WO2022078009A1 - 一种计算机存储系统性能测试装置、方法及其存储介质 - Google Patents
一种计算机存储系统性能测试装置、方法及其存储介质 Download PDFInfo
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- the present invention relates to the technical field of computer storage systems, in particular to a computer storage system performance testing device, method and storage medium thereof.
- Performance is a key factor in evaluating a storage system. Understanding the performance test method, calculating the rationality of the test results, and mastering the necessary rectification methods are the keys to solving performance problems.
- bandwidth (Throughout)
- IOPS Input/Output Operations Per Second, the number of read and write operations per second). Bandwidth is used to measure the IO (more than 16KB) capability of the storage system to process sequential reads and writes of large data blocks. The unit is MB/s.
- IOPS is used to measure the IO of the storage system to process random read and write small data blocks. (Below 16KB) capability, that is, the number of read and write (I/O) operations per second. The higher the IOPS, the stronger the storage system's ability to handle IO.
- the performance test is a test for a specific device or a specific topology.
- the performance test When testing the performance of a specific component, ensure that the performance of other equipment in the system is better than that of the test equipment, and ensure that the test equipment is the only bottleneck, so as to test the maximum performance of the equipment; when testing the performance of the system, ensure that all interfaces and components work In the best state, in order to measure the limit performance value of the entire system and find the bottleneck point that limits the performance, in other words, the performance test is not a single component test, but a comprehensive capability test of the entire storage system. Due to this limitation, the methods for performance testing vary widely, but there are few theoretical calculation methods for performance under storage topology.
- the traditional storage system performance test builds a simple empirical database or mathematical model scheme, relies on the experience data of testers, or the experience accumulation of the existing test database, and does not analyze the performance parameters and link relationships of the devices under the topology, resulting in:
- the accuracy is not high.
- the hard disk is changed from HDD (Hard Disk Drive, hard disk drive) to SSD (Solid State Disk, solid state disk), even if the topology is the same, the result changes greatly.
- the verification cost is high. To verify the correctness of the data, it is necessary to cover the performance tests under multiple configurations and multiple topologies, and to provide sufficient measured data.
- this paper proposes a computer storage system performance testing device, method and storage medium.
- the purpose of the present invention is to provide a computer storage system performance testing device, method and storage medium, so as to alleviate the technical problems of poor flexibility, low accuracy and high verification cost in the prior art.
- a method for testing the performance of a computer storage system includes:
- the bandwidth topology nodes are divided according to the links between each device in the storage topology, and the IOPS topology nodes are divided according to each device in the storage topology;
- test result is obtained based on the highest value of the system performance, and the test result is output.
- the steps of calculating and obtaining bandwidth bottleneck nodes based on the highest performance value of each bandwidth topology node include:
- BW Bottleneck Minimum(BW Node1 ,BW Node2 ,...,BW NodeN );
- Bottleneck is the bottleneck node
- BW Bottleneck is the highest performance value of the bandwidth bottleneck node
- BW Nodei is the highest bandwidth value of each bandwidth topology node.
- steps of calculating and obtaining the IOPS bottleneck node based on the highest performance value of each IOPS topology node include:
- IOPS Bottleneck Minimum (IOPS Node1 , IOPS Node2 , ..., IOPS NodeN );
- Bottleneck is the bottleneck node
- IOPS Bottleneck is the highest performance value of the IOPS bottleneck node
- IOPS Nodei is the highest IOPS value of each IOPS topology node.
- steps of calculating and obtaining the IOPS bottleneck node based on the highest performance value of each IOPS topology node include:
- steps of performing a single-disk IOPS test on each hard disk to obtain the highest performance value of the single-disk bottleneck node system include:
- Latency Bottleneck Sum(Latency Node1 , Latency Node2 ,..., Latency NodeN ); wherein, Latency Nodei is the maximum delay value of each IOPS topology node;
- the steps of taking the highest performance value of the bandwidth bottleneck node or the IOPS bottleneck node as the highest system performance value include:
- the step of obtaining the test result based on the highest value of the system performance and outputting the test result it also includes:
- the configuration parameters of the topology nodes are adjusted, and the steps of calculating the maximum performance value of each bandwidth topology node and the maximum performance value of each IOPS topology node are returned.
- the present invention also provides a computer storage system performance testing device, comprising:
- the topology module is used to divide bandwidth topology nodes according to links between various devices in the storage topology, and divide IOPS topology nodes according to each device in the storage topology;
- the calculation module is used to obtain the highest performance value of each bandwidth topology node and the highest performance value of each IOPS topology node;
- the calculation module is used to calculate and obtain the bandwidth bottleneck node based on the highest performance value of each bandwidth topology node, and obtain the IOPS bottleneck node based on the calculation based on the highest performance value of each IOPS topology node, and use the bandwidth bottleneck node or the highest performance value of the IOPS bottleneck node as the The highest value of system performance;
- An output module configured to obtain a test result based on the highest value of the system performance, and output the test result.
- a computer-readable storage medium provided by the present invention stores machine-executable instructions.
- the computer-executable instructions When invoked and executed by a processor, the computer-executable instructions cause the The processor runs the computer storage system performance testing method.
- a computer storage system performance testing device, method, and storage medium provided by the embodiments of the present invention divide bandwidth topology nodes according to links between various devices in the storage topology, divide IOPS topology nodes according to each device in the storage topology, and Obtain the highest performance value of each bandwidth topology node and the highest performance value of each IOPS topology node, obtain the bandwidth bottleneck node and IOPS bottleneck node, use the highest performance value of the bandwidth bottleneck node or IOPS bottleneck node as the highest performance value of the system, and finally output Test Results. Therefore, the present invention can effectively obtain test results for various topology models, and solve the problem of poor flexibility in the prior art. When the device under the storage system is changed, the test accuracy can also be guaranteed, and it does not need to cover multiple configurations and multiple topologies. Saves the verification cost of the test.
- FIG. 1 is a flowchart of a storage system performance testing method provided by an embodiment of the present invention
- FIG. 2 is a schematic diagram of a performance method under a storage topology provided by an embodiment of the present invention
- FIG. 3 is a bandwidth node diagram of a storage topology provided by an embodiment of the present invention.
- FIG. 4 is an IOPS node diagram of a storage topology provided by an embodiment of the present invention.
- An embodiment of the present invention provides a technical solution, a method for testing the performance of a computer storage system, including:
- the bandwidth topology nodes are divided according to the links between each device in the storage topology, and the IOPS topology nodes are divided according to each device in the storage topology;
- test result is obtained based on the highest value of the system performance, and the test result is output.
- the steps of calculating and obtaining bandwidth bottleneck nodes based on the highest performance value of each bandwidth topology node include:
- BW Bottleneck Minimum(BW Node1 ,BW Node2 ,...,BW NodeN ) (——Formula 1);
- Bottleneck is the bottleneck node
- BW Bottleneck is the highest performance value of the bandwidth bottleneck node
- BW Nodei is the highest bandwidth value of each bandwidth topology node.
- steps of calculating and obtaining the IOPS bottleneck node based on the highest performance value of each IOPS topology node include:
- IOPS Bottleneck Minimum(IOPS Node1 , IOPS Node2 , ..., IOPS NodeN ) (——Formula 2);
- Bottleneck is the bottleneck node
- IOPS Bottleneck is the highest performance value of the IOPS bottleneck node
- IOPS Nodei is the highest IOPS value of each IOPS topology node.
- steps of calculating and obtaining the IOPS bottleneck node based on the highest performance value of each IOPS topology node include:
- steps of performing a single-disk IOPS test on each hard disk to obtain the highest performance value of the single-disk bottleneck node system include:
- Latency Bottleneck Sum(Latency Node1 ,Latency Node2 ,...,Latency NodeN ) (——Formula 3); wherein, Latency Nodei is the maximum delay value of each IOPS topology node;
- the steps of taking the highest performance value of the bandwidth bottleneck node or the IOPS bottleneck node as the highest system performance value include:
- the step of obtaining the test result based on the highest value of the system performance and outputting the test result it also includes:
- test results are compared with the actual test results;
- the running performance test refers to the process of using performance test tools (such as IOMeter, FIO, etc.) and outputting the performance test results, and comparing the theoretical calculation results and the actual measurement results.
- performance test tools such as IOMeter, FIO, etc.
- the performance of the topology node is adjusted, and the steps of calculating the maximum performance value of each bandwidth topology node and the maximum performance value of each IOPS topology node are returned.
- the operating parameters of the hard disk were set in a way suitable for sequential reading and writing.
- the operating parameters of the hard disk can be adjusted to a configuration more suitable for random reading and writing, so that the hard disk can be used in subsequent tests. , can play a higher performance.
- the parameters of the BIOS (Basic Input Output System) of the motherboard can be adjusted, so that the motherboard can exert higher performance in subsequent tests.
- the method of calculating the performance under the storage topology by the node method is basically consistent with the measured results, which proves that the theoretical analysis method is effective.
- bandwidth topology nodes are divided according to links between various devices in the storage topology
- IOPS topology nodes are divided according to each device in the storage topology
- the performance of each bandwidth topology node is obtained.
- the highest value and the highest performance value of each IOPS topology node are obtained to obtain the bandwidth bottleneck node and IOPS bottleneck node. Therefore, the present invention can effectively obtain test results for various topology models, and solve the problem of poor flexibility in the prior art.
- the test accuracy can also be guaranteed, and it does not need to cover multiple configurations and multiple topologies. Saves the verification cost of the test.
- An embodiment of the present invention provides a computer storage system performance testing device, including:
- the topology module is used to divide bandwidth topology nodes according to links between various devices in the storage topology, and divide IOPS topology nodes according to each device in the storage topology;
- the calculation module is used to obtain the highest performance value of each bandwidth topology node and the highest performance value of each IOPS topology node;
- the calculation module is used to calculate and obtain the bandwidth bottleneck node based on the highest performance value of each bandwidth topology node, and obtain the IOPS bottleneck node based on the calculation based on the highest performance value of each IOPS topology node, and use the bandwidth bottleneck node or the highest performance value of the IOPS bottleneck node as the The highest value of system performance;
- An output module configured to obtain a test result based on the highest value of the system performance, and output the test result.
- Embodiments of the present invention provide a computer-readable storage medium, where the computer-readable storage medium stores machine-executable instructions, and when the computer-executable instructions are invoked and executed by a processor, the computer-executable instructions cause all The processor runs the computer storage system performance testing method.
- nodes are divided according to the storage topology.
- the topology of the storage system is formed at the beginning of the system design.
- the storage topology of the system can be directly divided into nodes.
- the typical storage topology node division is shown in the following figure:
- the motherboard CPU central processing unit, central processing unit
- SAS Card Serial Attached SCSI
- PCIe peripheral component interconnect express, a high-speed serial computer expansion bus standard
- SAS Small Computer System Interface, small computer system interface
- Expander Expander
- 12 SATA SSD hard drives are connected via connectors:
- Node1 is the PCIe link between the motherboard PCIe and the SAS Card
- Node2 is the SAS link between the SAS card and the Expander cascading backplane
- Node3 is the Expander cascading backplane and 12 cards All SATA (Serial Advanced Technology Attachment) links between hard drives.
- SATA Serial Advanced Technology Attachment
- each device unit of the storage system is divided into multiple different nodes (NODEs) according to their positions in the topology; the arrows between the nodes represent the flow of storage IO; when calculating the theoretical maximum bandwidth, the nodes represent the storage system The exchange rate of high-speed signals between upstream and downstream devices in the topology; when calculating the theoretical maximum IOPS, a node represents a device unit in the storage system topology;
- the highest performance value of each node is an inherent attribute of each node equipment unit, such as factory parameters, design parameters, etc.
- the factory batch, model, and design parameters of the node equipment unit can be directly obtained.
- Each node needs to calculate the theoretical maximum bandwidth (BW NodeN ) and maximum IOPS (IOPS NodeN ).
- BW NodeN of a node When the theoretical maximum bandwidth BW NodeN of a node is equal to BW Bottleneck , it means that the bandwidth performance bottleneck of the current storage system is node N, and the maximum bandwidth of node N is the maximum bandwidth value of the storage system; when the theoretical maximum IOPS value of a node, IOPS NodeN is equal to IOPS Bottleneck , it indicates that the IOPS performance bottleneck of the current storage system is node N, and the maximum IOPS of node N is the maximum IOPS value of the storage system.
- Latency Bottleneck Sum(Latency Node1 ,Latency Node2 ,...,Latency NodeN )——Equation 3
- the bandwidth bottleneck node is Node1 (ie, the PCIe link between the motherboard PCIe slot and the SAS card), and the maximum bandwidth is 6400MB/s;
- the IOPS bottleneck node is Node4 (that is, the total 4K performance of 12 hard disks), and the maximum IOPS is 1164 K IOPS.
- the performance bandwidth and IOPS may correspond to different bottleneck nodes respectively. This is not contradictory, because the performance test items mainly include two types of bandwidth and IOPS, and the two test methods are different.
- Running performance testing refers to the process of using performance testing tools (such as IOMeter, FIO, etc.) and outputting performance testing results, comparing the theoretical calculation results with the actual measurement results, and then correcting and tuning the theoretical model of performance calculation.
- performance testing tools such as IOMeter, FIO, etc.
- the method of calculating the performance under the storage topology by the node method is basically consistent with the measured results, which proves that the theoretical analysis method is effective.
- the ratio of the measured IOPS value to the IOPS of a single disk can be calculated by the ratio of the theoretical delay of the hard disk to the total delay:
- Node1 is the main board
- Node2 is the SAS Card
- Node3 is the Expander cascaded backplane
- Node4 is all 12 SSDs.
- the terms “arranged”, “installed”, “connected” and “connected” should be understood in a broad sense, for example, it may be a fixed connection, It can also be a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or the internal communication between the two components.
- the specific meanings of the above terms in the present invention can be understood in specific situations.
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Abstract
一种计算机存储系统性能测试装置、方法及其存储介质，属于计算机存储系统的技术领域，该计算机存储系统性能测试方法包括：根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；计算每个带宽拓扑节点的性能最高值，和每个IOPS拓扑节点的性能最高值；基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点；基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点；将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；基于所述系统性能最高值获得测试结果，并输出所述测试结果。
Description
本申请要求于2020年10月13日提交中国专利局、申请号为202011090549.6、发明名称为“一种计算机存储系统性能测试装置、方法及其存储介质”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
本发明涉及计算机存储系统技术领域，尤其是涉及一种计算机存储系统性能测试装置、方法及其存储介质。
伴随着互联网的快速发展，云计算技术的不断兴起，网上业务量不断增加。面对服务器技术变革日新月异的变化，如何提高存储系统的性能一直以来都是重要技术难题，性能是评价一个存储系统的关键因素。理解性能测试的方法、计算测试结果的合理性、掌握必要的整改方法是解决性能问题的关键，体现存储系统性能优劣的参数主要有两个：带宽(Throughout)和IOPS(Input/Output Operations Per Second，每秒进行读写操作的次数)。带宽用于衡量存储系统处理顺序读写大数据块的IO(16KB以上)能力，单位是MB/s，带宽越高，性能越好；IOPS用于衡量存储系统处理随机读写小数据块的IO(16KB以下)能力，即每秒进行读写(I/O)操作的次数，IOPS越高，代表存储系统处理IO的能力越强，同时，性能测试是针对特定设备或者特定拓扑的测试。测试特定部件性能时，应保证系统中其他设备的带宽等性能优于该测试设备，确保该测试设备是唯一瓶颈，以测试出设备的最大性能；测试系统性能时，应保证所有接口和部件工作在最佳状态，以便测量出整个系统的极限性能值，并且找到限制性能的瓶颈点，而言之，性能测试不是单一部件的测试，而是整个存储系统的综合能力测试。受限于此,针对性能测试的方法千差万别，但是却少有针对存储拓扑下对性能的理论计算方法。
传统的存储系统性能测试搭建简单的经验数据库或者数学模型方案， 依赖测试人员的经验数据，或者已有的测试数据库的经验积累，没有分析拓扑下设备的性能参数和链路关系，导致：
1、灵活性差。当前模型只针对特定的某个拓扑或者某几种拓扑才有效，换成其他拓扑，需要根据实测结果重新搭建数学模型。
2、精确度不高。当存储系统下设备变更时，如硬盘由HDD(Hard Disk Drive，硬盘驱动器)变为SSD(Solid State Disk，固态硬盘)，即使拓扑一致，但是结果变化很大。
3、验证成本高。需要覆盖多种配置、多种拓扑下的性能测试，提供充分的实测数据，才能验证数据的正确。
为此本文提出一种计算机存储系统性能测试装置、方法及其存储介质。
发明内容
本发明的目的在于提供一种计算机存储系统性能测试装置、方法及其存储介质，以缓解了现有技术中存在的灵活性差，精确度不高和验证成本高的技术问题。
第一方面，本发明提供的一种计算机存储系统性能测试方法，包括：
根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；
获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；
基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点；
基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点；
将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；
基于所述系统性能最高值获得测试结果，并输出所述测试结果。
进一步的，基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点的步骤，包括：
通过算式BW
Bottleneck＝Minimum(BW
Node1,BW
Node2,...,BW
NodeN)计算带宽瓶颈节点；
其中，Bottleneck为瓶颈节点，BW
Bottleneck为带宽瓶颈节点的性能最高值， BW
Nodei为每个带宽拓扑节点的带宽最高值。
进一步的，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：
通过算式IOPS
Bottleneck＝Minimum(IOPS
Node1，IOPS
Node2，...，IOPS
NodeN)计算IOPS瓶颈节点；
其中，Bottleneck为瓶颈节点，IOPS
Bottleneck为IOPS瓶颈节点的性能最高值，IOPS
Nodei为每个IOPS拓扑节点的IOPS最高值。
进一步的，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：
对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点作为IOPS瓶颈节点。
进一步的，对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点系统性能最高值的步骤，包括：
通过算式Latency
Bottleneck＝Sum(Latency
Node1,Latency
Node2,...,Latency
NodeN)计算系统总延时Latency
Bottleneck；其中，Latency
Nodei为每个IOPS拓扑节点的延时最高值；
通过算式
计算单盘瓶颈节点的性能最高值IOPS
Bottleneck；其中，Latency
disk为单盘延时，IOPS
disk为单盘IOPS最高值。
进一步的，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值的步骤，包括：
将带宽瓶颈节点与IOPS瓶颈节点中较低的性能最高值作为系统性能最高值。
进一步的，基于所述系统性能最高值获得测试结果，并输出所述测试结果的步骤之后，还包括：
将所述测试结果与实测结果进行对比；
若对比差值超出预设值，则调节拓扑节点的配置参数，并返回计算每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值的步骤。
第二方面，本发明还提供一种计算机存储系统性能测试装置，包括：
拓扑模块，用于根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；
计算模块，用于获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；
测算模块，用于基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；
输出模块，用于基于所述系统性能最高值获得测试结果，并输出所述测试结果。
本发明提供的一种计算机可读存储介质，所述计算机可读存储介质存储有机器可运行指令，所述计算机可运行指令在被处理器调用和运行时，所述计算机可运行指令促使所述处理器运行所述计算机存储系统性能测试方法。
本发明实施例提供的一种计算机存储系统性能测试装置、方法及其存储介质，根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点，并获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值，获得带宽瓶颈节点和IOPS瓶颈节点，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值，最后输出测试结果。因此本发明针对各种拓扑模型都能有效获得测试结果解决了现有技术灵活性差的问题，存储系统下设备变更时，也能够保证测试精确度，并且不需要覆盖多种配置、多种拓扑，节省了测试的验证成本。
为了更清楚地说明本发明具体实施方式或现有技术中的技术方案，下面将对具体实施方式或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图是本发明的一些实施方式，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获 得其他的附图。
图1为本发明实施例提供的存储系统性能测试方法流程图；
图2为本发明实施例提供的储拓扑下性能方法示意图；
图3为本发明实施例提供的存储拓扑的带宽节点图；
图4为本发明实施例提供的存储拓扑的IOPS节点图。
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合附图对本发明的技术方案进行清楚、完整地描述，显然，所描述的实施例是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
本发明实施例中所提到的术语“包括”和“具有”以及它们的任何变形，意图在于覆盖不排他的包含。例如包含了一系列步骤或单元的过程、方法、系统、产品或设备没有限定于已列出的步骤或单元，而是可选地还包括其他没有列出的步骤或单元，或可选地还包括对于这些过程、方法、产品或设备固有的其它步骤或单元。
本发明实施例提供一种技术方案，一种计算机存储系统性能测试方法，包括：
根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；
获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；
基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点；
基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点；
将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；
基于所述系统性能最高值获得测试结果，并输出所述测试结果。
进一步的，基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点的步骤，包括：
通过算式BW
Bottleneck＝Minimum(BW
Node1,BW
Node2,...,BW
NodeN)(——公式1)计算带宽瓶颈节点；
其中，Bottleneck为瓶颈节点，BW
Bottleneck为带宽瓶颈节点的性能最高值，BW
Nodei为每个带宽拓扑节点的带宽最高值。
进一步的，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：
通过算式IOPS
Bottleneck＝Minimum(IOPS
Node1，IOPS
Node2，...，IOPS
NodeN)(——公式2)计算IOPS瓶颈节点；
其中，Bottleneck为瓶颈节点，IOPS
Bottleneck为IOPS瓶颈节点的性能最高值，IOPS
Nodei为每个IOPS拓扑节点的IOPS最高值。
进一步的，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：
对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点作为IOPS瓶颈节点。
进一步的，对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点系统性能最高值的步骤，包括：
通过算式Latency
Bottleneck＝Sum(Latency
Node1,Latency
Node2,...,Latency
NodeN)(——公式3)计算系统总延时Latency
Bottleneck；其中，Latency
Nodei为每个IOPS拓扑节点的延时最高值；
通过算式
计算单盘瓶颈节点的性能最高值IOPS
Bottleneck；其中，Latency
disk为单盘延时，IOPS
disk为单盘IOPS最高值。
进一步的，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值的步骤，包括：
将带宽瓶颈节点与IOPS瓶颈节点中较低的性能最高值作为系统性能最高值。
进一步的，基于所述系统性能最高值获得测试结果，并输出所述测试结果的步骤之后，还包括：
将所述测试结果与实测结果进行对比；运行性能测试是指运用性能测 试工具(如IOMeter、FIO等)并输出性能测试结果的过程，比较理论计算结果与实测结果之间是否有差异从而修正和调优性能计算的理论模型。
若对比差值超出预设值，则调节拓扑节点的性能，并返回计算每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值的步骤。例如，在之前的测试中，硬盘的运行参数是以适合顺序读写的方式设置的，那么本步骤中可以将硬盘的运行参数调整为更适合随机读写的配置，使得硬盘在之后的测试中，能够发挥出更高的性能。又如，可以对主板的BIOS(Basic Input Output System，基本输入输出系统)参数进行调节，使主板在之后的测试中发挥出更高的性能。根据多次性能测试，通过节点法计算存储拓扑下性能的方法与实测结果比较发现基本一致，证明该理论分析方法有效。
本发明实施例提供的计算机存储系统性能测试方法，根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点，并获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值，获得带宽瓶颈节点和IOPS瓶颈节点，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值，最后输出测试结果。因此本发明针对各种拓扑模型都能有效获得测试结果解决了现有技术灵活性差的问题，存储系统下设备变更时，也能够保证测试精确度，并且不需要覆盖多种配置、多种拓扑，节省了测试的验证成本。
本发明实施例提供一种计算机存储系统性能测试装置，包括：
拓扑模块，用于根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；
计算模块，用于获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；
测算模块，用于基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；
输出模块，用于基于所述系统性能最高值获得测试结果，并输出所述 测试结果。
本发明实施例提供一种计算机可读存储介质，所述计算机可读存储介质存储有机器可运行指令，所述计算机可运行指令在被处理器调用和运行时，所述计算机可运行指令促使所述处理器运行所述计算机存储系统性能测试方法。
在本实施例中需要说明的是，如图1所示，根据存储拓扑划分节点。存储系统的拓扑是在系统设计之初就已成型的，此时直接获得系统的存储拓扑划分节点即可。如典型的存储拓扑节点划分如下图所示：主板CPU(central processing unit，中央处理器)通过PCIe(peripheral component interconnect express，一种高速串行计算机扩展总线标准)槽位连接SAS Card(Serial Attached SCSI(Small Computer System Interface，小型计算机系统接口)Card，串行小型计算机系统接口卡)，SAS卡通过SAS线缆与Expander(扩张器)级联背板连接，Expander级联背板又与12张SATA SSD硬盘通过连接器连接：
理论带宽节点拓扑如下图所示：Node1是主板PCIe与SAS Card之间的PCIe链路；Node2是SAS卡与Expander级联背板之间的SAS链路；Node3是Expander级联背板与12张硬盘之间的所有SATA(Serial Advanced Technology Attachment，串行高级技术附件)链路。
如图2所示，将存储系统各设备单元按照拓扑中的位置划分为多个不同的节点(NODE)；节点之间的箭头代表存储IO的流向；当计算理论最大带宽时，节点代表存储系统拓扑中上行和下行设备之间高速信号的交互速率；当计算理论最大IOPS时，节点代表存储系统拓扑中个设备单元；
其中，每个节点的性能最高值，是每个节点设备单元的固有属性，比如出厂参数、设计参数等，在本步骤中节点设备单元的出厂批次、型号、设计参数直接获取即可。
每个节点需分别计算理论最大带宽(BW
NodeN)和最大IOPS(IOPS
NodeN)。
当节点的理论最大带宽BW
NodeN等于BW
Bottleneck时，说明当前存储系统的带宽性能瓶颈为节点N，且节点N的最大带宽就是存储系统的最大带宽值；当节点的理论最大IOPS值IOPS
NodeN等于IOPS
Bottleneck时，说明当前存储系统 的IOPS性能瓶颈为节点N，且节点N的最大IOPS就是存储系统的最大IOPS值。
存储系统拓扑下，由于IOPS＝IOdepth/Latency，即在IOdepth不变的情况下系统的延时(Latency)与IOPS成反比，所以系统的IOPS也可以用系统的延时来表征。
Latency
Bottleneck＝Sum(Latency
Node1,Latency
Node2,...,Latency
NodeN)——公式3
如图3-4所示，分别计算每个节点的最大带宽和最大IOPS值。
得到性能瓶颈节点和理论最大带宽、最大IOPS值。
根据公式1，得到带宽瓶颈节点为Node1(即主板PCIe槽位与SAS 卡之间的PCIe链路)，最大带宽为6400MB/s；
根据公式2，得到IOPS瓶颈节点为Node4(即12张硬盘总的4K性能)，最大IOPS为1164 K IOPS。
可以看出来，性能带宽和IOPS可能分别对应不同的瓶颈节点。这并不矛盾，因为性能测试项主要包括了带宽和IOPS两类，二者测试方法不同。
运行性能测试是指运用性能测试工具(如IOMeter、FIO等)并输出性能测试结果的过程，比较理论计算结果与实测结果之间是否有差异从而修正和调优性能计算的理论模型。
根据多次性能测试，通过节点法计算存储拓扑下性能的方法与实测结果比较发现基本一致，证明该理论分析方法有效。
例如，该拓扑下一组并行性能带宽测试数据比较：
例如，该拓扑下一组并行性能IOPS测试数据比较：
与并行测试的结果不同，当对所有硬盘逐一做单盘性能测试IOPS实 测时，理论上该拓扑中硬盘应该成为这种拓扑中的IOPS瓶颈点。但是实测结果却显示，硬盘在4K RR性能测试过程中无法达到厂商规定的最大IOPS值。这种拓扑下的单盘性能测试IOPS时，需要运用公式3来解决。
根据公式3，单盘性能测试时，系统理论延时瓶颈往往是SSD或者HDD硬盘；总的延时为：Latency
bottleneck＝Sum(5,60,50,400)＝515us。实测的IOPS值与单盘IOPS的比值，可以用硬盘的理论延时占总的延时的比例来计算：
理论IOPS节点拓扑如下图所示：Node1是主板，Node2是SAS Card，Node3是Expander级联背板，Node4是所有的12张SSD硬盘。
应注意到：相似的标号和字母在下面的附图中表示类似项，因此，一旦某一项在一个附图中被定义，则在随后的附图中不需要对其进行进一步定义和解释。
在本发明的描述中，需要说明的是，术语“中心”、“上”、“下”、“左”、 “右”、“竖直”、“水平”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，或者是该发明产品使用时惯常摆放的方位或位置关系，仅是为了便于描述本发明和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本发明的限制。此外，术语“第一”、“第二”、“第三”等仅用于区分描述，而不能理解为指示或暗示相对重要性。
在本发明的描述中，还需要说明的是，除非另有明确的规定和限定，术语“设置”、“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通。对于本领域的普通技术人员而言，可以具体情况理解上述术语在本发明中的具体含义。
Claims (9)
- 一种计算机存储系统性能测试方法，其特征在于，包括：根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点；基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点；将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；基于所述系统性能最高值获得测试结果，并输出所述测试结果。
- 根据权利要求1所述的计算机存储系统性能测试方法，其特征在于，基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点的步骤，包括：通过算式BW Bottleneck＝Minimum(BW Node1,BW Node2,...,BW NodeN)计算带宽瓶颈节点；其中，Bottleneck为瓶颈节点，BW Bottleneck为带宽瓶颈节点的性能最高值，BW Nodei为每个带宽拓扑节点的带宽最高值。
- 根据权利要求1所述的计算机存储系统性能测试方法，其特征在于，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：通过算式IOPS Bottleneck＝Minimum(IOPS Node1，IOPS Node2，...，IOPS NodeN)计算IOPS瓶颈节点；其中，Bottleneck为瓶颈节点，IOPS Bottleneck为IOPS瓶颈节点的性能最高值，IOPS Nodei为每个IOPS拓扑节点的IOPS最高值。
- 根据权利要求1所述的计算机存储系统性能测试方法，其特征在于，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点的步骤，包括：对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点作为IOPS瓶颈节点。
- 根据权利要求4所述的计算机存储系统性能测试方法，其特征在于，对每个硬盘进行单盘IOPS测试，获得单盘瓶颈节点系统性能最高值的步骤，包括：通过算式Latency Bottleneck＝Sum(Latency Node1,Latency Node2,...,Latency NodeN)计算系统总延时Latency Bottleneck；其中，Latency Nodei为每个IOPS拓扑节点的延时最高值；通过算式计算单盘瓶颈节点的性能最高值IOPS Bottleneck；其中，Latency disk为单盘延时，IOPS disk为单盘IOPS最高值。
- 根据权利要求1所述的计算机存储系统性能测试方法，其特征在于，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值的步骤，包括：将带宽瓶颈节点与IOPS瓶颈节点中较低的性能最高值作为系统性能最高值。
- 根据权利要求1所述的计算机存储系统性能测试方法，其特征在于，基于所述系统性能最高值获得测试结果，并输出所述测试结果的步骤之后，还包括：将所述测试结果与实测结果进行对比；若对比差值超出预设值，则调节拓扑节点的配置参数，并返回计算每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值的步骤。
- 一种计算机存储系统性能测试装置，其特征在于，包括：拓扑模块，用于根据存储拓扑中各个设备之间的链路划分带宽拓扑节点，根据存储拓扑中的各个设备划分IOPS拓扑节点；计算模块，用于获取每个带宽拓扑节点的性能最高值和每个IOPS拓扑节点的性能最高值；测算模块，用于基于各个带宽拓扑节点的性能最高值进行测算获得带宽瓶颈节点，基于各个IOPS拓扑节点的性能最高值进行测算获得IOPS瓶颈节点，将带宽瓶颈节点或IOPS瓶颈节点的性能最高值作为系统性能最高值；输出模块，用于基于所述系统性能最高值获得测试结果，并输出所述测试结果。
- 一种计算机可读存储介质，其特征在于，所述计算机可读存储介质存储有机器可运行指令，所述计算机可运行指令在被处理器调用和运行时，所述计算机可运行指令促使所述处理器运行所述权利要求1至7任一项所述的方法。
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115543718A (zh) * | 2022-09-23 | 2022-12-30 | 苏州浪潮智能科技有限公司 | 一种硬盘读写测试的方法、装置、设备及可读介质 |
| CN115934435A (zh) * | 2022-10-21 | 2023-04-07 | 苏州浪潮智能科技有限公司 | 设备存储性能的检测方法、装置、电子设备及存储介质 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112269696A (zh) * | 2020-10-13 | 2021-01-26 | 苏州浪潮智能科技有限公司 | 一种计算机存储系统性能测试装置、方法及其存储介质 |
| CN113568798B (zh) * | 2021-09-28 | 2022-01-04 | 苏州浪潮智能科技有限公司 | 服务器故障定位方法、装置、电子设备及存储介质 |
| CN115394345A (zh) * | 2022-08-25 | 2022-11-25 | 苏州浪潮智能科技有限公司 | 一种服务器硬盘性能的测试方法、装置、设备及介质 |
| CN120723610B (zh) * | 2025-08-27 | 2025-10-28 | 苏州元脑智能科技有限公司 | 一种计算节点的性能和压力测试方法以及电子设备 |
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| CN111090551A (zh) * | 2019-11-22 | 2020-05-01 | 苏州浪潮智能科技有限公司 | 一种存储服务器性能测试调优方法和装置 |
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| CN112269696A (zh) * | 2020-10-13 | 2021-01-26 | 苏州浪潮智能科技有限公司 | 一种计算机存储系统性能测试装置、方法及其存储介质 |
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| CN115543718A (zh) * | 2022-09-23 | 2022-12-30 | 苏州浪潮智能科技有限公司 | 一种硬盘读写测试的方法、装置、设备及可读介质 |
| CN115934435A (zh) * | 2022-10-21 | 2023-04-07 | 苏州浪潮智能科技有限公司 | 设备存储性能的检测方法、装置、电子设备及存储介质 |
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