WO2022135635A1 - Détermination de défauts dans la courbe de la surface d'un objet à l'aide de réflexions colorées - Google Patents
Détermination de défauts dans la courbe de la surface d'un objet à l'aide de réflexions colorées Download PDFInfo
- Publication number
- WO2022135635A1 WO2022135635A1 PCT/DE2021/101022 DE2021101022W WO2022135635A1 WO 2022135635 A1 WO2022135635 A1 WO 2022135635A1 DE 2021101022 W DE2021101022 W DE 2021101022W WO 2022135635 A1 WO2022135635 A1 WO 2022135635A1
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- Prior art keywords
- object surface
- pattern
- colored light
- reflection
- light pattern
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2509—Color coding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8845—Multiple wavelengths of illumination or detection
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Signal Processing (AREA)
- Image Processing (AREA)
Abstract
L'invention concerne le domaine de la détermination de forme d'objet optique et l'identification optique de défauts dans la surface d'un objet et de la courbe de la surface d'un objet. Le système pour déterminer des défauts dans la surface d'un objet ou la courbe de la surface d'un objet est conçu pour mettre en œuvre un procédé correspondant, ce procédé comprenant les étapes qui consistent à : acquérir, au moyen d'un dispositif d'acquisition d'image, un motif d'image respectif présentant une réflexion respective d'un motif lumineux coloré à partir d'une surface d'un objet à chaque moment parmi une pluralité de moments d'un mouvement de la surface de l'objet par rapport au motif lumineux coloré ; distinguer en termes de couleur la réflexion respective du motif lumineux coloré par rapport à d'autres réflexions et d'une autre lumière réfléchie par la surface de l'objet ; et déterminer une courbe de la surface de l'objet et/ou tout défaut dans la surface de l'objet le long du mouvement et lors de la réflexion respective à partir d'une position spécifique et par comparaison de la réflexion respective par rapport au motif lumineux coloré.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112021006586.6T DE112021006586A5 (de) | 2020-12-21 | 2021-12-20 | Bestimmung von Störungen eines Objektoberflächenverlaufs mit Hilfe farbiger Reflexionen |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102020134509 | 2020-12-21 | ||
| DE102020134509.7 | 2020-12-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2022135635A1 true WO2022135635A1 (fr) | 2022-06-30 |
Family
ID=79316628
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/DE2021/101022 WO2022135635A1 (fr) | 2020-12-21 | 2021-12-20 | Détermination de défauts dans la courbe de la surface d'un objet à l'aide de réflexions colorées |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE112021006586A5 (fr) |
| WO (1) | WO2022135635A1 (fr) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04106461A (ja) * | 1990-08-28 | 1992-04-08 | Mazda Motor Corp | 表面欠陥検査装置 |
| DE19726094A1 (de) * | 1996-06-25 | 1998-03-12 | Matsushita Electric Works Ltd | Verfahren zur Bildverarbeitung |
| US20030026475A1 (en) * | 2001-08-01 | 2003-02-06 | Akira Yahashi | Three-dimensional measuring method and device, and computer program |
| US20080030744A1 (en) * | 2006-08-01 | 2008-02-07 | Beardsley Paul A | Method and system for sensing 3D shapes of objects with specular and hybrid specular-diffuse surfaces |
| WO2008044096A1 (fr) * | 2006-10-13 | 2008-04-17 | Yeditepe Üniversitesi | Procédé permettant un balayage de lumière à structure tridimensionnelle d'objets brillants ou spéculaires |
| WO2018025389A1 (fr) * | 2016-08-05 | 2018-02-08 | エヌズエンタープライズ株式会社 | Instrument de détection de point défectueux et procédé de détection de point défectueux |
| EP3715779A1 (fr) * | 2019-03-29 | 2020-09-30 | FRAUNHOFER-GESELLSCHAFT zur Förderung der angewandten Forschung e.V. | Procédé et dispositif de détermination des déformations d'un objet |
-
2021
- 2021-12-20 DE DE112021006586.6T patent/DE112021006586A5/de active Pending
- 2021-12-20 WO PCT/DE2021/101022 patent/WO2022135635A1/fr active Application Filing
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04106461A (ja) * | 1990-08-28 | 1992-04-08 | Mazda Motor Corp | 表面欠陥検査装置 |
| DE19726094A1 (de) * | 1996-06-25 | 1998-03-12 | Matsushita Electric Works Ltd | Verfahren zur Bildverarbeitung |
| US20030026475A1 (en) * | 2001-08-01 | 2003-02-06 | Akira Yahashi | Three-dimensional measuring method and device, and computer program |
| US20080030744A1 (en) * | 2006-08-01 | 2008-02-07 | Beardsley Paul A | Method and system for sensing 3D shapes of objects with specular and hybrid specular-diffuse surfaces |
| WO2008044096A1 (fr) * | 2006-10-13 | 2008-04-17 | Yeditepe Üniversitesi | Procédé permettant un balayage de lumière à structure tridimensionnelle d'objets brillants ou spéculaires |
| WO2018025389A1 (fr) * | 2016-08-05 | 2018-02-08 | エヌズエンタープライズ株式会社 | Instrument de détection de point défectueux et procédé de détection de point défectueux |
| EP3715779A1 (fr) * | 2019-03-29 | 2020-09-30 | FRAUNHOFER-GESELLSCHAFT zur Förderung der angewandten Forschung e.V. | Procédé et dispositif de détermination des déformations d'un objet |
Non-Patent Citations (1)
| Title |
|---|
| N.OTSU, THRESHOLD SELECTION METHOD FROM GRAY LEVEL HISTOGRAMS IEEE, 1979 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE112021006586A5 (de) | 2024-02-22 |
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