WO2023229566A1 - Current ratio equalizer circuit - Google Patents
Current ratio equalizer circuit Download PDFInfo
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- WO2023229566A1 WO2023229566A1 PCT/TR2023/050477 TR2023050477W WO2023229566A1 WO 2023229566 A1 WO2023229566 A1 WO 2023229566A1 TR 2023050477 W TR2023050477 W TR 2023050477W WO 2023229566 A1 WO2023229566 A1 WO 2023229566A1
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- 239000003990 capacitor Substances 0.000 claims abstract description 19
- 230000003247 decreasing effect Effects 0.000 claims abstract description 6
- 230000007704 transition Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 17
- 230000010354 integration Effects 0.000 description 10
- 230000009977 dual effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/575—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
Definitions
- the invention relates to a current ratio equalizer circuit used in all applications that use two or more current sources and control the ratio of these currents to each other.
- the invention relates to a current ratio equalizer circuit that equalizes the current ratios by decreasing or increasing the currents of current sources by the control circuit according to the result of the comparison, until the integral results are equal, by integrating a plurality of currents at different times over the same capacitor and comparing the results of these integrals with a comparator circuit.
- Current mirroring is the most common method used to adjust current ratios, especially in electronic chip circuits.
- the desired current ratios are made by adjusting the lengths of the transistors in the circuit.
- an 11 current is multiplied by 100 and an I2 current is obtained using M1 , M2, M3 and M4 transistors. If the current 11 is passed through the transistor M1 of size W/L, a voltage VG is formed at the gate of the transistor according to the equation in the saturation region of the transistor. If this gate voltage is supplied to transistor M2, which is 100 times larger than transistor M1 , again according to the equation of the transistor in the saturation region, it is ensured that the current 11 passes 100 times through the M2 transistor.
- the channel length modulation effect of transistors is neglected.
- M3 and M4 cascode transistors are added to the circuit so as to reduce the channel length modulation effect and to ensure that the current ratio is not affected by the load voltage (VL).
- the ratio of the currents may differ from the desired value due to the differences caused by the nonuniformity in the CMOS fabrication. For this reason, the channel width and length of the transistors used in current mirroring circuits are kept too large so as to achieve a precise ratio.
- the channel width and length of the transistors are kept large, it is difficult to obtain huge ratio precisely such as 100-200 due to mismatches in the fabrication. In particular, it can be much more difficult to achieve the desired ratio in a small area in circuits where small currents are used to obtain low power consumption (approximately 1-100 nA).
- the results found in the second phase are compared with the results found in the first phase in the calculation unit. According to this result, the (IE2-IB2)/(IE1 -IB1 ) ratio is tried to be equalized to 16 by adjusting the IE2 current.
- the value of at least one current supplied from current sources is adjusted so as to maintain a predetermined current ratio as a result of comparing the voltages obtained from the currents from different current sources with each other.
- the input current of the ADC can be converted into a high resolution digital data by switching these currents on and off at certain times by a controller.
- the ratio of IL and IS currents must be at the desired level so as to avoid linearity errors in this ADC structure.
- this value is set as 32.
- a ratio higher or lower than this value may cause monotonicity and missing code errors. Therefore, in such a case, the currents need to be calibrated so that the ratio of their currents is 32 in order for the circuit to work properly.
- instead of calibrating the ratio of currents to a specific number first of all the ratio between currents are founded. Then to calculate the final value of ADC this founded ratio is used. The method described below is used to find the ratio of the currents in this application.
- the capacitance is filled with a current whose value is known. Then, the current II discharges the capacitance during the time i . Following this, the Is current discharges the capacitance during the time tsi ⁇ This process is repeated using the times tL2 and ts2. At the end of these periods, the ratio of the currents is calculated according to the following formula:
- the value of can be, for example, .i .
- This value is then used in the calculator to create the numerical value of the input current.
- this extra process increases the complexity of the circuit.
- the process of changing the current value fed from the variable current source until the integrals taken by the integrator are sampled over the capacitances and the voltages measured across these capacitances are equal to each other, is not mentioned in this invention.
- Aim of the Invention aims to solve the abovementioned disadvantages by being inspired from the current conditions.
- the main aim of the invention is to equalize the current ratios by decreasing or increasing the currents of current sources by the current ratio equalizer circuit according to the result of the comparison, until the integral results are equal, by integrating a plurality of currents at different times over the same capacitor and comparing the results of these integrals with a comparator circuit.
- Another aim of the invention is to control the ratios of currents to each other and to fix these ratios in applications where two or more current sources are used in general, in particular two current sources that discharge the sampling capacity dual ramp single slope analog-to-digital converters.
- Another aim of the invention is to provide a more accurate current ratio at small currents.
- Figure 1 is the schematic view of the mirroring method used in prior art
- Figure 2 is a simplified schematic view of the current equalizer circuit which is the subject of the invention.
- Figure 3 is the time display of the current equalizer circuit which is the subject of the invention.
- Figure 4 is the detailed schematic view of the alternative version of the current equalizer circuit which is the subject of the invention.
- Figure 5 is a representative schematic view of the OTA (Operational Trasnconductance Amplifier) load current problem.
- an l 2 current is A times as much as an current in the example application seen in the simplified scheme of the inventive current equalizer circuit, given in Figure 2.
- the current equalizer circuit integrates the and l 2 currents respectively and compares the result of these integrals with a comparator (2), and changes the value of the l 2 current to be A multiple of the current so as to adjust the ratio of the currents.
- the value of l 2 current can be increased or decreased by controlling the DAC (Digital to Analog Converter) control circuit (3).
- the present invention can be adapted to control and fix the ratios of currents produced by current sources to each other in applications where two or more current sources are used in general, in particular two current sources that discharge sampling capacitor in dual ramp single slope analog-to-digital converters. Accordingly, the present invention mainly comprises of the following;
- the integration time determines the ratio of the currents.
- the output voltage of the integrator OTA is shown in Equation 1.
- Equation 1 can be simplified as in Equation2.
- Equation 4 Equation 4:
- VOUTI and VOUT2 voltages are compared with each other through the comparator (2) during each cycle and as a result of this, the value of l 2 current is changed with a digital-analog converter in each cycle, thus VOUTI and VOUT2 voltages are equalized to each other.
- the integration capacitance Cint is reset by the reset switch. Then, the reset switch is opened and the 01 switch is closed, and the current is integrated during tinti ⁇ The resulting integral voltage is sampled by opening the switch ⁇ t>i at the capacitance Ci.
- Cint capacitance is reset again for the second integration.
- the 2 switch is closed and the l 2 current is integrated in time.
- the resulting integral voltage is sampled by opening the switch 0 2 at the capacitance C 2 .
- the comparator (2) compares the voltages across capacitances Ci and C 2 and the control circuit (3); o increases l 2 current through the digital analog converter if the voltage across capacitance C 2 is less than the voltage across capacitance Ci. o reduces l 2 current through the digital analog converter if the voltage across capacitance C 2 is greater than the voltage across capacitance Ci.
- circuit shown in Figure 4 is presented so as to achieve the requested A ratio with higher accuracy:
- the first value of the integral voltage should be 2.65V and the final value should be 1.65V in order for the current equalizer circuit to operate better.
- the S 2 and S 3 switches shown in Figure 4 have been added so as to achieve this.
- Cciamp capacitor and S 4 switch are added to the circuit so as to prevent settling errors during transitions between the reset phase and the current integrating, and to get rid of the reset noise simultaneously.
- Switch S 4 is kept closed for a while after the integration of and l 2 currents begins.
- the voltage on the right side remains constant at VREF2 (2.65V).
- the switch S 4 is turned on, the voltage value on the right side of the Cciamp capacitor starts from the VREF2 voltage and follows the voltage on the left side of the capacitor with the same slope.
- the slope of the output voltage is different by a multiple of A when integrating the current h and l 2 .
- the feedback voltage at the negative input voltage of the OTA differs for both phases. This difference causes the final voltage on the C S h_isb and C S h_msb capacitors to change and desired ratio to be different from A.
- Switches S 5 and S 6 are added to the circuit, and these switches are turned on for a very short time in the last step of the integration process, and the OTA output voltage is sampled on the C S h_isb and Csh_msb capacities so as to solve this problem.
- it is prevented from driving current over the C S h_isb and C S h_msb capacities while integrating the and l 2 currents of the OTA, so that the feedback voltage remains the same in both phases of the integrating process.
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- Automation & Control Theory (AREA)
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Abstract
The present invention relates to a current ratio equalizer circuit that equalizes the current ratios by decreasing or increasing the currents of current sources by the control circuit (3) according to the result of the comparison, until the integral results are equal, by integrating a plurality of currents at different times over the same capacitor and comparing the results of these integrals with a comparator (2).
Description
Current Ratio Equalizer Circuit
Technical Field
The invention relates to a current ratio equalizer circuit used in all applications that use two or more current sources and control the ratio of these currents to each other.
The invention relates to a current ratio equalizer circuit that equalizes the current ratios by decreasing or increasing the currents of current sources by the control circuit according to the result of the comparison, until the integral results are equal, by integrating a plurality of currents at different times over the same capacitor and comparing the results of these integrals with a comparator circuit.
Prior Art
Current mirroring is the most common method used to adjust current ratios, especially in electronic chip circuits. In this method, the desired current ratios are made by adjusting the lengths of the transistors in the circuit. In this circuit, for example, an 11 current is multiplied by 100 and an I2 current is obtained using M1 , M2, M3 and M4 transistors. If the current 11 is passed through the transistor M1 of size W/L, a voltage VG is formed at the gate of the transistor according to the equation in the saturation region of the transistor. If this gate voltage is supplied to transistor M2, which is 100 times larger than transistor M1 , again according to the equation of the transistor in the saturation region, it is ensured that the current 11 passes 100 times through the M2 transistor. Herein, the channel length modulation effect of transistors is neglected. M3 and M4 cascode transistors are added to the circuit so as to reduce the channel length modulation effect and to ensure that the current ratio is not affected by the load voltage (VL). The ratio of the currents may differ from the desired value due to the differences caused by the nonuniformity in the CMOS fabrication. For this reason, the channel width and length of the transistors used in current mirroring circuits are kept too large so as to achieve a precise ratio. However, although the channel width and length of the transistors are kept large, it is difficult to obtain huge ratio precisely such as 100-200 due to mismatches in the fabrication. In particular, it can be much more difficult to
achieve the desired ratio in a small area in circuits where small currents are used to obtain low power consumption (approximately 1-100 nA).
As a result of the research on the subject, the application numbered US4268820 and titled “Integrating Type Analog-to-Digital Converter” was encountered. An integral type analog-to-digital converter with a short conversion period and a small amplitude of the integral output is disclosed in the application. Here, a method has been revealed to improve the conversion accuracy of the ADC topology known as "Dual slope integrating analog to digital converter". In said method, the integrals of different currents are taken and these integrals are compared. However, the process of changing the current value fed from the variable current source until the integrals taken by the integrator are sampled over the capacitances and the voltages measured across these capacitances are equal to each other, is not mentioned herein.
As a result of the research on the subject, the application numbered US20100231290 and titled “Measurement Device, Electronic System, and Control Method Utilizing the Same” was encountered. A circuit for correcting the manufacturing-induced errors in the p parameter of BJT transistors in a circuit used to measure the temperature of chips (IC) is described in said application. This circuit is designed to make the ratio of the collector current of the PNP transistor 16 between the two phases. In this circuit, since the collector current goes directly to the GND point, the ratio of IC currents in two phases is tried to be made 16 by using the formula IC=IE-IB. Therefore, IB1 and IE1 currents in the first phase are converted to voltage with a current mirroring element and resistor and kept in the memory of the calculation unit. In the second phase, after the same operations are performed for IB2 and IE2 currents, the results found in the second phase are compared with the results found in the first phase in the calculation unit. According to this result, the (IE2-IB2)/(IE1 -IB1 ) ratio is tried to be equalized to 16 by adjusting the IE2 current. Here, the value of at least one current supplied from current sources is adjusted so as to maintain a predetermined current ratio as a result of comparing the voltages obtained from the currents from different current sources with each other. The process of changing the current value fed from the variable current source until the integrals taken by the integrator are sampled over the capacitances and the voltages measured across these capacitances are equal to each other but not to a fixed value, is not mentioned in said application.
As a result of the research on the subject, the application numbered WO96/10297 and titled “System for Calibrating Analog-to-Digital Converter” was encountered. In said application, a novelty has been revealed so as to solve the low resolution problem in the ADC technique known as "Dual slope integrating analog to digital converter". Herein, the charge accumulated on the capacitor is discharged using two separate current sources called IL and IS. The input current of the ADC can be converted into a high resolution digital data by switching these currents on and off at certain times by a controller. However, the ratio of IL and IS currents must be at the desired level so as to avoid linearity errors in this ADC structure. Here, this value is set as 32. A ratio higher or lower than this value may cause monotonicity and missing code errors. Therefore, in such a case, the currents need to be calibrated so that the ratio of their currents is 32 in order for the circuit to work properly. In said application, instead of calibrating the ratio of currents to a specific number, first of all the ratio between currents are founded. Then to calculate the final value of ADC this founded ratio is used. The method described below is used to find the ratio of the currents in this application. First of all, the capacitance is filled with a current whose value is known. Then, the current II discharges the capacitance during the time i . Following this, the Is current discharges the capacitance during the time tsi ■ This process is repeated using the times tL2 and ts2. At the end of these periods, the ratio of the currents is calculated according to the following formula:
As a result of this ratio, the value of can be, for example, .i . This value is then used in the calculator to create the numerical value of the input current. However, this extra process increases the complexity of the circuit. In addition to this, the process of changing the current value fed from the variable current source until the integrals taken by the integrator are sampled over the capacitances and the voltages measured across these capacitances are equal to each other, is not mentioned in this invention.
As a result, due to the abovementioned disadvantages and the insufficiency of the current solutions regarding the subject matter, a development is required to be made in the relevant technical field.
Aim of the Invention
The invention aims to solve the abovementioned disadvantages by being inspired from the current conditions.
The main aim of the invention is to equalize the current ratios by decreasing or increasing the currents of current sources by the current ratio equalizer circuit according to the result of the comparison, until the integral results are equal, by integrating a plurality of currents at different times over the same capacitor and comparing the results of these integrals with a comparator circuit.
Another aim of the invention is to control the ratios of currents to each other and to fix these ratios in applications where two or more current sources are used in general, in particular two current sources that discharge the sampling capacity dual ramp single slope analog-to-digital converters.
Another aim of the invention is to provide a more accurate current ratio at small currents.
The structural and characteristic features of the present invention will be understood clearly by the following drawings and the detailed description made with reference to these drawings and therefore the evaluation shall be made by taking these figures and the detailed description into consideration.
Figures to Help Understanding of the Invention
Figure 1 is the schematic view of the mirroring method used in prior art
Figure 2 is a simplified schematic view of the current equalizer circuit which is the subject of the invention.
Figure 3 is the time display of the current equalizer circuit which is the subject of the invention.
Figure 4 is the detailed schematic view of the alternative version of the current equalizer circuit which is the subject of the invention.
Figure 5 is a representative schematic view of the OTA (Operational Trasnconductance Amplifier) load current problem.
Reference List
1. OTA (Operational T ransconductance Amplifier)
2. Comparator
3. Control circuit
T1 . Reset time
T2. 11 current integration time
T3. Reset time
T4. I2 current integration time
Symbols and abbreviations used in the figures and description
I: Current
M: Transistor
V: Voltage
C: Capacitor t: Time
<D: Switch
S: Another switch
Detailed Description of the Invention
In this detailed description, the preferred embodiments of the inventive current equalizer circuit are described by means of examples only for clarifying the subject matter.
For example, it is aimed that an l2 current is A times as much as an current in the example application seen in the simplified scheme of the inventive current equalizer circuit, given in Figure 2. The current equalizer circuit integrates the and l2 currents respectively and compares the result of these integrals with a comparator (2), and changes the value of the l2 current to be A multiple of the current so as to adjust the
ratio of the currents. The value of l2 current can be increased or decreased by controlling the DAC (Digital to Analog Converter) control circuit (3).
The present invention can be adapted to control and fix the ratios of currents produced by current sources to each other in applications where two or more current sources are used in general, in particular two current sources that discharge sampling capacitor in dual ramp single slope analog-to-digital converters. Accordingly, the present invention mainly comprises of the following;
• at least one constant current source producing constant current and at least one variable current producing variable current source,
• at least one integrator that integrates the constant current supplied by the constant current source and the variable current supplied by the variable current source,
• a sampler that samples the constant current integral over a first capacitance and the variable current integral over a second capacitance taken by the integrator;
• at least one comparator (2) at the output of the sampler that compares the voltage across the first capacitance with the voltage across the second capacitance in each cycle, and
• at least one digital-analog converter control circuit (3) that enables the variable current value to be increased or decreased in each cycle until the voltages on the first capacitance and the second capacitance are equal according to the comparison result coming from the comparator (2).
In the present invention, the integration time determines the ratio of the currents. The output voltage of the integrator OTA is shown in Equation 1.
Here tx time denotes the time to start the integral. Before time tx as seen in Figure 3, since the Ont capacitor is reset, the vCint(tx) voltage (loaded voltage across the capacitor before starting the integral) becomes zero. Here, Vref is the voltage connected to the positive input of the OTA shown in Figure 2. Also, since the integrated currents are time-invariant DC currents, Equation 1 can be simplified as in Equation2.
If the h current is integrated during tinti, the resulting VOUTI output voltage becomes as in Equation 3.
Likewise, if the l2 current is integrated during , the resulting VOUT2 output voltage becomes as in Equation 4. Equation 4:
If VOUTI and VOUT2 can be equated with a circuit to be used, the ratio of currents is equal to the ratio of integration time.
Equation 5: tint2
I2 tint!
In the inventive current equalizer circuit, VOUTI and VOUT2 voltages are compared with each other through the comparator (2) during each cycle and as a result of this, the value of l2 current is changed with a digital-analog converter in each cycle, thus VOUTI and VOUT2 voltages are equalized to each other.
The timing signals of the switches used in the inventive current equalizer circuit and the voltages of the signals in the circuit are given in Figure 3. The operating structure of the circuit can be understood more easily with the help of Figure 3:
• First of all, the integration capacitance Cint is reset by the reset switch. Then, the reset switch is opened and the 01 switch is closed, and the current is integrated during tinti ■ The resulting integral voltage is sampled by opening the switch <t>i at the capacitance Ci.
• Then the Cint capacitance is reset again for the second integration. After this step, the 2 switch is closed and the l2 current is integrated in time. The resulting integral voltage is sampled by opening the switch 02 at the capacitance C2.
• After the second integration is finished, the comparator (2) compares the voltages across capacitances Ci and C2 and the control circuit (3); o increases l2 current through the digital analog converter if the voltage across capacitance C2 is less than the voltage across capacitance Ci. o reduces l2 current through the digital analog converter if the voltage across capacitance C2 is greater than the voltage across capacitance Ci.
• Then, the Cint capacitance is reset again and the same operations are applied, and the circuit operates until the voltages on the capacitances Ci and C2 are equal to each other.
When the voltages across capacitances Ci and C2 are equal, the condition specified in Equation 5 is fulfilled and the value of l2 current becomes equal to A times the value of current.
In an alternative embodiment of the present invention, the circuit shown in Figure 4 is presented so as to achieve the requested A ratio with higher accuracy:
I. In an exemplary embodiment, the first value of the integral voltage should be 2.65V and the final value should be 1.65V in order for the current equalizer circuit to operate better. In addition to the reset switch shown in Figure 2, the S2 and S3 switches shown in Figure 4 have been added so as to achieve this.
II. Cciamp capacitor and S4 switch are added to the circuit so as to prevent settling errors during transitions between the reset phase and the current integrating, and to get rid of the reset noise simultaneously. Switch S4 is kept closed for a while after the integration of and l2 currents begins. Thus, while the voltage on the left side of the Cciamp capacitor starts to decrease due to the integration process, the voltage on the right side remains constant at VREF2 (2.65V). Then, when the switch S4 is turned on, the voltage value on the right side of the Cciamp capacitor starts from the VREF2 voltage and follows the voltage on the left side of the capacitor with the same slope. The effect of the OTA's reset noise is not seen in the voltage across the right branch of the capacitor since the initial voltage of this circuit does not start from the output voltage of the OTA at the time of reset, it always starts from the VREF2 voltage. At the same time, the voltage changes that appear on the left side of the capacitor are not visible on the right side of the capacitor during the opening and closing of other switches in the circuit, since switch S4 remains closed for a while after the integrating process has started. If switch S4 opens after the voltages on the left side of the capacitor have fully settled, settling errors that may occur due to opening and closing of other switches on the right side of the capacitor are prevented.
III. Also, the load on the CSh_isb and CSh_msb capacitances changes since the output voltage changes while integrating the large and small currents. Currents Id and Ic2 that change this load are provided by OTA. Ici and Ic2 currents are formed as in the equations below.
Equation 6 and Equation 7:
However, the slope of the output voltage is different by a multiple of A when integrating the current h and l2. For this reason, there is a difference of a multiple of A between the currents provided by the OTA, as seen in Equation 8, during the phases where the and l2 currents are integrated.
When different current is provided by the OTA, the feedback voltage at the negative input voltage of the OTA differs for both phases. This difference causes the final voltage on the CSh_isb and CSh_msb capacitors to change and desired ratio to be different from A. Switches S5 and S6 are added to the circuit, and these switches are turned on for a very short time in the last step of the integration process, and the OTA output voltage is sampled on the CSh_isb and Csh_msb capacities so as to solve this problem. Thus, it is prevented from driving current over the CSh_isb and CSh_msb capacities while integrating the and l2 currents of the OTA, so that the feedback voltage remains the same in both phases of the integrating process.
IV. Offset and other errors of OTA in the current equalizer circuit do not affect the operating performance of the circuit.. But the effect of comparator (2) is not like this. The performance of the comparator (2), in particular the offset voltage, directly affects the performance of the current equalizer circuit. Therefore, autozero switches 89,10,11,12 and auto-zero comparator (2) have been added to the current equalizer circuit. The auto-zero comparator (2) operates in two phases. The first phase is the auto-zero phase. In this phase, switches Sn and Si2 are kept closed, and switches S9 and S10 are kept open. In this way, the same voltage is applied to the plus and minus ends of the comparator (2), and the
offset of the circuit is recorded on a capacitance in the comparator (2). Then, when the comparator (2) is in phase, switches Sn and S12 are opened and switches S9 and S10 are closed, the comparator (2) works with zero offset by adding the offset value recorded in the previous phase to the difference between the input voltages.
Claims
CLAIMS A current equalizer which controls and equalizes the ratios of currents produced by current sources in applications where two or more current sources are used, characterized by comprising;
• at least one constant current source producing constant current and at least one variable current producing variable current source,
• at least one integrator that integrates the constant current supplied by the constant current source and the variable current supplied by the variable current source,
• a sampler that samples the constant current integral over a first capacitance and the variable current integral over a second capacitance taken by the integrator;
• at least one comparator (2) at the output of the sampler that compares the voltage across the first capacitance with the voltage across the second capacitance in each cycle, and
• at least one digital-analog converter control circuit (3) that enables the variable current value to be increased or decreased in each cycle until the voltages on the first capacitance and the second capacitance are equal according to the comparison result coming from the comparator (2). The current equalizer according to claim 1 , characterized by comprising at least one Cciamp capacitor that prevents settling errors and reset noise in the phase transitions where reset phase and current are integrated. The current equalizer according to claim 1 , characterized by comprising at least one switch that prevents settling errors and reset noise in the phase transitions where reset phase and current are integrated. The current equalizer according to claim 1 , characterized by comprising autozero switches and auto-zero comparator (2) so as to prevent errors occurring in the circuit in all phases.
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TR2022008555 | 2022-05-26 | ||
TR2022/008555 TR2022008555A1 (en) | 2022-05-26 | Current rate equalizer circuit |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4268820A (en) | 1977-09-09 | 1981-05-19 | Nippon Electric Co., Ltd. | Integrating type analog-to-digital converter |
WO1996010297A1 (en) | 1994-09-29 | 1996-04-04 | Rosemount Inc. | System for calibrating analog-to-digital converter |
US20100231290A1 (en) | 2009-03-16 | 2010-09-16 | Li-Lun Chi | Measurement device, electronic system, and control method utilizing the same |
-
2023
- 2023-05-25 WO PCT/TR2023/050477 patent/WO2023229566A1/en active Search and Examination
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4268820A (en) | 1977-09-09 | 1981-05-19 | Nippon Electric Co., Ltd. | Integrating type analog-to-digital converter |
WO1996010297A1 (en) | 1994-09-29 | 1996-04-04 | Rosemount Inc. | System for calibrating analog-to-digital converter |
US5621406A (en) * | 1994-09-29 | 1997-04-15 | Rosemount Inc. | System for calibrating analog-to-digital converter |
US20100231290A1 (en) | 2009-03-16 | 2010-09-16 | Li-Lun Chi | Measurement device, electronic system, and control method utilizing the same |
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