WO2023117079A1 - Système et procédé de détermination d'une taille d'un défaut dans un composant - Google Patents

Système et procédé de détermination d'une taille d'un défaut dans un composant Download PDF

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WO2023117079A1
WO2023117079A1 PCT/EP2021/087288 EP2021087288W WO2023117079A1 WO 2023117079 A1 WO2023117079 A1 WO 2023117079A1 EP 2021087288 W EP2021087288 W EP 2021087288W WO 2023117079 A1 WO2023117079 A1 WO 2023117079A1
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Prior art keywords
insp
ref
measurement
sel
saft
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PCT/EP2021/087288
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German (de)
English (en)
Inventor
Georg Bodammer
Matthias Goldammer
Hubert Mooshofer
Karsten SCHÖRNER
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Siemens Aktiengesellschaft
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Priority to PCT/EP2021/087288 priority Critical patent/WO2023117079A1/fr
Publication of WO2023117079A1 publication Critical patent/WO2023117079A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4463—Signal correction, e.g. distance amplitude correction [DAC], distance gain size [DGS], noise filtering

Definitions

  • the invention relates to determining the size of a defect in a component using a SAFT method.
  • Test objects such as e.g. Machine components can have defects near the surface or deep in the component, such as Exhibit cavities or cracks, which may have arisen during manufacture and/or during regular use of the component.
  • defects can lead to component failure. Consequently, in particular those components that are prone to the occurrence of defects, e.g. after their manufacture and/or as part of interim maintenance work, etc. checked to see if they have any defects.
  • non-destructive testing methods such as Eddy current testing, dye penetrant testing, magnetic particle testing, thermographic testing or ultrasonic testing.
  • Electrically insulating and non-ferromagnetic components can also be tested using ultrasonic testing, i .e . H . the respective test procedure is more independent of the material of the test object.
  • ultrasonic testing i .e . H .
  • the respective test procedure is more independent of the material of the test object.
  • an ultrasonic test head is moved in two spatial dimensions over the surface of the test object.
  • local information about the local state of the test object is determined for each spatial position of the ultrasonic test head.
  • the collected individually determined local information is then brought together so that an overall picture of the condition of the test object results. For this it is important to match the local information to the associated spatial positions of the ultrasonic probe to assign it, d . H . the spatial position of the ultrasonic probe must be known for each individual measurement.
  • SAFT Synthetic Aperture Focusing Technique
  • Ultrasonic testing can be carried out with the aid of SAFT analysis, e.g. in the case of a manual movement of a test head which emits the ultrasonic pulses and which receives the echo signals corresponding to the emitted ultrasonic pulses.
  • SAFT exams are, for example. described in EP2932256B1 and in EP2898322B1.
  • the method for determining the size of a defect in a test area of a test object using a SAFT method provides that in an inspection measurement INSPM of the test object SAFT-based with a probe, a large number of A-images IMAA_INSP(p) in different actual poses PE_INSP (p) of the test head (210), ie the poses PE_INSP(p) are the real poses of the test head during a respective measurement of an A-scan.
  • the probe (210) is positioned at different poses PE_INSP(p) for different A-scans.
  • a pose PE_INSP(p) and an associated A-image IMAA_INSP(p), ie one recorded at this pose PE_INSP(p), are unambiguously assigned to one another.
  • All poses PE_INSP(p) of the inspection measurement INSPM taken together form a set m_insp of poses.
  • REFM total reference measurement
  • the probe (210) is positioned at different poses PE_REF ( j , nj , mj ), with each pose PE_REF ( j , nj , mj ) and an associated one, ie at this Pose PE_REF ( j , nj , mj ) captured
  • A-scan IMAA_REF ( j , nj , mj ) are uniquely associated with each other. All poses PE_REF(j, nj, mj) of a respective j or a respective reference measurement REFM(j) taken together form an entity m_ref(j) of poses.
  • an evaluation database BEW is now based on a SAFT analysis of a selection IMAA_REF_SEL (j) of A-images of the reference measurements REFM(j) and based on the known parameters of the defects DEFj SAFT analysis resulting amplitude sum and the defect parameters together.
  • AMPL amplitude sums for the spatial elements or voxels of the test area of the SAFT method in the test object (100) are determined based on a SAFT analysis of a selection of A images of the inspection measurement INSPM. The amplitude sums AMPL of the spatial elements can then be converted into the size of the defect to be determined using the evaluation database BEW.
  • the assessment database BEW is created using the amplitude sums resulting from the SAFT analysis and using the known parameters of the known defects DEFj. More precisely, to create the evaluation database BEW for each j, a SAFT analysis based on the A-images of the selection IMAA_REF_SEL (j) is carried out for the respective j in a reconstruction step SAFTREC(j), resulting in amplitude sums for the spatial elements or voxels of a test area of the SAFT method in the test object (100T), in particular for the space elements containing the known defects DEFj. The evaluation database BEW is then based on of the resulting amplitude sums and the related parameters known for the known defects DEFj.
  • a test grid RAST(j) with intended measurement poses PE(j) is specified, in the best possible proximity of which the test head for recording a respective A-scan IMAA_REF ( j , nj , mj ) of the reference measurement REFM( j) to be positioned.
  • A-scans for the respective selection IMAA_REF_SEL (j) for a respective j in a first selection step SEL1 (j) are selected from a total m_insp of poses PE_INSP(p) of the inspection measurement INSPM to form a selection m_insp_sel ( j) those poses PE_INSP(p') are selected and thus assigned to m_insp_sel(j) which, due to their spatial arrangement, come closest to the intended measurement poses PE(j) of a test grid RAST(j) defined for the respective reference measurement REEM(j).
  • a second selection step SEL2 (j) those actual poses PE_REF (j, nj , mj) are selected and thus assigned to m_ref_sel(j) that are spatially closest to the poses PE_INSP(p') of the entity m_insp_sel(j) determined in the first selection step SEL1(j).
  • IMAASEL(j) the A-scans IMAA_REF(j) of the respective reference measurement REFM(j) assigned to the actual poses of the entity m_ref_sel(j) selected in the second selection step SEL2(j) are used to form the selection IMAA_REF_SEL ( j ) selected.
  • a pose PE_INSP(p) of the whole m_insp is then selected for m_insp_sel(j) if its spatial distance APOS_INSP(p) from the nearest intended measurement posePE(j) of the test grid RAST(j) is less than a predetermined threshold value , especially smaller ones is a fraction 1/n of the distance APOS between two adjacent measuring poses PE(j) of the test grid RAST(j).
  • the selection of A-scans for the SAFT analysis includes those A-scans of the inspection measurement INSPM that have the poses PE_INSP(p) a associated with any of the m_insp_sel( ) entities.
  • a SAFT analysis of those A images IMAA_INSP( p) the inspection measurement INSPM is carried out, which is assigned to the poses PE_INSP(p) of the respective selection m_insp_sel(j), resulting in the respective individual amplitude sums AMPL(j) for the spatial elements or voxels of the test area of the SAFT method in the test object (100) .
  • a respective pose PE_REF of the selection m_ref_sel (j) can be assigned that pose PE_INSP from the totality m_insp_sel (j) which is spatially closest to it for each pair PP of poses formed in this way, a difference in the sound paths between the respective pose PE_REF, PE_INSP and the defect (110) is determined and the A-scan which is assigned to the pose PE_REF of this pair PP is corrected using the determined difference.
  • amplitudes of ultrasonic echoes UECHO(i) of the respective reference measurement REFM(j) can be compared with amplitudes of corresponding ultrasonic echoes UECHO(i), i.e. recorded in comparable measurement situations, of the inspection measurement INSPM .
  • the amplitudes of the A-scans of the corresponding individual reference measurement REFM(j) can be corrected based on the determined deviation.
  • moving the test head to different poses is done manually.
  • a corresponding device for determining a size of a defect in a test area of a test object using a A SAFT process has a control unit that is set up to carry out such a process.
  • the device or the SAFT system has a transmitter for transmitting ultrasonic pulses UIMP(i) into the test object and a receiver for receiving ultrasonic echoes UECHO(i) corresponding to the transmitted ultrasonic pulses UIMP(i).
  • the measurement signals received by the receiver form the A-scans recorded in the reference measurements REFM(j) or in the inspection measurement INSPM.
  • the transmitter and receiver are preferably housed in a common test head, the test head being movable manually to carry out the SAFT method.
  • a detection device is preferably provided for determining a respective pose of the transmitter and/or the receiver.
  • the solution presented here offers the advantage that it not only offers a qualitative result in the form of the reconstructed SAFT images, but also gives the reconstructed voxels a defect size or Substitute assigns error size and thus represents a quantitative method.
  • the solution presented here also offers the advantage that the simulation of the ultrasonic signals can be omitted or. is replaced by a corresponding reference measurement of artificial defects. This approach, based on real reference measurements, promises higher accuracy than using a simulation, since the latter usually cannot take all physical effects into account. Further advantages and embodiments result from the drawings and the corresponding description.
  • FIG. 3 shows a perspective view of a test object with artificial defects at different depths
  • FIG. 7 shows a top view of a test grid and poses of the inspection measurement and a reference measurement
  • FIG. 8 shows a side view of a test object with poses of inspection measurement and reference measurement.
  • FIG. 1 shows a simplified example of a test object 100 which has a defect 110 .
  • the defect 110 can, for example. be a cavity unintentionally created during the production of the test object 100 .
  • the device 200 is in the form of a SAFT system 200 whose mode of operation and functioning is based in principle on the SAFT method explained in the introduction, for example corresponding to the statements in EP2932256B1 and/or in EP2898322B1.
  • a probe 210 of the SAFT system 200 is designed, ultrasonic signals UIMP, for example. sending ultrasonic pulses out .
  • the probe 210 for example. be implemented as a round or rectangular single-oscillator probe or also as a round or rectangular phased array probe.
  • the probe 210 is also designed to receive ultrasonic signals UECHO, these received ultrasonic signals UECHO being in particular the ultrasonic echoes UECHO corresponding to the transmitted ultrasonic pulses UIMP in the course of a SAFT measurement, which are reflected by walls and/or irregularities of the test object 100. Such an irregularity is e.g. the defect 110 represents .
  • the test head 210 can, in particular also manually, freely on or along a surface 101 of the fürobj ect 100 and are held in such a way that the probe 210 transmits the ultrasonic pulses UIMP into the fürobj ect 100 during the movement along the surface 101 on the one hand and the corresponding ultrasonic echoes UECHO are detected or detected on the other hand. measures .
  • the SAFT system 200 also includes a control unit 220 which is connected to the test head 210 via a wired or wireless connection 225 .
  • the control unit Unit 220 is set up on the one hand to control the test head 210 via the connection 225 in such a way that it generates the ultrasonic pulses UIMP to be sent out for examining the test object 100 .
  • the control unit 220 is set up to further process the ultrasonic echoes UECHO measured by the probe 210 and corresponding to the emitted ultrasonic pulses UIMP in the manner of a conventional SAFT analysis in order to finally generate images of a test area of the test object 100 and display them on a display device 240 .
  • the corresponding measured time signals of the ultrasonic echoes UECHO are transmitted from the probe 210 to the control unit 220 via the connection 225 .
  • the measured ultrasonic echoes UECHO d. H .
  • A-scans are generated first and thus before the actual conventional SAFT analysis.
  • Such an A-scan ultimately represents a time series of the measured amplitudes of the ultrasonic echoes UECHO after an ultrasonic pulse UIMP, i. H . it shows the times and the corresponding amplitudes of the ultrasonic echoes UECHO received at the test head 210 corresponding to a previously radiated ultrasonic pulse UIMP.
  • the A-scans are processed further, with the corresponding ultrasound amplitude contributions of the corresponding ultrasound echoes UECHO from the raw data being summed up individually for each voxel, e.g. in the form of superimposition and averaging of the amplitude values of the received ultrasonic echoes UECHO for each voxel.
  • the term "conventional SAFT method” includes conventional data acquisition and conventional SAFT analysis.
  • Conventional data acquisition essentially involves moving the probe 210 along the surface 101 of the test object 100, emitting the ultrasonic pulses UIMP in the test object 100 by means of the test head 210 during the movement, the receiving of respective ultrasonic echoes UECHO corresponding to the transmitted ultrasonic pulses UIMP by means of the test head 210 and the generation of the corresponding
  • SAFT analysis includes the creation of an image of a predetermined test area of the test object 100, consisting of a large number of voxels, based on a summation of amplitude values of the received ultrasonic echoes UECHO, in particular based on a superimposition and averaging of the corresponding amplitude values of the received ultrasonic echoes UECHO, using the Control unit 220.
  • the conventional SAFT analysis supplies a SAFT amplitude sum for each observed voxel of the test area, which can finally be further processed for imaging
  • the SAFT system 200 uses a corresponding detection device 230 to determine the positions and possibly the orientations of the test head 210 during the measurement process.
  • such an ultrasonic echo UECHO (i) comprises a plurality of individual echoes which have arisen at different structures in the test object 100 and which are reflected as a corresponding plurality of peaks in the associated A-scan.
  • a current position POSI(i) and orientation ORI(i) of the probe 210 at the time T(i) of each ultrasonic pulse UIMP(i) can be determined from the measured positions and orientations and a respective time reference T(i) and at of the SAFT analysis to determine a respective distance between the reconstructed respective voxel and the measurement position.
  • a center position of the active aperture of the probe 210 can be determined when emitting the ultrasonic pulses UIMP(i) and taken into account when generating the image of the test area of the test object 100.
  • the active aperture is to be understood as meaning that part of the test head 210 which serves as an effective transmission or reception surface.
  • a spatial offset between the respective position measurement and the position of the test head 210 can be calculated using the recorded information about the test head orientation.
  • the image of the test object 100 can be created by the control unit 220 based on the ultrasonic echoes UECHO(i) depending on the respectively detected positions POSI (i) and orientations ORI (i) of the test head 210 .
  • the inspection measurement INSPM or examination of a test object 100 with the SAFT system 200 presented here should in particular also include an evaluation of the size GR of a defect 110 that may be present in the test object 100 .
  • an evaluation of a size GR of a defect is explained as follows 110 in a test object 100 possible.
  • the pose PE(i) should in particular include the position POSI(i) and possibly also the respective orientation ORI(i).
  • the ORI (i) is particularly advantageous when the probe 210 does not generate a sound cone that is rotationally symmetrical. E.g. in the case of rotational symmetry, the orientation ORI(i) can be omitted. For the sake of simplicity, it is assumed below that only the positions, but not the orientations, are determined and used.
  • the transmission of the UT pulse is not spatially uniform, i . H .
  • the sound pressure depends on the angles phi , the-ta .
  • an overall reference measurement REFM is now typically, but not necessarily, carried out on a test object 100T before the actual inspection measurement INSPM of the test object 100 to be examined using the SAFT system 200 .
  • the overall reference measurement REFM on the test object 100T results in an evaluation database BEW, which relates SAFT amplitude sums from a conventional SAFT method to corresponding defect sizes.
  • the evaluation database BEW can therefore be used to replace the amplitude sums for different voxels of the test area, which result from the SAFT analysis, with a more practicable parameter, which allows a statement to be made about the size GR of a defect found there.
  • the so-called Circular disk reflector (KSR) is used and the size GR of a defect is specified in "mmKSR", i.e. the measured amplitude sums are replaced by mmKSR from the evaluation database BEW.
  • KSR Circular disk reflector
  • mmKSR the size GR of a defect is specified in "mmKSR”
  • the evaluation database BEW which is thus e.g. Matrix is used, are therefore for this purpose the location or
  • the evaluation database BEW can be created based on simulations, as explained for example in the already mentioned DE102013211616A1, this brings with it the disadvantages mentioned.
  • An advantageous alternative to creating the evaluation database BEW is therefore proposed below.
  • the size GR of the defect 110 found in this way can be determined in mmKSR from the evaluation database BEW from an amplitude sum measured there and the depth in the test object 100 also determined during the measurement.
  • a size GR in mmKSR can nevertheless be determined by interpolating the closest values in the evaluation database BEW.
  • the test object 100T largely corresponds to the test object 100 to be examined with regard to its internal and external structure, including the materials used.
  • J denotes the total number of artificial defects DEFj in the test object 100T.
  • the different depths TIEj are equivalent to different signal propagation times of the ultrasonic signals UIMP, UECHO.
  • FIG. 2 shows an embodiment in which the artificial defects DEFI, DEF2, DEF3 lie at the same depth TIEI below the surface 101 of the test object 100, but have different sizes GR1, GR2, GR3. Ie only the magnitudes GRj are varied, but not the depths TIEj.
  • a preferred embodiment, which is not shown here, could be designed in such a way that both the sizes GRj and the depths TIEj of the artificial defects DEFj in the test object 100T are varied.
  • the overall reference measurement REFM on the test object 100T is carried out with the same settings of the SAFT system 200 as the actual inspection measurement INSPM of the test object 100 to find any defects in the test object 100, i.e. the same aperture and the same ultrasonic pulses UIMP(i) are defined, for example used by voltage, square pulse width, filter etc.
  • a multiplicity of A images IMAA_REF(j) are recorded at different locations in a known manner for each of the artificial defects DEFj.
  • the correspondingly provided measuring positions POS (j) of these provided measuring points are identified in FIG. 2 and FIG. 3 by the dots and in FIG. 5 and also in FIG. 6 and FIG. 7 by the crossing points of the horizontal and vertical lines there.
  • these intended measurement points of the test grid RAST(j) represent the positions POS(j) at which or in their best possible Proximity of the probe 210 is to be positioned to generate a data set for a respective A-scan.
  • test grid RAST(j) ie the arrangement of these provided measurement positions POS(j) of the reference measurement REFM(j), is selected such that a respective measurement covers and records the volume around the respective artificial defect DEFj as well as possible. Furthermore, the test grid RAST(j) is defined in such a way that the reference measurement REFM(j) with the greatest possible spatial sampling or with the finest possible sampling on the surface 101T of the test object 100T, since this increases the conversion accuracy that can ultimately be achieved.
  • the actual positions POS_REF (1) deviate from the intended measuring positions POS (1), ie the intended measuring positions POS (1) are not always met exactly in practice, e.g. because the positioning of the test head 210 is hand is not arbitrarily precisely possible.
  • the test head 210 is then moved as precisely as possible to the next measuring point of the N1*M1 measuring points POS(1) of the test grid RAST(1) for the artificial defect DEF1 and again records the data for generating the corresponding A-image IMAA_REF there.
  • An A-scan IMAA_REF (1, nl, ml) is recorded for each measurement point (nl, ml) provided for each grid RAST (1) or at least for a sufficient proportion of the measurement points provided there.
  • the poses PE_REF (j, n, m) comprising the positions POS_REF (j, nj , mj ) and, if necessary, the orientations ORI_REF (j, nj , mj ) of the test head 210 are determined and stored for each individual measurement of the reference measurement REFM(j). All of the poses PE_REF(j, nj, mj) of a reference measurement REFM(j) on a respective defect DEFj are referred to below as m_ref(j).
  • an A-scan IMAA_REF (j, nj , mj ) and the corresponding pose PE_REF (j, nj , mj ) are uniquely associated with one another.
  • the associated poses m_ref(j) of the test head 210 are also available in addition to the respective A images IMAA_REF(j, nj, mj) itself.
  • the orientations ORI_REF can be represented in particular by a rotation PHI_REF around the respective vertical axis or normal to the surface 101T.
  • the sizes GRj and the depths TIEj of the respectively examined artificial defects DEFj are also known.
  • a respective pose PE_INSP(p) includes the position POS_INSP(p) of the test head 210 and possibly its orientation ORI_INSP(p).
  • the poses PE_INSP(p) in or at which the test head 210 is actually positioned for a respective measurement process for recording a respective A-image IMAA_INSP(p) are detected with the detection device 230, for example. Consequently, an A-scan IMAA_INSP(p) and the corresponding pose PE_INSP(p) are in turn uniquely assigned to one another.
  • the totality of all actual poses PE_INSP(p) of the inspection head 210 during the inspection measurement INSPM, on which an individual measurement is carried out to generate a respective A image IMAA_INSP(p), is referred to below as m_insp.
  • the corresponding plurality P of A-images IMAA_INSP(p) as well as the total m_insp of the corresponding poses PE_INSP(p) result from the totality of the P individual measurements of the inspection measurement INSPM.
  • a first selection step SELl (j) those positions POS_INSP(p') of the inspection measurement INSPM are now selected for a respective j from the totality m_insp which, due to their spatial arrangement, correspond to the measurement positions POS (j) provided for the corresponding reference measurement REFM(j ) defined test grid RAST(j) come closest.
  • the entirety of the measurement positions POS_INSP(p′) selected in this way for a respective j is denoted by m_insp_sel(j).
  • FIG 6 exemplarily shows the entirety m_insp of the positions POS_INSP1, ..., POS_INSP10 of the inspection head 210 actually approached during the inspection measurement INSPM, the individual positions POS_INSP(p) of the entirety m_insp, at which the inspection head 210 was actually positioned for the inspection measurement INSPM crosses are marked.
  • m_insp_sel ( j ) For a respective j for m_insp_sel ( j ), those positions POS_INSP(p') are selected from the total m_insp to form m_insp_sel ( j ) which, due to their spatial arrangement, correspond to the previously defined test grid RAST(j) come closest and which are at the same time in the coverage area REL(j).
  • m_insp_sel ( j ) is a possibly spurious subset of m_insp, since m_insp_sel ( j ) and m_insp can be identical to one another in extreme cases.
  • a second selection step SEL2(j) those positions POS_REF(j) that correspond to the positions POS_INSP( p′) are spatially closest to all m_insp_sel (j) of the first selection step SEL1 (j), i.e. have the smallest spatial distance, e.g. according to the absolute value minimum of the corresponding difference vector.
  • PR(j) is the number such pairs PP for the respective j.
  • positions POS_REF (1) _2 and POS_INSP4 are associated with each other and form a pair PP (1) _2.
  • m_ref_sel(j) The entirety of the selected in this course in the second selection step SEL2 (j) for a respective j from m_ref (j) th positions POS_REF(j) is referred to below as m_ref_sel(j).
  • IMAASEL the A-scans IMAA_REF(j) of the reference measurement REFM(j) associated with the measurement positions m_ref_sel (j) selected in the second selection step SEL2 (j) are selected, i.e. the associated A-scan is selected for each measurement position in m_ref_sel (j). selected from IMAA_REF(j).
  • the A-scans selected based on the measurement positions in m_ref_sel (j) from IMAA_REF(j) form a set IMAA_REF_SEL ( j ) , which therefore includes those A-scans IMAA_REF (j, nj , mj ) from IMAA_REF(j) that for the artificial defect DEFj were measured at those positions POS_REF (j, n j , mj ) of the probe 210 from POS_REF(j) which best correspond to the positions contained in m_insp_sel ( j ).
  • an associated sound path correction AL (j, pr j ) can be determined, which is used in each case to correct the A-scan IMAA_REF belonging to the corresponding position POS_REF.
  • This correction consists of a displacement of the echo signals corresponding to the sound path correction AL(j, pr j ) in that A image IMAA_REF(j) which is uniquely assigned to the position POS_REF(j) of the pair PP(j)_prj.
  • a rotation correction RCORR(j) which is also optional, it can be taken into account that, particularly with a flat test surface 101 during the inspection measurement INSPM, the test head 210 rotates PHI around the vertical axis compared to the alignment can occur in the reference measurements REFM(j).
  • the sound field of the probe 210 is not rotationally symmetrical, which can be the case, for example, when using a non-circular aperture and/or when measuring with insonification angles V0°
  • the effect of this rotation PHI can be calculated based on a 3D sound f field simulation, as described, for example, in "Sound Field Calculation for Rectangular Sources", Kenneth B.
  • the 3D sound field simulation can be used to calculate the sound pressure for both situations, where psound (j, n , m , PHI_REF(j) ) describes the sound pressure psound for the individual measurement (n , m ) of the respective reference measurement REFM(j) and psound (PHI_INSP, nj , mj ) stands for the sound pressure psound for the individual measurements (nj, mj ) of the inspection measurement INSPM.
  • Such a specific measurement situation in which the amplitudes A_INSPM of the echoes in the inspection measurement INSPM and the amplitudes A_REEM of the corresponding echoes in the reference measurements REFM(j) should be essentially the same, can be, for example, the scanning of the rear wall RW of the examined test object 100 or test object 100T.
  • A_INSPM_RW and A_REFM_RW deviate from one another by more than a tolerance value, for example 5%
  • the optional correction step CORR(j) processes or corrects the selected A-images IMAA_REF_SEL as input data for a respective j ( j ) and in turn supplies corrected A-scans IMAA_REF_SEL ( j ) .
  • a conventional SAFT analysis based on the quantity IMAA_REF_SEL ( j ) generated in this way of possibly corrected A-images is carried out, which is carried out in particular for the artificial Defective DEFj mapping voxels corresponding amplitude sums.
  • the evaluation database BEW which is thus created individually for the test object 100T, is finally used to calculate the values during the inspection measurement INSPM of the corresponding test object. jekts 100 to convert recorded data into representative mmKSR values.
  • a conventional SAFT analysis is first carried out based on those A-images in the set IMAA_INSP_SEL( ) which are uniquely assigned to the selected measurement positions m_insp_sel ( ) of the inspection measurement INSPM, as repeatedly emphasized above.
  • test grids RAST(j) , RAST(k) for kVj differ so much from each other, i.e. RAST ( k) VRAST ( j ) , that the ensembles m_insp_sel ( k) and m_insp_sel ( j ) and thus also the ensembles of the associated A -Images in IMAA_INSP_SEL ( j ) and in IMAA_INSP_SEL ( k ) are different, i.e.
  • the SAFT analysis based on IMAA_INSP_SEL results in corresponding amplitude sums for the voxels of the examined test area of the test object 100. For example, for a voxel which contains the defect 110 of the test object 100, the amplitude sum corresponding to this voxel can be be converted into a defect size in mmKSR using the evaluation database BEW.
  • the overall reference measurement REFM comprising the individual reference measurements REFM(j) is typically carried out before the actual inspection measurement INSPM of the test object 100 to be examined. This means that the information needed to determine the size is already available at the time of the inspection measurement INSPM. However, it is also conceivable to carry out the overall reference measurement REEM after the inspection measurement INSPM. In this case, the results of the sizing are only available afterwards, but this can be acceptable depending on the application of the SAFT examination.
  • the probe 210 can, for example. be designed as a so-called "phased array probe".
  • a phased array probe allows test objects to be scanned not only mechanically but also electronically, i.e. by a type of electronic shifting of the active zone of the probe several Measurements can be carried out in a defined test grid
  • SAFT analysis This works both with a stationary probe and with a probe moving during the electronic scan if the transmit and receiving positions as well as insonification angles and focusing are known at the time of reconstruction.

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Abstract

L'invention concerne un procédé et un dispositif permettant de déterminer une taille d'un défaut dans un objet à inspecter sur la base d'un procédé SAFT. Dans une mesure d'inspection (INSPM), selon un mode basé sur SAFT, une tête de sonde enregistre une pluralité d'images de balayage A dans différentes positions réelles de la tête de sonde. Dans une mesure de référence globale, sur un objet de test correspondant à l'objet à inspecter et présentant une pluralité de défauts DEFj ayant des paramètres connus, selon un mode basé sur SAFT, une pluralité d'images de balayage A dans différentes positions réelles de la tête de sonde sont enregistrées pour chacun des défauts artificiels DEFj dans une mesure de référence respective. Sur la base d'une analyse SAFT d'une sélection d'images de balayage A des mesures de référence et sur la base des paramètres connus des défauts DEFj, une base de données d'évaluation (BEW) est créée. Sur la base d'une analyse SAFT d'une sélection d'images de balayage A de la mesure d'inspection, des sommes d'amplitude pour les éléments spatiaux de la région à inspecter dans l'objet à inspecter sont déterminées. Sur la base de la base de données d'évaluation (BEW), les sommes d'amplitude des éléments spatiaux sont converties en la taille du défaut à déterminer.
PCT/EP2021/087288 2021-12-22 2021-12-22 Système et procédé de détermination d'une taille d'un défaut dans un composant WO2023117079A1 (fr)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011051546A1 (de) * 2011-07-04 2013-01-10 Ge Sensing & Inspection Technologies Gmbh Vorrichtung zur zerstörungsfreien Prüfung eines Prüflings mittels Ultraschall, Verfahren zum Betreiben einer solchen Vorrichtung sowie Verfahren zur zerstörungsfreien Prüfung eines Prüflings mittels Ultraschall
DE102013211064A1 (de) * 2013-06-13 2014-12-18 Siemens Aktiengesellschaft SAFT-Analyse oberflächennaher Defekte
DE102013211616A1 (de) 2013-06-20 2014-12-24 Bundesanstalt für Materialforschung- und prüfung (BAM) Verfahren und Vorrichtung zur Defektgrößenbewertung
EP2898322B1 (fr) 2013-02-07 2018-12-26 Siemens Aktiengesellschaft Procédé et dispositif d'amélioration d'une analyse saft en cas de densité de mesures locale irrégulière
EP2932256B1 (fr) 2013-01-22 2021-05-19 Siemens Aktiengesellschaft Procédé et système de controle par ultrasons a commande manuelle pour des objets à controler

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Publication number Priority date Publication date Assignee Title
DE102011051546A1 (de) * 2011-07-04 2013-01-10 Ge Sensing & Inspection Technologies Gmbh Vorrichtung zur zerstörungsfreien Prüfung eines Prüflings mittels Ultraschall, Verfahren zum Betreiben einer solchen Vorrichtung sowie Verfahren zur zerstörungsfreien Prüfung eines Prüflings mittels Ultraschall
EP2932256B1 (fr) 2013-01-22 2021-05-19 Siemens Aktiengesellschaft Procédé et système de controle par ultrasons a commande manuelle pour des objets à controler
EP2898322B1 (fr) 2013-02-07 2018-12-26 Siemens Aktiengesellschaft Procédé et dispositif d'amélioration d'une analyse saft en cas de densité de mesures locale irrégulière
DE102013211064A1 (de) * 2013-06-13 2014-12-18 Siemens Aktiengesellschaft SAFT-Analyse oberflächennaher Defekte
DE102013211616A1 (de) 2013-06-20 2014-12-24 Bundesanstalt für Materialforschung- und prüfung (BAM) Verfahren und Vorrichtung zur Defektgrößenbewertung

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AZAR ET AL.: "NDET&E International", ELSEVIER, article "Beam focusing behavior of linear phased arrays", pages: 189 - 198
KENNETH B. OCHELTREELEON A. FRIZZELL: "Sound Field Calculation for Rectangular Sources", IEEE TRANSACTIONS ON ULTRASONICS, vol. 36, no. 2, 1989

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