WO2024023005A1 - Optoelektronisches modul und verfahren zur herstellung eines optoelektronischen moduls - Google Patents
Optoelektronisches modul und verfahren zur herstellung eines optoelektronischen moduls Download PDFInfo
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- WO2024023005A1 WO2024023005A1 PCT/EP2023/070425 EP2023070425W WO2024023005A1 WO 2024023005 A1 WO2024023005 A1 WO 2024023005A1 EP 2023070425 W EP2023070425 W EP 2023070425W WO 2024023005 A1 WO2024023005 A1 WO 2024023005A1
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- optoelectronic module
- connecting element
- carrier
- component
- connection point
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0235—Method for mounting laser chips
- H01S5/02355—Fixing laser chips on mounts
- H01S5/02365—Fixing laser chips on mounts by clamping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/02208—Mountings; Housings characterised by the shape of the housings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0235—Method for mounting laser chips
- H01S5/02355—Fixing laser chips on mounts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02255—Out-coupling of light using beam deflecting elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02257—Out-coupling of light using windows, e.g. specially adapted for back-reflecting light to a detector inside the housing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
Definitions
- An optoelectronic module and a method for producing an optoelectronic module are specified.
- the optoelectronic module comprises a carrier.
- the carrier serves in particular for the mechanical stabilization of other components of the optoelectronic module. Furthermore, it is possible for the other components to be electrically contacted via the carrier.
- the carrier can be, for example, a connection carrier that includes conductor tracks and/or contact points for electrically contacting other components.
- the optoelectronic module comprises a radiation-emitting semiconductor body.
- the optoelectronic module is, in particular, a radiation-emitting module.
- the radiation-emitting semiconductor body preferably emits electromagnetic radiation in the visible spectral range, for example in the red, green, or blue wavelength range and/or in the near infrared or UV spectral range.
- this is the case Semiconductor body around a laser diode.
- the semiconductor body in particular has an exit facet through which the electromagnetic radiation is emitted.
- the radiation-emitting semiconductor body is preferably arranged on the carrier.
- the carrier can advantageously be used for electrical contacting of the radiation-emitting semiconductor body.
- the optoelectronic module comprises an optical element.
- the optical element is arranged in a beam path of the radiation-emitting semiconductor body.
- the optical element is set up to influence the electromagnetic radiation emitted by the radiation-emitting semiconductor body.
- the optical element can be, for example, a diffractive and/or reflective and/or radiation-refracting and/or polarizing and/or birefringent optical element.
- At least one component from the group of semiconductor body and optical element is connected to the carrier via a connection point.
- connection point is designed to mechanically and/or electrically couple the component to the carrier.
- the connection point is in direct contact with the carrier, the semiconductor body and/or the optical element.
- a further component is arranged between the semiconductor body and the carrier and/or the optical element and the carrier, which is in direct contact with the connection point.
- a submount arranged between the semiconductor body and the carrier, for example the submount being connected directly to the carrier via the connection point.
- connection point has metallic nanostructures.
- the nanostructures therefore have a metal or are formed from it.
- the nanostructures have metallic properties.
- the nanostructures have an extent, for example a length, a width and/or a diameter, in the range from 10 nanometers to 10 micrometers inclusive, in particular in the range from 10 nanometers to 1 micrometer inclusive.
- connection point is free of organic components.
- no organic connecting agent for example no organic adhesive, is used to attach the radiation-emitting semiconductor body and/or the optical element to the carrier.
- an optoelectronic module has a carrier, a radiation-emitting semiconductor body on the carrier and an optical element in a beam path of the semiconductor body, with at least one component from the group of semiconductor body and optical element via a connection point that has metallic nanostructures. connected to the carrier.
- the semiconductor body and the optical element are each connected to the carrier via a connection point.
- Such an optoelectronic module can advantageously be used in the field of projection, in the automotive sector, as in a head-up display (HUD) or in a lidar system, and/or in the area of sensor technology.
- HUD head-up display
- lidar lidar system
- the optoelectronic module has a housing.
- the housing hermetically encapsulates the semiconductor body.
- the housing at least partially prevents damage to the semiconductor body caused by external influences, such as oxygen or moisture. This allows the lifespan of the optoelectronic module to be extended.
- the semiconductor body comprises or is a laser diode.
- the laser diode emits an emission spectrum with an emission maximum of at most 550 nanometers or with an emission maximum in the range from 550 nanometers to 620 nanometers inclusive or in the range from 620 nanometers to 680 nanometers inclusive.
- the laser diode emits, for example, blue to blue-green light, green to green-yellow light or red light.
- the optoelectronic module has at least one further semiconductor body. All features and embodiments that have already been described in connection with the semiconductor body also apply in particular to the at least one further semiconductor body.
- the optoelectronic module has a total of three semiconductor bodies.
- the at least one further semiconductor body is or includes, for example, one Laser diode.
- the further semiconductor bodies preferably have an emission maximum in a different spectral range than the semiconductor body.
- the optoelectronic module includes a first semiconductor body with an emission maximum in the blue spectral range, a second semiconductor body with an emission maximum in the green spectral range and a third semiconductor body with an emission maximum in the red spectral range. In this way, an optoelectronic module can be provided that emits white mixed light.
- the optoelectronic module is free of organic components, at least within the housing.
- optoelectronic modules which in particular have a laser diode with an emission maximum of at most 550 nanometers
- organic contaminants are deposited on the exit facet of the semiconductor body due to a high energy density of the emitted radiation and/or a high beam divergence. This can lead to a reduced service life of the optoelectronic module.
- the optical element is selected from the following group: lens, prism, collimation lens, beam combiner, polarization filter, birefringent crystal, photonic integrated circuit .
- the beam combiner is a dichroic beam combiner.
- the photonic integrated circuit is also known in English as a “photonic integrated circuit” (PIC for short).
- the metallic nanostructures include or consist of nanowires.
- the nanowires have a distance of a maximum of 10 micrometers, in particular a maximum of 1 micrometer, for example a maximum of 0.1 micrometer.
- the distance is the length of a shortest connecting line between two adjacent nanowires.
- the nanowires at least partially touch each other.
- the nanowires are present in the connection point in such a way that there is stable contact between two nanowires. This advantageously creates a mechanically stable connection point.
- the nanowires are intertwined.
- the metallic nanostructures include or consist of at least one metal from the following group: Au, Ag, Cu.
- Au, Ag and Cu are characterized by their chemical stability.
- these metals can be easily deformed.
- the Module is between the metallic nanostructures Alloy arranged.
- the alloy has the metal of the nanostructures.
- the alloy provides a material-coherent connection point.
- a further component of the alloy is selected from the following group: Ga, In, Hg, Sn.
- Ga, In, Hg and Sn have a low melting point in their metallic form.
- these elements can advantageously be easily introduced into the connection point.
- Ga, In, Hg and Sn form alloys with the metal of the nanostructures, for example Au, Ag and Cu, with a melting point of in particular over 250 ° C, preferably over 260 ° C.
- An optoelectronic module is thus advantageously provided that has high temperature resistance and/or is SMD solderable.
- SMD stands for surface mounted device.
- the alloy has a material selected from the following group: AuGa, Auln, AuHg, AgGa, Agln, AgHg, CuSn.
- a method for producing an optoelectronic module is also specified.
- the optoelectronic module described here is produced using the method. Therefore, all features and embodiments described in connection with the optoelectronic module also apply to the method and vice versa.
- a carrier with a first connecting element is provided.
- the connecting element has metallic nanostructures.
- the metallic nanostructures include or consist of nanowires.
- the first connecting element covers the carrier, for example, partially or completely.
- a component is provided.
- the component includes a second connecting element with metallic nanostructures.
- the metallic nanostructures include or consist of nanowires.
- the metallic nanostructures of the first connecting element and the metallic nanostructures of the second connecting element are, for example, designed to be the same or different.
- the second connecting element at least partially covers a surface of the component that is connected to the carrier.
- the component is actively adjusted on the carrier.
- a positioning and/or an alignment of the component on the carrier is carried out using an optical output parameter.
- an intensity, a spectral power distribution, a beam divergence and/or a degree of polarization of an electromagnetic radiation emitted by the optoelectronic module during operation is used as the optical output parameter.
- positioning refers, for example, to a displacement of the component in the lateral and/or horizontal direction based on a Main extension plane of the carrier understood.
- the alignment of the component includes, in particular, a rotation of the component about one of its main axes. In particular, the component is aligned around six axes during active adjustment.
- the active adjustment enables the component to be precisely applied to the carrier. This makes it possible to compensate for component-specific fluctuations and thus prevent the production of defective optoelectronic modules.
- the carrier and the component are connected.
- a connection point is created.
- the connection point includes in particular the first connecting element and the second connecting element.
- the carrier and the component are connected while the component is being actively adjusted on the carrier.
- the carrier and the component are only connected after active adjustment.
- the metallic nanostructures comprise nanowires, the nanowires of the first connecting element and the second connecting element become entangled, particularly during connection.
- the method for producing an optoelectronic module comprises the following steps:
- connection point comprising the first connecting element and the second connecting element is in particular free of organic components, which can initially lead to reduced performance and ultimately to the inoperability of the optoelectronic module.
- the service life of the optoelectronic module can therefore advantageously be extended by the connection point, which has no organic components.
- organic adhesives are used to connect the component and the carrier.
- the component is advantageously brought into the desired position only once by active adjustment and connected to the carrier. This allows the number of optoelectronic modules that can be produced in one hour using the process to be increased compared to the other processes.
- the component is selected from the following group: semiconductor body, optical element, submount, interposer.
- a submount is a component that is used to electrical contacting and / or mechanical stabilization of a semiconductor body is used.
- An interposer is, for example, a mechanical component that can be used to adjust the height of the optical element.
- connection point is stable at a temperature of at least 250° C.
- stable is understood to mean that the connection point shows no or only slight mechanical deformation and/or chemical change in the composition of the connection point at the temperature.
- the connection point has a high temperature resistance. This makes it possible to provide an optoelectronic module that is advantageously SMD solderable.
- a compacting agent is introduced into the connection point when connecting the carrier and the component.
- the densifying agent forms an alloy with a material of the first connecting element and the second connecting element.
- the densifying agent preferably forms an alloy with a material of the metallic nanostructures.
- the material of the first connecting element and the second connecting element is partially dissolved in the densifying agent and the alloy is thus formed.
- the alloy preferably has a higher melting point than the densifying agent. This can lead to isothermal solidification of the alloy.
- the melting point of the alloy also allows the alloy to harden at low temperatures, for example at Temperatures below 100°C. Because the material of the first connecting element and the second connecting element is only partially dissolved in the sealing agent, the connection point with the metallic nanostructures can be distinguished from a soldering point. For example, a difference between the connection point and a soldering point can be seen with the help of a scanning electron microscope.
- the densifying agent and thus also the alloy fills cavities that are present in particular between the metallic nanostructures of the first connecting element and the metallic nanostructures of the second connecting element. This advantageously forms a materially coherent connection between the component and the carrier.
- a solder is used in particular to firmly connect the carrier and the component.
- the use of the solder can lead to high thermal and/or mechanical stress on the carrier and/or the component.
- the high thermal and/or mechanical stress is caused, for example, by high temperatures that are necessary during soldering or by tensions and distortion that arise during soldering.
- a solder material used such as a solder paste, contains an organic component that must be removed to protect the optoelectronic module from contamination.
- connection point created in this way is in particular free of organic components and has low frozen stresses and a low bi-metal effect.
- the bi-metal effect can be observed, for example, with two layers of metal lying one above the other, which are materially connected to one another and have different coefficients of thermal expansion. Due to the different coefficients of thermal expansion, one of the layers expands more than the other when heated, causing the two layers on top of each other to bend.
- the nanowires in the first connecting element and the nanowires in the second connecting element are brought together during the active adjustment in such a way that the nanowires of the first connecting element and the nanowires of the second connecting element have a distance of a maximum of 10 micrometers, in particular of have a maximum of 1 micrometer, for example a maximum of 0.1 micrometer.
- a play-free active adjustment is carried out.
- a mechanically stable connection point is then obtained, for example.
- the sealing agent is melted before being introduced into the connection point.
- the sealing agent is introduced into the connection point in liquid form. In this way, in particular, an almost complete or complete filling of the cavities between the metallic nanostructures of the first Connecting element and the metallic nanostructures of the second connecting element with the sealant and the alloy.
- the densifying agent is selected from the following group: Ga, In, Hg, Sn and alloys thereof.
- Ga, In, Hg, Sn and alloys thereof have a low melting point. This advantageously facilitates introduction into the connection point. In addition, thermal stress on the optoelectronic module and its components can be reduced.
- the first connecting element has a greater extent than the second connecting element, in particular in a top view.
- the first connecting element has a larger area in plan view than the second connecting element. This advantageously results in the formation of a connection point with the greatest possible extent, for example with the extent of the second connecting element.
- the first connecting element and/or the second connecting element has a rectangular, in particular square, shape, particularly in plan view.
- first connecting element and/or the second connecting element it is also possible for the first connecting element and/or the second connecting element to have a different shape in plan view, such as that of an oval, in particular an ellipse or a circle, or that of a polygon, such as a hexagon.
- refinements and further developments of the optoelectronic module and the method for producing an optoelectronic module result from the following exemplary embodiments shown in conjunction with the figures.
- Figure 1A shows a schematic sectional view of an optoelectronic module according to an exemplary embodiment.
- Figure 1B shows a schematic top view of an optoelectronic module according to an exemplary embodiment.
- Figures 2A and 2B show schematic sectional views of steps of a method for producing an optoelectronic module according to an exemplary embodiment.
- Figures 3A to 3C show schematic sectional views of steps of a method for producing an optoelectronic module according to a further exemplary embodiment.
- Figures 4A and 4B show a schematic sectional view and a top view of a step of a method for producing an optoelectronic module according to an exemplary embodiment.
- FIG. 1A An exemplary embodiment of an optoelectronic module 1 is shown in FIG. 1A.
- the optoelectronic module 1 comprises a carrier 2 on which a semiconductor body 3 and an optical element 4 are arranged.
- the semiconductor body 3 and the optical element 4 are hermetically encapsulated by a housing 6.
- the semiconductor body 3 comprises or is, in the present case, a laser diode with an emission maximum of at most 550 nanometers. Electromagnetic radiation emitted by the semiconductor body 3 is emitted through an exit facet 31 .
- the semiconductor body 3 is applied to a submount 7, which is connected directly to the carrier 2 via a connection point 5. In other words, the semiconductor body 3 is connected to the carrier 2 via the connection point 5. It is also possible for a further connection point 5 to be arranged between the semiconductor body 3 and the submount 7. Alternatively, the semiconductor body 3 is connected directly to the carrier 2 via the connection point 5. In this case, no submount 7 is arranged between semiconductor body 3 and carrier 2.
- the connection point 5 has metallic nanostructures.
- the metallic nanostructures are nanowires. In the present case, the nanowires are at a maximum distance of 1 micrometer or the nanowires are at least partially touching each other. In particular, the nanowires are intertwined. A main extension direction of the nanowires is transverse, in particular perpendicular to a main extension plane of the connection point 5.
- the metallic nanostructures include Au, Ag and/or Cu or consist of them.
- An alloy is arranged between the metallic nanostructures.
- the alloy has the Au, Ag and/or Cu of the metallic nanostructures and another component.
- the other component of the alloy is selected from the following group: Ga, In, Hg, Sn.
- the alloy can therefore include, for example, AuGa, Auln, AuHg, AgGa, Agln, AgHg or CuSn.
- the optical element 4 is arranged in a beam path of the semiconductor body 3 of the optoelectronic module 1 of FIG. 1A. In other words, the optical element 4 is arranged on a side of the semiconductor body 3 on which the exit facet 31 is present.
- the optical element 4 is, for example, a prism, a collimation lens or a beam splitter.
- An interposer 8 is arranged between the optical element 4 and the carrier 2 .
- a connection point 5' is arranged between the interposer 8 and the carrier 2.
- the optical element 4 is connected to the carrier 2 via the connection point 5′ between the interposer 8 and the carrier 2.
- the optical element 4 is connected directly to the carrier 2 via the connection point 5'. This means that there is no interposer 8 arranged between the optical element 4 and the carrier 2.
- connection point 5 'between the interposer 8 and the carrier 2 is in particular designed in the same way as the connection point 5 between the submount 7 and the carrier 2.
- the connection point 5′ has metallic nanostructures and/or an alloy made of a different material than the connection point 5.
- the metallic nanostructures of the connection point 5' include Au, Ag and/or Cu.
- the alloy of the connection point 5' has the Au, Ag and/or Cu of the metallic nanostructures and another component such as Ga, In, Hg or Sn.
- the metallic nanostructures are nanowires which have a main extension direction transversely, in particular perpendicular to a main extension plane of the connection point 5 '.
- FIG. 1B shows an optoelectronic module 1 in a schematic top view.
- FIG. 1B shows the optoelectronic module 1 of FIG. 1A in a top view.
- a total of three semiconductor bodies 3, 3 ', 3'' are arranged on the carrier 2 and are connected to the carrier 2 via a connection point 5.
- a submount 7, 7', 7'' is arranged between the carrier 2 and the semiconductor bodies 3, 3', 3''.
- the semiconductor bodies 3, 3 ', 3' 'in the present case comprise laser diodes.
- Optical elements 4, 4', 4'' are located in beam paths of the semiconductor bodies 3, 3', 3''.
- the optical elements 4, 4', 4'' are connected to the carrier 2 through connection points 5'.
- the semiconductor bodies 3, 3', 3'' differ in the electromagnetic radiation they emit.
- the semiconductor body 3 emits electromagnetic radiation from the blue spectral range
- the semiconductor body 3' emits electromagnetic radiation from the red spectral range
- the semiconductor body 3'' emits electromagnetic radiation from the green spectral range.
- Figures 2A and 2B describe a method for producing an optoelectronic module 1 according to an exemplary embodiment.
- a carrier 2 with a first connecting element 9 and a component 10 with a second connecting element 11 are provided (Figure 2A).
- the first connecting element 9 at least partially covers the carrier 2.
- the first connecting element 9 and the second connecting element 11 comprise metallic nanostructures, preferably nanowires, which have Au.
- the first connecting element 9 on the carrier 2 has a greater extent than the second connecting element 11 on the component 10.
- the metallic nanostructures comprise nanowires which have a main extension direction transverse to a main extension direction of the first connecting element 9 and/or the second connecting element 11.
- the component 10 includes a semiconductor body 3 or an optical element 4.
- component 10 is a lens.
- the component 10 is actively adjusted with the aid of a gripper.
- an optical output parameter of the optoelectronic module 1 is detected.
- the component 10 is then aligned and positioned with the gripper based on the optical output parameter.
- the component 10 is aligned and positioned while a semiconductor body 3 already arranged on the carrier 2 emits electromagnetic radiation.
- the component 10 is aligned with the help of the gripper so that, for example, an intensity of the electromagnetic radiation emitted by the optoelectronic module 1 is maximum.
- connection point 5 which is the first connecting element 9 and the second connecting element 11 comprises, as shown in FIG. 2B.
- the metallic nanostructures of the first connecting element 9 and the second connecting element 11 engage with one another or at least partially touch one another.
- Figures 3A to 3C show a further exemplary embodiment of a method for producing an optoelectronic module 1.
- a carrier 2 with a first connecting element 9, which has metallic nanostructures is provided (FIG. 3A).
- a component 10 is provided with a second connecting element 11, which also has metallic nanostructures.
- the first connecting element 9 has a greater extent than the second connecting element 11.
- the metallic nanostructures of the first connecting element 9 and the second connecting element 11 comprise nanowires with Au.
- Au has a melting temperature of around 1064 ° C.
- component 10 comprises a lens.
- the component 10 is actively adjusted, with the first connecting element 9 and the second connecting element 11 being pressed together, as shown in FIG. 3B.
- the component 10 is aligned and/or positioned around six axes. This creates a connection point 5 which includes the first connecting element 9 and the second connecting element 11.
- the nanowires of the first connecting element 9 and the second connecting element 11 are at a maximum distance of 10 micrometers.
- a compaction agent 12 is then introduced into the connection point 5.
- the densifying agent 12 is introduced into the connection point 5 in liquid form, for example with the help of a dispenser 13.
- the compression agent 12 comprises Ga or In.
- the sealing agent 12 can be introduced into the connection point 5 in liquid form, the sealing agent 12 is melted before being introduced into the connection point 5.
- Ga in particular has a melting temperature of about 30 ° C, In of about 157 ° C.
- the compaction agent 12 is drawn into cavities between the metallic nanostructures of the first connecting element 9 and the second connecting element 11. In particular, this process occurs through capillary forces.
- the densification agent 12 dissolves part of the material of the metallic nanostructures of the first connecting element 9 and the second connecting element 9, so that an alloy is formed between the metallic nanostructures. Some of the metallic nanostructures remain in the connection point 5.
- the connection point 5 has the metallic nanostructures of the first connecting element 9 and the second connecting element 11 as well as the alloy.
- the alloy features AuGa or Auln.
- the alloy made of the material of the first connecting element 9 and the second connecting element 11 as well as the densifying agent 12 has a higher melting temperature than the densifying agent 12, in particular a melting temperature of over 260 ° C. This results in one isothermal solidification of the alloy between the metallic nanostructures in the connection point 5. In this way, a cohesive connection is created between the component 10 and the carrier 2 (FIG. 3C).
- the junction 5 is stable at a temperature of approximately 260° C. because none of the materials in the junction 5 melts below this temperature. This means that the connection is SMD solderable.
- Figure 4A shows a schematic sectional view of a step of a method for producing an optoelectronic module 1 according to an exemplary embodiment.
- a first connecting element 9 is applied to the carrier 2 and a second connecting element 11 is applied to the component 10.
- the second connecting element 11 has a smaller extension than the first connecting element 9.
- the second connecting element 11 has a smaller dimension than the component 10.
- the second connection point 11 only covers a part of the surface of the component 10, via which the component 10 is connected to the carrier 2.
- the component 10 is aligned by rotating about one of its main axes. The rotation takes place in particular along the rotation directions 14.
- FIG. 4B shows a top view of the step of the method for producing an optoelectronic module 1 shown in FIG. 4A.
- the first connecting element 9 on the carrier 2 has a greater extent than the component 10.
- the component 10 is positioned along the displacement directions 15.
- the displacement directions 15 are parallel to a main extension plane of the carrier 2 and/or the component 10.
- vertical positioning takes place, that is, positioning perpendicular to the main extension plane of the carrier 2.
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
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Abstract
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112023001865.0T DE112023001865A5 (de) | 2022-07-29 | 2023-07-24 | Optoelektronisches modul und verfahren zur herstellung eines optoelektronischen moduls |
| JP2024576499A JP2025523777A (ja) | 2022-07-29 | 2023-07-24 | 光電子モジュール及び光電子モジュールの製造方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102022119151.6A DE102022119151A1 (de) | 2022-07-29 | 2022-07-29 | Optoelektronisches modul und verfahren zur herstellung eines optoelektronischen moduls |
| DE102022119151.6 | 2022-07-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2024023005A1 true WO2024023005A1 (de) | 2024-02-01 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2023/070425 Ceased WO2024023005A1 (de) | 2022-07-29 | 2023-07-24 | Optoelektronisches modul und verfahren zur herstellung eines optoelektronischen moduls |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2025523777A (de) |
| DE (2) | DE102022119151A1 (de) |
| WO (1) | WO2024023005A1 (de) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019086619A1 (de) * | 2017-11-03 | 2019-05-09 | Jenoptik Laser Gmbh | Diodenlaser |
| US20190148321A1 (en) * | 2017-11-14 | 2019-05-16 | Vuereal Inc. | Integration and bonding of micro-devices into system substrate |
| DE102018106959A1 (de) * | 2018-03-23 | 2019-09-26 | Osram Opto Semiconductors Gmbh | Optoelektronisches bauelement und verfahren zur herstellung eines optoelektronischen bauelements |
| WO2023089059A2 (en) * | 2021-11-19 | 2023-05-25 | Ams-Osram International Gmbh | Laser package and method for manufacturing a laser package |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012215684A1 (de) * | 2012-09-04 | 2014-03-06 | Osram Opto Semiconductors Gmbh | Laserbauelement und Verfahren zu dessen Herstellung |
| DE102017122865B3 (de) * | 2017-10-02 | 2019-03-14 | Infineon Technologies Ag | Verfahren zum Bilden einer metallischen Zwischenverbindung, Verfahren zum Herstellen einer Halbleiteranordnung mit einer metallischen Zwischenverbindung und Halbleitervorrichtungsanordnung mit einer metallischen Zwischenverbindung |
| DE102018210134A1 (de) * | 2018-06-21 | 2019-12-24 | Trumpf Photonics, Inc. | Diodenlaseranordnung und Verfahren zum Herstellen einer Diodenlaseranordnung |
| US11282807B2 (en) * | 2019-04-08 | 2022-03-22 | Texas Instruments Incorporated | Nanowires plated on nanoparticles |
| DE102019215098A1 (de) * | 2019-10-01 | 2021-04-01 | Robert Bosch Gmbh | Mikromechanisch-optisches Bauteil und Herstellungsverfahren |
-
2022
- 2022-07-29 DE DE102022119151.6A patent/DE102022119151A1/de not_active Withdrawn
-
2023
- 2023-07-24 JP JP2024576499A patent/JP2025523777A/ja active Pending
- 2023-07-24 DE DE112023001865.0T patent/DE112023001865A5/de active Pending
- 2023-07-24 WO PCT/EP2023/070425 patent/WO2024023005A1/de not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019086619A1 (de) * | 2017-11-03 | 2019-05-09 | Jenoptik Laser Gmbh | Diodenlaser |
| US20190148321A1 (en) * | 2017-11-14 | 2019-05-16 | Vuereal Inc. | Integration and bonding of micro-devices into system substrate |
| DE102018106959A1 (de) * | 2018-03-23 | 2019-09-26 | Osram Opto Semiconductors Gmbh | Optoelektronisches bauelement und verfahren zur herstellung eines optoelektronischen bauelements |
| WO2023089059A2 (en) * | 2021-11-19 | 2023-05-25 | Ams-Osram International Gmbh | Laser package and method for manufacturing a laser package |
Also Published As
| Publication number | Publication date |
|---|---|
| DE112023001865A5 (de) | 2025-01-23 |
| JP2025523777A (ja) | 2025-07-25 |
| DE102022119151A1 (de) | 2024-02-01 |
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