WO2021241763A1 - Resin composition - Google Patents
Resin composition Download PDFInfo
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- WO2021241763A1 WO2021241763A1 PCT/JP2021/020567 JP2021020567W WO2021241763A1 WO 2021241763 A1 WO2021241763 A1 WO 2021241763A1 JP 2021020567 W JP2021020567 W JP 2021020567W WO 2021241763 A1 WO2021241763 A1 WO 2021241763A1
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- Prior art keywords
- group
- carbon atoms
- independently
- resin composition
- formula
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- 239000011342 resin composition Substances 0.000 title claims abstract description 257
- 229920001721 polyimide Polymers 0.000 claims abstract description 410
- 125000000962 organic group Chemical group 0.000 claims abstract description 336
- 239000002210 silicon-based material Substances 0.000 claims abstract description 234
- 239000004642 Polyimide Substances 0.000 claims abstract description 230
- 150000001875 compounds Chemical class 0.000 claims abstract description 176
- 239000002243 precursor Substances 0.000 claims abstract description 132
- 239000009719 polyimide resin Substances 0.000 claims abstract description 96
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 claims abstract description 90
- 239000011347 resin Substances 0.000 claims abstract description 79
- 229920005989 resin Polymers 0.000 claims abstract description 79
- 125000004432 carbon atom Chemical group C* 0.000 claims description 326
- 239000002253 acid Substances 0.000 claims description 180
- 150000004985 diamines Chemical class 0.000 claims description 168
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims description 155
- 125000000524 functional group Chemical group 0.000 claims description 108
- -1 3,4-Dicarboxyphenyl Chemical group 0.000 claims description 91
- 238000000034 method Methods 0.000 claims description 84
- 125000003277 amino group Chemical group 0.000 claims description 78
- 238000004519 manufacturing process Methods 0.000 claims description 75
- 238000006243 chemical reaction Methods 0.000 claims description 74
- 125000001931 aliphatic group Chemical group 0.000 claims description 68
- 239000000758 substrate Substances 0.000 claims description 59
- 125000003118 aryl group Chemical group 0.000 claims description 56
- 125000004018 acid anhydride group Chemical group 0.000 claims description 41
- 238000006068 polycondensation reaction Methods 0.000 claims description 41
- 238000010438 heat treatment Methods 0.000 claims description 38
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 claims description 37
- 238000000576 coating method Methods 0.000 claims description 33
- 239000011248 coating agent Substances 0.000 claims description 32
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 30
- 125000003700 epoxy group Chemical group 0.000 claims description 28
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 28
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 claims description 28
- 125000003396 thiol group Chemical group [H]S* 0.000 claims description 28
- 102100031503 Barrier-to-autointegration factor-like protein Human genes 0.000 claims description 24
- 101000729827 Homo sapiens Barrier-to-autointegration factor-like protein Proteins 0.000 claims description 24
- 125000004185 ester group Chemical group 0.000 claims description 24
- 150000004820 halides Chemical group 0.000 claims description 24
- 125000004216 fluoromethyl group Chemical group [H]C([H])(F)* 0.000 claims description 22
- LJGHYPLBDBRCRZ-UHFFFAOYSA-N 3-(3-aminophenyl)sulfonylaniline Chemical compound NC1=CC=CC(S(=O)(=O)C=2C=C(N)C=CC=2)=C1 LJGHYPLBDBRCRZ-UHFFFAOYSA-N 0.000 claims description 20
- 230000008569 process Effects 0.000 claims description 20
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 claims description 19
- KIFDSGGWDIVQGN-UHFFFAOYSA-N 4-[9-(4-aminophenyl)fluoren-9-yl]aniline Chemical compound C1=CC(N)=CC=C1C1(C=2C=CC(N)=CC=2)C2=CC=CC=C2C2=CC=CC=C21 KIFDSGGWDIVQGN-UHFFFAOYSA-N 0.000 claims description 17
- 241000699700 Ondatra zibethicus Species 0.000 claims description 10
- HTJFDXAUQWWWFX-UHFFFAOYSA-N 4-[10-(3,4-dicarboxyphenyl)-1,3-dioxoindeno[2,1-e][2]benzofuran-10-yl]phthalic acid Chemical compound C(=O)(O)C=1C=C(C=CC1C(=O)O)C1(C2=CC=CC=C2C2=CC=C3C(=C12)C(=O)OC3=O)C3=CC(=C(C=C3)C(=O)O)C(=O)O HTJFDXAUQWWWFX-UHFFFAOYSA-N 0.000 claims description 8
- NKYXYJFTTIPZDE-UHFFFAOYSA-N 4-[4-amino-2-(trifluoromethyl)phenoxy]-3-(trifluoromethyl)aniline Chemical compound FC(F)(F)C1=CC(N)=CC=C1OC1=CC=C(N)C=C1C(F)(F)F NKYXYJFTTIPZDE-UHFFFAOYSA-N 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 6
- APXJLYIVOFARRM-UHFFFAOYSA-N 4-[2-(3,4-dicarboxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(C(O)=O)C(C(O)=O)=C1 APXJLYIVOFARRM-UHFFFAOYSA-N 0.000 claims description 5
- QHHKLPCQTTWFSS-UHFFFAOYSA-N 5-[2-(1,3-dioxo-2-benzofuran-5-yl)-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)(C(F)(F)F)C(F)(F)F)=C1 QHHKLPCQTTWFSS-UHFFFAOYSA-N 0.000 claims description 4
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims description 4
- 150000008064 anhydrides Chemical class 0.000 claims description 3
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 156
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 156
- 239000010408 film Substances 0.000 description 108
- 239000002904 solvent Substances 0.000 description 82
- 239000000203 mixture Substances 0.000 description 80
- 238000003756 stirring Methods 0.000 description 78
- 125000005462 imide group Chemical group 0.000 description 59
- 238000010992 reflux Methods 0.000 description 52
- 239000000243 solution Substances 0.000 description 50
- SXGMVGOVILIERA-UHFFFAOYSA-N (2R,3S)-2,3-diaminobutanoic acid Natural products CC(N)C(N)C(O)=O SXGMVGOVILIERA-UHFFFAOYSA-N 0.000 description 47
- 239000002966 varnish Substances 0.000 description 44
- 239000000178 monomer Substances 0.000 description 42
- OVASAEXSPYGGES-UHFFFAOYSA-N C1C2C(C(OC3=O)=O)C3C1CC2(C1=O)CCC21CC1CC2C2C(=O)OC(=O)C12 Chemical compound C1C2C(C(OC3=O)=O)C3C1CC2(C1=O)CCC21CC1CC2C2C(=O)OC(=O)C12 OVASAEXSPYGGES-UHFFFAOYSA-N 0.000 description 37
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 36
- 125000003368 amide group Chemical group 0.000 description 31
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 27
- 230000000052 comparative effect Effects 0.000 description 27
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 27
- 229910001873 dinitrogen Inorganic materials 0.000 description 26
- 239000003921 oil Substances 0.000 description 24
- 235000019198 oils Nutrition 0.000 description 24
- 239000010410 layer Substances 0.000 description 23
- 238000011156 evaluation Methods 0.000 description 19
- 229910052710 silicon Inorganic materials 0.000 description 19
- 239000010703 silicon Substances 0.000 description 19
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 19
- 239000011521 glass Substances 0.000 description 17
- 125000004122 cyclic group Chemical group 0.000 description 16
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 16
- 230000015572 biosynthetic process Effects 0.000 description 15
- 150000001408 amides Chemical class 0.000 description 14
- 239000012299 nitrogen atmosphere Substances 0.000 description 14
- 229920001296 polysiloxane Polymers 0.000 description 14
- 238000003786 synthesis reaction Methods 0.000 description 14
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 13
- 239000004094 surface-active agent Substances 0.000 description 13
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 12
- 238000001035 drying Methods 0.000 description 12
- 239000004973 liquid crystal related substance Substances 0.000 description 12
- 150000008065 acid anhydrides Chemical class 0.000 description 11
- 238000003860 storage Methods 0.000 description 11
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 10
- 239000012298 atmosphere Substances 0.000 description 10
- 238000001723 curing Methods 0.000 description 10
- 238000001914 filtration Methods 0.000 description 10
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 10
- 125000003258 trimethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])[*:1] 0.000 description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 9
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 9
- 239000001301 oxygen Substances 0.000 description 9
- 229910052760 oxygen Inorganic materials 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- 125000000217 alkyl group Chemical group 0.000 description 8
- 125000000753 cycloalkyl group Chemical group 0.000 description 8
- 125000001995 cyclobutyl group Chemical group [H]C1([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 8
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 8
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 8
- 229910052731 fluorine Inorganic materials 0.000 description 8
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 8
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 8
- 125000001971 neopentyl group Chemical group [H]C([*])([H])C(C([H])([H])[H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 8
- 229920006395 saturated elastomer Polymers 0.000 description 8
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 8
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 8
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 7
- 125000006159 dianhydride group Chemical group 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 238000006116 polymerization reaction Methods 0.000 description 7
- 125000003944 tolyl group Chemical group 0.000 description 7
- KWOIWTRRPFHBSI-UHFFFAOYSA-N 4-[2-[3-[2-(4-aminophenyl)propan-2-yl]phenyl]propan-2-yl]aniline Chemical compound C=1C=CC(C(C)(C)C=2C=CC(N)=CC=2)=CC=1C(C)(C)C1=CC=C(N)C=C1 KWOIWTRRPFHBSI-UHFFFAOYSA-N 0.000 description 6
- NVKGJHAQGWCWDI-UHFFFAOYSA-N 4-[4-amino-2-(trifluoromethyl)phenyl]-3-(trifluoromethyl)aniline Chemical compound FC(F)(F)C1=CC(N)=CC=C1C1=CC=C(N)C=C1C(F)(F)F NVKGJHAQGWCWDI-UHFFFAOYSA-N 0.000 description 6
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 6
- 229910052581 Si3N4 Inorganic materials 0.000 description 6
- 125000004453 alkoxycarbonyl group Chemical group 0.000 description 6
- 150000001412 amines Chemical class 0.000 description 6
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 6
- 125000000582 cycloheptyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 6
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 6
- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 125000005843 halogen group Chemical group 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 6
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 6
- 230000002194 synthesizing effect Effects 0.000 description 6
- LJMPOXUWPWEILS-UHFFFAOYSA-N 3a,4,4a,7a,8,8a-hexahydrofuro[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1C2C(=O)OC(=O)C2CC2C(=O)OC(=O)C21 LJMPOXUWPWEILS-UHFFFAOYSA-N 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 230000009435 amidation Effects 0.000 description 5
- 238000007112 amidation reaction Methods 0.000 description 5
- 238000009835 boiling Methods 0.000 description 5
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 4
- GEWWCWZGHNIUBW-UHFFFAOYSA-N 1-(4-nitrophenyl)propan-2-one Chemical compound CC(=O)CC1=CC=C([N+]([O-])=O)C=C1 GEWWCWZGHNIUBW-UHFFFAOYSA-N 0.000 description 4
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 4
- UENRXLSRMCSUSN-UHFFFAOYSA-N 3,5-diaminobenzoic acid Chemical compound NC1=CC(N)=CC(C(O)=O)=C1 UENRXLSRMCSUSN-UHFFFAOYSA-N 0.000 description 4
- 125000004975 3-butenyl group Chemical group C(CC=C)* 0.000 description 4
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 4
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- 125000003545 alkoxy group Chemical group 0.000 description 4
- GCAIEATUVJFSMC-UHFFFAOYSA-N benzene-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1C(O)=O GCAIEATUVJFSMC-UHFFFAOYSA-N 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- 229910052801 chlorine Inorganic materials 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 4
- 239000011737 fluorine Substances 0.000 description 4
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 4
- 238000005227 gel permeation chromatography Methods 0.000 description 4
- 230000009477 glass transition Effects 0.000 description 4
- 125000006038 hexenyl group Chemical group 0.000 description 4
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 4
- 230000006872 improvement Effects 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 239000012528 membrane Substances 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- 238000005192 partition Methods 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 229920000139 polyethylene terephthalate Polymers 0.000 description 4
- 239000005020 polyethylene terephthalate Substances 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 229920005591 polysilicon Polymers 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 229920002545 silicone oil Polymers 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 4
- 125000005023 xylyl group Chemical group 0.000 description 4
- MEKOFIRRDATTAG-UHFFFAOYSA-N 2,2,5,8-tetramethyl-3,4-dihydrochromen-6-ol Chemical compound C1CC(C)(C)OC2=C1C(C)=C(O)C=C2C MEKOFIRRDATTAG-UHFFFAOYSA-N 0.000 description 3
- DKKYOQYISDAQER-UHFFFAOYSA-N 3-[3-(3-aminophenoxy)phenoxy]aniline Chemical compound NC1=CC=CC(OC=2C=C(OC=3C=C(N)C=CC=3)C=CC=2)=C1 DKKYOQYISDAQER-UHFFFAOYSA-N 0.000 description 3
- MQAHXEQUBNDFGI-UHFFFAOYSA-N 5-[4-[2-[4-[(1,3-dioxo-2-benzofuran-5-yl)oxy]phenyl]propan-2-yl]phenoxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC2=CC=C(C=C2)C(C)(C=2C=CC(OC=3C=C4C(=O)OC(=O)C4=CC=3)=CC=2)C)=C1 MQAHXEQUBNDFGI-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 3
- 239000002313 adhesive film Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 230000000875 corresponding effect Effects 0.000 description 3
- YMHQVDAATAEZLO-UHFFFAOYSA-N cyclohexane-1,1-diamine Chemical compound NC1(N)CCCCC1 YMHQVDAATAEZLO-UHFFFAOYSA-N 0.000 description 3
- 230000018044 dehydration Effects 0.000 description 3
- 238000006297 dehydration reaction Methods 0.000 description 3
- 230000005525 hole transport Effects 0.000 description 3
- 150000002430 hydrocarbons Chemical group 0.000 description 3
- 239000011229 interlayer Substances 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000003960 organic solvent Substances 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000003566 sealing material Substances 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 238000005979 thermal decomposition reaction Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 3
- YKNMIGJJXKBHJE-UHFFFAOYSA-N (3-aminophenyl)-(4-aminophenyl)methanone Chemical compound C1=CC(N)=CC=C1C(=O)C1=CC=CC(N)=C1 YKNMIGJJXKBHJE-UHFFFAOYSA-N 0.000 description 2
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 2
- VXNZUUAINFGPBY-UHFFFAOYSA-N 1-Butene Chemical group CCC=C VXNZUUAINFGPBY-UHFFFAOYSA-N 0.000 description 2
- AFFLGGQVNFXPEV-UHFFFAOYSA-N 1-decene Chemical group CCCCCCCCC=C AFFLGGQVNFXPEV-UHFFFAOYSA-N 0.000 description 2
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- AVQQQNCBBIEMEU-UHFFFAOYSA-N 1,1,3,3-tetramethylurea Chemical compound CN(C)C(=O)N(C)C AVQQQNCBBIEMEU-UHFFFAOYSA-N 0.000 description 1
- BWKAYBPLDRWMCJ-UHFFFAOYSA-N 1,1-diethoxy-n,n-dimethylmethanamine Chemical compound CCOC(N(C)C)OCC BWKAYBPLDRWMCJ-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- PCNMALATRPXTKX-UHFFFAOYSA-N 1,4-dimethylcyclohexa-2,4-dien-1-ol Chemical compound CC1=CCC(C)(O)C=C1 PCNMALATRPXTKX-UHFFFAOYSA-N 0.000 description 1
- KUFFULVDNCHOFZ-UHFFFAOYSA-N 2,4-xylenol Chemical compound CC1=CC=C(O)C(C)=C1 KUFFULVDNCHOFZ-UHFFFAOYSA-N 0.000 description 1
- BSKHPKMHTQYZBB-UHFFFAOYSA-N 2-methylpyridine Chemical compound CC1=CC=CC=N1 BSKHPKMHTQYZBB-UHFFFAOYSA-N 0.000 description 1
- RSCMSACQRPYYRN-UHFFFAOYSA-N 3,5-diaminobenzamide Chemical compound NC(=O)C1=CC(N)=CC(N)=C1 RSCMSACQRPYYRN-UHFFFAOYSA-N 0.000 description 1
- PMJIKKNFJBDSHO-UHFFFAOYSA-N 3-[3-aminopropyl(diethoxy)silyl]oxy-3-methylpentane-1,5-diol Chemical compound NCCC[Si](OCC)(OCC)OC(C)(CCO)CCO PMJIKKNFJBDSHO-UHFFFAOYSA-N 0.000 description 1
- WCXGOVYROJJXHA-UHFFFAOYSA-N 3-[4-[4-(3-aminophenoxy)phenyl]sulfonylphenoxy]aniline Chemical compound NC1=CC=CC(OC=2C=CC(=CC=2)S(=O)(=O)C=2C=CC(OC=3C=C(N)C=CC=3)=CC=2)=C1 WCXGOVYROJJXHA-UHFFFAOYSA-N 0.000 description 1
- FPHRTSFRLFDOHZ-UHFFFAOYSA-N 3-[[4-[3-aminopropyl(dimethyl)silyl]phenyl]-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)C1=CC=C([Si](C)(C)CCCN)C=C1 FPHRTSFRLFDOHZ-UHFFFAOYSA-N 0.000 description 1
- UAHAMNBFDHWCPU-UHFFFAOYSA-N 3-tributoxysilylpropan-1-amine Chemical compound CCCCO[Si](CCCN)(OCCCC)OCCCC UAHAMNBFDHWCPU-UHFFFAOYSA-N 0.000 description 1
- LVNLBBGBASVLLI-UHFFFAOYSA-N 3-triethoxysilylpropylurea Chemical compound CCO[Si](OCC)(OCC)CCCNC(N)=O LVNLBBGBASVLLI-UHFFFAOYSA-N 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- XUZVALKTSQQLCH-UHFFFAOYSA-N 3-tripropoxysilylpropan-1-amine Chemical compound CCCO[Si](CCCN)(OCCC)OCCC XUZVALKTSQQLCH-UHFFFAOYSA-N 0.000 description 1
- VGVHNLRUAMRIEW-UHFFFAOYSA-N 4-methylcyclohexan-1-one Chemical compound CC1CCC(=O)CC1 VGVHNLRUAMRIEW-UHFFFAOYSA-N 0.000 description 1
- JZQUFXTZHWQLPU-UHFFFAOYSA-N 4-tributoxysilylbutan-2-amine Chemical compound CCCCO[Si](CCC(C)N)(OCCCC)OCCCC JZQUFXTZHWQLPU-UHFFFAOYSA-N 0.000 description 1
- BHTZPJXABISXPB-UHFFFAOYSA-N 4-triethoxysilylbutan-2-amine Chemical compound CCO[Si](OCC)(OCC)CCC(C)N BHTZPJXABISXPB-UHFFFAOYSA-N 0.000 description 1
- QAPHWZATUFXMGN-UHFFFAOYSA-N 4-trimethoxysilylbutan-2-amine Chemical compound CO[Si](OC)(OC)CCC(C)N QAPHWZATUFXMGN-UHFFFAOYSA-N 0.000 description 1
- ONPDPADPZNBIDE-UHFFFAOYSA-N 4-tripropoxysilylbutan-2-amine Chemical compound CCCO[Si](CCC(C)N)(OCCC)OCCC ONPDPADPZNBIDE-UHFFFAOYSA-N 0.000 description 1
- FMACFWAQBPYRFO-UHFFFAOYSA-N 5-[9-(1,3-dioxo-2-benzofuran-5-yl)fluoren-9-yl]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C2(C3=CC=CC=C3C3=CC=CC=C32)C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 FMACFWAQBPYRFO-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 1
- QOSSAOTZNIDXMA-UHFFFAOYSA-N Dicylcohexylcarbodiimide Chemical compound C1CCCCC1N=C=NC1CCCCC1 QOSSAOTZNIDXMA-UHFFFAOYSA-N 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 1
- ZSXGLVDWWRXATF-UHFFFAOYSA-N N,N-dimethylformamide dimethyl acetal Chemical compound COC(OC)N(C)C ZSXGLVDWWRXATF-UHFFFAOYSA-N 0.000 description 1
- ZWXPDGCFMMFNRW-UHFFFAOYSA-N N-methylcaprolactam Chemical compound CN1CCCCCC1=O ZWXPDGCFMMFNRW-UHFFFAOYSA-N 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 239000004697 Polyetherimide Substances 0.000 description 1
- 239000004734 Polyphenylene sulfide Substances 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000000010 aprotic solvent Substances 0.000 description 1
- 239000003125 aqueous solvent Substances 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 239000007810 chemical reaction solvent Substances 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 229910001431 copper ion Inorganic materials 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- RZIPTXDCNDIINL-UHFFFAOYSA-N cyclohexane-1,1,2,2-tetracarboxylic acid Chemical compound OC(=O)C1(C(O)=O)CCCCC1(C(O)=O)C(O)=O RZIPTXDCNDIINL-UHFFFAOYSA-N 0.000 description 1
- VKIRRGRTJUUZHS-UHFFFAOYSA-N cyclohexane-1,4-diamine Chemical compound NC1CCC(N)CC1 VKIRRGRTJUUZHS-UHFFFAOYSA-N 0.000 description 1
- UKJLNMAFNRKWGR-UHFFFAOYSA-N cyclohexatrienamine Chemical group NC1=CC=C=C[CH]1 UKJLNMAFNRKWGR-UHFFFAOYSA-N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- ZZNQQQWFKKTOSD-UHFFFAOYSA-N diethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OCC)(OCC)C1=CC=CC=C1 ZZNQQQWFKKTOSD-UHFFFAOYSA-N 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- OLLFKUHHDPMQFR-UHFFFAOYSA-N dihydroxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](O)(O)C1=CC=CC=C1 OLLFKUHHDPMQFR-UHFFFAOYSA-N 0.000 description 1
- AHUXYBVKTIBBJW-UHFFFAOYSA-N dimethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OC)(OC)C1=CC=CC=C1 AHUXYBVKTIBBJW-UHFFFAOYSA-N 0.000 description 1
- SZIZIGBTHTUEBU-UHFFFAOYSA-N dimethoxy-bis(4-methylphenyl)silane Chemical compound C=1C=C(C)C=CC=1[Si](OC)(OC)C1=CC=C(C)C=C1 SZIZIGBTHTUEBU-UHFFFAOYSA-N 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 239000012769 display material Substances 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000032050 esterification Effects 0.000 description 1
- 238000005886 esterification reaction Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- JBTWLSYIZRCDFO-UHFFFAOYSA-N ethyl methyl carbonate Chemical compound CCOC(=O)OC JBTWLSYIZRCDFO-UHFFFAOYSA-N 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 238000007646 gravure printing Methods 0.000 description 1
- 229920006015 heat resistant resin Polymers 0.000 description 1
- 229920006158 high molecular weight polymer Polymers 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- YAMHXTCMCPHKLN-UHFFFAOYSA-N imidazolidin-2-one Chemical compound O=C1NCCN1 YAMHXTCMCPHKLN-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000008863 intramolecular interaction Effects 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 239000012046 mixed solvent Substances 0.000 description 1
- 125000002950 monocyclic group Chemical group 0.000 description 1
- 125000005487 naphthalate group Chemical group 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 125000005375 organosiloxane group Chemical group 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920005575 poly(amic acid) Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 229920000069 polyphenylene sulfide Polymers 0.000 description 1
- 229920012287 polyphenylene sulfone Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000001226 reprecipitation Methods 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 238000006798 ring closing metathesis reaction Methods 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 125000001174 sulfone group Chemical group 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- KKEYFWRCBNTPAC-UHFFFAOYSA-L terephthalate(2-) Chemical compound [O-]C(=O)C1=CC=C(C([O-])=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-L 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- FCVNATXRSJMIDT-UHFFFAOYSA-N trihydroxy(phenyl)silane Chemical compound O[Si](O)(O)C1=CC=CC=C1 FCVNATXRSJMIDT-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- XQEGZYAXBCFSBS-UHFFFAOYSA-N trimethoxy-(4-methylphenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=C(C)C=C1 XQEGZYAXBCFSBS-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- NLSXASIDNWDYMI-UHFFFAOYSA-N triphenylsilanol Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(O)C1=CC=CC=C1 NLSXASIDNWDYMI-UHFFFAOYSA-N 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- 235000015112 vegetable and seed oil Nutrition 0.000 description 1
- 239000008158 vegetable oil Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/34—Layered products comprising a layer of synthetic resin comprising polyamides
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1057—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain
- C08G73/106—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain containing silicon
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L83/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
- C08L83/10—Block- or graft-copolymers containing polysiloxane sequences
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/22—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of auxiliary dielectric or reflective layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
Definitions
- the present invention relates to a polyimide precursor / polyimide-containing resin composition and a polyimide film.
- the present invention further relates to a method for producing a polyimide precursor / polyimide-containing resin composition, and a method for producing a polyimide film, a display, a laminate, and a flexible device.
- the polyimide resin is an insoluble and infusible super heat resistant resin, and has excellent properties such as heat oxidation resistance, heat resistance, radiation resistance, low temperature resistance, and chemical resistance. Therefore, polyimide resins are used in a wide range of fields including electronic materials. Examples of applications of polyimide resins in the field of electronic materials include insulating coating materials, insulating films, semiconductors, electrode protective films for thin film transistor liquid crystal displays (TFT-LCD), and the like. Recently, taking advantage of the lightness and flexibility of the polyimide film, adoption as a flexible substrate is being considered in place of the glass substrate conventionally used in the field of display materials.
- Patent Document 1 describes, as a monomer, 3,5-diaminobenzamide (hereinafter, also referred to as DABA) and the following structural formula: A polyimide film obtained by synthesizing a polyimide using the above compound (hereinafter, also referred to as CpODA) and another compound, adding a cross-linking agent to the obtained polyimide varnish, applying the mixture, and drying the film is described. .. Further, Patent Document 1 also describes that this film has excellent gas separation performance.
- Patent Document 2 is a transparent polyimide film obtained by applying and drying a polyimide varnish using DABA, TFMB (2,2'-bis (trifluoromethyl) benzidine) as a diamine and CpODA as an acid dianhydride. Is described.
- Patent Document 1 The polyimide film described in Patent Document 1 is used as a gas separation membrane and has not been studied as an optical material.
- the present inventors synthesized a polyimide varnish in the same manner as described in Patent Document 2 using DABA, TFMB and CpODA, a silicon-containing compound, etc. as a monomer, and found that the varnish required in the varnish manufacturing process. It was found that the polyimide film obtained by applying and heating the polyimide varnish has insufficient properties (tensile elongation, etc.) required for display applications.
- the present inventors have DABA, 3,3'-diaminodiphenyl sulfone (33DAS), 4,4'-diaminodiphenyl sulfone (44DAS), 9,9-bis (4-aminophenyl) fluorene (BAFL) and the like.
- ODPA 4,4'-oxydiphthalic anhydride
- BPAF 9,9-bis (3,4-dicarboxyphenyl) fluorene diacid anhydride
- the present invention has been made in view of the above circumstances, and has both the characteristics required for the manufacturing process of the polyimide precursor and / or the polyimide-containing resin composition and other characteristics required for display applications. It is an object of the present invention to provide an excellent polyimide film and a resin composition for forming the same.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- It contains a structural unit derived from the silicon-containing compound represented by, and contains 25% by mass or less of the silicon-containing compound based on the total mass of the resin.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- It contains a structural unit derived from a silicon-containing compound represented by, and the imidization ratio of the resin is 50% or more.
- Resin composition. ⁇ 3> The resin composition according to item 1, wherein the resin has an imidization ratio of 50% or more.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- the P 3 and / or P 5 is the following general formula (8): In comprising a structural unit derived from a compound represented; or (b) the P 4 and / or P 6 is represented by the following general formula (9): Includes structural units derived from the compounds represented by; A resin composition that satisfies any of the above.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
- 3,3'-Diaminodiphenyl sulfone (33DAS), 4,4'-Diaminodiphenyl sulfone (44DAS), or 9,9-bis (4-aminophenyl) fluorene (BAFL) A resin composition containing at least one structural unit derived from each of the above compounds.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
- 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) A resin composition containing at least one structural unit derived from. ⁇ 7> The following general formulas (6) and (7): ⁇ In the formula, P 3 represents a divalent organic group, P 4 represents a tetravalent organic group, and p represents a positive integer.
- P 5 represents a divalent organic group
- P 6 represents a tetravalent organic group
- q represents a positive integer.
- P 5 or P 6 is represented by the following general formula (10):
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50. be.
- the diamine The following general formula (8): Compound represented by, 3,3'-Diaminodiphenyl sulfone (33DAS), 4,4'-Diaminodiphenyl sulfone (44DAS), and 9,9-bis (4-aminophenyl) fluorene (BAFL)
- 33DAS 3,3'-Diaminodiphenyl sulfone
- 44DAS 4,4'-Diaminodiphenyl sulfone
- BAFL 9,9-bis (4-aminophenyl) fluorene
- P 4 and / or P 6 are each independently, 4,4'-oxydiphthalic anhydride (ODPA), or 9,9-bis ( 3,4-Dicarboxyphenyl)
- ODPA 4,4'-oxydiphthalic anhydride
- BPAF fluorene diacid anhydride
- the P 5 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
- P 4 or P 6 are each independently, 4,4 '- (hexafluoro isopropylidene) diphthalic anhydride, the following formula: Compound represented by (BzDA), or the following formula:
- BNBDA compound represented by (BzDA)
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ After polycondensation reaction of the silicon-containing compound represented by It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
- the silicon-containing compound is contained in an amount of 25% by mass or less based on the total mass of the resin.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ After polycondensation reaction of the silicon-containing compound represented by It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
- the imidization rate of the resin is 50% or more.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- a method for producing a resin composition which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- a method for producing a resin composition which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
- a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds At least one compound selected from 4,4'-oxydiphthalic anhydride (ODPA) and 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF), and the following general formula ( 10):
- ODPA 4,4'-oxydiphthalic anhydride
- BPAF 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- a method for producing a resin composition which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
- a film forming step of heating the resin composition to form a polyimide resin film An element forming step of forming an element on the polyimide resin film and A peeling step of peeling the polyimide resin film on which the element is formed from the support, How to make a display, including.
- the P 1 is the following general formula (3): Containing a structural unit derived from in the compound represented by, and the P 1
- the P 2 is represented by the following general formula (5): ⁇ In the formula, R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms, and R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are each independently an integer of 0 to 200
- the functional group equivalent is 800 or more.
- the above P 2 is the following general formula (4): 28.
- the resin composition according to item 28 which comprises a structural unit derived from the compound represented by.
- the above P 3 or P 4 is the following general formula (10): ⁇
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms, R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and L 1 and L 2 are independent groups.
- P 5 indicates a divalent organic group
- P 6 indicates a tetravalent organic group
- q indicates a positive integer
- P 5 indicates a 2,2'-bis (tri). Fluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) is not included.
- the above P 3 or P 4 is the following general formula (10): ⁇ In the formula, R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms, and R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms.
- the P 3 and / or P 5 is the following general formula (8): In comprising a structural unit derived from a compound represented; or (b) the P 4 and / or P 6 is represented by the following general formula (9): Includes structural units derived from the compounds represented by; A resin composition that satisfies any of the above.
- P 5 indicates a divalent organic group
- P 6 indicates a tetravalent organic group
- q indicates a positive integer
- P 5 indicates a 2,2'-bis (tri). Fluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) is not included.
- the above P 3 or P 4 is the following general formula (10): ⁇ In the formula, R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms, and R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50. be.
- ⁇ Containing a structural unit derived from in the silicon-containing compound represented, and the P 3 and / or P 5 is 3,3'-diaminodiphenyl sulfone (33DAS), or 4,4'-diaminodiphenyl sulfone (44DAS)
- Fluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) is not included.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50.
- BAFL 9,9-Bis (4-aminophenyl) fluorene
- Compound (BisAM) A resin composition containing at least one structural unit derived from each of the above compounds.
- the above P 3 or P 4 is the following general formula (10): ⁇
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms, R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ In comprising a structural unit derived from silicon-containing compound represented, and the P 4 and / or P 6 is 4,4'-Oxydiphthalic anhydride (ODPA), 4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride (6FDA), 9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF), The following general formula: Compound (BzDA); or the following general formula: Compound (BNBDA); A resin composition containing at least one structural unit derived from each of the above compounds.
- ODPA 4,4'-Oxydiphthalic anhydride
- 6FDA 4,4'-(Hexafluoroisopropylidene) diphthal
- the P 3 contains a structural unit derived from the compound represented by the general formula (10).
- the P 3 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
- the compound represented by the general formula (3) or (8) is more than 50 mol% when the total diamine (excluding the compound represented by the general formula (5) or (10)) is 100 mol%.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50.
- a method for producing a resin composition which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction of another compound to provide a polyimide precursor and / or a polyimide.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50.
- a method for producing a resin composition which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are independently integers of 0 to 200, with 0 ⁇ j / (i + j + k) ⁇ 0.50. be.
- a method for producing a resin composition which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide.
- a film forming step of heating the resin composition to form a polyimide resin film A peeling step of peeling the polyimide resin film from the support, A method for producing a polyimide resin film, including.
- the method for producing a polyimide resin film according to item 43 which comprises an irradiation step of irradiating the resin composition with a laser from the support side prior to the peeling step.
- a film forming step of heating the resin composition to form a polyimide resin film An element forming step of forming an element on the polyimide resin film and A peeling step of peeling the polyimide resin film on which the element is formed from the support, How to make a display, including.
- a method for manufacturing a flexible device which comprises manufacturing the laminate by the method according to item 46 or 47.
- a polyimide precursor or a polyimide resin composition having excellent properties required for display applications by using DABA, CpODA, other silicon-containing compounds and the like as monomers.
- secondly using DABA, a silicon-containing compound and other compounds as a monomer, or using DABA and a silicon-containing compound and other compounds as a monomer, 3,3'-diamino Using diphenyl sulfone (33DAS) and / or 4,4'-diaminodiphenyl sulfone (44DAS), a silicon-containing compound and other compounds as monomers, a polyimide precursor or polyimide resin composition having excellent properties required for display applications.
- DABA diphenyl sulfone
- 44DAS 4,4'-diaminodiphenyl sulfone
- FIG. 1 is a schematic view showing the structure of a top-emission type flexible organic EL display above the polyimide substrate as an example of the display of the present embodiment.
- the present embodiment an exemplary embodiment of the present invention (hereinafter, abbreviated as “the present embodiment”) will be described in detail.
- the present invention is not limited to the present embodiment, and can be variously modified and implemented within the scope of the gist thereof.
- the upper limit value and the lower limit value of each numerical range can be arbitrarily combined.
- the resin composition of the present embodiment has the following general formulas (6) and (7): ⁇ In the formula, P 3 represents a divalent organic group, P 4 represents a tetravalent organic group, and p represents a positive integer. ⁇ ⁇ In the formula, P 5 represents a divalent organic group, P 6 represents a tetravalent organic group, and q represents a positive integer.
- ⁇ In comprising a structural unit of the resin represented, in part may also include imidized polyimide precursor, P 5 or P 6 is represented by the following general formula (10):
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ Includes a structural unit derived from a silicon-containing compound represented by.
- the viscosity stability of the composition is superior to that of the total polyimide precursor, and the polyimide (polyimide precursor) is synthesized as compared with the total polyimide. Excellent in terms of ease.
- the ratio of the silicon group-containing compound is 25% by mass or less based on the total mass of the resin.
- the ratio of the silicon-containing compound in the total resin is preferably 20% by mass or less, more preferably 10% by mass or less, and particularly preferably 5% by mass or less, from the viewpoint of viscosity storage stability and filterability of the varnish.
- the mechanism by which the smaller the ratio of the silicon-containing compound in the resin is, the better the viscosity storage stability and the filterability of the varnish is unclear, but it is considered that the aggregation of the dissociated silicon group-containing compound is correlated. Be done.
- the ratio of the silicon group-containing compound is preferably 5% by mass or more, more preferably 10% by mass or more, and particularly preferably 15% by mass or more, from the viewpoint of the residual stress of the obtained polyimide film.
- the appropriate ratio of the silicon-containing compound in the total resin varies depending on the type and ratio of the diamine monomer and acid dianhydride monomer used, and the residual stress of the polyimide film, the viscosity storage stability of the varnish, the filterability, etc. are mutually considered. Then you need to decide.
- the imidization rate of the resin is 50% or more.
- the imidization ratio of the resin is preferably 60% or more, more preferably 70% or more, further preferably 80% or more, and particularly preferably 90% or more from the viewpoint of viscosity storage stability of the varnish.
- the mechanism by which the viscosity storage stability of the varnish is better as the imidization ratio is larger is not clear, but it is considered that there is a correlation with the occurrence of decomposition polymerization of the amide portion during the storage of the varnish.
- the imidization rate of the resin is preferably 90% or less, more preferably 80% or less, still more preferably 70% or less, from the viewpoint of hygroscopic white turbidity of the varnish.
- the mechanism by which the hygroscopic white turbidity of the varnish is less likely to occur as the imidization ratio is smaller is not clear, but it is considered to have a correlation with the solvent solubility of the polyimide / polyamide.
- the appropriate imidization ratio of the resin varies depending on the type and ratio of the diamine monomer and acid dianhydride monomer used, and it is necessary to determine the appropriate imidization ratio in consideration of the viscosity storage stability of the varnish, the moisture absorption and cloudiness of the varnish, and the like. ..
- the difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine monomer of the resin is larger than 0 and 60 or less.
- the difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine monomer of the resin can be obtained from the following formula.
- A: Silicon-containing compound ratio (% by mass) in diamine of imide unit silicon-containing compound used in imidization step / total mass of diamine monomer (including silicon-containing compound) used in imidization step * 100
- B: Silicon-containing compound ratio (% by mass) in diamine of the amide unit total mass of silicon-containing compound used in the imidization step / diamine monomer (including silicon-containing compound) used in the amidation step * 100
- A is "among the general formula in (7) of the diamine constituting the P 5, the ratio (mass%) of the general formula (10)" and can turn also.
- B can be rephrased as "the ratio (mass%) of the general formula (10) to the diamines constituting P 3 in the general formula (6)". Then, the difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine becomes BA by using the above A and B.
- the difference between the imide unit and the amide unit in the proportion of the silicon-containing compound in the diamine monomer is the difference between the imide unit and the amide unit in the partially imidized polyimide precursor (polyamide-imide) resin having a structure derived from the silicon-containing compound.
- polyamide-imide partially imidized polyimide precursor
- the diamine used for the resin is The following general formula (8): Compound; 3,3'-Diaminodiphenyl sulfone (33DAS); 4,4'-Diaminodiphenyl sulfone (44DAS); and 9,9-bis (4-aminophenyl) fluorene (BAFL)
- 33DAS 3,3'-Diaminodiphenyl sulfone
- 44DAS 4,4'-Diaminodiphenyl sulfone
- BAFL 9,9-bis (4-aminophenyl) fluorene
- the resin composition according to another embodiment of the present invention has the following general formulas (6) and (7): ⁇ In the formula, P 3 represents a divalent organic group, P 4 represents a tetravalent organic group, and p represents a positive integer. ⁇ ⁇ In the formula, P 5 represents a divalent organic group, P 6 represents a tetravalent organic group, and q represents a positive integer. ⁇ It can also contain a partially imidized polyimide precursor, including structural units represented by. P 5 or P 6 is represented by the following general formula (10): ⁇ In the formula, R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms, and R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers of 0 to 200, and 0 ⁇ j / (i + j + k) ⁇ 0.50.
- ⁇ It can contain a structural unit derived from a silicon-containing compound represented by, and can satisfy any of the following (a) or (b):
- (A) The P 3 and / or P 5 is the following general formula (8): In comprising a structural unit derived from a compound represented; or (b) the P 4 and / or P 6 is represented by the following general formula (9): Includes building blocks derived from the compound represented by.
- the diamine resin composition has the following general formula (8): Compound; 3,3'-Diaminodiphenyl sulfone (33DAS); 4,4'-Diaminodiphenyl sulfone (44DAS); 9,9-bis (4-aminophenyl) fluorene (BAFL); or 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) Contains at least one building block selected from each diamine compound of.
- diamine compounds represented by the general formula (8) 3,5-diaminobenzoic acid (DABA) is preferable from the viewpoint of transparency of the polyimide film and YI.
- the content of DABA in the total diamine is more than 50 mol%, more than 55 mol%, or more than 70 mol%, or 90. It may be mol% or more, or 95 mol% or more.
- the larger the amount of DABA the larger the tensile elongation of the polyimide film, which is preferable.
- diamines other than the general formula (8) examples include p-phenylenediamine (PDA), m-phenylenediamine, 2,2'-dimethylbenzidine (mTB), 4,4'-diaminodiphenylsulfide, and 3,4'-diamino.
- PDA p-phenylenediamine
- mTB 2,2'-dimethylbenzidine
- 4,4'-diaminodiphenylsulfide 4,4'-diaminodiphenylsulfide
- 3,4'-diamino examples include p-phenylenediamine (PDA), m-phenylenediamine, 2,2'-dimethylbenzidine (mTB), 4,4'-diaminodiphenylsulfide, and 3,4'-diamino.
- Diamines other than the general formula (8) consist of a group consisting of 1,3-bis [1- (4-aminophenyl) -1-methylethyl] benzene] (BisAM) and 1,4-cyclohexanediamine (CHDA). It is preferably at least one selected.
- the acid dianhydride resin composition has the following general formula (9): Compound represented by (also referred to as CpODA), 4,4'-Oxydiphthalic anhydride (ODPA) or 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF) Contains at least one building block selected from each acid dianhydride compound of. Having these structural units is preferable because the transparency, YI, and heat resistance of the obtained polyimide film can be improved.
- CpODA Compound represented by
- ODPA 4,4'-Oxydiphthalic anhydride
- BPAF 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride
- the content of CpODA, ODPA, and BPAF in the total acid dianhydride is 50 mol% or more and 60 mol% or more. , Or 70 mol% or more, 90 mol% or more, or 95 mol% or more.
- a larger amount of CpODA, ODPA, and BPAF is preferable because the transparency of the polyimide film is improved.
- Examples of the acid dianhydride other than the general formula (9) include pyromellitic acid dianhydride (PMDA), 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride (BPDA), 2,2',.
- PMDA pyromellitic acid dianhydride
- BPDA 4,4'-biphenyltetracarboxylic acid dianhydride
- 2,2' 2,2'
- 3,3'-Biphenyltetracarboxylic dianhydride 4,4'-(hexafluoroisopropylidene) diphthalic anhydride (6FDA), 5- (2,5-dioxotetrahydro-3-franyl) -3- Methyl-cyclohexene-1,2 dicarboxylic acid anhydride, 1,2,3,4-benzenetetracarboxylic acid dianhydride, 3,3', 4,4'-benzophenone tetracarboxylic acid dianhydride, 2,2' , 3,3'-benzophenone tetracarboxylic acid dianhydride, 3,3', 4,4'-diphenylsulfone tetracarboxylic acid dianhydride, methylene-4,4'-diphthalic acid dianhydride, 1,1- Ethiliden-4,4'-diphthalic acid dianhydride, 2,2-propylidene-4,4'-diphthal
- the acid dianhydride other than the above general formula (9) may be at least one selected from the group consisting of BzDA, BNBDA, 1,2,4,5-cyclohexanetetracarboxylic dianhydride (HPMDA). preferable.
- the acid dianhydride may be used alone or in combination of two or more.
- the polyimide precursor in the present embodiment may have a structure represented by the above formula (6) as well as a structure represented by the above formula (7).
- the content ratio of the structure derived from the silicon-containing compound in the polyimide precursor is preferably 5% by mass or more and 40% by mass or less based on the mass of the polyimide precursor. It is preferable that the polyimide precursor contains a structure derived from a silicon-containing compound within this numerical range because it is possible to achieve both low residual stress and high transparency and heat resistance in the obtained polyimide film.
- the content ratio of the structure derived from the silicon-containing compound may be 6% by mass or more, 7% by mass or more, or 30% by mass or less, or 25% by mass or less, based on the mass of the polyimide precursor. You may.
- the polyimide / polyimide precursor in this embodiment has a structure derived from a silicon-containing compound. Therefore, the silicon-containing compound used in the synthesis of the polyimide precursor in the present embodiment may be a compound having a reactive group capable of cocondensing with at least one of the tetracarboxylic dianhydride and the diamine.
- Such a silicon-containing compound is, for example, the following formula (10) :.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms.
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 2 and R 3 is a monovalent aliphatic group having 1 to 5 carbon atoms.
- It is a hydrocarbon group and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 4 and R 5 is a monovalent aromatic group having 6 to 10 carbon atoms.
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 6 and R 7 is an unsaturated aliphatic hydrocarbon having 2 to 10 carbon atoms. It is an organic group containing a hydrogen group.
- L 1 and L 2 are each independently a monovalent organic group containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group.
- i and j are independently integers from 1 to 200, respectively.
- k is an integer from 0 to 200, and The relationship of 0.05 ⁇ j / (i + j + k) ⁇ 0.50 is satisfied. ⁇ Can be mentioned.
- R 1 in the formula (10) is a single bond or a divalent organic group having 1 to 10 carbon atoms, respectively.
- the divalent organic group having 1 to 10 carbon atoms may be linear, cyclic, or branched, and may be saturated or unsaturated.
- Examples of the divalent aliphatic hydrocarbon group having 1 to 10 carbon atoms include a methylene group, an ethylene group, an n-propylene group, an i-propylene group, an n-butylene group, an s-butylene group and a t-butylene group.
- Linear or branched alkylene groups such as n-pentylene group, neopentylene group, n-hexylene group, n-heptylene group, n-octylene group, n-nonylene group, n-decylene group; cyclopropylene group, cyclobutylene group, Examples thereof include a cycloalkylene group such as a cyclopentylene group, a cyclohexylene group, a cycloheptylene group and a cyclooctylene group.
- the divalent aliphatic hydrocarbon group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of an ethylene group, an n-propylene group and an i-propylene group.
- R 2 and R 3 in the formula (10) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- the monovalent organic group having 1 to 10 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group, and an n-pentyl group.
- Cycloalkyl group such as cycloheptyl group, cyclooctyl group; aromatic group such as phenyl group, tolyl group, xsilyl group, ⁇ -naphthyl group, ⁇ -naphthyl group and the like.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, and a t-butyl group.
- Linear or branched alkyl groups such as n-pentyl group and neopentyl group; cycloalkyl groups such as cyclopropyl group, cyclobutyl group and cyclopentyl group can be mentioned.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and an n-propyl group.
- R 4 and R 5 in the formula (10) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aromatic group having 6 to 10 carbon atoms.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- monovalent organic groups having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group and n-pentyl.
- Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl.
- Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, ⁇ -naphthyl group and ⁇ -naphthyl group can be mentioned.
- Examples of the monovalent aromatic group having 6 to 10 carbon atoms include a phenyl group, a tolyl group, a xsilyl group, an ⁇ -naphthyl group, a ⁇ -naphthyl group and the like, and may be a phenyl group, a tolyl group, or a xsilyl group. It is preferable to have.
- R 6 and R 7 in the formula (10) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is an organic group having an unsaturated aliphatic hydrocarbon group.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched. Examples of the monovalent organic group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group and an n-pentyl group.
- Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl.
- Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, ⁇ -naphthyl group and ⁇ -naphthyl group can be mentioned.
- the monovalent organic group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and a group phenyl.
- the organic group having an unsaturated aliphatic hydrocarbon group may be an unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms, and may be linear, cyclic or branched.
- Examples of the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms include a vinyl group, an allyl group, a 1-propenyl group, a 3-butenyl group, a 2-butenyl group, a pentenyl group, a cyclopentenyl group, a hexenyl group and a cyclo. Examples thereof include a hexenyl group, a heptenyl group, an octenyl group, a nonenyl group, a decenyl group, an ethynyl group, a propynyl group, a butynyl group, a pentynyl group and a hexynyl group.
- the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms is preferably at least one selected from the group consisting of a vinyl group, an allyl group, and a 3-butenyl group.
- a part or all of the hydrogen atoms of R 1 to R 7 in the formula (10) may be substituted with a substituent such as a halogen atom such as F, Cl, Br, etc., or may be unsubstituted.
- L 1 and L 2 in the formula (10) are each independently a monovalent organic group (also referred to as an acid anhydride group) containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, and the like. It is a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group.
- Examples of the monovalent organic group containing an acid anhydride structure include the following formula: ⁇ In the above formula, "*" represents a bond. ⁇ , Examples thereof include a 2,5-dioxotetrahydrofuran-3-yl group.
- the alkoxyl group in the alkoxycarbonyl group may be an alkoxyl group having 1 to 6 carbon atoms, for example, a methoxyl group, an ethoxyl group, an n-propoxyl group, an i-propoxyl group, an n-butoxyl group, or an i-butoxyl group. , T-butoxyl group and the like.
- the halogen atom in the halogenated carbonyl group is preferably a halogen atom other than a fluorine atom, and more preferably a chlorine atom or an iodine atom.
- the functional group equivalent of the silicon-containing compound represented by the formula (10) is preferably 800 or more, more preferably 1000 or more, still more preferably 1500 or more, from the viewpoint of the filterability of the resin composition.
- the functional group equivalent is the molecular weight of the silicon-containing compound per 1 mol of the functional group (unit: g / mol).
- the functional group equivalent can be measured by a known method.
- the functional group equivalent of the silicon-containing compound is 800 or more, the residual stress of the polyimide film under the nitrogen atmosphere is small, which is preferable. The reason for this is considered to be that when the functional group equivalent is equal to or more than a specific value, the silicone domain increases and stress is relaxed.
- the functional group equivalent can be measured according to existing standards and the like.
- I in the formula (10) is an integer of 1 to 200, preferably an integer of 2 to 100, more preferably an integer of 4 to 80, and even more preferably an integer of 8 to 40.
- j and k are independently integers of 0 to 200, preferably an integer of 0 to 50, more preferably an integer of 0 to 20, and even more preferably an integer of 0 to 50.
- the polyimide in the resin composition has a structure derived from the formula (10) because the residual stress measured in the nitrogen atmosphere of the polyimide film is good (small).
- the reason for measuring in a nitrogen atmosphere is that when an inorganic film such as SiO, SiN is formed on a polyimide film in the display process, it may be exposed to the nitrogen atmosphere, and the residual stress in the nitrogen atmosphere is small. This is because it is required.
- the resin composition of this embodiment is The following general formula (1) or (2): ⁇ In the formula, P 1 represents a divalent organic group, P 2 represents a tetravalent organic group, and p represents a positive integer. ⁇ ⁇ In the formula, P 1 represents a divalent organic group, P 2 represents a tetravalent organic group, and p represents a positive integer.
- P 1 contains the resin of the structural unit represented by, and may also contain a polyimide precursor (hereinafter, also referred to as a total polyimide precursor) or a polyimide (hereinafter, also referred to as a total polyimide), and P 1 is the following general formula (3). : Containing a structural unit derived from the compound represented by, and optionally, P 2 is the following general formula (4) :. It can contain a structural unit derived from the compound represented by. Further, P 1 or P 2 is expressed by the following general formula (5): ⁇ In the formula, R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms, and R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms.
- At least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms
- R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- Each independently is an amino group
- i is an integer of 1 to 200
- j and k are each independently an integer of 0 to 200
- the functional group equivalent is 8000 or more ⁇ Includes a structural unit derived from a silicon-containing compound represented by.
- Polyimide can be obtained by thermally imidizing a polyimide precursor and can also be chemically imidized. Thermal imidization is preferable from the viewpoint of transparency of the obtained polyimide film.
- the polyimide resin composition is preferable as compared with the polyimide precursor resin composition from the viewpoint of the viscosity stability of the composition.
- the resin composition according to another embodiment of the present invention has the following general formulas (6) and (7): ⁇ In the formula, P 3 represents a divalent organic group, P 4 represents a tetravalent organic group, p represents a positive integer, and P 3 represents a 2,2'-bis (tri). Does not contain fluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) or structural units derived from it. ⁇ ⁇ In the formula, P 5 indicates a divalent organic group, P 6 indicates a tetravalent organic group, q indicates a positive integer, and P 5 indicates a 2,2'-bis (tri).
- P 3 and / or P 5 are 3,3'-diaminodiphenyl sulfone (33DAS); or 4,4'-diaminodiphenyl sulfone (44DAS) It can contain at least one structural unit derived from each compound of.
- P 3 and / or P 5 are 9,9-Bis (4-aminophenyl) fluorene (BAFL); or the following general formula: Compound (BisAM) It can contain at least one structural unit derived from each compound of.
- the compound of the following general formula (8), 3,3'-diaminodiphenyl sulfone (33DAS) and / or 4,4'-diaminodiphenyl sulfone ( 44DAS) is preferred.
- the use of 6FODA for P 3 and / or P 5 is not preferable from the viewpoint of viscosity stability of the varnish, filterability, and foreign matter generated during imidization.
- P 4 and / or P 6 is represented by the following general formula (9): It can also contain a structural unit derived from the compound represented by.
- P 4 and / or P 6 is 4,4'-Oxydiphthalic anhydride (ODPA); 4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride (6FDA); 9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF); the following general formula: Compound (BzDA); and the following general formula: Compound (BNBDA); Can contain at least one structural unit derived from the compound of.
- ODPA 4,4'-Oxydiphthalic anhydride
- 6FDA 4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride
- BPAF 9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride
- the compound of the general formula (9), ODPA is preferable from the viewpoint of viscosity stability of the varnish, filterability, and transparency of the polyimide film.
- P 3 or P 4 is represented by the following general formula (10): ⁇
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms. It is a group, at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms, and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, respectively.
- At least one is a monovalent aromatic group having 6 to 10 carbon atoms
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms
- L 1 and L 2 are independent groups.
- each is an amino group, an acid anhydride group, an isocyanate group, a carboxyl group, an acid ester group, an acid halide group, a hydroxy group, an epoxy group, or a mercapto group
- i is an integer of 1 to 200.
- j and k are independently integers from 0 to 200, 0 ⁇ j / (i + j + k) ⁇ 0.50, and the functional group equivalent is 8000 or more ⁇ .
- the viscosity stability of the composition is excellent as compared with the above-mentioned all polyimide precursor, and compared with the above-mentioned all polyimide, the polyimide (polyimide precursor) It is excellent in terms of ease of synthesis.
- L 1 and L 2 are independently amino group, acid anhydride group, isocyanate group, carboxyl group, acid ester group, acid halide group, hydroxy group, epoxy group or mercapto. It is a group, and among them, an amino group is preferable from the viewpoint of resin properties or film properties.
- the diamine resin composition has the following general formula (3): Contains structural units derived from the diamine compound represented by.
- diamine compounds represented by the general formula (3) 3,5-diaminobenzoic acid (DABA) is preferable from the viewpoint of transparency of the polyimide film and YI. Having this structural unit is preferable because the mechanical properties of the obtained polyimide film can be improved (particularly the tensile elongation) and the heat resistance can be improved. The reason for the improvement of such properties is not clear, but it is considered that the intramolecular interaction is working due to the action of the carboxyl group.
- the content of DABA in the total diamine is more than 50 mol%, more than 55 mol%, or 70 mol%. It may be 90 mol% or more, or 95 mol% or more.
- the larger the amount of DABA the larger the tensile elongation of the polyimide film, which is preferable.
- the resin composition also contains structural units derived from 33 DAS and / or 44 DAS.
- 33DAS and 44DAS it is preferable to use a mixture of 33DAS and 44DAS from the viewpoint of achieving both the thickness direction Rth (retaration) of the polyimide film and the mechanical properties.
- the total content of 33 DAS and / or 44 DAS in the total diamine is more than 50 mol% and more than 55 mol%. , Or 70 mol% or more, 90 mol% or more, or 95 mol% or more. A larger amount of 33 DAS and / or 44 DAS is preferable because the mechanical strength of the polyimide film is improved.
- diamines other than the general formula (3) examples include p-phenylenediamine (PDA), m-phenylenediamine, 2,2'-dimethylbenzidine (mTB), 4,4'-diaminodiphenylsulfide, and 3,4'-diamino.
- PDA p-phenylenediamine
- mTB 2,2'-dimethylbenzidine
- 4,4'-diaminodiphenylsulfide 4,4'-diaminodiphenylsulfide
- 3,4'-diamino examples include p-phenylenediamine (PDA), m-phenylenediamine, 2,2'-dimethylbenzidine (mTB), 4,4'-diaminodiphenylsulfide, and 3,4'-diamino.
- BAFL 9,9-bis (4-aminophenyl) fluorene
- BiSAM 1,3-bis [1- (4-aminophenyl) -1-methylethyl] benzene]
- CHDA 1,4 -Preferably at least one selected from the group consisting of cyclohexanediamine
- diamines other than the general formula (3) 33DAS and / or 44DAS are 9,9-bis (4-aminophenyl) fluorene (BAFL), 1,3-. More preferably, it is at least one selected from the group consisting of bis [1- (4-aminophenyl) -1-methylethyl] benzene] (BiSAM).
- the acid dianhydride resin composition has the following general formula (4): It contains a structural unit derived from a compound represented by (also referred to as CpODA). Having this structural unit is preferable because it can improve the transparency, YI, and heat resistance of the obtained polyimide film.
- the content of CpODA in total acid anhydride is 50 mol% or more and 60 mol% or more. , Or 70 mol% or more, 90 mol% or more, or 95 mol% or more.
- the resin composition contains a structural unit derived from ODPA. Having this structural unit is preferable because it can improve the viscosity stability of the varnish, the filterability, and the transparency of the obtained polyimide film.
- the content of ODPA in total acid anhydride (including compounds in which L 1 and L 2 are acid anhydride groups in the above general formulas (5) and (10)) is 50 mol% or more and 60 mol% or more. , Or 70 mol% or more, 90 mol% or more, or 95 mol% or more.
- Examples of the acid dianhydride other than the general formula (4) include pyromellitic acid dianhydride (PMDA), 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride (BPDA), 2,2',.
- PMDA pyromellitic acid dianhydride
- BPDA 4,4'-biphenyltetracarboxylic acid dianhydride
- 2,2' 2,2'
- 3,3'-Biphenyltetracarboxylic dianhydride 4,4'-(hexafluoroisopropylidene) diphthalic anhydride (6FDA), 5- (2,5-dioxotetrahydro-3-franyl) -3- Methyl-cyclohexene-1,2 dicarboxylic acid anhydride, 1,2,3,4-benzenetetracarboxylic acid dianhydride, 3,3', 4,4'-benzophenone tetracarboxylic acid dianhydride, 2,2' , 3,3'-benzophenone tetracarboxylic acid dianhydride, 3,3', 4,4'-diphenylsulfone tetracarboxylic acid dianhydride, methylene-4,4'-diphthalic acid dianhydride, 1,1- Ethiliden-4,4'-diphthalic acid dianhydride, 2,2-propylidene-4,4'-diphthal
- Acid dianhydrides other than the above general formula (4) include 6FDA, 9,9-bis (3,4-dicarboxyphenyl) fluorene dianhydride (BPAF), BzDA, BNBDA, 1, 2, 4, 5 -Preferably at least one selected from the group consisting of cyclohexanetetracarboxylic dianhydride (HPMDA).
- the acid dianhydride may be used alone or in combination of two or more.
- the polyimide precursor in the present embodiment may have a structure represented by the above formula (1) as well as a structure represented by the above formula (2).
- the content ratio of the structure derived from the silicon-containing compound in the polyimide precursor is preferably 5% by mass or more and 40% by mass or less based on the mass of the polyimide precursor. It is preferable that the polyimide precursor contains a structure derived from a silicon-containing compound within this numerical range because it is possible to achieve both low residual stress and high transparency and heat resistance in the obtained polyimide film.
- the content ratio of the structure derived from the silicon-containing compound may be 6% by mass or more, 7% by mass or more, or 30% by mass or less, or 25% by mass or less, based on the mass of the polyimide precursor. You may.
- the polyimide / polyimide precursor in this embodiment has a structure derived from a silicon-containing compound. Therefore, the silicon-containing compound used in the synthesis of the polyimide precursor in the present embodiment may be a compound having a reactive group capable of cocondensing with at least one of the tetracarboxylic dianhydride and the diamine.
- Such a silicon-containing compound is, for example, the following formula (5) :.
- R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms.
- R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 2 and R 3 is a monovalent aliphatic group having 1 to 5 carbon atoms.
- It is a hydrocarbon group and R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 4 and R 5 is a monovalent aromatic group having 6 to 10 carbon atoms.
- R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 6 and R 7 is an unsaturated aliphatic hydrocarbon having 2 to 10 carbon atoms. It is an organic group containing a hydrogen group.
- L 1 and L 2 are each independently a monovalent organic group containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group.
- i and j are independently integers from 1 to 200, respectively.
- k is an integer from 0 to 200, and The relationship of 0.05 ⁇ j / (i + j + k) ⁇ 0.50 is satisfied. ⁇ Can be mentioned.
- R 1 in the formula (5) is a single bond or a divalent organic group having 1 to 10 carbon atoms, respectively.
- the divalent organic group having 1 to 10 carbon atoms may be linear, cyclic, or branched, and may be saturated or unsaturated.
- Examples of the divalent aliphatic hydrocarbon group having 1 to 10 carbon atoms include a methylene group, an ethylene group, an n-propylene group, an i-propylene group, an n-butylene group, an s-butylene group and a t-butylene group.
- Linear or branched alkylene groups such as n-pentylene group, neopentylene group, n-hexylene group, n-heptylene group, n-octylene group, n-nonylene group, n-decylene group; cyclopropylene group, cyclobutylene group, Examples thereof include a cycloalkylene group such as a cyclopentylene group, a cyclohexylene group, a cycloheptylene group and a cyclooctylene group.
- the divalent aliphatic hydrocarbon group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of an ethylene group, an n-propylene group and an i-propylene group.
- R 2 and R 3 in the formula (5) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- the monovalent organic group having 1 to 10 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group, and an n-pentyl group.
- Cycloalkyl group such as cycloheptyl group, cyclooctyl group; aromatic group such as phenyl group, tolyl group, xsilyl group, ⁇ -naphthyl group, ⁇ -naphthyl group and the like.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, and a t-butyl group.
- Linear or branched alkyl groups such as n-pentyl group and neopentyl group; cycloalkyl groups such as cyclopropyl group, cyclobutyl group and cyclopentyl group can be mentioned.
- the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and an n-propyl group.
- R 4 and R 5 in the formula (5) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aromatic group having 6 to 10 carbon atoms.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated.
- monovalent organic groups having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group and n-pentyl.
- Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl.
- Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, ⁇ -naphthyl group and ⁇ -naphthyl group can be mentioned.
- Examples of the monovalent aromatic group having 6 to 10 carbon atoms include a phenyl group, a tolyl group, a xsilyl group, an ⁇ -naphthyl group, a ⁇ -naphthyl group and the like, and may be a phenyl group, a tolyl group, or a xsilyl group. It is preferable to have.
- R 6 and R 7 in the formula (5) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is an organic group having an unsaturated aliphatic hydrocarbon group.
- the monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched. Examples of the monovalent organic group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group and an n-pentyl group.
- Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl.
- Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, ⁇ -naphthyl group and ⁇ -naphthyl group can be mentioned.
- the monovalent organic group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and a group phenyl.
- the organic group having an unsaturated aliphatic hydrocarbon group may be an unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms, and may be linear, cyclic or branched.
- Examples of the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms include a vinyl group, an allyl group, a 1-propenyl group, a 3-butenyl group, a 2-butenyl group, a pentenyl group, a cyclopentenyl group, a hexenyl group and a cyclo. Examples thereof include a hexenyl group, a heptenyl group, an octenyl group, a nonenyl group, a decenyl group, an ethynyl group, a propynyl group, a butynyl group, a pentynyl group and a hexynyl group.
- the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms is preferably at least one selected from the group consisting of a vinyl group, an allyl group, and a 3-butenyl group.
- a part or all of the hydrogen atoms of R 1 to R 7 in the formula (5) may be substituted with a substituent such as a halogen atom such as F, Cl, Br or the like, or may be unsubstituted.
- L 1 and L 2 in the formula (5) are each independently a monovalent organic group (also referred to as an acid anhydride group) containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, and the like. It is a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group. Among them, as L 1 and L 2 , an amino group is preferable from the viewpoint of resin properties or film properties.
- Examples of the monovalent organic group containing an acid anhydride structure include the following formula: ⁇ In the above formula, "*" represents a bond. ⁇ , Examples thereof include a 2,5-dioxotetrahydrofuran-3-yl group. Among these, an amino group and an acid anhydride group are preferable, and an amino group is more preferable from the viewpoint of viscosity stability of the resin composition.
- the alkoxyl group in the alkoxycarbonyl group may be an alkoxyl group having 1 to 6 carbon atoms, for example, a methoxyl group, an ethoxyl group, an n-propoxyl group, an i-propoxyl group, an n-butoxyl group, or an i-butoxyl group. , T-butoxyl group and the like.
- the halogen atom in the halogenated carbonyl group is preferably a halogen atom other than a fluorine atom, and more preferably a chlorine atom or an iodine atom.
- the functional group equivalent of the silicon-containing compound represented by the formula (5) is preferably 800 or more, more preferably 1000 or more, still more preferably 1500 or more, from the viewpoint of the filterability of the resin composition.
- the functional group equivalent is the molecular weight of the silicon-containing compound per 1 mol of the functional group (unit: g / mol).
- the functional group equivalent can be measured by a known method.
- the functional group equivalent of the silicon-containing compound is 800 or more, the residual stress of the polyimide film under the nitrogen atmosphere is small, which is preferable. The reason for this is considered to be that when the functional group equivalent is equal to or more than a specific value, the silicone domain increases and stress is relaxed.
- the functional group equivalent can be measured according to existing standards and the like.
- I in the formula (5) is an integer of 1 to 200, preferably an integer of 2 to 100, more preferably an integer of 4 to 80, and even more preferably an integer of 8 to 40.
- j and k are independently integers of 0 to 200, preferably an integer of 0 to 50, more preferably an integer of 0 to 20, and even more preferably an integer of 0 to 50.
- the polyimide in the resin composition has a structure derived from the formula (5) because the residual stress measured in the nitrogen atmosphere of the polyimide film is good (small).
- the reason for measuring in a nitrogen atmosphere is that when an inorganic film such as SiO, SiN is formed on a polyimide film in the display process, it may be exposed to the nitrogen atmosphere, and the residual stress in the nitrogen atmosphere is small. This is because it is required.
- the silicon-containing compound of the general formula (5) or (10) described above is preferably a silicon-containing diamine.
- the silicon-containing diamine include the following formula (11): ⁇ In the formula, P 5 independently represents a divalent hydrocarbon group, which may be the same or different, and P 3 and P 4 are R 2 defined in the general formula (5) or (10). , R 3 and l represents an integer from 1 to 200. ⁇ The diamino (poly) siloxane represented by is preferable.
- P 3 and P 4 in the general formula (11) a methyl group, an ethyl group, a propyl group, a butyl group, and phenyl group and the like.
- the methyl group is preferable.
- L in the general formula (11) is an integer of 1 to 200, and is an integer of 3 to 200 from the viewpoint of heat resistance of the polyimide obtained by using the silicon-containing diamine represented by the formula (11). Is preferable.
- the preferable range of the functional group equivalent of the compound represented by the general formula (11) is the same as that of the silicon-containing compound represented by the general formula (10) described above.
- the copolymerization ratio of the silicon-containing diamine is preferably 0.5 to 30% by mass, more preferably 1.0% by mass to 25% by mass, and further preferably 1.5 with respect to the total mass of the polyimide precursor / polyimide. It is from% by mass to 20% by mass.
- the silicon-containing diamine is 0.5% by mass or more, the residual stress generated between the silicon-containing diamine and the support can be effectively reduced.
- the silicon-containing diamine is 30% by mass or less, the transparency (particularly low HAZE) of the obtained polyimide film is good, which is preferable from the viewpoint of achieving high total light transmittance and high glass transition temperature.
- the silicon-containing compound as the monomer used for the polyimide precursor / polyimide may be synthesized by using the common general technical knowledge at the time of filing, or a commercially available product may be used.
- Commercially available products include both-terminal amine-modified methylphenyl silicone oil (manufactured by Shin-Etsu Chemical Co., Ltd .: X22-1660B-3 (functional group equivalent 2200), X22-9409 (functional group equivalent 670)), both-terminal acid anhydride-modified methylphenyl.
- Silicone oil (manufactured by Shin-Etsu Chemical Co., Ltd .: X22-168-P5-B (functional group equivalent 2100)), both-ended epoxy-modified methylphenyl silicone oil (manufactured by Shin-Etsu Chemical Co., Ltd .: X22-2000 (functional group equivalent 620)), both ends Amino-modified dimethyl silicone (manufactured by Shin-Etsu Chemical Co., Ltd .: PAM-E (functional group equivalent 130), X22-161A (functional group equivalent 800), X22-161B (functional group equivalent 1500), KF8012 (functional group equivalent 2200), Toledau Made by Corning: BY16-853U (functional group equivalent 450), JNC: Silaplane FM3311 (number average molecular weight 1000)), both-ended epoxy-modified dimethyl silicone (made by Shin-Etsu Chemical Co., Ltd .: X-22-163A (functional group equivalent 1750) ), Both-ended
- the resin composition typically contains a solvent.
- the solvent those having good solubility of the polyimide / polyimide precursor and capable of appropriately controlling the solution viscosity of the resin composition are preferable, and the reaction solvent of the polyimide precursor can be used as the solvent of the composition.
- NMP N-methyl-2-pyrrolidone
- GBL ⁇ -butyrolactone
- the like are preferable.
- the solvent composition examples include N-methyl-2-pyrrolidone (NMP) alone, or a mixed solvent of N-methyl-2-pyrrolidone (NMP) and ⁇ -butyrolactone (GBL).
- NMP N-methyl-2-pyrrolidone
- GBL ⁇ -butyrolactone
- the resin composition of this embodiment may further contain additional components in addition to the polyimide / polyimide precursor, small molecule cyclic siloxane, and solvent. Additional components include, for example, surfactants, alkoxysilane compounds and the like.
- the coatability of the resin composition can be improved. Specifically, it is possible to prevent the occurrence of streaks in the coating film.
- surfactants examples include silicone-based surfactants, fluorine-based surfactants, and nonionic surfactants other than these.
- silicone-based surfactant examples include organosiloxane polymers KF-640, 642, 643, KP341, X-70-092, X-70-093 (trade name, manufactured by Shin-Etsu Chemical Co., Ltd.); SH-28PA, SH.
- fluorine-based surfactant examples include Megafuck F171, F173, R-08 (manufactured by Dainippon Ink and Chemicals, Inc., trade name); Florard FC4430, FC4432 (Sumitomo 3M Ltd., trade name) and the like. ..
- nonionic surfactant other than these include polyoxyethylene uralyl ether, polyoxyethylene stearyl ether, polyoxyethylene oleyl ether, polyoxyethylene octylphenol ether and the like.
- silicone-based surfactants and fluorine-based surfactants are preferable from the viewpoint of coatability (streak suppression) of the resin composition, and the YI value and total light transmittance depending on the oxygen concentration during the curing step are preferable.
- a silicone-based surfactant is preferable from the viewpoint of reducing the influence on the rate.
- the blending amount thereof is preferably 0.001 to 5 parts by mass, more preferably 0.01 to 3 parts by mass with respect to 100 parts by mass of the polyimide precursor in the resin composition.
- the resin composition is a polyimide precursor from the viewpoint of obtaining good adhesion between the support and the polyimide film in the manufacturing process. 0.01 to 20 parts by mass of the alkoxysilane compound can be contained with respect to 100 parts by mass.
- the content of the alkoxysilane compound with respect to 100 parts by mass of the polyimide precursor is 0.01 parts by mass or more, good adhesion between the support and the polyimide film can be obtained. Further, it is preferable that the content of the alkoxysilane compound is 20 parts by mass or less from the viewpoint of storage stability of the resin composition.
- the content of the alkoxysilane compound is preferably 0.02 to 15 parts by mass, more preferably 0.05 to 10 parts by mass, and further preferably 0.1 to 8 parts by mass with respect to 100 parts by mass of the polyimide precursor. be.
- alkoxysilane compound examples include 3-ureidopropyltriethoxysilane, bis (2-hydroxyethyl) -3-aminopropyltriethoxysilane, 3-glycidoxypropyltrimethoxysilane, and ⁇ -aminopropyltrimethoxysilane.
- the method for producing the resin composition in the present embodiment is not particularly limited, and for example, the following method can be used.
- the resin composition of the present embodiment can be produced by subjecting a polycondensation component containing an acid dianhydride, a diamine, and a silicon-containing compound to a polycondensation reaction.
- a polycondensation component containing an acid dianhydride, a diamine, and a silicon-containing compound to a polycondensation reaction.
- the silicon-containing compound is purified before the polycondensation reaction to obtain the total amount of the cyclic silicon-containing compound. Is mentioned.
- the resin composition may be purified to reduce the total amount of cyclic silicon-containing compounds.
- stripping may be performed while blowing an inert gas, for example, nitrogen gas, into the silicon-containing compound in an arbitrary container.
- the stripping temperature is preferably 200 ° C. or higher and 300 ° C. or lower, more preferably 220 ° C. or higher and 300 ° C. or lower, and further preferably 240 ° C. or higher and 300 ° C. or lower.
- the stripping vapor pressure is preferably as low as possible, more preferably 1000 Pa or less, more preferably 300 Pa or less, still more preferably 200 Pa or less, still more preferably 133.32 Pa (1 mmHg) or less.
- the stripping time is preferably 4 hours or more and 12 hours or less, and more preferably 6 hours or more and 10 hours or less.
- the polyimide precursor of the present embodiment can be synthesized by subjecting a polycondensation component containing an acid dianhydride, a diamine, and a silicon-containing compound to a polycondensation reaction.
- one of the following steps -The compound represented by the general formula (8) or the compound represented by the general formula (9) described above is subjected to a polycondensation reaction with the silicon-containing compound represented by the general formula (10) to form a polyimide.
- a step of polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and polyimide -The diamine or acid dianhydride described above and the silicon-containing compound represented by the general formula (10) are polycondensed to obtain a polyimide, and then other compounds are polycondensed to obtain the polyimide.
- a method for producing a resin composition which comprises a step of providing a resin composition containing a precursor and a polyimide.
- one of the following steps -The compound represented by the general formula (3) described above, the compound represented by the general formula (4), the silicon-containing compound represented by the general formula (5), and other compounds are weighted.
- a silicon-containing compound represented by the general formula (5) and another compound are subjected to a polycondensation reaction to contain a polyimide precursor and a polyimide.
- the polycondensation component comprises an acid dianhydride, a diamine, and a silicon-containing compound.
- the polycondensation reaction is preferably carried out in a suitable solvent. Specific examples thereof include a method in which a predetermined amount of a diamine component and a silicon-containing compound are dissolved in a solvent, a predetermined amount of acid dianhydride is added to the obtained diamine solution, and the mixture is stirred.
- the molar ratio of acid dianhydride to diamine when synthesizing the polyimide / polyimide precursor is determined from the viewpoint of increasing the molecular weight of the polyimide precursor resin and the slit coating characteristics of the resin composition.
- Acid dianhydride: diamine 100.
- the range is preferably 90 to 100: 110 (0.90 to 1.10 parts of diamine with respect to 1 mol of acid dianhydride), and 100: 95 to 100: 105 (with respect to 1 mol of acid dianhydride).
- the range of diamine 0.95 to 1.05 mol parts) is more preferable.
- the molecular weight of the polyimide / polyimide precursor is controlled by adjusting the types of acid dianhydride, diamine and silicon-containing compounds, adjusting the molar ratio of acid dianhydride and diamine, adding an end-capping agent, adjusting reaction conditions, and the like. It is possible. The closer the molar ratio of the acid dianhydride component to the diamine component is to 1: 1 and the smaller the amount of the end-capping agent used, the higher the molecular weight of the polyimide precursor can be.
- the purity is preferably 98% by mass or more, more preferably 99% by mass or more, and further preferably 99.5% by mass or more, respectively. High purity can also be achieved by reducing the water content in the acid dianhydride component and the diamine component.
- the acid dianhydride components as a whole and the diamine components as a whole have the above-mentioned purity, and all types to be used. It is more preferable that the acid dianhydride component and the diamine component of the above have the above-mentioned purity, respectively.
- the solvent for the reaction is not particularly limited as long as it can dissolve the acid dianhydride component and the diamine component, and the resulting polyimide / polyimide precursor, and a high-molecular-weight polymer can be obtained.
- a solvent include an aprotic solvent, a phenol-based solvent, an ether and a glycol-based solvent, and the like.
- Examples of the aprotonic solvent include N, N-dimethylformamide (DMF), N, N-dimethylacetamide (DMAc), N-methyl-2-pyrrolidone (NMP), N-methylcaprolactam, 1,3-dimethyl.
- phenolic solvent examples include phenol, o-cresol, m-cresol, p-cresol, 2,3-xylenol, 2,4-xylenol, 2,5-xylenol, 2,6-xylenol, 3, Examples thereof include 4-xylenol and 3,5-xylenol.
- ether and glycol-based solvent examples include 1,2-dimethoxyethane, bis (2-methoxyethyl) ether, 1,2-bis (2-methoxyethoxy) ethane, and bis [2- (2-methoxyethoxy) ethyl. ] Ether, tetrahydrofuran, 1,4-dioxane and the like can be mentioned.
- solvents may be used alone or in combination of two or more.
- the boiling point of the solvent used for the synthesis of the polyimide / polyimide precursor at normal pressure is preferably 60 to 300 ° C, more preferably 140 to 280 ° C, and further preferably 170 to 270 ° C. Since the boiling point of the solvent is lower than 300 ° C., the drying step is shortened. When the boiling point of the solvent is 60 ° C. or higher, roughening of the surface of the resin film, mixing of air bubbles in the resin film, and the like are less likely to occur during the drying step, and a more uniform film can be obtained. In particular, it is preferable to use a solvent having a boiling point of 170 to 270 ° C. and / or a vapor pressure of 250 Pa or less at 20 ° C.
- NMP N-methyl-2-pyrrolidone
- GBL ⁇ -butyrolactone
- One or more are preferable.
- the water content in the solvent is preferably, for example, 3,000 mass ppm or less in order to allow the polycondensation reaction to proceed satisfactorily.
- the content of molecules having a molecular weight of less than 1,000 is preferably less than 5% by mass. It is considered that the reason why the molecule having a molecular weight of less than 1,000 is present in the resin composition is that the water content of the solvent and the raw material (acid dianhydride, diamine) used at the time of synthesis is involved. That is, it is considered that the acid anhydride group of some acid dianhydride monomers is hydrolyzed by water to become a carboxyl group and remains in a low molecular weight state without increasing the molecular weight.
- the water content of the solvent used for the above polycondensation reaction is small.
- the water content of the solvent is preferably 3,000 mass ppm or less, more preferably 1,000 mass ppm or less.
- the amount of water contained in the raw material is preferably 3,000 mass ppm or less, and more preferably 1,000 mass ppm or less.
- the water content of the solvent is the grade of the solvent used (dehydration grade, general-purpose grade, etc.), solvent container (bin, 18L can, canister can, etc.), storage state of the solvent (presence or absence of rare gas filling, etc.), from opening to use. It is considered that the time (whether it is used immediately after opening or after a lapse of time after opening, etc.) is involved. It is considered that the replacement of rare gas in the reactor before synthesis and the presence or absence of rare gas flow during synthesis are also involved. Therefore, when synthesizing the polyimide precursor, it is recommended to use a high-purity product as a raw material, use a solvent with a low water content, and take measures to prevent water from the environment from entering the system before and during the reaction. Will be done.
- the reaction temperature at the time of synthesizing the polyimide precursor may be preferably 0 ° C to 120 ° C, 40 ° C to 100 ° C, or 60 to 100 ° C, and the polymerization time may be set. Is preferably 1 to 100 hours, or 2 to 10 hours.
- the polymerization time is 1 hour or more, a polyimide precursor having a uniform degree of polymerization can be obtained, and when the polymerization time is 100 hours or less, a polyimide precursor having a high degree of polymerization can be obtained.
- the resin composition of the present embodiment may contain other additional polyimide precursors in addition to the polyimide / polyimide precursor of the present embodiment.
- the mass ratio of the additional polyimide / polyimide precursor is relative to the total amount of the polyimide / polyimide precursor in the resin composition from the viewpoint of reducing the oxygen dependence of the YI value and the total light transmittance of the polyimide film. It is preferably 30% by mass or less, more preferably 10% by mass or less.
- a part of the polyimide precursor in the present embodiment may be imidized (partially imidized).
- the imidization ratio is preferably 5% or more, more preferably 8% or more, and preferably 8% or more, from the viewpoint of balancing the solubility of the polyimide precursor in the resin composition and the storage stability of the solution. It is 80% or less, more preferably 70% or less, still more preferably 50% or less. This partial imidization is obtained by heating the polyimide precursor to dehydrate and ring closure.
- This heating can be carried out at a temperature of preferably 120 to 200 ° C., more preferably 150 to 185 ° C., still more preferably 150 to 180 ° C., preferably for 15 minutes to 20 hours, more preferably 30 minutes to 10 hours. ..
- a part or all of the carboxylic acid is esterified by adding N, N-dimethylformamide dimethylacetal or N, N-dimethylformamide diethylacetal to the polyimide / polyimide precursor obtained by the above reaction and heating. May be used as the polyimide precursor of the present embodiment. Esterification can improve viscosity stability during storage.
- the above-mentioned acid dianhydride component is sequentially reacted with 1 equivalent of a monovalent alcohol with respect to the acid anhydride group and a dehydration condensing agent such as thionyl chloride and dicyclohexylcarbodiimide. It can also be obtained by a method of conducting a condensation reaction with a diamine component.
- the polyimide varnish dissolves an acid dianhydride component and a diamine component in a solvent, for example, an organic solvent, adds a co-boiling solvent such as toluene, and removes water generated during imidization to the outside of the system. By removing it, it can be produced as a polyimide solution (also referred to as polyimide varnish) containing polyimide and a solvent.
- a solvent for example, an organic solvent
- a co-boiling solvent such as toluene
- the conditions at the time of reaction are not particularly limited, but for example, the reaction temperature is 0 ° C. to 180 ° C. and the reaction time is 3 to 72 hours.
- the atmosphere is an inert atmosphere such as argon or nitrogen.
- the synthesized polyimide / polyimide precursor solution can be used as it is as the resin composition.
- a resin composition is prepared by adding one or more of a further solvent and an additional component to the polyimide precursor and stirring and mixing them in a temperature range of room temperature (25 ° C.) to 80 ° C. You may. This stirring and mixing can be performed by using an appropriate device such as a three-one motor (manufactured by Shinto Chemical Co., Ltd.) equipped with a stirring blade, a rotation / revolution mixer, and the like. If necessary, the resin composition may be heated to 40 ° C to 100 ° C.
- the solvent in the synthesized polyimide precursor solution is used, for example, reprecipitation, solvent distillation, etc.
- the polyimide / polyimide precursor may be isolated by removing it by an appropriate method. Then, in the temperature range of room temperature (25 ° C.) to 80 ° C., a desired solvent and, if necessary, additional components are added to the isolated polyimide precursor, and the mixture is stirred and mixed to prepare a resin composition. You may.
- the resin composition is heated at, for example, 130 to 200 ° C. for, for example, 5 minutes to 2 hours to remove a part of the polyimide precursor to the extent that the polymer does not precipitate.
- Dehydration imidization may be carried out (partial imidization).
- the imidization rate can be controlled by controlling the heating temperature and the heating time.
- the solution viscosity of the resin composition is preferably 500 to 100,000 mPa ⁇ s, more preferably 1,000 to 50,000 mPa ⁇ s, still more preferably 3,000 to 20,000 mPa ⁇ s from the viewpoint of slit coat performance. s. Specifically, it is preferably 500 mPa ⁇ s or more, more preferably 1,000 mPa ⁇ s or more, and further preferably 3,000 mPa ⁇ s or more in terms of preventing liquid leakage from the slit nozzle.
- the slit nozzle is less likely to be clogged, and is preferably 100,000 mPa ⁇ s or less, more preferably 50,000 mPa ⁇ s or less, and further preferably 20,000 mPa ⁇ s or less.
- the solution viscosity of the resin composition during the synthesis of the polyimide / polyimide precursor is higher than 200,000 mPa ⁇ s, there may be a problem that stirring during the synthesis becomes difficult. However, even if the solution becomes highly viscous during synthesis, it is possible to obtain a resin composition having a viscosity that is easy to handle by adding a solvent and stirring after the reaction is completed.
- the solution viscosity of the resin composition in this embodiment is a value measured at 23 ° C. using an E-type viscometer (for example, VISCONICEHD, manufactured by Toki Sangyo).
- the water content of the resin composition of the present embodiment is preferably 3,000 mass ppm or less, more preferably 2,500 mass ppm or less, still more preferably 2 from the viewpoint of viscosity stability when the resin composition is stored.
- a polyimide film (hereinafter, also referred to as a polyimide resin film) can be provided by using the resin composition of the present embodiment.
- the method for producing the polyimide film of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. Includes a peeling step of peeling the polyimide resin film from the support.
- the resin composition of the present embodiment is coated on the surface of the support.
- the support is not particularly limited as long as it has heat resistance to the heating temperature in the subsequent film forming step (heating step) and has good peelability in the peeling step.
- the support include a glass substrate, for example, a non-alkali glass substrate; a silicon wafer; PET (polyethylene terephthalate), OPP (stretched polypropylene), polyethylene glycol terephthalate, polyethylene glycol naphthalate, polycarbonate, polyimide, polyamideimide, and polyetherimide.
- Resin substrates such as polyetheretherketone, polyethersulfone, polyphenylene sulfone, and polyphenylene sulfide; metal substrates such as stainless steel, alumina, copper, and nickel can be mentioned.
- a thin film-shaped polyimide molded body for example, a glass substrate, a silicon wafer, etc. are preferable, and when forming a thick film-shaped film-shaped or sheet-shaped polyimide molded body, for example, PET (polyethylene terephthalate) is used. ), OPP (stretched polypropylene) and the like are preferable.
- a doctor blade knife coater As a coating method, generally, a doctor blade knife coater, an air knife coater, a roll coater, a rotary coater, a flow coater, a die coater, a bar coater, etc., a spin coat, a spray coat, a dip coat, etc. are applied; screen printing. And printing technology typified by gravure printing and the like.
- the resin composition of the present embodiment is preferably coated with a slit coat.
- the coating thickness should be appropriately adjusted according to the desired thickness of the resin film and the content of the polyimide precursor in the resin composition, but is preferably about 1 to 1,000 ⁇ m.
- the temperature in the coating step may be room temperature, and the resin composition may be heated to, for example, 40 to 80 ° C. in order to reduce the viscosity and improve the workability.
- the drying step may be performed after the coating step, or the drying step may be omitted and the process may be directly proceeded to the next film forming step (heating step).
- the drying step is performed for the purpose of removing the organic solvent in the resin composition.
- an appropriate device such as a hot plate, a box-type dryer, or a conveyor-type dryer can be used.
- the temperature of the drying step is preferably 80 to 200 ° C, more preferably 100 to 150 ° C.
- the implementation time of the drying step is preferably 1 minute to 10 hours, more preferably 3 minutes to 1 hour.
- a coating film containing the polyimide precursor is formed on the support.
- a film forming step (heating step) is performed.
- the heating step is a step of removing the organic solvent contained in the coating film and advancing the imidization reaction of the polyimide precursor in the coating film to obtain a polyimide resin film.
- This heating step can be performed using, for example, an apparatus such as an inert gas oven, a hot plate, a box-type dryer, and a conveyor-type dryer. This step may be carried out at the same time as the drying step, or both steps may be carried out sequentially.
- the heating step may be carried out in an air atmosphere, but from the viewpoint of safety, good transparency of the obtained polyimide film, low thickness direction retardation (Rth) and low YI value, it is carried out in an inert gas atmosphere. It is preferable to do so.
- the inert gas include nitrogen, argon and the like.
- the heating temperature may be appropriately set depending on the type of the polyimide precursor and the type of the solvent in the resin composition, but is preferably 250 ° C to 550 ° C, more preferably 300 to 450 ° C. If the temperature is 250 ° C. or higher, imidization proceeds satisfactorily, and if the temperature is 550 ° C. or lower, inconveniences such as deterioration of transparency and heat resistance of the obtained polyimide film can be avoided.
- the heating time is preferably about 0.1 to 10 hours.
- the oxygen concentration in the ambient atmosphere in the heating step is preferably 2,000 mass ppm or less, more preferably 100 mass ppm or less, still more preferably 100 mass ppm or less, from the viewpoint of the transparency and YI value of the obtained polyimide film. Is 10 mass ppm or less.
- the YI value of the obtained polyimide film can be reduced to 30 or less.
- the peeling step the polyimide resin film on the support is cooled to, for example, room temperature (25 ° C.) to about 50 ° C. and then peeled off.
- Examples of the peeling step include the following aspects (1) to (4).
- the interface between the support and the polyimide resin film is ablated by irradiating a laser from the support side of the structure.
- a method of peeling off the polyimide resin examples include a solid (YAG) laser and a gas (UV excimer) laser. It is preferable to use a spectrum having a wavelength of 308 nm or the like (see Japanese Patent Publication No. 2007-512568, Japanese Patent Publication No. 2012-511173, etc.).
- release layer A method in which a release layer is formed on a support before the resin composition is applied to the support, and then a structure including a polyimide resin film / release layer / support is obtained and the polyimide resin film is peeled off. ..
- the release layer include parylene (registered trademark, manufactured by Japan Parylene LLC) and tungsten oxide; a release agent such as vegetable oil-based, silicone-based, fluorine-based, and alkyd-based may be used (Japanese Patent Laid-Open No. 2010-067957). No., Japanese Patent Application Laid-Open No. 2013-179306, etc.).
- This method (2) and the laser irradiation of the method (1) may be used in combination.
- a method of obtaining a polyimide resin film by using an etchable metal substrate as a support, obtaining a structure including a polyimide resin film / support, and then etching the metal with an etchant for example, copper (specifically, electrolytic copper foil "DFF" manufactured by Mitsui Mining & Smelting Co., Ltd.), aluminum and the like can be used.
- the etchant ferric chloride or the like can be used for copper, and dilute hydrochloric acid or the like can be used for aluminum.
- the method (1) or (2) is preferable from the viewpoint of the difference in refractive index between the front and back surfaces of the obtained polyimide resin film, the YI value and the elongation. From the viewpoint of the difference in refractive index between the front and back of the obtained polyimide resin film, it is more preferable to perform the method (1), that is, the irradiation step of irradiating the laser from the support side prior to the peeling step.
- the YI value of the obtained polyimide resin film tends to be large and the elongation tends to be small. This is considered to be the effect of copper ions.
- the thickness of the obtained polyimide film is not limited, but is preferably 1 to 200 ⁇ m, and more preferably 5 to 100 ⁇ m.
- the polyimide film obtained from the resin composition of the present embodiment can be used as, for example, a semiconductor insulating film, a thin film transistor liquid crystal display (TFT-LCD) insulating film, an electrode protective film, a liquid crystal display, an organic electroluminescence display, a field emission display, or the like. It can be applied as a transparent substrate of a display device such as electronic paper.
- the polyimide film obtained from the resin composition of the present embodiment is suitable as a substrate for a thin film transistor (TFT) substrate, a color filter substrate, a touch panel substrate, and a transparent conductive film (ITO, Indium Thin Oxide) in the manufacture of a flexible device. Can be used.
- Examples of the flexible device to which the polyimide film in this embodiment can be applied include a TFT device for a flexible display, a flexible solar cell, a flexible touch panel, a flexible lighting, a flexible battery, a flexible printed substrate, a flexible color filter, a surface cover lens for a smartphone, and the like. Can be mentioned.
- the step of forming a TFT on a flexible substrate using a polyimide film is typically carried out at a temperature in a wide range of 150 to 650 ° C.
- a process temperature of 250 ° C to 350 ° C is generally required, and the polyimide film of the present embodiment needs to be able to withstand that temperature.
- a process temperature of 320 ° C to 400 ° C is generally required, and the polyimide film of the present embodiment must be able to withstand that temperature. Therefore, it is necessary to appropriately select a polymer structure having a glass transition temperature equal to or higher than the maximum temperature of the TFT fabrication process and a thermal decomposition start temperature.
- LTPS low temperature polysilicon
- a process temperature of 380 ° C to 520 ° C is generally required, and the polyimide film of the present embodiment needs to be able to withstand that temperature. It is necessary to appropriately select the glass transition temperature and the thermal decomposition start temperature above the maximum temperature of the TFT fabrication process.
- the optical properties of the polyimide film tend to decrease as they are exposed to high temperature processes.
- the polyimide obtained from the polyimide precursor of the present embodiment has good optical properties even after undergoing thermal history.
- the method for manufacturing the display of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. It includes an element forming step of forming an element on the polyimide resin film; and a peeling step of peeling the polyimide resin film on which the element is formed from the support.
- FIG. 1 is a schematic view showing a structure above a polyimide substrate of a top emission type flexible organic EL display as an example of the display of the present embodiment.
- the organic EL structure portion 25 of FIG. 1 will be described.
- an organic EL element 250a that emits red light, an organic EL element 250b that emits green light, and an organic EL element 250c that emits blue light are arranged in a matrix as one unit, and are arranged in a matrix.
- the light emitting region of each organic EL element is defined by 251.
- Each organic EL element is composed of a lower electrode (anode) 252, a hole transport layer 253, a light emitting layer 254, and an upper electrode (cathode) 255.
- an interlayer insulating film 258 provided with contact holes 257, and a plurality of lower electrodes 259 are provided.
- the organic EL element is enclosed by a sealing substrate 2b, and a hollow portion 261 is formed between each organic EL element and the sealing substrate 2b.
- the manufacturing process of the flexible organic EL display consists of manufacturing a polyimide film on a glass substrate support and manufacturing the organic EL substrate shown in FIG. 1 on the polyimide film, and manufacturing a sealed substrate.
- the assembly step of bonding and the peeling step of peeling the organic EL display produced on the polyimide film from the glass substrate support are included.
- a well-known manufacturing process can be applied to the organic EL substrate manufacturing process, the sealed substrate manufacturing process, and the assembling process. The following is an example, but the present invention is not limited to this.
- the peeling step is the same as the peeling step of the polyimide film described above.
- a polyimide film is formed on a glass substrate support by the above method, and a multilayer layer of silicon nitride (SiN) and silicon oxide (SiO) is formed on the polyimide film by a CVD method or a sputtering method.
- a multi-barrier layer having a structure (lower substrate 2a in FIG. 1) is manufactured, and a metal wiring layer for driving a TFT is manufactured on the upper portion by using a photoresist or the like.
- An active buffer layer such as SiO is formed on the upper portion by a CVD method, and a TFT device (TFT256 in FIG.
- IGZO metal oxide semiconductor
- LTPS low-temperature polysilicon
- the hole transport layer 253 and the light emitting layer 254 are formed in each space partitioned by the partition wall.
- the upper electrode (cathode) 255 is formed so as to cover the light emitting layer 254 and the partition wall (bank) 251.
- an organic EL substrate is manufactured.
- the organic EL substrate is sealed with a sealing film or the like (sealed substrate 2b in FIG. 1), and the device above the polyimide substrate is peeled from the glass substrate support by a known peeling method such as laser peeling to obtain a top.
- Emission type flexible organic EL display can be manufactured.
- a see-through type flexible organic EL display can be manufactured.
- a bottom emission type flexible organic EL display may be manufactured by a known method.
- a flexible liquid crystal display can be manufactured using the polyimide film of the present embodiment.
- a polyimide film is produced on a glass substrate support by the above method, and the above method is used, for example, composed of amorphous silicon, a metal oxide semiconductor (IGZO, etc.), and low-temperature polysilicon.
- a TFT substrate is manufactured.
- a polyimide film is produced on a glass substrate support according to the coating step and the film forming step of the present embodiment, and a color resist or the like is used according to a known method to provide a color filter glass substrate (CF substrate) with the polyimide film. ) Is prepared.
- a sealing material made of thermosetting epoxy resin or the like is applied to one of the TFT substrate and the CF substrate by screen printing to a frame-shaped pattern lacking the liquid crystal injection port portion, and the other substrate corresponds to the thickness of the liquid crystal layer.
- a spherical spacer made of plastic or silica is sprayed.
- a flexible liquid crystal display can be manufactured by peeling the glass substrate on the CF side and the glass substrate on the TFT side at the interface between the polyimide film and the glass substrate by a laser peeling method or the like.
- the method for producing the laminate of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. Includes an element forming step of forming an element on the polyimide resin film.
- the element in the laminated body examples include those exemplified in the manufacture of the above-mentioned flexible device.
- the support for example, a glass substrate can be used.
- the preferred specific procedure of the coating step and the film forming step is the same as that described with respect to the above-mentioned method for producing a polyimide film.
- the above-mentioned element is formed on the polyimide resin film as a flexible substrate formed on the support. Then, optionally, the polyimide resin film and the element may be peeled from the support in the peeling step.
- the calibration curve for calculating the weight average molecular weight was prepared using standard polystyrene (manufactured by Toso Co., Ltd.). Column: Shodex KD-806M (manufactured by Showa Denko KK) Flow rate: 1.0 mL / min Column temperature: 40 ° C Pump: PU-2080Plus (manufactured by JASCO) Detector: RI-2031Plus (RI: differential refractometer, manufactured by JASCO) and UV-2075Plus (UV-VIS: ultraviolet-visible absorptiometer, manufactured by JASCO)
- Viscosity stability was evaluated according to the following criteria.
- C Viscosity stability 6% / day more than 10% / day or less "OK”
- D Viscosity stability 8% / day over "OK”
- a 6-inch silicon wafer substrate having an aluminum-deposited layer on its surface was used as a support, and the resin compositions prepared in Examples and Comparative Examples were placed on the surface of the aluminum-deposited layer, and the thickness of the polyimide resin film was 10 ⁇ m.
- a coating film was formed by spin coating so as to be. After prebaking this coating film at 100 ° C. for 6 minutes, a vertical curing furnace (manufactured by Koyo Thermo System Co., Ltd., model name "VF-2000B") in which the oxygen concentration in the refrigerator was adjusted to 10 mass ppm or less was used. It was heated at 400 ° C.
- a dicing saw manufactured by Disco Co., Ltd., product name "DAD 3350" was used to make a 3 mm wide cut in the obtained polyimide film, and then the wafer with the polyimide film was immersed in a dilute hydrochloric acid aqueous solution overnight. , The polyimide film piece was peeled off and dried to obtain a polyimide piece having a width of 3 mm. This was cut into a length of 50 mm to obtain a polyimide measurement sample having a width of 3 mm and a length of 50 mm.
- the ratio of the silicon group-containing compound can be determined by the following method using a varnish. An appropriate amount of water is added to the varnish, and the mixture is heat-treated at 80 ° C. for 3 days to depolymerize the depolymerization component into the acid component and the amine component to obtain an acid monomer and an amine monomer. Then, the solvent is distilled off to obtain a powder in which an acid monomer and an amine monomer are mixed, an acetonitrile solution is prepared, and high performance liquid chromatography mass spectrometry (LC / MS) measurement is performed. Then, the peak area of each monomer can be obtained and calculated from the peak area ratio.
- LC / MS high performance liquid chromatography mass spectrometry
- Example I-1 Total number of moles of diamine monomer in the imidization step (including the silicon-containing compound in which L 1 and L 2 of the general formula (10) are amino groups): 93.6 mmol Total number of moles of diamine monomer in the amidation step (including the silicon-containing compound in which L 1 and L 2 of the general formula (10) are amino groups): 111.9 mmol
- the imidization rate is 83.7%.
- Imidization rate (%) Total number of moles of acid dianhydride monomer in the imidization step (where L 1 and L 2 in the general formula (10) include the silicon-containing compound of the acid anhydride group) / ⁇ acid anhydride monomer in the imidization step (general formula (general formula (1) 10) L 1 and L 2 are the total number of moles of the silicon-containing compound of the acid anhydride group) + the acid dianhydride monomer in the amidation step (L 1 and L 2 of the general formula (10) are the acid anhydride groups Total number of moles of (including silicon-containing compounds) ⁇ * 100
- the imidization rate can be determined by the following method using a varnish. An appropriate amount of water is added to the varnish, and the mixture is heat-treated at 80 ° C. for 3 days to depolymerize the depolymerization component into the acid component and the amine component to obtain an acid monomer and an amine monomer. Then, the solvent is distilled off to obtain a powder in which an acid monomer and an amine monomer are mixed, an acetonitrile solution is prepared, and high performance liquid chromatography mass spectrometry (LC / MS) measurement is performed. Then, the peak area of each monomer can be obtained and calculated from the peak area ratio.
- LC / MS high performance liquid chromatography mass spectrometry
- the imidization rate can also be measured using an IR (infrared spectrophotometer).
- the varnish was reprecipitated with an aqueous solvent, the powder was separated and dried, and KBr was added to make pellets, which were used as a sample. Then, by measuring the infrared absorption spectrum of the resin layer at one time reflection ATR method, with respect to the benzene ring carbon hydrogen bonds 1009Cm -1, can be calculated from the absorbance from the imide groups of 1778cm -1.
- the imidization ratio of the polyimide film after heat-treating the varnish at 400 ° C. for 1 hour was set to 100%.
- A: Silicon-containing compound ratio (% by mass) in diamine of imide unit silicon-containing compound used in imidization step / total mass of diamine monomer (including silicon-containing compound) used in imidization step * 100
- B: Silicon-containing compound ratio (% by mass) in diamine of the amide unit total mass of silicon-containing compound used in the imidization step / diamine monomer (including silicon-containing compound) used in the amidation step * 100
- A is "among the general formula in (7) of the diamine constituting the P 5, the ratio (mass%) of the general formula (10)" and can turn also.
- B can be rephrased as "the ratio (mass%) of the general formula (10) to the diamines constituting P 3 in the general formula (6)". Then, the ratio of the silicon-containing compound in the diamine The difference between the imide unit and the amide unit is expressed as "BA".
- Table 5 shows the values of BA of Examples I-14, I-16, I-17 and Comparative Examples I-4 to I-6, their varnishes, and the characteristics of the polyimide film.
- Example I-1 As shown in Tables 1 and 2, NMP (189 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (73.0 mmol, 11.1 g) and silicon-containing compound (2) (6.699 mmol, 10.72 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. rice field. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- DABA 73.0 mmol, 11.1 g
- silicon-containing compound (2) 6.699 mmol, 10.72 g
- Example I-2 As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (13.6 g) and the silicon-containing compound (1) (10.82 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-3 As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (7.3 g) and the silicon-containing compound (3) (10.85 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-4 As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (8.7 g) and the silicon-containing compound (4) (10.85 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-5 As shown in Tables 1 and 2, NMP (186 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (14.9 g) was added with stirring, and then CpODA (32.8 g) and a silicon-containing compound (5) (10.51 g) were added as acid dianhydride at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-6 >> As shown in Tables 1 and 2, NMP (184 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (12.9 g) and the silicon-containing compound (1) (10.44 g) were added with stirring, and then CpODA (28.8 g) and ODPA (7.8 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-7 As shown in Tables 1 and 2, NMP (194 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (11.1 g) and the silicon-containing compound (2) (11.02 g) were added with stirring, and then CpODA (28.8 g) and 6FDA (11.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-8 As shown in Tables 1 and 2, NMP (197 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (8.6 g) and the silicon-containing compound (1) (11.19 g) were added with stirring, and then CpODA (28.8 g) and BPAF (11.5 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-9 >> As shown in Tables 1 and 2, NMP (193 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (7.2 g) and the silicon-containing compound (1) (10.92 g) were added with stirring, and then CpODA (28.8 g) and BzDA (10.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-10 As shown in Tables 1 and 2, NMP (170 g), toluene (17 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (13.3 g) and the silicon-containing compound (2) (9.62 g) were added with stirring, and then CpODA (28.8 g) and BNBDF (4.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-11 >> As shown in Tables 1 and 2, NMP (204 g), toluene (20 g), and diamine as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (10.3 g), BAFL (5.9 g) and silicon-containing compound (1) (11.57 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-12 As shown in Tables 1 and 2, NMP (202 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (5.5 g), BisAM (3.1 g) and silicon-containing compound (2) (11.42 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-13 >> As shown in Tables 1 and 2, NMP (218 g), toluene (22 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (5.9 g), BAFL (9.4 g) and silicon-containing compound (1) (12.35 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature to obtain an NMP solution of a polyimide resin (functional group other than silicon-containing compound: imide group, functional group of silicon-containing compound: imide group). The obtained varnish was stored in a freezer (setting -20 ° C, the same applies hereinafter), and was thawed and used for evaluation.
- a polyimide resin functional group other than silicon-containing compound: imide group, functional group of silicon-containing compound: imide group
- Comparative Examples I-2 and I-3 >> In Comparative Example I-1, the same procedure was used for Comparative Example I-1 except that the types and amounts of the solvent, acid dianhydride, and diamine were changed to those shown in Tables 1 and 2.
- Example I-14 As shown in Tables 3 and 4, NMP (177 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. As a silicon-containing compound (2) (4.12 g), 33 DAS (8.5 g), 44 DAS (12.8 g) was added with stirring, and then ODPA (31.0 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-15 As shown in Tables 3 and 4, NMP (170 g), toluene (17 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top.
- Example I-16 As shown in Tables 3 and 4, NMP (204 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top.
- the silicon-containing compound (2) (16.36 g) and DABA (12.0 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-17 As shown in Tables 3 and 4, NMP (259 g), toluene (26 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top.
- the silicon-containing compound (1) (15.54 g) and BAFL (29.1 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example I-18 As shown in Tables 3 and 4, NMP (232 g), toluene (23 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. As a silicon-containing compound (1) (7.73 g), 33 DAS (8.5 g), 44 DAS (12.8 g) was added with stirring, and then BPAF (45.8 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- BPAF 45.8 g
- Example I-19 As shown in Tables 3 and 4, NMP (235 g), toluene (24 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top.
- the silicon-containing compound (1) (7.84 g) and 6FODA (28.9 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- the temperature was raised to 80 ° C., 11.30 g (13.78 mmol) of the silicon-containing compound KF-8010 (manufactured by Shin-Etsu Chemical Co., Ltd., both ends: amino group, functional group equal amount 430) was added, and the mixture was further stirred for 0.5 hour. After that, the temperature was raised to 170 ° C. and heated for 4 hours.
- the by-produced water was azeotropically boiled with toluene and dehydrated under reflux using a condenser with a ball equipped with a water separation trap. After draining the by-product water, reflux was stopped and all toluene was drained.
- Comparative Example I-6 A 500 mL five-necked round-bottom flask with a stainless half-moon agitator, a nitrogen inlet tube, a Dean Stark with a condenser, a thermometer, and a glass end cap, as described in Tables 3 and 4. 27.0 g (0.0802 mol) of 6FODA and 56.000 g of NMP were added, and the mixture was stirred at a system temperature of 70 ° C. and a nitrogen atmosphere at a rotation speed of 200 rpm to obtain a solution.
- DABA 3,5-diaminobenzoic acid 3,3'-diaminodiphenyl sulfone (33DAS) 4,4'-Diaminodiphenyl sulfone (44DAS)
- BAFL 9,9-bis (4-aminophenyl) fluorene
- BisAM a compound of the following general formula TFMB: Diaminobis (trifluoromethyl) biphenyl
- BAPP Compound of the following general formula mBAPS: Bis [4- (3-aminophenoxy) phenyl] Sulfone
- APB 1,3-Bis (3-aminophenoxy) benzene
- Silicon-containing compound (1) (In the general formula (10), L 1 and L 2 are amino groups (-NH 2 ), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 ,. A compound in which R 3 is a methyl group, j and k are 0, and a functional group equivalent is 1500).
- Silicon-containing compound (3) (In the general formula (10), L 1 and L 2 are amino groups (-NH 2 ), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 ,. A compound in which R 3 is a methyl group, j and k are 0, and a functional group equivalent is 2200). Silicon-containing compound (4): In the general formula (10), L 1 and L 2 are amino groups, R 1 is ⁇ CH 2 CH 2 CH 2 ⁇ , and R 2 , R 3 , R 6 and R 7 are methyl.
- R 1 is a trimethylene group (-CH 2 CH 2 CH 2- )
- R 2 and R 3 are methyl groups, and j and k are 0.
- the calibration curve for calculating the weight average molecular weight was prepared using standard polystyrene (manufactured by Toso Co., Ltd.). Column: Shodex KD-806M (manufactured by Showa Denko KK) Flow rate: 1.0 mL / min Column temperature: 40 ° C Pump: PU-2080Plus (manufactured by JASCO) Detector: RI-2031Plus (RI: differential refractometer, manufactured by JASCO) and UV-2075Plus (UV-VIS: ultraviolet-visible absorptiometer, manufactured by JASCO)
- Viscosity stability was evaluated according to the following criteria.
- C Viscosity stability 3% / day over 5% / day or less "OK”
- D Viscosity stability 5% / day over "OK”
- a 6-inch silicon wafer substrate having an aluminum-deposited layer on its surface was used as a support, and the resin compositions prepared in Examples and Comparative Examples were placed on the surface of the aluminum-deposited layer, and the thickness of the polyimide resin film was 10 ⁇ m.
- a coating film was formed by spin coating so as to be. After prebaking this coating film at 100 ° C. for 6 minutes, a vertical curing furnace (manufactured by Koyo Thermo System Co., Ltd., model name "VF-2000B") in which the oxygen concentration in the refrigerator was adjusted to 10 mass ppm or less was used. It was heated at 400 ° C.
- a dicing saw manufactured by Disco Co., Ltd., product name "DAD 3350" was used to make a 3 mm wide cut in the obtained polyimide film, and then the wafer with the polyimide film was immersed in a dilute hydrochloric acid aqueous solution overnight. , The polyimide film piece was peeled off and dried to obtain a polyimide piece having a width of 3 mm. This was cut into a length of 50 mm to obtain a polyimide measurement sample having a width of 3 mm and a length of 50 mm.
- Example II-1 As shown in Tables 6 and 7, NMP (191 g) as a solvent, DABA (14.4 g) as a diamine, and a silicon-containing compound (1) (1) while introducing nitrogen gas into a 3 L separable flask with a stirring rod. 10.82 g) was added with stirring, followed by CpODA (38.4 g) as acid dianhydride. The molar ratio of acid dianhydride and diamine was 100: 98. The mixture was stirred at room temperature for 48 hours to obtain an NMP solution (hereinafter, also referred to as varnish) of a transparent polyimide precursor (functional group other than silicon-containing compound: amide group, functional group of silicon-containing compound: amide group). The obtained varnish was stored in a freezer (setting -20 ° C, the same applies hereinafter), and was thawed and used for evaluation.
- NMP (191 g) as a solvent, DABA (14.4 g) as a diamine, and a silicon-containing compound (1) (1) while
- Example II-2 As shown in Tables 6 and 7, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (14.4 g) and the silicon-containing compound (1) (10.82 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example II-3 While introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top, as shown in any of Tables 6 to 9, NMP (189 g) and toluene (19 g) were used as solvents. ), DABA (13.9 g) as a diamine was added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization.
- Example II-16 As shown in Tables 8 and 9, NMP (177 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. 33 DAS (8.5 g) and 44 DAS (12.8 g) were added with stirring, and then ODPA (31.0 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene.
- Example II-17 As shown in Tables 8 and 9, NMP (173 g), toluene (17 g), as solvents, while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dane Stark tube and a reflux tube at the top. DABA (13.0 g) was added as a diamine with stirring, followed by CpODA (38.4 g) as an acid dianhydride at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene.
- Comparative Example II-4 A 500 mL five-necked round-bottom flask with a stainless half-moon agitator, a nitrogen inlet tube, a Dean Stark with a condenser, a thermometer, and a glass end cap, as described in Tables 8 and 9. 27.0 g (0.0802 mol) of 6FODA and 56.000 g of NMP were added, and the mixture was stirred at a system temperature of 70 ° C. and a nitrogen atmosphere at a rotation speed of 200 rpm to obtain a solution.
- Example II-3 the same procedure was used for Example II-3, except that the types and amounts of the solvent, acid dianhydride, diamine, and silicon-containing compound were changed to those shown in Tables 6 and 7. ..
- Example II-2 the same procedure was used for Example II-2, except that the types and amounts of the solvent, acid dianhydride, diamine, and silicon-containing compound were changed to those shown in Tables 6 and 7. ..
- DABA 3,5-diaminobenzoic acid
- BAFL 9,9-bis (4-aminophenyl) fluorene
- BisAM a compound of the following general formula
- TFMB Diaminobis (trifluoromethyl) biphenyl
- BAPP Compound of the following general formula 33DAS: 3,3'-diaminodiphenyl sulfone 44DAS: 3,3'-diaminodiphenyl sulfone 6FODA: 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether
- Silicon-containing compound (1) (in the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ) and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 1500). Silicon-containing compound (2): (In the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ), and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 800).
- Silicon-containing compound (3) (in the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ) and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 2200).
Abstract
Description
<1>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記樹脂の総質量を基準に前記ケイ素含有化合物を25質量%以下含む、
樹脂組成物。
<2>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記樹脂のイミド化率が50%以上である、
樹脂組成物。
<3>
前記樹脂のイミド化率が50%以上である、項目1に記載の樹脂組成物。
<4>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
下記(ア)又は(イ):
(ア)前記P3及び/又はP5は、下記一般式(8):
(イ)前記P4及び/又はP6は、下記一般式(9):
のいずれかを満たす、樹脂組成物。
<5>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5が、それぞれ独立に、
3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、又は
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。
<6>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5が、それぞれ独立に、
2,2’-ビス(トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル(6FODA)
に由来する構成単位を少なくとも一つ含む、樹脂組成物。
<7>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
A(質量%):一般式(7)におけるP5を構成するジアミンのうち、一般式(10)の割合
B(質量%):一般式(6)におけるP3を構成するジアミンのうち、一般式(10)の割合
としたとき、B-Aが、0より大きく、60未満である、
樹脂組成物。
<8>
前記ジアミンが、
下記一般式(8):
3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、及び
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
から選択される少なくとも一つの化合物である、項目7に記載の樹脂組成物。
<9>
前記一般式(6)及び/又は前記一般式(7)において、P4及び/又はP6が、それぞれ独立に、4,4’-オキシジフタル酸無水物(ODPA)、又は9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)の各化合物に由来する構成単位を少なくとも一つ含む、請求項1~8のいずれか1項に記載の樹脂組成物。
<10>
前記一般式(10)で表されるケイ素含有化合物の官能基当量が800以上である、項目1~9のいずれか一項に記載の樹脂組成物。
<11>
前記P5が、前記一般式(10)で表される化合物に由来する構成単位を含み、かつ
前記一般式(10)において前記L1及びL2が、それぞれ独立に、アミノ基である、
項目1~10のいずれか一項に記載の樹脂組成物。
<12>
前記一般式(8)で表される化合物が、全ジアミン(前記一般式(10)で表される化合物を除く)を100mol%としたとき、50mol%より多い、項目4及び9~11のいずれか一項に記載の樹脂組成物。
<13>
前記P3又はP5が、それぞれ独立に、下記式:
<14>
前記P4又はP6が、それぞれ独立に、4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸二無水物、下記式:
<15>
前記樹脂を加熱して得られるポリイミド樹脂膜が、フレキシブル基板に用いられる、項目1~14のいずれか一項に記載の樹脂組成物。
<16>
前記樹脂を硬化して得られるポリイミド樹脂膜が、フレキシブルディスプレイに用いられる、項目1~15のいずれか一項に記載の樹脂組成物。
<17>
ジアミン又は酸二無水物と下記一般式(10):
で表されるケイ素含有化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂を含む樹脂組成物を提供することを含み、
前記樹脂の総質量を基準に前記ケイ素含有化合物を25質量%以下含む、
樹脂組成物の製造方法。
<18>
ジアミン又は酸二無水物と下記一般式(10):
で表されるケイ素含有化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂を含む樹脂組成物を提供することを含み、
前記樹脂のイミド化率が50%以上である、
樹脂組成物の製造方法。
<19>
下記一般式(8):
で表されるケイ素含有化合物と、その他の化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。
<20>
3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、及び
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
から選択される少なくとも一つの化合物と、
下記一般式(10):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。
<21>
4,4’-オキシジフタル酸無水物(ODPA)、及び9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)から選択される少なくとも一つの化合物と、下記一般式(10):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。
<22>
支持体の表面上に、項目1~16のいずれか一項に記載の樹脂組成物、又は項目17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ポリイミド樹脂膜の製造方法。
<23>
前記剥離工程に先立って、前記支持体側から前記樹脂組成物にレーザーを照射する照射工程を含む、項目22に記載のポリイミド樹脂膜の製造方法。
<24>
支持体の表面上に、項目1~16のいずれか一項に記載の樹脂組成物、又は項目17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
該素子が形成された該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ディスプレイの製造方法。
<25>
支持体の表面上に、項目1~16のいずれか一項に記載の樹脂組成物、又は項目17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
を含む、積層体の製造方法。
<26>
前記素子が形成された前記ポリイミド樹脂膜を前記支持体から剥離する工程をさらに含む、項目25に記載の積層体の製造方法。
<27>
項目25又は26に記載の方法により積層体を製造することを含む、フレキシブルデバイスの製造方法。 [First aspect]
<1>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from the silicon-containing compound represented by, and contains 25% by mass or less of the silicon-containing compound based on the total mass of the resin.
Resin composition.
<2>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by, and the imidization ratio of the resin is 50% or more.
Resin composition.
<3>
The resin composition according to item 1, wherein the resin has an imidization ratio of 50% or more.
<4>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by (a) or (b) below.
(A) The P 3 and / or P 5 is the following general formula (8):
A resin composition that satisfies any of the above.
<5>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), or 9,9-bis (4-aminophenyl) fluorene (BAFL)
A resin composition containing at least one structural unit derived from each of the above compounds.
<6>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA)
A resin composition containing at least one structural unit derived from.
<7>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and A (wt%): Of the diamine that constitutes the P 5 in the general formula (7), the proportion of the general formula (10) B (wt%): of the diamine that constitutes the P 3 in the general formula (6), when the ratio of the general formula (10), B-a is greater than 0 and less than 60,
Resin composition.
<8>
The diamine
The following general formula (8):
3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), and 9,9-bis (4-aminophenyl) fluorene (BAFL)
The resin composition according to item 7, which is at least one compound selected from the above.
<9>
In Formula (6) and / or the general formula (7), P 4 and / or P 6 are each independently, 4,4'-oxydiphthalic anhydride (ODPA), or 9,9-bis ( 3,4-Dicarboxyphenyl) The resin composition according to any one of claims 1 to 8, which comprises at least one structural unit derived from each compound of fluorene diacid anhydride (BPAF).
<10>
The resin composition according to any one of items 1 to 9, wherein the silicon-containing compound represented by the general formula (10) has a functional group equivalent of 800 or more.
<11>
The P 5 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
The resin composition according to any one of items 1 to 10.
<12>
The compound represented by the general formula (8) is more than 50 mol% when the total diamine (excluding the compound represented by the general formula (10)) is 100 mol%, whichever of items 4 and 9 to 11. The resin composition according to item 1.
<13>
Wherein P 3 or P 5 are each independently, the following formula:
<14>
Wherein P 4 or P 6 are each independently, 4,4 '- (hexafluoro isopropylidene) diphthalic anhydride, the following formula:
<15>
The resin composition according to any one of items 1 to 14, wherein the polyimide resin film obtained by heating the resin is used for a flexible substrate.
<16>
The resin composition according to any one of items 1 to 15, wherein the polyimide resin film obtained by curing the resin is used for a flexible display.
<17>
Diamine or acid dianhydride and the following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by
It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
The silicon-containing compound is contained in an amount of 25% by mass or less based on the total mass of the resin.
A method for producing a resin composition.
<18>
Diamine or acid dianhydride and the following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by
It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
The imidization rate of the resin is 50% or more.
A method for producing a resin composition.
<19>
The following general formula (8):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
<20>
3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), and 9,9-bis (4-aminophenyl) fluorene (BAFL)
With at least one compound selected from
The following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
<21>
At least one compound selected from 4,4'-oxydiphthalic anhydride (ODPA) and 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF), and the following general formula ( 10):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds.
<22>
A coating step of applying the resin composition according to any one of items 1 to 16 or the resin composition obtained by the method according to any one of items 17 to 21 onto the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
A peeling step of peeling the polyimide resin film from the support,
A method for producing a polyimide resin film, including.
<23>
The method for producing a polyimide resin film according to item 22, further comprising an irradiation step of irradiating the resin composition with a laser from the support side prior to the peeling step.
<24>
A coating step of applying the resin composition according to any one of items 1 to 16 or the resin composition obtained by the method according to any one of items 17 to 21 onto the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A peeling step of peeling the polyimide resin film on which the element is formed from the support,
How to make a display, including.
<25>
A coating step of applying the resin composition according to any one of items 1 to 16 or the resin composition obtained by the method according to any one of items 17 to 21 onto the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A method for manufacturing a laminate, including.
<26>
The method for producing a laminate according to
<27>
A method for manufacturing a flexible device, which comprises manufacturing the laminate by the method according to
<28>
下記一般式(1)又は(2):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P1は、下記一般式(3):
前記P1又P2は、下記一般式(5):
で表されるケイ素含有化合物に由来する構成単位を含む、
樹脂組成物。
<29>
前記P2が、下記一般式(4):
<30>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含む、
樹脂組成物。
<31>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
下記(ア)又は(イ):
(ア)前記P3及び/又はP5は、下記一般式(8):
(イ)前記P4及び/又はP6は、下記一般式(9):
のいずれかを満たす、樹脂組成物。
<32>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5は、
3,3’-ジアミノジフェニルスルホン(33DAS)、又は
4,4’-ジアミノジフェニルスルホン(44DAS)
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。
<33>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5は、
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)、又は
下記一般式:
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。
<34>
下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P4及び/又はP6は、
4,4’-オキシジフタル酸無水物(ODPA)、
4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物(6FDA)、
9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)、
下記一般式:
下記一般式:
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。
<35>
前記P3が、前記一般式(10)で表される化合物に由来する構成単位を含み、
前記一般式(10)で表されるケイ素含有化合物の官能基当量が800以上である、項目30~34のいずれか一項に記載の樹脂組成物。
<36>
前記P3が、前記一般式(10)で表される化合物に由来する構成単位を含み、かつ
前記一般式(10)において前記L1及びL2が、それぞれ独立に、アミノ基である、
項目30~35のいずれか一項に記載の樹脂組成物。
<37>
前記一般式(3)又は(8)で表される化合物が、全ジアミン(前記一般式(5)又は(10)で表される化合物を除く)を100mol%としたとき、50mol%より多い、項目28、29及び31のいずれか一項に記載の樹脂組成物。
<38>
前記樹脂を加熱して得られるポリイミド樹脂膜が、フレキシブル基板に用いられる、項目28~37のいずれか一項に記載の樹脂組成物。
<39>
前記樹脂を硬化して得られるポリイミド樹脂膜が、フレキシブルディスプレイに用いられる、項目28~38のいずれか一項に記載の樹脂組成物。
<40> 下記一般式(3):
3,3’-ジアミノジフェニルスルホン(33DAS)、及び
4,4’-ジアミノジフェニルスルホン(44DAS)、
から選択される少なくとも一つのジアミンと、
酸二無水物と、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミド前駆体及び/又はポリイミドを提供することを含む、樹脂組成物の製造方法。
<41>
ジアミン(ただし、2,2 ’-ビス (トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル(6FODA)を含まない)と酸二無水物を重縮合反応させてポリイミドを得た後、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。
<42>
下記一般式(3):
3,3’-ジアミノジフェニルスルホン(33AS)、及び
4,4’-ジアミノジフェニルスルホン(44DAS)、
から選択される少なくとも一つのジアミンと、
酸二無水物と、
その他の化合物とを重縮合反応させてポリイミドを得た後、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。
<43>
支持体の表面上に、項目28~39のいずれか一項に記載の樹脂組成物、又は項目40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ポリイミド樹脂膜の製造方法。
<44>
前記剥離工程に先立って、前記支持体側から前記樹脂組成物にレーザーを照射する照射工程を含む、項目43に記載のポリイミド樹脂膜の製造方法。
<45>
支持体の表面上に、項目28~39のいずれか一項に記載の樹脂組成物、又は項目40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
該素子が形成された該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ディスプレイの製造方法。
<46>
支持体の表面上に、項目28~39のいずれか一項に記載の樹脂組成物、又は項目40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
を含む、積層体の製造方法。
<47>
前記素子が形成された前記ポリイミド樹脂膜を前記支持体から剥離する工程をさらに含む、項目46に記載の積層体の製造方法。
<48>
項目46又は47に記載の方法により積層体を製造することを含む、フレキシブルデバイスの製造方法。 [Second aspect]
<28>
The following general formula (1) or (2):
A resin composition containing a resin of a structural unit represented by.
The P 1 is the following general formula (3):
Containing structural units derived from silicon-containing compounds represented by
Resin composition.
<29>
The above P 2 is the following general formula (4):
<30>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing structural units derived from silicon-containing compounds represented by
Resin composition.
<31>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by (a) or (b) below.
(A) The P 3 and / or P 5 is the following general formula (8):
A resin composition that satisfies any of the above.
<32>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and the P 3 and / or P 5 is
3,3'-diaminodiphenyl sulfone (33DAS), or 4,4'-diaminodiphenyl sulfone (44DAS)
A resin composition containing at least one structural unit derived from each of the above compounds.
<33>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and the P 3 and / or P 5 is
9,9-Bis (4-aminophenyl) fluorene (BAFL), or the following general formula:
A resin composition containing at least one structural unit derived from each of the above compounds.
<34>
The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
In comprising a structural unit derived from silicon-containing compound represented, and the P 4 and / or P 6 is
4,4'-Oxydiphthalic anhydride (ODPA),
4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride (6FDA),
9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF),
The following general formula:
A resin composition containing at least one structural unit derived from each of the above compounds.
<35>
The P 3 contains a structural unit derived from the compound represented by the general formula (10).
The resin composition according to any one of items 30 to 34, wherein the silicon-containing compound represented by the general formula (10) has a functional group equivalent of 800 or more.
<36>
The P 3 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
The resin composition according to any one of items 30 to 35.
<37>
The compound represented by the general formula (3) or (8) is more than 50 mol% when the total diamine (excluding the compound represented by the general formula (5) or (10)) is 100 mol%. The resin composition according to any one of items 28, 29 and 31.
<38>
The resin composition according to any one of items 28 to 37, wherein the polyimide resin film obtained by heating the resin is used for a flexible substrate.
<39>
The resin composition according to any one of items 28 to 38, wherein the polyimide resin film obtained by curing the resin is used for a flexible display.
<40> The following general formula (3):
3,3'-Diaminodiphenyl sulfone (33DAS), and 4,4'-diaminodiphenyl sulfone (44DAS),
With at least one diamine selected from,
Acid dianhydride and
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction of another compound to provide a polyimide precursor and / or a polyimide.
<41>
After polycondensation reaction of diamine (however, 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) is not contained) and acid dianhydride to obtain polyimide,
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide.
<42>
The following general formula (3):
3,3'-Diaminodiphenyl sulfone (33AS), and 4,4'-diaminodiphenyl sulfone (44DAS),
With at least one diamine selected from,
Acid dianhydride and
After polycondensation reaction with other compounds to obtain polyimide,
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide.
<43>
A coating step of applying the resin composition according to any one of items 28 to 39 or the resin composition obtained by the method according to any one of items 40 to 42 on the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
A peeling step of peeling the polyimide resin film from the support,
A method for producing a polyimide resin film, including.
<44>
The method for producing a polyimide resin film according to item 43, which comprises an irradiation step of irradiating the resin composition with a laser from the support side prior to the peeling step.
<45>
A coating step of applying the resin composition according to any one of items 28 to 39 or the resin composition obtained by the method according to any one of items 40 to 42 on the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A peeling step of peeling the polyimide resin film on which the element is formed from the support,
How to make a display, including.
<46>
A coating step of applying the resin composition according to any one of items 28 to 39 or the resin composition obtained by the method according to any one of items 40 to 42 on the surface of the support. ,
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A method for manufacturing a laminate, including.
<47>
The method for producing a laminate according to item 46, further comprising a step of peeling the polyimide resin film on which the element is formed from the support.
<48>
A method for manufacturing a flexible device, which comprises manufacturing the laminate by the method according to item 46 or 47.
本発明によれば、第二に、DABAとケイ素含有化合物とその他の化合物等をモノマーとして用いて、または、DABAとケイ素含有化合物とその他の化合物等をモノマーとして用いて、3,3’-ジアミノジフェニルスルホン(33DAS)及び/又は、4,4’-ジアミノジフェニルスルホン(44DAS)とケイ素含有化合物とその他の化合物等をモノマーとして用いて、ディスプレイ用途に求められる特性に優れるポリイミド前駆体又はポリイミド樹脂組成物を提供することができる。
なお、上述の記載は、本発明の全ての実施形態及び本発明に関する全ての利点を開示したものと見なしてはならない。本発明の更なる実施形態及びその利点は、以下の記載を参照することにより明らかとなる。 According to the present invention, firstly, it is possible to provide a polyimide precursor or a polyimide resin composition having excellent properties required for display applications by using DABA, CpODA, other silicon-containing compounds and the like as monomers.
According to the present invention, secondly, using DABA, a silicon-containing compound and other compounds as a monomer, or using DABA and a silicon-containing compound and other compounds as a monomer, 3,3'-diamino Using diphenyl sulfone (33DAS) and / or 4,4'-diaminodiphenyl sulfone (44DAS), a silicon-containing compound and other compounds as monomers, a polyimide precursor or polyimide resin composition having excellent properties required for display applications. Can provide things.
It should be noted that the above description shall not be deemed to disclose all the embodiments of the present invention and all the advantages relating to the present invention. Further embodiments of the present invention and their advantages will become apparent with reference to the following description.
《樹脂組成物》
〈樹脂/ポリイミド前駆体/ポリイミド〉
本実施形態の樹脂組成物は、下記一般式(6)及び(7):
で表される構造単位の樹脂を含み、一部がイミド化されたポリイミド前駆体を含むこともでき、P5又はP6は、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含む。このような一部がイミド化されたポリイミド前駆体の場合、全ポリイミド前駆体と比較して、組成物の粘度安定性に優れ、全ポリイミドと比較すると、ポリイミド(ポリイミド前駆体)の合成のし易さの観点で優れる。 [First aspect]
<< Resin composition >>
<Resin / Polyimide precursor / Polyimide>
The resin composition of the present embodiment has the following general formulas (6) and (7):
In comprising a structural unit of the resin represented, in part may also include imidized polyimide precursor, P 5 or P 6 is represented by the following general formula (10):
Includes a structural unit derived from a silicon-containing compound represented by. In the case of such a partially imidized polyimide precursor, the viscosity stability of the composition is superior to that of the total polyimide precursor, and the polyimide (polyimide precursor) is synthesized as compared with the total polyimide. Excellent in terms of ease.
A:イミドユニットのジアミン中のケイ素含有化合物割合(質量%)=イミド化工程で用いたケイ素含有化合物/イミド化工程で用いたジアミンモノマー(ケイ素含有化合物含む)の質量の総量*100
B:アミドユニットのジアミン中のケイ素含有化合物割合(質量%)=イミド化工程で用いたケイ素含有化合物/アミド化工程で用いたジアミンモノマー(ケイ素含有化合物含む)の質量の総量*100
ここで、Aは、“一般式(7)におけるP5を構成するジアミンのうち、一般式(10)の割合(質量%)”とも言い換えることができる。また、Bは、“一般式(6)におけるP3を構成するジアミンのうち、一般式(10)の割合(質量%)”とも言い換えることができる。
そして、ジアミン中のケイ素含有化合物割合のイミドユニットとアミドユニットの差は、上記A,Bを用いて、B-Aとなる。 The difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine monomer of the resin is larger than 0 and 60 or less. The difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine monomer of the resin can be obtained from the following formula.
A: Silicon-containing compound ratio (% by mass) in diamine of imide unit = silicon-containing compound used in imidization step / total mass of diamine monomer (including silicon-containing compound) used in imidization step * 100
B: Silicon-containing compound ratio (% by mass) in diamine of the amide unit = total mass of silicon-containing compound used in the imidization step / diamine monomer (including silicon-containing compound) used in the amidation step * 100
Here, A is "among the general formula in (7) of the diamine constituting the P 5, the ratio (mass%) of the general formula (10)" and can turn also. Further, B can be rephrased as "the ratio (mass%) of the general formula (10) to the diamines constituting P 3 in the general formula (6)".
Then, the difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine becomes BA by using the above A and B.
下記一般式(8):
3,3’-ジアミノジフェニルスルホン(33DAS);
4,4’-ジアミノジフェニルスルホン(44DAS);及び
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
から選択される少なくとも一つの化合物である場合は、ワニス・ポリイミドの特性がさらによくなるため好ましい。 Among them, the diamine used for the resin is
The following general formula (8):
3,3'-Diaminodiphenyl sulfone (33DAS);
4,4'-Diaminodiphenyl sulfone (44DAS); and 9,9-bis (4-aminophenyl) fluorene (BAFL)
When it is at least one compound selected from the above, it is preferable because the characteristics of the varnish / polyimide are further improved.
で表される構造単位を含む、一部がイミド化されたポリイミド前駆体を含むこともでき、
P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含むことができ、そして
下記(ア)又は(イ)のいずれかを満たすことができる:
(ア)前記P3及び/又はP5は、下記一般式(8):
(イ)前記P4及び/又はP6は、下記一般式(9):
It can also contain a partially imidized polyimide precursor, including structural units represented by.
P 5 or P 6 is represented by the following general formula (10):
It can contain a structural unit derived from a silicon-containing compound represented by, and can satisfy any of the following (a) or (b):
(A) The P 3 and / or P 5 is the following general formula (8):
樹脂組成物は、下記一般式(8):
3,3’-ジアミノジフェニルスルホン(33DAS);
4,4’-ジアミノジフェニルスルホン(44DAS);
9,9-ビス(4-アミノフェニル)フルオレン(BAFL);又は
2,2’-ビス(トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル(6FODA)
の各ジアミン化合物から選択される少なくとも一つの構成単位を含む。一般式(8)で表されるジアミン化合物の中でも、ポリイミドフィルムの透明性、YIの観点から、3,5-ジアミノ安息香酸(DABA)が好ましい。ジアミン化合物として、DABA,33DAS,44DAS,BAFL,及び6FODAから選択される少なくとも一つを用いることにより、ポリイミドフィルムの機械特性向上し(特に引張伸度)、耐熱性を向上することができるため好ましい。 The diamine resin composition has the following general formula (8):
3,3'-Diaminodiphenyl sulfone (33DAS);
4,4'-Diaminodiphenyl sulfone (44DAS);
9,9-bis (4-aminophenyl) fluorene (BAFL); or 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA)
Contains at least one building block selected from each diamine compound of. Among the diamine compounds represented by the general formula (8), 3,5-diaminobenzoic acid (DABA) is preferable from the viewpoint of transparency of the polyimide film and YI. It is preferable to use at least one selected from DABA, 33DAS, 44DAS, BAFL, and 6FODA as the diamine compound because the mechanical properties of the polyimide film can be improved (particularly the tensile elongation) and the heat resistance can be improved. ..
樹脂組成物は、下記一般式(9):
4,4’-オキシジフタル酸無水物(ODPA)、又は
9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)
の各酸二無水物化合物から選択される少なくとも一つの構成単位を含む。これらの構造単位を有すると、得られるポリイミドフィルムの透明性、YI、耐熱性の機械特性を向上することができるため好ましい。 The acid dianhydride resin composition has the following general formula (9):
4,4'-Oxydiphthalic anhydride (ODPA) or 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF)
Contains at least one building block selected from each acid dianhydride compound of. Having these structural units is preferable because the transparency, YI, and heat resistance of the obtained polyimide film can be improved.
本実施形態におけるポリイミド前駆体は、上記式(6)で表される構造とともに、上記式(7)で表される構造を有していてもよい。ポリイミド前駆体中の、ケイ素含有化合物に由来する構造の含有割合は、ポリイミド前駆体の質量を基準として、5質量%以上40質量%以下であることが好ましい。ポリイミド前駆体がケイ素含有化合物に由来する構造をこの数値範囲内で含むと、得られるポリイミドフィルムにおいて、低い残留応力と、高度の透明性及び耐熱性とを両立することができるため好ましい。ケイ素含有化合物に由来する構造の含有割合は、ポリイミド前駆体の質量を基準として、6質量%以上、又は7質量%以上であってもよく、また30質量%以下、又は25質量%以下であってもよい。 <Silicon-containing compound>
The polyimide precursor in the present embodiment may have a structure represented by the above formula (6) as well as a structure represented by the above formula (7). The content ratio of the structure derived from the silicon-containing compound in the polyimide precursor is preferably 5% by mass or more and 40% by mass or less based on the mass of the polyimide precursor. It is preferable that the polyimide precursor contains a structure derived from a silicon-containing compound within this numerical range because it is possible to achieve both low residual stress and high transparency and heat resistance in the obtained polyimide film. The content ratio of the structure derived from the silicon-containing compound may be 6% by mass or more, 7% by mass or more, or 30% by mass or less, or 25% by mass or less, based on the mass of the polyimide precursor. You may.
R1は、それぞれ独立に、単結合又は炭素数1~10の2価の有機基であり、
R2及びR3は、それぞれ独立に、炭素数1~10の1価の有機基であって、R2及びR3のうちの少なくとも1つは、炭素数1~5の1価の脂肪族炭化水素基であり、
R4及びR5は、それぞれ独立に、炭素数1~10の1価の有機基であって、R4及びR5のうちの少なくとも1つは、炭素数6~10の1価の芳香族基であり、
R6及びR7は、それぞれ独立に、炭素数1~10の1価の有機基であって、R6及びR7のうちの少なくとも1つは、炭素数2~10の不飽和脂肪族炭化水素基を含む有機基であり、
L1及びL2は、それぞれ独立に、酸無水物構造を含む1価の有機基、アミノ基、イソシアネート基、カルボキシル基、アルコキシカルボニル基、ハロゲン化カルボニル基、ヒドロキシ基、エポキシ基、又はメルカプト基であり、
i及びjは、それぞれ独立に、1~200の整数であり、
kは、0~200の整数であり、そして、
0.05≦j/(i+j+k)≦0.50の関係を満たす。}で表される化合物が挙げられる。 Such a silicon-containing compound is, for example, the following formula (10) :.
R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms.
R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 2 and R 3 is a monovalent aliphatic group having 1 to 5 carbon atoms. It is a hydrocarbon group and
R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 4 and R 5 is a monovalent aromatic group having 6 to 10 carbon atoms. Is the basis and
R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 6 and R 7 is an unsaturated aliphatic hydrocarbon having 2 to 10 carbon atoms. It is an organic group containing a hydrogen group.
L 1 and L 2 are each independently a monovalent organic group containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group. And
i and j are independently integers from 1 to 200, respectively.
k is an integer from 0 to 200, and
The relationship of 0.05 ≦ j / (i + j + k) ≦ 0.50 is satisfied. } Can be mentioned.
炭素数1~10の1価の有機基は、直鎖状、環状、分枝状のいずれでもよく、飽和していても不飽和であってもよい。例えば、炭素数1~10の1価の有機基としては、メチル基、エチル基、n-プロピル基i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、ネオペンチル基、n-ヘキシル基、n-ヘプチル基、n-オクチル基、n-ノニル基、n-デシル基等の直鎖又は分岐鎖アルキル基;シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基等のシクロアルキル基;フェニル基、トリル基、キシリル基、α-ナフチル基、β-ナフチル基等の芳香族基等が挙げられる。
炭素数1~5の1価の脂肪族炭化水素基は、直鎖状、環状、分枝状のいずれでもよく、飽和していても不飽和であってもよい。例えば、炭素数1~5の1価の脂肪族炭化水素基としては、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、ネオペンチル基等の直鎖または分岐鎖アルキル基;シクロプロピル基、シクロブチル基、シクロペンチル基等のシクロアルキル基等が挙げられる。炭素数1~5の1価の脂肪族炭化水素基としては、メチル基、エチル基、及びn-プロピル基からなる群から選択される少なくとも1種であることが好ましい。 R 2 and R 3 in the formula (10) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms.
The monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated. For example, the monovalent organic group having 1 to 10 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group, and an n-pentyl group. , Neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and other linear or branched alkyl groups; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group. , Cycloalkyl group such as cycloheptyl group, cyclooctyl group; aromatic group such as phenyl group, tolyl group, xsilyl group, α-naphthyl group, β-naphthyl group and the like.
The monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated. For example, the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, and a t-butyl group. Linear or branched alkyl groups such as n-pentyl group and neopentyl group; cycloalkyl groups such as cyclopropyl group, cyclobutyl group and cyclopentyl group can be mentioned. The monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and an n-propyl group.
不飽和脂肪族炭化水素基を有する有機基は、炭素数3~10の不飽和脂肪族炭化水素基であってよく、直鎖状、環状、分枝状のいずれでもよい。炭素数3~10の不飽和脂肪族炭化水素基としては、例えば、ビニル基、アリル基、1-プロペニル基、3-ブテニル基、2-ブテニル基、ペンテニル基、シクロペンテニル基、ヘキセニル基、シクロヘキセニル基、ヘプテニル基、オクテニル基、ノネニル基、デセニル基、エチニル基、プロピニル基、ブチニル基、ペンチニル基、ヘキシニル基等が挙げられる。炭素数3~10の不飽和脂肪族炭化水素基としては、ビニル基、アリル基、及び3-ブテニル基から成る群から選択される少なくとも1種であることが好ましい。 R 6 and R 7 in the formula (10) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is an organic group having an unsaturated aliphatic hydrocarbon group. The monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched. Examples of the monovalent organic group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group and an n-pentyl group. Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl. Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, α-naphthyl group and β-naphthyl group can be mentioned. The monovalent organic group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and a group phenyl.
The organic group having an unsaturated aliphatic hydrocarbon group may be an unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms, and may be linear, cyclic or branched. Examples of the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms include a vinyl group, an allyl group, a 1-propenyl group, a 3-butenyl group, a 2-butenyl group, a pentenyl group, a cyclopentenyl group, a hexenyl group and a cyclo. Examples thereof include a hexenyl group, a heptenyl group, an octenyl group, a nonenyl group, a decenyl group, an ethynyl group, a propynyl group, a butynyl group, a pentynyl group and a hexynyl group. The unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms is preferably at least one selected from the group consisting of a vinyl group, an allyl group, and a 3-butenyl group.
酸無水物構造を含む1価の有機基としては、例えば、下記式:
アルコキシカルボニル基におけるアルコキシル基は、炭素数1~6のアルコキシル基であってよく、例えば、メトキシル基、エトキシル基、n-プロポキシル基、i-プロポキシル基、n-ブトキシル基、i-ブトキシル基、t-ブトキシル基等であってよい。
ハロゲン化カルボニル基におけるハロゲン原子は、フッ素原子以外のハロゲン原子が好ましく、より好ましくは、塩素原子又はヨウ素原子である。 L 1 and L 2 in the formula (10) are each independently a monovalent organic group (also referred to as an acid anhydride group) containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, and the like. It is a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group.
Examples of the monovalent organic group containing an acid anhydride structure include the following formula:
The alkoxyl group in the alkoxycarbonyl group may be an alkoxyl group having 1 to 6 carbon atoms, for example, a methoxyl group, an ethoxyl group, an n-propoxyl group, an i-propoxyl group, an n-butoxyl group, or an i-butoxyl group. , T-butoxyl group and the like.
The halogen atom in the halogenated carbonyl group is preferably a halogen atom other than a fluorine atom, and more preferably a chlorine atom or an iodine atom.
なお、官能基当量は、既存の規格等に従って、測定することができる。 The functional group equivalent of the silicon-containing compound represented by the formula (10) is preferably 800 or more, more preferably 1000 or more, still more preferably 1500 or more, from the viewpoint of the filterability of the resin composition. On the other hand, when the functional group equivalent is 500 or less, the filterability may deteriorate. Here, the functional group equivalent is the molecular weight of the silicon-containing compound per 1 mol of the functional group (unit: g / mol). The functional group equivalent can be measured by a known method. Further, when the functional group equivalent of the silicon-containing compound is 800 or more, the residual stress of the polyimide film under the nitrogen atmosphere is small, which is preferable. The reason for this is considered to be that when the functional group equivalent is equal to or more than a specific value, the silicone domain increases and stress is relaxed.
The functional group equivalent can be measured according to existing standards and the like.
《樹脂組成物》
〈樹脂/ポリイミド前駆体/ポリイミド〉
本実施形態の樹脂組成物は、
下記一般式(1)又は(2):
で表される構造単位の樹脂を含み、ポリイミド前駆体(以下、全ポリイミド前駆体ともいう)又はポリイミド(以下、全ポリイミドともいう)を含むこともでき、P1は、下記一般式(3):
また、P1又P2は、下記一般式(5):
で表されるケイ素含有化合物に由来する構成単位を含む。 [Second aspect]
<< Resin composition >>
<Resin / Polyimide precursor / Polyimide>
The resin composition of this embodiment is
The following general formula (1) or (2):
It contains the resin of the structural unit represented by, and may also contain a polyimide precursor (hereinafter, also referred to as a total polyimide precursor) or a polyimide (hereinafter, also referred to as a total polyimide), and P 1 is the following general formula (3). :
Further, P 1 or P 2 is expressed by the following general formula (5):
Includes a structural unit derived from a silicon-containing compound represented by.
で表される構造単位を含む、一部がイミド化されたポリイミド前駆体を含むこともでき、P3及び/又はP5は、下記一般式(8):
In a structural unit represented by the part it can also include imidized polyimide precursor, P 3 and / or P 5 is represented by the following general formula (8):
3,3’-ジアミノジフェニルスルホン(33DAS);又は
4,4’-ジアミノジフェニルスルホン(44DAS)
の各化合物に由来する構成単位を少なくとも一つ含むことができる。 Further, P 3 and / or P 5 are
3,3'-diaminodiphenyl sulfone (33DAS); or 4,4'-diaminodiphenyl sulfone (44DAS)
It can contain at least one structural unit derived from each compound of.
9,9-ビス(4-アミノフェニル)フルオレン(BAFL);又は
下記一般式:
の各化合物に由来する構成単位を少なくとも一つ含むことができる。 Further, P 3 and / or P 5 are
9,9-Bis (4-aminophenyl) fluorene (BAFL); or the following general formula:
It can contain at least one structural unit derived from each compound of.
4,4’-オキシジフタル酸無水物(ODPA);
4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物(6FDA);
9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF);下記一般式:
下記一般式:
の化合物に由来する構成単位を少なくとも一つ含むことができる。 Moreover, P 4 and / or P 6 is
4,4'-Oxydiphthalic anhydride (ODPA);
4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride (6FDA);
9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF); the following general formula:
Can contain at least one structural unit derived from the compound of.
で表されるケイ素含有化合物に由来する構成単位を含む。 Further, in one embodiment, P 3 or P 4 is represented by the following general formula (10):
Includes a structural unit derived from a silicon-containing compound represented by.
樹脂組成物は、下記一般式(3):
樹脂組成物は、下記一般式(4):
本実施形態におけるポリイミド前駆体は、上記式(1)で表される構造とともに、上記式(2)で表される構造を有していてもよい。ポリイミド前駆体中の、ケイ素含有化合物に由来する構造の含有割合は、ポリイミド前駆体の質量を基準として、5質量%以上40質量%以下であることが好ましい。ポリイミド前駆体がケイ素含有化合物に由来する構造をこの数値範囲内で含むと、得られるポリイミドフィルムにおいて、低い残留応力と、高度の透明性及び耐熱性とを両立することができるため好ましい。ケイ素含有化合物に由来する構造の含有割合は、ポリイミド前駆体の質量を基準として、6質量%以上、又は7質量%以上であってもよく、また30質量%以下、又は25質量%以下であってもよい。 <Silicon-containing compound>
The polyimide precursor in the present embodiment may have a structure represented by the above formula (1) as well as a structure represented by the above formula (2). The content ratio of the structure derived from the silicon-containing compound in the polyimide precursor is preferably 5% by mass or more and 40% by mass or less based on the mass of the polyimide precursor. It is preferable that the polyimide precursor contains a structure derived from a silicon-containing compound within this numerical range because it is possible to achieve both low residual stress and high transparency and heat resistance in the obtained polyimide film. The content ratio of the structure derived from the silicon-containing compound may be 6% by mass or more, 7% by mass or more, or 30% by mass or less, or 25% by mass or less, based on the mass of the polyimide precursor. You may.
R1は、それぞれ独立に、単結合又は炭素数1~10の2価の有機基であり、
R2及びR3は、それぞれ独立に、炭素数1~10の1価の有機基であって、R2及びR3のうちの少なくとも1つは、炭素数1~5の1価の脂肪族炭化水素基であり、
R4及びR5は、それぞれ独立に、炭素数1~10の1価の有機基であって、R4及びR5のうちの少なくとも1つは、炭素数6~10の1価の芳香族基であり、
R6及びR7は、それぞれ独立に、炭素数1~10の1価の有機基であって、R6及びR7のうちの少なくとも1つは、炭素数2~10の不飽和脂肪族炭化水素基を含む有機基であり、
L1及びL2は、それぞれ独立に、酸無水物構造を含む1価の有機基、アミノ基、イソシアネート基、カルボキシル基、アルコキシカルボニル基、ハロゲン化カルボニル基、ヒドロキシ基、エポキシ基、又はメルカプト基であり、
i及びjは、それぞれ独立に、1~200の整数であり、
kは、0~200の整数であり、そして、
0.05≦j/(i+j+k)≦0.50の関係を満たす。}で表される化合物が挙げられる。 Such a silicon-containing compound is, for example, the following formula (5) :.
R 1 is an independently single-bonded or divalent organic group having 1 to 10 carbon atoms.
R 2 and R 3 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 2 and R 3 is a monovalent aliphatic group having 1 to 5 carbon atoms. It is a hydrocarbon group and
R 4 and R 5 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 4 and R 5 is a monovalent aromatic group having 6 to 10 carbon atoms. Is the basis and
R 6 and R 7 are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one of R 6 and R 7 is an unsaturated aliphatic hydrocarbon having 2 to 10 carbon atoms. It is an organic group containing a hydrogen group.
L 1 and L 2 are each independently a monovalent organic group containing an acid anhydride structure, an amino group, an isocyanate group, a carboxyl group, an alkoxycarbonyl group, a halogenated carbonyl group, a hydroxy group, an epoxy group, or a mercapto group. And
i and j are independently integers from 1 to 200, respectively.
k is an integer from 0 to 200, and
The relationship of 0.05 ≦ j / (i + j + k) ≦ 0.50 is satisfied. } Can be mentioned.
炭素数1~10の1価の有機基は、直鎖状、環状、分枝状のいずれでもよく、飽和していても不飽和であってもよい。例えば、炭素数1~10の1価の有機基としては、メチル基、エチル基、n-プロピル基i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、ネオペンチル基、n-ヘキシル基、n-ヘプチル基、n-オクチル基、n-ノニル基、n-デシル基等の直鎖又は分岐鎖アルキル基;シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基等のシクロアルキル基;フェニル基、トリル基、キシリル基、α-ナフチル基、β-ナフチル基等の芳香族基等が挙げられる。
炭素数1~5の1価の脂肪族炭化水素基は、直鎖状、環状、分枝状のいずれでもよく、飽和していても不飽和であってもよい。例えば、炭素数1~5の1価の脂肪族炭化水素基としては、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、ネオペンチル基等の直鎖または分岐鎖アルキル基;シクロプロピル基、シクロブチル基、シクロペンチル基等のシクロアルキル基等が挙げられる。炭素数1~5の1価の脂肪族炭化水素基としては、メチル基、エチル基、及びn-プロピル基からなる群から選択される少なくとも1種であることが好ましい。 R 2 and R 3 in the formula (5) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is a monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms.
The monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated. For example, the monovalent organic group having 1 to 10 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group, and an n-pentyl group. , Neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and other linear or branched alkyl groups; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group. , Cycloalkyl group such as cycloheptyl group, cyclooctyl group; aromatic group such as phenyl group, tolyl group, xsilyl group, α-naphthyl group, β-naphthyl group and the like.
The monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms may be linear, cyclic or branched, and may be saturated or unsaturated. For example, the monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms includes a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, and a t-butyl group. Linear or branched alkyl groups such as n-pentyl group and neopentyl group; cycloalkyl groups such as cyclopropyl group, cyclobutyl group and cyclopentyl group can be mentioned. The monovalent aliphatic hydrocarbon group having 1 to 5 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and an n-propyl group.
不飽和脂肪族炭化水素基を有する有機基は、炭素数3~10の不飽和脂肪族炭化水素基であってよく、直鎖状、環状、分枝状のいずれでもよい。炭素数3~10の不飽和脂肪族炭化水素基としては、例えば、ビニル基、アリル基、1-プロペニル基、3-ブテニル基、2-ブテニル基、ペンテニル基、シクロペンテニル基、ヘキセニル基、シクロヘキセニル基、ヘプテニル基、オクテニル基、ノネニル基、デセニル基、エチニル基、プロピニル基、ブチニル基、ペンチニル基、ヘキシニル基等が挙げられる。炭素数3~10の不飽和脂肪族炭化水素基としては、ビニル基、アリル基、及び3-ブテニル基から成る群から選択される少なくとも1種であることが好ましい。 R 6 and R 7 in the formula (5) are independently monovalent organic groups having 1 to 10 carbon atoms, and at least one is an organic group having an unsaturated aliphatic hydrocarbon group. The monovalent organic group having 1 to 10 carbon atoms may be linear, cyclic or branched. Examples of the monovalent organic group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an s-butyl group, a t-butyl group and an n-pentyl group. Linear or branched alkyl group such as group, neopentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl. Cycloalkyl groups such as groups, cycloheptyl groups and cyclooctyl groups; aromatic groups such as phenyl group, trill group, xylyl group, α-naphthyl group and β-naphthyl group can be mentioned. The monovalent organic group having 1 to 10 carbon atoms is preferably at least one selected from the group consisting of a methyl group, an ethyl group, and a group phenyl.
The organic group having an unsaturated aliphatic hydrocarbon group may be an unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms, and may be linear, cyclic or branched. Examples of the unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms include a vinyl group, an allyl group, a 1-propenyl group, a 3-butenyl group, a 2-butenyl group, a pentenyl group, a cyclopentenyl group, a hexenyl group and a cyclo. Examples thereof include a hexenyl group, a heptenyl group, an octenyl group, a nonenyl group, a decenyl group, an ethynyl group, a propynyl group, a butynyl group, a pentynyl group and a hexynyl group. The unsaturated aliphatic hydrocarbon group having 3 to 10 carbon atoms is preferably at least one selected from the group consisting of a vinyl group, an allyl group, and a 3-butenyl group.
ハロゲン化カルボニル基におけるハロゲン原子は、フッ素原子以外のハロゲン原子が好ましく、より好ましくは、塩素原子又はヨウ素原子である。 The alkoxyl group in the alkoxycarbonyl group may be an alkoxyl group having 1 to 6 carbon atoms, for example, a methoxyl group, an ethoxyl group, an n-propoxyl group, an i-propoxyl group, an n-butoxyl group, or an i-butoxyl group. , T-butoxyl group and the like.
The halogen atom in the halogenated carbonyl group is preferably a halogen atom other than a fluorine atom, and more preferably a chlorine atom or an iodine atom.
本発明の第一の態様と第二の態様に共通する構成要素、及び本発明の好ましい実施形態について以下に説明する。なお、第一の態様と第二の態様の構成要素は、互換したり、組み合わせたりしてよい。 [Components common to the first and second aspects and preferred embodiments]
The components common to the first aspect and the second aspect of the present invention, and preferred embodiments of the present invention will be described below. The components of the first aspect and the second aspect may be compatible or combined.
モノマーの種類、コストの観点、および得られるポリイミド前駆体の分子量の観点から、上記で説明された一般式(5)又は(10)のケイ素含有化合物は、ケイ素含有ジアミンであることが好ましい。ケイ素含有ジアミンとしては、例えば、下記式(11):
で表されるジアミノ(ポリ)シロキサンが好ましい。 <Silicon-containing diamine>
From the viewpoint of the type of monomer, the cost, and the molecular weight of the obtained polyimide precursor, the silicon-containing compound of the general formula (5) or (10) described above is preferably a silicon-containing diamine. Examples of the silicon-containing diamine include the following formula (11):
The diamino (poly) siloxane represented by is preferable.
樹脂組成物は典型的に溶媒を含む。溶媒としては、ポリイミド/ポリイミド前駆体の溶解性が良好で、かつ樹脂組成物の溶液粘度を適切に制御できるものが好ましく、ポリイミド前駆体の反応溶媒を、組成物の溶媒として用いることができる。その中でも、N-メチル-2-ピロリドン(NMP)、γ-ブチロラクトン(GBL)、第一の態様に係る上記一般式(9)で表される化合物、第二の態様に係る上記一般式(4)で表される化合物等が好ましい。溶媒組成の具体例としては、N-メチル-2-ピロリドン(NMP)単独、又はN-メチル-2-ピロリドン(NMP)とγ-ブチロラクトン(GBL)との混合溶媒等が挙げられる。NMPとGBLとの質量比は、例えば、NMP:GBL(質量比)=10:90~90:10であってよい。 <solvent>
The resin composition typically contains a solvent. As the solvent, those having good solubility of the polyimide / polyimide precursor and capable of appropriately controlling the solution viscosity of the resin composition are preferable, and the reaction solvent of the polyimide precursor can be used as the solvent of the composition. Among them, N-methyl-2-pyrrolidone (NMP), γ-butyrolactone (GBL), the compound represented by the above general formula (9) according to the first aspect, and the above general formula (4) according to the second aspect. ) And the like are preferable. Specific examples of the solvent composition include N-methyl-2-pyrrolidone (NMP) alone, or a mixed solvent of N-methyl-2-pyrrolidone (NMP) and γ-butyrolactone (GBL). The mass ratio of NMP to GBL may be, for example, NMP: GBL (mass ratio) = 10: 90 to 90:10.
本実施形態の樹脂組成物は、ポリイミド/ポリイミド前駆体、低分子環状シロキサン、及び溶媒に加えて、追加の成分を更に含んでもよい。追加の成分としては、例えば、界面活性剤、及びアルコキシシラン化合物等が挙げられる。 <Additional ingredients>
The resin composition of this embodiment may further contain additional components in addition to the polyimide / polyimide precursor, small molecule cyclic siloxane, and solvent. Additional components include, for example, surfactants, alkoxysilane compounds and the like.
本実施形態の樹脂組成物に界面活性剤を添加することによって、樹脂組成物の塗布性を向上することができる。具体的には、塗工膜におけるスジの発生を防ぐことができる。 Surfactant By adding a surfactant to the resin composition of the present embodiment, the coatability of the resin composition can be improved. Specifically, it is possible to prevent the occurrence of streaks in the coating film.
本実施形態の樹脂組成物から得られるポリイミドフィルムをフレキシブル基板等に用いる場合、製造プロセスにおける支持体とポリイミドフィルムとの良好な密着性を得る観点から、樹脂組成物は、ポリイミド前駆体100質量部に対して、アルコキシシラン化合物を0.01~20質量部含有することができる。ポリイミド前駆体100質量部に対するアルコキシシラン化合物の含有量が0.01質量部以上であることにより、支持体とポリイミドフィルムとの間に良好な密着性を得ることができる。またアルコキシシラン化合物の含有量が20質量部以下であることが、樹脂組成物の保存安定性の観点から好ましい。アルコキシシラン化合物の含有量は、ポリイミド前駆体100質量部に対して、好ましくは0.02~15質量部、より好ましくは0.05~10質量部、更に好ましくは0.1~8質量部である。アルコキシシラン化合物を用いることにより、上記の密着性の向上に加えて、樹脂組成物の塗工性が向上し(スジムラ抑制)、及びキュア時の酸素濃度によるポリイミドフィルムのYI値への影響を低減することもできる。 Aalkoxysilane compound When the polyimide film obtained from the resin composition of the present embodiment is used for a flexible substrate or the like, the resin composition is a polyimide precursor from the viewpoint of obtaining good adhesion between the support and the polyimide film in the manufacturing process. 0.01 to 20 parts by mass of the alkoxysilane compound can be contained with respect to 100 parts by mass. When the content of the alkoxysilane compound with respect to 100 parts by mass of the polyimide precursor is 0.01 parts by mass or more, good adhesion between the support and the polyimide film can be obtained. Further, it is preferable that the content of the alkoxysilane compound is 20 parts by mass or less from the viewpoint of storage stability of the resin composition. The content of the alkoxysilane compound is preferably 0.02 to 15 parts by mass, more preferably 0.05 to 10 parts by mass, and further preferably 0.1 to 8 parts by mass with respect to 100 parts by mass of the polyimide precursor. be. By using the alkoxysilane compound, in addition to the above-mentioned improvement of the adhesion, the coatability of the resin composition is improved (sujimura suppression), and the influence of the oxygen concentration at the time of curing on the YI value of the polyimide film is reduced. You can also do it.
本実施形態における樹脂組成物の製造方法は、特に限定されるものではなく、例えば、以下の方法によることができる。 << Manufacturing method of resin composition >>
The method for producing the resin composition in the present embodiment is not particularly limited, and for example, the following method can be used.
本実施形態の樹脂組成物は、酸二無水物、ジアミン、及びケイ素含有化合物を含む重縮合成分を重縮合反応させることにより製造することができる。本実施形態の樹脂組成物中に含まれる、環状のケイ素含有化合物の総量を低減する方法としては、例えば、重縮合反応の前に、ケイ素含有化合物を精製して、環状のケイ素含有化合物の総量を低減することが挙げられる。あるいは、重縮合反応の後に、樹脂組成物を精製して、環状のケイ素含有化合物の総量を低減してもよい。 <Purification of silicon-containing compounds>
The resin composition of the present embodiment can be produced by subjecting a polycondensation component containing an acid dianhydride, a diamine, and a silicon-containing compound to a polycondensation reaction. As a method for reducing the total amount of the cyclic silicon-containing compound contained in the resin composition of the present embodiment, for example, the silicon-containing compound is purified before the polycondensation reaction to obtain the total amount of the cyclic silicon-containing compound. Is mentioned. Alternatively, after the polycondensation reaction, the resin composition may be purified to reduce the total amount of cyclic silicon-containing compounds.
本実施形態のポリイミド前駆体は、酸二無水物、ジアミン、及びケイ素含有化合物を含む重縮合成分を重縮合反応させることにより合成することができる。 <Synthesis of polyimide / polyimide precursor>
The polyimide precursor of the present embodiment can be synthesized by subjecting a polycondensation component containing an acid dianhydride, a diamine, and a silicon-containing compound to a polycondensation reaction.
・上記で説明された一般式(8)で表される化合物又は一般式(9)で表される化合物と、一般式(10)で表されるケイ素含有化合物とを重縮合反応させてポリイミドを得た後、その他の化合物とを重縮合反応させてポリイミド前駆体及びポリイミドを含む樹脂組成物を提供する工程;
・上記で説明されたジアミン又は酸二無水物と、一般式(10)で表されるケイ素含有化合物とを重縮合反応させてポリイミドを得た後、その他の化合物とを重縮合反応させてポリイミド前駆体及びポリイミドを含む樹脂組成物を提供する工程
を含む樹脂組成物の製造方法が提供される。 In connection with the synthesis of the polyimide / polyimide precursor according to the first aspect, for example, one of the following steps:
-The compound represented by the general formula (8) or the compound represented by the general formula (9) described above is subjected to a polycondensation reaction with the silicon-containing compound represented by the general formula (10) to form a polyimide. After obtaining, a step of polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and polyimide;
-The diamine or acid dianhydride described above and the silicon-containing compound represented by the general formula (10) are polycondensed to obtain a polyimide, and then other compounds are polycondensed to obtain the polyimide. Provided is a method for producing a resin composition, which comprises a step of providing a resin composition containing a precursor and a polyimide.
・上記で説明された一般式(3)で表される化合物と、一般式(4)で表される化合物と、一般式(5)で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミド前駆体又はポリイミドを含む樹脂組成物を提供する工程;
・上記で説明された一般式(3)で表される化合物とその他の化合物と、一般式(4)で表される化合物とその他の化合物とを重縮合反応させてポリイミドを得た後、上記で説明された一般式(5)で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミド前駆体及びポリイミドを含む樹脂組成物を提供する工程;又は
・上記で説明されたジアミンと酸二無水物とを重縮合反応させてポリイミドを得た後、一般式(5)で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミド前駆体及びポリイミドを含む樹脂組成物を提供する工程;
を含む樹脂組成物の製造方法が提供される。 In connection with the synthesis of the polyimide / polyimide precursor according to the second aspect, for example, one of the following steps:
-The compound represented by the general formula (3) described above, the compound represented by the general formula (4), the silicon-containing compound represented by the general formula (5), and other compounds are weighted. A step of subjecting a condensation reaction to provide a polyimide precursor or a resin composition containing a polyimide;
-After subjecting the compound represented by the general formula (3) and other compounds described above to a polycondensation reaction with the compound represented by the general formula (4) and other compounds to obtain polyimide, the above. A step of polycondensing the silicon-containing compound represented by the general formula (5) described in (5) with another compound to provide a resin composition containing a polyimide precursor and a polyimide; or-described above. After a polycondensation reaction of diamine and acid dianhydride to obtain a polyimide, a silicon-containing compound represented by the general formula (5) and another compound are subjected to a polycondensation reaction to contain a polyimide precursor and a polyimide. Step of providing the resin composition;
A method for producing a resin composition containing the above is provided.
より好ましい様態としては、ポリイミドワニスは、酸二無水物成分及びジアミン成分を、溶媒、例えば有機溶媒に溶解し、トルエンなどの共沸溶媒を加え、イミド化の際に発生する水を系外に除去することでポリイミド及び溶媒を含有するポリイミド溶液(ポリイミドワニスとも言う)として製造することが出来る。ここで、反応時の条件は特に限定されないが、例えば、反応温度は0℃~180℃、反応時間は3~72時間である。スルホン基含有ジアミン類との反応を充分に進めるために、180℃で12時間程度加熱反応させることが好ましい。また、反応時、アルゴンや窒素などの不活性雰囲気であることが好ましい。 <Synthesis of polyimide>
In a more preferable mode, the polyimide varnish dissolves an acid dianhydride component and a diamine component in a solvent, for example, an organic solvent, adds a co-boiling solvent such as toluene, and removes water generated during imidization to the outside of the system. By removing it, it can be produced as a polyimide solution (also referred to as polyimide varnish) containing polyimide and a solvent. Here, the conditions at the time of reaction are not particularly limited, but for example, the reaction temperature is 0 ° C. to 180 ° C. and the reaction time is 3 to 72 hours. In order to sufficiently proceed with the reaction with the sulfone group-containing diamines, it is preferable to carry out a heating reaction at 180 ° C. for about 12 hours. Further, during the reaction, it is preferable that the atmosphere is an inert atmosphere such as argon or nitrogen.
ポリイミド前駆体を合成した際に用いた溶媒と、樹脂組成物に含有させる溶媒とが同一の場合には、合成したポリイミド/ポリイミド前駆体溶液をそのまま樹脂組成物として使用することができる。必要に応じて、室温(25℃)~80℃の温度範囲で、ポリイミド前駆体に更なる溶媒及び追加の成分の1種以上を添加して、攪拌混合することにより、樹脂組成物を調製してもよい。この攪拌混合は、撹拌翼を備えたスリーワンモータ(新東化学株式会社製)、自転公転ミキサー等の適宜の装置を用いて行うことができる。必要に応じて樹脂組成物を40℃~100℃に加熱してもよい。 <Preparation of resin composition>
When the solvent used when synthesizing the polyimide precursor and the solvent contained in the resin composition are the same, the synthesized polyimide / polyimide precursor solution can be used as it is as the resin composition. If necessary, a resin composition is prepared by adding one or more of a further solvent and an additional component to the polyimide precursor and stirring and mixing them in a temperature range of room temperature (25 ° C.) to 80 ° C. You may. This stirring and mixing can be performed by using an appropriate device such as a three-one motor (manufactured by Shinto Chemical Co., Ltd.) equipped with a stirring blade, a rotation / revolution mixer, and the like. If necessary, the resin composition may be heated to 40 ° C to 100 ° C.
本実施形態の樹脂組成物を用いて、ポリイミドフィルム(以下、ポリイミド樹脂膜ともいう)を提供することができる。本実施形態のポリイミドフィルムの製造方法は、支持体の表面上に、本実施形態の樹脂組成物を塗布する塗布工程と;上記樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と;上記ポリイミド樹脂膜を上記支持体から剥離する剥離工程とを含む。 << Polyimide film and its manufacturing method >>
A polyimide film (hereinafter, also referred to as a polyimide resin film) can be provided by using the resin composition of the present embodiment. The method for producing the polyimide film of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. Includes a peeling step of peeling the polyimide resin film from the support.
塗布工程では、支持体の表面上に本実施形態の樹脂組成物を塗布する。支持体は、その後の膜形成工程(加熱工程)における加熱温度に対する耐熱性を有し、かつ剥離工程における剥離性が良好であれば特に限定されない。支持体としては、例えば、ガラス基板、例えば無アルカリガラス基板;シリコンウェハー;PET(ポリエチレンテレフタレート)、OPP(延伸ポリプロピレン)、ポリエチレングリコールテレフタレート、ポリエチレングリコールナフタレート、ポリカーボネート、ポリイミド、ポリアミドイミド、ポリエーテルイミド、ポリエーテルエーテルケトン、ポリエーテルスルホン、ポリフェニレンスルホン、ポリフェニレンスルフィド等の樹脂基板;ステンレス、アルミナ、銅、ニッケル等の金属基板等が挙げられる。 <Applying process>
In the coating step, the resin composition of the present embodiment is coated on the surface of the support. The support is not particularly limited as long as it has heat resistance to the heating temperature in the subsequent film forming step (heating step) and has good peelability in the peeling step. Examples of the support include a glass substrate, for example, a non-alkali glass substrate; a silicon wafer; PET (polyethylene terephthalate), OPP (stretched polypropylene), polyethylene glycol terephthalate, polyethylene glycol naphthalate, polycarbonate, polyimide, polyamideimide, and polyetherimide. , Resin substrates such as polyetheretherketone, polyethersulfone, polyphenylene sulfone, and polyphenylene sulfide; metal substrates such as stainless steel, alumina, copper, and nickel can be mentioned.
塗布工程に続いて乾燥工程を行ってもよく、又は乾燥工程を省略して直接次の膜形成工程(加熱工程)に進んでもよい。乾燥工程は、樹脂組成物中の有機溶剤除去の目的で行われる。乾燥工程を行う場合、例えば、ホットプレート、箱型乾燥機、コンベヤー型乾燥機等の適宜の装置を使用することができる。乾燥工程の温度は、好ましくは80~200℃、より好ましくは100~150℃である。乾燥工程の実施時間は、好ましくは1分~10時間、より好ましくは3分~1時間である。上記のようにして、支持体上にポリイミド前駆体を含有する塗膜が形成される。 <Arbitrary drying process>
The drying step may be performed after the coating step, or the drying step may be omitted and the process may be directly proceeded to the next film forming step (heating step). The drying step is performed for the purpose of removing the organic solvent in the resin composition. When performing the drying step, for example, an appropriate device such as a hot plate, a box-type dryer, or a conveyor-type dryer can be used. The temperature of the drying step is preferably 80 to 200 ° C, more preferably 100 to 150 ° C. The implementation time of the drying step is preferably 1 minute to 10 hours, more preferably 3 minutes to 1 hour. As described above, a coating film containing the polyimide precursor is formed on the support.
続いて、膜形成工程(加熱工程)を行う。加熱工程は、上記の塗膜中に含まれる有機溶剤の除去を行うとともに、塗膜中のポリイミド前駆体のイミド化反応を進行させ、ポリイミド樹脂膜を得る工程である。この加熱工程は、例えば、イナートガスオーブン、ホットプレート、箱型乾燥機、コンベヤー型乾燥機等の装置を用いて行うことができる。この工程は乾燥工程と同時に行っても、両工程を逐次的に行なってもよい。 <Membrane formation process>
Subsequently, a film forming step (heating step) is performed. The heating step is a step of removing the organic solvent contained in the coating film and advancing the imidization reaction of the polyimide precursor in the coating film to obtain a polyimide resin film. This heating step can be performed using, for example, an apparatus such as an inert gas oven, a hot plate, a box-type dryer, and a conveyor-type dryer. This step may be carried out at the same time as the drying step, or both steps may be carried out sequentially.
剥離工程では、支持体上のポリイミド樹脂膜を、例えば室温(25℃)~50℃程度まで冷却した後に剥離する。この剥離工程としては、例えば下記の(1)~(4)の態様が挙げられる。 <Peeling process>
In the peeling step, the polyimide resin film on the support is cooled to, for example, room temperature (25 ° C.) to about 50 ° C. and then peeled off. Examples of the peeling step include the following aspects (1) to (4).
この方法(2)と方法(1)のレーザー照射とを併用してもよい。 (2) A method in which a release layer is formed on a support before the resin composition is applied to the support, and then a structure including a polyimide resin film / release layer / support is obtained and the polyimide resin film is peeled off. .. Examples of the release layer include parylene (registered trademark, manufactured by Japan Parylene LLC) and tungsten oxide; a release agent such as vegetable oil-based, silicone-based, fluorine-based, and alkyd-based may be used (Japanese Patent Laid-Open No. 2010-067957). No., Japanese Patent Application Laid-Open No. 2013-179306, etc.).
This method (2) and the laser irradiation of the method (1) may be used in combination.
本実施形態の樹脂組成物から得られるポリイミドフィルムは、例えば、半導体絶縁膜、薄膜トランジスタ液晶ディスプレイ(TFT-LCD)絶縁膜、電極保護膜として、また、液晶ディスプレイ、有機エレクトロルミネッセンスディスプレイ、フィールドエミッションディスプレイ、電子ペーパー等の表示装置の透明基板等として適用できる。特に、本実施形態の樹脂組成物から得られるポリイミドフィルムは、フレキシブルデバイスの製造において、薄膜トランジスタ(TFT)基板、カラーフィルタ基板、タッチパネル基板、透明導電膜(ITO、Indium Thin Oxide)の基板として好適に使用することができる。本実施形態におけるポリイミドフィルムを適用可能なフレキシブルデバイスとしては、例えば、フレキシブルディスプレイ用TFTデバイス、フレキシブル太陽電池、フレキシブルタッチパネル、フレキシブル照明、フレキシブルバッテリー、フレキシブルプリント基板、フレキシブルカラーフィルター、スマートフォン向け表面カバーレンズ等を挙げることができる。 << Applications of polyimide film >>
The polyimide film obtained from the resin composition of the present embodiment can be used as, for example, a semiconductor insulating film, a thin film transistor liquid crystal display (TFT-LCD) insulating film, an electrode protective film, a liquid crystal display, an organic electroluminescence display, a field emission display, or the like. It can be applied as a transparent substrate of a display device such as electronic paper. In particular, the polyimide film obtained from the resin composition of the present embodiment is suitable as a substrate for a thin film transistor (TFT) substrate, a color filter substrate, a touch panel substrate, and a transparent conductive film (ITO, Indium Thin Oxide) in the manufacture of a flexible device. Can be used. Examples of the flexible device to which the polyimide film in this embodiment can be applied include a TFT device for a flexible display, a flexible solar cell, a flexible touch panel, a flexible lighting, a flexible battery, a flexible printed substrate, a flexible color filter, a surface cover lens for a smartphone, and the like. Can be mentioned.
本実施形態のディスプレイの製造方法は、支持体の表面上に、本実施形態の樹脂組成物を塗布する塗布工程と;上記樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と;上記ポリイミド樹脂膜上に素子を形成する素子形成工程と;上記素子が形成された上記ポリイミド樹脂膜を上記支持体から剥離する剥離工程とを含む。 <Manufacturing method of display>
The method for manufacturing the display of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. It includes an element forming step of forming an element on the polyimide resin film; and a peeling step of peeling the polyimide resin film on which the element is formed from the support.
図1は、本実施形態のディスプレイの例として、トップエミッション型フレキシブル有機ELディスプレイのポリイミド基板より上部の構造を示す模式図である。図1の有機EL構造部25について説明する。例えば、赤色光を発光する有機EL素子250aと、緑色光を発光する有機EL素子250bと、青色光を発光する有機EL素子250cと1単位として、マトリクス状に配列されており、隔壁(バンク)251により、各有機EL素子の発光領域が画定されている。各有機EL素子は、下部電極(陽極)252、正孔輸送層253、発光層254、上部電極(陰極)255から構成されている。窒化ケイ素(SiN)や酸化ケイ素(SiO)からなるCVD複層膜(マルチバリヤーレイヤー)を示す下部層2a上には、有機EL素子を駆動するためのTFT256(低温ポリシリコン(LTPS)や金属酸化物半導体(IGZO等)から選択される)、コンタクトホール257を備えた層間絶縁膜258、及び下部電極259が複数設けられている。有機EL素子は封止基板2bで封入されており、各有機EL素子と封止基板2bとの間に中空部261が形成されている。 Manufacturing Example of Flexible Organic EL Display FIG. 1 is a schematic view showing a structure above a polyimide substrate of a top emission type flexible organic EL display as an example of the display of the present embodiment. The organic
本実施形態のポリイミドフィルムを使用してフレキシブル液晶ディスプレイを作製することができる。具体的な作製方法としては、上記の方法でガラス基板支持体上にポリイミドフィルムを作製し、上記の方法を用いて、例えばアモルファスシリコン、金属酸化物半導体(IGZO等)、及び低温ポリシリコンからなるTFT基板を作製する。別途、本実施形態の塗布工程及び膜形成工程に従って、ガラス基板支持体上にポリイミドフィルムを作製し、公知の方法に従ってカラーレジスト等を使用して、ポリイミドフィルムを備えたカラーフィルターガラス基板(CF基板)を作製する。TFT基板およびCF基板の一方に、スクリーン印刷により、熱硬化性エポキシ樹脂などからなるシール材料を液晶注入口の部分を欠いた枠状パターンに塗布し、他方の基板に液晶層の厚さに相当する直径を持ち、プラスチックまたはシリカからなる球状のスペーサーを散布する。 Manufacturing Example of Flexible Liquid Crystal Display A flexible liquid crystal display can be manufactured using the polyimide film of the present embodiment. As a specific production method, a polyimide film is produced on a glass substrate support by the above method, and the above method is used, for example, composed of amorphous silicon, a metal oxide semiconductor (IGZO, etc.), and low-temperature polysilicon. A TFT substrate is manufactured. Separately, a polyimide film is produced on a glass substrate support according to the coating step and the film forming step of the present embodiment, and a color resist or the like is used according to a known method to provide a color filter glass substrate (CF substrate) with the polyimide film. ) Is prepared. A sealing material made of thermosetting epoxy resin or the like is applied to one of the TFT substrate and the CF substrate by screen printing to a frame-shaped pattern lacking the liquid crystal injection port portion, and the other substrate corresponds to the thickness of the liquid crystal layer. A spherical spacer made of plastic or silica is sprayed.
本実施形態の積層体の製造方法は、支持体の表面上に、本実施形態の樹脂組成物を塗布する塗布工程と;上記樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と;上記ポリイミド樹脂膜上に素子を形成する素子形成工程とを含む。 <Manufacturing method of laminated body>
The method for producing the laminate of the present embodiment includes a coating step of applying the resin composition of the present embodiment on the surface of the support; and a film forming step of heating the resin composition to form a polyimide resin film. Includes an element forming step of forming an element on the polyimide resin film.
《測定及び評価方法》
〈重量平均分子量〉
重量平均分子量(Mw)及び数平均分子量(Mn)は、ゲルパーミエ-ションクロマトグラフィー(GPC)にて、下記の条件により測定した。
溶媒として、NMP(和光純薬工業社製、高速液体クロマトグラフ用、測定直前に24.8mmol/Lの臭化リチウム一水和物(和光純薬工業社製、純度99.5%)及び63.2mmol/Lのリン酸(和光純薬工業社製、高速液体クロマトグラフ用)を加えて溶解したもの)を使用した。重量平均分子量を算出するための検量線は、スタンダ-ドポリスチレン(東ソ-社製)を用いて作製した。
カラム:Shodex KD-806M(昭和電工社製)
流速:1.0mL/分
カラム温度:40℃
ポンプ:PU-2080Plus(JASCO社製)
検出器:RI-2031Plus(RI:示差屈折計、JASCO社製)及びUV-2075Plus(UV-VIS:紫外可視吸光計、JASCO社製) [First aspect]
<< Measurement and evaluation method >>
<Weight average molecular weight>
The weight average molecular weight (Mw) and the number average molecular weight (Mn) were measured by gel permeation chromatography (GPC) under the following conditions.
As solvents, NMP (manufactured by Wako Pure Chemical Industries, Ltd., for high performance liquid chromatograph, 24.8 mmol / L lithium bromide monohydrate (manufactured by Wako Pure Chemical Industries, Ltd., purity 99.5%) immediately before measurement) and 63. .2 mmol / L phosphoric acid (manufactured by Wako Pure Chemical Industries, Ltd., for high performance liquid chromatograph) was added and dissolved) was used. The calibration curve for calculating the weight average molecular weight was prepared using standard polystyrene (manufactured by Toso Co., Ltd.).
Column: Shodex KD-806M (manufactured by Showa Denko KK)
Flow rate: 1.0 mL / min Column temperature: 40 ° C
Pump: PU-2080Plus (manufactured by JASCO)
Detector: RI-2031Plus (RI: differential refractometer, manufactured by JASCO) and UV-2075Plus (UV-VIS: ultraviolet-visible absorptiometer, manufactured by JASCO)
実施例、及び比較例において調製した樹脂組成物を23℃、50%RHの雰囲気下で24時間放置し、樹脂組成物の初期(0日)の粘度を、温調機付粘度計(東機産業械社製VISCOMATER TVE-35H)を用いて測定した。そして、樹脂組成物を23℃、50%RHの雰囲気下で10日間放置し、初期と同様にして、10日後の粘度を測定した。続いて、下記式で表される粘度安定性を算出した。
粘度安定性(%/day)=|(初期の粘度(mPa・s))―(10日後の粘度(mPa・s))|/(初期粘度(mPa・s))*100/10(day)
粘度安定性は下記基準で評価を行った。
A:粘度安定性2%/day以下 「優良」
B:粘度安定性4%/day超7%/day以下 「良」
C:粘度安定性6%/day超10%/day以下 「可」
D:粘度安定性8%/day超 「可」 <Evaluation of viscosity stability of composition (varnish)>
The resin compositions prepared in Examples and Comparative Examples were left to stand in an atmosphere of 23 ° C. and 50% RH for 24 hours, and the initial (0 day) viscosity of the resin composition was measured by a viscometer with a temperature controller (Toki). It was measured using VISCOMATER TVE-35H) manufactured by Sangyo Kikai. Then, the resin composition was left to stand in an atmosphere of 23 ° C. and 50% RH for 10 days, and the viscosity after 10 days was measured in the same manner as in the initial stage. Subsequently, the viscosity stability represented by the following formula was calculated.
Viscosity stability (% / day) = | (initial viscosity (mPa · s))-(viscosity after 10 days (mPa · s)) | / (initial viscosity (mPa · s)) * 100/10 (day)
Viscosity stability was evaluated according to the following criteria.
A: Viscosity stability 2% / day or less "excellent"
B: Viscosity stability 4% / day over 7% / day or less "Good"
C: Viscosity stability 6% / day more than 10% / day or less "OK"
D: Viscosity stability 8% / day over "OK"
実施例、及び比較例において調製した樹脂組成物を23℃、50%RHの雰囲気下で、サイズ900mmφ、目付0.2μmのポリエチレン製のメンブレンフィルターを用いて、0.25MPaの圧力で加圧ろ過を行った。この時のろ過された樹脂組成物の質量を測定し、ろ過速度を計算した。ろ過性は下記基準で評価を行った。
A:ろ過速度1700g/hr以上 「優」
B:ろ過速度1700g/hr未満1500g/hr以上 「良」
C:ろ過速度1500g/hr未満500g/hr以上 「可」
D:ろ過速度500g/hr未満 「不可」 <Evaluation of the filterability of the composition (varnish)>
The resin compositions prepared in Examples and Comparative Examples were pressure-filtered at a pressure of 0.25 MPa at 23 ° C. and 50% RH using a polyethylene membrane filter having a size of 900 mmφ and a basis weight of 0.2 μm. Was done. The mass of the filtered resin composition at this time was measured, and the filtration rate was calculated. The filterability was evaluated according to the following criteria.
A: Filtration speed of 1700 g / hr or more "excellent"
B: Filtration rate less than 1700 g / hr 1500 g / hr or more "Good"
C: Filtration rate less than 1500 g / hr 500 g / hr or more "OK"
D: Filtration rate less than 500 g / hr "impossible"
支持体として、表面にアルミニウム蒸着層を設けた6インチシリコンウェハー基板を用い、そのアルミニウム蒸着層の面上に、実施例及び比較例において調製した樹脂組成物を、ポリイミド樹脂膜の膜厚が10μmになるようにスピンコートして、塗膜を形成した。この塗膜を、100℃、6分間プリベークした後、庫内の酸素濃度が10質量ppm以下に調整された縦型キュア炉(光洋サーモシステム(株)製、型式名「VF-2000B」)を用いて、400℃にて1時間加熱し、ウェハー上にポリイミドフィルムを形成した。続いて、ダイシングソー((株)ディスコ製、品名「DAD 3350」)を用いて、得られたポリイミドフィルムに3mm幅の切れ目を入れた後、ポリイミドフィルム付きウェハーを、希塩酸水溶液に一晩浸して、ポリイミドフィルム片を剥離して、乾燥させて、幅3mmのポリイミド片を得た。これを長さ50mmにカットして、幅3mm、長さ50mmのポリイミド測定試料を得た。TENSILON((株)オリエンテック社製、型式名「UTM-II-20」)を用いて、試験速度40mm/分、初期加重0.5fsにて、ポリイミド樹脂膜の引張伸度を測定した。引張伸度は下記基準で評価を行った。
A:引張伸度が40%超 「優良」
B:引張伸度が30%超40%以下 「良」
C:引張伸度が20%超30%以下 「可」
D:引張伸度が20%未満 「不可」 <Evaluation of tensile elongation of polyimide resin film>
A 6-inch silicon wafer substrate having an aluminum-deposited layer on its surface was used as a support, and the resin compositions prepared in Examples and Comparative Examples were placed on the surface of the aluminum-deposited layer, and the thickness of the polyimide resin film was 10 μm. A coating film was formed by spin coating so as to be. After prebaking this coating film at 100 ° C. for 6 minutes, a vertical curing furnace (manufactured by Koyo Thermo System Co., Ltd., model name "VF-2000B") in which the oxygen concentration in the refrigerator was adjusted to 10 mass ppm or less was used. It was heated at 400 ° C. for 1 hour to form a polyimide film on the wafer. Subsequently, a dicing saw (manufactured by Disco Co., Ltd., product name "DAD 3350") was used to make a 3 mm wide cut in the obtained polyimide film, and then the wafer with the polyimide film was immersed in a dilute hydrochloric acid aqueous solution overnight. , The polyimide film piece was peeled off and dried to obtain a polyimide piece having a width of 3 mm. This was cut into a length of 50 mm to obtain a polyimide measurement sample having a width of 3 mm and a length of 50 mm. Using TENSILON (manufactured by Orientec Co., Ltd., model name "UTM-II-20"), the tensile elongation of the polyimide resin film was measured at a test speed of 40 mm / min and an initial load of 0.5 fs. The tensile elongation was evaluated according to the following criteria.
A: Tensile elongation exceeds 40% "excellent"
B: Tensile elongation is more than 30% and 40% or less "Good"
C: Tensile elongation is more than 20% and 30% or less "OK"
D: Tensile elongation is less than 20% "impossible"
予め「反り量」を測定しておいた、厚み625μm±25μmの6インチシリコンウェハー上に、実施例及び比較例において調製した樹脂組成物をスピンコーターにより塗布し、100℃において7分間プリベークした。その後、縦型キュア炉(光洋リンドバーグ社製、型式名VF-2000B)を用いて、庫内の酸素濃度が10質量ppm以下になるように調整して、400℃において1時間の加熱硬化処理(キュア処理)を施し、硬化後膜厚10μmのポリイミド樹脂膜のついたシリコンウェハーを作製した。
このウェハーの反り量を、残留応力測定装置(テンコール社製、型式名FLX-2320)を用いて測定し、“窒素雰囲気下において”シリコンウェハーと樹脂膜との間に生じた残留応力を評価した。
A:残留応力が35MPa未満 「良」
B:残留応力が35MPa以上45MPa未満 「可」
C:残留応力が45MPa以上 「不可」 <Evaluation of residual stress of polyimide resin film>
The resin compositions prepared in Examples and Comparative Examples were applied on a 6-inch silicon wafer having a thickness of 625 μm ± 25 μm for which the “warp amount” had been measured in advance by a spin coater, and prebaked at 100 ° C. for 7 minutes. After that, using a vertical curing furnace (manufactured by Koyo Lindbergh Co., Ltd., model name VF-2000B), the oxygen concentration in the refrigerator was adjusted to 10% by mass or less, and heat curing treatment was performed at 400 ° C. for 1 hour. After curing, a silicon wafer with a polyimide resin film having a thickness of 10 μm was produced.
The amount of warpage of this wafer was measured using a residual stress measuring device (model name FLX-2320 manufactured by Tencor), and the residual stress generated between the silicon wafer and the resin film was evaluated "under a nitrogen atmosphere". ..
A: Residual stress is less than 35 MPa "Good"
B: Residual stress is 35 MPa or more and less than 45 MPa "Yes"
C: Residual stress is 45 MPa or more "impossible"
実施例/比較例の樹脂組成物の全樹脂の総質量におけるケイ素基含有化合物の割合(質量%)を下記の通り算出した。
ケイ素基含有化合物の割合(質量%)=ケイ素基含有化合物の質量(g)/各モノマー(酸二無水物モノマー、ジアミンモノマー、ケイ素基含有化合物)の質量の総量(g)*100 <Ratio of silicon-containing compounds in all resins>
The ratio (mass%) of the silicon group-containing compound to the total mass of the total resin of the resin composition of Example / Comparative Example was calculated as follows.
Ratio of silicon group-containing compound (mass%) = mass of silicon group-containing compound (g) / total mass of each monomer (acid dianhydride monomer, diamine monomer, silicon group-containing compound) (g) * 100
ワニスに水を適当量加え、80℃で3日間加熱処理を行い、酸成分とアミン成分とに解重合成分とを解重合させ、酸モノマーとアミンモノマーとする。その後、溶媒留去により酸モノマーとアミンモノマーが混ざった粉体を得て、アセトニトリル溶液を調製し、高速液体クロマトグラフィー質量分析(LC/MS)測定を行う。そして、各モノマーのピーク面積を求め、そのピーク面積比から算出することができる。 The ratio of the silicon group-containing compound can be determined by the following method using a varnish.
An appropriate amount of water is added to the varnish, and the mixture is heat-treated at 80 ° C. for 3 days to depolymerize the depolymerization component into the acid component and the amine component to obtain an acid monomer and an amine monomer. Then, the solvent is distilled off to obtain a powder in which an acid monomer and an amine monomer are mixed, an acetonitrile solution is prepared, and high performance liquid chromatography mass spectrometry (LC / MS) measurement is performed. Then, the peak area of each monomer can be obtained and calculated from the peak area ratio.
実施例/比較例の樹脂のイミド化率(%)を下記の通り算出した。
(一般式(10)のL1及びL2がアミノ基の場合)
イミド化率(%)=
イミド化工程のジアミンモノマー(一般式(10)のL1及びL2がアミノ基のケイ素含有化合物含む)の総モル数/{イミド化工程のジアミンモノマー(一般式(10)のL1及びL2がアミノ基のケイ素含有化合物含む)の総モル数+アミド化工程のジアミンモノマー(一般式(10)のL1及びL2がアミノ基のケイ素含有化合物含む)の総モル数}*100 <Imidization rate>
The imidization rate (%) of the resin of the example / comparative example was calculated as follows.
(When L 1 and L 2 of the general formula (10) are amino groups)
Imidization rate (%) =
Total number of moles of diamine monomers in the imidization step (including compounds containing silicon containing amino groups L 1 and L 2 in the general formula (10)) / {diamine monomers in the imidization step (L 1 and L in the general formula (10)) 2 is the total number of moles of the amino group silicon-containing compound) + the total number of moles of the diamine monomer in the amidation step (where L 1 and L 2 of the general formula (10) include the amino group silicon-containing compound)} * 100
イミド化工程のジアミンモノマー(一般式(10)のL1及びL2がアミノ基のケイ素含有化合物含む)の総モル数:93.6mmol
アミド化工程のジアミンモノマー(一般式(10)のL1及びL2がアミノ基のケイ素含有化合物含む)の総モル数:111.9mmol
であり、イミド化率は83.7%になる。 For example, in the case of Example I-1
Total number of moles of diamine monomer in the imidization step (including the silicon-containing compound in which L 1 and L 2 of the general formula (10) are amino groups): 93.6 mmol
Total number of moles of diamine monomer in the amidation step (including the silicon-containing compound in which L 1 and L 2 of the general formula (10) are amino groups): 111.9 mmol
The imidization rate is 83.7%.
イミド化率(%)=
イミド化工程の酸二無水物モノマー(一般式(10)のL1及びL2が酸無水物基のケイ素含有化合物含む)の総モル数/{イミド化工程の酸無水物モノマー(一般式(10)のL1及びL2が酸無水物基のケイ素含有化合物含む)の総モル数+アミド化工程の酸二無水物モノマー(一般式(10)のL1及びL2が酸無水物基のケイ素含有化合物含む)の総モル数}*100 (When L 1 and L 2 of the general formula (10) are acid anhydride groups)
Imidization rate (%) =
Total number of moles of acid dianhydride monomer in the imidization step (where L 1 and L 2 in the general formula (10) include the silicon-containing compound of the acid anhydride group) / {acid anhydride monomer in the imidization step (general formula (general formula (1) 10) L 1 and L 2 are the total number of moles of the silicon-containing compound of the acid anhydride group) + the acid dianhydride monomer in the amidation step (L 1 and L 2 of the general formula (10) are the acid anhydride groups Total number of moles of (including silicon-containing compounds)} * 100
ワニスに水を適当量加え、80℃で3日間加熱処理を行い、酸成分とアミン成分とに解重合成分とを解重合させ、酸モノマーとアミンモノマーとする。その後、溶媒留去により酸モノマーとアミンモノマーが混ざった粉体を得て、アセトニトリル溶液を調製し、高速液体クロマトグラフィー質量分析(LC/MS)測定を行う。そして、各モノマーのピーク面積を求め、そのピーク面積比から算出することができる。 The imidization rate can be determined by the following method using a varnish.
An appropriate amount of water is added to the varnish, and the mixture is heat-treated at 80 ° C. for 3 days to depolymerize the depolymerization component into the acid component and the amine component to obtain an acid monomer and an amine monomer. Then, the solvent is distilled off to obtain a powder in which an acid monomer and an amine monomer are mixed, an acetonitrile solution is prepared, and high performance liquid chromatography mass spectrometry (LC / MS) measurement is performed. Then, the peak area of each monomer can be obtained and calculated from the peak area ratio.
実施例/比較例の樹脂の、ジアミン中のケイ素含有化合物割合の、イミドユニットとアミドユニットの差は、下記式より求められる。
A:イミドユニットのジアミン中のケイ素含有化合物割合(質量%)=イミド化工程で用いたケイ素含有化合物/イミド化工程で用いたジアミンモノマー(ケイ素含有化合物含む)の質量の総量*100
B:アミドユニットのジアミン中のケイ素含有化合物割合(質量%)=イミド化工程で用いたケイ素含有化合物/アミド化工程で用いたジアミンモノマー(ケイ素含有化合物含む)の質量の総量*100
Aは、“一般式(7)におけるP5を構成するジアミンのうち、一般式(10)の割合(質量%)”とも言い換えることができる。
また、Bは、“一般式(6)におけるP3を構成するジアミンのうち、一般式(10)の割合(質量%)”とも言い換えることができる。
そして、ジアミン中のケイ素含有化合物割合 イミドユニットとアミドユニットの差は、“B-A”と表される。 <Ratio of silicon-containing compounds in diamine Difference between imide unit and amide unit>
The difference between the imide unit and the amide unit in the ratio of the silicon-containing compound in the diamine of the resin of the example / comparative example can be obtained from the following formula.
A: Silicon-containing compound ratio (% by mass) in diamine of imide unit = silicon-containing compound used in imidization step / total mass of diamine monomer (including silicon-containing compound) used in imidization step * 100
B: Silicon-containing compound ratio (% by mass) in diamine of the amide unit = total mass of silicon-containing compound used in the imidization step / diamine monomer (including silicon-containing compound) used in the amidation step * 100
A is "among the general formula in (7) of the diamine constituting the P 5, the ratio (mass%) of the general formula (10)" and can turn also.
Further, B can be rephrased as "the ratio (mass%) of the general formula (10) to the diamines constituting P 3 in the general formula (6)".
Then, the ratio of the silicon-containing compound in the diamine The difference between the imide unit and the amide unit is expressed as "BA".
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(189g)、トルエン(19g)、ジアミンとしてDABA(73.0mmol,11.1g)、ケイ素含有化合物(2)(6.699mmol,10.72g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(18.3mmol,2.8g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液(以下、ワニスともいう)を得た。 << Example I-1 >>
As shown in Tables 1 and 2, NMP (189 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (73.0 mmol, 11.1 g) and silicon-containing compound (2) (6.699 mmol, 10.72 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. rice field. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (18.3 mmol, 2.8 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture was stirred at room temperature for 48 hours, and an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group) ( Hereinafter, it is also referred to as varnish).
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(191g)、トルエン(19g)、ジアミンとしてDABA(13.6g)、ケイ素含有化合物(1)(10.82g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(0.7g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-2 >>
As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (13.6 g) and the silicon-containing compound (1) (10.82 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (0.7 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(191g)、トルエン(19g)、ジアミンとしてDABA(7.3g)、ケイ素含有化合物(3)(10.85g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(7.3g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-3 >>
As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (7.3 g) and the silicon-containing compound (3) (10.85 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (7.3 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(191g)、トルエン(19g)、ジアミンとしてDABA(8.7g)、ケイ素含有化合物(4)(10.85g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(5.8g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-4 >>
As shown in Tables 1 and 2, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (8.7 g) and the silicon-containing compound (4) (10.85 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (5.8 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(186g)、トルエン(19g)、ジアミンとしてDABA(14.9g)を撹拌しながら加え、続いて酸二無水物としてCpODA(32.8g)、ケイ素含有化合物(5)(10.51g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、酸二無水物としてCpODA(3.6g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-5 >>
As shown in Tables 1 and 2, NMP (186 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (14.9 g) was added with stirring, and then CpODA (32.8 g) and a silicon-containing compound (5) (10.51 g) were added as acid dianhydride at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, CpODA (3.6 g) was added as an acid dianhydride with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(184g)、トルエン(18g)、ジアミンとしてDABA(12.9g)、ケイ素含有化合物(1)(10.44g)を撹拌しながら加え、続いて酸二無水物としてCpODA(28.8g),ODPA(7.8g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(1.4g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-6 >>
As shown in Tables 1 and 2, NMP (184 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (12.9 g) and the silicon-containing compound (1) (10.44 g) were added with stirring, and then CpODA (28.8 g) and ODPA (7.8 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (1.4 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(194g)、トルエン(19g)、ジアミンとしてDABA(11.1g)、ケイ素含有化合物(2)(11.02g)を撹拌しながら加え、続いて酸二無水物としてCpODA(28.8g),6FDA(11.1g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(2.8g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-7 >>
As shown in Tables 1 and 2, NMP (194 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (11.1 g) and the silicon-containing compound (2) (11.02 g) were added with stirring, and then CpODA (28.8 g) and 6FDA (11.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (2.8 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(197g)、トルエン(20g)、ジアミンとしてDABA(8.6g)、ケイ素含有化合物(1)(11.19g)を撹拌しながら加え、続いて酸二無水物としてCpODA(28.8g),BPAF(11.5g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(5.7g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-8 >>
As shown in Tables 1 and 2, NMP (197 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (8.6 g) and the silicon-containing compound (1) (11.19 g) were added with stirring, and then CpODA (28.8 g) and BPAF (11.5 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (5.7 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(193g)、トルエン(19g)、ジアミンとしてDABA(7.2g)、ケイ素含有化合物(1)(10.92g)を撹拌しながら加え、続いて酸二無水物としてCpODA(28.8g),BzDA(10.1g)を室温で 加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(7.2g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-9 >>
As shown in Tables 1 and 2, NMP (193 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (7.2 g) and the silicon-containing compound (1) (10.92 g) were added with stirring, and then CpODA (28.8 g) and BzDA (10.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (7.2 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(170g)、トルエン(17g)、ジアミンとしてDABA(13.3g)、ケイ素含有化合物(2)(9.62g)を撹拌しながら加え、続いて酸二無水物としてCpODA(28.8g),BNBDF(4.1g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(0.7g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-10 >>
As shown in Tables 1 and 2, NMP (170 g), toluene (17 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (13.3 g) and the silicon-containing compound (2) (9.62 g) were added with stirring, and then CpODA (28.8 g) and BNBDF (4.1 g) were added as acid dianhydrides at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (0.7 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(204g)、トルエン(20g)、ジアミンとしてDABA(10.3g)、BAFL(5.9g)、ケイ素含有化合物(1)(11.57g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(1.1g)、BAFL(0.7g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-11 >>
As shown in Tables 1 and 2, NMP (204 g), toluene (20 g), and diamine as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (10.3 g), BAFL (5.9 g) and silicon-containing compound (1) (11.57 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (1.1 g) and BAFL (0.7 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(202g)、トルエン(20g)、ジアミンとしてDABA(5.5g)、BisAM(3.1g)、ケイ素含有化合物(2)(11.42g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(5.5g)、BisAM(3.1g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-12 >>
As shown in Tables 1 and 2, NMP (202 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (5.5 g), BisAM (3.1 g) and silicon-containing compound (2) (11.42 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (5.5 g) and BisAM (3.1 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(218g)、トルエン(22g)、ジアミンとしてDABA(5.9g)、BAFL(9.4g)、ケイ素含有化合物(1)(12.35g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(2.5g)、BAFL(4.0g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-13 >>
As shown in Tables 1 and 2, NMP (218 g), toluene (22 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (5.9 g), BAFL (9.4 g) and silicon-containing compound (1) (12.35 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (2.5 g) and BAFL (4.0 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表1及び2に記載する様に、溶媒としてNMP(208g)、トルエン(21g)、ジアミンとしてDABA(10.22g)、TFMB(16.0g)を撹拌しながら加え、続いて酸二無水物としてCpODA(27.7g)、BPDA(5.3g)、ケイ素含有化合物(6)(9.95g)を室温で加えた。酸二無水物、ジアミンのモル比は、100:100であった。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻し、ポリイミド樹脂(ケイ素含有化合物以外の官能基:イミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。得られたワニスを冷凍庫(設定-20℃、以下同様)で保管し、評価をする際は解凍して使用した。 << Comparative Example I-1 >>
As shown in Tables 1 and 2, NMP (208 g), toluene (21 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (10.22 g) and TFMB (16.0 g) were added with stirring, followed by CpODA (27.7 g), BPDA (5.3 g) and silicon-containing compound (6) (9.) as acid dianhydride. 95 g) was added at room temperature. The molar ratio of acid dianhydride and diamine was 100: 100. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature to obtain an NMP solution of a polyimide resin (functional group other than silicon-containing compound: imide group, functional group of silicon-containing compound: imide group). The obtained varnish was stored in a freezer (setting -20 ° C, the same applies hereinafter), and was thawed and used for evaluation.
比較例I-1において、溶媒、酸二無水物、ジアミンの種類及び量を表1及び2に記載したものに変更したことを除いて、比較例I-1と同様に行った。 << Comparative Examples I-2 and I-3 >>
In Comparative Example I-1, the same procedure was used for Comparative Example I-1 except that the types and amounts of the solvent, acid dianhydride, and diamine were changed to those shown in Tables 1 and 2.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(177g)、トルエン(18g)、ジアミンとしてケイ素含有化合物(2)(4.12g)、33DAS(8.5g)、44DAS(12.8g)を撹拌しながら加え、続いて酸二無水物としてODPA(31.0g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとして33DAS(0.9g)、44DAS(1.4g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-14 >>
As shown in Tables 3 and 4, NMP (177 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. As a silicon-containing compound (2) (4.12 g), 33 DAS (8.5 g), 44 DAS (12.8 g) was added with stirring, and then ODPA (31.0 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, 33 DAS (0.9 g) and 44 DAS (1.4 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(170g)、トルエン(17g)、ジアミンとしてケイ素含有化合物(2)(1.70g)、33DAS(8.7g)、44DAS(13.0g)を撹拌しながら加え、続いて酸二無水物としてODPA(31.0g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとして33DAS(1.0g)、44DAS(1.4g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-15 >>
As shown in Tables 3 and 4, NMP (170 g), toluene (17 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. The silicon-containing compound (2) (1.70 g), 33DAS (8.7 g) and 44DAS (13.0 g) were added with stirring, and then ODPA (31.0 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, 33 DAS (1.0 g) and 44 DAS (1.4 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(204g)、トルエン(20g)、ジアミンとしてケイ素含有化合物(2)(16.36g)、DABA(12.0g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(1.3g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-16 >>
As shown in Tables 3 and 4, NMP (204 g), toluene (20 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. The silicon-containing compound (2) (16.36 g) and DABA (12.0 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (1.3 g) was added as a diamine with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(259g)、トルエン(26g)、ジアミンとしてケイ素含有化合物(1)(15.54g)、BAFL(29.1g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてBAFL(3.2g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-17 >>
As shown in Tables 3 and 4, NMP (259 g), toluene (26 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. The silicon-containing compound (1) (15.54 g) and BAFL (29.1 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, BAFL (3.2 g) as a diamine was added with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(232g)、トルエン(23g)、ジアミンとしてケイ素含有化合物(1)(7.73g)、33DAS(8.5g)、44DAS(12.8g)を撹拌しながら加え、続いて酸二無水物としてBPAF(45.8g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとして33DAS(0.9g)、44DAS(1.4g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-18 >>
As shown in Tables 3 and 4, NMP (232 g), toluene (23 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. As a silicon-containing compound (1) (7.73 g), 33 DAS (8.5 g), 44 DAS (12.8 g) was added with stirring, and then BPAF (45.8 g) as an acid dianhydride was added at room temperature. .. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, 33 DAS (0.9 g) and 44 DAS (1.4 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表3及び4に記載する様に、溶媒としてNMP(235g)、トルエン(24g)、ジアミンとしてケイ素含有化合物(1)(7.84g)、6FODA(28.9g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとして6FODA(3.2g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。 << Example I-19 >>
As shown in Tables 3 and 4, NMP (235 g), toluene (24 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. The silicon-containing compound (1) (7.84 g) and 6FODA (28.9 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, 6FODA (3.2 g) as a diamine was added with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture is stirred at room temperature for 48 hours to prepare an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: imide group). Obtained.
表3及び4に記載する様に、BPADA200g(0.384mol)を1,2-ビス(2-メトキシエトキシ)エタン(トリグラム)1101gに分散し、80℃に保った。これにケイ素含有化合物X-22-9409(信越化学社製、両末端:アミノ基、官能基等量:670)を172g(0.115mol)投入し、30分間均一攪拌を行った。次いで、140℃に加熱して1時間攪拌を行い、反応を終了させた後、180℃に昇温させて3時間加熱還流を行った。反応終了後、室温まで冷却し水を27.7g(1.54mol)投入した。均一に30分間攪拌した後、80℃に加熱して3時間加熱還流を行った。このようにしてイミド化したテトラカルボン酸(末端テトラカルボン酸シロキサンイミドオリゴマー)を溶解した溶液を得た。
次いで溶液を、室温まで冷却してmBAPSを99.7g(0.230mol)投入して室温下で1時間均一攪拌を行い、樹脂組成物溶液を得た。 << Comparative Example I-4 >>
As shown in Tables 3 and 4, 200 g (0.384 mol) of BPADA was dispersed in 1101 g of 1,2-bis (2-methoxyethoxy) ethane (trigram) and kept at 80 ° C. 172 g (0.115 mol) of a silicon-containing compound X-22-9409 (manufactured by Shin-Etsu Chemical Co., Ltd., both ends: amino group, functional group equal amount: 670) was added thereto, and the mixture was uniformly stirred for 30 minutes. Then, the mixture was heated to 140 ° C. and stirred for 1 hour to complete the reaction, and then the temperature was raised to 180 ° C. and reflux was performed for 3 hours. After completion of the reaction, the mixture was cooled to room temperature and 27.7 g (1.54 mol) of water was added. After stirring uniformly for 30 minutes, the mixture was heated to 80 ° C. and heated under reflux for 3 hours. A solution in which the tetracarboxylic acid (terminal tetracarboxylic acid siloxaneimide oligomer) imidized in this manner was dissolved was obtained.
Then, the solution was cooled to room temperature, 99.7 g (0.230 mol) of mBAPS was added, and the mixture was uniformly stirred at room temperature for 1 hour to obtain a resin composition solution.
表3及び4に記載する様に、三口セパラブルフラスコに窒素導入管、温度計、水分分離トラップを備えた玉付冷却管を取り付けた。室温25℃で、トリエチレングリコールジメチルエーテル(トリグラム)15g、γ-ブチロラクトン(GBL)35g、トルエン20.0g、ODPA10.86g(35.00mmol)を入れ、均一になるまで攪拌した。その後、80℃に昇温しケイ素含有化合物KF-8010(信越化学工業社製、両末端:アミノ基、官能基等量430)11.30g(13.78mmol)を加え、更に0.5時間攪拌した後、170℃まで昇温し、4時間加熱した。反応中、副生する水は、トルエンと共沸し、水分分離トラップを備えた玉付冷却管を用いて、還流下、脱水を行った。副生水を抜いた後、還流を止め、トルエンを全抜きした。系を100℃まで冷却した後、無水マレイン酸0.14gを加え0.5時間攪拌した。
12時間室温25℃にて静置、冷却した後にAPB6.00g(20.52mmol)を添加し、樹脂組成物を得た。 << Comparative Example I-5 >>
As shown in Tables 3 and 4, a cooling tube with a ball equipped with a nitrogen introduction tube, a thermometer, and a water separation trap was attached to the three-necked separable flask. At room temperature of 25 ° C., 15 g of triethylene glycol dimethyl ether (trigram), 35 g of γ-butyrolactone (GBL), 20.0 g of toluene and 10.86 g of ODPA (35.00 mmol) were added and stirred until uniform. Then, the temperature was raised to 80 ° C., 11.30 g (13.78 mmol) of the silicon-containing compound KF-8010 (manufactured by Shin-Etsu Chemical Co., Ltd., both ends: amino group, functional group equal amount 430) was added, and the mixture was further stirred for 0.5 hour. After that, the temperature was raised to 170 ° C. and heated for 4 hours. During the reaction, the by-produced water was azeotropically boiled with toluene and dehydrated under reflux using a condenser with a ball equipped with a water separation trap. After draining the by-product water, reflux was stopped and all toluene was drained. After cooling the system to 100 ° C., 0.14 g of maleic anhydride was added and the mixture was stirred for 0.5 hours.
After allowing to stand at room temperature of 25 ° C. for 12 hours and cooling, 6.00 g (20.52 mmol) of APB was added to obtain a resin composition.
ステンレス製半月型撹拌翼、窒素導入管、冷却管を取り付けたディーン・スターク、温度計、ガラス製エンドキャップを備えた500mLの5つ口丸底フラスコに、表3及び4に記載する様に、6FODAを27.0g(0.0802モル)、及びNMPを56.000g投入し、系内温度70℃、窒素雰囲気下、回転数200rpmで撹拌して溶液を得た。 << Comparative Example I-6 >>
A 500 mL five-necked round-bottom flask with a stainless half-moon agitator, a nitrogen inlet tube, a Dean Stark with a condenser, a thermometer, and a glass end cap, as described in Tables 3 and 4. 27.0 g (0.0802 mol) of 6FODA and 56.000 g of NMP were added, and the mixture was stirred at a system temperature of 70 ° C. and a nitrogen atmosphere at a rotation speed of 200 rpm to obtain a solution.
〈酸二無水物〉
CpODA:下記一般式の化合物
6FDA:4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物
BPAF:9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物
BzDA:下記一般式の化合物
<Acid dianhydride>
CpODA: A compound of the following general formula
DABA:3,5-ジアミノ安息香酸
3,3’-ジアミノジフェニルスルホン(33DAS)
4,4’-ジアミノジフェニルスルホン(44DAS)
BAFL:9,9-ビス(4-アミノフェニル)フルオレン
BisAM:下記一般式の化合物
BAPP:下記一般式の化合物
APB:1,3-ビス(3-アミノフェノキシ)ベンゼン
<Diamine>
DABA: 3,5-diaminobenzoic acid 3,3'-diaminodiphenyl sulfone (33DAS)
4,4'-Diaminodiphenyl sulfone (44DAS)
BAFL: 9,9-bis (4-aminophenyl) fluorene BisAM: a compound of the following general formula
ケイ素含有化合物(1):(一般式(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量1500の化合物)
ケイ素含有化合物(2):(一般式(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量800の化合物)
ケイ素含有化合物(3):(一般式(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量2200の化合物)
ケイ素含有化合物(4):一般式(10)において、L1及びL2がアミノ基、R1が-CH2CH2CH2-であり、R2、R3、R6、R7がメチル基、R4、R5がフェニル基、j/(i+j+k)=0.15であり、官能基当量2200の化合物
ケイ素含有化合物(5):(一般式(10)において、L1及びL2が酸無水物基(―CH(C=O)2O)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量1000の化合物)
ケイ素含有化合物(6):(一般式(10)において、L1及びL2が酸無水物基(―CH(C=O)2O)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量500の化合物) <Silicon-containing compound>
Silicon-containing compound (1): (In the general formula (10), L 1 and L 2 are amino groups (-NH 2 ), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 ,. A compound in which R 3 is a methyl group, j and k are 0, and a functional group equivalent is 1500).
Silicon-containing compound (2): (In the general formula (10), L 1 and L 2 are amino groups (-NH 2 ), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 ,. A compound in which R 3 is a methyl group, j and k are 0, and a functional group equivalent is 800).
Silicon-containing compound (3): (In the general formula (10), L 1 and L 2 are amino groups (-NH 2 ), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 ,. A compound in which R 3 is a methyl group, j and k are 0, and a functional group equivalent is 2200).
Silicon-containing compound (4): In the general formula (10), L 1 and L 2 are amino groups, R 1 is −CH 2 CH 2 CH 2 −, and R 2 , R 3 , R 6 and R 7 are methyl. Group, R 4 , R 5 are phenyl group, j / (i + j + k) = 0.15, functional group equivalent 2200 compound Silicon-containing compound (5): (In the general formula (10), L 1 and L 2 are The acid anhydride group (-CH (C = O) 2 O), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), R 2 and R 3 are methyl groups, and j and k are 0. , A compound having a functional group equivalent of 1000)
Silicon-containing compound (6): (In the general formula (10), L 1 and L 2 are acid anhydride groups (-CH (C = O) 2 O), R 1 is a trimethylene group (-CH 2 CH 2 CH 2). -), R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 500).
《測定及び評価方法》
〈重量平均分子量〉
重量平均分子量(Mw)及び数平均分子量(Mn)は、ゲルパーミエ-ションクロマトグラフィー(GPC)にて、下記の条件により測定した。
溶媒として、NMP(和光純薬工業社製、高速液体クロマトグラフ用、測定直前に24.8mmol/Lの臭化リチウム一水和物(和光純薬工業社製、純度99.5%)及び63.2mmol/Lのリン酸(和光純薬工業社製、高速液体クロマトグラフ用)を加えて溶解したもの)を使用した。重量平均分子量を算出するための検量線は、スタンダ-ドポリスチレン(東ソ-社製)を用いて作製した。
カラム:Shodex KD-806M(昭和電工社製)
流速:1.0mL/分
カラム温度:40℃
ポンプ:PU-2080Plus(JASCO社製)
検出器:RI-2031Plus(RI:示差屈折計、JASCO社製)及びUV-2075Plus(UV-VIS:紫外可視吸光計、JASCO社製) [Second aspect]
<< Measurement and evaluation method >>
<Weight average molecular weight>
The weight average molecular weight (Mw) and the number average molecular weight (Mn) were measured by gel permeation chromatography (GPC) under the following conditions.
As solvents, NMP (manufactured by Wako Pure Chemical Industries, Ltd., for high performance liquid chromatograph, 24.8 mmol / L lithium bromide monohydrate (manufactured by Wako Pure Chemical Industries, Ltd., purity 99.5%) immediately before measurement) and 63. .2 mmol / L phosphoric acid (manufactured by Wako Pure Chemical Industries, Ltd., for high performance liquid chromatograph) was added and dissolved) was used. The calibration curve for calculating the weight average molecular weight was prepared using standard polystyrene (manufactured by Toso Co., Ltd.).
Column: Shodex KD-806M (manufactured by Showa Denko KK)
Flow rate: 1.0 mL / min Column temperature: 40 ° C
Pump: PU-2080Plus (manufactured by JASCO)
Detector: RI-2031Plus (RI: differential refractometer, manufactured by JASCO) and UV-2075Plus (UV-VIS: ultraviolet-visible absorptiometer, manufactured by JASCO)
実施例、及び比較例において調製した樹脂組成物を23℃、50%RHの雰囲気下で24時間放置し、樹脂組成物の初期(0日)の粘度を、温調機付粘度計(東機産業械社製VISCOMATER TVE-35H)を用いて測定した。そして、樹脂組成物を23℃、50%RHの雰囲気下で7日間放置し、初期と同様にして、7日後の粘度を測定した。続いて、下記式で表される粘度安定性を算出した。
粘度安定性(%/day)=|(初期の粘度(mPa・s))―(7日後の粘度(mPa・s))|/(初期粘度(mPa・s))*100/7(day)
粘度安定性は下記基準で評価を行った。
A:粘度安定性1%/day以下 「優良」
B:粘度安定性1%/day超3%/day以下 「良」
C:粘度安定性3%/day超5%/day以下 「可」
D:粘度安定性5%/day超 「可」 <Evaluation of viscosity stability of composition (varnish)>
The resin compositions prepared in Examples and Comparative Examples were left to stand in an atmosphere of 23 ° C. and 50% RH for 24 hours, and the initial (0 day) viscosity of the resin composition was measured by a viscometer with a temperature controller (Toki). It was measured using VISCOMATER TVE-35H) manufactured by Sangyo Kikai. Then, the resin composition was left to stand in an atmosphere of 23 ° C. and 50% RH for 7 days, and the viscosity after 7 days was measured in the same manner as in the initial stage. Subsequently, the viscosity stability represented by the following formula was calculated.
Viscosity stability (% / day) = | (Initial viscosity (mPa · s))-(Viscosity after 7 days (mPa · s)) | / (Initial viscosity (mPa · s)) * 100/7 (day)
Viscosity stability was evaluated according to the following criteria.
A: Viscosity stability 1% / day or less "excellent"
B: Viscosity stability 1% / day over 3% / day or less "Good"
C: Viscosity stability 3% / day over 5% / day or less "OK"
D: Viscosity stability 5% / day over "OK"
実施例、及び比較例において調製した樹脂組成物を23℃、50%RHの雰囲気下で、サイズ900mmφ、目付0.2μmのポリエチレン製のメンブレンフィルターを用いて、0.25MPaの圧力で加圧ろ過を行った。この時のろ過された樹脂組成物の質量を測定し、ろ過速度を計算した。ろ過性は下記基準で評価を行った。
A:ろ過速度2000g/hr以上 「優」
B:ろ過速度2000g/hr未満1500g/hr以上 「良」
C:ろ過速度1500g/hr未満1000g/hr以上 「可」
D:ろ過速度1000g/hr未満 「不可」 <Evaluation of the filterability of the composition (varnish)>
The resin compositions prepared in Examples and Comparative Examples were pressure-filtered at a pressure of 0.25 MPa at 23 ° C. and 50% RH using a polyethylene membrane filter having a size of 900 mmφ and a basis weight of 0.2 μm. Was done. The mass of the filtered resin composition at this time was measured, and the filtration rate was calculated. The filterability was evaluated according to the following criteria.
A: Filtration speed 2000g / hr or more "excellent"
B: Filtration rate less than 2000 g / hr 1500 g / hr or more "Good"
C: Filtration rate less than 1500 g / hr 1000 g / hr or more "OK"
D: Filtration rate less than 1000 g / hr "impossible"
支持体として、表面にアルミニウム蒸着層を設けた6インチシリコンウェハー基板を用い、そのアルミニウム蒸着層の面上に、実施例及び比較例において調製した樹脂組成物を、ポリイミド樹脂膜の膜厚が10μmになるようにスピンコートして、塗膜を形成した。この塗膜を、100℃、6分間プリベークした後、庫内の酸素濃度が10質量ppm以下に調整された縦型キュア炉(光洋サーモシステム(株)製、型式名「VF-2000B」)を用いて、400℃にて1時間加熱し、ウェハー上にポリイミドフィルムを形成した。続いて、ダイシングソー((株)ディスコ製、品名「DAD 3350」)を用いて、得られたポリイミドフィルムに3mm幅の切れ目を入れた後、ポリイミドフィルム付きウェハーを、希塩酸水溶液に一晩浸して、ポリイミドフィルム片を剥離して、乾燥させて、幅3mmのポリイミド片を得た。これを長さ50mmにカットして、幅3mm、長さ50mmのポリイミド測定試料を得た。TENSILON((株)オリエンテック社製、型式名「UTM-II-20」)を用いて、試験速度40mm/分、初期加重0.5fsにて、ポリイミド樹脂膜の引張伸度を測定した。引張伸度は下記基準で評価を行った。
A:引張伸度が50%超 「優良」
B:引張伸度が40%超50%以下 「良」
C:引張伸度が30%超40%以下 「可」
D:引張伸度が30%未満 「不可」 <Evaluation of tensile elongation of polyimide resin film>
A 6-inch silicon wafer substrate having an aluminum-deposited layer on its surface was used as a support, and the resin compositions prepared in Examples and Comparative Examples were placed on the surface of the aluminum-deposited layer, and the thickness of the polyimide resin film was 10 μm. A coating film was formed by spin coating so as to be. After prebaking this coating film at 100 ° C. for 6 minutes, a vertical curing furnace (manufactured by Koyo Thermo System Co., Ltd., model name "VF-2000B") in which the oxygen concentration in the refrigerator was adjusted to 10 mass ppm or less was used. It was heated at 400 ° C. for 1 hour to form a polyimide film on the wafer. Subsequently, a dicing saw (manufactured by Disco Co., Ltd., product name "DAD 3350") was used to make a 3 mm wide cut in the obtained polyimide film, and then the wafer with the polyimide film was immersed in a dilute hydrochloric acid aqueous solution overnight. , The polyimide film piece was peeled off and dried to obtain a polyimide piece having a width of 3 mm. This was cut into a length of 50 mm to obtain a polyimide measurement sample having a width of 3 mm and a length of 50 mm. Using TENSILON (manufactured by Orientec Co., Ltd., model name "UTM-II-20"), the tensile elongation of the polyimide resin film was measured at a test speed of 40 mm / min and an initial load of 0.5 fs. The tensile elongation was evaluated according to the following criteria.
A: Tensile elongation exceeds 50% "excellent"
B: Tensile elongation is more than 40% and 50% or less "Good"
C: Tensile elongation is more than 30% and 40% or less "OK"
D: Tensile elongation is less than 30% "impossible"
予め「反り量」を測定しておいた、厚み625μm±25μmの6インチシリコンウェハー上に、実施例及び比較例において調製した樹脂組成物をスピンコーターにより塗布し、100℃において7分間プリベークした。その後、縦型キュア炉(光洋リンドバーグ社製、型式名VF-2000B)を用いて、庫内の酸素濃度が10質量ppm以下になるように調整して、400℃において1時間の加熱硬化処理(キュア処理)を施し、硬化後膜厚10μmのポリイミド樹脂膜のついたシリコンウェハーを作製した。
このウェハーの反り量を、残留応力測定装置(テンコール社製、型式名FLX-2320)を用いて測定し、“窒素雰囲気下において”シリコンウェハーと樹脂膜との間に生じた残留応力を評価した。
A:残留応力が30MPa未満 「良」
B:残留応力が30MPa以上40MPa未満 「可」
C:引張伸度が40MPa以上 「不可」 <Evaluation of residual stress of polyimide resin film>
The resin compositions prepared in Examples and Comparative Examples were applied on a 6-inch silicon wafer having a thickness of 625 μm ± 25 μm for which the “warp amount” had been measured in advance by a spin coater, and prebaked at 100 ° C. for 7 minutes. After that, using a vertical curing furnace (manufactured by Koyo Lindbergh Co., Ltd., model name VF-2000B), the oxygen concentration in the refrigerator was adjusted to 10% by mass or less, and heat curing treatment was performed at 400 ° C. for 1 hour. After curing, a silicon wafer with a polyimide resin film having a thickness of 10 μm was produced.
The amount of warpage of this wafer was measured using a residual stress measuring device (model name FLX-2320 manufactured by Tencor), and the residual stress generated between the silicon wafer and the resin film was evaluated "under a nitrogen atmosphere". ..
A: Residual stress is less than 30 MPa "Good"
B: Residual stress is 30 MPa or more and less than 40 MPa "Yes"
C: Tensile elongation is 40 MPa or more "impossible"
撹拌棒付き3Lセパラブルフラスコに、窒素ガスを導入しながら、表6及び7に記載するように、溶媒としてNMP(191g)、ジアミンとしてDABA(14.4g)、及びケイ素含有化合物(1)(10.82g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を加えた。酸二無水物、ジアミンのモル比は、100:98であった。混合物を室温で48時間撹拌し、透明なポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基、ケイ素含有化合物の官能基:アミド基)のNMP溶液(以下、ワニスともいう)を得た。得られたワニスを冷凍庫(設定-20℃、以下同様)で保管し、評価をする際は解凍して使用した。 << Example II-1 >>
As shown in Tables 6 and 7, NMP (191 g) as a solvent, DABA (14.4 g) as a diamine, and a silicon-containing compound (1) (1) while introducing nitrogen gas into a 3 L separable flask with a stirring rod. 10.82 g) was added with stirring, followed by CpODA (38.4 g) as acid dianhydride. The molar ratio of acid dianhydride and diamine was 100: 98. The mixture was stirred at room temperature for 48 hours to obtain an NMP solution (hereinafter, also referred to as varnish) of a transparent polyimide precursor (functional group other than silicon-containing compound: amide group, functional group of silicon-containing compound: amide group). The obtained varnish was stored in a freezer (setting -20 ° C, the same applies hereinafter), and was thawed and used for evaluation.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表6及び7に記載する様に、溶媒としてNMP(191g)、トルエン(19g)、ジアミンとしてDABA(14.4g)、及びケイ素含有化合物(1)(10.82g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。酸二無水物、ジアミンのモル比は、100:98であった。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻し、ポリイミド樹脂(ケイ素含有化合物以外の官能基:イミド基、ケイ素含有化合物の官能基:イミド基)のNMP溶液を得た。得られたワニスを冷凍庫(設定-20℃、以下同様)で保管し、評価をする際は解凍して使用した。 << Example II-2 >>
As shown in Tables 6 and 7, NMP (191 g), toluene (19 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. DABA (14.4 g) and the silicon-containing compound (1) (10.82 g) were added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature to obtain an NMP solution of a polyimide resin (functional group other than silicon-containing compound: imide group, functional group of silicon-containing compound: imide group). The obtained varnish was stored in a freezer (setting -20 ° C, the same applies hereinafter), and was thawed and used for evaluation.
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表6~9のいずれかに記載する様に、溶媒としてNMP(189g)、トルエン(19g)、ジアミンとしてDABA(13.9g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ケイ素含有化合物(2)(10.72g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:アミド基)のNMP溶液(以下、ワニスともいう)を得た。 << Example II-3 >>
While introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top, as shown in any of Tables 6 to 9, NMP (189 g) and toluene (19 g) were used as solvents. ), DABA (13.9 g) as a diamine was added with stirring, and then CpODA (38.4 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, the silicon-containing compound (2) (10.72 g) was added with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture was stirred at room temperature for 48 hours, and an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: amide group) ( Hereinafter, it is also referred to as varnish).
ディーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表8及び9に記載する様に、溶媒としてNMP(177g)、トルエン(18g)、ジアミンとして33DAS(8.5g)及び44DAS(12.8g)を撹拌しながら加え、続いて酸二無水物としてODPA(31.0g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとして33DAS(0.9g)及び44DAS(1.4g)と、ケイ素含有化合物(2)(4.12g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:アミド基)のNMP溶液(以下、ワニスともいう)を得た。 << Example II-16 >>
As shown in Tables 8 and 9, NMP (177 g), toluene (18 g), and diamine were used as solvents while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dean-Stark tube and a reflux tube at the top. 33 DAS (8.5 g) and 44 DAS (12.8 g) were added with stirring, and then ODPA (31.0 g) as an acid dianhydride was added at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, 33 DAS (0.9 g) and 44 DAS (1.4 g) as diamines and the silicon-containing compound (2) (4.12 g) were added with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture was stirred at room temperature for 48 hours, and an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: amide group) ( Hereinafter, it is also referred to as varnish).
デ ィーン・スターク管及び還流管を上部に備えた撹拌棒付きセパラブルフラスコに、窒素ガスを導入しながら、表8及び9に記載する様に、溶媒としてNMP(173g)、トルエン(17g)、ジアミンとしてDABA(13.0g)を撹拌しながら加え、続いて酸二無水物としてCpODA(38.4g)を室温で加えた。その後、内温160℃まで昇温し、160℃で1時間加熱還流を行い、イミド化を行った。イミド化完了後、180℃まで昇温し、トルエンを抜き出しながら反応を続けた。12時間反応後、オイルバスを外して室温に戻した。次に、ジアミンとしてDABA(1.4g)と、ケイ素含有化合物(2)(4.80g)を撹拌しながら加えた。酸二無水物、ジアミンのモル比は、100:98であった。そして、混合物を室温で48時間撹拌し、一部がイミド化されたポリイミド前駆体(ケイ素含有化合物以外の官能基:アミド基又はイミド基、ケイ素含有化合物の官能基:アミド基)のNMP溶液(以下、ワニスともいう)を得た。 << Example II-17 >>
As shown in Tables 8 and 9, NMP (173 g), toluene (17 g), as solvents, while introducing nitrogen gas into a separable flask with a stirring rod equipped with a Dane Stark tube and a reflux tube at the top. DABA (13.0 g) was added as a diamine with stirring, followed by CpODA (38.4 g) as an acid dianhydride at room temperature. Then, the temperature was raised to an internal temperature of 160 ° C., and the mixture was heated under reflux at 160 ° C. for 1 hour for imidization. After the imidization was completed, the temperature was raised to 180 ° C., and the reaction was continued while extracting toluene. After the reaction for 12 hours, the oil bath was removed and the temperature was returned to room temperature. Next, DABA (1.4 g) and the silicon-containing compound (2) (4.80 g) were added as diamines with stirring. The molar ratio of acid dianhydride and diamine was 100: 98. Then, the mixture was stirred at room temperature for 48 hours, and an NMP solution of a partially imidized polyimide precursor (functional group other than silicon-containing compound: amide group or imide group, functional group of silicon-containing compound: amide group) ( Hereinafter, it is also referred to as varnish).
ステンレス製半月型撹拌翼、窒素導入管、冷却管を取り付けたディーン・スターク、温度計、ガラス製エンドキャップを備えた500mLの5つ口丸底フラスコに、表8及び9に記載する様に、6FODAを27.0g(0.0802モル)、及びNMPを56.000g投入し、系内温度70℃、窒素雰囲気下、回転数200rpmで撹拌して溶液を得た。 << Comparative Example II-4 >>
A 500 mL five-necked round-bottom flask with a stainless half-moon agitator, a nitrogen inlet tube, a Dean Stark with a condenser, a thermometer, and a glass end cap, as described in Tables 8 and 9. 27.0 g (0.0802 mol) of 6FODA and 56.000 g of NMP were added, and the mixture was stirred at a system temperature of 70 ° C. and a nitrogen atmosphere at a rotation speed of 200 rpm to obtain a solution.
実施例II-3において、溶媒、酸二無水物、ジアミン、ケイ素含有化合物の種類及び量を表6及び7に記載したものに変更したことを除いて、実施例II-3と同様に行った。 << Examples II-4, II-5, II-7, II-9, II-10, II-12, II-14, II-15 >>
In Example II-3, the same procedure was used for Example II-3, except that the types and amounts of the solvent, acid dianhydride, diamine, and silicon-containing compound were changed to those shown in Tables 6 and 7. ..
実施例II-2において、溶媒、酸二無水物、ジアミン、ケイ素含有化合物の種類及び量を表6及び7に記載したものに変更したことを除いて、実施例II-2と同様に行った。 << Reference Example II-6, Examples II-8, II-11, II-13, Comparative Examples II-1 to II-3 >>
In Example II-2, the same procedure was used for Example II-2, except that the types and amounts of the solvent, acid dianhydride, diamine, and silicon-containing compound were changed to those shown in Tables 6 and 7. ..
〈酸二無水物〉
CpODA:下記一般式の化合物
6FDA:4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物
BPAF:9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物
BzDA:下記一般式の化合物
<Acid dianhydride>
CpODA: A compound of the following general formula
DABA:3,5-ジアミノ安息香酸
BAFL:9,9-ビス(4-アミノフェニル)フルオレン
BisAM:下記一般式の化合物
BAPP:下記一般式の化合物
44DAS:3,3’-ジアミノジフェニルスルホン
6FODA:2,2 ’-ビス (トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル <Diamine>
DABA: 3,5-diaminobenzoic acid BAFL: 9,9-bis (4-aminophenyl) fluorene BisAM: a compound of the following general formula
ケイ素含有化合物(1):(一般式(5),(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量1500の化合物)
ケイ素含有化合物(2):(一般式(5),(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量800の化合物)
ケイ素含有化合物(3):(一般式(5),(10)において、L1及びL2がアミノ基(-NH2)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量2200の化合物)
ケイ素含有化合物(4)::一般式(5),(10)において、L1及びL2がアミノ基、R1が-CH2CH2CH2-であり、R2、R3、R6、R7がメチル基、R4、R5がフェニル基、j/(i+j+k)=0.15であり、官能基当量2200の化合物
ケイ素含有化合物(5):(一般式(5),(10)において、L1及びL2が酸無水物基(―CH(C=O)2O)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量1000の化合物)
ケイ素含有化合物(6):(一般式(5),(10)において、L1及びL2が酸無水物基(―CH(C=O)2O)、R1がトリメチレン基(-CH2CH2CH2-)であり、R2、R3がメチル基、j,kが0であり、官能基当量500の化合物) <Silicon-containing compound>
Silicon-containing compound (1): (in the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ) and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 1500).
Silicon-containing compound (2): (In the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ), and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 800).
Silicon-containing compound (3): (in the general formulas (5) and (10), L 1 and L 2 are amino groups (-NH 2 ) and R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ). , R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 2200).
Silicon-containing compound (4) :: In the general formulas (5) and (10), L 1 and L 2 are amino groups, R 1 is -CH 2 CH 2 CH 2- , and R 2 , R 3 , R 6 , R 7 is a methyl group, R 4 , R 5 is a phenyl group, j / (i + j + k) = 0.15, and a functional group equivalent of 2200 is a compound Silicon-containing compound (5): (general formula (5), (10). ), L 1 and L 2 are acid anhydride groups (-CH (C = O) 2 O), R 1 is a trimethylene group (-CH 2 CH 2 CH 2- ), and R 2 and R 3 are methyl. A compound having 0 groups, j and k, and a functional group equivalent of 1000)
Silicon-containing compound (6): (In the general formulas (5) and (10), L 1 and L 2 are acid anhydride groups (-CH (C = O) 2 O), and R 1 is a trimethylene group (-CH 2). CH 2 CH 2- ), R 2 and R 3 are methyl groups, j and k are 0, and the functional group equivalent is 500).
2b 封止基板
25 有機EL構造部
250a 赤色光を発光する有機EL素子
250b 緑色光を発光する有機EL素子
250c 青色光を発光する有機EL素子
251 隔壁(バンク)
252 下部電極(陽極)
253 正孔輸送層
254 発光層
255 上部電極(陰極)
256 TFT
257 コンタクトホール
258 層間絶縁膜
259 下部電極
261 中空部
252 Lower electrode (anode)
253
256 TFT
257
Claims (48)
- 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記樹脂の総質量を基準に前記ケイ素含有化合物を25質量%以下含む、
樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from the silicon-containing compound represented by, and contains 25% by mass or less of the silicon-containing compound based on the total mass of the resin.
Resin composition. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記樹脂のイミド化率が50%以上である、
樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by, and the imidization ratio of the resin is 50% or more.
Resin composition. - 前記樹脂のイミド化率が50%以上である、請求項1に記載の樹脂組成物。 The resin composition according to claim 1, wherein the imidization ratio of the resin is 50% or more.
- 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
下記(ア)又は(イ):
(ア)前記P3及び/又はP5は、下記一般式(8):
(イ)前記P4及び/又はP6は、下記一般式(9):
のいずれかを満たす、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by (a) or (b) below.
(A) The P 3 and / or P 5 is the following general formula (8):
A resin composition that satisfies any of the above. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5が、それぞれ独立に、
3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、又は
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), or 9,9-bis (4-aminophenyl) fluorene (BAFL)
A resin composition containing at least one structural unit derived from each of the above compounds. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5が、それぞれ独立に、
2,2’-ビス(トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル(6FODA)
に由来する構成単位を少なくとも一つ含む、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from the silicon-containing compound represented by, and the P 3 and / or P 5 are independent of each other.
2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA)
A resin composition containing at least one structural unit derived from. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P5又はP6が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
A(質量%):一般式(7)におけるP5を構成するジアミンのうち、一般式(10)の割合
B(質量%):一般式(6)におけるP3を構成するジアミンのうち、一般式(10)の割合
としたとき、B-Aが、0より大きく、60未満である、
樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
Wherein P 5 or P 6 is represented by the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and A (wt%): Of the diamine that constitutes the P 5 in the general formula (7), the proportion of the general formula (10) B (wt%): of the diamine that constitutes the P 3 in the general formula (6), when the ratio of the general formula (10), B-a is greater than 0 and less than 60,
Resin composition. - 前記ジアミンが、
下記一般式(8):
3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、及び
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
から選択される少なくとも一つの化合物である、請求項7に記載の樹脂組成物。 The diamine
The following general formula (8):
3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), and 9,9-bis (4-aminophenyl) fluorene (BAFL)
The resin composition according to claim 7, which is at least one compound selected from the above. - 前記一般式(6)及び/又は前記一般式(7)において、P4及び/又はP6が、それぞれ独立に、4,4’-オキシジフタル酸無水物(ODPA)、又は9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)の各化合物に由来する構成単位を少なくとも一つ含む、請求項1~8のいずれか1項に記載の樹脂組成物。 In Formula (6) and / or the general formula (7), P 4 and / or P 6 are each independently, 4,4'-oxydiphthalic anhydride (ODPA), or 9,9-bis ( 3,4-Dicarboxyphenyl) The resin composition according to any one of claims 1 to 8, which comprises at least one structural unit derived from each compound of fluorene diacid anhydride (BPAF).
- 前記一般式(10)で表されるケイ素含有化合物の官能基当量が800以上である、請求項1~9のいずれか一項に記載の樹脂組成物。 The resin composition according to any one of claims 1 to 9, wherein the silicon-containing compound represented by the general formula (10) has a functional group equivalent of 800 or more.
- 前記P5が、前記一般式(10)で表される化合物に由来する構成単位を含み、かつ
前記一般式(10)において前記L1及びL2が、それぞれ独立に、アミノ基である、
請求項1~10のいずれか一項に記載の樹脂組成物。 The P 5 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
The resin composition according to any one of claims 1 to 10. - 前記一般式(8)で表される化合物が、全ジアミン(前記一般式(10)で表される化合物を除く)を100mol%としたとき、50mol%より多い、請求項4及び9~11のいずれか一項に記載の樹脂組成物。 The compound represented by the general formula (8) is more than 50 mol% when the total diamine (excluding the compound represented by the general formula (10)) is 100 mol%, according to claims 4 and 9 to 11. The resin composition according to any one of the above.
- 前記P4又はP6が、それぞれ独立に、4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸二無水物、下記式:
- 前記樹脂を加熱して得られるポリイミド樹脂膜が、フレキシブル基板に用いられる、請求項1~14のいずれか一項に記載の樹脂組成物。 The resin composition according to any one of claims 1 to 14, wherein the polyimide resin film obtained by heating the resin is used for a flexible substrate.
- 前記樹脂を硬化して得られるポリイミド樹脂膜が、フレキシブルディスプレイに用いられる、請求項1~15のいずれか一項に記載の樹脂組成物。 The resin composition according to any one of claims 1 to 15, wherein the polyimide resin film obtained by curing the resin is used for a flexible display.
- ジアミン又は酸二無水物と下記一般式(10):
で表されるケイ素含有化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂を含む樹脂組成物を提供することを含み、
前記樹脂の総質量を基準に前記ケイ素含有化合物を25質量%以下含む、
樹脂組成物の製造方法。 Diamine or acid dianhydride and the following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by
It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
The silicon-containing compound is contained in an amount of 25% by mass or less based on the total mass of the resin.
A method for producing a resin composition. - ジアミン又は酸二無水物と下記一般式(10):
で表されるケイ素含有化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂を含む樹脂組成物を提供することを含み、
前記樹脂のイミド化率が50%以上である、
樹脂組成物の製造方法。 Diamine or acid dianhydride and the following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by
It comprises polycondensing reaction with other compounds to provide a resin composition containing a polyimide precursor and a resin containing polyimide.
The imidization rate of the resin is 50% or more.
A method for producing a resin composition. - 下記一般式(8):
で表されるケイ素含有化合物と、その他の化合物を重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。 The following general formula (8):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds. - 3,3’-ジアミノジフェニルスルホン(33DAS)、
4,4’-ジアミノジフェニルスルホン(44DAS)、及び
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)
から選択される少なくとも一つの化合物と、
下記一般式(10):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。 3,3'-Diaminodiphenyl sulfone (33DAS),
4,4'-Diaminodiphenyl sulfone (44DAS), and 9,9-bis (4-aminophenyl) fluorene (BAFL)
With at least one compound selected from
The following general formula (10):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds. - 4,4’-オキシジフタル酸無水物(ODPA)、及び9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)から選択される少なくとも一つの化合物と、下記一般式(10):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミドを得た後、
その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。 At least one compound selected from 4,4'-oxydiphthalic anhydride (ODPA) and 9,9-bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF), and the following general formula ( 10):
After polycondensation reaction of the silicon-containing compound represented by (1) and other compounds to obtain polyimide,
A method for producing a resin composition, which comprises subjecting a resin composition containing a polyimide precursor and a polyimide by polycondensation reaction with other compounds. - 支持体の表面上に、請求項1~16のいずれか一項に記載の樹脂組成物、又は請求項17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ポリイミド樹脂膜の製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 1 to 16 or the resin composition obtained by the method according to any one of claims 17 to 21. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
A peeling step of peeling the polyimide resin film from the support,
A method for producing a polyimide resin film, including. - 前記剥離工程に先立って、前記支持体側から前記樹脂組成物にレーザーを照射する照射工程を含む、請求項22に記載のポリイミド樹脂膜の製造方法。 The method for producing a polyimide resin film according to claim 22, further comprising an irradiation step of irradiating the resin composition with a laser from the support side prior to the peeling step.
- 支持体の表面上に、請求項1~16のいずれか一項に記載の樹脂組成物、又は請求項17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
該素子が形成された該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ディスプレイの製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 1 to 16 or the resin composition obtained by the method according to any one of claims 17 to 21. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A peeling step of peeling the polyimide resin film on which the element is formed from the support,
How to make a display, including. - 支持体の表面上に、請求項1~16のいずれか一項に記載の樹脂組成物、又は請求項17~21のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
を含む、積層体の製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 1 to 16 or the resin composition obtained by the method according to any one of claims 17 to 21. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A method for manufacturing a laminate, including. - 前記素子が形成された前記ポリイミド樹脂膜を前記支持体から剥離する工程をさらに含む、請求項25に記載の積層体の製造方法。 The method for manufacturing a laminate according to claim 25, further comprising a step of peeling the polyimide resin film on which the element is formed from the support.
- 請求項25又は26に記載の方法により積層体を製造することを含む、フレキシブルデバイスの製造方法。 A method for manufacturing a flexible device, which comprises manufacturing a laminate by the method according to claim 25 or 26.
- 下記一般式(1)又は(2):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P1は、下記一般式(3):
前記P1又P2は、下記一般式(5):
で表されるケイ素含有化合物に由来する構成単位を含む、
樹脂組成物。 The following general formula (1) or (2):
A resin composition containing a resin of a structural unit represented by.
The P 1 is the following general formula (3):
Containing structural units derived from silicon-containing compounds represented by
Resin composition. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含む、
樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing structural units derived from silicon-containing compounds represented by
Resin composition. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
下記(ア)又は(イ):
(ア)前記P3及び/又はP5は、下記一般式(8):
(イ)前記P4及び/又はP6は、下記一般式(9):
のいずれかを満たす、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
It contains a structural unit derived from a silicon-containing compound represented by (a) or (b) below.
(A) The P 3 and / or P 5 is the following general formula (8):
A resin composition that satisfies any of the above. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5は、
3,3’-ジアミノジフェニルスルホン(33DAS)、又は
4,4’-ジアミノジフェニルスルホン(44DAS)
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and the P 3 and / or P 5 is
3,3'-diaminodiphenyl sulfone (33DAS), or 4,4'-diaminodiphenyl sulfone (44DAS)
A resin composition containing at least one structural unit derived from each of the above compounds. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P3及び/又はP5は、
9,9-ビス(4-アミノフェニル)フルオレン(BAFL)、又は
下記一般式:
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
Containing a structural unit derived from in the silicon-containing compound represented, and the P 3 and / or P 5 is
9,9-Bis (4-aminophenyl) fluorene (BAFL), or the following general formula:
A resin composition containing at least one structural unit derived from each of the above compounds. - 下記一般式(6)及び(7):
で表される構造単位の樹脂を含む、樹脂組成物であって、
前記P3又はP4が、下記一般式(10):
で表されるケイ素含有化合物に由来する構成単位を含み、かつ
前記P4及び/又はP6は、
4,4’-オキシジフタル酸無水物(ODPA)、
4,4’-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物(6FDA)、
9,9-ビス(3,4-ジカルボキシフェニル)フルオレン二酸無水物(BPAF)、
下記一般式:
下記一般式:
の各化合物に由来する構成単位を少なくとも一つ含む、樹脂組成物。 The following general formulas (6) and (7):
A resin composition containing a resin of a structural unit represented by.
The above P 3 or P 4 is the following general formula (10):
In comprising a structural unit derived from silicon-containing compound represented, and the P 4 and / or P 6 is
4,4'-Oxydiphthalic anhydride (ODPA),
4,4'-(Hexafluoroisopropylidene) diphthalic acid anhydride (6FDA),
9,9-Bis (3,4-dicarboxyphenyl) fluorene diic acid anhydride (BPAF),
The following general formula:
A resin composition containing at least one structural unit derived from each of the above compounds. - 前記P3が、前記一般式(10)で表される化合物に由来する構成単位を含み、
前記一般式(10)で表されるケイ素含有化合物の官能基当量が800以上である、請求項30~34のいずれか一項に記載の樹脂組成物。 The P 3 contains a structural unit derived from the compound represented by the general formula (10).
The resin composition according to any one of claims 30 to 34, wherein the silicon-containing compound represented by the general formula (10) has a functional group equivalent of 800 or more. - 前記P3が、前記一般式(10)で表される化合物に由来する構成単位を含み、かつ
前記一般式(10)において前記L1及びL2が、それぞれ独立に、アミノ基である、
請求項30~35のいずれか一項に記載の樹脂組成物。 The P 3 contains a structural unit derived from the compound represented by the general formula (10), and the L 1 and L 2 in the general formula (10) are independently amino groups.
The resin composition according to any one of claims 30 to 35. - 前記一般式(3)又は(8)で表される化合物が、全ジアミン(前記一般式(5)又は(10)で表される化合物を除く)を100mol%としたとき、50mol%より多い、請求項28、29及び31のいずれか一項に記載の樹脂組成物。 The compound represented by the general formula (3) or (8) is more than 50 mol% when the total diamine (excluding the compound represented by the general formula (5) or (10)) is 100 mol%. The resin composition according to any one of claims 28, 29 and 31.
- 前記樹脂を加熱して得られるポリイミド樹脂膜が、フレキシブル基板に用いられる、請求項28~37のいずれか一項に記載の樹脂組成物。 The resin composition according to any one of claims 28 to 37, wherein the polyimide resin film obtained by heating the resin is used for a flexible substrate.
- 前記樹脂を硬化して得られるポリイミド樹脂膜が、フレキシブルディスプレイに用いられる、請求項28~38のいずれか一項に記載の樹脂組成物。 The resin composition according to any one of claims 28 to 38, wherein the polyimide resin film obtained by curing the resin is used for a flexible display.
- 下記一般式(3):
3,3’-ジアミノジフェニルスルホン(33DAS)、及び
4,4’-ジアミノジフェニルスルホン(44DAS)、
から選択される少なくとも一つのジアミンと、
酸二無水物と、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させてポリイミド前駆体及び/又はポリイミドを提供することを含む、樹脂組成物の製造方法。 The following general formula (3):
3,3'-Diaminodiphenyl sulfone (33DAS), and 4,4'-diaminodiphenyl sulfone (44DAS),
With at least one diamine selected from,
Acid dianhydride and
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction of another compound to provide a polyimide precursor and / or a polyimide. - ジアミン(ただし、2,2 ’-ビス (トリフルオロメチル)-4,4’-ジアミノジフェニルエーテル(6FODA)を含まない)と酸二無水物を重縮合反応させてポリイミドを得た後、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。 After polycondensation reaction of diamine (however, 2,2'-bis (trifluoromethyl) -4,4'-diaminodiphenyl ether (6FODA) is not contained) and acid dianhydride to obtain polyimide,
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide. - 下記一般式(3):
3,3’-ジアミノジフェニルスルホン(33AS)、及び
4,4’-ジアミノジフェニルスルホン(44DAS)、
から選択される少なくとも一つのジアミンと、
酸二無水物と、
その他の化合物とを重縮合反応させてポリイミドを得た後、
下記一般式(5):
で表されるケイ素含有化合物と、その他の化合物とを重縮合反応させて、ポリイミド前駆体及びポリイミドを含む樹脂組成物を提供することを含む、樹脂組成物の製造方法。 The following general formula (3):
3,3'-Diaminodiphenyl sulfone (33AS), and 4,4'-diaminodiphenyl sulfone (44DAS),
With at least one diamine selected from,
Acid dianhydride and
After polycondensation reaction with other compounds to obtain polyimide,
The following general formula (5):
A method for producing a resin composition, which comprises subjecting a silicon-containing compound represented by (1) to a polycondensation reaction with another compound to provide a resin composition containing a polyimide precursor and a polyimide. - 支持体の表面上に、請求項28~39のいずれか一項に記載の樹脂組成物、又は請求項40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ポリイミド樹脂膜の製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 28 to 39 or the resin composition obtained by the method according to any one of claims 40 to 42. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
A peeling step of peeling the polyimide resin film from the support,
A method for producing a polyimide resin film, including. - 前記剥離工程に先立って、前記支持体側から前記樹脂組成物にレーザーを照射する照射工程を含む、請求項43に記載のポリイミド樹脂膜の製造方法。 The method for producing a polyimide resin film according to claim 43, which comprises an irradiation step of irradiating the resin composition with a laser from the support side prior to the peeling step.
- 支持体の表面上に、請求項28~39のいずれか一項に記載の樹脂組成物、又は請求項40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
該素子が形成された該ポリイミド樹脂膜を該支持体から剥離する剥離工程と、
を含む、ディスプレイの製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 28 to 39 or the resin composition obtained by the method according to any one of claims 40 to 42. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A peeling step of peeling the polyimide resin film on which the element is formed from the support,
How to make a display, including. - 支持体の表面上に、請求項28~39のいずれか一項に記載の樹脂組成物、又は請求項40~42のいずれか一項に記載の方法により得られた樹脂組成物を塗布する塗布工程と、
該樹脂組成物を加熱してポリイミド樹脂膜を形成する膜形成工程と、
該ポリイミド樹脂膜上に素子を形成する素子形成工程と、
を含む、積層体の製造方法。 Coating on the surface of the support by applying the resin composition according to any one of claims 28 to 39 or the resin composition obtained by the method according to any one of claims 40 to 42. Process and
A film forming step of heating the resin composition to form a polyimide resin film,
An element forming step of forming an element on the polyimide resin film and
A method for manufacturing a laminate, including. - 前記素子が形成された前記ポリイミド樹脂膜を前記支持体から剥離する工程をさらに含む、請求項46に記載の積層体の製造方法。 The method for manufacturing a laminate according to claim 46, further comprising a step of peeling the polyimide resin film on which the element is formed from the support.
- 請求項46又は47に記載の方法により積層体を製造することを含む、フレキシブルデバイスの製造方法。 A method for manufacturing a flexible device, which comprises manufacturing a laminate by the method according to claim 46 or 47.
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04108879A (en) * | 1990-08-30 | 1992-04-09 | Nippon Steel Chem Co Ltd | Polyimide resin coating agent composition |
WO2014098235A1 (en) * | 2012-12-21 | 2014-06-26 | 旭化成イーマテリアルズ株式会社 | Polyimide precursor and resin composition containing same |
WO2014148441A1 (en) * | 2013-03-18 | 2014-09-25 | 旭化成イーマテリアルズ株式会社 | Resin precursor, resin composition containing said resin precursor, resin film, method for producing said resin film, laminate, and method for producing said laminate |
JP2016162403A (en) * | 2015-03-05 | 2016-09-05 | 旭化成株式会社 | Optical member comprising polyimide as laminating adhesion layer |
WO2019065164A1 (en) * | 2017-09-26 | 2019-04-04 | 東レ株式会社 | Polyimide precursor resin composition, polyimide resin composition, polyimide resin film, production method for layered product, production method for color filter, production method for liquid crystal element, and production method for organic el element |
WO2019188305A1 (en) * | 2018-03-28 | 2019-10-03 | 三菱瓦斯化学株式会社 | Polyimide resin, polyimide varnish, and polyimide film |
WO2019208590A1 (en) * | 2018-04-23 | 2019-10-31 | 信越化学工業株式会社 | Silicon-containing compound |
WO2019211972A1 (en) * | 2018-05-01 | 2019-11-07 | 三菱瓦斯化学株式会社 | Polyimide resin, polyimide varnish, and polyimide film |
JP2019203120A (en) * | 2018-05-16 | 2019-11-28 | 旭化成株式会社 | Polyimide precursor resin composition |
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Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04108879A (en) * | 1990-08-30 | 1992-04-09 | Nippon Steel Chem Co Ltd | Polyimide resin coating agent composition |
WO2014098235A1 (en) * | 2012-12-21 | 2014-06-26 | 旭化成イーマテリアルズ株式会社 | Polyimide precursor and resin composition containing same |
WO2014148441A1 (en) * | 2013-03-18 | 2014-09-25 | 旭化成イーマテリアルズ株式会社 | Resin precursor, resin composition containing said resin precursor, resin film, method for producing said resin film, laminate, and method for producing said laminate |
JP2016162403A (en) * | 2015-03-05 | 2016-09-05 | 旭化成株式会社 | Optical member comprising polyimide as laminating adhesion layer |
WO2019065164A1 (en) * | 2017-09-26 | 2019-04-04 | 東レ株式会社 | Polyimide precursor resin composition, polyimide resin composition, polyimide resin film, production method for layered product, production method for color filter, production method for liquid crystal element, and production method for organic el element |
WO2019188305A1 (en) * | 2018-03-28 | 2019-10-03 | 三菱瓦斯化学株式会社 | Polyimide resin, polyimide varnish, and polyimide film |
WO2019208590A1 (en) * | 2018-04-23 | 2019-10-31 | 信越化学工業株式会社 | Silicon-containing compound |
WO2019211972A1 (en) * | 2018-05-01 | 2019-11-07 | 三菱瓦斯化学株式会社 | Polyimide resin, polyimide varnish, and polyimide film |
JP2019203120A (en) * | 2018-05-16 | 2019-11-28 | 旭化成株式会社 | Polyimide precursor resin composition |
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