WO2022179387A1 - 用于射线检查的成像系统 - Google Patents

用于射线检查的成像系统 Download PDF

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Publication number
WO2022179387A1
WO2022179387A1 PCT/CN2022/074837 CN2022074837W WO2022179387A1 WO 2022179387 A1 WO2022179387 A1 WO 2022179387A1 CN 2022074837 W CN2022074837 W CN 2022074837W WO 2022179387 A1 WO2022179387 A1 WO 2022179387A1
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WIPO (PCT)
Prior art keywords
radiation source
detector
source assembly
radiation
imaging system
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PCT/CN2022/074837
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English (en)
French (fr)
Inventor
陈志强
张丽
金鑫
赵振华
Original Assignee
清华大学
同方威视技术股份有限公司
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Application filed by 清华大学, 同方威视技术股份有限公司 filed Critical 清华大学
Priority to EP22758752.4A priority Critical patent/EP4300083A1/en
Publication of WO2022179387A1 publication Critical patent/WO2022179387A1/zh

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • A61B6/035—Mechanical aspects of CT
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/06—Diaphragms
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/44—Constructional features of apparatus for radiation diagnosis
    • A61B6/4429—Constructional features of apparatus for radiation diagnosis related to the mounting of source units and detector units
    • A61B6/4435—Constructional features of apparatus for radiation diagnosis related to the mounting of source units and detector units the source unit and the detector unit being coupled by a rigid structure
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4266—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a plurality of detector units

Definitions

  • the present disclosure relates to the technical field of fluoroscopic imaging, and in particular, to an imaging system for radiographic inspection.
  • CT computed tomography
  • existing CT scanning systems may include dynamic helical CT scanning systems and static CT scanning systems according to the movement of the ray source relative to the object to be inspected during the scanning process.
  • the conveying device conveys the object to be inspected horizontally and uniformly through the inspection area.
  • Dynamic helical CT scanning systems usually require a slip ring and bearing, and the slip ring needs to rotate at high speed during the scanning process.
  • the radiation source remains fixed during the entire scanning process, and an integrated radiation source surrounding the detection area is used for scanning.
  • the static CT scanning system can have a more flexible design.
  • static CT scanning systems can have different scanning channel sizes, equipment heights, and transport speeds, etc., depending on the application requirements.
  • the static CT scanning system can reduce noise and cost because it does not require slip rings, etc., and can achieve instant scanning and termination, thus shortening the preparation time.
  • a single distributed ray source usually cannot meet this requirement due to the limitation of mechanical structure.
  • multiple distributed ray sources are arranged in combination, due to the structural interference between different ray sources or between ray sources and detectors, it is difficult to meet the data requirements by arranging multiple distributed ray sources on the same plane.
  • Completeness requirements Usually, multiple (three or more) planes need to be set, and a set of ray sources and a set of opposite detectors are arranged on each plane, and the ray beam plane of the ray source coincides with the central plane of the detector. This arrangement increases the size of the overall system and the number of detectors.
  • An object of the present disclosure is to provide an imaging system capable of avoiding structural interference.
  • An object of the present disclosure is to provide an imaging system that meets the needs of CT reconstruction.
  • An object of the present disclosure is to provide an imaging system capable of improving imaging quality.
  • An object of the present disclosure is to provide an imaging system capable of reducing equipment size and cost.
  • An object of the present disclosure is to provide an imaging system capable of flexibly designing an optical path.
  • An aspect of the present disclosure provides an imaging system for radiographic inspection, including: an inspection area, wherein an object to be inspected can be transported through the inspection area in a traveling direction; a first radiation source assembly including a plurality of radiation sources; A two-ray source assembly includes a plurality of radiation sources, wherein each radiation source of the first radiation source assembly and the second radiation source assembly includes a separate casing to define a vacuum space and includes a plurality of target points packaged in the casing, the first The target points of all ray sources of a ray source assembly are arranged in the plane of the first ray source, and the target points of all ray sources of the second ray source assembly are arranged in the plane of the second ray source; a plurality of first detector units , for receiving X-rays emitted from the first ray source assembly and passing through the inspection area, a plurality of first detector units are arranged in the first detector plane; a plurality of second detector units are used to receive X-rays from the second ray X-rays
  • the first ray source plane, the first detector plane, the second detector plane, and the second ray source plane are substantially perpendicular to the direction of travel and substantially parallel to each other.
  • the imaging system is further configured to reconstruct a three-dimensional scan image of the object under inspection based on detection data of the plurality of first detector units and the plurality of second detector units.
  • the imaging system further includes a radiation source control device for controlling radiation emission of the first radiation source assembly and the second radiation source assembly, wherein the radiation source control device is configured so that the first radiation at the same time At most one target in the source assembly emits X-rays and at most one target in the second radiation source assembly emits X-rays.
  • the plurality of first detector units cover at least the radiation emission range of the first radiation source assembly
  • the plurality of second detector units cover at least the radiation emission range of the second radiation source assembly
  • the plurality of first detector units are configured to extend completely around the examination area to form a first detector ring; and/or the plurality of second detector units are configured to extend completely around the examination area to form a second detector ring.
  • the distribution positions of the target points in the first ray source assembly and the distribution positions of the target points in the second ray source assembly do not completely coincide.
  • the distribution positions of the target points in the first radiation source assembly and the distribution positions of the target points in the second radiation source assembly are staggered from each other.
  • the projection of each ray source of the first ray source assembly does not completely fall within the projection of any ray source of the second ray source assembly, and the projection of the second ray source assembly The projection of each ray source does not completely fall within the projection of any ray source of the first ray source assembly.
  • the projections of the plurality of ray sources of the first ray source assembly and the projections of the plurality of ray sources of the second ray source assembly are staggered from each other.
  • the target point of each radiation source of the first radiation source assembly is arranged to be deflected by a first deflection angle toward the plurality of first detector units in the traveling direction, so that the first radiation source assembly has a The X-rays emitted by each radiation source will not be blocked by the plurality of first detector units before passing through the inspection area; and/or the target point of each radiation source of the second radiation source assembly is arranged to face multiple The second detector units are deflected by the second deflection angle, so that the X-rays emitted by each radiation source of the second radiation source assembly are not blocked by the plurality of second detector units before passing through the inspection area.
  • the first ray source assembly further includes a first collimator for deflecting the direction of the X-rays emitted by the first ray source assembly toward the plurality of first detector units along the traveling direction an angle of inclination; and/or the second radiation source assembly further includes a second collimator for deflecting the direction of the X-rays emitted by the second radiation source assembly toward the plurality of second detector units along the traveling direction by a second inclination angle.
  • the first radiation source assembly and the second radiation source assembly have a combined scan angle of greater than 120 degrees with respect to the inspection area, viewed in the direction of travel.
  • the first radiation source assembly and the second radiation source assembly have a combined scan angle of greater than 180 degrees with respect to the inspection area, viewed in the direction of travel.
  • At least one of the targets of the first radiation source assembly and the second radiation source assembly is a digital imaging (DR) target
  • the radiation source control device is configured so that the radiation emission frequency of the digital imaging target is high The frequency of ray emission at other targets.
  • the first detector unit includes a single row of detector crystals or multiple rows of detector crystals
  • the second detector unit includes a single row of detector crystals or multiple rows of detector crystals
  • the imaging system has two ray source assemblies and one detector assembly, the two ray source assemblies constitute two ray source planes, and the two ray source planes are respectively located on two sides of the detector assembly, wherein
  • the detector assembly includes two groups of detector units, respectively corresponding to the two ray source assemblies and forming two detector planes.
  • two sets of detector units are installed on the same detector bracket, so that the length and weight of the imaging device can be effectively shortened and the difficulty of radiation protection can be reduced.
  • the radiation sources in each radiation source assembly are arranged so as not to interfere with each other, and each radiation source plane is arranged spaced from the corresponding detector plane, whereby the imaging system can avoid the radiation sources between and among radiation sources.
  • each radiation source assembly includes multiple radiation sources, and the detectors in a corresponding set of detector units can be shared by the multiple radiation sources, thereby reducing the cost of the imaging system.
  • the target distribution positions of the two ray source assemblies can complement each other, thereby obtaining more complete projection data and improving imaging quality and accuracy.
  • the arrangement of the light source targets and detectors and the optical path design of the imaging system are more flexible and can meet more application requirements.
  • FIG. 1 is a schematic diagram of an imaging system according to certain embodiments of the present disclosure.
  • FIG. 2 is a perspective view of an imaging system according to certain embodiments of the present disclosure.
  • FIG. 3 is a schematic diagram of a detector assembly in accordance with certain embodiments of the present disclosure.
  • FIG. 4 is a schematic diagram of the relative positions of a radiation source assembly and a detector assembly in accordance with certain embodiments of the present disclosure.
  • FIG. 5 is a schematic diagram of an imaging system according to certain embodiments of the present disclosure.
  • 6A is a schematic cross-sectional view of a radiation source and detector unit according to some embodiments of the present disclosure.
  • 6B is a schematic cross-sectional view of a radiation source and detector unit according to certain embodiments of the present disclosure.
  • FIG. 7 is a schematic diagram of a target distribution of an imaging system according to certain embodiments of the present disclosure.
  • the imaging system for radiographic inspection may be applied to an inspection system for performing fluoroscopic imaging inspection of an object or a human body, or the like.
  • an inspection system may include an imaging system and a delivery device.
  • the conveying device is used for conveying the inspected object through the inspection area in the traveling direction.
  • the direction of travel is substantially parallel to the horizontal direction.
  • the conveying device conveys the object under inspection in a uniform linear motion.
  • FIG. 1 is a schematic diagram of an imaging system according to certain embodiments of the present disclosure.
  • 2 is a perspective view of an imaging system according to certain embodiments of the present disclosure.
  • 3 is a schematic diagram of a detector assembly in accordance with certain embodiments of the present disclosure.
  • 4 is a schematic diagram of the relative positions of a radiation source assembly and a detector assembly in accordance with certain embodiments of the present disclosure.
  • the imaging system includes two radiation source assemblies 10 , 20 and a detector assembly 30 .
  • the radiation source assemblies 10, 20 are used to emit X-rays.
  • the detector assembly 30 is used for receiving X-rays emitted from the radiation source assemblies 10, 20 and passing through the inspection area.
  • the radiation source assemblies 10, 20 and the detector assembly 30 remain stationary during operation of the imaging system, ie, the imaging system is a static imaging system.
  • the imaging system defines an examination area.
  • "inspection area” means that an object to be inspected can be conveyed through said inspection area in the direction of travel.
  • the inspection area includes a first end and a second end.
  • the object under inspection is conveyed into the inspection area from one of the first end and the second end and exits the inspection area from the other.
  • the imaging system may further include a shielding member 40 .
  • the shielding member 40 may be arranged to surround the examination area of the imaging system.
  • the radiation source assemblies 10 , 20 and the detector assembly 30 are arranged outside the inspection area, ie, on the side of the shielding member 40 away from the inspection area.
  • the radiation source assembly 10 includes a plurality of radiation sources 100 .
  • the radiation source assembly 20 includes a plurality of radiation sources 100 .
  • the radiation source assemblies 10 and 20 respectively include three radiation sources 100 .
  • the radiation source assembly 10 and the radiation source assembly 20 respectively include a plurality of radiation sources 100 .
  • the present disclosure is not limited thereto.
  • the radiation source assembly 10 or the radiation source assembly 20 may include one or more radiation sources 100 .
  • each ray source 100 is a distributed ray source.
  • each radiation source 100 has a separate housing to define a separate vacuum space.
  • Each radiation source 100 includes a plurality of targets (not shown in FIGS. 1 and 2 ) encapsulated within a housing.
  • the plurality of target points of each radiation source 100 have a uniform target point spacing.
  • each radiation source 100 defines a separate vacuum space, and thus does not share the vacuum space with other radiation sources 100 .
  • the vacuum spaces of different radiation sources 100 are not connected.
  • each radiation source 100 may be detached and/or installed in an imaging system independently of the other radiation sources 100 .
  • the multiple target points of each radiation source 100 may be distributed along a straight line.
  • the shape of the housing of the radiation source 100 may also correspond to the distribution of the target points.
  • the housing of the radiation source 100 may also have a linear outer contour, as shown in FIG. 1 , for example.
  • the multiple target points in each radiation source 100 are arranged in a straight line.
  • the present disclosure is not limited thereto.
  • the multiple target points in the radiation source 100 may also be arranged along arcs, broken lines, and the like.
  • 5 is a schematic diagram of an imaging system according to certain embodiments of the present disclosure.
  • a plurality of target points (not shown in FIG. 5 ) in the radiation source 100 located below the examination area are arranged in an arc.
  • the housing of the radiation source 100 can also have an arc-shaped outer contour when viewed along the travel direction. In this case, the arc-shaped profile of the radiation source 100 can provide sufficient space for the installation of the conveying device.
  • the plurality of radiation sources 100 of the radiation source assembly 10 may have the same or different dimensions.
  • the plurality of radiation sources 100 of the radiation source assembly 20 may have the same or different dimensions.
  • the three radiation sources of the radiation source assembly 10 have two different sizes, and the three radiation sources of the radiation source assembly 20 also have two different sizes.
  • each radiation source 100 of the radiation source assemblies 10, 20 has a radiation emission range.
  • the ray source assembly 10 when the ray source assembly 10 includes a plurality of ray sources 100, the plurality of ray sources 100 of the ray source assembly 10 may provide a combined ray emission range. In some embodiments, the combined radiation emission range of the radiation source assembly 10 may be continuous or discontinuous.
  • the radiation source assembly 20 when the radiation source assembly 20 includes a plurality of radiation sources 100, the plurality of radiation sources 100 of the radiation source assembly 20 may provide a combined radiation emission range. In some embodiments, the combined radiation emission range of radiation source assembly 20 may be continuous or discontinuous.
  • the radiation emission range of the radiation source assemblies 10, 20 is selected such that the object under inspection can all fall within the radiation emission range. Thereby, the inspected object can receive a complete fluoroscopic examination, thereby improving the imaging integrity of the imaging system.
  • the radiation emission range of the radiation source assemblies 10, 20 is selected such that the portion of interest of the object under inspection can fall within the radiation emission range.
  • the target points of all the radiation sources 100 of the radiation source assembly 10 are arranged on the same plane (hereinafter referred to as the "first radiation source plane”). ), that is, the multiple radiation sources 100 of the radiation source assembly 10 are coplanarly arranged.
  • the radiation source assembly 20 includes a plurality of radiation sources 100, the target points of all the radiation sources 100 of the radiation source assembly 20 are arranged on the same plane (hereinafter referred to as the "second radiation source plane”). ), that is, the multiple radiation sources 100 of the radiation source assembly 20 are coplanarly arranged.
  • the target points are arranged in the same plane means that the beam exit points of the target points are all arranged in the same plane.
  • the first radiation source plane and the second radiation source plane are substantially parallel. In some embodiments, the first ray source plane is substantially perpendicular to the direction of travel. In some embodiments, the second ray source plane is substantially perpendicular to the direction of travel.
  • the plurality of radiation sources 100 of the radiation source assembly 10 are arranged so as not to interfere with each other.
  • the plurality of radiation sources 100 of the radiation source assembly 10 are arranged to be spaced apart around the examination area.
  • the plurality of radiation sources 100 of the radiation source assembly 10 are arranged in a continuous distribution around the examination area. In some embodiments, for example, as shown in FIG.
  • the plurality of radiation sources 100 of the radiation source assembly 10 may include a radiation source 100 located below the inspection area, a radiation source 100 located on the left side of the inspection area, and/or Or the radiation source 100 on the right side of the examination area.
  • the plurality of radiation sources 100 of the radiation source assembly 20 are arranged so as not to interfere with each other.
  • the plurality of radiation sources 100 of the radiation source assembly 20 are arranged to be spaced apart around the examination area.
  • the plurality of radiation sources 100 of the radiation source assembly 20 are arranged in a continuous distribution around the examination area. In some embodiments, for example, as shown in FIG.
  • the plurality of radiation sources 100 of the radiation source assembly 20 may include a radiation source 100 located below the inspection area, a radiation source 100 located on the left side of the inspection area, and/or Or the radiation source 100 on the right side of the examination area.
  • the detector assembly 30 includes a plurality of first detector units 310 , a plurality of second detector units 320 , and a detector holder 330 .
  • the plurality of first detector units 310 are used for receiving X-rays emitted from the radiation source assembly 10 and passing through the inspection area.
  • the plurality of second detector units 320 are used for receiving X-rays emitted from the radiation source assembly 20 and passing through the inspection area.
  • the plurality of first detector units 310 and the plurality of second detector units 320 are mounted on the detector bracket 330 .
  • each detector unit 310, 320 may be a single-energy detector unit, a dual-energy detector unit, or an energy spectrum detector unit, or the like.
  • the types of detector units of the present disclosure are not limited to the above three types of detector units.
  • the plurality of first detector units 310 are arranged in the same plane (hereinafter referred to as "first detector plane”).
  • the plurality of second detector units 320 are arranged in the same plane (hereinafter referred to as “second detector plane”).
  • the detectors are arranged in the same plane means that the central planes of the detectors (eg detector crystal central planes) are all arranged in the same plane.
  • the central planes of the plurality of first detector units 310 or the plurality of second detector units 320 are arranged in the same plane through the same positioning reference.
  • the first detector unit 310 includes a single row of detector crystals or multiple rows of detector crystals
  • the second detector unit 320 includes a single row of detector crystals or multiple rows of detector crystals.
  • the first detector plane and the second detector plane are substantially parallel. In some embodiments, the first detector plane is substantially perpendicular to the direction of travel. In some embodiments, the second detector plane is substantially perpendicular to the direction of travel.
  • the first radiation source plane of the radiation source assembly 10 is spaced apart from the first detector planes of the plurality of first detector units 310 along the direction of travel. In an exemplary embodiment, the first radiation source plane of the radiation source assembly 10 is substantially parallel to the first detector planes of the plurality of first detector units 310 .
  • the second radiation source plane of the radiation source assembly 20 is spaced apart from the second detector planes of the plurality of second detector units 320 along the direction of travel. In an exemplary embodiment, the second radiation source plane of the radiation source assembly 20 is substantially parallel to the second detector planes of the plurality of second detector units 320 .
  • the first ray source plane, the first detector plane, the second detector plane, and the second ray source plane are sequentially distributed along the traveling direction.
  • the radiation source assembly 10 and the radiation source assembly 20 are respectively disposed on two sides of the detector assembly 30 .
  • the imaging system according to some embodiments of the present disclosure has two radiation source planes, and the two radiation source planes are located on two sides of the detector assembly, respectively.
  • the first radiation source plane, the first detector plane, the second detector plane and the second radiation source plane are substantially parallel to each other. In some embodiments, the first radiation source plane, the first detector plane, the second detector plane and the second radiation source plane are substantially perpendicular to the direction of travel.
  • the detector holder 330 has a detector holder center plane, such as shown in FIG. 2 .
  • the "detector holder center plane” refers to the geometric center plane of the detector holder 330 in the direction of travel.
  • the central plane of the detector support is substantially parallel to the first radiation source plane and/or the second radiation source plane.
  • the detector support center plane is substantially parallel to the first detector plane and/or the second detector plane.
  • the detector support center plane is substantially perpendicular to the direction of travel.
  • the first ray source plane, the central plane of the detector support and the second ray source plane are sequentially distributed along the traveling direction.
  • the imaging system according to some embodiments of the present disclosure has two radiation source planes and a detector support center plane, and the two radiation source planes are respectively located on both sides of the detector support center plane.
  • the radiation source assemblies 10, 20 and the detector assembly 30 are arranged so as not to interfere with each other.
  • the plurality of radiation sources 100 of the radiation source assembly 10 are adjacent to the outermost portions of the detector assembly 30 (eg, the plurality of first detector units 310 or the radiation source of the detector bracket 330 and the radiation Opposite outermost portions of the source assembly 10) are spaced apart by a predetermined distance.
  • the plurality of radiation sources 100 of the radiation source assembly 20 are adjacent to the outermost portions of the detector assembly 30 (eg, the plurality of second detector units 320 or the radiation of the detector bracket 330 and the radiation Opposite outermost portions of the source assembly 20) are spaced apart by a predetermined distance.
  • the detector unit 310 (or 320 ) is spaced apart from the target point of the radiation source 100 . Therefore, the X-rays emitted by the radiation source assembly 10 or 20 will not be blocked by the detector assembly 30 before passing through the inspection area.
  • the arrangement of detector units in the detector assembly 30 may be set according to factors such as the arrangement of the radiation sources 10 and 20 and/or the size of the object to be inspected. In some embodiments, the arrangement of the detector units in the detector assembly 30 may also adopt a cost-effective arrangement, that is, with as few detector units as possible to meet the imaging requirements.
  • the plurality of first detector units 310 of the detector assembly 30 are arranged to cover at least the radiation emission range of the radiation source assembly 10 .
  • the plurality of second detector units 320 of the detector assembly 30 are arranged to cover at least the radiation emission range of the radiation source assembly 20 .
  • the detector assembly 30 can cover the radiation emission range of the radiation source assemblies 10 and 20, so as to cover the entire imaging range in the inspection area. In this case, the arrangement of the detector assembly 30 can make full use of the X-rays emitted by the radiation source to improve imaging quality and inspection accuracy.
  • the plurality of first detector units 310 are arranged to cover at least a portion of the radiation emission range of the radiation source assembly 10 (eg, the radiation emission range corresponding to a portion of interest of the object under inspection).
  • the plurality of second detector units 320 are arranged to cover at least a portion of the radiation emission range of the radiation source assembly 20 (eg, the radiation emission range corresponding to a portion of interest of the object under inspection).
  • the detector assembly 30 can cover the selected radiation emission range of the radiation source assemblies 10 and 20, so that the main imaging range in the examination area can be covered. In this case, the arrangement of the detector assembly 30 can reduce the cost of the imaging system while ensuring sufficient imaging quality and inspection accuracy.
  • the plurality of first detector units 310 of the detector assembly 30 extend completely around the examination area.
  • the plurality of first detector units 310 form a complete and continuous first detector ring.
  • the first detector ring may be a circular ring, a square ring, a rectangular ring, a polygonal ring, or the like.
  • the plurality of first detector units 310 form a square ring.
  • the plurality of second detector units 320 of the detector assembly 30 extend completely around the examination area.
  • the plurality of second detector units 320 form a complete and continuous second detector ring.
  • the second detector ring may be a circular ring, a square ring, a rectangular ring, a polygonal ring, or the like.
  • the plurality of second detector units 320 form a square ring.
  • the plurality of first detector units 310 or the plurality of second detector units 320 form a complete detector ring.
  • the detector ring formed by the plurality of first detector units 310 or the plurality of second detector units 320 may be incomplete, that is, there are gaps.
  • the plurality of first detector units 310 are divided into multiple segments, and the first detector units 310 of different segments may be distributed at intervals around the examination area.
  • the plurality of second detector units 320 are divided into multiple segments, and the second detector units 320 of different segments may be distributed at intervals around the examination area.
  • the imaging system may also be configured to reconstruct a three-dimensional scan of the object under inspection based on the detection data of the plurality of first detector units 310 and the plurality of second detector units 320 of the detector assembly 30 ( CT) image.
  • the imaging system may use an iterative reconstruction algorithm, an analytical reconstruction algorithm, etc., or a combination of different reconstruction algorithms when reconstructing a three-dimensional scan image of an object under inspection. For example, if the radiation source assemblies 10 and 20 have a combined scan angle of greater than 180 degrees relative to the examination area, the imaging system may prefer an analytical reconstruction algorithm to increase reconstruction speed and reduce computational performance requirements.
  • the imaging system may preferentially select the iterative reconstruction algorithm or use the analytical result as the initial value of the iterative algorithm.
  • the recognition algorithm employed by the imaging system may be based on three-dimensional scan (CT) images or digital imaging (DR) images alone, or both.
  • each ray source 100 has a scan angle.
  • the "scanning angle" of each radiation source 100 refers to the angular range of all target points of the radiation source 100 relative to the inspection area (eg relative to the central axis of the inspection area).
  • the central axis of the inspection area refers to the axis, viewed in the direction of travel, passing through the approximate center of the inspection area and substantially perpendicular to the central plane of the detector support.
  • a plurality of radiation sources 100 located in different scanning positions relative to the examination area may provide one Combined scan angle.
  • combined scan angle refers to a scan angle produced by combining the scan angles of a plurality of radiation sources 100 in a plurality of scan positions relative to the examination area.
  • the combined scan angles of the multiple radiation sources 100 at multiple scanning positions relative to the examination region may be continuous or discontinuous.
  • the radiation source assemblies 10 and 20 have a combined scan angle of greater than 120 degrees with respect to the inspection area, viewed in the direction of travel.
  • the imaging system can basically realize three-dimensional image reconstruction.
  • the radiation source assemblies 10 and 20 have a combined scan angle of greater than 180 degrees relative to the examination area, viewed in the direction of travel.
  • the imaging system can generate more complete scan data, and produce better CT scan results and better 3D scan images.
  • the imaging system is configured such that X-rays emitted by the radiation source assembly 10 can pass through the examination area and received by the plurality of first detector units 310 , and X-rays emitted by the radiation source assembly 20 can pass through The area is inspected and received by the plurality of second detector units 320 .
  • the imaging system is configured such that the X-rays emitted by the radiation source assembly 10 can cover the X-rays emitted by the first detector unit 310 and/or the X-rays emitted by the radiation source assembly 20 in the direction of travel can cover the second Detector unit 320.
  • the imaging system is configured such that the X-rays emitted by each radiation source 100 are not blocked by the detector assembly 30 before passing through the examination area.
  • each first detector unit 310 of the detector assembly 30 is arranged so as not to block the X-rays emitted by one or more radiation sources 100 on the same side of the radiation source assembly 10 and can receive the radiation source assembly X-rays emitted by one or more radiation sources 100 on the other side of 10 .
  • each second detector unit 320 of the detector assembly 30 is arranged so as not to block the X-rays emitted by one or more radiation sources 100 on the same side of the radiation source assembly 20 and can receive the radiation source assembly X-rays emitted by one or more radiation sources 100 on the other side of 20 .
  • the target point of each radiation source 100 of the radiation source assembly 10 is set to be deflected by a first deflection angle toward the plurality of first detector units 310 in the traveling direction, so that the The X-rays emitted by each radiation source 100 can pass through the examination area and be received by the plurality of first detector units 310 .
  • the first deflection angle is set so that the X-rays emitted by each radiation source 100 of the radiation source assembly 10 can cover the first detector unit 310 in the traveling direction.
  • the first deflection angle is set so that the X-rays emitted by each radiation source 100 of the radiation source assembly 10 are not blocked by the plurality of first detector units 310 before passing through the inspection area.
  • the target point of each radiation source 100 of the radiation source assembly 20 is set to be deflected toward the plurality of second detector units 320 by a second deflection angle along the traveling direction, so that the The X-rays emitted by each radiation source 100 can pass through the examination area and be received by the plurality of second detector units 320 .
  • the second deflection angle is set such that the X-rays emitted by each radiation source 100 of the radiation source assembly 20 can cover the second detector unit 320 in the traveling direction.
  • the second deflection angle is set such that the X-rays emitted by each radiation source 100 of the radiation source assembly 20 are not blocked by the plurality of second detector units 320 before passing through the inspection area.
  • the first deflection angle is equal to the second deflection angle.
  • FIG. 6A shows a schematic cross-sectional view of a radiation source and detector unit according to some embodiments of the present disclosure.
  • the radiation source 100 is deflected by an angle toward the detector unit 310 (or 320 ) in the direction of travel.
  • the detector unit on the same side as the radiation source 100 is not shown in FIG. 6A , but only one detector unit opposite to the radiation source 100 is shown.
  • each radiation source 100 is deflected about the axis of its target.
  • each radiation source 100 is deflected such that the X-rays emitted by the radiation source 100 can cover the corresponding detector unit 310 (or 320 ) in the direction of travel.
  • the X-rays emitted by the radiation source 100 can be more efficiently received by the corresponding detector unit.
  • the X-rays emitted by the radiation source 100 can avoid the detector units on the same side, and can also be received by the detector units on the other side.
  • the ray source assembly 10 may further include a collimator for directing the X-rays emitted by the ray source 100 of the first ray source assembly 10 toward the plurality of first detectors along the traveling direction
  • the unit 310 is deflected by the first tilt angle, so that the X-rays emitted by the radiation source 100 of the radiation source assembly 10 can pass through the examination area and be received by the plurality of first detector units 310 .
  • the first tilt angle is set such that the X-rays emitted by each radiation source 100 of the radiation source assembly 10 can cover the first detector unit 310 in the traveling direction.
  • the first inclination angle is set so that the X-rays emitted by each radiation source 100 of the radiation source assembly 10 are not blocked by the plurality of first detector units 310 before passing through the inspection area.
  • the radiation source assembly 20 may further include a collimator for directing the direction of the X-rays emitted by the radiation source 100 of the second radiation source assembly 20 toward the plurality of second detectors along the traveling direction
  • the unit 320 is deflected by the second tilt angle, so that the X-rays emitted by the radiation source 100 of the radiation source assembly 20 can pass through the examination area and be received by the plurality of second detector units 320 .
  • the second angle of inclination is set so that the X-rays emitted by each radiation source 100 of the radiation source assembly 20 can cover the second detector unit 320 in the traveling direction.
  • the second inclination angle is set so that the X-rays emitted by each radiation source 100 of the radiation source assembly 20 are not blocked by the plurality of second detector units 320 before passing through the inspection area.
  • the first tilt angle is equal to the second tilt angle.
  • FIG. 6B shows a schematic cross-sectional view of a radiation source and detector unit according to some embodiments of the present disclosure.
  • the X-rays emitted by the radiation source 100 are constrained by a collimator (as shown by the shaded part), so that the direction of the X-rays emitted by the radiation source 100 is toward the detector unit 310 ( or 320) to deflect an angle.
  • the detector unit on the same side as the radiation source 100 is not shown in FIG. 6B , but only one detector unit opposite to the radiation source 100 is shown.
  • the collimator is configured to deflect X-rays emitted by the radiation source 100 to cover the corresponding detector unit 310 (or 320 ) in the direction of travel.
  • the X-rays emitted by the radiation source 100 can be more effectively received by the corresponding detector units.
  • the X-rays emitted by the radiation source 100 can avoid the detector units on the same side, and can also be received by the detector units on the other side.
  • the ray source 100 of the imaging system may also be configured such that the emitted X-rays have a beam width sufficiently wide in the traveling direction to cover the detector unit 310 or 320 in the traveling direction.
  • the collimator of the radiation source 100 may have a wider slit width. In this case, part of the X-rays emitted by the radiation source 100 may fall outside the receiving range of the detector unit.
  • the imaging system may also be provided with additional shielding components (eg, on one side of the detector unit in the direction of travel) to shield X-rays that fall outside the receiving range of the detector unit.
  • the detector assembly 30 is positioned closer to the center of the examination area relative to the radiation source assemblies 10 , 20 . In some embodiments, when the imaging system includes multiple radiation sources 100 , the detector assembly 30 is positioned closer to the center of the examination area relative to all the radiation sources 100 . Thus, the detector assembly 30 is disposed radially inside the radiation source assemblies 10 and 20 .
  • the number of target points in the radiation source assembly 10 and the number of target points in the radiation source assembly 20 may be the same or different. According to some embodiments of the present disclosure, when viewed along the traveling direction, the distribution positions of the target points in the radiation source assembly 10 and the distribution positions of the target points in the radiation source assembly 20 do not completely coincide.
  • 7 is a schematic diagram of a target distribution of an imaging system according to certain embodiments of the present disclosure. In some embodiments, as shown in FIG. 7 , the target distributions in the radiation source assemblies 10 and 20 are not completely coincident. Therefore, the distribution positions of the target points of the radiation source assembly 10 and the radiation source assembly 20 can complement each other, so as to increase the number of target points for effective imaging and provide a larger combined scanning angle.
  • the distribution positions of the target points in the radiation source assembly 10 and the distribution positions of the target points in the radiation source assembly 20 are staggered from each other.
  • the distribution of target points in the radiation source assemblies 10 and 20 avoids the existence of two target points located at the same position. Therefore, the imaging system can make full use of the completely interlaced target points of the radiation source assemblies 10 and 20 for imaging, and the imaging precision and quality can be improved.
  • the projection of each ray source 100 of the ray source assembly 10 does not completely fall within the projection of any ray source 100 of the ray source assembly 20, and each ray source assembly 20
  • the projections of each ray source 100 do not completely fall within the projections of any ray source 100 of the ray source assembly 10 .
  • the arrangement of each ray source 100 in the ray source assembly 10 and the ray source assembly 20 is not completely consistent, and there is no completely overlapping mutually in the ray source assemblies 10 and 20 .
  • the radiation sources 100 or none of the radiation sources 100 are completely within the range of the other radiation source 100 . Therefore, the radiation emission range and scanning range of the radiation source assembly 10 and the radiation source assembly 20 can complement each other, so as to increase the number of target points for effective imaging and provide a larger combined scanning angle.
  • the projections of the plurality of radiation sources 100 of the radiation source assembly 10 and the projections of the plurality of radiation sources 100 of the radiation source assembly 20 are staggered from each other when viewed along the travel direction. In this case, the radiation sources 100 in the radiation source assembly 10 and the radiation source assembly 20 are completely staggered with each other. Therefore, the imaging system can fully utilize all the radiation sources of the radiation source assemblies 10 and 20 for imaging, and the imaging precision and quality can be improved.
  • the imaging system may further include a radiation source control device.
  • the radiation source control device is used to control the radiation of the radiation source assembly 10 and the radiation source assembly 20 .
  • the radiation source control device is configured such that at most one target in the radiation source assembly 10 emits X-rays and at most one target in the radiation source assembly 20 emits X-rays at the same time. Therefore, there will not be more than two target points in the first ray source plane that emit X-rays simultaneously, and there will not be more than two target points in the second ray source plane that emit X-rays simultaneously.
  • the imaging system may have a target point from the first radiation source plane and a target point from the second radiation source plane to emit X-rays simultaneously.
  • the radiation source control device may be configured to control the radiation emission of the radiation source assembly 10 and the radiation source assembly 20 respectively, such as target firing sequence, firing frequency, firing current, and the like.
  • At least one target of radiation source assemblies 10 and 20 is a digital imaging (DR) target.
  • DR digital imaging
  • the radiation source control device is configured such that the radiation emission frequency of the digital imaging target point is higher than the radiation emission frequency of other target points.
  • the imaging system includes a plurality of DR targets selected from radiation source assemblies 10 and 20 . In some embodiments, when the imaging system has multiple DR targets, the DR targets may be in different scanning positions relative to the examination area, ie, used to generate DR images of different viewing angles.
  • the imaging system may also set a separate DR target, that is, the DR target is independent of the targets in the radiation source assemblies 10 and 20 .
  • the imaging system may also be provided with a separate DR detector unit to receive X-rays emitted by the separate DR target.
  • Imaging methods according to certain embodiments of the present disclosure are described in detail below. According to certain embodiments of the present disclosure, the imaging method may be implemented using any of the imaging systems described above.
  • the imaging method according to some embodiments of the present disclosure is described below by taking the object under inspection passing through the radiation source assembly 10 and the radiation source assembly 20 successively as an example. However, it should be understood that the object to be inspected may also pass through the radiation source assembly 20 and the radiation source assembly 10 successively.
  • step S10 the object to be inspected is carried on the conveying device, and the conveying device is made to convey the object to be inspected through the inspection area along the traveling direction.
  • step S20 the target points of the radiation source assemblies 10 and 20 are controlled to emit X-rays in a predetermined order.
  • step S30 the emitted X-rays are received by the detector assembly 30 through the inspected object located in the inspection area.
  • the imaging method may further include step S40 : reconstructing a three-dimensional scan image of the inspected object according to the detection data of the plurality of first detector units 310 and the plurality of second detector units 320 .
  • the imaging method may further include recognizing the object under inspection and providing the identification result after reconstructing the three-dimensional scan image of the object under inspection.
  • the imaging method may further include displaying the three-dimensional scan image and/or the recognition result.
  • the imaging method may further preload or produce configuration information or correction information, such as background data, air data, and the like.
  • the imaging method may further include detecting whether the object under inspection enters the beam surface of the X-ray emitted by the radiation source assembly 10 through the plurality of first detector units 310 of the detector assembly 30 . In some embodiments, the imaging method may further include detecting whether the object under inspection enters the beam surface of the X-rays emitted by the radiation source assembly 20 through a plurality of second detector units 320 of the detector assembly 30 . For example, by detecting in real time whether the object under inspection enters the beam surface of the X-rays of the radiation source assemblies 10, 20, the imaging method can provide a reference for subsequent operations.
  • the imaging method may further include buffering and/or preprocessing the detection data of the plurality of first detector units 310 .
  • the imaging method may start according to the detection data of the plurality of first detector units 310 and the plurality of second detector units 320 to reconstruct the 3D scanned image of the inspected object.
  • the imaging method may further include controlling the radiation source components 10 and 20 to stop emitting X-rays after it is determined that the object to be inspected completely passes through the beam surface of the X-rays emitted by the radiation source assembly 20 .
  • the imaging method may further include controlling the DR target to emit X-rays to generate a DR image.
  • the imaging method may receive, by a single DR detector unit, the X-rays emitted by the single DR target and passing through the object under inspection.
  • the imaging method may receive through the detector assembly 30 radiation transmitted by the DR targets and passing through the object to be inspected. X-ray.

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Abstract

一种用于射线检查的成像系统，包括：第一射线源组件（10），包括多个射线源（100）；第二射线源组件（20），包括多个射线源（100），第一射线源组件（10）的所有射线源（100）的靶点都布置在第一射线源平面内，第二射线源组件（20）的所有射线源（100）的靶点都布置在第二射线源平面内；多个第一探测器单元（310），多个第一探测器单元（310）布置在第一探测器平面内；多个第二探测器单元（320），多个第二探测器单元（320）布置在第二探测器平面内；和探测器支架（330），多个第一探测器单元（310）和多个第二探测器单元（320）都安装在探测器支架上（330），其中，第一射线源平面、第二射线源平面、第一探测器平面与第二探测器平面沿行进方向依次分布。

Description

用于射线检查的成像系统
相关申请的交叉引用
本公开以2021年2月26日提交的申请号为202110217737.9且名称为“用于射线检查的成像系统”的中国专利申请为优先权，并将其全部内容引用于此。
技术领域
本公开涉及透视成像技术领域，特别是涉及一种用于射线检查的成像系统。
背景技术
分布式射线源已经广泛应用于透视成像领域，例如用于物品检测、医疗诊断等的CT(计算机断层成像)设备中。CT扫描生成三维扫描图像并且具有高识别能力。根据在扫描过程中射线源相对于被检查物体的运动，现有的CT扫描系统可以包括动态螺旋CT扫描系统和静态CT扫描系统。
动态螺旋CT扫描系统在扫描过程中射线源围绕被检查物体连续旋转的同时，传送装置匀速水平地传送被检查物体通过检查区域。动态螺旋CT扫描系统通常需要一个滑环和轴承，并且在扫描过程中，滑环需要高速旋转。现有的静态CT扫描系统在整个扫描过程中射线源保持固定，采用围绕检测区域的一体式射线源来进行扫描。
相比于采用滑环的动态螺旋CT，静态CT扫描系统可以具有更灵活的设计。例如，静态CT扫描系统可以根据应用需求而具有不同扫描通道尺寸、设备高度及传送速度等。静态CT扫描系统由于不需要滑环等，因此可以降低噪音和成本，可以实现即时扫描和终止，从而缩短了准备时间。
根据CT重建理论，被扫描对象在CT扫描系统中达到一定的扫描角度(例如至少120度)，才可以满足数据完备性并且保证数值重建的准确 性。单个分布式射线源由于机械结构的限制而通常无法满足该要求。当多个分布式射线源组合排布时，由于不同的射线源之间或者射线源与探测器之间的结构干涉，很难通过将多个分布式射线源排布到同一个平面来满足数据完备性要求。通常，需要设置多个(三个或更多)平面，在每个平面布置一组射线源和相对的一组探测器，射线源的射线束面与探测器的中心面重合。这种布置方式增大了整个系统的尺寸和探测器数量。
为此，需要一种改进的成像系统和方法。
发明内容
本公开的一个目的是提供一种能够避免结构干涉的成像系统。本公开的一个目的是提供一种满足CT重建需要的成像系统。本公开的一个目的是提供一种能够提高成像质量的成像系统。本公开的一个目的是提供一种能够减小设备尺寸和成本的成像系统。本公开的一个目的是提供一种能够灵活设计光路的成像系统。
本公开的一方面提供一种用于射线检查的成像系统，包括：检查区域，其中被检查对象能够沿行进方向被传送经过所述检查区域；第一射线源组件，包括多个射线源；第二射线源组件，包括多个射线源，其中第一射线源组件和第二射线源组件的每个射线源包括单独的壳体以限定真空空间并且包括封装在壳体内的多个靶点，第一射线源组件的所有射线源的靶点都布置在第一射线源平面内，第二射线源组件的所有射线源的靶点都布置在第二射线源平面内；多个第一探测器单元，用于接收从第一射线源组件发射并经过检查区域的X射线，多个第一探测器单元布置在第一探测器平面内；多个第二探测器单元，用于接收从第二射线源组件发射并经过检查区域的X射线，多个第二探测器单元布置在第二探测器平面内；和探测器支架，多个第一探测器单元和多个第二探测器单元都安装在探测器支架上，其中，第一射线源平面、第一探测器平面、第二探测器平面和第二射线源平面沿行进方向依次分布。
根据本公开的某些实施例，第一射线源平面、第一探测器平面、第二探测器平面和第二射线源平面与行进方向基本上垂直并且彼此基本上平 行。
根据本公开的某些实施例，成像系统还构造成基于多个第一探测器单元和多个第二探测器单元的检测数据来重建被检查对象的三维扫描图像。
根据本公开的某些实施例，成像系统还包括射线源控制装置，用于控制第一射线源组件和第二射线源组件的射线发射，其中射线源控制装置构造成使得在同一时刻第一射线源组件中至多只有一个靶点发射X射线并且第二射线源组件中至多只有一个靶点发射X射线。
根据本公开的某些实施例，多个第一探测器单元至少覆盖第一射线源组件的射线发射范围，并且多个第二探测器单元至少覆盖第二射线源组件的射线发射范围。
根据本公开的某些实施例，多个第一探测器单元构造成完整地围绕检查区域延伸以组成第一探测器环；和/或多个第二探测器单元构造成完整地围绕检查区域延伸以组成第二探测器环。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件中靶点的分布位置与第二射线源组件中靶点的分布位置没有完全重合。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件中靶点的分布位置与第二射线源组件中靶点的分布位置相互错开。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件的每个射线源的投影没有完全落在第二射线源组件的任意射线源的投影内，并且第二射线源组件的每个射线源的投影没有完全落在第一射线源组件的任意射线源的投影内。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件的多个射线源的投影与第二射线源组件的多个射线源的投影相互错开。
根据本公开的某些实施例，第一射线源组件的每个射线源的靶点都设置成沿行进方向朝着多个第一探测器单元偏转第一偏转角度，使得第一射线源组件的每个射线源发射的X射线在经过检查区域之前不会被多个第一探测器单元遮挡；和/或第二射线源组件的每个射线源的靶点都设置成沿行进方向朝着多个第二探测器单元偏转第二偏转角度，使得第二射线源组件的每个射线源发射的X射线在经过检查区域之前不会被多个第二探测器单 元遮挡。
根据本公开的某些实施例，第一射线源组件还包括第一准直器，用于使第一射线源组件发射的X射线的方向沿行进方向朝着多个第一探测器单元偏转第一倾斜角度；和/或第二射线源组件还包括第二准直器，用于使第二射线源组件发射的X射线的方向沿行进方向朝着多个第二探测器单元偏转第二倾斜角度。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件和第二射线源组件相对于检查区域具有大于120度的组合扫描角度。
根据本公开的某些实施例，沿行进方向观察，第一射线源组件和第二射线源组件相对于检查区域具有大于180度的组合扫描角度。
根据本公开的某些实施例，第一射线源组件和第二射线源组件的至少一个靶点是数字成像(DR)靶点，射线源控制装置构造成使得数字成像靶点的射线发射频率高于其他靶点的射线发射频率。
根据本公开的某些实施例，其中，第一探测器单元包括单排探测器晶体或多排探测器晶体，和/或第二探测器单元包括单排探测器晶体或多排探测器晶体。
根据本公开的某些实施例，成像系统具有两个射线源组件和一个探测器组件，两个射线源组件构成两个射线源平面，两个射线源平面分别位于探测器组件的两侧，其中探测器组件包括两组探测器单元，分别对应于两个射线源组件并且构成两个探测器平面。在一些实施例中，两组探测器单元安装在同一个探测器支架上，从而可以有效缩短成像设备的长度和重量并且可以降低辐射防护的难度。在一些实施例中，每个射线源组件中的射线源布置成没有相互干涉，并且每个射线源平面与相应的探测器平面间隔开布置，由此成像系统可以避免射线源之间以及射线源和探测器之间的干涉，使覆盖检查区域的扫描角度更大并且可以提供更加完备的检测数据。在一些实施例中，每个射线源组件包括多个射线源，并且相应的一组探测器单元中的探测器可以被多个射线源共用，由此可以降低成像系统的成本。在一些实施例中，两个射线源组件的靶点分布位置能够相互补充，由此可以获得更为完备的投影数据并且提高成像质量和精度。在一些实施例中， 成像系统的光源靶点和探测器的排布以及光路设计更加灵活，可以满足更多应用需求。
附图说明
图1是根据本公开的某些实施例的成像系统的示意图。
图2是根据本公开的某些实施例的成像系统的透视图。
图3是根据本公开的某些实施例的探测器组件的示意图。
图4是根据本公开的某些实施例的射线源组件和探测器组件的相对位置的示意图。
图5是根据本公开的某些实施例的成像系统的示意图。
图6A是根据本公开的某些实施例的射线源和探测器单元的截面示意图。
图6B是根据本公开的某些实施例的射线源和探测器单元的截面示意图。
图7是根据本公开的某些实施例的成像系统的靶点分布的示意图。
具体实施方式
下文中，参照附图描述本公开的实施例。下面的详细描述和附图用于示例性地说明本公开的原理，本公开不限于所描述的优选实施例，本公开的范围由权利要求书限定。现参考示例性的实施方式详细描述本公开，一些实施例图示在附图中。以下描述参考附图进行，除非另有表示，否则在不同附图中的相同附图标记代表相同或类似的元件。以下示例性实施方式中描述的方案不代表本公开的所有方案。相反，这些方案仅是所附权利要求中涉及的本公开的各个方面的系统和方法的示例。
根据本公开的实施例的用于射线检查的成像系统可以应用于检查系统中，以用于对物体或人体等进行透视成像检查。
根据本公开的某些实施例，检查系统可以包括成像系统和传送装置。传送装置用于沿行进方向传送被检查对象经过检查区域。在示例性实施例中，行进方向基本上平行于水平方向。在一些实施例中，传送装置以匀速 直线运动来传送被检查对象。
图1是根据本公开的某些实施例的成像系统的示意图。图2是根据本公开的某些实施例的成像系统的透视图。图3是根据本公开的某些实施例的探测器组件的示意图。图4是根据本公开的某些实施例的射线源组件和探测器组件的相对位置的示意图。
根据本公开的某些实施例，如图1所示，成像系统包括两个射线源组件10、20和探测器组件30。射线源组件10、20用于发射X射线。探测器组件30用于接收从射线源组件10、20发射并经过检查区域的X射线。根据本公开的某些实施例，射线源组件10、20和探测器组件30在成像系统的操作过程中保持静止，即成像系统是静态成像系统。
根据本公开的某些实施例，成像系统限定检查区域。在本文中，“检查区域”表示被检查对象能够沿行进方向被传送经过所述检查区域。当被检查对象位于检查区域中时，从射线源组件10、20发射的X射线能够穿透被检查对象并且被探测器组件30接收到。在示例性实施例中，检查区域包括第一端和第二端。在一些实施例中，被检查对象从第一端和第二端中的一者被传送进入检查区域，并且从另一者离开检查区域。
根据本公开的某些实施例，如图1所示，成像系统还可以包括屏蔽部件40。在示例性实施例中，屏蔽部件40可以布置成围绕成像系统的检查区域。在示例性实施例中，射线源组件10、20和探测器组件30布置在检查区域的外侧，即在屏蔽部件40的远离检查区域的一侧。
下面参照附图详细描述根据本公开的某些实施例的射线源组件的结构。
根据本公开的某些实施例，射线源组件10包括多个射线源100。根据本公开的某些实施例，射线源组件20包括多个射线源100。在图1和图2所示的某些实施例中，射线源组件10和20分别包括三个射线源100。
上文描述射线源组件10和射线源组件20分别包括多个射线源100。但是，本公开不限于此。根据本公开的某些实施例，射线源组件10或射线源组件20可以包括一个或多个射线源100。
根据本公开的某些实施例，每个射线源100是分布式射线源。在示例 性实施例中，每个射线源100具有单独的壳体以限定单独的真空空间。每个射线源100包括封装在壳体内的多个靶点(图1和图2中未示出)。在示例性实施例中，每个射线源100的多个靶点具有均匀的靶点间距。
如上所述，当成像系统包括多个射线源100时，每个射线源100限定单独的真空空间，因此不与其他射线源100共用真空空间。不同的射线源100的真空空间不连通。根据本公开的某些实施例，每个射线源100可以与其他射线源100独立地被拆卸和/或安装在成像系统中。
在一些实施例中，每个射线源100的多个靶点可以沿直线分布。在一些实施例中，射线源100的壳体的形状也可以对应于靶点的分布。例如，当射线源100的靶点沿直线分布时，射线源100的壳体也可以具有直线型的外轮廓，例如图1所示。
上文描述每个射线源100中的多个靶点沿直线排布。但是，本公开不限于此。在一些实施例中，射线源100中的多个靶点还可以沿弧线、折线等排布。图5是根据本公开的某些实施例的成像系统的示意图。在一些实施例中，如图5所示，位于检查区域下方的射线源100中的多个靶点(图5中未示出)沿弧线排布。相应地，沿行进方向观察，射线源100的壳体也可以具有弧形的外轮廓。这种情况下，射线源100的弧形轮廓可以为传送装置的安装提供充足的空间。
根据本公开的某些实施例，射线源组件10的多个射线源100可以具有相同或不同的尺寸。根据本公开的某些实施例，射线源组件20的多个射线源100可以具有相同或不同的尺寸。例如，如图1和图2所示，射线源组件10的三个射线源具有两种不同的尺寸，射线源组件20的三个射线源也具有两种不同的尺寸。
根据本公开的某些实施例，射线源组件10、20的每个射线源100具有一个射线发射范围。根据本公开的某些实施例，在射线源组件10包括多个射线源100时，射线源组件10的多个射线源100可以提供一个组合射线发射范围。在一些实施例中，射线源组件10的组合射线发射范围可以是连续的或不连续的。根据本公开的某些实施例，在射线源组件20包括多个射线源100时，射线源组件20的多个射线源100可以提供一个组合射 线发射范围。在一些实施例中，射线源组件20的组合射线发射范围可以是连续的或不连续的。
在一些实施例中，射线源组件10、20的射线发射范围经选择，以使得被检查对象能够全部落入该射线发射范围内。由此，被检查对象能够接受完整的透视检查，从而提高成像系统的成像完整性。
在一些实施例中，射线源组件10、20的射线发射范围经选择，以使得被检查对象的感兴趣部分能够落入该射线发射范围内。由此，可以仅专注于对被检查对象的感兴趣部分的透视检查，从而可以在满足成像要求的情况下降低成像系统的功耗和成本。
根据本公开的某些实施例，当射线源组件10包括多个射线源100时，射线源组件10的所有射线源100的靶点都布置在同一平面(以下称为“第一射线源平面”)内，即射线源组件10的多个射线源100共面设置。根据本公开的某些实施例，当射线源组件20包括多个射线源100时，射线源组件20的所有射线源100的靶点都布置在同一平面(以下称为“第二射线源平面”)内，即射线源组件20的多个射线源100共面设置。在本文中，“靶点布置在同一平面内”表示靶点的出束点都布置在同一平面内。
在示例性实施例中，第一射线源平面与第二射线源平面基本上平行。在一些实施例中，第一射线源平面与行进方向基本上垂直。在一些实施例中，第二射线源平面与行进方向基本上垂直。
根据本公开的某些实施例，射线源组件10的多个射线源100布置成没有相互干涉。在一些实施例中，当射线源组件10包括多个射线源100时，射线源组件10的多个射线源100布置成围绕检查区域间隔分布。在一些实施例中，当射线源组件10包括多个射线源100时，射线源组件10的多个射线源100布置成围绕检查区域连续分布。在一些实施例中，例如如图1所示，沿行进方向观察，射线源组件10的多个射线源100可以包括位于检查区域下方的射线源100、位于检查区域左侧的射线源100和/或位于检查区域右侧的射线源100。
根据本公开的某些实施例，射线源组件20的多个射线源100布置成没有相互干涉。在一些实施例中，当射线源组件20包括多个射线源100 时，射线源组件20的多个射线源100布置成围绕检查区域间隔分布。在一些实施例中，当射线源组件20包括多个射线源100时，射线源组件20的多个射线源100布置成围绕检查区域连续分布。在一些实施例中，例如如图1所示，沿行进方向观察，射线源组件20的多个射线源100可以包括位于检查区域下方的射线源100、位于检查区域左侧的射线源100和/或位于检查区域右侧的射线源100。
下面参照附图详细描述根据本公开的某些实施例的探测器组件的结构。
根据本公开的某些实施例，例如如图3所示，探测器组件30包括多个第一探测器单元310、多个第二探测器单元320和探测器支架330。多个第一探测器单元310用于接收从射线源组件10发射并经过检查区域的X射线。多个第二探测器单元320用于接收从射线源组件20发射并经过检查区域的X射线。根据本公开的某些实施例，多个第一探测器单元310和多个第二探测器单元320都安装在探测器支架330上。
根据本公开的某些实施例，每个探测器单元310、320可以是单能探测器单元，双能探测器单元或能谱探测器单元等。但是，应当理解本公开的探测器单元的类型不限于以上三种类型探测器单元。
在示例性实施例中，多个第一探测器单元310布置在同一平面(以下称为“第一探测器平面”)内。在示例性实施例中，多个第二探测器单元320布置在同一平面(以下称为“第二探测器平面”)内。在本文中，“探测器布置在同一平面内”表示探测器的中心面(例如探测器晶体中心面)都布置在同一平面内。例如，通过相同的定位基准使得多个第一探测器单元310或多个第二探测器单元320的中心面布置在同一平面内。在一些实施例中，第一探测器单元310包括单排探测器晶体或多排探测器晶体，和/或第二探测器单元320包括单排探测器晶体或多排探测器晶体。
在示例性实施例中，第一探测器平面与第二探测器平面基本上平行。在一些实施例中，第一探测器平面与行进方向基本上垂直。在一些实施例中，第二探测器平面与行进方向基本上垂直。
在一些实施例中，沿行进方向，射线源组件10的第一射线源平面与 多个第一探测器单元310的第一探测器平面间隔开。在示例性实施例中，射线源组件10的第一射线源平面与多个第一探测器单元310的第一探测器平面基本上平行。
在一些实施例中，沿行进方向，射线源组件20的第二射线源平面与多个第二探测器单元320的第二探测器平面间隔开。在示例性实施例中，射线源组件20的第二射线源平面与多个第二探测器单元320的第二探测器平面基本上平行。
根据本公开的某些实施例，第一射线源平面、第一探测器平面、第二探测器平面和第二射线源平面沿行进方向依次分布。在示例性实施例中，例如如图2所示，沿着行进方向，射线源组件10和射线源组件20分别设置在探测器组件30的两侧。由此，根据本公开的某些实施例的成像系统具有两个射线源平面，两个射线源平面分别位于探测器组件的两侧。
在一些实施例中，第一射线源平面、第一探测器平面、第二探测器平面和第二射线源平面彼此基本上平行。在一些实施例中，第一射线源平面、第一探测器平面、第二探测器平面和第二射线源平面与行进方向基本上垂直。
在一些实施例中，探测器支架330具有探测器支架中心面，例如如图2所示。在本文中，“探测器支架中心面”表示探测器支架330沿行进方向的几何中心面。根据本公开的某些实施例，探测器支架中心面基本上平行于第一射线源平面和/或第二射线源平面。在一些实施例中，探测器支架中心面基本上平行于第一探测器平面和/或第二探测器平面。在示例性实施例中，探测器支架中心面与行进方向基本上垂直。根据本公开的某些实施例，第一射线源平面、探测器支架中心面和第二射线源平面沿行进方向依次分布。由此，根据本公开的某些实施例的成像系统具有两个射线源平面和一个探测器支架中心面，两个射线源平面分别位于探测器支架中心面的两侧。
根据本公开的某些实施例，射线源组件10、20和探测器组件30布置成没有相互干涉。在一些实施例中，沿行进方向，射线源组件10的多个射线源100与探测器组件30的相邻最外侧部分(例如，多个第一探测器 单元310或探测器支架330的与射线源组件10相对的最外侧部分)间隔开预定距离。在一些实施例中，沿行进方向，射线源组件20的多个射线源100与探测器组件30的相邻最外侧部分(例如，多个第二探测器单元320或探测器支架330的与射线源组件20相对的最外侧部分)间隔开预定距离。在一些实施例中，如图4所示，探测器单元310(或320)与射线源100的靶点间隔开。由此，射线源组件10或20发射的X射线在经过检查区域前不会被探测器组件30遮挡。
在一些实施例中，探测器组件30中探测器单元的布置可以根据射线源10、20的排布和/或被检查对象的尺寸等因素来设置。在一些实施例中，探测器组件30中探测器单元的布置还可以采用成本效益高的排布，即以尽量少的探测器单元来满足成像需求。
根据本公开的某些实施例，探测器组件30的多个第一探测器单元310布置成至少覆盖射线源组件10的射线发射范围。根据本公开的某些实施例，探测器组件30的多个第二探测器单元320布置成至少覆盖射线源组件20的射线发射范围。由此，探测器组件30可以覆盖射线源组件10和20的射线发射范围，从而可以覆盖检查区域中的整个成像范围。这种情况下，探测器组件30的布置可以充分利用射线源发射的X射线，提高成像质量和检查准确性。
在一些实施例中，多个第一探测器单元310布置成至少覆盖射线源组件10的一部分射线发射范围(例如对应于被检查对象的感兴趣部分的射线发射范围)。根据本公开的某些实施例，多个第二探测器单元320布置成至少覆盖射线源组件20的一部分射线发射范围(例如对应于被检查对象的感兴趣部分的射线发射范围)。由此，探测器组件30可以覆盖射线源组件10和20的经选择的射线发射范围，从而可以覆盖检查区域中的主要成像范围。这种情况下，探测器组件30的布置可以在保证足够的成像质量和检查准确性的情况下降低成像系统的成本。
在示例性实施例中，探测器组件30的多个第一探测器单元310完整地围绕检查区域延伸。由此，多个第一探测器单元310组成一个完整且连续的第一探测器环。在一些实施例中，第一探测器环可以是圆环、方形 环、矩形环、多边形环等。例如，如图2和图3所示，多个第一探测器单元310构成方形环。
在示例性实施例中，探测器组件30的多个第二探测器单元320完整地围绕检查区域延伸。由此，多个第二探测器单元320组成一个完整且连续的第二探测器环。在一些实施例中，第二探测器环可以是圆环、方形环、矩形环、多边形环等。例如，如图2和图3所示，多个第二探测器单元320构成方形环。
上文描述多个第一探测器单元310或多个第二探测器单元320组成一个完整的探测器环。但是，本公开不限于此。在某些实施例中，多个第一探测器单元310或多个第二探测器单元320组成的探测器环可以是不完整的，即存在缺口部分。在某些实施例中，多个第一探测器单元310分成多段，不同段的第一探测器单元310可以围绕检查区域间隔地分布。在某些实施例中，多个第二探测器单元320分成多段，不同段的第二探测器单元320可以围绕检查区域间隔地分布。
根据本公开的某些实施例，成像系统还可以构造成基于探测器组件30的多个第一探测器单元310和多个第二探测器单元320的检测数据来重建被检查对象的三维扫描(CT)图像。根据本公开的某些实施例，成像系统在重建被检查对象的三维扫描图像时可以采用迭代重建算法、解析重建算法等或不同重建算法的结合。例如，如果射线源组件10和20相对于检查区域具有大于180度的组合扫描角度，成像系统可以优先选择解析重建算法，以提高重建速度并降低对计算性能的要求。例如，如果射线源组件10和20相对于检查区域具有小于150度的组合扫描角度，成像系统可以优先选择迭代重建算法或者以解析结果作为迭代算法的初值。根据本公开的某些实施例，成像系统采用的识别算法可以单独基于三维扫描(CT)图像或数字成像(DR)图像，或同时基于上述两种图像。
根据本公开的某些实施例，每个射线源100具有一个扫描角度。在本文中，每个射线源100的“扫描角度”表示该射线源100的所有靶点相对于检查区域(例如相对于检查区域的中心轴线)的角度范围。在本文中，检查区域的中心轴线表示沿行进方向观察穿过检查区域的大致中心并且与探 测器支架中心面基本上垂直的轴线。根据本公开的某些实施例，在成像系统包括多个射线源100时，相对于检查区域处于不同扫描位置的多个射线源100(射线源组件10和20的所有射线源100)可以提供一个组合扫描角度。在本文中，“组合扫描角度”表示将处于多个扫描位置的多个射线源100相对于检查区域的扫描角度组合在一起所产生的扫描角度。在一些实施例中，处于多个扫描位置的多个射线源100相对于检查区域的组合扫描角度可以是连续的或不连续的。
根据本公开的某些实施例，沿行进方向观察，射线源组件10和20相对于检查区域具有大于120度的组合扫描角度。当成像系统的组合扫描角度大于120度时，成像系统能够基本实现三维图像重建。在示例性实施例中，沿行进方向观察，射线源组件10和20相对于检查区域具有大于180度的组合扫描角度。当成像系统具有超过180度的组合扫描角度时，成像系统能够产生更完整的扫描数据，并且产生更好的CT扫描效果和更好的三维扫描图像。
根据本公开的某些实施例，成像系统构造成使得射线源组件10发射的X射线能够经过检查区域并且被多个第一探测器单元310接收到，并且射线源组件20发射的X射线能够经过检查区域并且被多个第二探测器单元320接收到。在一些实施例中，成像系统构造成使得射线源组件10发射的X射线能够在行进方向上覆盖第一探测器单元310和/或射线源组件20发射的X射线能够在行进方向上覆盖第二探测器单元320。
根据本公开的某些实施例，成像系统构造成使得每个射线源100发射的X射线在经过检查区域之前不会被探测器组件30遮挡。在示例性实施例中，探测器组件30的每个第一探测器单元310设置成不遮挡射线源组件10的同侧的一个或多个射线源100发射的X射线，并且能够接收射线源组件10的其他侧的一个或多个射线源100发射的X射线。在示例性实施例中，探测器组件30的每个第二探测器单元320设置成不遮挡射线源组件20的同侧的一个或多个射线源100发射的X射线，并且能够接收射线源组件20的其他侧的一个或多个射线源100发射的X射线。
下面参照附图详细描述根据本公开的某些实施例的射线源和探测器单 元的布置结构。
根据本公开的某些实施例，射线源组件10的每个射线源100的靶点都设置成沿行进方向朝着多个第一探测器单元310偏转第一偏转角度，使得射线源组件10的每个射线源100发射的X射线能够经过检查区域并且被多个第一探测器单元310接收到。在一些实施例中，第一偏转角度设置成使得射线源组件10的每个射线源100发射的X射线能够在行进方向上覆盖第一探测器单元310。在一些实施例中，第一偏转角度设置成使得射线源组件10的每个射线源100发射的X射线在经过检查区域之前不会被多个第一探测器单元310遮挡。
根据本公开的某些实施例，射线源组件20的每个射线源100的靶点都设置成沿行进方向朝着多个第二探测器单元320偏转第二偏转角度，使得射线源组件20的每个射线源100发射的X射线能够经过检查区域并且被多个第二探测器单元320接收到。在一些实施例中，第二偏转角度设置成使得射线源组件20的每个射线源100发射的X射线能够在行进方向上覆盖第二探测器单元320。在一些实施例中，第二偏转角度设置成使得射线源组件20的每个射线源100发射的X射线在经过检查区域之前不会被多个第二探测器单元320遮挡。
在示例性实施例中，第一偏转角度与第二偏转角度相等。
图6A示出根据本公开的某些实施例的射线源和探测器单元的截面示意图。在示例性实施例中，如图6A所示，射线源100沿行进方向朝着探测器单元310(或320)偏转一个角度。请注意图6A中未示出与射线源100同侧的探测器单元，而仅示出与该射线源100相对的一个探测器单元。在一些实施例中，每个射线源100围绕其靶点的轴线偏转。在示例性实施例中，每个射线源100偏转为使得该射线源100发射的X射线能够在行进方向上覆盖相应的探测器单元310(或320)。通过将射线源100相对于探测器单元偏转，射线源100发射的X射线可以更有效地被相应的探测器单元接收到。此外，射线源100发射的X射线可以避开同侧的探测器单元，并且还可以被其他侧的探测器单元接收到。
根据本公开的某些实施例，射线源组件10还可以包括准直器，用于 使第一射线源组件10的射线源100发射的X射线的方向沿行进方向朝着多个第一探测器单元310偏转第一倾斜角度，使得射线源组件10的射线源100发射的X射线能够经过检查区域并且被多个第一探测器单元310接收到。在一些实施例中，第一倾斜角度设置成使得射线源组件10的每个射线源100发射的X射线能够在行进方向上覆盖第一探测器单元310。在一些实施例中，第一倾斜角度设置成使得射线源组件10的每个射线源100发射的X射线在经过检查区域之前不会被多个第一探测器单元310遮挡。
根据本公开的某些实施例，射线源组件20还可以包括准直器，用于使第二射线源组件20的射线源100发射的X射线的方向沿行进方向朝着多个第二探测器单元320偏转第二倾斜角度，使得射线源组件20的射线源100发射的X射线能够经过检查区域并且被多个第二探测器单元320接收到。在一些实施例中，第二倾斜角度设置成使得射线源组件20的每个射线源100发射的X射线能够在行进方向上覆盖第二探测器单元320。在一些实施例中，第二倾斜角度设置成使得射线源组件20的每个射线源100发射的X射线在经过检查区域之前不会被多个第二探测器单元320遮挡。
在示例性实施例中，第一倾斜角度与第二倾斜角度相等。
图6B示出根据本公开的某些实施例的射线源和探测器单元的截面示意图。在示例性实施例中，如图6B所示，射线源100发射的X射线受准直器(如阴影部分所示)约束，从而射线源100发射的X射线的方向朝着探测器单元310(或320)偏转一个角度。请注意图6B中未示出与射线源100同侧的探测器单元，而仅示出与该射线源100相对的一个探测器单元。在示例性实施例中，准直器构造成使射线源100发射的X射线偏转为能够在行进方向上覆盖相应的探测器单元310(或320)。通过准直器来偏转射线源100发射的X射线的方向，射线源100发射的X射线可以更有效地被相应的探测器单元接收到。此外，射线源100发射的X射线可以避开同侧的探测器单元，并且还可以被其他侧的探测器单元接收到。
上文描述通过偏转射线源或者利用准直器来使X射线能够被探测器单元接收到。但是，本公开不限于此。根据本公开的某些实施例，成像系统的射线源100还可以构造成使得发射的X射线沿行进方向具有足够宽的射 线束宽度，以在行进方向上覆盖探测器单元310或320。例如，射线源100的准直器可以具有较宽的缝宽。在这种情况下，射线源100发射的部分X射线会落在探测器单元的接收范围以外。在一些实施例中，成像系统还可以设置额外的屏蔽部件(例如沿行进方向设置在探测器单元的一侧)，以屏蔽落在探测器单元的接收范围以外的X射线。
在一些实施例中，探测器组件30设置成相对于射线源组件10、20更靠近检查区域的中心。在一些实施例中，在成像系统包括多个射线源100时，探测器组件30设置成相对于所有射线源100更靠近检查区域的中心。由此，探测器组件30设置成位于射线源组件10、20的径向内侧。
根据本公开的某些实施例，射线源组件10中的靶点的数量与射线源组件20中的靶点的数量可以相同或者不同。根据本公开的某些实施例，沿行进方向观察，射线源组件10中靶点的分布位置与射线源组件20中靶点的分布位置没有完全重合。图7是根据本公开的某些实施例的成像系统的靶点分布的示意图。在一些实施例中，如图7所示，射线源组件10和20中的靶点分布没有完全重合。由此，射线源组件10和射线源组件20的靶点分布位置能够相互补充，以提高用于有效成像的靶点数量并且提供更大的组合扫描角度。
在一些实施例中，沿行进方向观察，射线源组件10中靶点的分布位置与射线源组件20中靶点的分布位置相互错开。由此，射线源组件10和20中的靶点分布避免存在两个靶点位于相同位置。因此，成像系统可以充分利用射线源组件10和20的完全相互交错的靶点来成像，并且可以提高成像精度和质量。
根据本公开的某些实施例，沿行进方向观察，射线源组件10的每个射线源100的投影没有完全落在射线源组件20的任意射线源100的投影内，并且射线源组件20的每个射线源100的投影没有完全落在射线源组件10的任意射线源100的投影内。这种情况下，例如如图1和图2所示，射线源组件10和射线源组件20中的各个射线源100的布置不完全一致，在射线源组件10和20中不存在相互完全重叠的射线源100或者不存在一个射线源100完全落入在另一射线源100的范围内。由此，射线源组件10 和射线源组件20的射线发射范围和扫描范围能够相互补充，以提高用于有效成像的靶点数量并且提供更大的组合扫描角度。
在一些实施例中，沿行进方向观察，射线源组件10的多个射线源100的投影与射线源组件20的多个射线源100的投影相互错开。在这种情况下，射线源组件10和射线源组件20中的各个射线源100彼此完全交错布置。由此，成像系统可以充分利用射线源组件10和20的所有射线源来成像，并且可以提高成像精度和质量。
根据本公开的某些实施例，成像系统还可以包括射线源控制装置。射线源控制装置用于控制射线源组件10和射线源组件20的射线发射。在一些实施例中，射线源控制装置构造成使得在同一时刻，射线源组件10中至多只有一个靶点发射X射线并且射线源组件20中至多只有一个靶点发射X射线。由此，第一射线源平面中不会存在两个以上靶点同时发射X射线，第二射线源平面中也不会存在两个以上靶点同时发射X射线。在同一时刻，成像系统可以存在来自第一射线源平面的一个靶点和来自第二射线源平面的一个靶点同时发射X射线。根据本公开的某些实施例，射线源控制装置可以构造成分别控制射线源组件10和射线源组件20的射线发射，例如靶点发射顺序、发射频率、发射电流等。
根据本公开的某些实施例，射线源组件10和20的至少一个靶点是数字成像(DR)靶点。在被探测器组件30接收到后，DR靶点发射的X射线可以用于生成DR图像。由此，根据本公开的某些实施例的成像系统可以同时用于CT成像和DR成像。在一些实施例中，射线源控制装置构造成使得该数字成像靶点的射线发射频率高于其他靶点的射线发射频率。在一些实施例中，成像系统包括从射线源组件10和20中选出的多个DR靶点。在一些实施例中，当成像系统具有多个DR靶点时，这些DR靶点可以相对于检查区域处于不同的扫描位置，即用于生成不同视角的DR图像。
上文描述选用射线源组件10和20中的一个或多个靶点作为DR靶点。但是，本公开不限于此，在一些实施例中，成像系统还可以设置单独的DR靶点，即DR靶点独立于射线源组件10和20中的靶点。在这种情 况下，成像系统还可以设置单独的DR探测器单元，以接收该单独的DR靶点发射的X射线。
应当理解，上文所述的射线源和探测器单元的布置、数量和形状等仅是示例性的，而不应该认为是对本公开的限制。
下面详细描述根据本公开的某些实施例的成像方法。根据本公开的某些实施例，可以使用上述任意成像系统来实施该成像方法。
下面以被检查对象先后经过射线源组件10和射线源组件20为例来描述根据本公开的某些实施例的成像方法。但是，应当理解被检查对象还可以先后经过射线源组件20和射线源组件10。
在步骤S 10中，使被检查对象承载于传送装置上，并且使传送装置传送被检查对象沿行进方向经过检查区域。在步骤S20中，控制射线源组件10、20的靶点以预定顺序发射X射线。在步骤S30中，发射的X射线经过位于检查区域中的被检查对象而被探测器组件30接收到。
在一些实施例中，成像方法还可以包括步骤S40：根据多个第一探测器单元310和多个第二探测器单元320的检测数据来重建被检查对象的三维扫描图像。在一些实施例中，成像方法还可以包括在重建被检查对象的三维扫描图像后，对被检查对象进行识别并提供识别结果。在一些实施例中，成像方法还可以包括显示三维扫描图像和/或识别结果。
在一些实施例中，在执行步骤S10前，成像方法还可以预先加载或生产配置信息或校正信息等，例如本底数据、空气数据等。
在一些实施例中，成像方法还可以包括通过探测器组件30的多个第一探测器单元310来探测被检查对象是否进入射线源组件10发射的X射线的束面。在一些实施例中，成像方法还可以包括通过探测器组件30的多个第二探测器单元320来探测被检查对象是否进入射线源组件20发射的X射线的束面。例如，通过实时地探测被检查对象是否进入射线源组件10、20的X射线的束面，成像方法可以为后续操作提供参考。
在一些实施例中，当判断被检查对象进入射线源组件10发射的X射线的束面后，成像方法还可以包括缓存和/或预处理多个第一探测器单元310的检测数据。在一些实施例中，当判断被检查对象进入射线源组件20 发射的X射线的束面后，成像方法可以开始根据多个第一探测器单元310和多个第二探测器单元320的检测数据来重建被检查对象的三维扫描图像。在一些实施例中，成像方法还可以包括当判断被检查对象完全经过射线源组件20发射的X射线的束面后，控制射线源组件10、20停止发射X射线。
在一些实施例中，成像方法还可以包括控制DR靶点发射X射线，以生成DR图像。在一些实施例中，当设置单独DR靶点时，成像方法可以通过单独DR探测器单元来接收经过由该单独DR靶点发射并且经过被检查对象的X射线。在一些实施例中，当选用射线源组件10和20中的一个或多个靶点作为DR靶点时，成像方法可以通过探测器组件30来接收经过由DR靶点发射并且经过被检查对象的X射线。
在根据本公开的某些实施例的成像方法中，所使用的成像系统的其他实施方式参见上文所述并且相应地结合到成像方法的实施例中，在此不再赘述。
尽管已经参考示例性实施例描述了本公开，但是应理解，本公开并不限于上述实施例的构造和方法。相反，本公开意在覆盖各种修改例和等同配置。另外，尽管在各种示例性结合体和构造中示出了所公开的各种元件和方法步骤，但是包括更多、更少的元件或方法的其它组合也落在本公开的范围之内。

Claims (16)

  1. 一种用于射线检查的成像系统，包括：
    检查区域，其中被检查对象能够沿行进方向被传送经过所述检查区域；
    第一射线源组件，包括多个射线源；
    第二射线源组件，包括多个射线源，其中所述第一射线源组件和所述第二射线源组件的每个射线源包括单独的壳体以限定真空空间并且包括封装在所述壳体内的多个靶点，所述第一射线源组件的所有射线源的靶点都布置在第一射线源平面内，所述第二射线源组件的所有射线源的靶点都布置在第二射线源平面内；
    多个第一探测器单元，用于接收从所述第一射线源组件发射并经过所述检查区域的X射线，所述多个第一探测器单元布置在第一探测器平面内；
    多个第二探测器单元，用于接收从所述第二射线源组件发射并经过所述检查区域的X射线，所述多个第二探测器单元都布置在第二探测器平面内；和
    探测器支架，所述多个第一探测器单元和所述多个第二探测器单元都安装在所述探测器支架上，
    其中，所述第一射线源平面、所述第一探测器平面、所述第二探测器平面和所述第二射线源平面沿所述行进方向依次分布。
  2. 根据权利要求1所述的成像系统，其中，所述第一射线源平面、所述第一探测器平面、所述第二探测器平面和所述第二射线源平面与所述行进方向基本上垂直并且彼此基本上平行。
  3. 根据权利要求1或2所述的成像系统，其中，所述成像系统还构造成基于所述多个第一探测器单元和所述多个第二探测器单元的检测数据来重建所述被检查对象的三维扫描图像。
  4. 根据权利要求3所述的成像系统，还包括射线源控制装置，用于控制所述第一射线源组件和所述第二射线源组件的射线发射，其中所述射线 源控制装置构造成使得在同一时刻所述第一射线源组件中至多只有一个靶点发射X射线并且所述第二射线源组件中至多只有一个靶点发射X射线。
  5. 根据权利要求1或2所述的成像系统，其中，所述多个第一探测器单元至少覆盖所述第一射线源组件的射线发射范围，并且所述多个第二探测器单元至少覆盖所述第二射线源组件的射线发射范围。
  6. 根据权利要求5所述的成像系统，其中，所述多个第一探测器单元构造成完整地围绕所述检查区域延伸以组成第一探测器环；和/或
    所述多个第二探测器单元构造成完整地围绕所述检查区域延伸以组成第二探测器环。
  7. 根据权利要求1或2所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件中靶点的分布位置与所述第二射线源组件中靶点的分布位置没有完全重合。
  8. 根据权利要求7所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件中靶点的分布位置与所述第二射线源组件中靶点的分布位置相互错开。
  9. 根据权利要求1或2所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件的每个射线源的投影没有完全落在所述第二射线源组件的任意射线源的投影内，并且所述第二射线源组件的每个射线源的投影没有完全落在所述第一射线源组件的任意射线源的投影内。
  10. 根据权利要求9所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件的多个射线源的投影与所述第二射线源组件的多个射线源的投影相互错开。
  11. 根据权利要求1或2所述的成像系统，其中，
    所述第一射线源组件的每个射线源的靶点都设置成沿所述行进方向朝着所述多个第一探测器单元偏转第一偏转角度，使得所述第一射线源组件的每个射线源发射的X射线在经过所述检查区域之前不会被所述多个第一探测器单元遮挡；和/或
    所述第二射线源组件的每个射线源的靶点都设置成沿所述行进方向朝着所述多个第二探测器单元偏转第二偏转角度，使得所述第二射线源组件 的每个射线源发射的X射线在经过所述检查区域之前不会被所述多个第二探测器单元遮挡。
  12. 根据权利要求1或2所述的成像系统，其中，
    所述第一射线源组件还包括第一准直器，用于使所述第一射线源组件发射的X射线的方向沿行进方向朝着所述多个第一探测器单元偏转第一倾斜角度；和/或
    所述第二射线源组件还包括第二准直器，用于使所述第二射线源组件发射的X射线的方向沿行进方向朝着所述多个第二探测器单元偏转第二倾斜角度。
  13. 根据权利要求1或2所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件和所述第二射线源组件相对于所述检查区域具有大于120度的组合扫描角度。
  14. 根据权利要求13所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件和所述第二射线源组件相对于所述检查区域具有大于180度的组合扫描角度。
  15. 根据权利要求4所述的成像系统，其中，所述第一射线源组件和所述第二射线源组件的至少一个靶点是数字成像(DR)靶点，所述射线源控制装置构造成使得所述数字成像靶点的射线发射频率高于其他靶点的射线发射频率。
  16. 根据权利要求1或2所述的成像系统，其中，所述第一探测器单元包括单排探测器晶体或多排探测器晶体，和/或所述第二探测器单元包括单排探测器晶体或多排探测器晶体。
PCT/CN2022/074837 2021-02-26 2022-01-28 用于射线检查的成像系统 WO2022179387A1 (zh)

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