WO2023079601A1 - 超音波検査装置、方法及びプログラム - Google Patents
超音波検査装置、方法及びプログラム Download PDFInfo
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- WO2023079601A1 WO2023079601A1 PCT/JP2021/040438 JP2021040438W WO2023079601A1 WO 2023079601 A1 WO2023079601 A1 WO 2023079601A1 JP 2021040438 W JP2021040438 W JP 2021040438W WO 2023079601 A1 WO2023079601 A1 WO 2023079601A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
Definitions
- Embodiments of the present invention relate to ultrasonic inspection technology for non-destructive inspection of internal defects occurring in structural members and welds.
- Welding is widely used in civil engineering and building structures such as bridges, plant equipment such as tanks and piping, and structural members of automobile and train bodies. For this reason, from the viewpoint of strength of a structure or closed container, maintenance of this strength, and ensuring safety thereof, non-destructive inspection of welds and defects generated in the vicinity of welds is an important technique. In particular, the importance of quantitative evaluation of defects and measurement of growth behavior is increasing for the soundness and life prediction of structures. In addition, there is an increasing demand for highly accurate and efficient implementation of defect sizing and propagation behavior measurement by non-destructive inspection.
- ultrasonic waves are transmitted from a wide-directivity small single transducer and received by a similar small single transducer. There is a method. However, this technology has insufficient defect detection sensitivity, making it difficult to inspect materials with high attenuation and welds.
- the embodiment of the present invention has been made in consideration of such circumstances, and aims to provide an ultrasonic inspection technique that detects defects in a wide area with high sensitivity.
- a setting unit for setting an incident direction and a focal distance of an ultrasonic beam, and each of a plurality of transducers arranged in an array probe based on the incident direction and the focal distance a transmission unit that calculates the oscillation timing of and transmits a pulse signal, and a reception unit that receives a detection signal obtained by detecting an ultrasonic wave diffracted by a defect due to a back surface reflected wave of the ultrasonic beam, detected by each of the transducers.
- a registration unit that defines and registers a mesh obtained by dividing the interior of the inspection object into a lattice based on the position information of the coordinate system of the array probe; a first calculation unit that calculates a first path length until a reflected wave is incident; a second calculation unit that calculates a second path length of the diffracted wave from the mesh to each of the oscillators; and the first path length.
- a conversion unit that converts each of the second path lengths into ultrasonic wave propagation times, combines them, links them to the corresponding meshes, and registers them; obtains signal strengths corresponding to the propagation times from the received detection signals, and a display unit for displaying the meshes with brightness or color corresponding to each of the integrated values.
- the embodiment of the present invention provides an ultrasonic inspection technology that detects defects in a wide area with high sensitivity.
- FIG. 1 is a configuration diagram of an ultrasonic inspection apparatus according to a first embodiment of the present invention
- FIG. 3 is a block diagram of a data processing unit in the ultrasonic inspection apparatus of the first embodiment
- FIG. 4 is an explanatory diagram of an ultrasonic beam, a back surface reflected wave, and an ultrasonic diffracted wave in the first embodiment
- FIG. 1 is a configuration diagram of an ultrasonic inspection apparatus according to a first embodiment of the present invention
- FIG. 3 is a block diagram of a data processing unit in the ultrasonic inspection apparatus of the first embodiment
- FIG. 4 is an explanatory diagram of an ultrasonic beam, a back surface reflected wave, and an ultrasonic diffracted wave in the first embodiment
- FIG. 4 is an explanatory diagram of a mesh defined by dividing the inside of an inspection object into a lattice in the first embodiment;
- A In the second embodiment, an explanatory diagram of the ultrasonic beam and the back surface reflected wave when the focal distance is set to the outside of the back surface of the inspection object having a non-planar back surface,
- B Positioned on the mesh Explanatory drawing of the diffraction wave which generate
- A Explanatory diagram of the ultrasonic beam in the third embodiment
- B Explanatory diagram of the diffracted wave of the ultrasonic wave generated at the defect due to the back surface reflected wave
- C At the defect where the ultrasonic beam is directly incident as an incident wave Explanatory drawing of the generated diffracted wave.
- the block diagram of the ultrasonic inspection apparatus which concerns on 4th Embodiment of this invention.
- the block diagram of the ultrasonic inspection apparatus which concerns on 5th Embodiment of this invention. 4 is a flowchart for explaining steps of an ultrasonic inspection method and an algorithm of an ultrasonic inspection program according to an embodiment of the present invention;
- FIG. 1 is a configuration diagram of an ultrasonic inspection apparatus 10 according to the first embodiment.
- FIG. 2 is a block diagram of the data processing section 20 in the ultrasonic inspection apparatus 10 of the first embodiment.
- FIG. 3 is an explanatory diagram of the ultrasonic beam 30 n , the back surface reflected wave 31 n , and the diffracted ultrasonic wave 32 n (32 1 , 32 2 . . . 32 N ) in the first embodiment.
- FIG. 4 is an explanatory diagram of meshes 42 m (42 1 , 42 2 . . . 42 M ) defined by dividing the inside of the inspection target 37 into a lattice in the first embodiment.
- the ultrasonic inspection apparatus 10 includes a setting unit for setting the incident directions ⁇ ( ⁇ 1 , ⁇ 2 ) of the ultrasonic beams 30 n (30 1 , 30 2 . . . 30 N ) and the distance h of the focus 39. 15, a calculation unit 16 for calculating the oscillation timing of each of a plurality of transducers 35 n (35 1 , 35 2 . . .
- Detection signals 41 n (41 1 , 41 2 . . . 41 N ) of waves 32 n (32 1 , 32 2 . . . 32 N ) (FIG. 3) detected by transducers 35 n (35 1 , 35 2 . ), a data processing unit 20 for the detection signal 41 n , and a display unit 19 for image-displaying the inspection result of the defect 38 in the inspection object 37 .
- the data processing unit 20 divides the interior of the inspection object 37 into a grid-like mesh 42 m (42 1 , 42 2 . . . 42 M ), and a first path 21 from the vibrator 35 n to the incidence of the back surface reflected wave 31 n on the mesh 42 m based on the shape information 24 of the inspection object 37 . and a second path length of the diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) from the mesh 42 m to each of the oscillators 35 n (35 1 , 35 2 . . .
- the array probe 36 incorporates a plurality of transducers 35 n (35 1 , 35 2 . . . 35 N ) arranged linearly or in a matrix, and includes a wedge-shaped shoe 45 and an acoustic couplant ( (not shown) are placed in close contact with the inspection target 37 .
- the oscillation timing delay time of these adjacent transducers 35 n 35 1 , 35 2 . . . 35 N
- the incident direction ⁇ and focal point of the ultrasonic beam 30 n (30 1 , 30 2 . . . 30 N )
- the distance h of 39 can be set arbitrarily.
- the setting unit 15 fixes the array probe 36 in the XZ coordinate system of the inspection target 37, scans the incident direction ⁇ or the distance h of the focal point 39, and scans the array probe 36 in the Y-axis direction of the inspection target 37.
- Set method Alternatively, an inspection method can be set in which the incident direction ⁇ and focal length h are fixed and the array probe 36 is scanned in the XY coordinate system of the inspection object 37 .
- the calculation unit 16 calculates the delay time of each oscillation timing of the transducers 35 n (35 1 , 35 2 . . . 35 N ).
- the transmitter 17 transmits the pulse signal 40 to each transducer 35 n (35 1 , 35 2 . . . 35 N ) based on the delay time calculated by the calculator 16 to oscillate.
- the back surface reflected wave 31 n reaches the surface of the inspection object 37 and is repeatedly reflected and attenuated. Then, if there is a defect 38 on the path of the back reflected wave 31 n , it is diffracted there, and part of it is diffracted as diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) and vibrators 35 n (35 1 , 35 2 . incident on Incidentally, when the back surface reflected wave 31n is incident on the defect 38, it is diffracted or reflected at the tip and main body. The ultrasonic wave generated at the defect 38 and incident on the transducer 35 n is called a diffracted wave 32 n here.
- the detection signal 41 n output by the vibrator 35 n (35 1 , 35 2 . . . 35 N ) into which the diffracted wave 32 n (32 1 , 32 2 . . . 32 N ) is incident.
- a detection signal 41 n output from these transducers 35 n is guided to the receiving section 18 by the switch 14 .
- the receiver 18 is provided with an amplifier (not shown) for amplifying the detection signal 41 n and an A/D converter (not shown) for converting an analog signal into a digital signal.
- the processes in the registration unit 25, the first calculation unit 11, the second calculation unit 12, and the conversion unit 26 are performed in advance before the transmission unit 17 and the reception unit 18 are operated. It is.
- the registration unit 25 defines meshes 42 m (42 1 , 42 2 . . . 42 M ) (FIG. 4) obtained by dividing the inside of the inspection object 37 into a lattice. These meshes 42 m constitute the picture elements (pixels) of the image displayed on the display unit 19 . Although the positional information of these meshes 42 m is defined in the plane coordinate system in the embodiment, it may be defined in the three-dimensional coordinate system.
- the first calculator 11 calculates a first path 21 from the vibrator 35 n until the rear surface reflected wave 31 n is incident on the mesh 42 m based on the shape information 24 of the inspection object 37 . If the object 37 to be inspected is a parallel plate having flat and parallel front and back surfaces as shown in FIG. 3 or FIG.
- These propagation times P f , P r , P m are calculated from the position information of the coordinate system of the array probe 36 and the propagation velocity of the ultrasonic waves.
- the second calculation unit 12 calculates a second path length 22 of the diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) from the mesh 42 m to each of the oscillators 35 n (35 1 , 35 2 . . . 35 N ). do.
- Calculation of the propagation time Qn ( Q1 , Q2 ... QN ) of the second path 22 in the transforming unit 26 is based on the path from the mesh 42m to each transducer 35n ( 351 , 352 ... 35N ). is calculated from the position information of the coordinate system of the array probe 36 and the propagation speed of the ultrasonic wave.
- the conversion unit 26 thus converts the first path length 21 and each of the second path lengths 22 into ultrasonic wave propagation times P, Q n , and further combines (P+Q n ) to obtain the propagation time t m n (t m 1 , t m 2 ... t m N ). These propagation times t m n (t m 1 , t m 2 . . . t m N ) are linked to the position information of the corresponding mesh 42 m and registered together in the registration unit 25 . Up to this point, the preliminary work up to the actual start of the inspection by bringing the array probe 36 into contact with the surface of the inspection object 37 is performed. For this pre-work, it is necessary to calculate the first path 21 and each second path 22 for all ⁇ to be scanned, and pre-register the corresponding propagation times t m n in the register 25 .
- each of the detection signals 41n ( 411 , 412 ... 41N ) received by the receiver 18 by oscillating the transducers 35n ( 351 , 352 ... 35N ) is generated at a predetermined time interval.
- 2 is discrete data of signal strength I sampled at .
- the acquisition unit 27 compares the propagation times t m n (t m 1 , t m 2 . . . t m N ) registered in the registration unit 25 with the detection signals 41 n (41 1 , 41 2 . . . 41 N ). Obtain the signal intensity I m n (I m 1 , I m 2 . . . I m N ).
- the display unit 19 displays the meshes 42 m (42 1 , 42 2 . . . 42 M ) in brightness or color corresponding to each integrated value G m (G 1 , G 2 . . . GM ). As a result, the display unit 19 can detect the defect 38 that is likely to exist inside the inspection object 37 with high sensitivity in a wide area, image it, and use it as an inspection result.
- the acquisition unit 27 may be provided with a Hilbert transformer (not shown).
- the display unit 19 displays an image subjected to envelope processing by adding and synthesizing an image based on the detection signal 41 n processed by the Hilbert transform and an image based on the unprocessed detection signal 41 n . can do. By applying such envelope processing, a clearer image can be obtained.
- FIG. 5 to 7 The configuration of an ultrasonic inspection apparatus 10 according to the second embodiment is the same as those shown in FIGS. 1 and 2, which describe the first embodiment.
- the object 37 to be inspected has a non-planar rear surface.
- the shape information 24 (FIG. 2) has normal line information for each minute area of the back surface that is non-planar. Based on this normal line information, the back surface reflected wave 31 n is reflected in a direction in which the reflection angle is equal to the incident angle of the ultrasonic beam 30 n incident on the minute area on the back surface. Furthermore, in the second embodiment, the focal point 39 is not only set outside the back surface of the inspection object 37, but can also be set at an arbitrary position inside the back surface and the front surface, or outside the front surface.
- FIG. 5A is an explanatory diagram of an ultrasonic beam 30 n and a back surface reflected wave 31 n when a focal point 39 is set outside the back surface of an inspection object 37 having a non-planar back surface.
- FIG. 5(B) is an explanatory diagram of a diffracted wave 32n generated at a defect 38 located in the mesh 42m .
- FIG. 6A is an explanatory diagram of an ultrasonic beam 30 n and a back reflected wave 31 n when a focal point 39 is set outside the front surface of an inspection target 37 having a non-planar back surface.
- FIG. 6(B) is an explanatory diagram of a diffracted wave 32n generated at a defect 38 located in the mesh 42m .
- FIG. 7A is an explanatory diagram of an ultrasonic beam 30 n and a back surface reflected wave 31 n wave when a focal point 39 is set inside the back surface and the front surface in an inspection object 37 having a non-planar back surface.
- 7(B) is an illustration of a diffracted wave 32n generated at a defect 38 located in the mesh 42m .
- FIG. 8 is a block diagram of the data processing section 20 in the ultrasonic inspection apparatus of the third embodiment.
- FIG. 9A is an explanatory diagram of the ultrasonic beams 30 n (30 1 , 30 2 . . . 30 N ) in the third embodiment.
- FIG. 9(B) is an explanatory diagram of diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) of ultrasonic waves generated at the defect 38 by the back surface reflected waves 31 n (31 1 , 31 2 . . . 31 N ).
- 9C is an explanatory diagram of diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) generated at the defect 38 on which the ultrasonic beam 30 n is directly incident as an incident wave 33 n .
- parts having configurations or functions common to those in FIG. 2 are denoted by the same reference numerals, and overlapping descriptions are omitted.
- the overall configuration of the ultrasonic inspection apparatus of the third embodiment is common to the ultrasonic inspection apparatus 10 of the first embodiment shown in FIG. The point is that the third calculation unit 13 is added.
- the third calculator 13 calculates a third path length 23 of a direct incident wave 33n , which is the ultrasonic beam 30n directly incident on the mesh 42m from the center of the transducer 35n . Since the second process 22 and the third process 23 are the same, the third calculator 13 and the second calculator 12 perform substantially the same calculations. Therefore, for convenience of explanation, the third calculation unit 13 is provided separately from the second calculation unit 12. However, the third calculation unit 13 is not provided, and the third calculation unit 23 is replaced with the second calculation unit 22 for data processing. can do.
- the rear surface reflected wave 31n ( 311 , 312 ... 31N) as in the first embodiment ) derived from the diffracted wave 32 n ( 32 1 , 32 2 . . . 32 N ) (FIG. 9B), as well as the diffracted wave 32 n (32 1 , 32 2 . . . 32 N ) (FIG. 9(C)) are also included at the same time.
- the conversion unit 26b of the third embodiment converts the propagation time t m n (t m 1 , t m 2 . are registered in the registration unit 25 by linking to the corresponding mesh 42 m .
- the integrating section 28 integrates the signal intensity I m n based on the back surface reflected wave 31 n and the directly incident wave 33 n for each corresponding mesh 42 m . Accordingly, high-resolution imaging can be performed within the transmission range of the ultrasonic beam 30n .
- the above description is for the case where the incident direction ⁇ is fixed, but the following may be used when performing image composition in a wider range. That is, in the setting unit 15 (FIG. 1), the incident direction ⁇ ( ⁇ 1 , ⁇ 2 ) of the ultrasonic beam 30 n is set to scan, and the signal intensity I m n corresponding to each mesh 42 m is integrated.
- the third embodiment not only the back surface reflected wave 31 n used in the first embodiment, but also the directly incident wave 33 n that is directly incident on the defect 38 can be considered to display a superimposed image.
- a high-resolution, fine and clear image can be obtained, and the effect of detecting defects with high sensitivity can be further improved.
- detailed description is omitted, the above effect can be further improved by considering multiple reflected waves of the ultrasonic beam 30n .
- FIG. 10 is a configuration diagram of an ultrasonic inspection apparatus 10 according to the fourth embodiment.
- parts having configurations or functions common to those in FIG. 10 are identical to those in FIG. 10
- inspection is performed using a plurality of pairs of array probes 36 (36a, 36b). Then, by operating the switch 53, the pulse signal 40 and the detection signal 41n are transmitted and received to and from only one of the array probes 36.
- FIG. 1 A block diagram illustrating an exemplary computing environment in accordance with the present disclosure.
- FIG. 11 is a configuration diagram of an ultrasonic inspection apparatus 10 according to the fifth embodiment.
- parts having configurations or functions common to those in FIGS. 1 and 10 are denoted by the same reference numerals, and overlapping descriptions are omitted.
- the ultrasonic inspection apparatus of the fifth embodiment includes scanning means 50 for scanning array probes 36 (36a, 36b) on the surface of an inspection object 37 (37a, 37b), and a drive control section 55 of the scanning means 50. I have.
- the welded portion 34 is inspected in which the upper surface of one inspection object 37a and the lower end of the other inspection object 37b are connected to each other. .
- the scanning means 50 is a self-propelled one in which two pairs of array probes 36 (36a, 36b) are mounted on a support structure 54.
- the support structure 54 is provided with a pair of drive wheels 59a grounded on the top surface of one inspection object 37a and a driven wheel 59b grounded on the top surface of the other inspection object 37b.
- Magnets 57 (57a, 57b) are provided for pressing the wheels 59a, 59b against the upper surfaces of the respective inspection objects 37a, 37b.
- the support structure 54 is provided with a motor 56 that rotates the drive wheel 59a and a position detector 58 that detects the positional information of the support structure 54 that has moved.
- the drive control unit 55 sends electric power and drive signals to the motor 56, and receives signals from the position detector 58 as position information of the array probes 36 (36a, 36b).
- This position information of the array probe 36 is sent to the data processing unit 20 as the scanning information 46 together with the incident direction ⁇ and the focal point 39 of the ultrasonic beam 30 n obtained from the setting unit 15 . Further, although illustration is omitted, there is a supply unit that continuously supplies acoustic couplant (water), which is a liquid acoustic medium, to a portion where the array probe 36 (36a, 36b) abuts on the inspection target 37 (37a, 37b). is provided.
- acoustic couplant water
- the steps of the ultrasonic inspection method and the algorithm of the ultrasonic inspection program according to the embodiment will be described based on the flowchart of the present invention in FIG. 12 (see FIGS. 1 and 2 as appropriate).
- the incident direction ⁇ of the ultrasonic beam 30 n (30 1 , 30 2 . . . 30 N ) and the distance h of the focal point 39 are set (S11).
- the incident direction ⁇ , the focal length h, and the scanning information 46 of the array probe 36 are set.
- a mesh 42 m (42 1 , 42 2 . . . 42 M ) defined based on the xz coordinate system positional information of the array probe 36 is registered (S12). Then, based on the shape information 24 of the inspection object 37, the first path 21 from the vibrator 35n to the incidence of the back surface reflected wave 31n on the mesh 42m is calculated (S13). Further, if necessary, the third path length 23 of the direct incident wave 33n, which is the ultrasonic beam 30n directly incident on the mesh 42m from the transducer 35n , is also calculated.
- the second path length 22 of the diffracted waves 32n ( 321 , 322...32N) from the mesh 42m to each of the oscillators 35n (351, 352 ... 35N ) is calculated ( S14). Then, the first path length 21 and each of the second path lengths 22 are converted into ultrasonic wave propagation times t m n (t m 1 , t m 2 . . . t m N ) and combined (S15) to obtain the corresponding meshes 42 m ( 42 1 , 42 2 . . . 42 M ) and registered (S16).
- the third path length 23 and each of the second path lengths 22 are converted into ultrasonic propagation times t m n (t m 1 , t m 2 . . . t m N ) and combined to obtain the corresponding mesh 42 Link to m (42 1 , 42 2 ... 42 M ) and have them registered.
- This registration information is set for all ⁇ (for example, ⁇ 1 to ⁇ 13 from 20° to 80° at a pitch of 5°) and the focal length h of scanning (fan-shaped scanning) in the incident direction ⁇ . Propagation time is pre-registered.
- the array probe 36 is brought into contact with the surface of the object to be inspected 37 and mechanically or electronically scanned (S17). Then, a plurality of transducers 35 n (35 1 , 35 2 . . . 35 N ) are oscillated, and ultrasonic beams 30 n (30 1 , 30 2 . (S18).
- the diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) of the ultrasonic waves generated at the defect 38 by the back surface reflected waves 31 n (31 1 , 31 2 . . . 31 N ) 2 . . . 35 N ) (S19).
- a detection signal 41 n (41 1 , 41 2 . . . 41 N ) is received from the vibrator 35 n (35 1 , 35 2 . . . 35 N ) (S20), and the registered propagation time t m n (t m 1 , Signal intensities I m n (I m 1 , I m 2 . . . I m N ) at t m 2 .
- the diffracted waves 32 n (32 1 , 32 2 . . . 32 N ) of the ultrasonic waves generated at the defect 38 by the directly incident waves 33 n (33 1 , 33 2 . . . 33 N ) also 2 . . . 35 N ).
- the registered signal intensities I m n (I m 1 , I m 2 . . . I m N ) are similarly acquired.
- the embodiment improves the inspection performance of non-destructive inspection of welds that are widely used from civil engineering and building structures such as bridges, plant equipment such as tanks and piping, and structural members of automobiles and train bodies. be able to.
- quantitative evaluation of defects and measurement of growth behavior are becoming increasingly important for structural soundness and life prediction, and can be applied to defect sizing and growth behavior measurement by non-destructive inspection.
- an ultrasonic beam is focused by an array probe composed of a plurality of transducers, reflected from the rear surface, and then incident on a defect, and the generated diffracted waves are emitted from the transducers.
- an array probe composed of a plurality of transducers, reflected from the rear surface, and then incident on a defect, and the generated diffracted waves are emitted from the transducers.
- the ultrasonic inspection apparatus described above includes a controller with a highly integrated processor such as a dedicated chip, FPGA (Field Programmable Gate Array), GPU (Graphics Processing Unit), or CPU (Central Processing Unit), ROM ( Storage devices such as Read Only Memory) and RAM (Random Access Memory), external storage devices such as HDD (Hard Disk Drive) and SSD (Solid State Drive), display devices such as displays, and input such as mouse and keyboard It is provided with a device and a communication I/F, and can be realized with a hardware configuration using a normal computer. For this reason, the constituent elements of the ultrasonic inspection apparatus can also be realized by a processor of a computer, and can be operated by an ultrasonic inspection program.
- a highly integrated processor such as a dedicated chip, FPGA (Field Programmable Gate Array), GPU (Graphics Processing Unit), or CPU (Central Processing Unit), ROM ( Storage devices such as Read Only Memory) and RAM (Random Access Memory), external storage devices such as HDD (Hard Disk Drive) and SSD (Solid
- the ultrasound examination program is pre-installed in ROM, etc. and provided.
- this program is stored in a computer-readable storage medium such as a CD-ROM, CD-R, memory card, DVD, flexible disk (FD) as an installable or executable file. You may make it
- the ultrasonic examination program according to the present embodiment may be stored on a computer connected to a network such as the Internet, downloaded via the network, and provided.
- the ultrasonic inspection apparatus can also be configured by connecting and combining separate modules that independently perform each function of the constituent elements by connecting them via a network or a dedicated line.
- Incident direction h... Focal length, I m n (I m 1 , Im2 ... ImN )...signal intensity, Gm ( G1 , G2 ... GM )... integrated value , tmn ( tm1 , tm2 ... tmN )...propagation time.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023557869A JP7720404B2 (ja) | 2021-11-02 | 2021-11-02 | 超音波検査装置、方法及びプログラム |
| PCT/JP2021/040438 WO2023079601A1 (ja) | 2021-11-02 | 2021-11-02 | 超音波検査装置、方法及びプログラム |
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| PCT/JP2021/040438 WO2023079601A1 (ja) | 2021-11-02 | 2021-11-02 | 超音波検査装置、方法及びプログラム |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997036175A1 (fr) * | 1996-03-28 | 1997-10-02 | Mitsubishi Denki Kabushiki Kaisha | Detecteur de defauts par ultrasons et procede de detection de defauts par ultrasons |
| JP2000321251A (ja) * | 1999-05-07 | 2000-11-24 | Tokyo Gas Co Ltd | 超音波アレイ探傷法及び超音波アレイ探傷装置 |
| JP2005274557A (ja) * | 2004-02-23 | 2005-10-06 | Hitachi Ltd | 超音波探傷方法及び装置 |
| US20060230831A1 (en) * | 2002-12-17 | 2006-10-19 | Michael Berke | Method and device for sizing a crack in a workpiece using the ultrasonic pulse-echo technique |
| JP2008209364A (ja) * | 2007-02-28 | 2008-09-11 | Jfe Steel Kk | 管体の超音波探傷装置および超音波探傷方法 |
| JP2012215520A (ja) * | 2011-04-01 | 2012-11-08 | Ihi Inspection & Instrumentation Co Ltd | 表面亀裂深さの超音波計測方法と装置 |
-
2021
- 2021-11-02 WO PCT/JP2021/040438 patent/WO2023079601A1/ja not_active Ceased
- 2021-11-02 JP JP2023557869A patent/JP7720404B2/ja active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997036175A1 (fr) * | 1996-03-28 | 1997-10-02 | Mitsubishi Denki Kabushiki Kaisha | Detecteur de defauts par ultrasons et procede de detection de defauts par ultrasons |
| JP2000321251A (ja) * | 1999-05-07 | 2000-11-24 | Tokyo Gas Co Ltd | 超音波アレイ探傷法及び超音波アレイ探傷装置 |
| US20060230831A1 (en) * | 2002-12-17 | 2006-10-19 | Michael Berke | Method and device for sizing a crack in a workpiece using the ultrasonic pulse-echo technique |
| JP2005274557A (ja) * | 2004-02-23 | 2005-10-06 | Hitachi Ltd | 超音波探傷方法及び装置 |
| JP2008209364A (ja) * | 2007-02-28 | 2008-09-11 | Jfe Steel Kk | 管体の超音波探傷装置および超音波探傷方法 |
| JP2012215520A (ja) * | 2011-04-01 | 2012-11-08 | Ihi Inspection & Instrumentation Co Ltd | 表面亀裂深さの超音波計測方法と装置 |
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| JP7720404B2 (ja) | 2025-08-07 |
| JPWO2023079601A1 (https=) | 2023-05-11 |
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