WO2021115445A1 - 一种光模块劣化测试方法、系统、设备和存储介质 - Google Patents

一种光模块劣化测试方法、系统、设备和存储介质 Download PDF

Info

Publication number
WO2021115445A1
WO2021115445A1 PCT/CN2020/135846 CN2020135846W WO2021115445A1 WO 2021115445 A1 WO2021115445 A1 WO 2021115445A1 CN 2020135846 W CN2020135846 W CN 2020135846W WO 2021115445 A1 WO2021115445 A1 WO 2021115445A1
Authority
WO
WIPO (PCT)
Prior art keywords
polarization state
optical module
optical
state error
test
Prior art date
Application number
PCT/CN2020/135846
Other languages
English (en)
French (fr)
Inventor
刘文海
陈刚
涂明强
张璋
胡小念
Original Assignee
中兴通讯股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 中兴通讯股份有限公司 filed Critical 中兴通讯股份有限公司
Publication of WO2021115445A1 publication Critical patent/WO2021115445A1/zh

Links

Images

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795—Performance monitoring; Measurement of transmission parameters
    • H04B10/07953—Monitoring or measuring OSNR, BER or Q
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal

Definitions

  • This application relates to testing, and in particular to a method, system, device and storage medium for testing degradation of an optical module.
  • the optical module is composed of optoelectronic devices, functional circuits and optical interfaces for photoelectric conversion.
  • the degradation of the components in the optical module is an important factor affecting the reliability of the external field backbone network.
  • the test is performed under the condition of passing the short fiber self-loop, that is, the signal is sent from the transmitting end of the optical module, and then the signal is received by the receiving end.
  • the degradation of the optical module is tested according to the difference of the signal results, but due to the extremely limited indicators, it is impossible to Reflecting the difference in results, that is, it is impossible to screen for component-level failures.
  • the embodiments of the present application provide a method, system, device, and storage medium for testing degradation of an optical module.
  • the embodiment of the application provides a method for testing the degradation of an optical module, including: determining the corresponding H polarization state error rate and V polarization state error count according to the pre-collected H polarization state error count and V polarization state error count of the optical module to be tested Bit error rate; determine the corresponding H polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity according to the H polarization state error rate and the V polarization state error rate; according to the H polarization state The state error chi-square characterization quantity and the V polarization state error chi-square characterization quantity determine the polarization state signal quality difference characterization quantity; the degradation degree of the optical module under test is tested according to the polarization state signal quality difference characterization quantity.
  • the embodiment of the application provides an optical module degradation test system, including: a test frame, a switch, and an optical module testing tooling board; the optical module testing tooling board includes: an optical module to be tested and an optical module testing device; the optical module testing device It includes: a multiplexer, a first optical amplifier, an optical fiber, a second optical amplifier, and a demultiplexer; the transmitting end of the optical module to be tested is connected to the first end of the multiplexer, and the first end of the first optical amplifier Connected to the second end of the multiplexer, the second end of the first optical amplifier is connected to the first end of the optical fiber, and the first end of the second optical amplifier is connected to the second end of the optical fiber.
  • the second end of the second optical amplifier is connected to the first end of the demultiplexer, and the second end of the demultiplexer is connected to the receiving end of the optical module to be measured; the optical module to be measured
  • the transmitting end is connected to the add port of the multiplexer through an optical fiber jumper, and the multiplexer couples the emitted light of the optical module under test of different wavelengths into the main optical path, after passing through the real fiber system composed of optical amplifier and optical fiber, Through the demultiplexer, the drop port of the specific wavelength is returned to the receiving end of the optical module under test through the fiber jumper.
  • An embodiment of the present application provides a device, including: a memory, and one or more processors; the memory is configured to store one or more programs; when the one or more programs are used by the one or more processors Execution, so that the one or more processors implement the method described in any one of the foregoing embodiments.
  • An embodiment of the present application provides a storage medium that stores a computer program, and when the computer program is executed by a processor, the method described in any of the foregoing embodiments is implemented.
  • FIG. 1 is a flowchart of a method for testing degradation of an optical module according to an embodiment of the present application
  • FIG. 2 is a structural block diagram of an optical module degradation test system provided by an embodiment of the present application.
  • FIG. 3 is a schematic diagram of a connection between an optical module degradation test system provided by an embodiment of the present application and a test PC;
  • FIG. 4 is a schematic diagram of the connection of an optical module testing device provided by an embodiment of the present application.
  • FIG. 5 is a schematic diagram of a position where the receiving end of an optical module to be tested samples the polarization state error count according to an embodiment of the present application
  • FIG. 6 is a schematic diagram showing a test result provided by an embodiment of the present application.
  • FIG. 7 is a structural block diagram of a device for testing degradation of an optical module according to an embodiment of the present application.
  • Fig. 8 is a schematic structural diagram of a device provided by an embodiment of the present application.
  • test performance that is, the index difference between the module and the module is difficult to distinguish the difference between the devices; third, in order to screen the difference in device degradation, it is necessary to ensure that the test is carried out under the same test conditions, for example, the external conditions are consistent: long range Optical system dispersion, optical signal-to-noise ratio, fiber input power and wavelength position; the same internal conditions: signal shielding level, fiber coupling quality, matching of DSP and optical components, etc.
  • an optical module degradation test method is proposed in the embodiment of the present application, which solves the problem of poor testing and screening effects of existing optical modules and failure to perform component-level fault screening.
  • FIG. 1 is a flowchart of a method for testing degradation of an optical module according to an embodiment of the present application. This embodiment is applied to the case of screening the deterioration degree of the components in the optical module. This embodiment can be executed by the optical module degradation test system.
  • the method in this embodiment includes S110-S140.
  • natural light is also called orthogonal light, which can be decomposed into a vertical vibration part and a horizontal vibration part.
  • the H polarization state error count refers to the error count generated by the horizontal vibration part
  • the V polarization state error count refers to the error count generated by the vertical vibration part.
  • the optical module to be tested is installed on the optical module testing tooling board, and the optical module testing tooling board is inserted into the testing machine frame to test the degradation degree of the optical module to be tested.
  • the H polarization state error count and the V polarization state error count of the optical module under test are continuously collected through the optical module test tooling board, and the corresponding calculation is calculated according to the H polarization state error count and the V polarization state error count The bit error rate of the H polarization state and the bit error rate of the V polarization state.
  • the error rate of the H polarization state is the ratio between the error count of the H polarization state and the signal rate * acquisition time; the error rate of the V polarization state is between the error count of the V polarization state and the signal rate * acquisition time Ratio.
  • the collection time used for the H polarization state error count and the V polarization state error count is the same.
  • the H polarization state error chi-square characterization quantity refers to the horizontal polarization state signal quality characterization quantity, which is used to characterize the signal quality in the horizontal direction;
  • the V polarization state error chi-square characterization quantity refers to the vertical direction polarization.
  • State signal quality characterization quantity used to characterize the signal quality in the vertical direction.
  • a series of calculations can be performed on the bit error rate of the H polarization state to obtain the corresponding chi-square characterization of the H polarization state error rate; a series of calculations can also be performed on the bit error rate of the V polarization state to obtain the corresponding V polarization state error rate.
  • State error chi-square characterization quantity can be performed on the bit error rate of the H polarization state to obtain the corresponding chi-square characterization of the H polarization state error rate.
  • S130 Determine the quality difference characterization quantity of the polarization state signal according to the H polarization state error chi-square characterization quantity and the V polarization state error chi-square characterization quantity.
  • the two chi-square characterization quantities can be differenced, and the difference As a characterization quantity of the difference in polarization state signal quality.
  • the H polarization state error chi-square characterization quantity is recorded as Q H ;
  • the V polarization state error chi-square characterization quantity is recorded as Q V ;
  • S140 Determine the degree of degradation of the optical module to be measured according to the characteristic quantity of the difference in polarization state signal quality.
  • the quality difference characterization quantity of the polarization state signal is used to characterize the different degradation degrees of the optical module to be measured.
  • the greater the absolute value of the characteristic quantity of the difference in polarization state signal quality the more serious the degradation degree of the optical module to be measured, that is, the more serious the degradation degree of the components in the optical module to be measured.
  • the optical module to be tested in order to ensure the normal operation of each optical module under test, when the characteristic quantity of the polarization state signal quality difference of the optical module under test exceeds the preset signal quality difference characteristic quantity threshold, it indicates that the optical module under test is If the components are severely degraded and cannot work normally, the optical module to be tested can be directly screened out.
  • the statistical difference screening algorithm for the bit error rate of the H polarization state and the V polarization state is used.
  • the data comes from the same optical module.
  • the optical module degradation test system can provide a consistent internal module for the screening of the optical module device level. Conditions; and the sampled data belong to the same wavelength, the optical module degradation test system can effectively avoid the large attenuation difference of individual wavelength channels in the production environment, and the uneven distribution of the introduced noise in the entire wavelength band. Therefore, the test accuracy of the degradation degree of the optical module to be tested is improved.
  • the optical module degradation test method further includes: obtaining the frame number and slot number of the test frame where the optical module test tooling board is located, the optical module testing tooling board is used to load the optical module to be tested; The number and slot number are assigned to the Internet Protocol IP address; the corresponding wavelength is assigned to the optical module test tooling board according to the IP address.
  • each optical module testing tooling board can test multiple optical modules to be tested, which can also be understood as:
  • the optical module test tooling board can be installed with multiple optical modules to be tested.
  • the optical module degradation test system obtain the frame number corresponding to the test frame where the optical module test tooling board is currently located, and obtain the position of the optical module test tooling board in the test frame, and according to the position in the test frame Determine the corresponding slot number; assign an IP address according to the frame number and slot number of the test frame where the optical module test tooling board is located; then each piece of the optical module test tooling board that obtains the IP address is installed on the basis of the optical module to be tested
  • the IP address gets a specific assigned wavelength.
  • the wavelength allocation rule may cover the entire C+L band.
  • C+L band refers to 192.1 ⁇ 196.1THz (C band) and 186.9 ⁇ 190.9THz (L band) in the field of optical communication.
  • the wavelength assignment is performed through the combination logic of the frame dial number and the slot number, and the entire C+L band is reasonably used to maintain the stability of the optical module test tooling board slot and fiber splicing, which is convenient for production personnel to operate.
  • the relationship between the frame and the slot position a specific wavelength is set for each optical module under test in the real fiber system to avoid wavelength conflicts.
  • the correct production operation is ensured through a fixed distribution relationship.
  • determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-collected H polarization state error count and V polarization state error count of the optical module to be tested includes: pre-collecting Calculate the ratio of the H polarization state error count of the optical module under test and the acquisition time to obtain the corresponding H polarization state error rate; calculate the ratio of the V polarization state error count of the optical module under test and the acquisition time collected in advance , Get the corresponding V polarization state bit error rate.
  • the ratio between the H polarization state error count of the optical module under test and the signal rate * acquisition time is used as the H polarization state error rate; and the V polarization state error code of the optical module under test is counted
  • the ratio between the signal rate and the acquisition time is used as the bit error rate of the V polarization state.
  • the corresponding H polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity are determined according to the H polarization state error rate and the V polarization state error rate, including: The bit rate and the bit error rate of the V polarization state are respectively calculated by the inverse function of the right tail probability of the chi-square distribution to obtain the first value and the second value; the first value and the second value are logarithmically converted to obtain the corresponding H Polarization error chi-square characterization quantity and V polarization state error chi-square characterization quantity.
  • the QH of the H polarization state and the QV of the V polarization state are obtained.
  • QH represents the horizontal polarization state error chi-square characterization quantity
  • QV represents the vertical polarization state error chi-square characterization quantity.
  • determining the degradation degree of the optical module to be tested according to the characteristic quantity of the difference in polarization state signal quality includes: comparing the characteristic quantity of the difference in polarization state signal quality with a preset characteristic quantity of signal quality difference; and determining according to the comparison result The degree of degradation of the optical module to be measured.
  • the quality difference characterization quantity of the polarization state signal is used to characterize the quality difference between the two polarization states of the optical module under test, so as to achieve the purpose of screening the degraded optical module under test.
  • the characteristic quantity of the polarization state signal quality difference and the preset signal quality difference characteristic quantity are made difference, if the difference between the two is greater Large, indicating that the degradation degree of the optical module under test is more serious.
  • multiple preset signal quality difference characteristic quantities may be set, for example, the preset signal quality difference characteristic quantities are three, namely A, B, and C, where A ⁇ B ⁇ C.
  • the characterization quantity of the polarization state signal quality difference of the optical module under test is D.
  • D is less than A, it indicates that the degree of degradation of the optical module under test is level a; when D is between A and B, it indicates that the optical module under test is at level a.
  • the degradation degree of the optical module is level b; when D is between B and C, it indicates that the degradation degree of the optical module under test is level c; when D is greater than C, it indicates that the degradation degree of the optical module under test is level d.
  • the degree of degradation of the optical module to be measured corresponding to level a is the lightest; the degree of degradation of the optical module to be measured corresponding to level d is the most severe.
  • Fig. 2 is a structural block diagram of an optical module degradation test system provided by an embodiment of the present application.
  • the optical module degradation test system includes: a test frame 10, a switch 20, and an optical module testing tooling board 30;
  • the optical module testing tooling board 30 includes: an optical module to be tested 301 and an optical module testing device 302;
  • the optical module testing device 302 includes: a multiplexer 3021, a first optical amplifier 3022, an optical fiber 3023, a second optical amplifier 3024, and a demultiplexer 3025; the transmitting end of the optical module to be tested 301 is connected to the first end of the multiplexer 3021 , The first end of the first optical amplifier 3022 is connected to the second end of the multiplexer 3021, the second end of the first optical amplifier 3022 is connected to the first end of the optical fiber 3023, and the first end of the second optical amplifier 3024 is connected to the optical fiber The second end of 3023 is connected, the second end of the second optical amplifier 3024 is connected to the first end of the splitter 3025, and the second end of the splitter 3025 is connected to the receiving end of the optical module 301 under test;
  • the transmitting end of the optical module under test 301 is connected to the add port of the multiplexer 3021 through an optical fiber jumper.
  • the multiplexer 3021 couples the emitted light of the optical module 301 under test of different wavelengths into the main optical path, and passes through the first optical amplifier 3022 and the optical fiber. After the real fiber system composed of 3023, through the splitter 3025, it returns to the receiving end of the optical module 301 under test from the drop port of the specific wavelength through the fiber jumper.
  • the test machine frame 10 is connected to an external test personal computer (PC) through the switch 20.
  • the optical module degradation test system may include multiple test frames 10, and each test frame 10 is connected to a test PC through a switch 20, and each test frame 10 is inserted with an optical module test tooling board 30.
  • a plurality of optical modules to be tested 301 can be inserted into each optical module test tooling board 30, that is, a degradation test can be performed on the plurality of optical modules 301 to be tested.
  • the system composed of the first optical amplifier and the optical fiber is called an optical fiber system.
  • the optical fiber system may include one or more first optical amplifiers and one or more optical fibers, and the number of first optical amplifiers and the number of optical fibers are the same, that is, the optical fiber system is: (first Optical amplifier+fiber)*N, where N is an integer greater than or equal to 1.
  • the first optical amplifier 1023 and the second optical amplifier 1025 may be the same type of optical amplifiers, and both are configured to amplify optical signals, which is not limited.
  • the optical module degradation test system further includes: a noise source, which is respectively connected to the second end of the second optical amplifier and the first end of the splitter, and is configured to increase noise to the real fiber system, And stimulate the error code before error correction of the optical module under test.
  • the noise source is used to add noise to the real fiber system, which can flexibly configure the optical path signal-to-noise ratio, adjust the test stress, and stimulate the bit error rate before error correction of the optical module to be tested, and the error rate before error correction under specific noise conditions The bit error rate is used as one of the screening parameters.
  • the optical module degradation test system further includes: an optical attenuator, which is respectively connected to the second end of the multiplexer and the first end of the first optical amplifier, and is configured to control the optical signal-to-noise ratio .
  • an optical attenuator which is respectively connected to the second end of the multiplexer and the first end of the first optical amplifier, and is configured to control the optical signal-to-noise ratio .
  • the noise source in the optical module degradation test system can be removed, and the optical signal-to-noise ratio can be controlled by adding an optical attenuator between the multiplexer and the first optical amplifier.
  • the optical fiber is used to set the transmission dispersion, which is used to excite the internal dispersion compensation algorithm of the optical module to be measured and run the dispersion compensation function.
  • the system transmission dispersion can be introduced into the optical module degradation test system, which can stimulate the internal dispersion compensation algorithm work of the optical module to be tested, and realize the verification of the dispersion compensation function.
  • the system transmission dispersion is introduced into the optical module degradation test system, that is, the transmission dispersion is introduced to the optical fiber in the optical module test device, so that the dispersion compensation function of the optical module under test is activated.
  • FIG. 3 is a schematic diagram of a connection between an optical module degradation test system provided by an embodiment of the present application and a test PC.
  • the optical module degradation test system includes: a test frame 310, a switch 320, and an optical module test tooling board 330.
  • test PC 340 is connected to the test machine frame 310 through the switch 320, and the optical module test tooling board 330 is also connected to the switch 320 through the machine frame.
  • the optical module degradation test system may include: N test frames 310, namely, frame 1, frame 2, ... frame N.
  • the optical module degradation test system In the process of building the optical module degradation test system, first install the optical module to be tested on the optical module test tooling board 320, and insert the optical module test tooling board 330 of the installed optical module into the testing machine frame 310 for the light to be measured. The module is tested.
  • FIG. 4 is a schematic connection diagram of an optical module testing device provided by an embodiment of the present application.
  • the optical module testing device includes: a multiplexer 410, a first optical amplifier 420, an optical fiber 430, a second optical amplifier 440, a demultiplexer 450, and a noise source 460.
  • the transmitting end of the optical module to be measured 470 is connected to the first end of the multiplexer 410
  • the receiving end of the optical module to be measured 470 is connected to the second end of the demultiplexer 450
  • the optical module to be measured 470 is connected to the second end of the demultiplexer 450.
  • the test object, the transmitting end of the optical module 470 to be tested is connected to the add port of the specific wavelength of the multiplexer 410 through the fiber jumper.
  • the multiplexer 410 couples the light emitted by the optical modules of different wavelengths into the main optical path and passes through the first optical amplifier. After the real fiber system composed of 420 and optical fiber 430, it passes through the splitter 450, and returns to the receiving end of the optical module 470 to be tested from the drop port of the specific wavelength through the fiber jumper.
  • the noise source 460 is set to add noise to the real fiber system, and excite the error code before the error correction of the optical module 470 under test.
  • the test items of the polarization state error rate and other test items (for example, optical power test, status register test)
  • the serial process in order to ensure that other test items are not affected by the collection of H polarization state error count and V polarization state error count for a long time, only a short time is collected each time, and the data collected multiple times is smoothed deal with.
  • the test PC is numbered according to the number of each test frame and the position of the optical module test fixture board in the test frame (ie slot number), and allocates each optical module test fixture board IP address, the optical module to be tested on each optical module test tooling board that obtains an IP address obtains a specific assigned wavelength according to the IP address, and the rules for assigning wavelengths can cover the entire C+L band.
  • the optical module test tooling board continuously collects the error count of the H polarization state and the error count of the V polarization state of the optical module under test, and calculates the error rate of the two polarization states after a period of collection time.
  • the test PC obtains the Q H of the H polarization state and the Q V of the V polarization state by calculating the inverse function of the right tail probability of the chi-square distribution on the bit error rates of the two polarization states and doing logarithmic conversion.
  • Q H represents the chi-square characterization of the horizontal polarization state error
  • Q V represents the chi-square characterization of the vertical polarization state error.
  • FIG. 5 is a schematic diagram of a position where the receiving end of the optical module to be tested samples the polarization state error count according to an embodiment of the present application.
  • the H polarization state error count is collected through the H polarization state error collection point of the DSP in the optical module under test
  • the V polarization state error count is collected through the V polarization state error count collection point in the DSP. Count for collection.
  • Fig. 6 is a schematic diagram showing a test result provided by an embodiment of the present application.
  • the difference between the H polarization state error chi-square characterization quantity and the V polarization state error chi-square characterization quantity is displayed, that is, the polarization state signal quality difference characterization quantity is displayed, and according to the polarization state signal
  • the quality difference characterization quantity is used to determine the degree of degradation of the optical module to be measured.
  • the larger the number the more severe the degradation of the corresponding optical module to be measured.
  • multiple wavelengths can be assigned to the optical module test tooling board according to the packaging of different optical modules to be tested, that is, each optical module test tooling board can test multiple optical modules to be tested.
  • the distance of the real fiber system can be flexibly adjusted according to different models and types of the optical module to be tested, and the distance range can be 0-2000 kilometers (Km), which has a wide range of applications.
  • the process of collecting and calculating the bit error rate by the test PC can be implemented directly by using the optical module test tooling board, and then the test result is returned to the test PC, thereby effectively improving the test efficiency.
  • the overall optical signal-to-noise ratio of the optical module test device can be controlled at a uniform error level (for example, 10 -3 ), so that the test PC can omit the H polarization state error rate and the V polarization state error.
  • the code rate is used to calculate the inverse function of the right tail probability of the chi-square distribution, which directly controls the bit error rate ratio, thereby effectively improving the calculation efficiency of the test PC.
  • the optical module test tooling board can be changed to adapt to different package types of optical modules to be tested (for example, the model can be CFP, CFP2, CFP4, QSFP28, MSA320, MSA168)), and adapt to different Communication interfaces (such as Management Data Input/Output (MDIO), Inter-Integrated Circuit (I2C), High-speed Serial Computer Expansion Bus Standard (Peripheral Component Interconnect Express, PCIE)), thus Expanded the scope of application.
  • MDIO Management Data Input/Output
  • I2C Inter-Integrated Circuit
  • PCIE High-speed Serial Computer Expansion Bus Standard
  • FIG. 7 is a structural block diagram of an optical module degradation test device provided by an embodiment of the present application. This embodiment is applied to the case of testing the deterioration degree of the components in the optical module. As shown in FIG. 7, the device in this embodiment includes: a first determining module 510, a second determining module 520, a third determining module 530, and a fourth determining module 540.
  • the first determining module 510 is configured to determine the corresponding bit error rate in the H polarization state and the bit error rate in the V polarization state based on the pre-collected H polarization state error count and V polarization state error count of the optical module to be tested;
  • the second determining module 520 is configured to determine the corresponding H polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity according to the H polarization state error rate and the V polarization state error rate;
  • the third determining module 530 is configured to determine the characteristic quantity of the polarization state signal quality difference according to the H polarization state error chi-square characteristic quantity and the V polarization state error chi-square characteristic quantity;
  • the fourth determining module 540 is configured to determine the degree of degradation of the optical module to be measured according to the characteristic quantity of the difference in polarization state signal quality.
  • the optical module degradation test device provided in this embodiment is configured to implement the optical module degradation test method of the embodiment shown in FIG. 1.
  • the implementation principle and technical effect of the optical module degradation test device provided in this embodiment are similar, and will not be repeated here.
  • the optical module degradation test device further includes:
  • the first allocation module is set to allocate Internet Protocol IP addresses according to the chassis number and the slot number;
  • the second allocation module is set to allocate the corresponding wavelength to the optical module test tooling board according to the IP address.
  • the first determining module 510 includes:
  • the first calculation unit is configured to calculate the ratio of the pre-collected H polarization state error count of the optical module to be tested and the signal rate * acquisition time to obtain the corresponding H polarization state error rate;
  • the second calculation unit is configured to calculate the ratio of the pre-collected V polarization state error count and the signal rate * acquisition time of the optical module to be tested to obtain the corresponding V polarization state error rate.
  • the second determining module 520 includes:
  • the third calculation unit is configured to calculate the inverse function of the right tail probability of the chi-square distribution on the bit error rate of the H polarization state and the bit error rate of the V polarization state to obtain the first value and the second value;
  • the fourth calculation unit is configured to perform logarithmic conversion on the first value and the second value respectively to obtain the corresponding H polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity.
  • the fourth determining module 540 includes:
  • the comparison unit is configured to compare the characteristic quantity of the signal quality difference in the polarization state with the preset signal quality difference characteristic quantity
  • the determining unit is configured to determine the degree of degradation of the optical module to be measured according to the comparison result.
  • Fig. 8 is a schematic structural diagram of a device provided by an embodiment of the present application.
  • the device provided in this embodiment of the present application includes a processor 610 and a memory 620.
  • the number of processors 610 in the device may be one or more.
  • one processor 610 is taken as an example.
  • the number of memories 620 in the device may be one or more.
  • one memory 620 is taken as an example.
  • the processor 610 and the memory 620 of the device are connected through a bus or in other ways. In FIG. 8, the connection through a bus is taken as an example.
  • the device may be a personal computer.
  • the memory 620 can be configured to store software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to the equipment of any embodiment of the present application (for example, the first module in the optical module degradation test apparatus).
  • the memory 620 may include a program storage area and a data storage area.
  • the program storage area may store an operating system and an application program required by at least one function; the data storage area may store data created according to the use of the device, and the like.
  • the memory 620 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage devices.
  • the memory 620 may further include a memory remotely provided with respect to the processor 610, and these remote memories may be connected to the device through a network. Examples of the aforementioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.
  • the above-provided equipment can be configured to execute the optical module degradation test method provided in any of the above-mentioned embodiments, and has corresponding functions and effects.
  • the embodiment of the present application also provides a storage medium containing computer-executable instructions.
  • the computer-executable instructions are executed by a computer processor, they are used to perform a method for testing optical module degradation.
  • the method includes: according to pre-collected light to be measured.
  • the module's H polarization state error count and V polarization state error count determine the corresponding H polarization state error rate and V polarization state error rate; determine the corresponding H polarization state error rate and V polarization state error rate Polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity; according to H polarization state error chi-square characterization quantity and V polarization state error chi-square characterization quantity to determine the polarization state signal quality difference characterization quantity; according to polarization
  • the characterization quantity of the difference in state signal quality determines the degree of degradation of the optical module to be measured.
  • the embodiments of the present application provide a method, system, equipment, and storage medium for testing the deterioration of an optical module, which implements the component-level fault screening in the optical module.
  • user equipment covers any suitable type of optical communication field.
  • the various embodiments of the present application can be implemented in hardware or dedicated circuits, software, logic or any combination thereof.
  • some aspects may be implemented in hardware, while other aspects may be implemented in firmware or software that may be executed by a controller, microprocessor, or other computing device, although the present application is not limited thereto.
  • Computer program instructions can be assembly instructions, Instruction Set Architecture (ISA) instructions, machine instructions, machine-related instructions, microcode, firmware instructions, state setting data, or written in any combination of one or more programming languages Source code or object code.
  • ISA Instruction Set Architecture
  • the block diagram of any logic flow in the drawings of the present application may represent program steps, or may represent interconnected logic circuits, modules, and functions, or may represent a combination of program steps and logic circuits, modules, and functions.
  • the computer program can be stored on the memory.
  • the memory can be of any type suitable for the local technical environment and can be implemented using any suitable data storage technology, such as but not limited to read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), optical Memory devices and systems (Digital Video Disc (DVD) or Compact Disk (CD)), etc.
  • Computer-readable media may include non-transitory storage media.
  • the data processor can be any type suitable for the local technical environment, such as but not limited to general-purpose computers, special-purpose computers, microprocessors, digital signal processors (Digital Signal Processing, DSP), application specific integrated circuits (ASICs) ), programmable logic devices (Field-Programmable Gate Array, FGPA), and processors based on multi-core processor architecture.
  • DSP Digital Signal Processing
  • ASICs application specific integrated circuits
  • FGPA programmable logic devices

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Optical Communication System (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

一种光模块劣化测试方法、系统、设备和存储介质。该方法包括：根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率(S110)；根据H偏振态误码率和V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量(S120)；根据H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量(S130)；根据偏振态信号质量差异表征量确定待测光模块的劣化程度(S140)。

Description

一种光模块劣化测试方法、系统、设备和存储介质
相关申请的交叉引用
本申请基于申请号为201911273288.9、申请日为2019年12月12日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此引入本申请作为参考。
技术领域
本申请涉及测试，具体涉及一种光模块劣化测试方法、系统、设备和存储介质。
背景技术
光模块由光电子器件、功能电路和光接口等组成，用于进行光电转换。光模块中的器件降级劣化是影响外场骨干网可靠性的重要因素。
在通过短纤自环的条件下进行测试，即由光模块的发送端发出信号，再由接收端接收信号，根据信号的结果差异性对光模块的劣化进行测试，但由于指标极其有限，无法体现出结果差异性，即无法进行元器件级别故障的筛查。
发明内容
有鉴于此，本申请实施例提供一种光模块劣化测试方法、系统、设备和存储介质。
本申请实施例提供一种光模块劣化测试方法，包括：根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率；根据所述H偏振态误码率和所述V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量；根据所述H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量；根据所述偏振态信号质量差异表征量对所述待测光模块的劣化程度进行测试。
本申请实施例提供一种光模块劣化测试系统，包括：测试机框、交换机和光模块测试工装板；所述光模块测试工装板包括：待测光模块和光模块测试装置；所述光模块测试装置包括：合波器、第一光放大器、光纤、第二光放大器和分波器；待测光模块的发送端与所述合波器的第一端连接，所述第一光放大器的第一端与所述合波器的第二端连接，所述第一光放大器的第二端与所述光纤的第一端连接，所述第二光放大器的第一端与所述光纤的第二端连接，所述第二光放大器的第二端与所述分波器的第一端连接，所述分波器的第二端与待测光模块的接收端连接；所述待测光模块的发送端通过光纤跳线接入所述合波器的上路端口，所述合波器将不同波长的待测光模块发射光耦合进入主光路，经过光放大器 和光纤组成的实纤系统之后，经由所述分波器，从特定波长的下路端口经过光纤跳线返回至所述待测光模块的接收端。
本申请实施例提供一种设备，包括：存储器，以及，一个或多个处理器；存储器，设置为存储一个或多个程序；当所述一个或多个程序被所述一个或多个处理器执行，使得所述一个或多个处理器实现上述任一实施例所述的方法。
本申请实施例提供了一种存储介质，所述存储介质存储有计算机程序，所述计算机程序被处理器执行时实现上述任一实施例所述的方法。
附图说明
图1是本申请实施例提供的一种光模块劣化测试方法的流程图；
图2是本申请实施例提供的一种光模块劣化测试系统的结构框图；
图3是本申请实施例提供的一种光模块劣化测试系统与测试PC连接的示意图；
图4是本申请实施例提供的一种光模块测试装置的连接示意图；
图5是本申请实施例提供的一种待测光模块的接收端对偏振态误码计数进行采样的位置示意图；
图6是本申请实施例提供的一种测试结果的显示示意图；
图7是本申请实施例提供的一种光模块劣化测试装置的结构框图；
图8是本申请实施例提供的一种设备的结构示意图。
具体实施方式
下文中将结合附图对本申请的实施例进行说明。在不冲突的情况下，本申请中的实施例及实施例中的特征可以相互任意组合。
在对光模块中的器件降级劣化进行筛选测试的过程中，存在以下难点：其一，在通过短纤自环的条件下进行测试，测试指标极其有限，无法体现出结果差异性；其二，高速光模块的业务链路较长，数字信号处理器(Digital Signal Processing，DSP)、高速插座、高速走线、LD光谱质量、驱动(DRIVER)、调制器、焊接点等都会影响待测光模块的测试性能，即模块与模块之间的指标差异难以区分器件间的差异；其三，为了对器件劣化的差异进行筛查，需保证测试在同一测试条件下进行，比如，外部条件一致：长程光系统色散、光信噪比、入纤功率和波长位置；内部条件一致：信号屏蔽水平、光纤耦合质量、DSP与光器件的匹配等。
有鉴于此，本申请实施例中提出一种光模块劣化测试方法，解决了现有光模块测试筛选效果差、无法进行元器件级别故障筛查的问题。
在一实现方式中，图1是本申请实施例提供的一种光模块劣化测试方法的流程图。本实施例应用于对光模块中元器件的劣化程度进行筛查的情况。本实施例可以由光模块劣化测试系统执行。
如图1所示，本实施例中的方法包括S110-S140。
S110、根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率。
一般来说，自然光也称为正交光，可分解为垂直方向振动部分和水平方向振动部分。在实施例中，H偏振态误码计数指的是水平方向振动部分所产生的误码计数；V偏振态误码计数指的是垂直方向震动部分所产生的误码计数。
在实施例中，待测光模块安装在光模块测试工装板上，以及光模块测试工装板插入测试机框，以对待测光模块的劣化程度进行测试。在测试过程中，通过光模块测试工装板不断采集待测光模块的H偏振态误码计数和V偏振态误码计数，并根据H偏振态误码计数和V偏振态误码计数计算出对应的H偏振态误码率和V偏振态误码率。
在一实施例中，可将偏振态误码计数和信号速率*采集时间之间的比值，作为偏振态误码率，即偏振态误码率＝偏振态误码计数/(信号速率*采集时间)。在实施例中，H偏振态误码率为H偏振态误码计数和信号速率*采集时间之间的比值；V偏振态误码率为V偏振态误码计数和信号速率*采集时间之间的比值。在实施例中，H偏振态误码计数和V偏振态误码计数所采用的采集时间是相同的。
S120、根据H偏振态误码率和V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量。
在实施例中，H偏振态误码卡方表征量指的是水平方向偏振态信号质量表征量，用于表征水平方向的信号质量；V偏振态误码卡方表征量指的是垂直方向偏振态信号质量表征量，用于表征垂直方向的信号质量。在实施例中，可对H偏振态误码率进行一系列运算，得到对应的H偏振态误码卡方表征量；也可以对V偏振态误码率进行一系列运算，得到对应的V偏振态误码卡方表征量。
S130、根据H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量。
在实施例中，在确定待测光模块的H偏振态误码卡方表征量和V偏振态误码卡方表征量之后，可将这两个卡方表征量进行作差，并将差值作为偏振态信号质量差异表征量。 示例性地，将H偏振态误码卡方表征量，记为Q H；将V偏振态误码卡方表征量，记为Q V；将偏振态信号质量差异表征量，记为dQ，则dQ＝Q H-Q V。
S140、根据偏振态信号质量差异表征量确定待测光模块的劣化程度。
在实施例中，偏振态信号质量差异表征量用于表征待测光模块的不同劣化程度。在实施例中，偏振态信号质量差异表征量的绝对值越大，表明待测光模块的劣化程度越严重，即待测光模块中元件器的劣化程度越严重。
在一实施例中，为了保证每个待测光模块的正常运行，在待测光模块的偏振态信号质量差异表征量超过预设信号质量差异表征量阈值的情况下，表明待测光模块中元器件的劣化程度严重，无法进行正常工作，则可直接将该待测光模块筛选出来。
本实施例中采用H偏振态和V偏振态误码率统计差值筛查算法，其采用数据来自同一个光模块，光模块劣化测试系统能够为光模块器件级的筛查提供一致的模块内部条件；并且采样数据属于同一个波长，光模块劣化测试系统能有效地避免生产环境中个别波长通道衰减差异大，以及引入的噪声在整个波段的分布不均造成的不同待测光模块指标差异，从而提高了待测光模块劣化程度的测试准确率。
在一实施例中，光模块劣化测试方法，还包括：获取光模块测试工装板所在测试机框的机框编号和槽位号，光模块测试工装板用于装载待测光模块；根据机框编号和槽位号分配网际互连协议IP地址；根据IP地址为光模块测试工装板分配对应的波长。
在实施例中，根据不同待测光模块的封装，可为光模块测试工装板分配多个波长，即每个光模块测试工装板可测试多个待测光模块，也可理解为，每个光模块测试工装板可以安装有多个待测光模块。在光模块劣化测试系统中，获取光模块测试工装板当前所在的测试机框对应的机框编号，以及获取光模块测试工装板在测试机框中的位置，并根据在测试机框中的位置确定对应的槽位号；根据光模块测试工装板所在的测试机框的机框编号以及槽位号分配IP地址；然后每块获取IP地址的光模块测试工装板上安装的待测光模块依据IP地址获取一个特定分配的波长。在实施例中，波长的分配规则可以覆盖整个C+L波段。其中，C+L波段在光通讯领域中指的是：192.1～196.1THz(C波段)和186.9～190.9THz(L波段)。
在实施例中，通过机框拨号编号和槽位号的组合逻辑进行波长分配，合理利用整个C+L波段，保持光模块测试工装板槽位与接纤的稳定性，方便生产人员操作。同时，利用机框和槽位的关系，在实纤系统中为每个待测光模块设定特定波长，避免波长冲突。同时， 通过固定的分配关系保证生产操作的正确。
在一实施例中，根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率，包括：将预先采集的待测光模块的H偏振态误码计数和采集时间进行比值计算，得到对应的H偏振态误码率；将预先采集的待测光模块的V偏振态误码计数和采集时间进行比值计算，得到对应的V偏振态误码率。
在实施例中，将待测光模块的H偏振态误码计数和信号速率*采集时间之间的比值，作为H偏振态误码率；以及，将待测光模块的V偏振态误码计数和信号速率*采集时间之间的比值，作为V偏振态误码率。
在一实施例中，根据H偏振态误码率和V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量，包括：对H偏振态误码率和V偏振态误码率分别进行卡方分布的右尾概率的反函数计算，得到第一数值和第二数值；对第一数值和第二数值分别进行对数转换，得到对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量。
在实施例中，通过分别对两个偏振态的误码率进行卡方分布的右尾概率的反函数计算，并进行对数转换，得到H偏振态的QH和V偏振态的QV。其中，QH表示水平偏振态误码卡方表征量，QV表示垂直偏振态误码卡方表征量。
在一实施例中，根据偏振态信号质量差异表征量确定待测光模块的劣化程度，包括：将偏振态信号质量差异表征量和预设信号质量差异表征量进行比对；根据对比结果，确定待测光模块的劣化程度。
在实施例中，偏振态信号质量差异表征量用于表征待测光模块的两个偏振态的质量差异，以达到对劣化待测光模块进行筛选的目的。在实施例中，在确定待测光模块的偏振态信号质量差异表征量之后，将偏振态信号质量差异表征量和预设信号质量差异表征量进行作差，若两者之间的差值越大，表明待测光模块的劣化程度越严重。
在实施例中，可设置多个预设信号质量差异表征量，比如，预设信号质量差异表征量为3个，分别为A、B和C，其中A＜B＜C。同时，待测光模块的偏振态信号质量差异表征量为D，则当D在小于A时，表明待测光模块的劣化程度为级别a；当D在A和B之间时，表明待测光模块的劣化程度为级别b；当D在B和C之间时，表明待测光模块的劣化程度为级别c；当D在大于C时，表明待测光模块的劣化程度为级别d。也就是说，级别a对应的待测光模块的劣化程度最轻；级别d对应的待测光模块的劣化程度最严重。
图2是本申请实施例提供的一种光模块劣化测试系统的结构框图。如图2所示，光模 块劣化测试系统，包括：测试机框10、交换机20和光模块测试工装板30；光模块测试工装板30包括：待测光模块301和光模块测试装置302；
光模块测试装置302包括：合波器3021、第一光放大器3022、光纤3023、第二光放大器3024和分波器3025；待测光模块301的发送端与合波器3021的第一端连接，第一光放大器3022的第一端与合波器3021的第二端连接，第一光放大器3022的第二端与光纤3023的第一端连接，第二光放大器3024的第一端与光纤3023的第二端连接，第二光放大器3024的第二端与分波器3025的第一端连接，分波器3025的第二端与待测光模块301的接收端连接；
待测光模块301的发送端通过光纤跳线接入合波器3021的上路端口，合波器3021将不同波长的待测光模块301发射光耦合进入主光路，经过第一光放大器3022和光纤3023组成的实纤系统之后，经由分波器3025，从特定波长的下路端口经过光纤跳线返回至待测光模块301的接收端。
在实施例中，测试机框10通过交换机20与其外接的测试个人计算机(Personal Computer，PC)连接。在光模块劣化测试系统中可以包括多个测试机框10，并且，每个测试机框10均通过交换机20与测试PC连接，以及每个测试机框10上都插入光模块测试工装板30。在每个光模块测试工装板30上可以插入多个待测光模块301，即可以对多个待测光模块301进行劣化测试。
在一实施例中，第一光放大器和光纤组成的系统称为光纤系统。在一实施例中，光纤系统中可以包括一个或多个第一光放大器，以及一个或多个光纤，且第一光放大器的数量和光纤的数量是相同的，即光纤系统为：(第一光放大器+光纤)*N，其中，N为大于等于1的整数。
在一实施例中，第一光放大器1023和第二光放大器1025可以为同类型的光放大器，均被设置成对光信号进行放大，对此并不进行限定。
在一实施例中，光模块劣化测试系统，还包括：噪声源，噪声源分别与第二光放大器的第二端以及分波器的第一端连接，被设置成对实纤系统增加噪声，并激发待测光模块的纠错前误码。在实施例中，利用噪声源对实纤系统增加噪声，可以灵活调配光路信噪比，调整测试应力，并激发待测光模块的纠错前误码率，将特定噪声条件下的纠错前误码率作为其中一个筛查参数。
在一实施例中，光模块劣化测试系统，还包括：光衰减器，光衰减器分别与合波器的 第二端以及第一光放大器的第一端连接，被设置成控制光信噪比。在实施例中，可将光模块劣化测试系统中的噪声源去除，并通过在合波器和第一光放大器之间加入光衰减器来实现对光信噪比的控制。
在一实施例中，利用光纤设置传输色散，用于激发待测光模块内部色散补偿算法，并运行色散补偿功能。在实施例中，可在光模块劣化测试系统中引入系统传输色散，能激发待测光模块内部色散补偿算法相关工作，实现了对色散补偿功能的验证。在实施例中，在光模块劣化测试系统中引入系统传输色散，即对光模块测试装置中的光纤引入传输色散，以使待测光模块色散补偿功能被激发。
在一实现方式中，图3是本申请实施例提供的一种光模块劣化测试系统与测试PC连接的示意图。如图3所示，光模块劣化测试系统中包括：测试机框310、交换机320、光模块测试工装板330。
在实施例中，测试PC340通过交换机320与测试机框310进行连接，光模块测试工装板330经过机框也接入交换机320。在一实施例中，光模块劣化测试系统中可以包括：N个测试机框310，即机框1、机框2……机框N。
在搭建光模块劣化测试系统的过程中，首先在光模块测试工装板320上安装待测光模块，安装好待测光模块的光模块测试工装板330插入测试机框310中，以对待测光模块进行测试。
在一实现方式中，图4是本申请实施例提供的一种光模块测试装置的连接示意图。如图4所示，光模块测试装置包括：合波器410、第一光放大器420、光纤430、第二光放大器440、分波器450和噪声源460。在实施例中，待测光模块470的发送端与合波器410的第一端连接，待测光模块470的接收端与分波器450的第二端连接，待测光模块470为被测试对象，待测光模块470的发送端通过光纤跳线接入合波器410的特定波长的上路端口，合波器410将不同波长的光模块发射光耦合进入主光路，经过第一光放大器420和光纤430共同组成的实纤系统后，经由分波器450，从特定波长的下路端口经过光纤跳线回到待测光模块470的接收端。噪声源460被设置成给实纤系统增加噪声，激发出被测光模块470的纠错前误码。
在一实施例中，在对H偏振态误码计数和V偏振态误码计数进行采集筛查时，并且偏振态误码率的测试项目与其它测试项目(比如，光功率测试、状态寄存器测试)串行进行时，为了保证其他测试项目不被采集H偏振态误码计数与V偏振态误码计数占用较多时 间影响，每次仅采集较短时间，并对多次采集的数据进行平滑处理。
在光模块劣化测试系统中，测试PC根据每个测试机框的编号，以及光模块测试工装板在测试机框中的位置进行编号(即槽位号)，为每个光模块测试工装板分配IP地址，每块获得IP地址的光模块测试工装板上按照的待测光模块根据IP地址获得一个特定分配的波长，并且，分配波长的规则可以覆盖整个C+L波段。
光模块测试工装板不断采集待测光模块的H偏振态误码计数和V偏振态误码计数，并经过一段采集时间后统计出两个偏振态的误码率。
测试PC通过分别对两个偏振态的误码率进行卡方分布的右尾概率的反函数计算并做对数转换得到H偏振态的Q H和V偏振态的Q V。其中，Q H代表水平偏振态误码卡方表征量，Q V代表垂直偏振态误码卡方表征量。
最终通过计算Q H和Q V之间的差值，即相干光模块偏振态信号质量差异表征量dQ＝Q H-Q V来表征被测光模块05的两个偏振态的质量差异，以对待测光模块进行筛选。
图5是本申请实施例提供的一种待测光模块的接收端对偏振态误码计数进行采样的位置示意图。如图5所示，通过待测光模块中DSP的H偏振态误码采集点对H偏振态误码计数进行采集，以及通过DSP中的V偏振态误码计数采集点对V偏振态误码计数进行采集。
图6是本申请实施例提供的一种测试结果的显示示意图。如图6所示，将H偏振态误码卡方表征量和V偏振态误码卡方表征量之间的差值进行展示，即偏振态信号质量差异表征量进行展示，并根据偏振态信号质量差异表征量来确定待测光模块的劣化程度。在图6中，其数字越大，则表明对应的待测光模块劣化程度越严重。
在一实施例中，可根据不同待测光模块的封装，为光模块测试工装板分配多个波长，即每个光模块测试工装板可以测试多个待测光模块。
在一实施例中，可根据待测光模块的不同型号与类型，灵活调整实纤系统的距离，其距离范围可以为0～2000千米(Km)，适用范围广。
在一实施例中，测试PC对误码率进行采集和计算的过程，可直接利用光模块测试工装板来实现，然后将测试结果返回至测试PC，从而有效提高了测试效率。
在一实施例中，可将光模块测试装置的整体光信噪比控制在统一的误码量级(比如，10 -3)，从而测试PC可以省略H偏振态误码率和V偏振态误码率进行卡方分布的右尾概率的反函数计算的过程，直接控制误码率比值，从而有效提高了测试PC的计算效率。
在一实施例中，可通过更改光模块测试工装板，来适配不同封装类型的待测光模块(比如，型号可以为CFP、CFP2、CFP4、QSFP28、MSA320、MSA168))，并适配不同的通讯接口(比如，管理数据输入输出(Management Data Input/Output，MDIO)、集成电路总线(Inter-Integrated Circuit，I2C)、高速串行计算机扩展总线标准(Peripheral Component Interconnect Express，PCIE))，从而扩大了适用范围。
图7是本申请实施例提供的一种光模块劣化测试装置的结构框图。本实施例应用于对光模块中元器件的劣化程度进行测试的情况。如图7所示，本实施例中的装置包括：第一确定模块510、第二确定模块520、第三确定模块530和第四确定模块540。
其中，第一确定模块510，设置为根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率；
第二确定模块520，设置为根据H偏振态误码率和V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量；
第三确定模块530，设置为根据H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量；
第四确定模块540，设置为根据偏振态信号质量差异表征量确定待测光模块的劣化程度。
本实施例提供的光模块劣化测试装置设置为实现图1所示实施例的光模块劣化测试方法，本实施例提供的光模块劣化测试装置实现原理和技术效果类似，此处不再赘述。
在一实施例中，光模块劣化测试装置，还包括：
获取模块，设置为获取光模块测试工装板所在测试机框的机框编号和槽位号，光模块测试工装板用于装载待测光模块；
第一分配模块，设置为根据机框编号和槽位号分配网际互连协议IP地址；
第二分配模块，设置为根据IP地址为光模块测试工装板分配对应的波长。
在一实施例中，第一确定模块510，包括：
第一计算单元，设置为将预先采集的待测光模块的H偏振态误码计数和信号速率*采集时间进行比值计算，得到对应的H偏振态误码率；
第二计算单元，设置为将预先采集的待测光模块的V偏振态误码计数和信号速率*采集时间进行比值计算，得到对应的V偏振态误码率。
在一实施例中，第二确定模块520，包括：
第三计算单元，设置为对H偏振态误码率和V偏振态误码率分别进行卡方分布的右尾概率的反函数计算，得到第一数值和第二数值；
第四计算单元，设置为对第一数值和第二数值分别进行对数转换，得到对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量。
在一实施例中，第四确定模块540，包括：
比对单元，设置为将偏振态信号质量差异表征量和预设信号质量差异表征量进行比对；
确定单元，设置为根据对比结果，确定待测光模块的劣化程度。
图8是本申请实施例提供的一种设备的结构示意图。如图8所示，本申请实施例提供的设备，包括：处理器610和存储器620。该设备中处理器610的数量可以是一个或者多个，图8中以一个处理器610为例。该设备中存储器620的数量可以是一个或者多个，图8中以一个存储器620为例。该设备的处理器610和存储器620以通过总线或者其他方式连接，图8中以通过总线连接为例。示例性地，设备可以为个人计算机。
存储器620作为一种计算机可读存储介质，可设置为存储软件程序、计算机可执行程序以及模块，如本申请任意实施例的设备对应的程序指令/模块(例如，光模块劣化测试装置中的第一确定模块510、第二确定模块520、第三确定模块530和第四确定模块540)。存储器620可包括存储程序区和存储数据区，其中，存储程序区可存储操作系统、至少一个功能所需的应用程序；存储数据区可存储根据设备的使用所创建的数据等。此外，存储器620可以包括高速随机存取存储器，还可以包括非易失性存储器，例如至少一个磁盘存储器件、闪存器件、或其他非易失性固态存储器件。在一些实例中，存储器620可进一步包括相对于处理器610远程设置的存储器，这些远程存储器可以通过网络连接至设备。上述网络的实例包括但不限于互联网、企业内部网、局域网、移动通信网及其组合。
上述提供的设备可设置为执行上述任意实施例提供的光模块劣化测试方法，具备相应的功能和效果。
本申请实施例还提供一种包含计算机可执行指令的存储介质，计算机可执行指令在由计算机处理器执行时用于执行一种光模块劣化测试方法，该方法包括：根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率；根据H偏振态误码率和V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量；根据H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量；根据偏振态信号质量差异表征量确定待测光模块的劣化 程度。
本申请实施例提供一种光模块劣化测试方法、系统、设备和存储介质，实现了光模块中元器件级别的故障筛查。
本领域内的技术人员应明白，术语用户设备涵盖任何适合类型的光通讯领域。
一般来说，本申请的多种实施例可以在硬件或专用电路、软件、逻辑或其任何组合中实现。例如，一些方面可以被实现在硬件中，而其它方面可以被实现在可以被控制器、微处理器或其它计算装置执行的固件或软件中，尽管本申请不限于此。
本申请的实施例可以通过移动装置的数据处理器执行计算机程序指令来实现，例如在处理器实体中，或者通过硬件，或者通过软件和硬件的组合。计算机程序指令可以是汇编指令、指令集架构(Instruction Set Architecture，ISA)指令、机器指令、机器相关指令、微代码、固件指令、状态设置数据、或者以一种或多种编程语言的任意组合编写的源代码或目标代码。
本申请附图中的任何逻辑流程的框图可以表示程序步骤，或者可以表示相互连接的逻辑电路、模块和功能，或者可以表示程序步骤与逻辑电路、模块和功能的组合。计算机程序可以存储在存储器上。存储器可以具有任何适合于本地技术环境的类型并且可以使用任何适合的数据存储技术实现，例如但不限于只读存储器(Read-Only Memory，ROM)、随机访问存储器(Random Access Memory，RAM)、光存储器装置和系统(数码多功能光碟(Digital Video Disc，DVD)或光盘(Compact Disk，CD))等。计算机可读介质可以包括非瞬时性存储介质。数据处理器可以是任何适合于本地技术环境的类型，例如但不限于通用计算机、专用计算机、微处理器、数字信号处理器(Digital Signal Processing，DSP)、专用集成电路(Application Specific Integrated Circuit，ASIC)、可编程逻辑器件(Field-Programmable Gate Array，FGPA)以及基于多核处理器架构的处理器。

Claims (11)

  1. 一种光模块劣化测试方法，包括：
    根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率；
    根据所述H偏振态误码率和所述V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量；
    根据所述H偏振态误码卡方表征量和V偏振态误码卡方表征量确定偏振态信号质量差异表征量；
    根据所述偏振态信号质量差异表征量确定所述待测光模块的劣化程度。
  2. 根据权利要求1所述的方法，还包括：
    获取光模块测试工装板所在测试机框的机框编号和槽位号，所述光模块测试工装板用于装载待测光模块；
    根据所述机框编号和所述槽位号分配网际互连协议IP地址；
    根据所述IP地址为所述光模块测试工装板分配对应的波长。
  3. 根据权利要求1所述的方法，其中，所述根据预先采集的待测光模块的H偏振态误码计数和V偏振态误码计数确定对应的H偏振态误码率和V偏振态误码率，包括：
    将预先采集的待测光模块的H偏振态误码计数和信号速率*采集时间进行比值计算，得到对应的H偏振态误码率；
    将预先采集的待测光模块的V偏振态误码计数和信号速率*采集时间进行比值计算，得到对应的V偏振态误码率。
  4. 根据权利要求1所述的方法，其中，所述根据所述H偏振态误码率和所述V偏振态误码率确定对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量，包括：
    对所述H偏振态误码率和所述V偏振态误码率分别进行卡方分布的右尾概率的反函数计算，得到第一数值和第二数值；
    对所述第一数值和所述第二数值分别进行对数转换，得到对应的H偏振态误码卡方表征量和V偏振态误码卡方表征量。
  5. 根据权利要求1所述的方法，其中，所述根据所述偏振态信号质量差异表征量确定所述待测光模块的劣化程度，包括：
    将所述偏振态信号质量差异表征量和至少两个预设信号质量差异表征量进行比对；
    根据对比结果，确定所述待测光模块的劣化程度。
  6. 一种光模块劣化测试系统，包括：测试机框、交换机和光模块测试工装板；其中， 所述光模块测试工装板包括：待测光模块和光模块测试装置；
    所述光模块测试装置包括：合波器、第一光放大器、光纤、第二光放大器和分波器；待测光模块的发送端与所述合波器的第一端连接，所述第一光放大器的第一端与所述合波器的第二端连接，所述第一光放大器的第二端与所述光纤的第一端连接，所述第二光放大器的第一端与所述光纤的第二端连接，所述第二光放大器的第二端与所述分波器的第一端连接，所述分波器的第二端与待测光模块的接收端连接；
    所述待测光模块的发送端通过光纤跳线接入所述合波器的上路端口，所述合波器将不同波长的待测光模块发射光耦合进入主光路，经过光放大器和光纤组成的实纤系统之后，经由所述分波器，从特定波长的下路端口经过光纤跳线返回至所述待测光模块的接收端。
  7. 根据权利要求6所述的系统，其中，所述光模块测试装置，还包括：噪声源，所述噪声源分别与所述第二光放大器的第二端以及所述分波器的第一端连接，被设置成对实纤系统增加噪声，并激发所述待测光模块的纠错前误码。
  8. 根据权利要求6所述的系统，其中，所述光模块测试装置，还包括：光衰减器，所述光衰减器分别与所述合波器的第二端以及所述第一光放大器的第一端连接，被设置成控制光信噪比。
  9. 根据权利要求6所述的系统，其中，利用所述光纤设置传输色散，用于激发所述待测光模块内部色散补偿算法，并运行色散补偿功能。
  10. 一种设备，包括：存储器，以及一个或多个处理器；其中，
    存储器，设置为存储一个或多个程序；
    当所述一个或多个程序被所述一个或多个处理器执行，使得所述一个或多个处理器实现如权利要求1-5任一所述的方法。
  11. 一种存储介质，存储有计算机程序，其中，所述计算机程序被处理器执行时实现权利要求1-5任一项所述的方法。
PCT/CN2020/135846 2019-12-12 2020-12-11 一种光模块劣化测试方法、系统、设备和存储介质 WO2021115445A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201911273288.9A CN112994786B (zh) 2019-12-12 2019-12-12 一种光模块劣化测试方法、系统、设备和存储介质
CN201911273288.9 2019-12-12

Publications (1)

Publication Number Publication Date
WO2021115445A1 true WO2021115445A1 (zh) 2021-06-17

Family

ID=76329634

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2020/135846 WO2021115445A1 (zh) 2019-12-12 2020-12-11 一种光模块劣化测试方法、系统、设备和存储介质

Country Status (2)

Country Link
CN (1) CN112994786B (zh)
WO (1) WO2021115445A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113644973B (zh) * 2021-06-30 2022-10-14 中国信息通信研究院 一种otn网络光信噪比测试方法和系统

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6676304B1 (en) * 2001-01-11 2004-01-13 Ciena Corporation Optical module testing system
US20040184802A1 (en) * 2003-03-21 2004-09-23 Agilent Technologies, Inc. Method and apparatus for assessing performance of optical systems
CN201629746U (zh) * 2010-04-28 2010-11-10 青岛海信宽带多媒体技术有限公司 一种自环光模块
CN102932058A (zh) * 2012-11-08 2013-02-13 绍兴飞泰光电技术有限公司 一种光模块自动测试中测试仪器共享使用方法及测试系统
CN103457657A (zh) * 2013-09-13 2013-12-18 许继集团有限公司 智能变电站继电保护装置光模块状态检测方法
CN204089820U (zh) * 2014-09-15 2015-01-07 四川泰瑞创通讯技术有限公司 光模块性能参数测试装置
CN105634589A (zh) * 2016-01-26 2016-06-01 四川华拓光通信股份有限公司 短距离传输万兆光模块的综合测试系统及应用方法
CN108037390A (zh) * 2017-12-14 2018-05-15 武汉电信器件有限公司 一种筛选光模块退化的检测方法和装置
CN109000889A (zh) * 2018-06-21 2018-12-14 青岛海信宽带多媒体技术有限公司 一种光模块劣化的检测方法及装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6676304B1 (en) * 2001-01-11 2004-01-13 Ciena Corporation Optical module testing system
US20040184802A1 (en) * 2003-03-21 2004-09-23 Agilent Technologies, Inc. Method and apparatus for assessing performance of optical systems
CN201629746U (zh) * 2010-04-28 2010-11-10 青岛海信宽带多媒体技术有限公司 一种自环光模块
CN102932058A (zh) * 2012-11-08 2013-02-13 绍兴飞泰光电技术有限公司 一种光模块自动测试中测试仪器共享使用方法及测试系统
CN103457657A (zh) * 2013-09-13 2013-12-18 许继集团有限公司 智能变电站继电保护装置光模块状态检测方法
CN204089820U (zh) * 2014-09-15 2015-01-07 四川泰瑞创通讯技术有限公司 光模块性能参数测试装置
CN105634589A (zh) * 2016-01-26 2016-06-01 四川华拓光通信股份有限公司 短距离传输万兆光模块的综合测试系统及应用方法
CN108037390A (zh) * 2017-12-14 2018-05-15 武汉电信器件有限公司 一种筛选光模块退化的检测方法和装置
CN109000889A (zh) * 2018-06-21 2018-12-14 青岛海信宽带多媒体技术有限公司 一种光模块劣化的检测方法及装置

Also Published As

Publication number Publication date
CN112994786B (zh) 2024-02-23
CN112994786A (zh) 2021-06-18

Similar Documents

Publication Publication Date Title
US20140055776A1 (en) Read optical power link service for link health diagnostics
CN108242952A (zh) 一种bob设备校准系统及方法
WO2021115445A1 (zh) 一种光模块劣化测试方法、系统、设备和存储介质
CN113783606B (zh) 一种光分配装置和光通信检测系统以及光通信检测方法
US20160048475A1 (en) Method, Apparatus, and System for Configuring High-Speed Serial Bus Parameter
CN112363883A (zh) 一种cpu压力测试方法及装置
WO2024146366A1 (zh) 一种前后端负载管理方法、系统、设备及计算机存储介质
EP2829972A1 (en) Method and apparatus for allocating stream processing unit
US11275683B2 (en) Method, apparatus, device and computer-readable storage medium for storage management
CN105281825A (zh) 测试系统和方法
CN111064507A (zh) 光纤链路长度检测方法、装置及终端设备
CN112305511A (zh) 一种雷达接收机数字基带信号录取分析系统和方法
CN111385019A (zh) 光线路测试系统、方法及存储介质
CN113037370A (zh) Bosa接收功率校准装置方法及装置
CN116185799A (zh) 中断时间获取方法、装置、系统、通信设备及存储介质
US11212001B1 (en) Transmit optical power adjustment based on receive optical power measurements
CN112269715B (zh) 服务器功耗测方法及相关设备
US6201620B1 (en) Test method for a network element of an optical communication system and network element therefor with test module
CN207528415U (zh) 一种可调光学滤波器的在线冲击振动测试系统
US9785539B2 (en) Application development via a multi-unit device
WO2021036852A1 (zh) 光纤线路检测控制方法、装置、设备及可读存储介质
CN113381808B (zh) 一种矩阵光开关的测试装置及方法
US20230268992A1 (en) Test modules for network test instrument utilizing containers
CN112564845B (zh) 一种确定逻辑连接的方法和相关设备
CN113259000B (zh) 一种光模块测试装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 20898318

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 20898318

Country of ref document: EP

Kind code of ref document: A1

32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205A DATED 14/02/2023)

122 Ep: pct application non-entry in european phase

Ref document number: 20898318

Country of ref document: EP

Kind code of ref document: A1