WO2021128313A1

WO2021128313A1 - Automatic sample injection system, sample analysis system, and method for control of automatic sample injection

Info

Publication number: WO2021128313A1
Application number: PCT/CN2019/129355
Authority: WO
Inventors: 李爱博; 刘洋; 杨晓楠
Original assignee: 深圳迈瑞生物医疗电子股份有限公司; 北京深迈瑞医疗电子技术研究院有限公司
Priority date: 2019-12-27
Filing date: 2019-12-27
Publication date: 2021-07-01
Also published as: CN114008459A

Abstract

An automatic sample injection device (1), a sample analysis system, and a method for control of automatic sample injection. The automatic sample injection device (1) comprises a feeding channel (10), a loading area (20), a storage area (30), an urgent area (40), and a transfer dispatching mechanism (50). A sample suction position (10a) of the feeding channel (10) is located between the loading area (20) and the storage area (30). A sample frame moving from the loading area (20) to the feeding channel (10) moves in a first direction to the sample suction position (10a), and a sample frame taking out from the storage area (30) by the transfer dispatching mechanism (50) and moving to the feeding channel (10) moves in a direction opposite to the first direction to the sample suction position (10a).

Description

Automatic sampling system, sample analysis system and automatic sampling control method

Technical field

The invention relates to an automatic sampling system, a sample analysis system and an automatic sampling control method.

Background technique

Analytical equipment, such as biochemical analyzers, immunoassay analyzers, and cell analyzers, are instruments used to analyze and determine samples. Generally, reagents are added to the samples, and the samples that react with the reagents are measured in a certain way. Get the chemical composition and concentration in the sample.

There are roughly three types of institutions used to supply samples for analytical equipment. The first is to set a fixed sample position in the analysis equipment. When a sample needs re-inspection, it is directly re-sucked into a fixed sample location for re-inspection, which can meet the needs of priority processing for sample re-inspection; however, this type of sample supply organization is not suitable for mass sample testing. The second sample supply method is to set up a sample backup in the analysis equipment. When the sample needs to be retested, a sample is drawn from the sample backup for retesting. This type of organization is also not suitable for mass sample testing. The third sample supply method is to set up a sample scheduling system independent of the analysis equipment, which can be flexibly designed into a system with different scheduling capabilities according to the number of samples, and can be adapted to mass sample testing. However, the current sample scheduling system generally has re-inspection and emergency samples that need to be dispatched to the put-in area for queuing, which makes the output efficiency of the test results of re-inspection and emergency samples low, and cannot meet the current needs of priority processing for re-inspection and emergency. .

Summary of the invention

technical problem

The invention mainly provides an automatic sampling system, a sample analysis system and an automatic sampling control method.

The solution to the problem

Technical solutions

According to the first aspect, an embodiment provides an automatic sampling device, including:

A feed channel, the feed channel is arranged along the first direction, and is used to carry the sample rack and allow the sample rack to move on the feed channel along its length; the feed channel is also provided with a sample suction position , Used for the sample on the sample rack to be aspirated when the sample on the sample rack is located at the sample aspiration position of the feeding channel;

The loading area, the loading area is connected with the feeding channel, and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to move in the second direction to the feeding channel and then along the first direction. Move to the suction position in one direction;

A buffer area, the buffer area is used to hold a sample rack waiting for the test result after sample aspiration and/or a sample rack storing emergency samples;

The transfer scheduling mechanism is used to schedule the sample racks between the buffer area and the feed channel, so that the sample racks with sample suction are moved out of the feed channel and then moved into the buffer area to wait for the test result. When the sample is tested When the result indicates that the sample needs to be re-examined, the corresponding sample rack in the buffer area is removed from the buffer area and moved into the feeding channel, or when an emergency instruction input by the user is received, the buffer area is combined with The sample rack corresponding to the emergency instruction is moved out of the buffer area and moved into the feeding channel;

Wherein, the sample suction position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves to the sample suction position in the first direction , The sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel is moved to the sample suction position in a direction opposite to the first direction.

According to a second aspect, an embodiment provides a sample analysis system, including: an automatic sampling device, and an analysis device that aspirates and analyzes a sample from a sample rack supplied by the automatic sampling device, wherein the The automatic sampling device includes:

A feed channel, the feed channel is arranged along the first direction, and is used to carry the sample rack and allow the sample rack to move on the feed channel along its length; the feed channel is also provided with a sample suction position , When the sample on the sample rack is located at the sample suction position of the feed channel, the sample suction device of the analysis system sucks the sample;

The transfer scheduling mechanism is used to schedule the sample racks between the buffer area and the feed channel, so that the sample racks with sample suction are moved out of the feed channel and then moved into the buffer area to wait for the test result. When the sample is tested The result indicates that when the sample needs to be re-examined, the corresponding sample rack in the buffer area is removed from the buffer area and moved into the feeding channel. When the emergency instruction input by the user is received, the buffer area is connected to the emergency department. The sample rack corresponding to the instruction is moved out of the buffer area and moved into the feeding channel;

Wherein, the sample suction position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves to the sample suction position in the first direction , The sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel is moved to the sample suction position in a direction opposite to the first direction;

The automatic sample introduction device is arranged on one side of the analysis equipment, and the first direction is consistent with the length direction of the analysis equipment; the loading area and the buffer area are located on the first side of the feeding channel, The analysis equipment is located on a second side of the automatic sample introduction device opposite to the first side.

According to a third aspect, an embodiment provides a method for automatic sample injection control, including:

Steps of placing the sample rack: controlling the movement of the sample rack from the loading area to the feeding channel in the second direction;

Sample rack feeding step: control the sample rack to move in the first direction along the feed channel to a sample suction position on the feed channel for sample aspiration;

Sample rack buffer step: control the transfer scheduling mechanism to move the sample rack that has finished aspirating and moved out of the feed channel to the buffer area in the direction opposite to the second direction, and drive the sample rack to move in the same or opposite direction as the first direction Cache area to wait for test results;

Re-inspection step: When the test result of the sample indicates that the sample needs to be re-inspected, control the transfer scheduling mechanism to take out the sample rack corresponding to the re-inspection instruction in the buffer area in the opposite or same direction as the first direction, and then follow the first direction. The two directions are dispatched to the feeding channel to move along the feeding channel in a direction opposite to the first direction to the sample aspiration position for sample aspiration.

The beneficial effects of the invention

Brief description of the drawings

Description of the drawings

Fig. 1 is a schematic structural diagram of an automatic sampling device according to an embodiment;

Fig. 2 is a schematic structural diagram of an automatic sample introduction device according to another embodiment;

Figure 3 is a perspective view of the sample rack;

Figure 4 is a schematic view of the structure of the feed channel of an embodiment;

Figure 5 is a schematic diagram of the structure of an embodiment of the reciprocating feed mechanism;

FIG. 6 is a schematic structural diagram of an automatic sampling device according to another embodiment;

FIG. 7 is a schematic diagram of the structure of a buffer area according to an embodiment;

FIG. 8 is a schematic diagram of the structure of an automatic sampling device according to another embodiment;

FIG. 9 is a schematic diagram of the structure of two channel ports of the feed channel according to an embodiment;

FIG. 10 is a schematic diagram of the structure of a transit scheduling mechanism according to an embodiment;

FIG. 11 is a schematic structural diagram of an automatic sampling device according to another embodiment;

FIG. 12 is a schematic structural diagram of a sample analysis system according to an embodiment;

FIG. 13 is a flowchart of a method for automatic sample injection control according to an embodiment;

FIG. 14 is a flowchart of a method for automatic sample injection control according to another embodiment;

FIG. 15 is a flowchart of a method for automatic sample injection control according to another embodiment;

Fig. 16 is a flowchart of a method for automatic sample injection control according to another embodiment.

Invention embodiment

Embodiments of the present invention

Hereinafter, the present invention will be further described in detail through specific embodiments in conjunction with the accompanying drawings. Among them, similar elements in different embodiments use related similar element numbers. In the following embodiments, many detailed descriptions are used to make this application better understood. However, those skilled in the art can easily realize that some of the features can be omitted under different circumstances, or can be replaced by other elements, materials, and methods. In some cases, some operations related to this application are not shown or described in the specification. This is to avoid the core part of this application being overwhelmed by excessive descriptions. For those skilled in the art, these are described in detail. Related operations are not necessary, they can fully understand the related operations based on the description in the manual and the general technical knowledge in the field.

In addition, the features, operations, or features described in the specification can be combined in any appropriate manner to form various implementations. At the same time, the steps or actions in the method description can also be sequentially exchanged or adjusted in a manner obvious to those skilled in the art. Therefore, the various sequences in the specification and the drawings are only for the purpose of clearly describing a certain embodiment, and do not mean a necessary sequence, unless a certain sequence must be followed unless otherwise stated.

The serial numbers assigned to the components herein, such as "first", "second", etc., are only used to distinguish the described objects and do not have any sequence or technical meaning. The "connection" and "connection" mentioned in this application include direct and indirect connection (connection) unless otherwise specified. In addition, the up, down, left, and right directions mentioned in this article refer to the paper direction of the drawings.

1 and 2, the automatic sample introduction device disclosed in some embodiments of the present application includes a feed channel 10, a loading area 20, a buffer area 30, an emergency area 40, and a transfer scheduling mechanism 50. It should be said that the automatic sampling device in some embodiments may not include the emergency area 40. For example, FIG. 1 is an example, and the automatic sampling device in some embodiments may include the emergency area 40. For example, FIG. 2 is an example. The following is a detailed description of the components of the automatic sampling device.

The feed channel 10 is where the analysis equipment sucks samples. In some embodiments, the feed channel 10 is arranged along a first direction—for example, the X-axis direction in FIGS. 1 and 2. The feeding channel 10 is used to carry the sample holder and for the sample holder to move on the feeding passage along its length direction. As shown in Fig. 3, it is an example of a sample holder. Its length, width and height are respectively L, W and H. The length direction of the sample holder is the measuring direction where the length L is located, and the height direction is the measurement direction where the height H is located. In some embodiments, the feed channel 10 is also provided with a sample suction position—for example, the sample suction position 10a in Figs. 1 and 2, which is used when the sample on the sample rack is located at the sample suction position of the feed channel 10. The sample on the rack is sucked; in other words, when the sample on the sample rack is at the suction position of the feeding channel 10, the analysis device sucks the sample, and the sample rack can move continuously in the first direction, so that the Each sample passes through the sample suction position one by one, so that all samples in the sample rack are sucked by the analysis device.

4, in order to make the sample holder reciprocate on the feed channel 10, that is, move in the same direction as the first direction (for example, the positive direction of the X axis in the figure) and the opposite direction (for example, the negative direction of the X axis in the figure), In other words, moving in the left and right directions in the figure, a reciprocating feeding mechanism 11 may be provided on the feeding channel 10. By setting the reciprocating feeding mechanism 11 in the feeding channel 10, the sample rack is carried on one track bidirectionally, so that one feeding channel can complete the aspiration of the initial sample, the retest sample, and the emergency sample. At the same time, it can realize the retest sample, The emergency samples are processed first, which overcomes the shortcomings of waiting in line for re-examination samples and emergency samples in the prior art. In a specific embodiment, referring to FIG. 5, the reciprocating feeding mechanism 11 includes a motor 11a and a locking portion 11b. A plurality of grooves 11c are provided at the bottom of the sample rack. The retaining portion 11b can be driven by the motor 11a to expand and contract along the height direction of the sample rack, and move in the same and opposite directions as the first direction; when the retaining portion 11b is driven to extend, it can be matched with any groove of the sample rack , So that when the locking portion 11b is driven, the sample rack is driven to move in the same and opposite direction as the first direction. For example, when the locking portion 11b is driven to move in the first direction, the sample rack can be driven to move along the first direction. It moves in one direction. When the locking portion 11b is driven to move in a direction opposite to the first direction, the sample holder can be driven to move in a direction opposite to the first direction.

The feed channel 10 may also be provided with other components, such as at least one of the test tube/test tube cap presence detection mechanism 12, the test tube rotation mechanism 13 and the scanner 14. The scanner 14 is used to scan the label of the test tube to obtain sample information. The test tube rotation mechanism 13 is used to drive the test tube rotation mechanism. For example, when the sample rack moves on the feed channel 10, if the scanner 14 cannot scan the test tube carried on the sample rack-the reason may be that the test tube is labeled That side is not facing the scanner 14, at this time, the test tube rotating mechanism 13 drives the test tube to rotate so that the label of the test tube is aligned with the scanner 14. Test tube/test tube cap presence detection mechanism 12 is used to detect the presence or absence of test tube and test tube cap on the test tube. The test tube/test tube cap presence detection mechanism, if it detects that there is no test tube in the sample position on the sample rack, it will automatically enter Such a device can sound an alarm.

The above are some descriptions of the feed channel 10.

The loading area 20 is in communication with the feeding channel 10 and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to move to the feeding channel 10 in the second direction and then to the sample suction position in the first direction. In some embodiments herein, the first direction and the second direction are perpendicular, for example, the X-axis direction in the figure is the first direction, and the Y-axis direction is the second direction. The loading area 20 can be used for users to place sample racks carrying samples to be tested in batches.

The buffer area 30 is used to carry a sample rack for waiting for the test result after sample suction and/or a sample rack for storing emergency samples. In some embodiments, the buffer area 30 carries the sample rack, the length direction of the sample rack is parallel to the first direction, and the sample rack is moved out of the buffer area 30 in the same or opposite direction as the first direction, and the sample rack faces the first direction. Move into the buffer area 30 in the opposite direction or in the same direction. In a specific embodiment, referring to FIG. 6, the buffer area 30 includes a plurality of buffer bits 31 sequentially arranged along the second direction; any one of the buffer bits 31 can carry a sample rack with a length direction parallel to the first direction, and provide The sample rack is moved out of the buffer area 30 in the same or opposite direction as the first direction, and the sample rack is moved into the buffer area 30 in the direction opposite or the same as the first direction. In the examples in FIGS. 1 and 2, the sample rack moves out of the buffer area 30 in a first direction, and moves into the buffer area in a direction opposite to the first direction.

In order to enable each sample rack to be stably placed in the buffer area, in some embodiments, referring to FIG. 7, the buffer area 30 includes a baffle 31a and a plurality of partitions 31b, and the arrangement direction of the plurality of partitions 31b is the same as the first The directions are parallel, a number of the partitions 31b are arranged at intervals and arranged along the second direction, a buffer position 31 is formed between two adjacent partitions 31b; the baffle 31a is arranged in a direction parallel to the second direction, and the baffle 31a It is connected to one end of a plurality of said partitions 31b.

Under the condition that the total number of buffer bits in the buffer 30 is basically unchanged, in some embodiments, the number of the buffer area 30 may be one. For example, FIG. 1 and FIG. 2 are examples of this. In some embodiments, the number of cache areas 30 is at least two, for example two or more than two, etc., and the total cache bits are allocated to two or more cache areas 30 to achieve a design in a certain dimension. The size change. In some embodiments, when there are multiple cache areas 30, these cache areas are arranged in parallel. In some embodiments, when there are multiple buffer areas 30, these buffer areas are arranged in parallel along the first direction. These buffers are arranged in parallel along the first direction. For example, Figure 8 is an example. It can be seen that although the length of the automatic sampling device in the first direction is increased, the automatic sampling device can be set in the analysis later. One side of the device, and the first direction is consistent with the length of the analysis device. Therefore, in actual situations, the length of the automatic analysis device in the first direction has sufficient design space; in addition, these buffer areas are arranged in parallel along the first direction, The length in the second direction can be reduced, and the design space in the second direction is relatively small. In actual situations, it is desirable to reduce the length of the automatic analysis device in the second direction as much as possible. After this setting, when the device is automatically assembled with the analysis device, as described above, the automatic sample introduction device is set on one side of the analysis device, and the first direction is consistent with the length direction of the analysis device, so that the final adjustment can be made. The length direction of the machine (that is, the length in the first direction) remains unchanged, but the longitudinal depth (that is, the length in the second direction) will not increase much due to the addition of the automatic sampling device. In addition, for the buffer area 30 on the left in FIG. 8, the sample rack can move into the buffer area 30 in the first direction, and move out of the buffer area in the direction opposite to the first direction; for the buffer area 30 on the right in FIG. The rack can move out of the buffer area in the first direction and move into the buffer area in a direction opposite to the first direction.

For example, there are two buffer areas 30. In some embodiments, the two buffer areas 30 are separated by a middle area 32, and the middle area 32 is taken as the axis of symmetry. The two buffer areas 30 are arranged axially symmetrically. The length of the middle area 32 in the first direction is at least the length of the sample holder, so that the sample holders in the two buffer areas 30 can be moved into the middle area 32 in the same or opposite direction as the first direction. The sample holder can then be moved in the same or opposite direction as the second direction. Taking FIG. 8 as an example, for the buffer area 30 on the left in FIG. 8, the sample rack can move out of the buffer area in the direction opposite to the first direction and enter the middle area, and can move from the buffer area in the same direction as the first direction. The middle area moves into the buffer area; for the buffer area 30 on the right in FIG. 8, the sample rack can move out of the buffer area in the first direction and enter the middle area, and can move in from the middle area in the direction opposite to the first direction. The cache area. The transfer scheduling mechanism 50 moves back and forth in the middle zone 32. The transfer scheduling mechanism 50 moves in a direction opposite to the second direction to dispatch the sample rack from the feeding channel 10 to the corresponding buffer position 31 of the buffer area 30; the transfer scheduling mechanism 50 moves in the same direction as the second direction , To take out the samples in the corresponding buffer position 31 of the buffer area 30 and dispatch them to the feeding channel 10 to realize re-aspiration.

In some embodiments, the loading area 20 and the buffer area 30 are on the same side of the feeding channel 10, for example, below the feeding channel 10 in the figure.

The above is some explanations about the buffer area 30.

The emergency area 40 is used for the user to place a sample rack—for example, the user can place a sample rack carrying emergency samples in the emergency area 40. In some embodiments, the emergency area 40 is connected to at least the buffer area 30—when there are multiple buffer areas 30, the emergency area 40 is connected to at least one of the buffer areas 30. The emergency area 40 is used for moving the sample rack from the emergency area 40 into the buffer area 30 connected to the emergency area 40. In some embodiments, the emergency area 40 carries the sample racks placed in the first direction along the length direction, and the sample racks are moved from the emergency area 40 into the connected buffer area 30 in the same or opposite direction as the first direction. In some embodiments, the emergency area 40 includes at least one emergency position 41; the emergency position 41 is aligned with the buffer position 31 of the buffer area 30, and is used to carry the sample rack placed in the first direction along the length direction, and is used for the sample rack along the first direction. Move out of the emergency position 41 in the same or opposite direction and enter the buffer position 31 aligned with the emergency position 41. Figures 6 and 8 are two examples. The sample rack in the emergency area 40 can be moved from the emergency area 40 into the connected buffer area 30 along the first direction, for example, the emergency room 41 can be moved in the first direction to be opposite to the emergency room 41. Standard cache bit 31. As described above, in some embodiments, the buffer area 30 includes a baffle 31a and a partition 31b. It is understandable that when the automatic sampling device has an emergency area 40, the partition 31b does not separate the emergency area 40 from the buffer area 30. Open, that is, the partition 31b does not prevent the sample rack from entering the buffer area 30 connected to it from the emergency area 40. For example, there is no partition 31b at the buffer area 31 connected to the emergency area 41 and the sample rack.

In some embodiments, the emergency room 40 may also be arranged in the buffer area 30. In some embodiments, at least one buffer location 31 of the buffer area 30 is set as an emergency location for the user to place a sample rack.

In some embodiments, the emergency area 40 is provided with a button (not shown in the figure). When the button is triggered, an instruction to test the sample rack in the emergency area 40 is generated, in other words, it is an emergency instruction.

The above are some instructions about the emergency area 40.

The transfer scheduling mechanism 50 is used for scheduling the sample rack between the buffer area 30 and the feed channel 10. In some embodiments, the transfer scheduling mechanism 50 removes the sample rack after sample suction from the feed channel 10 and then moves it into the buffer area 30 to wait for the test result. When the test result of the sample indicates that the sample needs to be re-examined, the buffer area 30 corresponds to The sample rack of is removed from the buffer area 30 and moved into the feeding channel 10. In some embodiments, when the emergency instruction input by the user is received, the sample rack corresponding to the emergency instruction in the buffer area 30 is removed from the buffer area 30 and moved into the feeding channel 10.

In some embodiments, the sample suction position of the feed channel 10 is located between the loading area 20 and the buffer area 30; the sample rack moved from the loading area 20 to the feed channel 10 moves to the sample suction position in the first direction, and The sample rack taken out from the buffer area 30 by the transfer scheduling mechanism 50 and moved into the feeding channel 10 moves to the sample suction position in a direction opposite to the first direction, for example, the reciprocating feeding mechanism 11 of the feeding channel 10 drives the loading area 20 The sample rack moved into the feeding channel 10 moves to the sample suction position in the first direction, and the sample rack taken out from the buffer area 30 by the transfer scheduling mechanism 50 and moved into the feeding channel 10 is driven to move in the direction opposite to the first direction. To the suction position. In some specific embodiments, referring to FIG. 9, the feed channel 10 includes a first channel port 10b and a second channel port 10c. The loading area 20 is located at one end of the first channel port 10b of the feed channel, and the buffer area 30 is located at the feed channel. One end of the second channel port 10c of the channel 10, so that the loading area 20 moves the sample rack from the first channel port 10b into the feeding channel 10, and makes the transfer scheduling mechanism 50 remove the sample rack from the buffer area 30 and from the second channel The port 10c moves into the feed passage 10. In some specific embodiments, the transfer scheduling mechanism 50 is used to move the sample rack at least in the second direction, so that it can be moved to the feeding channel 10 after being removed from the buffer area 30, and to move the sample rack at least in the second direction. It is moved in the opposite direction, so that the sample holder can be moved into the buffer area 30 after being moved out along the feeding channel 10. It can be seen that the present application redesigned the arrangement, function and sample rack entry and exit path between the feed channel 10, the loading area 20, and the buffer area 30, so that the normal sample to be tested enters the feed channel 10 from the loading area 20. , And move to the aspiration position in the first direction to complete the aspiration; and samples that require re-examination and emergency treatment can enter the feed channel 10 from the buffer 30 and move to the aspiration position in the direction opposite to the first direction. Sample aspiration, so the samples that need to be re-examined and emergency department enter the aspiration position through a completely different path from the normal sample to be tested, so that the samples that need re-examination and emergency department can be processed preferentially, and there is no need to wait before they enter the sample aspiration position There are other problems with normal samples to be tested on the path, so there is no problem of eliminating and skipping the queue together with the normal samples to be tested.

There are various implementation structures of the transit scheduling mechanism 50. For example, in some embodiments, please refer to FIG. 10, the transfer scheduling mechanism 50 includes a motor 51 and a test tube rack bracket 52; the test tube rack bracket 52 is used to carry a sample rack with a length direction along the first direction; the motor 51 can drive the test tube rack bracket The slot 52 moves in the same and opposite directions as the second direction to drive the sample rack carried by the test tube rack bracket 52 to move in the same and opposite directions as the second direction. In some embodiments, the transfer scheduling mechanism 50 further includes a test tube rack transfer mechanism 53, which is used to move the sample rack with the length direction along the first direction into or out of the test tube rack holder in the same or opposite direction along the first direction.槽52. In some embodiments, the transfer scheduling mechanism 50 further includes a first detection mechanism 54 for the presence or absence of a test tube rack and/or a second detection mechanism 55 for the presence or absence of a test tube rack. The first detection mechanism 54 for the presence or absence of the test tube rack is used to detect whether the test tube rack bracket 52 carries a sample rack. The second detection mechanism 55 for the presence or absence of the test tube rack is used for detecting whether the buffer position aligned with the test tube rack bracket 52 carries a sample rack.

The above is some explanations about the transit dispatching agency 50.

Please refer to FIG. 11, the automatic sampling device of some embodiments of the present application further includes an unloading channel 60 and an unloading area 70.

The unloading channel 60 is arranged along the first direction, and is used to carry the sample rack with the length direction along the first direction, and the sample rack is moved into the unloading area 70 from the unloading channel 60 in the direction opposite to the second direction. In some embodiments, the unloading channel 60 is aligned with the feeding channel 10. Specifically, in some embodiments, the transit scheduling mechanism 50 is configured to move the sample racks whose detection results in the buffer area 30 indicate that samples do not need to be rechecked, at least in the second direction, so that they can be moved into and unloaded after being removed from the buffer area 30 Channel 60.

The unloading area 70 is used to carry the sample holder with the length direction along the first direction, and for the sample holder to move in a direction opposite to the second direction. In some examples, the user can take out the sample rack that has been tested or to be recovered from the unloading area 70.

It can be seen that the sample rack carrying the sample to be tested enters the feeding channel 10 from the loading area 20 and does not need to be dispatched by the transit dispatching mechanism 50; while the transit dispatching mechanism 50 mainly loads the load in the buffer area 30. The sample racks for re-inspection samples and the sample racks carrying emergency samples are dispatched to the feed channel 10, and the sample racks that have been tested or to be recovered are dispatched to the unloading channel 60; functionally speaking, the sample racks that need to be tested when they enter the system for the first time The scheduling of sample aspiration is separated from the scheduling of special functions, namely emergency scheduling, re-inspection scheduling, and unloading scheduling. The scheduling of sample aspiration is implemented by the relevant institutions on the loading area 20 and the feed channel 10. The dispatching, re-inspection dispatching and unloading dispatching are carried out by the transit dispatching agency 50, with clear division of labor, coordination, processing, and implementation of the dispatching process in the entire test process with high efficiency.

In some embodiments, the unloading area 70, the buffer area 30, and the loading area 20 are all located on the same side of the feeding channel 10, for example, below the feeding channel 10 in the figure. In some embodiments, the loading area 20, the buffering area 30, and the unloading area 70 are sequentially arranged along the first direction.

The above is the description of the automatic sampling device of some embodiments of the present application.

The automatic sample introduction device is used to supply sample racks carrying samples for analysis equipment. Referring to FIG. 12, some embodiments of the present application disclose a sample analysis system, including an automatic sample injection device 1 and an analysis device 2. The automatic sample injection device 1 may be the automatic sample injection device disclosed in any of the embodiments herein. , The analysis equipment 2 is used for aspirating samples from the sample rack supplied by the automatic sampling device 1 and analyzing them. The automatic sampling device 1 is arranged on one side of the analysis device 2, and the first direction is consistent with the length direction of the analysis device 2. After this setting, the length direction of the final machine (that is, the length in the first direction) can remain unchanged, but the longitudinal depth (that is, the length in the second direction) will not be increased by the addition of the automatic sampling device. It is very conducive to placing the final machine in the room for layout, effectively using the space of the department. Specifically, the loading area 20 and the buffer area 30 are located on the first side of the feeding channel 10—for example, the lower part of the figure. When the automatic sampling device 1 further includes an unloading area 70, the loading area 20, the buffer area 30, and the unloading area The area 70 is located on the first side of the feed channel 10-for example, the lower side in the figure; the analysis device 2 is located on the second side of the automatic sample introduction device 1 opposite to the first side-for example, the upper side in the figure.

The following describes the flow of how the automatic sampling device supplies the sample rack to the analysis equipment.

Take Figure 8, Figure 11 or Figure 12 as an example. The first direction is the positive X-axis, the opposite direction to the first is the negative X-axis, and the second direction is the positive Y-axis. The direction opposite to the second direction is the negative direction of the Y axis.

The sample rack carrying the sample to be tested in the loading area 20 moves in the second direction to enter the feeding channel 10, and then moves in the first direction on the feeding channel 10 to pass the sample suction position, and the analysis equipment is positioned at the sample suction position After all samples on the sample rack are sucked, the sample rack continues along the first direction and enters the transfer dispatching mechanism 50 from the feed channel 10. After receiving the sample rack, the transfer dispatching mechanism drives the sample rack to Move in the opposite direction to the second direction, and then align with an empty buffer bit 31 and stop-if the empty buffer bit 31 is in the buffer area 30 on the left in the figure, then the sample rack moves in the first direction to enter In the left buffer area 30, if the empty buffer bit 31 is in the right buffer area 30 in the figure, then the sample rack moves in the opposite direction to the first direction to enter the right buffer area 30. The purpose of the sample rack entering the buffer area 30 is to wait for the test results of the samples it carries.

When the test result of the sample indicates that the sample needs to be re-examined, the corresponding sample rack in the buffer area 30 is removed from the buffer area 30 and moved into the feeding channel 10—specifically, the transfer scheduling mechanism 50 moves and aligns the sample The buffer position 31 where the rack is located, if the sample rack is located in the buffer area 30 on the left in the figure, then the sample rack moves in the direction opposite to the first direction to enter the transfer scheduling mechanism 50, if the sample rack is located on the right in the figure In the buffer area 30, the sample rack moves in the first direction to enter the transfer scheduling mechanism 50; after receiving the sample rack, the transfer scheduling mechanism 50 moves in the second direction to align with the feeding channel 10, and then the sample rack moves toward and Move in the opposite direction of the first direction to enter the feeding channel 10 so that the sample to be rechecked passes through the sample suction position, so that the sample to be rechecked is sucked by the analysis device, and all samples to be rechecked on the sample rack are sucked After the sample, the sample rack enters the transfer scheduling mechanism 50 from the feed channel 10 in the first direction, and the transfer scheduling mechanism 50 moves in the opposite direction to the second direction to re-schedule the sample rack back to the buffer area 30. Of course In some test modes, the sample only needs to be retested once, that is, after the sample is aspirated for the first time, it waits for the test result in the buffer area. If the test result indicates that it needs to be retested, then the sample is retested, and the sample does not need to be retested afterwards. Then wait for the test result of the re-inspection, but be directly dispatched, for example, dispatched to the unloading area. In this mode, after all the samples to be re-inspected on the sample rack are sucked, the sample rack moves along the first direction. Enter the transfer scheduling mechanism 50 from the feed channel 10, and then continue in the first direction from the transfer scheduling mechanism 50 to the unloading channel 60, and finally enter the unloading area 70 through the unloading channel 60 in the direction opposite to the second direction. During this process, the sample holder may need to move a distance along the unloading channel 60 in the first direction, and then enter the unloading area 70 in the direction opposite to the second direction.

When the test results of all samples on the same shelf in the buffer area 30 indicate that the corresponding sample does not need to be re-examined, the corresponding sample shelf in the buffer area 30 is removed from the buffer area 30 and finally moved into the unloading area 70-transfer The scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. If the sample rack is located in the buffer area 30 on the left in the figure, the sample rack moves in the direction opposite to the first direction to enter the transfer scheduling mechanism 50, If the sample rack is located in the buffer area 30 on the right side of the figure, then the sample rack moves in the first direction to enter the transfer scheduling mechanism 50; after receiving the sample rack, the transfer scheduling mechanism 50 moves in the second direction to remove the unloading channel 60. The sample rack enters the unloading channel 60 from the transfer scheduling mechanism 50 in the first direction, and finally enters the unloading area 70 through the unloading channel 60 in the direction opposite to the second direction. During this process, the sample rack may need to be moved along The unloading channel 60 moves a certain distance in the first direction, and then enters the unloading area 70 in the direction opposite to the second direction.

The scheduling and testing process of the sample rack carrying emergency samples is also similar. After the user puts the sample rack in the emergency area 40, the sample rack moves in the first direction from the emergency area 40 to enter the buffer area 30 connected to it; of course, for the emergency department In the embodiment in which the area 40 is arranged in the buffer area 30, for example, a buffer position 31 in the buffer area 30 is set as an emergency position 41, then the sample rack carrying emergency samples is already located in the buffer area 30. The sample rack is then removed from the buffer area 30 and moved into the feed channel 10-specifically, the transfer scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. The figure shows the sample rack located on the right side of the figure. In the buffer area 30, the sample rack moves in the first direction to enter the transfer scheduling mechanism 50; after receiving the sample rack, the transfer scheduling mechanism 50 moves in the second direction to align with the feeding channel 10, and then the sample rack moves toward and The first direction moves in the opposite direction to enter the feeding channel 10 so that each sample passes through the suction position one by one, so that each sample in the sample rack is sucked by the analysis device. After each sample on the sample rack is sucked, the sample rack Then enter the transfer scheduling mechanism 50 from the feed channel 10 in the first direction, and the transfer scheduling mechanism 50 moves in the opposite direction to the second direction to reschedule the sample rack back to the buffer area 30, and the sample rack enters the buffer at this time The purpose of the area 30 is to wait for the test results of the samples it carries. When there is a sample rack that carries emergency samples and the test result of a sample indicates that the sample needs to be re-examined, the sample rack needs to go to the feed channel 10 again to re-examine the corresponding sample-specific scheduling process You can participate in the above and will not repeat it here; similarly, when the test results of all samples on the sample rack carrying emergency samples indicate that the corresponding sample does not need to be re-examined, the sample rack is removed from the buffer area 30 and Finally moved into the unloading area 70-the specific scheduling process can be involved in the above, and will not be repeated here.

In some embodiments of the present application, a method for automatic sample injection control is also disclosed, and the method can be applied to the automatic sample injection device disclosed in any embodiment herein.

Referring to FIG. 13, the method of automatic sample injection control in some embodiments includes the following steps:

Step 100, that is, the step of placing the sample rack, controls the movement of the sample rack from the loading area 20 to the feeding channel 10 in the second direction.

In step 120, the step of feeding the sample rack, the sample rack is controlled to move along the feeding channel 10 in the first direction to a sample suction position on the feeding channel 10 to aspirate the sample.

In step 140, the step of buffering the sample rack, the transfer scheduling mechanism 50 is controlled to move the sample rack that has been sampled and removed from the feed channel 10 to the buffer area 30 in a direction opposite to the second direction, and drives the sample rack to move along with the first Move into the buffer area 30 in the same or opposite direction to wait for the test result.

Let’s take Figure 8, Figure 11 or Figure 12 as an example. After all samples on the sample rack are sucked and sampled, the sample rack continues along the first direction to enter the transfer dispatching mechanism 50 from the feed channel 10, and the transfer dispatching agency receives After arriving at the sample rack, drive the sample rack to move in the direction opposite to the second direction, and then align with an empty buffer position 31 to stop-if the empty buffer position 31 is in the buffer area 30 on the left in the figure, then The sample rack moves in the first direction to enter the left buffer area 30. If the empty buffer position 31 is in the right buffer area 30 in the figure, then the sample rack moves in the opposite direction to the first direction to enter the right buffer area. Cache area 30. The purpose of the sample rack entering the buffer area 30 is to wait for the test results of the samples it carries.

Step 150, that is, the re-inspection step, when the test result of the sample indicates that the sample needs to be re-inspected, control the transfer scheduling mechanism to move the sample rack corresponding to the re-inspection instruction in the buffer area in the opposite or same direction as the first direction After being taken out, it is dispatched to the feeding channel along the second direction, so as to move into the sample aspiration position along the feeding channel in a direction opposite to the first direction for sample aspiration. It should be noted that the re-inspection instruction can be automatically generated by the sample analysis system or analytical equipment or automatic sampling device when it determines that there is a sample that needs to be re-inspected, or it can be issued by the user through the mouse or keyboard, for example, the user is displaying After seeing the test result on the interface, manually specify a sample on a sample rack for re-inspection.

Take Figure 8, Figure 11 or Figure 12 as an example. When the test result of a sample indicates that the sample needs to be re-examined, the corresponding sample rack in the buffer area 30 is removed from the buffer area 30 and moved into the feed channel 10. ——Specifically, the transfer scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. If the sample rack is located in the buffer area 30 on the left in the figure, then the sample rack moves in the direction opposite to the first direction. Enter the transit scheduling mechanism 50. If the sample rack is located in the buffer area 30 on the right side of the figure, the sample rack moves in the first direction to enter the transit scheduling mechanism 50; after receiving the sample rack, the transit scheduling mechanism 50 moves to the second Move in the direction to align with the feeding channel 10, and then the sample holder moves in the opposite direction to the first direction to enter the feeding channel 10 so that the sample to be rechecked passes through the sample suction position, so that the sample to be rechecked is sucked by the analysis device sample. After all the samples to be rechecked on the sample rack have been sampled, the sample rack enters the transfer scheduling mechanism 50 from the feed channel 10 in the first direction, and the transfer scheduling mechanism 50 moves in the direction opposite to the second direction. , To reschedule the sample rack back to the buffer area 30. Of course, in some test modes, the sample only needs to be rechecked once, that is, after the sample is aspirated for the first time, it waits for the test result in the buffer area. If the test result indicates that it needs to be rechecked The sample is re-inspected. After that, the sample does not need to wait for the test result of the re-inspection, but is dispatched directly, for example, to the unloading area. In this mode, all samples to be re-inspected on the sample rack are After the sample is sucked, the sample rack enters the transfer scheduling mechanism 50 from the feeding channel 10 in the first direction, and then continues in the first direction from the transfer scheduling mechanism 50 to the unloading channel 60, and finally passes through the unloading channel 60 to the first The two opposite directions enter the unloading area 70-in this process, the sample holder may need to move a distance along the unloading channel 60 in the first direction, and then enter the unloading area 70 in the direction opposite to the second direction.

In some cases, when the sample rack needs to enter the feed channel 10 from the buffer area 30 for re-inspection, it is possible that the sample rack itself already exists on the feed channel 10. At this time, some avoidance strategies need to be adopted to deal with this more complicated situation. .

In some embodiments, the re-inspection step 150 may include: when the test result of the sample indicates that the sample needs to be re-inspected, controlling the sample holder located in the sample suction position to move out along the feeding channel-this refers to the feeding channel 10 There is a sample rack at this time, and the sample on the sample rack is at the sample suction position, then the samples on the sample rack that is being injected can be sucked, and then the transfer scheduling mechanism 50 is controlled to dispatch the sample rack to The buffer area 30 waits for the test result. Then control the transfer scheduling mechanism 50 to take out the sample racks in the buffer area corresponding to the re-inspection instruction in the same or opposite direction as the first direction, and then dispatch them to the feeding channel in the direction opposite to the second direction. Move to the sample aspiration position along the feed channel in a direction opposite to the first direction for sample aspiration.

In some embodiments, the re-inspection step 150 may include: when the test result of the sample indicates that the sample needs to be re-inspected, controlling the sample holder located in the sample aspiration position to move in a direction opposite to the first direction along the feeding channel Remove-This means that there is a sample rack on the feeding channel 10 at this time, and the sample on the sample rack is at the sample suction position, then the sample rack can be moved in the opposite direction to the first direction to allow the sample to be aspirated Position; and then control the transfer scheduling mechanism 50 to take out the sample racks in the buffer area corresponding to the recheck instruction in the same or opposite direction as the first direction, and then dispatch them to the feed channel in the direction opposite to the second direction, The sample is aspirated by moving to the sample aspiration position along the feeding channel in a direction opposite to the first direction.

It can be seen that the avoidance strategy is realized by controlling the movement of the sample holder on the feed channel to avoid. Therefore, in some embodiments, the rechecking step 150 may include: when it is determined that the sample rack exists in the feeding channel, controlling the movement of the sample rack on the feeding channel to avoid.

In some specific embodiments, it can be processed from the perspective of whether the feeding channel 10 is currently one sample rack or multiple sample racks. In some embodiments, controlling the movement of the sample rack on the feeding channel to avoid avoidance includes: when it is determined that there is only one sample rack on the feeding channel 10, controlling the sample rack to move on the feeding channel to avoid avoiding, For example, the sample rack can be controlled to move to the sample suction position first, so that all samples on the sample rack are sucked, and then the sample rack can be controlled to move on the feed channel to avoid it—for example, control the transfer scheduling mechanism 50 and then The sample rack with the sample suction completed is dispatched to the buffer area 30 to wait for the test result, or the sample rack is controlled to move in a direction opposite to the first direction to allow the sample suction position. In some embodiments, controlling the movement of the sample racks on the feeding channel to avoid avoidance includes: when it is determined that there are multiple sample racks on the feeding channel 10, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position So that all the samples on the sample rack are aspirated, and then the sample rack that has been aspirated is controlled to move out of the feed channel—for example, the transfer scheduling mechanism 50 is controlled to dispatch the sample rack that has been aspirated to the buffer area 30 to wait for testing. As a result, other sample racks on the feed channel are controlled to move on the feed channel to avoid it-for example, these other sample racks are controlled to move on the feed channel 10 in a direction opposite to the first direction to let out the sample suction position. It is even possible to control the sample rack to re-enter the loading area 20.

In some specific embodiments, it can also be processed from the perspective of whether the feed channel 10 is full. In some embodiments, controlling the movement of the sample racks on the feeding channel to avoid avoidance includes: when it is determined that the feeding channel 10 is not fully loaded, controlling each sample rack to move on the feeding channel 10 to avoid avoiding—for example, controlling Each sample rack moves on the feeding channel 10 in a direction opposite to the first direction to let out the sample suction position, and can even control the sample rack to re-enter the loading area 20. In some embodiments, the above-mentioned controlling the movement of the sample rack on the feeding channel for avoidance includes: when it is determined that the feeding channel is fully loaded, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position to place the sample rack on the sample rack. After each sample is aspirated, the sample rack is controlled to move out of the feed channel-for example, the transfer scheduling mechanism 50 is controlled to dispatch the sample rack to the buffer area 30 to wait for the test result and control the feed Other sample racks on the channel move on the feed channel to avoid it-for example, control these other sample racks on the feed channel 10 to move in a direction opposite to the first direction to get out of the suction position, or even control the sample rack to re Enter the loading area 20.

Through some of the above avoidance strategies and specific methods, it is possible to give priority to the samples that need to be retested as much as possible, so that the time for the results of the final sample to meet the requirements of the department.

Referring to FIG. 14, the automatic sample injection control method in some embodiments includes the following steps:

In step 140, the step of buffering the sample rack, the transfer scheduling mechanism 50 is controlled to move the sample rack that has been sampled and removed from the feed channel 10 to the buffer area 30 in a direction opposite to the second direction, and drives the sample rack to move along with the first Move into the buffer area 30 in the same or opposite direction.

Step 160, namely the emergency step, in response to the emergency instruction input by the user, control the transfer scheduling mechanism to move the sample rack from the buffer area 30 out of the buffer area 30 in the same or opposite direction as the first direction and move to the feeding channel in the second direction 10, so that the sample holder moves to the sample suction position along the feed channel 10 in a direction opposite to the first direction.

In some examples, the emergency area 40 is an area connected to the buffer area 30, and the emergency step 160 further includes: in response to the emergency instruction input by the user, controlling the sample rack located in the emergency area 40 to be in the same direction as or opposite to the first direction. The direction is moved from the emergency area 40 into the connected buffer area 30. Specifically, step 160 includes the first emergency step, that is, in response to the emergency instruction input by the user, controlling the sample rack located in the emergency area 40 to move from the emergency area 40 into the connected buffer area 30 in the same or opposite direction as the first direction; Control the sample rack from the buffer area 30 to move out of the buffer area 30 in the same or opposite direction as the first direction; control the sample rack removed from the buffer area 30 to move in the second direction; control the sample rack to move into the feeding channel 10 and move along the The feeding channel 10 moves to the sample aspiration position to aspirate the sample in a direction opposite to the first direction.

In some examples, if there is an emergency area 40 in the buffer area 30, or a buffer bit 31 is set as the emergency position 41, then the emergency step 160 directly controls the emergency position 41 in the emergency position 41 in the buffer area 30 in response to the emergency instruction input by the user. The sample holder moves from the buffer area 30 out of the buffer area 30 in the same or opposite direction as the first direction and moves to the feeding channel 10 in the second direction. Specifically, step 160 includes a second emergency step, that is, in response to the emergency instruction input by the user, the sample rack on the emergency position 41 in the buffer area 40 is controlled to move out of the buffer area 30 in the same or opposite direction as the first direction; The sample rack removed from the buffer area 30 moves in the second direction; the sample rack is controlled to move into the feeding channel 10 and move to the sample suction position along the feeding channel in a direction opposite to the first direction.

In some cases, when the sample rack carrying emergency samples needs to enter the feed channel 10 from the buffer area 30 for testing, it is possible that the sample rack itself already exists on the feed channel 10. At this time, some avoidance strategies need to be adopted to deal with this A more complicated situation.

In some embodiments, the emergency step 160 further includes: when it is determined that there is a sample rack in the feeding channel 10, controlling the movement of the sample rack on the feeding channel to avoid.

Through some of the above avoidance strategies and specific methods, it is possible to give priority to the samples that need emergency treatment as much as possible, and to meet the requirements of the time required for the emergence of results of the samples required for the emergency samples.

After all samples on the sample rack carrying the emergency department are sucked, control the sample rack that has passed the sample suction position to move out of the feed channel 10 in the first direction; then control the transfer scheduling mechanism 50 to move out of the feed channel 10 The sample rack of the sample holder moves in the direction opposite to the second direction, and moves into the buffer area 30 in the same or opposite direction as the first direction to wait for the test result. When the test result of an emergency sample indicates that the emergency sample needs to be re-examined, the re-examination step is performed, and the corresponding sample rack is scheduled for re-examination. The specific process has been explained above, so I will not repeat it here.

15 and 16, the automatic sample injection control method in some embodiments may further include step 170, that is, an unloading step. When the buffer area 30 contains the test results of each sample on the sample rack, it indicates that the corresponding sample does not need to be rechecked. When, control the sample rack from the buffer area 30 to move out of the buffer area 30 in the same or opposite direction as the first direction, and control the sample rack removed from the buffer area 30 to move in the same direction as the second direction, and then control the sample The rack moves into the unloading channel 60, and moves from the unloading channel 60 into the unloading area 70 in the direction opposite to the second direction. During this process, the sample rack may need to move a certain distance along the unloading channel 60 in the first direction, and then to and The direction opposite to the second direction enters the unloading area 70.

The above is the sample analysis system, analysis equipment, automatic sampling device, and dynamic sampling control method disclosed in this application. The sample analysis system, analysis equipment and automatic sampling device of the present application have a compact structure, and can realize routine sampling, rapid emergency sampling and rapid re-examination. The automatic sampling device can be independent of the analysis equipment. When the analysis equipment needs to be connected to the assembly line system, the automatic sampling device can be removed. In addition, when the analysis equipment needs to test a larger batch of samples than the designed capacity, an expansion module can be added externally. The expansion module transports the sample rack carrying the sample to be tested to the loading area 20 through the track, and can also be used after the test is completed , And then transfer the sample rack in the unloading area 70 out through the track. In addition, the automatic sample introduction device can also supply samples for multiple analysis equipment by setting multiple supply channels 10 in the first direction, as well as the buffer area 30 and the transfer scheduling mechanism 50 matching each supply channel 10 (each supply channel 10Supply samples for one analysis device), so as to realize the cascade of multiple analysis devices.

This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications can be made to the exemplary embodiments without departing from the scope of this document. For example, various operation steps and components used to perform the operation steps can be implemented in different ways according to a specific application or considering any number of cost functions associated with the operation of the system (for example, one or more steps can be deleted, Modify or incorporate into other steps).

In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. In addition, as understood by those skilled in the art, the principles herein can be reflected in a computer program product on a computer-readable storage medium, which is pre-installed with computer-readable program code. Any tangible, non-transitory computer-readable storage medium can be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD to ROM, DVD, Blu Ray disks, etc.), flash memory and/or the like . These computer program instructions can be loaded on a general-purpose computer, a special-purpose computer, or other programmable data processing equipment to form a machine, so that these instructions executed on the computer or other programmable data processing device can generate a device that realizes the specified function. These computer program instructions can also be stored in a computer-readable memory, which can instruct a computer or other programmable data processing equipment to operate in a specific manner, so that the instructions stored in the computer-readable memory can form a piece of Manufactured products, including realizing devices that realize designated functions. Computer program instructions can also be loaded on a computer or other programmable data processing equipment, thereby executing a series of operation steps on the computer or other programmable equipment to produce a computer-implemented process, so that the execution of the computer or other programmable equipment Instructions can provide steps for implementing specified functions.

Although the principles herein have been shown in various embodiments, many modifications to the structure, arrangement, proportions, elements, materials, and components that are particularly suitable for specific environments and operating requirements can be made without departing from the principles and scope of this disclosure. use. The above modifications and other changes or amendments will be included in the scope of this article.

The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the consideration of this disclosure will be in an illustrative rather than restrictive sense, and all these modifications will be included in its scope. Likewise, the advantages, other advantages, and solutions to problems of the various embodiments have been described above. However, benefits, advantages, solutions to problems, and any elements that can produce these, or make them more specific, should not be construed as critical, necessary, or necessary. The term "including" and any other variants thereof used in this article are non-exclusive inclusions. Such a process, method, article or device that includes a list of elements not only includes these elements, but also includes those that are not explicitly listed or are not part of the process. , Methods, systems, articles or other elements of equipment. In addition, the term "coupled" and any other variations thereof used herein refer to physical connection, electrical connection, magnetic connection, optical connection, communication connection, functional connection and/or any other connection.

Those skilled in the art will recognize that many changes can be made to the details of the above-described embodiments without departing from the basic principles of the present invention. Therefore, the scope of the present invention should only be determined by the claims.

Claims

An automatic sampling device, which is characterized in that it comprises:

A feed channel, the feed channel is arranged along the first direction, is used to carry the sample rack and allow the sample rack to move on the feed channel along its length; the feed channel is also provided with a sample suction position , Used for the sample on the sample rack to be aspirated when the sample on the sample rack is located at the sample aspiration position of the feeding channel;

The loading area, the loading area is connected with the feeding channel, and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to move into the feeding channel along the first direction in the second direction. Move the direction to the suction position;

A buffer area, the buffer area is used to carry a sample rack with a length direction along the first direction, and allows the sample rack to move out and into the buffer area along the first direction;

The emergency area, the emergency area is used for users to place sample racks; the emergency area is connected to the buffer area, and is used to carry the sample racks placed along the first direction in the length direction, and for the sample racks to be along with the sample racks. The first direction is the same or the opposite direction is moved from the emergency area into the connected buffer area; or, the emergency area is set in the buffer area;

The transfer scheduling mechanism is used to schedule the sample rack between the buffer area and the feed channel, and when an emergency instruction input by the user is received, the sample rack corresponding to the emergency instruction in the buffer area is removed from the buffer area And move into the feed channel;

Wherein, the sample suction position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves to the sample suction position in the first direction , The sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel is moved to the sample suction position in a direction opposite to the first direction.
The automatic sample introduction device according to claim 1, wherein the loading area and the buffer area are on the same side of the feeding channel.
The automatic sample feeding device according to claim 1 or 2, wherein the feeding channel is provided with a reciprocating feeding mechanism, and the feeding channel is provided with a reciprocating feeding mechanism to drive the loading zone to move in The sample rack of the feeding channel is moved to the sample suction position in the first direction, and the sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel is driven to be opposite to the first direction Move to the suction position in the direction of.
The automatic sampling device according to claim 3, wherein the feed channel comprises: a first channel port and a second channel port, and the loading area is located at one end of the first channel port of the feed channel. The buffer area is located at one end of the second passage port of the feeding channel, so that the loading area moves the sample rack from the first passage port into the feeding channel, and causes the transfer scheduling mechanism to move the sample rack out of the buffer area and from the first passage port. The second channel port moves into the feed channel.
The automatic sampling device according to any one of claims 1 to 4, wherein the buffer area includes a baffle and a plurality of partitions, the setting direction of the plurality of partitions is parallel to the first direction, and the plurality of partitions are arranged in parallel with the first direction. The partitions are arranged at intervals and arranged along the second direction, and a buffer position is formed between two adjacent partitions to carry the sample rack; the baffles are arranged in a direction parallel to the second direction, and the baffles are connected to the One end of a plurality of said partitions is connected.
5. The automatic sampling device of claim 1, further comprising an unloading channel and an unloading area;

The unloading area is used to carry the sample rack with the length direction along the first direction, and allows the sample rack to move in a direction opposite to the second direction;

The unloading channel is arranged along the first direction, and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to be moved into the unloading area from the unloading channel in the direction opposite to the second direction.
The automatic sample introduction device of claim 5, wherein the unloading area, the buffer area, and the loading area are all located on the same side of the feeding channel.
The automatic sample introduction device according to any one of claims 1 to 7, wherein the emergency area is provided with a button, and when the button is triggered, an instruction to test the sample rack in the emergency area is generated.
The automatic sampling device according to any one of claims 1 to 8, wherein the first direction and the second direction are perpendicular.
A sample analysis system, characterized by comprising: an automatic sample introduction device, and an analysis device that aspirates and analyzes a sample from a sample rack supplied by the automatic sample introduction device, wherein the automatic sample introduction device includes:

A feed channel, the feed channel is arranged along a first direction, and is used to carry a sample rack with a length direction along the first direction, and allows the sample rack to move in the feed channel; the feed channel is also provided There is a sample suction position for the sample on the sample rack to be aspirated when the sample on the sample rack is located at the suction position of the feed channel;

A loading area, the loading area is in communication with the feeding channel, and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to move into the feeding channel in the second direction;

A buffer area, the buffer area is used to carry a sample rack with a length direction along the first direction, and allows the sample rack to move out and into the buffer area along the first direction;

The emergency area, the emergency area is used for users to place sample racks; the emergency area is connected to the buffer area, and is used to carry the sample racks placed along the first direction in the length direction, and for the sample racks to be along with the sample racks. The first direction is the same or the opposite direction is moved from the emergency area into the connected buffer area; or, the emergency area is set in the buffer area;

The transfer scheduling mechanism is used to schedule the sample rack between the buffer area and the feed channel, and when an emergency instruction input by the user is received, the sample rack corresponding to the emergency instruction in the buffer area is removed from the buffer area and Move into the feed channel;

Wherein, the sample suction position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves to the sample suction position in the first direction , The sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel is moved to the sample suction position in a direction opposite to the first direction;

The automatic sample introduction device is arranged on one side of the analysis equipment, and the first direction is consistent with the length direction of the analysis system; the loading area and the buffer area are located on the first side of the feeding channel, The analysis equipment is located on a second side of the automatic sample introduction device opposite to the first side.
The sample analysis system according to claim 10, wherein the feeding channel is provided with a reciprocating feeding mechanism to drive the sample holder of the loading area to move into the feeding channel to move in the first direction to the sample suction And drive the sample rack taken out from the buffer area by the transfer scheduling mechanism and moved into the feeding channel to the sample suction position in a direction opposite to the first direction.
The sample analysis system of claim 11, wherein the feed channel comprises: a first channel port and a second channel port, the loading area is located at one end of the first channel port of the feed channel, and The buffer area is located at one end of the second channel port of the feeding channel, so that the loading area moves the sample rack from the first channel port into the feeding channel, and allows the transfer scheduling mechanism to move the sample rack from the buffer area and from the second channel port. The channel port is moved into the feed channel.
The sample analysis system according to any one of claims 10 to 12, wherein the automatic sample introduction device further comprises an unloading channel and an unloading area;

The unloading area is used to carry the sample rack with the length direction along the first direction, and allows the sample rack to move in a direction opposite to the second direction;

The unloading channel is arranged along the first direction, and is used to carry the sample rack with the length direction along the first direction, and for the sample rack to be moved into the unloading area from the unloading channel in the direction opposite to the second direction.
The sample analysis system according to claim 13, wherein the unloading area, the buffer area and the loading area are all located on the same side of the feeding channel.
A method for automatic sampling control, which is characterized in that it comprises:

Steps of placing the sample rack: controlling the movement of the sample rack from the loading area to the feeding channel in the second direction;

Sample rack feeding step: control the sample rack to move in the first direction along the feed channel to a sample suction position on the feed channel for sample aspiration;

Step of buffering the sample rack: controlling the transfer scheduling mechanism to move the sample rack that has finished sample aspiration and moved out of the feed channel to the buffer area in a direction opposite to the second direction;

Emergency step: In response to the emergency instruction input by the user, the transfer scheduling mechanism is controlled to move the sample rack from the buffer area in the same or opposite direction as the first direction out of the buffer area and move to the feeding channel in the second direction to make the sample The rack moves to the sample aspiration position along the feed channel in a direction opposite to the first direction.
The method of claim 15, wherein the emergency treatment step further comprises:

In response to the emergency instruction input by the user, the sample rack located in the emergency area is controlled to move from the emergency area into the connected buffer area in the same or opposite direction as the first direction.
The method according to claim 16, wherein the emergency treatment step further comprises:

When it is determined that there is a sample rack in the feeding channel, the sample rack on the feeding channel is controlled to move to avoid.
The method according to any one of claims 15 to 17, further comprising a rechecking step: when it is determined that there are samples on the sample rack in the buffer area that need to be retested, control to perform retest scheduling; the control Retest scheduling includes:

Control the transfer scheduling mechanism to move the sample rack from the buffer area out of the buffer area in the same or opposite direction as the first direction;

Control the sample rack removed from the buffer area to move in the second direction, so that the sample rack moves into the feeding channel, and is moved to the sample suction position along the feeding channel in a direction opposite to the first direction Carry out aspiration.
The method according to claim 18, wherein said controlling to perform retest scheduling further comprises:

When it is determined that there is a sample rack in the feeding channel, the sample rack on the feeding channel is controlled to move to avoid.
The method according to claim 17 or 19, wherein the controlling movement of the sample holder on the feeding channel to avoid avoidance comprises:

When it is determined that there is only one sample rack on the feeding channel, the sample rack is controlled to move on the feeding channel to avoid.
The method of claim 20, wherein before controlling the sample rack to move on the feed channel to avoid, first control the sample rack to move to the sample suction position, so that each sample on the sample rack is completed by aspiration .
The method according to claim 17 or 19, wherein the controlling movement of the sample holder on the feeding channel to avoid avoidance comprises:

When it is judged that there are multiple sample racks on the feed channel, control the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then control the sample that has completed aspiration The rack moves out of the feed channel, and other sample racks on the feed channel are controlled to move on the feed channel to avoid.
The method according to claim 17 or 19, wherein the controlling movement of the sample holder on the feeding channel to avoid avoidance comprises:

When it is judged that the feeding channel is not full, the sample racks are controlled to move on the feeding channel to avoid.
The method according to claim 17 or 19, wherein the controlling movement of the sample holder on the feeding channel to avoid avoidance comprises:

When it is judged that the feed channel is full, control the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then control the sample rack that has completed aspiration to move out of the feed channel , And control the other sample holders on the feed channel to move on the feed channel to avoid.
The method according to any one of claims 15 to 24, further comprising:

Controlling the sample rack after sample suction to move in a direction opposite to the second direction, and then controlling the sample rack to move into the buffer area in the same or opposite direction as the first direction.
The method according to any one of claims 17 to 25, wherein controlling the sample holder to move on the feeding channel to avoid avoidance comprises: controlling the sample holder to move along the feeding channel in a direction opposite to the first direction.
The method according to any one of claims 15 to 26, further comprising an uninstallation step:

When it is judged that there is no sample on the sample rack in the buffer area that needs to be retested, control to perform recovery scheduling; the control to perform recovery scheduling includes:

Moving the sample rack from the buffer area out of the buffer area in the same or opposite direction as the first direction;

Control the sample rack moved out of the buffer area to move in the second direction;

The sample rack is controlled to move into the unloading channel, and move from the unloading channel into the unloading area along the direction opposite to the second direction.