WO2023134867A1 - Procédé et système de détermination de la position d'une sonde lors d'un examen saft - Google Patents

Procédé et système de détermination de la position d'une sonde lors d'un examen saft Download PDF

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Publication number
WO2023134867A1
WO2023134867A1 PCT/EP2022/050792 EP2022050792W WO2023134867A1 WO 2023134867 A1 WO2023134867 A1 WO 2023134867A1 EP 2022050792 W EP2022050792 W EP 2022050792W WO 2023134867 A1 WO2023134867 A1 WO 2023134867A1
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Prior art keywords
ultrasonic
probe
determined
uecho
test
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PCT/EP2022/050792
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German (de)
English (en)
Inventor
Matthias Goldammer
Hubert Mooshofer
Karsten SCHÖRNER
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Siemens Aktiengesellschaft
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Priority to PCT/EP2022/050792 priority Critical patent/WO2023134867A1/fr
Publication of WO2023134867A1 publication Critical patent/WO2023134867A1/fr

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654Imaging
    • G01N29/069Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/225Supports, positioning or alignment in moving situation
    • G01N29/226Handheld or portable devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/26Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4436Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a reference signal

Definitions

  • the invention relates to determining the position of a test head of a SAFT system during the inspection of a test object.
  • Test objects such as machine components can have defects near the surface or deep in the component, such as cavities or cracks, which can have arisen during manufacture and/or during regular use of the component.
  • defects can lead to component failure. Consequently, components that are prone to defects or in which defects can lead to a critical failure, for example after their manufacture and/or as part of interim maintenance work, etc., are checked to see whether they have defects.
  • non-destructive test methods such as eddy current tests, dye penetrant tests, magnetic particle tests, thermographic tests, radiographic tests or ultrasonic tests.
  • Ultrasonic testing can also be used to test electrically insulating and non-ferromagnetic components, ie the respective test method is less dependent on the material of the test object.
  • an ultrasonic probe is moved in two spatial dimensions over the surface of the test object.
  • local information about the local condition of the test object is determined for each spatial position of the ultrasonic probe.
  • the collected individually determined local information The data are then merged to give an overall picture of the condition of the test object. For this it is important to assign the local information to the associated spatial positions of the ultrasonic probe, ie the spatial position of the ultrasonic probe must be known for each individual measurement.
  • SAFT Synthetic Aperture Focusing Technique
  • SAR synthetic aperture radar
  • the test volume is subdivided into small volume elements or voxels, and for each voxel those echo signal components from different positions of the probe are added that could originate from this voxel with regard to their propagation time.
  • amplitude sums are determined from the large number of echo signals for each voxel of the test object, i.e. non-rectified ultrasonic data from different probe positions in the test object are superimposed in the correct phase.
  • the SAFT signal or also the SAFT amplitude sum is thus obtained as a superimposition of the echo signals for different probe positions.
  • Ultrasonic testing can be used with the aid of the SAFT analysis, for example, with a manual movement of a test head that emits the ultrasonic impulses and receives the echo signals corresponding to the emitted ultrasonic impulses.
  • SAFT tests are described, for example, in EP2932256B1 and in EP2898322B1.
  • a respective ultrasonic echo "UECHO(i)" can certainly be composed of a large number of individual echoes or represent a corresponding superimposition of individual echoes which are generated by reflections of the pulse UIMP(i) at different reflectors of the test object.
  • an event E(i) can be the insonification of a respective ultrasonic impulse UIMP(i).
  • an event E(i) can also be the receipt of an echo UECHO(i) corresponding to an insonified pulse UIMP(i).
  • Both the echo UECHO(i) and the pulse UIMP(i) on which it is based are related to the respective event E(i), i.e. are “connected” to it.
  • the index "i" counts those events E(i) or ultrasonic pulses UIMP(i) etc., to which, as described below, positions POS(i) of the probe are based on the corresponding ultrasonic echoes UECHO( i) are determined, which are then subsequently processed to determine a specific end position POS(J)
  • UIMP(i) and UIMP(i+1) further ultrasonic pulses UIMP' are generated and insonified, whose echoes UECHO' are definitely used for the following SAFT analysis, possibly, but not for determining the position.
  • Such impulses and echoes are not taken into account when counting i.
  • an impulse is provided for determining the position However, the corresponding echo is not used for this purpose.
  • the ultrasonic echo UECHO(i) used to determine the position POS(i) of the probe (210) for the respective event E(i) is at least partly due to reflection of the corresponding ultrasonic pulse UIMP, also associated with the event E(i). (i) formed on the reference structure ST of the test object (100).
  • the reference structure ST is an intrinsic property of a surface of the test object, in particular a structure on this surface of the test object and preferably a structure of a roughness area of the surface.
  • the ultrasonic testing system is designed and installed in such a way is used that the ultrasonic pulses UIMP(i) are insonified in such a way that a respective ultrasonic echo UECHO(i) corresponding to a specific pulse UIMP(i) of the ultrasonic pulses is at least partially detected by reflections on this reference structure ST on the surface of the test object is created.
  • the reference structure ST ie for example the roughness, is preferably located on that surface of the test object along which the test head for the ultrasonic test is moved.
  • the variable G(i) derived in each case can be, for example, a position or point t(i) of an amplitude pattern in the A-scan IMAA(i) associated with the respective echo UECHO(i).
  • the derived quantities G(i) can be precisely these 2D images.
  • the reference structure ST is shown in these images at specific points and a comparison of these points allows conclusions to be drawn about the position of the probe.
  • the probe can be designed as a phased array probe, which emits the ultrasonic pulses UIMP(i) and receives corresponding ultrasonic echoes UECHO(i).
  • the ultrasonic testing system reconstructs associated images 2DIMA(i) of areas of the surface based on the ultrasonic echoes UECHO(i) associated with the events E(i).
  • a distance ⁇ s(i) covered by the probe between the associated events E(i), E(i+1) is then determined by comparing the corresponding images 2DIMA(i), 2DIMA(i+1).
  • the SAFT system can also be operated in such a way that roughness on the surface and in particular the reference structure ST cause significant ultrasonic echoes UECHO(i), so that the images 2DIMA(i) contain this structure ST .
  • the respective 2D image 2DIMA(i) represents the derived variable G(i) introduced above.
  • DETPOSV1 for determining a specific position POS(J) of the probe for a specific event E(J)
  • this point t(i) represents the derived quantity G(i) introduced above.
  • the respective A-scan IMAA(i) itself represents the derived variable G(i).
  • the respective position POS(i) can be determined in two dimensions, for example if the test head comprises two individual test heads (210x, 210y) which are arranged at an angle of preferably, but not necessarily, 90° to one another , ie the pulses UIMP or sound bundles emitted by the probes enclose such an angle of, for example, 90°.
  • the method described above for determining the probe position can then be carried out separately for each individual probe (210x, 210y) in order to determine POSx(i) or POSy(i).
  • a 2D position determination is possible if the probe is equipped with an additional sensor that detects the direction PHI(i) of the movement along the covered distance ⁇ s(i) between the events E(i), E(i+1 ) is detected, so that the 2D position POS(i) can be determined by combining the respective distance ⁇ s(i) covered and the respective direction PHI(i).
  • a correspondingly designed ultrasonic testing system which can be set up in particular as a SAFT system, includes a test head for inspecting a test object and a control unit for controlling the test head and for processing ultrasonic echoes UECHO(i), which during an inspection of the Test object, for example. Be received by the probe itself or by additional sensors.
  • the ultrasonic test system is set up to carry out the method explained above to determine the position POS(i) of the test head (210) for a respective event E(i) or at the corresponding point in time T(i).
  • the control unit for realizing the functions of controlling the test head and processing the ultrasonic echoes UECHO(i) can be designed as an integrated unit or have a corresponding number of separate modules.
  • the ultrasonic testing system can be set up to generate the ultrasonic pulses UIMP(i) and insonify them into the test object in such a way that a respective ultrasonic echo UECHO(i) corresponding to an insonified ultrasonic pulse UIMP(i) is at least partially reflected on structures the surface of the test object, especially at surface roughness.
  • the ultrasonic test system can be designed in such a way that the test head is designed as a phased array test head or that a wedge is provided, with the help of which the probe is to be arranged at an angle ALPHA with respect to the surface, so that the ultrasonic pulses UIMP(i) can be irradiated into the test object at a corresponding insonification angle ALPHA with respect to the surface.
  • the test head can comprise two individual test heads, which are arranged at an angle of 90° to one another.
  • the ultrasonic testing system is then set up to carry out the method described above separately for each individual probe in order to determine POSx(i) or POSy(i ) to determine.
  • the ultrasonic testing system can be set up, as described above, to determine the distance ⁇ s(i) covered between two events E(i), E(i+1).
  • the probe is additionally equipped with a sensor that detects the direction PHI(i) of movement along the distance ⁇ s(i) between the events E(i), E(i+1), with the 2D position POS (i) is determined by combining the respective distance covered ⁇ s(i) and the respective direction PHI(i).
  • the solution proposed here therefore allows position detection of the probe without the use of external components.
  • the position is only detected by the probe itself and can therefore be described as “probe-integrated”.
  • the solution is particularly suitable for a manual SAFT inspection, in which the inspection head is moved manually over the object surface.
  • FIG. 3 shows an alternative embodiment of the first variant
  • FIG. 4 shows a probe with a sensor and individual probes
  • FIG. 5 shows a plan view of a 2D phased array probe
  • FIG. 6 shows a second variant of the method for determining the position.
  • FIG. 1 shows an example and a simplified example of a test object 100 which has a defect 110 .
  • the defect 110 can be, for example, a cavity that was unintentionally created during the production of the test object 100 .
  • the device 200 is designed as a SAFT system 200, the way it works and functions is basically based on the SAFT method explained in the introduction, for example in accordance with the statements in EP2932256B1 and/or in EP2898322B1.
  • a probe 210 of the SAFT system 200 is designed to emit ultrasonic signals UIMP, for example ultrasonic pulses.
  • the probe 210 can be implemented, for example, as a round or rectangular single-oscillator probe or also as a likewise round or rectangular phased array probe.
  • the probe 210 is also designed to receive ultrasonic signals UECHO, these received ultrasonic signals UECHO being in particular the ultrasonic echoes UECHO which correspond to the transmitted ultrasonic pulses UIMP in the course of a SAFT measurement and which come from reflectors, e.g. from walls and / or irregularities of the test object 100 are reflected.
  • Defect 110 for example, represents such an irregularity.
  • the probe 210 can, in particular also manually, be guided freely on or along a surface 101 of the test object 100 and held in such a way that the probe 210 transmits the ultrasonic pulses UIMP into the test object 100 during the movement along the surface 101 transmits or “insonates” and on the other hand detects or measures the corresponding ultrasonic echoes UECHO.
  • a wedge 250 is used to arrange the probe 210 at an angle ALPHA with respect to the surface 101, so that the ultrasonic pulses UIMP are radiated into the test object 100 at a corresponding insonification angle ALPHA with respect to the surface 101 become.
  • the SAFT system 200 further comprises a control unit 220 which is connected to the test head 210 via a wired or wireless connection 225 .
  • the control unit 220 is set up to control the test head 210 via the connection 225 in such a way that it transmits the ultrasonic pulses to be emitted for examining the test object 100. se UIMP generated.
  • the control unit 220 is set up to further process the ultrasonic echoes UECHO measured by the test head 210 and corresponding to the transmitted ultrasonic pulses UIMP in the manner of a conventional SAFT analysis in order finally to produce images of a test area of the test object 100 to generate and display on a display device 240.
  • the corresponding measured time signals of the ultrasonic echoes UECHO are transmitted from the probe 210 to the control unit 220 via the connection 225 .
  • A-scans are generated from the measured ultrasonic echoes UECHO, ie from the raw data of the measurement, first and thus before the actual conventional SAFT analysis.
  • Such an A-scan ultimately represents a time series of the measured amplitudes of the ultrasonic echoes UECHO after an ultrasonic pulse, ie it shows the times and the corresponding amplitudes of the ultrasonic echoes UECHO received at the probe 210 corresponding to a previously radiated ultrasonic pulse UIMP.
  • the A-scans are processed further, with the corresponding ultrasound amplitude contributions of the corresponding ultrasound echoes UECHO being summed from the raw data for each voxel, for example in the form of a superimposition and averaging of the amplitude values of the received Ult - rapid echoes UECHO for each voxel.
  • control unit 220 is set up to carry out the approach to be described below for determining the positions POS of the test head 210 during a measurement, also using the A-scans.
  • the term "conventional SAFT method” includes conventional data acquisition and conventional SAFT analysis.
  • the conventional data acquisition essentially comprises the movement of the probe 210 along the surface 101 of the test object 100, the transmission of the ultrasonic pulses UIMP into the test object 100 by means of the probe 210 during the movement, the reception of the respective ultrasonic pulses UIMP corresponding to the transmitted render ultrasonic echoes UECHO by means of the probe 210 and the generation of the corresponding A-scans.
  • the conventional SAFT analysis includes the creation of an image of a specified test area of the test object 100 based on a summation of amplitude values of the received ultrasonic echoes UECHO, in particular based on a superimposition and averaging of the amplitude values of the received ultrasonic echoes UECHO, using the control unit 220
  • the SAFT system 200 determines and processes the positions POS(i) of the test head 210 during the measurement process, at which the test head 210 is located for a respective event E(i).
  • an event E(i) can be, for example, the irradiation of an ultrasonic pulse UIMP(i) into the test object 100.
  • those successive ultrasonic pulses UIMP( i) is one of which, as described below, positions POS(i) of the test head 210 are determined using the corresponding ultrasonic echoes UECHO(i).
  • positions POS(i) of the test head 210 are determined using the corresponding ultrasonic echoes UECHO(i).
  • a respective position POS(i) can in principle also be determined in the period between transmission and reception, i.e. not necessarily at the exact time of transmission.
  • a respective event E(i) for which the position POS(i) is determined could then also be the transmission of the ultrasonic pulse UIMP(i), even if the times of the actual transmission and of the position determination are slightly different.
  • the echo UECHO(i) corresponding to the transmitted ultrasonic pulse UIPMP(i) is also associated with this event E(i), even if this also occurs at a different point in time.
  • an event E(i) is associated with both an ultrasonic pulse UIPMP(i) and the corresponding dating ultrasonic echo UECHO(i), the position POS(i) of the test head 210 to be determined for this event E(i) being that at the time TIMP(i) of the transmission of the pulse UIMP(i), that at the time TECHO( i) receiving the corresponding echo UECHO(i) or that at a time between TIMP(i) and TECHO(i). Since, as mentioned, it can be assumed that the probe movement is much slower than the speed of sound, these different options can be regarded as equivalent.
  • UIMP(i) ultrasonic pulses
  • UIMP(i+1) further ultrasonic pulses UIMP' are generated and insonified, which are used for the SAFT method, i.e. their corresponding echoes UECHO ' are included in the SAFT analysis, but are not used to determine the position.
  • All ultrasonic echoes UECHO(i) which correspond to the ultrasonic pulses UIMP(i) and which are used to determine the position are preferably also used for the SAFT method. However, it is conceivable that only a subset of the echoes UECHO(i) is used for the SAFT method. This can be advantageous, for example, when a rate PRF or a pulse repetition rate of the ultrasonic pulses UIMP(i), which are used to determine the position, is very high compared to a movement speed vPK of the test head 210 during the examination of the test object.
  • those ultrasonic pulses UIMP(i) whose echoes UECHO(i) are not used for the SAFT method can be applied with a comparatively low amplitude in order to avoid phantom echoes interfering with the SAFT analysis.
  • an ultrasonic echo UECHO(i) includes a plurality of individual echoes which have arisen at different reflectors of the test object 100 and which are reflected as a corresponding plurality of peaks in the associated A-scan.
  • the measured positions POS(i) of the probe 210 at times T(i) of the respective ultrasonic pulses UIMP(i) and the respective time references T(i) can be used in the SAFT method to determine a respective distance between reconstructed respective voxel and measurement position.
  • a center position of the active aperture of the test head 210 can be determined when the ultrasonic signals UIMP(i) are emitted and taken into account when generating the image of the test area of the test object 100.
  • the active aperture is to be understood as meaning that part of the test head 210 which serves as an effective transmission or reception area.
  • images of the test object 100 can thus be created by means of the control unit 220 based on the ultrasonic echoes UECHO(i) as a function of the respective detected positions POS(i) of the test head 210 .
  • the solution proposed here makes use of the fact that each surface 101 has a certain roughness or, in particular, a characteristic structure ST in the surface roughness points.
  • the solution presented here to the problem mentioned at the outset is accordingly based on the use of this surface roughness and in particular on the use of the structure ST as a possible reference point for determining the positions POS(i), it being assumed that the structure ST acts as a reflector for the Ultrasonic pulses UIMP(i) acts.
  • the positions POS(i) are determined and specified in particular with reference to a starting position POS(0) or with reference to a position POS(ij) determined in a previous step with i>j and j ⁇ 1, ie it is a matter of relative position determination and relative positions POS(i).
  • the starting position POS(0) can be, for example, the position of the test head 210 at the point in time T(0) when a suitable ultrasonic signal UIMP is first sent out, or else, for example, by a user of the test head 210 or the SAFT- Systems 200 are specified. The latter can take place, for example, when the user has arranged the test head 210 in a specific position which he considers to be a suitable starting position.
  • the probe 210 for the inspection of the test object 100 i.e. for sending the ultrasonic signals UIMP(i) into the test object 100 and for receiving the corresponding ultrasonic echoes UECHO(i)
  • the probe 210 for the inspection of the test object 100 is arranged in such a way that its longitudinal axis L, along the the ultrasonic pulses UIMP(i) are emitted, encloses an angle ALPHA with the surface 101, so that the ultrasonic pulses UIMP(i) hit the surface 101 at this angle ALPHA and are radiated into the test object 100 at this angle ALPHA.
  • the insonification angle ALPHA is selected in such a way that creeping waves, ie surface-pa- parallel longitudinal waves or transverse waves are excited.
  • test head 210 can be designed as a so-called angle test head, so that the use of the wedge 250 can be dispensed with.
  • additional angles can also be used by means of appropriate focal laws when using a phased array probe.
  • A-images IMAA(i) are generated in a manner known per se, ie for example by “conventional data acquisition” as described above, which show the amplitudes of the ultrasonic echoes UECHO (i) represent as a function of time.
  • the area in which the ultrasonic echoes UECHO caused by the surface roughness can fall is analyzed in these A-scans IMAA(i). This is usually the time range that corresponds to a sound path of a few centimeters from the insonification position of the probe. The path should be long enough to allow signal correlation.
  • the surface roughness or in particular the specific structure ST in the surface roughness causes a characteristic temporal sequence of ultrasonic echoes UECHO(i) or their amplitudes and thus a corresponding amplitude pattern MUST (ST) in the associated A-scan IMAA(i ), ie a characteristic time sequence MUST (ST) of amplitudes.
  • This pattern MUST (ST) is located in the A-scan IMAA(i) at a position t(i).
  • the point t(i) represents the signal propagation time of the ultrasonic pulse UIMP(i) between the probe 210 and the structure ST of the surface roughness causing the corresponding ultrasonic echo UECHO(i).
  • T the point t(i) in the A-scan and the point in time T(i) at which an ultrasonic pulse UIMP(i) is transmitted.
  • the distance of the probe 210 from the structure ST will have changed when the A-image IMAA(i+1 ) is generated, since the test head 210 is at a different position POS(i+1)APOS(i) at this point in time T(i+1) with respect to the structure ST than at the point in time T(i) of the external dens of the previous ultrasonic pulse UIMP(i).
  • the amplitude pattern MUST(ST) caused by the structure ST is located at a different point t(i+1) in the A-scan IMAA(i+1) due to the correspondingly changed signal propagation time between probe 210 and structure ST than in the previous A-frame IMAA(i).
  • ⁇ s(i) (1/2)*cLW* ⁇ t (i) based on the time differences ⁇ t (i).
  • cLW represents the speed of sound of the wave in the test object 100.
  • FIG. 2 shows a sequence of method steps of a method DETPOSV1 for determining the position of the test head 210 when recording a series of A images IMAA(i).
  • this series of A images IMAA(i) with i 1, .
  • the point t(i) at which the amplitude pattern MUST (ST) is located is identified in the individual A images IMAA(i).
  • the point t(i) can be defined, for example, in such a way that it specifies the point in the A-scan IMAA(i) at which the amplitude pattern MUST (ST) begins, or can be based on significant signal peaks or the like.
  • t(i) can also be defined, for example, in such a way that it describes the center of gravity or the middle of the amplitude pattern MUST (ST). For example, two A-scans are time-shifted in relation to one another until the patterns match; the shift then corresponds to t(i). A match of the patterns can be calculated, for example, via a cross-correlation of the two A-scans.
  • the probe positions POS(i) are finally calculated starting from POS(0). with respect to the starting position POS(0) can be determined.
  • a position POS(J) is therefore calculated in a third evaluation step EVAL3, for example according to .
  • the method steps IDENT and EVAL1 can be replaced by a method step EVAL4 in an alternative embodiment DETPOSV1' of the method DETPOSV1.
  • DETPOSV1' of the method DETPOSV1.
  • the time shift ⁇ t(i) is determined in step EVAL4 based on the series of A images IMAA(i) from the acquisition step ACQ, for example by correlating successive A images IMAA(i) and IMAA (i+1), ie by correlating the amplitude time series contained in the respective A images.
  • other methods can also be used here Determination of signal shifts conceivable, e.g. methods of frequency transformation or phase correlation.
  • the rate PRF of the ultrasonic pulses UIMP or the pulse repetition rate compared to the movement speed vPK of the probe 210 is sufficiently high, so that the probe 210 in the period between two consecutive ultrasonic pulses UIMP(i), UIMP(i+1) only a small Distance ⁇ s(i) covered.
  • vPK/PRF ⁇ LAMBDA/4 with vPK in [m/s] and PRF in [Hz] or [1/s] could represent a reasonable order of magnitude, with LAMBDA denoting the wavelength of the ultrasonic signals UIMP in [m]. .
  • the previously specified method DETPOSV1, DETPOSV1' for position determination in the first variant describes the position determination in one dimension.
  • the method can be extended to a two-dimensional position determination by the probe 210 being equipped with a sensor 211, which detects a rotation of the probe 210 about the normal of the surface 101, ie an alignment PHI of the probe 210.
  • a sensor 211 can, for example, be designed as a magnetic field sensor.
  • a two-dimensional position determination can alternatively also be achieved in that the probe 210 is equipped with two individual probes 210x, 210y in addition or as an alternative to the sensor 211, which are arranged relative to one another in such a way that the sound beams emitted by them enclose an angle, for example an angle of 90°.
  • the method described above for the test head 210 is carried out for each individual test head 210x, 210y.
  • POS(i) (POSx(i),POSy(i)) of the total probe 210 are combined.
  • FIG. 4 shows a probe 210 which is equipped both with a sensor 211 and with individual probes 210x, 210y.
  • these two supplements should preferably be seen as alternatives to one another.
  • vertical probes or phased arrays without a wedge can advantageously be used.
  • the test head 210 is preferably designed to carry out both the actual inspection of the test object 100 and the position determination DETPOSV1, DETPOSV1', ie the use of two separate test heads can be dispensed with.
  • probe parameters e.g. Frequency, size and bandwidth can be chosen differently. In some cases good compromises are conceivable, but in other cases it may be better to use two different probes for position determination and inspection.
  • the SAFT system 200 can essentially be designed in accordance with the version in DE102019205581A1, with the probe 210 being designed in particular as a phased array probe is.
  • the surface waves excited as a side effect during the actual volume test can also be at least partially detected and used to determine signal amplitudes, on the basis of which the position is determined in the second variant.
  • a signal amplitude is thus determined for the surface wave that is at least partially reflected on a partial surface area and in particular on the structure ST.
  • the surface wave that may be excited as a side effect is used to test the surface of the test object 100 .
  • the signal amplitude which corresponds to the surface waves and is typically different from the volume waves of the ultrasound, is determined.
  • This determined signal amplitude can also be used, for example, to identify or detect cracks and/or near-surface and/or open-surface defects in the object even during a volume test of the test object 100, which, however, is not the main interest in the invention addressed here.
  • Each individual test head 210-k can send ultrasonic impulses and receive ultrasonic echoes
  • the individual probes 210-k are placed next to each NEN row or, as indicated in FIG 5 in a plan view of the probe 210 along its longitudinal axis L, arranged in several rows, so that the individual probes 210-k form a two-dimensional, typically rectangular array.
  • the area visible in FIG. 5 is placed on the surface 101 of the test object 100 to examine it and is moved there to inspect the test object 100 .
  • phased array test head Such a 2D phased array test head is known per se and is therefore not explained in more detail at this point.
  • test objects can be scanned not only mechanically but also electronically, i.e. several measurements are carried out in a defined grid by a kind of electronic shifting of the active zone of the probe.
  • SAFT analysis With a stationary probe, data acquired with the same electronic scan can be evaluated using SAFT analysis. This works both when the probe is not moving and when the probe is moving during the electronic scan, if the transmit and receive positions as well as the insonification angle ALPHA and focussing are known at the time of reconstruction.
  • the probe 210 is designed and the SAFT system 200 or the control unit 220 are set up with several array elements 210-k of the probe 210 echoes UECHO(i) corresponding to the echoes of at least one array element or individual probe 210- k ultrasonic pulses UIMP(i) emitted by the probe 210. These echoes UECHO(i) are then further processed based on the conventional SAFT method in order finally to use the echoes UECHO(i) corresponding to the transmitted ultrasonic pulses UIMP(i) and corresponding A images to determine the reflectors of the ultrasonic pulses UIMP( i) to reconstruct in or on the test object 100.
  • phased array probe 210 in a manner known per se, ie for example.
  • A-images IMAA(i) generated which the amplitudes of the ultrasonic echoes UECHO(i) as a function of the represent time.
  • reflectors in a section of the surface 101 can be reconstructed using the received echo signals UECHO(i), for example including the structure ST of the surface roughness.
  • the phased array test head 210 is again moved along the surface 101 to inspect the test object 100 .
  • ultrasonic pulses UIMP(i) are transmitted into the object 100 and corresponding ultrasonic echoes UECHO(i) are received.
  • roughness of the surface 101 causes significant ultrasonic echoes UECHO(i) of the transmitted ultrasonic signals UIMP(i), from which reflectors or the structure ST can be reconstructed in a section of the surface 101, as indicated above.
  • a 2D image is thus preferably determined for each position determination.
  • the array elements emits an ultrasonic pulse UIMP for testing and then the same or a different set of array elements receives the ultrasonic echo UECHO.
  • Focal laws can also be used here, for example for focusing or panning the ultrasonic signal.
  • the position is typically determined after the test step. This can be done, for example, in such a way that individual array elements are pulsed one after the other and the echo signals are recorded by one or more array elements. This allows a 2D image of the surface to be created.
  • FIG. 6 shows a sequence of method steps of a method DETPOSV2 for position determination with the phased array probe 210 when recording a series of images 2DIMA(i).
  • images 2DIMA(i) are generated at different points in time T(i) as described above, which, for example, depict the structure ST, among other things.
  • the phased array probe 210 was moved between the recordings of the echoes UECHO(i), UECHO(i+1) for the images 2DIMA(i), 2DIMA(i+1), it can be assumed that the images of the ST structure are in these images 2DIMA(i), 2DIMA(i+1) at different positions (x(i),y(i)) and (x (i+1),y (i+1)) are located, so that the interim movement of the phased array probes 210 can be derived therefrom without further ado.
  • the difference D PA(i) between the positions (x(i),y(i)) and (x(i+1),y(i+1)) has to be 200 possibly be scaled. In any case, however, the difference D PA(i) is a direct measure of the distance ⁇ s(i) covered.
  • the distances ⁇ s(i) covered between two consecutive images 2DIMA(i), 2DIMA(i+1) or between the corresponding positions POS(i), POS(i+1) of the test head 210 or the differences D PA(i) are determined, for example by correlating the images 2DIMA(i), 2DIMA(i+1).
  • step EVAL1_PA in the first evaluation step EVAL1_PA, based on the series of images 2DIMA(i) from the acquisition step ACQ_PA, the determination of the between the recordings of two images 2DIMA(i), 2DIMA(i+1) distances ⁇ s(i) traveled by correlating the corresponding consecutive images 2DIMA(i) and 2DIMA(i+1).
  • steps EVAL1_PA for example.
  • the rate PRF of the ultrasonic pulses UIMP or the pulse repetition rate is sufficiently high compared to the movement speed vPK of the probe 210, so that the probe 210 in the period between two consecutive ultrasonic pulses UIMP(i), UIMP(i+ 1) only covers a small distance ⁇ s(i), whereby vPK/PRF ⁇ LAMBDA/4 can also apply here, for example.
  • vPK/PRF ⁇ LAMBDA/4 can also apply here, for example.
  • the probe positions POS(i) with respect to the starting position are finally calculated from POS(0).
  • POS(0) can be determined.
  • a position POS(J) is then calculated in a second evaluation step EVAL2_PA of the DETPOSV2 method, again according to .
  • the two-dimensionality of the phased array test heads 210 and the two-dimensionality of the 2DIMA(i) images mean that the position determination that is possible in this way is already readily carried out in two dimensions. Ie the variables ⁇ s(i) and POS(i) are already two-dimensional.
  • the two-dimensionality can also be achieved, for example, by equipping the probe 210 with the sensor 211, which detects a rotation of the probe 210 about the normal of the surface 101, ie an alignment PHI(i) of the probe 210 in step i, which ultimately allows conclusions to be drawn about the direction of movement of a respective covered distance ⁇ s(i). Taking this respective orientation PHI(i) into account during the accumulation results in a two-dimensional position determination.
  • A-images IMAA or images 2DIMA are also used, which were not recorded directly one after the other, i.e. within the framework of the first variant, A-images IMAA (i) and IMAA(i+N) or in the second variant images 2DIMA(i) and 2DIMA(i+N) are processed, each with N>1. This leads to a higher robustness of the result.
  • the method presented has the advantages that no external components are required to determine the position of the test head 210, so that consequent quently there is no effort involved in setting up such components. There are also no restrictions on the test area, which would result, for example, from a restricted field of view of a camera or an airborne sound listener, etc.
  • the method can also be used in the presence of a coupling agent.
  • the method is not only suitable for the intended main application of position determination for the hand-held SAFT method, but also allows position determinations for any ultrasonic inspection, e.g. for the specific application of ensuring inspection coverage.
  • An application together with other probes in which the position information plays a role is also conceivable.

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  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

L'invention concerne la détermination de la position d'une sonde d'un système de contrôle par ultrasons, en particulier d'un système SAFT, lors de l'inspection d'un objet d'essai. Cela est accompli par l'introduction d'impulsions ultrasonores UIMP(i) de telle sorte que des structures ST sur la surface de l'objet d'essai, par exemple la rugosité de surface, génèrent des échos ultrasonores UECHO(i). En fonction de la position de la sonde, les échos UECHO(i) ainsi générés se trouvent à différents emplacements dans les valeurs G(i) calculées à partir des échos ultrasonores UECHO(i), par exemple balayages d'amplitude IMMA(i) ou balayages 2D 2DIMA(i) de la surface. En comparant les valeurs calculées G(i), G(i+1) d'échos successifs UECHO(i), UECHO(i +1), la position POS(i) de la sonde peut être reproduite.
PCT/EP2022/050792 2022-01-14 2022-01-14 Procédé et système de détermination de la position d'une sonde lors d'un examen saft WO2023134867A1 (fr)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11318892A (ja) * 1998-05-08 1999-11-24 Ge Yokogawa Medical Systems Ltd 超音波撮像方法および装置
US20070150238A1 (en) * 2005-12-22 2007-06-28 Ge Inspection Technologies Gmbh And General Electric Company Sensor array for navigation on surfaces
EP2898322B1 (fr) 2013-02-07 2018-12-26 Siemens Aktiengesellschaft Procédé et dispositif d'amélioration d'une analyse saft en cas de densité de mesures locale irrégulière
DE102019205581A1 (de) 2019-04-17 2020-10-22 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Ultraschallprüfung eines Objektes
US20210089817A1 (en) * 2019-09-24 2021-03-25 The Boeing Company Method for Tracking Location of Two-Dimensional Non-Destructive Inspection Scanner on Target Object Using Scanned Structural Features
US20210090269A1 (en) * 2019-09-24 2021-03-25 The Boeing Company System and Method for Continual Localization of Scanner Using Non-Destructive Inspection Data
EP2932256B1 (fr) 2013-01-22 2021-05-19 Siemens Aktiengesellschaft Procédé et système de controle par ultrasons a commande manuelle pour des objets à controler

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11318892A (ja) * 1998-05-08 1999-11-24 Ge Yokogawa Medical Systems Ltd 超音波撮像方法および装置
US20070150238A1 (en) * 2005-12-22 2007-06-28 Ge Inspection Technologies Gmbh And General Electric Company Sensor array for navigation on surfaces
EP2932256B1 (fr) 2013-01-22 2021-05-19 Siemens Aktiengesellschaft Procédé et système de controle par ultrasons a commande manuelle pour des objets à controler
EP2898322B1 (fr) 2013-02-07 2018-12-26 Siemens Aktiengesellschaft Procédé et dispositif d'amélioration d'une analyse saft en cas de densité de mesures locale irrégulière
DE102019205581A1 (de) 2019-04-17 2020-10-22 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Ultraschallprüfung eines Objektes
US20210089817A1 (en) * 2019-09-24 2021-03-25 The Boeing Company Method for Tracking Location of Two-Dimensional Non-Destructive Inspection Scanner on Target Object Using Scanned Structural Features
US20210090269A1 (en) * 2019-09-24 2021-03-25 The Boeing Company System and Method for Continual Localization of Scanner Using Non-Destructive Inspection Data

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