WO2023213596A1 - Vorrichtung zum verpacken von waferkassetten - Google Patents
Vorrichtung zum verpacken von waferkassetten Download PDFInfo
- Publication number
- WO2023213596A1 WO2023213596A1 PCT/EP2023/060652 EP2023060652W WO2023213596A1 WO 2023213596 A1 WO2023213596 A1 WO 2023213596A1 EP 2023060652 W EP2023060652 W EP 2023060652W WO 2023213596 A1 WO2023213596 A1 WO 2023213596A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- shipping box
- bag
- shipping
- semiconductor wafers
- packaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3404—Storage means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0611—Sorting devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0606—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0614—Marking devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0618—Apparatus for monitoring, sorting, marking, testing or measuring using identification means, e.g. labels on substrates or labels on containers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1916—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by sealing arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1918—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by coupling elements, kinematic members, handles or elements to be externally gripped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1922—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by the construction of the closed carrier
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3218—Conveying cassettes, containers or carriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3402—Mechanical parts of transfer devices
Definitions
- the present invention relates to packaging of a wafer cassette, and more particularly to a wafer cassette packaging apparatus capable of automatically packaging a wafer cassette.
- a wafer refers to a thin plate used as a raw material for a semiconductor integrated circuit (IC), and is mainly manufactured using a silicon material.
- a manufacturing process of a semiconductor wafer made of silicon includes a single crystal growing process for producing a single crystal silicon ingot, a cutting process for obtaining a thin disk-shaped wafer by cutting a single crystal ingot, an edge grinding process for processing an outer peripheral portion of a wafer to prevent cracks and deformation of the through a lapping process for removing damage left on a wafer due to mechanical processing to improve the flatness of the wafer, a polishing process for mirror polishing a wafer, and a cleaning process for removing abrasives or foreign matter remaining on adhere to a semiconductor wafer.
- the semiconductor wafers produced by these various processes are stored in a cassette, e.g. B. housed in a front open shipping box (FOSB) to avoid contamination and protect it from external influences. Before they are packaged and shipped, they are sealed on the outside with a packaging film.
- a cassette e.g. B. housed in a front open shipping box (FOSB) to avoid contamination and protect it from external influences.
- FOSB front open shipping box
- the quality of the packaging plays an extremely important role.
- labels must be positioned precisely and reproducibly.
- the contents of these labels must also exactly match the contents of each delivery.
- the semiconductor wafers must be in the correct order in the respective slots of the wafer cassette.
- different Requirements from the different manufacturers of electronic components must be taken into account. For example, depending on the customer, the labels have to be positioned differently or the content of the labels (in barcode or characters, or both) varies depending on the customer.
- US 2020 219 741 A1 describes a device for packaging wafer cassettes, the device comprising: a loading part into which a wafer cassette is loaded; an accessory inspection part configured to inspect a recipe attached to the wafer cassette and inspect accessories of the wafer cassette; a first label attaching part configured to attach a first label to the wafer cassette on which the accessory inspection is completed; a primary film package configured to receive a primary film according to the recipe and package the wafer cassette using the primary film; a secondary film packaging member configured to receive a secondary film according to the recipe and secondary package the wafer cassette using the secondary film; a second label attaching member configured to attach a second label to the secondary film with which the wafer cassette has been packaged; and an unloading part configured to discharge the wafer cassette that has been completely packaged.
- JP 2015 058 958 A2 describes a packaging system that has a plurality of clamps for opening and closing the bag opening of a gusseted bag in a horizontal state in which the bag opening is formed at one end, and a carriage arm for inserting a container or a packaging object into the gusseted bag.
- the object of the present invention is to provide a device that minimizes the above-mentioned problems and is also capable of increasing the throughput of the packaging system.
- Figure 1 shows an exemplary embodiment of a device according to the invention for packaging wafer cassettes.
- the device contains the following elements:
- the device according to the invention for packaging wafer cassettes comprises several elements, which are described in more detail below.
- the shipping boxes used are containers made of plastic, for example polycarbonate (PC), which can contain components made of polybutylene terephthalate (PBT), polyolefin elastomers (POE) or polyethylethylene (PEE). These shipping boxes are commonly referred to as “front opening shipping boxes” (FOSB).
- the device according to the invention comprises an automatic loading station (101) which is able to accommodate a shipping box for semiconductor wafers.
- the FOSB is set up at the loading station (101).
- the device according to the invention further comprises an element for automatically writing and reading an RFID tag (102) attached to the shipping box.
- an RFID tag radio-frequency identification “identification using electromagnetic waves” refers to a technology for transmitter-receiver systems for the automatic and contactless identification and localization of objects using radio waves.
- the device according to the invention also comprises an element for automatically optically checking attachment parts of the shipping box using a camera (103). It must be possible to exclude any damage to the shipping box, so it is important to carry out checks in this regard. All test results including the camera images are saved.
- the device according to the invention preferably contains an element for automatically checking the correct filling of the wafer cassette.
- the task of this element is, for example, to identify semiconductors that have been sorted incorrectly.
- the wafer cassette has a plurality of receiving slots spaced apart for holding semiconductor wafers, each of which is prevented from further movement by a lower and upper pad, respectively.
- a common error can be a so-called cross-slot error, in which the semiconductor wafer was sorted diagonally in the wafer box.
- the device according to the invention preferably further contains a printer for printing labels which are used to stick onto the box.
- the device according to the invention also contains a device for automatically applying the labels to the shipping box (107). Furthermore, the device according to the invention preferably contains an element for automatically checking the labels attached to the shipping box. Here, for example, it is checked whether the labels are in the correct position and/or the printed content is legible and its content matches the desired content.
- the stuck position is preferably checked with millimeter precision using a camera system.
- the printed contents of the labels are also checked. All codes and characters must be legible and printed without errors. Areas of the label that are not printed must not have any printing errors.
- the label is compared with an image generated via a print file using image comparison and checked for a reproduction factor. All test results are saved.
- the device according to the invention also contains a device for automatically closing an inner bag that surrounds the shipping box by means of a first weld seam (105).
- the device according to the invention contains an element for automatically checking the tightness of the first weld seam (106). For example, negative pressure is used to check the tightness of the weld seam.
- the packaged FOSB is tested in a vacuum chamber to determine whether the bag is tight using a filling gas test. The test result is saved in the computer.
- the device according to the invention additionally contains an element for automatically loading the shipping box with a desiccant bag (104).
- Desiccant bags are usually filled with silica gel and are suitable for absorbing moisture from the air and thus avoiding the formation of condensation. It is essential that the desiccant bags are always positioned in the same position in the shipping box. A desiccant bag is automatically attached.
- the device according to the invention preferably also contains an element for closing an outer bag surrounding the shipping box by means of a second weld.
- the material used for the outer bag is usually different from the material used for the inner bag. After the bag is folded, the air is drawn out of the bag and an adjustable, defined amount of gas is supplied. The bag is then sealed. The excess of the bag is folded and glued on.
- the device according to the invention preferably contains an element for automatically checking the tightness of the second weld seam. Negative pressure is preferably used. The packaged FOSB is tested in a vacuum chamber to determine whether the bag is tight using a filling gas test. The test result is saved.
- the device according to the invention additionally contains an element for automatically transporting the shipping box (108).
- Transport devices are suitable here
- the device according to the invention contains an element which is capable of receiving a shipping box for semiconductor wafers and storing them for transport.
Landscapes
- Packaging Frangible Articles (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Engineering & Computer Science (AREA)
- Robotics (AREA)
- Packages (AREA)
- Auxiliary Devices For And Details Of Packaging Control (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024564908A JP2025515089A (ja) | 2022-05-05 | 2023-04-24 | ウェハカセット梱包装置 |
| CN202380037637.5A CN119137721A (zh) | 2022-05-05 | 2023-04-24 | 用于包装晶圆盒的设备 |
| KR1020247038735A KR102967549B1 (ko) | 2022-05-05 | 2023-04-24 | 웨이퍼 카세트 패키징용 장치 |
| US18/937,065 US20250069927A1 (en) | 2022-05-05 | 2024-11-05 | Device for packaging wafer cassettes |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP22171717.6A EP4273910A1 (de) | 2022-05-05 | 2022-05-05 | Vorrichtung zum verpacken von waferkassetten |
| EPEP22171717 | 2022-05-05 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US18/937,065 Continuation US20250069927A1 (en) | 2022-05-05 | 2024-11-05 | Device for packaging wafer cassettes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2023213596A1 true WO2023213596A1 (de) | 2023-11-09 |
Family
ID=81580509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2023/060652 Ceased WO2023213596A1 (de) | 2022-05-05 | 2023-04-24 | Vorrichtung zum verpacken von waferkassetten |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20250069927A1 (de) |
| EP (1) | EP4273910A1 (de) |
| JP (1) | JP2025515089A (de) |
| CN (1) | CN119137721A (de) |
| TW (1) | TWI860701B (de) |
| WO (1) | WO2023213596A1 (de) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040000495A1 (en) * | 2002-06-24 | 2004-01-01 | Hung-Wen Lee | Wafer shipping device and storage method for preventing fluoridation in bonding pads |
| US20040098949A1 (en) * | 2002-11-21 | 2004-05-27 | Taiwan Semiconductor Manufacturing Co., Ltd | Packaging method for wafers |
| US20050189629A1 (en) * | 2004-02-27 | 2005-09-01 | Fujio Ito | Method of manufacturing a semiconductor device |
| US20130341403A1 (en) * | 2012-06-22 | 2013-12-26 | Global Foundries Inc. | Method and apparatus for recording status of shippable goods |
| JP2015058958A (ja) | 2013-09-19 | 2015-03-30 | ミクロ技研株式会社 | 包装装置および包装システム |
| US20200219741A1 (en) | 2019-01-09 | 2020-07-09 | Sk Siltron Co., Ltd. | Wafer cassette packing apparatus |
| WO2020250267A1 (ja) * | 2019-06-10 | 2020-12-17 | ミクロ技研株式会社 | 出荷検査装置、これを有する包装装置および包装システム |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3336652B2 (ja) * | 1993-01-27 | 2002-10-21 | 神鋼電機株式会社 | 可搬式密閉コンテナ |
| JP4553840B2 (ja) * | 2003-03-04 | 2010-09-29 | 信越ポリマー株式会社 | 精密基板収納容器 |
| KR101876416B1 (ko) * | 2011-03-15 | 2018-07-11 | 삼성전자주식회사 | 버퍼 내의 웨이퍼 캐리어 정보 관리 시스템 및 방법 |
| CN111619899A (zh) * | 2020-06-24 | 2020-09-04 | 江苏微导纳米科技股份有限公司 | 晶圆盒自动封装设备 |
| TWM610157U (zh) * | 2020-09-16 | 2021-04-11 | 鴻績工業股份有限公司 | 裝袋機構 |
-
2022
- 2022-05-05 EP EP22171717.6A patent/EP4273910A1/de active Pending
-
2023
- 2023-04-24 WO PCT/EP2023/060652 patent/WO2023213596A1/de not_active Ceased
- 2023-04-24 CN CN202380037637.5A patent/CN119137721A/zh active Pending
- 2023-04-24 JP JP2024564908A patent/JP2025515089A/ja active Pending
- 2023-04-28 TW TW112115900A patent/TWI860701B/zh active
-
2024
- 2024-11-05 US US18/937,065 patent/US20250069927A1/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040000495A1 (en) * | 2002-06-24 | 2004-01-01 | Hung-Wen Lee | Wafer shipping device and storage method for preventing fluoridation in bonding pads |
| US20040098949A1 (en) * | 2002-11-21 | 2004-05-27 | Taiwan Semiconductor Manufacturing Co., Ltd | Packaging method for wafers |
| US20050189629A1 (en) * | 2004-02-27 | 2005-09-01 | Fujio Ito | Method of manufacturing a semiconductor device |
| US20130341403A1 (en) * | 2012-06-22 | 2013-12-26 | Global Foundries Inc. | Method and apparatus for recording status of shippable goods |
| JP2015058958A (ja) | 2013-09-19 | 2015-03-30 | ミクロ技研株式会社 | 包装装置および包装システム |
| US20200219741A1 (en) | 2019-01-09 | 2020-07-09 | Sk Siltron Co., Ltd. | Wafer cassette packing apparatus |
| WO2020250267A1 (ja) * | 2019-06-10 | 2020-12-17 | ミクロ技研株式会社 | 出荷検査装置、これを有する包装装置および包装システム |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI860701B (zh) | 2024-11-01 |
| JP2025515089A (ja) | 2025-05-13 |
| US20250069927A1 (en) | 2025-02-27 |
| EP4273910A1 (de) | 2023-11-08 |
| KR20250007589A (ko) | 2025-01-14 |
| CN119137721A (zh) | 2024-12-13 |
| TW202344462A (zh) | 2023-11-16 |
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