WO2022237099A1

WO2022237099A1 - Equivalent circuit parameter generation method and apparatus, and multiplexer de-loading method and apparatus

Info

Publication number: WO2022237099A1
Application number: PCT/CN2021/129847
Authority: WO
Inventors: 章秀银; 苏华峰; 徐金旭; 吴琳玲
Original assignee: 华南理工大学
Priority date: 2021-05-08
Filing date: 2021-11-10
Publication date: 2022-11-17
Also published as: CN112986747A; CN112986747B

Abstract

The present application relates to an equivalent circuit parameter generation method and apparatus, a multiplexer de-loading method and apparatus, an electronic device, and a computer readable storage medium. The equivalent circuit parameter generation method comprises: performing de-phasing loading processing on original scattering parameters of a filter to be debugged of a multiplexer to be debugged to obtain target scattering parameters; converting the target scattering parameters to obtain corresponding original admittance parameters; performing de-loading processing of a loading parameter of a common cavity on each parameter in the original admittance parameters, and obtaining target admittance parameters according to the parameters subjected to de-loading processing; extracting a pole in the target admittance parameters and a residue corresponding to the pole; and generating equivalent circuit parameters according to the pole and the residue corresponding to the pole.

Description

Method for generating equivalent circuit parameters, method and device for unloading multiplexer

Cross References to Related Applications

This application claims the priority of the Chinese application titled "Equivalent Circuit Parameter Generation Method, Multiplexer Unloading Method, Device" and application number 2021104979270 submitted on May 08, 2021, the disclosure of which is fully incorporated by reference incorporated in this application.

technical field

The present application relates to the technical field of microwave device testing, in particular to a method, device, computer equipment and storage medium for generating equivalent circuit parameters, and a multiplexer unloading method, device, computer equipment and storage medium.

Background technique

With the deployment of 5G (5th generation mobile/wireless/cellular system, the fifth generation mobile communication system), the wireless communication frequency band has added multiple 5G frequency bands on the basis of the original 2G/3G/4G frequency band. Since the frequency bands of 2G/3G/4G base stations have already occupied the golden position, the space resources reserved for 5G base stations are relatively tight. In order to solve the above problems, multiplexers can be used to connect systems in different frequency bands together. The multiplexer is composed of multiple different frequency filters, which can generate sufficient out-of-band suppression and improve the isolation between different frequency systems, thereby improving the communication capacity of different frequency band base station systems, and finally integrating different frequency band systems together.

In the production process of multiplexers, debugging has always been a difficult point in the production process of multiplexers. Usually, a multi-port network analyzer can be used to read the S-parameter (scattering parameter) matrix of all filters in the multiplexer; based on the S-parameter matrix extraction, the equivalent circuit parameters are obtained; according to the difference guidance between the equivalent circuit parameters and the standard parameters The manipulator performs automatic debugging of the multiplexer.

Contents of the invention

The present application provides a method, device, computer equipment and storage medium for generating equivalent circuit parameters capable of greatly reducing the debugging cost of a multiplexer, and a multiplexer unloading method, device, computer equipment and storage medium.

In the first aspect, the embodiment of the present application provides a method for generating equivalent circuit parameters, the method including:

Dephasing and loading the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters;

converting the target scattering parameters to obtain corresponding original admittance parameters;

performing unloading processing on the original admittance parameters of the loading parameters of the common cavity to obtain target admittance parameters;

extracting poles in the target admittance parameter and residues corresponding to the poles;

Equivalent circuit parameters are generated from the poles and residues corresponding to the poles.

In the second aspect, the embodiment of the present application provides a multiplexer unloading method, the method comprising:

Perform dephasing and loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to obtain target scattering parameters;

Unloading the loading parameters of the common cavity is performed on the original admittance parameters to obtain target admittance parameters.

In a third aspect, the embodiment of the present application provides a device for generating equivalent circuit parameters, the device comprising:

The dephasing loading module is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters;

A conversion module, configured to convert the target scattering parameters to obtain corresponding original admittance parameters;

an unloading module, configured to unload the loading parameters of the common cavity on the original admittance parameters to obtain target admittance parameters;

An extraction module, configured to extract poles in the target admittance parameters and residues corresponding to the poles;

A parameter generating module, configured to generate equivalent circuit parameters according to the pole and the residue corresponding to the pole.

In the fourth aspect, the embodiment of the present application provides a multiplexer unloading device, the device includes:

The dephasing loading module is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to obtain target scattering parameters;

The unloading module is configured to unload the loading parameters of the common cavity on the original admittance parameters to obtain target admittance parameters.

In a fifth aspect, an embodiment of the present application provides an electronic device, including a memory and a processor, the memory stores a computer program, and when the processor executes the computer program, any of the above-mentioned first aspect and/or second aspect is implemented. The steps of a method described in one embodiment.

In the sixth aspect, the embodiment of the present application provides a non-volatile computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, any one of the above-mentioned first aspect and/or second aspect can be realized. The steps of the method described in the embodiment.

The details of one or more embodiments of the application are set forth in the accompanying drawings and the description below. Other features, objects and advantages of the present application will be apparent from the description, drawings and claims.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of this specification or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some implementations described in this specification. Those skilled in the art can also obtain other drawings based on these drawings without any creative effort.

Fig. 1 is the application environment diagram of the generation method of equivalent circuit parameter in an embodiment;

Fig. 2 is a schematic flow chart of a method for generating equivalent circuit parameters in an embodiment;

Fig. 3 is a schematic diagram of an equivalent circuit diagram of a multiplexer in an embodiment;

FIG. 4 is a schematic flow chart of a method for generating equivalent circuit parameters in another embodiment;

Fig. 5 is a schematic diagram of the topological structure of a duplexer in an embodiment;

Fig. 6a is a comparative schematic diagram of equivalent circuit parameters and standard circuit parameters obtained by an analytical method in one embodiment;

Fig. 6b is a comparative schematic diagram of equivalent circuit parameters and standard circuit parameters obtained by an analytical method in one embodiment;

Fig. 6c is a comparative schematic diagram of equivalent circuit parameters obtained by vector fitting method and standard circuit parameters in one embodiment;

Figure 6d is a schematic diagram of comparison between equivalent circuit parameters and standard circuit parameters obtained by the vector fitting method in one embodiment;

FIG. 7 is a structural block diagram of a device for generating equivalent circuit parameters in an embodiment;

Fig. 8 is a structural block diagram of a multiplexer unloading device in an embodiment.

Detailed ways

In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

Currently, multiport network analyzers are commonly used for multiplexer debugging. However, due to the high cost of multi-port network analyzers, cost constraints have prevented the above debugging methods from being used in mass products so far.

The method for generating equivalent circuit parameters provided in this application can be applied to the application environment shown in FIG. 1 . Wherein, the electronic device 110 is connected to the filter to be debugged in the multiplexer 120 to be debugged. The electronic device 110 may be realized by one device or a combination of multiple electronic devices, for example, by a network analyzer with computing capability alone, or by a combination of a network analyzer and a terminal. Wherein, the terminal can be, but not limited to, various personal computers, notebook computers, smart phones, and tablet computers. The electronic device 110 may be pre-deployed with dephasing logic, conversion logic, multiplexer unloading logic, pole and corresponding residue extraction logic, and equivalent parameter generation logic, but is not limited to. Specifically, the electronic device 110 reads the original scattering parameters (hereinafter referred to as S parameters for short) of the filter to be tuned in the multiplexer 120 to be tuned. S parameters are dephased and loaded by dephasing loading logic to obtain target scattering parameters (hereinafter referred to as S' parameters); S' parameters are converted by conversion logic to obtain corresponding original admittance parameters (hereinafter referred to as Y parameter); carry out the unloading processing of the loading parameter of the common cavity to the Y parameter through the multiplexer unloading logic, and obtain the target admittance parameter (hereinafter referred to as the Y' parameter); extract the pole in the Y' parameter and the Residues corresponding to poles; equivalent circuit parameters are generated from poles and residues corresponding to poles by equivalent parameter generation logic.

Furthermore, the method for generating equivalent circuit parameters provided in this application can also be applied to other microwave devices, for example, filter antennas and the like. Applied to other microwave devices and filters, the difference between the two is only the application scenarios and application objects, but the realization principle and implementation process are similar.

In one embodiment, as shown in FIG. 2 , a method for generating equivalent circuit parameters is provided. The application of the method to the electronic device in FIG. 1 is used as an example for illustration, including the following steps:

Step S210, performing dephasing and loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters.

Wherein, the multiplexer to be debugged refers to a multiplexer to be debugged. As shown in Figure 3, the multiplexer has a single input port and multiple output ports, and is composed of multiple filters of different frequencies. These filters are combined to ensure that they are not loaded on each other, and the outputs are highly isolated. The filter to be debugged may be any filter in the multiplexer to be debugged.

The S parameters may refer to scattering parameters read from the filter to be debugged without any modification. Scattering parameters are parameters related to incident wave, transmitted wave and reflected wave, which can be read by vector network analyzer. In the following embodiments, a two-port network is taken as an example for illustration. In a two-port network, S parameters include S ₁₁ parameters, S ₁₂ parameters, S ₂₁ parameters, and S ₂₂ parameters. Among them, the _S11 parameter is the reflection coefficient of the input terminal when the output terminal (port 2) is in the matching state; the _S22 parameter is the reflection coefficient of the output terminal when the input terminal (port 1) is in the matching state; the _S12 parameter is when the input terminal is matched , the reverse transmission coefficient from the output terminal to the input terminal; the S ₂₁ parameter is the forward transmission coefficient from the input terminal to the output terminal when the output terminal is matched.

Specifically, in this embodiment, the overall test of the multiplexer to be debugged in the traditional technology is adjusted to an individual test of each filter in the multiplexer to be debugged. For the currently tested filter (ie, the filter to be debugged), a two-port network analyzer can be used to read the S parameters of the filter to be debugged. Since the S parameters include the dispersion effect of the input and output high-order modes and the phase shift of the test system and the port itself, it is easy to cause the reference phase plane to be inconsistent with the ideal circuit model of the filter, so the S parameters can be dephased and loaded. The dephasing loading processing logic is pre-deployed in the electronic device. The dephasing loading processing logic can be implemented, but not limited to, by polynomial fitting of the phase shift and time delay of the actual loading physical structure, and iterative adjustment of the phase shift by an optimization function. After the electronic device obtains the S parameter, the S parameter is dephased and loaded through the dephasing loading processing logic to obtain the S' parameter.

Step S220, converting target scattering parameters to obtain corresponding original admittance parameters.

Wherein, the Y parameter may refer to the admittance parameter without any modification. The admittance parameter is a parameter commonly used in microwave systems to describe networks. In a two-port network, Y parameters include Y ₁₁ parameters, Y ₂₂ parameters, Y ₁₂ parameters, and Y ₂₁ parameters. Among them, the _Y11 parameter is the actuation point admittance parameter of the input terminal when the output terminal is short-circuited; the _Y22 parameter is the actuation point admittance parameter of the output terminal when the input terminal is short-circuited; the _Y12 parameter is the transfer of the input terminal to the output terminal when the input terminal is short-circuited Admittance parameter; Y ₂₁ parameter is the transfer admittance parameter of the output terminal to the input terminal when the output terminal is short-circuited. Specifically, the electronic device converts the S' parameter through a pre-deployed conversion logic to obtain a corresponding Y parameter.

Step S230 , performing unloading processing of loading parameters of the common cavity on each parameter in the original admittance parameters, and obtaining target admittance parameters according to each parameter after unloading processing.

Wherein, the loading parameters of the public cavity may refer to relevant parameters generated by other parts of the multiplexer to be debugged except the filter to be debugged, for example, the coupling parameters of the public resonant cavity (hereinafter referred to as the common cavity), the resonance frequency offset Loading admittance parameters of the filter to be debugged, etc.

Specifically, since the Y parameter includes the loading parameter part of the common cavity of the multiplexer, each parameter in the original admittance parameter can be deloaded by the multiplexer of the common cavity type, and the Y' parameter can be restored, that is, the target Admittance parameter. Electronic devices are pre-deployed with multiplexers to load the logic. The deloading logic of the multiplexer can be realized based on any obtained network parameter, for example, based on any one of admittance parameters, scattering parameters, impedance parameters and the like. The electronic device performs multiplexer deloading processing on the Y parameter through the multiplexer deloading logic to obtain the Y' parameter.

Step S240, extracting poles and residues corresponding to poles in the target admittance parameter.

Specifically, the electronic device can extract the pole of each admittance parameter in the Y' parameter and the residue corresponding to the pole based on any method such as a vector fitting method or a self-defined analytical method. When using the vector fitting method, the order used for fitting is the same as the filter order.

Step S250, generating equivalent circuit parameters according to the poles and residues corresponding to the poles.

Specifically, the electronic device constructs a prototype coupling matrix of the filter to be debugged according to the pole corresponding to each admittance parameter in the Y' parameter and the residue corresponding to the pole. Based on the specific topology of the multiplexer to be debugged, the corresponding coupling matrix is constructed by using the elimination method, so as to generate the equivalent circuit parameters of the filter to be debugged.

Further, the electronic device can acquire standard circuit parameters of the filter to be debugged. Wherein, the standard circuit parameters may refer to theoretical circuit parameters of the filter to be debugged. Calculate the difference between the equivalent circuit parameter and the standard circuit parameter, and instruct the debugging device (such as a manipulator) to automatically debug the multiplexer to be debugged according to the difference.

Further, multiple filters are included in the multiplexer to be debugged. The electronic device can generate equivalent circuit parameters corresponding to each filter by referring to the content described in the above steps S210 to S250, and automatically debug the multiplexer to be debugged according to the equivalent circuit parameters corresponding to each filter.

In the generation method of the above-mentioned equivalent circuit parameters, a multi-port network analyzer will be used to debug the entire worker to be debugged, and the filter in the worker to be debugged will be adjusted to a separate test. Since the filter is a dual-port component, the low A low-cost network analyzer can read the original scattering parameters, which can greatly reduce the cost of debugging the multiplexer. By pre-deploying multiple algorithms such as dephasing loading algorithm and multiplexer unloading algorithm, the equivalent circuit parameters of the filter to be debugged are constructed based on multiple algorithms, and the automatic debugging of the multiplexer to be debugged is guided based on the equivalent circuit parameters. On the premise of not affecting the debugging accuracy of the multiplexer, the efficiency of multiplexer debugging can also be improved.

In one embodiment, step S230, performing unloading processing on the original admittance parameters of the loading parameters of the common cavity to obtain the target admittance parameters, including: determining the loading parameters of the common cavity in the multiplexer to be debugged according to the original admittance parameters ; Perform unloading processing on the original admittance parameters to obtain the target admittance parameters.

Among them, the Y parameters include the first original instigating point admittance parameter (hereinafter referred to as _Y11 parameter), the second original instigating point admittance parameter (hereinafter referred to as _Y22 parameter), the first original transfer admittance parameter (hereinafter referred to as Y ₁₂ parameter), the second original transfer admittance parameter (hereinafter referred to as Y ₂₁ parameter for short). The Y ₁₁ parameter, Y ₂₂ parameter, Y ₁₂ parameter, and Y ₂₁ parameter can be fitted by a vector fitting method.

Specifically, the deloading logic of the multiplexer can be implemented based on the specified admittance parameter in the Y parameter. The Y parameter is processed by the deloading logic of the multiplexer based on the specified admittance parameter to obtain the Y' parameter.

In some possible embodiments, the _Y11 parameter is used as an example to specify the admittance parameter. First, obtain a rational polynomial expression for the _Y11 parameter. Then, the loading parameters are calculated based on the rational polynomial expression of the _Y11 parameter.

Among them, the rational polynomial expression of the _Y11 parameter can be obtained based on a vector fitting algorithm:

Wherein, Y ₁₁ (s) is a rational polynomial expression of Y ₁₁ parameters; Y ₂₂ (s) is a rational polynomial expression of Y ₂₂ parameters; Y ₁₂ (s) is a rational polynomial expression of Y ₁₂ parameters; Y ₂₁ ( s) is the rational polynomial expression of Y ₂₁ parameter; F ₁₁ (s) is the numerator polynomial of Y ₁₁ (s); F ₂₂ (s) is the numerator polynomial of Y ₂₂ (s); F ₁₂ (s) is Y ₁₂ (s) numerator polynomial; F ₂₁ (s) is the numerator polynomial of Y ₂₁ (s); D(s) is the denominator polynomial of Y ₁₁ (s), Y ₂₂ (s), Y ₁₂ (s); a _{n -1} is the coefficient of F ₁₁ (s); b _n-1 is the coefficient of D(s).

In this embodiment, by pre-deploying the multiplexer unloading algorithm, the relevant parameters in the multiplexer common cavity are unloaded, so that the generated equivalent circuit parameters conform to the filter application scene, thereby improving the multiplexer debugging. accuracy.

In one embodiment, the loading parameters include the coupling parameters of the common cavity and the resonance frequency offset. In this case, the coupling parameters of the common cavity can be obtained by any one of the following formulas:

Among them, J is the coupling parameter of the public cavity; Y ₁₁ (s) is the rational polynomial expression of Y ₁₁ parameter; s=jω, ω is the normalized angular frequency; a _n-1 is the molecular polynomial expression of Y ₁₁ (s) coefficient of the highest power;

The resonant frequency offset can be obtained by the following formula:

Among them, b is the resonant frequency offset;

J is the coupling parameter of the common cavity.

In one embodiment, the unloading process of loading parameters is performed on the Y parameter to obtain the Y' parameter. Specifically, it can be realized by unloading the loading parameters on each admittance parameter in the Y parameter, that is:

Carry out the unloading processing of the loading parameters on the _Y11 parameter to obtain the admittance parameter of the first target driving point (hereinafter referred to as the _Y'11 parameter), and the loading of the filter to be debugged in the multiplexer to be debugged Admittance parameter (hereinafter will be referred to as Y ₀ parameter for short); Y ₁₂ parameter is carried out the unloading processing of loading parameter, obtains the first target transfer admittance parameter (hereinafter will be referred to as Y' ₁₂ parameter for short) and the second target transfer admittance parameters (hereinafter referred to as _Y'21 parameters for short); _Y22 parameters are subjected to unloading processing of loading parameters to obtain second target actuation point admittance parameters (hereinafter referred to as _Y'22 parameters for short).

The obtained Y' ₁₁ parameter, Y' ₁₂ parameter, Y' ₂₁ parameter, and Y' ₂₂ parameter are the matrix elements of the Y' parameter, and the Y' parameter can be generated according to these four admittance parameters, namely:

In this embodiment, each admittance parameter in the Y parameter is subjected to unloading processing of the loading parameters in the common cavity, so that the generated equivalent circuit parameters conform to the filter application scene, thereby improving the accuracy of multiplexer debugging .

In an embodiment, an implementation manner of multiplexer unloading processing is described. Carry out the unloading processing of loading parameters on the _Y11 parameter to obtain the _Y'11 parameter and _Y0 parameter, which can be realized by the following formula:

Among them, _Y'11 is the _Y'11 parameter; Y0 is the Y0 parameter; J is the coupling parameter of the public cavity; _Y11 is the _Y11 _parameter ; b is the resonance frequency offset; _s =jω, ω is the normalization Angular frequency;

Carry out the unloading processing of the loading parameters on the Y ₁₂ parameter to obtain the Y' ₁₂ parameter and Y' ₂₁ parameter, which can be realized by the following formula:

Wherein, _Y'12 is _Y'12 parameter; _Y'21 is _Y'21 parameter; _Y21 is _Y21 parameter.

Carry out the unloading processing of loading parameters to the Y ₂₂ parameter to obtain the Y' ₂₂ parameter, which can be realized by the following formula:

Wherein, _Y'22 is _Y'22 parameter; _Y12 is _Y12 parameter; _Y22 is _Y22 parameter.

In this embodiment, step S240, extracting the pole in the target admittance parameter and the residue corresponding to the pole can be realized by the following content:

Specifically, firstly, the _Y'12 parameter can be vector fitted by a vector fitting method to obtain the poles and residues corresponding to the _Y'12 parameter. where the residue is a column vector. Further, since the _Y'21 parameter is the same as the _Y'12 parameter, the poles and residues corresponding to the _Y'21 parameter are the same as the poles and residues corresponding to the _Y'12 parameter. The _Y'22 parameters are vector fitted by the vector fitting method, and the corresponding poles and residues of the _Y'22 parameters are obtained. where the residue is a column vector.

Then, a matrix is formed according to the pole corresponding to the _Y'12 parameter and the pole corresponding to the _Y'22 parameter, and the residue corresponding to the _Y'11 parameter is obtained based on the matrix. And the poles of the _Y'11 parameter are the same as the poles of the _Y'12 parameter. In specific implementation, the residue corresponding to the _Y'11 parameter can be obtained by the first preset formula:

[r]=[A][Y′ ₁₁ +Y ₀ ]

Among them, [r] is the residue corresponding to the pole of the _Y'11 parameter, which is a column vector; A is the matrix formed by the respective poles corresponding to the _Y'12 parameter and the _Y'22 parameter; _Y'11 is the _Y'11 parameter; Y ₀ is the Y ₀ parameter; [Y′ ₁₁ +Y ₀ ] is a column vector composed of the sampling points of the Y’ ₁₁ parameter and the Y ₀ parameter.

Further, after the poles and residues corresponding to the _Y'11 parameters are obtained by the first preset formula, the Y0 parameter can be obtained based on the first preset formula _:

Among them, J is the coupling parameter of the public cavity; s=jω, ω is the normalized angular frequency;

b is the resonant frequency offset.

In this embodiment, the pole and the residue corresponding to the pole are extracted from the Y' parameter by using the vector fitting method, which helps to speed up the efficiency of constructing the equivalent circuit parameters of the filter to be debugged, thereby saving time and cost.

In an embodiment, another implementation manner of multiplexer unloading is described. Perform the unloading process of loading parameters on the Y _11th parameter to obtain the Y' parameter and the Y ₀ parameter, which can be realized by the following formula:

Wherein, Y' ₁₁ is Y' ₁₁ parameters; Y ₀ is Y ₀ parameters; J is the coupling parameter of the public cavity; b is the resonance frequency offset;

F ₁₁ (s) is the numerator polynomial of the rational polynomial of Y ₁₁ parameters; D (s) is the denominator polynomial of the rational polynomial of Y ₁₁ parameters;

Wherein, Y' ₁₂ is Y' ₁₂ parameters; Y' ₂₁ is Y' ₂₁ parameters; F ₂₁ (s) is the numerator polynomial of the rational polynomial of Y ₂₁ parameters;

The unloading process of loading parameters for Y ₂₂ parameters can be realized by the following formula:

Among them, _Y'22 is _Y'22 parameter; M(s) is the molecular polynomial of Y11×Y22-Y12×Y21.

In this embodiment, the poles and the residues corresponding to the poles can be obtained through a self-defined analytical method:

Specifically, the residue expansion is performed on the _Y'11 parameter and the _Y0 parameter to obtain poles and residues corresponding to poles. Specifically, it can be realized by the following formula:

Wherein, s' _i is the zero point of F ₁₁ (s), and is the pole of Y' ₁₁ parameter; R' ₁₁ is Y' ₁₁ + Y ₀ corresponding to the residue of s'_i;Y' ₁₂ is Y' ₁₂ parameter ; K ₁₁ is a constant term;

Carry out residue expansion on the _Y'12 parameter to obtain poles and residues corresponding to poles. Specifically, it can be realized by the following formula:

Among them, s' _i is the zero point of F ₁₁ (s), and the pole of _Y'12 parameter; R'12 is the residue _of _Y'12 parameter corresponding to s' _i .

Further, since the _Y'21 parameter is the same as the _Y'12 parameter, the residue expansion of the _Y'21 parameter can also refer to the above formula. Since the _Y'12 parameter does not have a private pole after residue expansion, the order of the pole of the _Y'12 parameter can be set to be the same as the order of the filter to be debugged.

The _Y'22 parameter is processed through the second preset formula to obtain the pole and the residue corresponding to the pole. Specifically, it can be realized by the following formula:

Wherein, s' _i is the zero point of F ₁₁ (s), and is the pole of Y' ₂₂ parameter;

Y' ₂₂ parameters corresponding to the residue of s'_i; n is the order of residue expansion.

Further, after carrying out residue expansion on the _Y'11 parameter and _Y'22 parameter, the poles and corresponding _residues that do not belong to the _Y'12 parameter can be classified into the Y0 parameter, so as to obtain the _Y0 parameter expression.

In this embodiment, the pole and the residue corresponding to the pole are extracted from the Y' parameter through a self-defined analysis method, which helps to improve the accuracy of the equivalent circuit parameters of the filter to be debugged, thereby improving the multiplex The accuracy of the debugger.

In an embodiment, the electronic device may also generate the reconstructed scattering parameters of the filter to be debugged according to the equivalent circuit parameters, loading parameters, and loading admittance parameters of the filter to be debugged. The reconstructed scattering parameters are compared with the target scattering parameters to obtain the quality evaluation information of the equivalent circuit parameters. Based on the quality evaluation information, it is judged whether the quality of the equivalent circuit parameters is acceptable or not.

In this embodiment, by reconstructing the scattering parameters, use the reconstructed scattering parameters to judge whether the generated equivalent circuit parameters meet the requirements, and then debug the multiplexer to be debugged based on the equivalent circuit parameters if the requirements are met, which can be Provide guarantee for the accurate debugging of the multiplexer to be debugged.

In one embodiment, as shown in FIG. 4 , a method for generating equivalent circuit parameters is provided, and the method for generating equivalent circuit parameters is applied to a duplexer as an example for illustration. Fig. 5 exemplarily shows a topological structure diagram of a duplexer. The duplexer includes a TX filter and an RX filter, and the specific parameters can be:

TX filter:

Passband: 1925-1992MHz (MHz)

Order: 10

Number of transmitted zeros: 4

RX filter:

Passband: 1845.5-1915.5MHz

Order: 9

Number of transmitted zeros: 3

As shown in FIG. 4, the method for generating the equivalent circuit parameters of the duplexer may specifically be implemented through the following steps:

Step S402, using a two-port network analyzer to read and obtain the original scattering parameters of the duplexer to be debugged.

Specifically, first connect the filter to be debugged of the duplexer to be debugged to a two-port network analyzer. Read the S-parameters of the filter to be tested through a two-port network analyzer. When the two-port network analyzer reads the S-parameters of the filter to be tested, other filters in the duplexer to be debugged need to be connected to the load.

Step S404, performing dephasing and loading processing on the S parameters of the filter to be debugged to obtain the S' parameters.

Specifically, the S parameters of the filter port to be debugged are converted into complex numbers, and the vector fitting method is used to fit the S parameters, and the rational polynomial expressions of the S ₁₁ and S ₂₂ parameters are obtained. Among them, the vector fitting method is a method for rational polynomial fitting of S parameters in an iterative manner, and the output result is the zero and pole points of the rational polynomial corresponding to the fitted curve, which can be realized by the following formula:

Among them, s _i represents the pole; z _i represents the zero point; i=1,2.

If the fitting iteration does not converge, then increase the order on the basis of the order of the filter to be debugged, and re-iterate until it converges. The fitting result is output in zero-pole mode, and the increased order is no more than 2.

Then, the dynamic K-means clustering algorithm is used to classify the poles and zeros, and the poles and zeros introduced due to the port loading effect are identified. An algorithm for classifying and identifying the belonging relationship between categories. In this embodiment, the K-means clustering algorithm is improved to a dynamic K-means algorithm, and at the end of the algorithm, it is judged according to a preset threshold whether to merge between categories.

Specifically, pre-classification is performed according to K=3. Arrange the absolute values of the poles and zeros from small to large, and classify the poles and zeros with the largest absolute value into category a and category b respectively, and the remaining poles and zeros into category c. Calculate the cluster center of class a, the cluster center of class b and the cluster center of class c, where the cluster centers of class a and b are the absolute value of the largest zero-pole point and the absolute value of the second largest zero-pole point, The cluster center of class c is the average value of the remaining zero and pole points. Calculate the distance between each pole-zero point and the clustering center of the above three categories, and classify the pole-zero point into the category with the shortest distance, then perform K-Means clustering until convergence, and obtain the reclassified categories a, b and class c. Calculate the distance between each pole-zero point and the above-mentioned three types of clustering centers, which can be realized by the following formula:

Among them, D _ij is the distance from the i-th cluster center to the j-th cluster center; μ _i is the cluster center of the i-th class; μ _j is the cluster center of the j-th class.

Recalculate the cluster centers of class a, class b and class c; calculate the mutual distance between the recalculated cluster centers of the three classes. If the distance between any two cluster centers is less than the set threshold, they will be merged. Then, calculate the distance between the cluster centers of the merged classes and the retained cluster types and the passband center frequency. If the distance is greater than the preset threshold, it is judged that the pole-zero point under the cluster center is the pole-zero point introduced by the port loading effect.

Convert this pole-zero to a phase, which is removed by matrix operations. Assuming that the pole-zero points introduced due to the port loading effect are z _k and p _k , at this time:

Among them, z _k and p _k are the zero and pole of S _ii (i=1,2) respectively.

At this point, the loading phase of each port is:

Wherein, θ _i is the phase of each port; θ _i (s)=arg(α _i )/2, i=1,2,...,p.

Then, the S parameter can be dephased and loaded and eliminated by the following formula to obtain the S’ parameter:

[S']=[D][S][D]

Among them, [S] is the S parameter read by the two-port network analyzer, and [S′] is the S parameter after dephasing and loading.

Step S406, converting the S' parameter to obtain the corresponding Y parameter. Specifically, the Y parameter can be obtained by the following:

[Y]=([I]-[S])([I]+[S]) ^-1

Among them, [Y] is the Y parameter matrix; [I] is the identity matrix.

Step S408, determine the coupling parameters and resonance frequency offset of the common cavity in the duplexer to be debugged according to the _Y11 parameter.

Specifically, after obtaining the Y parameter, determine the Y ₁₁ parameter rational polynomial expression. According to the rational polynomial expression, the coupling parameters and resonance frequency offset of the common cavity are obtained. For a specific implementation manner, reference may be made to the foregoing embodiments, and no specific description is given here.

Step S410, according to the coupling parameters of the common cavity and the resonance frequency offset, the _Y11 parameter, _Y22 parameter, _Y12 parameter, and _Y21 parameter in the Y parameter are respectively demultiplexed and loaded to obtain the corresponding Y' ₁₁ parameters and Y ₀ parameters, Y' ₂₂ parameters, Y' ₁₂ parameters, Y' ₂₁ parameters. For a specific implementation manner, reference may be made to the foregoing embodiments, and no specific description is given here.

Step S412, based on the vector fitting method, or any one of self-defined analytical methods to obtain the poles and residues corresponding to each admittance parameter in the Y' parameter. For a specific implementation manner, reference may be made to the foregoing embodiments, and no specific description is given here.

Step S414, place the poles and corresponding residues in the prototype coupling matrix according to the filter synthesis theory, and then use the Givens (orthogonal transformation) elimination method to eliminate redundant elements in the matrix until the coupling matrix corresponding to the design topology is obtained , so as to generate the equivalent circuit parameters of the filter to be debugged. Figures 6a-6b exemplarily show the comparison schematic diagram of the equivalent circuit parameters (coupling coefficient extraction value) and standard circuit parameters (coupling coefficient theoretical value) of the TX filter and RX filter obtained by the self-defined analytical method; Fig. 6c-6d exemplarily show the comparison diagrams of the equivalent circuit parameters (coupling coefficient extraction values) and standard circuit parameters (coupling coefficient theoretical values) of the TX filter and RX filter obtained by the vector fitting method.

Step S416, obtaining the difference between the equivalent circuit parameter of the filter to be debugged and the standard circuit parameter, and instructing the manipulator to debug the duplexer to be debugged according to the difference.

In one embodiment, a multiplexer unloading method is provided, and the application of the method to the electronic device in FIG. 1 is used as an example for illustration, including the following steps:

Regarding the specific implementation manners of steps S210 to S230, reference may be made to the foregoing embodiments, and no specific description is given here.

In the above multiplexer unloading method, since the debugging of the entire to-be-debugged worker is adjusted to the separate debugging of the filters in the to-be-debugged worker, the multiplexers are removed from the common cavity by pre-deploying the multiplexer unloading algorithm. The relevant parameters of the filter are unloaded, so that the generated equivalent circuit parameters conform to the filter application scene, thereby improving the accuracy of multiplexer debugging.

It should be understood that although the various steps in the above flow chart are displayed sequentially according to the arrows, these steps are not necessarily executed sequentially in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowchart above may include multiple steps or stages, these steps or stages are not necessarily executed at the same time, but may be executed at different times, the execution order of these steps or stages It does not necessarily have to be performed sequentially, but can be performed alternately or alternately with other steps or at least a part of steps or stages in other steps.

Based on the description of the above-mentioned embodiment of the method for generating equivalent circuit parameters, the present disclosure also provides a device for generating equivalent circuit parameters; based on the above-mentioned description of the embodiment of the multiplexer unloading method, the present disclosure also provides multiple Worker unloading device. The device may include a system (including a distributed system), software (application), module, component, server, client, etc. using the methods described in the embodiments of this specification combined with necessary implementation hardware. Based on the same innovative idea, the devices in one or more embodiments provided by the embodiments of the present disclosure are described in the following embodiments. Since the implementation of the device to solve the problem is similar to the method, the implementation of the specific device in the embodiment of this specification can refer to the implementation of the aforementioned method, and the repetition will not be repeated. As used below, the term "unit" or "module" may be a combination of software and/or hardware that realizes a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementations in hardware, or a combination of software and hardware are also possible and contemplated.

In one embodiment, as shown in FIG. 7 , an equivalent circuit parameter generation device 700 is provided, including: a dephasing loading module 702, a conversion module 704, an unloading module 706, an extraction module 708, and a parameter generation module 710 ,in:

The dephasing loading module 702 is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain the target scattering parameters; the conversion module 704 is used to convert the target scattering parameters to obtain corresponding original guides Acceptance parameters; unloading module 706, used to unload the original admittance parameters of the loading parameters of the public cavity to obtain target admittance parameters; extraction module 708, used to extract the poles in the target admittance parameters and correspond to the poles The residue of the parameter generating module 710, configured to generate equivalent circuit parameters according to the pole and the residue corresponding to the pole.

In one embodiment, the raw scattering parameters are parameters read by a two-port network analyzer.

In one embodiment, the unloading module 706 includes: a loading parameter determination unit, configured to determine the loading parameters of the common cavity in the multiplexer to be debugged according to the original admittance parameters; an unloading unit, used to perform the original admittance parameter The unloading processing of the loading parameters obtains the target admittance parameters.

In one embodiment, the original admittance parameters include the first original instigating point admittance parameters; the loading parameter determination unit is used to determine the rational polynomial expression of the first original instigating point admittance parameter; generate the loading parameter according to the rational polynomial expression .

In one embodiment, the loading parameters include the coupling parameters of the common cavity and the resonance frequency offset; the loading parameter determination unit is used to obtain the coupling parameters of the public cavity by any one of the following formulas:

Among them, J is the coupling parameter of the public cavity; Y ₁₁ (s) is the rational polynomial expression of the admittance parameter of the first original driving point; s=jω, ω is the normalized angular frequency; a _n-1 is Y ₁₁ ( s) the coefficient of the highest power of the numerator polynomial;

The resonant frequency offset is obtained by the following formula:

Among them, b is the resonant frequency offset;

J is the coupling parameter of the common cavity.

In one embodiment, the original admittance parameter also includes a first original transfer admittance parameter, a second original transfer admittance parameter, and a second original actuation point admittance parameter; the unloading unit includes: a first unloading subunit, It is used to unload the loading parameters of the admittance parameters of the first original driving point to obtain the admittance parameters of the first target driving point and the loading admittance parameters of the filters not to be debugged in the multiplexer to be debugged ; The second decarrier subunit is used to perform unloading processing on the first original transfer admittance parameter of the loading parameter to obtain the first target transfer admittance parameter and the second target transfer admittance parameter; the third decarrier subunit, It is used to perform unloading processing of loading parameters on the second original instigating point admittance parameters to obtain the second target instigating point admittance parameters; the target admittance parameter generating unit is used to obtain the second target instigating point admittance parameters according to the first target instigating point admittance parameters, the first The target transfer admittance parameter, the second target transfer admittance parameter, and the second target instigating point admittance parameter generate a target admittance parameter.

In one embodiment, the first unloading subunit is used to obtain the admittance parameter and the loading admittance parameter of the first target driving point by the following formula:

Among them, Y' ₁₁ is the admittance parameter of the first target driving point; Y ₀ is the loading admittance parameter; J is the coupling parameter of the public cavity; Y ₁₁ is the admittance parameter of the first original driving point; b is the resonance frequency offset ; s=jω, ω is the normalized angular frequency;

The second decarrier unit is used to obtain the first target transfer admittance parameter and the second target transfer admittance parameter by the following formula:

Wherein, Y' ₁₂ is the first target transfer admittance parameter; Y' ₂₁ is the second target transfer admittance parameter; Y ₂₁ is the second original transfer admittance parameter;

The third decarrier unit is used to obtain the admittance parameter of the second target driving point through the following formula:

Among them, _Y'22 is the admittance parameter of the second target driving point; _Y12 is the admittance parameter of the first original transfer; _Y22 is the admittance parameter of the second original driving point.

In one embodiment, the first unloading subunit is configured to obtain the admittance parameter of the first target driving point and the admittance parameter of the loading through the following formula:

Wherein, _Y'11 is the admittance parameter of the first target instigating point _; Y0 is the loading admittance parameter; J is the coupling parameter of the public cavity; b is the resonance frequency offset;

F ₁₁ (s) is the numerator polynomial of the admittance parameter of the first original driving point; D(s) is the denominator polynomial of the admittance parameter of the first original driving point;

Wherein, Y' ₁₂ is the first target transfer admittance parameter; Y' ₂₁ is the second target transfer admittance parameter; F ₂₁ (s) is the molecular polynomial of the second original transfer admittance parameter;

Wherein, Y′ ₂₂ is the admittance parameter of the second target driving point; M(s) is the numerator polynomial of Y ₁₁ Y ₂₂ -Y ₁₂ Y ₂₁ .

In one embodiment, the extraction module 708 includes: a first extraction unit, configured to perform vector fitting on the first target transfer admittance parameter to obtain the pole and residue corresponding to the first target transfer admittance parameter; the second extraction The unit is used to carry out vector fitting to the second target instigating point admittance parameters to obtain the poles and residues corresponding to the second target instigating point admittance parameters; the third extraction unit is used to transfer the admittance parameters corresponding to the first target , and the pole corresponding to the admittance parameter of the second target driving point, determine the residue corresponding to the admittance parameter of the first target driving point.

In one embodiment, the third extraction unit is used to process the admittance parameter of the first target driving point by the following formula to obtain the pole and the residue corresponding to the pole:

[r]=[A][Y′ ₁₁ +Y ₀ ]

Wherein, [r] is the residue corresponding to the pole of the first target instigating point admittance parameter, which is a column vector; A is formed by the respective poles corresponding to the first target transfer admittance parameter and the second target instigating point admittance parameter matrix; Y′ ₁₁ is the admittance parameter of the first target driving point; Y ₀ is the loading admittance parameter; [Y′ ₁₁ +Y ₀ ] is the composition of the sampling points of the first target driving point admittance parameter and the loading admittance parameter column vector of .

In one embodiment, the extraction module 708 includes: a fourth extraction unit, configured to perform residue expansion on the admittance parameter of the first target driving point and the loading admittance parameter to obtain the pole corresponding to the admittance parameter of the first target driving point and residue; the fifth extraction unit is used to carry out residue expansion to the first target transfer admittance parameter, and obtain the pole and residue corresponding to the first target transfer admittance parameter and the second target transfer admittance parameter; the sixth extraction The unit is configured to process the second target actuation point admittance parameter through a second preset formula to obtain the pole and residue corresponding to the second target actuation point admittance parameter.

In one embodiment, the sixth extraction unit is configured to process the admittance parameter of the second target actuation point by the following formula:

Wherein, Y' ₂₂ is the second target instigating point admittance parameter; s' ₁ is the pole of Y'₂₂;

Be the residue corresponding to s′ _i ; the order of n residue expansion;

In one embodiment, the device 700 further includes: a reconstruction module, configured to generate the reconstructed scattering parameters of the filter to be debugged according to the equivalent circuit parameters, loading parameters, and loading admittance parameters of the filter to be debugged; a comparison module, using In order to compare the reconstructed scattering parameters with the target scattering parameters, the quality evaluation information of the equivalent circuit parameters is obtained.

In one embodiment, as shown in FIG. 8 , a multiplexer unloading device 800 is provided, including: a dephase loading module 802, a conversion module 804, and an unloading module 806, wherein:

The dephasing loading module 802 is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain the target scattering parameters; the conversion module 804 is used to convert the target scattering parameters to obtain corresponding original guides The admittance parameter; the unloading module 806, configured to unload the original admittance parameter of the loading parameter of the public cavity to obtain the target admittance parameter.

For specific limitations and beneficial effects of the device for generating equivalent circuit parameters, reference may be made to the limitations and beneficial effects of the method for generating equivalent circuit parameters above, which will not be repeated here. For the specific limitations of the multiplexer unloading device, refer to the above-mentioned limitations and beneficial effects of the multiplexer unloading method, which will not be repeated here. Each module in the above-mentioned generating device of equivalent circuit parameters and multiplexer unloading device can be fully or partially realized by software, hardware and a combination thereof. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, and can also be stored in the memory of the computer device in the form of software, so that the processor can invoke and execute the corresponding operations of the above-mentioned modules.

In one embodiment, an electronic device is provided. The electronic device includes a processor, a memory, a communication interface, a display screen, an input device, etc. connected through a system bus. Wherein, the processor of the electronic device is used to provide calculation and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface of the electronic device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be realized through WIFI, an operator network, NFC (Near Field Communication) or other technologies. When the computer program is executed by the processor, a method for generating equivalent circuit parameters, and/or, a multiplexer unloading method is implemented. The display screen of the electronic device may be a liquid crystal display screen or an electronic ink display screen, and the input device of the electronic device may be a touch layer covered on the display screen, or a button, a trackball or a touch pad provided on the housing of the electronic device , and can also be an external keyboard, touchpad, or mouse.

Those skilled in the art can understand that the structure of the electronic device described above is only a part of the structure related to the solution of this application, and does not constitute a limitation on the electronic device to which the solution of this application is applied. The specific electronic device may include a comparison diagram More or fewer components than those shown, or combinations of certain components, or different arrangements of components.

In one embodiment, an electronic device is provided, including a memory and a processor, where a computer program is stored in the memory, and the processor implements the method for generating equivalent circuit parameters described in any of the above embodiments when executing the computer program.

In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the method for generating equivalent circuit parameters described in any of the above-mentioned embodiments is implemented.

In one embodiment, an electronic device is provided, including a memory and a processor, where a computer program is stored in the memory, and the processor implements the multiplexer unloading method described in any of the above embodiments when executing the computer program.

In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the multiplexer unloading method described in any one of the above-mentioned embodiments is implemented.

Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be implemented through computer programs to instruct related hardware, and the computer programs can be stored in a non-volatile computer-readable memory In the medium, when the computer program is executed, it may include the processes of the embodiments of the above-mentioned methods. Wherein, any references to memory, storage, database or other media used in the various embodiments provided in the present application may include at least one of non-volatile memory and volatile memory. Non-volatile memory may include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

The technical features of the above embodiments can be combined arbitrarily. To make the description concise, all possible combinations of the technical features in the above embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, they should be It is considered to be within the range described in this specification.

The above-mentioned embodiments only represent several implementation modes of the present application, and the description thereof is relatively specific and detailed, but it should not be construed as limiting the scope of the patent for the invention. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the scope of protection of the patent application should be based on the appended claims.

Claims

A method for generating equivalent circuit parameters, comprising:

Dephasing and loading the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters;

converting the target scattering parameters to obtain corresponding original admittance parameters;

Carrying out unloading processing of the loading parameters of the common cavity for each parameter in the original admittance parameters, and obtaining target admittance parameters according to each of the parameters after unloading processing;

extracting poles in the target admittance parameter and residues corresponding to the poles;

Equivalent circuit parameters are generated from the poles and residues corresponding to the poles.
The method according to claim 1, wherein the original scattering parameters are parameters read by a two-port network analyzer.
The method according to claim 2, wherein, the unloading process of the loading parameters of the common cavity is performed on each parameter in the original admittance parameters, and the target guide is obtained according to each of the parameters after the unloading process. Nano parameters, including:

determining the loading parameters of the common cavity in the multiplexer to be debugged according to the original admittance parameters;

Perform unloading processing on the loading parameters for each parameter in the original admittance parameters, and obtain the target admittance parameter according to each parameter after unloading processing.
The method according to claim 3, wherein said raw admittance parameters comprise first raw instigating point admittance parameters;

The determining the loading parameters of the common cavity in the multiplexer to be debugged according to the original admittance parameters includes:

determining a rational polynomial expression for an admittance parameter of the first raw instigating point;

The loading parameters are generated based on the rational polynomial expression.
The method according to claim 4, wherein the loading parameters include coupling parameters and resonance frequency offsets of the common cavity;

The generating the loading parameters according to the rational polynomial expression includes:

Obtain the coupling parameter of the common cavity by any one of the following formulas:

Wherein, J is the coupling parameter of the public cavity; Y 11 (s) is the rational polynomial expression of the admittance parameter of the first original driving point; s=jω, ω is the normalized angular frequency; a n-1 is Y 11 (s) coefficients of the highest power of the numerator polynomial;

The resonant frequency offset is obtained by the following formula:

Among them, b is the resonant frequency offset;
J is the coupling parameter of the common cavity.
The method according to claim 4, wherein the original admittance parameter further comprises a first original transfer admittance parameter, a second original transfer admittance parameter, and a second original instigating point admittance parameter;

The step of performing unloading processing of the loading parameters on each parameter in the original admittance parameters, and obtaining the target admittance parameters according to each parameter after the unloading processing includes:

Perform unloading processing of the loading parameters on the first original actuation point admittance parameter to obtain the first target actuation point admittance parameter, and the non-to-be-debugged filter in the to-be-debugged multiplexer The loading admittance parameter of the filter;

performing unloading processing of the loading parameters on the first original transfer admittance parameters to obtain a first target transfer admittance parameter and a second target transfer admittance parameter;

Carrying out the unloading process of the loading parameters on the second original instigating point admittance parameters to obtain the second target instigating point admittance parameters;

generating the target admittance according to the first target instigating point admittance parameter, the first target transition admittance parameter, the second target transition admittance parameter, and the second target instigating point admittance parameter parameter.
The method according to claim 6, wherein the unloading process of the loading parameters is performed on the first original actuation point admittance parameters to obtain the first target actuation point admittance parameters, and the multiple to-be-debugged The loading admittance parameters of the filter to be debugged by the filter to be debugged in the device include:

The admittance parameter of the first target instigating point and the loading admittance parameter are obtained by the following formula:

Wherein, Y' 11 is the admittance parameter of the first target driving point; Y 0 is the loading admittance parameter; J is the coupling parameter of the public cavity; Y 11 is the admittance parameter of the first original driving point; b is the resonance frequency offset; s=jω, ω is the normalized angular frequency;

The step of performing the unloading process of the loading parameters on the first original transfer admittance parameters to obtain the first target transfer admittance parameters and the second target transfer admittance parameters includes:

The first target transfer admittance parameter and the second target transfer admittance parameter are obtained by the following formula:

Wherein, Y' 12 is the first target transfer admittance parameter; Y' 21 is the second target transfer admittance parameter; Y 21 is the second original transfer admittance parameter;

The step of performing the unloading process of the loading parameters on the second original instigating point admittance parameters to obtain the second target instigating point admittance parameters includes:

The admittance parameter of the second target triggering point is obtained by the following formula:

Wherein, Y' 22 is the admittance parameter of the second target driving point; Y 12 is the admittance parameter of the first original transfer; Y 22 is the admittance parameter of the second original driving point.
The method according to claim 7, wherein, according to the first target instigating point admittance parameter, the first target transfer admittance parameter, the second target transfer admittance parameter, and the second target instigating point admittance parameters, generating the target admittance parameters, including:

The target admittance parameter is obtained by the following formula:

Wherein, Y' is the target admittance parameter.
The method according to claim 6, wherein the unloading process of the loading parameters is performed on the first original actuation point admittance parameters to obtain the first target actuation point admittance parameters, and the multiple to-be-debugged The loading admittance parameters of the filter to be debugged by the filter to be debugged in the device include:

The admittance parameter of the first target instigating point and the loading admittance parameter are obtained by the following formula:

Wherein, Y'11 is the admittance parameter of the first target instigating point ; Y0 is the loading admittance parameter; J is the coupling parameter of the public cavity; b is the resonance frequency offset;
F 11 (s) is the numerator polynomial of the admittance parameter of the first original driving point; D(s) is the denominator polynomial of the admittance parameter of the first original driving point;

The first original transfer admittance parameter is subjected to the unloading process of the loading parameter to obtain the first target transfer admittance parameter and the second target transfer admittance parameter, including:

The first target transfer admittance parameter and the second target transfer admittance parameter are obtained by the following formula:

Wherein, Y' 12 is the first target transfer admittance parameter; Y' 21 is the second target transfer admittance parameter; F 21 (s) is the molecular polynomial of the second original transfer admittance parameter;

The step of performing the unloading process of the loading parameters on the second original instigating point admittance parameters to obtain the second target instigating point admittance parameters includes:

The admittance parameter of the second target triggering point is obtained by the following formula:

Wherein, Y' 22 is the second target instigating point admittance parameter; M (s) is the numerator polynomial of Y 11 Y 22 -Y 12 Y 21 ; Y 11 is the first original instigating point admittance parameter; Y 21 is the second original transfer admittance parameter; Y 12 is the first original transfer admittance parameter; Y 22 is the second original instigating point admittance parameter.
The method according to claim 6, wherein said extracting a pole in said target admittance parameter and a residue corresponding to said pole comprises:

Carrying out vector fitting on the first target transfer admittance parameter to obtain poles and residues corresponding to the first target transfer admittance parameter;

Carrying out vector fitting to the admittance parameter of the second target instigating point to obtain the pole and residue corresponding to the admittance parameter of the second target instigating point;

A residue corresponding to the first target instigating point admittance parameter is determined according to the pole corresponding to the first target transfer admittance parameter and the pole corresponding to the second target instigating point admittance parameter.
The method according to claim 10, wherein the order of the vector fitting is the same as the order of the filter to be debugged.
The method according to claim 10, wherein, according to the pole corresponding to the first target transfer admittance parameter and the pole corresponding to the second target drive point admittance parameter, the first target drive point is determined The residues corresponding to the admittance parameters include:

The residue corresponding to the admittance parameter of the first target driving point is obtained through the first preset formula:

[r]=[A][Y′ 11 +Y 0 ]

Wherein, [r] is the residue corresponding to the pole of the first target instigating point admittance parameter, which is a column vector; A matrix composed of poles; Y' 11 is the admittance parameter of the first target driving point; Y 0 is the loading admittance parameter; [Y' 11 +Y 0 ] is the admittance of the first target driving point A column vector consisting of parameters and the sampling points of the loaded admittance parameters.
The method according to claim 6, wherein said extracting a pole in said target admittance parameter and a residue corresponding to said pole comprises:

Carrying out residue expansion on the first target instigating point admittance parameter and the loading admittance parameter to obtain poles and residues corresponding to the first target instigating point admittance parameter;

performing residue expansion on the first target transfer admittance parameter to obtain poles and residues corresponding to the first target transfer admittance parameter and the second target transfer admittance parameter;

The second target actuation point admittance parameter is processed through a second preset formula to obtain the pole and residue corresponding to the second target actuation point admittance parameter.
The method according to claim 13, wherein, the second target actuation point admittance parameter is processed through the second preset formula to obtain the pole and residue corresponding to the second target actuation point admittance parameter ,include:

The pole and residue corresponding to the admittance parameter of the second target driving point are obtained by the following formula:

Wherein, Y' 22 is the admittance parameter of the second target instigating point; s' i is the pole of Y'22;
is the residue corresponding to s′ i ; n is the order of residue expansion.
The method of claim 6, further comprising:

generating reconstructed scattering parameters of the filter to be debugged according to the equivalent circuit parameters of the filter to be debugged, the loading parameters, and the loading admittance parameters;

The reconstructed scattering parameters are compared with the target scattering parameters to obtain quality evaluation information of the equivalent circuit parameters.
The method according to claim 1, wherein the original scattering parameters of the filter to be debugged in the multiplexer to be debugged are dephased and loaded to obtain target scattering parameters, including:

By performing curve polynomial fitting on the phase shift and time delay of the actual loaded physical structure, or by iteratively adjusting the phase shift through an optimization function, the original scattering parameters of the filter to be debugged in the multiplexer to be debugged are dephased and loaded. Get target scattering parameters.
The method according to claim 1, further comprising:

Acquiring theoretical circuit parameters of the filter to be debugged;

calculating a difference between said equivalent circuit parameter and said standard circuit parameter;

The debugging device automatically debugs the filter to be debugged according to the difference instruction.
A multiplexer unloading method, comprising:

Dephasing and loading the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters;

converting the target scattering parameters to obtain corresponding original admittance parameters;

Perform unloading processing on the loading parameters of the common cavity for each parameter in the original admittance parameters, and obtain target admittance parameters according to each parameter after unloading processing.
A device for generating equivalent circuit parameters, comprising:

The dephasing loading module is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to be debugged to obtain target scattering parameters;

A conversion module, configured to convert the target scattering parameters to obtain corresponding original admittance parameters;

The unloading module is used to perform unloading processing on the loading parameters of the common cavity for each parameter in the original admittance parameters, and obtain target admittance parameters according to each of the parameters after unloading processing;

An extraction module, configured to extract poles in the target admittance parameters and residues corresponding to the poles;

A parameter generating module, configured to generate equivalent circuit parameters according to the pole and the residue corresponding to the pole.
A multiplexer unloading device, comprising:

The dephasing loading module is used to perform dephasing loading processing on the original scattering parameters of the filter to be debugged in the multiplexer to obtain target scattering parameters;

A conversion module, configured to convert the target scattering parameters to obtain corresponding original admittance parameters;

The unloading module is configured to perform unloading processing of the loading parameters of the common cavity on each parameter in the original admittance parameters, and obtain target admittance parameters according to each parameter after unloading processing.
An electronic device, comprising a memory and a processor, the memory stores a computer program, and when the processor executes the computer program, the steps of the method according to any one of claims 1 to 18 are realized.
A non-volatile computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 18 are realized.