WO2022173152A3 - 복제시스템 구축 및 복제값 추출방법 - Google Patents

복제시스템 구축 및 복제값 추출방법 Download PDF

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Publication number
WO2022173152A3
WO2022173152A3 PCT/KR2022/001328 KR2022001328W WO2022173152A3 WO 2022173152 A3 WO2022173152 A3 WO 2022173152A3 KR 2022001328 W KR2022001328 W KR 2022001328W WO 2022173152 A3 WO2022173152 A3 WO 2022173152A3
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WO
WIPO (PCT)
Prior art keywords
establishing
memory
value
stored
duplication system
Prior art date
Application number
PCT/KR2022/001328
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English (en)
French (fr)
Other versions
WO2022173152A2 (ko
Inventor
이성호
Original Assignee
이성호
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이성호 filed Critical 이성호
Publication of WO2022173152A2 publication Critical patent/WO2022173152A2/ko
Publication of WO2022173152A3 publication Critical patent/WO2022173152A3/ko
Priority to US18/232,829 priority Critical patent/US20230384897A1/en

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/175Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416Control or interface arrangements specially adapted for digitisers

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Environmental & Geological Engineering (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Health & Medical Sciences (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)

Abstract

본 발명은 시스템에서 부가된 인자에 의한 변화량을 검출하기 위해 기존의 상태를 복제하여 메모리에 저장하고, 메모리에 저장된 값을 기반으로 시스템의 변화량을 검출한다. 이러한 복제된 값을 추출하기 위해 소정의 전자회로가 사용되며 전자회로에서 출력되는 값을 피드백하여 조정된 입력변수는 추출되어 메모리에 저장된다.
PCT/KR2022/001328 2021-02-15 2022-01-25 복제시스템 구축 및 복제값 추출방법 WO2022173152A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US18/232,829 US20230384897A1 (en) 2021-02-15 2023-08-11 How to build a replication system and extract replication values

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020210019680A KR102365145B1 (ko) 2021-02-15 2021-02-15 복제시스템 구축 및 복제값 추출방법
KR10-2021-0019680 2021-02-15

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US18/232,829 Continuation US20230384897A1 (en) 2021-02-15 2023-08-11 How to build a replication system and extract replication values

Publications (2)

Publication Number Publication Date
WO2022173152A2 WO2022173152A2 (ko) 2022-08-18
WO2022173152A3 true WO2022173152A3 (ko) 2022-10-06

Family

ID=80495435

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2022/001328 WO2022173152A2 (ko) 2021-02-15 2022-01-25 복제시스템 구축 및 복제값 추출방법

Country Status (3)

Country Link
US (1) US20230384897A1 (ko)
KR (1) KR102365145B1 (ko)
WO (1) WO2022173152A2 (ko)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130035243A (ko) * 2011-09-29 2013-04-08 이성호 드라이빙 백 현상을 이용한 터치 검출수단, 검출방법 및 터치스크린패널과, 그러한 터치스크린패널을 내장한 표시장치
KR20140007537A (ko) * 2012-07-09 2014-01-20 삼성전기주식회사 정전용량 감지 장치, 정전용량 감지 방법 및 터치스크린 장치
KR20140121658A (ko) * 2013-04-08 2014-10-16 이성호 정전식 터치 검출수단 및 검출방법
KR20170019333A (ko) * 2014-10-13 2017-02-21 선전 후이딩 테크놀로지 컴퍼니 리미티드 지문 인식용 센서 픽셀 회로
KR20180059424A (ko) * 2016-10-31 2018-06-04 선전 구딕스 테크놀로지 컴퍼니, 리미티드 정전 용량 검출 장치, 방법 및 압력 검출 시스템

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130035243A (ko) * 2011-09-29 2013-04-08 이성호 드라이빙 백 현상을 이용한 터치 검출수단, 검출방법 및 터치스크린패널과, 그러한 터치스크린패널을 내장한 표시장치
KR20140007537A (ko) * 2012-07-09 2014-01-20 삼성전기주식회사 정전용량 감지 장치, 정전용량 감지 방법 및 터치스크린 장치
KR20140121658A (ko) * 2013-04-08 2014-10-16 이성호 정전식 터치 검출수단 및 검출방법
KR20170019333A (ko) * 2014-10-13 2017-02-21 선전 후이딩 테크놀로지 컴퍼니 리미티드 지문 인식용 센서 픽셀 회로
KR20180059424A (ko) * 2016-10-31 2018-06-04 선전 구딕스 테크놀로지 컴퍼니, 리미티드 정전 용량 검출 장치, 방법 및 압력 검출 시스템

Also Published As

Publication number Publication date
WO2022173152A2 (ko) 2022-08-18
US20230384897A1 (en) 2023-11-30
KR102365145B1 (ko) 2022-02-23

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