WO2024041018A1

WO2024041018A1 - Method and apparatus for adjusting response duration of stress test system, and device and medium

Info

Publication number: WO2024041018A1
Application number: PCT/CN2023/091088
Authority: WO
Inventors: 王昆
Original assignee: 京东科技控股股份有限公司
Priority date: 2022-08-23
Filing date: 2023-04-27
Publication date: 2024-02-29
Also published as: CN117667614A

Abstract

Provided are a method and apparatus for adjusting a response duration of a stress test system, and a device and a medium, which can be applied to the technical field of computers. The method comprises: in response to an nth simulated service request, acquiring response information of an (n-1)th simulated service request from a memory, wherein the response information comprises a first response duration and adjustment information, the adjustment information comprises a first adjustment duration consumed by using a stress stabilization assembly, and a first duration to be consumed, which is not consumed by the stress stabilization assembly during the process of a stress test system responding to the (n-1)th simulated service request, and n is a positive integer greater than 2; according to the first response duration, a preset response duration and the first duration to be consumed, determining a second duration to be consumed; determining a second adjustment duration according to the second duration to be consumed and the first adjustment duration; and according to the second adjustment duration, adjusting a response duration of the nth simulated service request by using the stress stabilization assembly.

Description

Methods, devices, equipment and media for adjusting the response time of the pressure measurement system

This application claims priority to the Chinese patent application with application number 202211015694.7, submitted on August 23, 2022, the entire content of which is incorporated into this application by reference.

Technical field

The present disclosure relates to the field of computer technology, and more specifically, to a method, device, equipment, medium and program product for adjusting the response time of a pressure measurement system.

Background technique

Stress testing is a testing method to determine system stability. It is usually performed outside the normal operating range of the system to examine the functional limits and hidden dangers of the system. The traditional pressure testing method generally applies pressure to the simulation thread, and calculates the pressure measurement flow based on the response time of the pressure measurement system.

In the process of realizing the concept of the present disclosure, the inventor found that there are at least the following problems in related technologies: since the response time will be interfered by various factors such as system response fluctuations, network fluctuations, system degradation, switch operations, etc., the pressure measurement flow will appear The constantly fluctuating state reduces the pressure measurement accuracy.

Contents of the invention

In view of this, the present disclosure provides a method, device, equipment, medium and program product for adjusting the response time of a pressure measurement system.

One aspect of the present disclosure provides a method for adjusting the response time of a pressure measurement system, including:

In response to the n-th simulated service request, the response information of the n-1th simulated service request is obtained from the memory, where the response information includes the first response duration and adjustment information, and the adjustment information is included in the stress testing system's response to the n-1st simulated service request. In the process of simulating a service request, the first adjustment time consumed by the voltage stabilizing component and the first unconsumed waiting time of the voltage stabilizing component are used;

Determine the second time to be consumed based on the first response time, the preset response time and the first time to be consumed. The preset response time represents the expected response time of the stress testing system for the simulated service request. The preset response time is greater than n-1 times. Simulate the average response time of service requests, where n is a positive integer greater than 2;

Determine the second adjustment duration based on the second to-be-consumed duration and the first adjustment duration;

Using the voltage stabilizing component, the response duration of the nth simulated service request is adjusted according to the second adjustment duration.

According to an embodiment of the present disclosure, determining the second time period to be consumed based on the first response time period, the preset response time length and the first time period to be consumed includes:

Determine the response deviation duration of the n-1th simulated service request based on the first response duration and the preset response duration;

The second time period to be consumed is determined based on the response deviation time period and the first time period to be consumed.

According to an embodiment of the present disclosure, determining the second adjustment duration based on the second to-be-consumed duration and the first adjustment duration includes:

When the second time period to be consumed is less than the first adjustment time period, the difference between the first adjustment time period and the second time period to be consumed is determined as the second adjustment time length;

In the case where the second to-be-consumed duration is greater than the first adjustment duration, the second adjustment duration is determined to be zero.

According to an embodiment of the present disclosure, the method for adjusting the response duration of the pressure measurement system further includes:

The third time period to be consumed is determined based on the second time period to be consumed and the first adjustment time period. The third time period to be consumed represents the remaining time recorded in the voltage stabilizing component after the second adjustment time period is consumed by the voltage stabilizing component.

According to an embodiment of the present disclosure, determining the third time period to be consumed based on the second time period to be consumed and the first adjustment time period includes:

When the second time period to be consumed is less than the first adjustment time period, it is determined that the third time period to be consumed is zero;

When the second time period to be consumed is greater than the first adjustment time period, the difference between the second time period to be consumed and the first adjustment time period is determined as the third time period to be consumed.

The third to-be-consumed duration and the second adjustment duration are overwritten and written into the memory for performing the adjustment operation of the response time of the (n+1)th simulated service request.

According to an embodiment of the present disclosure, the voltage stabilizing component is used to adjust the response duration of the nth simulated service request according to the second adjustment duration, including:

In response to the nth simulated service request, record the request start time information;

When the response to the nth simulated service request ends, use the voltage stabilizing component to consume the second adjustment time;

Determine the request end time information based on the stress test start time and the second adjustment duration;

Based on the stress test start time information and the stress test end time information, determine the adjusted response time for the nth simulated service request.

Another aspect of the present disclosure provides a device for adjusting the response duration of a pressure measurement system, including: an acquisition module, a first determination module, a second determination module, and an adjustment module. Among them, the acquisition module is used to respond to the n-th simulated service request and obtain the response information of the n-1th simulated service request from the memory, where the response information includes The first response time and adjustment information. The adjustment information includes the first adjustment time consumed by the voltage stabilizing component and the first unconsumed time to be consumed by the voltage stabilizing component during the process of the pressure measurement system responding to the n-1th simulated service request. , where n is a positive integer greater than 2. The first determination module is used to determine the second to-be-consumed duration based on the first response duration, the preset response duration and the first to-be-consumed duration. The preset response duration represents the expected response duration of each simulated service request. The preset response duration The average response time is greater than n simulated service requests. The second determination module is configured to determine the second adjustment duration based on the second to-be-consumed duration and the first adjustment duration. The adjustment module is configured to use the voltage stabilizing component to adjust the response duration of the nth simulated service request according to the second adjustment duration.

According to an embodiment of the present disclosure, the first determination module includes a first determination unit and a second determination unit. Wherein, the first determining unit is used to determine the response deviation duration of the n-1th simulated service request based on the first response duration and the preset response duration. The second determination unit is configured to determine the second time period to be consumed based on the response deviation time period and the first time period to be consumed.

According to an embodiment of the present disclosure, the second determination module includes a third determination unit and a fourth determination unit. Wherein, the third determining unit is configured to determine the difference between the first adjustment time period and the second time period to be consumed as the second adjustment time period when the second time period to be consumed is less than the first adjustment time period. The fourth determination unit is configured to determine that the second adjustment duration is zero when the second to-be-consumed duration is greater than the first adjustment duration.

According to an embodiment of the present disclosure, the device for adjusting the response time of the pressure measurement system further includes a third determination module for determining the third time to be consumed based on the second time to be consumed and the first adjustment time, and the third time to be consumed represents the After the voltage stabilizing component consumes the second adjustment duration, the remaining time recorded in the voltage stabilizing component is used.

According to an embodiment of the present disclosure, the third determination module includes a fifth determination unit and a sixth determination unit. Wherein, the fifth determination unit is configured to determine that the third time period to be consumed is zero when the second time period to be consumed is less than the first adjustment time period. The sixth determination unit is configured to determine the difference between the second time period to be consumed and the first adjustment time period as the third time period to be consumed when the second time period to be consumed is greater than the first adjustment time period.

According to an embodiment of the present disclosure, the above-mentioned device for adjusting the response duration of the pressure measurement system further includes a storage module for overwriting and writing the third to-be-consumed duration and the second adjustment duration into the memory for performing the n+1th simulation. Adjustment of response times for service requests.

According to an embodiment of the present disclosure, the adjustment module includes a recording unit, a consumption unit, a seventh determination unit and an eighth determination unit. The recording unit is used to record the request start time information in response to the nth simulated service request. The consumption unit is configured to use the voltage stabilizing component to consume the second adjustment duration when the response to the nth simulated service request ends. The seventh determination unit is used to determine the request end time information based on the pressure test start time and the second adjustment duration. The eighth determination unit is used to determine the adjusted third value based on the pressure test start time information and the pressure test end time information. The response time of n simulated service requests.

Another aspect of the present disclosure provides an electronic device, including: one or more processors; a storage device for storing one or more programs, wherein when the one or more programs are executed by the one or more processors When, one or more processors are caused to execute the method described in the embodiment of the present disclosure.

Another aspect of the disclosure provides a computer-readable storage medium storing computer-executable instructions that, when executed, are used to implement the methods described in embodiments of the disclosure.

Another aspect of the disclosure provides a computer program product. The computer program product includes computer-executable instructions. When executed, the instructions are used to implement the methods described in the embodiments of the disclosure.

According to the embodiment of the present disclosure, because the first response duration in the response information of the n-1th simulated service request, the unconsumed first to-be-consumed duration and the preset response duration in the voltage stabilizing component are used, the second to-be-awaited duration is determined. The technical method is to determine the second adjustment time based on the second time to be consumed and the first adjustment time, and use the voltage stabilizing component to adjust the response time of the nth simulated service request based on the second adjustment time. Since the voltage stabilizing component is used to adjust the response time of the n-th simulated service request according to the unconsumed time in the response information of n-1 simulated service requests, the response time of each simulated service request during the stress test process converges to the preset value. The response time is long, so it at least partially overcomes the technical problem of the response time fluctuation of the pressure measurement system, thereby achieving the technical effect of improving the pressure measurement accuracy.

Description of drawings

The above and other objects, features and advantages of the present disclosure will become more apparent from the following description of embodiments of the present disclosure with reference to the accompanying drawings, in which:

Figure 1 schematically illustrates an exemplary system architecture in which the method of adjusting the response duration of a pressure measurement system of the present disclosure can be applied;

Figure 2 schematically shows a flow chart of a method for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure;

Figure 3 schematically shows a flow chart of a method for determining a second to-be-consumed time period according to an embodiment of the present disclosure;

Figure 4 schematically shows a logic block diagram of a method for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure;

Figure 5 schematically shows a block diagram of a device for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure; and

FIG. 6 schematically shows a block diagram of an electronic device suitable for implementing a method for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure.

Detailed ways

Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood, however, that these descriptions are exemplary only and are not intended to limit the scope of the present disclosure. In the following detailed description, many specific details are set forth to facilitate explanation. Sections are provided to provide a comprehensive understanding of embodiments of the present disclosure. It will be apparent, however, that one or more embodiments may be practiced without these specific details. Furthermore, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily confusing the concepts of the present disclosure.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the disclosure. The terms "comprising," "comprising," and the like, as used herein, indicate the presence of stated features, steps, operations, and/or components but do not exclude the presence or addition of one or more other features, steps, operations, or components.

All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art, unless otherwise defined. It should be noted that the terms used here should be interpreted to have meanings consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

Where an expression similar to "at least one of A, B, C, etc." is used, it should generally be interpreted in accordance with the meaning that a person skilled in the art generally understands the expression to mean (e.g., "having A, B and C "A system with at least one of" shall include, but is not limited to, systems with A alone, B alone, C alone, A and B, A and C, B and C, and/or systems with A, B, C, etc. ).

In the process of implementing the embodiments of the present disclosure, the inventor found that in the traditional stress testing mode, since the stress testing traffic is determined based on the quotient of the request thread and the response time, the response time will fluctuate with the fluctuation of the system, resulting in stress testing. The flow rate is also in a fluctuating state, and the pressure measurement accuracy is low. When all response times plummet, the pressure test traffic suddenly increases, which may cause online accidents. In order to solve this problem, manual real-time control is currently generally used. However, manual control has poor timeliness, which will shorten the pressure measurement response time and reduce the pressure measurement efficiency.

In view of this, embodiments of the present disclosure provide a method for adjusting the response time of the pressure measurement system, using the first response time in the response information of the n-1th simulated service request and the unconsumed first response time in the voltage stabilizing component. The first time to be consumed and the preset response time are used to determine the second time to be consumed, and then the second adjustment time is determined based on the second time to be consumed and the first adjustment time, and the voltage stabilizing component is used to adjust the nth simulation according to the second adjustment time. Technical means of response time for service requests. Since the voltage stabilizing component is used to adjust the response time of the n-th simulated service request according to the unconsumed time in the response information of n-1 simulated service requests, the response time of each simulated service request during the stress test process converges to the preset value. The response time is long, so it at least partially overcomes the technical problem of the response time fluctuation of the pressure measurement system, thereby achieving the technical effect of improving the pressure measurement accuracy.

FIG. 1 schematically illustrates an exemplary system architecture 100 that may be used to adjust the response duration of a stress testing system according to an embodiment of the present disclosure. It should be noted that Figure 1 is only an example of a system architecture to which embodiments of the present disclosure can be applied, to help those skilled in the art understand the technical content of the present disclosure, but does not mean that the embodiments of the present disclosure cannot be used in other applications. Device, system, environment or scenario.

As shown in Figure 1, the system architecture 100 according to this embodiment may include terminal devices 101, 102, 103, a network 104 and a server 105. The network 104 is a medium used to provide communication links between the terminal devices 101, 102, 103 and the server 105. Network 104 may include various connection types, such as wired and/or wireless communication links, and the like.

Users can use terminal devices 101, 102, 103 to interact with the server 105 through the network 104 to receive or send messages, etc. Various communication client applications can be installed on the terminal devices 101, 102, and 103, such as shopping applications, web browser applications, search applications, instant messaging tools, email clients, and/or social platform software (examples only) ).

The terminal devices 101, 102, and 103 may be various electronic devices having a display screen and supporting web browsing, including but not limited to smart phones, tablet computers, laptop computers, desktop computers, and the like.

The server 105 may be a server that provides various services, such as a backend management server that provides support for websites browsed by users using the terminal devices 101, 102, and 103 (example only). The background management server can analyze and process the received user request and other data, and feed back the processing results (such as web pages, information, or data obtained or generated according to the user request) to the terminal device.

It should be noted that the method for adjusting the response time of the pressure measurement system provided by the embodiment of the present disclosure can generally be executed by the server 105 . Accordingly, the device for adjusting the response time of the stress measurement system provided by the embodiments of the present disclosure may generally be provided in the server 105 . The method of adjusting the response time of the stress measurement system provided by the embodiments of the present disclosure can also be executed by a server or server cluster that is different from the server 105 and can communicate with the terminal devices 101, 102, 103 and/or the server 105. Correspondingly, the device for adjusting the response time of the stress measurement system provided by the embodiment of the present disclosure can also be provided in a server or server cluster that is different from the server 105 and can communicate with the terminal devices 101, 102, 103 and/or the server 105.

It should be understood that the number of terminal devices, networks and servers in Figure 1 is only illustrative. Depending on implementation needs, there can be any number of end devices, networks, and servers.

FIG. 2 schematically shows a flow chart of a method for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure.

As shown in Figure 2, the method includes operations S210 to S240.

In operation S210, in response to the nth simulated service request, the response information of the n-1th simulated service request is obtained from the memory, where the response information includes the first response duration and adjustment information, and the adjustment information is included in the stress testing system In the process of responding to the n-1th simulated service request, the first adjustment time period consumed by the voltage stabilizing component and the first to-be-consumed time period not consumed by the voltage stabilizing component are used, where n is a positive integer greater than 2.

According to an embodiment of the present disclosure, the initial value of the first adjustment duration recorded in the voltage stabilizing component and the first unconsumed to-be-consumed duration may be 0. The first response duration AT _n-1 can be the time from the start of the request for the n-1th simulated service request. The total time to the end of the request, which can include the actual time T _n-1 for the stress measurement system to respond to the n-1th simulated service request and the time LT _n-1 adjusted by the voltage stabilizing component. The first time period to be consumed RT _n-1 may be the time remaining in the voltage stabilizing component after the voltage stabilizing component adjusts the response time of the n-1th simulated service request.

In operation S220, a second to-be-consumed time length is determined based on the first response time, the preset response time and the first to-be-consumed time. The preset response time represents the expected response time of the stress testing system for the simulated service request. The preset response time is greater than The average response time of n-1 simulated service requests.

According to an embodiment of the present disclosure, the preset response time TT may be the expected response time of the stress testing system for the simulated service request. The preset response time TT is the stable value of the response time of the pressure measurement system expected to be adjusted by the voltage stabilizing component. This value can be determined based on empirical values or the average response time during the actual pressure measurement process. For example: if the average response time of a simulated service request is 180ms, you can set the preset response time to 200ms.

According to an embodiment of the present disclosure, the second time period to be consumed RT n is determined based on the first response time period AT _n-1 , the preset response time period TT and the first time period to be consumed RT _n-1 _. The second time period to be consumed represents the total time period to be consumed that can be consumed in the voltage stabilizing component for the nth simulated service request. Therefore, the second time to be consumed RT _n can be calculated using equation (1):
RT _n ＝AT _n-1 -TT+RT _n-1 (1)

In operation S230, the second adjustment duration is determined according to the second to-be-consumed duration and the first adjustment duration.

According to an embodiment of the present disclosure, the initial value of the first adjustment duration may be the preset response duration TT. According to the second time period to be consumed RT _n and the first adjustment time period LT _n-1 , when the pressure measurement system responds to the nth simulation service request, the remaining second time period to be consumed RT _n that can be used for consumption in the voltage stabilizing component can be determined. Whether it is possible to continue to adjust according to the first adjustment duration LT _n-1 of the n-1th simulated service request. When the first adjustment period LT _n-1 is less than the second to-be-consumed period RT _n , since the adjustment time of the voltage stabilizing component cannot be less than 0, in this case, the nth simulation service request does not require voltage stabilizing component adjustment. The response time, that is, the second adjustment time is 0, and the remaining time to be consumed (RT _n - LT _n-1 ) can be used to adjust the response time of the n+1th simulated service request. When the first adjustment time LT _n-1 is greater than the second to-be-consumed time RT _n , it means that the nth simulation service request requires the voltage stabilizing component to adjust the response time, that is, the second adjustment time is LT _n-1 -RT _n .

In operation S240, the voltage stabilizing component is used to adjust the response duration of the nth simulated service request according to the second adjustment duration.

According to an embodiment of the present disclosure, the voltage stabilizing component may be provided in the stress testing tool, and in the process of the stress testing system responding to the nth simulated service request, the response duration of the nth simulated service request is adjusted according to the second adjustment duration. For example: you can add a second adjustment time based on the response time XT _n of the stress testing system in response to the nth simulated service request. LTn _-1 - _RTn .

The method shown in Figure 2 will be further described below with reference to Figures 3 to 4 and in combination with specific embodiments.

FIG. 3 schematically shows a flowchart of a method for determining the second to-be-consumed time period according to an embodiment of the present disclosure.

As shown in Figure 3, this embodiment includes S310~S320.

In operation S310, the response deviation duration of the n-1th simulated service request is determined based on the first response duration and the preset response duration.

According to the embodiment of the present disclosure, the response deviation duration of the n-1th simulated service request can be calculated according to Equation (2):
ST _n-1 = AT _n-1 - TT (2)

Among them, ST _n-1 represents the response deviation time of the n-1th simulated service request; AT _n-1 represents the first response time of the n-1 simulated service request; TT represents the preset response time.

According to the embodiment of the present disclosure, for example: the first response time of the n-1th simulated service request can be 230ms, and the preset response time can be 200ms, then the n-1th simulated service can be obtained by calculating according to Equation (2) The requested response deviation is 30ms.

In operation S320, a second time period to be consumed is determined based on the response deviation time period and the first time period to be consumed.

According to an embodiment of the present disclosure, the second to-be-consumed duration of the n-th simulated service request can be calculated according to Equation (3):
RT _n =ST _n-1 +RT _n-1 (3)

Among them, RT _n represents the second waiting time of the n-th simulated service request; ST _n-1 represents the response deviation time of the n-1 simulated service request; RT _n-1 represents the response deviation time of the n-1 simulated service request. The first time to be consumed.

According to the embodiment of the present disclosure, for example: the first time period to be consumed for the n-1th simulated service request may be 10 ms, and then the second time period to be consumed for the n-th simulated service request can be calculated according to Equation (3) to be 40 ms. .

According to an embodiment of the present disclosure, through the response deviation duration of the n-1th simulated service request and the n-1th mode In the simulated service request, the first time to be consumed that is not consumed by the voltage stabilizing component is used to determine the time to be consumed that can be used for the nth simulated service request. This is because the pressure test response time information of the n-1th simulated service request is used. Real-time control of the waiting time consumed by the nth simulated service request can achieve control that does not rely on human subjective factors, so that the stress measurement response time continues to become stable, thereby improving the stress measurement accuracy.

According to an embodiment of the present disclosure, when the second to-be-consumed time period RT _n is less than the first adjustment time period LT _n-1 , the second adjustment time period LT _n can be determined according to Equation (4).
LT _n =LT _n-1 -RT _n (4)

According to an embodiment of the present disclosure, for example, if the second time period to be consumed is 40 ms and the first adjustment time period is 60 ms, it may be determined that the second adjustment time period is 10 ms.

According to embodiments of the present disclosure, when the second time period to be consumed is greater than the first adjustment time period, since the second adjustment time period obtained according to equation (4) is less than 0, the remaining time period can be applied to the n+1th simulation service To adjust the response time of the request, the adjustment time of the nth simulated service request is 0. For example: the second time to be consumed is 40ms, and the first adjustment time is 30ms. It can be determined that the second adjustment time is 0, that is, for the nth simulated service request, there is no need to use a voltage stabilizing component to increase the response time of the stress measurement system.

According to an embodiment of the present disclosure, the second adjustment duration is determined based on the second to-be-consumed duration and the first adjustment duration. This is because the pressure test response duration information of the n-1th simulated service request is used to determine in real time whether voltage stabilizing component adjustment is required. The response time of the pressure measurement system can be adjusted without relying on human subjective factors, so that the response time of the pressure measurement system becomes more stable, thereby improving pressure measurement.

According to an embodiment of the present disclosure, the third to-be-consumed time period may be determined based on the second to-be-consumed time period RT _n and the first adjustment time period LT _n-1 . For example: when the second to-be-consumed time period RT _n is less than the first adjustment time period LT _n-1 , at this time, the second adjustment time period LT _n is LT _n-1 -RT _n , which means that in the nth simulated service request, stable use of After the pressure component adjusts the response time of the pressure measurement system, the remaining time to be consumed in the voltage stabilizing component has been consumed, and the third time to be consumed can be determined. The length is 0.

According to embodiments of the present disclosure, by updating the time to be consumed recorded in the voltage stabilizing component in real time, and automatically adjusting the unconsumed time to be consumed in the voltage stabilizing component for the n+1th simulated service request, it is possible to achieve this without changing the overall In the case of simulating the response time of service requests, the response time of the stress measurement system for each simulated service request is automatically adjusted in real time to make it continuously approach stability, thereby improving the stress measurement accuracy.

According to the embodiment of the present disclosure, for example: the second time period to be consumed is 30ms, and the first adjustment time period is 40ms. According to Equation (4), it can be determined that the second adjustment time period is 10ms, which means that at this time, the remaining time period in the voltage stabilizing component is 0, and it can be determined that the third time period to be consumed is zero.

According to an embodiment of the present disclosure, when the second time period to be consumed RT _n is greater than the first adjustment time period LT _n-1 , the third time period to be consumed RT _n* can be calculated according to Equation (5).
RT _n* =RT _n -LT _n-1 (five)

Among them, RT _n* represents the third time period to be consumed; RT _n represents the second time period to be consumed; LT _n-1 represents the first adjustment time period.

According to an embodiment of the present disclosure, the above-mentioned method for adjusting the response duration of the stress testing system further includes: overwriting and writing the third to-be-consumed duration and the second adjustment duration into the memory for executing the n+1th simulated service request. Response time adjustment operation.

According to the embodiment of the present disclosure, in order to use the voltage stabilizing component to adjust the response time of the pressure measurement system without affecting the actual response time of the pressure measurement system itself, the map storage in Java is used in the embodiment of the present disclosure to store each The adjustment time of a simulated service request and the unconsumed time in the voltage stabilizing component can also be called the remaining time.

According to the embodiment of the present disclosure, due to the characteristics of map storage in Java, it is necessary to overwrite and write the time to be consumed and the adjustment time after each update into the map storage, and then obtain the corresponding time from the memory when performing the adjustment operation. The time to be consumed and the time to adjust.

According to an embodiment of the present disclosure, for example: in response to the nth simulated service request, the first to-be-consumed duration RT _n-1 is obtained from the map storage, and then RT _n calculated according to equation (1) in the embodiment of the present disclosure is first overwritten Write the duration to be consumed into the map storage, and then obtain RT _n from the map storage, which is used to determine the second adjustment duration LT _n . Then the second adjustment duration LT _n overwrites the map storage of the adjustment duration, and updates the adjustment duration in the map storage of the adjustment duration to the adjustment duration of the nth simulated service request, so as to facilitate the n+1th simulated service request. According to the method of the embodiment of the present disclosure, it is obtained from the map storage of the adjusted duration.

According to an embodiment of the present disclosure, the third to-be-consumed duration and the second adjustment duration are overwritten and written into the memory, so that the n-th simulated service request uses the n-1th simulated service request adjustment information to determine the n-th simulated service request. The adjustment of the response time of the pressure measurement system achieves the purpose of automatic regulation and accurate pressure measurement.

According to an embodiment of the present disclosure, for example, in response to the nth simulation service request, the request start time information ST1 is recorded. The request start time information may be the specific time when the request started recorded by the stress testing system.

According to an embodiment of the present disclosure, for example: the end time of the pressure measurement system's response to the nth simulation service request is ST2. According to the method for adjusting the response time of the pressure measurement system provided by the embodiment of the present disclosure, it is determined that the second adjustment time is LT _n , the duration LT _n can be extended based on the end time ST2.

According to an embodiment of the present disclosure, for example, LT _n may be 10 ms, and the request end time information ST3 may be determined to be time information obtained by extending the end time ST2 by 10 ms.

According to an embodiment of the present disclosure, the adjusted response time of the nth simulated service request may be the difference between the request end time ST3 and the request start time ST1 adjusted by using the voltage stabilizing component.

According to an embodiment of the present disclosure, by recording the request start time and the request end time, the response time of the stress testing system for the nth simulated service request after adjustment using the voltage stabilizing component is determined, so as to calculate the pressure of the nth simulated service request. Measure the deviation between the system response time and the preset response time, and determine the time that needs to be adjusted for the n+1th simulated service request. This cycle makes the response time continue to converge to the preset response time, that is, it tends to a stable value. This enables accurate flow pressure measurement.

Figure 4 schematically shows a logic block diagram of a method for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure.

As shown in Figure 4, this embodiment includes operations S401 to S408

In operation S401, in response to the nth simulated service request, the response information of the n-1th simulated service request is obtained from the memory, where the response information includes the first response duration and adjustment information, and the adjustment information is included in the stress testing system In the process of responding to the n-1th simulated service request, the first adjustment time period consumed by the voltage stabilizing component and the first to-be-consumed time period not consumed by the voltage stabilizing component are used, where n is a positive integer greater than 2;

In operation S402, a second time period to be consumed is determined based on the first response time, the preset response time and the first time to be consumed. The preset response time represents the expected response time of the stress testing system for the simulated service request, and the preset response time is greater than The average response time of n-1 simulated service requests;

In operation S403, it is determined whether the second to-be-consumed duration is less than the first adjustment duration. If so, S404 is executed. If not, S406 is executed.

In operation S404, the difference between the first adjustment duration and the second to-be-consumed duration is determined as the second adjustment duration, and the third to-be-consumed duration is determined to be zero.

In operation S405, the second adjustment duration and the third to-be-consumed duration determined in operation S404 are overwritten and written into the adjustment duration memory and the to-be-consumed duration memory respectively.

In operation S406, the second adjustment duration is determined to be zero, and the difference between the second to-be-consumed duration and the first adjustment duration is determined to be the third to-be-consumed duration.

In operation S407, the second adjustment duration and the third to-be-consumed duration determined in operation S406 are overwritten and written into the adjustment duration memory and the to-be-consumed duration memory respectively.

In operation S408, the voltage stabilizing component is used to adjust the response duration of the nth simulated service request according to the second adjustment duration.

Based on the above method of adjusting the response time of the pressure measurement system, the present disclosure also provides a device for adjusting the response time of the pressure measurement system. The device will be described in detail below with reference to FIG. 5 .

FIG. 5 schematically shows a structural block diagram of a device for adjusting the response duration of a pressure measurement system according to an embodiment of the present disclosure.

As shown in FIG. 5 , the device 500 for adjusting the response duration of the pressure measurement system in this embodiment includes an acquisition module 510 , a first determination module 520 , a second determination module 530 , and an adjustment module 540 .

The acquisition module 510 is used to acquire the response information of the n-1th simulation service request from the memory in response to the nth simulation service request, where the response information includes the first response duration and adjustment information, and the adjustment information The information includes the consumption of the voltage stabilizing component during the process of the pressure measurement system responding to the n-1 simulated service request. An adjustment period and the first period of time to be consumed when the voltage stabilizing component is not consumed, where n is a positive integer greater than 2. In an embodiment, the acquisition module 510 may be used to perform the operation S210 described above, which will not be described again here.

The first determination module 520 is configured to determine the second time period to be consumed based on the first response time length, the preset response time length and the first time period to be consumed. The preset response time length represents the expected response time length of each simulated service request. The preset response time length The average response time is greater than n simulated service requests. In an embodiment, the first determination module 520 may be configured to perform the operation S220 described above, which will not be described again here.

The second determination module 530 is configured to determine the second adjustment duration according to the second to-be-consumed duration and the first adjustment duration. In an embodiment, the second determination module 530 may be configured to perform the operation S230 described above, which will not be described again here.

The adjustment module 540 is configured to use a voltage stabilizing component to adjust the response duration of the nth simulated service request according to the second adjustment duration. In an embodiment, the adjustment module 540 may be configured to perform the operation S240 described above, which will not be described again here.

According to an embodiment of the present disclosure, the adjustment module includes a recording unit, a consumption unit, a seventh determination unit and an eighth determination unit. fixed unit. The recording unit is used to record the request start time information in response to the nth simulated service request. The consumption unit is configured to use the voltage stabilizing component to consume the second adjustment duration when the response to the nth simulated service request ends. The seventh determination unit is used to determine the request end time information based on the pressure test start time and the second adjustment duration. The eighth determination unit is used to determine the adjusted response time of the nth simulated service request based on the stress test start time information and the stress test end time information.

Any multiple of the modules, units, or at least part of the functions of any multiple of the modules according to the embodiments of the present disclosure may be implemented in one module. Any one or more of the modules and units according to the embodiments of the present disclosure can be split into multiple modules for implementation. Any one or more of the modules and units according to the embodiments of the present disclosure may be at least partially implemented as hardware circuits, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, or a circuit on a substrate. System, system-on-package, application-specific integrated circuit (ASIC), or may be implemented in hardware or firmware in any other reasonable manner that integrates or packages circuits, or in any of the three implementations: software, hardware, or firmware or an appropriate combination of any of them. Alternatively, one or more of the modules and units according to the embodiments of the present disclosure may be at least partially implemented as a computer program module, and when the computer program module is executed, corresponding functions may be performed.

For example, any multiple of the acquisition module 510, the first determination module 520, the second determination module 530, and the adjustment module 540 can be combined and implemented in one module/unit/subunit, or any one module/unit/subunit among them. Can be split into multiple modules/units/sub-units. Alternatively, at least part of the functionality of one or more of these modules/units/subunits may be combined with at least part of the functionality of other modules/units/subunits and combined in one module/unit/subunit realized in. According to an embodiment of the present disclosure, at least one of the acquisition module 510, the first determination module 520, the second determination module 530, and the adjustment module 540 may be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), Implemented by hardware or firmware such as a programmable logic array (PLA), system on a chip, system on a substrate, system on a package, application specific integrated circuit (ASIC), or any other reasonable means of integrating or packaging circuits, Or it can be implemented in any one of the three implementation methods of software, hardware and firmware, or in an appropriate combination of any of them. Alternatively, at least one of the acquisition module 510, the first determination module 520, the second determination module 530, and the adjustment module 540 can be at least partially implemented as a computer program module. When the computer program module is run, corresponding functions can be performed. .

Figure 6 schematically shows a block diagram of an electronic device suitable for implementing the above-described method according to an embodiment of the present disclosure. The electronic device shown in FIG. 6 is only an example and should not impose any limitations on the functions and scope of use of the embodiments of the present disclosure.

As shown in Figure 6, an electronic device 600 according to an embodiment of the present disclosure includes a processor 601, which can store The program in the read-only memory (ROM) 602 or the program loaded from the storage section 608 into the random access memory (RAM) 603 executes various appropriate actions and processes. Processor 601 may include, for example, a general-purpose microprocessor (eg, a CPU), an instruction set processor and/or associated chipset, and/or a special-purpose microprocessor (eg, an application specific integrated circuit (ASIC)), among others. Processor 601 may also include onboard memory for caching purposes. The processor 601 may include a single processing unit or multiple processing units for performing different actions of the method flow according to the embodiment of the present disclosure.

In the RAM 603, various programs and data required for the operation of the electronic device 600 are stored. The processor 601, ROM 602 and RAM 603 are connected to each other through a bus 604. The processor 601 performs various operations according to the method flow of the embodiment of the present disclosure by executing programs in the ROM 602 and/or RAM 603. It should be noted that the program may also be stored in one or more memories other than ROM 602 and RAM 603. The processor 601 may also perform various operations according to the method flow of embodiments of the present disclosure by executing programs stored in the one or more memories.

According to embodiments of the present disclosure, the electronic device 600 may further include an input/output (I/O) interface 605 that is also connected to the bus 604 . System 600 may also include one or more of the following components connected to I/O interface 605: an input portion 606 including a keyboard, mouse, etc.; including a cathode ray tube (CRT), liquid crystal display (LCD), etc.; and a speaker. an output section 607, etc.; a storage section 608 including a hard disk, etc.; and a communication section 609 including a network interface card such as a LAN card, a modem, etc. The communication section 609 performs communication processing via a network such as the Internet. Driver 610 is also connected to I/O interface 605 as needed. Removable media 611, such as magnetic disks, optical disks, magneto-optical disks, semiconductor memories, etc., are installed on the drive 610 as needed, so that a computer program read therefrom is installed into the storage portion 608 as needed.

According to embodiments of the present disclosure, the method flow according to the embodiments of the present disclosure may be implemented as a computer software program. For example, embodiments of the present disclosure include a computer program product including a computer program carried on a computer-readable storage medium, the computer program containing program code for performing the method illustrated in the flowchart. In such embodiments, the computer program may be downloaded and installed from the network via communication portion 609, and/or installed from removable media 611. When the computer program is executed by the processor 601, the above-described functions defined in the system of the embodiment of the present disclosure are performed. According to embodiments of the present disclosure, the systems, devices, devices, modules, units, etc. described above may be implemented by computer program modules.

The present disclosure also provides a computer-readable storage medium. The computer-readable storage medium may be included in the device/device/system described in the above embodiments; it may also exist independently without being assembled into the device/system. in the device/system. The above computer-readable storage medium carries one or more programs. When the above one or more programs When executed, methods according to embodiments of the present disclosure are implemented.

According to embodiments of the present disclosure, the computer-readable storage medium may be a non-volatile computer-readable storage medium. Examples may include but are not limited to: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), portable compact disk read-only memory (CD-ROM), ROM), optical storage device, magnetic storage device, or any suitable combination of the above. In this disclosure, a computer-readable storage medium may be any tangible medium that contains or stores a program for use by or in connection with an instruction execution system, apparatus, or device.

For example, according to embodiments of the present disclosure, the computer-readable storage medium may include one or more memories other than ROM 602 and/or RAM 603 and/or ROM 602 and RAM 603 described above.

The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operations of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code that contains one or more logic functions that implement the specified executable instructions. It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown one after another may actually execute substantially in parallel, or they may sometimes execute in the reverse order, depending on the functionality involved. It will also be noted that each block in the block diagram or flowchart illustration, and combinations of blocks in the block diagram or flowchart illustration, can be implemented by special purpose hardware-based systems that perform the specified functions or operations, or may be implemented by special purpose hardware-based systems that perform the specified functions or operations. Achieved by a combination of specialized hardware and computer instructions.

Those skilled in the art will understand that features recited in various embodiments and/or claims of the present disclosure may be combined and/or combined in various ways, even if such combinations or combinations are not explicitly recited in the present disclosure. In particular, various combinations and/or combinations of features recited in the various embodiments and/or claims of the disclosure may be made without departing from the spirit and teachings of the disclosure. All such combinations and/or combinations fall within the scope of this disclosure.

The embodiments of the present disclosure have been described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although each embodiment is described separately above, this does not mean that the measures in the various embodiments cannot be used in combination to advantage. The scope of the disclosure is defined by the appended claims and their equivalents. Without departing from the scope of the present disclosure, those skilled in the art can make various substitutions and modifications, and these substitutions and modifications should all fall within the scope of the present disclosure.

Claims

A method for adjusting the response time of the pressure measurement system, including:

In response to the nth simulated service request, obtain the response information of the n-1th simulated service request from the memory, where the response information includes the first response duration and adjustment information, and the adjustment information is included in the stress testing system In the process of responding to the n-1th simulation service request, the first adjustment time period consumed by the voltage stabilizing component and the first to-be-consumed time period not consumed by the voltage stabilizing component are utilized, where n is a positive integer greater than 2;

Determine a second response time to be consumed based on the first response time, the preset response time and the first time to be consumed. The preset response time represents the expected response time of the stress testing system for the simulated service request. , the preset response time is greater than the average response time of n-1 simulated service requests;

Determine a second adjustment duration according to the second to-be-consumed duration and the first adjustment duration;

The voltage stabilizing component is used to adjust the response duration of the nth simulated service request according to the second adjustment duration.
The method according to claim 1, wherein determining the second to-be-consumed duration based on the first response duration, the preset response duration and the first to-be-consumed duration includes:

Determine the response deviation duration of the n-1th simulated service request based on the first response duration and the preset response duration;

The second time period to be consumed is determined based on the response deviation time period and the first time period to be consumed.
The method according to claim 1, wherein determining the second adjustment duration according to the second to-be-consumed duration and the first adjustment duration includes:

When the second time period to be consumed is less than the first adjustment time period, the difference between the first adjustment time period and the second time period to be consumed is determined as the second adjustment time length;

When the second to-be-consumed duration is greater than the first adjustment duration, the second adjustment duration is determined to be zero.
The method of claim 3, further comprising:

According to the second time period to be consumed and the first adjustment time period, a third time period to be consumed is determined. The third time period to be consumed represents the amount of time in the voltage stabilizing component after the second adjustment time period is consumed by the voltage stabilizing component. The remaining duration of the recording.
The method according to claim 4, wherein determining the third to-be-consumed time period based on the second to-be-consumed time period and the first adjustment time period includes:

When the second time period to be consumed is less than the first adjustment time period, it is determined that the third time period to be consumed is zero;

When the second time period to be consumed is greater than the first adjustment time period, the difference between the second time period to be consumed and the first adjustment time period is determined as the third time period to be consumed.
The method of claim 5, further comprising:

The third to-be-consumed duration and the second adjustment duration are overwritten and written into the memory for performing an adjustment operation of the response time of the (n+1)th simulated service request.
The method according to claim 1, wherein using the voltage stabilizing component to adjust the response duration of the nth simulated service request according to the second adjustment duration includes:

In response to the nth simulated service request, record the request start time information;

When the response to the nth simulated service request ends, use the voltage stabilizing component to consume the second adjustment duration;

Determine the request end time information based on the stress test start time and the second adjustment duration;

According to the stress test start time information and the stress test end time information, the adjusted response time of the nth simulated service request is determined.
A device for adjusting the response time of the pressure measurement system, including:

An acquisition module, configured to obtain the response information of the n-1th simulation service request from the memory in response to the nth simulation service request, wherein the response information includes the first response duration and adjustment information, and the adjustment information This includes utilizing the first adjustment time period consumed by the voltage stabilizing component and the first to-be-consumed time period that is not consumed by the voltage stabilizing component during the process of the pressure measurement system responding to the n-1th simulation service request, where n is greater than A positive integer of 2;

A first determination module configured to determine a second duration to be consumed based on the first response duration, the preset response duration and the first duration to be consumed, where the preset response duration represents the expected response of each simulated service request Duration, the preset response duration is greater than the average response duration of n simulated service requests;

a second determination module, configured to determine a second adjustment duration based on the second to-be-consumed duration and the first adjustment duration;

An adjustment module, configured to use the voltage stabilizing component to adjust the response duration of the nth simulated service request according to the second adjustment duration.
An electronic device including:

one or more processors;

a storage device for storing one or more programs,

Wherein, when the one or more programs are executed by the one or more processors, the one or more processors are caused to execute the method according to any one of claims 1 to 7.
A computer-readable storage medium on which executable instructions are stored, which when executed by a processor causes the processor to execute the method according to any one of claims 1 to 7.
A computer program product includes a computer program that implements the method according to any one of claims 1 to 7 when executed by a processor.