WO2021149228A1

WO2021149228A1 - Thickness measurement system, thickness measurement method, and thickness measurement program

Info

Publication number: WO2021149228A1
Application number: PCT/JP2020/002375
Authority: WO
Inventors: 萩原一成
Original assignee: 株式会社テイエルブイ
Priority date: 2020-01-23
Filing date: 2020-01-23
Publication date: 2021-07-29
Also published as: JP6725778B1; JPWO2021149228A1

Abstract

This invention achieves a thickness measurement system, thickness measurement method, and thickness measurement program that make it possible to preferentially inspect a location that needs particular attention. A thickness measurement system 1 comprises: a plurality of pulsed eddy current probes 2, an induced current detection unit 232, a measurement control unit 311, an attenuation analysis unit 312, a thickness calculation unit 411, and a measurement count allocation unit 412, wherein the measurement count allocation unit 412 is capable of allocating a total count of calculation processes that can be executed by the attenuation analysis unit 312 in a unit of time on the basis of corrosion rates that are the speeds at which the thickness decreases at each location under measurement, and the measurement control unit 311 is capable of controlling the pulsed eddy current probes 2 on the basis of the measurement execution counts allocated to each pulsed eddy current probe 2.

Description

Wall thickness measurement system, wall thickness measurement method, and wall thickness measurement program

This disclosure relates to a wall thickness measuring system, a wall thickness measuring method, and a wall thickness measuring program.

The pulse eddy current flaw detection method is widely used as a method for inspecting the presence or absence of scratches and wall thickness of a metal article to be inspected without destroying the article. In the pulsed eddy current flaw detection method, a probe (transmission coil) that generates a magnetic field by continuously passing an alternating current is brought close to the metal article to be measured to generate an eddy current, and the magnetic field generated by the eddy current is received by the probe (received). Detect by coil). Since the eddy current generated in the metal article reflects the presence or absence of scratches and the wall thickness of the article, the presence or absence of scratches and the wall thickness can be detected based on the signal detected by the probe. Attempts to improve the reliability of such a pulse eddy current flaw detection method are disclosed in, for example, Japanese Patent Application Laid-Open No. 2005-164593 (Patent Document 1) and Japanese Patent Application Laid-Open No. 2016-217991 (Patent Document 2). There is.

Japanese Patent Application Laid-Open No. 2005-164593 (or the corresponding US Patent Application Publication No. 2002/0190724) Japanese Patent Application Laid-Open No. 2016-217991

By the way, when trying to specify the wall thickness reduction rate of the article to be measured by the pulse eddy current flaw detection method, there is a problem that the wall thickness reduction rate of the metal article in a general case is small compared to the measurement error. That is, even if the measured value of the wall thickness decreases, it may not be possible to determine whether the wall thickness is actually decreasing or a measurement error. Therefore, in order to specify the wall thickness reduction rate, it is necessary to accumulate a considerable number of measured values and analyze them statistically.

On the other hand, when the wall thickness of the article to be measured is specified by the pulse eddy current flaw detection method, the calculation processing load is relatively large, so that a typical pulse eddy current flaw detection device requires several tens of minutes of calculation processing. Therefore, it is difficult to perform a large number of measurements in a short period of time, and it may take several months to accumulate the measured values of the number of times sufficient to specify the wall thickness reduction rate. However, in order to prevent problems that affect the operation of the equipment, it is necessary to identify the points requiring attention such as the places where the wall thickness decreases rapidly and the places where the wall thickness actually decreases. This is because it is necessary to focus on the specified points of interest.

Therefore, it is required to realize a wall thickness measurement system, a wall thickness measurement method, and a wall thickness measurement program that can preferentially inspect the parts that require special attention.

The wall thickness measuring system according to the present disclosure has a transmitting coil and a receiving coil, and detects a plurality of pulsed eddy current probes installed so as to abut each of different measurement points and an induced current generated in the receiving coil. A possible induced eddy current detection unit and a measurement control unit capable of controlling the pulse eddy current probe so that a pulse current flows through the transmission coil of one pulse eddy current probe selected from the plurality of pulse eddy current probes. An attenuation analysis unit capable of calculating the duration of the induced current, and a wall thickness calculation unit capable of calculating the wall thickness of the measurement point to which the selected pulse eddy current probe abuts based on the duration. A wall thickness measuring system including a measurement number distribution unit that distributes the total number of arithmetic processes that can be executed per unit period to the plurality of pulse eddy current probes. Can distribute the total number of times based on the collision rate, which is the rate of decrease of the wall thickness at each of the measurement points, and the measurement control unit executes the measurement distributed to each of the pulse eddy current probes. The pulse eddy current probe can be controlled based on the number of times.

Further, the wall thickness measuring method according to the present disclosure has a transmitting coil and a receiving coil, and one pulse eddy current probe selected from a plurality of pulse eddy current probes installed so as to abut each of different measurement points. A measurement control step of controlling the pulse eddy current probe so that a pulse current flows through the transmission coil, and an induction current detection step of detecting an induced current generated in the receiving coil of the selected pulse eddy current probe. , A decay analysis step for calculating the duration of the induced current, and a wall thickness calculation step for calculating the wall thickness of the measurement point to which the selected pulse eddy current probe abuts based on the duration, and a unit. A wall thickness measuring method including a measurement number distribution step of distributing the total number of the attenuation analysis steps that can be performed per period to a plurality of the pulsed eddy current probes, and the measurement is performed in the measurement number distribution step. The total number of times is distributed based on the collision rate, which is the rate of decrease of the wall thickness at each location, and in the measurement control step, the pulse eddy current is distributed based on the number of measurement executions distributed to each of the pulse eddy current probes. It is characterized by controlling the current probe.

Further, the wall thickness measurement program according to the present disclosure has a transmission coil and a reception coil, and one pulse vortex current probe selected from a plurality of pulse vortex current probes installed so as to abut on different measurement points. A measurement control function that controls the pulse vortex current probe so that a pulse current flows through the transmission coil, and an induction current detection function that detects an induction current generated in the reception coil of the selected pulse vortex current probe. , A decay analysis function that calculates the duration of the induced current, and a wall thickness calculation function that calculates the wall thickness of the point to be measured with which the selected pulsed vortex current probe abuts based on the duration. It is a wall thickness measurement program that causes a computer to execute a measurement number distribution function that distributes the total number of times of the attenuation analysis function that can be executed per period to a plurality of the pulse vortex current probes, and executes the measurement number distribution function. Occasionally, the total number of times is distributed based on the collision rate, which is the rate of decrease of the wall thickness at each of the points to be measured, and when the measurement control function is executed, the measurement execution is distributed to each of the pulsed eddy current probes. The pulse vortex current probe is controlled based on the number of times.

According to these configurations, the total number of measurements that can be performed per unit period is distributed based on the corrosion rate, so that points that require special attention can be preferentially inspected.

Hereinafter, preferred embodiments of the present disclosure will be described. However, the scope of the present disclosure is not limited by the preferred embodiments described below.

As one aspect, the wall thickness measuring system according to the present disclosure further includes a storage unit that can store the wall thickness calculated by the wall thickness calculation unit in association with identification information that identifies the measurement location. The storage unit can store the initial wall thickness, which is the initial wall thickness of the device to be measured, and the lower limit wall thickness, which is the lower limit wall thickness that cannot be used at the device to be measured. The wall thickness calculation unit can calculate the wall thickness reduction rate based on the calculated wall thickness, the initial wall thickness, and the lower limit wall thickness for each of the measurement points.
It is preferable that the measurement number distribution unit can distribute the total number of times based on the corrosion rate and the wall thickness reduction rate.

According to this configuration, the number of measurements is distributed in consideration of the wall thickness reduction rate, so that the current state of the measurement location is easily reflected in the number of measurements to be distributed.

In one aspect of the wall thickness measuring system according to the present disclosure, the measurement number distribution unit includes an even allocation portion that allocates the total number of times to all of the plurality of pulsed eddy current probes by the same number of times or more. The residual portion excluding the equal allocation portion from the total number of times can be divided into at least a priority allocation portion that distributes based on the coordination rate, and the measurement control unit can be divided into the equal allocation portion and the priority allocation portion. It is preferable that the pulsed eddy current probe can be controlled according to a predetermined number of executions.

According to this configuration, the minimum number of measurements can be secured for all the measured points.

As one aspect of the wall thickness measuring system according to the present disclosure, it is preferable that the measurement number distribution unit redistributes the total number of times at a predetermined review period.

According to this configuration, it is possible to detect at an early stage that the wall thinning behavior has changed due to a change in operating conditions or the like.

In one aspect of the wall thickness measurement system according to the present disclosure, the measurement control unit and the attenuation analysis unit are provided in the first device, and the wall thickness calculation unit and the measurement frequency distribution unit are the same as the first device. It is preferable that the first device is provided in the second device of another individual so that the duration can be sent to the second device.

According to this configuration, relatively simple information (duration) after the arithmetic processing is performed by the attenuation analysis unit having a large amount of arithmetic processing is transmitted, so that communication between the first apparatus and the second apparatus is performed. The amount can be reduced. In addition, the calculation of the wall thickness and the distribution of the number of measurements related to the plurality of first devices can be integrated into a single second device.

Further features and advantages of the present disclosure will be further clarified by the following illustration of exemplary and non-limiting embodiments described with reference to the drawings.

The figure which shows the outline of the wall thickness measurement system which concerns on embodiment Configuration diagram of the wall thickness measurement system according to the embodiment The figure which shows the example of the attenuation curve of an induced current

The wall thickness measurement system, the wall thickness measurement method, and the embodiment of the wall thickness measurement program according to the present disclosure will be described with reference to the drawings. Hereinafter, an example in which the wall thickness measuring system according to the present disclosure is applied to the wall thickness measuring system 1 for measuring the wall thickness of the pipe P installed in the chemical plant will be described.

[Overall configuration of wall thickness measurement system 1]
The wall thickness measuring system 1 according to the present embodiment includes a pulse eddy current probe 2, a hub terminal 3 (example of the first device), and a server device 4 (example of the second device) (FIG. 1). In the wall thickness measuring system 1, a plurality of pulse eddy current probes 2 are provided, and are installed so as to come into contact with different measurement points set in the pipe P for which the wall thickness is to be measured. The plurality of pulse eddy current probes 2 and the hub terminal 3 are connected by wire, and power is supplied and information communication is performed via the connection line L. The hub terminal 3 and the server device 4 are configured to enable wireless communication with each other.

[Pulse eddy current probe configuration]
The pulse eddy current probe 2 includes a transmitting coil 21, a receiving coil 22, and a microcontroller 23 (FIG. 2). The power supply control unit 231 of the microcontroller 23 controls the transmission coil 21 to flow a pulse current according to the control signal from the measurement control unit 311 of the hub terminal 3. When a pulse current flows through the transmission coil 21, a magnetic field is generated, and this magnetic field generates an induced current (eddy current) at a point to be measured with which the pulse eddy current probe 2 abuts.

The receiving coil 22 generates an induced current by the magnetic field generated by the induced current. The induced current detection unit 232 detects the induced current generated in the receiving coil 22. An example of the attenuation curve of the detected induced current is shown in FIG.

Each individual of the pulse eddy current probe 2 is identified by the identification information Id. The identification information Id can be set by using a DIP switch as 01, 02, 03, ... In order from the hub terminal 3, for example. In the present embodiment, since each pulse eddy current probe 2 is fixed to a different measurement point, the identification information Id is also identification information for identifying the measurement point. In the following description, the measured location where the pulse eddy current probe 2 specified by the identification information Id is installed may be simply referred to as the measured location specified by the identification information Id.

In the following description, a series of operations in which the power supply control unit 231 controls the transmission coil 21 to flow a pulse current and the induced current detection unit 232 detects the induced current generated in the receiving coil 22 is described as "measurement. It may be said to "execute".

[Hub terminal configuration]
The hub terminal 3 has a hub-side arithmetic unit 31 and a hub-side communication unit 32 (FIG. 2). The hub-side arithmetic unit 31 is an arithmetic unit including a measurement control unit 311 and an attenuation analysis unit 312, and is implemented as, for example, a microcontroller. The hub terminal 3 operates by receiving power supply from a power source (not shown), and also supplies power to each pulse eddy current probe 2.

The measurement control unit 311 controls which of the plurality of pulse eddy current probes 2 is used to perform wall thickness measurement. Specifically, one pulse eddy current probe 2 is selected from the plurality of pulse eddy current probes 2, and a control signal instructing the transmission coil 21 of the selected pulse eddy current probe 2 to flow a pulse current is transmitted. .. The control signal includes identification information Id that identifies the selected pulsed eddy current probe 2. The microcontroller 23 of the selected pulse eddy current probe 2 recognizes that the control signal is addressed to itself based on the identification information Id, and executes control to flow a pulse current through the transmission coil 21.

The measurement control unit 311 controls the pulse eddy current probe 2 based on the measurement execution number Pn (described later) calculated by the measurement number distribution unit 412 of the server device 4. The measurement control unit 311 determines the pulse eddy current probe so that the pulse current flows sequentially through the transmission coils 21 of the plurality of pulse eddy current probes 2 so that the number of measurement executions Pn distributed to each pulse eddy current probe 2 is satisfied. 2 is controlled.

The attenuation analysis unit 312 calculates the duration τ of the induced current detected by the induced current detection unit 232. The attenuation curve of the induced current (FIG. 3) is divided into a linear portion S1 that attenuates linearly and a curved portion S2 that exhibits a steeper attenuation than the linear portion S1. The attenuation analysis unit 312 analyzes the shape of the attenuation curve, identifies the time at the boundary between the straight line portion S1 and the curved portion S2, and determines the duration τ based on this.

Since the arithmetic processing for determining the duration τ has a relatively large arithmetic load, the capability of the entire wall thickness measuring system 1 is determined by the arithmetic speed of the attenuation analysis unit 312. Specifically, for example, the number of measurements that the wall thickness measuring system 1 can perform per day is the value obtained by dividing 24 hours (1440 minutes) by the time required for the attenuation analysis unit 312 to perform the arithmetic processing for each measurement. ..

The hub-side communication unit 32 is configured to be able to communicate with the server-side communication unit 43 of the server device 4. The hub-side communication unit 32 used the identification information Id for identifying the pulse eddy current probe 2 selected by the measurement control unit 311 and the measurement date and time (thickness Tc) in the duration τ calculated by the attenuation analysis unit 312. The date and time when the duration τ was measured. The same shall apply hereinafter), and the signal is sent to the server device 4. In addition, a measurement number table representing the measurement execution number Pn of each pulse eddy current probe 2 determined by the measurement number distribution unit 412 is received.

[Server device configuration]
The server device 4 includes a server-side arithmetic unit 41, a storage unit 42, and a server-side communication unit 43 (FIG. 2). The server-side arithmetic unit 41 is an arithmetic unit including a wall thickness arithmetic unit 411 and a measurement number distribution unit 412, and is implemented as, for example, a CPU.

The wall thickness Tc and the duration τ calculated by the wall thickness calculation unit 411 are stored in the storage unit 42 in association with the identification information Id that identifies the measurement location (pulse eddy current probe 2) and the measurement date and time. There is. Further, in the storage unit 42, for each measurement point, the initial wall thickness Ta, which is the initial wall thickness at which the pipe P is installed, and the lower limit wall thickness, which cannot be used at the measurement point, are used. A certain lower limit wall thickness Tb is stored. The initial wall thickness Ta and the lower limit wall thickness Tb are associated with the identification information Id.

The server-side communication unit 43 is configured to be able to communicate with the hub-side communication unit 32 on the hub terminal 3 side. The server-side communication unit 43 sends a measurement number table representing the measurement execution number Pn of each pulse eddy current probe 2 determined by the measurement number distribution unit 412 to the hub terminal 3. In addition, the duration τ calculated by the attenuation analysis unit 312 is received.

[Calculation processing by the wall thickness calculation unit]
The wall thickness calculation unit 411 calculates the wall thickness Tc of the measurement point specified by the identification information Id based on the duration τ sent from the hub terminal 3. Specifically, based on the fact that the duration τ and the wall thickness Tc are generally in a proportional relationship, the wall thickness Tc is calculated using the proportional relationship. The calculated wall thickness Tc is stored in the storage unit 42 in association with the identification information Id and the measurement date and time.

In addition, the wall thickness calculation unit 411 calculates the corrosion rate Cc, which is the rate of decrease in wall thickness, based on the wall thickness calculated in the past multiple measurement opportunities (for example, in the last year). Corrosion rate Cc is expressed as a numerical value per year in the amount of decrease in wall thickness (in mm). The calculated corrosion rate Cc is stored in the storage unit 42 in association with the identification information Id and the calculated date and time.

Further, the wall thickness calculation unit 411 calculates the wall thickness reduction rate Tg (%) based on the initial wall thickness Ta, the lower limit wall thickness Tb, and the calculated wall thickness Tc. Tg is given by the following formula (1).
Tg = (Tc-Tb) / (Ta-Tb) x 100 (1)
The calculated wall thickness reduction rate Tg is stored in the storage unit 42 in association with the identification information Id and the measurement date and time.

[Calculation processing by the measurement frequency distribution unit]
The measurement number distribution unit 412 determines the number of times to execute the wall thickness measurement for each of the plurality of pulse eddy current probes 2 based on the colossion rate Cc and the wall thickness reduction rate Tg accumulated in the storage unit 42. The measurement frequency distribution unit 412 first calculates the measurement priority value Ma for each pulse eddy current probe 2 according to the following equation (2).
Ma = Tg × (Cc / Cg) (2)
In the formula (2), Cg represents a predetermined reference value per year for the amount of decrease in wall thickness (in mm). The calculated measurement priority value Ma is stored in the storage unit 42 in association with the identification information Id and the measurement date and time.

Here, as is clear from the equation (2), the measurement priority value Ma is proportional to the wall thinning thickness ratio Tg and the corrosion rate Cc. That is, the measurement priority value Ma becomes large at the measured portion (the Tg is large) and the measured portion (the Cc is large) where the wall thickness reduction rate is large at the present time.

Further, the measurement frequency distribution unit 412 calculates the total measurement priority value Msum, which is the sum of the measurement priority values Ma for all the pulse eddy current probes 2. The total measurement priority value Msum is stored in the storage unit 42 in association with the measurement date and time.

By the way, the total number of measurements that the wall thickness measuring system 1 according to the present embodiment can perform per day (example of a unit period) is determined by the total number of arithmetic processes that the attenuation analysis unit 312 can perform per day. NS. Therefore, the total number of times is expressed as 1440 / t times by using the time t (minutes) required for each arithmetic processing by the attenuation analysis unit 312. The measurement frequency distribution unit 412 allocates the number of executions of 1440 / t times to all the pulse eddy current probes 2 once, and the remaining portion excluding the equal allocation portion from 1440 / t times. Divide into a certain priority allocation part. Here, assuming that n pulse eddy current probes 2 are installed, the equal allocation portion of the number of executions is n times, and the priority allocation portion is 1440 / tun times.

The measurement number distribution unit 412 calculates the measurement execution number Pn of each pulse eddy current probe 2 according to the following equation (3).
Pn = ROUND ((1440 / tun) x Ma / Msum) + 1 (3)
The calculated measurement execution number Pn is stored in the storage unit 42 in association with the identification information Id and the measurement date and time.

Here, a specific example of arithmetic processing by the measurement frequency distribution unit 412 is shown. In this specific example, 25 pulse eddy current probes 2 are installed (n = 25), and the wall thinning thickness ratio Tg and the corrosion rate Cc of the measured points of each pulse eddy current probe 2 are as shown in Table 1. be. The 25 pulse eddy current probes 2 are numbered 1 to 25 as the identification information Id. Further, in Table 1, for each pulsed eddy current probe 2 (measured point), the predetermined reference value Cg per year of the wall thickness reduction amount is set to 1.0, and the calculation process by the attenuation analysis unit 312 is performed once. The measurement priority value Ma calculated with the time t required per time as 20 minutes and the measurement execution number Pn are also shown. In Table 1, first, the measurement execution counts Pn are sorted in descending order, and when the measurement execution counts Pn are equal, the measurement priority value Ma is sorted in descending order.

In Table 1, for example, the thickness reduction rate Tg of No. 15 is medium (60%), but the corrosion rate Cc is particularly high (1.5 mm / year), so the measurement priority value Ma is large. , The number of measurement executions Pn is distributed in large numbers. Further, at the 9th measurement point, the corrosion rate Cc is medium (0.9 mm / year), but the wall thickness reduction rate Tg is large (90%), so the measurement priority value Ma is large and the number of measurement executions is large. A large amount of Pn is distributed. On the contrary, at the first measurement point, since the wall thinning thickness ratio Tg and the corrosion rate Cc are small, the measurement priority value Ma is small and the distribution of the number of measurement executions Pn is small. That is, the places where the wall thinning rate is large and approaching the usage limit (for example, Nos. 9 and 8), and the places where the wall thinning rate is large but the recent wall thinning rate is fast (for example, Nos. 15 and 14). The measurement priority value Ma of the locations corresponding to (number) or both is calculated to be large, and the number of measurement executions Pn of these locations is large.

As shown in the example shown in Table 1, the measurement number table in which the measurement priority value Ma and the measurement execution number Pn are associated with the identification information Id of each pulse eddy current probe 2 by the arithmetic processing by the measurement number distribution unit 412. Is generated. This measurement number table is sent to the hub terminal 3 via the server-side communication unit 43.

[Execution of wall thickness measurement based on the number of measurements table]
Based on the measurement number table received by the hub-side communication unit 32, the measurement control unit 311 executes the measurement in descending order of the measurement priority value Ma in the measurement number table. In the example of Table 1, the measurement is executed in the order of No. 15, No. 9, No. 14, .... At this time, at the same time as the measurement is executed, the value of the measurement execution number Pn on the measurement number table is decremented by 1. Table 2 shows a table of the number of measurements at the time when each measurement was performed for each pulse eddy current probe 2.

The measurement control unit 311 continues to execute the measurement in the measurement number table in descending order of the measurement priority value Ma in the same manner as described above. That is, the second measurement is executed in the order of No. 15, No. 9, No. 14, .... However, the measurement is not executed for the pulse eddy current probe 2 in which the number of measurement executions Pn is 0. In the example of Table 2, the second measurement of the No. 3, No. 19, No. 2, and No. 1 pulse eddy current probe 2 is not performed, and after the second measurement of the No. 10 pulse eddy current probe 2. The third measurement of the 15th pulse eddy current probe 2 is performed.

Here, the total value of the number of measurement executions Pn in the entire measurement number table is equal to the total number of measurements that the wall thickness measurement system 1 can perform, for example, per day. Therefore, for example, when the measurement of one day is completed, the measurement of the number of measurement executions Pn distributed to each pulse eddy current probe 2 is executed in the first received measurement number table (Table 1), and all the pulse eddy current probes. The number of measurement executions Pn of 2 becomes 0. At this time, the measurement control unit 311 acquires a new measurement number table from the server device 4, and executes the measurement for the next day based on the updated measurement number table.

Correspondingly, the measurement number distribution unit 412 regenerates the measurement number table, for example, every day (example of a predetermined review period). Therefore, the measurement count table is updated to reflect the latest wall thickness measurement results, for example, once a day. Thereby, the number of measurements in the daily measurement is determined by reflecting the latest (previous day) wall thickness measurement result.

[Effect of this embodiment]
Although omitted in the above explanation for the sake of simplicity, there are two problems in calculating the corrosion rate Cc. The first problem is that the wall thickness measurement using the pulsed eddy current includes a certain error. The second problem is that the wall thickness reduction of the pipe P is about several millimeters every year even when the reduction rate is fast, and the degree is smaller than the measurement error. Due to the existence of these problems, it is necessary to accumulate a considerable number of measured values and analyze them statistically in order to calculate a significant corrosion rate Cc. For example, if the initial wall thickness is 12 mm and the measurement error is ± 0.2%, it takes about 50 to 60 measurements to calculate a significant corrosion rate Cc.

On the other hand, as described above, the total number of measurements that the wall thickness measuring system 1 can perform per day is limited, and the total number of measurements is, for example, about 60 to 80 times per hub terminal 3. Further, for example, about 20 to 30 pulse eddy current probes 2 are connected to one hub terminal 3. Therefore, if the total number of times that the measurement can be performed is evenly assigned to all the measured points, the time required for a significant number of measured values to be accumulated for the points requiring attention where the wall thickness ratio Tg or the corrosion rate Cc is large. Will be long. Therefore, the detection of serious defects that may lead to damage to the piping may be delayed.

Therefore, according to the wall thickness measurement system 1 according to the present embodiment, the number of measurements is preferentially assigned to the points requiring attention, so that the period until the required number of measurements are performed for the points requiring attention is shortened. As a result, the wall thinning thickness ratio Tg is frequently calculated for the points requiring attention, and the period until a significant corrosion rate Cc is calculated is shortened. Therefore, it is easy to detect a defect in the piping at an early stage.

Also in the wall thickness measurement system 1 according to the present embodiment, the number of measurement executions is evenly distributed to the plurality of pulse eddy current probes 2 until a significant cologulation rate Cc is calculated for each measurement point. ..

[Other Embodiments]
Finally, other embodiments of the wall thickness measuring system, the wall thickness measuring method, and the wall thickness measuring program according to the present disclosure will be described. The configurations disclosed in each of the following embodiments can be applied in combination with the configurations disclosed in other embodiments as long as there is no contradiction.

In the above embodiment, the wall thickness measuring system 1 including the pulse eddy current probe 2, the hub terminal 3, and the server device 4 has been described as an example. However, the present disclosure may also be a program that causes a computer to perform a function similar to that of the above embodiment.

In the above embodiment, a configuration in which the number of measurement executions Pn is calculated based on the wall thickness reduction rate Tg and the corrosion rate Cc has been described as an example. However, without being limited to such a configuration, in the wall thickness measuring system according to the present disclosure, the measurement number distribution unit may distribute the total number of times by any method as long as it is based on the corrosion rate.

In the above embodiment, the configuration in which the attenuation analysis unit 312 distributes the total number of arithmetic processes that can be executed per day to each pulse eddy current probe 2 has been described as an example. However, in the wall thickness measuring system according to the present disclosure, the unit period as a reference for the total number of times distributed to each pulse eddy current probe is not limited to one day, for example, 12 hours, two days, one week, one month, etc. Can be.

In the above embodiment, the configuration in which the measurement number distribution unit 412 divides the total number of measurements that can be performed per day into an equal allocation portion and a priority allocation portion has been described as an example. However, in the wall thickness measuring system according to the present disclosure, the even allocation portion does not necessarily have to be provided.

In the above embodiment, the configuration in which the even allocation portion is a portion in which the number of times of execution of measurement is allocated once to all the pulse eddy current probes 2 has been described as an example. However, when the even allocation portion is provided in the wall thickness measurement system according to the present disclosure, the number of allocations for each pulse eddy current probe may be once or a plurality of times.

In the above embodiment, a configuration in which the measurement count table is regenerated every day has been described as an example. However, without being limited to such a configuration, the total number of redistributions may or may not be performed in the wall thickness measuring system according to the present disclosure. When the total number of times is recalculated, the review period, which is the interval for the recalculation, is arbitrary. If the review period is shortened, the calculation load will increase, but it will be easier to detect defects at an early stage. The review period may be the same as or different from the unit period that serves as a reference for the total number of times to be distributed to each pulse eddy current probe.

In the above embodiment, the pulse eddy current probe 2 is provided with the power supply control unit 231 and the induced current detection unit 232, the hub terminal 3 is provided with the measurement control unit 311 and the attenuation analysis unit 312, and the server device 4 is provided with the server device 4. The configuration in which the wall thickness calculation unit 411 and the measurement number distribution unit 412 are provided has been described as an example. However, without being limited to such a configuration, in the wall thickness measuring system according to the present disclosure, a power supply control unit, an induced current detection unit, a measurement control unit, an attenuation analysis unit, a wall thickness calculation unit, and a measurement frequency distribution unit. The distribution of the equipment to be provided is arbitrary. For example, the power supply control unit, the induced current detection unit, and the measurement control unit may be provided in the first device, and the attenuation analysis unit, the wall thickness calculation unit, and the measurement frequency distribution unit may be provided in the second device. Further, the power supply control unit, the induced current detection unit, the measurement control unit, the attenuation analysis unit, the wall thickness calculation unit, and the measurement frequency distribution unit may all be provided in one device.

In the above embodiment, an example in which the pulse eddy current probe 2 and the hub terminal 3 are connected by wire and the hub terminal 3 and the server device 4 are configured to enable wireless communication has been described. However, when the wall thickness measuring system according to the present disclosure is composed of a plurality of devices, the connection between the devices may be a wired connection or a wireless connection. For example, instead of the connection line L in the above embodiment, a wireless communication module that enables wireless communication between the pulse eddy current probe 2 and the hub terminal 3 (first device) may be provided. In this case, a battery may be mounted on the pulse eddy current probe 2 in order to supply the power required for the operation of the pulse eddy current probe 2.

In the above embodiment, the configuration in which the measurement control unit 311 executes the measurement in descending order of the measurement priority value Ma has been described as an example. However, without being limited to such a configuration, as long as the pulse eddy current probe is controlled based on the number of measurement executions distributed to each pulse eddy current probe in the wall thickness measuring system according to the present disclosure. The order is not limited. For example, based on the measurement count table illustrated in Table 1, the measurement of No. 15 is performed 6 times, the measurement of No. 9 is performed 5 times, the measurement of No. 14 is performed 5 times, and so on. May be good.

In the above embodiment, an example is shown in which the identification information Id for identifying each individual of the pulse eddy current probe 2 is set by using a DIP switch. Other examples of information that can be used as identification information in the wall thickness measurement system according to the present disclosure include a method of using the MAC address of a module constituting the pulse eddy current probe.

It should be understood that with respect to other configurations, the embodiments disclosed herein are exemplary in all respects and the scope of this disclosure is not limited thereto. Those skilled in the art will easily understand that modifications can be made as appropriate without departing from the spirit of the present disclosure. Therefore, another embodiment modified without departing from the spirit of the present disclosure is, of course, included in the scope of the present disclosure.

The present disclosure can be used, for example, in a wall thickness measuring system for measuring the wall thickness of a pipe.

1: Wall thickness measurement system 2: Pulse eddy current probe 21: Transmit coil 22: Receive coil 23: Microcontroller 231: Power supply control unit 232: Inductive current detection unit 3: Hub terminal 31: Hub side arithmetic unit 311: Measurement control unit 312: Attenuation analysis unit 32: Hub side communication unit 4: Server device 41: Server side arithmetic unit 411: Wall thickness calculation unit 412: Measurement frequency distribution unit 42: Storage unit 43: Server side communication unit S1: Inductive current attenuation curve Straight part S2: Curved part of induced current decay curve τ: Duration P: Piping L: Connection line

Claims

A plurality of pulsed eddy current probes having a transmitting coil and a receiving coil and installed so as to contact different measurement points.
An induced current detection unit that can detect the induced current generated in the receiving coil,
A measurement control unit capable of controlling the pulse eddy current probe so that a pulse current flows through the transmission coil of one pulse eddy current probe selected from the plurality of pulse eddy current probes.
An attenuation analysis unit that can calculate the duration of the induced current,
A wall thickness calculation unit capable of calculating the wall thickness of the measurement point to which the selected pulse eddy current probe abuts based on the duration, and a wall thickness calculation unit.
A wall thickness measuring system including a measurement number distribution unit that distributes the total number of arithmetic processes that can be executed per unit period to a plurality of the pulse eddy current probes.
The measurement number distribution unit can distribute the total number of times based on the corrosion rate, which is the rate of decrease of the wall thickness at each of the measurement points.
The measurement control unit is a wall thickness measurement system capable of controlling the pulse eddy current probe based on the number of measurement executions distributed to each of the pulse eddy current probes.
A storage unit that can store the wall thickness calculated by the wall thickness calculation unit in association with identification information that identifies the measurement location is further provided.
The storage unit stores, for each of the measurement points, an initial wall thickness which is the initial wall thickness at the time of installation and a lower limit wall thickness which is a lower limit wall thickness that cannot be used at the measurement point. It is possible and
The wall thickness calculation unit can calculate the wall thickness reduction rate based on the calculated wall thickness, the initial wall thickness, and the lower limit wall thickness for each of the measurement points.
The wall thickness measuring system according to claim 1, wherein the measurement number distribution unit can distribute the total number of times based on the corrosion rate and the wall thickness reduction rate.
The measurement number distribution unit allocates the same number of times to all of the plurality of pulse eddy current probes one or more times, and the remaining portion obtained by removing the equal allocation portion from the total number of times. It can be divided into at least a priority allocation portion to be distributed based on the corrosion rate.
The wall thickness measuring system according to claim 1 or 2, wherein the measurement control unit can control the pulse eddy current probe according to the number of executions determined for the equal allocation portion and the priority allocation portion.
The wall thickness measuring system according to any one of claims 1 to 3, wherein the measurement number distribution unit redistributes the total number of times at a predetermined review period.
The measurement control unit and the attenuation analysis unit are provided in the first apparatus.
The wall thickness calculation unit and the measurement frequency distribution unit are provided in a second device that is separate from the first device.
The wall thickness measuring system according to any one of claims 1 to 4, wherein the first device is configured so that the duration can be sent to the second device.
A pulse current flows through the transmit coil of one pulse eddy current probe having a transmit coil and a receive coil and selected from a plurality of pulse eddy current probes installed so as to abut each of different measurement points. A measurement control step for controlling the pulsed eddy current probe and
An induced current detection step for detecting an induced current generated in the receiving coil of the selected pulsed eddy current probe, and an induced current detection step.
Attenuation analysis step for calculating the duration of the induced current and
A wall thickness calculation step of calculating the wall thickness of the measurement point to which the selected pulse eddy current probe abuts based on the duration, and a wall thickness calculation step.
A wall thickness measuring method including a measurement number distribution step of distributing the total number of times of the attenuation analysis step that can be performed per unit period to a plurality of the pulsed eddy current probes.
In the measurement number distribution step, the total number of times is distributed based on the corrosion rate, which is the rate of decrease of the wall thickness at each of the measurement points.
A wall thickness measuring method for controlling the pulsed eddy current probe based on the number of measurement executions distributed to each of the pulsed eddy current probes in the measurement control step.
A pulse current flows through the transmit coil of one pulse eddy current probe having a transmit coil and a receive coil and selected from a plurality of pulse eddy current probes installed so as to abut each of different measurement points. A measurement control function that controls the pulsed eddy current probe and
An induced current detection function that detects an induced current generated in the receiving coil of the selected pulsed eddy current probe, and an induced current detection function.
Attenuation analysis function that calculates the duration of the induced current and
A wall thickness calculation function that calculates the wall thickness of the measurement point to which the selected pulse eddy current probe abuts based on the duration, and
It is a wall thickness measurement program that causes a computer to execute a measurement number distribution function that distributes the total number of times of the attenuation analysis function that can be executed per unit period to a plurality of the pulsed eddy current probes.
When the measurement number distribution function is executed, the total number of times is distributed based on the corrosion rate, which is the rate of decrease of the wall thickness at each of the measurement points.
A wall thickness measurement program in which the pulse eddy current probe is controlled based on the number of measurement executions distributed to each of the pulse eddy current probes when the measurement control function is executed.