WO2022133943A1 - Reactor and growth device - Google Patents

Reactor and growth device Download PDF

Info

Publication number
WO2022133943A1
WO2022133943A1 PCT/CN2020/139144 CN2020139144W WO2022133943A1 WO 2022133943 A1 WO2022133943 A1 WO 2022133943A1 CN 2020139144 W CN2020139144 W CN 2020139144W WO 2022133943 A1 WO2022133943 A1 WO 2022133943A1
Authority
WO
WIPO (PCT)
Prior art keywords
chamber
reactor
gas
channel
inlet
Prior art date
Application number
PCT/CN2020/139144
Other languages
French (fr)
Chinese (zh)
Inventor
刘南柳
张浩东
申健
Original Assignee
华为技术有限公司
北京大学东莞光电研究院
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司, 北京大学东莞光电研究院 filed Critical 华为技术有限公司
Priority to CN202080108140.4A priority Critical patent/CN117062945A/en
Priority to PCT/CN2020/139144 priority patent/WO2022133943A1/en
Publication of WO2022133943A1 publication Critical patent/WO2022133943A1/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/38Nitrides

Definitions

  • the embodiments of the present application relate to the technical field of semiconductors, and in particular, to a reactor and a growth apparatus.
  • Vapor phase epitaxy is a single crystal thin layer growth method, which refers to the deposition of semiconductor materials on a single wafer in a gas phase state, so that it grows a layer with a thickness and resistivity that meets the requirements along the crystallographic axis of the single wafer. single crystal layer.
  • a carrier gas eg, nitrogen or hydrogen
  • the reactor used is generally a cylindrical reactor, and the cylindrical reactor includes: Air inlet pipe, cylinder container and gas outlet pipe, the air inlet pipe includes an air inlet connection pipe and a spiral nozzle, and the spiral nozzle is located in the cylindrical container, and the reaction gas (such as halide gas or halogen gas) is introduced from the gas inlet pipe After the cylindrical container, it reacts with the surface metal of the metal source in the cylindrical container, and then the reacted product (containing metal precursor) and the unreacted gas are output from the gas outlet pipe to the cylindrical container.
  • the reaction gas such as halide gas or halogen gas
  • the embodiments of the present application provide a reactor and a growth device, which can improve the reaction conversion rate of the reaction gas and the metal source, thereby improving the growth rate of crystals.
  • a first aspect of the embodiments of the present application provides a reactor, which at least includes: a reactor body; the reactor body has a reaction chamber inside, and two opposite side walls of the reactor body are respectively provided with inlets. an air port and an air outlet, both the air inlet and the air outlet communicate with the reaction chamber; the reaction chamber is divided into a first chamber and a second chamber, and the air inlet includes a first chamber an air inlet and a second air inlet, the first air inlet and the air outlet are respectively communicated with the first chamber, and the second air inlet is communicated with the second chamber; and A plurality of control flow holes are arranged between the first chamber and the second chamber to communicate the first chamber and the second chamber.
  • different air inlets are arranged on the reactor body, the first air inlet is communicated with the first chamber, the second air inlet is communicated with the second chamber, and the third air inlet is communicated with the second chamber.
  • the first chamber and the second chamber are communicated through a plurality of control flow holes, so that the gas entering the second chamber through the second air inlet can be sprayed into the first chamber through the plurality of control flow holes, forming a dense
  • the gas curtain layer can promote the reaction gas entering the first chamber through the second air inlet to fully contact with the metal source in the first chamber, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and to a certain extent. crystal growth rate.
  • the second chamber is located above the first chamber.
  • the gas entering the second chamber from the second air inlet is sprayed into the first chamber through the plurality of control flow holes, an air curtain layer from top to bottom can be formed, and the gas in the second chamber passes through the plurality of control flow holes.
  • the holes are sprayed into the first chamber from top to bottom, which can have a greater impact on the reaction gas entering the first chamber through the second air inlet, so that the reaction gas can more fully interact with the metal source in the first chamber touch.
  • a first baffle is arranged between the first chamber and the second chamber, and the first baffle is provided with a plurality of the flow control holes, so as to The first chamber is communicated with the second chamber.
  • a plurality of the control flow holes are evenly distributed on the first baffle plate; or, a plurality of the control flow holes are distributed on the first baffle plate at intervals, and the In the direction from the end of the first baffle plate close to the air inlet to the end of the first baffle plate close to the air outlet, the density of the control flow holes gradually increases;
  • the control flow holes are distributed on the first baffle at intervals, and in a direction from an end of the first baffle close to the air inlet to an end of the first baffle close to the air outlet, the The density of the control flow holes gradually decreases.
  • an air curtain layer can be formed relatively uniformly, so that the gas pair in the second chamber enters the first chamber through the second air inlet
  • the reaction gas produces a uniform impact.
  • the gas in the second chamber is sprayed into the first chamber through the plurality of control flow holes, in the direction from the end of the first baffle close to the air inlet to the end of the first baffle close to the air outlet, the second The gas in the chamber forms a denser and denser gas curtain, thereby producing increasingly denser impact on the reaction gas entering the first chamber through the second gas inlet.
  • the gas in the second chamber when the gas in the second chamber is sprayed into the first chamber through the plurality of control flow holes, in the direction from the end of the first baffle plate close to the air outlet to the end of the first baffle plate close to the air inlet
  • the gas in the chamber forms a denser and denser gas curtain, thereby producing increasingly denser impact on the reaction gas entering the first chamber through the second gas inlet.
  • the specific distribution mode of the plurality of control flow holes on the first baffle can also be flexibly set according to the requirements of the actual application scenario.
  • the diameter of the control flow hole is 50nm-500um.
  • the diameter of the control flow hole is 20um-80um.
  • the diameter of the control flow hole is set to be small, so that when the gas entering the second chamber is sprayed into the first chamber through a plurality of control flow holes, a relatively dense air curtain layer is formed, so that the reaction gas can interact with the first chamber.
  • the metal source in the room is more fully contacted.
  • the distance between two adjacent flow control holes in the plurality of control flow holes is 1-3 mm.
  • each of the flow control holes is formed with an extension extending from a side facing the first chamber.
  • a spout-type structure can be formed at the position of each control flow hole, through which the gas in the second chamber enters the first chamber.
  • the cross-sectional shape of the extension portion is the same as the shape of the flow control hole.
  • the extension length of the extension portion is 1-3 mm.
  • a second baffle is arranged between the reaction chamber and the gas outlet; one end of the second baffle is connected to the lower bottom wall of the reactor body, and the A first gap is formed between the other end of the second baffle and the upper bottom wall of the reactor body.
  • a second baffle is arranged between the reaction chamber and the gas outlet, one end of the second baffle is connected to the lower bottom wall of the reactor body, and the other end of the second baffle is connected to the upper bottom wall of the reactor body
  • a first gap is formed. Part of the incompletely reacted reaction gas in the first chamber and the metal source vapor in the first chamber are blocked by the second baffle and return to form a vortex after encountering the second baffle. Part of the incompletely reacted reaction gas in the chamber can contact and react more fully with the metal source steam in the first chamber, and the gas generated after the reaction flows out of the reaction chamber through the first gap.
  • the reaction chamber further has at least one channel, the inlet of the channel communicates with the first chamber, and the outlet of the channel communicates with the gas outlet.
  • the inlet of the channel is communicated with the first chamber, and the outlet of the channel is communicated with the gas outlet, so that the circulation path in the reaction chamber can be increased, so that the partially reacted incompletely reacted in the first chamber can be increased.
  • the reaction gas and the metal source vapor in the first chamber can further react in the channel, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and increasing the crystal growth rate to a certain extent.
  • the reaction chamber has two channels; the inlet of the first channel of the two channels is communicated with the first chamber, and the outlet of the first channel is connected to the first channel.
  • the inlet of the second channel of the two channels is communicated with, and the outlet of the second channel is communicated with the gas outlet; and the inlet of the first channel and the outlet of the second channel are located in the reactor the same side of the body.
  • the inlet of the first channel is communicated with the first chamber
  • the outlet of the first channel is communicated with the inlet of the second channel
  • the outlet of the second channel is communicated with the gas outlet
  • the outlet of the first channel is communicated with the gas outlet.
  • the inlet and the outlet of the second channel are located on the same side of the reactor body, which can further increase the flow path in the reaction chamber and save the space occupied by the first channel and the second channel in the reaction chamber.
  • At least one of the channels is provided with a flow blocking structure; the channel has a first side wall, a second side wall, an upper bottom wall and a lower bottom wall; the flow blocking structure is related to all the flow blocking structures. Any one, any two or any three of the first side wall, the second side wall, the upper bottom wall and the lower bottom wall are fixedly connected, and the flow blocking structure is connected to the first side wall.
  • a second gap is formed between at least one of the side wall, the second side wall, the upper bottom wall, and the lower bottom wall.
  • the partially reacted reactive gas in the first chamber and the metal source vapor in the first chamber are blocked by the blocking structure to form a vortex after entering the channel, which can effectively prevent incomplete reaction.
  • the escape of the reacted reactant gas and the metal source steam enables the partially reacted reactant gas and the metal source steam in the first chamber to react more fully, and the gas generated after the full reaction flows out of the reaction chamber through the second gap, thereby ensuring that conversion and crystal growth rate.
  • the bluff structure includes: at least one bluff body; the bluff body is fixedly connected to one of the upper bottom wall and the lower bottom wall of the channel, and the bluff body is connected to one of the upper bottom wall and the lower bottom wall of the channel.
  • the second gap is formed between the other of the upper bottom wall and the lower bottom wall of the channel.
  • the bluff body By arranging one or more bluff bodies in at least one channel, the bluff body is fixedly connected with one of the upper bottom wall and the lower bottom wall of the channel, and the bluff body is connected with the upper bottom wall and the lower bottom wall of the channel.
  • a second gap is formed between the other, so that after the partially reacted reactant gas in the first chamber and the metal source vapor in the first chamber enter the channel, the upper bottom wall and the lower bottom wall of the channel are caused by the bluff body due to the bluff body.
  • reaction gas and the metal source steam can react more fully, and then the gas generated after the sufficient reaction flows out of the reaction chamber through the second gap formed between the bluff body and the other one of the upper bottom wall and the lower bottom wall of the channel, thereby Ensure conversion rate and crystal growth rate.
  • the number of the bluff bodies is multiple; and the multiple bluff bodies are distributed at intervals along the extending direction of the channel.
  • the bluff body is a columnar structure.
  • the bluff body is a helical structure.
  • the contact area between the outer surface of the bluff body and the gas can be increased, so that the bluff body can play a better blocking effect on the gas.
  • the axial direction of the bluff body is perpendicular to the extending direction of the channel. In this way, the blocking effect of the bluff body on the gas in the channel can be further increased.
  • the reactor is a Group III metal source reactor.
  • the reactor is a gallium source reactor.
  • the reaction chamber of the reactor body has liquid gallium.
  • the gas introduced into the first gas inlet of the reactor is halide gas or halogen gas.
  • the material of the reactor is quartz or corundum. Quartz or corundum is resistant to high temperature and corrosion by halide gas or halogen gas, so that the reactor can be prevented from being damaged by high temperature resistance or corroded by halide gas or halogen gas.
  • the gas introduced into the second gas inlet of the reactor is any one or more of hydrogen, argon and nitrogen.
  • a second aspect of the embodiments of the present application provides a growth device, which at least includes: a growth device and any one of the above-mentioned reactors; wherein, an outlet of the reactor communicates with an inlet of the growth device.
  • the growth device includes at least a growth device and a reactor, and the outlet of the reactor is communicated with the inlet of the growth device.
  • the first air inlet It is communicated with the first chamber
  • the second air inlet is communicated with the second chamber
  • the first chamber and the second chamber are communicated through a plurality of control flow holes, so that the air enters through the second air inlet.
  • the gas in the second chamber can be sprayed into the first chamber through a plurality of control flow holes to form a dense air curtain layer, which can promote the reaction gas entering the first chamber through the second air inlet to interact with the metal in the first chamber.
  • the source is in full contact, so that the reaction conversion efficiency between the reaction gas and the metal source can be effectively improved.
  • the gas generated in the reactor enters the inlet of the growth device from the gas outlet and further reacts with the substances in the growth device to form crystals. Since the reaction conversion efficiency of the reactor is improved, the crystal quality in the growth device can also be improved to a certain extent. growth rate.
  • FIG. 1 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 2 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 3 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 4 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 5 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 6 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 7 is a schematic structural diagram of a reactor provided by an embodiment of the application.
  • FIG. 8 is a schematic diagram of a working process of a reactor provided by an embodiment of the application.
  • Group III wide-bandgap nitride semiconductor materials such as gallium nitride (GaN) and aluminum nitride (AlN) have great application prospects in short-wavelength optoelectronic devices and high-frequency high-power electronic devices, and vapor phase epitaxy is the current epitaxy method.
  • HVPE halide vapor phase epitaxy
  • a halide gas or halogen gas reacts with a Group III metal source (such as metal gallium or aluminum) in a reactor to form a metal-containing precursor (such as gallium chloride or aluminum chloride), Then, the surface of the substrate transported by the carrier gas (eg nitrogen or hydrogen) into the growth apparatus reacts with the ammonia gas in the growth apparatus to form a nitride semiconductor material.
  • the contact reaction time between the reaction source gas and the metal source is directly related to the effective utilization rate of the source gas, the growth rate of the GaN single crystal material and the epitaxial quality of the crystal.
  • the metal reactor gallium boat is generally a simple semi-cylindrical structure, which includes an air inlet pipe, a cylindrical container and an air outlet pipe, and the air inlet pipe includes an inlet pipe.
  • the gas connecting pipe and the spiral nozzle, and the spiral nozzle is located in the cylindrical container.
  • this metal reactor gallium boat is prone to the problem that the halide gas or the halogen gas and the metal gallium source steam are not completely reacted and directly enter the reaction chamber, and the reaction conversion rate of the reaction gas and the metal gallium source is low, resulting in a crystal growth rate. It is difficult to improve, and at the same time, the unreacted halide will corrode the crystal material and interfere with the crystal growth, causing a serious negative impact on the crystal quality of the material.
  • an embodiment of the present application provides a reactor.
  • the first air inlet is connected to the first chamber
  • the second air inlet is connected to the second chamber.
  • the first chamber and the second chamber are communicated through a plurality of control flow holes, so that the gas entering the second chamber through the second air inlet can be sprayed into the first chamber through the plurality of control flow holes , forming a dense air curtain layer, which can promote the reaction gas entering the first chamber through the second air inlet to fully contact the metal source in the first chamber, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source.
  • the growth rate of the crystal can be improved, and at the same time, the problem that the unreacted reaction gas can corrode the crystal material, interfere with the crystal growth, and cause a serious negative impact on the crystal quality of the material can be avoided.
  • the reactor 100 may at least include: a reactor body 1 , wherein the reactor body 1 has a reaction chamber 10 inside, and the reactor body 1 has a reaction chamber 10 .
  • An air inlet 20 and an air outlet 30 are respectively provided on the two opposite side walls, and both the air inlet 20 and the air outlet 30 communicate with the reaction chamber 10 .
  • the reaction chamber 10 is divided into a first chamber 101 and a second chamber 102
  • the gas inlet 20 includes a first gas inlet 201 and a second gas inlet 202
  • the first gas inlet 201 and the gas outlet 30 are respectively communicated with the first chamber 101
  • the second air inlet 202 is communicated with the second chamber 102
  • the gas entering the second chamber 102 through the second air inlet 202 can be sprayed into the first chamber 101 through the plurality of control flow holes 103 to form a dense air curtain layer, which is urged to enter the first chamber 101 through the second air inlet 202
  • the reaction gas in the first chamber 101 can fully contact the metal source in the first chamber 101, which increases the contact probability and contact time between the reaction gas and the metal source, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and further To a certain extent, the growth rate of the crystal is increased.
  • spraying into the first chamber 101 through a plurality of control flow holes 103 the problem of the conversion rate and supply fluctuation caused by the gradual decrease of the metal source liquid level with the reaction consumption can be solved.
  • the device 100 can still ensure the contact reaction between the reaction gas and the metal source even when the liquid level of the metal source drops, thereby ensuring process stability.
  • the second chamber 102 may be located above the first chamber 101 .
  • a top-to-bottom air curtain can be formed.
  • the gas is injected into the first chamber 101 from top to bottom through the plurality of control flow holes 103, which can have a greater impact on the reaction gas entering the first chamber 101 through the second air inlet 202, thereby making the reaction gas
  • the metal source in the first chamber 101 can be more fully contacted.
  • a first baffle 104 may be disposed between the first chamber 101 and the second chamber 102 , and the first baffle 104 has a plurality of flow control holes 103 to communicate the first chamber 101 and the second chamber 102 .
  • the reaction chamber 10 can be partitioned into two chambers, and the first baffle 104 can be provided with a plurality of flow control holes 103, the first chamber 101 and the second chamber 102 can be communicated, the process is simple, and the realization is easy.
  • the specific distribution of the plurality of control flow holes 103 on the first baffle 104 includes but is not limited to the following possible implementations:
  • a possible implementation is as follows: a plurality of control flow holes 103 are evenly spaced and distributed on the first baffle 104 . In this way, when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103, the air curtain layer can be formed relatively uniformly, so that the gas pair in the second chamber 102 can pass through the second intake air. The reaction gas entering the first chamber 101 through the port 202 produces a uniform impact.
  • a plurality of control flow holes 103 are distributed on the first baffle 104 at intervals, from the end of the first baffle 104 close to the air inlet 20 to the end of the first baffle 104 close to the air outlet 30 In the direction of one end, the density of the control flow holes 103 gradually increases.
  • the gas in the second chamber 102 when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103 , from the end of the first baffle 104 close to the air inlet 20 to the first baffle 104 close to the air outlet In the direction of one end of 30 , the gas in the second chamber 102 forms a denser and denser gas curtain layer, thereby producing more and more dense impact on the reaction gas entering the first chamber 101 through the second gas inlet 202 .
  • a plurality of control flow holes 103 are distributed on the first baffle 104 at intervals, from the end of the first baffle 104 close to the air inlet 20 to the end of the first baffle 104 close to the air outlet 30 . In the direction of one end, the density of the control flow holes 103 gradually decreases.
  • the gas in the second chamber 102 when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103 , from the end of the first baffle 104 close to the air outlet 30 to the first baffle 104 close to the air inlet In the direction of one end of the chamber 20 , the gas in the second chamber 102 forms a denser and denser gas curtain layer, thereby producing more and more dense impact on the reaction gas entering the first chamber 101 through the second gas inlet 202 .
  • the specific distribution mode of the plurality of control flow holes 103 on the first baffle 104 can also be flexibly set according to the requirements of airflow control in practical application scenarios, such as gradient distribution.
  • This embodiment of the present application does not limit this, nor is it limited to the above examples.
  • the diameter of the control flow hole 103 may be 50nm-500um. It should be noted here that the numerical values and numerical ranges involved in this application are approximate values, and there may be errors in a certain range due to the influence of the manufacturing process, and those skilled in the art can consider these errors to be ignored.
  • the diameter of the control flow hole 103 may be 20um-80um.
  • the diameter of the flow control hole 103 may be 30 um, 50 um, or 70 um, etc., which is not limited in the embodiment of the present application, nor is it limited to the above examples.
  • the diameter of the control flow hole 103 is set to be small, so that when the gas entering the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103, a relatively dense air curtain layer is formed, so that the reaction gas can be It is possible to make more sufficient contact with the metal source in the first chamber 101 .
  • the distance L1 between two adjacent control flow holes 103 in the plurality of control flow holes 103 may be 1-3 mm.
  • the distance L1 between two adjacent flow control holes 103 may be 1.5 mm, 2.0 mm, or 2.5 mm, etc., which is not limited in this embodiment of the present application, nor is it limited to the above examples. Setting the distance between two adjacent control flow holes 103 in the plurality of control flow holes 103 to be smaller can reduce the interval between two adjacent control flow holes 103 , so that the air entering the second chamber 102 can be reduced.
  • a denser gas curtain layer is formed, so that the reaction gas can more fully contact the metal source in the first chamber 101 .
  • the shape of the flow control hole 103 may be a circle, a cone, or a square, etc., which is not limited in the embodiments of the present application, nor is it limited to the above examples.
  • each flow control hole 103 facing the first chamber 101 may also be extended with an extension portion 1031 .
  • an extension portion 1031 By forming an extension portion 1031 on the side of each control flow hole 103 facing the first chamber 101 , a spout-type structure can be formed at the position of each control flow hole 103 , through which the gas in the second chamber 102 passes.
  • the cross-sectional shape of the extension portion 1031 may be the same as that of the flow control hole 103 . That is, when the shape of the control flow hole 103 is circular, the cross-sectional shape of the extension portion 1031 may also be circular.
  • the extension length of the extension part 1031 may be 1-3 mm.
  • the extension length of the extension portion 1031 may be 1.5 mm, 2.0 mm, or 2.5 mm, etc., which is not limited in this embodiment of the present application, nor is it limited to the above examples.
  • a second baffle 40 may also be provided between the reaction chamber 10 and the gas outlet 30, wherein one end of the second baffle 40 is connected to the lower bottom wall 11 of the reactor body, and the second baffle A first gap 50 is formed between the other end of 40 and the upper bottom wall 12 of the reactor body.
  • the flow of the reaction gas (the gas entering the second gas inlet 202 ) can be effectively changed
  • the direction and flow field effectively prevent the unreacted reaction gas and metal source steam from mixing into the reaction precursor (that is, the gas generated by the reaction between the reaction gas and the metal source steam), which greatly reduces the conversion efficiency of the reaction gas into the metal precursor.
  • the stability of the conversion efficiency of the metal precursor can be achieved, and it is favorable for large-scale production.
  • the reaction chamber 10 may further have at least one channel 105 , wherein the inlet of the channel 105 is communicated with the first chamber 101 , and the outlet of the channel 105 is connected with the gas outlet 30 connected.
  • the flow paths in the reaction chamber 10 can be increased, and the chance of contact between the reaction gas and the metal source vapor can be further increased.
  • Part of the incompletely reacted reactive gas in the first chamber 101 and the metal source vapor in the first chamber 101 can further react in the channel 105, thereby effectively improving the reaction conversion efficiency between the reactive gas and the metal source, to a certain extent Improve crystal growth rate, growth quality and product yield.
  • the reaction chamber 10 may have two channels 105 therein.
  • the inlet of the first channel 1051 of the two channels 105 is communicated with the first chamber 101
  • the outlet of the first channel 1051 is communicated with the inlet of the second channel 1052 of the two channels 105
  • the outlet of the second channel 1052 It communicates with the gas outlet 30
  • the inlet of the first channel 1051 and the outlet of the second channel 1052 are located on the same side of the reactor body 1 .
  • the flow path in the reaction chamber 10 can be further increased, and since the inlet of the first channel 1051 and the outlet of the second channel 1052 are located on the same side of the reactor body 1 , the flow path in the reaction chamber 10 can be further increased.
  • the space occupied by the first channel 1051 and the second channel 1052 in the reaction chamber 10 is saved to a certain extent.
  • At least one channel 105 may further be provided with a flow blocking structure 106, wherein the channel 105 has a first side wall, a second side wall, an upper bottom wall and a lower bottom wall,
  • the flow blocking structure 106 is fixedly connected to any one, any two or any three of the first side wall, the second side wall, the upper bottom wall and the lower bottom wall.
  • a second gap 107 is formed between at least one of the side wall, the upper bottom wall and the lower bottom wall.
  • the flow blocking structure 106 By disposing the flow blocking structure 106 in at least one channel 105, a certain obstacle can be formed to the flow of the gas, the contact time between the reaction gas and the metal source can be increased again, and the conversion efficiency of the metal precursor and the crystal epitaxial growth quality can be improved.
  • the blocking structure 106 can effectively prevent the escape of the incompletely reacted reaction gas and the metal source steam, so that some of the incompletely reacted reaction gas and the metal source steam in the first chamber 101 can fully react again, and the fully reacted gas passes through the first chamber 101.
  • the second gap 107 flows out of the reaction chamber 10, thereby ensuring the conversion rate and the crystal growth rate.
  • the flow blocking structure 106 may be provided only in the first channel 1051 , the flow blocking structure 106 may be provided only in the second channel 1052 , or the flow blocking structure 106 may be provided only in the second channel 1052 .
  • Both the first channel 1051 and the second channel 1052 are provided with a flow blocking structure 106 .
  • both the first channel 1051 and the second channel 1052 are provided with a flow blocking structure 106 to achieve a better flow blocking effect.
  • the flow blocking structure 106 may also be disposed at other positions in the reaction chamber 10 except for the channel 105 (the first channel 1051 and the second channel 1052 ), so as to have a flow blocking effect.
  • the bluff structure 106 may include: at least one bluff body 1061 , wherein the bluff body 1061 may be fixedly connected with one of the upper bottom wall and the lower bottom wall of the channel 105 , and the bluff body 1061
  • the second gap 107 may be formed between 1061 and the other of the upper bottom wall and the lower bottom wall of the channel 105 .
  • One is fixedly connected, and part of the incompletely reacted reactant gas and the metal source vapor are blocked to form a vortex, which can effectively prevent the incompletely reacted reactant gas and the metal source vapor from escaping, so that some incompletely reacted reactions in the first chamber 101 are prevented.
  • the gas and the metal source steam can react more fully, and then the gas generated after the sufficient reaction flows out of the reaction chamber through the second gap 107 formed between the bluff body 1061 and the other one of the upper bottom wall and the lower bottom wall of the channel 105 10, so as to ensure the conversion rate and crystal growth rate.
  • the number of the bluff bodies 1061 may be multiple, and the multiple bluff bodies 1061 are distributed at intervals along the extending direction of the channel 105 .
  • the number of the bluff body 1061 in the channel 105 it can further block the incompletely reacted reactant gas and the metal source vapor, and thus can more effectively prevent the incompletely reacted reactant gas and the metal source vapor from escaping, so that the first The incompletely reacted reactant gas in a chamber 101 can further react sufficiently with the metal source vapor.
  • the specific structure of the bluff body 1061 includes but is not limited to the following possible implementations:
  • the bluff body 1061 is a columnar structure.
  • the bluff body 1061 may have a cylindrical structure (as shown in FIG. 5 ) or a prismatic structure (as shown in FIG. 7 ), which is not limited in this embodiment of the present application, nor is it limited to the above examples.
  • the bluff body 1061 is a cone-shaped structure.
  • the bluff body 1061 may have a conical structure.
  • the bluff body 1061 is a helical structure.
  • the contact area between the outer surface of the bluff body 1061 and the gas can be increased, so that the bluff body 1061 can play a better blocking effect on the gas.
  • the bluff body 1061 may also be a labyrinth-like rotating structure, and the embodiment of the present application does not limit the specific arrangement of the labyrinth-like rotating structure, nor is it limited to the above examples. Moreover, the embodiments of the present application do not limit the appearance and shape of the reactor 100. Specifically, the reactor 100 can be designed into a desired shape according to the connection between the reactor 100 and the external growth equipment or the spatial arrangement. For example, the reactor 100 can be a cylinder. body, cube or cuboid, etc. In addition, the volume of the reactor 100, the space of each chamber and the volume ratio thereof can also be flexibly set according to actual process requirements, which are not limited in the embodiments of the present application.
  • the axial direction of the bluff body 1061 may be perpendicular to the extending direction of the channel 105 . In this way, the blocking effect of the bluff body 1061 on the gas in the channel 105 can be further increased.
  • the axial direction of the bluff body 1061 may also be parallel to the extension direction of the channel 105 , or the included angle formed between the axial direction of the bluff body 1061 and the extension direction of the channel 105 may be Less than 90 degrees, that is, the axial direction of the bluff body 1061 may be inclined with respect to the extending direction of the channel 105 .
  • the metal source injection operation is simple, which is beneficial to reduce maintenance costs to a certain extent. That is, the metal source can be injected through the reaction gas inlet (ie, the first gas inlet 201 ), which has the advantages of high efficiency and convenience compared to the operation of taking out the quartz boat and injecting again or using pipeline injection in the prior art.
  • the reaction gas inlet ie, the first gas inlet 201
  • the embodiment of the present application provides a reactor 100, and the reactor 100 may be a group III metal source reactor.
  • the metal source within the metal source reactor may be a Group III metal.
  • the gas introduced into the first gas inlet 201 of the Group III metal source reactor may be a halide gas or a halogen gas.
  • the halide gas can be any one or more of hydrogen chloride (HCl), hydrogen bromide (HBr) or hydrogen iodide (HI), and the halogen gas can be chlorine (Cl 2 ), bromine (Br 2 ) or any one or more of iodine gas (I 2 ).
  • the gas introduced into the second gas inlet 202 of the Group III metal source reactor can be any one or more of hydrogen, argon and nitrogen, for example, the gas introduced into the second gas inlet 202 can be hydrogen Argon gas mixture.
  • the material of the reactor 100 may be quartz or corundum.
  • the embodiment of the present application does not limit the material of the reactor 100, as long as it can resist high temperature and corrosion of halide gas or halogen gas, that is, it can prevent the reactor 100 from being damaged by high temperature resistance or being damaged by halide gas Or halogen gas corrosion can be.
  • the quartz may be high-purity quartz.
  • the Group III metal source reactor may specifically be a gallium source reactor, and the reaction chamber 10 of the reactor body 1 of the gallium source reactor has liquid gallium in it.
  • halide gas HCl, HBr or HI
  • halogen gas Cl 2 , Br 2 or I 2
  • the chamber 101 reacts with the liquid gallium in the first chamber 101 to generate a gallium halide gas (eg, gallium chloride, gallium bromide or gallium iodide).
  • Hydrogen, argon or nitrogen gas enters the first chamber 102 from the second air inlet 202, and after the second chamber 102 is sufficiently gathered, the hydrogen, argon or nitrogen gas is injected into the first chamber 101 through the control flow hole 103, A dense gas curtain layer is formed above the first chamber 101 (that is, above the liquid level of the metal source in the first chamber 101 ), so that the halide gas or the halogen gas can be fully contacted with the liquid gallium in the first chamber 101 , Therefore, the conversion efficiency of the reaction between the halide gas or the halogen gas and the liquid gallium can be effectively improved.
  • the halide gas or halogen gas flows from the side close to the first gas inlet 201 in the first chamber 101 to the side away from the first gas inlet 201.
  • the halide gas or the halogen gas and the metal gallium vapor in the first chamber 101 are blocked by the second baffle 40 and return to form a vortex, so that the first chamber 101 partially reacts incompletely
  • the halide gas or halogen gas can be more fully contacted and reacted with the metal gallium vapor, and the gas generated by the reaction flows out through the first gap 50 .
  • the gallium halide gas, the remaining incompletely reacted halide gas or the halogen gas and the metal gallium vapor in the first chamber 101 enter the first channel 1051 and the second channel 1052 from the first chamber 101 in turn, and are
  • the bluff body 1061 blocks the formation of eddy currents, which can effectively prevent the escape of incompletely reacted halide gas or halogen gas and metal gallium vapor, so that part of the incompletely reacted halide gas or halogen gas and metal gallium vapor in the first chamber 101 can be More fully reacted, and then the fully reacted gas flows out of the channel 105 through the second gap 107, and then flows out of the gallium source reactor through the gas outlet 30, thereby ensuring the reaction conversion rate of the halide gas or the halogen gas and liquid gallium.
  • the reactor 100 includes, but is not limited to, a group III metal source reactor, that is, the reactor 100 can also be a group I metal source reactor or a group II metal source reactor .
  • This embodiment of the present application does not limit this, nor is it limited to the above examples.
  • An embodiment of the present application provides a growth apparatus, and the growth apparatus includes at least a growth device and the reactor 100 in the above-mentioned first or second embodiment. Wherein, the outlet of the reactor 100 is communicated with the inlet of the growth equipment.
  • the outlet of the reactor 100 may be communicated with the gas outlet 30 of the reactor 100 , or the gas outlet 30 of the reactor 100 may be used as the outlet of the reactor 100 .
  • the gas outlet 30 of the reactor 100 is used as the outlet of the reactor 100, and the reactor 100 is a gallium source reactor as an example.
  • the gallium halide gas eg, gallium chloride, gallium bromide or gallium iodide
  • the gallium halide gas flowing out of the gas outlet 30 of the device 100 enters the growth device from the inlet of the growth device, it reacts with NH 3 in the growth device, and the surface of the substrate reacts with NH 3 .
  • a nitride semiconductor material eg, a GaN single crystal material
  • the growth device provided in the embodiment of the present application includes at least a growth device and a reactor 100.
  • the outlet of the reactor 100 is communicated with the inlet of the growth device.
  • the first air inlet 201 communicates with the first chamber 101
  • the second air inlet 202 communicates with the second chamber 102
  • a plurality of control flow holes pass between the first chamber 101 and the second chamber 102 103 is connected, so that the gas entering the second chamber 102 through the second air inlet 202 can be sprayed into the first chamber 101 through the plurality of control flow holes 103 to form a dense air curtain layer, which can promote the passage of the second air inlet
  • the reaction gas entering the first chamber 101 through the port 202 can fully contact the metal source in the first chamber 101, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source.
  • the gas generated in the reactor 100 enters the inlet of the growth device from the gas outlet 30 and further reacts with the substances in the growth device to form crystals. Since the reaction conversion efficiency of the reactor 100 is improved, it can also be avoided that the reaction gas does not remain in the reactor.
  • the problem of completely reacting and then entering the growth device can also improve the growth rate of the crystal in the growth device and the quality stability and consistency of the crystal to a certain extent, and realize the large-scale production of epitaxial single crystal materials.
  • the quality stability and consistency of crystals in the growth device can be improved by preventing the reaction gas from not completely reacting in the reactor and then entering the growth device.
  • the reaction gas and the metal source vapor By preventing the reaction gas and the metal source vapor from being mixed into the growth device with the gallium halide gas, parasitic reactions and polycrystalline growth in the growth device can be suppressed, and the unreacted reaction gas entering the growth device will corrode the crystal material and interfere with the crystal growth.
  • the crystal quality of the material poses a problem of serious negative effects, so that the quality stability and consistency of the crystals within the growth apparatus can be improved.

Abstract

Embodiments of the present application provide a reactor and a growth device. A reaction chamber is provided inside a reactor body; an air inlet and an air outlet are respectively provided on two opposite side walls of the reactor body; both the air inlet and the air outlet are communicated with the reaction chamber; the reaction chamber is divided into a first chamber and a second chamber; the air inlet comprises a first air inlet and a second air inlet; the first air inlet and the air outlet are separately communicated with the first chamber; the second air inlet is communicated with the second chamber; and a plurality of flow control through holes communicating the first chamber and the second chamber are formed between the first chamber and the second chamber, such that the reaction conversion rate of a reaction gas and a metal source can be improved, thereby improving the growth rate of crystals.

Description

反应器及生长装置Reactors and Growth Devices 技术领域technical field
本申请实施例涉及半导体技术领域,特别涉及一种反应器及生长装置。The embodiments of the present application relate to the technical field of semiconductors, and in particular, to a reactor and a growth apparatus.
背景技术Background technique
在半导体科学技术的发展中,气相外延发挥了重要作用。气相外延是一种单晶薄层生长方法,是指在气相状态下,将半导体材料淀积在单晶片上,使它沿着单晶片的结晶轴方向生长出一层厚度和电阻率合乎要求的单晶层。通常在气相外延生长单晶层之前,例如,在采用气相外延法生长Ⅲ族宽禁带氮化物半导体材料之前,需要将卤化物气体或者卤素气体与Ⅲ族金属源在反应器内反应生成含金属前驱物,然后含金属前驱物被载气(例如氮气或氢气)输运到衬底表面与氨气反应生成氮化物半导体材料。In the development of semiconductor science and technology, vapor phase epitaxy has played an important role. Vapor phase epitaxy is a single crystal thin layer growth method, which refers to the deposition of semiconductor materials on a single wafer in a gas phase state, so that it grows a layer with a thickness and resistivity that meets the requirements along the crystallographic axis of the single wafer. single crystal layer. Usually, before the single crystal layer is grown by vapor phase epitaxy, for example, before the group III wide bandgap nitride semiconductor material is grown by vapor phase epitaxy, it is necessary to react halide gas or halogen gas with a group III metal source in a reactor to form a metal-containing material. The precursor, and then the metal-containing precursor, is transported by a carrier gas (eg, nitrogen or hydrogen) to the surface of the substrate to react with ammonia gas to form a nitride semiconductor material.
现有技术中,将卤化物气体或者卤素气体与Ⅲ族金属源在反应器内反应生成含金属前驱物时,所采用的反应器一般是圆筒形的反应器,该圆筒形反应器包括进气管、圆筒容纳器和出气管,进气管包括进气连接管和螺旋喷管,且螺旋喷管位于圆筒容纳器内,反应气体(例如卤化物气体或者卤素气体)从进气管通入圆筒容纳器后,与圆筒容纳器内的金属源表层金属发生反应,然后反应后的生成物(含金属前驱物)和未反应完全的气体再从出气管输出圆筒容纳器。In the prior art, when a halide gas or a halogen gas and a Group III metal source are reacted in a reactor to generate a metal-containing precursor, the reactor used is generally a cylindrical reactor, and the cylindrical reactor includes: Air inlet pipe, cylinder container and gas outlet pipe, the air inlet pipe includes an air inlet connection pipe and a spiral nozzle, and the spiral nozzle is located in the cylindrical container, and the reaction gas (such as halide gas or halogen gas) is introduced from the gas inlet pipe After the cylindrical container, it reacts with the surface metal of the metal source in the cylindrical container, and then the reacted product (containing metal precursor) and the unreacted gas are output from the gas outlet pipe to the cylindrical container.
然而,采用上述反应器时,反应气体与金属源的反应转化率较低,从而导致晶体的生长速率较低。However, when the above reactor is used, the reaction conversion of the reaction gas and the metal source is low, resulting in a low growth rate of crystals.
发明内容SUMMARY OF THE INVENTION
本申请实施例提供一种反应器及生长装置,能够提高反应气体与金属源的反应转化率,从而能够提高晶体的生长速率。The embodiments of the present application provide a reactor and a growth device, which can improve the reaction conversion rate of the reaction gas and the metal source, thereby improving the growth rate of crystals.
本申请实施例第一方面提供一种反应器,至少包括:反应器本体;所述反应器本体的内部具有反应腔室,且所述反应器本体上相对的两个侧壁上分别设有进气口和出气口,所述进气口和所述出气口均与所述反应腔室连通;所述反应腔室分隔为第一腔室和第二腔室,所述进气口包括第一进气口以及第二进气口,所述第一进气口和所述出气口分别与所述第一腔室连通,所述第二进气口与所述第二腔室连通;且所述第一腔室和所述第二腔室之间具有多个控流通孔,以将所述第一腔室和所述第二腔室连通。A first aspect of the embodiments of the present application provides a reactor, which at least includes: a reactor body; the reactor body has a reaction chamber inside, and two opposite side walls of the reactor body are respectively provided with inlets. an air port and an air outlet, both the air inlet and the air outlet communicate with the reaction chamber; the reaction chamber is divided into a first chamber and a second chamber, and the air inlet includes a first chamber an air inlet and a second air inlet, the first air inlet and the air outlet are respectively communicated with the first chamber, and the second air inlet is communicated with the second chamber; and A plurality of control flow holes are arranged between the first chamber and the second chamber to communicate the first chamber and the second chamber.
本申请实施例提供的反应器,通过在反应器本体上设置不同的进气口,第一进气口与第一腔室相连通,第二进气口与第二腔室相连通,且第一腔室和第二腔室之间通过多个控流通孔连通,这样,通过第二进气口进入第二腔室的气体可以通过多个控流通孔喷入第一腔室内,形成致密的气帘层,能够促使通过第二进气口进入第一腔室的反应气体能够与第一腔室内的金属源充分接触,从而能够有效提高反应气体与金属源的反应转换效率,在一定程度上提高晶体的生长速率。In the reactor provided by the embodiments of the present application, different air inlets are arranged on the reactor body, the first air inlet is communicated with the first chamber, the second air inlet is communicated with the second chamber, and the third air inlet is communicated with the second chamber. The first chamber and the second chamber are communicated through a plurality of control flow holes, so that the gas entering the second chamber through the second air inlet can be sprayed into the first chamber through the plurality of control flow holes, forming a dense The gas curtain layer can promote the reaction gas entering the first chamber through the second air inlet to fully contact with the metal source in the first chamber, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and to a certain extent. crystal growth rate.
在一种可能的实现方式中,所述第二腔室位于所述第一腔室的上方。这样,从第二进气口进入第二腔室的气体通过多个控流通孔喷入第一腔室内时,能够形成从上而下的气帘层, 第二腔室内的气体通过多个控流通孔从上而下喷入第一腔室内,能够对通过第二进气口进入第一腔室的反应气体产生较大的冲击,从而使得反应气体能够与第一腔室内的金属源更加充分进行接触。In a possible implementation, the second chamber is located above the first chamber. In this way, when the gas entering the second chamber from the second air inlet is sprayed into the first chamber through the plurality of control flow holes, an air curtain layer from top to bottom can be formed, and the gas in the second chamber passes through the plurality of control flow holes. The holes are sprayed into the first chamber from top to bottom, which can have a greater impact on the reaction gas entering the first chamber through the second air inlet, so that the reaction gas can more fully interact with the metal source in the first chamber touch.
在一种可能的实现方式中,所述第一腔室和所述第二腔室之间设置有第一挡板,所述第一挡板上具有多个所述控流通孔,以将所述第一腔室和所述第二腔室连通。通过在第一腔室和第二腔室之间设置第一挡板,可以将反应腔室隔档为两个腔室,通过在第一挡板上具有多个所述控流通孔,可以将第一腔室和第二腔室连通,工艺简单,易于实现。In a possible implementation manner, a first baffle is arranged between the first chamber and the second chamber, and the first baffle is provided with a plurality of the flow control holes, so as to The first chamber is communicated with the second chamber. By arranging a first baffle between the first chamber and the second chamber, the reaction chamber can be partitioned into two chambers, and by having a plurality of the flow control holes on the first baffle, the The first chamber is communicated with the second chamber, and the process is simple and easy to realize.
在一种可能的实现方式中,多个所述控流通孔均匀间隔分布在所述第一挡板上;或者,多个所述控流通孔间隔分布在所述第一挡板上,且从所述第一挡板靠近所述进气口的一端至所述第一挡板靠近所述出气口的一端的方向上,所述控流通孔的密集程度逐渐增大;或者,多个所述控流通孔间隔分布在所述第一挡板上,且从所述第一挡板靠近所述进气口的一端至所述第一挡板靠近所述出气口的一端的方向上,所述控流通孔的密集程度逐渐减小。In a possible implementation manner, a plurality of the control flow holes are evenly distributed on the first baffle plate; or, a plurality of the control flow holes are distributed on the first baffle plate at intervals, and the In the direction from the end of the first baffle plate close to the air inlet to the end of the first baffle plate close to the air outlet, the density of the control flow holes gradually increases; The control flow holes are distributed on the first baffle at intervals, and in a direction from an end of the first baffle close to the air inlet to an end of the first baffle close to the air outlet, the The density of the control flow holes gradually decreases.
这样,第二腔室内的气体通过多个控流通孔喷入第一腔室内时,能够相对均匀的形成气帘层,从而使得第二腔室的气体对通过第二进气口进入第一腔室的反应气体产生均匀的冲击。或者,第二腔室内的气体通过多个控流通孔喷入第一腔室内时,在从第一挡板靠近进气口的一端至第一挡板靠近出气口的一端的方向上,第二腔室内的气体形成越来越密集的气帘层,从而对通过第二进气口进入第一腔室的反应气体产生越来越密集的冲击。或者,第二腔室内的气体通过多个控流通孔喷入第一腔室内时,在从第一挡板靠近出气口的一端至第一挡板靠近进气口的一端的方向上,第二腔室内的气体形成越来越密集的气帘层,从而对通过第二进气口进入第一腔室的反应气体产生越来越密集的冲击。或者,也可以根据实际应用场景的需求,对多个控流通孔在第一挡板上的具体分布方式进行灵活设定。In this way, when the gas in the second chamber is sprayed into the first chamber through the plurality of control flow holes, an air curtain layer can be formed relatively uniformly, so that the gas pair in the second chamber enters the first chamber through the second air inlet The reaction gas produces a uniform impact. Or, when the gas in the second chamber is sprayed into the first chamber through the plurality of control flow holes, in the direction from the end of the first baffle close to the air inlet to the end of the first baffle close to the air outlet, the second The gas in the chamber forms a denser and denser gas curtain, thereby producing increasingly denser impact on the reaction gas entering the first chamber through the second gas inlet. Alternatively, when the gas in the second chamber is sprayed into the first chamber through the plurality of control flow holes, in the direction from the end of the first baffle plate close to the air outlet to the end of the first baffle plate close to the air inlet The gas in the chamber forms a denser and denser gas curtain, thereby producing increasingly denser impact on the reaction gas entering the first chamber through the second gas inlet. Alternatively, the specific distribution mode of the plurality of control flow holes on the first baffle can also be flexibly set according to the requirements of the actual application scenario.
在一种可能的实现方式中,所述控流通孔的直径为50nm-500um。In a possible implementation manner, the diameter of the control flow hole is 50nm-500um.
在一种可能的实现方式中,所述控流通孔的直径为20um-80um。将控流通孔的直径设置的较小,可以使得进入第二腔室的气体通过多个控流通孔喷入第一腔室内时,形成较为致密的气帘层,从而使得反应气体能够与第一腔室内的金属源更加充分的进行接触。In a possible implementation manner, the diameter of the control flow hole is 20um-80um. The diameter of the control flow hole is set to be small, so that when the gas entering the second chamber is sprayed into the first chamber through a plurality of control flow holes, a relatively dense air curtain layer is formed, so that the reaction gas can interact with the first chamber. The metal source in the room is more fully contacted.
在一种可能的实现方式中,多个所述控流通孔中的相邻两个控流通孔之间的距离为1-3mm。将多个所述控流通孔中的相邻两个控流通孔之间的距离设置得较小,能够减小相邻两个控流通孔之间的间隔,使得进入第二腔室的气体通过多个控流通孔喷入第一腔室内时,形成更为致密的气帘层,从而使得反应气体能够与第一腔室内的金属源更加充分的进行接触。In a possible implementation manner, the distance between two adjacent flow control holes in the plurality of control flow holes is 1-3 mm. By setting the distance between two adjacent control flow holes in the plurality of control flow holes to be small, the interval between the two adjacent control flow holes can be reduced, so that the gas entering the second chamber can pass through When the plurality of control flow holes are sprayed into the first chamber, a denser gas curtain layer is formed, so that the reaction gas can be more fully contacted with the metal source in the first chamber.
在一种可能的实现方式中,每个所述控流通孔朝向所述第一腔室的一侧延伸形成有延伸部。通过在每个控流通孔朝向第一腔室的一侧延伸形成有延伸部,能够在每个控流通孔的位置处形成喷口式结构,第二腔室内的气体通过该喷口式结构进入第一腔室时,能够对第一腔室内的反应气体产生更大的冲击,从而使得反应气体能够与第一腔室内的金属源更加充分进行接触。In a possible implementation manner, each of the flow control holes is formed with an extension extending from a side facing the first chamber. By forming an extension on the side of each control flow hole facing the first chamber, a spout-type structure can be formed at the position of each control flow hole, through which the gas in the second chamber enters the first chamber. When the chamber is used, a greater impact can be generated on the reaction gas in the first chamber, so that the reaction gas can more fully contact the metal source in the first chamber.
在一种可能的实现方式中,所述延伸部的截面形状与所述控流通孔的形状相同。In a possible implementation manner, the cross-sectional shape of the extension portion is the same as the shape of the flow control hole.
在一种可能的实现方式中,所述延伸部的延伸长度为1-3mm。In a possible implementation manner, the extension length of the extension portion is 1-3 mm.
在一种可能的实现方式中,所述反应腔室和所述出气口之间设置有第二挡板;所述第二挡板的一端与所述反应器本体的下底壁相连,所述第二挡板的另一端与所述反应器本体的上底壁之间形成第一间隙。In a possible implementation manner, a second baffle is arranged between the reaction chamber and the gas outlet; one end of the second baffle is connected to the lower bottom wall of the reactor body, and the A first gap is formed between the other end of the second baffle and the upper bottom wall of the reactor body.
通过在反应腔室和出气口之间设置有第二挡板,第二挡板的一端与反应器本体的下底壁相连,第二挡板的另一端与反应器本体的上底壁之间形成第一间隙,第一腔室内部分未完全 反应的反应气体与第一腔室内的金属源蒸汽在遇到第二挡板后,被第二挡板阻挡返回而形成涡流,这样,第一腔室内部分未完全反应的反应气体与第一腔室内的金属源蒸汽能够更加充分接触反应,反应生成后的气体再通过第一间隙流出反应腔室。A second baffle is arranged between the reaction chamber and the gas outlet, one end of the second baffle is connected to the lower bottom wall of the reactor body, and the other end of the second baffle is connected to the upper bottom wall of the reactor body A first gap is formed. Part of the incompletely reacted reaction gas in the first chamber and the metal source vapor in the first chamber are blocked by the second baffle and return to form a vortex after encountering the second baffle. Part of the incompletely reacted reaction gas in the chamber can contact and react more fully with the metal source steam in the first chamber, and the gas generated after the reaction flows out of the reaction chamber through the first gap.
在一种可能的实现方式中,所述反应腔室内还具有至少一个通道,所述通道的入口与所述第一腔室相连通,所述通道的出口与所述出气口相连通。In a possible implementation manner, the reaction chamber further has at least one channel, the inlet of the channel communicates with the first chamber, and the outlet of the channel communicates with the gas outlet.
通过在反应腔室内具有至少一个通道,通道的入口与第一腔室相连通,通道的出口与出气口相连通,能够增加反应腔室内的流通路径,这样,第一腔室内部分未完全反应的反应气体与第一腔室内的金属源蒸汽能够在通道内进一步发生反应,从而有效提高反应气体与金属源的反应转换效率,在一定程度上提高晶体的生长速率。By having at least one channel in the reaction chamber, the inlet of the channel is communicated with the first chamber, and the outlet of the channel is communicated with the gas outlet, so that the circulation path in the reaction chamber can be increased, so that the partially reacted incompletely reacted in the first chamber can be increased. The reaction gas and the metal source vapor in the first chamber can further react in the channel, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and increasing the crystal growth rate to a certain extent.
在一种可能的实现方式中,所述反应腔室内具有两个所述通道;两个所述通道中的第一通道的入口与所述第一腔室连通,所述第一通道的出口与两个所述通道中的第二通道的入口相连通,所述第二通道的出口与所述出气口连通;且所述第一通道的入口与所述第二通道的出口位于所述反应器本体的同一侧。In a possible implementation manner, the reaction chamber has two channels; the inlet of the first channel of the two channels is communicated with the first chamber, and the outlet of the first channel is connected to the first channel. The inlet of the second channel of the two channels is communicated with, and the outlet of the second channel is communicated with the gas outlet; and the inlet of the first channel and the outlet of the second channel are located in the reactor the same side of the body.
通过反应腔室内具有两个通道,第一通道的入口与第一腔室连通,第一通道的出口与第二通道的入口相连通,第二通道的出口与出气口连通,且第一通道的入口与第二通道的出口位于反应器本体的同一侧,能够进一步增加反应腔室内的流通路径,且能够节省第一通道和第二通道在反应腔室内的占用空间。There are two channels in the reaction chamber, the inlet of the first channel is communicated with the first chamber, the outlet of the first channel is communicated with the inlet of the second channel, the outlet of the second channel is communicated with the gas outlet, and the outlet of the first channel is communicated with the gas outlet. The inlet and the outlet of the second channel are located on the same side of the reactor body, which can further increase the flow path in the reaction chamber and save the space occupied by the first channel and the second channel in the reaction chamber.
在一种可能的实现方式中,至少一个所述通道内设置有阻流结构;所述通道具有第一侧壁、第二侧壁、上底壁以及下底壁;所述阻流结构与所述第一侧壁、所述第二侧壁、所述上底壁和所述下底壁中的任意一者、任意两者或任意三者固定相连,所述阻流结构与所述第一侧壁、所述第二侧壁、所述上底壁和所述下底壁中的至少一者之间形成有第二间隙。In a possible implementation, at least one of the channels is provided with a flow blocking structure; the channel has a first side wall, a second side wall, an upper bottom wall and a lower bottom wall; the flow blocking structure is related to all the flow blocking structures. Any one, any two or any three of the first side wall, the second side wall, the upper bottom wall and the lower bottom wall are fixedly connected, and the flow blocking structure is connected to the first side wall. A second gap is formed between at least one of the side wall, the second side wall, the upper bottom wall, and the lower bottom wall.
通过在至少一个通道内设置有阻流结构,第一腔室内部分未完全反应的反应气体与第一腔室内的金属源蒸汽在进入通道后,被阻流结构阻挡形成涡流,能够有效防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室内部分未完全反应的反应气体与金属源蒸汽能够更加充分反应,充分反应后生成的气体再通过第二间隙流出反应腔室,从而确保转化率以及晶体生长速度。By arranging a blocking structure in at least one channel, the partially reacted reactive gas in the first chamber and the metal source vapor in the first chamber are blocked by the blocking structure to form a vortex after entering the channel, which can effectively prevent incomplete reaction. The escape of the reacted reactant gas and the metal source steam enables the partially reacted reactant gas and the metal source steam in the first chamber to react more fully, and the gas generated after the full reaction flows out of the reaction chamber through the second gap, thereby ensuring that conversion and crystal growth rate.
在一种可能的实现方式中,所述阻流结构包括:至少一个阻流体;所述阻流体与所述通道的上底壁和下底壁中的其中一者固定相连,所述阻流体与所述通道的所述上底壁和所述下底壁中的另一者之间形成所述第二间隙。In a possible implementation manner, the bluff structure includes: at least one bluff body; the bluff body is fixedly connected to one of the upper bottom wall and the lower bottom wall of the channel, and the bluff body is connected to one of the upper bottom wall and the lower bottom wall of the channel. The second gap is formed between the other of the upper bottom wall and the lower bottom wall of the channel.
通过在至少一个通道内设置有一个或多个阻流体,阻流体与通道的上底壁和下底壁中的其中一者固定相连,且阻流体与通道的上底壁和下底壁中的另一者之间形成第二间隙,这样,第一腔室内部分未完全反应的反应气体与第一腔室内的金属源蒸汽在进入通道后,由于阻流体与通道的上底壁和下底壁中的其中一者固定相连,部分未完全反应的反应气体与金属源蒸汽被阻挡形成涡流,能够有效防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室内部分未完全反应的反应气体与金属源蒸汽能够更加充分反应,然后充分反应后生成的气体再通过阻流体与通道的上底壁和下底壁中的另一者之间形成的第二间隙流出反应腔室,从而确保转化率以及晶体生长速度。By arranging one or more bluff bodies in at least one channel, the bluff body is fixedly connected with one of the upper bottom wall and the lower bottom wall of the channel, and the bluff body is connected with the upper bottom wall and the lower bottom wall of the channel. A second gap is formed between the other, so that after the partially reacted reactant gas in the first chamber and the metal source vapor in the first chamber enter the channel, the upper bottom wall and the lower bottom wall of the channel are caused by the bluff body due to the bluff body. One of them is fixedly connected, and part of the incompletely reacted reactant gas and the metal source vapor are blocked to form a vortex, which can effectively prevent the incompletely reacted reactant gas and the metal source vapor from escaping, so that part of the incompletely reacted gas in the first chamber is prevented from escaping. The reaction gas and the metal source steam can react more fully, and then the gas generated after the sufficient reaction flows out of the reaction chamber through the second gap formed between the bluff body and the other one of the upper bottom wall and the lower bottom wall of the channel, thereby Ensure conversion rate and crystal growth rate.
在一种可能的实现方式中,所述阻流体的数量为多个;多个所述阻流体沿着所述通道的延伸方向间隔分布。通过增加通道内阻流体的数量能够起到对未完全反应的反应气体与金属源蒸汽的进一步阻挡作用,因而能够更加有效的防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室内未完全反应的反应气体与金属源蒸汽能够进一步的充分反应。In a possible implementation manner, the number of the bluff bodies is multiple; and the multiple bluff bodies are distributed at intervals along the extending direction of the channel. By increasing the number of blister fluids in the channel, it can further block the incompletely reacted reactant gas and the metal source vapor, and thus can more effectively prevent the incompletely reacted reactant gas and metal source vapor from escaping, so that the first cavity can be prevented from escaping. The incompletely reacted reaction gas in the chamber and the metal source steam can further fully react.
在一种可能的实现方式中,所述阻流体为柱状结构。In a possible implementation manner, the bluff body is a columnar structure.
在一种可能的实现方式中,所述阻流体为螺旋状结构。通过将流体设置为螺旋状结构,能够够增加阻流体的外表面与气体之间的接触面积,这样,阻流体能够对气体起到更好的阻挡作用。In a possible implementation manner, the bluff body is a helical structure. By arranging the fluid in a spiral structure, the contact area between the outer surface of the bluff body and the gas can be increased, so that the bluff body can play a better blocking effect on the gas.
在一种可能的实现方式中,所述阻流体的轴向方向与所述通道的延伸方向相垂直。这样,能够进一步增加阻流体对通道内气体的阻挡效果。In a possible implementation manner, the axial direction of the bluff body is perpendicular to the extending direction of the channel. In this way, the blocking effect of the bluff body on the gas in the channel can be further increased.
在一种可能的实现方式中,所述反应器为III族金属源反应器。In a possible implementation manner, the reactor is a Group III metal source reactor.
在一种可能的实现方式中,所述反应器为镓源反应器。In a possible implementation manner, the reactor is a gallium source reactor.
在一种可能的实现方式中,所述反应器本体的所述反应腔室内具有液态镓。In a possible implementation manner, the reaction chamber of the reactor body has liquid gallium.
在一种可能的实现方式中,所述反应器的第一进气口通入的气体为卤化物气体或卤素气体。In a possible implementation manner, the gas introduced into the first gas inlet of the reactor is halide gas or halogen gas.
在一种可能的实现方式中,当所述反应器的所述第一进气口通入的气体为卤化物气体或卤素气体时,所述反应器的材质为石英或刚玉。石英或刚玉能够耐高温以及抗卤化物气体或卤素气体腐蚀,从而能够避免反应器不耐高温遭到破坏或者被卤化物气体或卤素气体腐蚀。In a possible implementation manner, when the gas introduced into the first gas inlet of the reactor is halide gas or halogen gas, the material of the reactor is quartz or corundum. Quartz or corundum is resistant to high temperature and corrosion by halide gas or halogen gas, so that the reactor can be prevented from being damaged by high temperature resistance or corroded by halide gas or halogen gas.
在一种可能的实现方式中,所述反应器的第二进气口通入的气体为氢气、氩气和氮气中的任意一种或多种。In a possible implementation manner, the gas introduced into the second gas inlet of the reactor is any one or more of hydrogen, argon and nitrogen.
本申请实施例第二方面提供一种生长装置,至少包括:生长设备以及上述任一所述的反应器;其中,所述反应器的出口与所述生长设备的入口相连通。A second aspect of the embodiments of the present application provides a growth device, which at least includes: a growth device and any one of the above-mentioned reactors; wherein, an outlet of the reactor communicates with an inlet of the growth device.
本申请实施例提供的生长装置,该生长装置至少包括生长设备以及反应器,反应器的出口与生长设备的入口相连通,通过在反应器本体上设置不同的进气口,第一进气口与第一腔室相连通,第二进气口与第二腔室相连通,且第一腔室和第二腔室之间通过多个控流通孔连通,这样,通过第二进气口进入第二腔室的气体可以通过多个控流通孔喷入第一腔室内,形成致密的气帘层,能够促使通过第二进气口进入第一腔室的反应气体能够与第一腔室内的金属源充分接触,从而能够有效提高反应气体与金属源的反应转换效率。反应器内生成的气体从出气口进入生长设备的入口与生长装置内的物质进一步发生反应生成晶体,由于反应器的反应转换效率得到了提高,从而也能够在一定程度上提高生长装置内晶体的生长速率。The growth device provided by the embodiments of the present application includes at least a growth device and a reactor, and the outlet of the reactor is communicated with the inlet of the growth device. By setting different air inlets on the reactor body, the first air inlet It is communicated with the first chamber, the second air inlet is communicated with the second chamber, and the first chamber and the second chamber are communicated through a plurality of control flow holes, so that the air enters through the second air inlet. The gas in the second chamber can be sprayed into the first chamber through a plurality of control flow holes to form a dense air curtain layer, which can promote the reaction gas entering the first chamber through the second air inlet to interact with the metal in the first chamber. The source is in full contact, so that the reaction conversion efficiency between the reaction gas and the metal source can be effectively improved. The gas generated in the reactor enters the inlet of the growth device from the gas outlet and further reacts with the substances in the growth device to form crystals. Since the reaction conversion efficiency of the reactor is improved, the crystal quality in the growth device can also be improved to a certain extent. growth rate.
结合附图,根据下文描述的实施例,示例性实施例的这些和其它方面、实施形式和优点将变得显而易见。但应了解,说明书和附图仅用于说明并且不作为对本申请实施例的限制的定义,详见随附的权利要求书。本申请实施例的其它方面和优点将在以下描述中阐述,而且部分将从描述中显而易见,或通过本申请实施例的实践得知。此外,本申请实施例的各方面和优点可以通过所附权利要求书中特别指出的手段和组合得以实现和获得。These and other aspects, implementations, and advantages of exemplary embodiments will become apparent from the embodiments described hereinafter, taken in conjunction with the accompanying drawings. However, it should be understood that the description and the accompanying drawings are only used for illustration and do not serve as a definition for the limitation of the embodiments of the present application. For details, please refer to the appended claims. Other aspects and advantages of the embodiments of the present application will be set forth in the following description, and in part will be apparent from the description, or learned by practice of the embodiments of the present application. Furthermore, the various aspects and advantages of the embodiments of the present application may be realized and attained by means of the instrumentalities and combinations particularly pointed out in the appended claims.
附图说明Description of drawings
图1为本申请一实施例提供的反应器的结构示意图;1 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图2为本申请一实施例提供的反应器的结构示意图;2 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图3为本申请一实施例提供的反应器的结构示意图;3 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图4为本申请一实施例提供的反应器的结构示意图;4 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图5为本申请一实施例提供的反应器的结构示意图;5 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图6为本申请一实施例提供的反应器的结构示意图;6 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图7为本申请一实施例提供的反应器的结构示意图;7 is a schematic structural diagram of a reactor provided by an embodiment of the application;
图8为本申请一实施例提供的反应器的工作过程示意图。FIG. 8 is a schematic diagram of a working process of a reactor provided by an embodiment of the application.
附图标记说明:Description of reference numbers:
100-反应器;1-反应器本体;10-反应腔室;101-第一腔室;102-第二腔室;103-控流通孔;1031-延伸部;104-第一挡板;105-通道;1051-第一通道;1052-第二通道;106-阻流结构;1061-阻流体;107-第二间隙;20-进气口;201-第一进气口;202-第二进气口;30-出气口;40-第二挡板;50-第一间隙;11-反应器本体的下底壁;12-反应器本体的上底壁。100-reactor; 1-reactor body; 10-reaction chamber; 101-first chamber; 102-second chamber; 103-control flow hole; 1031-extension; 104-first baffle plate; 105 - channel; 1051 - first channel; 1052 - second channel; 106 - choke structure; 1061 - choke body; 107 - second gap; 20 - air inlet; 201 - first air inlet; 202 - second 30-air outlet; 40-second baffle plate; 50-first gap; 11-lower bottom wall of the reactor body; 12-the upper bottom wall of the reactor body.
具体实施方式Detailed ways
本申请的实施方式部分使用的术语仅用于对本申请的具体实施例进行解释,而非旨在限定本申请,下面将结合附图对本申请实施例的实施方式进行详细描述。The terms used in the embodiments of the present application are only used to explain the specific embodiments of the present application, and are not intended to limit the present application. The following will describe the embodiments of the embodiments of the present application in detail with reference to the accompanying drawings.
Ⅲ族宽禁带氮化物半导体材料,例如氮化镓(GaN)和氮化铝(AlN)在短波长光电器件与高频大功率电子器件方面有着巨大的应用前景,而气相外延法是目前外延生长Ⅲ族氮化物半导体材料及其器件制备的主要方法。其中,卤化物气相外延(Hydride Vapor Phase Epitaxy,HVPE)技术由于其具有生长速率快、工艺简单等特点,目前已成为GaN单晶衬底制备的主流技术。在HVPE技术中,卤化物气体或者卤素气体(例如氯化氢或氯气)与Ⅲ族金属源(例如金属镓或铝)在反应器内反应生成含金属前驱物(例如氯化镓或氯化铝),之后被载气(例如氮气或氢气)输运到生长设备内的衬底表面与生长设备内的氨气反应生成氮化物半导体材料。其中,HVPE系统中,反应源气体与金属源的接触反应时间直接关系到源气体的有效利用率、GaN单晶材料的生长速率以及晶体的外延质量。Group III wide-bandgap nitride semiconductor materials, such as gallium nitride (GaN) and aluminum nitride (AlN), have great application prospects in short-wavelength optoelectronic devices and high-frequency high-power electronic devices, and vapor phase epitaxy is the current epitaxy method. The main methods for the growth of III-nitride semiconductor materials and their device fabrication. Among them, halide vapor phase epitaxy (Hydride Vapor Phase Epitaxy, HVPE) technology has become the mainstream technology for the preparation of GaN single crystal substrates due to its fast growth rate and simple process. In HVPE technology, a halide gas or halogen gas (such as hydrogen chloride or chlorine) reacts with a Group III metal source (such as metal gallium or aluminum) in a reactor to form a metal-containing precursor (such as gallium chloride or aluminum chloride), Then, the surface of the substrate transported by the carrier gas (eg nitrogen or hydrogen) into the growth apparatus reacts with the ammonia gas in the growth apparatus to form a nitride semiconductor material. Among them, in the HVPE system, the contact reaction time between the reaction source gas and the metal source is directly related to the effective utilization rate of the source gas, the growth rate of the GaN single crystal material and the epitaxial quality of the crystal.
目前水平式HVPE系统结构中,以Ⅲ族金属源为金属镓为例,金属反应器镓舟一般是简单的半圆柱体结构,其包括进气管、圆筒容纳器和出气管,进气管包括进气连接管和螺旋喷管,且螺旋喷管位于圆筒容纳器内,卤化物气体或者卤素气体从进气管通入圆筒容纳器后,与圆筒容纳器内的金属镓源表层金属发生反应,然后反应后的生成物(例如氯化镓)和未反应完全的气体再从出气管输出圆筒容纳器。但是,采用该金属反应器镓舟容易出现卤化物气体或者卤素气体与金属镓源蒸汽未完全反应而直接进入反应腔的问题,反应气体与金属镓源的反应转化率较低,致使晶体生长速率难以提高,同时未反应的卤化物会腐蚀晶体材料而干扰晶体生长,对材料的晶体质量造成严重的负面影响。In the current horizontal HVPE system structure, taking the Group III metal source as metal gallium as an example, the metal reactor gallium boat is generally a simple semi-cylindrical structure, which includes an air inlet pipe, a cylindrical container and an air outlet pipe, and the air inlet pipe includes an inlet pipe. The gas connecting pipe and the spiral nozzle, and the spiral nozzle is located in the cylindrical container. After the halide gas or halogen gas is introduced into the cylindrical container from the air inlet pipe, it reacts with the surface metal of the metal gallium source in the cylindrical container. , and then the reacted product (eg gallium chloride) and unreacted gas are output from the gas outlet pipe to the cylindrical container. However, the use of this metal reactor gallium boat is prone to the problem that the halide gas or the halogen gas and the metal gallium source steam are not completely reacted and directly enter the reaction chamber, and the reaction conversion rate of the reaction gas and the metal gallium source is low, resulting in a crystal growth rate. It is difficult to improve, and at the same time, the unreacted halide will corrode the crystal material and interfere with the crystal growth, causing a serious negative impact on the crystal quality of the material.
基于此,本申请实施例提供一种反应器,通过在反应器本体上设置不同的进气口,第一进气口与第一腔室相连通,第二进气口与第二腔室相连通,且第一腔室和第二腔室之间通过多个控流通孔连通,这样,通过第二进气口进入第二腔室的气体可以通过多个控流通孔喷入第一腔室内,形成致密的气帘层,能够促使通过第二进气口进入第一腔室的反应气体能够与第一腔室内的金属源充分接触,从而能够有效提高反应气体与金属源的反应转换效率,在一定程度上提高晶体的生长速率,同时能够避免未反应的反应气体会腐蚀晶体材料而干扰晶体生长,对材料的晶体质量造成严重的负面影响的问题。Based on this, an embodiment of the present application provides a reactor. By setting different air inlets on the reactor body, the first air inlet is connected to the first chamber, and the second air inlet is connected to the second chamber. and the first chamber and the second chamber are communicated through a plurality of control flow holes, so that the gas entering the second chamber through the second air inlet can be sprayed into the first chamber through the plurality of control flow holes , forming a dense air curtain layer, which can promote the reaction gas entering the first chamber through the second air inlet to fully contact the metal source in the first chamber, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source. To a certain extent, the growth rate of the crystal can be improved, and at the same time, the problem that the unreacted reaction gas can corrode the crystal material, interfere with the crystal growth, and cause a serious negative impact on the crystal quality of the material can be avoided.
下面结合附图对该反应器的具体结构进行介绍。The specific structure of the reactor will be described below with reference to the accompanying drawings.
实施例一Example 1
参照图1所示,本申请实施例提供一种反应器100,该反应器100至少可以包括:反应器本体1,其中,反应器本体1的内部具有反应腔室10,且反应器本体1上相对的两个侧壁上分别设有进气口20和出气口30,进气口20和出气口30均与反应腔室10连通。Referring to FIG. 1 , an embodiment of the present application provides a reactor 100 . The reactor 100 may at least include: a reactor body 1 , wherein the reactor body 1 has a reaction chamber 10 inside, and the reactor body 1 has a reaction chamber 10 . An air inlet 20 and an air outlet 30 are respectively provided on the two opposite side walls, and both the air inlet 20 and the air outlet 30 communicate with the reaction chamber 10 .
具体地,反应腔室10被分隔为第一腔室101和第二腔室102,进气口20包括第一进气 口201以及第二进气口202,第一进气口201和出气口30分别与第一腔室101连通,第二进气口202与第二腔室102连通,且第一腔室101和第二腔室102之间具有多个控流通孔103,以将第一腔室101和第二腔室102连通。Specifically, the reaction chamber 10 is divided into a first chamber 101 and a second chamber 102, the gas inlet 20 includes a first gas inlet 201 and a second gas inlet 202, and the first gas inlet 201 and the gas outlet 30 are respectively communicated with the first chamber 101, the second air inlet 202 is communicated with the second chamber 102, and there are a plurality of control flow holes 103 between the first chamber 101 and the second chamber 102, so as to The chamber 101 and the second chamber 102 communicate.
这样,通过第二进气口202进入第二腔室102的气体可以通过多个控流通孔103喷入第一腔室101内,形成致密的气帘层,促使通过第二进气口202进入第一腔室101的反应气体能够与第一腔室101内的金属源充分接触,增加了反应气体与金属源的接触几率与接触时间,从而能够有效提高反应气体与金属源的反应转换效率,进而在一定程度上提高晶体的生长速率。而且,通过多个控流通孔103喷射入第一腔室101内,能够解决金属源液面随反应消耗而逐渐下降后所引起的转化率和供应量波动的问题,本申请实施例提供的反应器100在金属源液面下降的情况下依然能确保反应气体与金属源之间的接触反应,从而能够保证工艺稳定性。In this way, the gas entering the second chamber 102 through the second air inlet 202 can be sprayed into the first chamber 101 through the plurality of control flow holes 103 to form a dense air curtain layer, which is urged to enter the first chamber 101 through the second air inlet 202 The reaction gas in the first chamber 101 can fully contact the metal source in the first chamber 101, which increases the contact probability and contact time between the reaction gas and the metal source, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source, and further To a certain extent, the growth rate of the crystal is increased. Moreover, by spraying into the first chamber 101 through a plurality of control flow holes 103, the problem of the conversion rate and supply fluctuation caused by the gradual decrease of the metal source liquid level with the reaction consumption can be solved. The device 100 can still ensure the contact reaction between the reaction gas and the metal source even when the liquid level of the metal source drops, thereby ensuring process stability.
在本申请实施例中,如图1所示,第二腔室102可以位于第一腔室101的上方。这样,从第二进气口202进入第二腔室102的气体通过多个控流通孔103喷入第一腔室101内时,能够形成从上而下的气帘层,第二腔室102内的气体通过多个控流通孔103从上而下喷入第一腔室101内,能够对通过第二进气口202进入第一腔室101的反应气体产生较大的冲击,从而使得反应气体能够与第一腔室101内的金属源更加充分进行接触。In this embodiment of the present application, as shown in FIG. 1 , the second chamber 102 may be located above the first chamber 101 . In this way, when the gas entering the second chamber 102 from the second air inlet 202 is sprayed into the first chamber 101 through the plurality of control flow holes 103 , a top-to-bottom air curtain can be formed. The gas is injected into the first chamber 101 from top to bottom through the plurality of control flow holes 103, which can have a greater impact on the reaction gas entering the first chamber 101 through the second air inlet 202, thereby making the reaction gas The metal source in the first chamber 101 can be more fully contacted.
第一腔室101和第二腔室102之间可以设置有第一挡板104,第一挡板104上具有多个控流通孔103,以将第一腔室101和第二腔室102连通。通过在第一腔室101和第二腔室102之间设置第一挡板104,可以将反应腔室10隔档为两个腔室,通过在第一挡板104上具有多个控流通孔103,可以将第一腔室101和第二腔室102连通,工艺简单,易于实现。A first baffle 104 may be disposed between the first chamber 101 and the second chamber 102 , and the first baffle 104 has a plurality of flow control holes 103 to communicate the first chamber 101 and the second chamber 102 . By arranging the first baffle 104 between the first chamber 101 and the second chamber 102, the reaction chamber 10 can be partitioned into two chambers, and the first baffle 104 can be provided with a plurality of flow control holes 103, the first chamber 101 and the second chamber 102 can be communicated, the process is simple, and the realization is easy.
其中,多个控流通孔103在第一挡板104上的具体分布方式包括但不限于以下几种可能的实现方式:The specific distribution of the plurality of control flow holes 103 on the first baffle 104 includes but is not limited to the following possible implementations:
一种可能的实现方式为:多个控流通孔103均匀间隔分布在第一挡板104上。这样,第二腔室102内的气体通过多个控流通孔103喷入第一腔室101内时,能够相对均匀的形成气帘层,从而使得第二腔室102的气体对通过第二进气口202进入第一腔室101的反应气体产生均匀的冲击。A possible implementation is as follows: a plurality of control flow holes 103 are evenly spaced and distributed on the first baffle 104 . In this way, when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103, the air curtain layer can be formed relatively uniformly, so that the gas pair in the second chamber 102 can pass through the second intake air. The reaction gas entering the first chamber 101 through the port 202 produces a uniform impact.
另一种可能的实现方式为:多个控流通孔103间隔分布在第一挡板104上,且从第一挡板104靠近进气口20的一端至第一挡板104靠近出气口30的一端的方向上,控流通孔103的密集程度逐渐增大。这样,第二腔室102内的气体通过多个控流通孔103喷入第一腔室101内时,在从第一挡板104靠近进气口20的一端至第一挡板104靠近出气口30的一端的方向上,第二腔室102内的气体形成越来越密集的气帘层,从而对通过第二进气口202进入第一腔室101的反应气体产生越来越密集的冲击。Another possible implementation is as follows: a plurality of control flow holes 103 are distributed on the first baffle 104 at intervals, from the end of the first baffle 104 close to the air inlet 20 to the end of the first baffle 104 close to the air outlet 30 In the direction of one end, the density of the control flow holes 103 gradually increases. In this way, when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103 , from the end of the first baffle 104 close to the air inlet 20 to the first baffle 104 close to the air outlet In the direction of one end of 30 , the gas in the second chamber 102 forms a denser and denser gas curtain layer, thereby producing more and more dense impact on the reaction gas entering the first chamber 101 through the second gas inlet 202 .
又一种可能的实现方式为:多个控流通孔103间隔分布在第一挡板104上,且从第一挡板104靠近进气口20的一端至第一挡板104靠近出气口30的一端的方向上,控流通孔103的密集程度逐渐减小。这样,第二腔室102内的气体通过多个控流通孔103喷入第一腔室101内时,在从第一挡板104靠近出气口30的一端至第一挡板104靠近进气口20的一端的方向上,第二腔室102内的气体形成越来越密集的气帘层,从而对通过第二进气口202进入第一腔室101的反应气体产生越来越密集的冲击。Another possible implementation is as follows: a plurality of control flow holes 103 are distributed on the first baffle 104 at intervals, from the end of the first baffle 104 close to the air inlet 20 to the end of the first baffle 104 close to the air outlet 30 . In the direction of one end, the density of the control flow holes 103 gradually decreases. In this way, when the gas in the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103 , from the end of the first baffle 104 close to the air outlet 30 to the first baffle 104 close to the air inlet In the direction of one end of the chamber 20 , the gas in the second chamber 102 forms a denser and denser gas curtain layer, thereby producing more and more dense impact on the reaction gas entering the first chamber 101 through the second gas inlet 202 .
当然,在本申请实施例中,也可以根据实际应用场景中气流控制的需求,对多个控流通孔103在第一挡板104上的具体分布方式进行灵活设定,例如渐变式分布等。本申请实施例对此并不加以限定,也不限于上述示例。Of course, in the embodiment of the present application, the specific distribution mode of the plurality of control flow holes 103 on the first baffle 104 can also be flexibly set according to the requirements of airflow control in practical application scenarios, such as gradient distribution. This embodiment of the present application does not limit this, nor is it limited to the above examples.
在本申请实施例中,控流通孔103的直径可以为50nm-500um。这里需要说明的是,本申请涉及的数值和数值范围为近似值,受制造工艺的影响,可能会存在一定范围的误差,这部分误差本领域技术人员可以认为忽略不计。In the embodiment of the present application, the diameter of the control flow hole 103 may be 50nm-500um. It should be noted here that the numerical values and numerical ranges involved in this application are approximate values, and there may be errors in a certain range due to the influence of the manufacturing process, and those skilled in the art can consider these errors to be ignored.
进一步地,控流通孔103的直径可以为20um-80um。例如,控流通孔103的直径可以为30um、50um或70um等,本申请实施例对此并不加以限定,也不限于上述示例。将控流通孔103的直径设置的较小,可以使得进入第二腔室102的气体通过多个控流通孔103喷入第一腔室101内时,形成较为致密的气帘层,从而使得反应气体能够与第一腔室101内的金属源更加充分的进行接触。Further, the diameter of the control flow hole 103 may be 20um-80um. For example, the diameter of the flow control hole 103 may be 30 um, 50 um, or 70 um, etc., which is not limited in the embodiment of the present application, nor is it limited to the above examples. The diameter of the control flow hole 103 is set to be small, so that when the gas entering the second chamber 102 is sprayed into the first chamber 101 through the plurality of control flow holes 103, a relatively dense air curtain layer is formed, so that the reaction gas can be It is possible to make more sufficient contact with the metal source in the first chamber 101 .
另外,参见图1所示,多个控流通孔103中的相邻两个控流通孔103之间的距离L1可以为1-3mm。例如,相邻两个控流通孔103之间的距离L1可以为1.5mm、2.0mm或2.5mm等,本申请实施例对此并不加以限定,也不限于上述示例。将多个控流通孔103中的相邻两个控流通孔103之间的距离设置得较小,能够减小相邻两个控流通孔103之间的间隔,使得进入第二腔室102的气体通过多个控流通孔103喷入第一腔室101内时,形成更为致密的气帘层,从而使得反应气体能够与第一腔室101内的金属源更加充分的进行接触。In addition, as shown in FIG. 1 , the distance L1 between two adjacent control flow holes 103 in the plurality of control flow holes 103 may be 1-3 mm. For example, the distance L1 between two adjacent flow control holes 103 may be 1.5 mm, 2.0 mm, or 2.5 mm, etc., which is not limited in this embodiment of the present application, nor is it limited to the above examples. Setting the distance between two adjacent control flow holes 103 in the plurality of control flow holes 103 to be smaller can reduce the interval between two adjacent control flow holes 103 , so that the air entering the second chamber 102 can be reduced. When the gas is injected into the first chamber 101 through the plurality of control flow holes 103 , a denser gas curtain layer is formed, so that the reaction gas can more fully contact the metal source in the first chamber 101 .
需要说明的是,控流通孔103的形状可以为圆形、锥形或方形等,本申请实施例对此并不加以限定,也不限于上述示例。It should be noted that the shape of the flow control hole 103 may be a circle, a cone, or a square, etc., which is not limited in the embodiments of the present application, nor is it limited to the above examples.
在本申请实施例中,每个控流通孔103朝向第一腔室101的一侧还可以延伸形成有延伸部1031。通过在每个控流通孔103朝向第一腔室101的一侧延伸形成有延伸部1031,能够在每个控流通孔103的位置处形成喷口式结构,第二腔室102内的气体通过该喷口式结构进入第一腔室101时,能够对第一腔室101内的反应气体产生更大的冲击,从而使得反应气体能够与第一腔室101内的金属源更加充分进行接触。另外,延伸部1031的截面形状可以与控流通孔103的形状相同。即当控流通孔103的形状为圆形时,延伸部1031的截面形状也可以为圆形。In the embodiment of the present application, the side of each flow control hole 103 facing the first chamber 101 may also be extended with an extension portion 1031 . By forming an extension portion 1031 on the side of each control flow hole 103 facing the first chamber 101 , a spout-type structure can be formed at the position of each control flow hole 103 , through which the gas in the second chamber 102 passes. When the spout-type structure enters the first chamber 101 , it can have a greater impact on the reaction gas in the first chamber 101 , so that the reaction gas can more fully contact the metal source in the first chamber 101 . In addition, the cross-sectional shape of the extension portion 1031 may be the same as that of the flow control hole 103 . That is, when the shape of the control flow hole 103 is circular, the cross-sectional shape of the extension portion 1031 may also be circular.
延伸部1031的延伸长度可以为1-3mm。例如,延伸部1031的延伸长度可以为1.5mm、2.0mm或2.5mm等,本申请实施例对此并不加以限定,也不限于上述示例。The extension length of the extension part 1031 may be 1-3 mm. For example, the extension length of the extension portion 1031 may be 1.5 mm, 2.0 mm, or 2.5 mm, etc., which is not limited in this embodiment of the present application, nor is it limited to the above examples.
参照图2所示,反应腔室10和出气口30之间还可以设置有第二挡板40,其中,第二挡板40的一端与反应器本体的下底壁11相连,第二挡板40的另一端与反应器本体的上底壁12之间形成第一间隙50。这样,第一腔室101内部分未完全反应的反应气体与第一腔室101内的金属源蒸汽在遇到第二挡板40后,被第二挡板40阻挡返回而形成涡流,延长了其在反应器本体1内部的停留时间。第一腔室101内部分未完全反应的反应气体与第一腔室101内的金属源蒸汽能够更加充分接触反应,反应生成后的气体再通过第一间隙50流出反应腔室10。Referring to FIG. 2 , a second baffle 40 may also be provided between the reaction chamber 10 and the gas outlet 30, wherein one end of the second baffle 40 is connected to the lower bottom wall 11 of the reactor body, and the second baffle A first gap 50 is formed between the other end of 40 and the upper bottom wall 12 of the reactor body. In this way, after the partially reacted reaction gas in the first chamber 101 and the metal source vapor in the first chamber 101 meet the second baffle 40, they are blocked by the second baffle 40 and return to form a vortex, which prolongs the Its residence time inside the reactor body 1 . Part of the incompletely reacted reaction gas in the first chamber 101 can contact and react more fully with the metal source vapor in the first chamber 101 , and the reacted gas flows out of the reaction chamber 10 through the first gap 50 .
另外,通过设置第二挡板40,并结合调控控制气体(第二进气口202进入的气体)的分压与流速,能有效改变反应气体(第一进气口201进入的气体)的流动方向与流场,有效防止未反应的反应气体与金属源蒸汽混入到反应前驱物(即反应气体与金属源蒸汽反应生成的气体)中,大大降低了反应气体转化为金属前驱物的转化效率,从而能够实现金属前驱物转化效率的稳定性,且有利于规模化生产。In addition, by setting the second baffle 40 and combining with regulating and controlling the partial pressure and flow rate of the control gas (the gas entering the second gas inlet 202 ), the flow of the reaction gas (the gas entering the first gas inlet 201 ) can be effectively changed The direction and flow field effectively prevent the unreacted reaction gas and metal source steam from mixing into the reaction precursor (that is, the gas generated by the reaction between the reaction gas and the metal source steam), which greatly reduces the conversion efficiency of the reaction gas into the metal precursor. Thus, the stability of the conversion efficiency of the metal precursor can be achieved, and it is favorable for large-scale production.
在一种可能的实现方式中,如图3所示,反应腔室10内还可以具有至少一个通道105,其中,通道105的入口与第一腔室101相连通,通道105的出口与出气口30相连通。这样,能够增加反应腔室10内的流通路径,进一步增加了反应气体和金属源蒸汽接触的机会。第一腔室101内部分未完全反应的反应气体与第一腔室101内的金属源蒸汽能够在通道105内进 一步发生反应,从而有效提高反应气体与金属源的反应转换效率,在一定程度上提高晶体的生长速率、生长质量以及产品良率。In a possible implementation manner, as shown in FIG. 3 , the reaction chamber 10 may further have at least one channel 105 , wherein the inlet of the channel 105 is communicated with the first chamber 101 , and the outlet of the channel 105 is connected with the gas outlet 30 connected. In this way, the flow paths in the reaction chamber 10 can be increased, and the chance of contact between the reaction gas and the metal source vapor can be further increased. Part of the incompletely reacted reactive gas in the first chamber 101 and the metal source vapor in the first chamber 101 can further react in the channel 105, thereby effectively improving the reaction conversion efficiency between the reactive gas and the metal source, to a certain extent Improve crystal growth rate, growth quality and product yield.
参照图4所示,反应腔室10内可以具有两个通道105。其中,两个通道105中的第一通道1051的入口与第一腔室101连通,第一通道1051的出口与两个通道105中的第二通道1052的入口相连通,第二通道1052的出口与出气口30连通,且第一通道1051的入口与第二通道1052的出口位于反应器本体1的同一侧。通过反应腔室10内具有两个通道105,能够进一步增加反应腔室10内的流通路径,且由于第一通道1051的入口与第二通道1052的出口位于反应器本体1的同一侧,还能够在一定程度上节省第一通道1051和第二通道1052在反应腔室10内的占用空间。Referring to FIG. 4 , the reaction chamber 10 may have two channels 105 therein. The inlet of the first channel 1051 of the two channels 105 is communicated with the first chamber 101 , the outlet of the first channel 1051 is communicated with the inlet of the second channel 1052 of the two channels 105 , and the outlet of the second channel 1052 It communicates with the gas outlet 30 , and the inlet of the first channel 1051 and the outlet of the second channel 1052 are located on the same side of the reactor body 1 . By having two channels 105 in the reaction chamber 10 , the flow path in the reaction chamber 10 can be further increased, and since the inlet of the first channel 1051 and the outlet of the second channel 1052 are located on the same side of the reactor body 1 , the flow path in the reaction chamber 10 can be further increased. The space occupied by the first channel 1051 and the second channel 1052 in the reaction chamber 10 is saved to a certain extent.
在本申请实施例中,如图5所示,至少一个通道105内还可以设置有阻流结构106,其中,通道105具有第一侧壁、第二侧壁、上底壁以及下底壁,阻流结构106与第一侧壁、第二侧壁、上底壁和下底壁中的任意一者、任意两者或任意三者固定相连,阻流结构106与第一侧壁、第二侧壁、上底壁和下底壁中的至少一者之间形成有第二间隙107。通过在至少一个通道105内设置有阻流结构106,能够对气体的流动形成一定的障碍,再次增加反应气体与金属源的接触时间,提高金属前驱物的转换效率与晶体外延生长质量。In the embodiment of the present application, as shown in FIG. 5 , at least one channel 105 may further be provided with a flow blocking structure 106, wherein the channel 105 has a first side wall, a second side wall, an upper bottom wall and a lower bottom wall, The flow blocking structure 106 is fixedly connected to any one, any two or any three of the first side wall, the second side wall, the upper bottom wall and the lower bottom wall. A second gap 107 is formed between at least one of the side wall, the upper bottom wall and the lower bottom wall. By disposing the flow blocking structure 106 in at least one channel 105, a certain obstacle can be formed to the flow of the gas, the contact time between the reaction gas and the metal source can be increased again, and the conversion efficiency of the metal precursor and the crystal epitaxial growth quality can be improved.
具体地,第一腔室101内部分未完全反应的反应气体与第一腔室101内的金属源蒸汽在进入通道105后,被阻流结构106阻挡形成涡流,能够阻止气体在通道105内的快速流动,有效防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室101内部分未完全反应的反应气体与金属源蒸汽能够再次充分反应,充分反应后生成的气体再通过第二间隙107流出反应腔室10,从而确保转化率以及晶体生长速度。Specifically, after the partially reacted reactive gas in the first chamber 101 and the metal source vapor in the first chamber 101 enter the channel 105 , they are blocked by the blocking structure 106 to form a vortex, which can prevent the gas from flowing in the channel 105 . The rapid flow can effectively prevent the escape of the incompletely reacted reaction gas and the metal source steam, so that some of the incompletely reacted reaction gas and the metal source steam in the first chamber 101 can fully react again, and the fully reacted gas passes through the first chamber 101. The second gap 107 flows out of the reaction chamber 10, thereby ensuring the conversion rate and the crystal growth rate.
可以理解的是,在本申请实施例中,可以是仅在第一通道1051内设置有阻流结构106,也可以是仅在第二通道1052内设置有阻流结构106,还可以是在第一通道1051内和第二通道1052内均设置有阻流结构106。示例性地,如图6所示,第一通道1051内和第二通道1052内均设置有阻流结构106,以此起到更好的阻流效果。It can be understood that, in the embodiment of the present application, the flow blocking structure 106 may be provided only in the first channel 1051 , the flow blocking structure 106 may be provided only in the second channel 1052 , or the flow blocking structure 106 may be provided only in the second channel 1052 . Both the first channel 1051 and the second channel 1052 are provided with a flow blocking structure 106 . Exemplarily, as shown in FIG. 6 , both the first channel 1051 and the second channel 1052 are provided with a flow blocking structure 106 to achieve a better flow blocking effect.
另外,需要说明的是,阻流结构106也可以设置在反应腔室10内的除通道105(第一通道1051和第二通道1052)以外的其它位置,以起到阻流效果。In addition, it should be noted that the flow blocking structure 106 may also be disposed at other positions in the reaction chamber 10 except for the channel 105 (the first channel 1051 and the second channel 1052 ), so as to have a flow blocking effect.
继续参照图5或图6所示,阻流结构106可以包括:至少一个阻流体1061,其中,阻流体1061可以与通道105的上底壁和下底壁中的其中一者固定相连,阻流体1061可以与通道105的上底壁和下底壁中的另一者之间形成第二间隙107。这样,第一腔室101内部分未完全反应的反应气体与第一腔室101内的金属源蒸汽在进入通道105后,由于阻流体1061与通道105的上底壁和下底壁中的其中一者固定相连,部分未完全反应的反应气体与金属源蒸汽被阻挡形成涡流,能够有效防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室101内部分未完全反应的反应气体与金属源蒸汽能够更加充分反应,然后充分反应后生成的气体再通过阻流体1061与通道105的上底壁和下底壁中的另一者之间形成的第二间隙107流出反应腔室10,从而确保转化率以及晶体生长速度。Continuing to refer to FIG. 5 or FIG. 6 , the bluff structure 106 may include: at least one bluff body 1061 , wherein the bluff body 1061 may be fixedly connected with one of the upper bottom wall and the lower bottom wall of the channel 105 , and the bluff body 1061 The second gap 107 may be formed between 1061 and the other of the upper bottom wall and the lower bottom wall of the channel 105 . In this way, after the partially unreacted reactant gas in the first chamber 101 and the metal source vapor in the first chamber 101 enter the channel 105, due to the bluff body 1061 and the upper bottom wall and the lower bottom wall of the channel 105. One is fixedly connected, and part of the incompletely reacted reactant gas and the metal source vapor are blocked to form a vortex, which can effectively prevent the incompletely reacted reactant gas and the metal source vapor from escaping, so that some incompletely reacted reactions in the first chamber 101 are prevented. The gas and the metal source steam can react more fully, and then the gas generated after the sufficient reaction flows out of the reaction chamber through the second gap 107 formed between the bluff body 1061 and the other one of the upper bottom wall and the lower bottom wall of the channel 105 10, so as to ensure the conversion rate and crystal growth rate.
作为一种可选的实施方式,阻流体1061的数量可以为多个,多个阻流体1061沿着通道105的延伸方向间隔分布。通过增加通道105内阻流体1061的数量能够起到对未完全反应的反应气体与金属源蒸汽的进一步阻挡作用,因而能够更加有效的防止未完全反应的反应气体与金属源蒸汽的逃逸,使得第一腔室101内未完全反应的反应气体与金属源蒸汽能够进一步的充分反应。As an optional implementation manner, the number of the bluff bodies 1061 may be multiple, and the multiple bluff bodies 1061 are distributed at intervals along the extending direction of the channel 105 . By increasing the number of the bluff body 1061 in the channel 105, it can further block the incompletely reacted reactant gas and the metal source vapor, and thus can more effectively prevent the incompletely reacted reactant gas and the metal source vapor from escaping, so that the first The incompletely reacted reactant gas in a chamber 101 can further react sufficiently with the metal source vapor.
可以理解的是,在本申请实施例中,阻流体1061的具体结构包括但不限于以下几种可能 的实现方式:It can be understood that, in the embodiments of the present application, the specific structure of the bluff body 1061 includes but is not limited to the following possible implementations:
一种可能的实现方式为:阻流体1061为柱状结构。例如,阻流体1061可以为圆柱体结构(参见图5所示)或棱柱体结构(参见图7所示)等,本申请实施例对此并不加以限定,也不限于上述示例。A possible implementation manner is: the bluff body 1061 is a columnar structure. For example, the bluff body 1061 may have a cylindrical structure (as shown in FIG. 5 ) or a prismatic structure (as shown in FIG. 7 ), which is not limited in this embodiment of the present application, nor is it limited to the above examples.
另一种可能的实现方式为:阻流体1061为锥型结构。例如,阻流体1061可以为圆锥体结构。Another possible implementation is: the bluff body 1061 is a cone-shaped structure. For example, the bluff body 1061 may have a conical structure.
又一种可能的实现方式为:阻流体1061为螺旋状结构。通过将流体设置为螺旋状结构,能够够增加阻流体1061的外表面与气体之间的接触面积,这样,阻流体1061能够对气体起到更好的阻挡作用。Another possible implementation manner is: the bluff body 1061 is a helical structure. By arranging the fluid in a helical structure, the contact area between the outer surface of the bluff body 1061 and the gas can be increased, so that the bluff body 1061 can play a better blocking effect on the gas.
当然,在其它的一些可能的实现方式中,阻流体1061还可以为迷宫状回转结构,本申请实施例对该迷宫状回转结构的具体布置方式并不加以限定,也不限于上述示例。而且,本申请实施例对反应器100的外观形状也不加以限定,具体可以依据反应器100和外部生长设备连接或空间排布的需要设计成所需要的形状,例如,反应器100可以为圆柱体、正方体或长方体等。以及,反应器100的体积、各腔室的空间及其体积比也可以依据实际工艺的要求来进行灵活设定,本申请实施例对此并不加以限定。Certainly, in some other possible implementation manners, the bluff body 1061 may also be a labyrinth-like rotating structure, and the embodiment of the present application does not limit the specific arrangement of the labyrinth-like rotating structure, nor is it limited to the above examples. Moreover, the embodiments of the present application do not limit the appearance and shape of the reactor 100. Specifically, the reactor 100 can be designed into a desired shape according to the connection between the reactor 100 and the external growth equipment or the spatial arrangement. For example, the reactor 100 can be a cylinder. body, cube or cuboid, etc. In addition, the volume of the reactor 100, the space of each chamber and the volume ratio thereof can also be flexibly set according to actual process requirements, which are not limited in the embodiments of the present application.
另外,作为一种可选的实施方式,阻流体1061的轴向方向可以与通道105的延伸方向相垂直。这样,能够进一步增加阻流体1061对通道105内气体的阻挡效果。当然,在其它的一些实施例中,阻流体1061的轴向方向也可以与通道105的延伸方向相平行,或者,阻流体1061的轴向方向与通道105的延伸方向之间形成的夹角可以小于90度,即阻流体1061的轴向方向可以相对于通道105的延伸方向倾斜设置。In addition, as an optional implementation manner, the axial direction of the bluff body 1061 may be perpendicular to the extending direction of the channel 105 . In this way, the blocking effect of the bluff body 1061 on the gas in the channel 105 can be further increased. Of course, in some other embodiments, the axial direction of the bluff body 1061 may also be parallel to the extension direction of the channel 105 , or the included angle formed between the axial direction of the bluff body 1061 and the extension direction of the channel 105 may be Less than 90 degrees, that is, the axial direction of the bluff body 1061 may be inclined with respect to the extending direction of the channel 105 .
此外,本申请实施例中,金属源注入操作简单,有利于在一定程度上降低维护成本。即金属源可通过反应气体入口(即第一进气口201)注入,相比于现有技术中需取出石英舟再注入或者采用管路式注入的操作,具有高效便捷的优点。In addition, in the embodiment of the present application, the metal source injection operation is simple, which is beneficial to reduce maintenance costs to a certain extent. That is, the metal source can be injected through the reaction gas inlet (ie, the first gas inlet 201 ), which has the advantages of high efficiency and convenience compared to the operation of taking out the quartz boat and injecting again or using pipeline injection in the prior art.
实施例二Embodiment 2
在上述实施例一的基础上,本申请实施例提供一种反应器100,该反应器100可以为III族金属源反应器。金属源反应器内的金属源可以是III族金属。On the basis of the above-mentioned first embodiment, the embodiment of the present application provides a reactor 100, and the reactor 100 may be a group III metal source reactor. The metal source within the metal source reactor may be a Group III metal.
在本申请实施例中,该III族金属源反应器的第一进气口201通入的气体可以为卤化物气体或卤素气体。其中,卤化物气体可以为氯化氢(HCl)、溴化氢(HBr)或碘化氢(HI)中的任意一种或多种,卤素气体可以为氯气(Cl 2)、溴气(Br 2)或碘气(I 2)中的任意一种或多种。该III族金属源反应器的第二进气口202通入的气体可以为氢气、氩气和氮气中的任意一种或多种,例如,第二进气口202通入的气体可以为氢氩混合气体。 In the embodiment of the present application, the gas introduced into the first gas inlet 201 of the Group III metal source reactor may be a halide gas or a halogen gas. Wherein, the halide gas can be any one or more of hydrogen chloride (HCl), hydrogen bromide (HBr) or hydrogen iodide (HI), and the halogen gas can be chlorine (Cl 2 ), bromine (Br 2 ) or any one or more of iodine gas (I 2 ). The gas introduced into the second gas inlet 202 of the Group III metal source reactor can be any one or more of hydrogen, argon and nitrogen, for example, the gas introduced into the second gas inlet 202 can be hydrogen Argon gas mixture.
需要说明的是,当反应器100的第一进气口201通入的气体为卤化物气体或卤素气体时,反应器100的材质可以为石英或刚玉。本申请实施例对反应器100的材质并不加以限定,只要能起到耐高温以及抗卤化物气体或卤素气体腐蚀的作用,即能够避免反应器100不耐高温遭到破坏或者被卤化物气体或卤素气体腐蚀即可。It should be noted that, when the gas introduced into the first air inlet 201 of the reactor 100 is halide gas or halogen gas, the material of the reactor 100 may be quartz or corundum. The embodiment of the present application does not limit the material of the reactor 100, as long as it can resist high temperature and corrosion of halide gas or halogen gas, that is, it can prevent the reactor 100 from being damaged by high temperature resistance or being damaged by halide gas Or halogen gas corrosion can be.
其中,在一种可能的实现方式中,石英可以为高纯石英。Wherein, in a possible implementation manner, the quartz may be high-purity quartz.
另外,该III族金属源反应器具体可以为镓源反应器,该镓源反应器的反应器本体1的反应腔室10内具有液态镓。该镓源反应器在工作过程中,参照图8所示,卤化物气体(HCl、HBr或HI)或卤素气体(Cl 2、Br 2或I 2)从第一进气口201进入第一腔室101,与第一腔室101内的液态镓发生反应生成卤化镓气体(例如氯化镓、溴化镓或碘化镓)。氢气、氩气或氮 气从第二进气口202进入第一腔室102,在第二腔室102充分聚集后,氢气、氩气或氮气通过控流通孔103喷入第一腔室101内,在第一腔室101的上方(即第一腔室101内金属源液面的上方)形成致密的气帘层,促使卤化物气体或卤素气体能够与第一腔室101内的液态镓充分接触,从而能够有效提高卤化物气体或卤素气体与液态镓的反应转换效率。 In addition, the Group III metal source reactor may specifically be a gallium source reactor, and the reaction chamber 10 of the reactor body 1 of the gallium source reactor has liquid gallium in it. During the working process of the gallium source reactor, as shown in FIG. 8 , halide gas (HCl, HBr or HI) or halogen gas (Cl 2 , Br 2 or I 2 ) enters the first chamber from the first gas inlet 201 The chamber 101 reacts with the liquid gallium in the first chamber 101 to generate a gallium halide gas (eg, gallium chloride, gallium bromide or gallium iodide). Hydrogen, argon or nitrogen gas enters the first chamber 102 from the second air inlet 202, and after the second chamber 102 is sufficiently gathered, the hydrogen, argon or nitrogen gas is injected into the first chamber 101 through the control flow hole 103, A dense gas curtain layer is formed above the first chamber 101 (that is, above the liquid level of the metal source in the first chamber 101 ), so that the halide gas or the halogen gas can be fully contacted with the liquid gallium in the first chamber 101 , Therefore, the conversion efficiency of the reaction between the halide gas or the halogen gas and the liquid gallium can be effectively improved.
另外,卤化物气体或卤素气体从第一腔室101内靠近第一进气口201的一侧流向远离第一进气口201的一侧的方向上,在此过程中,部分未完全反应的卤化物气体或卤素气体与第一腔室101内的金属镓蒸汽在遇到第二挡板40后,被第二挡板40阻挡返回而形成涡流,使得第一腔室101内部分未完全反应的卤化物气体或卤素气体可以与金属镓蒸汽能够更加充分接触反应,反应生成后的气体再通过第一间隙50流出。In addition, the halide gas or halogen gas flows from the side close to the first gas inlet 201 in the first chamber 101 to the side away from the first gas inlet 201. During this process, some of the incompletely reacted After encountering the second baffle 40, the halide gas or the halogen gas and the metal gallium vapor in the first chamber 101 are blocked by the second baffle 40 and return to form a vortex, so that the first chamber 101 partially reacts incompletely The halide gas or halogen gas can be more fully contacted and reacted with the metal gallium vapor, and the gas generated by the reaction flows out through the first gap 50 .
反应生成后的卤化镓气体、剩余未完全反应的卤化物气体或卤素气体与第一腔室101内的金属镓蒸汽从第一腔室101依次进入第一通道1051和第二通道1052后,被阻流体1061阻挡形成涡流,能够有效防止未完全反应的卤化物气体或卤素气体与金属镓蒸汽的逃逸,使得第一腔室101内部分未完全反应的卤化物气体或卤素气体与金属镓蒸汽能够更加充分反应,然后充分反应后生成的气体再通过第二间隙107流出通道105,再通过出气口30流出镓源反应器,从而确保卤化物气体或卤素气体与液态镓的反应转化率。After the reaction, the gallium halide gas, the remaining incompletely reacted halide gas or the halogen gas and the metal gallium vapor in the first chamber 101 enter the first channel 1051 and the second channel 1052 from the first chamber 101 in turn, and are The bluff body 1061 blocks the formation of eddy currents, which can effectively prevent the escape of incompletely reacted halide gas or halogen gas and metal gallium vapor, so that part of the incompletely reacted halide gas or halogen gas and metal gallium vapor in the first chamber 101 can be More fully reacted, and then the fully reacted gas flows out of the channel 105 through the second gap 107, and then flows out of the gallium source reactor through the gas outlet 30, thereby ensuring the reaction conversion rate of the halide gas or the halogen gas and liquid gallium.
此外,需要说明的是,在其它的一些实施例中,反应器100包括但不限于为III族金属源反应器,即反应器100也可以为I族金属源反应器或者II族金属源反应器。本申请实施例对此并不加以限定,也不限于上述示例。In addition, it should be noted that in some other embodiments, the reactor 100 includes, but is not limited to, a group III metal source reactor, that is, the reactor 100 can also be a group I metal source reactor or a group II metal source reactor . This embodiment of the present application does not limit this, nor is it limited to the above examples.
实施例三 Embodiment 3
本申请实施例提供一种生长装置,该生长装置至少包括:生长设备以及上述实施例一或实施例二中的反应器100。其中,反应器100的出口与生长设备的入口相连通。An embodiment of the present application provides a growth apparatus, and the growth apparatus includes at least a growth device and the reactor 100 in the above-mentioned first or second embodiment. Wherein, the outlet of the reactor 100 is communicated with the inlet of the growth equipment.
需要说明的是,在本申请实施例中,可以是反应器100的出口与反应器100的出气口30相连通,也可以是反应器100的出气口30即作为反应器100的出口。It should be noted that, in the embodiments of the present application, the outlet of the reactor 100 may be communicated with the gas outlet 30 of the reactor 100 , or the gas outlet 30 of the reactor 100 may be used as the outlet of the reactor 100 .
其中,以反应器100的出气口30作为反应器100的出口,反应器100为镓源反应器为例,生长设备内具有衬底,且生长设备内可以具有氨气(NH 3),从反应器100的出气口30流出的卤化镓气体(例如氯化镓、溴化镓或碘化镓)从生长设备的入口进入生长设备后,与生长设备内的NH 3发生反应,在衬底表面上形成氮化物半导体材料(例如GaN单晶材料)。 The gas outlet 30 of the reactor 100 is used as the outlet of the reactor 100, and the reactor 100 is a gallium source reactor as an example. After the gallium halide gas (eg, gallium chloride, gallium bromide or gallium iodide) flowing out of the gas outlet 30 of the device 100 enters the growth device from the inlet of the growth device, it reacts with NH 3 in the growth device, and the surface of the substrate reacts with NH 3 . A nitride semiconductor material (eg, a GaN single crystal material) is formed.
本申请实施例提供的生长装置,该生长装置至少包括生长设备以及反应器100,该反应器100的出口与生长设备的入口相连通,通过在反应器本体1上设置不同的进气口20,第一进气口201与第一腔室101相连通,第二进气口202与第二腔室102相连通,且第一腔室101和第二腔室102之间通过多个控流通孔103连通,这样,通过第二进气口202进入第二腔室102的气体可以通过多个控流通孔103喷入第一腔室101内,形成致密的气帘层,能够促使通过第二进气口202进入第一腔室101的反应气体能够与第一腔室101内的金属源充分接触,从而能够有效提高反应气体与金属源的反应转换效率。反应器100内生成的气体从出气口30进入生长装置的入口与生长设备内的物质进一步发生反应生成晶体,由于反应器100的反应转换效率得到了提高,也能够避免反应气体在反应器内未完全反应随后进入生长设备内的问题,从而也能够在一定程度上提高生长装置内晶体的生长速率与晶体的质量稳定性以及一致性,实现外延单晶材料的规模化生产。The growth device provided in the embodiment of the present application includes at least a growth device and a reactor 100. The outlet of the reactor 100 is communicated with the inlet of the growth device. By setting different air inlets 20 on the reactor body 1, The first air inlet 201 communicates with the first chamber 101, the second air inlet 202 communicates with the second chamber 102, and a plurality of control flow holes pass between the first chamber 101 and the second chamber 102 103 is connected, so that the gas entering the second chamber 102 through the second air inlet 202 can be sprayed into the first chamber 101 through the plurality of control flow holes 103 to form a dense air curtain layer, which can promote the passage of the second air inlet The reaction gas entering the first chamber 101 through the port 202 can fully contact the metal source in the first chamber 101, thereby effectively improving the reaction conversion efficiency between the reaction gas and the metal source. The gas generated in the reactor 100 enters the inlet of the growth device from the gas outlet 30 and further reacts with the substances in the growth device to form crystals. Since the reaction conversion efficiency of the reactor 100 is improved, it can also be avoided that the reaction gas does not remain in the reactor. The problem of completely reacting and then entering the growth device can also improve the growth rate of the crystal in the growth device and the quality stability and consistency of the crystal to a certain extent, and realize the large-scale production of epitaxial single crystal materials.
可以理解的是,提高生长装置内晶体的生长速率则可以降低生长晶体的工艺成本。通过提升反应气体(卤化物气体或卤素气体)反应为卤化镓气体(例如氯化镓、溴化镓或碘化镓) 的转化率,可实现增大晶体生长速率,进而减少生长时间,降低衬底的制备成本。It can be understood that increasing the growth rate of the crystal in the growth device can reduce the process cost of growing the crystal. By increasing the conversion rate of the reaction gas (halide gas or halogen gas) into a gallium halide gas (such as gallium chloride, gallium bromide or gallium iodide), it is possible to increase the crystal growth rate, thereby reducing the growth time and reducing the lining. Bottom preparation cost.
避免反应气体在反应器内未完全反应随后进入生长设备即可以提高生长装置内晶体的质量稳定性以及一致性。通过避免反应气体与金属源蒸汽随着卤化镓气体混入生长装置,能够抑制生长装置内的寄生反应和多晶生长,避免未反应的反应气体进入生长设备后会腐蚀晶体材料而干扰晶体生长,对材料的晶体质量造成严重的负面影响的问题,从而能够提高生长装置内晶体的质量稳定性以及一致性。The quality stability and consistency of crystals in the growth device can be improved by preventing the reaction gas from not completely reacting in the reactor and then entering the growth device. By preventing the reaction gas and the metal source vapor from being mixed into the growth device with the gallium halide gas, parasitic reactions and polycrystalline growth in the growth device can be suppressed, and the unreacted reaction gas entering the growth device will corrode the crystal material and interfere with the crystal growth. The crystal quality of the material poses a problem of serious negative effects, so that the quality stability and consistency of the crystals within the growth apparatus can be improved.
在本申请实施例的描述中,需要说明的是,除非另有明确的规定和限定,术语“安装”、“相连”、“连接”应作广义理解,例如,可以是固定连接,也可以是通过中间媒介间接相连,可以是两个元件内部的连通或者两个元件的相互作用关系。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本申请实施例中的具体含义。In the description of the embodiments of the present application, it should be noted that, unless otherwise expressly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it may be a fixed connection or a The indirect connection through an intermediate medium may be the internal communication of the two elements or the interaction relationship between the two elements. Those of ordinary skill in the art can understand the specific meanings of the above terms in the embodiments of the present application according to specific situations.
在本申请实施例或者暗示所指的装置或者元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本申请实施例的限制。在本申请实施例的描述中,“多个”的含义是两个或两个以上,除非是另有精确具体地规定。The devices or elements referred to in the embodiments of the present application or implied must have a specific orientation, be constructed and operate in a specific orientation, and therefore should not be construed as a limitation on the embodiments of the present application. In the description of the embodiments of the present application, "plurality" means two or more, unless otherwise precisely and specifically specified.
本申请实施例的说明书和权利要求书及上述附图中的术语“第一”、“第二”、“第三”、“第四”等(如果存在)是用于区别类似的对象,而不必用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换,以便这里描述的本申请实施例的实施例例如能够以除了在这里图示或描述的那些以外的顺序实施。此外,术语“包括”和“具有”以及他们的任何变形,意图在于覆盖不排他的包含,例如,包含了一系列步骤或单元的过程、方法、系统、产品或设备不必限于清楚地列出的那些步骤或单元,而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the embodiments of the present application and the above-mentioned drawings are used to distinguish similar objects, while It is not necessary to describe a particular order or sequence. It is to be understood that data so used may be interchanged under appropriate circumstances such that embodiments of the embodiments of the application described herein can be implemented, for example, in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having" and any variations thereof, are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those expressly listed Rather, those steps or units may include other steps or units not expressly listed or inherent to these processes, methods, products or devices.
最后应说明的是:以上各实施例仅用以说明本申请实施例的技术方案,而非对其限制;尽管参照前述各实施例对本申请实施例进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分或者全部技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本申请实施例各实施例技术方案的范围。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of the present application, but not to limit them; It should be understood that: it is still possible to modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements to some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the embodiments of the present application The scope of the technical solutions of each embodiment.

Claims (25)

  1. 一种反应器,其特征在于,至少包括:A kind of reactor is characterized in that, at least comprises:
    反应器本体;Reactor body;
    所述反应器本体的内部具有反应腔室,且所述反应器本体上相对的两个侧壁上分别设有进气口和出气口,所述进气口和所述出气口均与所述反应腔室连通;The inside of the reactor body has a reaction chamber, and the two opposite side walls of the reactor body are respectively provided with an air inlet and an air outlet, and the air inlet and the air outlet are both connected with the The reaction chamber is connected;
    所述反应腔室分隔为第一腔室和第二腔室,所述进气口包括第一进气口以及第二进气口,所述第一进气口和所述出气口分别与所述第一腔室连通,所述第二进气口与所述第二腔室连通;The reaction chamber is divided into a first chamber and a second chamber, the air inlet includes a first air inlet and a second air inlet, the first air inlet and the air outlet are respectively connected with the the first chamber is in communication, and the second air inlet is in communication with the second chamber;
    且所述第一腔室和所述第二腔室之间具有多个控流通孔,以将所述第一腔室和所述第二腔室连通。And there are a plurality of control flow holes between the first chamber and the second chamber, so as to communicate the first chamber and the second chamber.
  2. 根据权利要求1所述的反应器,其特征在于,所述第二腔室位于所述第一腔室的上方。The reactor of claim 1, wherein the second chamber is located above the first chamber.
  3. 根据权利要求1或2所述的反应器,其特征在于,所述第一腔室和所述第二腔室之间设置有第一挡板,所述第一挡板上具有多个所述控流通孔,以将所述第一腔室和所述第二腔室连通。The reactor according to claim 1 or 2, wherein a first baffle is arranged between the first chamber and the second chamber, and the first baffle has a plurality of the A control flow hole is provided to communicate the first chamber and the second chamber.
  4. 根据权利要求3所述的反应器,其特征在于,多个所述控流通孔均匀间隔分布在所述第一挡板上;The reactor according to claim 3, wherein a plurality of the control flow holes are evenly distributed on the first baffle plate;
    或者,多个所述控流通孔间隔分布在所述第一挡板上,且从所述第一挡板靠近所述进气口的一端至所述第一挡板靠近所述出气口的一端的方向上,所述控流通孔的密集程度逐渐增大;Alternatively, a plurality of the control flow holes are distributed on the first baffle at intervals, from an end of the first baffle close to the air inlet to an end of the first baffle close to the air outlet In the direction of , the density of the control flow holes gradually increases;
    或者,多个所述控流通孔间隔分布在所述第一挡板上,且从所述第一挡板靠近所述进气口的一端至所述第一挡板靠近所述出气口的一端的方向上,所述控流通孔的密集程度逐渐减小。Alternatively, a plurality of the control flow holes are distributed on the first baffle at intervals, from an end of the first baffle close to the air inlet to an end of the first baffle close to the air outlet In the direction of , the density of the control flow holes gradually decreases.
  5. 根据权利要求3或4所述的反应器,其特征在于,所述控流通孔的直径为50nm-500um。The reactor according to claim 3 or 4, wherein the diameter of the control flow hole is 50nm-500um.
  6. 根据权利要求5所述的反应器,其特征在于,所述控流通孔的直径为20um-80um。The reactor according to claim 5, wherein the diameter of the control flow hole is 20um-80um.
  7. 根据权利要求3-6任一所述的反应器,其特征在于,多个所述控流通孔中的相邻两个控流通孔之间的距离为1-3mm。The reactor according to any one of claims 3-6, wherein the distance between two adjacent control flow holes in the plurality of control flow holes is 1-3 mm.
  8. 根据权利要求3-7任一所述的反应器,其特征在于,每个所述控流通孔朝向所述第一腔室的一侧延伸形成有延伸部。The reactor according to any one of claims 3-7, characterized in that, each of the flow control holes is formed with an extension portion extending from a side facing the first chamber.
  9. 根据权利要求8所述的反应器,其特征在于,所述延伸部的延伸长度为1-3mm。The reactor according to claim 8, wherein the extension length of the extension portion is 1-3 mm.
  10. 根据权利要求1-9任一所述的反应器,其特征在于,所述反应腔室和所述出气口之间设置有第二挡板;The reactor according to any one of claims 1-9, wherein a second baffle is arranged between the reaction chamber and the gas outlet;
    所述第二挡板的一端与所述反应器本体的下底壁相连,所述第二挡板的另一端与所述反应器本体的上底壁之间形成第一间隙。One end of the second baffle is connected to the lower bottom wall of the reactor body, and a first gap is formed between the other end of the second baffle and the upper bottom wall of the reactor body.
  11. 根据权利要求1-10任一所述的反应器,其特征在于,所述反应腔室内还具有至少一个通道,所述通道的入口与所述第一腔室相连通,所述通道的出口与所述出气口相连通。The reactor according to any one of claims 1-10, wherein the reaction chamber further has at least one channel, the inlet of the channel is communicated with the first chamber, and the outlet of the channel is connected to the first chamber. The air outlets are communicated.
  12. 根据权利要求11所述的反应器,其特征在于,所述反应腔室内具有两个所述通道;The reactor of claim 11, wherein the reaction chamber has two of the channels;
    两个所述通道中的第一通道的入口与所述第一腔室连通,所述第一通道的出口与两个所述通道中的第二通道的入口相连通,所述第二通道的出口与所述出气口连通;The inlet of the first channel of the two channels is communicated with the first chamber, the outlet of the first channel is communicated with the inlet of the second channel of the two channels, and the outlet of the second channel is communicated with the inlet of the second channel. the outlet communicates with the air outlet;
    且所述第一通道的入口与所述第二通道的出口位于所述反应器本体的同一侧。And the inlet of the first channel and the outlet of the second channel are located on the same side of the reactor body.
  13. 根据权利要求11或12所述的反应器,其特征在于,至少一个所述通道内设置有阻 流结构;所述通道具有第一侧壁、第二侧壁、上底壁以及下底壁;The reactor according to claim 11 or 12, wherein at least one of the passages is provided with a blocking structure; the passage has a first side wall, a second side wall, an upper bottom wall and a lower bottom wall;
    所述阻流结构与所述第一侧壁、所述第二侧壁、所述上底壁和所述下底壁中的任意一者、任意两者或任意三者固定相连,所述阻流结构与所述第一侧壁、所述第二侧壁、所述上底壁和所述下底壁中的至少一者之间形成有第二间隙。The flow blocking structure is fixedly connected to any one, any two or any three of the first side wall, the second side wall, the upper bottom wall and the lower bottom wall, and the blocking structure is A second gap is formed between the flow structure and at least one of the first side wall, the second side wall, the upper bottom wall, and the lower bottom wall.
  14. 根据权利要求13所述的反应器,其特征在于,所述阻流结构包括:至少一个阻流体;The reactor according to claim 13, wherein the bluff structure comprises: at least one bluff body;
    所述阻流体与所述通道的上底壁和下底壁中的其中一者固定相连,所述阻流体与所述通道的所述上底壁和所述下底壁中的另一者之间形成所述第二间隙。The bluff body is fixedly connected with one of the upper bottom wall and the lower bottom wall of the channel, and the bluff body is connected with the other one of the upper bottom wall and the lower bottom wall of the channel The second gap is formed therebetween.
  15. 根据权利要求14所述的反应器,其特征在于,所述阻流体的数量为多个;多个所述阻流体沿着所述通道的延伸方向间隔分布。The reactor according to claim 14, wherein the number of the bluff bodies is plural; and the plurality of the bluff bodies are distributed at intervals along the extending direction of the channel.
  16. 根据权利要求14或15所述的反应器,其特征在于,所述阻流体为柱状结构。The reactor according to claim 14 or 15, wherein the bluff body is a columnar structure.
  17. 根据权利要求14或15所述的反应器,其特征在于,所述阻流体为螺旋状结构。The reactor according to claim 14 or 15, wherein the bluff body is a helical structure.
  18. 根据权利要求14-17任一所述的反应器,其特征在于,所述阻流体的轴向方向与所述通道的延伸方向相垂直。The reactor according to any one of claims 14-17, wherein the axial direction of the bluff body is perpendicular to the extending direction of the channel.
  19. 根据权利要求1-18任一所述的反应器,其特征在于,所述反应器为III族金属源反应器。The reactor according to any one of claims 1-18, wherein the reactor is a Group III metal source reactor.
  20. 根据权利要求19所述的反应器,其特征在于,所述反应器为镓源反应器。The reactor of claim 19, wherein the reactor is a gallium source reactor.
  21. 根据权利要求20所述的反应器,其特征在于,所述反应器本体的所述反应腔室内具有液态镓。The reactor of claim 20, wherein the reaction chamber of the reactor body contains liquid gallium.
  22. 根据权利要求19-21任一所述的反应器,其特征在于,所述反应器的第一进气口通入的气体为卤化物气体或卤素气体。The reactor according to any one of claims 19-21, wherein the gas introduced into the first gas inlet of the reactor is a halide gas or a halogen gas.
  23. 根据权利要求22所述的反应器,其特征在于,当所述反应器的所述第一进气口通入的气体为卤化物气体或卤素气体时,所述反应器的材质为石英或刚玉。The reactor according to claim 22, wherein when the gas introduced into the first gas inlet of the reactor is halide gas or halogen gas, the material of the reactor is quartz or corundum .
  24. 根据权利要求19-23任一所述的反应器,其特征在于,所述反应器的第二进气口通入的气体为氢气、氩气和氮气中的任意一种或多种。The reactor according to any one of claims 19-23, wherein the gas introduced into the second gas inlet of the reactor is any one or more of hydrogen, argon and nitrogen.
  25. 一种生长装置,其特征在于,至少包括:生长设备以及上述权利要求1-24任一所述的反应器;其中,所述反应器的出口与所述生长设备的入口相连通。A growth device, characterized in that it at least comprises: a growth device and the reactor according to any one of the above claims 1-24; wherein the outlet of the reactor communicates with the inlet of the growth device.
PCT/CN2020/139144 2020-12-24 2020-12-24 Reactor and growth device WO2022133943A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202080108140.4A CN117062945A (en) 2020-12-24 2020-12-24 Reactor and growth device
PCT/CN2020/139144 WO2022133943A1 (en) 2020-12-24 2020-12-24 Reactor and growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2020/139144 WO2022133943A1 (en) 2020-12-24 2020-12-24 Reactor and growth device

Publications (1)

Publication Number Publication Date
WO2022133943A1 true WO2022133943A1 (en) 2022-06-30

Family

ID=82157181

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2020/139144 WO2022133943A1 (en) 2020-12-24 2020-12-24 Reactor and growth device

Country Status (2)

Country Link
CN (1) CN117062945A (en)
WO (1) WO2022133943A1 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101006548A (en) * 2004-06-30 2007-07-25 王望南 Deposition technique for producing high quality compound semiconductor materials
US20070231241A1 (en) * 2006-03-29 2007-10-04 Tokyo Electron Limited Method and integrated system for purifying and delivering a metal carbonyl precursor
CN101328579A (en) * 2007-06-24 2008-12-24 应用材料股份有限公司 HVPE showerhead design
CN101413112A (en) * 2007-10-16 2009-04-22 应用材料股份有限公司 Multi-gas straight channel showerhead
CN204138762U (en) * 2014-08-06 2015-02-04 上海世山科技有限公司 The gas mixer of a kind of HVPE
CN104878450A (en) * 2015-05-14 2015-09-02 中国科学院半导体研究所 AlN single crystal substrate production apparatus and application method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101006548A (en) * 2004-06-30 2007-07-25 王望南 Deposition technique for producing high quality compound semiconductor materials
US20070231241A1 (en) * 2006-03-29 2007-10-04 Tokyo Electron Limited Method and integrated system for purifying and delivering a metal carbonyl precursor
CN101328579A (en) * 2007-06-24 2008-12-24 应用材料股份有限公司 HVPE showerhead design
CN101413112A (en) * 2007-10-16 2009-04-22 应用材料股份有限公司 Multi-gas straight channel showerhead
CN204138762U (en) * 2014-08-06 2015-02-04 上海世山科技有限公司 The gas mixer of a kind of HVPE
CN104878450A (en) * 2015-05-14 2015-09-02 中国科学院半导体研究所 AlN single crystal substrate production apparatus and application method thereof

Also Published As

Publication number Publication date
CN117062945A (en) 2023-11-14

Similar Documents

Publication Publication Date Title
US9644267B2 (en) Multi-gas straight channel showerhead
TWI478771B (en) Multi-gas concentric injection showerhead
US20100263588A1 (en) Methods and apparatus for epitaxial growth of semiconductor materials
US20090095222A1 (en) Multi-gas spiral channel showerhead
TWI590300B (en) Wafer tray for MOCVD reaction system
US20120225564A1 (en) Vapor deposition device, vapor deposition method, and semiconductor element manufacturing method
JP2011012331A (en) Vapor deposition apparatus and vapor deposition method
US7011711B2 (en) Chemical vapor deposition reactor
CN103060906B (en) A kind of Square spray nozzle structure for vapor phase epitaxy of material
CN110172682A (en) The inlet spray head of vapor deposition apparatus
JP5015085B2 (en) Vapor growth equipment
CN104264128B (en) A kind of grating type distribution device in gas-fluid for MOCVD reactors
WO2022133943A1 (en) Reactor and growth device
TWI472645B (en) Mocvd gas diffusion system with air inlet baffles
JP2011018895A (en) Vapor-phase growth apparatus for group-iii nitride semiconductor
TWI502096B (en) Reaction device and manufacture method for chemical vapor deposition
WO2022266982A1 (en) Reaction device, growth device and growth apparatus
JP2010238831A (en) Vapor phase deposition device, and vapor phase deposition method
CN113363138A (en) Epitaxial growth method and apparatus
WO2021102726A1 (en) Linear spray head for gan material growth
CN218756159U (en) Spraying device for semiconductor material growth
KR20160116746A (en) Vertical metal organic chemical vapor deposition apparatus for solar cell
KR101343127B1 (en) Gas injector for batch type vapor deposition apparatus which includes a plurality of supply lines
JP2004103879A (en) Vapor growth device
US20150240356A1 (en) Inlet system for metal-organic chemical vapor deposition apparatus

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 20966515

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 202080108140.4

Country of ref document: CN

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 20966515

Country of ref document: EP

Kind code of ref document: A1