- alkali metal hydrides such as lithium hydride, potassium hydride, and sodium hydride
- sodium, tripotassium phosphate, cesium fluoride, and the like are sodium, tripotassium phosphate, cesium fluoride, and the like.
- the alkali metal compound may be used alone or in combination of two or more.
- the amount of alkali metal atoms in the alkali metal compound is usually 2 to 6 times equivalent, preferably 2 to 6 times the amount of -M in the compounds (b) and (c). It is used in an amount of 5 times equivalent, more preferably 2.2 to 4 times equivalent.
- the solvent examples include aprotic solvents such as N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, dimethylsulfoxide, dimethylformamide, dimethylacetamide, cyclohexanone, cyclopentanone, and toluene;
- aprotic solvents such as N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, dimethylsulfoxide, dimethylformamide, dimethylacetamide, cyclohexanone, cyclopentanone, and toluene
- protic solvents such as propylene glycol monomethyl ether, ethyl lactate, and water.
- the solvent may be used alone or in combination of two or more.
- the weight average molecular weight (Mw) of the present polymer in terms of polystyrene is preferably 5,000 to 300,000, more preferably 10,000 to 200,000, and the molecular weight distribution (Mw/Mn ) is preferably 2.0 to 7.0, more preferably 2.0 to 5.0.
- This polymer is alkali-soluble and has excellent solubility in alkaline aqueous solutions.
- examples of the alkaline aqueous solution include the following alkaline developing solutions. Note that, if 1 g or more of the present polymer is dissolved in 100 g of a 2.38% by mass aqueous solution of tetramethylammonium hydroxide at 25° C., the present polymer can be said to be alkali-soluble. Whether or not it dissolves can be determined by the presence or absence of a precipitate.
- additives other than the present polymer may be used in the present composition as long as they do not impair the purpose and characteristics of the present invention.
- the other additives include photosensitive compounds, crosslinking agents, solvents, alkali-soluble polymers other than the present polymer, monocarboxylic acid compounds, adhesion aids, crosslinked fine particles, leveling agents, surfactants, and sensitizers. agents, inorganic fillers, quenchers (polymerization inhibitors), pigments, dispersants, antioxidants, and acid amplifiers.
- one type of other additive may be used, or two or more types of other additives may be used.
- the present composition preferably contains a photosensitive compound.
- a photosensitive compound When using a photosensitive compound in this composition, one type of photosensitive compound may be used, or two or more types of photosensitive compounds may be used.
- the photosensitive compound is not particularly limited, it is preferably a photosensitive acid generator that generates acid upon irradiation with light.
- a photosensitive acid generator that generates acid upon irradiation with light.
- a cured product (cured film) formed from the composition is exposed to light, acid is generated in the exposed area based on the photosensitive acid generator, and the effect of this acid is Based on this, the solubility of the exposed area in the alkaline aqueous solution changes.
- the present composition may be either positive type or negative type, but it is preferably positive type in order to better exhibit the effects of the present invention.
- the type of photosensitive compound can be appropriately selected depending on the desired properties of the composition, such as positive type or negative type.
- Examples of the photosensitive acid generator include compounds having a quinonediazide group, onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds.
- a compound having a quinonediazide group will also be referred to as a "quinonediazide compound”
- photosensitive acid generators other than this will also be referred to as “other acid generators”.
- the quinonediazide compound is a compound in which a quinonediazide group is decomposed by light irradiation to produce a carboxyl group.
- a resin film that is poorly soluble in an alkaline developer a resin film before light irradiation.
- a cured product cured film that is easily soluble in an alkaline developer can be formed. Therefore, a positive pattern can be formed using the present composition containing such a quinonediazide compound.
- the other acid generator is a compound that forms an acid upon irradiation with light.
- a resin film (resin film before light irradiation) that is easily soluble in an alkaline developer can be formed.
- the acid generated by the light irradiation interacts with the crosslinking agent described below to form a crosslinked structure, forming a cured product (cured film) that is hardly soluble in an alkaline developer. can do. Therefore, a negative pattern can be formed using the present composition containing such other acid generator.
- quinonediazide compound examples include a condensate of a phenolic compound or an alcoholic compound (hereinafter also referred to as "mother core") and an orthonaphthoquinonediazide compound.
- mother core an alcoholic compound
- orthonaphthoquinonediazide compound examples include a condensate of a phenolic compound or an alcoholic compound (hereinafter also referred to as "mother core") and an orthonaphthoquinonediazide compound.
- a quinonediazide compound in the present composition one type of quinonediazide compound may be used, or two or more types of quinonediazide compounds may be used.
- the mother nucleus examples include compounds described in JP-A No. 2014-186300, and phenolic compounds are preferred.
- the orthonaphthoquinonediazide compound is preferably 1,2-naphthoquinonediazide sulfonic acid halide.
- quinonediazide compounds include 4,4'-dihydroxydiphenylmethane, 2,3,4,2',4'-pentahydroxybenzophenone, 2,3,4,4'-tetrahydroxybenzophenone, tri(p-hydroxy phenyl)methane, 1,1,1-tri(p-hydroxyphenyl)methane, 1,1,1-tri(p-hydroxyphenyl)ethane, 1,1-bis(4-hydroxyphenyl)-1-phenylethane , 1,3-bis[1-(4-hydroxyphenyl)-1-methylethyl]benzene, 1,4-bis[1-(4-hydroxyphenyl)-1-methylethyl]benzene, 4,6-bis [1-(4-hydroxyphenyl)-1-methylethyl]-1,3-dihydroxybenzene, and 4,4'-[1-[4-[1-[4-[1-[4-hydroxyphenyl]-1-methylethyl Examples include ester compounds of
- the usage ratio of the orthonaphthoquinonediazide compound to the mother nucleus is preferably 30 to 85 mol%, more preferably 50 to 70 mol%, based on the number of OH groups in the mother nucleus. It is desirable that the amount corresponds to %.
- the content of the quinonediazide compound is preferably 5 to 50 parts by weight, more preferably 10 to 30 parts by weight, based on 100 parts by weight of the present polymer. More preferably, it is 15 to 30 parts by mass.
- the content of the quinonediazide compound is equal to or higher than the lower limit, the residual film rate in the non-exposed areas improves, and an image faithful to the mask pattern is likely to be obtained.
- the content of the quinonediazide compound is below the upper limit, a cured product (cured film) with a desired shape (pattern shape) can be easily obtained, and foaming during film formation tends to be suppressed.
- Examples of the other acid generator include onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds.
- the other acid generator include onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds.
- one type of other acid generator may be used, or two or more types of other acid generators may be used.
- onium salt compounds include iodonium salts, sulfonium salts, phosphonium salts, diazonium salts, and pyridinium salts.
- Suitable examples of onium salts include diphenyliodonium trifluoromethanesulfonate, diphenyliodonium p-toluenesulfonate, diphenyliodonium hexafluoroantimonate, diphenyliodonium hexafluorophosphate, diphenyliodonium tetrafluoroborate, triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium p-Toluenesulfonate, triphenylsulfonium hexafluoroantimonate, 4-t-butylphenyl diphenylsulfonium trifluoromethanesulfonate, 4-t-butylpheny
- halogen-containing compound examples include a haloalkyl group-containing hydrocarbon compound and a haloalkyl group-containing heterocyclic compound.
- Preferred examples of halogen-containing compounds include 1,10-dibromo-n-decane; 1,1-bis(4-chlorophenyl)-2,2,2-trichloroethane; phenyl-bis(trichloromethyl)-s-triazine; 4-methoxyphenyl-bis(trichloromethyl)-s-triazine, styryl-bis(trichloromethyl)-s-triazine, naphthyl-bis(trichloromethyl)-s-triazine, 2-[2-(5-methylfuran-) Examples include s-triazine derivatives such as 2-yl)ethenyl]-4,6-bis-(trichloromethyl)-1,3,5-triazine.
- sulfone compound examples include ⁇ -ketosulfone compounds, ⁇ -sulfonylsulfone compounds, and ⁇ -diazo compounds of these compounds.
- Preferred examples of the sulfone compound include 4-trisphenacylsulfone, mesitylphenacylsulfone, and bis(phenacylsulfonyl)methane.
- sulfonic acid compound examples include alkyl sulfonic esters, haloalkyl sulfonic esters, arylsulfonic esters, and iminosulfonates. Suitable examples of the sulfonic acid compound include benzoin tosylate, pyrogallol tristrifluoromethanesulfonate, o-nitrobenzyl trifluoromethanesulfonate, and o-nitrobenzyl p-toluenesulfonate.
- sulfonimide compound examples include N-(trifluoromethylsulfonyloxy)succinimide, N-(trifluoromethylsulfonyloxy)phthalimide, N-(trifluoromethylsulfonyloxy)diphenylmaleimide, N-(trifluoromethylsulfonyloxy) ) Bicyclo[2.2.1]hept-5-ene-2,3-dicarboximide and N-(trifluoromethylsulfonyloxy)naphthylimide.
- diazomethane compound examples include bis(trifluoromethylsulfonyl)diazomethane, bis(cyclohexylsulfonyl)diazomethane, and bis(phenylsulfonyl)diazomethane.
- the content of the other acid generator is preferably 0.1 to 10 parts by mass, and more preferably 0.1 to 10 parts by mass, based on 100 parts by mass of the present polymer.
- the amount is preferably 0.3 to 5 parts by weight, more preferably 0.5 to 5 parts by weight.
- the composition may further contain a crosslinking agent to improve curability.
- a crosslinking agent to improve curability.
- the crosslinking agent acts, for example, as a crosslinking component (curing component) that reacts with the present polymer and the crosslinking agents.
- one type of crosslinking agent may be used, or two or more types of crosslinking agents may be used.
- the crosslinking agent is preferably a compound having two or more crosslinkable groups.
- the crosslinkable group is not particularly limited, but is preferably at least one selected from the group consisting of a methylol group, an alkoxymethyl group, and a glycidyl group in terms of high crosslinking reactivity. At least one selected from the group consisting of:
- the number of crosslinkable groups that one molecule of the crosslinking agent has is, for example, 2 to 10, preferably 2 to 8.
- Specific examples of the crosslinking agent include compounds described in JP 2022-67054 A, WO 2014/109143, and the like.
- the content of the crosslinking agent in the present composition is usually 1 to 60 parts by weight, preferably 5 to 50 parts by weight, and more preferably is 5 to 40 parts by mass.
- the content of the crosslinking agent is within the above range, a cured product (cured film) with excellent resolution, elongation properties, and heat resistance tends to be easily formed.
- the adhesion aid is preferably a component that can improve the adhesion between the resin film formed using the present composition and the adherend (substrate).
- the adhesion aid is preferably a functional silane coupling agent having a reactive functional group. Examples of the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
- functional coupling agents include trimethoxysilylbenzoic acid, 3-glycidyloxypropyltrimethoxysilane, 3-glycidyloxypropyltriethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxy Examples include silane, 3-(meth)acryloyloxypropyltrimethoxysilane, 3-(meth)acryloyloxypropyltriethoxysilane, vinyltriacetoxysilane, vinyltrimethoxysilane, and 3-isocyanatopropyltriethoxysilane.
- the content of the adhesion aid in the composition is preferably 0.01 parts by mass or more and 30 parts by mass based on 100 parts by mass of the present polymer contained in the composition. parts, more preferably 0.1 parts by mass or more and 20 parts by mass or less.
- the composition contains a solvent.
- a solvent By using a solvent, it is possible to improve the handleability of the present composition and to adjust the viscosity and storage stability.
- one type of solvent may be used, or two or more types of solvents may be used.
- the solvent examples include ethylene glycol monoalkyl ether acetates such as ethylene glycol monomethyl ether acetate and ethylene glycol monoethyl ether acetate; propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, and propylene glycol monobutyl ether.
- propylene glycol monoalkyl ethers such as propylene glycol dimethyl ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, propylene glycol dibutyl ether; propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene Propylene glycol monoalkyl ether acetates such as glycol monopropyl ether acetate and propylene glycol monobutyl ether acetate; cellosolves such as ethyl cellosolve and butyl cellosolve; diethylene glycol monoalkyl ethers such as diethylene glycol monomethyl ether and diethylene glycol monoethyl ether; diethylene glycol dimethyl ether and diethylene glycol Diethylene glycol dialkyl ethers such as methyl ethyl ether; dipropylene glycol monoalkyl ethers such as dipropylene glycol monomethyl
- Lactic acid esters such as methyl lactate, ethyl lactate, n-propyl lactate, isopropyl lactate; ethyl acetate, n-propyl acetate, isopropyl acetate, n-butyl acetate, isobutyl acetate, n-amyl acetate, isoamyl acetate, Aliphatic carboxylic acid esters such as isopropyl propionate, n-butyl propionate, isobutyl propionate; methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, Other esters such as methyl pyruvate and ethyl pyruvate; Ketones such as 2-heptanone, 3-heptanone, 4-heptanone, and cyclohexanone; N-dimethyl
- the content of the solvent in the present composition is usually 40 to 900 parts by mass, preferably 60 to 900 parts by mass, based on a total of 100 parts by mass of components other than the solvent in the composition. It is 400 parts by mass.
- the aforementioned composition can be suitably used as a positive composition.
- the present composition is preferably of positive type, but may be of negative type.
- the negative-type composition of the present invention will be explained.
- the negative-type present composition is not particularly limited as long as it contains the present polymer, but it also includes a resin containing one or more polymerizable monomers and one or more photopolymerization initiators. It is preferably a composition, and may also contain other components.
- the polymerizable monomer is a compound having one or more polymerizable groups, preferably two or more.
- the polymerizable group include an ethylenically unsaturated group, an oxiranyl group, an oxetanyl group, and an N-alkoxymethylamino group.
- ethylenically unsaturated groups and N-alkoxymethylamino groups are preferred in terms of high polymerizability, and vinyl group-containing groups such as (meth)acryloyl groups, vinyl groups, and vinyl phenyl groups are preferred.
- the polymerizable monomer is preferably a compound having two or more (meth)acryloyl groups, or a compound having two or more N-alkoxymethylamino groups, and two or more (meth)acryloyl groups.
- Compounds having an acryloyl group are particularly preferred.
- the number of polymerizable groups that one molecule of the polymerizable monomer has is preferably 2 to 10, more preferably 2 to 8.
- compounds having two or more (meth)acryloyl groups include polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid, and caprolactone-modified polyhydroxyl groups.
- Functional (meth)acrylates, alkylene oxide-modified polyfunctional (meth)acrylates, polyfunctional urethane (meth)acrylates obtained by reacting (meth)acrylates with hydroxyl groups and polyfunctional isocyanates, (meth)acrylates with hydroxyl groups examples include polyfunctional (meth)acrylates having a carboxy group obtained by reacting with acid anhydrides.
- Examples of the compound having two or more N-alkoxymethylamino groups include compounds having a melamine structure, a benzoguanamine structure, and a urea structure.
- the melamine structure and benzoguanamine structure refer to a chemical structure having one or more triazine rings or phenyl-substituted triazine rings as a basic skeleton, and are concepts that also include melamine, benzoguanamine, or condensates thereof.
- N-alkoxymethylamino groups include N,N,N',N',N'',N'-hexa(alkoxymethyl)melamine, N,N,N' , N'-tetra(alkoxymethyl)benzoguanamine, and N,N,N',N'-tetra(alkoxymethyl)glycoluril.
- polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid, caprolactone-modified polyfunctional (meth)acrylates, Polyfunctional urethane (meth)acrylate, polyfunctional (meth)acrylate with carboxy group, N, N, N', N', N'', N''-hexa(alkoxymethyl)melamine, N, N, N' , N'-tetra(alkoxymethyl)benzoguanamine is preferred, and polyfunctional (meth)acrylates and polyfunctional urethane (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid; A polyfunctional (meth)acrylate having a carboxyl group is more preferred, and a polyfunctional (meth)acrylate obtained by reacting an aliphatic polyhydroxy compound having a valence of 3 or more with (meth)acrylic acid is even more preferred
- polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid include pentaerythritol tri(meth)acrylate and dipentaerythritol di(meth)acrylate. , dipentaerythritol tri(meth)acrylate, dipentaerythritol tetra(meth)acrylate, dipentaerythritol penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, trimethylolpropane di(meth)acrylate, polypentaerythritol poly (Meth)acrylates are mentioned.
- pentaerythritol triacrylate, dipentaerythritol pentaacrylate, and dipentaerythritol hexa(meth) have higher intermolecular or intramolecular crosslinking density and can further improve the curability of the film even by low-temperature firing.
- Acrylates are particularly preferred.
- the content of the polymerizable monomer in the composition is preferably 10 parts by mass or more based on 100 parts by mass of the polymer contained in the composition. , more preferably 20 parts by mass or more, preferably 1000 parts by mass or less, more preferably 500 parts by mass or less.
- the content of the polymerizable monomer is within the above range, sufficient curability and sufficient alkali developability can be ensured as a cured film, and there is no background stain or film residue on the substrate or light-shielding layer in non-exposed areas. This method is preferable because it can sufficiently suppress the occurrence of such problems.
- the photopolymerization initiator is preferably a compound that is sensitive to actinic rays with a wavelength of 300 nm or more (preferably 300 to 450 nm) and initiates and promotes polymerization of the polymerizable monomer.
- a photopolymerization initiator that is not directly sensitive to actinic rays with a wavelength of 300 nm or more, by using it in combination with a sensitizer, it becomes sensitive to actinic rays with a wavelength of 300 nm or more and starts polymerization of the polymerizable monomer, It may also be promoted.
- photopolymerization initiator known compounds can be used. Specific examples include oxime ester compounds, organic halogenated compounds, oxydiazole compounds, carbonyl compounds, ketal compounds, benzoin compounds, acridine compounds, organic peroxide compounds, azo compounds, coumarin compounds, azide compounds, metallocene compounds, hexa Examples include arylbiimidazole compounds, organic boric acid compounds, disulfonic acid compounds, ⁇ -aminoketone compounds, onium salt compounds, and acylphosphine (including acylphosphine oxide) compounds.
- At least one selected from the group consisting of an oxime ester compound, an ⁇ -aminoketone compound, and a hexaarylbiimidazole compound is preferred from the viewpoint of increasing the sensitivity of the present composition.
- -Aminoketone compounds are more preferred.
- the content of the photopolymerization initiator in the present composition is preferably 1 part by mass or more, more preferably 1 part by mass or more, based on 100 parts by mass of the present polymer contained in the composition.
- the amount is preferably 2 parts by weight or more, more preferably 5 parts by weight or more, preferably 40 parts by weight or less, more preferably 30 parts by weight or less, even more preferably 20 parts by weight or less.
- the other components are components other than the polymerizable monomer and photopolymerization initiator, and specific examples include adhesion aids, solvents, sensitizers, crosslinking agents, and surfactants (fluorinated surfactants, etc.). surfactants, silicone surfactants, nonionic surfactants, etc.), and antioxidants. These other components may be used alone or in combination of two or more.
- the adhesion aid is preferably a component that can improve the adhesion between the cured film formed using the present composition and the adherend (substrate).
- the adhesion aid is preferably a functional silane coupling agent having a reactive functional group.
- the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
- the functional coupling agent include the same compounds as the functional coupling agents described in the section of other additives above.
- the content of the adhesion aid is preferably 0.01 parts by mass or more and 30 parts by mass based on 100 parts by mass of the present polymer contained in the present composition. parts, more preferably 0.1 parts by mass or more and 20 parts by mass or less.
- the solvent is preferably an organic solvent that dissolves each component included in the present composition and does not react with each component.
- examples of the solvent include the same solvents as those described in the column of other additives.
- the content of the solvent is preferably 50 to 95% by mass, more preferably 60 to 90% by mass, based on 100% by mass of the present composition.
- This composition can be prepared by (uniformly) mixing each component to be blended, and during this mixing, each component may be added and mixed at once, or it may be added in multiple steps. ⁇ May be mixed.
- the composition may be prepared at room temperature or by heating as appropriate. Further, in order to remove dust and the like, after the components to be blended are mixed (uniformly), the resulting mixture may be filtered using a filter or the like.
- a cured product according to one embodiment of the present invention (hereinafter also referred to as "main cured product") is formed using the present composition.
- the cured product has excellent sensitivity, transparency to light at a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low linear expansion coefficient, and bending resistance in a well-balanced manner. Therefore, this cured product can be suitably used as an (interlayer) insulating film, surface protection film, planarization film, etc. used in electronic components such as circuit boards, high-density mounting boards, semiconductor elements, semiconductor packages, and display elements. Can be done.
- a preferred example of the cured product is a cured film, particularly a patterned cured film, and a preferred manufacturing example of a patterned cured film is shown below.
- a preferred manufacturing example of this patterned cured film includes a step of coating the present composition on a support to form a resin film (coating step), and a step of exposing the resin film to light through a desired mask pattern (exposure step). step), and the resin film after the exposure step is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the exposed areas in the case of a negative type, thereby forming the desired image on the support.
- the method includes a step (developing step) of forming a cured film having a pattern (patterned cured film).
- the present composition is coated onto a support so that the thickness of the patterned cured film finally obtained is, for example, 0.1 to 100 ⁇ m. It is preferable to form a resin film on the support by heating the present composition coated on the support, usually at 50 to 140° C. for 10 to 360 seconds, using an oven, hot plate, or the like.
- Examples of the support include silicon wafers, compound semiconductor wafers, wafers with metal thin films, glass substrates, quartz substrates, ceramic substrates, aluminum substrates, and substrates having semiconductor chips on the surfaces of these supports.
- Examples of the coating method include a dipping method, a spray method, a bar coating method, a roll coating method, a spin coating method, a curtain coating method, a gravure printing method, a silk screen method, and an inkjet method.
- the resin film obtained in the coating step is exposed to light through a desired mask pattern using, for example, a contact aligner, a stepper, or a scanner.
- the shape of the pattern is not particularly limited and may be selected as appropriate depending on the desired use, but examples include line and space patterns, dot patterns, hole patterns (e.g. square contact hole patterns), and lattice patterns. Can be mentioned.
- the exposure light examples include ultraviolet rays and visible light, and usually light with a wavelength of 200 to 500 nm (eg, i-line (365 nm)).
- the amount of exposure varies depending on the type of each component in the composition, the blending ratio, the thickness of the resin film, etc., but when using i-line as the exposure light, the amount of exposure is usually 10 to 10,000 J/ m2 . be.
- heat treatment may be performed after exposure.
- the conditions for the heat treatment are not particularly limited and vary depending on the content of each component in the composition and the thickness of the resin film, but are usually 70 to 150°C, preferably 80 to 120°C, for 1 to 60 minutes. That's about it.
- the resin film after the exposure process is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the non-exposed areas in the case of a negative type.
- a desired patterned cured film is formed on the support. Note that the obtained patterned cured film may be washed with water or the like and dried, if necessary.
- Examples of the developing method include a shower developing method, a spray developing method, an immersion developing method, a paddle developing method, and the like.
- the developing conditions are usually 20 to 40°C for about 1 to 10 minutes.
- the alkaline developer examples include an alkaline developer in which an alkaline compound such as sodium hydroxide, potassium hydroxide, aqueous ammonia, tetramethylammonium hydroxide, choline, etc. is dissolved in water to a concentration of 1 to 10% by mass.
- an alkaline compound such as sodium hydroxide, potassium hydroxide, aqueous ammonia, tetramethylammonium hydroxide, choline, etc.
- water examples include aqueous solutions.
- An appropriate amount of a water-soluble organic solvent such as methanol or ethanol, a surfactant, or the like may be added to the alkaline aqueous solution.
- a curing process is performed to sufficiently harden the patterned cured film after the development process by heating, etc. Good too.
- the conditions for the curing step are not particularly limited and may be set appropriately depending on the intended use of the cured film, but include, for example, heating conditions at 100 to 250° C. for about 30 minutes to 10 hours.
- the display element according to an embodiment of the present invention is not particularly limited as long as it has the cured product, and it has one or more cured films selected from an (interlayer) insulating film, a surface protection film, and a flattening film. It is preferable.
- the display element is suitably used, for example, in a display device such as a liquid crystal display device or an organic EL display device.
- the liquid crystal display device may include a backlight unit using a white LED as a light source in addition to a cold cathode fluorescent lamp (CCFL).
- Examples of the organic EL display device include organic EL display devices having a top emission type structure, a bottom emission type structure, and the like.
- the display element can be suitably used for various purposes, and specific examples include watches, portable game machines, word processors, notebook computers, car navigation systems, camcorders, PDAs, digital cameras, mobile phones, smartphones, It can be used in various display devices such as various monitors, liquid crystal televisions, and information displays.
- DH-1 4,6-dichloropyrimidine
- DH-2 2,4-dichloro-1,3,5-triazine
- DH-3 2,6-dichloropyrimidine
- DH-4" 2 ,6-dichloropyrazine
- DH-5" 2,4-dichloro-6-phenyl-1,3,5-triazine
- DH-6 Bis(4-fluorophenyl)sulfone
- alkali-soluble group-containing compounds in Table 1 are as follows.
- AD-1 4,4',4''-trihydroxytriphenylmethane
- AD-2 ⁇ , ⁇ , ⁇ '-tris(4-hydroxyphenyl)-1-ethyl-4-isopropylbenzene
- AD-3 5,5',6,6'-tetrahydroxy-3,3,3',3'-tetramethyl-1,1'-spirobiindane
- AD-4" 1,3,5-tri Hydroxybenzene
- AD-5" 1,4-bis(3,4-dihydroxyphenyl)-2,3-dimethylbutane
- AD-6 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane
- AD-7 3,5-dihydroxybenzoic acid
- AD-8 4,4-bis(4-hydroxyphenyl)valeric acid
- AD-9 2,2-bis(3-amino-4- Hydroxyphenyl)propane
- AD-10 3,5-dihydroxybenzoic acid
- BP-1 2,2-bis(4-hydroxyphenyl)propane
- BP-2 2,2-bis(4-hydroxyphenyl)hexafluoropropane
- BP-3 1,1-bis( 4-hydroxyphenyl)-3,3,5-trimethylcyclohexane
- BP-4" ⁇ , ⁇ '-bis(4-hydroxyphenyl)-1,4-diisopropylbenzene
- BP-5" 9,9-bis (4-hydroxyphenyl)fluorene
- the precipitate obtained by reprecipitating in methanol was filtered, and the filtered material was vacuum-dried at room temperature for 8 hours to obtain a solid. Further, the obtained filtrate was added to methanol, and the precipitated solid matter was washed with an aqueous methanol solution. Polymer P-14 (acrylic resin) was obtained by drying the solid material after vacuum drying and the solid material washed with an aqueous methanol solution.
- polyimide solution containing 15% by mass of polyimide with an imidization rate of about 70%.
- the obtained polyimide solution was added to methanol, the precipitated solid was washed with an aqueous methanol solution, and the obtained solid was dried to obtain polymer P-15 (polyimide).
- ⁇ GPC column A combination of GPC-KF-801, GPC-KF-802, GPC-KF-803, and GPC-KF-804 manufactured by Shimadzu GLC ⁇ Mobile phase: Tetrahydrofuran ⁇ Column temperature: 40°C ⁇ Flow rate: 1.0mL/min ⁇ Sample concentration: 1.0% by mass ⁇ Sample injection amount: 100 ⁇ L ⁇ Detector: Differential refractometer ⁇ Standard material: Monodisperse polystyrene
- NMP N-methyl-2-pyrrolidone
- BC butyl cellosolve
- the transmittance was evaluated as "A” when the transmittance of light with a wavelength of 400 nm was 90% or more, “B” when it was 80% or more and less than 90%, and "C” when it was less than 80%.
- the results are shown in Table 2. When the evaluation result was “A” or “B”, the transmittance was evaluated as good, and when the evaluation result was "C”, the transmittance was evaluated as poor.
- the dielectric constant was measured by the CV method at a frequency of 10 kHz using an HP16451B electrode and HP4284A precision LCR meter manufactured by Hewlett-Packard Japan LLC.
- the dielectric constant is 3.3 or less, it is designated as "A”, when it exceeds 3.3 and 3.6 or less, it is designated as “B”, and when it exceeds 3.6, it is designated as "C”. evaluated.
- the results are shown in Table 2. When the evaluation result was "A” or "B”, the dielectric constant was evaluated to be good, and when the evaluation result was "C”, the dielectric constant was evaluated to be poor.
- Positive resist preparation 100 parts by mass of polymer P-1 and a quinonediazide compound (4,4'-[1-[4-[1-[4-hydroxyphenyl]-1- 20 parts by mass of a condensate of methylethyl[phenyl]ethylidene]bisphenol (1.0 mol) and 1,2-naphthoquinonediazide-5-sulfonic acid chloride (2.0 mol), and an adhesion aid ( ⁇ -glycide). 5 parts by mass of sidoxypropyltrimethoxysilane) and 0.5 parts by mass of a surfactant ("FTX-218" manufactured by Neos Co., Ltd.) were mixed.
- FTX-218 a surfactant manufactured by Neos Co., Ltd.
- a mixed solution of diethylene glycol methyl ethyl ether and cyclohexanone was added as a solvent so that the solid content concentration was 20% by mass.
- a composition positive resist was prepared by filtering through a membrane filter with a pore size of 0.2 ⁇ m.
- Examples 2 to 17 and Comparative Examples 1 to 4 Using the type of polymer listed in Table 3, in addition to the photosensitive compound, adhesion aid, surfactant, and solvent used in Example 1, the additives listed in Table 3 were added in the amounts listed in Table 3. A composition (positive resist) was prepared in the same manner as in Example 1 except that (parts by mass) was used.
- a composition (positive resist) prepared using a spin coater was applied onto a silicon substrate on which a line-and-space pattern with a depth of 2.0 ⁇ m and a width of 20 ⁇ m was formed. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 ⁇ m. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute.
- the resulting coating film was exposed to light using an exposure machine ("MPA-600FA” manufactured by Canon Co., Ltd.) at a cumulative dose of 9,000 J/ m2 , and the substrate with the coating film after exposure was exposed to nitrogen.
- An insulating film was formed on the substrate by heating at 230° C. for 1 hour in a replaced clean oven.
- the surface shape of the insulating film of the obtained insulating film-coated substrate was observed using a needle contact measuring device ("AS200” manufactured by KLA Tencor), and the difference in height between the highest and lowest parts of the unevenness of the insulating film was observed. ( ⁇ H) was used as an index of flatness.
- a composition (positive resist) prepared using a spin coater was applied onto a polyimide film substrate. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 ⁇ m. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. The obtained coating film was heated at 230° C. for 1 hour in a clean oven to form a cured film on the substrate.
- the obtained substrate with a cured film was cut into a size of 50 mm in length x 50 mm in width.
- the cured film-coated substrate was bent for 10 minutes with the cured film facing inward so that the cured films were in contact with each other.
- the bent substrate with the cured film was opened, and the bent portion of the surface of the cured film was observed using an optical microscope to evaluate changes in appearance.
- Bending property bending resistance: "A" if there are no cracks in the cured film, "B” if there are cracks in a part of the cured film, and "C” if there are cracks in the entire cured film. was evaluated. The results are shown in Table 3.
- Add-1 to Add-6 in Table 3 are as follows.
- “Add-1” A compound represented by the following formula (Add-1)
- “Add-2” A compound represented by the following formula (Add-2)
- “Add-3” A compound represented by the following formula (Add-3)
- Compound represented by “Add-4" Compound represented by the following formula (Add-4)
- “Add-5" Compound represented by the following formula (Add-5)
- “Add-6” Bisphenol A type epoxy Resin (“EP157S65” manufactured by Mitsubishi Chemical Corporation)
- Negative resist preparation 100 parts by mass of polymer P-1, 5 parts by mass of an O-acyl oxime compound ("Irgacure OXE01" manufactured by BASF) as a photopolymerization initiator, and a polymerizable monomer ( 30 parts by mass of a mixture of dipentaerythritol penta(meth)acrylate and dipentaerythritol hexa(meth)acrylate), 5 parts by mass of an adhesion aid ( ⁇ -glycidoxypropyltrimethoxysilane), and a surfactant ( 0.5 part by mass of "FTX-218" (manufactured by Neos Co., Ltd.) was mixed.
- an O-acyl oxime compound (“Irgacure OXE01" manufactured by BASF)
- a polymerizable monomer 30 parts by mass of a mixture of dipentaerythritol penta(meth)acrylate and dipentaerythritol
- the composition (negative resist) was filtered through a membrane filter with a pore size of 0.2 ⁇ m. Prepared. Using the prepared negative resist, sensitivity, flatness, and bending properties were evaluated in the same manner as described above, and good sensitivity, flatness, and bending properties were confirmed for the negative resist as well.
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Materials For Photolithography (AREA)
Abstract
One embodiment of the present invention relates to a polymer, a composition, a cured product, or a display element. The composition comprises a polymer having a structural unit represented by formula (1). [In formula (1), A is a divalent group having an aromatic heterocyclic ring, B is a divalent group having an aromatic ring or an aromatic heterocyclic ring and having an alkali-soluble group, and X is independently -O-, -NH- or -S-.]
Description
本発明の一実施形態は、重合体、組成物、硬化物又は表示素子に関する。
One embodiment of the present invention relates to a polymer, a composition, a cured product, or a display element.
近年の半導体回路基板等は、集積度の向上等に伴ってパターンの微細化が進んでおり、該半導体回路基板等に用いられる絶縁膜なども、ファインピッチの電極パッド間や配線間に応じたパターンを有することが求められている。このようなパターンを有する絶縁膜等の樹脂膜を形成するための組成物には、露光及び現像等によるパターン化が可能なフォトリソグラフィー性が求められている。
In recent years, the patterns of semiconductor circuit boards, etc. have become finer as the degree of integration has improved, and the insulating films used for these semiconductor circuit boards, etc., have also become smaller to accommodate the fine pitch between electrode pads and wiring lines. It is required to have a pattern. A composition for forming a resin film such as an insulating film having such a pattern is required to have photolithographic properties that allow patterning by exposure, development, and the like.
このようなフォトリソグラフィー性を有する組成物、特に、感度や解像度に優れる組成物に関し、様々な感光性組成物が提案されている(例えば、特許文献1~3参照)。
Various photosensitive compositions have been proposed regarding such compositions having photolithographic properties, particularly compositions with excellent sensitivity and resolution (see, for example, Patent Documents 1 to 3).
近年の表示素子等の高性能化に伴い、多量の電流が必要とされることから、このような表示素子等に用いられる絶縁膜等の樹脂膜には低誘電特性が求められ、耐熱性が求められている。
また、前記感度に関し、波長400nmの光の高い透過性が求められることがあり、さらに、近年の表示素子等に用いられる絶縁膜等の樹脂膜には、平坦性、低線膨張係数、耐折り曲げ性等が求められることもある。 As the performance of display elements has improved in recent years, large amounts of current are required, so resin films such as insulating films used in such display elements are required to have low dielectric properties and heat resistance. It has been demanded.
Regarding the sensitivity, high transparency of light with a wavelength of 400 nm is sometimes required, and resin films such as insulating films used in recent display elements are required to have flatness, low coefficient of linear expansion, and bending resistance. Gender, etc. may also be required.
また、前記感度に関し、波長400nmの光の高い透過性が求められることがあり、さらに、近年の表示素子等に用いられる絶縁膜等の樹脂膜には、平坦性、低線膨張係数、耐折り曲げ性等が求められることもある。 As the performance of display elements has improved in recent years, large amounts of current are required, so resin films such as insulating films used in such display elements are required to have low dielectric properties and heat resistance. It has been demanded.
Regarding the sensitivity, high transparency of light with a wavelength of 400 nm is sometimes required, and resin films such as insulating films used in recent display elements are required to have flatness, low coefficient of linear expansion, and bending resistance. Gender, etc. may also be required.
本発明の一実施形態は、感度、波長400nmの光の透過性、耐熱性、低比誘電率、平坦性、低線膨張係数及び耐折り曲げ性にバランスよく優れる硬化物(硬化膜)を形成可能な組成物及び重合体を提供する。
An embodiment of the present invention can form a cured product (cured film) that is excellent in sensitivity, transparency of light with a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low coefficient of linear expansion, and bending resistance in a well-balanced manner. The present invention provides compositions and polymers.
本発明の構成例は以下の通りである。
A configuration example of the present invention is as follows.
[1] 下記式(1)で表される構造単位を有する重合体を含む、組成物。
[1] A composition containing a polymer having a structural unit represented by the following formula (1).
Bは、芳香環又は芳香族複素環を有し、且つ、アルカリ可溶性基を有する2価の基であり、
Xは独立して、-O-、-NH-又は-S-である。]
B is a divalent group having an aromatic ring or an aromatic heterocycle and having an alkali-soluble group,
X is independently -O-, -NH- or -S-. ]
[2] 前記Aにおける芳香族複素環が、窒素含有芳香環である、[1]に記載の組成物。
[3] 前記Aにおける芳香族複素環が、窒素原子を2つ以上有する芳香環である、[1]または[2]に記載の組成物。 [2] The composition according to [1], wherein the aromatic heterocycle in A is a nitrogen-containing aromatic ring.
[3] The composition according to [1] or [2], wherein the aromatic heterocycle in A is an aromatic ring having two or more nitrogen atoms.
[3] 前記Aにおける芳香族複素環が、窒素原子を2つ以上有する芳香環である、[1]または[2]に記載の組成物。 [2] The composition according to [1], wherein the aromatic heterocycle in A is a nitrogen-containing aromatic ring.
[3] The composition according to [1] or [2], wherein the aromatic heterocycle in A is an aromatic ring having two or more nitrogen atoms.
[4] 前記Xが-O-又は-NH-である、[1]~[3]のいずれかに記載の組成物。
[4] The composition according to any one of [1] to [3], wherein the X is -O- or -NH-.
[5] 前記Bが、下記式(B1)~(B10)のいずれかで表される基である、[1]~[4]のいずれかに記載の組成物。
[5] The composition according to any one of [1] to [4], wherein B is a group represented by any of the following formulas (B1) to (B10).
[6] 前記Bにおけるアルカリ可溶性基が、フェノール性水酸基又はカルボキシ基である、[1]~[5]のいずれかに記載の組成物。
[6] The composition according to any one of [1] to [5], wherein the alkali-soluble group in B is a phenolic hydroxyl group or a carboxy group.
[7] 感光性化合物をさらに含有する、[1]~[6]のいずれかに記載の組成物。
[8] 前記感光性化合物が感光性酸発生剤である、[7]に記載の組成物。 [7] The composition according to any one of [1] to [6], further containing a photosensitive compound.
[8] The composition according to [7], wherein the photosensitive compound is a photosensitive acid generator.
[8] 前記感光性化合物が感光性酸発生剤である、[7]に記載の組成物。 [7] The composition according to any one of [1] to [6], further containing a photosensitive compound.
[8] The composition according to [7], wherein the photosensitive compound is a photosensitive acid generator.
[9] [1]~[8]のいずれかに記載の組成物を用いて形成された硬化物。
[10] 絶縁膜、表面保護膜又は平坦化膜である、[9]に記載の硬化物。 [9] A cured product formed using the composition according to any one of [1] to [8].
[10] The cured product according to [9], which is an insulating film, a surface protection film, or a planarization film.
[10] 絶縁膜、表面保護膜又は平坦化膜である、[9]に記載の硬化物。 [9] A cured product formed using the composition according to any one of [1] to [8].
[10] The cured product according to [9], which is an insulating film, a surface protection film, or a planarization film.
[11] [9]または[10]に記載の硬化物を有する表示素子。
[11] A display element comprising the cured product according to [9] or [10].
[12] 下記式(2)で表される構造単位を有する重合体。
[12] A polymer having a structural unit represented by the following formula (2).
Bは、下記式(B1)~(B10)のいずれかで表される2価の基であり、
Xは独立して、-O-、-NH-又は-S-である。]
B is a divalent group represented by any of the following formulas (B1) to (B10),
X is independently -O-, -NH- or -S-. ]
本発明の一実施形態によれば、感度、波長400nmの光の透過性、耐熱性、低比誘電率、平坦性、低線膨張係数及び耐折り曲げ性にバランスよく優れる硬化物(硬化膜)を形成することができる。
According to an embodiment of the present invention, a cured product (cured film) that is excellent in sensitivity, transparency of light with a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low coefficient of linear expansion, and bending resistance in a well-balanced manner is produced. can be formed.
以下、本発明に係る好適な実施形態について詳細に説明する。なお、本発明は、以下に記載された実施形態のみに限定されるものではなく、本発明の要旨を変更しない範囲において実施される各種の変形例も含むものとして理解されるべきである。
本明細書において、「~」を用いて記載された数値範囲は、「~」の前後に記載される数値を下限値及び上限値として含む意味である。 Hereinafter, preferred embodiments according to the present invention will be described in detail. It should be noted that the present invention is not limited to the embodiments described below, but should be understood to include various modifications that may be implemented within the scope of the invention.
In this specification, a numerical range described using "~" means that the numerical values described before and after "~" are included as lower and upper limits.
本明細書において、「~」を用いて記載された数値範囲は、「~」の前後に記載される数値を下限値及び上限値として含む意味である。 Hereinafter, preferred embodiments according to the present invention will be described in detail. It should be noted that the present invention is not limited to the embodiments described below, but should be understood to include various modifications that may be implemented within the scope of the invention.
In this specification, a numerical range described using "~" means that the numerical values described before and after "~" are included as lower and upper limits.
≪組成物及び重合体≫
本発明の一実施形態に係る組成物(以下「本組成物」ともいう。)は、下記式(1)で表される構造単位を有する重合体(以下「重合体(1)」ともいう。)を含む。
本組成物中に含まれる重合体(1)は、1種でもよく、2種以上でもよい。 ≪Compositions and polymers≫
The composition according to one embodiment of the present invention (hereinafter also referred to as "the present composition") is a polymer having a structural unit represented by the following formula (1) (hereinafter also referred to as "polymer (1)"). )including.
The number of polymers (1) contained in this composition may be one or two or more.
本発明の一実施形態に係る組成物(以下「本組成物」ともいう。)は、下記式(1)で表される構造単位を有する重合体(以下「重合体(1)」ともいう。)を含む。
本組成物中に含まれる重合体(1)は、1種でもよく、2種以上でもよい。 ≪Compositions and polymers≫
The composition according to one embodiment of the present invention (hereinafter also referred to as "the present composition") is a polymer having a structural unit represented by the following formula (1) (hereinafter also referred to as "polymer (1)"). )including.
The number of polymers (1) contained in this composition may be one or two or more.
本発明の一実施形態に係る重合体(以下「重合体(2)」ともいう。)は、下記式(2)で表される構造単位を有する。
以下、重合体(1)及び(2)を総称して、「本重合体」ともいう。 The polymer according to one embodiment of the present invention (hereinafter also referred to as "polymer (2)") has a structural unit represented by the following formula (2).
Hereinafter, polymers (1) and (2) are also collectively referred to as "the present polymer."
以下、重合体(1)及び(2)を総称して、「本重合体」ともいう。 The polymer according to one embodiment of the present invention (hereinafter also referred to as "polymer (2)") has a structural unit represented by the following formula (2).
Hereinafter, polymers (1) and (2) are also collectively referred to as "the present polymer."
下記式(1)で表される構造単位及び下記式(2)で表される構造単位は、例えば、下記他の構造単位と結合してもよい。つまり、重合体(1)及び重合体(2)は、下記式(1)で表される構造単位や下記式(2)で表される構造単位以外の他の構造単位を有していてもよい。
The structural unit represented by the following formula (1) and the structural unit represented by the following formula (2) may be combined with other structural units below, for example. In other words, even if polymer (1) and polymer (2) have structural units other than the structural unit represented by the following formula (1) or the structural unit represented by the following formula (2), good.
<本重合体>
前記重合体(1)は、下記式(1)で表される構造単位を有する重合体であり、前記重合体(2)は、下記式(2)で表される構造単位を有する重合体である。
本重合体は、下記式(1)又は(2)で表される構造単位を有するため、前記効果を奏し、特に、低比誘電率であり、アルカリ可溶性に優れる、具体的には、ハンセン溶解度パラメータ(HSP)値のdPとdHが高くなり、アルカリ水溶液に溶解しやすい重合体となる。なお、本重合体は、同じアルカリ可溶性基を同量含む他の重合体に比べ、アルカリ可溶性に予想以上に優れる。
重合体(1)に含まれる下記式(1)で表される構造単位は、1種でもよく、2種以上でもよい。また、重合体(2)に含まれる下記式(2)で表される構造単位も、1種でもよく、2種以上でもよい。 <This polymer>
The polymer (1) is a polymer having a structural unit represented by the following formula (1), and the polymer (2) is a polymer having a structural unit represented by the following formula (2). be.
Since this polymer has a structural unit represented by the following formula (1) or (2), it exhibits the above-mentioned effects, and in particular has a low dielectric constant and excellent alkali solubility. The parameter (HSP) values dP and dH become high, and the polymer becomes easily soluble in an alkaline aqueous solution. The present polymer has better alkali solubility than expected compared to other polymers containing the same amount of alkali-soluble groups.
The number of structural units represented by the following formula (1) contained in the polymer (1) may be one type or two or more types. Furthermore, the number of structural units represented by the following formula (2) contained in the polymer (2) may be one type or two or more types.
前記重合体(1)は、下記式(1)で表される構造単位を有する重合体であり、前記重合体(2)は、下記式(2)で表される構造単位を有する重合体である。
本重合体は、下記式(1)又は(2)で表される構造単位を有するため、前記効果を奏し、特に、低比誘電率であり、アルカリ可溶性に優れる、具体的には、ハンセン溶解度パラメータ(HSP)値のdPとdHが高くなり、アルカリ水溶液に溶解しやすい重合体となる。なお、本重合体は、同じアルカリ可溶性基を同量含む他の重合体に比べ、アルカリ可溶性に予想以上に優れる。
重合体(1)に含まれる下記式(1)で表される構造単位は、1種でもよく、2種以上でもよい。また、重合体(2)に含まれる下記式(2)で表される構造単位も、1種でもよく、2種以上でもよい。 <This polymer>
The polymer (1) is a polymer having a structural unit represented by the following formula (1), and the polymer (2) is a polymer having a structural unit represented by the following formula (2). be.
Since this polymer has a structural unit represented by the following formula (1) or (2), it exhibits the above-mentioned effects, and in particular has a low dielectric constant and excellent alkali solubility. The parameter (HSP) values dP and dH become high, and the polymer becomes easily soluble in an alkaline aqueous solution. The present polymer has better alkali solubility than expected compared to other polymers containing the same amount of alkali-soluble groups.
The number of structural units represented by the following formula (1) contained in the polymer (1) may be one type or two or more types. Furthermore, the number of structural units represented by the following formula (2) contained in the polymer (2) may be one type or two or more types.
前記式(1)で表される構造単位は、前記式(2)で表される構造単位であることが好ましい。
The structural unit represented by the formula (1) is preferably a structural unit represented by the formula (2).
本重合体中の前記式(1)及び(2)で表される構造単位の含有量は、本重合体を構成する全構造単位100質量%に対し、好ましくは20~100質量%、より好ましくは40~100質量%、更に好ましくは50~100質量%、特に好ましくは70~100質量%である。
本重合体が、前記式(1)で表される構造単位や前記式(2)で表される構造単位以外の他の構造単位を含有する場合、本重合体中の前記式(1)及び(2)で表される構造単位の含有量の上限は、本重合体を構成する全構造単位100質量%に対し、好ましくは99質量%、より好ましくは95質量%である。 The content of the structural units represented by formulas (1) and (2) in the present polymer is preferably 20 to 100% by mass, more preferably is 40 to 100% by weight, more preferably 50 to 100% by weight, particularly preferably 70 to 100% by weight.
When this polymer contains structural units other than the structural unit represented by the above formula (1) and the above formula (2), the above formula (1) and The upper limit of the content of the structural unit represented by (2) is preferably 99% by mass, more preferably 95% by mass, based on 100% by mass of all structural units constituting the present polymer.
本重合体が、前記式(1)で表される構造単位や前記式(2)で表される構造単位以外の他の構造単位を含有する場合、本重合体中の前記式(1)及び(2)で表される構造単位の含有量の上限は、本重合体を構成する全構造単位100質量%に対し、好ましくは99質量%、より好ましくは95質量%である。 The content of the structural units represented by formulas (1) and (2) in the present polymer is preferably 20 to 100% by mass, more preferably is 40 to 100% by weight, more preferably 50 to 100% by weight, particularly preferably 70 to 100% by weight.
When this polymer contains structural units other than the structural unit represented by the above formula (1) and the above formula (2), the above formula (1) and The upper limit of the content of the structural unit represented by (2) is preferably 99% by mass, more preferably 95% by mass, based on 100% by mass of all structural units constituting the present polymer.
Bは、芳香環又は芳香族複素環を有し、且つ、アルカリ可溶性基を有する2価の基であり、
Xは独立して、-O-、-NH-又は-S-である。]
B is a divalent group having an aromatic ring or an aromatic heterocycle and having an alkali-soluble group,
X is independently -O-, -NH- or -S-. ]
Bは、下記式(B1)~(B10)のいずれかで表される2価の基であり、
Xは独立して、-O-、-NH-又は-S-である。]
B is a divalent group represented by any of the following formulas (B1) to (B10),
X is independently -O-, -NH- or -S-. ]
前記Aとしては、下記式(a)で表されるジハロゲン化合物(a)由来の2価の基であることが好ましい。
前記式(1)及び(2)で表される構造単位が複数のAを含む場合、該複数のAは、同一であっても、異なっていてもよい。 The above A is preferably a divalent group derived from a dihalogen compound (a) represented by the following formula (a).
When the structural units represented by formulas (1) and (2) contain a plurality of A's, the plural A's may be the same or different.
前記式(1)及び(2)で表される構造単位が複数のAを含む場合、該複数のAは、同一であっても、異なっていてもよい。 The above A is preferably a divalent group derived from a dihalogen compound (a) represented by the following formula (a).
When the structural units represented by formulas (1) and (2) contain a plurality of A's, the plural A's may be the same or different.
前記Aにおける芳香族複素環としては、アルカリ溶解性に起因する感度等の点から、五員環又は六員環の芳香族複素環が好ましく、例えば、ピロール、イミダゾール、ピラゾール、ピリジン、ピラジン、ピリミジン、ピリダジン、トリアジン、フラン、チオフェン、チアゾールが挙げられる。
前記Aにおける窒素含有芳香環としては、アルカリ溶解性に起因する感度等の点から、五員環又は六員環の窒素含有芳香環が好ましく、例えば、ピロール、イミダゾール、ピラゾール、ピリジン、ピラジン、ピリミジン、ピリダジン、トリアジン、チアゾールが挙げられる。
前記Aにおける芳香族複素環及び窒素含有芳香環としては、これらの中でも、高い求核置換反応性から高分子量の重合体が得られやすく、塩基性による副反応を抑制できる等の点から、イミダゾール、ピラゾール、ピリジン、ピラジン、ピリミジン、ピリダジン、トリアジンが好ましく、ピラジン、ピリミジン、ピリダジン、トリアジンがより好ましい。 The aromatic heterocycle in A is preferably a five-membered or six-membered aromatic heterocycle from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine. , pyridazine, triazine, furan, thiophene, and thiazole.
The nitrogen-containing aromatic ring in A is preferably a five-membered or six-membered nitrogen-containing aromatic ring from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine. , pyridazine, triazine, and thiazole.
Among these, as the aromatic heterocycle and nitrogen-containing aromatic ring in A, imidazole is used because it is easy to obtain a high molecular weight polymer due to high nucleophilic substitution reactivity and side reactions due to basicity can be suppressed. , pyrazole, pyridine, pyrazine, pyrimidine, pyridazine, and triazine are preferred, and pyrazine, pyrimidine, pyridazine, and triazine are more preferred.
前記Aにおける窒素含有芳香環としては、アルカリ溶解性に起因する感度等の点から、五員環又は六員環の窒素含有芳香環が好ましく、例えば、ピロール、イミダゾール、ピラゾール、ピリジン、ピラジン、ピリミジン、ピリダジン、トリアジン、チアゾールが挙げられる。
前記Aにおける芳香族複素環及び窒素含有芳香環としては、これらの中でも、高い求核置換反応性から高分子量の重合体が得られやすく、塩基性による副反応を抑制できる等の点から、イミダゾール、ピラゾール、ピリジン、ピラジン、ピリミジン、ピリダジン、トリアジンが好ましく、ピラジン、ピリミジン、ピリダジン、トリアジンがより好ましい。 The aromatic heterocycle in A is preferably a five-membered or six-membered aromatic heterocycle from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine. , pyridazine, triazine, furan, thiophene, and thiazole.
The nitrogen-containing aromatic ring in A is preferably a five-membered or six-membered nitrogen-containing aromatic ring from the viewpoint of sensitivity due to alkali solubility, such as pyrrole, imidazole, pyrazole, pyridine, pyrazine, pyrimidine. , pyridazine, triazine, and thiazole.
Among these, as the aromatic heterocycle and nitrogen-containing aromatic ring in A, imidazole is used because it is easy to obtain a high molecular weight polymer due to high nucleophilic substitution reactivity and side reactions due to basicity can be suppressed. , pyrazole, pyridine, pyrazine, pyrimidine, pyridazine, and triazine are preferred, and pyrazine, pyrimidine, pyridazine, and triazine are more preferred.
前記Aの炭素数は、好ましくは3~48であり、より好ましくは3~24である。
前記Aは、アルカリ可溶性基を有していてもよいが、アルカリ可溶性基を有さないことが好ましい。
本明細書におけるアルカリ可溶性基としては特に制限されず、カルボキシ基、水酸基、スルホ基、リン酸基、酸無水物基等が挙げられるが、これらの中でも、カルボキシ基、フェノール性水酸基が好ましい。 The number of carbon atoms in A is preferably 3 to 48, more preferably 3 to 24.
The above A may have an alkali-soluble group, but preferably does not have an alkali-soluble group.
The alkali-soluble group in this specification is not particularly limited and includes carboxy groups, hydroxyl groups, sulfo groups, phosphoric acid groups, acid anhydride groups, etc. Among these, carboxy groups and phenolic hydroxyl groups are preferred.
前記Aは、アルカリ可溶性基を有していてもよいが、アルカリ可溶性基を有さないことが好ましい。
本明細書におけるアルカリ可溶性基としては特に制限されず、カルボキシ基、水酸基、スルホ基、リン酸基、酸無水物基等が挙げられるが、これらの中でも、カルボキシ基、フェノール性水酸基が好ましい。 The number of carbon atoms in A is preferably 3 to 48, more preferably 3 to 24.
The above A may have an alkali-soluble group, but preferably does not have an alkali-soluble group.
The alkali-soluble group in this specification is not particularly limited and includes carboxy groups, hydroxyl groups, sulfo groups, phosphoric acid groups, acid anhydride groups, etc. Among these, carboxy groups and phenolic hydroxyl groups are preferred.
前記Aにおける芳香族複素環は、前記効果を奏し、特に、アルカリ可溶性に優れる硬化物(硬化膜)を容易に得ることができ、また、所望の重合体を容易に合成することができる等の点から、窒素含有芳香環であることが好ましい。
前記窒素含有芳香環としては、窒素原子を2つ以上有する芳香環であることがより好ましく、窒素原子を2つ又は3つ有する芳香環であることが特に好ましい。 The aromatic heterocycle in A has the above-mentioned effects, and in particular, can easily obtain a cured product (cured film) with excellent alkali solubility, and can easily synthesize a desired polymer. From this point of view, a nitrogen-containing aromatic ring is preferred.
The nitrogen-containing aromatic ring is more preferably an aromatic ring having two or more nitrogen atoms, particularly preferably an aromatic ring having two or three nitrogen atoms.
前記窒素含有芳香環としては、窒素原子を2つ以上有する芳香環であることがより好ましく、窒素原子を2つ又は3つ有する芳香環であることが特に好ましい。 The aromatic heterocycle in A has the above-mentioned effects, and in particular, can easily obtain a cured product (cured film) with excellent alkali solubility, and can easily synthesize a desired polymer. From this point of view, a nitrogen-containing aromatic ring is preferred.
The nitrogen-containing aromatic ring is more preferably an aromatic ring having two or more nitrogen atoms, particularly preferably an aromatic ring having two or three nitrogen atoms.
前記Aは、下記群(A1)のいずれかの基であることが好ましい。
It is preferable that the above A is any group of the following group (A1).
前記Xは、前記効果にバランスよく優れる硬化物(硬化膜)を容易に形成することができる等の点から、好ましくは-O-又は-NH-であり、波長400nmの光の透過性、低比誘電率により優れる硬化物(硬化膜)を容易に形成することができる等の点から、より好ましくは-O-である。
一般に、Xが-O-であるポリエーテルは、アルカリ水溶液等への溶解性に劣る場合が多いが、本重合体は、Xが-O-であっても、アルカリ水溶液等への溶解性に優れる重合体である。
前記式(1)及び(2)で表される構造単位に含まれる複数のXは、同一であっても、異なっていてもよいが、同一であることが合成容易性等の点から好ましい。 The above-mentioned X is preferably -O- or -NH- from the viewpoint of easily forming a cured product (cured film) that is excellent in the above-mentioned effects in a well-balanced manner, and has low transmittance to light with a wavelength of 400 nm. -O- is more preferred because it can easily form a cured product (cured film) with better dielectric constant.
Generally, polyethers in which X is -O- often have poor solubility in alkaline aqueous solutions, etc., but this polymer has poor solubility in alkaline aqueous solutions, etc. even if X is -O-. It is an excellent polymer.
The plurality of Xs contained in the structural units represented by formulas (1) and (2) may be the same or different, but it is preferable that they be the same from the viewpoint of ease of synthesis.
一般に、Xが-O-であるポリエーテルは、アルカリ水溶液等への溶解性に劣る場合が多いが、本重合体は、Xが-O-であっても、アルカリ水溶液等への溶解性に優れる重合体である。
前記式(1)及び(2)で表される構造単位に含まれる複数のXは、同一であっても、異なっていてもよいが、同一であることが合成容易性等の点から好ましい。 The above-mentioned X is preferably -O- or -NH- from the viewpoint of easily forming a cured product (cured film) that is excellent in the above-mentioned effects in a well-balanced manner, and has low transmittance to light with a wavelength of 400 nm. -O- is more preferred because it can easily form a cured product (cured film) with better dielectric constant.
Generally, polyethers in which X is -O- often have poor solubility in alkaline aqueous solutions, etc., but this polymer has poor solubility in alkaline aqueous solutions, etc. even if X is -O-. It is an excellent polymer.
The plurality of Xs contained in the structural units represented by formulas (1) and (2) may be the same or different, but it is preferable that they be the same from the viewpoint of ease of synthesis.
前記Bとしては、下記式(b)で表されるアルカリ可溶性基含有化合物(b)由来の2価の基であることが好ましい。
前記式(1)及び(2)で表される構造単位が複数のBを含む場合、該複数のBは、同一であっても、異なっていてもよい。 Said B is preferably a divalent group derived from the alkali-soluble group-containing compound (b) represented by the following formula (b).
When the structural units represented by formulas (1) and (2) contain a plurality of Bs, the plurality of Bs may be the same or different.
前記式(1)及び(2)で表される構造単位が複数のBを含む場合、該複数のBは、同一であっても、異なっていてもよい。 Said B is preferably a divalent group derived from the alkali-soluble group-containing compound (b) represented by the following formula (b).
When the structural units represented by formulas (1) and (2) contain a plurality of Bs, the plurality of Bs may be the same or different.
前記式(1)におけるBは、芳香環を有し、且つ、アルカリ可溶性基を有する2価の基であることが好ましい。
前記Bの炭素数は、好ましくは5~48であり、より好ましくは6~36である。 B in the formula (1) is preferably a divalent group having an aromatic ring and an alkali-soluble group.
The number of carbon atoms in B is preferably 5 to 48, more preferably 6 to 36.
前記Bの炭素数は、好ましくは5~48であり、より好ましくは6~36である。 B in the formula (1) is preferably a divalent group having an aromatic ring and an alkali-soluble group.
The number of carbon atoms in B is preferably 5 to 48, more preferably 6 to 36.
前記式(1)におけるBは、感度、透過率、耐熱性、平坦性等の点から、下記式(B1)~(B10)のいずれかで表される基であることが好ましい。
感度と平坦性等の点から、前記式(1)及び(2)におけるBは、下記式(B1)~(B7)のいずれかで表される基であることがより好ましく、下記式(B1)~(B3)、(B5)のいずれかで表される基であることが更に好ましい。 In terms of sensitivity, transmittance, heat resistance, flatness, etc., B in the formula (1) is preferably a group represented by any of the following formulas (B1) to (B10).
From the viewpoint of sensitivity, flatness, etc., B in the above formulas (1) and (2) is more preferably a group represented by any of the following formulas (B1) to (B7); ) to (B3) and (B5) are more preferable.
感度と平坦性等の点から、前記式(1)及び(2)におけるBは、下記式(B1)~(B7)のいずれかで表される基であることがより好ましく、下記式(B1)~(B3)、(B5)のいずれかで表される基であることが更に好ましい。 In terms of sensitivity, transmittance, heat resistance, flatness, etc., B in the formula (1) is preferably a group represented by any of the following formulas (B1) to (B10).
From the viewpoint of sensitivity, flatness, etc., B in the above formulas (1) and (2) is more preferably a group represented by any of the following formulas (B1) to (B7); ) to (B3) and (B5) are more preferable.
C1の好適例は、単結合、酸素原子、硫黄原子、-CO-、-COO-、-NHCO-、-NHCOO-、-SO-、-SO2-、-CH(CH2OH)-;単結合以外のこれらの基(以下「ヘテロ原子含有置換基」ともいう。)を含んでいてもよい、炭素数1~15の二価の有機基又は炭素数1~15の二価のハロゲン化有機基;であり、炭素数1~15の二価の炭化水素基がより好ましい。
前記有機基(ヘテロ原子含有置換基を含む前及びハロゲン化前の有機基)及び前記炭化水素基としては、直鎖状又は分岐状のアルキル基、脂環又は芳香環を含む炭化水素基が挙げられる。以下のC2~C5の有機基(ヘテロ原子含有置換基を含む前及びハロゲン化前の有機基)も同様の基が挙げられる。
前記直鎖状又は分岐状のアルキル基の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。
前記脂環又は芳香環を含む炭化水素基の炭素数は、好ましくは5~15、より好ましくは6~12である。この炭化水素基に含まれ得る脂環は、単環でもよく多環でもよく、この炭化水素基に含まれ得る芳香環は、単環でもよく多環でもよい。また、この炭化水素基は、脂環及び芳香環を含んでもよい。 Preferred examples of C 1 are a single bond, an oxygen atom, a sulfur atom, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, -CH(CH 2 OH)-; A divalent organic group having 1 to 15 carbon atoms or a divalent halogenated group having 1 to 15 carbon atoms, which may contain these groups other than a single bond (hereinafter also referred to as "heteroatom-containing substituent") An organic group; more preferably a divalent hydrocarbon group having 1 to 15 carbon atoms.
Examples of the organic group (organic group before containing a heteroatom-containing substituent and before halogenation) and the hydrocarbon group include a linear or branched alkyl group, a hydrocarbon group containing an alicyclic ring, or an aromatic ring. It will be done. The following C 2 to C 5 organic groups (organic groups before containing a hetero atom-containing substituent and before halogenation) include similar groups.
The linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
The alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms. The alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
前記有機基(ヘテロ原子含有置換基を含む前及びハロゲン化前の有機基)及び前記炭化水素基としては、直鎖状又は分岐状のアルキル基、脂環又は芳香環を含む炭化水素基が挙げられる。以下のC2~C5の有機基(ヘテロ原子含有置換基を含む前及びハロゲン化前の有機基)も同様の基が挙げられる。
前記直鎖状又は分岐状のアルキル基の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。
前記脂環又は芳香環を含む炭化水素基の炭素数は、好ましくは5~15、より好ましくは6~12である。この炭化水素基に含まれ得る脂環は、単環でもよく多環でもよく、この炭化水素基に含まれ得る芳香環は、単環でもよく多環でもよい。また、この炭化水素基は、脂環及び芳香環を含んでもよい。 Preferred examples of C 1 are a single bond, an oxygen atom, a sulfur atom, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, -CH(CH 2 OH)-; A divalent organic group having 1 to 15 carbon atoms or a divalent halogenated group having 1 to 15 carbon atoms, which may contain these groups other than a single bond (hereinafter also referred to as "heteroatom-containing substituent") An organic group; more preferably a divalent hydrocarbon group having 1 to 15 carbon atoms.
Examples of the organic group (organic group before containing a heteroatom-containing substituent and before halogenation) and the hydrocarbon group include a linear or branched alkyl group, a hydrocarbon group containing an alicyclic ring, or an aromatic ring. It will be done. The following C 2 to C 5 organic groups (organic groups before containing a hetero atom-containing substituent and before halogenation) include similar groups.
The linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
The alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms. The alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
Y1及びY2の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 1 and Y 2 are -OH and -COOH, with -OH being more preferred.
Z1及びZ2の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
前記アルキル基及びR'の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。以下のZ3~Z21のアルキル基及びR'における炭素数も同様である。
前記アリール基及びアリールオキシ基の炭素数は、好ましくは6~20、より好ましくは6~14である。以下のZ3~Z21のアリール基及びアリールオキシ基における炭素数も同様である。
前記アラルキル基及びアラルキルオキシ基の炭素数は、好ましくは7~32、より好ましくは7~20である。以下のZ3~Z21のアラルキル基及びアラルキルオキシ基における炭素数も同様である。 Preferred examples of Z 1 and Z 2 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
The number of carbon atoms in the alkyl group and R' is preferably 1 to 12, more preferably 1 to 8, and still more preferably 1 to 6. The same applies to the number of carbon atoms in the alkyl group and R' of Z 3 to Z 21 below.
The number of carbon atoms in the aryl group and aryloxy group is preferably 6 to 20, more preferably 6 to 14. The same applies to the carbon numbers in the aryl groups and aryloxy groups Z 3 to Z 21 below.
The number of carbon atoms in the aralkyl group and aralkyloxy group is preferably 7 to 32, more preferably 7 to 20. The same applies to the number of carbon atoms in the aralkyl group and aralkyloxy group of Z 3 to Z 21 below.
前記アルキル基及びR'の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。以下のZ3~Z21のアルキル基及びR'における炭素数も同様である。
前記アリール基及びアリールオキシ基の炭素数は、好ましくは6~20、より好ましくは6~14である。以下のZ3~Z21のアリール基及びアリールオキシ基における炭素数も同様である。
前記アラルキル基及びアラルキルオキシ基の炭素数は、好ましくは7~32、より好ましくは7~20である。以下のZ3~Z21のアラルキル基及びアラルキルオキシ基における炭素数も同様である。 Preferred examples of Z 1 and Z 2 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
The number of carbon atoms in the alkyl group and R' is preferably 1 to 12, more preferably 1 to 8, and still more preferably 1 to 6. The same applies to the number of carbon atoms in the alkyl group and R' of Z 3 to Z 21 below.
The number of carbon atoms in the aryl group and aryloxy group is preferably 6 to 20, more preferably 6 to 14. The same applies to the carbon numbers in the aryl groups and aryloxy groups Z 3 to Z 21 below.
The number of carbon atoms in the aralkyl group and aralkyloxy group is preferably 7 to 32, more preferably 7 to 20. The same applies to the number of carbon atoms in the aralkyl group and aralkyloxy group of Z 3 to Z 21 below.
Z1及びZ2がそれぞれ独立してC1と結合して環を形成した場合の構造としては、下記式(B1-1)部分の構造として、例えば、以下の群(B1-1-1)で表される構造が挙げられる。
When Z 1 and Z 2 are each independently bonded to C 1 to form a ring, the structure of the following formula (B1-1) part is, for example, the following group (B1-1-1). An example of this is the structure represented by
n1及びn3は、好ましくは1である。
n2及びn4は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n1 and n3 are preferably 1.
n2 and n4 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
n2及びn4は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n1 and n3 are preferably 1.
n2 and n4 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
D1の好適例は、炭素数1~24の炭化水素基、該炭化水素基の一部を酸素原子、窒素原子、硫黄原子若しくはハロゲン原子で置換した基、リン原子又はホスフィンオキシド基であり、炭素数1~12の炭化水素基がより好ましい。
Preferred examples of D 1 are a hydrocarbon group having 1 to 24 carbon atoms, a group in which part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom or halogen atom, a phosphorus atom or a phosphine oxide group, A hydrocarbon group having 1 to 12 carbon atoms is more preferred.
Y3の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 3 are -OH and -COOH, with -OH being more preferred.
Z3~Z5の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 3 to Z 5 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n5は、好ましくは1である。
n6~n8は、好ましくは0~3の整数であり、より好ましくは0~2の整数であり、さらに好ましくは0又は1であり、特に好ましくは0である。 n5 is preferably 1.
n6 to n8 are preferably integers of 0 to 3, more preferably integers of 0 to 2, still more preferably 0 or 1, and particularly preferably 0.
n6~n8は、好ましくは0~3の整数であり、より好ましくは0~2の整数であり、さらに好ましくは0又は1であり、特に好ましくは0である。 n5 is preferably 1.
n6 to n8 are preferably integers of 0 to 3, more preferably integers of 0 to 2, still more preferably 0 or 1, and particularly preferably 0.
E1の好適例は、炭素数1~24の炭化水素基、又は、該炭化水素基の一部を酸素原子、窒素原子、硫黄原子若しくはハロゲン原子で置換した基であり、炭素数1~20の炭化水素基がより好ましい。
前記炭化水素基としては、直鎖状又は分岐状のアルキル基、脂環又は芳香環を含む炭化水素基が挙げられる。
前記直鎖状又は分岐状のアルキル基の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。
前記脂環又は芳香環を含む炭化水素基の炭素数は、好ましくは5~15、より好ましくは6~12である。この炭化水素基に含まれ得る脂環は、単環でもよく多環でもよく、この炭化水素基に含まれ得る芳香環は、単環でもよく多環でもよい。また、この炭化水素基は、脂環及び芳香環を含んでもよい。 A preferred example of E 1 is a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom, or halogen atom, and a group having 1 to 24 carbon atoms. The hydrocarbon group is more preferred.
Examples of the hydrocarbon group include a hydrocarbon group containing a linear or branched alkyl group, an alicyclic ring, or an aromatic ring.
The linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
The alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms. The alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
前記炭化水素基としては、直鎖状又は分岐状のアルキル基、脂環又は芳香環を含む炭化水素基が挙げられる。
前記直鎖状又は分岐状のアルキル基の炭素数は、好ましくは1~12、より好ましくは1~8、さらに好ましくは1~6である。
前記脂環又は芳香環を含む炭化水素基の炭素数は、好ましくは5~15、より好ましくは6~12である。この炭化水素基に含まれ得る脂環は、単環でもよく多環でもよく、この炭化水素基に含まれ得る芳香環は、単環でもよく多環でもよい。また、この炭化水素基は、脂環及び芳香環を含んでもよい。 A preferred example of E 1 is a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom, or halogen atom, and a group having 1 to 24 carbon atoms. The hydrocarbon group is more preferred.
Examples of the hydrocarbon group include a hydrocarbon group containing a linear or branched alkyl group, an alicyclic ring, or an aromatic ring.
The linear or branched alkyl group preferably has 1 to 12 carbon atoms, more preferably 1 to 8 carbon atoms, and still more preferably 1 to 6 carbon atoms.
The alicyclic or aromatic ring-containing hydrocarbon group preferably has 5 to 15 carbon atoms, more preferably 6 to 12 carbon atoms. The alicyclic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic, and the aromatic ring that may be contained in this hydrocarbon group may be monocyclic or polycyclic. Further, this hydrocarbon group may include an alicyclic ring and an aromatic ring.
Y4及びY5の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 4 and Y 5 are -OH and -COOH, with -OH being more preferred.
Z6~Z9の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 6 to Z 9 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n9及びn11は、好ましくは1である。
n10及びn12~n14は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n9 and n11 are preferably 1.
n10 and n12 to n14 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
n10及びn12~n14は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n9 and n11 are preferably 1.
n10 and n12 to n14 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
C2及びC3の好適例は、単結合、酸素原子又は硫黄原子であり、単結合がより好ましい。
C2及びC3におけるアルカリ可溶性基を含まない2価の有機基としては、-O-、-CO-、-COO-、-NHCO-、-NHCOO-、-SO-、-SO2-、-CH(CH2OH)-;これらの基(ヘテロ原子含有置換基)を含んでいてもよい、炭素数1~15の二価の有機基又は炭素数1~15の二価のハロゲン化有機基;が挙げられる。 Preferable examples of C 2 and C 3 are a single bond, an oxygen atom or a sulfur atom, and a single bond is more preferable.
Divalent organic groups not containing alkali-soluble groups at C 2 and C 3 include -O-, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, - CH(CH 2 OH)-; divalent organic group having 1 to 15 carbon atoms or divalent halogenated organic group having 1 to 15 carbon atoms, which may contain these groups (heteroatom-containing substituent) ; can be mentioned.
C2及びC3におけるアルカリ可溶性基を含まない2価の有機基としては、-O-、-CO-、-COO-、-NHCO-、-NHCOO-、-SO-、-SO2-、-CH(CH2OH)-;これらの基(ヘテロ原子含有置換基)を含んでいてもよい、炭素数1~15の二価の有機基又は炭素数1~15の二価のハロゲン化有機基;が挙げられる。 Preferable examples of C 2 and C 3 are a single bond, an oxygen atom or a sulfur atom, and a single bond is more preferable.
Divalent organic groups not containing alkali-soluble groups at C 2 and C 3 include -O-, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, - CH(CH 2 OH)-; divalent organic group having 1 to 15 carbon atoms or divalent halogenated organic group having 1 to 15 carbon atoms, which may contain these groups (heteroatom-containing substituent) ; can be mentioned.
Y6及びY7の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 6 and Y 7 are -OH and -COOH, with -OH being more preferred.
Z10及びZ11の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Suitable examples of Z 10 and Z 11 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n15及びn16は、好ましくは1である。
n17及びn18は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n15 and n16 are preferably 1.
n17 and n18 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
n17及びn18は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n15 and n16 are preferably 1.
n17 and n18 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
D2の好適例は、炭素数1~24の炭化水素基、又は、該炭化水素基の一部を酸素原子、窒素原子、硫黄原子若しくはハロゲン原子で置換した基であり、炭素数1~12の炭化水素基がより好ましい。
A preferred example of D 2 is a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, nitrogen atom, sulfur atom, or halogen atom, and a group having 1 to 12 carbon atoms. The hydrocarbon group is more preferred.
Z12及びZ13の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 12 and Z 13 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n19及びn20は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。
n19 and n20 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
D3及びD4の好適例は、炭素数1~24の炭化水素基、又は、該炭化水素基の一部を酸素原子、窒素原子、硫黄原子若しくはハロゲン原子で置換した基であり、炭素数1~12の炭化水素基がより好ましい。
Preferred examples of D 3 and D 4 are a hydrocarbon group having 1 to 24 carbon atoms, or a group in which a part of the hydrocarbon group is substituted with an oxygen atom, a nitrogen atom, a sulfur atom, or a halogen atom; 1 to 12 hydrocarbon groups are more preferred.
Y8~Y10の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 8 to Y 10 are -OH and -COOH, with -OH being more preferred.
Z14~Z17の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 14 to Z 17 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n21、n23及びn25は、好ましくは1である。
n22、n24、n26及びn27は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n21, n23 and n25 are preferably 1.
n22, n24, n26 and n27 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
n22、n24、n26及びn27は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n21, n23 and n25 are preferably 1.
n22, n24, n26 and n27 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
C4及びC5の好適例は、単結合、酸素原子、硫黄原子、-CO-、-COO-、-NHCO-、-NHCOO-、-SO-、-SO2-、-CH(CH2OH)-;単結合以外のこれらの基(ヘテロ原子含有置換基)を含んでいてもよい、炭素数1~15の二価の有機基又は炭素数1~15の二価のハロゲン化有機基;であり、炭素数1~15の二価の炭化水素基がより好ましい。
Preferred examples of C 4 and C 5 are single bonds, oxygen atoms, sulfur atoms, -CO-, -COO-, -NHCO-, -NHCOO-, -SO-, -SO 2 -, -CH(CH 2 OH )-; A divalent organic group having 1 to 15 carbon atoms or a divalent halogenated organic group having 1 to 15 carbon atoms, which may contain these groups other than a single bond (heteroatom-containing substituent); and a divalent hydrocarbon group having 1 to 15 carbon atoms is more preferred.
Y11~Y13の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 11 to Y 13 are -OH and -COOH, with -OH being more preferred.
Z18~Z20の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 18 to Z 20 include an alkyl group, an alkoxy group (-OR'), an acyl group (-OCR'), an acyloxy group (-OOCR'), an aryl group, an aryloxy group, an aralkyl group, and an aralkyloxy group. , a halogen atom, a nitro group, a cyano group, an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n28及びn32は、好ましくは0又は1である。
n30は、好ましくは1である。
n29、n31及びn33は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。
mは、好ましくは1又は2である。 n28 and n32 are preferably 0 or 1.
n30 is preferably 1.
n29, n31 and n33 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
m is preferably 1 or 2.
n30は、好ましくは1である。
n29、n31及びn33は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。
mは、好ましくは1又は2である。 n28 and n32 are preferably 0 or 1.
n30 is preferably 1.
n29, n31 and n33 are preferably integers of 0 to 2, more preferably 0 or 1, and even more preferably 0.
m is preferably 1 or 2.
Y14の好適例は、-OH、-COOHであり、-OHがより好ましい。
Preferred examples of Y 14 are -OH and -COOH, with -OH being more preferred.
Z21の好適例は、アルキル基、アルコキシ基(-OR')、アシル基(-OCR')、アシルオキシ基(-OOCR')、アリール基、アリールオキシ基、アラルキル基、アラルキルオキシ基、ハロゲン原子、ニトロ基、シアノ基、アミノ基であり、炭素数1~12のアルキル基がより好ましい。
Preferred examples of Z 21 are alkyl groups, alkoxy groups (-OR'), acyl groups (-OCR'), acyloxy groups (-OOCR'), aryl groups, aryloxy groups, aralkyl groups, aralkyloxy groups, and halogen atoms. , a nitro group, a cyano group, and an amino group, and an alkyl group having 1 to 12 carbon atoms is more preferable.
n34は、好ましくは1である。
n35は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n34 is preferably 1.
n35 is preferably an integer of 0 to 2, more preferably 0 or 1, and even more preferably 0.
n35は、好ましくは0~2の整数であり、より好ましくは0又は1であり、さらに好ましくは0である。 n34 is preferably 1.
n35 is preferably an integer of 0 to 2, more preferably 0 or 1, and even more preferably 0.
R6はそれぞれ独立して、水素原子又はアルキル基であり、好ましくは炭素数1~10のアルキル基であり、
G1はそれぞれ独立して、単結合又は酸素原子であり、好ましくは単結合であり、
nはそれぞれ独立して、0~3の整数であり、好ましくは0又は1であり、より好ましくは0である。]
R 6 is each independently a hydrogen atom or an alkyl group, preferably an alkyl group having 1 to 10 carbon atoms,
G 1 is each independently a single bond or an oxygen atom, preferably a single bond,
Each n is independently an integer of 0 to 3, preferably 0 or 1, and more preferably 0. ]
R6はそれぞれ独立して、水素原子又はアルキル基であり、好ましくは炭素数1~10のアルキル基であり、
R7は、水素原子又は有機基であり、好ましくは水素原子又は炭素数10以下の有機基であり、より好ましくは水素原子又は炭素数1~10のアルキル基であり、
R6同士、R7同士又は隣接するR6及びR7は結合して環を形成していてもよく、好ましくは5員又は6員の環を形成していてもよく、
G1は、単結合又は酸素原子であり、好ましくは単結合であり、
nは、0~3の整数であり、好ましくは0又は1であり、より好ましくは0である。]
R 6 is each independently a hydrogen atom or an alkyl group, preferably an alkyl group having 1 to 10 carbon atoms,
R 7 is a hydrogen atom or an organic group, preferably a hydrogen atom or an organic group having 10 or less carbon atoms, more preferably a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
R 6 and R 7 or adjacent R 6 and R 7 may be combined to form a ring, preferably a 5- or 6-membered ring,
G 1 is a single bond or an oxygen atom, preferably a single bond,
n is an integer from 0 to 3, preferably 0 or 1, and more preferably 0. ]
<他の構造単位>
本重合体は、前記式(1)で表される構造単位や前記式(2)で表される構造単位以外の他の構造単位を1種又は2種以上有していてもよい。
該他の構造単位としては、例えば、下記式(3)で表される構造単位、下記式(4)で表される構造単位、末端構造が挙げられる。
該末端構造としては、下記式(1)や(2)で表される構造単位等を構成する原料(例:下記式(a)~(d)で表される化合物)由来の構造又は下記末端封止剤由来の構造が挙げられる。 <Other structural units>
The present polymer may have one or more types of structural units other than the structural unit represented by the formula (1) or the structural unit represented by the formula (2).
Examples of the other structural units include a structural unit represented by the following formula (3), a structural unit represented by the following formula (4), and a terminal structure.
The terminal structure may be a structure derived from a raw material (e.g., a compound represented by the following formulas (a) to (d)) constituting the structural unit represented by the following formulas (1) or (2), or the following terminal structure. Examples include structures derived from sealants.
本重合体は、前記式(1)で表される構造単位や前記式(2)で表される構造単位以外の他の構造単位を1種又は2種以上有していてもよい。
該他の構造単位としては、例えば、下記式(3)で表される構造単位、下記式(4)で表される構造単位、末端構造が挙げられる。
該末端構造としては、下記式(1)や(2)で表される構造単位等を構成する原料(例:下記式(a)~(d)で表される化合物)由来の構造又は下記末端封止剤由来の構造が挙げられる。 <Other structural units>
The present polymer may have one or more types of structural units other than the structural unit represented by the formula (1) or the structural unit represented by the formula (2).
Examples of the other structural units include a structural unit represented by the following formula (3), a structural unit represented by the following formula (4), and a terminal structure.
The terminal structure may be a structure derived from a raw material (e.g., a compound represented by the following formulas (a) to (d)) constituting the structural unit represented by the following formulas (1) or (2), or the following terminal structure. Examples include structures derived from sealants.
本重合体中の前記他の構造単位の含有量は、本重合体を構成する全構造単位100質量%に対し、好ましくは60質量%以下であり、平坦性、低線膨張係数により優れる硬化物(硬化膜)を容易に形成することができる等の点から、より好ましくは1~30質量%である。
The content of the other structural units in the present polymer is preferably 60% by mass or less based on 100% by mass of all structural units constituting the present polymer, and the cured product has excellent flatness and a low coefficient of linear expansion. From the viewpoint of being able to easily form a cured film, the content is more preferably 1 to 30% by mass.
前記B'の好適例は、前記Bとして説明した基から、アルカリ可溶性基を除いた基である。前記B'としては、前記式(B1)で表される基であり、且つ、該式(B1)におけるn1及びn3が0である基がより好ましい。
前記B'としては、下記式(c)で表される化合物(c)由来の2価の基であることが好ましい。 A preferred example of B' is a group obtained by removing the alkali-soluble group from the group described as B above. The B' is preferably a group represented by the formula (B1) above, and a group in which n1 and n3 in the formula (B1) are 0.
The B' is preferably a divalent group derived from the compound (c) represented by the following formula (c).
前記B'としては、下記式(c)で表される化合物(c)由来の2価の基であることが好ましい。 A preferred example of B' is a group obtained by removing the alkali-soluble group from the group described as B above. The B' is preferably a group represented by the formula (B1) above, and a group in which n1 and n3 in the formula (B1) are 0.
The B' is preferably a divalent group derived from the compound (c) represented by the following formula (c).
前記A'の好適例は、フェニレンジイル基又は置換基を有するフェニレンジイル基である。
該置換基としては、炭素数1~12の有機基が挙げられ、好ましくは炭素数1~12の炭化水素基である。
前記A'としては、下記式(d)で表される化合物(d)由来の2価の基であることが好ましい。 A preferred example of A' is a phenylenediyl group or a phenylenediyl group having a substituent.
Examples of the substituent include organic groups having 1 to 12 carbon atoms, preferably hydrocarbon groups having 1 to 12 carbon atoms.
The above A' is preferably a divalent group derived from the compound (d) represented by the following formula (d).
該置換基としては、炭素数1~12の有機基が挙げられ、好ましくは炭素数1~12の炭化水素基である。
前記A'としては、下記式(d)で表される化合物(d)由来の2価の基であることが好ましい。 A preferred example of A' is a phenylenediyl group or a phenylenediyl group having a substituent.
Examples of the substituent include organic groups having 1 to 12 carbon atoms, preferably hydrocarbon groups having 1 to 12 carbon atoms.
The above A' is preferably a divalent group derived from the compound (d) represented by the following formula (d).
<本重合体の合成方法>
本重合体の合成方法は特に制限されず、従来公知の方法が挙げられるが、下記式(a)で表されるジハロゲン化合物(a)と、下記式(b)で表されるアルカリ可溶性基含有化合物(b)とを反応させる反応工程を含む方法が好ましい。
この反応工程の際には、1種の化合物(a)を用いてもよく、2種以上の化合物(a)を用いてもよく、1種の化合物(b)を用いてもよく、2種以上の化合物(b)を用いてもよい。 <Synthesis method of this polymer>
The method for synthesizing the present polymer is not particularly limited, and conventionally known methods may be used. A method including a reaction step of reacting with compound (b) is preferred.
In this reaction step, one type of compound (a) may be used, two or more types of compounds (a) may be used, one type of compound (b) may be used, or two types of compounds (b) may be used. The above compound (b) may also be used.
本重合体の合成方法は特に制限されず、従来公知の方法が挙げられるが、下記式(a)で表されるジハロゲン化合物(a)と、下記式(b)で表されるアルカリ可溶性基含有化合物(b)とを反応させる反応工程を含む方法が好ましい。
この反応工程の際には、1種の化合物(a)を用いてもよく、2種以上の化合物(a)を用いてもよく、1種の化合物(b)を用いてもよく、2種以上の化合物(b)を用いてもよい。 <Synthesis method of this polymer>
The method for synthesizing the present polymer is not particularly limited, and conventionally known methods may be used. A method including a reaction step of reacting with compound (b) is preferred.
In this reaction step, one type of compound (a) may be used, two or more types of compounds (a) may be used, one type of compound (b) may be used, or two types of compounds (b) may be used. The above compound (b) may also be used.
L-A-L (a)
[式(a)中、Aは、式(1)中のAと同義であり、Lはハロゲン原子である。] L-A-L (a)
[In formula (a), A has the same meaning as A in formula (1), and L is a halogen atom. ]
[式(a)中、Aは、式(1)中のAと同義であり、Lはハロゲン原子である。] L-A-L (a)
[In formula (a), A has the same meaning as A in formula (1), and L is a halogen atom. ]
ジハロゲン化合物(a)の具体例としては、2,5-ジクロロピロール、3,4-ジクロロピロール、2,4-ジクロロイミダゾール、4,5-ジクロロイミダゾール、3,5-ジクロロピラゾール、2,4-ジクロロピリジン、2,6-ジクロロピリジン、3,5-ジクロロピリジン、2,3-ジクロロピラジン、2,6-ジクロロピラジン、2,6-ジクロロピリミジン、4,6-ジクロロピリミジン、3,6-ジクロロピリダジン、4,5-ジクロロピリダジン、2,4-ジクロロ-1,3,5-トリアジン、2,4-ジクロロ-6-フェニル-1,3,5-トリアジン、2,5-ジクロロフラン、3,4-ジクロロフラン、2,5-ジクロロチオフェン、3,4-ジクロロチオフェン、2,4-ジクロロチアゾール、4,5-ジクロロチアゾール、これらの化合物の塩素原子をフッ素原子に置き換えたジフルオロ化合物、これらの化合物の少なくとも1つの水素原子を炭素数1~12の有機基、好ましくは炭素数1~12の炭化水素基で置換した置換化合物が挙げられる。
Specific examples of the dihalogen compound (a) include 2,5-dichloropyrrole, 3,4-dichloropyrrole, 2,4-dichloroimidazole, 4,5-dichloroimidazole, 3,5-dichloropyrazole, and 2,4-dichloropyrrole. Dichloropyridine, 2,6-dichloropyridine, 3,5-dichloropyridine, 2,3-dichloropyrazine, 2,6-dichloropyrazine, 2,6-dichloropyrimidine, 4,6-dichloropyrimidine, 3,6-dichloro Pyridazine, 4,5-dichloropyridazine, 2,4-dichloro-1,3,5-triazine, 2,4-dichloro-6-phenyl-1,3,5-triazine, 2,5-dichlorofuran, 3, 4-dichlorofuran, 2,5-dichlorothiophene, 3,4-dichlorothiophene, 2,4-dichlorothiazole, 4,5-dichlorothiazole, difluoro compounds in which the chlorine atom of these compounds is replaced with a fluorine atom; Examples include substituted compounds in which at least one hydrogen atom of the compound is replaced with an organic group having 1 to 12 carbon atoms, preferably a hydrocarbon group having 1 to 12 carbon atoms.
M-B-M (b)
[式(b)中、Bは、式(1)中のBと同義であり、Mは独立して、-OH、-SH又は-NH2である。] M-B-M (b)
[In formula (b), B has the same meaning as B in formula (1), and M is independently -OH, -SH or -NH 2 . ]
[式(b)中、Bは、式(1)中のBと同義であり、Mは独立して、-OH、-SH又は-NH2である。] M-B-M (b)
[In formula (b), B has the same meaning as B in formula (1), and M is independently -OH, -SH or -NH 2 . ]
アルカリ可溶性基含有化合物(b)としては、例えば、前記式(B1)~(B10)において、「-*」を「-M」とした化合物が挙げられる。
前記Mとしては-OHが好ましい。
アルカリ可溶性基含有化合物(b)の具体例としては、下記群(b1)~(b8)に記載の化合物が挙げられる。 Examples of the alkali-soluble group-containing compound (b) include compounds in which "-*" is replaced with "-M" in the above formulas (B1) to (B10).
The above M is preferably -OH.
Specific examples of the alkali-soluble group-containing compound (b) include compounds described in the following groups (b1) to (b8).
前記Mとしては-OHが好ましい。
アルカリ可溶性基含有化合物(b)の具体例としては、下記群(b1)~(b8)に記載の化合物が挙げられる。 Examples of the alkali-soluble group-containing compound (b) include compounds in which "-*" is replaced with "-M" in the above formulas (B1) to (B10).
The above M is preferably -OH.
Specific examples of the alkali-soluble group-containing compound (b) include compounds described in the following groups (b1) to (b8).
前記反応工程の際には、下記式(c)で表される化合物(c)、下記式(d)で表される化合物(d)及び末端封止剤から選ばれる少なくとも1つを用いてもよい。
この際には、1種の化合物(c)を用いてもよく、2種以上の化合物(c)を用いてもよく、1種の化合物(d)を用いてもよく、2種以上の化合物(d)を用いてもよく、1種の末端封止剤を用いてもよく、2種以上の末端封止剤を用いてもよい。 During the reaction step, at least one selected from a compound (c) represented by the following formula (c), a compound (d) represented by the following formula (d), and a terminal capping agent may be used. good.
In this case, one type of compound (c) may be used, two or more types of compounds (c) may be used, one type of compound (d) may be used, two or more types of compounds (d) may be used, one type of terminal blocking agent may be used, or two or more types of terminal blocking agents may be used.
この際には、1種の化合物(c)を用いてもよく、2種以上の化合物(c)を用いてもよく、1種の化合物(d)を用いてもよく、2種以上の化合物(d)を用いてもよく、1種の末端封止剤を用いてもよく、2種以上の末端封止剤を用いてもよい。 During the reaction step, at least one selected from a compound (c) represented by the following formula (c), a compound (d) represented by the following formula (d), and a terminal capping agent may be used. good.
In this case, one type of compound (c) may be used, two or more types of compounds (c) may be used, one type of compound (d) may be used, two or more types of compounds (d) may be used, one type of terminal blocking agent may be used, or two or more types of terminal blocking agents may be used.
M-B'-M (c)
[式(c)中、B'は、式(3)中のB'と同義であり、Mは独立して、-OH、-SH又は-NH2である。] M-B'-M (c)
[In formula (c), B' has the same meaning as B' in formula (3), and M is independently -OH, -SH or -NH 2 . ]
[式(c)中、B'は、式(3)中のB'と同義であり、Mは独立して、-OH、-SH又は-NH2である。] M-B'-M (c)
[In formula (c), B' has the same meaning as B' in formula (3), and M is independently -OH, -SH or -NH 2 . ]
前記化合物(c)としては、例えば、前記式(B1)~(B10)において、「-*」を「-M」とし、且つ、前記式(B1)~(B10)中のアルカリ可溶性基を水素原子とした化合物が挙げられる。
前記Mとしては-OHが好ましい。
前記化合物(c)の具体例としては、前記群(b1)~(b8)に記載の化合物のM以外のアルカリ可溶性基を水素原子とした化合物が挙げられ、好適例としては、下記群(c1)に記載の化合物が挙げられる。 As for the compound (c), for example, in the formulas (B1) to (B10), "-*" is replaced with "-M", and the alkali-soluble group in the formulas (B1) to (B10) is hydrogen. Examples include compounds in which atoms are used as atoms.
The above M is preferably -OH.
Specific examples of the compound (c) include compounds in which an alkali-soluble group other than M of the compounds described in the groups (b1) to (b8) is a hydrogen atom, and preferred examples include the following group (c1). ).
前記Mとしては-OHが好ましい。
前記化合物(c)の具体例としては、前記群(b1)~(b8)に記載の化合物のM以外のアルカリ可溶性基を水素原子とした化合物が挙げられ、好適例としては、下記群(c1)に記載の化合物が挙げられる。 As for the compound (c), for example, in the formulas (B1) to (B10), "-*" is replaced with "-M", and the alkali-soluble group in the formulas (B1) to (B10) is hydrogen. Examples include compounds in which atoms are used as atoms.
The above M is preferably -OH.
Specific examples of the compound (c) include compounds in which an alkali-soluble group other than M of the compounds described in the groups (b1) to (b8) is a hydrogen atom, and preferred examples include the following group (c1). ).
L-A'-L (d)
[式(d)中、A'は、式(4)中のA'と同義であり、Lはハロゲン原子である。] L-A'-L (d)
[In formula (d), A' has the same meaning as A' in formula (4), and L is a halogen atom. ]
[式(d)中、A'は、式(4)中のA'と同義であり、Lはハロゲン原子である。] L-A'-L (d)
[In formula (d), A' has the same meaning as A' in formula (4), and L is a halogen atom. ]
前記化合物(d)の具体例としては、1,2-ジクロロベンゼン、1,3-ジクロロベンゼン、1,4-ジクロロベンゼン、これらの化合物の塩素原子をフッ素原子に置き換えたジフルオロ化合物、これらの化合物の少なくとも1つの水素原子を炭素数1~12の有機基、好ましくは炭素数1~12の炭化水素基で置換した置換化合物が挙げられる。
Specific examples of the compound (d) include 1,2-dichlorobenzene, 1,3-dichlorobenzene, 1,4-dichlorobenzene, difluoro compounds in which the chlorine atom of these compounds is replaced with a fluorine atom, and these compounds. Examples include substituted compounds in which at least one hydrogen atom of is substituted with an organic group having 1 to 12 carbon atoms, preferably a hydrocarbon group having 1 to 12 carbon atoms.
前記末端封止剤としては、例えば、前記化合物(a)及び(d)中の2つのLのうち1つのLを水素原子としたモノハロゲン化物、前記化合物(b)及び(c)の1つ以外のMを水素原子とした化合物(例:モノヒドロキシ化合物)が挙げられる。
Examples of the terminal capping agent include a monohalide in which one of the two L's in the compounds (a) and (d) is a hydrogen atom, and one of the compounds (b) and (c). Other examples include compounds in which M is a hydrogen atom (eg, monohydroxy compound).
前記反応工程は、具体的には、前記化合物(a)及び前記化合物(b)などのモノマーを、炭酸カリウムなどのアルカリ金属化合物の存在下、適当な溶媒中で重合させることで合成することができる。
また、前記反応工程で得られた本重合体は、公知の方法で精製してもよい。例えば、得られた本重合体溶液から濾過によって無機塩を除去した後、濾別後の溶液をメタノール水溶液等に注いで本重合体を析出させる方法が挙げられる。 Specifically, the reaction step can be synthesized by polymerizing monomers such as the compound (a) and the compound (b) in an appropriate solvent in the presence of an alkali metal compound such as potassium carbonate. can.
Further, the present polymer obtained in the above reaction step may be purified by a known method. For example, a method may be mentioned in which, after removing inorganic salts from the resulting polymer solution by filtration, the filtered solution is poured into an aqueous methanol solution or the like to precipitate the polymer.
また、前記反応工程で得られた本重合体は、公知の方法で精製してもよい。例えば、得られた本重合体溶液から濾過によって無機塩を除去した後、濾別後の溶液をメタノール水溶液等に注いで本重合体を析出させる方法が挙げられる。 Specifically, the reaction step can be synthesized by polymerizing monomers such as the compound (a) and the compound (b) in an appropriate solvent in the presence of an alkali metal compound such as potassium carbonate. can.
Further, the present polymer obtained in the above reaction step may be purified by a known method. For example, a method may be mentioned in which, after removing inorganic salts from the resulting polymer solution by filtration, the filtered solution is poured into an aqueous methanol solution or the like to precipitate the polymer.
前記反応工程における反応温度としては、重合反応が進行する限り特に制限されないが、副反応を抑制する等の点から、好ましくは30~250℃、より好ましくは40~180℃であり、反応時間は、好ましくは0.5~100時間、より好ましくは1~24時間である。
The reaction temperature in the reaction step is not particularly limited as long as the polymerization reaction proceeds, but from the viewpoint of suppressing side reactions, it is preferably 30 to 250°C, more preferably 40 to 180°C, and the reaction time is , preferably 0.5 to 100 hours, more preferably 1 to 24 hours.
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(a)の使用量は、好ましくは40~60モル%、より好ましくは45~55モル%である。
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(b)の使用量は、好ましくは20~60モル%、より好ましくは30~55モル%である。
前記式(1)や(2)で表される構造単位を有する重合体を容易に合成することができる等の点から、前記化合物(a)および(d)と前記化合物(b)および(c)との使用量のモル比[(化合物(a)および(d))/(化合物(b)および(c))]は、好ましくは0.8~1.2、より好ましくは0.9~1.1である。 The amount of compound (a) used is preferably 40 to 60 mol%, more preferably 45 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
The amount of compound (b) used is preferably 20 to 60 mol%, more preferably 30 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
The compounds (a) and (d) and the compounds (b) and (c The molar ratio of the amount used [(compounds (a) and (d))/(compounds (b) and (c))] is preferably 0.8 to 1.2, more preferably 0.9 to It is 1.1.
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(b)の使用量は、好ましくは20~60モル%、より好ましくは30~55モル%である。
前記式(1)や(2)で表される構造単位を有する重合体を容易に合成することができる等の点から、前記化合物(a)および(d)と前記化合物(b)および(c)との使用量のモル比[(化合物(a)および(d))/(化合物(b)および(c))]は、好ましくは0.8~1.2、より好ましくは0.9~1.1である。 The amount of compound (a) used is preferably 40 to 60 mol%, more preferably 45 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
The amount of compound (b) used is preferably 20 to 60 mol%, more preferably 30 to 55 mol%, based on the total of 100 mol% of compounds (a) to (d).
The compounds (a) and (d) and the compounds (b) and (c The molar ratio of the amount used [(compounds (a) and (d))/(compounds (b) and (c))] is preferably 0.8 to 1.2, more preferably 0.9 to It is 1.1.
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(c)の使用量は、好ましくは0~30モル%、より好ましくは0~20モル%である。
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(d)の使用量は、好ましくは0~30モル%、より好ましくは0~20モル%である。 The amount of compound (c) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
The amount of compound (d) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
前記化合物(a)~(d)の合計100モル%に対する、前記化合物(d)の使用量は、好ましくは0~30モル%、より好ましくは0~20モル%である。 The amount of compound (c) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
The amount of compound (d) used is preferably 0 to 30 mol%, more preferably 0 to 20 mol%, based on the total of 100 mol% of compounds (a) to (d).
前記アルカリ金属化合物としては、例えば、リチウム、カリウム、ナトリウムなどのアルカリ金属;水素化リチウム、水素化カリウム、水素化ナトリウムなどの水素化アルカリ金属;水酸化リチウム、水酸化カリウム、水酸化ナトリウムなどの水酸化アルカリ金属;炭酸リチウム、炭酸カリウム、炭酸ナトリウムなどのアルカリ金属炭酸塩;炭酸水素リチウム、炭酸水素カリウム、炭酸水素ナトリウムなどのアルカリ金属炭酸水素塩;ナトリウムエトキシドなどのアルカリ金属アルコキシド;酢酸ナトリウム、酢酸カリウムなどのアルカリ金属酢酸塩;酸化リチウムなどの酸化アルカリ金属;リン酸三リチウム、リン酸三ナトリウム、リン酸三カリウムなどのアルカリ金属リン酸塩;フッ化セシウムなどのアルカリ金属フッ化物が挙げられる。これらの中でも、炭酸カリウム、水酸化カリウム、炭酸ナトリウム、水酸化ナトリウム、炭酸水素ナトリウム、ナトリウムエトキシド、酢酸ナトリウム、炭酸リチウム、水酸化リチウム、酸化リチウム、酢酸カリウム、リン酸三リチウム、リン酸三ナトリウム、リン酸三カリウム、フッ化セシウムなどが好ましい。
前記アルカリ金属化合物は、1種を用いてもよく、2種以上を用いてもよい。 Examples of the alkali metal compound include alkali metals such as lithium, potassium, and sodium; alkali metal hydrides such as lithium hydride, potassium hydride, and sodium hydride; lithium hydroxide, potassium hydroxide, and sodium hydroxide; Alkali metal hydroxide; alkali metal carbonates such as lithium carbonate, potassium carbonate, and sodium carbonate; alkali metal bicarbonates such as lithium bicarbonate, potassium bicarbonate, and sodium bicarbonate; alkali metal alkoxides such as sodium ethoxide; sodium acetate , alkali metal acetates such as potassium acetate; alkali metal oxides such as lithium oxide; alkali metal phosphates such as trilithium phosphate, trisodium phosphate, tripotassium phosphate; alkali metal fluorides such as cesium fluoride. Can be mentioned. Among these, potassium carbonate, potassium hydroxide, sodium carbonate, sodium hydroxide, sodium bicarbonate, sodium ethoxide, sodium acetate, lithium carbonate, lithium hydroxide, lithium oxide, potassium acetate, trilithium phosphate, triphosphate Preferred are sodium, tripotassium phosphate, cesium fluoride, and the like.
The alkali metal compound may be used alone or in combination of two or more.
前記アルカリ金属化合物は、1種を用いてもよく、2種以上を用いてもよい。 Examples of the alkali metal compound include alkali metals such as lithium, potassium, and sodium; alkali metal hydrides such as lithium hydride, potassium hydride, and sodium hydride; lithium hydroxide, potassium hydroxide, and sodium hydroxide; Alkali metal hydroxide; alkali metal carbonates such as lithium carbonate, potassium carbonate, and sodium carbonate; alkali metal bicarbonates such as lithium bicarbonate, potassium bicarbonate, and sodium bicarbonate; alkali metal alkoxides such as sodium ethoxide; sodium acetate , alkali metal acetates such as potassium acetate; alkali metal oxides such as lithium oxide; alkali metal phosphates such as trilithium phosphate, trisodium phosphate, tripotassium phosphate; alkali metal fluorides such as cesium fluoride. Can be mentioned. Among these, potassium carbonate, potassium hydroxide, sodium carbonate, sodium hydroxide, sodium bicarbonate, sodium ethoxide, sodium acetate, lithium carbonate, lithium hydroxide, lithium oxide, potassium acetate, trilithium phosphate, triphosphate Preferred are sodium, tripotassium phosphate, cesium fluoride, and the like.
The alkali metal compound may be used alone or in combination of two or more.
アルカリ金属化合物の使用量としては、前記化合物(b)及び(c)中の2つの-Mに対し、アルカリ金属化合物中のアルカリ金属原子の量が、通常2~6倍当量、好ましくは2~5倍当量、より好ましくは2.2~4倍当量となる量で使用される。
Regarding the amount of the alkali metal compound used, the amount of alkali metal atoms in the alkali metal compound is usually 2 to 6 times equivalent, preferably 2 to 6 times the amount of -M in the compounds (b) and (c). It is used in an amount of 5 times equivalent, more preferably 2.2 to 4 times equivalent.
前記溶媒としては、例えば、N-メチル-2-ピロリドン、1,3-ジメチル-2-イミダゾリジノン、ジメチルスルホキシド、ジメチルホルムアミド、ジメチルアセトアミド、シクロヘキサノン、シクロペンタノン、トルエン等の非プロトン性溶媒、プロピレングリコールモノメチルエーテル、乳酸エチル、水等のプロトン性溶媒が挙げられる。
前記溶媒は、1種を用いてもよく、2種以上を用いてもよい。 Examples of the solvent include aprotic solvents such as N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, dimethylsulfoxide, dimethylformamide, dimethylacetamide, cyclohexanone, cyclopentanone, and toluene; Examples include protic solvents such as propylene glycol monomethyl ether, ethyl lactate, and water.
The solvent may be used alone or in combination of two or more.
前記溶媒は、1種を用いてもよく、2種以上を用いてもよい。 Examples of the solvent include aprotic solvents such as N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, dimethylsulfoxide, dimethylformamide, dimethylacetamide, cyclohexanone, cyclopentanone, and toluene; Examples include protic solvents such as propylene glycol monomethyl ether, ethyl lactate, and water.
The solvent may be used alone or in combination of two or more.
<本重合体の物性等>
本重合体は、耐熱性に優れる重合体となる等の点から、ポリスチレン換算の重量平均分子量(Mw)は、好ましくは5000~300000、より好ましくは10000~200000であり、分子量分布(Mw/Mn)は、好ましくは2.0~7.0、より好ましくは2.0~5.0である。 <Physical properties of this polymer>
The weight average molecular weight (Mw) of the present polymer in terms of polystyrene is preferably 5,000 to 300,000, more preferably 10,000 to 200,000, and the molecular weight distribution (Mw/Mn ) is preferably 2.0 to 7.0, more preferably 2.0 to 5.0.
本重合体は、耐熱性に優れる重合体となる等の点から、ポリスチレン換算の重量平均分子量(Mw)は、好ましくは5000~300000、より好ましくは10000~200000であり、分子量分布(Mw/Mn)は、好ましくは2.0~7.0、より好ましくは2.0~5.0である。 <Physical properties of this polymer>
The weight average molecular weight (Mw) of the present polymer in terms of polystyrene is preferably 5,000 to 300,000, more preferably 10,000 to 200,000, and the molecular weight distribution (Mw/Mn ) is preferably 2.0 to 7.0, more preferably 2.0 to 5.0.
本重合体は、アルカリ可溶性であり、アルカリ水溶液への溶解性に優れる。
ここで、該アルカリ水溶液としては、例えば、下記アルカリ性現像液が挙げられる。
なお、25℃において、テトラメチルアンモニウムヒドロキシド2.38質量%水溶液100gに対し、本重合体が1g以上溶解する場合、本重合体は、アルカリ可溶性であるといえる。溶解するか否かは、沈殿物の有無で判断することができる。 This polymer is alkali-soluble and has excellent solubility in alkaline aqueous solutions.
Here, examples of the alkaline aqueous solution include the following alkaline developing solutions.
Note that, if 1 g or more of the present polymer is dissolved in 100 g of a 2.38% by mass aqueous solution of tetramethylammonium hydroxide at 25° C., the present polymer can be said to be alkali-soluble. Whether or not it dissolves can be determined by the presence or absence of a precipitate.
ここで、該アルカリ水溶液としては、例えば、下記アルカリ性現像液が挙げられる。
なお、25℃において、テトラメチルアンモニウムヒドロキシド2.38質量%水溶液100gに対し、本重合体が1g以上溶解する場合、本重合体は、アルカリ可溶性であるといえる。溶解するか否かは、沈殿物の有無で判断することができる。 This polymer is alkali-soluble and has excellent solubility in alkaline aqueous solutions.
Here, examples of the alkaline aqueous solution include the following alkaline developing solutions.
Note that, if 1 g or more of the present polymer is dissolved in 100 g of a 2.38% by mass aqueous solution of tetramethylammonium hydroxide at 25° C., the present polymer can be said to be alkali-soluble. Whether or not it dissolves can be determined by the presence or absence of a precipitate.
<その他の添加剤>
本組成物には、本重合体以外のその他の添加剤を、本発明の目的及び特性を損なわない範囲で用いてもよい。
前記その他の添加剤としては、例えば、感光性化合物、架橋剤、溶剤、本重合体以外のアルカリ可溶性重合体、モノカルボン酸化合物、密着助剤、架橋微粒子、レベリング剤、界面活性剤、増感剤、無機フィラー、クエンチャー(重合禁止剤)、色素、分散剤、酸化防止剤、酸増幅剤が挙げられる。
本組成物にその他の添加剤を用いる場合、1種のその他の添加剤を用いてもよく、2種以上のその他の添加剤を用いてもよい。 <Other additives>
Other additives other than the present polymer may be used in the present composition as long as they do not impair the purpose and characteristics of the present invention.
Examples of the other additives include photosensitive compounds, crosslinking agents, solvents, alkali-soluble polymers other than the present polymer, monocarboxylic acid compounds, adhesion aids, crosslinked fine particles, leveling agents, surfactants, and sensitizers. agents, inorganic fillers, quenchers (polymerization inhibitors), pigments, dispersants, antioxidants, and acid amplifiers.
When using other additives in the present composition, one type of other additive may be used, or two or more types of other additives may be used.
本組成物には、本重合体以外のその他の添加剤を、本発明の目的及び特性を損なわない範囲で用いてもよい。
前記その他の添加剤としては、例えば、感光性化合物、架橋剤、溶剤、本重合体以外のアルカリ可溶性重合体、モノカルボン酸化合物、密着助剤、架橋微粒子、レベリング剤、界面活性剤、増感剤、無機フィラー、クエンチャー(重合禁止剤)、色素、分散剤、酸化防止剤、酸増幅剤が挙げられる。
本組成物にその他の添加剤を用いる場合、1種のその他の添加剤を用いてもよく、2種以上のその他の添加剤を用いてもよい。 <Other additives>
Other additives other than the present polymer may be used in the present composition as long as they do not impair the purpose and characteristics of the present invention.
Examples of the other additives include photosensitive compounds, crosslinking agents, solvents, alkali-soluble polymers other than the present polymer, monocarboxylic acid compounds, adhesion aids, crosslinked fine particles, leveling agents, surfactants, and sensitizers. agents, inorganic fillers, quenchers (polymerization inhibitors), pigments, dispersants, antioxidants, and acid amplifiers.
When using other additives in the present composition, one type of other additive may be used, or two or more types of other additives may be used.
〈感光性化合物〉
本組成物を感光性組成物とする場合、本組成物は、感光性化合物を含有することが好ましい。
本組成物に感光性化合物を用いる場合、1種の感光性化合物を用いてもよく、2種以上の感光性化合物を用いてもよい。 <Photosensitive compound>
When the present composition is a photosensitive composition, the present composition preferably contains a photosensitive compound.
When using a photosensitive compound in this composition, one type of photosensitive compound may be used, or two or more types of photosensitive compounds may be used.
本組成物を感光性組成物とする場合、本組成物は、感光性化合物を含有することが好ましい。
本組成物に感光性化合物を用いる場合、1種の感光性化合物を用いてもよく、2種以上の感光性化合物を用いてもよい。 <Photosensitive compound>
When the present composition is a photosensitive composition, the present composition preferably contains a photosensitive compound.
When using a photosensitive compound in this composition, one type of photosensitive compound may be used, or two or more types of photosensitive compounds may be used.
感光性化合物としては特に制限されないが、光照射により酸を発生する感光性酸発生剤であることが好ましい。
このような感光性酸発生剤を用いる場合、本組成物から形成された硬化物(硬化膜)に対する露光処理によって、感光性酸発生剤に基づき露光部に酸が発生し、この酸の作用に基づき露光部のアルカリ水溶液への溶解性が変化する。
本組成物は、ポジ型又はネガ型のいずれであってもよいが、本発明の効果がより発揮される等の点から、ポジ型であることが好ましい。
感光性化合物の種類は、ポジ型又はネガ型等の本組成物の所望の性質に応じて、適宜選択することができる。 Although the photosensitive compound is not particularly limited, it is preferably a photosensitive acid generator that generates acid upon irradiation with light.
When such a photosensitive acid generator is used, when a cured product (cured film) formed from the composition is exposed to light, acid is generated in the exposed area based on the photosensitive acid generator, and the effect of this acid is Based on this, the solubility of the exposed area in the alkaline aqueous solution changes.
The present composition may be either positive type or negative type, but it is preferably positive type in order to better exhibit the effects of the present invention.
The type of photosensitive compound can be appropriately selected depending on the desired properties of the composition, such as positive type or negative type.
このような感光性酸発生剤を用いる場合、本組成物から形成された硬化物(硬化膜)に対する露光処理によって、感光性酸発生剤に基づき露光部に酸が発生し、この酸の作用に基づき露光部のアルカリ水溶液への溶解性が変化する。
本組成物は、ポジ型又はネガ型のいずれであってもよいが、本発明の効果がより発揮される等の点から、ポジ型であることが好ましい。
感光性化合物の種類は、ポジ型又はネガ型等の本組成物の所望の性質に応じて、適宜選択することができる。 Although the photosensitive compound is not particularly limited, it is preferably a photosensitive acid generator that generates acid upon irradiation with light.
When such a photosensitive acid generator is used, when a cured product (cured film) formed from the composition is exposed to light, acid is generated in the exposed area based on the photosensitive acid generator, and the effect of this acid is Based on this, the solubility of the exposed area in the alkaline aqueous solution changes.
The present composition may be either positive type or negative type, but it is preferably positive type in order to better exhibit the effects of the present invention.
The type of photosensitive compound can be appropriately selected depending on the desired properties of the composition, such as positive type or negative type.
感光性酸発生剤としては、例えば、キノンジアジド基を有する化合物、オニウム塩化合物、ハロゲン含有化合物、スルホン化合物、スルホン酸化合物、スルホンイミド化合物、ジアゾメタン化合物が挙げられる。以下、キノンジアジド基を有する化合物を「キノンジアジド化合物」ともいい、これ以外の感光性酸発生剤を「他の酸発生剤」ともいう。
Examples of the photosensitive acid generator include compounds having a quinonediazide group, onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds. Hereinafter, a compound having a quinonediazide group will also be referred to as a "quinonediazide compound", and photosensitive acid generators other than this will also be referred to as "other acid generators".
前記キノンジアジド化合物は、光照射によりキノンジアジド基が分解してカルボキシ基を生じる化合物である。キノンジアジド化合物を含有する本組成物を用いることで、例えば、アルカリ性現像液に対して難溶の樹脂膜(光照射前の樹脂膜)を形成することができる。該樹脂膜に光を照射することにより、アルカリ性現像液に易溶の硬化物(硬化膜)を形成することができる。従って、このようなキノンジアジド化合物を含有する本組成物により、ポジ型のパターンを形成することができる。
前記他の酸発生剤は、光照射により酸を形成する化合物である。他の酸発生剤を含有する本組成物を用いることで、例えば、アルカリ性現像液に対して易溶の樹脂膜(光照射前の樹脂膜)を形成することができる。該樹脂膜に光を照射することにより、光照射により発生する前記酸が後述する架橋剤等と作用することで架橋構造が形成され、アルカリ性現像液に難溶の硬化物(硬化膜)を形成することができる。従って、このような他の酸発生剤を含有する本組成物により、ネガ型のパターンを形成することができる。 The quinonediazide compound is a compound in which a quinonediazide group is decomposed by light irradiation to produce a carboxyl group. By using the present composition containing a quinonediazide compound, it is possible to form, for example, a resin film that is poorly soluble in an alkaline developer (a resin film before light irradiation). By irradiating the resin film with light, a cured product (cured film) that is easily soluble in an alkaline developer can be formed. Therefore, a positive pattern can be formed using the present composition containing such a quinonediazide compound.
The other acid generator is a compound that forms an acid upon irradiation with light. By using the present composition containing another acid generator, for example, a resin film (resin film before light irradiation) that is easily soluble in an alkaline developer can be formed. By irradiating the resin film with light, the acid generated by the light irradiation interacts with the crosslinking agent described below to form a crosslinked structure, forming a cured product (cured film) that is hardly soluble in an alkaline developer. can do. Therefore, a negative pattern can be formed using the present composition containing such other acid generator.
前記他の酸発生剤は、光照射により酸を形成する化合物である。他の酸発生剤を含有する本組成物を用いることで、例えば、アルカリ性現像液に対して易溶の樹脂膜(光照射前の樹脂膜)を形成することができる。該樹脂膜に光を照射することにより、光照射により発生する前記酸が後述する架橋剤等と作用することで架橋構造が形成され、アルカリ性現像液に難溶の硬化物(硬化膜)を形成することができる。従って、このような他の酸発生剤を含有する本組成物により、ネガ型のパターンを形成することができる。 The quinonediazide compound is a compound in which a quinonediazide group is decomposed by light irradiation to produce a carboxyl group. By using the present composition containing a quinonediazide compound, it is possible to form, for example, a resin film that is poorly soluble in an alkaline developer (a resin film before light irradiation). By irradiating the resin film with light, a cured product (cured film) that is easily soluble in an alkaline developer can be formed. Therefore, a positive pattern can be formed using the present composition containing such a quinonediazide compound.
The other acid generator is a compound that forms an acid upon irradiation with light. By using the present composition containing another acid generator, for example, a resin film (resin film before light irradiation) that is easily soluble in an alkaline developer can be formed. By irradiating the resin film with light, the acid generated by the light irradiation interacts with the crosslinking agent described below to form a crosslinked structure, forming a cured product (cured film) that is hardly soluble in an alkaline developer. can do. Therefore, a negative pattern can be formed using the present composition containing such other acid generator.
[キノンジアジド化合物]
前記キノンジアジド化合物としては、例えば、フェノール性化合物又はアルコール性化合物(以下「母核」ともいう。)と、オルソナフトキノンジアジド化合物との縮合物が挙げられる。
本組成物にキノンジアジド化合物を用いる場合、1種のキノンジアジド化合物を用いてもよく、2種以上のキノンジアジド化合物を用いてもよい。 [Quinonediazide compound]
Examples of the quinonediazide compound include a condensate of a phenolic compound or an alcoholic compound (hereinafter also referred to as "mother core") and an orthonaphthoquinonediazide compound.
When using a quinonediazide compound in the present composition, one type of quinonediazide compound may be used, or two or more types of quinonediazide compounds may be used.
前記キノンジアジド化合物としては、例えば、フェノール性化合物又はアルコール性化合物(以下「母核」ともいう。)と、オルソナフトキノンジアジド化合物との縮合物が挙げられる。
本組成物にキノンジアジド化合物を用いる場合、1種のキノンジアジド化合物を用いてもよく、2種以上のキノンジアジド化合物を用いてもよい。 [Quinonediazide compound]
Examples of the quinonediazide compound include a condensate of a phenolic compound or an alcoholic compound (hereinafter also referred to as "mother core") and an orthonaphthoquinonediazide compound.
When using a quinonediazide compound in the present composition, one type of quinonediazide compound may be used, or two or more types of quinonediazide compounds may be used.
前記母核としては、例えば、特開2014-186300号公報に記載の化合物が挙げられ、フェノール性化合物が好ましい。
前記オルソナフトキノンジアジド化合物としては、1,2-ナフトキノンジアジドスルホン酸ハライドが好ましい。 Examples of the mother nucleus include compounds described in JP-A No. 2014-186300, and phenolic compounds are preferred.
The orthonaphthoquinonediazide compound is preferably 1,2-naphthoquinonediazide sulfonic acid halide.
前記オルソナフトキノンジアジド化合物としては、1,2-ナフトキノンジアジドスルホン酸ハライドが好ましい。 Examples of the mother nucleus include compounds described in JP-A No. 2014-186300, and phenolic compounds are preferred.
The orthonaphthoquinonediazide compound is preferably 1,2-naphthoquinonediazide sulfonic acid halide.
キノンジアジド化合物の具体例としては、4,4'-ジヒドロキシジフェニルメタン、2,3,4,2',4'-ペンタヒドロキシベンゾフェノン、2,3,4,4'-テトラヒドロキシベンゾフェノン、トリ(p-ヒドロキシフェニル)メタン、1,1,1-トリ(p-ヒドロキシフェニル)メタン、1,1,1-トリ(p-ヒドロキシフェニル)エタン、1,1-ビス(4-ヒドロキシフェニル)-1-フェニルエタン、1,3-ビス[1-(4-ヒドロキシフェニル)-1-メチルエチル]ベンゼン、1,4-ビス[1-(4-ヒドロキシフェニル)-1-メチルエチル]ベンゼン、4,6-ビス[1-(4-ヒドロキシフェニル)-1-メチルエチル]-1,3-ジヒドロキシベンゼン、及び、4,4'-[1-[4-[1-[4-ヒドロキシフェニル]-1-メチルエチル]フェニル]エチリデン]ビスフェノールから選ばれるフェノール性水酸基含有化合物と、1,2-ナフトキノンジアジド-4-スルホン酸クロリド又は1,2-ナフトキノンジアジド-5-スルホン酸クロリドとのエステル化合物が挙げられる。
Specific examples of quinonediazide compounds include 4,4'-dihydroxydiphenylmethane, 2,3,4,2',4'-pentahydroxybenzophenone, 2,3,4,4'-tetrahydroxybenzophenone, tri(p-hydroxy phenyl)methane, 1,1,1-tri(p-hydroxyphenyl)methane, 1,1,1-tri(p-hydroxyphenyl)ethane, 1,1-bis(4-hydroxyphenyl)-1-phenylethane , 1,3-bis[1-(4-hydroxyphenyl)-1-methylethyl]benzene, 1,4-bis[1-(4-hydroxyphenyl)-1-methylethyl]benzene, 4,6-bis [1-(4-hydroxyphenyl)-1-methylethyl]-1,3-dihydroxybenzene, and 4,4'-[1-[4-[1-[4-hydroxyphenyl]-1-methylethyl Examples include ester compounds of a phenolic hydroxyl group-containing compound selected from phenyl]ethylidene]bisphenol and 1,2-naphthoquinonediazide-4-sulfonic acid chloride or 1,2-naphthoquinonediazide-5-sulfonic acid chloride.
前記母核とオルソナフトキノンジアジド化合物との使用割合は、オルソナフトキノンジアジド化合物の使用量を、母核中のOH基の数に対して、好ましくは30~85モル%、より好ましくは50~70モル%に相当する量とすることが望ましい。
The usage ratio of the orthonaphthoquinonediazide compound to the mother nucleus is preferably 30 to 85 mol%, more preferably 50 to 70 mol%, based on the number of OH groups in the mother nucleus. It is desirable that the amount corresponds to %.
本組成物において、感光性化合物としてキノンジアジド化合物を用いる場合、該キノンジアジド化合物の含有量は、本重合体100質量部に対して、好ましくは5~50質量部、より好ましくは10~30質量部、さらに好ましくは15~30質量部である。
キノンジアジド化合物の含有量が前記下限値以上であると、非露光部の残膜率が向上し、マスクパターンに忠実な像が得られやすい。キノンジアジド化合物の含有量が前記上限値以下であると、所望の形状(パターン形状)の硬化物(硬化膜)を容易に得ることができ、製膜時の発泡も抑制できる傾向にある。 In the present composition, when a quinonediazide compound is used as a photosensitive compound, the content of the quinonediazide compound is preferably 5 to 50 parts by weight, more preferably 10 to 30 parts by weight, based on 100 parts by weight of the present polymer. More preferably, it is 15 to 30 parts by mass.
When the content of the quinonediazide compound is equal to or higher than the lower limit, the residual film rate in the non-exposed areas improves, and an image faithful to the mask pattern is likely to be obtained. When the content of the quinonediazide compound is below the upper limit, a cured product (cured film) with a desired shape (pattern shape) can be easily obtained, and foaming during film formation tends to be suppressed.
キノンジアジド化合物の含有量が前記下限値以上であると、非露光部の残膜率が向上し、マスクパターンに忠実な像が得られやすい。キノンジアジド化合物の含有量が前記上限値以下であると、所望の形状(パターン形状)の硬化物(硬化膜)を容易に得ることができ、製膜時の発泡も抑制できる傾向にある。 In the present composition, when a quinonediazide compound is used as a photosensitive compound, the content of the quinonediazide compound is preferably 5 to 50 parts by weight, more preferably 10 to 30 parts by weight, based on 100 parts by weight of the present polymer. More preferably, it is 15 to 30 parts by mass.
When the content of the quinonediazide compound is equal to or higher than the lower limit, the residual film rate in the non-exposed areas improves, and an image faithful to the mask pattern is likely to be obtained. When the content of the quinonediazide compound is below the upper limit, a cured product (cured film) with a desired shape (pattern shape) can be easily obtained, and foaming during film formation tends to be suppressed.
[他の酸発生剤]
前記他の酸発生剤としては、例えば、オニウム塩化合物、ハロゲン含有化合物、スルホン化合物、スルホン酸化合物、スルホンイミド化合物、ジアゾメタン化合物が挙げられる。
本組成物に他の酸発生剤を用いる場合、1種の他の酸発生剤を用いてもよく、2種以上の他の酸発生剤を用いてもよい。 [Other acid generators]
Examples of the other acid generator include onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds.
When using other acid generators in the present composition, one type of other acid generator may be used, or two or more types of other acid generators may be used.
前記他の酸発生剤としては、例えば、オニウム塩化合物、ハロゲン含有化合物、スルホン化合物、スルホン酸化合物、スルホンイミド化合物、ジアゾメタン化合物が挙げられる。
本組成物に他の酸発生剤を用いる場合、1種の他の酸発生剤を用いてもよく、2種以上の他の酸発生剤を用いてもよい。 [Other acid generators]
Examples of the other acid generator include onium salt compounds, halogen-containing compounds, sulfone compounds, sulfonic acid compounds, sulfonimide compounds, and diazomethane compounds.
When using other acid generators in the present composition, one type of other acid generator may be used, or two or more types of other acid generators may be used.
オニウム塩化合物としては、例えば、ヨードニウム塩、スルホニウム塩、ホスホニウム塩、ジアゾニウム塩、ピリジニウム塩が挙げられる。
オニウム塩の好適例としては、ジフェニルヨードニウムトリフルオロメタンスルホネート、ジフェニルヨードニウムp-トルエンスルホネート、ジフェニルヨードニウムヘキサフルオロアンチモネート、ジフェニルヨードニウムヘキサフルオロホスフェート、ジフェニルヨードニウムテトラフルオロボレート、トリフェニルスルホニウムトリフルオロメタンスルホネート、トリフェニルスルホニウムp-トルエンスルホネート、トリフェニルスルホニウムヘキサフルオロアンチモネート、4-t-ブチルフェニル・ジフェニルスルホニウムトリフルオロメタンスルホネート、4-t-ブチルフェニル・ジフェニルスルホニウムp-トルエンスルホネート、4,7-ジ-n-ブトキシナフチルテトラヒドロチオフェニウムトリフルオロメタンスルホネート、4-(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート、4-(フェニルチオ)フェニルジフェニルスルホニウムヘキサフルオロホスファートが挙げられる。 Examples of onium salt compounds include iodonium salts, sulfonium salts, phosphonium salts, diazonium salts, and pyridinium salts.
Suitable examples of onium salts include diphenyliodonium trifluoromethanesulfonate, diphenyliodonium p-toluenesulfonate, diphenyliodonium hexafluoroantimonate, diphenyliodonium hexafluorophosphate, diphenyliodonium tetrafluoroborate, triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium p-Toluenesulfonate, triphenylsulfonium hexafluoroantimonate, 4-t-butylphenyl diphenylsulfonium trifluoromethanesulfonate, 4-t-butylphenyl diphenylsulfonium p-toluenesulfonate, 4,7-di-n-butoxynaphthyl Examples include tetrahydrothiophenium trifluoromethanesulfonate, 4-(phenylthio)phenyldiphenylsulfonium tris(pentafluoroethyl)trifluorophosphate, and 4-(phenylthio)phenyldiphenylsulfonium hexafluorophosphate.
オニウム塩の好適例としては、ジフェニルヨードニウムトリフルオロメタンスルホネート、ジフェニルヨードニウムp-トルエンスルホネート、ジフェニルヨードニウムヘキサフルオロアンチモネート、ジフェニルヨードニウムヘキサフルオロホスフェート、ジフェニルヨードニウムテトラフルオロボレート、トリフェニルスルホニウムトリフルオロメタンスルホネート、トリフェニルスルホニウムp-トルエンスルホネート、トリフェニルスルホニウムヘキサフルオロアンチモネート、4-t-ブチルフェニル・ジフェニルスルホニウムトリフルオロメタンスルホネート、4-t-ブチルフェニル・ジフェニルスルホニウムp-トルエンスルホネート、4,7-ジ-n-ブトキシナフチルテトラヒドロチオフェニウムトリフルオロメタンスルホネート、4-(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート、4-(フェニルチオ)フェニルジフェニルスルホニウムヘキサフルオロホスファートが挙げられる。 Examples of onium salt compounds include iodonium salts, sulfonium salts, phosphonium salts, diazonium salts, and pyridinium salts.
Suitable examples of onium salts include diphenyliodonium trifluoromethanesulfonate, diphenyliodonium p-toluenesulfonate, diphenyliodonium hexafluoroantimonate, diphenyliodonium hexafluorophosphate, diphenyliodonium tetrafluoroborate, triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium p-Toluenesulfonate, triphenylsulfonium hexafluoroantimonate, 4-t-butylphenyl diphenylsulfonium trifluoromethanesulfonate, 4-t-butylphenyl diphenylsulfonium p-toluenesulfonate, 4,7-di-n-butoxynaphthyl Examples include tetrahydrothiophenium trifluoromethanesulfonate, 4-(phenylthio)phenyldiphenylsulfonium tris(pentafluoroethyl)trifluorophosphate, and 4-(phenylthio)phenyldiphenylsulfonium hexafluorophosphate.
ハロゲン含有化合物としては、例えば、ハロアルキル基含有炭化水素化合物、ハロアルキル基含有複素環式化合物が挙げられる。
ハロゲン含有化合物の好適例としては、1,10-ジブロモ-n-デカン;1,1-ビス(4-クロロフェニル)-2,2,2-トリクロロエタン;フェニル-ビス(トリクロロメチル)-s-トリアジン、4-メトキシフェニル-ビス(トリクロロメチル)-s-トリアジン、スチリル-ビス(トリクロロメチル)-s-トリアジン、ナフチル-ビス(トリクロロメチル)-s-トリアジン、2-[2-(5-メチルフラン-2-イル)エテニル]-4,6-ビス-(トリクロロメチル)-1,3,5-トリアジン等のs-トリアジン誘導体が挙げられる。 Examples of the halogen-containing compound include a haloalkyl group-containing hydrocarbon compound and a haloalkyl group-containing heterocyclic compound.
Preferred examples of halogen-containing compounds include 1,10-dibromo-n-decane; 1,1-bis(4-chlorophenyl)-2,2,2-trichloroethane; phenyl-bis(trichloromethyl)-s-triazine; 4-methoxyphenyl-bis(trichloromethyl)-s-triazine, styryl-bis(trichloromethyl)-s-triazine, naphthyl-bis(trichloromethyl)-s-triazine, 2-[2-(5-methylfuran-) Examples include s-triazine derivatives such as 2-yl)ethenyl]-4,6-bis-(trichloromethyl)-1,3,5-triazine.
ハロゲン含有化合物の好適例としては、1,10-ジブロモ-n-デカン;1,1-ビス(4-クロロフェニル)-2,2,2-トリクロロエタン;フェニル-ビス(トリクロロメチル)-s-トリアジン、4-メトキシフェニル-ビス(トリクロロメチル)-s-トリアジン、スチリル-ビス(トリクロロメチル)-s-トリアジン、ナフチル-ビス(トリクロロメチル)-s-トリアジン、2-[2-(5-メチルフラン-2-イル)エテニル]-4,6-ビス-(トリクロロメチル)-1,3,5-トリアジン等のs-トリアジン誘導体が挙げられる。 Examples of the halogen-containing compound include a haloalkyl group-containing hydrocarbon compound and a haloalkyl group-containing heterocyclic compound.
Preferred examples of halogen-containing compounds include 1,10-dibromo-n-decane; 1,1-bis(4-chlorophenyl)-2,2,2-trichloroethane; phenyl-bis(trichloromethyl)-s-triazine; 4-methoxyphenyl-bis(trichloromethyl)-s-triazine, styryl-bis(trichloromethyl)-s-triazine, naphthyl-bis(trichloromethyl)-s-triazine, 2-[2-(5-methylfuran-) Examples include s-triazine derivatives such as 2-yl)ethenyl]-4,6-bis-(trichloromethyl)-1,3,5-triazine.
スルホン化合物としては、例えば、β-ケトスルホン化合物、β-スルホニルスルホン化合物及びこれらの化合物のα-ジアゾ化合物が挙げられる。
スルホン化合物の好適例としては、4-トリスフェナシルスルホン、メシチルフェナシルスルホン、ビス(フェナシルスルホニル)メタンが挙げられる。 Examples of the sulfone compound include β-ketosulfone compounds, β-sulfonylsulfone compounds, and α-diazo compounds of these compounds.
Preferred examples of the sulfone compound include 4-trisphenacylsulfone, mesitylphenacylsulfone, and bis(phenacylsulfonyl)methane.
スルホン化合物の好適例としては、4-トリスフェナシルスルホン、メシチルフェナシルスルホン、ビス(フェナシルスルホニル)メタンが挙げられる。 Examples of the sulfone compound include β-ketosulfone compounds, β-sulfonylsulfone compounds, and α-diazo compounds of these compounds.
Preferred examples of the sulfone compound include 4-trisphenacylsulfone, mesitylphenacylsulfone, and bis(phenacylsulfonyl)methane.
スルホン酸化合物としては、例えば、アルキルスルホン酸エステル類、ハロアルキルスルホン酸エステル類、アリールスルホン酸エステル類、イミノスルホネート類が挙げられる。
スルホン酸化合物の好適例としては、ベンゾイントシレート、ピロガロールトリストリフルオロメタンスルホネート、o-ニトロベンジルトリフルオロメタンスルホネート、o-ニトロベンジルp-トルエンスルホネートが挙げられる。 Examples of the sulfonic acid compound include alkyl sulfonic esters, haloalkyl sulfonic esters, arylsulfonic esters, and iminosulfonates.
Suitable examples of the sulfonic acid compound include benzoin tosylate, pyrogallol tristrifluoromethanesulfonate, o-nitrobenzyl trifluoromethanesulfonate, and o-nitrobenzyl p-toluenesulfonate.
スルホン酸化合物の好適例としては、ベンゾイントシレート、ピロガロールトリストリフルオロメタンスルホネート、o-ニトロベンジルトリフルオロメタンスルホネート、o-ニトロベンジルp-トルエンスルホネートが挙げられる。 Examples of the sulfonic acid compound include alkyl sulfonic esters, haloalkyl sulfonic esters, arylsulfonic esters, and iminosulfonates.
Suitable examples of the sulfonic acid compound include benzoin tosylate, pyrogallol tristrifluoromethanesulfonate, o-nitrobenzyl trifluoromethanesulfonate, and o-nitrobenzyl p-toluenesulfonate.
スルホンイミド化合物としては、例えば、N-(トリフルオロメチルスルホニルオキシ)スクシンイミド、N-(トリフルオロメチルスルホニルオキシ)フタルイミド、N-(トリフルオロメチルスルホニルオキシ)ジフェニルマレイミド、N-(トリフルオロメチルスルホニルオキシ)ビシクロ[2.2.1]ヘプト-5-エン-2,3-ジカルボキシイミド、N-(トリフルオロメチルスルホニルオキシ)ナフチルイミドが挙げられる。
Examples of the sulfonimide compound include N-(trifluoromethylsulfonyloxy)succinimide, N-(trifluoromethylsulfonyloxy)phthalimide, N-(trifluoromethylsulfonyloxy)diphenylmaleimide, N-(trifluoromethylsulfonyloxy) ) Bicyclo[2.2.1]hept-5-ene-2,3-dicarboximide and N-(trifluoromethylsulfonyloxy)naphthylimide.
ジアゾメタン化合物としては、例えば、ビス(トリフルオロメチルスルホニル)ジアゾメタン、ビス(シクロヘキシルスルホニル)ジアゾメタン、ビス(フェニルスルホニル)ジアゾメタンが挙げられる。
Examples of the diazomethane compound include bis(trifluoromethylsulfonyl)diazomethane, bis(cyclohexylsulfonyl)diazomethane, and bis(phenylsulfonyl)diazomethane.
本組成物において、感光性化合物として他の酸発生剤を用いる場合、該他の酸発生剤の含有量は、本重合体100質量部に対して、好ましくは0.1~10質量部、より好ましくは0.3~5質量部、さらに好ましくは0.5~5質量部である。
他の酸発生剤の含有量が前記下限値以上であると、露光部の硬化が充分となり、耐熱性が向上しやすい。他の酸発生剤の含有量が前記上限値以下であると、露光光に対する透明性が低下することなく、解像度が高いパターンが得られやすい。 In the present composition, when another acid generator is used as a photosensitive compound, the content of the other acid generator is preferably 0.1 to 10 parts by mass, and more preferably 0.1 to 10 parts by mass, based on 100 parts by mass of the present polymer. The amount is preferably 0.3 to 5 parts by weight, more preferably 0.5 to 5 parts by weight.
When the content of the other acid generator is equal to or higher than the lower limit, the exposed portions are sufficiently cured and heat resistance is likely to be improved. When the content of the other acid generator is below the upper limit, a pattern with high resolution can be easily obtained without reducing the transparency to exposure light.
他の酸発生剤の含有量が前記下限値以上であると、露光部の硬化が充分となり、耐熱性が向上しやすい。他の酸発生剤の含有量が前記上限値以下であると、露光光に対する透明性が低下することなく、解像度が高いパターンが得られやすい。 In the present composition, when another acid generator is used as a photosensitive compound, the content of the other acid generator is preferably 0.1 to 10 parts by mass, and more preferably 0.1 to 10 parts by mass, based on 100 parts by mass of the present polymer. The amount is preferably 0.3 to 5 parts by weight, more preferably 0.5 to 5 parts by weight.
When the content of the other acid generator is equal to or higher than the lower limit, the exposed portions are sufficiently cured and heat resistance is likely to be improved. When the content of the other acid generator is below the upper limit, a pattern with high resolution can be easily obtained without reducing the transparency to exposure light.
〈架橋剤〉
本組成物は、硬化性を向上させるため、架橋剤をさらに含有してもよい。
本組成物に架橋剤を用いることで、得られる硬化物(硬化膜)の強度及び得られる硬化物(硬化膜)を形成したい対象(例:下記支持体)に対する密着性を向上できる。
該架橋剤は、例えば、本重合体や、架橋剤同士と反応する架橋成分(硬化成分)として作用する。
本組成物に架橋剤を用いる場合、1種の架橋剤を用いてもよく、2種以上の架橋剤を用いてもよい。 <Crosslinking agent>
The composition may further contain a crosslinking agent to improve curability.
By using a crosslinking agent in the present composition, it is possible to improve the strength of the obtained cured product (cured film) and the adhesion of the obtained cured product (cured film) to the object (eg, the support described below) on which it is desired to be formed.
The crosslinking agent acts, for example, as a crosslinking component (curing component) that reacts with the present polymer and the crosslinking agents.
When using a crosslinking agent in the present composition, one type of crosslinking agent may be used, or two or more types of crosslinking agents may be used.
本組成物は、硬化性を向上させるため、架橋剤をさらに含有してもよい。
本組成物に架橋剤を用いることで、得られる硬化物(硬化膜)の強度及び得られる硬化物(硬化膜)を形成したい対象(例:下記支持体)に対する密着性を向上できる。
該架橋剤は、例えば、本重合体や、架橋剤同士と反応する架橋成分(硬化成分)として作用する。
本組成物に架橋剤を用いる場合、1種の架橋剤を用いてもよく、2種以上の架橋剤を用いてもよい。 <Crosslinking agent>
The composition may further contain a crosslinking agent to improve curability.
By using a crosslinking agent in the present composition, it is possible to improve the strength of the obtained cured product (cured film) and the adhesion of the obtained cured product (cured film) to the object (eg, the support described below) on which it is desired to be formed.
The crosslinking agent acts, for example, as a crosslinking component (curing component) that reacts with the present polymer and the crosslinking agents.
When using a crosslinking agent in the present composition, one type of crosslinking agent may be used, or two or more types of crosslinking agents may be used.
架橋剤は、2個以上の架橋性基を有する化合物であることが好ましい。
該架橋性基としては特に限定されないが、架橋反応性が高い等の点で、メチロール基、アルコキシメチル基及びグリシジル基からなる群より選択される少なくとも1種が好ましく、メチロール基及びアルコキシメチル基からなる群より選択される少なくとも1種がより好ましい。
架橋剤1分子が有する架橋性基の数は、例えば2~10個であり、好ましくは2~8個である。
架橋剤の具体例としては、特開2022-67054号公報、国際公開第2014/109143号等に記載の化合物が挙げられる。 The crosslinking agent is preferably a compound having two or more crosslinkable groups.
The crosslinkable group is not particularly limited, but is preferably at least one selected from the group consisting of a methylol group, an alkoxymethyl group, and a glycidyl group in terms of high crosslinking reactivity. At least one selected from the group consisting of:
The number of crosslinkable groups that one molecule of the crosslinking agent has is, for example, 2 to 10, preferably 2 to 8.
Specific examples of the crosslinking agent include compounds described in JP 2022-67054 A, WO 2014/109143, and the like.
該架橋性基としては特に限定されないが、架橋反応性が高い等の点で、メチロール基、アルコキシメチル基及びグリシジル基からなる群より選択される少なくとも1種が好ましく、メチロール基及びアルコキシメチル基からなる群より選択される少なくとも1種がより好ましい。
架橋剤1分子が有する架橋性基の数は、例えば2~10個であり、好ましくは2~8個である。
架橋剤の具体例としては、特開2022-67054号公報、国際公開第2014/109143号等に記載の化合物が挙げられる。 The crosslinking agent is preferably a compound having two or more crosslinkable groups.
The crosslinkable group is not particularly limited, but is preferably at least one selected from the group consisting of a methylol group, an alkoxymethyl group, and a glycidyl group in terms of high crosslinking reactivity. At least one selected from the group consisting of:
The number of crosslinkable groups that one molecule of the crosslinking agent has is, for example, 2 to 10, preferably 2 to 8.
Specific examples of the crosslinking agent include compounds described in JP 2022-67054 A, WO 2014/109143, and the like.
本組成物が架橋剤を含有する場合、本組成物中の架橋剤の含有量は、本重合体100質量部に対して、通常1~60質量部、好ましくは5~50質量部、より好ましくは5~40質量部である。
架橋剤の含有量が前記範囲にあると、解像度、伸び物性及び耐熱性に優れる硬化物(硬化膜)を容易に形成できる傾向にある。 When the present composition contains a crosslinking agent, the content of the crosslinking agent in the present composition is usually 1 to 60 parts by weight, preferably 5 to 50 parts by weight, and more preferably is 5 to 40 parts by mass.
When the content of the crosslinking agent is within the above range, a cured product (cured film) with excellent resolution, elongation properties, and heat resistance tends to be easily formed.
架橋剤の含有量が前記範囲にあると、解像度、伸び物性及び耐熱性に優れる硬化物(硬化膜)を容易に形成できる傾向にある。 When the present composition contains a crosslinking agent, the content of the crosslinking agent in the present composition is usually 1 to 60 parts by weight, preferably 5 to 50 parts by weight, and more preferably is 5 to 40 parts by mass.
When the content of the crosslinking agent is within the above range, a cured product (cured film) with excellent resolution, elongation properties, and heat resistance tends to be easily formed.
〈密着助剤〉
前記密着助剤は、本組成物を用いて形成される樹脂膜と被着体(基板)との接着性を向上させることができる成分であることが好ましい。
該密着助剤としては、反応性官能基を有する官能性シランカップリング剤が好ましい。
該反応性官能基としては、カルボキシ基、(メタ)アクリロイル基、エポキシ基、ビニル基、イソシアネート基等が挙げられる。 <Adhesion aid>
The adhesion aid is preferably a component that can improve the adhesion between the resin film formed using the present composition and the adherend (substrate).
The adhesion aid is preferably a functional silane coupling agent having a reactive functional group.
Examples of the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
前記密着助剤は、本組成物を用いて形成される樹脂膜と被着体(基板)との接着性を向上させることができる成分であることが好ましい。
該密着助剤としては、反応性官能基を有する官能性シランカップリング剤が好ましい。
該反応性官能基としては、カルボキシ基、(メタ)アクリロイル基、エポキシ基、ビニル基、イソシアネート基等が挙げられる。 <Adhesion aid>
The adhesion aid is preferably a component that can improve the adhesion between the resin film formed using the present composition and the adherend (substrate).
The adhesion aid is preferably a functional silane coupling agent having a reactive functional group.
Examples of the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
官能性カップリング剤の具体例としては、トリメトキシシリル安息香酸、3-グリシジルオキシプロピルトリメトキシシラン、3-グリシジルオキシプロピルトリエトキシシラン、2-(3,4-エポキシシクロへキシル)エチルトリメトキシシラン、3-(メタ)アクリロイルオキシプロピルトリメトキシシラン、3-(メタ)アクリロイルオキシプロピルトリエトキシシラン、ビニルトリアセトキシシラン、ビニルトリメトキシシラン、3-イソシアナートプロピルトリエトキシシランが挙げられる。
Specific examples of functional coupling agents include trimethoxysilylbenzoic acid, 3-glycidyloxypropyltrimethoxysilane, 3-glycidyloxypropyltriethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxy Examples include silane, 3-(meth)acryloyloxypropyltrimethoxysilane, 3-(meth)acryloyloxypropyltriethoxysilane, vinyltriacetoxysilane, vinyltrimethoxysilane, and 3-isocyanatopropyltriethoxysilane.
本組成物に密着助剤を用いる場合、本組成物中の密着助剤の含有量は、本組成物に含まれる本重合体100質量部に対して、好ましくは0.01質量部以上30質量部以下、より好ましくは0.1質量部以上20質量部以下である。
When an adhesion aid is used in the composition, the content of the adhesion aid in the composition is preferably 0.01 parts by mass or more and 30 parts by mass based on 100 parts by mass of the present polymer contained in the composition. parts, more preferably 0.1 parts by mass or more and 20 parts by mass or less.
〈溶剤〉
本組成物は、溶剤を含有することが好ましい。
溶剤を用いることで、本組成物の取扱い性を向上させたり、粘度や保存安定性を調節することができる。
本組成物に溶剤を用いる場合、1種の溶剤を用いてもよく、2種以上の溶剤を用いてもよい。 <solvent>
Preferably, the composition contains a solvent.
By using a solvent, it is possible to improve the handleability of the present composition and to adjust the viscosity and storage stability.
When using a solvent in this composition, one type of solvent may be used, or two or more types of solvents may be used.
本組成物は、溶剤を含有することが好ましい。
溶剤を用いることで、本組成物の取扱い性を向上させたり、粘度や保存安定性を調節することができる。
本組成物に溶剤を用いる場合、1種の溶剤を用いてもよく、2種以上の溶剤を用いてもよい。 <solvent>
Preferably, the composition contains a solvent.
By using a solvent, it is possible to improve the handleability of the present composition and to adjust the viscosity and storage stability.
When using a solvent in this composition, one type of solvent may be used, or two or more types of solvents may be used.
前記溶剤としては、例えば、エチレングリコールモノメチルエーテルアセテート、エチレングリコールモノエチルエーテルアセテート等のエチレングリコールモノアルキルエーテルアセテート類;プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル等のプロピレングリコールモノアルキルエーテル類;プロピレングリコールジメチルエーテル、プロピレングリコールジエチルエーテル、プロピレングリコールジプロピルエーテル、プロピレングリコールジブチルエーテル等のプロピレングリコールジアルキルエーテル類;プロピレングリコールモノメチルエーテルアセテート、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノプロピルエーテルアセテート、プロピレングリコールモノブチルエーテルアセテート等のプロピレングリコールモノアルキルエーテルアセテート類;エチルセロソルブ、ブチルセロソルブ等のセロソルブ類;ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル等のジエチレングリコールモノアルキルエーテル類;ジエチレングリコールジメチルエーテル、ジエチレングリコールメチルエチルエーテル等のジエチレングリコールジアルキルエーテル類;ジプロピレングリコールモノメチルエーテル、ジプロピレングリコールモノエチルエーテル、ジプロピレングリコールモノプロピルエーテル、ジプロピレングリコールモノブチルエーテル等のジプロピレングリコールモノアルキルエーテル類;ブチルカルビトール等のカルビトール類;乳酸メチル、乳酸エチル、乳酸n-プロピル、乳酸イソプロピル等の乳酸エステル類;酢酸エチル、酢酸n-プロピル、酢酸イソプロピル、酢酸n-ブチル、酢酸イソブチル、酢酸n-アミル、酢酸イソアミル、プロピオン酸イソプロピル、プロピオン酸n-ブチル、プロピオン酸イソブチル等の脂肪族カルボン酸エステル類;3-メトキシプロピオン酸メチル、3-メトキシプロピオン酸エチル、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル、ピルビン酸メチル、ピルビン酸エチル等の他のエステル類;2-ヘプタノン、3-ヘプタノン、4-ヘプタノン、シクロヘキサノン等のケトン類;N-ジメチルホルムアミド、N-メチルアセトアミド、N,N-ジメチルアセトアミド、N-メチルピロリドン等のアミド類;γ-ブチロラクン等のラクトン類;トルエン、キシレン等の芳香族炭化水素類;が挙げられる。
Examples of the solvent include ethylene glycol monoalkyl ether acetates such as ethylene glycol monomethyl ether acetate and ethylene glycol monoethyl ether acetate; propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, and propylene glycol monobutyl ether. propylene glycol monoalkyl ethers such as propylene glycol dimethyl ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, propylene glycol dibutyl ether; propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene Propylene glycol monoalkyl ether acetates such as glycol monopropyl ether acetate and propylene glycol monobutyl ether acetate; cellosolves such as ethyl cellosolve and butyl cellosolve; diethylene glycol monoalkyl ethers such as diethylene glycol monomethyl ether and diethylene glycol monoethyl ether; diethylene glycol dimethyl ether and diethylene glycol Diethylene glycol dialkyl ethers such as methyl ethyl ether; dipropylene glycol monoalkyl ethers such as dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether, dipropylene glycol monopropyl ether, dipropylene glycol monobutyl ether; butyl carbitol, etc. Carbitols; Lactic acid esters such as methyl lactate, ethyl lactate, n-propyl lactate, isopropyl lactate; ethyl acetate, n-propyl acetate, isopropyl acetate, n-butyl acetate, isobutyl acetate, n-amyl acetate, isoamyl acetate, Aliphatic carboxylic acid esters such as isopropyl propionate, n-butyl propionate, isobutyl propionate; methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, Other esters such as methyl pyruvate and ethyl pyruvate; Ketones such as 2-heptanone, 3-heptanone, 4-heptanone, and cyclohexanone; N-dimethylformamide, N-methylacetamide, N,N-dimethylacetamide, N - Amides such as methylpyrrolidone; lactones such as γ-butyrolacune; aromatic hydrocarbons such as toluene and xylene;
本組成物が溶剤を含有する場合、本組成物中の溶剤の含有量は、本組成物中の溶剤以外の成分の合計100質量部に対して、通常40~900質量部、好ましくは60~400質量部である。
When the present composition contains a solvent, the content of the solvent in the present composition is usually 40 to 900 parts by mass, preferably 60 to 900 parts by mass, based on a total of 100 parts by mass of components other than the solvent in the composition. It is 400 parts by mass.
<ネガ型の本組成物>
前述の本組成物は、ポジ型の本組成物として好適に使用できる。本組成物は、ポジ型であることが好ましいが、ネガ型であってもよい。
以下において、ネガ型の本組成物について説明する。ネガ型の本組成物は、前記本重合体を含めば特に制限されないが、更に、1種又は2種以上の重合性単量体及び1種又は2種以上の光重合開始剤を含有する樹脂組成物であることが好ましく、また、その他の成分を含んでいてもよい。 <Negative type composition>
The aforementioned composition can be suitably used as a positive composition. The present composition is preferably of positive type, but may be of negative type.
Below, the negative-type composition of the present invention will be explained. The negative-type present composition is not particularly limited as long as it contains the present polymer, but it also includes a resin containing one or more polymerizable monomers and one or more photopolymerization initiators. It is preferably a composition, and may also contain other components.
前述の本組成物は、ポジ型の本組成物として好適に使用できる。本組成物は、ポジ型であることが好ましいが、ネガ型であってもよい。
以下において、ネガ型の本組成物について説明する。ネガ型の本組成物は、前記本重合体を含めば特に制限されないが、更に、1種又は2種以上の重合性単量体及び1種又は2種以上の光重合開始剤を含有する樹脂組成物であることが好ましく、また、その他の成分を含んでいてもよい。 <Negative type composition>
The aforementioned composition can be suitably used as a positive composition. The present composition is preferably of positive type, but may be of negative type.
Below, the negative-type composition of the present invention will be explained. The negative-type present composition is not particularly limited as long as it contains the present polymer, but it also includes a resin containing one or more polymerizable monomers and one or more photopolymerization initiators. It is preferably a composition, and may also contain other components.
〈重合性単量体〉
前記重合性単量体は、重合性基を1個以上、好ましくは2個以上有する化合物である。
該重合性基としては、例えば、エチレン性不飽和基、オキシラニル基、オキセタニル基、N-アルコキシメチルアミノ基が挙げられる。これらのうち、重合性が高い点で、エチレン性不飽和基及びN-アルコキシメチルアミノ基が好ましく、(メタ)アクリロイル基、ビニル基及びビニルフェニル基等のビニル基含有基が好ましい。 <Polymerizable monomer>
The polymerizable monomer is a compound having one or more polymerizable groups, preferably two or more.
Examples of the polymerizable group include an ethylenically unsaturated group, an oxiranyl group, an oxetanyl group, and an N-alkoxymethylamino group. Among these, ethylenically unsaturated groups and N-alkoxymethylamino groups are preferred in terms of high polymerizability, and vinyl group-containing groups such as (meth)acryloyl groups, vinyl groups, and vinyl phenyl groups are preferred.
前記重合性単量体は、重合性基を1個以上、好ましくは2個以上有する化合物である。
該重合性基としては、例えば、エチレン性不飽和基、オキシラニル基、オキセタニル基、N-アルコキシメチルアミノ基が挙げられる。これらのうち、重合性が高い点で、エチレン性不飽和基及びN-アルコキシメチルアミノ基が好ましく、(メタ)アクリロイル基、ビニル基及びビニルフェニル基等のビニル基含有基が好ましい。 <Polymerizable monomer>
The polymerizable monomer is a compound having one or more polymerizable groups, preferably two or more.
Examples of the polymerizable group include an ethylenically unsaturated group, an oxiranyl group, an oxetanyl group, and an N-alkoxymethylamino group. Among these, ethylenically unsaturated groups and N-alkoxymethylamino groups are preferred in terms of high polymerizability, and vinyl group-containing groups such as (meth)acryloyl groups, vinyl groups, and vinyl phenyl groups are preferred.
重合性単量体としては、具体的には、2個以上の(メタ)アクリロイル基を有する化合物、又は、2個以上のN-アルコキシメチルアミノ基を有する化合物が好ましく、2個以上の(メタ)アクリロイル基を有する化合物が特に好ましい。
重合性単量体1分子が有する重合性基の数は、好ましくは2~10個であり、より好ましくは2~8個である。 Specifically, the polymerizable monomer is preferably a compound having two or more (meth)acryloyl groups, or a compound having two or more N-alkoxymethylamino groups, and two or more (meth)acryloyl groups. ) Compounds having an acryloyl group are particularly preferred.
The number of polymerizable groups that one molecule of the polymerizable monomer has is preferably 2 to 10, more preferably 2 to 8.
重合性単量体1分子が有する重合性基の数は、好ましくは2~10個であり、より好ましくは2~8個である。 Specifically, the polymerizable monomer is preferably a compound having two or more (meth)acryloyl groups, or a compound having two or more N-alkoxymethylamino groups, and two or more (meth)acryloyl groups. ) Compounds having an acryloyl group are particularly preferred.
The number of polymerizable groups that one molecule of the polymerizable monomer has is preferably 2 to 10, more preferably 2 to 8.
2個以上の(メタ)アクリロイル基を有する化合物の具体例としては、3価以上の脂肪族ポリヒドロキシ化合物と(メタ)アクリル酸とを反応させて得られる多官能(メタ)アクリレート、カプロラクトン変性多官能(メタ)アクリレート、アルキレンオキサイド変性多官能(メタ)アクリレート、水酸基を有する(メタ)アクリレートと多官能イソシアネートとを反応させて得られる多官能ウレタン(メタ)アクリレート、水酸基を有する(メタ)アクリレートと酸無水物とを反応させて得られるカルボキシ基を有する多官能(メタ)アクリレートが挙げられる。
Specific examples of compounds having two or more (meth)acryloyl groups include polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid, and caprolactone-modified polyhydroxyl groups. Functional (meth)acrylates, alkylene oxide-modified polyfunctional (meth)acrylates, polyfunctional urethane (meth)acrylates obtained by reacting (meth)acrylates with hydroxyl groups and polyfunctional isocyanates, (meth)acrylates with hydroxyl groups, Examples include polyfunctional (meth)acrylates having a carboxy group obtained by reacting with acid anhydrides.
2個以上のN-アルコキシメチルアミノ基を有する化合物としては、例えば、メラミン構造、ベンゾグアナミン構造、ウレア構造を有する化合物が挙げられる。なお、メラミン構造、ベンゾグアナミン構造とは、1個以上のトリアジン環又はフェニル置換トリアジン環を基本骨格として有する化学構造をいい、メラミン、ベンゾグアナミン又はそれらの縮合物をも含む概念である。
2個以上のN-アルコキシメチルアミノ基を有する化合物の具体例としては、N,N,N’,N’,N’’,N’’-ヘキサ(アルコキシメチル)メラミン、N,N,N’,N’-テトラ(アルコキシメチル)ベンゾグアナミン、N,N,N’,N’-テトラ(アルコキシメチル)グリコールウリルが挙げられる。 Examples of the compound having two or more N-alkoxymethylamino groups include compounds having a melamine structure, a benzoguanamine structure, and a urea structure. Note that the melamine structure and benzoguanamine structure refer to a chemical structure having one or more triazine rings or phenyl-substituted triazine rings as a basic skeleton, and are concepts that also include melamine, benzoguanamine, or condensates thereof.
Specific examples of compounds having two or more N-alkoxymethylamino groups include N,N,N',N',N'',N''-hexa(alkoxymethyl)melamine, N,N,N' , N'-tetra(alkoxymethyl)benzoguanamine, and N,N,N',N'-tetra(alkoxymethyl)glycoluril.
2個以上のN-アルコキシメチルアミノ基を有する化合物の具体例としては、N,N,N’,N’,N’’,N’’-ヘキサ(アルコキシメチル)メラミン、N,N,N’,N’-テトラ(アルコキシメチル)ベンゾグアナミン、N,N,N’,N’-テトラ(アルコキシメチル)グリコールウリルが挙げられる。 Examples of the compound having two or more N-alkoxymethylamino groups include compounds having a melamine structure, a benzoguanamine structure, and a urea structure. Note that the melamine structure and benzoguanamine structure refer to a chemical structure having one or more triazine rings or phenyl-substituted triazine rings as a basic skeleton, and are concepts that also include melamine, benzoguanamine, or condensates thereof.
Specific examples of compounds having two or more N-alkoxymethylamino groups include N,N,N',N',N'',N''-hexa(alkoxymethyl)melamine, N,N,N' , N'-tetra(alkoxymethyl)benzoguanamine, and N,N,N',N'-tetra(alkoxymethyl)glycoluril.
これらの中でも、重合性単量体としては、3価以上の脂肪族ポリヒドロキシ化合物と(メタ)アクリル酸とを反応させて得られる多官能(メタ)アクリレート、カプロラクトン変性多官能(メタ)アクリレート、多官能ウレタン(メタ)アクリレート、カルボキシ基を有する多官能(メタ)アクリレート、N,N,N’,N’,N’’,N’’-ヘキサ(アルコキシメチル)メラミン、N,N,N’,N’-テトラ(アルコキシメチル)ベンゾグアナミンが好ましく、3価以上の脂肪族ポリヒドロキシ化合物と(メタ)アクリル酸とを反応させて得られる多官能(メタ)アクリレート、多官能ウレタン(メタ)アクリレート、カルボキシ基を有する多官能(メタ)アクリレートがより好ましく、3価以上の脂肪族ポリヒドロキシ化合物と(メタ)アクリル酸とを反応させて得られる多官能(メタ)アクリレートが更に好ましい。
Among these, as polymerizable monomers, polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid, caprolactone-modified polyfunctional (meth)acrylates, Polyfunctional urethane (meth)acrylate, polyfunctional (meth)acrylate with carboxy group, N, N, N', N', N'', N''-hexa(alkoxymethyl)melamine, N, N, N' , N'-tetra(alkoxymethyl)benzoguanamine is preferred, and polyfunctional (meth)acrylates and polyfunctional urethane (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid; A polyfunctional (meth)acrylate having a carboxyl group is more preferred, and a polyfunctional (meth)acrylate obtained by reacting an aliphatic polyhydroxy compound having a valence of 3 or more with (meth)acrylic acid is even more preferred.
3価以上の脂肪族ポリヒドロキシ化合物と(メタ)アクリル酸とを反応させて得られる多官能(メタ)アクリレートの具体例としては、ペンタエリスリトールトリ(メタ)アクリレート、ジペンタエリスリトールジ(メタ)アクリレート、ジペンタエリスリトールトリ(メタ)アクリレート、ジペンタエリスリトールテトラ(メタ)アクリレート、ジペンタエリスリトールペンタ(メタ)アクリレート、ジペンタエリスリトールヘキサ(メタ)アクリレート、トリメチロールプロパンジ(メタ)アクリレート、ポリペンタエリスリトールポリ(メタ)アクリレートが挙げられる。これらの中でも、分子間又は分子内における架橋密度が高められ、低温焼成によっても膜の硬化性をより向上できる等の点で、ペンタエリスリトールトリアクリレート、ジペンタエリスリトールペンタアクリレート、ジペンタエリスリトールヘキサ(メタ)アクリレートが特に好ましい。
Specific examples of polyfunctional (meth)acrylates obtained by reacting trivalent or higher aliphatic polyhydroxy compounds with (meth)acrylic acid include pentaerythritol tri(meth)acrylate and dipentaerythritol di(meth)acrylate. , dipentaerythritol tri(meth)acrylate, dipentaerythritol tetra(meth)acrylate, dipentaerythritol penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, trimethylolpropane di(meth)acrylate, polypentaerythritol poly (Meth)acrylates are mentioned. Among these, pentaerythritol triacrylate, dipentaerythritol pentaacrylate, and dipentaerythritol hexa(meth) have higher intermolecular or intramolecular crosslinking density and can further improve the curability of the film even by low-temperature firing. ) Acrylates are particularly preferred.
本組成物に重合性単量体を用いる場合、本組成物中の重合性単量体の含有量は、本組成物に含まれる本重合体100質量部に対して、好ましくは10質量部以上、より好ましくは20質量部以上であり、好ましくは1000質量部以下、より好ましくは500質量部以下である。
重合性単量体の含有量が前記範囲にあると、硬化膜として十分な硬化性と十分なアルカリ現像性とを確保できるとともに、非露光部の基板上又は遮光層上の地汚れ、膜残り等の発生を十分に抑制できる等の点で好ましい。 When a polymerizable monomer is used in the composition, the content of the polymerizable monomer in the composition is preferably 10 parts by mass or more based on 100 parts by mass of the polymer contained in the composition. , more preferably 20 parts by mass or more, preferably 1000 parts by mass or less, more preferably 500 parts by mass or less.
When the content of the polymerizable monomer is within the above range, sufficient curability and sufficient alkali developability can be ensured as a cured film, and there is no background stain or film residue on the substrate or light-shielding layer in non-exposed areas. This method is preferable because it can sufficiently suppress the occurrence of such problems.
重合性単量体の含有量が前記範囲にあると、硬化膜として十分な硬化性と十分なアルカリ現像性とを確保できるとともに、非露光部の基板上又は遮光層上の地汚れ、膜残り等の発生を十分に抑制できる等の点で好ましい。 When a polymerizable monomer is used in the composition, the content of the polymerizable monomer in the composition is preferably 10 parts by mass or more based on 100 parts by mass of the polymer contained in the composition. , more preferably 20 parts by mass or more, preferably 1000 parts by mass or less, more preferably 500 parts by mass or less.
When the content of the polymerizable monomer is within the above range, sufficient curability and sufficient alkali developability can be ensured as a cured film, and there is no background stain or film residue on the substrate or light-shielding layer in non-exposed areas. This method is preferable because it can sufficiently suppress the occurrence of such problems.
〈光重合開始剤〉
前記光重合開始剤としては、波長300nm以上(好ましくは300~450nm)の活性光線に感応し、前記重合性単量体の重合を開始、促進する化合物が好ましい。
なお、波長300nm以上の活性光線に直接感応しない光重合開始剤を用いる場合、増感剤と併用することによって、波長300nm以上の活性光線に感応し、前記重合性単量体の重合を開始、促進するようにしてもよい。 <Photopolymerization initiator>
The photopolymerization initiator is preferably a compound that is sensitive to actinic rays with a wavelength of 300 nm or more (preferably 300 to 450 nm) and initiates and promotes polymerization of the polymerizable monomer.
In addition, when using a photopolymerization initiator that is not directly sensitive to actinic rays with a wavelength of 300 nm or more, by using it in combination with a sensitizer, it becomes sensitive to actinic rays with a wavelength of 300 nm or more and starts polymerization of the polymerizable monomer, It may also be promoted.
前記光重合開始剤としては、波長300nm以上(好ましくは300~450nm)の活性光線に感応し、前記重合性単量体の重合を開始、促進する化合物が好ましい。
なお、波長300nm以上の活性光線に直接感応しない光重合開始剤を用いる場合、増感剤と併用することによって、波長300nm以上の活性光線に感応し、前記重合性単量体の重合を開始、促進するようにしてもよい。 <Photopolymerization initiator>
The photopolymerization initiator is preferably a compound that is sensitive to actinic rays with a wavelength of 300 nm or more (preferably 300 to 450 nm) and initiates and promotes polymerization of the polymerizable monomer.
In addition, when using a photopolymerization initiator that is not directly sensitive to actinic rays with a wavelength of 300 nm or more, by using it in combination with a sensitizer, it becomes sensitive to actinic rays with a wavelength of 300 nm or more and starts polymerization of the polymerizable monomer, It may also be promoted.
光重合開始剤としては、公知の化合物を用いることができる。その具体例としては、オキシムエステル化合物、有機ハロゲン化化合物、オキシジアゾール化合物、カルボニル化合物、ケタール化合物、ベンゾイン化合物、アクリジン化合物、有機過酸化化合物、アゾ化合物、クマリン化合物、アジド化合物、メタロセン化合物、ヘキサアリールビイミダゾール化合物、有機ホウ酸化合物、ジスルホン酸化合物、α-アミノケトン化合物、オニウム塩化合物、アシルホスフィン(アシルホスフィンオキシドを含む)化合物が挙げられる。これらの中でも、本組成物の感度をより高くできる等の点から、オキシムエステル化合物、α-アミノケトン化合物及びヘキサアリールビイミダゾール化合物よりなる群から選択される少なくとも1種が好ましく、オキシムエステル化合物又はα-アミノケトン化合物がより好ましい。
As the photopolymerization initiator, known compounds can be used. Specific examples include oxime ester compounds, organic halogenated compounds, oxydiazole compounds, carbonyl compounds, ketal compounds, benzoin compounds, acridine compounds, organic peroxide compounds, azo compounds, coumarin compounds, azide compounds, metallocene compounds, hexa Examples include arylbiimidazole compounds, organic boric acid compounds, disulfonic acid compounds, α-aminoketone compounds, onium salt compounds, and acylphosphine (including acylphosphine oxide) compounds. Among these, at least one selected from the group consisting of an oxime ester compound, an α-aminoketone compound, and a hexaarylbiimidazole compound is preferred from the viewpoint of increasing the sensitivity of the present composition. -Aminoketone compounds are more preferred.
本組成物に光重合開始剤を用いる場合、本組成物中の光重合開始剤の含有量は、本組成物に含まれる本重合体100質量部に対して、好ましくは1質量部以上、より好ましくは2質量部以上、更に好ましくは5質量部以上であり、好ましくは40質量部以下、より好ましくは30質量部以下、更に好ましくは20質量部以下である。
When a photopolymerization initiator is used in the present composition, the content of the photopolymerization initiator in the present composition is preferably 1 part by mass or more, more preferably 1 part by mass or more, based on 100 parts by mass of the present polymer contained in the composition. The amount is preferably 2 parts by weight or more, more preferably 5 parts by weight or more, preferably 40 parts by weight or less, more preferably 30 parts by weight or less, even more preferably 20 parts by weight or less.
〈その他の成分〉
前記その他の成分としては、前記重合性単量体及び光重合開始剤以外の成分であり、具体例としては、密着助剤、溶媒、増感剤、架橋剤、界面活性剤(フッ素系界面活性剤、シリコーン系界面活性剤、ノニオン系界面活性剤等)、酸化防止剤が挙げられる。
これらのその他の成分は、それぞれ1種を用いてもよく、2種以上を用いてもよい。 <Other ingredients>
The other components are components other than the polymerizable monomer and photopolymerization initiator, and specific examples include adhesion aids, solvents, sensitizers, crosslinking agents, and surfactants (fluorinated surfactants, etc.). surfactants, silicone surfactants, nonionic surfactants, etc.), and antioxidants.
These other components may be used alone or in combination of two or more.
前記その他の成分としては、前記重合性単量体及び光重合開始剤以外の成分であり、具体例としては、密着助剤、溶媒、増感剤、架橋剤、界面活性剤(フッ素系界面活性剤、シリコーン系界面活性剤、ノニオン系界面活性剤等)、酸化防止剤が挙げられる。
これらのその他の成分は、それぞれ1種を用いてもよく、2種以上を用いてもよい。 <Other ingredients>
The other components are components other than the polymerizable monomer and photopolymerization initiator, and specific examples include adhesion aids, solvents, sensitizers, crosslinking agents, and surfactants (fluorinated surfactants, etc.). surfactants, silicone surfactants, nonionic surfactants, etc.), and antioxidants.
These other components may be used alone or in combination of two or more.
・密着助剤
前記密着助剤は、本組成物を用いて形成される硬化膜と被着体(基板)との接着性を向上させることができる成分であることが好ましい。
該密着助剤としては、反応性官能基を有する官能性シランカップリング剤が好ましい。
該反応性官能基としては、カルボキシ基、(メタ)アクリロイル基、エポキシ基、ビニル基、イソシアネート基等が挙げられる。
官能性カップリング剤としては、例えば、前記その他の添加剤の欄に記載の官能性カップリング剤と同様の化合物等が挙げられる。 - Adhesion aid The adhesion aid is preferably a component that can improve the adhesion between the cured film formed using the present composition and the adherend (substrate).
The adhesion aid is preferably a functional silane coupling agent having a reactive functional group.
Examples of the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
Examples of the functional coupling agent include the same compounds as the functional coupling agents described in the section of other additives above.
前記密着助剤は、本組成物を用いて形成される硬化膜と被着体(基板)との接着性を向上させることができる成分であることが好ましい。
該密着助剤としては、反応性官能基を有する官能性シランカップリング剤が好ましい。
該反応性官能基としては、カルボキシ基、(メタ)アクリロイル基、エポキシ基、ビニル基、イソシアネート基等が挙げられる。
官能性カップリング剤としては、例えば、前記その他の添加剤の欄に記載の官能性カップリング剤と同様の化合物等が挙げられる。 - Adhesion aid The adhesion aid is preferably a component that can improve the adhesion between the cured film formed using the present composition and the adherend (substrate).
The adhesion aid is preferably a functional silane coupling agent having a reactive functional group.
Examples of the reactive functional group include a carboxy group, (meth)acryloyl group, epoxy group, vinyl group, and isocyanate group.
Examples of the functional coupling agent include the same compounds as the functional coupling agents described in the section of other additives above.
ネガ型の本組成物に密着助剤を用いる場合、該密着助剤の含有量は、該本組成物に含まれる本重合体100質量部に対して、好ましくは0.01質量部以上30質量部以下、より好ましくは0.1質量部以上20質量部以下である。
When an adhesion aid is used in the negative-type present composition, the content of the adhesion aid is preferably 0.01 parts by mass or more and 30 parts by mass based on 100 parts by mass of the present polymer contained in the present composition. parts, more preferably 0.1 parts by mass or more and 20 parts by mass or less.
・溶媒
前記溶媒としては、本組成物に配合される各成分を溶解し、かつ各成分と反応しない有機溶媒が好ましい。該溶媒としては、例えば、前記その他の添加剤の欄に記載の溶剤と同様の溶剤が挙げられる。
ネガ型の本組成物に溶媒を用いる場合、該溶媒の含有量は、該本組成物100質量%に対し、好ましくは50~95質量%、より好ましくは60~90質量%である。 -Solvent The solvent is preferably an organic solvent that dissolves each component included in the present composition and does not react with each component. Examples of the solvent include the same solvents as those described in the column of other additives.
When a solvent is used in the negative-type present composition, the content of the solvent is preferably 50 to 95% by mass, more preferably 60 to 90% by mass, based on 100% by mass of the present composition.
前記溶媒としては、本組成物に配合される各成分を溶解し、かつ各成分と反応しない有機溶媒が好ましい。該溶媒としては、例えば、前記その他の添加剤の欄に記載の溶剤と同様の溶剤が挙げられる。
ネガ型の本組成物に溶媒を用いる場合、該溶媒の含有量は、該本組成物100質量%に対し、好ましくは50~95質量%、より好ましくは60~90質量%である。 -Solvent The solvent is preferably an organic solvent that dissolves each component included in the present composition and does not react with each component. Examples of the solvent include the same solvents as those described in the column of other additives.
When a solvent is used in the negative-type present composition, the content of the solvent is preferably 50 to 95% by mass, more preferably 60 to 90% by mass, based on 100% by mass of the present composition.
<本組成物の調製方法>
本組成物は、配合する各成分を(均一に)混合することで調製することができ、この混合の際には、各成分を一度に添加・混合してもよく、複数回に分けて添加・混合してもよい。
本組成物の調製は室温で行ってもよく、適宜加熱して行ってもよい。
また、ゴミ等を取り除くために、配合する各成分を(均一に)混合した後、得られた混合物をフィルター等で濾過してもよい。 <Method for preparing this composition>
This composition can be prepared by (uniformly) mixing each component to be blended, and during this mixing, each component may be added and mixed at once, or it may be added in multiple steps.・May be mixed.
The composition may be prepared at room temperature or by heating as appropriate.
Further, in order to remove dust and the like, after the components to be blended are mixed (uniformly), the resulting mixture may be filtered using a filter or the like.
本組成物は、配合する各成分を(均一に)混合することで調製することができ、この混合の際には、各成分を一度に添加・混合してもよく、複数回に分けて添加・混合してもよい。
本組成物の調製は室温で行ってもよく、適宜加熱して行ってもよい。
また、ゴミ等を取り除くために、配合する各成分を(均一に)混合した後、得られた混合物をフィルター等で濾過してもよい。 <Method for preparing this composition>
This composition can be prepared by (uniformly) mixing each component to be blended, and during this mixing, each component may be added and mixed at once, or it may be added in multiple steps.・May be mixed.
The composition may be prepared at room temperature or by heating as appropriate.
Further, in order to remove dust and the like, after the components to be blended are mixed (uniformly), the resulting mixture may be filtered using a filter or the like.
≪硬化物≫
本発明の一実施形態に係る硬化物(以下「本硬化物」ともいう。)は、本組成物を用いて形成される。
本組成物を用いることにより、本硬化物は、感度、波長400nmの光の透過性、耐熱性、低比誘電率、平坦性、低線膨張係数及び耐折り曲げ性にバランスよく優れる。従って、本硬化物は、回路基板、高密度実装基板、半導体素子、半導体パッケージ又は表示素子等の電子部品に用いられる、(層間)絶縁膜、表面保護膜、平坦化膜等として好適に用いることができる。 ≪Cured product≫
A cured product according to one embodiment of the present invention (hereinafter also referred to as "main cured product") is formed using the present composition.
By using this composition, the cured product has excellent sensitivity, transparency to light at a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low linear expansion coefficient, and bending resistance in a well-balanced manner. Therefore, this cured product can be suitably used as an (interlayer) insulating film, surface protection film, planarization film, etc. used in electronic components such as circuit boards, high-density mounting boards, semiconductor elements, semiconductor packages, and display elements. Can be done.
本発明の一実施形態に係る硬化物(以下「本硬化物」ともいう。)は、本組成物を用いて形成される。
本組成物を用いることにより、本硬化物は、感度、波長400nmの光の透過性、耐熱性、低比誘電率、平坦性、低線膨張係数及び耐折り曲げ性にバランスよく優れる。従って、本硬化物は、回路基板、高密度実装基板、半導体素子、半導体パッケージ又は表示素子等の電子部品に用いられる、(層間)絶縁膜、表面保護膜、平坦化膜等として好適に用いることができる。 ≪Cured product≫
A cured product according to one embodiment of the present invention (hereinafter also referred to as "main cured product") is formed using the present composition.
By using this composition, the cured product has excellent sensitivity, transparency to light at a wavelength of 400 nm, heat resistance, low dielectric constant, flatness, low linear expansion coefficient, and bending resistance in a well-balanced manner. Therefore, this cured product can be suitably used as an (interlayer) insulating film, surface protection film, planarization film, etc. used in electronic components such as circuit boards, high-density mounting boards, semiconductor elements, semiconductor packages, and display elements. Can be done.
本硬化物の好適例は、硬化膜、特にパターン化硬化膜であり、パターン化硬化膜の好適な製造例を以下に示す。
このパターン化硬化膜の好適な製造例は、本組成物を支持体上に塗布して樹脂膜を形成する工程(塗布工程)、所望のマスクパターンを介して前記樹脂膜を露光する工程(露光工程)、及び、アルカリ性現像液により前記露光工程後の樹脂膜を現像して、ポジ型の場合は露光部を、ネガ型の場合は露光部を溶解・除去することにより、支持体上に所望のパターンの硬化膜(パターン化硬化膜)を形成する工程(現像工程)を有する。 A preferred example of the cured product is a cured film, particularly a patterned cured film, and a preferred manufacturing example of a patterned cured film is shown below.
A preferred manufacturing example of this patterned cured film includes a step of coating the present composition on a support to form a resin film (coating step), and a step of exposing the resin film to light through a desired mask pattern (exposure step). step), and the resin film after the exposure step is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the exposed areas in the case of a negative type, thereby forming the desired image on the support. The method includes a step (developing step) of forming a cured film having a pattern (patterned cured film).
このパターン化硬化膜の好適な製造例は、本組成物を支持体上に塗布して樹脂膜を形成する工程(塗布工程)、所望のマスクパターンを介して前記樹脂膜を露光する工程(露光工程)、及び、アルカリ性現像液により前記露光工程後の樹脂膜を現像して、ポジ型の場合は露光部を、ネガ型の場合は露光部を溶解・除去することにより、支持体上に所望のパターンの硬化膜(パターン化硬化膜)を形成する工程(現像工程)を有する。 A preferred example of the cured product is a cured film, particularly a patterned cured film, and a preferred manufacturing example of a patterned cured film is shown below.
A preferred manufacturing example of this patterned cured film includes a step of coating the present composition on a support to form a resin film (coating step), and a step of exposing the resin film to light through a desired mask pattern (exposure step). step), and the resin film after the exposure step is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the exposed areas in the case of a negative type, thereby forming the desired image on the support. The method includes a step (developing step) of forming a cured film having a pattern (patterned cured film).
[1]塗布工程
塗布工程では、本組成物を、最終的に得られるパターン化硬化膜の膜厚が、例えば0.1~100μmとなるように、支持体上に塗布する。
支持体上に塗布した本組成物を、オーブンやホットプレート等を用いて、通常、50~140℃で10~360秒間加熱することで、支持体上に樹脂膜を形成することが好ましい。 [1] Coating step In the coating step, the present composition is coated onto a support so that the thickness of the patterned cured film finally obtained is, for example, 0.1 to 100 μm.
It is preferable to form a resin film on the support by heating the present composition coated on the support, usually at 50 to 140° C. for 10 to 360 seconds, using an oven, hot plate, or the like.
塗布工程では、本組成物を、最終的に得られるパターン化硬化膜の膜厚が、例えば0.1~100μmとなるように、支持体上に塗布する。
支持体上に塗布した本組成物を、オーブンやホットプレート等を用いて、通常、50~140℃で10~360秒間加熱することで、支持体上に樹脂膜を形成することが好ましい。 [1] Coating step In the coating step, the present composition is coated onto a support so that the thickness of the patterned cured film finally obtained is, for example, 0.1 to 100 μm.
It is preferable to form a resin film on the support by heating the present composition coated on the support, usually at 50 to 140° C. for 10 to 360 seconds, using an oven, hot plate, or the like.
支持体としては、例えば、シリコンウエハ、化合物半導体ウエハ、金属薄膜付きウエハ、ガラス基板、石英基板、セラミックス基板、アルミ基板、これらの支持体の表面に半導体チップを有する基板が挙げられる。
塗布方法としては、例えば、ディッピング法、スプレー法、バーコート法、ロールコート法、スピンコート法、カーテンコート法、グラビア印刷法、シルクスクリーン法、インクジェット法が挙げられる。 Examples of the support include silicon wafers, compound semiconductor wafers, wafers with metal thin films, glass substrates, quartz substrates, ceramic substrates, aluminum substrates, and substrates having semiconductor chips on the surfaces of these supports.
Examples of the coating method include a dipping method, a spray method, a bar coating method, a roll coating method, a spin coating method, a curtain coating method, a gravure printing method, a silk screen method, and an inkjet method.
塗布方法としては、例えば、ディッピング法、スプレー法、バーコート法、ロールコート法、スピンコート法、カーテンコート法、グラビア印刷法、シルクスクリーン法、インクジェット法が挙げられる。 Examples of the support include silicon wafers, compound semiconductor wafers, wafers with metal thin films, glass substrates, quartz substrates, ceramic substrates, aluminum substrates, and substrates having semiconductor chips on the surfaces of these supports.
Examples of the coating method include a dipping method, a spray method, a bar coating method, a roll coating method, a spin coating method, a curtain coating method, a gravure printing method, a silk screen method, and an inkjet method.
[2]露光工程
露光工程では、所望のマスクパターンを介して、例えば、コンタクトアライナー、ステッパー又はスキャナーを用いて、塗布工程で得られた樹脂膜に対して露光を行う。
パターンの形状は特に限定されず、所望の用途に応じて適宜選択すればよいが、例えば、ライン・アンド・スペースパターン、ドットパターン、ホールパターン(例:スクエア・コンタクト・ホールパターン)、格子パターンが挙げられる。 [2] Exposure Step In the exposure step, the resin film obtained in the coating step is exposed to light through a desired mask pattern using, for example, a contact aligner, a stepper, or a scanner.
The shape of the pattern is not particularly limited and may be selected as appropriate depending on the desired use, but examples include line and space patterns, dot patterns, hole patterns (e.g. square contact hole patterns), and lattice patterns. Can be mentioned.
露光工程では、所望のマスクパターンを介して、例えば、コンタクトアライナー、ステッパー又はスキャナーを用いて、塗布工程で得られた樹脂膜に対して露光を行う。
パターンの形状は特に限定されず、所望の用途に応じて適宜選択すればよいが、例えば、ライン・アンド・スペースパターン、ドットパターン、ホールパターン(例:スクエア・コンタクト・ホールパターン)、格子パターンが挙げられる。 [2] Exposure Step In the exposure step, the resin film obtained in the coating step is exposed to light through a desired mask pattern using, for example, a contact aligner, a stepper, or a scanner.
The shape of the pattern is not particularly limited and may be selected as appropriate depending on the desired use, but examples include line and space patterns, dot patterns, hole patterns (e.g. square contact hole patterns), and lattice patterns. Can be mentioned.
露光光としては、紫外線、可視光線等が挙げられ、通常、波長200~500nmの光(例:i線(365nm))が挙げられる。
露光量は、本組成物中の各成分の種類、配合割合、樹脂膜の厚さなどによって異なるが、露光光にi線を使用する場合、露光量は通常10~10,000J/m2である。 Examples of the exposure light include ultraviolet rays and visible light, and usually light with a wavelength of 200 to 500 nm (eg, i-line (365 nm)).
The amount of exposure varies depending on the type of each component in the composition, the blending ratio, the thickness of the resin film, etc., but when using i-line as the exposure light, the amount of exposure is usually 10 to 10,000 J/ m2 . be.
露光量は、本組成物中の各成分の種類、配合割合、樹脂膜の厚さなどによって異なるが、露光光にi線を使用する場合、露光量は通常10~10,000J/m2である。 Examples of the exposure light include ultraviolet rays and visible light, and usually light with a wavelength of 200 to 500 nm (eg, i-line (365 nm)).
The amount of exposure varies depending on the type of each component in the composition, the blending ratio, the thickness of the resin film, etc., but when using i-line as the exposure light, the amount of exposure is usually 10 to 10,000 J/ m2 . be.
ネガ型の本組成物を用いる場合は、露光後に加熱処理を行ってもよい。
該加熱処理の条件は特に制限されず、本組成物中の各成分の含有量及び樹脂膜の膜厚等によって異なるが、通常70~150℃、好ましくは80~120℃で、1~60分間程度である。 When using a negative type of the present composition, heat treatment may be performed after exposure.
The conditions for the heat treatment are not particularly limited and vary depending on the content of each component in the composition and the thickness of the resin film, but are usually 70 to 150°C, preferably 80 to 120°C, for 1 to 60 minutes. That's about it.
該加熱処理の条件は特に制限されず、本組成物中の各成分の含有量及び樹脂膜の膜厚等によって異なるが、通常70~150℃、好ましくは80~120℃で、1~60分間程度である。 When using a negative type of the present composition, heat treatment may be performed after exposure.
The conditions for the heat treatment are not particularly limited and vary depending on the content of each component in the composition and the thickness of the resin film, but are usually 70 to 150°C, preferably 80 to 120°C, for 1 to 60 minutes. That's about it.
[3]現像工程
現像工程では、アルカリ性現像液により前記露光工程後の樹脂膜を現像して、ポジ型の場合は露光部を、ネガ型の場合は非露光部を溶解・除去することにより、支持体上に所望のパターン化硬化膜を形成する。
なお、得られたパターン化硬化膜は、必要により、水等で洗浄し、乾燥してもよい。 [3] Development process In the development process, the resin film after the exposure process is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the non-exposed areas in the case of a negative type. A desired patterned cured film is formed on the support.
Note that the obtained patterned cured film may be washed with water or the like and dried, if necessary.
現像工程では、アルカリ性現像液により前記露光工程後の樹脂膜を現像して、ポジ型の場合は露光部を、ネガ型の場合は非露光部を溶解・除去することにより、支持体上に所望のパターン化硬化膜を形成する。
なお、得られたパターン化硬化膜は、必要により、水等で洗浄し、乾燥してもよい。 [3] Development process In the development process, the resin film after the exposure process is developed with an alkaline developer to dissolve and remove the exposed areas in the case of a positive type and the non-exposed areas in the case of a negative type. A desired patterned cured film is formed on the support.
Note that the obtained patterned cured film may be washed with water or the like and dried, if necessary.
現像方法としては、シャワー現像法、スプレー現像法、浸漬現像法、パドル現像法等が挙げられる。
現像条件は、通常、20~40℃で1~10分間程度である。 Examples of the developing method include a shower developing method, a spray developing method, an immersion developing method, a paddle developing method, and the like.
The developing conditions are usually 20 to 40°C for about 1 to 10 minutes.
現像条件は、通常、20~40℃で1~10分間程度である。 Examples of the developing method include a shower developing method, a spray developing method, an immersion developing method, a paddle developing method, and the like.
The developing conditions are usually 20 to 40°C for about 1 to 10 minutes.
前記アルカリ性現像液としては、例えば、水酸化ナトリウム、水酸化カリウム、アンモニア水、テトラメチルアンモニウムヒドロキシド、コリン等のアルカリ性化合物を、濃度が1~10質量%となるように水に溶解させたアルカリ性水溶液が挙げられる。該アルカリ性水溶液には、例えば、メタノール、エタノール等の水溶性の有機溶剤及び界面活性剤などを適量添加してもよい。
Examples of the alkaline developer include an alkaline developer in which an alkaline compound such as sodium hydroxide, potassium hydroxide, aqueous ammonia, tetramethylammonium hydroxide, choline, etc. is dissolved in water to a concentration of 1 to 10% by mass. Examples include aqueous solutions. An appropriate amount of a water-soluble organic solvent such as methanol or ethanol, a surfactant, or the like may be added to the alkaline aqueous solution.
[4]硬化工程
前記現像工程後、パターン化硬化膜としての特性を充分に発現させるため、必要に応じて、加熱等により現像工程後のパターン化硬化膜を充分に硬化する硬化工程を行ってもよい。
硬化工程の条件は特に限定されず、硬化膜の用途等に応じて適宜設定すればよいが、例えば100~250℃で30分間~10時間程度加熱する条件が挙げられる。 [4] Curing process After the development process, in order to fully express the characteristics of the patterned cured film, if necessary, a curing process is performed to sufficiently harden the patterned cured film after the development process by heating, etc. Good too.
The conditions for the curing step are not particularly limited and may be set appropriately depending on the intended use of the cured film, but include, for example, heating conditions at 100 to 250° C. for about 30 minutes to 10 hours.
前記現像工程後、パターン化硬化膜としての特性を充分に発現させるため、必要に応じて、加熱等により現像工程後のパターン化硬化膜を充分に硬化する硬化工程を行ってもよい。
硬化工程の条件は特に限定されず、硬化膜の用途等に応じて適宜設定すればよいが、例えば100~250℃で30分間~10時間程度加熱する条件が挙げられる。 [4] Curing process After the development process, in order to fully express the characteristics of the patterned cured film, if necessary, a curing process is performed to sufficiently harden the patterned cured film after the development process by heating, etc. Good too.
The conditions for the curing step are not particularly limited and may be set appropriately depending on the intended use of the cured film, but include, for example, heating conditions at 100 to 250° C. for about 30 minutes to 10 hours.
≪表示素子≫
本発明の一実施形態に係る表示素子は、本硬化物を有すれば特に制限されず、(層間)絶縁膜、表面保護膜及び平坦化膜から選択される1種以上の本硬化膜を有することが好ましい。
前記表示素子は、例えば、液晶表示装置、有機EL表示装置等の表示装置に好適に用いられる。 ≪Display element≫
The display element according to an embodiment of the present invention is not particularly limited as long as it has the cured product, and it has one or more cured films selected from an (interlayer) insulating film, a surface protection film, and a flattening film. It is preferable.
The display element is suitably used, for example, in a display device such as a liquid crystal display device or an organic EL display device.
本発明の一実施形態に係る表示素子は、本硬化物を有すれば特に制限されず、(層間)絶縁膜、表面保護膜及び平坦化膜から選択される1種以上の本硬化膜を有することが好ましい。
前記表示素子は、例えば、液晶表示装置、有機EL表示装置等の表示装置に好適に用いられる。 ≪Display element≫
The display element according to an embodiment of the present invention is not particularly limited as long as it has the cured product, and it has one or more cured films selected from an (interlayer) insulating film, a surface protection film, and a flattening film. It is preferable.
The display element is suitably used, for example, in a display device such as a liquid crystal display device or an organic EL display device.
前記液晶表示装置は、冷陰極蛍光管(CCFL:Cold Cathode Fluorescent Lamp)の他、白色LEDを光源とするバックライトユニットを具備していてもよい。
前記有機EL表示装置としては、例えば、トップエミッション型構造、ボトムエミッション型構造等の構造の有機EL表示装置が挙げられる。 The liquid crystal display device may include a backlight unit using a white LED as a light source in addition to a cold cathode fluorescent lamp (CCFL).
Examples of the organic EL display device include organic EL display devices having a top emission type structure, a bottom emission type structure, and the like.
前記有機EL表示装置としては、例えば、トップエミッション型構造、ボトムエミッション型構造等の構造の有機EL表示装置が挙げられる。 The liquid crystal display device may include a backlight unit using a white LED as a light source in addition to a cold cathode fluorescent lamp (CCFL).
Examples of the organic EL display device include organic EL display devices having a top emission type structure, a bottom emission type structure, and the like.
前記表示素子は、種々の用途に好適に用いることができ、具体例としては、時計、携帯型ゲーム機、ワープロ、ノート型パソコン、カーナビゲーションシステム、カムコーダー、PDA、デジタルカメラ、携帯電話機、スマートフォン、各種モニター、液晶テレビ、インフォメーションディスプレイ等の各種表示装置に用いることができる。
The display element can be suitably used for various purposes, and specific examples include watches, portable game machines, word processors, notebook computers, car navigation systems, camcorders, PDAs, digital cameras, mobile phones, smartphones, It can be used in various display devices such as various monitors, liquid crystal televisions, and information displays.
以下、本発明の一実施形態を実施例に基づいて具体的に説明するが、本発明は以下の実施例に限定されない。
Hereinafter, one embodiment of the present invention will be specifically described based on Examples, but the present invention is not limited to the following Examples.
[合成例1]重合体P-1の合成
窒素導入管、Dean-Stark管及び冷却管を取り付けた4つ口フラスコに、ジハロゲン化合物として100モル部の4,6-ジクロロピリミジン、アルカリ可溶性基含有化合物として60モル部の4,4',4''-トリヒドロキシトリフェニルメタン、他の化合物として40モル部の2,2-ビス(4-ヒドロキシフェニル)プロパン、重合触媒として260モル部の炭酸カリウム、重合溶媒としてN-メチル-2-ピロリドン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.5g)及びトルエン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.25g)を入れた。
フラスコ内を窒素置換した後、フラスコの内容物を130℃で6時間加熱し、加熱の際に生成する水をDean-Stark管から随時取り除いた。フラスコの内容物を室温に冷却後、析出した固形物を濾別した。また、酢酸を加えて酸性にした濾液をメタノール水溶液に加え、析出した固形物をメタノール水溶液で洗浄した。濾別した固形物及びメタノール水溶液で洗浄した固形物を乾燥することで、重合体P-1を得た。 [Synthesis Example 1] Synthesis of Polymer P-1 Into a four-necked flask equipped with a nitrogen inlet tube, a Dean-Stark tube, and a cooling tube, 100 mole parts of 4,6-dichloropyrimidine as a dihalogen compound containing an alkali-soluble group were added. 60 mole parts of 4,4',4''-trihydroxytriphenylmethane as a compound, 40 mole parts of 2,2-bis(4-hydroxyphenyl)propane as other compounds, and 260 mole parts of carbonic acid as a polymerization catalyst. Potassium, N-methyl-2-pyrrolidone as a polymerization solvent (0.5 g per 1 mmol of the total amount of dihalogen compounds, alkali-soluble group-containing compounds, and other compounds) and toluene (dihalogen compounds, alkali-soluble group-containing compounds, and other compounds) 0.25 g) was added per 1 mmol of the total amount of the compound.
After purging the inside of the flask with nitrogen, the contents of the flask were heated at 130° C. for 6 hours, and water generated during heating was removed from the Dean-Stark tube as needed. After the contents of the flask were cooled to room temperature, the precipitated solid matter was filtered off. Further, the filtrate made acidic by adding acetic acid was added to an aqueous methanol solution, and the precipitated solid was washed with an aqueous methanol solution. Polymer P-1 was obtained by drying the solid matter separated by filtration and the solid matter washed with an aqueous methanol solution.
窒素導入管、Dean-Stark管及び冷却管を取り付けた4つ口フラスコに、ジハロゲン化合物として100モル部の4,6-ジクロロピリミジン、アルカリ可溶性基含有化合物として60モル部の4,4',4''-トリヒドロキシトリフェニルメタン、他の化合物として40モル部の2,2-ビス(4-ヒドロキシフェニル)プロパン、重合触媒として260モル部の炭酸カリウム、重合溶媒としてN-メチル-2-ピロリドン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.5g)及びトルエン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.25g)を入れた。
フラスコ内を窒素置換した後、フラスコの内容物を130℃で6時間加熱し、加熱の際に生成する水をDean-Stark管から随時取り除いた。フラスコの内容物を室温に冷却後、析出した固形物を濾別した。また、酢酸を加えて酸性にした濾液をメタノール水溶液に加え、析出した固形物をメタノール水溶液で洗浄した。濾別した固形物及びメタノール水溶液で洗浄した固形物を乾燥することで、重合体P-1を得た。 [Synthesis Example 1] Synthesis of Polymer P-1 Into a four-necked flask equipped with a nitrogen inlet tube, a Dean-Stark tube, and a cooling tube, 100 mole parts of 4,6-dichloropyrimidine as a dihalogen compound containing an alkali-soluble group were added. 60 mole parts of 4,4',4''-trihydroxytriphenylmethane as a compound, 40 mole parts of 2,2-bis(4-hydroxyphenyl)propane as other compounds, and 260 mole parts of carbonic acid as a polymerization catalyst. Potassium, N-methyl-2-pyrrolidone as a polymerization solvent (0.5 g per 1 mmol of the total amount of dihalogen compounds, alkali-soluble group-containing compounds, and other compounds) and toluene (dihalogen compounds, alkali-soluble group-containing compounds, and other compounds) 0.25 g) was added per 1 mmol of the total amount of the compound.
After purging the inside of the flask with nitrogen, the contents of the flask were heated at 130° C. for 6 hours, and water generated during heating was removed from the Dean-Stark tube as needed. After the contents of the flask were cooled to room temperature, the precipitated solid matter was filtered off. Further, the filtrate made acidic by adding acetic acid was added to an aqueous methanol solution, and the precipitated solid was washed with an aqueous methanol solution. Polymer P-1 was obtained by drying the solid matter separated by filtration and the solid matter washed with an aqueous methanol solution.
[合成例2~10、12及び13]重合体P-2~P-10、P-12及びP-13の合成
表1に記載のジハロゲン化合物、アルカリ可溶性基含有化合物、他の化合物及び重合触媒を表1に記載の量(モル部)で用いた以外は合成例1と同様にして、重合体P-2~P-10、P-12及びP-13を得た。 [Synthesis Examples 2 to 10, 12 and 13] Synthesis of polymers P-2 to P-10, P-12 and P-13 Dihalogen compounds, alkali-soluble group-containing compounds, other compounds and polymerization catalysts listed in Table 1 Polymers P-2 to P-10, P-12 and P-13 were obtained in the same manner as in Synthesis Example 1, except that the amounts (molar parts) listed in Table 1 were used.
表1に記載のジハロゲン化合物、アルカリ可溶性基含有化合物、他の化合物及び重合触媒を表1に記載の量(モル部)で用いた以外は合成例1と同様にして、重合体P-2~P-10、P-12及びP-13を得た。 [Synthesis Examples 2 to 10, 12 and 13] Synthesis of polymers P-2 to P-10, P-12 and P-13 Dihalogen compounds, alkali-soluble group-containing compounds, other compounds and polymerization catalysts listed in Table 1 Polymers P-2 to P-10, P-12 and P-13 were obtained in the same manner as in Synthesis Example 1, except that the amounts (molar parts) listed in Table 1 were used.
[合成例11]重合体P-11の合成
窒素導入管を取り付けた3つ口フラスコに、ジハロゲン化合物として100モル部の4,6-ジクロロピリミジン、アルカリ可溶性基含有化合物として60モル部の2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン、他の化合物として40モル部の2,2-ビス(4-ヒドロキシフェニル)ヘキサフルオロプロパン、重合溶媒としてN-メチル-2-ピロリドン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.8g)を入れた。
フラスコ内を窒素置換した後、フラスコの内容物を150℃で8時間加熱した。その後、フラスコの内容物を室温に冷却し、メタノール水溶液に加え、析出した固形物をメタノール水溶液で洗浄した。メタノール水溶液で洗浄した固形物を乾燥することで、重合体P-11を得た。 [Synthesis Example 11] Synthesis of Polymer P-11 In a three-necked flask equipped with a nitrogen inlet tube, 100 mole parts of 4,6-dichloropyrimidine as a dihalogen compound and 60 mole parts of 2,6-dichloropyrimidine as an alkali-soluble group-containing compound were added. 2-bis(3-amino-4-hydroxyphenyl)propane, 40 mole parts of 2,2-bis(4-hydroxyphenyl)hexafluoropropane as other compounds, N-methyl-2-pyrrolidone (dihalogen 0.8 g per 1 mmol of the total amount of the compound, alkali-soluble group-containing compound, and other compounds were added.
After purging the inside of the flask with nitrogen, the contents of the flask were heated at 150° C. for 8 hours. Thereafter, the contents of the flask were cooled to room temperature and added to an aqueous methanol solution, and the precipitated solids were washed with an aqueous methanol solution. Polymer P-11 was obtained by drying the solid material washed with an aqueous methanol solution.
窒素導入管を取り付けた3つ口フラスコに、ジハロゲン化合物として100モル部の4,6-ジクロロピリミジン、アルカリ可溶性基含有化合物として60モル部の2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン、他の化合物として40モル部の2,2-ビス(4-ヒドロキシフェニル)ヘキサフルオロプロパン、重合溶媒としてN-メチル-2-ピロリドン(ジハロゲン化合物、アルカリ可溶性基含有化合物及び他の化合物の合計量1mmolに対して0.8g)を入れた。
フラスコ内を窒素置換した後、フラスコの内容物を150℃で8時間加熱した。その後、フラスコの内容物を室温に冷却し、メタノール水溶液に加え、析出した固形物をメタノール水溶液で洗浄した。メタノール水溶液で洗浄した固形物を乾燥することで、重合体P-11を得た。 [Synthesis Example 11] Synthesis of Polymer P-11 In a three-necked flask equipped with a nitrogen inlet tube, 100 mole parts of 4,6-dichloropyrimidine as a dihalogen compound and 60 mole parts of 2,6-dichloropyrimidine as an alkali-soluble group-containing compound were added. 2-bis(3-amino-4-hydroxyphenyl)propane, 40 mole parts of 2,2-bis(4-hydroxyphenyl)hexafluoropropane as other compounds, N-methyl-2-pyrrolidone (dihalogen 0.8 g per 1 mmol of the total amount of the compound, alkali-soluble group-containing compound, and other compounds were added.
After purging the inside of the flask with nitrogen, the contents of the flask were heated at 150° C. for 8 hours. Thereafter, the contents of the flask were cooled to room temperature and added to an aqueous methanol solution, and the precipitated solids were washed with an aqueous methanol solution. Polymer P-11 was obtained by drying the solid material washed with an aqueous methanol solution.
表1中のジハロゲン化合物は以下のとおりである。
「DH-1」:4,6-ジクロロピリミジン
「DH-2」:2,4-ジクロロ-1,3,5-トリアジン
「DH-3」:2,6-ジクロロピリミジン
「DH-4」:2,6-ジクロロピラジン
「DH-5」:2,4-ジクロロ-6-フェニル-1,3,5-トリアジン
「DH-6」:ビス(4-フルオロフェニル)スルホン The dihalogen compounds in Table 1 are as follows.
"DH-1": 4,6-dichloropyrimidine "DH-2": 2,4-dichloro-1,3,5-triazine "DH-3": 2,6-dichloropyrimidine "DH-4": 2 ,6-dichloropyrazine "DH-5": 2,4-dichloro-6-phenyl-1,3,5-triazine "DH-6": Bis(4-fluorophenyl)sulfone
「DH-1」:4,6-ジクロロピリミジン
「DH-2」:2,4-ジクロロ-1,3,5-トリアジン
「DH-3」:2,6-ジクロロピリミジン
「DH-4」:2,6-ジクロロピラジン
「DH-5」:2,4-ジクロロ-6-フェニル-1,3,5-トリアジン
「DH-6」:ビス(4-フルオロフェニル)スルホン The dihalogen compounds in Table 1 are as follows.
"DH-1": 4,6-dichloropyrimidine "DH-2": 2,4-dichloro-1,3,5-triazine "DH-3": 2,6-dichloropyrimidine "DH-4": 2 ,6-dichloropyrazine "DH-5": 2,4-dichloro-6-phenyl-1,3,5-triazine "DH-6": Bis(4-fluorophenyl)sulfone
表1中のアルカリ可溶性基含有化合物は以下のとおりである。
「AD-1」:4,4',4''-トリヒドロキシトリフェニルメタン
「AD-2」:α,α,α'-トリス(4-ヒドロキシフェニル)-1-エチル-4-イソプロピルベンゼン
「AD-3」:5,5’,6,6’-テトラヒドロキシ-3,3,3’,3’-テトラメチル-1,1’-スピロビインダン
「AD-4」:1,3,5-トリヒドロキシベンゼン
「AD-5」:1,4-ビス(3,4-ジヒドロキシフェニル)-2,3-ジメチルブタン
「AD-6」:1,1,2,2-テトラキス(4-ヒドロキシフェニル)エタン
「AD-7」:3,5-ジヒドロキシ安息香酸
「AD-8」:4,4-ビス(4-ヒドロキシフェニル)吉草酸
「AD-9」:2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン
「AD-10」:3,5-ジチオール安息香酸 The alkali-soluble group-containing compounds in Table 1 are as follows.
"AD-1": 4,4',4''-trihydroxytriphenylmethane "AD-2": α,α,α'-tris(4-hydroxyphenyl)-1-ethyl-4-isopropylbenzene AD-3": 5,5',6,6'-tetrahydroxy-3,3,3',3'-tetramethyl-1,1'-spirobiindane "AD-4": 1,3,5-tri Hydroxybenzene "AD-5": 1,4-bis(3,4-dihydroxyphenyl)-2,3-dimethylbutane "AD-6": 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane "AD-7": 3,5-dihydroxybenzoic acid "AD-8": 4,4-bis(4-hydroxyphenyl)valeric acid "AD-9": 2,2-bis(3-amino-4- Hydroxyphenyl)propane “AD-10”: 3,5-dithiolbenzoic acid
「AD-1」:4,4',4''-トリヒドロキシトリフェニルメタン
「AD-2」:α,α,α'-トリス(4-ヒドロキシフェニル)-1-エチル-4-イソプロピルベンゼン
「AD-3」:5,5’,6,6’-テトラヒドロキシ-3,3,3’,3’-テトラメチル-1,1’-スピロビインダン
「AD-4」:1,3,5-トリヒドロキシベンゼン
「AD-5」:1,4-ビス(3,4-ジヒドロキシフェニル)-2,3-ジメチルブタン
「AD-6」:1,1,2,2-テトラキス(4-ヒドロキシフェニル)エタン
「AD-7」:3,5-ジヒドロキシ安息香酸
「AD-8」:4,4-ビス(4-ヒドロキシフェニル)吉草酸
「AD-9」:2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン
「AD-10」:3,5-ジチオール安息香酸 The alkali-soluble group-containing compounds in Table 1 are as follows.
"AD-1": 4,4',4''-trihydroxytriphenylmethane "AD-2": α,α,α'-tris(4-hydroxyphenyl)-1-ethyl-4-isopropylbenzene AD-3": 5,5',6,6'-tetrahydroxy-3,3,3',3'-tetramethyl-1,1'-spirobiindane "AD-4": 1,3,5-tri Hydroxybenzene "AD-5": 1,4-bis(3,4-dihydroxyphenyl)-2,3-dimethylbutane "AD-6": 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane "AD-7": 3,5-dihydroxybenzoic acid "AD-8": 4,4-bis(4-hydroxyphenyl)valeric acid "AD-9": 2,2-bis(3-amino-4- Hydroxyphenyl)propane “AD-10”: 3,5-dithiolbenzoic acid
表1中の他の化合物は以下のとおりである。
「BP-1」:2,2-ビス(4-ヒドロキシフェニル)プロパン
「BP-2」:2,2-ビス(4-ヒドロキシフェニル)ヘキサフルオロプロパン
「BP-3」:1,1-ビス(4-ヒドロキシフェニル)-3,3,5-トリメチルシクロヘキサン
「BP-4」:α,α'-ビス(4-ヒドロキシフェニル)-1,4-ジイソプロピルベンゼン
「BP-5」:9,9-ビス(4-ヒドロキシフェニル)フルオレン Other compounds in Table 1 are as follows.
"BP-1": 2,2-bis(4-hydroxyphenyl)propane "BP-2": 2,2-bis(4-hydroxyphenyl)hexafluoropropane "BP-3": 1,1-bis( 4-hydroxyphenyl)-3,3,5-trimethylcyclohexane "BP-4": α,α'-bis(4-hydroxyphenyl)-1,4-diisopropylbenzene "BP-5": 9,9-bis (4-hydroxyphenyl)fluorene
「BP-1」:2,2-ビス(4-ヒドロキシフェニル)プロパン
「BP-2」:2,2-ビス(4-ヒドロキシフェニル)ヘキサフルオロプロパン
「BP-3」:1,1-ビス(4-ヒドロキシフェニル)-3,3,5-トリメチルシクロヘキサン
「BP-4」:α,α'-ビス(4-ヒドロキシフェニル)-1,4-ジイソプロピルベンゼン
「BP-5」:9,9-ビス(4-ヒドロキシフェニル)フルオレン Other compounds in Table 1 are as follows.
"BP-1": 2,2-bis(4-hydroxyphenyl)propane "BP-2": 2,2-bis(4-hydroxyphenyl)hexafluoropropane "BP-3": 1,1-bis( 4-hydroxyphenyl)-3,3,5-trimethylcyclohexane "BP-4": α,α'-bis(4-hydroxyphenyl)-1,4-diisopropylbenzene "BP-5": 9,9-bis (4-hydroxyphenyl)fluorene
[合成例14]重合体P-14(アクリル樹脂)の合成
100mLの二つ口フラスコに、窒素下で、重合モノマーとして、メタクリル酸20質量部、グリシジルメタクリレート20質量部、メチルメタクリレート40質量部及びスチレン20質量部、ラジカル重合開始剤として2,2’-アゾビス(2,4-ジメチルバレロニトリル)3質量部、並びに、溶媒としてN-メチル-2-ピロリドン(NMP)400質量部を加え、70℃で6時間重合した。
重合後、メタノールに再沈殿させることで得られた沈殿物を濾過し、濾物を室温で8時間真空乾燥することで固形物を得た。また、得られた濾液をメタノールに加え、析出した固形物をメタノール水溶液で洗浄した。真空乾燥後の固形物及びメタノール水溶液で洗浄した固形物を乾燥することで、重合体P-14(アクリル樹脂)を得た。 [Synthesis Example 14] Synthesis of Polymer P-14 (acrylic resin) In a 100 mL two-necked flask, under nitrogen, as polymerization monomers, 20 parts by mass of methacrylic acid, 20 parts by mass of glycidyl methacrylate, 40 parts by mass of methyl methacrylate, and Adding 20 parts by mass of styrene, 3 parts by mass of 2,2'-azobis(2,4-dimethylvaleronitrile) as a radical polymerization initiator, and 400 parts by mass of N-methyl-2-pyrrolidone (NMP) as a solvent, Polymerization was carried out at ℃ for 6 hours.
After the polymerization, the precipitate obtained by reprecipitating in methanol was filtered, and the filtered material was vacuum-dried at room temperature for 8 hours to obtain a solid. Further, the obtained filtrate was added to methanol, and the precipitated solid matter was washed with an aqueous methanol solution. Polymer P-14 (acrylic resin) was obtained by drying the solid material after vacuum drying and the solid material washed with an aqueous methanol solution.
100mLの二つ口フラスコに、窒素下で、重合モノマーとして、メタクリル酸20質量部、グリシジルメタクリレート20質量部、メチルメタクリレート40質量部及びスチレン20質量部、ラジカル重合開始剤として2,2’-アゾビス(2,4-ジメチルバレロニトリル)3質量部、並びに、溶媒としてN-メチル-2-ピロリドン(NMP)400質量部を加え、70℃で6時間重合した。
重合後、メタノールに再沈殿させることで得られた沈殿物を濾過し、濾物を室温で8時間真空乾燥することで固形物を得た。また、得られた濾液をメタノールに加え、析出した固形物をメタノール水溶液で洗浄した。真空乾燥後の固形物及びメタノール水溶液で洗浄した固形物を乾燥することで、重合体P-14(アクリル樹脂)を得た。 [Synthesis Example 14] Synthesis of Polymer P-14 (acrylic resin) In a 100 mL two-necked flask, under nitrogen, as polymerization monomers, 20 parts by mass of methacrylic acid, 20 parts by mass of glycidyl methacrylate, 40 parts by mass of methyl methacrylate, and Adding 20 parts by mass of styrene, 3 parts by mass of 2,2'-azobis(2,4-dimethylvaleronitrile) as a radical polymerization initiator, and 400 parts by mass of N-methyl-2-pyrrolidone (NMP) as a solvent, Polymerization was carried out at ℃ for 6 hours.
After the polymerization, the precipitate obtained by reprecipitating in methanol was filtered, and the filtered material was vacuum-dried at room temperature for 8 hours to obtain a solid. Further, the obtained filtrate was added to methanol, and the precipitated solid matter was washed with an aqueous methanol solution. Polymer P-14 (acrylic resin) was obtained by drying the solid material after vacuum drying and the solid material washed with an aqueous methanol solution.
[合成例15]重合体P-15(ポリイミド)の合成
2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン100モル部をN-メチル-2-ピロリドン(NMP)に溶解し、そこにピロメリット酸二無水物100モル部を加え、40℃で24時間反応させることにより、ポリアミック酸を20質量%含有するポリアミック酸溶液を得た。
次いで、得られたポリアミック酸溶液に、NMPを追加してポリアミック酸の濃度を10質量%とし、そこにピリジン及び無水酢酸を添加して、90℃で4時間脱水閉環反応を行った。脱水閉環反応後、系内の溶媒を新たなNMPで溶媒置換することにより、イミド化率約70%のポリイミドを15質量%含有するポリイミド溶液を得た。得られたポリイミド溶液をメタノールに加え、析出した固形物をメタノール水溶液で洗浄し、得られた固形物を乾燥することで、重合体P-15(ポリイミド)を得た。 [Synthesis Example 15] Synthesis of Polymer P-15 (Polyimide) 100 mole parts of 2,2-bis(3-amino-4-hydroxyphenyl)propane was dissolved in N-methyl-2-pyrrolidone (NMP), and 100 mol parts of pyromellitic dianhydride was added to the mixture and reacted at 40° C. for 24 hours to obtain a polyamic acid solution containing 20% by mass of polyamic acid.
Next, NMP was added to the obtained polyamic acid solution to make the concentration of polyamic acid 10% by mass, pyridine and acetic anhydride were added thereto, and a dehydration ring closure reaction was performed at 90° C. for 4 hours. After the dehydration ring closure reaction, the solvent in the system was replaced with fresh NMP to obtain a polyimide solution containing 15% by mass of polyimide with an imidization rate of about 70%. The obtained polyimide solution was added to methanol, the precipitated solid was washed with an aqueous methanol solution, and the obtained solid was dried to obtain polymer P-15 (polyimide).
2,2-ビス(3-アミノ-4-ヒドロキシフェニル)プロパン100モル部をN-メチル-2-ピロリドン(NMP)に溶解し、そこにピロメリット酸二無水物100モル部を加え、40℃で24時間反応させることにより、ポリアミック酸を20質量%含有するポリアミック酸溶液を得た。
次いで、得られたポリアミック酸溶液に、NMPを追加してポリアミック酸の濃度を10質量%とし、そこにピリジン及び無水酢酸を添加して、90℃で4時間脱水閉環反応を行った。脱水閉環反応後、系内の溶媒を新たなNMPで溶媒置換することにより、イミド化率約70%のポリイミドを15質量%含有するポリイミド溶液を得た。得られたポリイミド溶液をメタノールに加え、析出した固形物をメタノール水溶液で洗浄し、得られた固形物を乾燥することで、重合体P-15(ポリイミド)を得た。 [Synthesis Example 15] Synthesis of Polymer P-15 (Polyimide) 100 mole parts of 2,2-bis(3-amino-4-hydroxyphenyl)propane was dissolved in N-methyl-2-pyrrolidone (NMP), and 100 mol parts of pyromellitic dianhydride was added to the mixture and reacted at 40° C. for 24 hours to obtain a polyamic acid solution containing 20% by mass of polyamic acid.
Next, NMP was added to the obtained polyamic acid solution to make the concentration of polyamic acid 10% by mass, pyridine and acetic anhydride were added thereto, and a dehydration ring closure reaction was performed at 90° C. for 4 hours. After the dehydration ring closure reaction, the solvent in the system was replaced with fresh NMP to obtain a polyimide solution containing 15% by mass of polyimide with an imidization rate of about 70%. The obtained polyimide solution was added to methanol, the precipitated solid was washed with an aqueous methanol solution, and the obtained solid was dried to obtain polymer P-15 (polyimide).
[重量平均分子量(Mw)及び分子量分布(Mw/Mn)]
前記合成例で合成した重合体のMw及びMnは、ゲルパーミエーションクロマトグラフィー(GPC)法により、以下の装置及び条件で測定した。測定したMw及びMnから分子量分布(Mw/Mn)を算出した。結果を表2に示す。
・装置:昭和電工(株)製のGPC-101
・GPCカラム:(株)島津ジーエルシー製のGPC-KF-801、GPC-KF-802、GPC-KF-803及びGPC-KF-804を結合したもの
・移動相:テトラヒドロフラン
・カラム温度:40℃
・流速:1.0mL/分
・試料濃度:1.0質量%
・試料注入量:100μL
・検出器:示差屈折計
・標準物質:単分散ポリスチレン [Weight average molecular weight (Mw) and molecular weight distribution (Mw/Mn)]
The Mw and Mn of the polymer synthesized in the above synthesis example were measured by gel permeation chromatography (GPC) using the following equipment and conditions. Molecular weight distribution (Mw/Mn) was calculated from the measured Mw and Mn. The results are shown in Table 2.
・Device: GPC-101 manufactured by Showa Denko K.K.
・GPC column: A combination of GPC-KF-801, GPC-KF-802, GPC-KF-803, and GPC-KF-804 manufactured by Shimadzu GLC ・Mobile phase: Tetrahydrofuran ・Column temperature: 40°C
・Flow rate: 1.0mL/min ・Sample concentration: 1.0% by mass
・Sample injection amount: 100μL
・Detector: Differential refractometer ・Standard material: Monodisperse polystyrene
前記合成例で合成した重合体のMw及びMnは、ゲルパーミエーションクロマトグラフィー(GPC)法により、以下の装置及び条件で測定した。測定したMw及びMnから分子量分布(Mw/Mn)を算出した。結果を表2に示す。
・装置:昭和電工(株)製のGPC-101
・GPCカラム:(株)島津ジーエルシー製のGPC-KF-801、GPC-KF-802、GPC-KF-803及びGPC-KF-804を結合したもの
・移動相:テトラヒドロフラン
・カラム温度:40℃
・流速:1.0mL/分
・試料濃度:1.0質量%
・試料注入量:100μL
・検出器:示差屈折計
・標準物質:単分散ポリスチレン [Weight average molecular weight (Mw) and molecular weight distribution (Mw/Mn)]
The Mw and Mn of the polymer synthesized in the above synthesis example were measured by gel permeation chromatography (GPC) using the following equipment and conditions. Molecular weight distribution (Mw/Mn) was calculated from the measured Mw and Mn. The results are shown in Table 2.
・Device: GPC-101 manufactured by Showa Denko K.K.
・GPC column: A combination of GPC-KF-801, GPC-KF-802, GPC-KF-803, and GPC-KF-804 manufactured by Shimadzu GLC ・Mobile phase: Tetrahydrofuran ・Column temperature: 40°C
・Flow rate: 1.0mL/min ・Sample concentration: 1.0% by mass
・Sample injection amount: 100μL
・Detector: Differential refractometer ・Standard material: Monodisperse polystyrene
<評価用樹脂溶液の調製>
前記合成例で得た100質量部の重合体それぞれに、溶剤としてN-メチル-2-ピロリドン(NMP)及びブチルセロソルブ(BC)を加え、溶剤組成がNMP/BC=50/50(質量比)であり、固形分濃度が12質量%の溶液を得た。
得られた溶液を、孔径0.45μmのフィルターで濾過することにより評価用樹脂溶液を調製した。 <Preparation of resin solution for evaluation>
N-methyl-2-pyrrolidone (NMP) and butyl cellosolve (BC) were added as solvents to 100 parts by mass of each of the polymers obtained in the above synthesis example, and the solvent composition was NMP/BC = 50/50 (mass ratio). A solution with a solid content concentration of 12% by mass was obtained.
A resin solution for evaluation was prepared by filtering the obtained solution through a filter with a pore size of 0.45 μm.
前記合成例で得た100質量部の重合体それぞれに、溶剤としてN-メチル-2-ピロリドン(NMP)及びブチルセロソルブ(BC)を加え、溶剤組成がNMP/BC=50/50(質量比)であり、固形分濃度が12質量%の溶液を得た。
得られた溶液を、孔径0.45μmのフィルターで濾過することにより評価用樹脂溶液を調製した。 <Preparation of resin solution for evaluation>
N-methyl-2-pyrrolidone (NMP) and butyl cellosolve (BC) were added as solvents to 100 parts by mass of each of the polymers obtained in the above synthesis example, and the solvent composition was NMP/BC = 50/50 (mass ratio). A solution with a solid content concentration of 12% by mass was obtained.
A resin solution for evaluation was prepared by filtering the obtained solution through a filter with a pore size of 0.45 μm.
<透過率(光透過性)の評価>
スピンナーを用い、ガラス基板上に、調製した評価用樹脂溶液を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン中で、このガラス基板を230℃で30分間加熱することで硬化膜を形成した。形成した硬化膜の透過率を日本分光(株)製の「V-630」紫外可視分光光度計により測定した。波長400nmの光の透過率が、90%以上の場合を「A」とし、80%以上90%未満の場合を「B」とし、80%未満の場合を「C」として透過率を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合を透過率が良好であると評価し、評価結果が「C」の場合に透過率が不良であると評価した。 <Evaluation of transmittance (light transmittance)>
The prepared resin solution for evaluation was applied onto a glass substrate using a spinner, and then prebaked on a hot plate at 90° C. for 2 minutes to form a coating film with a thickness of 3.0 μm. Next, this glass substrate was heated at 230° C. for 30 minutes in a clean oven purged with nitrogen to form a cured film. The transmittance of the formed cured film was measured using a "V-630" ultraviolet-visible spectrophotometer manufactured by JASCO Corporation. The transmittance was evaluated as "A" when the transmittance of light with a wavelength of 400 nm was 90% or more, "B" when it was 80% or more and less than 90%, and "C" when it was less than 80%. The results are shown in Table 2.
When the evaluation result was "A" or "B", the transmittance was evaluated as good, and when the evaluation result was "C", the transmittance was evaluated as poor.
スピンナーを用い、ガラス基板上に、調製した評価用樹脂溶液を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン中で、このガラス基板を230℃で30分間加熱することで硬化膜を形成した。形成した硬化膜の透過率を日本分光(株)製の「V-630」紫外可視分光光度計により測定した。波長400nmの光の透過率が、90%以上の場合を「A」とし、80%以上90%未満の場合を「B」とし、80%未満の場合を「C」として透過率を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合を透過率が良好であると評価し、評価結果が「C」の場合に透過率が不良であると評価した。 <Evaluation of transmittance (light transmittance)>
The prepared resin solution for evaluation was applied onto a glass substrate using a spinner, and then prebaked on a hot plate at 90° C. for 2 minutes to form a coating film with a thickness of 3.0 μm. Next, this glass substrate was heated at 230° C. for 30 minutes in a clean oven purged with nitrogen to form a cured film. The transmittance of the formed cured film was measured using a "V-630" ultraviolet-visible spectrophotometer manufactured by JASCO Corporation. The transmittance was evaluated as "A" when the transmittance of light with a wavelength of 400 nm was 90% or more, "B" when it was 80% or more and less than 90%, and "C" when it was less than 80%. The results are shown in Table 2.
When the evaluation result was "A" or "B", the transmittance was evaluated as good, and when the evaluation result was "C", the transmittance was evaluated as poor.
<耐熱性の評価>
スピンナーを用い、シリコン基板上に、調製した評価用樹脂溶液を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン中で、このシリコン基板を230℃で60分間加熱することで硬化膜を形成した。形成した硬化膜の5%熱重量減少温度を(株)日立ハイテクサイエンス製の「TG/DTA220U」を用いて空気下で測定した。5%熱重量減少温度が、350℃以上の場合を「A」とし、300℃以上350℃未満の場合を「B」とし、300℃未満の場合を「C」として耐熱性を評価した。結果を表2に示す。 <Evaluation of heat resistance>
The prepared resin solution for evaluation was applied onto a silicon substrate using a spinner, and then prebaked on a hot plate at 90° C. for 2 minutes to form a coating film with a thickness of 3.0 μm. Next, this silicon substrate was heated at 230° C. for 60 minutes in a clean oven purged with nitrogen to form a cured film. The 5% thermal weight loss temperature of the formed cured film was measured under air using "TG/DTA220U" manufactured by Hitachi High-Tech Science Co., Ltd. The heat resistance was evaluated as "A" when the 5% thermal weight loss temperature was 350°C or higher, "B" when it was 300°C or more and less than 350°C, and "C" when it was less than 300°C. The results are shown in Table 2.
スピンナーを用い、シリコン基板上に、調製した評価用樹脂溶液を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン中で、このシリコン基板を230℃で60分間加熱することで硬化膜を形成した。形成した硬化膜の5%熱重量減少温度を(株)日立ハイテクサイエンス製の「TG/DTA220U」を用いて空気下で測定した。5%熱重量減少温度が、350℃以上の場合を「A」とし、300℃以上350℃未満の場合を「B」とし、300℃未満の場合を「C」として耐熱性を評価した。結果を表2に示す。 <Evaluation of heat resistance>
The prepared resin solution for evaluation was applied onto a silicon substrate using a spinner, and then prebaked on a hot plate at 90° C. for 2 minutes to form a coating film with a thickness of 3.0 μm. Next, this silicon substrate was heated at 230° C. for 60 minutes in a clean oven purged with nitrogen to form a cured film. The 5% thermal weight loss temperature of the formed cured film was measured under air using "TG/DTA220U" manufactured by Hitachi High-Tech Science Co., Ltd. The heat resistance was evaluated as "A" when the 5% thermal weight loss temperature was 350°C or higher, "B" when it was 300°C or more and less than 350°C, and "C" when it was less than 300°C. The results are shown in Table 2.
<比誘電率の評価>
サイザルバフ(麻バフ)により研磨して表面を平滑化したSUS304製基板上に、調製した評価用樹脂溶液を塗布した後、到達圧力を100Paに設定し、該塗布した溶液から真空下で溶剤を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン内にて230℃で1時間加熱することによって、基板上に絶縁膜を形成した。この絶縁膜上に、蒸着法によりPt/Pd電極パターンを形成して誘電率測定用サンプルを作製した。
作製した誘電率測定用サンプルを用い、日本ヒューレット・パッカード合同会社製のHP16451B電極及びHP4284AプレシジョンLCRメーターを用いて、10kHzの周波数で、CV法により比誘電率の測定を行った。比誘電率が、3.3以下の場合を「A」とし、3.3を超えて3.6以下の場合を「B」とし、3.6を超える場合を「C」として比誘電率を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合を比誘電率が良好であると評価し、評価結果が「C」の場合に比誘電率が不良であると評価した。 <Evaluation of relative dielectric constant>
After applying the prepared resin solution for evaluation on a SUS304 substrate whose surface had been smoothed by polishing with a sisal buff (hemp buff), the ultimate pressure was set to 100 Pa, and the solvent was removed from the applied solution under vacuum. This was further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, an insulating film was formed on the substrate by heating at 230° C. for 1 hour in a clean oven purged with nitrogen. A Pt/Pd electrode pattern was formed on this insulating film by vapor deposition to prepare a sample for dielectric constant measurement.
Using the prepared sample for dielectric constant measurement, the dielectric constant was measured by the CV method at a frequency of 10 kHz using an HP16451B electrode and HP4284A precision LCR meter manufactured by Hewlett-Packard Japan LLC. When the dielectric constant is 3.3 or less, it is designated as "A", when it exceeds 3.3 and 3.6 or less, it is designated as "B", and when it exceeds 3.6, it is designated as "C". evaluated. The results are shown in Table 2.
When the evaluation result was "A" or "B", the dielectric constant was evaluated to be good, and when the evaluation result was "C", the dielectric constant was evaluated to be poor.
サイザルバフ(麻バフ)により研磨して表面を平滑化したSUS304製基板上に、調製した評価用樹脂溶液を塗布した後、到達圧力を100Paに設定し、該塗布した溶液から真空下で溶剤を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、窒素置換したクリーンオーブン内にて230℃で1時間加熱することによって、基板上に絶縁膜を形成した。この絶縁膜上に、蒸着法によりPt/Pd電極パターンを形成して誘電率測定用サンプルを作製した。
作製した誘電率測定用サンプルを用い、日本ヒューレット・パッカード合同会社製のHP16451B電極及びHP4284AプレシジョンLCRメーターを用いて、10kHzの周波数で、CV法により比誘電率の測定を行った。比誘電率が、3.3以下の場合を「A」とし、3.3を超えて3.6以下の場合を「B」とし、3.6を超える場合を「C」として比誘電率を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合を比誘電率が良好であると評価し、評価結果が「C」の場合に比誘電率が不良であると評価した。 <Evaluation of relative dielectric constant>
After applying the prepared resin solution for evaluation on a SUS304 substrate whose surface had been smoothed by polishing with a sisal buff (hemp buff), the ultimate pressure was set to 100 Pa, and the solvent was removed from the applied solution under vacuum. This was further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, an insulating film was formed on the substrate by heating at 230° C. for 1 hour in a clean oven purged with nitrogen. A Pt/Pd electrode pattern was formed on this insulating film by vapor deposition to prepare a sample for dielectric constant measurement.
Using the prepared sample for dielectric constant measurement, the dielectric constant was measured by the CV method at a frequency of 10 kHz using an HP16451B electrode and HP4284A precision LCR meter manufactured by Hewlett-Packard Japan LLC. When the dielectric constant is 3.3 or less, it is designated as "A", when it exceeds 3.3 and 3.6 or less, it is designated as "B", and when it exceeds 3.6, it is designated as "C". evaluated. The results are shown in Table 2.
When the evaluation result was "A" or "B", the dielectric constant was evaluated to be good, and when the evaluation result was "C", the dielectric constant was evaluated to be poor.
<線膨張係数(CTE)の評価>
前記合成例で得た重合体それぞれを、N-メチル-2-ピロリドンに溶解し、重合体濃度20質量%の樹脂組成物を調製した。この調製した樹脂組成物を、バーコーターを用いてシリコン基板上に塗布し、70℃で15分間乾燥し、次いで100℃で15分間乾燥してフィルムを形成した後、シリコン基板より剥離した。その後、フィルムを金枠に固定し、更に230℃で1時間乾燥して、評価用フィルムを作製した。
TMA(Thermal Mechanical Analysis)SS6100装置(セイコーインスツル(株)製)を用い、作製した評価用フィルムの線膨張係数を測定した。測定は以下のように行った。
室温から200℃まで5℃/minで一旦昇温した後、室温まで冷却し、再度、室温から250℃まで5℃/minで昇温し、TMA曲線を作成した。このTMA曲線の50℃~ガラス転移温度(Tg)の間の傾きから線膨張係数を求めた。線膨張係数が、70ppm/℃未満の場合を「A」とし、70ppm/℃以上100ppm/℃未満の場合を「B」とし、100ppm/℃以上の場合を「C」として線膨張係数(CTE)を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合をCTEが良好であると評価し、評価結果が「C」の場合にCTEが不良であると評価した。 <Evaluation of coefficient of linear expansion (CTE)>
Each of the polymers obtained in the above synthesis example was dissolved in N-methyl-2-pyrrolidone to prepare a resin composition having a polymer concentration of 20% by mass. This prepared resin composition was applied onto a silicon substrate using a bar coater, dried at 70° C. for 15 minutes, and then dried at 100° C. for 15 minutes to form a film, which was then peeled off from the silicon substrate. Thereafter, the film was fixed to a metal frame and further dried at 230° C. for 1 hour to produce a film for evaluation.
The linear expansion coefficient of the produced evaluation film was measured using a TMA (Thermal Mechanical Analysis) SS6100 device (manufactured by Seiko Instruments Inc.). The measurements were performed as follows.
The temperature was once raised from room temperature to 200°C at a rate of 5°C/min, then cooled to room temperature, and the temperature was raised again from room temperature to 250°C at a rate of 5°C/min to create a TMA curve. The coefficient of linear expansion was determined from the slope of this TMA curve between 50° C. and the glass transition temperature (Tg). Coefficient of linear expansion (CTE): "A" if the linear expansion coefficient is less than 70 ppm/°C, "B" if it is 70 ppm/°C or more and less than 100 ppm/°C, and "C" if it is 100 ppm/°C or more. was evaluated. The results are shown in Table 2.
When the evaluation result was "A" or "B", the CTE was evaluated as good, and when the evaluation result was "C", the CTE was evaluated as poor.
前記合成例で得た重合体それぞれを、N-メチル-2-ピロリドンに溶解し、重合体濃度20質量%の樹脂組成物を調製した。この調製した樹脂組成物を、バーコーターを用いてシリコン基板上に塗布し、70℃で15分間乾燥し、次いで100℃で15分間乾燥してフィルムを形成した後、シリコン基板より剥離した。その後、フィルムを金枠に固定し、更に230℃で1時間乾燥して、評価用フィルムを作製した。
TMA(Thermal Mechanical Analysis)SS6100装置(セイコーインスツル(株)製)を用い、作製した評価用フィルムの線膨張係数を測定した。測定は以下のように行った。
室温から200℃まで5℃/minで一旦昇温した後、室温まで冷却し、再度、室温から250℃まで5℃/minで昇温し、TMA曲線を作成した。このTMA曲線の50℃~ガラス転移温度(Tg)の間の傾きから線膨張係数を求めた。線膨張係数が、70ppm/℃未満の場合を「A」とし、70ppm/℃以上100ppm/℃未満の場合を「B」とし、100ppm/℃以上の場合を「C」として線膨張係数(CTE)を評価した。結果を表2に示す。
評価結果が「A」又は「B」の場合をCTEが良好であると評価し、評価結果が「C」の場合にCTEが不良であると評価した。 <Evaluation of coefficient of linear expansion (CTE)>
Each of the polymers obtained in the above synthesis example was dissolved in N-methyl-2-pyrrolidone to prepare a resin composition having a polymer concentration of 20% by mass. This prepared resin composition was applied onto a silicon substrate using a bar coater, dried at 70° C. for 15 minutes, and then dried at 100° C. for 15 minutes to form a film, which was then peeled off from the silicon substrate. Thereafter, the film was fixed to a metal frame and further dried at 230° C. for 1 hour to produce a film for evaluation.
The linear expansion coefficient of the produced evaluation film was measured using a TMA (Thermal Mechanical Analysis) SS6100 device (manufactured by Seiko Instruments Inc.). The measurements were performed as follows.
The temperature was once raised from room temperature to 200°C at a rate of 5°C/min, then cooled to room temperature, and the temperature was raised again from room temperature to 250°C at a rate of 5°C/min to create a TMA curve. The coefficient of linear expansion was determined from the slope of this TMA curve between 50° C. and the glass transition temperature (Tg). Coefficient of linear expansion (CTE): "A" if the linear expansion coefficient is less than 70 ppm/°C, "B" if it is 70 ppm/°C or more and less than 100 ppm/°C, and "C" if it is 100 ppm/°C or more. was evaluated. The results are shown in Table 2.
When the evaluation result was "A" or "B", the CTE was evaluated as good, and when the evaluation result was "C", the CTE was evaluated as poor.
[実施例1]ポジレジスト調製
100質量部の重合体P-1と、感光性化合物としてのキノンジアジド化合物(4,4’-〔1-〔4-〔1-〔4-ヒドロキシフェニル〕-1-メチルエチル〕フェニル〕エチリデン〕ビスフェノール(1.0モル)と1,2-ナフトキノンジアジド-5-スルホン酸クロリド(2.0モル)との縮合物)20質量部と、密着助剤(γ-グリシドキシプロピルトリメトキシシラン)5質量部と、界面活性剤(「FTX-218」(株)ネオス製)0.5質量部とを混合した。さらに、固形分濃度が20質量%となるように溶媒としてジエチレングリコールメチルエチルエーテルとシクロヘキサノンとの混合溶液を添加した。その後、孔径0.2μmのメンブレンフィルターで濾過することにより、組成物(ポジレジスト)を調製した。 [Example 1] Positive resist preparation 100 parts by mass of polymer P-1 and a quinonediazide compound (4,4'-[1-[4-[1-[4-hydroxyphenyl]-1- 20 parts by mass of a condensate of methylethyl[phenyl]ethylidene]bisphenol (1.0 mol) and 1,2-naphthoquinonediazide-5-sulfonic acid chloride (2.0 mol), and an adhesion aid (γ-glycide). 5 parts by mass of sidoxypropyltrimethoxysilane) and 0.5 parts by mass of a surfactant ("FTX-218" manufactured by Neos Co., Ltd.) were mixed. Furthermore, a mixed solution of diethylene glycol methyl ethyl ether and cyclohexanone was added as a solvent so that the solid content concentration was 20% by mass. Thereafter, a composition (positive resist) was prepared by filtering through a membrane filter with a pore size of 0.2 μm.
100質量部の重合体P-1と、感光性化合物としてのキノンジアジド化合物(4,4’-〔1-〔4-〔1-〔4-ヒドロキシフェニル〕-1-メチルエチル〕フェニル〕エチリデン〕ビスフェノール(1.0モル)と1,2-ナフトキノンジアジド-5-スルホン酸クロリド(2.0モル)との縮合物)20質量部と、密着助剤(γ-グリシドキシプロピルトリメトキシシラン)5質量部と、界面活性剤(「FTX-218」(株)ネオス製)0.5質量部とを混合した。さらに、固形分濃度が20質量%となるように溶媒としてジエチレングリコールメチルエチルエーテルとシクロヘキサノンとの混合溶液を添加した。その後、孔径0.2μmのメンブレンフィルターで濾過することにより、組成物(ポジレジスト)を調製した。 [Example 1] Positive resist preparation 100 parts by mass of polymer P-1 and a quinonediazide compound (4,4'-[1-[4-[1-[4-hydroxyphenyl]-1- 20 parts by mass of a condensate of methylethyl[phenyl]ethylidene]bisphenol (1.0 mol) and 1,2-naphthoquinonediazide-5-sulfonic acid chloride (2.0 mol), and an adhesion aid (γ-glycide). 5 parts by mass of sidoxypropyltrimethoxysilane) and 0.5 parts by mass of a surfactant ("FTX-218" manufactured by Neos Co., Ltd.) were mixed. Furthermore, a mixed solution of diethylene glycol methyl ethyl ether and cyclohexanone was added as a solvent so that the solid content concentration was 20% by mass. Thereafter, a composition (positive resist) was prepared by filtering through a membrane filter with a pore size of 0.2 μm.
[実施例2~17及び比較例1~4]
表3に記載の種類の重合体を用い、さらに、実施例1で用いた感光性化合物、密着助剤、界面活性剤及び溶媒以外に、表3に記載の添加剤を表3に記載の量(質量部)で用いた以外は実施例1と同様にして、組成物(ポジレジスト)を調製した。 [Examples 2 to 17 and Comparative Examples 1 to 4]
Using the type of polymer listed in Table 3, in addition to the photosensitive compound, adhesion aid, surfactant, and solvent used in Example 1, the additives listed in Table 3 were added in the amounts listed in Table 3. A composition (positive resist) was prepared in the same manner as in Example 1 except that (parts by mass) was used.
表3に記載の種類の重合体を用い、さらに、実施例1で用いた感光性化合物、密着助剤、界面活性剤及び溶媒以外に、表3に記載の添加剤を表3に記載の量(質量部)で用いた以外は実施例1と同様にして、組成物(ポジレジスト)を調製した。 [Examples 2 to 17 and Comparative Examples 1 to 4]
Using the type of polymer listed in Table 3, in addition to the photosensitive compound, adhesion aid, surfactant, and solvent used in Example 1, the additives listed in Table 3 were added in the amounts listed in Table 3. A composition (positive resist) was prepared in the same manner as in Example 1 except that (parts by mass) was used.
<感度(放射線感度)の評価>
スピンナーを用い、60℃で60秒間HMDS処理したシリコン基板上に、調製した組成物(ポジレジスト)を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。この塗膜に、キヤノン(株)製の「MPA-600FA」露光機を用い、幅10μmのライン・アンド・スペースパターンを有するパターンマスクを介して、所定量の紫外線を照射した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。このとき、幅10μmのライン・アンド・スペースパターンを形成可能な最小露光量を測定した。この測定値が1500J/m2未満の場合を「A」(感度が優良)とし、1500J/m2以上の場合を「B」(感度は良)とし、パターンが得られなかった場合を「C」として感度を評価した。結果を表3に示す。 <Evaluation of sensitivity (radiation sensitivity)>
Using a spinner, the prepared composition (positive resist) was applied onto a silicon substrate treated with HMDS at 60°C for 60 seconds, and then prebaked on a hot plate at 90°C for 2 minutes to form a coating with a film thickness of 3.0 μm. A film was formed. This coating film was irradiated with a predetermined amount of ultraviolet rays using an exposure machine "MPA-600FA" manufactured by Canon Inc. through a pattern mask having a line and space pattern with a width of 10 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. At this time, the minimum exposure amount capable of forming a line and space pattern with a width of 10 μm was measured. If this measured value is less than 1500 J/ m2 , it is graded as "A" (sensitivity is excellent), if it is 1500 J/m2 or more , it is graded as "B" (sensitivity is good), and if no pattern is obtained, it is graded as "C". The sensitivity was evaluated as follows. The results are shown in Table 3.
スピンナーを用い、60℃で60秒間HMDS処理したシリコン基板上に、調製した組成物(ポジレジスト)を塗布した後、90℃にて2分間ホットプレート上でプレベークして膜厚3.0μmの塗膜を形成した。この塗膜に、キヤノン(株)製の「MPA-600FA」露光機を用い、幅10μmのライン・アンド・スペースパターンを有するパターンマスクを介して、所定量の紫外線を照射した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。このとき、幅10μmのライン・アンド・スペースパターンを形成可能な最小露光量を測定した。この測定値が1500J/m2未満の場合を「A」(感度が優良)とし、1500J/m2以上の場合を「B」(感度は良)とし、パターンが得られなかった場合を「C」として感度を評価した。結果を表3に示す。 <Evaluation of sensitivity (radiation sensitivity)>
Using a spinner, the prepared composition (positive resist) was applied onto a silicon substrate treated with HMDS at 60°C for 60 seconds, and then prebaked on a hot plate at 90°C for 2 minutes to form a coating with a film thickness of 3.0 μm. A film was formed. This coating film was irradiated with a predetermined amount of ultraviolet rays using an exposure machine "MPA-600FA" manufactured by Canon Inc. through a pattern mask having a line and space pattern with a width of 10 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. At this time, the minimum exposure amount capable of forming a line and space pattern with a width of 10 μm was measured. If this measured value is less than 1500 J/ m2 , it is graded as "A" (sensitivity is excellent), if it is 1500 J/m2 or more , it is graded as "B" (sensitivity is good), and if no pattern is obtained, it is graded as "C". The sensitivity was evaluated as follows. The results are shown in Table 3.
<平坦性の評価>
深さ2.0μm、幅20μmのライン・アンド・スペースパターンが形成されたシリコン基板上に、スピンコーターを用いて調製した組成物(ポジレジスト)を塗布した。その後、到達圧力を100Paに設定し、該塗布した組成物から真空下で溶媒を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。得られた塗膜に対し、露光機(「MPA-600FA」キャノン(株)製)で積算照射量が9,000J/m2になるように露光し、露光後の塗膜を有する基板を窒素置換したクリーンオーブン内にて230℃で1時間加熱することによって、基板上に絶縁膜を形成した。
得られた絶縁膜付き基板の絶縁膜の表面形状を、針接触式測定機(「AS200」KLA Tencor社製)を用いて観察し、絶縁膜の凹凸の最高部と最低部の高さの差(ΔH)を平坦性の指標とした。このΔHが、500nm未満の場合を「A」とし、500nm以上800nm以下の場合を「B」とし、800nmを超える場合を「C」として平坦性を評価した。結果を表3に示す。 <Evaluation of flatness>
A composition (positive resist) prepared using a spin coater was applied onto a silicon substrate on which a line-and-space pattern with a depth of 2.0 μm and a width of 20 μm was formed. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. The resulting coating film was exposed to light using an exposure machine ("MPA-600FA" manufactured by Canon Co., Ltd.) at a cumulative dose of 9,000 J/ m2 , and the substrate with the coating film after exposure was exposed to nitrogen. An insulating film was formed on the substrate by heating at 230° C. for 1 hour in a replaced clean oven.
The surface shape of the insulating film of the obtained insulating film-coated substrate was observed using a needle contact measuring device ("AS200" manufactured by KLA Tencor), and the difference in height between the highest and lowest parts of the unevenness of the insulating film was observed. (ΔH) was used as an index of flatness. The flatness was evaluated as "A" if this ΔH was less than 500 nm, "B" if it was 500 nm or more and not more than 800 nm, and "C" if it exceeded 800 nm. The results are shown in Table 3.
深さ2.0μm、幅20μmのライン・アンド・スペースパターンが形成されたシリコン基板上に、スピンコーターを用いて調製した組成物(ポジレジスト)を塗布した。その後、到達圧力を100Paに設定し、該塗布した組成物から真空下で溶媒を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。得られた塗膜に対し、露光機(「MPA-600FA」キャノン(株)製)で積算照射量が9,000J/m2になるように露光し、露光後の塗膜を有する基板を窒素置換したクリーンオーブン内にて230℃で1時間加熱することによって、基板上に絶縁膜を形成した。
得られた絶縁膜付き基板の絶縁膜の表面形状を、針接触式測定機(「AS200」KLA Tencor社製)を用いて観察し、絶縁膜の凹凸の最高部と最低部の高さの差(ΔH)を平坦性の指標とした。このΔHが、500nm未満の場合を「A」とし、500nm以上800nm以下の場合を「B」とし、800nmを超える場合を「C」として平坦性を評価した。結果を表3に示す。 <Evaluation of flatness>
A composition (positive resist) prepared using a spin coater was applied onto a silicon substrate on which a line-and-space pattern with a depth of 2.0 μm and a width of 20 μm was formed. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. The resulting coating film was exposed to light using an exposure machine ("MPA-600FA" manufactured by Canon Co., Ltd.) at a cumulative dose of 9,000 J/ m2 , and the substrate with the coating film after exposure was exposed to nitrogen. An insulating film was formed on the substrate by heating at 230° C. for 1 hour in a replaced clean oven.
The surface shape of the insulating film of the obtained insulating film-coated substrate was observed using a needle contact measuring device ("AS200" manufactured by KLA Tencor), and the difference in height between the highest and lowest parts of the unevenness of the insulating film was observed. (ΔH) was used as an index of flatness. The flatness was evaluated as "A" if this ΔH was less than 500 nm, "B" if it was 500 nm or more and not more than 800 nm, and "C" if it exceeded 800 nm. The results are shown in Table 3.
<ベンディング性(耐折り曲げ性)の評価>
ポリイミドフィルム基板上に、スピンコーターを用いて調製した組成物(ポジレジスト)を塗布した。その後、到達圧力を100Paに設定し、該塗布した組成物から真空下で溶媒を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。得られた塗膜をクリーンオーブン内にて230℃で1時間加熱することによって、基板上に硬化膜を形成した。
得られた硬化膜付き基板を、縦50mm×横50mmの大きさに切り出した。次に、硬化膜の面を内側にして、硬化膜同士が接するように硬化膜付き基板を折り曲げた状態で、10分間保持した。10分後、折り曲げた硬化膜付き基板を開き、光学顕微鏡を用いて硬化膜表面の折り曲げ部分を観察し、外観変化を評価した。硬化膜にひび割れがない場合を「A」とし、硬化膜の一部にひび割れがある場合を「B」とし、硬化膜の全体にひび割れがある場合を「C」としてベンディング性(耐折り曲げ性)を評価した。結果を表3に示す。 <Evaluation of bending property (bending resistance)>
A composition (positive resist) prepared using a spin coater was applied onto a polyimide film substrate. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. The obtained coating film was heated at 230° C. for 1 hour in a clean oven to form a cured film on the substrate.
The obtained substrate with a cured film was cut into a size of 50 mm in length x 50 mm in width. Next, the cured film-coated substrate was bent for 10 minutes with the cured film facing inward so that the cured films were in contact with each other. After 10 minutes, the bent substrate with the cured film was opened, and the bent portion of the surface of the cured film was observed using an optical microscope to evaluate changes in appearance. Bending property (bending resistance): "A" if there are no cracks in the cured film, "B" if there are cracks in a part of the cured film, and "C" if there are cracks in the entire cured film. was evaluated. The results are shown in Table 3.
ポリイミドフィルム基板上に、スピンコーターを用いて調製した組成物(ポジレジスト)を塗布した。その後、到達圧力を100Paに設定し、該塗布した組成物から真空下で溶媒を除去し、さらに90℃で2分間プレベークして平均膜厚3.0μmの塗膜を形成した。次いで、現像液(テトラメチルアンモニウムヒドロキシド2.38質量%水溶液)を用い、25℃で60秒間現像処理を行った後、超純水で1分間流水洗浄を行った。得られた塗膜をクリーンオーブン内にて230℃で1時間加熱することによって、基板上に硬化膜を形成した。
得られた硬化膜付き基板を、縦50mm×横50mmの大きさに切り出した。次に、硬化膜の面を内側にして、硬化膜同士が接するように硬化膜付き基板を折り曲げた状態で、10分間保持した。10分後、折り曲げた硬化膜付き基板を開き、光学顕微鏡を用いて硬化膜表面の折り曲げ部分を観察し、外観変化を評価した。硬化膜にひび割れがない場合を「A」とし、硬化膜の一部にひび割れがある場合を「B」とし、硬化膜の全体にひび割れがある場合を「C」としてベンディング性(耐折り曲げ性)を評価した。結果を表3に示す。 <Evaluation of bending property (bending resistance)>
A composition (positive resist) prepared using a spin coater was applied onto a polyimide film substrate. Thereafter, the ultimate pressure was set to 100 Pa, the solvent was removed from the applied composition under vacuum, and further prebaked at 90° C. for 2 minutes to form a coating film with an average thickness of 3.0 μm. Next, development was performed at 25° C. for 60 seconds using a developer (2.38% by mass aqueous solution of tetramethylammonium hydroxide), followed by washing with running ultrapure water for 1 minute. The obtained coating film was heated at 230° C. for 1 hour in a clean oven to form a cured film on the substrate.
The obtained substrate with a cured film was cut into a size of 50 mm in length x 50 mm in width. Next, the cured film-coated substrate was bent for 10 minutes with the cured film facing inward so that the cured films were in contact with each other. After 10 minutes, the bent substrate with the cured film was opened, and the bent portion of the surface of the cured film was observed using an optical microscope to evaluate changes in appearance. Bending property (bending resistance): "A" if there are no cracks in the cured film, "B" if there are cracks in a part of the cured film, and "C" if there are cracks in the entire cured film. was evaluated. The results are shown in Table 3.
表3中のAdd-1~Add-6は以下のとおりである。
「Add-1」:下記式(Add-1)で表される化合物
「Add-2」:下記式(Add-2)で表される化合物
「Add-3」:下記式(Add-3)で表される化合物
「Add-4」:下記式(Add-4)で表される化合物
「Add-5」:下記式(Add-5)で表される化合物
「Add-6」:ビスフェノールA型エポキシ樹脂(「EP157S65」三菱ケミカル(株)製) Add-1 to Add-6 in Table 3 are as follows.
"Add-1": A compound represented by the following formula (Add-1) "Add-2": A compound represented by the following formula (Add-2) "Add-3": A compound represented by the following formula (Add-3) Compound represented by "Add-4": Compound represented by the following formula (Add-4) "Add-5": Compound represented by the following formula (Add-5) "Add-6": Bisphenol A type epoxy Resin (“EP157S65” manufactured by Mitsubishi Chemical Corporation)
「Add-1」:下記式(Add-1)で表される化合物
「Add-2」:下記式(Add-2)で表される化合物
「Add-3」:下記式(Add-3)で表される化合物
「Add-4」:下記式(Add-4)で表される化合物
「Add-5」:下記式(Add-5)で表される化合物
「Add-6」:ビスフェノールA型エポキシ樹脂(「EP157S65」三菱ケミカル(株)製) Add-1 to Add-6 in Table 3 are as follows.
"Add-1": A compound represented by the following formula (Add-1) "Add-2": A compound represented by the following formula (Add-2) "Add-3": A compound represented by the following formula (Add-3) Compound represented by "Add-4": Compound represented by the following formula (Add-4) "Add-5": Compound represented by the following formula (Add-5) "Add-6": Bisphenol A type epoxy Resin (“EP157S65” manufactured by Mitsubishi Chemical Corporation)
[実施例18]ネガレジスト調製
100質量部の重合体P-1と、光重合開始剤としてのO-アシルオキシム化合物(「イルガキュアOXE01」BASF社製)5質量部と、重合性単量体(ジペンタエリスリトールペンタ(メタ)アクリレートとジペンタエリスリトールヘキサ(メタ)アクリレートとの混合物)30質量部と、密着助剤(γ-グリシドキシプロピルトリメトキシシラン)5質量部と、界面活性剤(「FTX-218」(株)ネオス製)0.5質量部とを混合した。さらに、固形分濃度が20質量%となるように溶媒としてジエチレングリコールメチルエチルエーテルとシクロヘキサノンとの混合溶液を添加した後、孔径0.2μmのメンブレンフィルターで濾過することにより、組成物(ネガレジスト)を調製した。
調製したネガレジストを用いて、前記と同様の感度、平坦性及びベンディング性の評価を行ったところ、ネガレジストに関しても良好な感度、平坦性及びベンディング性が確認された。 [Example 18] Negative resist preparation 100 parts by mass of polymer P-1, 5 parts by mass of an O-acyl oxime compound ("Irgacure OXE01" manufactured by BASF) as a photopolymerization initiator, and a polymerizable monomer ( 30 parts by mass of a mixture of dipentaerythritol penta(meth)acrylate and dipentaerythritol hexa(meth)acrylate), 5 parts by mass of an adhesion aid (γ-glycidoxypropyltrimethoxysilane), and a surfactant ( 0.5 part by mass of "FTX-218" (manufactured by Neos Co., Ltd.) was mixed. Furthermore, after adding a mixed solution of diethylene glycol methyl ethyl ether and cyclohexanone as a solvent so that the solid content concentration was 20% by mass, the composition (negative resist) was filtered through a membrane filter with a pore size of 0.2 μm. Prepared.
Using the prepared negative resist, sensitivity, flatness, and bending properties were evaluated in the same manner as described above, and good sensitivity, flatness, and bending properties were confirmed for the negative resist as well.
100質量部の重合体P-1と、光重合開始剤としてのO-アシルオキシム化合物(「イルガキュアOXE01」BASF社製)5質量部と、重合性単量体(ジペンタエリスリトールペンタ(メタ)アクリレートとジペンタエリスリトールヘキサ(メタ)アクリレートとの混合物)30質量部と、密着助剤(γ-グリシドキシプロピルトリメトキシシラン)5質量部と、界面活性剤(「FTX-218」(株)ネオス製)0.5質量部とを混合した。さらに、固形分濃度が20質量%となるように溶媒としてジエチレングリコールメチルエチルエーテルとシクロヘキサノンとの混合溶液を添加した後、孔径0.2μmのメンブレンフィルターで濾過することにより、組成物(ネガレジスト)を調製した。
調製したネガレジストを用いて、前記と同様の感度、平坦性及びベンディング性の評価を行ったところ、ネガレジストに関しても良好な感度、平坦性及びベンディング性が確認された。 [Example 18] Negative resist preparation 100 parts by mass of polymer P-1, 5 parts by mass of an O-acyl oxime compound ("Irgacure OXE01" manufactured by BASF) as a photopolymerization initiator, and a polymerizable monomer ( 30 parts by mass of a mixture of dipentaerythritol penta(meth)acrylate and dipentaerythritol hexa(meth)acrylate), 5 parts by mass of an adhesion aid (γ-glycidoxypropyltrimethoxysilane), and a surfactant ( 0.5 part by mass of "FTX-218" (manufactured by Neos Co., Ltd.) was mixed. Furthermore, after adding a mixed solution of diethylene glycol methyl ethyl ether and cyclohexanone as a solvent so that the solid content concentration was 20% by mass, the composition (negative resist) was filtered through a membrane filter with a pore size of 0.2 μm. Prepared.
Using the prepared negative resist, sensitivity, flatness, and bending properties were evaluated in the same manner as described above, and good sensitivity, flatness, and bending properties were confirmed for the negative resist as well.
Claims (12)
- 下記式(1)で表される構造単位を有する重合体を含む、組成物:
Bは、芳香環又は芳香族複素環を有し、且つ、アルカリ可溶性基を有する2価の基であり、
Xは独立して、-O-、-NH-又は-S-である。 A composition containing a polymer having a structural unit represented by the following formula (1):
B is a divalent group having an aromatic ring or an aromatic heterocycle and having an alkali-soluble group,
X is independently -O-, -NH- or -S-. - 前記Aにおける芳香族複素環が、窒素含有芳香環である、請求項1に記載の組成物。 The composition according to claim 1, wherein the aromatic heterocycle in A is a nitrogen-containing aromatic ring.
- 前記Aにおける芳香族複素環が、窒素原子を2つ以上有する芳香環である、請求項1に記載の組成物。 The composition according to claim 1, wherein the aromatic heterocycle in A is an aromatic ring having two or more nitrogen atoms.
- 前記Xが-O-又は-NH-である、請求項1に記載の組成物。 The composition according to claim 1, wherein the X is -O- or -NH-.
- 前記Bが、下記式(B1)~(B10)のいずれかで表される基である、請求項1に記載の組成物:
- 前記Bにおけるアルカリ可溶性基が、フェノール性水酸基又はカルボキシ基である、請求項1に記載の組成物。 The composition according to claim 1, wherein the alkali-soluble group in B is a phenolic hydroxyl group or a carboxy group.
- 感光性化合物をさらに含有する、請求項1に記載の組成物。 The composition according to claim 1, further comprising a photosensitive compound.
- 前記感光性化合物が感光性酸発生剤である、請求項7に記載の組成物。 The composition according to claim 7, wherein the photosensitive compound is a photosensitive acid generator.
- 請求項1~8のいずれか1項に記載の組成物を用いて形成された硬化物。 A cured product formed using the composition according to any one of claims 1 to 8.
- 絶縁膜、表面保護膜又は平坦化膜である、請求項9に記載の硬化物。 The cured product according to claim 9, which is an insulating film, a surface protection film, or a planarization film.
- 請求項9に記載の硬化物を有する表示素子。 A display element comprising the cured product according to claim 9.
- 下記式(2)で表される構造単位を有する重合体:
Bは、下記式(B1)~(B10)のいずれかで表される2価の基であり、
Xは独立して、-O-、-NH-又は-S-である;
B is a divalent group represented by any of the following formulas (B1) to (B10),
X is independently -O-, -NH- or -S-;
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2022143851 | 2022-09-09 | ||
JP2022-143851 | 2022-09-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2024053722A1 true WO2024053722A1 (en) | 2024-03-14 |
Family
ID=90191378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2023/032771 WO2024053722A1 (en) | 2022-09-09 | 2023-09-08 | Polymer, composition, cured product, and display element |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2024053722A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004156001A (en) * | 2002-11-07 | 2004-06-03 | Sanei Kagaku Kk | Triazine dihalide containing phenolic hydroxy group, aromatic (poly)guanamine and their composition |
WO2014109143A1 (en) * | 2013-01-09 | 2014-07-17 | Jsr株式会社 | Photosensitive composition, polymer, resin film, method for producing resin film, and electronic component |
JP2015038560A (en) * | 2013-08-19 | 2015-02-26 | Jsr株式会社 | Photosensitive resin composition, polymer, resin film and production method of the same, and electronic component |
JP2016145913A (en) * | 2015-02-06 | 2016-08-12 | Jsr株式会社 | Resin composition for pattern formation, insulation film and manufacturing method and display device thereof |
WO2019093203A1 (en) * | 2017-11-08 | 2019-05-16 | 日産化学株式会社 | Triazine-ring-containing polymer and composition including same |
-
2023
- 2023-09-08 WO PCT/JP2023/032771 patent/WO2024053722A1/en unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004156001A (en) * | 2002-11-07 | 2004-06-03 | Sanei Kagaku Kk | Triazine dihalide containing phenolic hydroxy group, aromatic (poly)guanamine and their composition |
WO2014109143A1 (en) * | 2013-01-09 | 2014-07-17 | Jsr株式会社 | Photosensitive composition, polymer, resin film, method for producing resin film, and electronic component |
JP2015038560A (en) * | 2013-08-19 | 2015-02-26 | Jsr株式会社 | Photosensitive resin composition, polymer, resin film and production method of the same, and electronic component |
JP2016145913A (en) * | 2015-02-06 | 2016-08-12 | Jsr株式会社 | Resin composition for pattern formation, insulation film and manufacturing method and display device thereof |
WO2019093203A1 (en) * | 2017-11-08 | 2019-05-16 | 日産化学株式会社 | Triazine-ring-containing polymer and composition including same |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI491987B (en) | A negative photosensitive resin composition, a hardened embossed pattern, and a semiconductor device | |
US20110272643A1 (en) | Organic anti-reflective layer composition containing ring-opened phthalic anhydride and method for preparation thereof | |
KR20170039561A (en) | Binder resin and photosensitive resin composition containing the same | |
JP5649242B2 (en) | Insulation film | |
CN103052916A (en) | Negative photosensitive resin composition | |
WO2007052540A1 (en) | Photosensitive resin composition | |
JP5257450B2 (en) | Positive photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device using the same | |
WO2009087964A1 (en) | Positive photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device using the cured film | |
KR102186921B1 (en) | Terpolymer, process of synthesizing thepolymer, anti-reflection filim including the terpolymer and application thereof | |
WO2007125818A1 (en) | Polymer and photosensitive resin composition comprising the same | |
JP4771412B2 (en) | Photosensitive resin and method for producing the same | |
JP7056662B2 (en) | Polymers, resin compositions, resin films, methods for manufacturing patterned resin films, and electronic components | |
WO2015178074A1 (en) | Photosensitive resin composition and use of same | |
KR20210078072A (en) | Organic compound and method of synthesizing thereof | |
WO2024053722A1 (en) | Polymer, composition, cured product, and display element | |
JP6468068B2 (en) | Photosensitive resin composition and use thereof | |
JP5290686B2 (en) | Photosensitive resin composition | |
KR101017234B1 (en) | Photosensitive resin composition | |
TW202411289A (en) | Polymers, compositions, hardened materials and display components | |
WO2021065540A1 (en) | Photosensitive resin composition, dry film, cured object, and electronic component | |
JP5884551B2 (en) | Photosensitive resin composition and use thereof | |
KR20210048118A (en) | Polysiloxane copolymer, method for preparing the same and resin composition comprising the same | |
KR20200031903A (en) | Photosensitive resin composition, photosensitive resin layer and electronic device using the same | |
KR102613692B1 (en) | Polymer having high refractive index, process of synthesizing the polymer, organic flim incluidng the polymer and application thereof | |
TW201927982A (en) | Binder resin and photosensitive resin composition or coating solution containing the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23863260 Country of ref document: EP Kind code of ref document: A1 |