WO2022239427A1 - 状態検出システム - Google Patents

状態検出システム Download PDF

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Publication number
WO2022239427A1
WO2022239427A1 PCT/JP2022/010038 JP2022010038W WO2022239427A1 WO 2022239427 A1 WO2022239427 A1 WO 2022239427A1 JP 2022010038 W JP2022010038 W JP 2022010038W WO 2022239427 A1 WO2022239427 A1 WO 2022239427A1
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Prior art keywords
state
detection system
inspected
electromagnetic wave
time
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PCT/JP2022/010038
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English (en)
French (fr)
Japanese (ja)
Inventor
拓己 石渡
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コニカミノルタ株式会社
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Priority to JP2023520845A priority Critical patent/JPWO2022239427A1/ja
Publication of WO2022239427A1 publication Critical patent/WO2022239427A1/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws

Definitions

  • the present disclosure relates to a state detection system.
  • IoT The introduction of IoT is progressing toward the realization of a smart society. Until now, various electronic devices such as automobiles and home appliances have been connected to the Internet, making it possible to link information between cyberspace and physical space. However, the scope of IoT is limited to electronic devices in environments where power supply is easy. Therefore, at present, it is difficult to connect structures for outdoor use and components of durable consumer goods themselves to cyberspace and monitor their quality deterioration.
  • Patent Document 1 attempts to reduce power consumption by installing multiple sensor modules on a bridge and operating the modules in sequence. However, drastic power consumption of the sensor module is unavoidable, and management costs due to periodic maintenance are unavoidable. Further, in Patent Document 2, an attempt is made to grasp the quality of a member by mixing RFID into concrete and checking the distribution with RFID. Further, Patent Document 3 attempts to embed an RFID inside a tire to detect tire troubles such as wear in real time.
  • JP 2015-207235 A Japanese Patent Publication No. 2011-501704 JP 2017-132292 A
  • the present disclosure has been made in view of such problems, and makes it possible to detect temporal changes in the material state of an object to be inspected (in particular, the state of the material inside the object to be inspected) using a simpler method. It is an object of the present invention to provide a condition detection system.
  • An electromagnetic wave reading type state detection system an electromagnetic wave responsive material disposed in a state of being responsive to the state of the material to be detected of the object to be inspected, and changing its own electromagnetic wave reflection characteristics according to the state of the material; a reader that transmits an electromagnetic wave from the outside of the object to be inspected to a position where the electromagnetic wave responsive material is arranged in the object to be inspected, receives the reflected wave, and acquires the spectrum of the reflected wave;
  • the inspection object at the first time based on the spectrum acquired at a first time at the same position in the inspection object and the spectrum acquired at a second time before the first time an analysis device for estimating the state of the material in the object;
  • a condition detection system comprising:
  • the state detection system it is possible to detect temporal changes in the material state of the object to be inspected using a simpler method.
  • FIG. 4 is a diagram schematically explaining the distribution of material properties of an object detected by the state detection system according to the present disclosure
  • a diagram showing an example of a specific configuration of a sensor according to the present disclosure A diagram showing an example of a reflected wave spectrum of a sensor according to the present disclosure
  • FIG. 11 is a diagram showing a mode of detecting an expansion/contraction state (that is, shape change) of an object to be inspected by a sensor according to the present disclosure;
  • FIG. 11 is a diagram showing a mode of detecting an expansion/contraction state (that is, shape change) of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the thickness of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the thickness of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the material composition of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the material composition of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the material composition of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the degree of oxidation of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the degree of oxidation of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the strength of electrical anisotropy (eg, orientation) of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the strength of electrical anisotropy (eg, orientation) of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing a mode of detecting the strength of electrical anisotropy (eg, orientation) of an object to be inspected by a sensor according to the present disclosure
  • FIG. 4 is a diagram showing an example of another arrangement of sensors in an object to be inspected as viewed from the reader side according to the present disclosure
  • FIG. 10 is a diagram showing the configuration of a sensor according to Modification 1
  • FIG. 11 is a diagram illustrating an example of a mechanism for detecting a state using a sensor according to Modification 1
  • FIG. 5 is a diagram illustrating an example of a method for estimating the distribution of the material state of an object to be inspected by the analysis apparatus according to the present disclosure
  • FIG. 5 is a diagram illustrating an example of a method for estimating the distribution of the material state of an object to be inspected by the analysis apparatus according to the present disclosure
  • FIG. 5 is a diagram explaining an example of the operation of the state detection system according to the present disclosure
  • FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment
  • FIG. FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment
  • FIG. FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment
  • FIG. FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment
  • FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment
  • FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment
  • FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment
  • FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment
  • FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment
  • FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fourth embodiment
  • FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fourth embodiment
  • FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fifth embodiment
  • FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fifth embodiment
  • FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fifth embodiment
  • FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a sixth embodiment
  • FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a sixth embodiment
  • FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a sixth embodiment
  • FIG. 11 is
  • the inventors of the present application diligently studied a method for detecting temporal changes in the internal state of an object to be inspected using a simple method that does not require a power supply. ”) was conceived to adopt a state detection system.
  • This type of state detection system is generally arranged in a state sensitive to the material state of an object to be inspected, and transmits and receives electromagnetic waves to and from a sensor tag that changes its own electromagnetic wave reflection characteristics according to the material state of the object, and a reader for acquiring the frequency spectrum of the reflected wave from the object to be inspected (hereinafter referred to as the "reflected wave spectrum").
  • the reader receives a reflected wave from the sensor tag when an electromagnetic wave is transmitted to the sensor tag, thereby obtaining a change in the electromagnetic wave reflection characteristic of the sensor tag. Estimate the state change of the target object.
  • data of the reference pattern of the electromagnetic wave reflection characteristics of the sensor tag is stored in advance by experiment or the like, and the data of the reference pattern and the sensor tag obtained this time are stored.
  • a method of estimating a state change of an object to be inspected is adopted by collating it with electromagnetic wave reflection characteristics.
  • a basic configuration of a state detection system (hereinafter referred to as “state detection system U”) according to an embodiment of the present disclosure will be described below with reference to FIGS. 1A and 1B.
  • the state detection system U according to the present disclosure is constructed based on the state detection system using the electromagnetic wave reading type sensor tag described above.
  • FIG. 1A is a diagram showing an example of the overall configuration of the state detection system U.
  • FIG. 1B is a diagram schematically explaining the distribution of material properties of an object M detected by the state detection system U. As shown in FIG.
  • the state detection system U includes a sensor tag 1, a reader 2, and an analysis device 3.
  • the sensor tag 1 (corresponding to the "electromagnetic wave reflector” of the present invention) is sensitive to the specific material condition of the object M (that is, the material condition to be detected) on the surface or inside of the object M to be inspected. placed in a state.
  • the sensor tag 1 has, for example, a resonator whose resonance state changes according to the specific material state of the object M, and has a reflection characteristic (hereinafter referred to as "the sensor tag 1's Also referred to as “electromagnetic wave reflection characteristics” or "reflected wave spectrum of the sensor tag 1”), information relating to the material state of the object M is transferred to the reader 2 (details will be described later).
  • At least one sensor tag 1 is arranged, for example, at each of a plurality of inspection target positions Ma (see FIG. 1B) in the inspection target object M.
  • the reader 2 transmits an electromagnetic wave to the presence position of the sensor tag 1 of the inspection target object M (that is, the inspection target position Ma of the inspection target object M) and receives the reflected wave, and the reflected wave spectrum ( That is, the reflected wave spectrum characterized by the electromagnetic wave reflection characteristics of the sensor tag 1 is acquired.
  • the analysis device 3 Based on the reflected wave spectrum acquired at the inspection target position Ma in the inspection target object M by the reader 2, the analysis device 3 estimates the temporal change in the material state of the detection target in the inspection target object M (for example, See Figure 16A). At this time, the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the inspection target object M, and compares them with each other to perform the inspection. It is configured to estimate temporal changes (for example, deterioration over time) in the state of materials in the target object M, thereby enabling highly accurate state estimation (details will be described later).
  • the object M to be inspected by the state detection system U is, for example, a concrete structure, a resin material, a ceramic material, or a sheet material. Then, the state detection system U detects, for example, corrosion occurring inside the inspection target object M, cracks in the inspection target object M, composition of constituent materials of the inspection target object M, and the like, and detects these inspection target object It is applied to the quality control at the manufacturing site of M and the check of the deterioration state when the use is started in the actual environment.
  • the object M to be inspected is not limited to the above, and may be any dielectric material.
  • the material condition to be detected by the condition detection system U may be any material property and/or structural property of the object M to be inspected.
  • the state detection system U is typically constructed based on the use of electromagnetic waves in the UWB band, millimeter wave band, or sub-millimeter wave band (range of 3.1 GHz to 3 THz). ing. That is, the sensor tag 1 is configured to respond to electromagnetic waves in such a band, and the reader 2 is configured to detect the material properties for each position of the object to be inspected using the electromagnetic waves in this band. Electromagnetic waves in such a band have characteristics such as a short wavelength, high directivity (that is, rectilinearity) of the electromagnetic wave, and high frequency resolution at the time of detection. By using electromagnetic waves in such a band, it is possible to achieve high area resolution when grasping the distribution of the material properties of the object M to be inspected, and the size of the sensor tag 1 can also be reduced.
  • FIG. 2 is a diagram showing an example of how the sensor tags 1 are arranged in the inspection object M viewed from the reader 2 side.
  • FIG. 3 is a diagram showing an example of a specific configuration of the sensor tag 1.
  • FIG. 4 is a diagram showing an example of the reflected wave spectrum of the sensor tag 1.
  • FIG. 3 is a diagram showing an example of a specific configuration of the sensor tag 1.
  • FIG. 4 is a diagram showing an example of the reflected wave spectrum of the sensor tag 1.
  • a plurality of sensor tags 1 are dispersedly arranged on the surface or inside the inspection target region of the inspection target object M in a state sensitive to the material state of the detection target of the inspection target object M.
  • the inspection target area of the inspection target object M is divided into, for example, a plurality of small areas, and at least one sensor tag 1 is provided for each small area.
  • the plurality of inspection target positions Ma in FIG. 1B are the positions of the small areas obtained by partitioning the inspection target area of the inspection target object M, respectively.
  • Each sensor tag 1 detects the material state of the inspection target object M at each inspection target position Ma. Note that FIG.
  • FIG. 2 shows, as an example, a mode in which eight sensor tags 1 are dispersedly arranged at eight inspection target positions Ma of the inspection target object M, and the eight sensor tags 1 are arranged at eight locations. Each sensor tag 1 detects the material state of each of the eight inspection target positions Ma.
  • the sensor tag 1 detects, for example, the state of the material to be detected of the object M as the resonance state of the resonator 1a (see, for example, FIG. 3), and transmits information on the state of the material when electromagnetic waves are emitted from the reader 2. (ie, the position of the resonance peak and the peak intensity at the resonance peak) regarding the pattern of the reflected wave spectrum of .
  • the reflected wave spectrum of the sensor tag 1 is superimposed on the reflected wave spectrum of the inspection target object M itself, and is acquired by the reader 2. , a unique pattern centered on the resonance peak position of the resonator 1a is drawn. Therefore, the reflected wave spectrum pattern of the sensor tag 1 (see, for example, FIG. 4) can be clearly identified from the reflected wave spectrum pattern of the inspection object M itself.
  • the sensor tag 1 has, for example, a resonant structure that resonates when externally irradiated with an electromagnetic wave of a predetermined frequency and absorbs or reflects the electromagnetic wave.
  • the sensor tag 1 according to the present embodiment has an electromagnetic wave reflection characteristic that absorbs electromagnetic waves with a frequency that matches its own resonance frequency and reflects electromagnetic waves with frequencies other than that (see FIG. 4).
  • the sensor tag 1 is composed of, for example, a resonator 1a, an isolation layer 1b, and a back reflector 1c, which are arranged in order from the front side.
  • the resonator 1a is, for example, a conductor pattern formed in a strip shape, absorbs an electromagnetic wave of a frequency matching its own resonance frequency, and reflects the electromagnetic wave when irradiated with an electromagnetic wave of a frequency other than that. do.
  • the resonator 1a resonates, for example, when it is irradiated with an electromagnetic wave having a frequency corresponding to 1/2 ⁇ of the resonator length (length in the longitudinal direction of the resonator 1a).
  • FIG. 3 shows only one resonator 1a
  • the sensor tag 1 is preferably provided with a plurality of resonators 1a having mutually different resonance frequencies. This makes it possible to further diversify the reflected wave spectrum pattern of the sensor tag 1 and improve the distinguishability from the reflected wave spectrum pattern of the inspection target object M itself.
  • the isolation layer 1b is an insulating material layer or an insulating space layer (including a space where no object is arranged), is formed between the resonator 1a and the back reflector 1c, and is formed between the resonator 1a and the back reflector 1c. insulate between The isolation layer 1b may be partially or entirely composed of the object M to be inspected.
  • the back reflector 1c is a material having characteristics of reflecting electromagnetic waves, such as a metal material such as silver, gold, copper, or aluminum, and is disposed facing the resonator 1a via the isolation layer 1b, The electromagnetic wave irradiated to the sensor tag 1 is reflected.
  • the rear reflector 1c also functions to amplify the resonance phenomenon that occurs in the resonator 1a. Specifically, when the back reflector 1c exists, the resonance phenomenon occurring in the resonator 1a also occurs between the resonator 1a and the back reflector 1c, and the resonance phenomenon is amplified. That is, the back reflector 1c increases the resonance peak when a resonance phenomenon occurs in the resonator 1a.
  • a part or the whole of the back reflector 1c may be composed of the object M to be inspected.
  • the resonance peak at frequency f0 in the reflected wave spectrum of FIG. 4 represents power loss (absorption) due to resonance of the resonator 1a.
  • the baseband region in the reflected wave spectrum of FIG. 4 represents the reflection of the electromagnetic wave from the rear reflector 1c when the resonator 1a is not resonating.
  • a change in the state of at least one of the resonator 1a, the isolation layer 1b, and the back reflector 1c is a change in the state of the material to be detected of the object M to be inspected (for example, a change in shape). , structural change, ambient atmosphere change, physical property change, etc.).
  • the material state of the object M to be detected by the sensor tag 1 is arbitrary.
  • the state of the material to be detected includes, for example, the expansion and contraction of the constituent material in the object M to be inspected, the thickness of the constituent material in the object M to be inspected, the corrosion state (degree of oxidation) of the constituent material in the object M to be inspected, Orientation state of constituent materials in the inspection object M, composition state of the constituent materials in the inspection object M, pressure state in the inspection object M, wear state in the inspection object M, cracks in the inspection object M Occurrence state, dielectric constant in the object M to be inspected, detachment state of the region joining a plurality of members in the object M to be inspected, moisture content in the object M to be inspected, temperature in the object M to be inspected, etc. is mentioned.
  • FIG. 5A to 9B are diagrams showing an example of detection modes of the material state of the inspection target object M by the sensor tag 1.
  • FIG. 5A to 9B are diagrams showing an example of detection modes of the material state of the inspection target object M by the sensor tag 1.
  • FIGS. 5A and 5B are diagrams showing how the sensor tag 1 detects the expansion/contraction state (that is, shape change) of the object M to be inspected.
  • the sensor tag 1 is made of, for example, a member that allows the resonator 1a to expand and contract in the longitudinal direction. Then, the sensor tag 1 detects the expansion/contraction state of the object M to be inspected as a change in the length of the resonator 1a. A change in the length of the resonator 1a is expressed as a change in resonance frequency in the reflected wave spectrum of the sensor tag 1.
  • FIGS. 6A and 6B are diagrams showing modes of detecting the thickness of the inspection target object M with the sensor tag 1.
  • the sensor tag 1 is arranged such that the thickness of the isolation layer 1b (that is, the distance between the resonator 1a and the back reflector 1c) changes in conjunction with the thickness of the inspection object M, for example. It is configured. Then, the sensor tag 1 detects the thickness of the object M to be inspected as a change in the thickness of the isolation layer 1b.
  • the intensity of the reflected wave from the sensor tag 1 becomes maximum when the distance between the resonator 1a and the back surface reflector 1c is a predetermined distance. The distance to the reflector 1c becomes smaller as the distance from the predetermined distance increases. In other words, a change in the thickness of the isolation layer 1b appears as a change in the peak intensity of the resonance peak in the reflected wave spectrum of the sensor tag 1.
  • FIG. 1 the intensity of the reflected wave from the sensor tag 1 becomes maximum when the distance between the resonator 1a
  • FIGS. 7A and 7B are diagrams showing modes of detecting the material composition of the inspection target object M with the sensor tag 1.
  • the sensor tag 1 has, for example, a structure in which a portion of the object M to be inspected is arranged in the isolation layer 1b, or a structure in which the object M to be inspected is the isolation layer 1b itself. Then, the sensor tag 1 detects a change in the material composition of the object M to be inspected as a change in dielectric constant of the isolation layer 1b.
  • the change in the dielectric constant of the isolation layer 1b is expressed as a change in the resonance frequency of the resonator 1a in the reflected wave spectrum of the sensor tag 1.
  • FIGS. 8A and 8B are diagrams showing modes in which the sensor tag 1 detects the degree of oxidation of the object M to be inspected.
  • the sensor tag 1 is configured such that the back reflector 1c is part of the object M to be inspected, for example. Then, the sensor tag 1 detects the degree of oxidation of the object M to be inspected as a change in conductivity of the back reflector 1c. A change in the conductivity of the back reflector 1c is expressed as a change in the peak intensity of the resonance peak in the reflected wave spectrum of the sensor tag 1.
  • FIGS. 9A and 9B are diagrams showing how the sensor tag 1 detects the strength of the electrical anisotropy (eg, orientation) of the object M to be inspected.
  • the sensor tag 1 has, for example, a structure in which a portion of the object M to be inspected is placed within the isolation layer 1b. Then, the sensor tag 1 detects the strength of the electrical anisotropy of the object M to be inspected from the magnitude of the peak intensity of the resonance peak.
  • the sensor tag 1 detects the strength of the electrical anisotropy of the object M to be inspected. This is based on the fact that it depends on the ease of occurrence of the resonance phenomenon of the electromagnetic field generated in the That is, in the sensor tag 1, the resonance current that flows when the resonator 1a resonates flows along the extending direction of the resonator 1a. The direction of flow of this resonant current determines the direction of the electromagnetic field generated around the resonator 1a (for example, the isolation layer 1b).
  • the object M to be inspected has electrical anisotropy, and the arrangement direction of the object M to be inspected (that is, the polarization direction of the object M to be inspected) is the direction of the electromagnetic field generated by this resonance current.
  • the presence of the inspection object M functions to strengthen the resonance phenomenon of the electromagnetic field generated around the resonator 1a, increasing the peak intensity of the resonance peak.
  • the sensor tag 1 is arranged on the surface or inside of the object M to be inspected so as to be responsive to the state of the material to be detected of the object M to be inspected. Whether the sensor tag 1 is arranged on the surface of the object M to be inspected or arranged inside it depends on the type of material state of the object M to be inspected and the part of the object M to be detected. , preferred embodiments are different.
  • the sensor tag 1 is provided inside the inspection target object M for inspection. It is preferably arranged integrally with the material forming the target object M (see, for example, FIG. 16B described later).
  • the sensor tag 1 may be embedded inside the inspection target object M so as to be mixed with the material constituting the inspection target object M in the process of forming the inspection target object M, or may be embedded in the inspection target object M. It may be embedded inside the object to be inspected M so as to be sandwiched between the materials constituting M. In such a configuration, the entire sensor tag 1 may be embedded inside the object M to be inspected, or only a part of the configuration (for example, only the resonator 1a) may be embedded inside the object M to be inspected. may be embedded in
  • the sensor tag 1 is arranged on the surface of the object M to be inspected by, for example, affixing method or coating method. may be
  • the sensor tags 1 are arranged at regular intervals in the inspection target object M (see, for example, FIG. 2). As a result, it is possible to suppress a situation in which the reflected wave intensity when reading the reflected wave spectrum by the reader 2 changes greatly for each position of the detection target due to the difference in the existence density of the sensor tags 1 in the inspection target object M. can be done.
  • the sensor tags 1 are arranged in the inspection target object M with the resonators 1a oriented in the same direction (see FIG. 2, for example). As a result, it is possible to prevent the high-sensitivity direction from being different with respect to the polarization direction of the electromagnetic wave for each inspection target position Ma.
  • sensor tags 1 having different resonance frequencies for each inspection target position Ma may be used. As a result, the distinguishability of each inspection target position Ma in the inspection target object M can be enhanced.
  • FIG. 10 is a diagram showing an example of another arrangement mode of the sensor tag 1 in the inspection target object M viewed from the reader 2 side.
  • the sensor tag 1 has a plurality of types of resonators 1a having different resonance frequencies for each position Ma to be inspected (that is, a small area in the object M to be inspected). is preferably provided.
  • FIG. 10 shows a mode in which two types of sensor tags 1X and 1Y having resonators 1a with mutually different resonance frequencies are arranged at each inspection target position Ma in the inspection target object M.
  • the high-sensitivity band of the state of the material to be detected may be restricted to a narrow band.
  • multiple types of sensor tags 1X and 1Y are arranged for each inspection target position Ma, and the multiple types of sensor tags 1X and 1Y are each provided with a high sensitivity band for the state of the material to be detected. material state can be detected.
  • the sensor tags 1X and 1Y are used for detecting the temperature inside the object M to be inspected, the sensor tag 1X having a high sensitivity band to a temperature of around 30° C. and the sensor tag 1Y having a high sensitivity band to a temperature of around 50° C.
  • the plurality of types of sensor tags 1X and 1Y may share the isolation layer 1b and the back reflector 1c, and may differ only in the configuration of the resonator 1a (that is, the resonator length).
  • [Modification 1 of sensor tag 1] 11A is a diagram showing the configuration of the sensor tag 1 according to Modification 1.
  • FIG. 11B is a diagram illustrating a mechanism for detecting a state using the sensor tag 1 according to Modification 1.
  • the sensor tag 1 shown in FIG. 11A has a configuration in which a conversion unit 1d is added to the sensor tag 1 shown in FIG.
  • the conversion unit 1d is made of a material that responds to a specific material condition of the object M to be inspected (that is, the material condition to be detected).
  • the conversion unit 1d is arranged in contact with the resonator 1a, and changes the electromagnetic wave reflection characteristics of the resonator 1a by changing the physical properties of the conversion unit 1d. That is, the sensor tag 1 is configured such that the change in the physical properties of the conversion portion 1d is linked to the change in the material state of the object M to be inspected.
  • the conversion unit 1d is made of a material that changes at least one of the dielectric constant, the dielectric loss tangent (tan ⁇ ), and the conductivity in accordance with changes in the specific material state of the inspection object M to which the conversion unit 1d is sensitive. be done.
  • the conversion unit 1d changes the dielectric constant, dielectric loss tangent, or electrical conductivity of the region adjacent to the resonator 1a through the change in its own dielectric constant, dielectric loss tangent, or electrical conductivity. is changed to change the electromagnetic wave reflection characteristic change of the resonator 1a.
  • a change in the dielectric constant and dielectric loss tangent of the region adjacent to the resonator 1a induces a change in the resonance frequency of the resonator 1a due to the short wavelength effect, and a change in conductivity in the region adjacent to the resonator 1a. This induces a change in the peak intensity of the resonance peak when the resonator 1a resonates.
  • the conversion unit 1d when it is desired to detect the strain generated inside the inspection target object M by the state detection system U, the conversion unit 1d is selectively made of A material that reacts and changes physical properties is used. If the state detection system U is to detect the composition of the constituent material of the object M to be inspected, the conversion unit 1d may be a material whose physical properties change in response to the composition of the constituent material of the object M to be inspected. is used.
  • the material of the conversion portion 1d includes, for example, a liquid crystal material (e.g., nematic liquid crystal, cholesteric liquid crystal), a phase transition material (e.g., wax, microcapsule, phenanthrene), or polymerized or crosslinked material in response to heat or light. , irritant irreversibly reactive materials that decompose, etc. may be used. These materials can effectively cause a change in the dielectric constant of the conversion section 1d due to a change in the state of the surrounding environment.
  • a liquid crystal material e.g., nematic liquid crystal, cholesteric liquid crystal
  • a phase transition material e.g., wax, microcapsule, phenanthrene
  • polymerized or crosslinked material in response to heat or light.
  • irritant irreversibly reactive materials that decompose, etc. may be used. These materials can effectively cause a change in the dielectric constant of the conversion section 1d due to a change in the state of the surrounding environment.
  • the material of the conversion portion 1d for example, a semiconductor doped with an active point (a substance that converts a semiconductor into a conductor in response to a change in the external environment, such as a copper complex that adsorbs gas molecules), an anisotropic conductive material, or the like.
  • an active point a substance that converts a semiconductor into a conductor in response to a change in the external environment, such as a copper complex that adsorbs gas molecules
  • an anisotropic conductive material or the like.
  • a conductor doped with a metal having a different ionization tendency than the conductor forming the resonator may be used. These materials can effectively cause a change in conductivity of the conversion portion 1d due to a change in the state of the surrounding environment.
  • the conversion section 1d is arranged integrally with the resonator 1a, for example, and in this embodiment, the conversion section 1d is arranged so as to entirely cover the resonator 1 (that is, the strip conductor). .
  • the conversion portion 1d may be located at a position where at least a part of the conversion portion 1d is in contact with the resonator 1a and a change in the electromagnetic wave reflection characteristics of the resonator 1a can be induced.
  • the conversion section 1d may be provided inside the isolation layer 1b or may be provided on the side of the resonator 1a.
  • the converter 1d changes the electromagnetic wave reflection characteristic of the resonator 1a (that is, changes the reflected wave spectrum), so that the reader 2 selectively detects the specific material state of the inspection target object M. allow it to be captured.
  • FIG. 12A is a diagram showing the configuration of the sensor tag 1 according to Modification 2.
  • FIG. 12A is a diagram showing the configuration of the sensor tag 1 according to Modification 2.
  • FIG. 12A is a diagram showing the configuration of the sensor tag 1 according to Modification 2.
  • FIG. FIG. 12B is a modification of the sensor tag 1 shown in FIG. 12A, and shows a configuration in which the sensor tag 1 shown in FIG. 12A is provided with a conversion section 1d.
  • the sensor tag 1 according to Modification 2 is composed of an electromagnetic wave reflector 1e and a slot-type resonator 1a formed in the electromagnetic wave reflector 1e.
  • the electromagnetic wave reflector 1e is made of a plate-like, sheet-like, film-like, or foil-like conductive material such as aluminum or copper.
  • the electromagnetic wave reflector 1e has a rectangular slot formed by cutting out a part of a solid conductor material, and the slot forms a resonator 1a. This resonator 1a typically resonates when the length of the slot corresponds to approximately ⁇ /2 of the wavelength of the irradiated electromagnetic wave.
  • the principle of detecting the material state of the object M to be inspected in the sensor tag 1 according to Modification 2 is the same as that of the sensor tag 1 shown in FIG. That is, the sensor tag 1 according to Modification 2 is configured such that the change in the state of at least one of the resonator 1a and the electromagnetic wave reflector 1e is linked to the change in the material state of the object M to be inspected.
  • the sensor tag 1 according to Modification 2 changes its own electromagnetic wave reflection characteristics based on, for example, changes in the dielectric constant of an inspection target object M (not shown) arranged on the base of the resonator 1a, and performs inspection.
  • the material state of the target object M is detected.
  • a conversion unit 1d may be provided as shown in FIG. 12B.
  • modified examples of the sensor tag 1 include a mode using a ring-shaped or U-shaped resonator 1a.
  • a mode using a ring-shaped or U-shaped resonator 1a when it is desired to avoid the directional dependence of the sensitivity of the sensor tag 1 (the polarization direction of the electromagnetic wave and the direction of change in the material state of the object M to be inspected), it is preferable to use the ring-shaped resonator 1a.
  • the reader 2 when acquiring a reflected wave spectrum from the sensor tag 1, the reader 2 is arranged so as to be directly facing the inspection object M (that is, the sensor tag 1) at a distance of several centimeters to several meters. Then, the reader 2 transmits an electromagnetic wave to each inspection target position Ma where the sensor tag 1 in the inspection target object M is arranged, receives a reflected wave from each inspection target position Ma, and receives a reflected wave from each inspection target position Ma. Acquire the reflected wave spectrum at the position Ma.
  • FIG. 13 is a diagram showing an example of the configuration of the reader 2 and the analysis device 3.
  • the reader 2 includes a transmitter 21, a receiver 22, and a controller 23.
  • the transmission unit 21 includes, for example, a transmission antenna (eg, phased array antenna), an oscillator, and the like.
  • the transmitter 21 transmits, for example, sinusoidal electromagnetic waves having peak intensity at a single frequency. Then, the transmission unit 21 temporally changes the transmission frequency of the electromagnetic wave transmitted from the transmission antenna, and sweeps the frequency within a preset predetermined frequency band.
  • the transmission unit 21, for example, within the frequency band (range of 3.1 GHz to 3 THz) of the UWB band, millimeter wave band or sub-millimeter wave band, for example, every bandwidth of 500 MHz or less, preferably every 10 MHz bandwidth A frequency sweep is performed while changing the transmission frequency in a pattern.
  • the frequency band of the electromagnetic wave transmitted by the transmitter 1 is set so as to include the resonance frequency of the resonator 1a of the sensor tag 1.
  • the transmitting unit 21 may temporarily collectively irradiate electromagnetic waves having a specific intensity profile in a predetermined frequency band (ie, impulse method).
  • the transmission unit 21 temporally sequentially changes the transmission direction of the electromagnetic wave so as to scan the inspection target area of the inspection target object M.
  • the electromagnetic wave scanning method by the transmission unit 21 is arbitrary, for example, the transmission unit 21 raster scans the inspection target object M by electronic scanning using a phased array antenna. That is, the transmission unit 21 changes the transmission direction of the electromagnetic wave to be transmitted while sweeping the frequency of the electromagnetic wave to be transmitted so that the reflected wave spectrum of each inspection target position Ma of the inspection target object M can be obtained.
  • the receiving unit 22 includes, for example, a receiving antenna (for example, a phased array antenna) and a received signal processing circuit that detects the intensity and phase of the reflected wave based on the received signal of the reflected wave acquired by the receiving antenna. be done. Then, the receiving unit 22 receives the reflected wave from the inspection target object M (that is, the sensor tag 1) generated when the transmitting unit 21 transmits the electromagnetic wave with the receiving antenna, and the received signal processing circuit receives the reflected wave. A received wave signal is received and processed to generate a reflected wave spectrum of the inspection target object M from the intensity of the reflected wave detected at each transmission frequency of the electromagnetic wave.
  • a receiving antenna for example, a phased array antenna
  • a received signal processing circuit that detects the intensity and phase of the reflected wave based on the received signal of the reflected wave acquired by the receiving antenna. be done. Then, the receiving unit 22 receives the reflected wave from the inspection target object M (that is, the sensor tag 1) generated when the transmitting unit 21 transmits the electromagnetic wave
  • the receiving unit 22 temporally sequentially changes the receiving direction of the reflected wave so as to correspond to the scanning position (that is, the electromagnetic wave transmitting direction) by the transmitting unit 21 .
  • a scanning method in the receiving direction by the receiving unit 22 for example, electronic scanning using a phased array antenna is used as in the case of the transmitting unit 21.
  • FIG. the receiving unit 22 acquires the reflected wave spectrum (frequency spectrum) of each inspection target position Ma of the inspection target object M.
  • the signal processing circuits of the transmitting section 21 and the receiving section 22 may be integrally configured by a vector network analyzer.
  • the control unit 23 is a microcomputer including, for example, a CPU (Central Processing Unit), ROM (Read Only Memory), RAM (Random Access Memory), etc., and controls the reader 2 in an integrated manner.
  • the control unit 23 may cause the transmission unit 21 and the reception unit 22 to execute the above-described processing at predetermined time intervals in order to sequentially monitor the material state of the object M to be detected.
  • the transmission unit 21 and the reception unit 22 may be caused to execute the above-described processing in response to the reflected wave spectrum acquisition command.
  • the reader 2 may have a camera in order to confirm the location of the object M to be inspected where the electromagnetic wave scanning has been performed by the transmitting unit 21 and the receiving unit 22. good.
  • the analysis device 3 includes a material state estimation unit 31 that estimates the material state of the inspection target object M, and an image display unit 32 that displays an image of the distribution of the material state of the inspection target object M estimated by the material state estimation unit 31. .
  • FIG. 14 is a diagram illustrating an example of a method of estimating the material state of the inspection target object M by the analysis device 3 (material state estimating unit 31).
  • FIG. 14 shows the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the object M to be inspected.
  • the reflected wave spectrum acquired at the current time has a frequency shift of about 0.2 GHz from the previously acquired reflected wave spectrum. , suggesting that an abnormal condition has occurred.
  • the material state estimation unit 31 acquires the reflected wave spectrum of the inspection target object M (that is, the reflected wave spectrum characterized by the electromagnetic wave reflection characteristics of the sensor tag 1) from the reader 2, and obtains the reflected wave spectrum Based on this, the material state of the object M to be inspected is estimated. At this time, the material state estimating unit 31 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the object M to be inspected, and compares them. The state of materials in the object M to be inspected at the current time (for example, change from normal state to abnormal state) is estimated.
  • the electromagnetic wave reflection characteristic itself of the sensor tag 1 may change due to the state of materials other than the detection target of the inspection target object M (for example, the sensor tag 1 may Even with a configuration that detects the pressure state, the electromagnetic wave reflection characteristics of the sensor tag 1 may change under the influence of the temperature in the object M to be inspected).
  • the reflected wave spectrum acquired by the reader 2 also includes reflected wave components from the inspection target object M itself and reflected wave components from surrounding objects of the inspection target object M. And since these are affected by various factors of the surrounding environment (for example, temperature, humidity, light intensity, magnetic field, etc.), even if the material state of the object M to be detected is the same, the reader 2 The acquired reflected wave spectrum varies depending on the surrounding environment.
  • the method of estimating the state of the material of the object M to be detected by collating it with the data of the reference pattern prepared in advance may lack accuracy.
  • the material state estimating unit 31 compares the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the inspection target object M, thereby estimating the inspection target object M Estimate the state of the material inside (see FIG. 14). For example, the material state estimation unit 31 estimates whether or not the material state in the inspection object M has changed from a normal state to an abnormal state.
  • the abnormal state of the material state in the object M to be inspected means, for example, a state in which corrosion occurs in the object M to be inspected, or a state in which a constituent material in the object M to be inspected is worn or peeled off. means.
  • the material state estimation unit 31 preferably compares the "reflected wave spectrum acquired at the current time” with the "reflected wave spectrum acquired during the execution of the previous inspection".
  • the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the inspection object M are superimposed on these reflected wave spectra. It is based on the technical idea that the noise components to be inspected are also substantially the same, so that the same pattern is obtained when the material state of the inspection object M does not change. In other words, if the reflected wave spectrum acquired at the current time is different from the reflected wave spectrum acquired previously at the same position in the inspection target object M, an abnormal state has occurred at that position. means that
  • the identity analysis by the material state estimator 31 is typically performed by analyzing the electromagnetic wave reflection characteristics (resonance It evaluates the identity of peak positions and/or peak intensities).
  • the material state estimation unit 31 preferably performs analysis based on pattern matching such as template matching and trained learner models (for example, SVM (Support Vector Machine) and neural networks). .
  • pattern matching such as template matching and trained learner models (for example, SVM (Support Vector Machine) and neural networks).
  • the identity of the two reflected wave spectra is determined based on the amount of frequency shift of the entire pattern of the reflected wave spectrum and the amount of change in the peak intensity of the entire vicinity of the resonance peak in the reflected wave spectrum. to judge.
  • the material state estimation unit 31 acquires the reflected wave spectrum from each inspection target position Ma of the inspection target object M from the reader 2, each time, the data related to the reflected wave spectrum is preferably associated with the acquisition position and the acquisition time and stored in a storage unit (for example, the ROM of the analysis device 3 (not shown)). Then, the material state estimating unit 31 determines the identity of the positions of the two reflected wave spectra obtained at different timings, for example, from the pattern of each inspection target position Ma in the inspection target object M obtained during electromagnetic wave scanning. You may
  • the material state estimation unit 31 refers to discrimination reference data stored in advance in a storage unit (for example, the ROM of the analysis device 3 not shown) to determine the difference between the two reflected wave spectra. If (for example, the amount of frequency shift or the amount of change in peak intensity) is equal to or greater than a threshold, it may be determined that the inspection target position Ma is abnormal.
  • discrimination reference data can be obtained in advance through experiments or simulations, for example. Further, such discrimination reference data may be stored in association with the degree of change in the state of the material according to the magnitude of the difference.
  • the material state estimation unit 31 extracts the electromagnetic wave reflection characteristics of the sensor tag 1 from these reflected wave spectra.
  • identity analysis may be performed using the electromagnetic wave reflection characteristics of the extracted sensor tag 1 .
  • the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the inspection object M, A method of estimating the material state of the object M (for example, normal and abnormal material states) is adopted by comparing these with each other.
  • the "reflected wave spectrum acquired before” referred to here refers to a time period close enough to the inspection target object M that the surrounding environment does not change, with reference to the "reflected wave spectrum acquired at the current time”. It means the reflected wave spectrum acquired during the previous periodical inspection, and does not necessarily have to be the reflected wave spectrum acquired during the previous periodical inspection.
  • the process of estimating the material state of the inspection object M is repeatedly executed, for example, when the inspection object M is installed. preferably.
  • the material state estimating unit 31 compares the frequency spectrum acquired at the current time with the frequency spectrum acquired before that, and thus the material state of the inspection target object at the current time from the previous timing. Estimate temporal changes. Then, the material condition estimating unit 31 preferably updates the material condition in the object to be inspected at the current time by accumulating the temporal changes. This makes it possible to estimate the material state more accurately.
  • the image display unit 32 converts the distribution of the material state of the object to be inspected M obtained by the analysis into, for example, an image pattern (hereinafter referred to as a “material distribution image”), and displays it on the display unit (for example, the analysis device 3 LCD display).
  • the image display unit 32 associates the type of the material state of the detection target with the image color using a conversion table prepared in advance, and for each inspection target position Ma of the inspection target object M, displays the inspection target position Ma.
  • a material distribution image is generated by changing the image color according to the material state.
  • the image generation unit 32 converts the material distribution image into an electromagnetic wave reflection intensity image (for example, an image expressing the reflection intensity for each scanning position in gray scale) obtained when the inspection target object M is scanned with electromagnetic waves.
  • an electromagnetic wave reflection intensity image for example, an image expressing the reflection intensity for each scanning position in gray scale
  • a superimposed display image is generated and the display image is output to the display unit (see FIG. 16A).
  • the image generator 32 may generate a display image in which the material distribution image is superimposed on the camera image instead of the electromagnetic wave reflection intensity image.
  • FIG. 15A and 15B are diagrams for explaining an example of the operation of the state detection system U.
  • FIG. Note that the processing of the flowchart of FIG. 15 is processing that is executed, for example, triggered by an inspection command start command from the user.
  • step S10 the reader 2 transmits electromagnetic waves to irradiate the inspection target area of the inspection target object M (that is, the area in which the plurality of sensor tags 1 are dispersedly arranged), and the electromagnetic wave is reflected from the inspection target object M. receive waves. Then, the reader 2 switches the electromagnetic wave transmission direction of the transmission unit 21 and the electromagnetic wave reception direction of the reception unit 22, and scans the inspection target area of the inspection target object M with electromagnetic waves. At this time, the reader 2 sweeps the transmission frequency at each scanning position, and obtains the reflected wave spectrum from the inspection object M in a predetermined frequency band. The reader 2 then transmits the reflected wave spectrum obtained at each scanning position of the object M to be inspected to the analysis device 3 via a communication line.
  • step S20 the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the inspection target object M, and compares them. Estimate the material state of the inspection object M at the current time. Then, the analysis device 3 performs the same processing for each inspection target position Ma of the inspection target object M, and sequentially estimates the material state of all the inspection target positions Ma.
  • step S30 the analysis device 3 generates a material distribution image of the inspection object M using the information regarding the material state of each inspection object position Ma in the inspection object M obtained in step S20. Then, the analysis device 3 generates a display image (for example, see FIG. 16A) in which the material distribution image of the inspection object M is superimposed on the electromagnetic wave reflection intensity image obtained when the inspection object M is scanned with electromagnetic waves. Then, the display image is output to the display unit.
  • a display image for example, see FIG. 16A
  • the state detection system U provides the user with information on the state of the materials in the object M to be inspected.
  • FIG. 16A is a diagram illustrating an implementation of the state detection system U according to the first embodiment.
  • the left diagram in FIG. 16A shows a camera image of reinforced concrete (inspection target object M of the present embodiment) photographed by the reader 2, and the right diagram in FIG. 16A is based on the reflected wave spectrum acquired by the reader 2.
  • FIG. 16B shows an electromagnetic wave reflection intensity image of the reinforced concrete in the left diagram of FIG. Note that FIG. 16A shows a mode in which the material state distribution image of reinforced concrete is displayed in a form superimposed on the electromagnetic wave reflection intensity image (the right diagram in FIG. 16A).
  • the reinforced concrete used in buildings is not permanent and deteriorates as the reinforcing steel corrodes.
  • the composition of reinforced concrete is adjusted so that it becomes basic at the construction stage, but this is the process of corrosion, in the following manner: concrete neutralization ⁇ reinforcing bar corrosion (rust) ⁇ concrete cracking ⁇ concrete peeling ⁇ reinforcing bar breaking ⁇ collapse Corrosion progresses.
  • rust rust
  • concrete cracking ⁇ concrete peeling
  • reinforcing bar breaking ⁇ collapse Corrosion progresses.
  • the industry dislikes this inspection because it involves the risk of drilling a hole and is time-consuming, there is currently no means of non-destructive inspection.
  • the state detection system U is applied to detecting the state of corrosion of reinforcing bars in the reinforced concrete (hereinafter referred to as "reinforced concrete M1") using reinforced concrete as the inspection target object M. It is
  • FIG. 16B is a diagram showing an example of how the sensor tag 1 is arranged in the reinforced concrete M1.
  • FIG. 16C is a diagram showing an example of changes over time in the peak intensity of the resonance peak of the sensor tag 1 due to corrosion of reinforcing bars in the reinforced concrete M1.
  • the sensor tags 1 are embedded in, for example, a plurality of positions of the reinforced concrete M1 (for example, 28 inspection target positions Ma shown as black areas in the left diagram of FIG. 16A). be.
  • the sensor tag 1 according to the present embodiment is formed by embedding a resonator 1a (here, a strip conductor) at a position about 3 to 10 mm away from the reinforcing bars in the concrete when the reinforced concrete M1 is constructed.
  • the sensor tag 1 according to this embodiment has the sensor structure shown in FIG. and a rear reflector 1c made of a reinforcing bar of M1 (see FIG. 16B).
  • the corroded portion M1Q when the corroded portion M1Q occurs in the reinforcing bar of the reinforced concrete M1, the corroded portion M1Q causes the conductivity of the reinforcing bar (that is, the back reflector 1c) to decrease. This causes an electromagnetic wave reflection characteristic that reduces the resonance peak of the resonator 1a (see FIG. 16C).
  • a plurality of such sensor tags 1 are embedded in the concrete along the extending direction of the reinforcing bars, for example, when the reinforced concrete M1 is constructed.
  • the sensor tag 1 is attached to the surface of the reinforced concrete M1, it is difficult for the sensor tag 1 to detect the state of corrosion of the reinforcing bars inside the reinforced concrete M1. Therefore, in the state detection system U according to the present embodiment, the sensor tag 1 is arranged inside the reinforced concrete M1.
  • the reader 2 acquires the reflected wave spectrum of each inspection target position Ma of the reinforced concrete M1 while scanning the inspection target area of the reinforced concrete M1 with electromagnetic waves.
  • the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position in the reinforced concrete M1, and compares them to obtain the shape of the reinforced concrete M1 at the current time. Presence or absence of occurrence of corroded state of rebar. Then, the analysis device 3 estimates the presence or absence of the corroded state of reinforcing bars for all inspection target positions Ma of the reinforced concrete M1, and generates a material state distribution image (see the right diagram of FIG. 16A) from the estimation results.
  • the state detection system U makes it possible to grasp the presence or absence of the corroded portion M1Q in the reinforced concrete M1 and the location of the corroded portion M1Q.
  • the analysis device 3 may store in advance corrosion degree determination reference data that associates the degree of decrease in the peak intensity of the resonance peak of the sensor tag 1 with the degree of corrosion of the reinforcement.
  • the analysis device 3 for example, refers to the corrosion degree determination reference data, and from the difference in peak intensity between the reflected wave spectrum acquired before that and the reflected wave spectrum acquired at the current time, determines the determination target The degree of corrosion of the rebar at the location may be estimated.
  • the analysis device 3 preferably estimates the current state of the reinforced concrete M1 by, for example, accumulating temporal changes in the degree of corrosion of reinforcing bars obtained at each inspection timing. This makes it possible to more accurately estimate the state of corrosion of reinforcing bars in reinforced concrete.
  • the state detection system U can monitor the state of corrosion of reinforcing bars in the reinforced concrete M1 and reliably perform maintenance and management of the reinforced concrete M1.
  • FIG. 17A is a diagram illustrating an embodiment of the state detection system U according to the second embodiment.
  • the state detection system U uses a winding core around which a sheet product is wound as an object to be inspected M, and the distribution of pressure applied to the winding core (hereinafter referred to as "winding core M2"). It is used for detecting
  • FIG. 17B is a diagram showing an example of changes in reflected wave spectrum of the sensor tag 1 observed when pressure unevenness occurs in the winding core M2.
  • 17C is a diagram showing an example of a material state distribution image generated by the analysis device 3.
  • the sensor tag 1 is attached to the outer peripheral surface of the winding core M2, for example, before the sheet-shaped product Mf is wound, and the sheet-shaped product Mf is attached to the winding core M2. At each winding timing, the pressure applied from the sheet product Mf to the winding core M2 is detected.
  • the sensor tag 1 for example, one having a conversion portion 1d made of an anisotropic conductive film whose conductivity changes with pressure is used (see FIG. 11A).
  • the sensor tag 1 converts changes in pressure applied to the core M2 into changes in its own electromagnetic wave reflection characteristics. That is, the sensor tag 1 changes the conductivity of the conversion portion 1d in accordance with the change in the pressure applied to the winding core M2, thereby changing the peak intensity of the resonance peak in the reflected wave spectrum.
  • such sensor tags 1 are arranged over the entire area of the winding core M2 (see, for example, the left diagram of FIG. 17C) to detect the pressure distribution applied to the winding core M2. .
  • the reader 2 is arranged, for example, on the inner peripheral surface side of the winding core M2, and at each timing when the sheet-like product Mf is wound around the winding core M2, the reader 2 detects each inspection target position Ma of the winding core M2. An electromagnetic wave is transmitted and received, and a reflected wave spectrum of each inspection target position Ma of the winding core M2 is acquired.
  • the analysis device 3 estimates the pressure distribution applied to each inspection target position Ma of the winding core M2 at each timing when the sheet product Mf is wound around the winding core M2. At this time, the analysis device 3, for example, at the same position in the core M2, refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that time, and compares them. The state of pressure applied to the winding core M2 at each inspection target position Ma at the current time is estimated.
  • the analysis device 3 adjusts the curvature of the rollers in the upstream process, etc., and eliminates the pressure unevenness applied to the winding core M2. At this time, the analysis device 3 determines at which position in the winding core M2 the reflected wave spectrum has changed to an abnormal state, and whether the change in the reflected wave spectrum is in the increasing direction of the peak intensity of the resonance peak or in the decreasing direction. and the degree of the change, the curvature and the like of the rollers in the upstream process are adjusted.
  • the state detection system U can suppress pressure unevenness occurring in the winding core M2.
  • the state detection system U by detecting the pressure itself applied to the core M2, it is possible to adjust the curvature of the rollers in the upstream process. It is possible to eliminate unevenness in the pressure applied to the core M2 at an earlier stage than the timing of detecting the appearance change due to deterioration in quality. Therefore, according to the state detection system U according to the present embodiment, it is possible to reliably avoid deterioration of product quality due to uneven pressure applied to the winding core M2.
  • the configuration of the state detection system U for detecting the distribution of pressure applied to the winding core M2 has been described above, but the configuration of the state detection system U for detecting the distribution of the pressure applied to the core M2 has been described.
  • the configuration of the state detection system U for detecting the pressure distribution can also be realized with a configuration similar to that described above.
  • FIG. 18A is a diagram illustrating an embodiment of the state detection system U according to the third embodiment.
  • the state detection system U is applied to the application of detecting the distribution of wear of a tire (hereinafter referred to as "tire M3") using a vehicle tire as an inspection target object M. ing.
  • FIG. 18B is a diagram showing an example of changes in reflected wave spectrum of the sensor tag 1 observed when the tire M3 wears.
  • FIG. 18C is a diagram showing an example of a material state distribution image generated by the analysis device 3.
  • the sensor tag 1 is embedded, for example, inside the tire M3 (for example, the area between the tread and the belt that constitute the tire M3). Then, when the tread of the tire M3 wears, the sensor tag 1 transforms a part of the underlying portion of the sensor tag 1 into an air layer, and the sensor tag 1 resonates in its own reflected wave spectrum so as to respond to the state in which the dielectric constant is lowered. Change the position of the peak to the high frequency side (see FIG. 18B).
  • the sensor tag 1 is arranged, for example, over the entire circumference of the tire M3, and the wear state of the entire surface of the tire M3 is sequentially monitored.
  • the reader 2 is disposed at a position facing the tire M3 inside the vehicle, separated from the tread outer peripheral surface of the tire M3 by about 30 cm, and reads the sensor tag of the tire M3 at each timing while the vehicle is running.
  • An electromagnetic wave is transmitted to one existing position, and the reflected wave spectrum of each of the plurality of inspection target positions Ma of the tire M3 is acquired.
  • the reader 2 may be arranged under the road surface in order to deal with a vehicle not equipped with a reader.
  • the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position of the tire M3, and compares them to obtain the relevant spectrum of the tire M3 at the current time. Estimate the wear state at the location. Then, the analysis device 3 estimates the wear state for each inspection target position Ma in the tire M3, and outputs the monitoring result as a material state distribution image (see FIG. 18C).
  • the analysis device 3 determines whether a reflected wave spectrum indicating an abnormal state is found among the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the tire M3.
  • the degree of wear at that location may be determined based on the amount of frequency shift in the wave spectrum.
  • the state detection system U can reliably detect wear occurring in the tire M3 with the configuration described above.
  • FIG. 19A is a diagram illustrating an embodiment of the state detection system U according to the fourth embodiment.
  • belt conveyors are known to break due to deterioration over time when operated in a poor environment. Once broken, it takes a long time to replace, resulting in downtime loss.
  • Typical causes of breakage of such belt conveyors include peeling of the belts at the belt joints that connect the belts, and cracks that occur in the belt main body.
  • the state detection system U uses a belt conveyor as an object to be inspected M to detect peeling and cracking of the belt that occurs in the belt conveyor (hereinafter referred to as "belt conveyor M4"). It is used for detecting
  • FIG. 19B shows changes in the reflected wave spectrum of the sensor tag 1 observed when the belt is peeled off at the belt joint portion ML1 of the belt conveyor M4 and when a crack occurs at the belt main body portion ML2 of the belt conveyor M4. It is a figure which shows an example.
  • the sensor tag 1 is interposed between one belt and the other belt at the belt junction ML1 of the belt conveyor M4, as shown in the enlarged view of FIG. , and is arranged on the back side of the belt main body ML2 of the belt conveyor M4.
  • the belt joint ML1 of the belt conveyor M4 separates from the sensor tag 1 disposed at the belt joint ML1 of the belt conveyor M4, part of the periphery of the sensor tag 1 changes to an air layer, and the underlying portion of the sensor tag 1 changes. Detects that the dielectric constant of That is, the sensor tag 1 disposed at the belt joint portion ML1 of the belt conveyor M4 detects the separation state of the belt joint portion ML1 as a change in the peak position of the resonance peak in the reflected wave spectrum (here, shifting to the high frequency side). information related to the occurrence of is passed to the reader 2.
  • the sensor tag 1 disposed on the belt main body ML2 of the belt conveyor M4 changes part of the periphery of the sensor tag 1 into an air layer, and the underlying portion of the sensor tag 1 changes. Detects a decrease in dielectric constant. That is, the sensor tag 1 disposed on the belt main body ML2 of the belt conveyor M4 detects cracks in the belt main body ML2 as changes in the peak position of the resonance peak in the reflected wave spectrum (here, shifting to the high frequency side). Information related to the occurrence is passed to the reader 2 .
  • the sensor tag 1 arranged at the belt joint portion ML1 and the sensor tag 1 arranged at the belt main body portion ML2 have different resonance frequencies. Sensor tag 1 is adopted. In other words, this allows the reader 2 to detect both the state of the belt joint portion ML1 and the state of the belt main body portion ML2 by transmitting and receiving electromagnetic waves once.
  • such sensor tags 1 are arranged over the entire circumference of the belt conveyor M4.
  • the reader 2 is arranged, for example, several meters away from the belt conveyor M4, transmits an electromagnetic wave to the existing position of the sensor tag 1 in the belt conveyor M4, and detects the reflected wave spectrum of each inspection target position Ma of the belt conveyor M4. to get Then, the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position of the belt conveyor M4, and compares them to obtain the belt at the current time. The peeling state and crack state at the relevant position of the conveyor M4 are estimated. Then, the analysis device 3 estimates the delamination state and the crack state for each inspection target position Ma on the belt conveyor M4, and outputs the monitoring result as a material state distribution image.
  • the state detection system U can reliably perform maintenance management of the belt conveyor M4 and prevent damage to the belt conveyor M4.
  • FIG. 20A is a diagram illustrating an embodiment of the state detection system U according to the fifth embodiment.
  • the state detection system U detects the distribution of the water content in the soil (hereinafter referred to as "soil M5") in the greenhouse as the inspection target object M. It is applied for the purpose of
  • FIG. 20B is a diagram showing an example of an arrangement mode of sensor tags 1 for monitoring the moisture content distribution of soil M5.
  • FIG. 20C shows the reflected wave spectrum of the sensor tag 1 observed when there is sufficient moisture in the soil M5, and the sensor tag 1 observed when there is no moisture in the soil M5 (dry state). is a diagram showing a reflected wave spectrum of .
  • the sensor tag 1 is arranged on or inside the soil M5, for example.
  • the sensor tag 1 according to the present embodiment has a structure having a converter 1d that affects the resonance state of the resonator 1a according to changes in the moisture content of the soil M5 (see FIG. 12B). .
  • the conversion unit 1d collects water in the soil M5, and causes a change in the peak position and/or the peak intensity of the resonance peak of the resonator 1a according to the change in the water content of the soil M5.
  • the conversion unit 1d collects the water in the soil M5, suppresses the flow of the resonance current around the resonator 1a, and suppresses the resonance of the resonator 1a. It works to reduce peaks.
  • the conversion unit 1d may be configured to cause a change in dielectric constant around the resonator 1a in accordance with a change in the moisture content of the soil M5. That is, the sensor tag 1 according to this embodiment detects changes in the water content of the soil M5 as changes in the peak position and/or the peak intensity of the resonance peak.
  • the sensor tag 1 is arranged at each position (inspection target position Ma) where a plant to be observed exists in the entire area of the soil M5. to detect the moisture content of
  • the reader 2 transmits an electromagnetic wave to the position where the sensor tag 1 exists in the soil M5, and acquires the reflected wave spectrum of each inspection target position Ma in the soil M5. Further, the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position of the soil M5, and compares them to obtain the soil M5 at the current time. Estimate the moisture content at that location in the Then, the analysis device 3 estimates the moisture content for each inspection target position Ma in the soil M5, and outputs the monitoring result as a material state distribution image.
  • water is selectively supplied to the dry place to suppress root rot of the plant.
  • the state detection system U can monitor the occurrence of unevenness in the amount of moisture in the soil M5 in the house.
  • FIG. 21A is a diagram illustrating an embodiment of the state detection system U according to the sixth embodiment.
  • Example 5 we focused on the importance of detecting the amount of moisture in the soil inside the greenhouse, but in smart agriculture, in addition to detecting the amount of moisture in the soil, we are also interested in monitoring the temperature distribution. In particular, there is a demand for monitoring the temperature of the leaves and crop surfaces because the quality of crops deteriorates when excessive heat is applied to crops before harvest due to sunlight.
  • the state detection system U is used to detect the distribution of temperature in a plant (hereinafter referred to as "plant M6") in a greenhouse as an object to be inspected M. applied to
  • FIG. 21B is a diagram showing an example of changes in the reflected wave spectrum of the sensor tag 1 according to changes in the temperature of the plant M6.
  • the sensor tag 1 is attached, for example, to the surface of the fruit in the plant M6.
  • the sensor structure shown in FIG. 12B is applied to the sensor tag 1 according to the present embodiment, and the conversion unit 1d responds to the temperature of the fruit to cause a change in dielectric constant around the resonator 1a.
  • FIG. 21B shows changes in the reflected wave spectrum when the paraffin-impregnated nonwoven fabric that melts at 60 degrees is used as the converting portion 1d. The position of the resonance peak of the resonator 1a changes when the frequency exceeds the degree.
  • the sensor tag 1 is arranged for each fruit (inspection target position Ma) in the plant M6 to detect the temperature of each fruit in the plant M6.
  • the reader 2 transmits electromagnetic waves to each inspection target position Ma in the plant M6, and acquires the reflected wave spectrum of each inspection target position Ma in the plant M6.
  • the analysis device 3 refers to the reflected wave spectrum acquired at the current time and the reflected wave spectrum acquired before that at the same position of the plant M, and compares them. The temperature at the position of the plant M6 at the current time is estimated. Then, the analysis device 3 estimates the temperature for each inspection target position Ma in the plant M6, and outputs the monitoring result as a material state distribution image.
  • a heat shielding curtain is selectively applied to the inspection target position Ma. work may be performed.
  • the state detection system U can monitor the occurrence of temperature unevenness in the plant M6.
  • the state detection system U is an electromagnetic wave responsive material disposed in a state of being responsive to the state of the material to be detected of the object to be inspected, and changing its own electromagnetic wave reflection characteristics according to the state of the material; a reader that transmits an electromagnetic wave from the outside of the object to be inspected to a position where the electromagnetic wave responsive material is arranged in the object to be inspected, receives the reflected wave, and acquires the spectrum of the reflected wave; By referring to and comparing the spectrum obtained at the same position in the object to be inspected at a first time and the spectrum obtained at a second time before the first time, the an analysis device for estimating the state of the material in the object to be inspected at a first time; Prepare.
  • the state detection system U it is possible to detect changes over time in the material state of the object to be inspected by a simple method that does not require power supply.
  • an abnormality occurring in a part of the inspection object M for example, the inspection object M occurrence of internal corrosion
  • the chipless sensor tag 1 is shown as an example of the electromagnetic wave responsive material arranged in the object M to be inspected.
  • the state detection system U if the electromagnetic wave response material responds to the state of the material to be detected of the object to be inspected and changes its own electromagnetic wave reflection characteristics according to the state of the material, the chipless Unlike the sensor tag 1, it may not have a resonator 1a.
  • the state detection system it is possible to detect temporal changes in the material state of the object to be inspected using a simpler method.
  • U state detection system 1 Chipless sensor tag (electromagnetic wave response material) 1a resonator 1b isolation layer 1c rear reflector 1d converter 1e electromagnetic wave reflector 2 reader 21 transmitter 22 receiver 23 controller 3 analyzer 31 material state estimator 32 image display M (M1, M2, M3, M4 , M5, M6) Object to be inspected Ma Position to be inspected

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PCT/JP2022/010038 2021-05-10 2022-03-08 状態検出システム WO2022239427A1 (ja)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005523494A (ja) * 2002-04-03 2005-08-04 エスアールアイ インターナショナル 構造的健全性モニタリングのためのセンサデバイス
US20160061751A1 (en) * 2014-08-28 2016-03-03 William N. Carr Wireless Impedance Spectrometer
JP2016166776A (ja) * 2015-03-09 2016-09-15 富士通株式会社 読み取り装置、読み取りシステム、及び読み取り方法
WO2020090904A1 (ja) * 2018-11-02 2020-05-07 コニカミノルタ株式会社 検出システム、及びリーダー
WO2021039662A1 (ja) * 2019-08-26 2021-03-04 コニカミノルタ株式会社 タグ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005523494A (ja) * 2002-04-03 2005-08-04 エスアールアイ インターナショナル 構造的健全性モニタリングのためのセンサデバイス
US20160061751A1 (en) * 2014-08-28 2016-03-03 William N. Carr Wireless Impedance Spectrometer
JP2016166776A (ja) * 2015-03-09 2016-09-15 富士通株式会社 読み取り装置、読み取りシステム、及び読み取り方法
WO2020090904A1 (ja) * 2018-11-02 2020-05-07 コニカミノルタ株式会社 検出システム、及びリーダー
WO2021039662A1 (ja) * 2019-08-26 2021-03-04 コニカミノルタ株式会社 タグ

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