WO2023092308A1 - 一种天线测试系统及方法 - Google Patents

一种天线测试系统及方法 Download PDF

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Publication number
WO2023092308A1
WO2023092308A1 PCT/CN2021/132587 CN2021132587W WO2023092308A1 WO 2023092308 A1 WO2023092308 A1 WO 2023092308A1 CN 2021132587 W CN2021132587 W CN 2021132587W WO 2023092308 A1 WO2023092308 A1 WO 2023092308A1
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Prior art keywords
antenna
test
array
plane
matrix
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PCT/CN2021/132587
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English (en)
French (fr)
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张劲松
安红波
徐庆洹
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华为技术有限公司
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Priority to PCT/CN2021/132587 priority Critical patent/WO2023092308A1/zh
Publication of WO2023092308A1 publication Critical patent/WO2023092308A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas

Definitions

  • the present application relates to the technical field of antennas, in particular to an antenna testing system and method.
  • the performance index of the antenna mainly includes radiation performance and directional performance.
  • a test antenna with known gain is used in a darkroom environment to test the performance of the antenna under test.
  • the antenna under test is usually placed at a position where the electromagnetic wave of the test antenna is similar to a plane wave, and this position is usually called the quiet zone position. Since the location of the quiet zone is far away from the test antenna, a larger darkroom environment is required to realize the performance test of the antenna, which seriously increases the test cost.
  • the present application provides an antenna testing system and method, so as to reduce the cost of antenna testing and improve the convenience of antenna testing operation.
  • the present application provides an antenna testing system, which may include an antenna array, a control device, and a testing device.
  • the antenna array may include multiple array elements, and the multiple array elements may be arranged in a preset plane array.
  • the control device can be electrically connected with the antenna array, and the control device can be used to independently control the conduction of the transmission line between each array element and the control device.
  • the test device can be electrically connected with the control device, and the test device can be used to electrically connect with the antenna under test, and the test device can be used to test the performance of the antenna under test according to the test signal sent and the test signal received from the antenna under test .
  • the technical solution provided by this application utilizes the principle that the antenna array synthesizes plane waves in a darkroom environment.
  • the distance between the quiet zone position and the antenna array can be closer , that is, the distance between the antenna to be tested and the antenna array can be relatively close, which can reduce the size of the darkroom environment and reduce the cost of antenna testing.
  • the distance between the antenna to be tested and the antenna array can be relatively short, it is also relatively convenient to adjust the antenna to be tested and the antenna array during actual testing, which facilitates efficient antenna testing.
  • the antenna testing system may further include a fixing frame, which may be used to connect with the antenna to be tested to control the rotation of the antenna to be tested, and the fixing frame may be located at one side of the antenna array.
  • the antenna to be tested can be placed at a preset position in the darkroom environment through the fixing frame, and the rotation of the antenna to be tested can be controlled.
  • the fixed frame can include a supporting part and a rotating part.
  • One end of the rotating part is rotatably connected to the supporting part, and the other end is used to connect the antenna to be tested.
  • the supporting part can drive the antenna to be tested by driving the rotating part to rotate. turn.
  • the supporting part can be fixed at the position corresponding to the plane wave in the darkroom environment, so that the antenna to be tested can be fixed on the rotating part, so that the rotation of the antenna to be tested can be realized, so as to realize the performance test of the antenna to be tested under different working angles.
  • the test results can be more comprehensive.
  • control device can be a multi-channel switch
  • the multi-channel switch includes a plurality of switches, each switch is connected to a corresponding array element, and when the control device controls a switch to be closed, it is connected to the closed switch The transmission line between the array element and the control device is turned on.
  • the multi-channel switch can individually control the conduction of each array element, and the multi-channel switch has a wide bandwidth, which can meet the performance test of the antenna under test with a wide bandwidth.
  • the test device can be a vector network analyzer, a spectrum analyzer or a power meter. This facilitates test signal data recording and analysis.
  • the antenna test system may further include: a first power amplifier electrically connected to the control device and the test device; and/or a second power amplifier electrically connected to the test device and the antenna under test respectively. amplifier. In this way, the test signal is amplified and processed through the power amplifier, which can make the test signal clearer and the test result more accurate.
  • the present application provides an antenna testing method, which can be applied to the above-mentioned antenna testing system, including the following steps:
  • the weight h i corresponding to each array element in the antenna array satisfies: the weight h i corresponding to each array element and the product of the electric field E i corresponding to each array element on the plane at the preset position and is similar to the electric field distribution of a plane wave on a plane; the line loss l corresponding to the i-th element in the antenna array is when the calibration antenna with known gain is buckled and connected to each element of the antenna array respectively, the test device Determined according to the test signal sent out and the test signal received from the calibration antenna, i ⁇ (1 ⁇ n);
  • the gain of the antenna to be tested is obtained.
  • the antenna array satisfies the weights required to be loaded by each array element forming a plane wave at a preset position through calculation, so that the antenna to be tested can be considered to be in a plane wave environment when the antenna to be tested is tested, which is equivalent to Tested in a traditional darkroom far-field environment.
  • the antenna to be tested can be considered to be in a plane wave environment when the antenna to be tested is tested, which is equivalent to Tested in a traditional darkroom far-field environment.
  • the electromagnetic intensity that each element of the antenna array actually sends (or receives) can be calculated by the test matrix and the line loss matrix, thus, according to the corresponding The electromagnetic strength of each element of the antenna array can obtain the gain of the antenna under test.
  • the product of the ratio of the test matrix T to the line loss matrix L and the weight matrix H may be used as the gain G of the antenna under test.
  • the gain of the antenna under test can be obtained by weighting the electromagnetic intensity of each element of the corresponding antenna array. Therefore, a specific achievable scheme for obtaining the gain of the antenna under test according to the weight matrix H, the line loss matrix L and the test matrix T is proposed.
  • the weight h i corresponding to each array element in the antenna array satisfies: the weight h i corresponding to each array element respectively corresponds to each array element on a plane at a preset position
  • the sum of the products of the electric field E i is similar to the electric field distribution of the plane wave on the plane, which can be specifically: the weight h i corresponding to each array element, and the weight h i corresponding to each array element on the vertical plane at the preset position
  • the sum of the products of the electric field E i approximates the electric field distribution of a plane wave on a vertical plane. In this way, the test of the antenna to be tested vertically placed on the face of the mouth can be realized, and the performance test of the antenna to be tested can be completed efficiently and accurately.
  • the weight h i corresponding to each array element in the antenna array satisfies: the weight h i corresponding to each array element respectively corresponds to each array element on a plane at a preset position
  • the sum of the products of the electric field E i of the plane wave is similar to the electric field distribution of the plane wave on the plane, which can be specifically: the weight h i ⁇ corresponding to each array element, and the electric field corresponding to each array element on the inclined plane at the preset position
  • the sum of the products of E i ⁇ is approximate to the electric field distribution of the plane wave on the inclined plane;
  • the inclined plane may specifically be a plane located at a preset position and forming an angle ⁇ with the horizontal direction.
  • FIG. 1 is a schematic structural diagram of an antenna test solution in the prior art
  • FIG. 2 is a schematic structural diagram of an antenna testing system provided in an embodiment of the present application.
  • FIG. 3 is a schematic structural diagram of an antenna array in an antenna test system provided in an embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of an antenna testing system provided by another embodiment of the present application.
  • 1-test antenna 2-antenna to be tested; 3-quiet zone position; 100-antenna array; 200-control device; 300-test device;
  • 400-antenna to be tested 500-fixing frame; 101-array element; 501-supporting part; 502-rotating part.
  • the antenna testing system provided in the embodiment of the present application may be applied to testing antenna performance indicators, for example, testing the radiation performance and directional performance of the antenna.
  • the existing antenna test solution is to use the test antenna 1 with known gain to test the performance of the antenna 2 under test in a dark room environment. Since the antenna is usually far away from the base station in actual use, the electromagnetic wave received by the antenna is usually a plane wave.
  • the antenna 2 to be tested is usually placed in a darkroom environment where the electromagnetic wave of the test antenna 1 is close to a plane wave, and this position is usually called the quiet zone position 3. Since the quiet zone position 3 is far away from the test antenna 1, a relatively large darkroom environment is required to realize the antenna performance test, which makes the antenna test costly and inconvenient to operate.
  • an embodiment of the present application provides an antenna test system, so as to reduce the cost of antenna test and improve the convenience of antenna test operation.
  • FIG. 2 shows a schematic structural diagram of the antenna testing system provided by the embodiment of the present application
  • FIG. 3 shows a schematic structural diagram of the antenna array 100 in the antenna testing system provided by the embodiment of the present application.
  • the antenna test system provided by the embodiment of the present application may include an antenna array 100 , a control device 200 and a test device 300 , and the antenna array 100 may be electrically connected to the test device 300 through the control device 200 .
  • the antenna array 100 can include a plurality of array elements 101 with known gain
  • the array element 101 is an antenna, which can be used as the above-mentioned test antenna
  • a plurality of array elements 101 can be arranged in a preset plane array, for example, arranged as 8 ⁇ 8, 16 ⁇ 16, or 24 ⁇ 24 and other array situations
  • 1 to n in Figure 2 represent the number of rows of array elements 101 (for example, the first row of array elements 1 in Figure 2, the second row of array elements 2, and the third row Array element 3 ... the nth row of array element n)
  • Fig. 3 exemplifies the situation in which multiple array elements 101 are arranged in an 8 ⁇ 8 array.
  • the preset plane can be any plane in the darkroom environment, such as a vertical plane in the darkroom, wherein the preset plane does not affect the test of the antenna 400 to be tested, and can be flexibly set according to the actual situation of the darkroom environment.
  • a plurality of array elements 101 of the antenna array 100 can be fixed by a support frame, and the support frame can have a plurality of positioning holes arranged in an array, and a plurality of array elements 101 can be fixed in the plurality of positioning holes one by one to realize multiple array elements 101's fixed.
  • the support frame may be in the shape of a flat plate, so that multiple array elements 101 of the antenna array 100 may be located in one plane.
  • the control device 200 can use a multi-channel switch, and each switch can be connected to an array element 101 , and the control device 200 can realize the electrical connection between the control device 200 and the corresponding array element 101 by closing the corresponding switch.
  • the control device 200 can individually open the transmission line of each array element 101 in the antenna array 100 by turning off each switch, so that the test signal sent by the test device 300 can be transmitted to each antenna through the corresponding transmission line.
  • array element 101 the antenna under test 400 may receive the test signal radiated by each array element 101 .
  • control device 200 and the antenna array 100 can be electrically connected through a radio frequency coaxial cable, and the control device 200 and the test device 300 can also be electrically connected through a radio frequency coaxial cable, and of course other types of cables can also be used.
  • the electrical connection is realized, which is not limited in the present application.
  • the test device 300 can adopt a vector network analyzer to realize the test function, the test device 300 can send a test signal, and the test signal can be transmitted to each array element 101 in the antenna array 100 through the control device 200, and then outwards from each array element 101 Radiation, the antenna under test 400 can then receive different test signals radiated by different array elements 101 .
  • the antenna under test 400 can be electrically connected to the testing device 300 , so that the test signal received by the antenna under test 400 can be transmitted to the testing device 300 .
  • the test device 300 can record the test signal sent out and the test signal received from the antenna under test 400 , so that the gain of the antenna under test 400 can be obtained by analyzing the performance of the test signal sent out and the test signal received from the antenna under test 400 .
  • the antenna under test 400 and the test device 300 may be electrically connected through a radio frequency coaxial cable, and of course, may also be electrically connected through other types of cables.
  • the test device 300 in addition to using a vector network analyzer, can also use a spectrum analyzer or a power meter, which can be selected according to actual testing needs, and this application is not limited to this; when using a spectrum analyzer or The power meter can be used in conjunction with the signal source to have the ability to send and receive as a whole.
  • the antenna test system utilizes the principle that the antenna array 100 synthesizes a plane wave (approximately a plane wave) in a darkroom environment.
  • the distance between the quiet zone and the antenna array 100 is relatively close, that is, the distance between the antenna 400 to be tested and the antenna array 100 can be relatively close, which can reduce the size of the darkroom environment and reduce the cost of antenna testing.
  • the distance between the antenna 400 to be tested and the antenna array 100 can be relatively short, it is convenient to adjust the antenna 400 to be tested and the antenna array 100 during actual testing, which facilitates efficient testing.
  • the control device 200 adopts a multi-channel switch, and the multi-channel switch has a wider bandwidth, which can satisfy the performance test of the antenna 400 to be tested with a wider bandwidth.
  • the test signal transmission lines include two, namely “testing device 300-control device 200-one element 101 in the antenna array 100" and “antenna under test 400-testing device 300".
  • the transmission line of the test signal can also be regarded as one, that is, “antenna to be tested 400-test device 300-control device 200-an array element 101 in the antenna array 100" (each array element 101 in the antenna array 100).
  • the signal transmission between the antenna 400 and the antenna to be tested is the mode of electromagnetic radiation, there is no physical line, which can not be included in the signal transmission line of the present application), since the antenna array 100 can include a plurality of array elements 101, so the transmission line of the test signal is also It is understandable that there are many.
  • a power amplifier can be installed on the signal transmission line to make the test signal loss smaller, the signal more real, and the test result more accurate.
  • a first power amplifier may be electrically connected between the control device 200 and the test device 300, or a second power amplifier may also be electrically connected between the test device 300 and the antenna under test 400, or, The first power amplifier is electrically connected between the control device 200 and the testing device 300 and the second power amplifier is electrically connected between the testing device 300 and the antenna 400 to be tested, which is not limited in this application.
  • FIG. 4 shows a schematic structural diagram of an antenna testing system provided by another embodiment of the present application.
  • the antenna testing system provided by the present application may further include a fixing frame 500 relative to the embodiment shown in FIG.
  • the fixing frame 500 may include a supporting part 501 and a rotating part 502 connected to each other, and the rotating part 502 and the supporting part 501 may be rotatably connected.
  • the support part 501 can be fixed at the position corresponding to the plane wave in the darkroom environment, and the antenna under test 400 can be fixed on the rotating part 502 to realize the rotation of the antenna under test 400, so that the antenna under test 400 can be The performance of receiving electromagnetic waves in different directions is tested, so that the test results can be more comprehensive.
  • the rotating part 502 and the supporting part 501 may be connected through a universal joint, so as to realize the rotatable connection between the rotating part 502 and the supporting part 501 .
  • the rotating part 502 may be provided with a slot or a mounting clip, so as to fix the antenna under test 400 on the rotating part 502 and facilitate the removal of the antenna under test 400 from the rotating part 502 .
  • the supporting part 501 can be designed as a telescopic rod-shaped structure, so as to facilitate the adjustment of the height of the rotating part 502 .
  • the supporting part 501 can be connected with the testing device 300, and the testing device 300 can drive the rotating part 502 to rotate by controlling the supporting part 501, thereby driving the antenna 400 to rotate.
  • the embodiment of the present application also provides an antenna testing method based on the structure shown in Figure 2, and the testing method may include the following steps:
  • the desired preset position ie, the position of the quiet zone
  • the diameter of the quiet zone ie, the diameter of the quiet zone.
  • Z 0 may be 1-3 m
  • d is greater than the maximum dimension of the mouth surface of the antenna 400 to be tested.
  • the antenna to be tested 400 can be horn-shaped, and the mouth surface (electromagnetic wave receiving surface) of the antenna to be tested 400 can be rectangular or square, taking the mouth surface of the antenna to be tested 400 as a rectangle as an example, the above-mentioned antenna to be tested 400
  • the maximum dimension of the mouth surface can be considered as the diagonal dimension of the rectangle.
  • the weight h i can satisfy the sum(h i ⁇ E i ) to approximate the plane wave along the plane perpendicular to the antenna array 100
  • the electric field distribution on the vertical plane during transmission in the (above preset plane) direction that is, if the array element 101 is loaded with a weight h i , then the corresponding electric fields of all array elements 101 on the vertical plane at the preset position are superimposed , can approximate the electric field distribution on the vertical plane when the plane wave propagates along the direction perpendicular to the plane where the antenna array 100 is located.
  • the weight h i is specifically the magnitude and phase correlation value that needs to be loaded on the array element 101 of the antenna array 100 when the above-mentioned quiet zone needs to be formed, and the weight h i can be specifically determined according to the principle of a plane wave generator, which is a relatively mature Technology, you can refer to the existing literature, such as "Xie Yongjun et al. The key technology of 5G RF indoor test [J].
  • the calibration antenna with known gain is electrically connected to the test device 300, and the test device 300 is electrically connected to the antenna array 100 through the control device 200 to establish a calibration circuit, that is, the calibration circuit is "calibration antenna-test device 300-control Device 200—one element 101" of antenna array 100. Since the control device 200 can use a multi-channel switch, it can be realized that each array element 101 of the antenna array 100 has an independent calibration circuit. Moreover, the calibration antenna is fastened to the array element 101 of the antenna array 100 so that the radiation transmission path between the array element 101 of the antenna array 100 and the calibration antenna is the shortest and can be ignored.
  • the mouth of the calibration antenna faces the mouth of the array element 101 and connects with the mouth of the array element 101. Therefore, when selecting the calibration antenna, the mouth of the array can be selected.
  • a calibration antenna whose surface is the same as or close to that of the array element 101.
  • the test device 300 can record the sent test signal data and the received test signal data, and since the gain of the calibration antenna is known, the antenna array can be obtained Line loss l i corresponding to one array element 101 of 100 .
  • the above process is repeated several times, that is, the calibration antenna is fastened and connected to each element 101 of the antenna array 100 one by one, and correspondingly, the control device 200 opens the transmission line of each element 101 of the antenna array 100 one by one, and the antenna array 100 can be obtained
  • test signal data recorded by the test device 300 can be the power attenuation and phase offset of the test signal, and the line loss ln can be expressed by the ratio of the power of the test signal sent and the power of the test signal received and the phase offset (may be recorded via a vector network analyzer).
  • the calibration antenna can be replaced with the antenna under test 400, and the antenna under test 400 can be placed at a preset position.
  • the above-mentioned test signal transmission process is repeated, that is, the test device 300 sends a test signal, and the control device 200 opens the transmission line of an array element 101 of the antenna array 100 through a corresponding switch, and the test signal is sequentially transmitted through the control device 200, the array element 101 and The antenna 400 to be tested is received by the test device 300 , and the test device 300 records the sent test signal data and the received test signal data, and can obtain the test data t i corresponding to one element 101 of the antenna array 100 .
  • the control device 200 opens the transmission line of each array element 101 of the antenna array 100 one by one, and the test data corresponding to each array element 101 of the antenna array 100 can be obtained.
  • control device 200 multi-channel switch
  • the control device 200 can be used to test Obtain the amplitude information of the transmission line corresponding to each array element 101, and then measure the phase information of the transmission line corresponding to each array element 101 by using the reference line provided by the test device 300, so that a test matrix can also be established;
  • the antenna test method provided by the embodiment of the present application is further developed Instructions, as follows:
  • the placement angle of the antenna under test 400 is considered. For example, as shown in FIG. 4 , the angle between the mouth surface of the antenna under test 400 and the horizontal direction is ⁇ . According to the required quiet zone position (0, 0, Z 0 ) and the quiet zone diameter (d), and considering the placement angle ⁇ of the antenna 400 to be tested, determine the weight h i ⁇ to be loaded on the element 101 of the antenna array 100 .
  • the weight h i ⁇ can satisfy sum(h i ⁇ ⁇ E i ⁇ ) is approximate to the electric field distribution on the inclined plane when the plane wave is transmitted along the direction perpendicular to the plane where the antenna array 100 is located (the above-mentioned preset plane), that is, after the array element 101 is loaded with the weight value h i ⁇ , the entire array If the electric field corresponding to the element 101 on the inclined plane at the preset position is superimposed, it can be approximated to the electric field distribution on the inclined plane when a plane wave propagates along a direction perpendicular to the plane where the antenna array 100 is located.
  • H ⁇ [h 1 ⁇ , h 2 ⁇ , . . . h n ⁇ ].
  • the above-mentioned embodiment may be referred to for obtaining the line loss matrix L.
  • the calibration antenna is replaced with the antenna under test 400 , and the antenna under test 400 is placed at a preset position so that the angle between the antenna under test 400 and the horizontal direction is ⁇ .
  • the test signal transmission process is carried out, that is, the test device 300 sends a test signal
  • the control device 200 opens the transmission line of an array element 101 of the antenna array 100
  • the test signal is sequentially transmitted through the control device 200, the array element 101 and the antenna 400 to be tested
  • Received by the test device 300 the test device 300 records the sent test signal data and the received test signal data, and can obtain the test data t i ⁇ corresponding to one element 101 of the antenna array 100 .
  • the above-mentioned process is repeated multiple times, that is, the control device 200 opens the transmission line of each array element 101 of the antenna array 100 one by one, and the test data corresponding to each array element 101 of the antenna array 100 can be obtained.
  • the antenna testing method by loading weights on the array elements 101 of the antenna array 100, a weight matrix of the antenna array 100 is established, a line loss matrix and a test matrix are established, and the gain of the antenna 400 to be tested is obtained by calculation , it is not necessary to adjust the amplitude and phase of the array element 101 during the test, thereby avoiding the nonlinear effect of adjusting the amplitude and phase of the array element 101 in the case of high power, and improving the flatness of the quiet zone (within the quiet zone and the ideal The proximity of the plane wave), the test accuracy is high, and the test error is small.
  • antenna testing at multiple angles can be realized, relatively comprehensive data collection can be completed in a short period of time, and the testing efficiency is high.

Abstract

本申请提供了一种天线测试系统及方法。天线测试系统包括天线阵列、控制装置及测试装置。天线阵列包括多个阵元，多个阵元在预设平面阵列排布。控制装置与天线阵列电性连接，控制装置用于独立控制每个阵元与控制装置之间的传输线路的导通。测试装置与控制装置电性连接，且测试装置用于与待测天线电性连接，测试装置用于根据发出的测试信号和从待测天线接收的测试信号，测试待测天线的性能。本申请的天线测试系统采用天线阵列在暗室环境中合成平面波，相较于现有天线测试方案中的静区位置与测试阵元的距离，静区位置与天线阵列的距离较近，即待测天线与天线阵列的距离可以较近，可以减小暗室环境的大小，降低天线测试成本。

Description

一种天线测试系统及方法 技术领域
本申请涉及天线技术领域，尤其涉及一种天线测试系统及方法。
背景技术
天线的性能指标主要包含辐射性能和方向性能，通常是在暗室环境中使用已知增益的测试天线来测试待测天线的性能。为了与真实使用情况接近，通常将待测天线放置于测试天线的电磁波近似于平面波的位置，该位置通常称为静区位置。由于静区位置距离测试天线的距离较远，这样就需要较大的暗室环境才能实现天线性能测试，严重增加了测试成本。
发明内容
本申请提供了一种天线测试系统及方法，以降低天线测试成本，提高天线测试操作便利性。
第一方面，本申请提供了一种天线测试系统，可以包括天线阵列、控制装置及测试装置。天线阵列可以包括多个阵元，多个阵元可以在预设平面阵列排布。控制装置可以与天线阵列电性连接，控制装置可以用于独立控制每个阵元与控制装置之间的传输线路的导通。测试装置可以与控制装置电性连接，且测试装置可以用于与待测天线电性连接，测试装置可以用于根据发出的测试信号和从待测天线接收的测试信号，测试待测天线的性能。
本申请提供的技术方案，利用天线阵列在暗室环境中合成平面波的原理，相较于现有天线测试方案中的静区位置与测试阵元的距离，静区位置与天线阵列的距离可以较近，即待测天线与天线阵列的距离可以较近，可以减小暗室环境的大小，降低天线测试成本。并且，由于待测天线与天线阵列的距离可以较近，在实际测试时，对待测天线及天线阵列的调整也比较方便，便于高效地进行天线测试。
在一个具体的可实施方案中，天线测试系统还可以包括固定架，固定架可以用于与待测天线连接，以控制待测天线转动，固定架可以位于天线阵列的一侧。这样待测天线可以通过固定架放置在暗室环境中的预设位置，并可以控制待测天线转动。
在具体设置固定架时，固定架可以包括支撑部和转动部，转动部的一端可转动连接于支撑部，另一端用于连接待测天线，支撑部可以通过带动转动部转动以带动待测天线转动。这样可以将支撑部固定在暗室环境中对应于平面波的位置，以将待测天线固定在转动部上，从而可以实现待测天线的转动，以实现待测天线在不同工作角度下的性能测试，测试结果可以比较全面。
在一个具体的可实施方案中，控制装置可以为多通道开关，多通道开关包括多个开关，每一个开关与一个对应的阵元连接，当控制装置控制一个开关闭合时，与闭合的开关连接的阵元与控制装置之间的传输线路导通。多通道开关可以单独控制每一个阵元的导通，且多通道开关的宽带较宽，可以满足带宽较宽的待测天线的性能测试。
在一个具体的可实施方案中，测试装置可以为矢量网络分析仪、频谱仪或功率计。这样便于测试信号数据记录及分析。
在一个具体的可实施方案中，天线测试系统还可以包括：分别与控制装置和测试装置 电性连接的第一功率放大器；和/或分别与测试装置和待测天线电性连接的第二功率放大器。这样通过功率放大器对测试信号进行放大处理，可以使测试信号更清晰，测试结果更准确。
第二方面，本申请提供了一种天线测试方法，可以应用于上述的天线测试系统中，包括以下步骤：
确定权值矩阵H和线路损耗矩阵L，其中H＝[h 1，h 2，…h n]，L＝[l 1，l 2，…l n]，n为天线阵列中阵元的数量；
其中，天线阵列中的各个阵元分别对应的权值h i满足：各个阵元分别对应的权值h i、与各个阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在平面上的电场分布；天线阵列中的第i个阵元对应的线路损耗l i为将已知增益的校准天线与天线阵列的每个阵元分别扣合连接时，测试装置根据发出的测试信号和从校准天线接收的测试信号确定的，i∈(1～n)；
在待测天线置于预设位置时，且在控制装置打开天线阵列的第i个阵元的传输线路时，测试装置根据发出的测试信号和接收的测试信号，确定第i个阵元对应的测试值t i，得到测试矩阵T，其中T＝[t 1，t 2，…t n]；
根据权值矩阵H、线路损耗矩阵L和测试矩阵T，获得待测天线的增益。
本申请提供的技术方案，通过计算获得天线阵列在预设位置满足形成平面波的每个阵元所需加载的权值，由此对待测天线进行测试时可认为待测天线处于平面波环境中，等同于在传统暗室远场环境中测试。并建立天线阵列的权值矩阵，且通过测试建立线路损耗矩阵及测试矩阵，由测试矩阵和线路损耗矩阵可计算出天线阵列各个阵元真实发出(或接收)的电磁强度，由此，根据对应的天线阵列各个阵元电磁强度可以获得待测天线的增益。在测试过程中不必调节阵元的幅度和相位，从而可以避免调节阵元的幅度和相位在大功率情况下所存在的非线性效应，可以提高静区的平整度，测试精度较高，测试误差较小。
示例性地，在具体获得待测天线的增益时，可以将测试矩阵T与线路损耗矩阵L的比值、与权值矩阵H的乘积，作为待测天线的增益G。将对应的天线阵列各个阵元电磁强度加权可以获得待测天线的增益。因此，提出一种具体的根据权值矩阵H、线路损耗矩阵L和测试矩阵T，获得待测天线的增益的可实现方案。
在一个具体的可实施方案中，天线阵列中的各个阵元分别对应的权值h i满足：各个阵元分别对应的权值h i、与各个阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在平面上的电场分布，具体可以为：各个阵元分别对应的权值h i、与各个阵元在位于预设位置的竖直平面上分别对应的电场E i的乘积之和近似于平面波在竖直平面上的电场分布。这样可以实现对口面竖直放置的待测天线的测试，可以高效、准确地完成待测天线的性能测试。
在一个具体的可实施方案中，天线阵列中的各个阵元分别对应的权值h i满足：各个阵元分别对应的权值h i、与各个阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在平面上的电场分布，具体可以为：各个阵元分别对应的权值h iθ、与各个阵元在位于预设位置的倾斜平面上分别对应的电场E iθ的乘积之和近似于平面波在倾斜平面上的电场分布；倾斜平面具体可以为位于预设位置、且与水平方向呈θ夹角的平面。这样可以实现对待测试天线在多角度下进行测试，可以在短时间内完成对待测天线的方向性能的测试数据采集(如方向图等)，测试效率和测试精度均较高。
附图说明
图1为现有技术的天线测试方案的结构示意图；
图2为本申请实施例提供的天线测试系统的结构示意图；
图3为本申请实施例提供的天线测试系统中的天线阵列的结构示意图；
图4为本申请另一实施例提供的天线测试系统的结构示意图。
附图标记：
1-测试天线；2-待测天线；3-静区位置；100-天线阵列；200-控制装置；300-测试装置；
400-待测天线；500-固定架；101-阵元；501-支撑部；502-转动部。
具体实施方式
下面将结合附图，对本申请实施例进行详细描述。
为了方便理解，首先说明本申请涉及的天线测试系统的应用场景。本申请实施例提供的天线测试系统可以应用于天线性能指标的测试，例如对天线的辐射性能和方向性能进行测试。现有的天线测试方案是在暗室环境中使用已知增益的测试天线1来测试待测天线2的性能。由于天线在实际使用时通常距离基站较远，天线接收到的电磁波通常为平面波。为了与天线真实使用情况接近，如图1所示，通常将待测天线2放置于暗室环境中对应于测试天线1的电磁波近似于平面波的位置，该位置通常称为静区位置3。由于静区位置3距离测试天线1的距离较远，这样就需要较大的暗室环境才能实现天线性能测试，使得天线测试成本较高，且不便于操作。
基于此，本申请实施例提供了一种天线测试系统，以降低天线测试成本，提高天线测试操作便利性。
首先参考图2及图3，图2示出了本申请实施例提供的天线测试系统的结构示意图，图3示出了本申请实施例提供的天线测试系统中的天线阵列100的结构示意图。如图2所示，本申请实施例提供的天线测试系统可以包括天线阵列100、控制装置200及测试装置300，天线阵列100可以通过控制装置200与测试装置300电性连接。其中，天线阵列100可以包括多个已知增益的阵元101，阵元101即为天线，可作为上述测试天线，多个阵元101可以在预设平面阵列排布，例如排布为8×8，16×16，或24×24等阵列情况，图2中1～n表示阵元101的排数(比如图2中的第一排阵元1、第二排阵元2、第三排阵元3…第n排阵元n)，图3中示例了多个阵元101排布为8×8阵列的情况。该预设平面可以为暗室环境中的任意平面，例如为暗室内的竖直平面，其中，预设平面对待测天线400的测试不产生影响，可以根据暗室环境的实际情况灵活设置。天线阵列100的多个阵元101可以通过支撑架固定，支撑架可以具有多个阵列排布的定位孔，多个阵元101可以一一对应固定在多个定位孔内，实现多个阵元101的固定。并且，支撑架可以为平板状，从而可以实现天线阵列100的多个阵元101位于一个平面内。
控制装置200可以采用多通道开关，每个开关可以与一个阵元101连接，控制装置200可以通过对应的开关的闭合来实现控制装置200与对应的阵元101的电连接。比如，控制装置200可以通过每个开关的开断实现单独打开天线阵列100中的每个阵元101的传输线路，从而可以使得实现测试装置300发出的测试信号可以通过对应的传输线路传输至每个阵元101。进而，待测天线400可以接收各个阵元101辐射的测试信号。具体实施时，控 制装置200与天线阵列100可以通过射频同轴线实现电性连接，控制装置200与测试装置300也可以通过射频同轴线实现电性连接，当然还可以通过其他性质的线缆实现电性连接，本申请对此不作限定。
测试装置300可以采用矢量网络分析仪实现测试功能，测试装置300可以发出测试信号，测试信号可以通过控制装置200传输至天线阵列100中的每个阵元101，由每个阵元101再向外辐射，待测天线400进而可以接收不同阵元101辐射的不同测试信号。实际对待测天线400进行测试时，可以将待测天线400与测试装置300电性连接，从而待测天线400接收的测试信号可以传输至测试装置300。测试装置300可以记录发出的测试信号和从待测天线400接收的测试信号，从而可以通过分析发出的测试信号和从待测天线400接收的测试信号的性能，获得待测天线400的增益。
具体实施时，待测天线400与测试装置300可以通过射频同轴线实现电性连接，当然也可以通过其他性质的线缆进行电性连接。在一些可能的具体实施中，测试装置300除了采用矢量网络分析仪以外，还可以采用频谱仪或功率计等，可根据实际测试需要进行选择，对此本申请均不作限定；当采用频谱仪或功率计时，可以与信号源配合使用，以整体具备收发能力。
本申请实施例提供的天线测试系统，利用天线阵列100在暗室环境中合成平面波(近似为平面波)的原理，相较于现有天线测试方案中的静区位置(平面波的位置)与测试阵元101的距离，静区位置与天线阵列100的距离较近，即待测天线400与天线阵列100的距离可以较近，可以减小暗室环境的大小，降低天线测试成本。并且，由于待测天线400与天线阵列100的距离可以较近，在实际测试时，对待测天线400及天线阵列100的调整也比较方便，便于高效地进行测试。此外，控制装置200采用多通道开关，多通道开关的宽带较宽，可以满足带宽较宽的待测天线400的性能测试。
在实际测试时，结合上述，测试信号的传输线路包括两条，即“测试装置300-控制装置200-天线阵列100中的一个阵元101”和“待测天线400-测试装置300”。当然，测试信号的传输线路也可以看作是一条，即“待测天线400-测试装置300-控制装置200-天线阵列100中的一个阵元101”(天线阵列100中的每个阵元101与待测天线400之间的信号传输为电磁辐射的方式，没有实体线路，可不算入本申请的信号传输线路内)，由于天线阵列100可包括多个阵元101，所以测试信号的传输线路也可以理解有多条。考虑到信号传输线路损耗可能较大，在一些可实施的方案中，可以在信号传输线路上设置功率放大器，以使测试信号损失更小、信号更加真实，测试结果更准确。示例性地，可以在控制装置200与测试装置300之间电性连接第一功率放大器，或者，也可以在测试装置300与待测天线400之间电性连接第二功率放大器，或者，还可以在控制装置200与测试装置300之间电性连接第一功率放大器以及在测试装置300与待测天线400之间电性连接第二功率放大器，对此本申请不作限定。
参考图4，图4示出了本申请另一实施例提供的天线测试系统的结构示意图。如图4所示，作为一种可能的实施例，本申请提供的天线测试系统相对于图2所示的实施例还可以包括固定架500，固定架500可以位于天线阵列100的一侧且用于与待测天线400连接，从而可以将待测天线400固定在暗室环境中对应于平面波的位置。在具体实施时，固定架500可以包括相互连接的支撑部501和转动部502，且转动部502与支撑部501之间可以为可转动连接。实际测试时，可以将支撑部501固定在暗室环境中对应于平面波的位置， 并将待测天线400固定在转动部502上，以实现待测天线400的转动，从而可以实现对待测天线400在不同方向下接收电磁波的性能进行测试，使得测试结果可以比较全面。具体实施中，转动部502与支撑部501之间可以通过万向节连接，从而实现转动部502与支撑部501可转动连接。转动部502上可以设置有卡槽或安装夹，以便于将待测天线400固定在转动部502上，及便于待测天线400从转动部502上拆卸。支撑部501可以设计为可伸缩的杆状结构，从而便于调节转动部502的高度。其中，支撑部501可以与测试装置300连接，测试装置300可以通过控制支撑部501带动转动部502转动，从而带动待测天线400转动。
为了更清楚地理解本申请的技术方案，本申请实施例在图2所示的结构基础上还提供了一种天线测试方法，该测试方法可以包括以下步骤：
首先，选定所需的预设位置(即静区位置)及静区直径。示例性地，如图2所示，设定天线阵列100中心的坐标为(0，0，0)，需要在(0，0，Z 0)处形成直径为d的静区，其中，供参考地，Z 0可以为1～3m，d大于待测天线400的口面最大尺寸。示例性地，待测天线400可以为喇叭状，待测天线400的口面(电磁波接收面)可以为矩形或方形，以待测天线400的口面为矩形为例，上述的待测天线400口面最大尺寸可以认为是矩形的对角线尺寸。根据所需的静区位置及静区直径，分别确定天线阵列100中的单个阵元101所需加载的权值h i，i表示天线阵列中的第i个阵元，也就是说，权值h i则表示第i条传输线路上的阵元101所需加载的权值。假设第i个阵元101在处于预设位置的竖直平面上对应的电场为E i，那么权值h i可以满足sum(h i×E i)近似于平面波沿垂直于天线阵列100所在平面(上述的预设平面)方向传输时在竖直平面上的电场分布，即如果阵元101加载权值h i，那么全部阵元101在处于预设位置的竖直平面上对应的电场叠加的话，可以近似于平面波沿垂直于天线阵列100所在平面方向传输时在竖直平面上的电场分布。根据上述权值，仿真建立权值矩阵H，其中H＝[h 1，h 2，…h n]，n为天线阵列100所包括的阵元101的总数量，前述的i∈(1～n)。其中，权值h i具体为当需要形成上述静区时需要为天线阵列100的阵元101加载的幅度及相位相关值，权值h i可以根据平面波生成器的原理具体确定，为比较成熟的技术，可以参考已有文献，例如“谢拥军等.5G射频室内测试的关键技术[J].电子技术应用,2018,7.”、“陈晓明等.基于阵列平面波发生器的紧凑型天线测试系统研究.IEEE2020微波与毫米波技术国际会议.(ICMMT).IEEE,2020:1-3.”等文献，在此不作赘述。
将已知增益的校准天线与测试装置300电性连接，并将测试装置300通过控制装置200与天线阵列100电性连接，以建立校准线路，即校准线路为“校准天线-测试装置300-控制装置200-天线阵列100的一个阵元101”。由于控制装置200可以采用多通道开关，从而可以实现天线阵列100的每个阵元101都具有独立的校准线路。并且，将校准天线与天线阵列100的阵元101扣合连接，使得天线阵列100的阵元101与校准天线之间的辐射传输路径最短，可以忽略不计。关于校准天线与阵元101的扣合连接，具体可以为校准天线的口面朝向阵元101的口面并与阵元101的口面对接，由此，在选择校准天线时，可以选择口面与阵元101口面相同或接近的校准天线。在校准天线与天线阵列100的阵元101扣合连接后，测试装置300可以发出测试信号，控制装置200可以通过对应的开关打开与校准天线扣合连接的阵元101的传输线路，测试信号依次传输经过控制装置200、阵元101和校准天线，并由测试装置300接收，测试装置300可以记录发出的测试信号数据和接收的测试信号数据，且由于校准天线的增益已知，可以获得天线阵列100的一个阵元101对应的 线路损耗l i。重复多次上述过程，即将校准天线逐个与天线阵列100的每个阵元101扣合连接，对应地，控制装置200逐个打开天线阵列100的每个阵元101的传输线路，可以获得天线阵列100的每个阵元101对应的线路损耗，从而，可以根据测试装置300记录的数据建立线路损耗矩阵L，其中L＝[l 1，l 2，…l n]。其中，测试装置300记录的测试信号数据可以是测试信号的功率衰减和相位偏移量，线路损耗l n可以通过发出的测试信号功率与接收的测试信号功率的比值及相位偏移来表示(可通过矢量网络分析仪记录)。
在获得线路损耗矩阵L后，可以将校准天线替换为待测天线400，并将待测天线400放置于预设位置。之后重复上述的测试信号传输过程，即测试装置300发出测试信号，控制装置200通过对应的开关打开天线阵列100的一个阵元101的传输线路，测试信号依次传输经过控制装置200、阵元101和待测天线400，并由测试装置300接收，测试装置300记录发出的测试信号数据和接收的测试信号数据，可以获得天线阵列100的一个阵元101对应的测试数据t i。重复多次上述过程，即控制装置200逐个打开天线阵列100的每个阵元101的传输线路，可以获得天线阵列100的每个阵元101对应的测试数据，从而，可以根据测试装置300记录的数据建立测试矩阵T，其中T＝[t 1，t 2，…t n]。可以理解，在测试对象不是天线，而是基站产品时，测试装置300可以不采用矢量网络分析仪，而是采用频谱仪或功率计等，相应地，可以通过控制装置200(多通道开关)测得各个阵元101对应的传输线路的幅度信息，再通过使用测试装置300自带的参考线路等方式测得各个阵元101对应的传输线路的相位信息，由此同样可以建立测试矩阵；
在获得权值矩阵H、线路损耗矩阵L和测试矩阵T之后，可以将测试矩阵T与线路损耗矩阵L之比乘以权值矩阵H，从而获得待测天线400的增益G，即G＝(T/L)×H，进一步地，
Figure PCTCN2021132587-appb-000001
也就是说，通过将对应的天线阵列100的各个阵元101的电磁强度的加权求和结果作为待测天线400的增益，至此完成待测天线400的测试。
作为一种可能的实施例，考虑到实际中需要测试待测天线400不同方向接收电磁波的能力(如方向图数据等)，为了使得测试结果更加全面，对本申请实施例提供的天线测试方法作进一步说明，具体如下：
在建立权值矩阵时，考虑待测天线400的放置角度，示例性地，如图4所示，待测天线400的口面与水平方向的夹角为θ。根据所需的静区位置(0，0，Z 0)及静区直径(d)，并虑待测天线400的放置角度θ，确定天线阵列100的阵元101所需加载的权值h iθ。假设阵元101在处于预设位置的倾斜平面上对应的电场为E iθ，该倾斜平面的中心位于预设位置，且该倾斜平面与水平方向的夹角为θ，那么权值h iθ可以满足sum(h iθ×E iθ)近似于平面波沿垂直于天线阵列100所在平面(上述的预设平面)方向传输时在倾斜平面上的电场分布，即阵元101加载权值h iθ后，全部阵元101在处于预设位置的倾斜平面上对应的电场叠加的话，可以近似于平面波沿垂直于天线阵列100所在平面方向传输时在倾斜平面上的电场分布。根据上述权值，仿真建立权值矩阵H θ，其中H θ＝[h 1θ，h 2θ，…h nθ]。可以理解，上述的待测天线400的口面以水平方向作为参照方向呈夹角仅为示例，待测天线400的口面也可以与竖直方向呈夹角，在这种情况下，在建立上述权值矩阵时将阵元101对应的电场和权值满足的条件进行适应性变化即可。
由于信号传输线路损耗与待测天线400的放置角度无关，所以线路损耗矩阵L的获得可以参考上述实施例。在获得线路损耗矩阵L后，将校准天线替换为待测天线400，并将待测天线400放置于预设位置且使待测天线400与水平方向的夹角为θ。之后进行测试信 号传输过程，即测试装置300发出测试信号，控制装置200打开天线阵列100的一个阵元101的传输线路，测试信号依次传输经过控制装置200、阵元101和待测天线400，并由测试装置300接收，测试装置300记录发出的测试信号数据和接收的测试信号数据，可以获得天线阵列100的一个阵元101对应的测试数据t iθ。重复多次上述过程，即控制装置200逐个打开天线阵列100的每个阵元101的传输线路，可以获得天线阵列100的每个阵元101对应的测试数据，从而，可以根据测试装置300记录的数据建立测试矩阵T θ，其中T θ＝[t 1 θ，t 2θ，…t nθ]。
在获得权值矩阵H θ、线路损耗矩阵L和测试矩阵T θ之后，可以将测试矩阵T θ与线路损耗矩阵L之比乘以权值矩阵H θ，获得待测天线400的增益G θ，即G θ＝(T θ/L)×H θ，进一步地，
Figure PCTCN2021132587-appb-000002
至此完成待测天线400的测试。
本申请实施例提供的天线测试方法，通过对天线阵列100的阵元101加载权值，建立天线阵列100的权值矩阵，并建立线路损耗矩阵及测试矩阵，通过计算获得待测天线400的增益，测试过程中不必调节阵元101的幅度和相位，从而可以避免调节阵元101的幅度和相位在大功率情况下所存在的非线性效应，可以提高静区的平整度(静区内和理想平面波的接近程度)，测试精度较高，测试误差较小。并且，可以实现多角度下天线测试，可以在短时间内完成比较全面的数据采集，测试效率较高。
以上，仅为本申请的具体实施方式，但本申请的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本申请揭露的技术范围内，可轻易想到的变化或替换，都应涵盖在本申请的保护范围之内。

Claims (10)

  1. 一种天线测试系统，其特征在于，包括天线阵列、控制装置及测试装置；
    所述天线阵列包括多个阵元，多个所述阵元在预设平面阵列排布；
    所述控制装置与所述天线阵列电性连接，所述控制装置用于独立控制每个所述阵元与所述控制装置之间的传输线路的导通；
    所述测试装置与所述控制装置电性连接，且所述测试装置用于与待测天线电性连接，所述测试装置用于根据发出的测试信号和从所述待测天线接收的测试信号，测试所述待测天线的性能。
  2. 如权利要求1所述的天线测试系统，其特征在于，还包括固定架，所述固定架用于与所述待测天线连接，以控制所述待测天线转动。
  3. 如权利要求2所述的天线测试系统，其特征在于，所述固定架包括支撑部和转动部，所述转动部的一端可转动连接于所述支撑部，另一端用于连接所述待测天线；
    所述支撑部通过带动所述转动部转动以带动所述待测天线转动。
  4. 如权利要求1～3任一项所述的天线测试系统，其特征在于，所述控制装置为多通道开关，所述多通道开关的每一个开关与一个对应的所述阵元连接；
    当所述控制装置控制一个所述开关闭合时，与闭合的所述开关连接的所述阵元与所述控制装置之间的传输线路导通。
  5. 如权利要求1～4任一项所述的天线测试系统，其特征在于，所述测试装置为矢量网络分析仪、频谱仪或功率计。
  6. 如权利要求1～5任一项所述的天线测试系统，其特征在于，还包括：
    分别与所述控制装置和所述测试装置电性连接的第一功率放大器；和/或
    分别与所述测试装置和所述待测天线电性连接的第二功率放大器。
  7. 一种天线测试方法，其特征在于，应用于如权利要求1～6任一项所述的天线测试系统中，所述方法包括：
    确定权值矩阵H和线路损耗矩阵L，其中H＝[h 1，h 2，…h n]，L＝[l 1，l 2，…l n]，n为所述天线阵列中所述阵元的数量；
    其中，所述天线阵列中的各个所述阵元分别对应的权值满足：各个所述阵元分别对应的权值h i、与各个所述阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在所述平面上的电场分布；所述天线阵列中的第i个所述阵元对应的线路损耗l i为将已知增益的校准天线与所述天线阵列的每个所述阵元分别扣合连接时，所述测试装置根据发出的测试信号和从所述校准天线接收的测试信号确定的，i∈(1～n)；
    在待测天线置于所述预设位置时，且在所述控制装置打开所述天线阵列的第i个所述阵元的传输线路时，所述测试装置根据发出的测试信号和接收的测试信号，确定第i个所述阵元对应的测试值t i，得到测试矩阵T，其中T＝[t 1，t 2，…t n]；
    根据所述权值矩阵H、所述线路损耗矩阵L和所述测试矩阵T，获得所述待测天线的增益。
  8. 如权利要求7所述的天线测试方法，其特征在于，根据所述权值矩阵H、所述线路损耗矩阵L和所述测试矩阵T，获得所述待测天线的增益，包括：
    将所述测试矩阵T与所述线路损耗矩阵L的比值、与所述权值矩阵H的乘积，作为所 述待测天线的增益G。
  9. 如权利要求7或8所述的天线测试方法，其特征在于，所述天线阵列中的各个所述阵元分别对应的权值h i满足：各个所述阵元分别对应的权值h i、与各个所述阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在所述平面上的电场分布，具体为：
    各个所述阵元分别对应的权值h i、与各个所述阵元在位于预设位置的竖直平面上分别对应的电场E i的乘积之和近似于平面波在所述竖直平面上的电场分布。
  10. 如权利要求7或8所述的天线测试方法，其特征在于，所述天线阵列中的各个所述阵元分别对应的权值h i满足：各个所述阵元分别对应的权值h i、与各个所述阵元在位于预设位置的平面上分别对应的电场E i的乘积之和近似于平面波在所述平面上的电场分布，具体为：
    各个所述阵元分别对应的权值h iθ、与各个所述阵元在位于预设位置的倾斜平面上分别对应的电场E iθ的乘积之和近似于平面波在所述倾斜平面上的电场分布；
    所述倾斜平面具体为位于所述预设位置、且与水平方向呈θ夹角的平面。
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