WO2023231315A1 - 光学感测装置及其感测方法 - Google Patents

光学感测装置及其感测方法 Download PDF

Info

Publication number
WO2023231315A1
WO2023231315A1 PCT/CN2022/132710 CN2022132710W WO2023231315A1 WO 2023231315 A1 WO2023231315 A1 WO 2023231315A1 CN 2022132710 W CN2022132710 W CN 2022132710W WO 2023231315 A1 WO2023231315 A1 WO 2023231315A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
sensing
ambient light
diode
sensing device
Prior art date
Application number
PCT/CN2022/132710
Other languages
English (en)
French (fr)
Inventor
孙伯伟
陈经纬
胡耀升
Original Assignee
神盾股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 神盾股份有限公司 filed Critical 神盾股份有限公司
Publication of WO2023231315A1 publication Critical patent/WO2023231315A1/zh

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G01S17/14—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves wherein a voltage or current pulse is initiated and terminated in accordance with the pulse transmission and echo reception respectively, e.g. using counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4861—Circuits for detection, sampling, integration or read-out

Definitions

  • the present invention relates to a sensing device, and in particular, to an optical sensing device and a sensing method thereof.
  • Integrated chips (ICs) with photonic devices exist in many modern electronic devices.
  • photonic devices including image sensors are used in cameras, video recorders, and other types of photographic systems to capture images.
  • light sensing chips often use photocurrent integration to convert the current into voltage, and then use an analog-to-digital converter for decoding.
  • Analog-to-digital converters have the disadvantages of complex design and power consumption.
  • a high-precision analog-to-digital conversion circuit is required for noise control or an increase in the number of light sensing diodes to improve sensing sensitivity.
  • the circuit area will be increased and the cost will be increased.
  • using photocurrent integration for signal processing requires sufficient integration time to prevent the signal-to-noise ratio from being too low, which will significantly limit the data report rate.
  • the present invention provides an optical sensing device and a sensing method thereof, which can accurately determine the optical characteristics of ambient light without increasing circuit area, cost and power consumption in the case of weak ambient light, and provide good Sensing quality and data return rate, and compared with traditional light sensing diodes, the same sensing sensitivity can be achieved in a smaller circuit area.
  • the optical sensing device of the present invention includes a bias voltage generating circuit, at least one light sensing diode, a quenching circuit, a counter circuit and a signal processing circuit.
  • the bias voltage generating circuit provides a collapse bias voltage or a standard bias voltage.
  • the cathode terminal of the light sensing diode is coupled to the bias voltage generating circuit to sense ambient light and generate a light sensing signal.
  • the quenching circuit is coupled to the anode terminal of the light sensing diode to quench the light sensing diode.
  • the counter circuit is coupled to the anode terminal of the light sensing diode, and counts the number of collapses of the light sensing diode according to the light sensing signal generated by the light sensing diode during receiving the breakdown bias voltage to generate a count value.
  • the signal processing circuit is coupled to the counter circuit, samples the count value to generate a plurality of sample values, and determines the optical characteristics of the ambient light based on the sample values.
  • the invention also provides a sensing method of an optical sensing device, which includes the following steps.
  • a collapse bias voltage is provided to at least one light sensing diode.
  • the number of collapses of the light sensing diode is counted to generate a count value. Sampling the count value produces multiple sample values. Determine the light characteristics of the ambient light based on the sampled values.
  • the light sensing diode can receive the collapse bias voltage and sense the ambient light to generate a light sensing signal.
  • the counter circuit can count the number of collapses of the light sensing diode according to the light sensing signal to generate a count value.
  • the signal processing circuit can sample the count value to generate multiple sampling values, and determine the light characteristics of the ambient light based on the multiple sampling values.
  • the light-sensing diode in an extremely reverse-biased state is used to sense ambient light
  • the counting value of the counter circuit is used to calculate the light intensity sensed by the light-sensing diode. This avoids the use of an integrator circuit and can be used in weak conditions.
  • FIG. 1 is a schematic diagram of an optical sensing device according to an embodiment of the present invention.
  • FIG. 2 is a waveform diagram of a light sensing signal according to an embodiment of the present invention.
  • FIG. 3 is a waveform diagram of a count value according to an embodiment of the present invention.
  • FIG. 4 is a schematic diagram of an optical sensing device according to another embodiment of the present invention.
  • FIG. 5 is a schematic diagram of an optical sensing device according to another embodiment of the present invention.
  • FIG. 6 is a schematic diagram of an optical sensing device according to another embodiment of the present invention.
  • FIG. 7 is a flow chart of a sensing method of an optical sensing device according to an embodiment of the present invention.
  • FIG. 8 is a flow chart of a sensing method of an optical sensing device according to another embodiment of the present invention.
  • FIG. 1 is a schematic diagram of an optical sensing device according to an embodiment of the present invention.
  • the optical sensing device may include a bias voltage generation circuit 102, a light sensing diode PD1 (for example, a Single Photon Avalanche Diode, SPAD), a quenching circuit 104, a counter circuit 106, and a signal processing circuit 108.
  • the bias voltage generating circuit 102 is coupled to the cathode terminal of the light sensing diode PD1
  • the quenching circuit 104 is coupled to the anode terminal of the light sensing diode PD1.
  • the bias voltage generating circuit 102 can be used to provide a collapse bias voltage or a standard bias voltage to the light sensing diode PD1, so that the light sensing diode PD1 enters an extreme reverse bias or reverse bias state.
  • the light sensing diode PD1 is in an extremely reverse biased state, when the photons of the ambient light L1 are injected into the depletion layer of the light sensing diode PD1, the light sensing diode PD1 can be triggered to generate an avalanche current, thereby providing light sensing. Signal S1.
  • the quenching circuit 104 can quench the light sensing diode PD1 after the light sensing diode PD1 provides the light sensing signal S1, so as to restore the anode terminal voltage of the light sensing diode PD1 to the voltage before the light sensing signal S1 is provided.
  • the quenching circuit 104 is active or passive, which is not limited by the present invention. It is worth noting that although only one light sensing unit formed by the light sensing diode PD1 and the quenching circuit 104 is shown in the embodiment of FIG. 1, it is not limited to this. In other embodiments, the optical sensing unit is The device may include more light sensing units, such as a light sensing unit array formed by a plurality of light sensing units and the counter circuit 106 .
  • the counter circuit 106 can count the number of collapses of the light sensing diode PD1 according to the light sensing signal S1 generated by the light sensing diode PD1 during receiving the collapse bias voltage and generate the count value C1 to the signal processing circuit 108.
  • the signal processing circuit 108 can count the number of collapses of the light sensing diode PD1 according to the The count value C1 determines the light intensity sensed by the light sensing diode PD1. For example, as shown in FIG.
  • the signal processing circuit 108 can count the number of pulses of the light sensing signal S1 during the light sensing period T1 according to the counter circuit 106 (that is, the number of collapses of the light sensing diode PD1 during the light sensing period T1 ) to determine the light intensity sensed by the light sensing diode PD1 during the light sensing period T1.
  • the light sensing period T1 can be, for example, the period during which the light sensing diode PD1 receives the collapse bias voltage. However, it is not limited to this.
  • the light sensing diode PD1 receives ambient light.
  • the counter circuit 106 can periodically re-count the number of pulses of the light sensing signal S1, for example, re-count the number of pulses of the light sensing signal S1 every light sensing period T1, so that in In the case where the intensity change of the ambient light L1 has a specific frequency, the change in the count value generated by the counter circuit 106 will also have a specific frequency as shown in FIG. 3 .
  • the signal processing circuit 108 may sample the count value generated by the counter circuit 106 to generate multiple sample values, for example, generate multiple sample values based on the count value generated by the sampling counter circuit 106 at a preset sampling frequency. It is worth noting that the sampling frequency of the signal processing circuit 108 is not limited to FIG. 3 .
  • the signal processing circuit 108 can also sample the count value at a higher or lower preset sampling frequency.
  • the sampling time can be, for example, the sampling frequency. 2N times the reciprocal, where N is a positive integer, but it is not limited to this.
  • the signal processing circuit 108 can determine the light characteristics of the ambient light L1 based on the sampled values.
  • the signal processing circuit 108 can determine the frequency of the ambient light L1 based on changes in the amplitude of the sampled value over time.
  • the signal processing circuit 108 may also perform spectrum analysis on the sampled values, such as fast Fourier transform (FFT) on the sampled values, to obtain the harmonic distribution of the light sensing signal S1.
  • FFT fast Fourier transform
  • the signal processing circuit 108 can also determine whether there is a flicker phenomenon based on the amplitude of the harmonic in the frequency domain. For example, when the harmonic amplitude of a certain frequency in the frequency domain is higher than a preset threshold, it means that the ambient light L1 flickers at this frequency.
  • the signal processing circuit 108 may also first calculate the average value of the sampled values, and then subtract the average value from the sampled values to remove the DC component of the sampled values, and then perform a fast Fourier transform on the sampled values with the DC component removed. .
  • the optical sensing device's resistance to noise can be improved. Resistance ability, the light characteristics of ambient light can still be accurately judged under weak ambient light conditions, so that the light sensing device has good sensing quality and data return rate, in addition, there is no need to set up an integrator and an analog-to-digital converter , which can further reduce the circuit area, reduce power consumption and reduce production costs. Compared with traditional light sensing diodes, the same sensing sensitivity can be achieved in a smaller circuit area.
  • the signal processing circuit 108 can also compensate the count value according to the error compensation value and correct the count value provided by the counter circuit 106, where the error compensation value can, for example, include the dark current of the corresponding light sensing diode PD1 At least one of the count values or the count values corresponding to crosstalk interference between adjacent light sensing diodes.
  • the signal processing circuit 108 may, for example, subtract the error compensation value from the count value C1 to more accurately obtain the count value corresponding to the ambient light L1, thereby further improving the sensing quality of the optical sensing device.
  • FIG. 4 is a schematic diagram of an optical sensing device according to another embodiment of the present invention.
  • the optical sensing device may further include a filter layer F1.
  • the filter layer F1 may be, for example, a color filter, such as a green, red or blue color filter, but is not limited thereto.
  • the filter layer F1 can band-pass filter the ambient light L1, so that the count value provided by the counter circuit 106 represents the optical characteristics of the ambient light L1 within the bandwidth range of the corresponding color filter. For example, the light intensity and flicker rate of the ambient light L1 within the bandwidth range of the color filter are not limited to this.
  • the signal processing circuit 108 can generate a corresponding sampling value based on the count value generated by the preset sampling frequency sampling counter circuit 106, and determine the ambient light L1 within the bandwidth range of the filter layer F1 based on the sampling value of the light sensing diode PD1. strength. For example, when the filter layer F1 is a red filter, the signal processing circuit 108 can determine the light intensity of the ambient light L1 in the red light wavelength range based on the sampled value.
  • the optical sensing device may also include multiple different filter layers. As shown in FIG. 5 , the optical sensing device may include multiple filter layers F1 ⁇ F3.
  • the filter layers F1 to F3 may, for example, have different bandwidth ranges, for example, implemented with green, red, and blue color filters respectively, but are not limited thereto.
  • the filter layers F1-F3 correspond to different light-sensing unit arrays AR1-AR3, and can perform band-pass filtering on the ambient light L1 irradiated to the light-sensing unit arrays AR1-AR3 respectively.
  • the light sensing diodes PD1 of the light sensing unit arrays AR1 ⁇ AR3 can respectively receive the ambient light L1 through the corresponding filter layers F1 ⁇ F3, and the counter circuits 106 of the light sensing unit arrays AR1 ⁇ AR3 can respectively count the to which they are coupled. The number of collapses of the light sensing diode PD1 is generated to generate a corresponding count value.
  • the signal processing circuit 108 may sample the count values of the photo-sensing diodes PD1 of each of the photo-sensing unit arrays AR1 - AR3 according to a preset sampling frequency to generate corresponding sampling values. Since different sensing unit arrays AR1 to AR3 correspond to different filter layers F1 to F3, the count values generated by the counter circuits 106 of the different sensing unit arrays AR1 to AR3 can represent the ambient light L1 in different bandwidth ranges. Therefore, the signal processing circuit 108 can determine the color temperature of the ambient light L1 based on the sampled value obtained by the sampling count value, and further determine the light source type and illumination of the ambient light L1, such as LED, incandescent lamp, sunlight, etc.
  • the signal processing circuit 108 can determine based on the sampled values whether the ambient light L1 is in the green light wavelength range, the red light wavelength range, and the blue color filter.
  • the light intensity in the light wavelength range can be used to know the wavelength distribution of the ambient light L1, and then determine the color temperature, light source type and illumination of the ambient light L1.
  • the corresponding error compensation values can also be subtracted from the count values corresponding to the sensing unit arrays AR1 to AR3, for example, the count values of the dark current corresponding to the sensing unit arrays AR1 to AR3 are subtracted respectively.
  • the count value of the crosstalk interference can be obtained more accurately to obtain the count value corresponding to the ambient light L1, thereby further improving the sensing quality of the optical sensing device.
  • the filter layers F1 to F3 may only cover part of the sensing unit arrays AR1 to AR3, so that part of the photosensing diodes PD1 in the sensing unit arrays AR1 to AR3 can pass through the filter.
  • the layers F1 to F3 receive ambient light L1, and some of the light sensing diodes PD1 directly receive the ambient light L1.
  • the sensing unit arrays AR1 to AR3 respectively have some of the light sensing diodes PD1 to directly receive the ambient light L1.
  • one of the sensing unit arrays AR1 to AR3 may have a part of the light sensing diode PD1 to directly receive the ambient light L1.
  • the signal processing circuit 108 can determine the light intensity of the ambient light L1 in the bandwidth range of the filter layers F1 to F3 based on the sampled values obtained from the sampling count value, and determine the light intensity of the ambient light L1 in the bandwidth range of the filter layers F1 to F3 based on the sampled values.
  • the color temperature can be determined based on the light intensity in the device.
  • the light intensity of the ambient light L1 can also be determined based on the count value of the light sensing diode PD1 that directly receives the ambient light L1.
  • FIG. 6 is a schematic diagram of an optical sensing device according to another embodiment of the present invention.
  • the optical sensing device may further include a switch SW1, a switching circuit 602 and a readout circuit 604.
  • the switch SW1 is coupled between the anode terminal of the photo sensing diode PD1 and the quenching circuit 104.
  • the switching circuit 602 Coupled between the anode terminal of the light sensing diode PD1, the counter circuit 106 and the readout circuit 604, the readout circuit 604 is also coupled to the signal processing circuit 108.
  • the readout circuit 604 can be implemented by, for example, switches SW2 and SW3.
  • the switch SW2 is coupled between the anode terminal of the light sensing diode PD1 and the counter circuit 106.
  • the switch SW3 is coupled between the anode terminal of the light sensing diode PD1 and the readout circuit 106. between circuit 604.
  • the signal processing circuit 108 can control the conduction state of the switches SW1 to SW3 according to the sensing mode of the optical sensing device. For example, when the optical sensing device is in a weak ambient light sensing mode, the control bias voltage generating circuit 102 provides a collapse bias voltage to the light sensing diode PD1, controls the switch SW1 to turn on, and controls the switching circuit 502 to turn the light sensing diode PD
  • the anode end of the switch is connected to the counter circuit 106 (that is, the switch SW2 is controlled to be turned on and the switch SW3 is turned off), so that the optical sensing device can accurately determine the optical characteristics of the ambient light L1 in a low-light environment, and Maintain good sensing quality.
  • the signal processing circuit 108 can control the bias voltage generating circuit 102 to provide a standard bias voltage, control the switch SW1 to turn off and control the switching circuit 502 to turn the anode terminal of the light sensing diode PD1
  • the switch is connected to the readout circuit 504 (that is, the switch SW2 is controlled to be off, and the switch SW3 is controlled to be on), so that the optical sensing device is suitable for sensing the ambient light L1 in a higher illumination environment.
  • the standard bias voltage is smaller than the collapse bias voltage.
  • the standard bias voltage can make the light sensing diode PD1 enter the reverse bias state but does not enter the extreme reverse bias state. That is to say, the light sensing diode PD1 does not have a single photon at this time. Characteristics of avalanche diodes.
  • the readout circuit 504 may include, for example, an integrator and an analog-to-digital converter.
  • the integrator may integrate the light sensing signal provided by the light sensing diode PD1 to generate an integrated signal.
  • the analog-to-digital converter may convert the integrated signal into a digital signal.
  • the sensing value SD1 is generated to the signal processing circuit 108 .
  • switching the light sensing diode PD1 to the counter circuit 106 or the readout circuit 504 under different lighting environments can expand the applicable range of light intensity of the optical sensing device for light sensing, and improve the convenience of use of the optical sensing device. sex.
  • FIG. 7 is a flow chart of a sensing method of an optical sensing device according to an embodiment of the present invention.
  • the sensing method of the optical sensing device may include at least the following steps. First, a collapse bias voltage is provided to the light sensing diode (step S702). Next, the number of collapses of the light sensing diode is counted according to the light sensing signal generated by the light sensing diode sensing ambient light to generate a count value (step S704). Then, the count value is sampled to generate multiple sample values (step S706). For example, the count value may be sampled according to a preset sampling frequency to generate multiple sample values.
  • the optical characteristics of the ambient light are determined based on the sampled values (step S708). For example, spectrum analysis can be performed on the sampled values to obtain the harmonic distribution of the light sensing signal, or whether the vibration of any harmonic is greater than a predetermined value. Set a threshold to determine whether flickering of a specific frequency occurs.
  • FIG. 8 is a flow chart of a sensing method of an optical sensing device according to another embodiment of the present invention.
  • the optical sensing device may include at least one filter layer.
  • the filter layer may band-pass filter the ambient light.
  • the light sensing diode receives the ambient light through the corresponding filter layer.
  • the filter layer may be, for example, Color filters.
  • different light sensing diodes can also receive ambient light through filter layers with different frequency bands, or some of the light sensing diodes receive ambient light through the filter layer, and some of the light sensing diodes Receive ambient light directly.
  • the count value can also be compensated based on the error compensation value (step S804), for example, the count value is compensated by subtracting the error compensation value from the count value.
  • the error compensation value may include, for example, at least one of the count value corresponding to the dark current of the light sensing diode or the count value corresponding to the crosstalk interference between adjacent light sensing diodes, but is not limited to this. Compensating the count value through the error compensation value can more accurately obtain the count value corresponding to the ambient light L1, thereby improving the sensing quality of the optical sensing device.
  • step S708 since the light sensing diode of this embodiment receives ambient light through the filter layer, the optical characteristics of the ambient light within the bandwidth range can be determined based on the sampled values. For example, the light intensity and flicker rate of ambient light within the bandwidth range of the color filter are not limited to this.
  • the light intensity of the ambient light within the bandwidth range of each filter layer can also be determined based on the sampled values obtained from the sampling count value, and The color temperature of the ambient light is determined based on the light intensity of the ambient light within the bandwidth range of each filter layer, and the type and illumination of the light source that provides the ambient light are further determined.
  • the light-sensing diodes receive ambient light through the filter layer and some of the light-sensing diodes directly receive the ambient light
  • the sampling values corresponding to the light-sensing diodes that receive the ambient light through the filter layer Determine the light intensity of the ambient light within the bandwidth range of each filter layer, and determine the color temperature of the ambient light based on the light intensity of the ambient light within the bandwidth range of each filter layer. It can also directly receive the light perception of the ambient light based on the corresponding Measure the sampling value of the diode to determine the light intensity of the ambient light.
  • the light sensing diode can receive the collapse bias voltage and sense the ambient light to generate a light sensing signal.
  • the counter circuit can count the number of collapses of the light sensing diode based on the light sensing signal.
  • the signal processing circuit can sample the count value to generate multiple sampling values, and determine the light characteristics of the ambient light based on the multiple sampling values.
  • the light-sensing diode in an extremely reverse-biased state is used to sense ambient light
  • the counting value of the counter circuit is used to calculate the light intensity sensed by the light-sensing diode. This avoids the use of an integrator circuit and can be used in weak conditions.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Light Receiving Elements (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

一种光学感测装置及其感测方法，感测方法包括：提供崩溃偏压电压至光感测二极管（PD1）（S702），依据光感测二极管（PD1）感测环境光（L1）而产生的光感测信号（S1）计数光感测二极管（PD1）的崩溃次数而产生计数值（C1）（S704），取样计数值（C1）而产生多个取样值（S706），依据取样值判断环境光（L1）的光特性（S708）。

Description

光学感测装置及其感测方法 技术领域
本发明涉及一种感测装置，尤其涉及一种光学感测装置及其感测方法。
背景技术
诸多现代电子装置中皆存在具有光子装置的集成芯片(Integrated chip，IC)。举例而言，包括影像传感器的光子装置用于相机、录像机及其他类型的摄影系统中来捕获影像。一般来说，光感测芯片常利用光电流积分的方式，将电流转到电压，再利用模拟数字转换器来进行译码。模拟数字转换器具有设计复杂且耗电的缺点，且在弱环境光的情形下，需要高精度的模拟数字转换电路进行噪声控制或增加光感测二极管的数量，来提高感测灵敏度，然如此将提高电路面积且会使成本上升。此外，以光电流积分的方式来进行信号处理，需要足够的积分时间来避免讯杂比过低，然如此将大幅地限制数据回报速率(report rate)。
发明内容
本发明提供一种光学感测装置及其感测方法，在弱环境光的情形下，可在不增加电路面积、成本以及功耗的情形下，准确地判断环境光的光特性，提供良好的感测质量以及数据回报速率，且相较于传统的光感测二极管，可以更小的电路面积达到相同的感测敏感度。
本发明的光学感测装置，包括偏压电压产生电路、至少一光感测二极管、淬熄电路、计数器电路以及信号处理电路。偏压电压产生电路提供崩溃偏压电压或标准偏压电压。光感测二极管的阴极端耦接偏压电压产生电路，感测环境光而产生光感测信号。淬熄电路耦接光感测二极管的阳极端，淬熄光感测二极管。计数器电路耦接光感测二极管的阳极端，依据光感测二极管在接收崩溃偏压电压期间产生的光感测信号计数光感测二极管的崩溃次数而产生计数值。信号处理电路耦接计数器电路，取样计数值而产生多个取样值，依据取样值判断环境光的光特性。
本发明还提供一种光学感测装置的感测方法，包括下列步骤。提供崩溃偏压电压给至少一光感测二极管。依据光感测二极管感测环境光而产生的光感测信号计数光感测二极管的崩溃次数而产生计数值。取样计数值而产生多个取样值。依据取样值判断环境光的光特性。
基于上述，本发明实施例的光感测二极管可接收崩溃偏压电压并感测环境光而产生光感测信号，计数器电路可依据光感测信号计数光感测二极管的崩溃次数而产生计数值，信号处理电路可取样计数值而产生多个取样值，并依据多个取样值判断环境光的光特性。如此利用在极度逆偏状态下的光感测二极管来感测环境光，并利用计数器电路的计数值来计算光感测二极管所感测到的光强度，可避免使用积分器电路，而可在弱环境光的条件下，在不增加电路面积、成本以及功耗的情形下，准确地判断环境光的光特性，提供良好的感测质量以及数据回报速率，且相较于传统的光感测二极管，可以更小的电路面积达到相同的感测敏感度。
为让本发明的上述特征和优点能更明显易懂，下文特举实施例，并配合附图作详细说明如下。
附图说明
图1是依照本发明实施例的光学感测装置的示意图。
图2是依照本发明实施例的光感测信号的波形图。
图3是依照本发明实施例的计数值的波形图。
图4是依照本发明另一实施例的光学感测装置的示意图。
图5是依照本发明另一实施例的光学感测装置的示意图。
图6是依照本发明另一实施例的光学感测装置的示意图。
图7是依照本发明实施例的光学感测装置的感测方法的流程图。
图8是依照本发明另一实施例的光学感测装置的感测方法的流程图。
具体实施方式
为了使本发明之内容可以被更容易明了，以下特举实施例做为本发明确实能够据以实施的范例。另外，凡可能之处，在附图及实施方式中使用相同标号的组件/构件，系代表相同或类似部件。
以下请参照图1，图1是依照本发明一实施例所绘示的光学感测装置的示意图。光学感测装置可包括偏压电压产生电路102、光感测二极管PD1(例如，单光子崩溃二极管Single Photon Avalanche Diode，SPAD)、淬熄(quenching)电路104、计数器电路106以及信号处理电路108，偏压电压产生电路102耦接光感测二极管PD1的阴极端，淬熄电路104耦接光感测二极管PD1的阳极端。偏压电压产生电路102可用以提供崩溃偏压电压或标准偏压电压至光感测二极管PD1，而使光感测二极管PD1进入极度逆偏或逆偏的状态。在光感测二极管PD1处于极度逆偏的状态下，当环境光L1的光子注入光感测二极管PD1的空乏层时，可触发光感测二极管PD1产生崩溃(avalanche)电流，而提供光感测信号S1。此外，淬熄电路104可在光感测二极管PD1提供光感测信号S1后淬熄光感测二极管PD1，以将光感测二极管PD1的阳极端电压回复到提供光感测信号S1前的电压，淬熄电路104为主动式或被动式，本发明并不限定。值得注意的是，在图1实施例中虽仅绘示一个由光感测二极管PD1与淬熄电路104形成的光感测单元，然不以此为限，在其它实施例中，光学感测装置可包括更多个光感测单元，例如由多个光感测单元与计数器电路106形成的光感测单元阵列。
计数器电路106可依据光感测二极管PD1在接收崩溃偏压电压期间产生的光感测信号S1计数光感测二极管PD1的崩溃次数而产生计数值C1给信号处理电路108，信号处理电路108可依据计数值C1判断光感测二极管PD1所感测到的光强度。举例来说，如图2所示，信号处理电路108可依据计数器电路106计数光感测期间T1光感测信号S1的脉冲数量(也就是光感测二极管PD1于光感测期间T1的崩溃次数)所得到的计数值C1，来判断光感测二极管PD1于光感测期间T1所感测到的光强度，其中计数值C1越大代表光感测二极管PD1于光感测期间T1所感测到的光强度越强。其中光感测期间T1可例如为光感测二极管PD1接收崩溃偏压电压的期间，然不以此为限，也可依使用者需求设定为其它期间，例如光感测二极管PD1接收环境光L1的期间或计数器电路106执行计数的期间。举例来说，在部分实施例中，计数器电路106可周期性地重新计数光感测信号S1的脉冲数量，例如每隔光感测期间T1便重新计数光感测信号S1的脉冲数量，如此在环境光L1的强度变化具有特定频率的情形下，计数器电路106所产生的计数值变化也将如图3所示具 有特定频率。
如图3所示，信号处理电路108可取样计数器电路106所产生的计数值而产生多个取样值，例如依据预设取样频率取样计数器电路106所产生的计数值而产生多个取样值。值得注意的是，信号处理电路108的取样频率并不以图3为限，信号处理电路108也可以更高或更低的预设取样频率对计数值进行取样，取样时间可例如为取样频率的倒数的2N倍，其中N为正整数，然不以此为限。信号处理电路108可依据取样值判断环境光L1的光特性。信号处理电路108可依据取样值的振幅随时间的变化判断环境光L1的频率。在部分实施例中，信号处理电路108也可对取样值进行频谱分析，例如对取样值进行快速傅立叶变换(FFT)，以获得光感测信号S1的谐波分布。此外，信号处理电路108还可依据频域中谐波的振幅判断是否有闪烁现象，例如当在频域中某一频率的谐波振幅高于预设阈值时，代表环境光L1以此频率闪烁，例如当在频域中频率100Hz处的谐波振幅高于预设阈值时，代表环境光L1的闪烁速率为100Hz。在部分实施例中，信号处理电路108可也先计算取样值的平均值，而后将取样值减去平均值，以去除取样值的直流成分，而后再对去除直流成分的取样值进行快速傅立叶变换。
如此通过将光感测二极管PD1偏压至极度逆偏的状态，并利用计数器电路计数光感测二极管的崩溃次数所产生计数值来判断环境光的光特性，可提高光学感测装置对噪声的抵抗能力，在弱环境光的条件下仍可准确地判断环境光的光特性，而使光感测装置具有良好的感测质量以及数据回报速率，此外还可不需设置积分器与模拟数字转换器，而可进一步缩小电路面积、降低功率消耗并降低生产成本，相较于传统的光感测二极管，可以更小的电路面积达到相同的感测敏感度。
此外，在部分实施例中，信号处理电路108还可依据误差补偿值来对计数值进行补偿，校正计数器电路106提供的计数值，其中误差补偿值可例如包括对应光感测二极管PD1的暗电流的计数值或对应相邻光感测二极管间的串音干扰的计数值至少其中之一。信号处理电路108可例如将计数值C1减去误差补偿值，以更精确地获得对应环境光L1的计数值，从而进一步提高光学感测装置的感测质量。
图4是依照本发明另一实施例的光学感测装置的示意图。在本实施例中， 光学感测装置还可包括滤光层F1，滤光层F1可例如为彩色滤光片，例如绿色、红色或蓝色的彩色滤光片，然不以此为限。滤光层F1可对环境光L1进行带通滤波，而使计数器电路106提供的计数值代表对应彩色滤光片的带宽范围内的环境光L1的光特性。例如彩色滤光片的带宽范围内的环境光L1的光强度以及闪烁速率，然不以此为限。信号处理电路108可依据预设取样频率取样计数器电路106产生的计数值而产生对应的取样值，并依据光感测二极管PD1的取样值判断环境光L1在滤光层F1的带宽范围内的光强度。例如当滤光层F1为红色滤光片时，信号处理电路108可依据取样值判断环境光L1在红色光波长范围内的光强度。
值得注意的是，在其它实施例中，光学感测装置也可包括多个不同的滤光层，如图5所示，光学感测装置可包括多个滤光层F1～F3，滤光层F1～F3可例如具有不同的带宽范围，例如分别以绿色、红色以及蓝色的彩色滤光片来实施，然不以此为限。滤光层F1～F3对应不同的光感测单元阵列AR1～AR3，而可分别对照射至光感测单元阵列AR1～AR3的环境光L1进行带通滤波。光感测单元阵列AR1～AR3的光感测二极管PD1可分别通过对应的滤光层F1～F3接收环境光L1，光感测单元阵列AR1～AR3的计数器电路106可分别计数其所耦接的光感测二极管PD1的崩溃次数而产生对应的计数值。
信号处理电路108可依据预设取样频率取样各光感测单元阵列AR1～AR3的光感测二极管PD1的计数值而产生对应的取样值。由于不同的感测单元阵列AR1～AR3对应不同的滤光层F1～F3，不同的感测单元阵列AR1～AR3的计数器电路106所产生的计数值可代表环境光L1在不同带宽范围内的光强度，因此信号处理电路108可依据取样计数值所得到的取样值判断环境光L1的色温，并进一步判断环境光L1的光源类型以及照度，例如LED、白炽灯、太阳光…等等。举例来说，假设滤光层F1～F3分别为绿色、红色以及蓝色的彩色滤光片，信号处理电路108可依据取样值判断环境光L1在绿色光波长范围、红色光波长范围以及蓝色光波长范围的光强度，而可得知环境光L1的波长分布，进而判断环境光L1的色温、光源类型以及照度。在部分实施例中，还可先将对应感测单元阵列AR1～AR3的计数值分别先减去对应的误差补偿值，例如分别减去对应感测单元阵列AR1～AR3的暗电流的计数值以及串音干扰的计数值，以更精确地获得对应环境光L1的计数值，从而进一步提高光学感 测装置的感测质量。
值得注意的是，在部分实施例中，滤光层F1～F3可仅覆盖部分的感测单元阵列AR1～AR3，而使感测单元阵列AR1～AR3中部分的光感测二极管PD1通过滤光层F1～F3接收环境光L1，部分的光感测二极管PD1直接接收环境光L1，例如感测单元阵列AR1～AR3分别有部分的光感测二极管PD1直接接收环境光L1，然不以此为限，也可例如感测单元阵列AR1～AR3其中之一有部分的光感测二极管PD1直接接收环境光L1。如此，信号处理电路108可依据取样计数值所得到的取样值判断环境光L1在滤光层F1～F3的带宽范围内的光强度，并依据环境光L1在滤光层F1～F3的带宽范围内的光强度判断色温，此外还可依据对应直接接收环境光L1的光感测二极管PD1的计数值判断环境光L1的光强度。
图6是依照本发明另一实施例的光学感测装置的示意图。在本实施例中，光学感测装置还可包括开关SW1、切换电路602以及读出电路604，其中开关SW1耦接于光感测二极管PD1的阳极端与淬熄电路104之间，切换电路602耦接于光感测二极管PD1的阳极端、计数器电路106与读出电路604之间，读出电路604还耦接信号处理电路108。其中读出电路604可例如以开关SW2与SW3来实施，开关SW2耦接于光感测二极管PD1的阳极端与计数器电路106之间，开关SW3耦接于光感测二极管PD1的阳极端与读出电路604之间。
信号处理电路108可依据光学感测装置的感测模式控制开关SW1～SW3的导通状态。例如当光学感测装置处于弱环境光感测模式时，控制偏压电压产生电路102提供崩溃偏压电压给光感测二极管PD1，控制开关SW1导通并控制切换电路502将光感测二极管PD的阳极端切换连接至计数器电路106(也就是控制开关SW2导通，并控制开关SW3断开)，以使光学感测装置在低光照环境下也可准确地判断环境光L1的光特性，而保持良好的感测质量。而在光学感测装置处于一般感测模式时，信号处理电路108可控制偏压电压产生电路102提供标准偏压电压，控制开关SW1断开并控制切换电路502将光感测二极管PD1的阳极端切换连接至读出电路504(也就是控制开关SW2断开，并控制开关SW3导通)，以使光学感测装置适于在较高光照环境下进行环境光L1的感测。
其中标准偏压电压小于崩溃偏压电压，标准偏压电压可使光感测二极管PD1进入逆偏状态但未达进入极度逆偏的状态，也就是说光感测二极管PD1此时不具有单光子雪崩二极管的特性。读出电路504可例如包括积分器与模拟数字转换器，积分器可对光感测二极管PD1提供的光感测信号进行积分操作而产生积分信号，模拟数字转换器可将积分信号转换为数字信号而产生感测值SD1给信号处理电路108。如此在不同的光照环境下将光感测二极管PD1切换接至计数器电路106或读出电路504，可扩大光学感测装置进行光感测的光强度适用范围，而提高光学感测装置的使用便利性。
图7是依照本发明实施例的光学感测装置的感测方法的流程图。由上述实施例可知，光学感测装置的感测方法可至少包括下列步骤。首先，提供崩溃偏压电压至光感测二极管(步骤S702)。接着，依据光感测二极管感测环境光而产生的光感测信号计数光感测二极管的崩溃次数而产生计数值(步骤S704)。然后，取样计数值而产生多个取样值(步骤S706)，例如可依据预设取样频率取样计数值而产生多个取样值。之后，依据该些取样值判断该环境光的光特性(步骤S708)，例如可对取样值进行频谱分析，以获得光感测信号的谐波分布，或者依据是否有谐波的振福大于预设阈值可判断是否出现特定频率的闪烁现象。
图8是依照本发明另一实施例的光学感测装置的感测方法的流程图。在本实施例中，光学感测装置可包括至少一滤光层，滤光层可对环境光进行带通滤波，光感测二极管通过对应的滤光层接收环境光，滤光层可例如为彩色滤光片。在步骤S702后，可依据光感测二极管经由滤光层感测环境光而产生的光感测信号计数光感测二极管的崩溃次数而产生计数值(步骤S802)。在部分实施例中，不同的光感测二极管还可经由具有不同频带的滤光层接收环境光，又或者是，部分的光感测二极管通过滤光层接收环境光，部分的光感测二极管直接接收环境光。此外，在本实施例中，还可依据误差补偿值对计数值进行补偿(步骤S804)，例如将计数值减去误差补偿值来对计数值进行补偿。其中误差补偿值可例如包括对应光感测二极管的暗电流的计数值或对应相邻光感测二极管间的串音干扰的计数值至少其中之一，然不以此为限。通过误差补偿值来对计数值进行补偿可更精确地获得对应环境光L1的计数值，从而提高光学感测装置的感测质量。
在步骤S708中，由于本实施例的光感测二极管为经由滤光层接收环境光，因此依据取样值可判断环境光在带宽范围内的的光特性。例如彩色滤光片的带宽范围内的环境光的光强度以及闪烁速率，然不以此为限。在不同的光感测二极管经由具有不同频带的滤光层接收环境光的情形下，还可依据取样计数值所得到的取样值判断环境光在各滤光层的带宽范围内的光强度，并依据环境光在各滤光层的带宽范围内的光强度判断环境光的色温，并进一步判断提供环境光的光源类型以及照度。此外，在部分的光感测二极管通过滤光层接收环境光，部分的光感测二极管直接接收环境光的情形下，除了可依据对应通过滤光层接收环境光的光感测二极管的取样值判断环境光在各滤光层的带宽范围内的光强度，并依据环境光在各滤光层的带宽范围内的光强度判断环境光的色温外，还可依据对应直接接收环境光的光感测二极管的取样值判断环境光的光强度。
综上所述，本发明实施例的光感测二极管可接收崩溃偏压电压并感测环境光而产生光感测信号，计数器电路可依据光感测信号计数光感测二极管的崩溃次数而产生计数值，信号处理电路可取样计数值而产生多个取样值，依据多个取样值判断环境光的光特性。如此利用在极度逆偏状态下的光感测二极管来感测环境光，并利用计数器电路的计数值来计算光感测二极管所感测到的光强度，可避免使用积分器电路，而可在弱环境光的条件下，在不增加电路面积、成本以及功耗的情形下，准确地判断环境光的光特性，提供良好的感测质量以及数据回报速率，且相较于传统的光感测二极管，可以更小的电路面积达到相同的感测敏感度。
虽然本发明已以实施例揭示如上，然其并非用以限定本发明，任何所属技术领域中技术人员，在不脱离本发明的精神和范围内，当可作些许的更改与润饰，故本发明的保护范围当视权利要求所界定的为准。

Claims (23)

  1. 一种光学感测装置，其特征在于，包括：
    偏压电压产生电路，提供崩溃偏压电压或标准偏压电压；
    至少一光感测二极管，其阴极端耦接所述偏压电压产生电路，感测环境光而产生光感测信号；
    淬熄电路，耦接所述光感测二极管的阳极端，淬熄所述光感测二极管；
    计数器电路，耦接所述光感测二极管的阳极端，依据所述光感测二极管在接收所述崩溃偏压电压期间产生的所述光感测信号计数所述光感测二极管的崩溃次数而产生计数值；以及
    信号处理电路，耦接所述计数器电路，取样所述计数值而产生多个取样值，依据所述多个取样值判断所述环境光的光特性。
  2. 根据权利要求1所述的光学感测装置，其特征在于，所述信号处理电路对所述多个取样值进行频谱分析，以获得所述光感测信号的谐波分布。
  3. 根据权利要求2所述的光学感测装置，其特征在于，所述信号处理电路依据是否有谐波的振福大于预设阈值判断是否出现闪烁现象。
  4. 根据权利要求1所述的光学感测装置，其特征在于，还包括:
    至少一滤光层，对所述环境光进行带通滤波，所述光感测二极管通过对应的滤光层接收所述环境光。
  5. 根据权利要求1所述的光学感测装置，其特征在于，还包括：
    滤光层，对所述环境光进行带通滤波，所述光感测二极管通过所述滤光层接收所述环境光，所述计数器电路计数所述光感测二极管的崩溃次数而产生对应的计数值，所述信号处理电路取样所述光感测二极管的计数值而产生多个取样值，依据所述光感测二极管的所述多个取样值判断所述环境光在所述滤光层的带宽范围内的光强度。
  6. 根据权利要求1所述的光学感测装置，其特征在于，所述光学感测装置包括多个光感测二极管以及多个滤光层，所述多个滤光层具有不同的频带，对所述环境光进行带通滤波，所述多个光感测二极管分别通过对应的滤光层接收所述环境光，所述计数器电路分别计数各光感测二极管的崩溃次数而产生对应的计数值，所述信号处理电路取样各光感测二极管的计数值而产生对应的取样值，依据所述多个光感测二极管的取样值判断所述环境光在各 滤光层的带宽范围内的光强度，并依据所述环境光在各滤光层的带宽范围内的光强度判断所述环境光的色温。
  7. 根据权利要求6所述的光学感测装置，其特征在于，所述信号处理电路依据环境光的色温判断所述环境光的光源类型。
  8. 根据权利要求1所述的光学感测装置，其特征在于，所述光学感测装置包括多个光感测二极管以及多个滤光层，所述多个滤光层具有不同的频带，对所述环境光进行带通滤波，部分的所述多个光感测二极管分别通过对应的滤光层接收所述环境光，所述计数器电路分别计数各光感测二极管的崩溃次数而产生对应的计数值，所述信号处理电路取样各光感测二极管的计数值而产生对应的取样值，依据所述多个光感测二极管的取样值判断所述环境光的光强度以及所述环境光在各滤光层的带宽范围内的光强度，并依据所述环境光在各滤光层的带宽范围内的光强度判断所述环境光的色温。
  9. 根据权利要求1所述的光学感测装置，其特征在于，所述信号处理电路还依据误差补偿值对所述计数值进行补偿。
  10. 根据权利要求9所述的光学感测装置，其特征在于，所述误差补偿值包括对应所述光感测二极管的暗电流的计数值或对应相邻光感测二极管间的串音干扰的计数值至少其中之一。
  11. 根据权利要求1所述的光学感测装置，其特征在于，所述信号处理电路，依据预设取样频率取样所述计数值而产生所述多个取样值。
  12. 根据权利要求1所述的光学感测装置，其特征在于，还包括：
    开关，耦接于所述光感测二极管的阳极端与所述淬熄电路之间；
    切换电路，耦接于所述光感测二极管的阳极端与所述计数器电路之间；以及
    读出电路，耦接于所述切换电路与所述信号处理电路之间，对所述光感测信号进行积分操作，以产生感测值给所述信号处理电路，所述信号处理电路于所述光学感测装置处于弱环境光感测模式时，控制所述偏压电压产生电路提供所述崩溃偏压电压至所述光感测二极管的阴极端，控制所述开关导通并控制所述切换电路将所述光感测二极管的阳极端切换连接至所述计数器电路，于所述光学感测装置处于一般感测模式时，控制所述偏压电压产生电路提供所述标准偏压电压至所述光感测二极管的阴极端，并控制所述开关断开 控制所述切换电路将所述光感测二极管的阳极端切换连接至所述读出电路，其中所述标准偏压电压小于所述崩溃偏压电压。
  13. 一种光学感测装置的感测方法，其特征在于，包括：
    提供崩溃偏压电压给至少一光感测二极管；
    依据所述光感测二极管感测环境光而产生的光感测信号计数所述光感测二极管的崩溃次数而产生计数值；
    取样所述计数值而产生多个取样值；以及
    依据所述多个取样值判断所述环境光的光特性。
  14. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，包括：
    对所述多个取样值进行频谱分析，以获得所述光感测信号的谐波分布。
  15. 根据权利要求14所述的光学感测装置的感测方法，其特征在于，包括：
    依据是否有谐波的振福大于预设阈值判断是否出现闪烁现象。
  16. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，所述光学感测装置还包括至少一滤光层，所述滤光层对所述环境光进行带通滤波，所述光感测二极管通过对应的滤光层接收所述环境光。
  17. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，所述光学感测装置包括滤光层，所述滤光层对所述环境光进行带通滤波，所述光感测二极管通过所述滤光层接收所述环境光，所述感测方法包括：
    计数所述光感测二极管的崩溃次数而产生对应的计数值；
    取样所述光感测二极管的计数值而产生多个取样值；以及
    依据所述光感测二极管的所述多个取样值判断所述环境光在所述滤光层的带宽范围内的光强度。
  18. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，所述光学感测装置包括多个光感测二极管以及多个滤光层，所述多个滤光层具有不同的频带，对所述环境光进行带通滤波，所述多个光感测二极管分别通过对应的滤光层接收所述环境光，所述感测方法包括：
    分别计数各光感测二极管的崩溃次数而产生对应的计数值；
    取样各光感测二极管的计数值而产生对应的取样值；以及
    依据所述多个光感测二极管的取样值判断所述环境光在各滤光层的带宽范围内的光强度，并依据所述环境光在各滤光层的带宽范围内的光强度判断所述环境光的色温。
  19. 根据权利要求18所述的光学感测装置的感测方法，其特征在于，包括：
    依据环境光的色温判断所述环境光的光源类型。
  20. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，所述光学感测装置包括多个光感测二极管以及多个滤光层，所述多个滤光层具有不同的频带，对所述环境光进行带通滤波，部分的所述多个光感测二极管分别通过对应的滤光层接收所述环境光，所述感测方法包括：
    分别计数各光感测二极管的崩溃次数而产生对应的计数值；
    取样各光感测二极管的计数值而产生对应的取样值；以及
    依据所述多个光感测二极管的取样值判断所述环境光的光强度以及所述环境光在各滤光层的带宽范围内的光强度，并依据所述环境光在各滤光层的带宽范围内的光强度判断所述环境光的色温。
  21. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，包括：
    依据误差补偿值对所述计数值进行补偿。
  22. 根据权利要求21所述的光学感测装置的感测方法，其特征在于，所述误差补偿值包括对应所述光感测二极管的暗电流的计数值或对应相邻光感测二极管间的串音干扰的计数值至少其中之一。
  23. 根据权利要求13所述的光学感测装置的感测方法，其特征在于，包括：
    依据预设取样频率取样所述计数值而产生所述多个取样值。
PCT/CN2022/132710 2022-05-30 2022-11-18 光学感测装置及其感测方法 WO2023231315A1 (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US202263346913P 2022-05-30 2022-05-30
US63/346,913 2022-05-30
US202263392495P 2022-07-27 2022-07-27
US63/392,495 2022-07-27

Publications (1)

Publication Number Publication Date
WO2023231315A1 true WO2023231315A1 (zh) 2023-12-07

Family

ID=86026325

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/CN2022/132710 WO2023231315A1 (zh) 2022-05-30 2022-11-18 光学感测装置及其感测方法
PCT/CN2022/132705 WO2023231314A1 (zh) 2022-05-30 2022-11-18 距离感测装置及其感测方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/CN2022/132705 WO2023231314A1 (zh) 2022-05-30 2022-11-18 距离感测装置及其感测方法

Country Status (3)

Country Link
CN (4) CN219016582U (zh)
TW (4) TW202346892A (zh)
WO (2) WO2023231315A1 (zh)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060192086A1 (en) * 2005-02-14 2006-08-31 Ecole Polytechnique Federale De Lausanne Epfl Integrated imager circuit comprising a monolithic array of single photon avalanche diodes
CN105895645A (zh) * 2015-02-17 2016-08-24 全视科技有限公司 像素阵列及图像感测系统
CN109459149A (zh) * 2018-10-11 2019-03-12 桂林电子科技大学 一种高精度单光子探测芯片实时温度测量及性能优化系统
CN111121986A (zh) * 2019-12-25 2020-05-08 桂林电子科技大学 一种具有后脉冲校正功能的单光子探测系统
CN112397542A (zh) * 2020-11-16 2021-02-23 Oppo（重庆）智能科技有限公司 图像传感模组及时间飞行器件、电子设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108885264B (zh) * 2015-12-18 2022-07-22 杰拉德·迪尔克·施密茨 对象的实时位置感测
JP6860467B2 (ja) * 2017-10-26 2021-04-14 ソニーセミコンダクタソリューションズ株式会社 フォトダイオード、画素回路、および、フォトダイオードの製造方法
KR20210150765A (ko) * 2020-06-04 2021-12-13 에스케이하이닉스 주식회사 이미지 센싱 장치 및 이를 포함하는 촬영 장치
TWI759213B (zh) * 2020-07-10 2022-03-21 大陸商廣州印芯半導體技術有限公司 光感測器及其感測方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060192086A1 (en) * 2005-02-14 2006-08-31 Ecole Polytechnique Federale De Lausanne Epfl Integrated imager circuit comprising a monolithic array of single photon avalanche diodes
CN105895645A (zh) * 2015-02-17 2016-08-24 全视科技有限公司 像素阵列及图像感测系统
CN109459149A (zh) * 2018-10-11 2019-03-12 桂林电子科技大学 一种高精度单光子探测芯片实时温度测量及性能优化系统
CN111121986A (zh) * 2019-12-25 2020-05-08 桂林电子科技大学 一种具有后脉冲校正功能的单光子探测系统
CN112397542A (zh) * 2020-11-16 2021-02-23 Oppo（重庆）智能科技有限公司 图像传感模组及时间飞行器件、电子设备

Also Published As

Publication number Publication date
TW202347806A (zh) 2023-12-01
TWM641708U (zh) 2023-06-01
CN116007748A (zh) 2023-04-25
CN116400370A (zh) 2023-07-07
TWM640855U (zh) 2023-05-11
CN219142015U (zh) 2023-06-06
WO2023231314A1 (zh) 2023-12-07
CN219016582U (zh) 2023-05-12
TW202346892A (zh) 2023-12-01

Similar Documents

Publication Publication Date Title
JP5305387B2 (ja) 光検出装置、及び画像表示装置
US20090160830A1 (en) Photodetection semiconductor device, photodetector, and image display device
CN101189885B (zh) 照相系统中照明闪烁检测的方法和设备及其图像传感器
US20090184331A1 (en) Photodetection semiconductor device, photodetector, and image display device
TWI453940B (zh) A light detection device, and a video display device
US20090310003A1 (en) Image sensor
KR20150035622A (ko) 조도와 물체의 거리를 측정하는 광 센서
WO2023231315A1 (zh) 光学感测装置及其感测方法
CN114166343B (zh) 一种高性能环境光接近光传感器芯片
US5153713A (en) Color temperature information forming device
JP2020202472A (ja) 撮像装置及びその制御方法
RU2250478C2 (ru) Способ обнаружения объектов
JP4029135B2 (ja) 光電変換素子及び光電変換装置
US11523073B2 (en) Image sensor with noise cancellation feature and electronic device with same
Raynor et al. Ambient Light Sensor with 358pW/cm^ 2 equivalent noise floor for behind screen operation
US8884210B2 (en) Spectrum information measurement method, color sensor and virtual slide device
KR101329170B1 (ko) 인간의 시감 특성에 기반한 조도 센서
JP2004072542A (ja) 光センサ
JP2012185043A (ja) センサおよび表示装置
JPS63180825A (ja) 光電変換装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 22944617

Country of ref document: EP

Kind code of ref document: A1