WO2024018742A1 - Vacuum chamber and film formation apparatus - Google Patents

Vacuum chamber and film formation apparatus Download PDF

Info

Publication number
WO2024018742A1
WO2024018742A1 PCT/JP2023/018595 JP2023018595W WO2024018742A1 WO 2024018742 A1 WO2024018742 A1 WO 2024018742A1 JP 2023018595 W JP2023018595 W JP 2023018595W WO 2024018742 A1 WO2024018742 A1 WO 2024018742A1
Authority
WO
WIPO (PCT)
Prior art keywords
chamber
reinforcing member
vacuum chamber
film forming
wall surface
Prior art date
Application number
PCT/JP2023/018595
Other languages
French (fr)
Japanese (ja)
Inventor
瑞穂 白倉
Original Assignee
キヤノントッキ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by キヤノントッキ株式会社 filed Critical キヤノントッキ株式会社
Publication of WO2024018742A1 publication Critical patent/WO2024018742A1/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation

Definitions

  • the present invention relates to a vacuum chamber and a film forming apparatus.
  • a manufacturing apparatus for an electronic device such as an organic EL display device includes a heating chamber where a substrate is pre-treated, a film-forming chamber where a film-forming process is performed on the substrate, and the like.
  • Patent Document 1 discloses a configuration in which a reinforcing member is attached to the outer wall surface of the chamber with bolts for the purpose of improving the strength of the chamber whose interior can be switched between a vacuum state and an atmospheric pressure state.
  • an object of the present invention is to prevent the scattering of shavings in a vacuum chamber configured to be able to reduce the pressure inside and in which a reinforcing member is provided on the wall of the chamber.
  • the vacuum chamber of the present invention is A chamber whose interior can be decompressed; a reinforcing member provided along the wall surface of the chamber; a fixture for attaching the reinforcing member to the wall surface; A vacuum chamber comprising the reinforcing member and a dust scattering prevention member provided at a boundary between the chamber.
  • a vacuum chamber that is configured to be able to reduce the pressure inside and in which a reinforcing member is provided on the wall surface of the chamber.
  • FIG. 1 is a schematic diagram showing a part of a film forming apparatus according to an example.
  • FIG. 3 is a schematic diagram of a heating chamber according to an example.
  • FIG. 7 is a schematic cross-sectional view showing the attachment structure of reinforcing members according to a comparative example and an example. It is a typical sectional view showing the attachment composition of the reinforcing member concerning a modification.
  • FIG. 2 is a schematic configuration diagram of a film forming chamber according to an example.
  • FIG. 2 is an explanatory diagram of an organic EL display device according to an example.
  • the present invention relates to a vacuum chamber configured to be able to reduce the pressure inside, and a film forming apparatus equipped with the vacuum chamber.
  • the present invention can be applied, for example, to an apparatus that performs film formation by depositing various materials on the surface of a substrate.
  • Any material such as glass, a film of a polymeric material, a silicon wafer, or metal can be selected as the material of the substrate, and the substrate may be, for example, a substrate in which a film of polyimide or the like is deposited on a glass substrate.
  • any material such as an organic material or a metallic material (metal, metal oxide, etc.) may be selected as the vapor deposition material.
  • the technology of the present invention is applicable to manufacturing equipment for organic electronic devices (eg, organic light emitting elements, thin film solar cells), optical members, and the like.
  • organic electronic devices eg, organic light emitting elements, thin film solar cells
  • optical members e.g., optical members, and the like.
  • the present invention is not limited to this and can be applied to various vacuum chambers and film forming apparatuses.
  • FIG. 1 is a schematic diagram schematically showing a partial configuration of a film forming apparatus 1 according to an embodiment of the present invention.
  • the film forming apparatus 1 includes a storage chamber 11 in which a substrate 3 to be film-formed is accommodated, a heating chamber (preparation chamber) 12 for performing heat treatment on the substrate 3, and a film-forming process on the surface of the substrate 3 to be processed.
  • a film forming chamber 13 is provided.
  • the heating chamber 12 and the film forming chamber 13 are vacuum chambers configured to be able to reduce the pressure inside.
  • the substrate 3 is carried integrally with the substrate carrier 5 from the storage chamber 11 to the heating chamber 12 by a transfer means such as a transfer robot while being held by the substrate carrier 5 so that the surface to be processed of the substrate 3 faces vertically.
  • the film is transported from the heating chamber 12 to the film forming chamber 13.
  • a plurality of unprocessed substrates 3 are stored in the storage chamber 11 while being held by the substrate carrier 5.
  • the substrate carrier 5 is a mask-integrated carrier that holds the substrate 3 with the surface to be processed of the substrate 3 exposed.
  • the substrate carrier 5 may be configured to be able to hold a plurality of substrates 3, or may be configured to be able to hold only one substrate.
  • the heating chamber 12 is equipped with heating means such as a heater, and heat treatment is performed for the purpose of increasing the adhesion of the thin film to the substrate 3 prior to the film forming process. Further, the heating chamber 12 is provided with an exhaust mechanism and configured to be able to adjust the pressure within the chamber. Since the inside of the storage chamber 11 is at atmospheric pressure, when the substrate 3 is transferred from the storage chamber 11 to the heating chamber 12 , the inside of the heating chamber 12 is brought to the atmospheric pressure according to the storage chamber 11 .
  • the evaporation material stored in the evaporation source is heated by the heater, evaporated, and deposited onto the substrate.
  • the substrate 3 transported from the heating chamber 12 to the film forming chamber 13 is subjected to a film forming process, and then is carried out from the film forming chamber 13.
  • the film forming process is performed with the inside of the film forming chamber 13 in a vacuum state, so when the substrate 3 is transferred from the heating chamber 12 to the film forming chamber 13, the insides of both chambers are brought into a vacuum state in advance.
  • a film forming apparatus is generally configured to have a plurality of film forming chambers so that thin films can be formed using different materials.
  • the storage chamber 11 is basically at atmospheric pressure and the film forming chamber 13 is in a vacuum state.
  • the heating chamber 12 is set to an atmospheric pressure state when the substrate 3 is carried in from the storage chamber 11, and is set to a vacuum state when the substrate 3 is carried out to the film forming chamber 13.
  • loads due to changes in the internal pressure state act on the heating chamber 12 more frequently than other chambers.
  • the configuration of an electronic device manufacturing apparatus has been described with reference to FIG. , the arrangement of these devices and chambers may be different.
  • the electronic device manufacturing apparatus may be a cluster type instead of an inline type.
  • the film forming chamber of the present invention is configured to form a thin film (material film) with a desired pattern by vacuum evaporation, the film forming chamber may also be configured to perform the film forming process using a sputtering device or a CVD (Chemical Vapor Deposition) device. .
  • FIG. 2(a) is a schematic diagram showing the appearance of the heating chamber 12 according to this embodiment, and shows a state in which the upper lid portion 123 is closed.
  • FIG. 2(b) is a schematic diagram showing the appearance of the heating chamber 12 according to this embodiment, and shows a state in which the upper lid portion 123 is open.
  • the heating chamber 12 includes a main body (chamber main body) 121, an upper lid 123 that can be opened and closed with respect to the main body 121, and a rib member 125 provided along the upper surface of the upper lid 123. That is, the heating chamber 12 has a structure in which a rib member 125, which is a reinforcing member, is provided in a chamber formed by a main body part 121 and an upper lid part 123. Further, a gate valve 31 is provided between the heating chamber 12 and the storage chamber 11 and between the heating chamber 12 and the film forming chamber 13 to connect the heating chamber 12 and other chambers. Furthermore, the heating chamber 12 is supported from below by a base 33.
  • the gate valve 31 is composed of a disk (valve body) and a body (valve body).
  • the gate valve 31 is provided around the communication port 121a of the main body portion 121, and opens and closes a passage through which the substrate 3 passes by movement of the disk. With the passage opened, the substrate 3 is carried in and out of the main body portion 121 through the communication port (entrance/exit) 121a of the heating chamber 12 by the transport means.
  • the heating chamber 12 is configured to be switchable between a vacuum state and an atmospheric pressure state by adjusting the pressure inside the chamber with an exhaust mechanism (not shown) while the passage is closed.
  • the main body portion 121 has an opening 121b on the upper side, and an operator can insert his/her hand through the opening 121b to perform maintenance on the inside of the heating chamber 12, if necessary.
  • the upper lid part 123 is provided to be openable and closable with respect to the main body part 121, and the opening part 121b is closed by the upper lid part 123 when the substrate 3 is heated. When the upper lid part 123 is closed, the O-ring provided so as to surround the opening part 121b is crushed, and the airtightness of the heating chamber 12 is maintained.
  • the upper lid portion 123 is made of a relatively lightweight aluminum alloy in consideration of operability during opening and closing.
  • a rib member 125 is provided in the heating chamber 12 as a reinforcing member to improve the strength of the upper lid portion 123.
  • the rib member 125 is provided along a mounting surface 123a that corresponds to the upper surface of the upper lid part 123 when the upper lid part 123 is closed, and is located outside the heating chamber 12.
  • two rib members 125 extend vertically and two horizontally from one end of the upper lid part 123 to the other end.
  • the rib member 125 of this embodiment is made of stainless steel such as SUS in consideration of strength.
  • a plurality of bolts 127 are provided as fixtures for attaching the rib member 125 to the upper lid portion 123.
  • the bolts 127 are inserted through the rib member 125 and the upper lid part 123 to attach the rib member 125 to the upper lid part 123.
  • the fitting for attaching the rib member 125 to the upper lid portion 123 is not limited to the above-mentioned screw parts, and various fittings can be used.
  • the upper lid part 123 is opened and closed with respect to the main body part 121 by rotating around a rotation axis extending parallel to the mounting surface 123a.
  • the upper lid part 123 is opened and closed by a cylinder 35 having a main body part 35a and a movable part 35b.
  • the cylinder 35 is a cylinder mechanism whose stroke changes and expands and contracts as the movable part 35b moves straight ahead with respect to the main body part 35a, and the movable part 35b moves straight ahead in a substantially vertical direction.
  • the rib member 125 has an extension portion 125a extending outward from the upper lid portion 123 in a direction orthogonal to the rotational axis of the upper lid portion 123 when viewed from a direction perpendicular to the mounting surface 123a.
  • the extension portion 125a is connected to the movable portion 35b, and as the movable portion 35b of the cylinder 35 moves, the upper lid portion 123 and the rib member 125 rotate integrally.
  • the reinforcing member also functions as a component of the opening/closing mechanism of the upper lid portion 123.
  • the rib member 125 serves as an opening/closing mechanism for the upper lid part 123, it is made of a material with higher strength than the upper lid part 123 so that the extension part 125a does not deform. Note that, in order to improve worker safety, a stopper such as a support may be further provided to prevent the upper lid portion 123 from closing unintentionally.
  • FIG. 3(a) is a schematic cross-sectional view showing the mounting structure of the rib member 125 of the comparative example
  • FIG. 3(b) is a schematic cross-sectional view showing the mounting structure of the rib member 125 of the present example. .
  • the inventors of the present invention came up with the idea of providing a dust scattering prevention member at the boundary between the rib member 125 and the upper lid part 123.
  • grease 129 is applied as a lubricant between the upper lid portion 123 and the rib member 125.
  • the coefficient of friction between the upper lid part 123 and the rib member 125 is reduced, and the generation of shavings 51 is suppressed when both members come into sliding contact. Can be done. Further, even if the shavings 51 are generated, the shavings 51 are captured in the grease 129, so that the shavings 51 can be prevented from scattering to the outside.
  • FIG. 4(a) is a schematic cross-sectional view showing the mounting configuration of the rib member 125 according to the first modification.
  • Modification 1 has a configuration in which a tape member 131 is further added as a dust scattering prevention member to the above-described embodiment.
  • the tape member 131 is provided so as to cover the entire boundary between the rib member 125 and the upper lid part 123. With this configuration, it is possible to prevent the shavings 51 and the grease 129 itself from scattering outside the grease 129. That is, the dust scattering prevention member is not limited to one type, and a combination of multiple types may be provided in the vacuum chamber.
  • FIG. 4(b) is a schematic cross-sectional view showing the mounting configuration of the rib member 125 according to the second modification.
  • Modification 2 has a configuration in which a liquid gasket 133 is provided in place of the grease 129 as a dust scattering prevention member in the above-described embodiment.
  • the liquid gasket 133 is a silicone sealant provided so as to cover the entire boundary between the rib member 125 and the upper lid part 123.
  • the second modification since there is no lubricant or the like interposed between the rib member 125 and the upper lid portion 123, the generation of scraped powder 51 is not suppressed.
  • the shavings 51 are trapped between the liquid gasket 133, the rib member 125, and the upper lid portion 123 without scattering to the outside. Furthermore, according to the second modification, scattering of the scraped powder 51 can be prevented without interposing a lubricant between the rib member 125 and the upper lid part 123.
  • the vacuum chamber may have a structure in which only the tape member 131 is provided without the grease 129, or a structure in which the liquid gasket 133 is provided after applying the grease 129.
  • the present invention may also be applied to a structure in which a reinforcing member is provided on the outer wall surface or inner wall surface of the main body portion of the chamber. good.
  • the present invention can also be applied to other vacuum chambers that constitute a film forming apparatus. For example, since the internal pressure state of a film forming chamber changes due to repeated operation and stop of the film forming apparatus, scattering of shavings can be prevented by applying the present invention to the film forming chamber.
  • ⁇ Film forming chamber> With reference to FIG. 5, the film forming process in the film forming chamber 13 will be described in more detail.
  • an evaporation source 7 is provided as a film forming source.
  • the substrate 3 held by the substrate carrier 5 is positioned and supported within the film forming chamber 13 so that the surface to be processed faces downward. As a result, a film is formed on the substrate 3 held by the substrate carrier 5.
  • film formation is performed by vacuum evaporation.
  • the film-forming material is evaporated or sublimated from the evaporation source 7, and the film-forming material is vapor-deposited onto the substrate 3 to form a thin film on the substrate 3.
  • the evaporation source 7 is a known technology, detailed explanation thereof will be omitted.
  • the evaporation source 7 can be configured with a container such as a crucible that houses the film forming material, a heating device that heats the container, and the like.
  • the film forming source is not limited to the evaporation source 7, and may be a sputtering cathode for forming a film by sputtering.
  • FIG. 6(a) shows an overall view of the organic EL display device 700
  • FIG. 6(b) shows a cross-sectional structure of one pixel.
  • each light emitting element has a structure including an organic layer sandwiched between a pair of electrodes.
  • the pixel herein refers to the smallest unit that can display a desired color in the display area 701.
  • a pixel 702 is configured by a combination of a first light emitting element 702R, a second light emitting element 702G, and a third light emitting element 702B that emit light different from each other.
  • the pixel 702 is often composed of a combination of a red light-emitting element, a green light-emitting element, and a blue light-emitting element, but it may also be a combination of a yellow light-emitting element, a cyan light-emitting element, and a white light-emitting element. There are no restrictions.
  • FIG. 6(b) is a schematic partial cross-sectional view taken along line BB in FIG. 6(a).
  • the pixel 702 consists of a plurality of light emitting elements, and each light emitting element has a first electrode (anode) 704, a hole transport layer 705, one of the light emitting layers 706R, 706G, and 706B, and an electron transport layer on a substrate 703. It has a layer 707 and a second electrode (cathode) 708.
  • the hole transport layer 705, the light emitting layers 706R, 706G, and 706B, and the electron transport layer 707 correspond to organic layers.
  • the light-emitting layer 706R is an organic EL layer that emits red
  • the light-emitting layer 706G is an organic EL layer that emits green
  • the light-emitting layer 706B is an organic EL layer that emits blue.
  • the light-emitting layers 706R, 706G, and 706B are formed in patterns corresponding to light-emitting elements (sometimes referred to as organic EL elements) that emit red, green, and blue, respectively.
  • the first electrode 704 is formed separately for each light emitting element.
  • the hole transport layer 705, the electron transport layer 707, and the second electrode 708 may be formed in common for the plurality of light emitting elements 702R, 702G, and 702B, or may be formed for each light emitting element.
  • an insulating layer 709 is provided between the first electrodes 704 in order to prevent the first electrodes 704 and the second electrodes 708 from shorting due to foreign matter.
  • a protective layer 710 is provided to protect the organic EL element from moisture and oxygen.
  • hole transport layer 705 and electron transport layer 707 are shown as one layer in FIG. 6(b), depending on the structure of the organic EL display element, they may be formed as multiple layers including a hole blocking layer and an electron blocking layer. may be formed. Further, between the first electrode 704 and the hole transport layer 705, a positive hole having an energy band structure that allows holes to be smoothly injected from the first electrode 704 to the hole transport layer 705 is provided. A hole injection layer can also be formed. Similarly, an electron injection layer can also be formed between the second electrode 708 and the electron transport layer 707.
  • a substrate (mother glass) 703 on which a circuit (not shown) for driving an organic EL display device and a first electrode 704 are formed is prepared.
  • Acrylic resin is formed by spin coating on the substrate 703 on which the first electrode 704 is formed, and the acrylic resin is patterned by lithography so that an opening is formed in the part where the first electrode 704 is formed, and an insulating layer is formed. Form 709. This opening corresponds to the light emitting region where the light emitting element actually emits light.
  • a substrate 703 with a patterned insulating layer 709 is placed on a substrate carrier on which an adhesive member is arranged.
  • the substrate 703 is held by the adhesive member.
  • a hole transport layer 705 is formed as a common layer on the first electrode 704 in the display area.
  • the hole transport layer 705 is formed by vacuum deposition. In reality, the hole transport layer 705 is formed to have a larger size than the display area 701, so a high-definition mask is not required.
  • the substrate 703 on which up to the hole transport layer 705 has been formed is carried into a second organic material film forming apparatus.
  • the substrate and the mask are aligned, the substrate is placed on the mask, and a light-emitting layer 706R that emits red light is formed on a portion of the substrate 703 where an element that emits red light is to be arranged.
  • a light-emitting layer 706G that emits green light is formed by a third organic material film-forming device, and a light-emitting layer 706B that emits blue light is further formed by a fourth organic material film-forming device.
  • the electron transport layer 707 is formed over the entire display area 701 using a fifth film formation apparatus.
  • the electron transport layer 707 is formed as a layer common to the three color light emitting layers 706R, 706G, and 706B.
  • a second electrode 708 is formed by moving the substrate on which the electron transport layer 707 has been formed using a metal vapor deposition material film forming apparatus.
  • the film is moved to a plasma CVD apparatus and a protective layer 710 is formed, thereby completing the film forming process on the substrate 703.
  • the adhesive member is peeled off from the substrate 703 to separate the substrate 703 from the substrate carrier.
  • the organic EL display device 700 is completed through cutting.
  • the substrate 703 on which the insulating layer 709 has been patterned is exposed to an atmosphere containing moisture or oxygen from the time the substrate 703 on which the insulating layer 709 has been patterned is carried into the film forming apparatus until the film forming of the protective layer 710 is completed, the light emitting layer made of the organic EL material may There is a risk of deterioration due to moisture and oxygen. Therefore, in this embodiment, substrates are carried in and out between film forming apparatuses under a vacuum atmosphere or an inert gas atmosphere.
  • Heating chamber vacuum chamber
  • Rib member reinforcing member
  • Bolt mounting tool
  • Grease dust scattering prevention member

Abstract

This vacuum chamber is characterized by comprising: a chamber of which the inside can be decompressed; a reinforcement member 125 provided along the wall surface of the chamber; a fixture tool 127 for attaching the reinforcement member 125 to the wall surface; and a dust scattering prevention member 129 provided to the boundary between the chamber and the reinforcement member 125.

Description

真空チャンバー及び成膜装置Vacuum chamber and film forming equipment
 本発明は、真空チャンバー及び成膜装置に関するものである。 The present invention relates to a vacuum chamber and a film forming apparatus.
 成膜装置においては、内部を減圧可能に構成される複数のチャンバーを備える装置が知られている。例えば、有機EL表示装置などの電子デバイスの製造装置は、基板の前処理が行われる加熱室、基板に成膜処理を行う成膜室等を備える。 Among film-forming apparatuses, there are known apparatuses that include a plurality of chambers that are configured to be able to reduce the internal pressure. For example, a manufacturing apparatus for an electronic device such as an organic EL display device includes a heating chamber where a substrate is pre-treated, a film-forming chamber where a film-forming process is performed on the substrate, and the like.
 上述のチャンバーは、内部が真空の状態と大気圧の状態とに切り替えられて使用されるため、真空状態と大気圧状態との圧力差によりチャンバーは変形を繰り返す。そこで、チャンバーの強度向上を目的として、チャンバーの壁面にリブ等の補強部材が設けられることがある。特許文献1には、内部を真空状態と大気圧状態に切り替え可能なチャンバーの強度向上を目的として、補強部材がチャンバーの外壁面にボルトで取り付けられている構成が開示されている。 Since the above-mentioned chamber is used while being switched between a vacuum state and an atmospheric pressure state, the chamber repeatedly deforms due to the pressure difference between the vacuum state and the atmospheric pressure state. Therefore, reinforcing members such as ribs are sometimes provided on the wall surface of the chamber for the purpose of improving the strength of the chamber. Patent Document 1 discloses a configuration in which a reinforcing member is attached to the outer wall surface of the chamber with bolts for the purpose of improving the strength of the chamber whose interior can be switched between a vacuum state and an atmospheric pressure state.
国際公開第2009/078351号International Publication No. 2009/078351
 しかしながら、チャンバーに補強部材を設けた構成であっても、成膜装置の稼働時にチャンバーの変形を完全に抑制することは非常に困難であり、チャンバーと補強部材は少なからず変形する。このとき、補強部材とチャンバーがこすれて両部材が削られることで、細かい粒状の削れ粉が発生することがある。削れ粉が風に舞うなどして飛散すると、削れ粉がチャンバー内に入り込み、チャンバー内の基板等に付着して製造不良が発生するなどの問題が生じうる。 However, even with a configuration in which a reinforcing member is provided in the chamber, it is extremely difficult to completely suppress deformation of the chamber during operation of the film forming apparatus, and the chamber and the reinforcing member deform to some extent. At this time, the reinforcing member and the chamber rub against each other and both members are scraped, which may generate fine shavings. If the shavings are scattered by wind, etc., the shavings may enter the chamber and adhere to the substrate or the like in the chamber, causing problems such as manufacturing defects.
 そこで、本発明は、内部を減圧可能に構成され、補強部材がチャンバーの壁面上に設けられる真空チャンバーにおいて、削れ粉の飛散を防止することを目的とする。 Therefore, an object of the present invention is to prevent the scattering of shavings in a vacuum chamber configured to be able to reduce the pressure inside and in which a reinforcing member is provided on the wall of the chamber.
 本発明の真空チャンバーは、
 内部を減圧可能なチャンバーと、
 前記チャンバーの壁面に沿って設けられる補強部材と、
 前記補強部材を前記壁面に取り付ける取付具と、
 前記補強部材と前記チャンバーの境界部に設けられる粉塵飛散防止部材と、を備えることを特徴とする真空チャンバー。
The vacuum chamber of the present invention is
A chamber whose interior can be decompressed;
a reinforcing member provided along the wall surface of the chamber;
a fixture for attaching the reinforcing member to the wall surface;
A vacuum chamber comprising the reinforcing member and a dust scattering prevention member provided at a boundary between the chamber.
 本発明によれば、内部を減圧可能に構成され、補強部材がチャンバーの壁面上に設けられる真空チャンバーにおいて、削れ粉の飛散を防止できる。 According to the present invention, it is possible to prevent shavings from scattering in a vacuum chamber that is configured to be able to reduce the pressure inside and in which a reinforcing member is provided on the wall surface of the chamber.
実施例に係る成膜装置の一部を示す模式図である。FIG. 1 is a schematic diagram showing a part of a film forming apparatus according to an example. 実施例に係る加熱室の模式図である。FIG. 3 is a schematic diagram of a heating chamber according to an example. 比較例と実施例に係る補強部材の取付構成を示す模式的断面図である。FIG. 7 is a schematic cross-sectional view showing the attachment structure of reinforcing members according to a comparative example and an example. 変形例に係る補強部材の取付構成を示す模式的断面図である。It is a typical sectional view showing the attachment composition of the reinforcing member concerning a modification. 実施例に係る成膜室の概略構成図である。FIG. 2 is a schematic configuration diagram of a film forming chamber according to an example. 実施例に係る有機EL表示装置の説明図である。FIG. 2 is an explanatory diagram of an organic EL display device according to an example.
 以下に図面を参照して、この発明を実施するための形態を、実施例に基づいて例示的に詳しく説明する。ただし、この実施の形態に記載されている構成部品の寸法、材質、形状それらの相対配置などは、発明が適用される装置の構成や各種条件により適宜変更されるべきものである。すなわち、この発明の範囲を以下の実施の形態に限定する趣旨のものではない。 EMBODIMENT OF THE INVENTION Below, with reference to drawings, the form for carrying out this invention is illustratively described in detail based on an Example. However, the dimensions, materials, shapes, and relative arrangement of the components described in this embodiment should be changed as appropriate depending on the configuration of the device to which the invention is applied and various conditions. That is, the scope of the present invention is not intended to be limited to the following embodiments.
 本発明は、内部を減圧可能に構成される真空チャンバー、及びその真空チャンバーを備える成膜装置に関するものである。本発明は、例えば、基板の表面に各種材料を堆積させて成膜を行う装置に適用することができる。基板の材料としては、ガラス、高分子材料のフィルム、シリコンウェハ、金属などの任意の材料を選択でき、基板は、例えば、ガラス基板上にポリイミドなどのフィルムが堆積された基板であってもよい。また、蒸着材料として、有機材料、金属製材料(金属、金属酸化物など)などの任意の材料が選択されてもよい。本発明の技術は、具体的には、有機電子デバイス(例えば、有機発光素子、薄膜太陽電池)、光学部材などの製造装置に適用可能である。以下、本発明を電子デバイスの製造装置に適用した場合を例に説明するが、本発明はこれに限られず、種々の真空チャンバーや成膜装置に適用可能である。 The present invention relates to a vacuum chamber configured to be able to reduce the pressure inside, and a film forming apparatus equipped with the vacuum chamber. The present invention can be applied, for example, to an apparatus that performs film formation by depositing various materials on the surface of a substrate. Any material such as glass, a film of a polymeric material, a silicon wafer, or metal can be selected as the material of the substrate, and the substrate may be, for example, a substrate in which a film of polyimide or the like is deposited on a glass substrate. . Furthermore, any material such as an organic material or a metallic material (metal, metal oxide, etc.) may be selected as the vapor deposition material. Specifically, the technology of the present invention is applicable to manufacturing equipment for organic electronic devices (eg, organic light emitting elements, thin film solar cells), optical members, and the like. Hereinafter, a case where the present invention is applied to an electronic device manufacturing apparatus will be described as an example, but the present invention is not limited to this and can be applied to various vacuum chambers and film forming apparatuses.
 (実施例)
 <成膜装置の構成>
 図1は、本発明の実施例に係る成膜装置1の一部構成を概略的に示した模式図である。成膜装置1は、成膜処理される基板3が収容される収容室11と、基板3に加熱処理を行う加熱室(仕込み室)12と、基板3の被処理面に成膜処理を行う成膜室13と、を備える。加熱室12や成膜室13は、内部を減圧可能に構成される真空チャンバーである。
基板3は、基板3の被処理面が鉛直方向を向くように基板キャリア5に保持された状態で、搬送ロボット等の搬送手段によって、基板キャリア5と一体的に収容室11から加熱室12、加熱室12から成膜室13へと搬送される。
(Example)
<Configuration of film forming apparatus>
FIG. 1 is a schematic diagram schematically showing a partial configuration of a film forming apparatus 1 according to an embodiment of the present invention. The film forming apparatus 1 includes a storage chamber 11 in which a substrate 3 to be film-formed is accommodated, a heating chamber (preparation chamber) 12 for performing heat treatment on the substrate 3, and a film-forming process on the surface of the substrate 3 to be processed. A film forming chamber 13 is provided. The heating chamber 12 and the film forming chamber 13 are vacuum chambers configured to be able to reduce the pressure inside.
The substrate 3 is carried integrally with the substrate carrier 5 from the storage chamber 11 to the heating chamber 12 by a transfer means such as a transfer robot while being held by the substrate carrier 5 so that the surface to be processed of the substrate 3 faces vertically. The film is transported from the heating chamber 12 to the film forming chamber 13.
 収容室11には、未処理状態の基板3が、基板キャリア5に保持された状態で複数収容されている。基板キャリア5は、基板3の被処理面が露出した状態で基板3を保持するマスク一体型キャリアである。基板キャリア5は、基板3を複数枚保持できる構成であっても良いし、1枚のみ保持できる構成であっても良い。 A plurality of unprocessed substrates 3 are stored in the storage chamber 11 while being held by the substrate carrier 5. The substrate carrier 5 is a mask-integrated carrier that holds the substrate 3 with the surface to be processed of the substrate 3 exposed. The substrate carrier 5 may be configured to be able to hold a plurality of substrates 3, or may be configured to be able to hold only one substrate.
 加熱室12は、ヒータ等の加熱手段を備え、成膜処理に先立って、基板3に対する薄膜の密着性を高めること等を目的とした加熱処理が行われる。また、加熱室12は、排気機構が設けられており、チャンバー内の圧力を調整可能に構成されている。収容室11の内部は大気圧状態であるため、基板3が収容室11から加熱室12へと搬送されるとき、加熱室12の内部は収容室11にあわせて大気圧状態にされる。 The heating chamber 12 is equipped with heating means such as a heater, and heat treatment is performed for the purpose of increasing the adhesion of the thin film to the substrate 3 prior to the film forming process. Further, the heating chamber 12 is provided with an exhaust mechanism and configured to be able to adjust the pressure within the chamber. Since the inside of the storage chamber 11 is at atmospheric pressure, when the substrate 3 is transferred from the storage chamber 11 to the heating chamber 12 , the inside of the heating chamber 12 is brought to the atmospheric pressure according to the storage chamber 11 .
 成膜室(蒸着装置)13では、蒸発源に収納された蒸着材料がヒータによって加熱されて蒸発し、基板上に蒸着される。加熱室12から成膜室13に搬送された基板3は、成膜処理が施された後、成膜室13から搬出される。成膜処理は、成膜室13の内部が真空の状態で行われるため、加熱室12から成膜室13に基板3が搬送される際は、両チャンバーの内部は予め真空状態にされる。なお、異なる材料によって薄膜を形成できるように、成膜装置としては成膜室が複数設けられる構成が一般的である。 In the film forming chamber (evaporation device) 13, the evaporation material stored in the evaporation source is heated by the heater, evaporated, and deposited onto the substrate. The substrate 3 transported from the heating chamber 12 to the film forming chamber 13 is subjected to a film forming process, and then is carried out from the film forming chamber 13. The film forming process is performed with the inside of the film forming chamber 13 in a vacuum state, so when the substrate 3 is transferred from the heating chamber 12 to the film forming chamber 13, the insides of both chambers are brought into a vacuum state in advance. Note that a film forming apparatus is generally configured to have a plurality of film forming chambers so that thin films can be formed using different materials.
 上述の通り、成膜装置1の稼働時、基本的に収容室11は大気圧状態であり、成膜室13は真空状態である。一方、加熱室12は、収容室11から基板3が搬入される際は大気圧状態とされ、成膜室13へ基板3が搬出される際は真空状態とされる。このように、加熱室12は大気圧状態と真空状態が頻繁に繰り返されるため、他のチャンバーと比較して加熱室12には内部の圧力状態の変化による負荷が頻繁に作用する。 As described above, when the film forming apparatus 1 is in operation, the storage chamber 11 is basically at atmospheric pressure and the film forming chamber 13 is in a vacuum state. On the other hand, the heating chamber 12 is set to an atmospheric pressure state when the substrate 3 is carried in from the storage chamber 11, and is set to a vacuum state when the substrate 3 is carried out to the film forming chamber 13. As described above, since the heating chamber 12 is frequently put into an atmospheric pressure state and a vacuum state, loads due to changes in the internal pressure state act on the heating chamber 12 more frequently than other chambers.
 本実施例では、図1を参照して、電子デバイスの製造装置の構成について説明したが、本発明を適用する構成はこれに限定されず、他の種類の装置やチャンバーを有し多孔性や、これらの装置やチャンバーの配置が変わった構成でも良い。例えば、電子デバイスの製造装置は、インラインタイプでなくクラスタタイプであってもよい。また、本発明の成膜室は真空蒸着によって所望のパターンの薄膜(材料膜)を形成する構成としたが、スパッタリング装置やCVD(Chemical Vapor Deposition)装置により成膜処理が行われる構成としても良い。 In this embodiment, the configuration of an electronic device manufacturing apparatus has been described with reference to FIG. , the arrangement of these devices and chambers may be different. For example, the electronic device manufacturing apparatus may be a cluster type instead of an inline type. Furthermore, although the film forming chamber of the present invention is configured to form a thin film (material film) with a desired pattern by vacuum evaporation, the film forming chamber may also be configured to perform the film forming process using a sputtering device or a CVD (Chemical Vapor Deposition) device. .
 <加熱室の構成>
 図2(a)、(b)を参照して、本実施例に係る加熱室12の詳細構成について説明する。図2(a)は、本実施例に係る加熱室12の外観を示す模式図であり、上蓋部123が閉じた状態を示している。図2(b)は、本実施例に係る加熱室12の外観を示す模式図であり、上蓋部123が開いた状態を示している。
<Configuration of heating chamber>
The detailed configuration of the heating chamber 12 according to this embodiment will be described with reference to FIGS. 2(a) and 2(b). FIG. 2(a) is a schematic diagram showing the appearance of the heating chamber 12 according to this embodiment, and shows a state in which the upper lid portion 123 is closed. FIG. 2(b) is a schematic diagram showing the appearance of the heating chamber 12 according to this embodiment, and shows a state in which the upper lid portion 123 is open.
 加熱室12は、本体部(チャンバー本体)121と、本体部121に対して開閉可能な上蓋部123と、上蓋部123の上面に沿って設けられるリブ部材125と、を備える。すなわち、加熱室12は、本体部121と上蓋部123により構成されるチャンバーに、補強部材であるリブ部材125が設けられている構成である。また、加熱室12と収容室11の間、加熱室12と成膜室13の間には、加熱室12と他のチャンバーを接続するゲートバルブ31が設けられている。更に、加熱室12は、土台33によって下方から支持されている。 The heating chamber 12 includes a main body (chamber main body) 121, an upper lid 123 that can be opened and closed with respect to the main body 121, and a rib member 125 provided along the upper surface of the upper lid 123. That is, the heating chamber 12 has a structure in which a rib member 125, which is a reinforcing member, is provided in a chamber formed by a main body part 121 and an upper lid part 123. Further, a gate valve 31 is provided between the heating chamber 12 and the storage chamber 11 and between the heating chamber 12 and the film forming chamber 13 to connect the heating chamber 12 and other chambers. Furthermore, the heating chamber 12 is supported from below by a base 33.
 ゲートバルブ31は、ディスク(弁体)とボディ(弁胴)により構成される。ゲートバルブ31は、本体部121の連通口121aの周囲に設けられ、ディスクの移動によって基板3が通過するための通路が開閉される。該通路が開通された状態で、基板3は搬送手段により加熱室12の連通口(出入口)121aを通って、本体部121の内部に搬入出される。加熱室12は、該通路が閉鎖された状態で、不図示の排気機構によって室内の圧力を調整することにより、真空状態と大気圧状態とを切替可能に構成されている。 The gate valve 31 is composed of a disk (valve body) and a body (valve body). The gate valve 31 is provided around the communication port 121a of the main body portion 121, and opens and closes a passage through which the substrate 3 passes by movement of the disk. With the passage opened, the substrate 3 is carried in and out of the main body portion 121 through the communication port (entrance/exit) 121a of the heating chamber 12 by the transport means. The heating chamber 12 is configured to be switchable between a vacuum state and an atmospheric pressure state by adjusting the pressure inside the chamber with an exhaust mechanism (not shown) while the passage is closed.
 本体部121は、上側に開口部121bを有し、作業者は必要に応じて、開口部121bから手を入れて加熱室12内部のメンテナンス等を行うことができる。また、上蓋部123は、本体部121に対して開閉可能に設けられ、基板3の加熱処理時、開口部121bは上蓋部123により塞がれる。上蓋部123が閉じられると、開口部121bを囲むように設けられたOリングがつぶされて、加熱室12の密閉性が保たれる。本実施例において、上蓋部123は、開閉時の操作性を考慮して比較的軽量なアルミ合金により形成されている。 The main body portion 121 has an opening 121b on the upper side, and an operator can insert his/her hand through the opening 121b to perform maintenance on the inside of the heating chamber 12, if necessary. Further, the upper lid part 123 is provided to be openable and closable with respect to the main body part 121, and the opening part 121b is closed by the upper lid part 123 when the substrate 3 is heated. When the upper lid part 123 is closed, the O-ring provided so as to surround the opening part 121b is crushed, and the airtightness of the heating chamber 12 is maintained. In this embodiment, the upper lid portion 123 is made of a relatively lightweight aluminum alloy in consideration of operability during opening and closing.
 上述の通り、加熱室12は大気圧状態と真空状態が繰り返し切り替えられるため、内部の圧力状態の変化により上蓋部123は変形する。そこで、加熱室12には、上蓋部123の強度を向上する補強部材として、リブ部材125が設けられる。リブ部材125は、上蓋部123が閉じた状態において、上蓋部123の上面に当たる取付面123aに沿って設けられ、加熱室12の外側に位置する。上蓋部123の取付面123aに垂直な方向から見たときに、リブ部材125は縦に2本、横に2本それぞれ交差するように上蓋部123の一端から他端まで延びている。 As mentioned above, since the heating chamber 12 is repeatedly switched between the atmospheric pressure state and the vacuum state, the upper lid portion 123 deforms due to changes in the internal pressure state. Therefore, a rib member 125 is provided in the heating chamber 12 as a reinforcing member to improve the strength of the upper lid portion 123. The rib member 125 is provided along a mounting surface 123a that corresponds to the upper surface of the upper lid part 123 when the upper lid part 123 is closed, and is located outside the heating chamber 12. When viewed from a direction perpendicular to the mounting surface 123a of the upper lid part 123, two rib members 125 extend vertically and two horizontally from one end of the upper lid part 123 to the other end.
 本実施例のリブ部材125は、強度を考慮してSUS等のステンレス鋼により形成される。このように、上蓋部123とリブ部材125が異なる材料により形成される場合、溶接により両部材を接続することは困難である。そこで、本実施例においては、リブ部材125を上蓋部123に取り付ける取付具として、複数のボルト127が設けられている。ボルト127は、リブ部材125と上蓋部123に挿通され、リブ部材125を上蓋部123に取り付ける。なお、リブ部材125を上蓋部123に取り付ける取付具は、上述のネジ部品に限られず、種々の取付具を使用することができる。 The rib member 125 of this embodiment is made of stainless steel such as SUS in consideration of strength. In this way, when the upper lid part 123 and the rib member 125 are formed of different materials, it is difficult to connect the two members by welding. Therefore, in this embodiment, a plurality of bolts 127 are provided as fixtures for attaching the rib member 125 to the upper lid portion 123. The bolts 127 are inserted through the rib member 125 and the upper lid part 123 to attach the rib member 125 to the upper lid part 123. Note that the fitting for attaching the rib member 125 to the upper lid portion 123 is not limited to the above-mentioned screw parts, and various fittings can be used.
 上蓋部123は、取付面123aに対して平行に延びる回転軸線を中心に回転することで、本体部121に対して開閉される。本実施例においては、本体部35aと可動部35bを有するシリンダー35により、上蓋部123が開閉される。シリンダー35は、可動部35bが、本体部35aに対して直進移動することにより、ストロークが変動して伸縮するシリンダー機構であり、可動部35bは略鉛直方向に直進移動する。 The upper lid part 123 is opened and closed with respect to the main body part 121 by rotating around a rotation axis extending parallel to the mounting surface 123a. In this embodiment, the upper lid part 123 is opened and closed by a cylinder 35 having a main body part 35a and a movable part 35b. The cylinder 35 is a cylinder mechanism whose stroke changes and expands and contracts as the movable part 35b moves straight ahead with respect to the main body part 35a, and the movable part 35b moves straight ahead in a substantially vertical direction.
 リブ部材125は、取付面123aに垂直な方向から見たときに上蓋部123に対して外側に、上蓋部123の回転軸線と直交する方向に延びる延長部125aを有する。延長部125aは可動部35bに接続され、シリンダー35の可動部35bの移動によって、上蓋部123とリブ部材125が一体的に回転する。このような構成とすることで、補強部材が上蓋部123の開閉機構の構成部材としても機能する。また、リブ部材125は、上蓋部123の開閉機構を担うため、延長部125aが変形しないように上蓋部123よりも高強度な材料で形成されている。なお、作業者の安全性向上のため、上蓋部123が意図せず閉じることを防ぐ支柱等のストッパを更に設ける構成としても良い。 The rib member 125 has an extension portion 125a extending outward from the upper lid portion 123 in a direction orthogonal to the rotational axis of the upper lid portion 123 when viewed from a direction perpendicular to the mounting surface 123a. The extension portion 125a is connected to the movable portion 35b, and as the movable portion 35b of the cylinder 35 moves, the upper lid portion 123 and the rib member 125 rotate integrally. With such a configuration, the reinforcing member also functions as a component of the opening/closing mechanism of the upper lid portion 123. Furthermore, since the rib member 125 serves as an opening/closing mechanism for the upper lid part 123, it is made of a material with higher strength than the upper lid part 123 so that the extension part 125a does not deform. Note that, in order to improve worker safety, a stopper such as a support may be further provided to prevent the upper lid portion 123 from closing unintentionally.
 <リブ部材の取付構成>
 図3(a)、(b)を参照して、リブ部材125の上蓋部123に対する取付構成について詳細を説明する。図3(a)は、比較例のリブ部材125の取付構成を示す模式的断面図であり、図3(b)は、本実施例のリブ部材125の取付構成を示す模式的断面図である。
<Rib member mounting configuration>
With reference to FIGS. 3(a) and 3(b), details of the attachment structure of the rib member 125 to the upper lid portion 123 will be described. FIG. 3(a) is a schematic cross-sectional view showing the mounting structure of the rib member 125 of the comparative example, and FIG. 3(b) is a schematic cross-sectional view showing the mounting structure of the rib member 125 of the present example. .
 上述の通り、加熱室12は、チャンバー内部の圧力状態が繰り返し変化するため、上蓋部123を含むチャンバー全体が繰り返し変形する。このとき、図3(a)に示す比較例のように、リブ部材125と上蓋部123が直接接触している構成においては、チャンバー変形時にリブ部材125と上蓋部123が摺接して、両部材が削られることで細かい粒状の削れ粉51が発生することがある。上蓋部123の開閉時に、削れ粉51が加熱室12の内部に入り込むと、基板に削れ粉51が付着して製造不良が発生するなどの問題が生じうる。そこで、本願発明者らは、削れ粉51の発生や飛散を防止するため、リブ部材125と上蓋部123の境界部に粉塵飛散防止部材を設けることを着想した。 As described above, in the heating chamber 12, since the pressure state inside the chamber changes repeatedly, the entire chamber including the upper lid portion 123 repeatedly deforms. At this time, in a configuration in which the rib member 125 and the upper lid part 123 are in direct contact, as in the comparative example shown in FIG. As a result of the scraping, fine granular scraping powder 51 may be generated. If the shavings 51 enter the heating chamber 12 when the upper lid portion 123 is opened and closed, problems such as the shavings 51 adhering to the substrate and production defects may occur. Therefore, in order to prevent the generation and scattering of the shavings 51, the inventors of the present invention came up with the idea of providing a dust scattering prevention member at the boundary between the rib member 125 and the upper lid part 123.
 図3(b)に示すように、本実施例においては、上蓋部123とリブ部材125の間に、潤滑剤としてグリース129が塗布される構成とした。グリース129が上蓋部123とリブ部材125の間に介在することにより、上蓋部123とリブ部材125間の摩擦係数が減少し、両部材が摺接したときに削れ粉51の発生を抑制することができる。更に、削れ粉51が発生したとしても、削れ粉51はグリース129内に取り込まれるため、削れ粉51が外へ飛散することを防止できる。 As shown in FIG. 3(b), in this embodiment, grease 129 is applied as a lubricant between the upper lid portion 123 and the rib member 125. By interposing the grease 129 between the upper lid part 123 and the rib member 125, the coefficient of friction between the upper lid part 123 and the rib member 125 is reduced, and the generation of shavings 51 is suppressed when both members come into sliding contact. Can be done. Further, even if the shavings 51 are generated, the shavings 51 are captured in the grease 129, so that the shavings 51 can be prevented from scattering to the outside.
 以上のように、本実施例によれば、リブ部材等の補強部材がチャンバーの壁面に設けられている場合でも、削れ粉の発生を抑制し、飛散を防止することができる。ひいては、削れ粉が起因の基板の製造不良や装置の汚れ等の問題発生を抑制できる。 As described above, according to this embodiment, even if a reinforcing member such as a rib member is provided on the wall surface of the chamber, generation of scraped powder can be suppressed and scattering can be prevented. Furthermore, it is possible to suppress the occurrence of problems such as manufacturing defects in the substrate and contamination of the device due to the scraped powder.
 (変形例)
 次に、図4(a)、(b)を参照して、本発明の変形例について説明する。図4(a)は、変形例1に係るリブ部材125の取付構成を示す模式的断面図である。変形例1は、上述の実施例に対して、粉塵飛散防止部材としてテープ部材131が更に加えられた構成である。テープ部材131は、リブ部材125と上蓋部123の境界部全体を覆うように設けられる。このような構成とすることで、グリース129の外に飛び出た削れ粉51やグリース129自体が飛散することを防止できる。すなわち、粉塵飛散防止部材は、一種類に限らず複数種類を組み合わせて真空チャンバーに設けられても良い。
(Modified example)
Next, a modification of the present invention will be described with reference to FIGS. 4(a) and 4(b). FIG. 4(a) is a schematic cross-sectional view showing the mounting configuration of the rib member 125 according to the first modification. Modification 1 has a configuration in which a tape member 131 is further added as a dust scattering prevention member to the above-described embodiment. The tape member 131 is provided so as to cover the entire boundary between the rib member 125 and the upper lid part 123. With this configuration, it is possible to prevent the shavings 51 and the grease 129 itself from scattering outside the grease 129. That is, the dust scattering prevention member is not limited to one type, and a combination of multiple types may be provided in the vacuum chamber.
 図4(b)は、変形例2に係るリブ部材125の取付構成を示す模式的断面図である。変形例2は、上述の実施例に対して、粉塵飛散防止部材としてグリース129の代わりに液体ガスケット133が設けられた構成である。液体ガスケット133は、リブ部材125と上蓋部123の境界部全体を覆うように設けられるシリコンシーラントである。変形例2においては、リブ部材125と上蓋部123の間に潤滑剤等が介在していないため、削れ粉51の発生は抑制されない。しかしながら、境界部の全体が液体ガスケット133に覆われているため、削れ粉51は外に飛散することなく、液体ガスケット133、リブ部材125、上蓋部123の間に閉じ込められる。ひいては、変形例2によれば、潤滑剤をリブ部材125と上蓋部123の間に介在させることなく、削れ粉51の飛散を防止できる。 FIG. 4(b) is a schematic cross-sectional view showing the mounting configuration of the rib member 125 according to the second modification. Modification 2 has a configuration in which a liquid gasket 133 is provided in place of the grease 129 as a dust scattering prevention member in the above-described embodiment. The liquid gasket 133 is a silicone sealant provided so as to cover the entire boundary between the rib member 125 and the upper lid part 123. In the second modification, since there is no lubricant or the like interposed between the rib member 125 and the upper lid portion 123, the generation of scraped powder 51 is not suppressed. However, since the entire boundary portion is covered by the liquid gasket 133, the shavings 51 are trapped between the liquid gasket 133, the rib member 125, and the upper lid portion 123 without scattering to the outside. Furthermore, according to the second modification, scattering of the scraped powder 51 can be prevented without interposing a lubricant between the rib member 125 and the upper lid part 123.
 なお、本発明の構成は上述の構成に限られたものではなく、上述の実施例に具現された発明と同一性を失わない範囲で種々の変更が可能である。例えば、真空チャンバーはグリース129を設けずにテープ部材131のみ設ける構成や、グリース129を塗布した上で液体ガスケット133を設ける構成としても良い。 Note that the configuration of the present invention is not limited to the above-described configuration, and various changes can be made without losing the sameness as the invention embodied in the above-described embodiments. For example, the vacuum chamber may have a structure in which only the tape member 131 is provided without the grease 129, or a structure in which the liquid gasket 133 is provided after applying the grease 129.
 また、上述の実施例は、チャンバーの上蓋部の面に補強部材を設ける構成としたが、本発明は、チャンバーの本体部の外壁面や内壁面に補強部材が設けられる構成に適用しても良い。また、上述の実施例では、加熱室に本発明を適用した例について説明したが、成膜装置を構成するその他の真空チャンバーにも本発明を適用することができる。例えば、成膜室なども成膜装置の稼働と停止が繰り返されることにより、内部の圧力状態が変化するため、成膜室に本発明を適用することにより削れ粉の飛散を防止できる。 Further, although the above-described embodiments have a structure in which a reinforcing member is provided on the surface of the upper lid portion of the chamber, the present invention may also be applied to a structure in which a reinforcing member is provided on the outer wall surface or inner wall surface of the main body portion of the chamber. good. Further, in the above-described embodiments, an example in which the present invention is applied to a heating chamber has been described, but the present invention can also be applied to other vacuum chambers that constitute a film forming apparatus. For example, since the internal pressure state of a film forming chamber changes due to repeated operation and stop of the film forming apparatus, scattering of shavings can be prevented by applying the present invention to the film forming chamber.
 <成膜室>
 図5を参照して、成膜室13における成膜処理について、より詳細に説明する。成膜室13内には、成膜源としての蒸発源7が設けられている。基板キャリア5に保持された基板3の被処理面が下向きとなるように、これらは成膜室13内に位置決めされた状態で支持される。これにより、基板キャリア5に保持された基板3上に成膜が行われる。
<Film forming chamber>
With reference to FIG. 5, the film forming process in the film forming chamber 13 will be described in more detail. In the film forming chamber 13, an evaporation source 7 is provided as a film forming source. The substrate 3 held by the substrate carrier 5 is positioned and supported within the film forming chamber 13 so that the surface to be processed faces downward. As a result, a film is formed on the substrate 3 held by the substrate carrier 5.
 本実施例においては、真空蒸着による成膜(蒸着)が行われる。具体的には、蒸発源7から成膜材料が蒸発又は昇華し、基板3上に成膜材料が蒸着して基板3上に薄膜が形成される。蒸発源7については、公知技術であるので、その詳細な説明は省略する。例えば、蒸発源7は、坩堝等の成膜材料を収容する容器と、容器を加熱する加熱装置等により構成することができる。なお、成膜源は蒸発源7に限定されるものではなく、成膜源はスパッタリングによって成膜を行うためのスパッタリングカソードであってもよい。 In this example, film formation (vapor deposition) is performed by vacuum evaporation. Specifically, the film-forming material is evaporated or sublimated from the evaporation source 7, and the film-forming material is vapor-deposited onto the substrate 3 to form a thin film on the substrate 3. Since the evaporation source 7 is a known technology, detailed explanation thereof will be omitted. For example, the evaporation source 7 can be configured with a container such as a crucible that houses the film forming material, a heating device that heats the container, and the like. Note that the film forming source is not limited to the evaporation source 7, and may be a sputtering cathode for forming a film by sputtering.
 <電子デバイスの製造方法>
 次に、本実施例に係る成膜装置を用いた電子デバイスの製造方法の一例を説明する。以下、電子デバイスの例として有機EL表示装置の構成を示し、有機EL表示装置の製造方法を例示する。
<Method for manufacturing electronic devices>
Next, an example of a method for manufacturing an electronic device using the film forming apparatus according to this embodiment will be described. Hereinafter, the configuration of an organic EL display device will be shown as an example of an electronic device, and a method for manufacturing the organic EL display device will be illustrated.
 まず、製造する有機EL表示装置について説明する。図6(a)は有機EL表示装置700の全体図、図6(b)は1画素の断面構造を表している。 First, the organic EL display device to be manufactured will be explained. FIG. 6(a) shows an overall view of the organic EL display device 700, and FIG. 6(b) shows a cross-sectional structure of one pixel.
 図6(a)に示すように、有機EL表示装置700の表示領域701には、発光素子を複数備える画素702がマトリクス状に複数配置されている。詳細は後で説明するが、発光素子のそれぞれは、一対の電極に挟まれた有機層を備えた構造を有している。なお、ここでいう画素とは、表示領域701において所望の色の表示を可能とする最小単位を指している。本実施例に係る有機EL表示装置の場合、互いに異なる発光を示す第1発光素子702R、第2発光素子702G、第3発光素子702Bの組み合わせにより画素702が構成されている。画素702は、赤色発光素子と緑色発光素子と青色発光素子の組み合わせで構成されることが多いが、黄色発光素子とシアン発光素子と白色発光素子の組み合わせでもよく、少なくとも1色以上であれば特に制限されるものではない。 As shown in FIG. 6(a), in the display area 701 of the organic EL display device 700, a plurality of pixels 702 each including a plurality of light emitting elements are arranged in a matrix. Although details will be explained later, each light emitting element has a structure including an organic layer sandwiched between a pair of electrodes. Note that the pixel herein refers to the smallest unit that can display a desired color in the display area 701. In the case of the organic EL display device according to this embodiment, a pixel 702 is configured by a combination of a first light emitting element 702R, a second light emitting element 702G, and a third light emitting element 702B that emit light different from each other. The pixel 702 is often composed of a combination of a red light-emitting element, a green light-emitting element, and a blue light-emitting element, but it may also be a combination of a yellow light-emitting element, a cyan light-emitting element, and a white light-emitting element. There are no restrictions.
 図6(b)は、図6(a)のB-B線における部分断面模式図である。画素702は、複数の発光素子からなり、各発光素子は、基板703上に、第1電極(陽極)704と、正孔輸送層705と、発光層706R、706G、706Bのいずれかと、電子輸送層707と、第2電極(陰極)708と、を有している。これらのうち、正孔輸送層705、発光層706R、706G、706B、電子輸送層707が有機層に当たる。また、本実施例では、発光層706Rは赤色を発する有機EL層、発光層706Gは緑色を発する有機EL層、発光層706Bは青色を発する有機EL層である。発光層706R、706G、706Bは、それぞれ赤色、緑色、青色を発する発光素子(有機EL素子と記述する場合もある)に対応するパターンに形成されている。 FIG. 6(b) is a schematic partial cross-sectional view taken along line BB in FIG. 6(a). The pixel 702 consists of a plurality of light emitting elements, and each light emitting element has a first electrode (anode) 704, a hole transport layer 705, one of the light emitting layers 706R, 706G, and 706B, and an electron transport layer on a substrate 703. It has a layer 707 and a second electrode (cathode) 708. Among these, the hole transport layer 705, the light emitting layers 706R, 706G, and 706B, and the electron transport layer 707 correspond to organic layers. Further, in this embodiment, the light-emitting layer 706R is an organic EL layer that emits red, the light-emitting layer 706G is an organic EL layer that emits green, and the light-emitting layer 706B is an organic EL layer that emits blue. The light-emitting layers 706R, 706G, and 706B are formed in patterns corresponding to light-emitting elements (sometimes referred to as organic EL elements) that emit red, green, and blue, respectively.
 また、第1電極704は、発光素子毎に分離して形成されている。正孔輸送層705と電子輸送層707と第2電極708は、複数の発光素子702R、702G、702Bで共通に形成されていてもよいし、発光素子毎に形成されていてもよい。なお、第1電極704と第2電極708とが異物によってショートするのを防ぐために、第1電極704間に絶縁層709が設けられている。更に、有機EL層は水分や酸素によって劣化するため、水分や酸素から有機EL素子を保護するための保護層710が設けられている。 Furthermore, the first electrode 704 is formed separately for each light emitting element. The hole transport layer 705, the electron transport layer 707, and the second electrode 708 may be formed in common for the plurality of light emitting elements 702R, 702G, and 702B, or may be formed for each light emitting element. Note that an insulating layer 709 is provided between the first electrodes 704 in order to prevent the first electrodes 704 and the second electrodes 708 from shorting due to foreign matter. Furthermore, since the organic EL layer deteriorates due to moisture and oxygen, a protective layer 710 is provided to protect the organic EL element from moisture and oxygen.
 図6(b)では正孔輸送層705や電子輸送層707は一つの層で示されているが、有機EL表示素子の構造によっては、正孔ブロック層や電子ブロック層を備える複数の層で形成されてもよい。また、第1電極704と正孔輸送層705との間には第1電極704から正孔輸送層705への正孔の注入が円滑に行われるようにすることのできるエネルギーバンド構造を有する正孔注入層を形成することもできる。同様に、第2電極708と電子輸送層707の間にも電子注入層が形成することもできる。 Although the hole transport layer 705 and electron transport layer 707 are shown as one layer in FIG. 6(b), depending on the structure of the organic EL display element, they may be formed as multiple layers including a hole blocking layer and an electron blocking layer. may be formed. Further, between the first electrode 704 and the hole transport layer 705, a positive hole having an energy band structure that allows holes to be smoothly injected from the first electrode 704 to the hole transport layer 705 is provided. A hole injection layer can also be formed. Similarly, an electron injection layer can also be formed between the second electrode 708 and the electron transport layer 707.
 次に、有機EL表示装置の製造方法の例について具体的に説明する。 Next, an example of a method for manufacturing an organic EL display device will be specifically described.
 まず、有機EL表示装置を駆動するための回路(不図示)及び第1電極704が形成された基板(マザーガラス)703を準備する。 First, a substrate (mother glass) 703 on which a circuit (not shown) for driving an organic EL display device and a first electrode 704 are formed is prepared.
 第1電極704が形成された基板703の上にアクリル樹脂をスピンコートで形成し、アクリル樹脂をリソグラフィ法により、第1電極704が形成された部分に開口が形成されるようにパターニングし絶縁層709を形成する。この開口部が、発光素子が実際に発光する発光領域に相当する。 Acrylic resin is formed by spin coating on the substrate 703 on which the first electrode 704 is formed, and the acrylic resin is patterned by lithography so that an opening is formed in the part where the first electrode 704 is formed, and an insulating layer is formed. Form 709. This opening corresponds to the light emitting region where the light emitting element actually emits light.
 絶縁層709がパターニングされた基板703を粘着部材が配置された基板キャリアに載置する。粘着部材によって、基板703は保持される。第1の有機材料成膜装置に搬入し、反転後、正孔輸送層705を、表示領域の第1電極704の上に共通する層として成膜する。正孔輸送層705は真空蒸着により成膜される。実際には正孔輸送層705は表示領域701よりも大きなサイズに形成されるため、高精細なマスクは不要である。 A substrate 703 with a patterned insulating layer 709 is placed on a substrate carrier on which an adhesive member is arranged. The substrate 703 is held by the adhesive member. After being carried into a first organic material film forming apparatus and inverted, a hole transport layer 705 is formed as a common layer on the first electrode 704 in the display area. The hole transport layer 705 is formed by vacuum deposition. In reality, the hole transport layer 705 is formed to have a larger size than the display area 701, so a high-definition mask is not required.
 次に、正孔輸送層705までが形成された基板703を第2の有機材料成膜装置に搬入する。基板とマスクとのアライメントを行い、基板をマスクの上に載置し、基板703の赤色を発する素子を配置する部分に、赤色を発する発光層706Rを成膜する。 Next, the substrate 703 on which up to the hole transport layer 705 has been formed is carried into a second organic material film forming apparatus. The substrate and the mask are aligned, the substrate is placed on the mask, and a light-emitting layer 706R that emits red light is formed on a portion of the substrate 703 where an element that emits red light is to be arranged.
 発光層706Rの成膜と同様に、第3の有機材料成膜装置により緑色を発する発光層706Gを成膜し、更に第4の有機材料成膜装置により青色を発する発光層706Bを成膜する。発光層706R、706G、706Bの成膜が完了した後、第5の成膜装置により表示領域701の全体に電子輸送層707を成膜する。電子輸送層707は、3色の発光層706R、706G、706Bに共通の層として形成される。 Similar to the formation of the light-emitting layer 706R, a light-emitting layer 706G that emits green light is formed by a third organic material film-forming device, and a light-emitting layer 706B that emits blue light is further formed by a fourth organic material film-forming device. . After the formation of the light emitting layers 706R, 706G, and 706B is completed, the electron transport layer 707 is formed over the entire display area 701 using a fifth film formation apparatus. The electron transport layer 707 is formed as a layer common to the three color light emitting layers 706R, 706G, and 706B.
 電子輸送層707まで形成された基板を金属性蒸着材料成膜装置で移動させて第2電極708を成膜する。 A second electrode 708 is formed by moving the substrate on which the electron transport layer 707 has been formed using a metal vapor deposition material film forming apparatus.
 その後プラズマCVD装置に移動して保護層710を成膜して、基板703への成膜工程を完了する。反転後、粘着部材を基板703から剥離することで、基板キャリアから基板703を分離する。その後、裁断を経て有機EL表示装置700が完成する。 Thereafter, the film is moved to a plasma CVD apparatus and a protective layer 710 is formed, thereby completing the film forming process on the substrate 703. After inversion, the adhesive member is peeled off from the substrate 703 to separate the substrate 703 from the substrate carrier. Thereafter, the organic EL display device 700 is completed through cutting.
 絶縁層709がパターニングされた基板703を成膜装置に搬入してから保護層710の成膜が完了するまでは、水分や酸素を含む雰囲気にさらしてしまうと、有機EL材料からなる発光層が水分や酸素によって劣化してしまうおそれがある。従って、本実施例において、成膜装置間の基板の搬入搬出は、真空雰囲気又は不活性ガス雰囲気の下で行われる。 If the substrate 703 on which the insulating layer 709 has been patterned is exposed to an atmosphere containing moisture or oxygen from the time the substrate 703 on which the insulating layer 709 has been patterned is carried into the film forming apparatus until the film forming of the protective layer 710 is completed, the light emitting layer made of the organic EL material may There is a risk of deterioration due to moisture and oxygen. Therefore, in this embodiment, substrates are carried in and out between film forming apparatuses under a vacuum atmosphere or an inert gas atmosphere.
 12…加熱室(真空チャンバー)、125…リブ部材(補強部材)、127…ボルト(取付具)、129…グリース(粉塵飛散防止部材) 12... Heating chamber (vacuum chamber), 125... Rib member (reinforcing member), 127... Bolt (mounting tool), 129... Grease (dust scattering prevention member)

Claims (13)

  1.  内部を減圧可能なチャンバーと、
     前記チャンバーの壁面に沿って設けられる補強部材と、
     前記補強部材を前記壁面に取り付ける取付具と、
     前記補強部材と前記チャンバーの境界部に設けられる粉塵飛散防止部材と、を備えることを特徴とする真空チャンバー。
    A chamber whose interior can be decompressed;
    a reinforcing member provided along the wall surface of the chamber;
    a fixture for attaching the reinforcing member to the wall surface;
    A vacuum chamber comprising the reinforcing member and a dust scattering prevention member provided at a boundary between the chamber.
  2.  前記補強部材は、前記壁面に沿って延びるリブ部材であることを特徴とする請求項1に記載の真空チャンバー。 The vacuum chamber according to claim 1, wherein the reinforcing member is a rib member extending along the wall surface.
  3.  前記取付具は、前記リブ部材と前記壁面の内部を挿通されるネジ部品であることを特徴とする請求項2に記載の真空チャンバー。 The vacuum chamber according to claim 2, wherein the fixture is a screw component that is inserted through the rib member and the wall surface.
  4.  前記粉塵飛散防止部材は、前記補強部材と前記チャンバーの間に介在する潤滑剤であることを特徴とする請求項1に記載の真空チャンバー。 The vacuum chamber according to claim 1, wherein the dust scattering prevention member is a lubricant interposed between the reinforcing member and the chamber.
  5.  前記潤滑剤は、グリースであることを特徴とする請求項4に記載の真空チャンバー。 The vacuum chamber according to claim 4, wherein the lubricant is grease.
  6.  前記粉塵飛散防止部材は、前記補強部材と前記チャンバーの境界部を覆う液体ガスケットであることを特徴とする請求項1に記載の真空チャンバー。 The vacuum chamber according to claim 1, wherein the dust scattering prevention member is a liquid gasket that covers a boundary between the reinforcing member and the chamber.
  7.  前記粉塵飛散防止部材は、前記補強部材と前記チャンバーの境界部を覆うテープ部材であることを特徴とする請求項1に記載の真空チャンバー。 The vacuum chamber according to claim 1, wherein the dust scattering prevention member is a tape member that covers a boundary between the reinforcing member and the chamber.
  8.  前記チャンバーは、チャンバー本体の開口部を塞ぎ、前記チャンバー本体に対して開閉可能に構成される蓋部を含み、
     前記壁面は、前記蓋部の面であることを特徴とする請求項1に記載の真空チャンバー。
    The chamber includes a lid that closes an opening of the chamber body and is configured to be openable and closable with respect to the chamber body,
    The vacuum chamber according to claim 1, wherein the wall surface is a surface of the lid.
  9.  前記蓋部に対して接続されるシリンダー機構を更に備え、
     前記シリンダー機構のストロークの変動により、前記蓋部は前記チャンバー本体に対して回転して開閉されることを特徴とする請求項8に記載の真空チャンバー。
    further comprising a cylinder mechanism connected to the lid,
    9. The vacuum chamber according to claim 8, wherein the lid portion rotates relative to the chamber body to open and close due to fluctuations in the stroke of the cylinder mechanism.
  10.  前記補強部材は、前記補強部材が取り付けられる前記壁面に垂直な方向から見たときに、前記チャンバーより外側に延びる延長部を有し、
     前記シリンダー機構は、前記補強部材の前記延長部を介して、前記蓋部に対して接続されることを特徴とする請求項9に記載の真空チャンバー。
    The reinforcing member has an extension extending outward from the chamber when viewed from a direction perpendicular to the wall surface to which the reinforcing member is attached,
    The vacuum chamber according to claim 9, wherein the cylinder mechanism is connected to the lid part via the extension part of the reinforcing member.
  11.  内部を減圧可能なチャンバーと、
     前記チャンバーの壁面に沿って設けられる補強部材と、
     前記補強部材を前記壁面に取り付ける取付具と、
     前記補強部材と前記チャンバーの接触部に塗布された潤滑剤と、を備えることを特徴とする真空チャンバー。
    A chamber whose interior can be decompressed;
    a reinforcing member provided along the wall surface of the chamber;
    a fixture for attaching the reinforcing member to the wall surface;
    A vacuum chamber comprising: a lubricant applied to a contact portion of the reinforcing member and the chamber.
  12.  前記補強部材と前記チャンバーの接触部を覆うテープ部材を備えることを特徴とする請求項11に記載の真空チャンバー。 The vacuum chamber according to claim 11, further comprising a tape member that covers a contact portion between the reinforcing member and the chamber.
  13.  基板を収容する収容室と、
     前記収容室から搬入される基板に対して加熱処理を行う加熱室と、
     前記加熱室から搬入される基板に対して成膜処理を行う成膜室と、
    を備える成膜装置であって、
     前記加熱室は、請求項1~12のいずれか1項に記載の真空チャンバーであることを特徴とする成膜装置。
    a storage chamber for accommodating the board;
    a heating chamber that performs heat treatment on the substrate carried in from the storage chamber;
    a film forming chamber that performs a film forming process on a substrate brought in from the heating chamber;
    A film forming apparatus comprising:
    A film forming apparatus characterized in that the heating chamber is a vacuum chamber according to any one of claims 1 to 12.
PCT/JP2023/018595 2022-07-21 2023-05-18 Vacuum chamber and film formation apparatus WO2024018742A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-116266 2022-07-21
JP2022116266A JP2024013863A (en) 2022-07-21 2022-07-21 Vacuum chamber and film forming equipment

Publications (1)

Publication Number Publication Date
WO2024018742A1 true WO2024018742A1 (en) 2024-01-25

Family

ID=89617359

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2023/018595 WO2024018742A1 (en) 2022-07-21 2023-05-18 Vacuum chamber and film formation apparatus

Country Status (2)

Country Link
JP (1) JP2024013863A (en)
WO (1) WO2024018742A1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007277667A (en) * 2006-04-10 2007-10-25 Sumitomo Heavy Ind Ltd Vacuum chamber, and substrate treatment apparatus having the same
WO2009078351A1 (en) * 2007-12-14 2009-06-25 Ulvac, Inc. Chamber and film-forming apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007277667A (en) * 2006-04-10 2007-10-25 Sumitomo Heavy Ind Ltd Vacuum chamber, and substrate treatment apparatus having the same
WO2009078351A1 (en) * 2007-12-14 2009-06-25 Ulvac, Inc. Chamber and film-forming apparatus

Also Published As

Publication number Publication date
JP2024013863A (en) 2024-02-01

Similar Documents

Publication Publication Date Title
KR102151616B1 (en) In-line deposition system and method for operating an evaporation source for organic material
US7820231B2 (en) Manufacturing apparatus
KR101901072B1 (en) Evaporation source device, film formation apparatus, film formation method and manufacturing method of electronic device
JP6642936B2 (en) OLED sealing mask management system and method
KR102158305B1 (en) Method for hybrid encapsulation of an organic light emitting diode
US10158098B2 (en) Encapsulating film stacks for OLED applications
KR101281909B1 (en) Thin film deposition device
US20100170439A1 (en) Vapor deposition apparatus
JP2008019477A (en) Vacuum vapor deposition apparatus
KR20070012508A (en) Method and apparatus of depositing low temperature inorganic films on plastic substrates
US20190036027A1 (en) A shadow mask with tapered openings formed by double electroforming
JP2008115441A (en) Film deposition mask exchange method and film deposition mask exchange system
WO2024018742A1 (en) Vacuum chamber and film formation apparatus
US20190036026A1 (en) A shadow mask with tapered openings formed by double electroforming using positive/negative photoresists
US9340851B2 (en) Device and method for preprocessing metallic magnesium
KR20090031616A (en) Deposition apparatus, deposition system and deposition method
JP6556802B2 (en) Vacuum equipment, vapor deposition equipment and gate valve
JP2013220421A (en) Nozzle and coating apparatus
US20170047867A1 (en) Electrostatic chuck with electrostatic fluid seal for containing backside gas
KR20180060139A (en) OLED thermal vacuum evaporation system
EP4127260A1 (en) Evaporation source, deposition apparatus having an evaporation source, and methods therefor
JP2003317951A (en) Vapor deposition device and method of organic thin film
KR20060115829A (en) Encapsulation layer of electric device and fabrication method for the same
DE102017122950A1 (en) Vacuum chamber assembly and method of operating a vacuum assembly
US20100055816A1 (en) Light Emitting Device Manufacturing Apparatus and Method

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 23842674

Country of ref document: EP

Kind code of ref document: A1