WO2024033945A1 - Système d'imagerie térahertz pour optimiser la position d'un échantillon et procédés associés - Google Patents
Système d'imagerie térahertz pour optimiser la position d'un échantillon et procédés associés Download PDFInfo
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- WO2024033945A1 WO2024033945A1 PCT/IN2023/050767 IN2023050767W WO2024033945A1 WO 2024033945 A1 WO2024033945 A1 WO 2024033945A1 IN 2023050767 W IN2023050767 W IN 2023050767W WO 2024033945 A1 WO2024033945 A1 WO 2024033945A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- terahertz
- laser
- image
- thz
- Prior art date
Links
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Toxicology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
L'invention concerne des systèmes et des procédés permettant d'optimiser la position d'un échantillon dans un système d'imagerie térahertz. Le système (200) comprend un appareil d'imagerie térahertz (100), un mécanisme de déplacement (140) et un dispositif de commande (160). L'appareil (100) comprend une source laser (102), un émetteur (104) comprenant une antenne THz, des éléments optiques (106A, 106B) et une caméra RVB (105). La source laser peut être un laser à impulsions femtoseconde ou un laser à onde continue accordable. L'invention concerne également un procédé (300) d'optimisation de la position de l'échantillon. L'optimisation d'une position d'un échantillon comprend l'identification (403) du foyer de l'image THz. Le procédé comprend la superposition (409) de l'image térahertz avec l'image visible et la détection de la région d'intérêt sur la base de la variation d'intensité à travers l'image térahertz. L'invention est efficace pour optimiser rapidement une position d'échantillon et identifier des zones cancéreuses dans des échantillons de tissu, ou des défauts dans d'autres types de matières.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IN202241033201 | 2022-08-10 | ||
| IN202241033201 | 2022-08-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2024033945A1 true WO2024033945A1 (fr) | 2024-02-15 |
Family
ID=89851135
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/IN2023/050767 WO2024033945A1 (fr) | 2022-08-10 | 2023-08-10 | Système d'imagerie térahertz pour optimiser la position d'un échantillon et procédés associés |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2024033945A1 (fr) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10021277B2 (en) * | 2012-04-04 | 2018-07-10 | Nec Corporation | Terahertz imaging device, and method of eliminating interference patterns from terahertz image |
| US20220003676A1 (en) * | 2006-12-06 | 2022-01-06 | Mohammad A. Mazed | Optical biomodule for detection of diseases at an early onset |
-
2023
- 2023-08-10 WO PCT/IN2023/050767 patent/WO2024033945A1/fr unknown
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220003676A1 (en) * | 2006-12-06 | 2022-01-06 | Mohammad A. Mazed | Optical biomodule for detection of diseases at an early onset |
| US10021277B2 (en) * | 2012-04-04 | 2018-07-10 | Nec Corporation | Terahertz imaging device, and method of eliminating interference patterns from terahertz image |
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