WO2021187732A3 - Device and method for generating defective image - Google Patents

Device and method for generating defective image Download PDF

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Publication number
WO2021187732A3
WO2021187732A3 PCT/KR2020/019364 KR2020019364W WO2021187732A3 WO 2021187732 A3 WO2021187732 A3 WO 2021187732A3 KR 2020019364 W KR2020019364 W KR 2020019364W WO 2021187732 A3 WO2021187732 A3 WO 2021187732A3
Authority
WO
WIPO (PCT)
Prior art keywords
defective
defective image
generating
generating defective
image
Prior art date
Application number
PCT/KR2020/019364
Other languages
French (fr)
Korean (ko)
Other versions
WO2021187732A2 (en
Inventor
윤기욱
안정민
양우석
Original Assignee
라온피플 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 라온피플 주식회사 filed Critical 라온피플 주식회사
Priority to CN202080078506.8A priority Critical patent/CN114730462A/en
Publication of WO2021187732A2 publication Critical patent/WO2021187732A2/en
Publication of WO2021187732A3 publication Critical patent/WO2021187732A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/90—Dynamic range modification of images or parts thereof
    • G06T5/94—Dynamic range modification of images or parts thereof based on local image properties, e.g. for local contrast enhancement
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/90—Dynamic range modification of images or parts thereof
    • G06T5/92—Dynamic range modification of images or parts thereof based on global image properties
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30121—CRT, LCD or plasma display

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Processing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A defective image generation method performed by a defective image generation device according to an embodiment of the present invention comprises the steps of: generating a normal image by adjusting at least one of the color of a non-defective panel and the brightness of the non-defective panel; and changing the brightness with reference to a predetermined unit area in the normal image so as to generate a mura, and generating a defective image including the mura.
PCT/KR2020/019364 2020-03-18 2020-12-30 Device and method for generating defective image WO2021187732A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202080078506.8A CN114730462A (en) 2020-03-18 2020-12-30 Defect image generating device and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2020-0033071 2020-03-18
KR1020200033071A KR102372987B1 (en) 2020-03-18 2020-03-18 Apparatus and method for generating a defect image

Publications (2)

Publication Number Publication Date
WO2021187732A2 WO2021187732A2 (en) 2021-09-23
WO2021187732A3 true WO2021187732A3 (en) 2021-11-11

Family

ID=77771307

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2020/019364 WO2021187732A2 (en) 2020-03-18 2020-12-30 Device and method for generating defective image

Country Status (3)

Country Link
KR (1) KR102372987B1 (en)
CN (1) CN114730462A (en)
WO (1) WO2021187732A2 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140070822A (en) * 2012-11-27 2014-06-11 엘지디스플레이 주식회사 System and Method of inspecting Display Device
KR20140076963A (en) * 2012-12-13 2014-06-23 엘지디스플레이 주식회사 Apparatus and Method for Mura Defect Detection of Display Device
KR20160031142A (en) * 2014-09-11 2016-03-22 엘지디스플레이 주식회사 Mura Detecting Device
KR20190113018A (en) * 2018-03-27 2019-10-08 코오롱인더스트리 주식회사 Rainbow mura measuring apparatus
JP2020027424A (en) * 2018-08-10 2020-02-20 東京エレクトロンデバイス株式会社 Learning data generating device, discrimination model generating device, and program

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005156334A (en) * 2003-11-25 2005-06-16 Nec Tohoku Sangyo System Kk Pseudo defective image automatic creation device and imaging inspection device
JP6807869B2 (en) * 2015-12-24 2021-01-06 オリンパス株式会社 Image processing equipment, image processing methods and programs
KR102117563B1 (en) * 2018-05-16 2020-06-02 세종대학교산학협력단 Method for data extensions in image processing and apparatus thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140070822A (en) * 2012-11-27 2014-06-11 엘지디스플레이 주식회사 System and Method of inspecting Display Device
KR20140076963A (en) * 2012-12-13 2014-06-23 엘지디스플레이 주식회사 Apparatus and Method for Mura Defect Detection of Display Device
KR20160031142A (en) * 2014-09-11 2016-03-22 엘지디스플레이 주식회사 Mura Detecting Device
KR20190113018A (en) * 2018-03-27 2019-10-08 코오롱인더스트리 주식회사 Rainbow mura measuring apparatus
JP2020027424A (en) * 2018-08-10 2020-02-20 東京エレクトロンデバイス株式会社 Learning data generating device, discrimination model generating device, and program

Also Published As

Publication number Publication date
WO2021187732A2 (en) 2021-09-23
KR20210116913A (en) 2021-09-28
CN114730462A (en) 2022-07-08
KR102372987B1 (en) 2022-03-11

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