WO2021110019A1 - Led light emitting device and manufacturing method therefor - Google Patents

Led light emitting device and manufacturing method therefor Download PDF

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Publication number
WO2021110019A1
WO2021110019A1 PCT/CN2020/133281 CN2020133281W WO2021110019A1 WO 2021110019 A1 WO2021110019 A1 WO 2021110019A1 CN 2020133281 W CN2020133281 W CN 2020133281W WO 2021110019 A1 WO2021110019 A1 WO 2021110019A1
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WO
WIPO (PCT)
Prior art keywords
area
emitting device
led light
electrode
layer
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PCT/CN2020/133281
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French (fr)
Chinese (zh)
Inventor
林纪年
林羿孜
李昱达
陈庆
Original Assignee
亿光电子工业股份有限公司
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Priority to CN202080083419.1A priority Critical patent/CN114747025A/en
Publication of WO2021110019A1 publication Critical patent/WO2021110019A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/40Materials therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto

Definitions

  • the present invention relates to the field of LED technology, in particular to an LED light-emitting device and a manufacturing method thereof.
  • LED light-emitting devices have the advantages of long working life, low power consumption, small size, light weight, etc., and have been widely used in lighting, display and other fields.
  • a common LED light-emitting device includes a carrier and an LED chip.
  • the carrier includes a conductive layer, the conductive layer includes a copper layer, and a soldering area is provided on the copper layer.
  • the soldering area is composed of a nickel layer and a gold layer.
  • the electrode of the LED chip is fixed on the gold layer by solder paste and electrically connected to the soldering area, so that the LED light-emitting device can emit light normally.
  • embodiments of the present invention provide an LED light-emitting device and a manufacturing method thereof, which are used to reduce the cost of the LED light-emitting device and improve the structural stability of the LED light-emitting device.
  • An embodiment of the present invention provides an LED light-emitting device, wherein the LED light-emitting device includes: a carrier, the carrier includes a conductive layer; an LED chip, the LED chip is arranged on the carrier, and the electrode of the LED chip Flip-chip bonding and conductive connection on the conductive layer;
  • the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
  • the LED light-emitting device provided by the embodiment of the present invention includes a carrier and an LED chip, the carrier includes a conductive layer, the electrodes of the LED chip are flip chip bonded and conductively connected to the conductive layer, and any one of the welding area of the conductive layer and the electrode of the LED chip Including tin layer, and excluding gold and nickel. With this arrangement, the nickel layer and the gold layer in the related solutions can be replaced by the tin layer, thereby saving cost.
  • the tin layer can provide a higher proportion of tin to the soldering area than the solder paste, which improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of tin in the tin layer is higher than the melting point of the solder paste, so when soldering , There will be no secondary melting, thereby improving the structural stability of the LED light-emitting device.
  • soldering area includes a tin layer.
  • soldering area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
  • the electrode includes a tin layer and does not include gold and nickel; and the soldering area includes gold and nickel.
  • the bonding area includes a tin layer and does not include gold and nickel; the electrode includes a tin layer but does not include gold and nickel.
  • the LED light-emitting device as described above, wherein the LED light-emitting device further includes a high-reflective bracket arranged on the carrier, the high-reflective bracket is a groove-shaped structure, and includes an integrally formed wall part and a base part;
  • the area in the welding area that is in contact with the electrode of the LED chip is a chip contact area, and the base portion covers an area in the welding area excluding the chip contact area;
  • the LED chip is located in the high reflection bracket.
  • the material of the high-reflective bracket includes resin and filler, and the resin is any one of polyester, unsaturated polyester, and epoxy;
  • the filler includes at least one of titanium dioxide or glass fiber;
  • the filler includes at least one of the titanium dioxide, silicon dioxide, and the glass fiber;
  • the filler includes at least one of the titanium dioxide, the silicon dioxide, and the aluminum oxide.
  • the area of the conductive layer corresponding to the chip contact area is a conductive layer contact area
  • the top surface of the conductive layer contact area and the top surface of the base portion are located on the same plane.
  • the base part has an isolation part located between the two welding areas.
  • the two soldering areas include two chip contact areas, the two chip contact areas correspond to the two conductive layer contact areas, and the two conductive layer contact areas Each has an extension part embedded in the isolation part.
  • the shape of the LED chip is a square; the limiting protrusion includes at least one L-shaped protrusion, and the L-shaped protrusion is distributed beside at least one corner of the LED chip .
  • the shape of the LED chip is a square; the limiting protrusion is a square ring-shaped protrusion, and the square ring-shaped protrusion surrounds four sides of the LED chip.
  • the embodiment of the present invention also provides a method for manufacturing an LED light-emitting device, wherein the method for manufacturing the LED light-emitting device includes:
  • the carrier including a conductive layer
  • the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
  • the manufacturing method of the LED light-emitting device includes providing a carrier including a conductive layer and an LED chip, and bonding the electrodes of the LED chip with flip-chip and conductively connected to the conductive layer; wherein the conductive layer includes a copper layer and is disposed on the conductive layer.
  • the soldering area on the copper layer, any one of the soldering area and the electrode includes a tin layer, and does not include gold and nickel. After the above steps, the tin layer can replace the gold layer and the nickel layer, and there is no need to provide the gold layer and the nickel layer in the welding area, thereby saving the cost.
  • the tin layer itself provides tin for soldering the electrode of the LED chip and the soldering area, without Use solder paste to provide tin. Since no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction between the electrode of the LED chip and the soldering area after soldering, and the above-mentioned impurities are not easy to clean, and the tin layer can be provided to the soldering area compared to the solder paste.
  • a higher proportion of tin improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of pure tin is higher than that of tin paste, so there will be no secondary melting during reflow soldering, thereby improving the LED light-emitting device
  • the structural stability
  • the bonding area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
  • soldering area includes a tin layer and does not include gold and nickel; and the electrode includes a tin layer and does not include gold and nickel.
  • At least one electrode of the LED chip is attached to the flux
  • soldering flux does not have tin.
  • the high-reflection support being arranged on the carrier;
  • the high-reflective bracket is a groove-shaped structure, including an integrally formed wall part and a base part; the area in the soldering area that is in contact with the electrode of the LED chip is a chip contact area, and the base part covers the The area of the bonding area excluding the chip contact area.
  • Figure 1 is a schematic diagram of the structure of the welding zone in the related technology
  • FIG. 2 is a schematic diagram of the structure of the welding zone in the embodiment of the present invention.
  • Figure 3 is a scanning electron micrograph (SEM) of the welding area and electrode of the carrier in the embodiment of the present invention
  • Fig. 4 is an energy dispersive X-ray spectrum (EDX) obtained by performing spectral analysis on the first analysis point in Fig. 3;
  • EDX energy dispersive X-ray spectrum
  • Figure 5 is a scanning electron micrograph (SEM) of the welding area and electrode of the carrier in the related scheme
  • Fig. 6 is an energy dispersive X-ray spectrogram (EDX) obtained by performing spectral analysis on the second analysis point in Fig. 5;
  • EDX energy dispersive X-ray spectrogram
  • FIG. 7 is a schematic diagram of the structure of the first highly reflective bracket in the embodiment of the present invention.
  • Figure 8 is a top view of Figure 7;
  • FIG. 9 is a schematic diagram of the structure of the highly reflective support and the conductive layer when no LED chip is provided in the embodiment of the present invention.
  • FIG. 10 is a schematic diagram of the structure when the conductive layer in FIG. 9 is provided with solder paste;
  • FIG. 11 is a schematic diagram of the structure when the LED chip is arranged in FIG. 9;
  • FIG. 12 is a schematic diagram of the structure when the conductive layer is provided with flux in the embodiment of the present invention.
  • FIG. 13 is a schematic diagram of the structure when the LED chip is arranged in FIG. 12;
  • FIG. 14 is a schematic structural diagram of a second type of highly reflective bracket provided in an embodiment of the present invention.
  • Figure 15 is a top view of Figure 14;
  • FIG. 16 is a schematic view of the structure of the conductive layer in FIG. 14 provided with flux;
  • FIG. 17 is a schematic diagram of the structure when the LED chip is arranged in the second type of highly reflective bracket in FIG. 14;
  • FIG. 18 is a schematic diagram of the structure when the LED chip is arranged in the third type of highly reflective bracket
  • Figure 19 is a top view of Figure 18;
  • 20 is a schematic diagram of the structure when the mixture of the bonding glue and the tin layer provided in the embodiment of the present invention overflows;
  • Figure 21 is a top view of Figure 20;
  • FIG. 22 is a schematic structural diagram of an extension portion of a conductive layer provided in an embodiment of the present invention.
  • Figure 23 is a top view of Figure 22;
  • FIG. 24 is a schematic diagram of a structure of a limiting protrusion provided in an embodiment of the present invention.
  • Figure 25 is a top view of Figure 24;
  • FIG. 26 is a schematic diagram of the structure of the LED chip provided in the embodiment of the present invention when the position of the LED chip is shifted; FIG.
  • Figure 27 is a top view of Figure 26;
  • Figure 29 is a top view of Figure 28;
  • FIG. 30 is a schematic diagram of the flow of reflow soldering in an embodiment of the present invention.
  • FIG. 31 is a schematic structural diagram of an LED chip provided by an embodiment of the present invention.
  • Electrode 610: Light-transmitting element substrate
  • 611 First surface
  • 612 Fourth area
  • 620 N-type semiconductor layer
  • 630 Light-emitting layer
  • 631 The third area; 640: P-type semiconductor layer;
  • 671 the first opening
  • 672 the second opening
  • 680 the second N electrode; 681: the first area;
  • the LED light-emitting device includes a carrier 1 and an LED chip.
  • the carrier 1 includes a conductive layer
  • the conductive layer includes a copper layer 5 and a bonding area, that is, the second bonding area 4 in FIG.
  • the welding area 4 covers the copper layer 5 to prevent the copper layer 5 from being oxidized by air.
  • the second welding area 4 includes a nickel layer 41 and a gold layer 42.
  • the electrode of the LED chip is fixed to the second soldering area 4 by the solder paste, thereby electrically connecting with the conductive layer, so that the LED light-emitting device can emit light normally.
  • gold and nickel are relatively expensive, and the provision of the nickel layer 41 and the gold layer 42 increases the cost of the LED light-emitting device.
  • solder paste is used as a bonding glue and the electrodes of the LED chip are welded and fixed in the second welding area through the tin powder dissolved in the solder paste. 4 on.
  • the flux in the solder paste cannot be removed during the process of fixing the LED chip on the second soldering area 4, otherwise the solder powder will not be dissolved in the solder paste and damage the solder paste The performance stability.
  • any one of the soldering area of the LED light emitting device and the electrode of the LED chip provided by the embodiment of the present invention includes a tin layer, and does not include gold and nickel.
  • the nickel layer and the gold layer are replaced by the tin layer, which saves costs.
  • the LED light emitting device includes a carrier 1 and an LED chip arranged on the carrier.
  • the carrier 1 includes a conductive layer; the LED chip is arranged on the carrier, and the electrode of the LED chip is flip-chip. Bonded and conductively connected to the conductive layer; wherein the conductive layer includes a copper layer 5 and a first welding area 3 provided on the copper layer 5. Any one of the first welding area 3 and the electrode includes a tin layer and does not include Gold and nickel.
  • the first welding zone 3 here is the welding zone in the embodiment of the present invention.
  • the carrier 1 may be a circuit board with a conductive layer, wherein the conductive layer may be a copper-plated layer, and the conductive layer includes a first bonding area 3 for conductive connection with the LED chip.
  • the LED chip is a semiconductor device and a light-emitting component of the LED light-emitting device.
  • the LED chip generally includes two electrodes 61. One or two electrodes of the LED chip can be connected to the first welding area 3 on the conductive layer.
  • the LED chip is a blue light or ultraviolet light (UV) chip, that is, the light emitted by the LED chip 6 is blue light or ultraviolet light.
  • the LED chip 6 may be a flip-chip LED chip. As shown in FIG.
  • the LED chip 6 includes a light-transmitting element substrate 610, an N-type semiconductor layer 620, a light-emitting layer 630, and a P-type semiconductor layer 640.
  • the two electrodes 61 electrically connected to the first pad 3 of the conductive layer are the second N electrode 680 and the second P electrode 690 shown in FIG. 31.
  • the light-transmitting element substrate 610 may be sapphire, ceramic, resin, or thermosetting epoxy resin (EMC).
  • the light-transmitting element substrate 610 includes a first surface 611.
  • the N-type semiconductor layer 620 is disposed on the surface 611 and connected to the light-transmitting element substrate 610.
  • the light-emitting layer 630 is disposed on the N-type semiconductor layer 620 and the light-emitting layer 630 contacts the N-type semiconductor layer 620 to form a third region 631.
  • the P-type semiconductor layer 640 is disposed on the light-emitting layer 630, the light-emitting layer 630 and the P-type semiconductor 640 expose a fourth region 612 of the N-type semiconductor layer 620, and the fourth region 612 is not covered by the light-emitting layer 630 and the P-type semiconductor layer 640 In the region, the P-type semiconductor layer 640 contacts the N-type semiconductor layer to form the light-emitting layer 630.
  • the first N electrode 650 is disposed on the fourth region 612 of the N-type semiconductor layer 620, and the first N electrode 650 is not connected to the P-type semiconductor layer 640, and the first N electrode 650 is in contact with the N-type semiconductor layer 620 to form a first junction ⁇ 651.
  • the first P electrode 660 is provided on the P-type semiconductor layer 640.
  • the first N electrode 650 and the first P electrode 660 may be indium tin oxide (ITO) and indium zinc oxide (IZO), respectively.
  • the first insulating layer 670 is disposed on the N-type semiconductor 620 between the first N electrode 650 and the first P electrode 660 to insulate the two electrodes from each other.
  • the first insulating layer 670 completely covers the left and right sides of the first N electrode 650, and also completely covers the left and right sides of the first P electrode 660, so that the first N electrode 650 and the first P The electrodes 660 are not electrically connected to each other.
  • the first insulating layer 670 covers the lower side of the first N electrode 650 and forms at least one first opening 671, and the first insulating layer 670 covers the lower side of the first P electrode 660 and forms at least one second opening 672.
  • the at least one first opening 671 and the at least one second opening 672 may be a cylindrical shape extending in a vertical direction, where the vertical direction is the vertical direction in FIG. 31.
  • the second N electrode 680 is disposed on the first N electrode 650 and the first insulating layer 670. A part of the second N electrode 680 passes through the first opening 671 and is electrically connected to the first N electrode 650.
  • the second N electrode 680 includes one The surface area of the first area 681 is larger than the surface area of the first joining surface 651.
  • the second P electrode 690 is disposed on the first P electrode 660 and the first insulating layer 670. A part of the second P electrode 690 passes through the second opening 672 and is electrically connected to the first P electrode 660.
  • the second P electrode 690 The second area 691 includes a second area 691, and the second area 691 is smaller than a third area 631 on the light-emitting layer 630, that is, the surface area of the second area 691 is smaller than the surface area of the third area 631.
  • the second N electrode 680 and the second P electrode 690 have almost the same size (same surface area) from a bottom view, and the second N electrode 680 and the second P electrode 690 are electrically connected and fixed to the conductive layer.
  • the second N electrode 680 may also have a size smaller than the size of the second P electrode 690 or larger than the size of the second P electrode 690.
  • the LED chip material may be nitride semiconductor, and the general formula of the nitride semiconductor is In x Al y Ga 1-xy N (0 ⁇ x, 0 ⁇ y, x+y ⁇ 1),
  • the LED chip material can also be a mixed crystal formed by mixing B, P, and As with a nitride semiconductor.
  • the N-type semiconductor layer and the P-type semiconductor layer are not particularly limited to a single layer or multiple layers.
  • the nitride semiconductor layer is a light-emitting layer having an active layer, and the active layer is a single (SQW) or multiple quantum well structure (MQW). Below, examples of nitride semiconductor layers are shown.
  • the base layer of a nitride semiconductor such as a buffer layer can be a low-temperature grown thin film GaN and GaN layer; as an N-type nitride semiconductor layer, it can be an N-type contact layer laminated with Si-doped GaN
  • the P-type nitride semiconductor layer can be a P-type multilayer film layer with Mg-doped InGaN/AlGaN layered and The structure of Mg-doped GaN P-type contact layer.
  • the light-emitting layer (active layer) of the nitride semiconductor may have a quantum well structure including a well layer or a barrier layer and a well layer.
  • the nitride semiconductor used in the active layer may be doped with P-type impurity, but through undoped or N-type impurity doping, the light-emitting element can be made into a high-output device.
  • Al is contained in the well layer, it is possible to obtain a wavelength shorter than the wavelength of the band gap energy of GaN, 365 nm.
  • the wavelength of light emitted from the active layer can be adjusted according to the purpose, application, etc.
  • the composition of the well layer is that InGaN is best used in the visible light and near-ultraviolet regions.
  • the composition of the barrier layer is preferably GaN or InGaN.
  • Specific examples of the film thickness of the barrier layer and the well layer are 1 nm or more and 30 nm or less and 1 nm or more and 20 nm or less, and can be used as a single quantum well structure with a single well layer, or a multiple quantum well structure of plural well layers such as a barrier layer.
  • the LED light emitting device emits white light
  • a blue or ultraviolet LED chip can be used in combination with a packaging gel mixed with yellow phosphors to mix blue and yellow light into white light.
  • the phosphor used in the encapsulating gel of the LED chip is not limited to the phosphor of a specific color, and can be red phosphor, green phosphor or yellow phosphor, or two or more different colors of phosphor
  • the composition even if the same is red, green or yellow phosphor, it can also be composed of one or more different materials; specifically, taking red phosphor as an example, it may include CASN or SCASN series, such as CaAlSiN 3 :Eu 2+ , (Sr,Ca)AlSiN 3 :Eu 2+ , (SrCa)S:Eu 2+ , CaS:Eu 2+ , Sr 3 Si(ON) 5 :Eu 2+ ; KSF series, such as K 2 SiF 6 :Mn 4+ ; It also includes red phosphors with AE 1-z S 1-y Se y : zA as the general formula, where AE is at least one alkaline earth metal selected from M
  • any one of the first welding area 3 and the electrode of the conductive layer includes a tin layer, and does not include gold and nickel, that is, at this time, the first welding area 3 uses a tin layer instead of the gold layer 42 and nickel in the related solution.
  • the role of layer 41 is that tin is cheaper than gold and nickel, so this solution can save costs.
  • the method of flip chip bonding of the electrodes of the LED chip may be reflow soldering.
  • reflow soldering only flux is needed to help and promote the soldering process, and the tin layer of the first soldering area 3 itself provides the tin for soldering the electrodes of the LED chip and the first soldering area 3, without the need to use solder paste.
  • solder paste Since solder paste is not used, there is no need to use solder paste to provide tin.
  • solder paste is not used, impurities other than tin in the solder paste can be avoided to remain at the junction between the electrode 61 of the LED chip and the first soldering area 3 after soldering, and The above-mentioned impurities are not easy to clean, and the tin layer of the first bonding area 3 can provide a higher proportion of tin to the first bonding area 3 than a solder paste, which improves the adhesion between the electrode of the LED chip and the first bonding area 3 In addition, the melting point of pure tin is higher than that of tin paste. During reflow soldering, there will be no secondary melting, which improves the structural stability of the LED light-emitting device.
  • any one of the first welding area 3 and the electrode includes a tin layer, and does not include gold and nickel. That is, the first bonding area 3 includes a tin layer and does not include gold and nickel; and/or, the electrode includes a tin layer and does not include gold and nickel.
  • the tin layer is a part of the first welding zone 3. This arrangement can prevent the copper layer covered by the first welding area 3 from being oxidized by air before welding with the LED chip electrode 61.
  • tin can be provided as a conductive component, and the flux can be a flux that does not contain conductive components such as tin.
  • the tin plating method of tin plating on the copper layer 5 of the first welding zone 3 can be used to set the tin layer on the copper layer 5 of the first welding zone 3, that is, the copper layer 5 in the welding zone passes through The chemical reaction is coated with pure tin.
  • the tin plating method adopts tin, the process is simple, the phenomenon of plate explosion is not easy to occur, and the thickness of the tin layer is uniform.
  • Fig. 3 is a scanning electron micrograph (SEM) of the contact area between the carrier 1 and the electrode 61 in an embodiment of the present invention
  • Fig. 5 is a scanning electron micrograph (SEM) of the contact area between the carrier 1 and the electrode 61 in a related scheme
  • the above-mentioned carrier 1 is a PCB carrier.
  • the LED chip electrode 61 and Between the copper layer 5 is the welding area of this scheme, namely the first welding area 3.
  • the chip electrode 61 and the copper layer Between 5 is the welding area of the related scheme, that is, the second welding area 4.
  • Performing spectral analysis on the first analysis point 31 of the first welding zone 3 can obtain the energy dispersive X-ray spectrogram as shown in Fig. 4, and analyzing the energy dispersive X-ray spectrogram as shown in Fig. 4 can be obtained as shown in Table 1.
  • Table 1 shows that the first welding zone 3 is the first
  • the elements at analysis point 31 include C, Cu, and Sn, where C mainly comes from the flux, Cu mainly comes from the first solder zone 3, and Sn mainly comes from the tin layer.
  • Performing spectral analysis on the second analysis point 43 of the second welding zone 4 can obtain the energy dispersive X-ray spectrogram as shown in Fig. 6, and analyzing the energy dispersive X-ray spectrogram as shown in Fig. 6 can be obtained as shown in Table 2.
  • the element types and the proportions of the elements at the second analysis point 43 of the second welding zone 4 of the carrier 1 and the electrode 61 provided by the related solutions shown in Table 2 show that the second analysis point of the second welding zone 4 Elements at 43 include C, P, Ni, Cu, Sn, where C mainly comes from flux, Ni mainly comes from the nickel layer 41, Cu mainly comes from the second pad 4 and solder paste, and Sn mainly comes from solder paste .
  • the LED light-emitting device provided by the embodiment of the present invention further includes a high-reflective bracket 7 arranged on the carrier 1, and the LED chip 6 is located in the high-reflective bracket 7.
  • the LED chip 6 is fixed on the first welding area 3 in the high-reflective bracket 7 by soldering with a tin layer. With this arrangement, the light emitted by the LED chip 6 can be reflected by the high-reflective bracket 7 so as to achieve the effect of increasing the light intensity emitted by the LED chip 6.
  • the material of the high reflection bracket 7 is shown in Table 3, including resin and filler, where the resin can be any of polyester, unsaturated polyester, and epoxy.
  • the filler includes at least one of titanium dioxide (TiO 2 ) or glass fiber (Glass fiber); when the resin is an unsaturated polyester, the filler includes titanium dioxide (TiO 2 ), silicon dioxide ( At least one of SiO 2 ) and glass fiber (Glass fiber); when the resin is epoxy resin, the filler includes titanium dioxide (TiO 2 ), silicon dioxide (SiO 2 ), and aluminum oxide (Al 2 O 3 ). At least one of.
  • the reflectance of silver to the visible light is 94%-98%, and the tin to the visible light
  • the reflectivity of the high-reflection bracket 7 is between 77% and 81%, and the reflectivity of the high-reflection bracket 7 to the visible light is between 95% and 97%.
  • the general way of reflecting the light emitted by the LED chip 6 in the general LED light-emitting device is to include a silver layer in the soldering area of the conductive layer 2 shown in Fig. 9, and the LED chip 6 is soldered and fixed to the conductive layer 2.
  • the light emitted by the LED chip 6 is reflected by the silver layer.
  • solder paste 8 is required.
  • solder paste As the bonding glue, solder paste or dispensing solder paste is applied to the soldering area shown in FIG.
  • the electrode 61 of the LED chip 6 is soldered and fixed in the soldering area by the tin powder dissolved in the solder paste 8.
  • the secondary tin melting is likely to occur, and the electrode 61 of the LED chip 6 is easily separated from the soldering area, causing the LED light-emitting device to fail.
  • the first soldering area 3 of the conductive layer 2 of the LED light-emitting device provided in this embodiment includes a tin layer, and the electrode 61 of the LED chip 6 is soldered
  • the conductive layer only the solder flux 9 is used as the bonding glue, that is, the solder flux 9 is dispensed on the conductive layer 2 as shown in FIG. 9, and there is no need to use the solder paste 8 to provide tin, and the tin layer itself can provide tin.
  • the melting point of pure tin is higher than that of the solder paste 8, and no secondary melting occurs during reflow soldering, which improves the structural reliability of the LED light-emitting device.
  • the LED chip 6 can be a flip chip or a formal chip, and the specific conditions can be selected according to actual needs.
  • the LED chip 6 may be various types of LED chips, such as mini LEDs and small-pitch light-emitting diodes.
  • the LED chip 6 is a flip chip. Compared with the normal chip, the flip chip can further increase the light extraction rate of the LED light-emitting device and increase the light intensity of the LED light-emitting device.
  • the LED chip 6 may use the chip shown in Table 4.
  • the LED chip is an ultra-fine-pitch light-emitting diode (mini LED), that is, when the LED light-emitting device is a mini LED light-emitting device, since the size of the ultra-fine-pitch light-emitting diode is extremely small, the size of the corresponding dispenser is also Very small, and the size of the tin particles in the solder paste cannot be spotted from the outlet of the dispenser.
  • the dispenser cannot be used to add the solder paste, and only brushing can be used. Add solder paste by machine brushing.
  • the flux used in this embodiment can be dispensed by a dispenser, thereby improving the accuracy of LED chip bonding.
  • the LED chip 6 includes two electrodes 61, and the conductive layer 2 of the carrier 1 includes two first welding areas 3 corresponding to the above two electrodes 61 one-to-one.
  • Each first welding area 3 includes a chip contact area
  • the chip contact area is the area where the first welding area 3 contacts the electrode 61 of the LED chip 6, and the area of the conductive layer 2 corresponding to each chip contact area is the conductive layer contact area 21, that is, the part of the conductive layer 2 that is in contact with the electrode 61 of the LED chip 6 is the conductive layer contact area 21.
  • the upper end of the conductive layer contact area 21 is a chip contact area.
  • the size of the conductive layer contact area 21 can be designed with reference to the size of the LED chip 6.
  • Table 5 lists the sizes of three different models of LED chips; as shown in Table 5, the sizes of the three different models of LED chips 6 are in order It is 580 ⁇ m*1170 ⁇ m, 660 ⁇ m*760 ⁇ m, 510 ⁇ m*1020 ⁇ m. Among them, 580 ⁇ m, 660 ⁇ m, and 510 ⁇ m are the longitudinal dimensions of the three different types of LED chips 6 in sequence, which can be characterized by a in Figure 8; 1170 ⁇ m, 760 ⁇ m, and 1020 ⁇ m are the horizontal dimensions of the three different types of LED chips in order. The size, the lateral size can be characterized by b in FIG. 8.
  • Table 5 The brightness of the LED light-emitting devices in the first, second and third options
  • the size of each electrode 61 of the LED chip 6 is 580 ⁇ m*1170 ⁇ m, the size of each electrode 61 of the LED chip 6 is 530 ⁇ m*450 ⁇ m; when the size of the LED chip 6 is 660 ⁇ m*760 ⁇ m, the size of each electrode 61 of the LED chip 6 is 460 ⁇ m*205 ⁇ m or 500 ⁇ m*225 ⁇ m. When the size of the LED chip 6 is 510 ⁇ m*1020 ⁇ m, the size of each electrode 61 of the LED chip 6 is 435 ⁇ m*365 ⁇ m.
  • the size of the conductive layer contact area 21 can be slightly smaller than the size of the electrode 61 of the LED chip 6, so that the electrode 61 of the LED chip 6 can completely cover the chip contact area on the conductive layer contact area 21, that is, the electrode of the LED chip 6. 61 completely covers the tin layer on the conductive layer contact area 21, thereby improving the adhesion (pushing force) between the electrode 61 of the LED chip 6 and the conductive layer contact area 21.
  • the size of each conductive layer contact area 21 is 205 ⁇ m*435 ⁇ m, and the interval between two conductive layer contact areas 21 is 150 ⁇ m.
  • 205 ⁇ m is the lateral dimension of the conductive layer contact area 21, which can be characterized by c in FIG. 15, and 435 ⁇ m is the longitudinal dimension of the conductive layer contact area 21, which can be characterized by d in FIG. 15; two conductive layer contact areas The interval between 21 can be characterized by e in FIG. 15.
  • the high reflection bracket 7 is a groove-shaped structure, and includes an integrally formed wall portion 71 and a base portion 72.
  • the LED chip 6 is soldered and fixed on the conductive layer 2 in the high-reflection bracket 7 through the tin layer of the first soldering area 3, and the base portion 72 covers the area of the first soldering area 3 except the chip contact area.
  • the light emitted by the LED chip 6 can be reflected by the base 72, compared to the light emitted by the LED chip 6 being reflected by the tin layer in the area other than the chip contact area in the first bonding area 3, due to the high reflection bracket 7
  • the reflectance of visible light is higher than that of the tin layer, so that the structure of the highly reflective bracket 7 provided in this embodiment can increase the intensity of the light emitted from the light outlet of the highly reflective bracket 7, thereby increasing the LED light emitting device emits The intensity of the light.
  • the soldering area of the LED light-emitting device in the first solution is a silver layer, and the base 72 does not cover areas other than the chip contact area; the soldering area of the LED light-emitting device in the second solution is a tin layer, and the base 72 does not cover the other than the chip The area other than the contact area; the soldering area of the LED light-emitting device in the third solution is a tin layer, and the base 72 covers the area except the chip contact area.
  • the average brightness of the light emitted by the LED light-emitting devices in the first, second, and third solutions are 21.59, 14.66, and 21.37, respectively.
  • the average brightness of the light emitted by the LED light-emitting devices in the second and third solutions is the same as the solution
  • the ratio of the average brightness of the light emitted by the LED light-emitting device in No. 1 is 67.91% and 99.00%.
  • the brightness of the light emitted by the LED light-emitting device in the third solution is much greater than that of the LED light-emitting device in the second solution, indicating that when the base 72 covers the soldering area except the chip contact area, it can be Greatly improve the brightness of the light emitted by the LED lighting device.
  • the brightness of the LED light-emitting device in the third solution is relatively close to that of the LED light-emitting device in the first solution, it indicates that when the base 72 covers the area other than the chip contact area, the soldering area formed by the silver layer is replaced with The soldering area formed by the tin layer has little effect on the brightness of the light emitted by the LED light-emitting device. Therefore, the silver layer can be replaced with a tin layer, thereby reducing the cost of the LED light-emitting device, avoiding secondary melting during soldering, and improving the structural reliability of the LED light-emitting device.
  • the base portion 72 includes an isolation portion 721 located between the two first welding areas 3. As shown in FIG. 18, in a specific embodiment, the isolation portion 721, the base portion 72 can separate the two first welding areas 3 into the positive electrode welding area and the negative electrode welding area, and the positive electrode welding area and the LED chip 6 The positive electrode is electrically connected, and the negative electrode welding area is electrically connected to the negative electrode of the LED chip 6.
  • the top surface of the conductive layer contact area 21 and the top surface of the base portion 72 are in the same plane.
  • the top surface of the isolation portion 721 of the base portion 72 is higher than the top surface of the conductive layer contact region 21. This arrangement can prevent the mixture of die-bonding glue and tin layer from overflowing during the welding process.
  • the isolation portion 721 when the top surface of the isolation portion 721 is not higher than the top surface of the conductive layer contact area 21, the mixture of the bonding glue and the tin layer on the two conductive layer contact areas 21 located on the left and right sides flows to The isolation portion 721 makes the two conductive layer contact areas 21 on the left and right sides conductively connected, resulting in a short circuit of the LED light-emitting device.
  • the mixture of the bond glue and the tin layer on the two conductive layer contact areas 21 on the left and right sides can be blocked from flowing to the isolation portion 721, avoiding the left and right sides.
  • the two conductive layer contact areas 21 are electrically connected, so as to avoid short-circuit failure.
  • the LED light-emitting device will be deformed when subjected to external forces such as bending or impact, especially when the LED light-emitting device is used as an edge-type backlight.
  • the LED light-emitting device has a long and narrow structure and is subjected to bending. It is easy to crack when external forces such as folding and impact are applied. Therefore, in order to enhance the ability of the LED light-emitting device to resist bending and impact deformation, in the present embodiment, the two conductive layer contact areas 21 on the left and the right are provided with extensions 22 embedded in the isolation portion 721.
  • the base 72 is provided with a limiting protrusion 722 located on the periphery of the LED chip 6.
  • a limiting protrusion 722 located on the periphery of the LED chip 6.
  • the LED light emitting device when the position of the LED chip 6 does not shift, the LED light emitting device will correspond to a specific light intensity at a specific light output angle.
  • the position of the LED chip 6 shifts, at this time, the position of the LED chip 6 relative to the high-reflective support 7, the first welding area 3 and other structures has changed, and the light emitted by the LED chip 6 passes through the high-reflective support 7, the first welding
  • the parameters such as the angle and intensity of the output of the structure such as zone 3 will also change after reflection, which causes the light-type distortion of the light emitted by the LED light-emitting device.
  • the shape of the LED chip 6 is square
  • the limiting protrusion 722 includes at least one L-shaped protrusion
  • the L-shaped protrusions are distributed on the LED At least one corner of the chip.
  • the limiting protrusion 722 includes four L-shaped protrusions distributed at the four corners of the LED chip 6. This arrangement has less influence on the light emitted by the LED chip 6 and can prevent the LED chip 6 from shifting in the four directions of up, down, left, and right in FIG. 14.
  • the shape of the LED chip 6 is square; the limiting protrusion 722 is a square ring-shaped protrusion, and the square ring-shaped protrusion surrounds the four sides of the LED chip 6. Sides.
  • the embodiment of the present invention also provides a method for manufacturing an LED light-emitting device.
  • the method for manufacturing an LED light-emitting device provided by the embodiment of the present invention first provides a carrier, and the carrier includes a conductive layer;
  • an LED chip is provided, and the electrodes of the LED chip are flip-chip bonded and conductively connected to the conductive layer;
  • the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
  • any one of the soldering area and the electrode of the carrier includes a tin layer, and does not include gold and nickel, that is, the gold layer and the nickel layer in the related scheme are replaced by the tin layer, and compared with gold and nickel, tin is cheaper and can be save costs.
  • solder paste to provide tin.
  • the tin layer itself can provide tin, and the flux is better than solder paste.
  • Cheap can reduce costs. Since no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction between the electrode of the LED chip and the soldering area after soldering, and the above-mentioned impurities are not easy to clean, and the tin layer can be provided to the soldering area compared to the solder paste.
  • the bonding force between the electrode of the LED chip and the soldering area is 50G-60G, which is much greater than that of the LED chip when the nickel layer and the gold layer are arranged on the carrier and the solder paste is used for connection in the related solution.
  • the adhesion between the electrode and the welding area (25G-35G).
  • any one of the soldering area and the electrode of the carrier includes a tin layer, and does not include gold and nickel. That is, the soldering area includes a tin layer and does not include nickel and gold; and/or, the electrode includes a tin layer and does not include gold and nickel.
  • the soldering area includes a tin layer and does not include nickel and gold; and/or, the electrode includes a tin layer and does not include gold and nickel.
  • the method further includes the following steps:
  • At least one electrode of the LED chip is attached to the flux
  • Adopting the glue dispensing method of the glue machine compared with the brushing method of the tin brushing machine, has the advantages of high precision and not easy to brush, so that the LED chip can be solidified, that is, at least one electrode of the LED chip is attached to the helper. When the flux is applied, the LED chip will not shift, so that the light pattern of the light emitted by the LED light-emitting device will not shift.
  • the LED chip is an ultra-fine-pitch light-emitting diode (mini LED)
  • the size of the corresponding dispenser is also extremely small, and the size of the tin particles in the solder paste cannot be
  • the exit point of the glue machine is out, and when the solder paste is used as the solid crystal glue, the glue can not be added by the glue dispensing method, and the solder paste can only be added by the brushing method of the tin brushing machine.
  • the flux used in this embodiment can be dispensed by a dispenser, thereby improving the accuracy of LED chip bonding.
  • the step of performing reflow soldering on the electrode and the soldering area so that at least one electrode of the LED chip is soldered and fixed in the soldering area includes:
  • the manufacturing method of the LED light-emitting device further includes: providing a high-reflection support, the high-reflection support is arranged on the carrier; the high-reflection support is a groove-shaped structure, including an integrally formed wall and Base: The area in the soldering area that is in contact with the electrode of the LED chip is the chip contact area, and the base covers the area of the soldering area except the chip contact area.
  • the light emitted by the LED chip can be reflected by the high-reflection bracket, and the brightness of the light-emitting direction of the LED light-emitting device can be improved.

Abstract

An LED light emitting device and a manufacturing method therefor, relating to the technical field of LEDs, for use in solving the technical problems of high cost and poor structural stability of LED light emitting devices. The LED light emitting device comprises: a carrier (1), the carrier (1) comprising a conductive layer (2); and an LED chip (6), the LED chip (6) being provided on the carrier (1), an electrode (61) of the LED chip (6) being flip-chip bonded to and conductively connected to the conductive layer (2), wherein the conductive layer (2) comprises a copper layer (5) and a soldering area (3) provided on the copper layer (5), and any of the soldering area (3) and the electrode (61) comprises a tin layer and does not comprise gold and nickel. The LED light emitting device and the manufacturing method therefor is used for reducing the cost of LED light emitting devices and improving the structural stability of LED light emitting devices.

Description

LED发光装置及其制造方法LED light emitting device and manufacturing method thereof
本发明要求于2019年12月2日提交美国专利及商标局、申请号为62/942,359、申请名称为“LED”以及于2020年的7月6日提交美国专利及商标局、申请号为63/048,343、申请名称为“Lead frame design for dispensing”的美国专利申请的优先权,其全部内容通过引用结合在本发明中。This invention is required to be filed with the U.S. Patent and Trademark Office on December 2, 2019, with application number 62/942,359, and the application name is "LED", and on July 6, 2020, with the U.S. Patent and Trademark Office, with application number 63. /048,343, the priority of the US patent application named "Lead frame design for dispensing", the entire content of which is incorporated into the present invention by reference.
技术领域Technical field
本发明涉及LED技术领域,尤其涉及一种LED发光装置及其制造方法。The present invention relates to the field of LED technology, in particular to an LED light-emitting device and a manufacturing method thereof.
背景技术Background technique
LED发光装置具有工作寿命长、耗电量低、体积小、重量轻等优点,在照明、显示等领域得到了广泛应用。LED light-emitting devices have the advantages of long working life, low power consumption, small size, light weight, etc., and have been widely used in lighting, display and other fields.
通常的LED发光装置包括载体与LED芯片,载体包括导电层,导电层包括铜层,铜层上设置有焊接区,焊接区由镍层与金层组成。LED芯片的电极通过锡膏固定在金层上,并与焊接区电连接,从而使得LED发光装置能够正常发光。A common LED light-emitting device includes a carrier and an LED chip. The carrier includes a conductive layer, the conductive layer includes a copper layer, and a soldering area is provided on the copper layer. The soldering area is composed of a nickel layer and a gold layer. The electrode of the LED chip is fixed on the gold layer by solder paste and electrically connected to the soldering area, so that the LED light-emitting device can emit light normally.
然而,上述LED发光装置存在成本高、结构稳定性较差的问题。However, the above-mentioned LED light-emitting devices have the problems of high cost and poor structural stability.
发明内容Summary of the invention
鉴于上述问题,本发明实施例提供一种LED发光装置及其制造方法,用于降低LED发光装置的成本、提高LED发光装置的结构稳定性。In view of the foregoing problems, embodiments of the present invention provide an LED light-emitting device and a manufacturing method thereof, which are used to reduce the cost of the LED light-emitting device and improve the structural stability of the LED light-emitting device.
为了实现上述目的,本发明实施例提供如下技术方案:In order to achieve the foregoing objectives, the embodiments of the present invention provide the following technical solutions:
本发明实施例提供一种LED发光装置,其中,所述LED发光装置包括:载体,所述载体包括一导电层;LED芯片,所述LED芯片设置于所述载体上,所述LED芯片的电极覆晶接合且导电性连接于所述导电层上;An embodiment of the present invention provides an LED light-emitting device, wherein the LED light-emitting device includes: a carrier, the carrier includes a conductive layer; an LED chip, the LED chip is arranged on the carrier, and the electrode of the LED chip Flip-chip bonding and conductive connection on the conductive layer;
其中,所述导电层包括铜层与设置在所述铜层上的焊接区,所述焊接区与所述电极中的任意一个包括锡层,且不包括金和镍。Wherein, the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
本发明实施例提供的LED发光装置具有如下优点:The LED light-emitting device provided by the embodiment of the present invention has the following advantages:
本发明实施例提供的LED发光装置包括载体和LED芯片,载体包括导电层,LED芯片的电极覆晶接合且导电性连接于导电层上,导电层的焊接区与LED芯片的电极中的任意一个包括锡层,且不包括金和镍。这样设置,通过锡层可以替代相关方案中的镍层与金层,从而节约了成本。且将LED芯片的至少一个电极焊接于焊接区时,只需使用助焊剂(Flux)作为固晶胶来帮助和促进焊接过程,并由锡层自身提供将LED芯片的电极和焊接区焊接在一起的锡,无需使用锡膏来提供锡,由于不使用锡膏,可避免锡膏中锡以外的杂质在焊接后残留于LED芯片的电极与焊接区的接合处,且上述杂质不易清洗的问题,并且锡层较锡膏可向焊接区提供更高比例的锡,提高了LED芯片的电极与焊接区之间的粘结力;且锡层中锡的熔点比锡膏的熔点高,进行焊接时,不会出现二次熔融状况,从而提高了LED发光装置的结构稳定性。The LED light-emitting device provided by the embodiment of the present invention includes a carrier and an LED chip, the carrier includes a conductive layer, the electrodes of the LED chip are flip chip bonded and conductively connected to the conductive layer, and any one of the welding area of the conductive layer and the electrode of the LED chip Including tin layer, and excluding gold and nickel. With this arrangement, the nickel layer and the gold layer in the related solutions can be replaced by the tin layer, thereby saving cost. And when soldering at least one electrode of the LED chip to the soldering area, you only need to use flux (Flux) as a die bond to help and promote the soldering process, and the tin layer itself provides the electrode and the soldering area of the LED chip to be soldered together There is no need to use solder paste to provide tin. Because no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction of the electrode and the soldering area of the LED chip after soldering, and the above-mentioned impurities are not easy to clean. Moreover, the tin layer can provide a higher proportion of tin to the soldering area than the solder paste, which improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of tin in the tin layer is higher than the melting point of the solder paste, so when soldering , There will be no secondary melting, thereby improving the structural stability of the LED light-emitting device.
如上所述的LED发光装置,其中,所述焊接区包括锡层。The LED light-emitting device as described above, wherein the soldering area includes a tin layer.
如上所述的LED发光装置,其中,所述焊接区包括锡层,且不包括金和镍;所述电极包括金和镍。The LED light-emitting device as described above, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
如上所述的LED发光装置,其中,所述电极包括锡层,且不包括金和镍;所述焊接区包括金和镍。The LED light-emitting device as described above, wherein the electrode includes a tin layer and does not include gold and nickel; and the soldering area includes gold and nickel.
如上所述的LED发光装置,其中,所述焊接区包括锡层,且不包括金和镍;所述电极包括锡层,且不包括金和镍。The LED light-emitting device as described above, wherein the bonding area includes a tin layer and does not include gold and nickel; the electrode includes a tin layer but does not include gold and nickel.
如上所述的LED发光装置,其中,所述LED发光装置还包括设置在所述载体上的高反射支架,所述高反射支架为凹槽状结构,包括一体成型的围墙部和基底部;所述焊接区中与所述LED芯片的电极接触的区域为芯片接触区,所述基底部覆盖所述焊接区中除所述芯片接触区以外的区域;The LED light-emitting device as described above, wherein the LED light-emitting device further includes a high-reflective bracket arranged on the carrier, the high-reflective bracket is a groove-shaped structure, and includes an integrally formed wall part and a base part; The area in the welding area that is in contact with the electrode of the LED chip is a chip contact area, and the base portion covers an area in the welding area excluding the chip contact area;
所述LED芯片位于所述高反射支架内。The LED chip is located in the high reflection bracket.
如上所述的LED发光装置,其中,所述高反射支架的材料包括树脂与填充剂,所述树脂为聚酯、不饱和聚酯、环氧树脂中的任意一种;The LED light-emitting device as described above, wherein the material of the high-reflective bracket includes resin and filler, and the resin is any one of polyester, unsaturated polyester, and epoxy;
当所述树脂为所述聚酯时,所述填充剂包括二氧化钛或玻璃纤维中的至少一种;When the resin is the polyester, the filler includes at least one of titanium dioxide or glass fiber;
当所述树脂为所述不饱和聚酯时,所述填充剂包括所述二氧化钛、二氧化硅、所述玻璃纤维中的至少一种;When the resin is the unsaturated polyester, the filler includes at least one of the titanium dioxide, silicon dioxide, and the glass fiber;
当所述树脂为所述环氧树脂时,所述填充剂包括所述二氧化钛、所述二氧化硅、氧化铝中的至少一种。When the resin is the epoxy resin, the filler includes at least one of the titanium dioxide, the silicon dioxide, and the aluminum oxide.
如上所述的LED发光装置,其中,所述芯片接触区对应的导电层的区域为导电层接触区,所述导电层接触区的顶面与所述基底部的顶面位于同一平面。The LED light-emitting device as described above, wherein the area of the conductive layer corresponding to the chip contact area is a conductive layer contact area, and the top surface of the conductive layer contact area and the top surface of the base portion are located on the same plane.
如上所述的LED发光装置,其中,所述LED芯片包括两个电极,所述导电层上包括有与两个所述电极一一对应的两个所述焊接区;The LED light-emitting device as described above, wherein the LED chip includes two electrodes, and the conductive layer includes two welding areas corresponding to the two electrodes one-to-one;
所述基底部具有位于两个所述焊接区之间的隔离部。The base part has an isolation part located between the two welding areas.
如上所述的LED发光装置,其中,所述隔离部的顶面高于所述导电层接触区的顶面。The LED light-emitting device as described above, wherein the top surface of the isolation portion is higher than the top surface of the conductive layer contact area.
如上所述的LED发光装置,其中,两个所述焊接区包括两个所述芯片接触区,两个所述芯片接触区对应两个所述导电层接触区,两个所述导电层接触区均有嵌入到所述隔离部中的延伸部。The LED light-emitting device as described above, wherein the two soldering areas include two chip contact areas, the two chip contact areas correspond to the two conductive layer contact areas, and the two conductive layer contact areas Each has an extension part embedded in the isolation part.
如上所述的LED发光装置,其中,所述基底部设置有限位凸起,所述限位凸起位于所述LED芯片的外围。The LED light-emitting device as described above, wherein the base is provided with a limiting protrusion, and the limiting protrusion is located at the periphery of the LED chip.
如上所述的LED发光装置,其中,所述LED芯片的形状为方形;所述限位凸起包括至少一个L型凸起,所述L型凸起分布在所述LED芯片的至少一个角旁。The LED light-emitting device as described above, wherein the shape of the LED chip is a square; the limiting protrusion includes at least one L-shaped protrusion, and the L-shaped protrusion is distributed beside at least one corner of the LED chip .
如上所述的LED发光装置,其中,所述LED芯片的形状为方形;所述限位凸起为方形环状凸起,所述方形环状凸起包围所述LED芯片的四个侧面。In the LED light-emitting device as described above, the shape of the LED chip is a square; the limiting protrusion is a square ring-shaped protrusion, and the square ring-shaped protrusion surrounds four sides of the LED chip.
本发明实施例还提供了一种LED发光装置的制造方法,其中,所述LED发光装置的制造方法包括:The embodiment of the present invention also provides a method for manufacturing an LED light-emitting device, wherein the method for manufacturing the LED light-emitting device includes:
提供载体,所述载体包括导电层;以及Providing a carrier, the carrier including a conductive layer; and
提供LED芯片,将所述LED芯片的电极覆晶接合且导电性连接于所述导电层上;Provide an LED chip, and connect the electrodes of the LED chip with flip chip and conductively connect to the conductive layer;
其中,所述导电层包括铜层与设置在所述铜层上的焊接区,所述焊接区与所述电极中的任意一个包括锡层,且不包括金和镍。Wherein, the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
本发明实施例提供的LED发光装置的制造方法具有如下优点:The manufacturing method of the LED light emitting device provided by the embodiment of the present invention has the following advantages:
本发明实施例提供的LED发光装置的制造方法包括提供包含导电层的载体以及LED芯片,将LED芯片的电极覆晶接合且导电性连接于导电层上;其中,导电层包括铜层与设置在铜层上的焊接区,焊接区与电极中的任意一个包括锡层,且不包括金和镍。经过上述步骤,可以使锡层替代金层与镍层,无需再在焊接区设置金层与镍层,从而节约了成本。并且将LED芯片的至少一个电极固定连接于焊接区时,只需使用助焊剂作为固晶胶来帮助和促进焊接过程,锡层自身提供将LED芯片的电极和焊接区焊接在一起的锡,无需使用锡膏来提供锡。由于不使用锡膏,可避免锡膏中锡以外的杂质在焊接后残留于LED芯片的电极与焊接区的接合处,且上述杂质不易清洗的问题,并且锡层较锡膏可向焊接区提供更高比例的锡,提高了LED芯片的电极与焊接区之间的粘结力;且纯锡熔点比锡膏高,进行回流焊时,不会出现二次熔融状况,从而提高了LED发光装置的结构稳定性。The manufacturing method of the LED light-emitting device provided by the embodiment of the present invention includes providing a carrier including a conductive layer and an LED chip, and bonding the electrodes of the LED chip with flip-chip and conductively connected to the conductive layer; wherein the conductive layer includes a copper layer and is disposed on the conductive layer. The soldering area on the copper layer, any one of the soldering area and the electrode includes a tin layer, and does not include gold and nickel. After the above steps, the tin layer can replace the gold layer and the nickel layer, and there is no need to provide the gold layer and the nickel layer in the welding area, thereby saving the cost. And when at least one electrode of the LED chip is fixedly connected to the soldering area, only flux is used as a die bond to help and promote the soldering process. The tin layer itself provides tin for soldering the electrode of the LED chip and the soldering area, without Use solder paste to provide tin. Since no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction between the electrode of the LED chip and the soldering area after soldering, and the above-mentioned impurities are not easy to clean, and the tin layer can be provided to the soldering area compared to the solder paste. A higher proportion of tin improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of pure tin is higher than that of tin paste, so there will be no secondary melting during reflow soldering, thereby improving the LED light-emitting device The structural stability.
如上所述的LED发光装置的制造方法,其中,所述焊接区包括锡层。The method for manufacturing an LED light-emitting device as described above, wherein the soldering area includes a tin layer.
如上所述的LED发光装置的制造方法,其中,所述焊接区包括锡层且不包括金和镍;所述电极包括金和镍。The method for manufacturing an LED light-emitting device as described above, wherein the bonding area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
如上所述的LED发光装置的制造方法,其中,所述电极包括锡层,且不包括金和镍;所述焊接区包括金和镍。The method for manufacturing an LED light-emitting device as described above, wherein the electrode includes a tin layer and does not include gold and nickel; and the bonding area includes gold and nickel.
如上所述的LED发光装置的制造方法,其中,所述焊接区包括锡层,且不包括金和镍;所述电极包括锡层,且不包括金和镍。The method for manufacturing an LED light emitting device as described above, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes a tin layer and does not include gold and nickel.
如上所述的LED发光装置的制造方法,其中,所述制造方法还包括:The manufacturing method of the LED light-emitting device as described above, wherein the manufacturing method further includes:
在所述焊接区上以点胶的方式添加助焊剂;Adding flux by dispensing glue on the welding area;
所述LED芯片的至少一个电极贴在所述助焊剂上;以及At least one electrode of the LED chip is attached to the flux; and
对所述电极与所述焊接区进行回流焊,使所述LED芯片的至少一个电极焊接固定在所述焊接区;Performing reflow soldering on the electrode and the welding area, so that at least one electrode of the LED chip is welded and fixed in the welding area;
其中,所述助焊剂不具有锡。Wherein, the soldering flux does not have tin.
如上所述的LED发光装置的制造方法,其中,所述制造方法还包括:The manufacturing method of the LED light-emitting device as described above, wherein the manufacturing method further includes:
提供高反射支架,所述高反射支架设置在所述载体上;以及Providing a high-reflection support, the high-reflection support being arranged on the carrier; and
将所述LED芯片设置在所述高反射支架内;Arranging the LED chip in the high reflection bracket;
其中,所述高反射支架为凹槽状结构,包括一体成型的围墙部和基底部;所述焊接区中与所述LED芯片的电极接触的区域为芯片接触区,所述基底部覆盖所述焊接区中除所述芯片接触区以外的区域。Wherein, the high-reflective bracket is a groove-shaped structure, including an integrally formed wall part and a base part; the area in the soldering area that is in contact with the electrode of the LED chip is a chip contact area, and the base part covers the The area of the bonding area excluding the chip contact area.
附图说明Description of the drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图是发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are For some of the embodiments of the invention, those of ordinary skill in the art can obtain other drawings based on these drawings without creative work.
图1为相关技术中焊接区的结构示意图;Figure 1 is a schematic diagram of the structure of the welding zone in the related technology;
图2为本发明实施例中的焊接区的结构示意图;2 is a schematic diagram of the structure of the welding zone in the embodiment of the present invention;
图3为本发明实施例中载体的焊接区与电极的扫描电子显微图像(SEM);Figure 3 is a scanning electron micrograph (SEM) of the welding area and electrode of the carrier in the embodiment of the present invention;
图4为对图3中的第一分析点进行光谱分析得到的能量色散X射线光谱图(EDX);Fig. 4 is an energy dispersive X-ray spectrum (EDX) obtained by performing spectral analysis on the first analysis point in Fig. 3;
图5为相关方案中载体的焊接区与电极的扫描电子显微图像(SEM);Figure 5 is a scanning electron micrograph (SEM) of the welding area and electrode of the carrier in the related scheme;
图6为对图5中第二分析点进行光谱分析得到的能量色散X射线光谱图(EDX);Fig. 6 is an energy dispersive X-ray spectrogram (EDX) obtained by performing spectral analysis on the second analysis point in Fig. 5;
图7为本发明实施例中的第一种高反射支架的结构示意图;FIG. 7 is a schematic diagram of the structure of the first highly reflective bracket in the embodiment of the present invention;
图8为图7的俯视图;Figure 8 is a top view of Figure 7;
图9为本发明实施例中未设置LED芯片时高反射支架和导电层的结构示意图;9 is a schematic diagram of the structure of the highly reflective support and the conductive layer when no LED chip is provided in the embodiment of the present invention;
图10为图9中的导电层设置有锡膏时的结构示意图;10 is a schematic diagram of the structure when the conductive layer in FIG. 9 is provided with solder paste;
图11为将LED芯片设置在图9中时的结构示意图;FIG. 11 is a schematic diagram of the structure when the LED chip is arranged in FIG. 9;
图12为本发明实施例中在导电层设置有助焊剂时的结构示意图;12 is a schematic diagram of the structure when the conductive layer is provided with flux in the embodiment of the present invention;
图13为将LED芯片设置在图12中时的结构示意图;FIG. 13 is a schematic diagram of the structure when the LED chip is arranged in FIG. 12;
图14为本发明实施例中提供的第二种高反射支架的结构示意图;FIG. 14 is a schematic structural diagram of a second type of highly reflective bracket provided in an embodiment of the present invention;
图15为图14的俯视图;Figure 15 is a top view of Figure 14;
图16为图14中的导电层设置助焊剂的结构示意图;16 is a schematic view of the structure of the conductive layer in FIG. 14 provided with flux;
图17为将LED芯片设置在图14中的第二种高反射支架内时的结构示意图;FIG. 17 is a schematic diagram of the structure when the LED chip is arranged in the second type of highly reflective bracket in FIG. 14;
图18为将LED芯片设置在第三种高反射支架内时的结构示意图;FIG. 18 is a schematic diagram of the structure when the LED chip is arranged in the third type of highly reflective bracket;
图19为图18的俯视图;Figure 19 is a top view of Figure 18;
图20为本发明实施例中提供的固晶胶与锡层的混合物溢流时的结构 示意图;20 is a schematic diagram of the structure when the mixture of the bonding glue and the tin layer provided in the embodiment of the present invention overflows;
图21为图20的俯视图;Figure 21 is a top view of Figure 20;
图22为本发明实施例中提供的导电层的延伸部的结构示意图;FIG. 22 is a schematic structural diagram of an extension portion of a conductive layer provided in an embodiment of the present invention; FIG.
图23为图22的俯视图;Figure 23 is a top view of Figure 22;
图24为本发明实施例中提供的一种限位凸起的结构示意图;24 is a schematic diagram of a structure of a limiting protrusion provided in an embodiment of the present invention;
图25为图24的俯视图;Figure 25 is a top view of Figure 24;
图26为本发明实施例中提供的LED芯片位置发生偏移时的结构示意图;FIG. 26 is a schematic diagram of the structure of the LED chip provided in the embodiment of the present invention when the position of the LED chip is shifted; FIG.
图27为图26的俯视图;Figure 27 is a top view of Figure 26;
图28为本发明实施例中提供的另一种限位凸起的结构示意图;28 is a schematic structural diagram of another limiting protrusion provided in an embodiment of the present invention;
图29为图28的俯视图;Figure 29 is a top view of Figure 28;
图30为本发明实施例中回流焊的流程示意图;FIG. 30 is a schematic diagram of the flow of reflow soldering in an embodiment of the present invention;
图31为本发明实施例提供的一种LED芯片的结构示意图。FIG. 31 is a schematic structural diagram of an LED chip provided by an embodiment of the present invention.
附图标记说明:Description of reference signs:
1:载体;                       2:导电层;1: Carrier; 2: Conductive layer;
21:导电层接触区;              22:延伸部;21: Conductive layer contact area; 22: Extension part;
3:第一焊接区;                 31:第一分析点;3: The first welding zone; 31: the first analysis point;
4:第二焊接区;                 41:镍层;4: The second welding zone; 41: Nickel layer;
42:金层;                      43:第二分析点;42: Gold layer; 43: Second analysis point;
5:铜层;                       6:LED芯片;5: Copper layer; 6: LED chip;
61:电极;                      610:透光元件基板;61: Electrode; 610: Light-transmitting element substrate;
611:第一表面;                 612:第四区域;611: First surface; 612: Fourth area;
620:N型半导体层;              630:发光层;620: N-type semiconductor layer; 630: Light-emitting layer;
631:第三区域;                 640:P型半导体层;631: The third area; 640: P-type semiconductor layer;
650:第一N电极;                651:第一接合面;650: the first N electrode; 651: the first joint surface;
660:第一P电极;                670:第一绝缘层;660: the first P electrode; 670: the first insulating layer;
671:第一开口;                 672:第二开口;671: the first opening; 672: the second opening;
680:第二N电极;                681:第一区域;680: the second N electrode; 681: the first area;
690:第二P电极;                691:第二区域;690: the second P electrode; 691: the second area;
7:高反射支架;                 71:围墙部;7: Highly reflective bracket; 71: Wall part;
72:基底部;                    721:隔离部;72: base; 721: isolation part;
722:限位凸起;               8:锡膏;722: Limit protrusion; 8: Solder paste;
9:助焊剂。9: Flux.
具体实施方式Detailed ways
在相关技术中,LED发光装置包括载体1与LED芯片,如图1所示,载体1包括导电层,导电层包括铜层5和焊接区,即图1中的第二焊接区4,第二焊接区4覆盖在铜层5上,防止铜层5被空气氧化,第二焊接区4包括镍层41与金层42。LED芯片的电极通过锡膏固定在第二焊接区4,从而与导电层导电性连接,使得LED发光装置能够正常发光。然而,金与镍的价格较为昂贵,设置镍层41与金层42提高了LED发光装置的成本。In the related art, the LED light-emitting device includes a carrier 1 and an LED chip. As shown in FIG. 1, the carrier 1 includes a conductive layer, and the conductive layer includes a copper layer 5 and a bonding area, that is, the second bonding area 4 in FIG. The welding area 4 covers the copper layer 5 to prevent the copper layer 5 from being oxidized by air. The second welding area 4 includes a nickel layer 41 and a gold layer 42. The electrode of the LED chip is fixed to the second soldering area 4 by the solder paste, thereby electrically connecting with the conductive layer, so that the LED light-emitting device can emit light normally. However, gold and nickel are relatively expensive, and the provision of the nickel layer 41 and the gold layer 42 increases the cost of the LED light-emitting device.
此外,由于金层42与LED芯片共晶时需要的温度过高,难以实现,一般使用锡膏作为固晶胶并通过锡膏中溶解的锡粉将LED芯片的电极焊接固定在第二焊接区4上。然而,锡膏中存在助焊剂,且在将LED芯片固定在第二焊接区4上的过程中不能将锡膏中的助焊剂清除,否则会导致锡粉无法溶解在锡膏中,破坏锡膏的性能稳定性。通过锡膏将LED芯片的电极焊接固定在第二焊接区4后,由于助焊剂无法去除,使得LED芯片的电极与第二焊接区4的接合处存在助焊剂等杂质,降低了LED芯片的电极与第二焊接区4之间的粘结力;且锡膏熔点较低,进行回流焊时,容易出现二次熔融状况,使得LED芯片的电极容易脱离第二焊接区4,降低了LED发光装置的结构稳定性。In addition, since the temperature required for the eutectic between the gold layer 42 and the LED chip is too high, it is difficult to achieve. Generally, solder paste is used as a bonding glue and the electrodes of the LED chip are welded and fixed in the second welding area through the tin powder dissolved in the solder paste. 4 on. However, there is flux in the solder paste, and the flux in the solder paste cannot be removed during the process of fixing the LED chip on the second soldering area 4, otherwise the solder powder will not be dissolved in the solder paste and damage the solder paste The performance stability. After the electrode of the LED chip is welded and fixed to the second welding area 4 by solder paste, since the flux cannot be removed, there are impurities such as flux at the junction of the electrode of the LED chip and the second welding area 4, which reduces the electrode of the LED chip. Adhesive force with the second soldering area 4; and the melting point of the solder paste is low, and the secondary melting is prone to occur during reflow soldering, so that the electrode of the LED chip is easily separated from the second soldering area 4, which reduces the LED light emitting device The structural stability.
针对上述问题,本发明实施例提供的LED发光装置的焊接区与LED芯片的电极中的任意一个包括锡层,且不包括金和镍。这样设置,通过锡层替代了镍层与金层,节约了成本。将LED芯片的至少一个电极焊接于焊接区时,只需使用助焊剂(Flux)作为固晶胶来帮助和促进焊接过程,并由焊接区的锡层自身提供将LED芯片的电极和焊接区焊接在一起的锡,无需使用锡膏来提供锡。由于不使用锡膏,可避免锡膏中锡以外的杂质在焊接后残留于LED芯片的电极与焊接区的接合处,且上述杂质不易清洗的问题,并且锡层较锡膏可向焊接区提供更高比例的锡,提高了LED芯片的电极与焊接区之间的粘结力;且锡层中纯锡的熔点比锡膏的熔点高,进行回流焊时,不会出现二次熔融状况,提高了LED发光装置的结构稳定性。In view of the above-mentioned problems, any one of the soldering area of the LED light emitting device and the electrode of the LED chip provided by the embodiment of the present invention includes a tin layer, and does not include gold and nickel. With this arrangement, the nickel layer and the gold layer are replaced by the tin layer, which saves costs. When soldering at least one electrode of the LED chip to the soldering area, you only need to use flux (Flux) as a bonding glue to help and promote the soldering process, and the tin layer of the soldering area itself provides the electrode and the soldering area of the LED chip. The tin together, there is no need to use solder paste to provide tin. Since no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction between the electrode of the LED chip and the soldering area after soldering, and the above-mentioned impurities are not easy to clean, and the tin layer can be provided to the soldering area compared to the solder paste. A higher proportion of tin improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of pure tin in the tin layer is higher than the melting point of the solder paste, so there will be no secondary melting during reflow soldering. The structural stability of the LED light-emitting device is improved.
为了使本发明实施例的上述目的、特征和优点能够更加明显易懂,下 面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述。显然,所描述的实施例仅仅是本发明的一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动的前提下所获得的所有其它实施例,均属于本发明保护的范围。In order to make the above objectives, features and advantages of the embodiments of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
如图2-图3所示,本发明实施例提供的LED发光装置包括载体1和设置在载体上的LED芯片,载体1包括一导电层;LED芯片设置于载体上,LED芯片的电极覆晶接合且导电性连接于导电层上;其中,导电层包括铜层5与设置在铜层5上的第一焊接区3,第一焊接区3与电极中的任意一个包括锡层,且不包括金和镍。此处的第一焊接区3即为本发明实施例中的焊接区。As shown in Figures 2 to 3, the LED light emitting device provided by the embodiment of the present invention includes a carrier 1 and an LED chip arranged on the carrier. The carrier 1 includes a conductive layer; the LED chip is arranged on the carrier, and the electrode of the LED chip is flip-chip. Bonded and conductively connected to the conductive layer; wherein the conductive layer includes a copper layer 5 and a first welding area 3 provided on the copper layer 5. Any one of the first welding area 3 and the electrode includes a tin layer and does not include Gold and nickel. The first welding zone 3 here is the welding zone in the embodiment of the present invention.
载体1可以为具有导电层的电路板,其中,导电层可以为镀铜层,在导电层包括用于与LED芯片导电性连接的第一焊接区3。LED芯片是一种半导体器件,是LED发光装置的发光部件,LED芯片一般包括两个电极61,LED芯片的一个或两个电极可以与导电层上的第一焊接区3连接。在一些实施例中,LED芯片为蓝光或紫外光(UV)芯片,即LED芯片6所发出的光为蓝光或紫外光。在一种具体的实施例中,LED芯片6可以为倒装LED芯片,如图31所示,LED芯片6包括透光元件基板610、N型半导体层620、发光层630、P型半导体层640、第一N电极650、第一P电极660、第一绝缘层670、第二N电极680以及第二P电极690。与导电层的第一焊接区3导电性连接的两个电极61为图31所示的第二N电极680以及第二P电极690。The carrier 1 may be a circuit board with a conductive layer, wherein the conductive layer may be a copper-plated layer, and the conductive layer includes a first bonding area 3 for conductive connection with the LED chip. The LED chip is a semiconductor device and a light-emitting component of the LED light-emitting device. The LED chip generally includes two electrodes 61. One or two electrodes of the LED chip can be connected to the first welding area 3 on the conductive layer. In some embodiments, the LED chip is a blue light or ultraviolet light (UV) chip, that is, the light emitted by the LED chip 6 is blue light or ultraviolet light. In a specific embodiment, the LED chip 6 may be a flip-chip LED chip. As shown in FIG. 31, the LED chip 6 includes a light-transmitting element substrate 610, an N-type semiconductor layer 620, a light-emitting layer 630, and a P-type semiconductor layer 640. , The first N electrode 650, the first P electrode 660, the first insulating layer 670, the second N electrode 680, and the second P electrode 690. The two electrodes 61 electrically connected to the first pad 3 of the conductive layer are the second N electrode 680 and the second P electrode 690 shown in FIG. 31.
透光元件基板610可以为蓝宝石、陶瓷、树脂、热固性环氧树酯(EMC)。透光元件基板610包括第一表面611。N型半导体层620设置在表面611上并连接透光元件基板610。发光层630设置在N型半导体层620上且发光层630与N型半导体层620接触形成第三区域631。P型半导体层640设置在发光层630上,发光层630与P型半导体640暴露N型半导体层620的一第四区域612,第四区域612是未被发光层630及P型半导体层640遮盖的区域,P型半导体层640接触N型半导体层形成发光层630。第一N电极650设置在N型半导体层620的第四区域612上,且第一N电极650不连接P型半导体层640,且第一N电极650与N型半导体层620接 触形成第一接合面651。第一P电极660设置在P型半导体层640上。第一N电极650及第一P电极660可分别为氧化铟锡(ITO)和氧化铟锌(IZO)。The light-transmitting element substrate 610 may be sapphire, ceramic, resin, or thermosetting epoxy resin (EMC). The light-transmitting element substrate 610 includes a first surface 611. The N-type semiconductor layer 620 is disposed on the surface 611 and connected to the light-transmitting element substrate 610. The light-emitting layer 630 is disposed on the N-type semiconductor layer 620 and the light-emitting layer 630 contacts the N-type semiconductor layer 620 to form a third region 631. The P-type semiconductor layer 640 is disposed on the light-emitting layer 630, the light-emitting layer 630 and the P-type semiconductor 640 expose a fourth region 612 of the N-type semiconductor layer 620, and the fourth region 612 is not covered by the light-emitting layer 630 and the P-type semiconductor layer 640 In the region, the P-type semiconductor layer 640 contacts the N-type semiconductor layer to form the light-emitting layer 630. The first N electrode 650 is disposed on the fourth region 612 of the N-type semiconductor layer 620, and the first N electrode 650 is not connected to the P-type semiconductor layer 640, and the first N electrode 650 is in contact with the N-type semiconductor layer 620 to form a first junction面651. The first P electrode 660 is provided on the P-type semiconductor layer 640. The first N electrode 650 and the first P electrode 660 may be indium tin oxide (ITO) and indium zinc oxide (IZO), respectively.
第一绝缘层670设置在N型半导体620上、第一N电极650与第一P电极660之间,以使该两个电极彼此绝缘。第一绝缘层670完全包覆第一N电极650的左侧面及右侧面,亦完全包覆第一P电极660的左侧面及右侧面,使第一N电极650与第一P电极660之间彼此不电性连接。第一绝缘层670包覆第一N电极650的下侧并形成至少一个第一开口671,且第一绝缘层670包覆第一P电极660的下侧并形成至少一个第二开口672。至少一个第一开口671及至少一个第二开口672可为朝垂直方向延伸的一圆柱型,此处垂直方向为图31中的竖向。第二N电极680设置在第一N电极650及第一绝缘层670上,第二N电极680的一部分穿过第一开口671与第一N电极650电性连接,第二N电极680包括一个第一区域681,第一区域681的表面积大于第一接合面651的表面积。第二P电极690设置在第一P电极660及第一绝缘层670上,第二P电极690的一部份穿过第二开口672与第一P电极660电性连接,第二P电极690的包括一个第二区域691,且第二区域691小于发光层630上的一个第三区域631,也就是,第二区域691的表面积小于第三区域631的表面积。第二N电极680与第二P电极690从一仰视面观之具有几乎相同的尺寸(表面积相同),且第二N电极680与第二P电极690均电性连接并固定至导电层上的第一焊接区3,即便欲使发光层630的尺寸变大,因而减小第一接合面651的尺寸,仍可避免将N型及P型电极与导电层上的第一焊接区3之间电性连接时,因尺寸改变进而对焊接精度有较高的要求而导致生产效率降低,且更易维持发光的均匀性,此处不作限制。第二N电极680亦可具有小于第二P电极690的尺寸或大于第二P电极690的尺寸。有关芯片的相关背景资讯,尚可参见专利文献CN100487931C之记载。The first insulating layer 670 is disposed on the N-type semiconductor 620 between the first N electrode 650 and the first P electrode 660 to insulate the two electrodes from each other. The first insulating layer 670 completely covers the left and right sides of the first N electrode 650, and also completely covers the left and right sides of the first P electrode 660, so that the first N electrode 650 and the first P The electrodes 660 are not electrically connected to each other. The first insulating layer 670 covers the lower side of the first N electrode 650 and forms at least one first opening 671, and the first insulating layer 670 covers the lower side of the first P electrode 660 and forms at least one second opening 672. The at least one first opening 671 and the at least one second opening 672 may be a cylindrical shape extending in a vertical direction, where the vertical direction is the vertical direction in FIG. 31. The second N electrode 680 is disposed on the first N electrode 650 and the first insulating layer 670. A part of the second N electrode 680 passes through the first opening 671 and is electrically connected to the first N electrode 650. The second N electrode 680 includes one The surface area of the first area 681 is larger than the surface area of the first joining surface 651. The second P electrode 690 is disposed on the first P electrode 660 and the first insulating layer 670. A part of the second P electrode 690 passes through the second opening 672 and is electrically connected to the first P electrode 660. The second P electrode 690 The second area 691 includes a second area 691, and the second area 691 is smaller than a third area 631 on the light-emitting layer 630, that is, the surface area of the second area 691 is smaller than the surface area of the third area 631. The second N electrode 680 and the second P electrode 690 have almost the same size (same surface area) from a bottom view, and the second N electrode 680 and the second P electrode 690 are electrically connected and fixed to the conductive layer. The first welding area 3, even if the size of the light-emitting layer 630 is to be increased, and thus the size of the first joint surface 651 is reduced, it is still possible to avoid the gap between the N-type and P-type electrodes and the first welding area 3 on the conductive layer. During electrical connection, due to the size change and higher requirements for welding accuracy, the production efficiency is reduced, and it is easier to maintain the uniformity of light emission, which is not limited here. The second N electrode 680 may also have a size smaller than the size of the second P electrode 690 or larger than the size of the second P electrode 690. For related background information of the chip, please refer to the record of patent document CN100487931C.
在一种具体的实施例中,LED芯片材料上可以是氮化物半导体,氮化物半导体一般式为In xAl yGa 1-x-yN(0≦x、0≦y、x+y≦1),LED芯片材料也可以是将B、P、As混入氮化物半导体形成的混晶。另外,N型半导体层、P型半导体层不特别限定为单层或多层。氮化物半导体层是具有活性层的发光层,其活性层是作为单一(SQW)或多重量子井构造(MQW)。以下,显示氮化物半导体层的示例。使用于成长基板上,借由缓冲层等的氮化物半 导体的基底层,可以是低温成长薄膜GaN与GaN层;作为N型氮化物半导体层,可以是层积Si掺杂GaN的N型接触层与GaN/InGaN的N型多层膜层,或者是层积InGaN/GaN的MQW的活性层;P型氮化物半导体层,可以是层积Mg掺杂InGaN/AlGaN的P型多层膜层与Mg掺杂GaN的P型接触层的构造。另外,氮化物半导体的发光层(活性层)可以是具有含有井层或含有障壁层与井层的量子井构造。活性层使用的氮化物半导体也可以为P型不纯物掺杂,但经由未掺杂,或N型不纯物掺杂,可将发光元件作为高输出化者。由使Al含于井层者,可得到较GaN的带隙能量的波长365nm为短的波长者。从活性层放出的光的波长可根据发光元件的目的、用途等进行调整,光的波长可以为360nm~650nm附近,优选380nm~560nm的光的波长。井层的组成是InGaN乃最佳使用于可视光、近紫外线域,此时的障壁层的组成乃GaN、InGaN为佳。作为障壁层与井层的膜厚具体例各为1nm以上30nm以下及1nm以上20nm以下,可作为借由一个的井层的单一量子井,障壁层等的复数的井层的多重量子井构造。 In a specific embodiment, the LED chip material may be nitride semiconductor, and the general formula of the nitride semiconductor is In x Al y Ga 1-xy N (0≦x, 0≦y, x+y≦1), The LED chip material can also be a mixed crystal formed by mixing B, P, and As with a nitride semiconductor. In addition, the N-type semiconductor layer and the P-type semiconductor layer are not particularly limited to a single layer or multiple layers. The nitride semiconductor layer is a light-emitting layer having an active layer, and the active layer is a single (SQW) or multiple quantum well structure (MQW). Below, examples of nitride semiconductor layers are shown. Used on a growth substrate, the base layer of a nitride semiconductor such as a buffer layer can be a low-temperature grown thin film GaN and GaN layer; as an N-type nitride semiconductor layer, it can be an N-type contact layer laminated with Si-doped GaN The N-type multilayer film layer with GaN/InGaN, or the active layer of the MQW layered with InGaN/GaN; the P-type nitride semiconductor layer can be a P-type multilayer film layer with Mg-doped InGaN/AlGaN layered and The structure of Mg-doped GaN P-type contact layer. In addition, the light-emitting layer (active layer) of the nitride semiconductor may have a quantum well structure including a well layer or a barrier layer and a well layer. The nitride semiconductor used in the active layer may be doped with P-type impurity, but through undoped or N-type impurity doping, the light-emitting element can be made into a high-output device. When Al is contained in the well layer, it is possible to obtain a wavelength shorter than the wavelength of the band gap energy of GaN, 365 nm. The wavelength of light emitted from the active layer can be adjusted according to the purpose, application, etc. of the light-emitting element, and the wavelength of the light can be around 360 nm to 650 nm, preferably the wavelength of light of 380 nm to 560 nm. The composition of the well layer is that InGaN is best used in the visible light and near-ultraviolet regions. In this case, the composition of the barrier layer is preferably GaN or InGaN. Specific examples of the film thickness of the barrier layer and the well layer are 1 nm or more and 30 nm or less and 1 nm or more and 20 nm or less, and can be used as a single quantum well structure with a single well layer, or a multiple quantum well structure of plural well layers such as a barrier layer.
在一些实施例中,LED发光装置发出白光,可采用蓝光或紫外光LED芯片配合混有黄色荧光粉的封装胶体,使蓝光和黄光混合成白光。In some embodiments, the LED light emitting device emits white light, and a blue or ultraviolet LED chip can be used in combination with a packaging gel mixed with yellow phosphors to mix blue and yellow light into white light.
在一些实施例中,LED芯片配合的封装胶体所使用的荧光粉不限于特定颜色的荧光粉,可为红色荧光粉、绿色荧光粉或黄色荧光粉,亦可为两种以上不同颜色的荧光粉组成,即便同为红色或绿色或黄色荧光粉,亦可由一种或多种不同的材料组成;具体而言,以红色荧光粉为例,可包括CASN或SCASN系列,例如CaAlSiN 3:Eu 2+、(Sr,Ca)AlSiN 3:Eu 2+、(SrCa)S:Eu 2+、CaS:Eu 2+、Sr 3Si(ON) 5:Eu 2+;KSF系列,例如K 2SiF 6:Mn 4+;尚包括以AE 1-zS 1-ySe y:zA为通式的红色荧光粉,其中AE是选自Mg、Ca、Sr和Ba中的至少一种碱土金属,0≤y<1和0.0005≤z≤0.2,A是选自Eu(II)、Ce(III)、Mn(II)和Pr(III)中的至少一种活化剂;另绿色荧光粉可以包括:L 2SiO 4:Eu 2+(L为碱土金属),特别是(SrBa) 2SiO 4:Eu 2+或(SrCa) 2SiO 4:Eu 2+,亦可为CaSc 2O 4:Ce 2+、SrGa 2S:Eu 2+、β-SiAlON(Si6-zAlzOzN8-z:Eu 2+)或LuAG(Lu 3Al 5O 12:Ce 2+)等;以黄色荧光粉为例,可包括TAG(Tb 3Al 5O 12:Ce 3+)、YAG(Y 3Al 5O 12:Ce 3+)、Sr 2SiO 4:Eu 2+、(SrBaCa)Si 2(OCl) 2N 2:Eu 2+;其外尚可包括量子点荧光粉及/或非量子点荧光粉,或BAM(BaMgAl 10O 17)、BAM:Mn、(Zn、Cd)Zn:Cu、Sr 5(PO 4) 3Cl:Eu 2+、 CCA、SCESN、SESN、CESN、CASBN,或由通式LSi2O2N2:Eu 2+、L xSi yN (2/3x+4/3y):Eu 2+、L xSi yO zN (2/3x+4/3y-2/3z):Eu 2+(L为Sr、Ca、Sr及Ca中的任一种)表示的荧光粉,可转换来自发光元件至少一部分的光波长。 In some embodiments, the phosphor used in the encapsulating gel of the LED chip is not limited to the phosphor of a specific color, and can be red phosphor, green phosphor or yellow phosphor, or two or more different colors of phosphor The composition, even if the same is red, green or yellow phosphor, it can also be composed of one or more different materials; specifically, taking red phosphor as an example, it may include CASN or SCASN series, such as CaAlSiN 3 :Eu 2+ , (Sr,Ca)AlSiN 3 :Eu 2+ , (SrCa)S:Eu 2+ , CaS:Eu 2+ , Sr 3 Si(ON) 5 :Eu 2+ ; KSF series, such as K 2 SiF 6 :Mn 4+ ; It also includes red phosphors with AE 1-z S 1-y Se y : zA as the general formula, where AE is at least one alkaline earth metal selected from Mg, Ca, Sr and Ba, 0≤y< 1 and 0.0005≤z≤0.2, A is at least one activator selected from Eu(II), Ce(III), Mn(II) and Pr(III); in addition, the green phosphor may include: L 2 SiO 4 :Eu 2+ (L is alkaline earth metal), especially (SrBa) 2 SiO 4 :Eu 2+ or (SrCa) 2 SiO 4 :Eu 2+ , or CaSc 2 O 4 :Ce 2+ , SrGa 2 S :Eu 2+ , β-SiAlON (Si6-zAlzOzN8-z:Eu 2+ ) or LuAG (Lu 3 Al 5 O 12 :Ce 2+ ), etc.; take the yellow phosphor as an example, which can include TAG (Tb 3 Al 5 O 12 :Ce 3+ ), YAG (Y 3 Al 5 O 12 :Ce 3+ ), Sr 2 SiO 4 :Eu 2+ , (SrBaCa)Si 2 (OCl) 2 N 2 :Eu 2+ ; Can include quantum dot phosphors and/or non-quantum dot phosphors, or BAM (BaMgAl 10 O 17 ), BAM:Mn, (Zn, Cd)Zn:Cu, Sr 5 (PO 4 ) 3 Cl:Eu 2+ , CCA, SCESN, SESN, CESN, CASBN, or by the general formula LSi2O2N2: Eu 2+ , L x Si y N (2/3x+4/3y) : Eu 2+ , L x Si y O z N (2/3x +4/3y-2/3z) : a phosphor represented by Eu 2+ (L is any one of Sr, Ca, Sr, and Ca), which can convert the wavelength of light from at least a part of the light-emitting element.
LED芯片的电极覆晶接合且导电性连接于导电层上,从而使得LED发光装置正常工作。此外,导电层的第一焊接区3与电极中的任意一个包括锡层,且不包括金和镍,即此时的第一焊接区3采用锡层替代了相关方案中的金层42与镍层41的作用,且相比于金和镍,锡更为便宜,因此本方案可以节约成本。The electrodes of the LED chip are flip chip bonded and electrically connected to the conductive layer, so that the LED light-emitting device works normally. In addition, any one of the first welding area 3 and the electrode of the conductive layer includes a tin layer, and does not include gold and nickel, that is, at this time, the first welding area 3 uses a tin layer instead of the gold layer 42 and nickel in the related solution. The role of layer 41 is that tin is cheaper than gold and nickel, so this solution can save costs.
将LED芯片的电极覆晶接合的方式可以为回流焊。进行回流焊时,只需使用助焊剂来帮助和促进焊接过程,且第一焊接区3的锡层自身提供将LED芯片的电极和第一焊接区3焊接在一起的锡,无需使用锡膏来提供锡。由于不使用锡膏,无需使用锡膏来提供锡,由于不使用锡膏,可避免锡膏中锡以外的杂质在焊接后残留于LED芯片的电极61与第一焊接区3的接合处,且上述杂质不易清洗的问题,并且第一焊接区3的锡层较锡膏可向第一焊接区3提供更高比例的锡,提高了LED芯片的电极与第一焊接区3之间的粘结力;且纯锡熔点比锡膏高,进行回流焊时,不会出现二次熔融状况,提高了LED发光装置的结构稳定性。The method of flip chip bonding of the electrodes of the LED chip may be reflow soldering. When performing reflow soldering, only flux is needed to help and promote the soldering process, and the tin layer of the first soldering area 3 itself provides the tin for soldering the electrodes of the LED chip and the first soldering area 3, without the need to use solder paste. Provide tin. Since solder paste is not used, there is no need to use solder paste to provide tin. Since solder paste is not used, impurities other than tin in the solder paste can be avoided to remain at the junction between the electrode 61 of the LED chip and the first soldering area 3 after soldering, and The above-mentioned impurities are not easy to clean, and the tin layer of the first bonding area 3 can provide a higher proportion of tin to the first bonding area 3 than a solder paste, which improves the adhesion between the electrode of the LED chip and the first bonding area 3 In addition, the melting point of pure tin is higher than that of tin paste. During reflow soldering, there will be no secondary melting, which improves the structural stability of the LED light-emitting device.
需要说明的时,第一焊接区3与电极中的任意一个包括锡层,且不包括金和镍。即第一焊接区3包括锡层,且不包括金和镍;和/或,电极包括锡层,且不包括金和镍。这样设置,可以提高LED发光装置的结构多样性。在本实施例中,锡层为第一焊接区3的一部分。这样设置,可以防止被第一焊接区3覆盖的铜层在与LED芯片电极61焊接前被空气氧化。基于锡层可以提供锡作为导电成分,助焊剂可以采用不含锡等导电成分的助焊剂。It should be noted that any one of the first welding area 3 and the electrode includes a tin layer, and does not include gold and nickel. That is, the first bonding area 3 includes a tin layer and does not include gold and nickel; and/or, the electrode includes a tin layer and does not include gold and nickel. This arrangement can increase the structural diversity of the LED light-emitting device. In this embodiment, the tin layer is a part of the first welding zone 3. This arrangement can prevent the copper layer covered by the first welding area 3 from being oxidized by air before welding with the LED chip electrode 61. Based on the tin layer, tin can be provided as a conductive component, and the flux can be a flux that does not contain conductive components such as tin.
在实际生产过程中,可以采用在第一焊接区3的铜层5上化锡的镀锡方式将锡层设置在第一焊接区3的铜层5上,即在焊接区的铜层5通过化学反应覆上一层纯锡。采用化锡的镀锡方式,工艺简单、不易产生爆板现象且锡层厚度均匀。In the actual production process, the tin plating method of tin plating on the copper layer 5 of the first welding zone 3 can be used to set the tin layer on the copper layer 5 of the first welding zone 3, that is, the copper layer 5 in the welding zone passes through The chemical reaction is coated with pure tin. The tin plating method adopts tin, the process is simple, the phenomenon of plate explosion is not easy to occur, and the thickness of the tin layer is uniform.
图3为本发明实施例中的载体1与电极61的接触区的扫描电子显微图像(SEM),图5为相关方案中的载体1与电极61的接触区的扫描电子显微图像(SEM)。在一种可实现的实施方式中,上述载体1为PCB载体,如图3所示,本发明实施例提供的载体1与电极61的接触区的扫描电子显 微图像中,LED芯片电极61与铜层5之间为本方案的焊接区,即第一焊接区3,如图5所示,相关方案的载体1与电极61的接触区的扫描电子显微图像中,芯片电极61与铜层5之间为相关方案的焊接区,即第二焊接区4。Fig. 3 is a scanning electron micrograph (SEM) of the contact area between the carrier 1 and the electrode 61 in an embodiment of the present invention, and Fig. 5 is a scanning electron micrograph (SEM) of the contact area between the carrier 1 and the electrode 61 in a related scheme ). In an achievable embodiment, the above-mentioned carrier 1 is a PCB carrier. As shown in FIG. 3, in the scanning electron microscopic image of the contact area between the carrier 1 and the electrode 61 provided by the embodiment of the present invention, the LED chip electrode 61 and Between the copper layer 5 is the welding area of this scheme, namely the first welding area 3. As shown in FIG. 5, in the scanning electron micrograph of the contact area between the carrier 1 and the electrode 61 of the related scheme, the chip electrode 61 and the copper layer Between 5 is the welding area of the related scheme, that is, the second welding area 4.
对第一焊接区3的第一分析点31进行光谱分析可以得到如图4所示的能量色散X射线光谱图,对图4所示的能量色散X射线光谱图进行分析可以得到如表1所示的本发明实施例提供的载体1与电极61的第一焊接区3的第一分析点31处的元素种类以及各元素所占的比重,由表1可知,第一焊接区3的第一分析点31处的元素包括C、Cu、Sn,其中C主要来自于助焊剂,Cu主要来自于第一焊接区3,Sn主要来自于锡层。Performing spectral analysis on the first analysis point 31 of the first welding zone 3 can obtain the energy dispersive X-ray spectrogram as shown in Fig. 4, and analyzing the energy dispersive X-ray spectrogram as shown in Fig. 4 can be obtained as shown in Table 1. The element type and the proportion of each element at the first analysis point 31 of the first welding zone 3 of the carrier 1 and the electrode 61 provided by the embodiment of the present invention are shown. Table 1 shows that the first welding zone 3 is the first The elements at analysis point 31 include C, Cu, and Sn, where C mainly comes from the flux, Cu mainly comes from the first solder zone 3, and Sn mainly comes from the tin layer.
表1:第一分析点处的元素种类以及各元素所占的比重Table 1: Element types at the first analysis point and the proportion of each element
Figure PCTCN2020133281-appb-000001
Figure PCTCN2020133281-appb-000001
对第二焊接区4的第二分析点43进行光谱分析可以得到如图6所示的能量色散X射线光谱图,对图6所示的能量色散X射线光谱图进行分析可以得到如表2所示的相关方案提供的载体1与电极61的第二焊接区4的第二分析点43处的元素种类以及各元素所占的比重,由表2可知,第二焊接区4的第二分析点43处的元素包括C、P、Ni、Cu、Sn,其中C主要来自于助焊剂,Ni主要来自于镍层41,Cu主要来自于第二焊接区4与锡膏,Sn主要来自于锡膏。Performing spectral analysis on the second analysis point 43 of the second welding zone 4 can obtain the energy dispersive X-ray spectrogram as shown in Fig. 6, and analyzing the energy dispersive X-ray spectrogram as shown in Fig. 6 can be obtained as shown in Table 2. The element types and the proportions of the elements at the second analysis point 43 of the second welding zone 4 of the carrier 1 and the electrode 61 provided by the related solutions shown in Table 2 show that the second analysis point of the second welding zone 4 Elements at 43 include C, P, Ni, Cu, Sn, where C mainly comes from flux, Ni mainly comes from the nickel layer 41, Cu mainly comes from the second pad 4 and solder paste, and Sn mainly comes from solder paste .
表2:第二分析点处的元素种类以及各元素所占的比重Table 2: Element types at the second analysis point and the proportion of each element
Figure PCTCN2020133281-appb-000002
Figure PCTCN2020133281-appb-000002
对比表1与表2可知,本发明实施例中的载体1与电极61的接触区的元素不包含镍与磷,即本发明实施例没有设置镍层41,且本发明实施例没有使用锡膏,从而可以降低成本,且减小回流焊时出现二次熔融的风险。Comparing Table 1 and Table 2, it can be seen that the elements in the contact area between the carrier 1 and the electrode 61 in the embodiment of the present invention do not contain nickel and phosphorus, that is, the embodiment of the present invention does not provide the nickel layer 41, and the embodiment of the present invention does not use solder paste. Therefore, the cost can be reduced, and the risk of secondary melting during reflow soldering can be reduced.
如图7-图8所示,本发明实施例提供的LED发光装置还包括设置在载体1上的高反射支架7,LED芯片6位于该高反射支架7内。具体的,LED芯片6通过锡层焊接固定在位于高反射支架7内的第一焊接区3上。这样设置,可以通过高反射支架7反射LED芯片6发出的光,从而实现提高LED芯片6发出的光强度的效果。As shown in FIGS. 7-8, the LED light-emitting device provided by the embodiment of the present invention further includes a high-reflective bracket 7 arranged on the carrier 1, and the LED chip 6 is located in the high-reflective bracket 7. Specifically, the LED chip 6 is fixed on the first welding area 3 in the high-reflective bracket 7 by soldering with a tin layer. With this arrangement, the light emitted by the LED chip 6 can be reflected by the high-reflective bracket 7 so as to achieve the effect of increasing the light intensity emitted by the LED chip 6.
高反射支架7的材料如表3所示,包括树脂与填充剂,其中,树脂可以为聚酯(Polyester)、不饱和聚酯(Unsaturated polyester)、环氧树脂(Epoxy)中的任意一种。当树脂为聚酯时,填充剂包括二氧化钛(TiO 2)或玻璃纤维(Glass fiber)中的至少一种;当树脂为不饱和聚酯时,填充剂包括二氧化钛(TiO 2)、二氧化硅(SiO 2)、玻璃纤维(Glass fiber)中的至少一种;当树脂为环氧树脂时,填充剂包括二氧化钛(TiO 2)、二氧化硅(SiO 2)、氧化铝(Al 2O 3)中的至少一种。 The material of the high reflection bracket 7 is shown in Table 3, including resin and filler, where the resin can be any of polyester, unsaturated polyester, and epoxy. When the resin is polyester, the filler includes at least one of titanium dioxide (TiO 2 ) or glass fiber (Glass fiber); when the resin is an unsaturated polyester, the filler includes titanium dioxide (TiO 2 ), silicon dioxide ( At least one of SiO 2 ) and glass fiber (Glass fiber); when the resin is epoxy resin, the filler includes titanium dioxide (TiO 2 ), silicon dioxide (SiO 2 ), and aluminum oxide (Al 2 O 3 ). At least one of.
表3:高反射支架的材料Table 3: Materials of high-reflective bracket
Figure PCTCN2020133281-appb-000003
Figure PCTCN2020133281-appb-000003
需要说明的是,在一种具体的实施例中,当LED芯片6发出的光为波 长范围处于100-700nm的可见光时,银对该可见光的反射率为94%-98%,锡对该可见光的反射率为77%-81%,高反射支架7对该可见光的反射率为95%-97%。It should be noted that, in a specific embodiment, when the light emitted by the LED chip 6 is visible light with a wavelength range of 100-700nm, the reflectance of silver to the visible light is 94%-98%, and the tin to the visible light The reflectivity of the high-reflection bracket 7 is between 77% and 81%, and the reflectivity of the high-reflection bracket 7 to the visible light is between 95% and 97%.
如图9-图11所示,一般LED发光装置中反射LED芯片6发出的光的方式为在图9所示的导电层2的焊接区包括银层,将LED芯片6焊接固定在导电层2上,并通过银层来反射LED芯片6发出的光,但由于银的熔点高达961℃,银层与LED芯片6的电极61共晶时需要的温度过高,难以实现,需要使用锡膏8作为固晶胶,即在图9所示的焊接区刷上锡膏或者点胶锡膏,通过锡膏8中溶解的锡粉将LED芯片6的电极61焊接固定在焊接区。而在焊接的过程中,由于使用锡膏8,容易出现二次融锡的状况,LED芯片6的电极61容易脱离焊接区,导致LED发光装置失效。As shown in Figs. 9-11, the general way of reflecting the light emitted by the LED chip 6 in the general LED light-emitting device is to include a silver layer in the soldering area of the conductive layer 2 shown in Fig. 9, and the LED chip 6 is soldered and fixed to the conductive layer 2. The light emitted by the LED chip 6 is reflected by the silver layer. However, since the melting point of silver is as high as 961°C, the temperature required for the eutectic between the silver layer and the electrode 61 of the LED chip 6 is too high, which is difficult to achieve, so solder paste 8 is required. As the bonding glue, solder paste or dispensing solder paste is applied to the soldering area shown in FIG. 9, and the electrode 61 of the LED chip 6 is soldered and fixed in the soldering area by the tin powder dissolved in the solder paste 8. During the soldering process, due to the use of the solder paste 8, the secondary tin melting is likely to occur, and the electrode 61 of the LED chip 6 is easily separated from the soldering area, causing the LED light-emitting device to fail.
如图12-图15所示,相比在设置银层的LED发光装置,本实施例提供的LED发光装置的导电层2的第一焊接区3包括锡层,将LED芯片6的电极61焊接于导电层时,只需使用助焊剂9作为固晶胶,即在图9所示的导电层2点胶助焊剂9,无需使用锡膏8来提供锡,锡层自身可以提供锡。且纯锡熔点比锡膏8高,进行回流焊时,不会出现二次熔融状况,提高了LED发光装置的结构可靠性。As shown in Figures 12-15, compared to the LED light-emitting device provided with a silver layer, the first soldering area 3 of the conductive layer 2 of the LED light-emitting device provided in this embodiment includes a tin layer, and the electrode 61 of the LED chip 6 is soldered For the conductive layer, only the solder flux 9 is used as the bonding glue, that is, the solder flux 9 is dispensed on the conductive layer 2 as shown in FIG. 9, and there is no need to use the solder paste 8 to provide tin, and the tin layer itself can provide tin. In addition, the melting point of pure tin is higher than that of the solder paste 8, and no secondary melting occurs during reflow soldering, which improves the structural reliability of the LED light-emitting device.
LED芯片6可以采用倒装芯片或正装芯片,具体情况可根据实际需要选定。LED芯片6可以是超小间距发光二极管(mini LED)、小间距发光二极管等不同种类的LED芯片。本实施例中,LED芯片6采用倒装芯片。倒装芯片相比正装芯片,可以进一步提高LED发光装置的出光率,提高LED发光装置的光强。在一种具体的实施例中,LED芯片6可以采用如表4所示的芯片。The LED chip 6 can be a flip chip or a formal chip, and the specific conditions can be selected according to actual needs. The LED chip 6 may be various types of LED chips, such as mini LEDs and small-pitch light-emitting diodes. In this embodiment, the LED chip 6 is a flip chip. Compared with the normal chip, the flip chip can further increase the light extraction rate of the LED light-emitting device and increase the light intensity of the LED light-emitting device. In a specific embodiment, the LED chip 6 may use the chip shown in Table 4.
需要说明的是,当LED芯片为超小间距发光二极管(mini LED)时,即LED发光装置为mini LED发光装置时,由于超小间距发光二极管的尺寸极小,对应的点胶机的尺寸也极小,而锡膏内的锡颗粒尺寸,无法从点胶机的出口点出,导致采用锡膏作为固晶胶时,无法使用点胶机点胶的方式添加锡膏,只能使用刷锡机刷胶方式添加锡膏。而本实施例使用的助焊剂可以使用点胶机点胶,从而提高了LED芯片固晶时的精度。It should be noted that when the LED chip is an ultra-fine-pitch light-emitting diode (mini LED), that is, when the LED light-emitting device is a mini LED light-emitting device, since the size of the ultra-fine-pitch light-emitting diode is extremely small, the size of the corresponding dispenser is also Very small, and the size of the tin particles in the solder paste cannot be spotted from the outlet of the dispenser. As a result, when the solder paste is used as the solid crystal glue, the dispenser cannot be used to add the solder paste, and only brushing can be used. Add solder paste by machine brushing. The flux used in this embodiment can be dispensed by a dispenser, thereby improving the accuracy of LED chip bonding.
表4:一种LED芯片的参数Table 4: Parameters of an LED chip
LED晶片规格LED chip specifications If(顺向电流)=60mAIf (forward current) = 60mA
尺寸(mil)Size(mil) 20*40(800)20*40(800)
Pad尺寸(um)Pad size (um) 465x365465x365
波长(nm)Wavelength (nm) 452.5-454.09-455452.5-454.09-455
Vf(V)Vf(V) 3.1-3.15-3.23.1-3.15-3.2
PO(mW)PO(mW) 430-453.66-460430-453.66-460
如图14-图15所示,在一些实施例中,LED芯片6包括两个电极61,载体1的导电层2上包括与上述两个电极61一一对应的两个第一焊接区3,每个第一焊接区3包括一个芯片接触区,芯片接触区为第一焊接区3与LED芯片6的电极61接触的区域,每个芯片接触区对应的导电层2的区域为导电层接触区21,即跟LED芯片6的电极61接触的导电层2的部分为导电层接触区21。如图14中,在一些实施例中,导电层接触区21的上端为芯片接触区。导电层接触区21的尺寸可以参照LED芯片6的尺寸进行设计。As shown in FIGS. 14-15, in some embodiments, the LED chip 6 includes two electrodes 61, and the conductive layer 2 of the carrier 1 includes two first welding areas 3 corresponding to the above two electrodes 61 one-to-one. Each first welding area 3 includes a chip contact area, the chip contact area is the area where the first welding area 3 contacts the electrode 61 of the LED chip 6, and the area of the conductive layer 2 corresponding to each chip contact area is the conductive layer contact area 21, that is, the part of the conductive layer 2 that is in contact with the electrode 61 of the LED chip 6 is the conductive layer contact area 21. As shown in FIG. 14, in some embodiments, the upper end of the conductive layer contact area 21 is a chip contact area. The size of the conductive layer contact area 21 can be designed with reference to the size of the LED chip 6.
当LED芯片6的型号不同时,LED芯片6的尺寸也不一样,表5列出了三种不同型号的LED芯片的尺寸;如表5所示,三种不同型号的LED芯片6的尺寸依次为580μm*1170μm、660μm*760μm、510μm*1020μm。其中,580μm、660μm、510μm依次为三种不同型号的LED芯片6的纵向尺寸,该纵向尺寸可以通过图8中的a来表征;1170μm、760μm、1020μm依次为三种不同型号的LED芯片的横向尺寸,该横向尺寸可以通过图8中的b来表征。When the model of the LED chip 6 is different, the size of the LED chip 6 is also different. Table 5 lists the sizes of three different models of LED chips; as shown in Table 5, the sizes of the three different models of LED chips 6 are in order It is 580μm*1170μm, 660μm*760μm, 510μm*1020μm. Among them, 580μm, 660μm, and 510μm are the longitudinal dimensions of the three different types of LED chips 6 in sequence, which can be characterized by a in Figure 8; 1170μm, 760μm, and 1020μm are the horizontal dimensions of the three different types of LED chips in order. The size, the lateral size can be characterized by b in FIG. 8.
表5:方案一、方案二以及方案三中的LED发光装置发出光的亮度Table 5: The brightness of the LED light-emitting devices in the first, second and third options
NONO 方案一Option One 方案二Option II 方案三 third solution
11 20.3320.33 14.2114.21 21.2021.20
22 22.5022.50 14.4514.45 21.8421.84
33 20.7120.71 15.0515.05 21.1921.19
44 22.0022.00 14.5514.55 21.4021.40
55 22.2022.20 14.9114.91 21.6021.60
66 21.1121.11 14.9114.91 20.4620.46
77 22.3022.30 14.4314.43 20.6320.63
88 22.4522.45 15.0115.01 20.8320.83
99 21.3121.31 14.8514.85 20.9020.90
1010 21.2921.29 14.7514.75 21.6621.66
1111 21.8221.82 14.6814.68 22.1022.10
1212 21.1921.19 14.5414.54 20.6420.64
1313 21.3621.36 14.7414.74 21.0321.03
1414 22.2522.25 14.4214.42 20.8220.82
1515 22.4122.41 14.4414.44 22.0722.07
1616 21.0121.01 14.8914.89 20.6720.67
1717 20.8920.89 14.5214.52 20.9620.96
1818 21.5621.56 14.3414.34 20.5820.58
1919 21.8521.85 14.9514.95 21.4621.46
2020 22.0822.08 14.7314.73 22.3622.36
21twenty one 21.3721.37 14.6914.69 21.1621.16
22twenty two 21.6321.63 14.7414.74 21.0421.04
23twenty three 21.4321.43 14.5614.56 21.7321.73
24twenty four 21.1721.17 14.5314.53 22.3622.36
2525 20.9820.98 14.6814.68 22.0822.08
2626 21.6621.66 14.4014.40 20.9620.96
2727 21.0621.06 14.8014.80 22.4022.40
2828 21.8221.82 15.2415.24 20.5720.57
2929 22.3422.34 14.5414.54 22.0922.09
3030 21.5421.54 14.2514.25 22.3822.38
AVG.AVG. 21.5921.59 14.6614.66 21.3721.37
亮度brightness 100.00%100.00% 67.91%67.91% 99.00%99.00%
当LED芯片6的尺寸为580μm*1170μm时,LED芯片6的每个电极61的尺寸为530μm*450μm;当LED芯片6的尺寸为660μm*760μm时,LED芯片6的每个电极61的尺寸为460μm*205μm或500μm*225μm,当LED芯片6的尺寸为510μm*1020μm时,LED芯片6的每个电极61的尺寸为435μm*365μm。When the size of the LED chip 6 is 580μm*1170μm, the size of each electrode 61 of the LED chip 6 is 530μm*450μm; when the size of the LED chip 6 is 660μm*760μm, the size of each electrode 61 of the LED chip 6 is 460 μm*205 μm or 500 μm*225 μm. When the size of the LED chip 6 is 510 μm*1020 μm, the size of each electrode 61 of the LED chip 6 is 435 μm*365 μm.
导电层接触区21的尺寸可以略小于LED芯片6的电极61的尺寸,这 样设置,可以使LED芯片6的电极61完全覆盖导电层接触区21上的芯片接触区上,即LED芯片6的电极61完全覆盖导电层接触区21上的锡层上,从而提高LED芯片6的电极61与导电层接触区21之间的粘结力(推力)。如图15所示,在一种具体的实施例中,每个导电层接触区21的尺寸为205μm*435μm,两个导电层接触区21之间的间隔为150μm。其中,205μm为导电层接触区21的横向尺寸,可以通过图15中的c来表征,435μm为导电层接触区21的纵向尺寸,可以通过图15中的d来表征;两个导电层接触区21之间的间隔可以通过图15中的e来表征。The size of the conductive layer contact area 21 can be slightly smaller than the size of the electrode 61 of the LED chip 6, so that the electrode 61 of the LED chip 6 can completely cover the chip contact area on the conductive layer contact area 21, that is, the electrode of the LED chip 6. 61 completely covers the tin layer on the conductive layer contact area 21, thereby improving the adhesion (pushing force) between the electrode 61 of the LED chip 6 and the conductive layer contact area 21. As shown in FIG. 15, in a specific embodiment, the size of each conductive layer contact area 21 is 205 μm*435 μm, and the interval between two conductive layer contact areas 21 is 150 μm. Among them, 205 μm is the lateral dimension of the conductive layer contact area 21, which can be characterized by c in FIG. 15, and 435 μm is the longitudinal dimension of the conductive layer contact area 21, which can be characterized by d in FIG. 15; two conductive layer contact areas The interval between 21 can be characterized by e in FIG. 15.
进一步的,如图16和图17所示,高反射支架7为凹槽状结构,包括一体成型的围墙部71和基底部72。LED芯片6通过第一焊接区3的锡层焊接固定在位于高反射支架7内的导电层2上,基底部72覆盖第一焊接区3中除芯片接触区以外的区域。Further, as shown in FIGS. 16 and 17, the high reflection bracket 7 is a groove-shaped structure, and includes an integrally formed wall portion 71 and a base portion 72. The LED chip 6 is soldered and fixed on the conductive layer 2 in the high-reflection bracket 7 through the tin layer of the first soldering area 3, and the base portion 72 covers the area of the first soldering area 3 except the chip contact area.
如此设置,可以通过基底部72来反射LED芯片6发出的光,相比通过第一焊接区3中除芯片接触区以外的区域的锡层来反射LED芯片6发出的光,由于高反射支架7对可见光的反射率高于锡层对可见光的反射率,使得本实施例提供的高反射支架7的结构可以提高从高反射支架7的出光口射出的光的强度,从而提高了LED发光装置发出的光的强度。With this arrangement, the light emitted by the LED chip 6 can be reflected by the base 72, compared to the light emitted by the LED chip 6 being reflected by the tin layer in the area other than the chip contact area in the first bonding area 3, due to the high reflection bracket 7 The reflectance of visible light is higher than that of the tin layer, so that the structure of the highly reflective bracket 7 provided in this embodiment can increase the intensity of the light emitted from the light outlet of the highly reflective bracket 7, thereby increasing the LED light emitting device emits The intensity of the light.
当LED芯片6的尺寸为22mil*40mil时。对方案一、方案二以及方案三中的LED发光装置发出光的亮度进行仿真得到的结果如表5所示。其中22mil指的是LED芯片6的纵向尺寸。方案一、方案二以及方案三的具体结构如下:When the size of the LED chip 6 is 22mil*40mil. Table 5 shows the results obtained by simulating the brightness of the LED light-emitting devices in the first, second, and third scenarios. Among them, 22mil refers to the longitudinal dimension of the LED chip 6. The specific structures of Scheme 1, Scheme 2 and Scheme 3 are as follows:
方案一中的LED发光装置的焊接区为银层,且基底部72不覆盖除芯片接触区以外的区域;方案二中的LED发光装置的焊接区为锡层,且基底部72不覆盖除芯片接触区以外的区域;方案三中的LED发光装置的焊接区为锡层,且基底部72覆盖除芯片接触区以外的区域。The soldering area of the LED light-emitting device in the first solution is a silver layer, and the base 72 does not cover areas other than the chip contact area; the soldering area of the LED light-emitting device in the second solution is a tin layer, and the base 72 does not cover the other than the chip The area other than the contact area; the soldering area of the LED light-emitting device in the third solution is a tin layer, and the base 72 covers the area except the chip contact area.
由表5可知,方案一、方案二以及方案三中的LED发光装置发出的光的平均亮度依次为21.59、14.66以及21.37,方案二、方案三中的LED发光装置发出的光的平均亮度与方案一中的LED发光装置发出的光的平均亮度的比值依次为67.91%、99.00%。It can be seen from Table 5 that the average brightness of the light emitted by the LED light-emitting devices in the first, second, and third solutions are 21.59, 14.66, and 21.37, respectively. The average brightness of the light emitted by the LED light-emitting devices in the second and third solutions is the same as the solution The ratio of the average brightness of the light emitted by the LED light-emitting device in No. 1 is 67.91% and 99.00%.
由上述分析可知,方案三中的LED发光装置发出的光的亮度远大于方案二中的LED发光装置发出的光的亮度,表明当基底部72覆盖焊接区除 芯片接触区以外的区域时,可以极大的提高LED发光装置发出的光的亮度。同时,由于方案三中的LED发光装置与方案一种的LED发光装置发出的光的亮度较为接近,表明当基底部72覆盖除芯片接触区以外的区域时,将由银层形成的焊接区替换为由锡层形成的焊接区对LED发光装置发出的光的亮度影响不大。因此,可以用锡层替换银层,从而减小LED发光装置的成本,且避免在焊接时出现二次熔融的状况,提高LED发光装置的结构可靠性。It can be seen from the above analysis that the brightness of the light emitted by the LED light-emitting device in the third solution is much greater than that of the LED light-emitting device in the second solution, indicating that when the base 72 covers the soldering area except the chip contact area, it can be Greatly improve the brightness of the light emitted by the LED lighting device. At the same time, because the brightness of the LED light-emitting device in the third solution is relatively close to that of the LED light-emitting device in the first solution, it indicates that when the base 72 covers the area other than the chip contact area, the soldering area formed by the silver layer is replaced with The soldering area formed by the tin layer has little effect on the brightness of the light emitted by the LED light-emitting device. Therefore, the silver layer can be replaced with a tin layer, thereby reducing the cost of the LED light-emitting device, avoiding secondary melting during soldering, and improving the structural reliability of the LED light-emitting device.
由上述内容可知,一个LED芯片6对应两个第一焊接区3,为了将两个第一焊接区3分隔开,基底部72包括位于两个第一焊接区3之间的隔离部721。如图18所示,在一中具体的实施例中,通过隔离部721,基底部72可以将两个第一焊接区3分隔为正极焊接区与负极焊接区,正极焊接区与LED芯片6的正极导电性连接,负极焊接区与LED芯片6的负极导电性连接。It can be seen from the above content that one LED chip 6 corresponds to two first welding areas 3. In order to separate the two first welding areas 3, the base portion 72 includes an isolation portion 721 located between the two first welding areas 3. As shown in FIG. 18, in a specific embodiment, the isolation portion 721, the base portion 72 can separate the two first welding areas 3 into the positive electrode welding area and the negative electrode welding area, and the positive electrode welding area and the LED chip 6 The positive electrode is electrically connected, and the negative electrode welding area is electrically connected to the negative electrode of the LED chip 6.
如图14、16和17所示,在一种可实现的实施方式中,导电层接触区21的顶面与基底部72的顶面处于同一平面内。这样设置,当LED芯片6固定在导电层接触区21后,LED芯片6不易晃动,从而提高了LED发光装置的结构稳定性。As shown in FIGS. 14, 16 and 17, in an achievable embodiment, the top surface of the conductive layer contact area 21 and the top surface of the base portion 72 are in the same plane. With this arrangement, when the LED chip 6 is fixed in the conductive layer contact area 21, the LED chip 6 is not easily shaken, thereby improving the structural stability of the LED light-emitting device.
如图18-图19所示,在另一种可实现的实施方式中,基底部72的隔离部721的顶面高于导电层接触区21的顶面。这样设置,可以防止在焊接过程中,固晶胶与锡层等的混合物发生溢流。As shown in FIGS. 18-19, in another achievable embodiment, the top surface of the isolation portion 721 of the base portion 72 is higher than the top surface of the conductive layer contact region 21. This arrangement can prevent the mixture of die-bonding glue and tin layer from overflowing during the welding process.
如图20-图21所示,当隔离部721的顶面不高于导电层接触区21的顶面时,位于左右两边的两个导电层接触区21上固晶胶与锡层的混合物流向隔离部721,使得左右两边的两个导电层接触区21导电性连接,导致LED发光装置短路。通过设置隔离部721的顶面高于导电层接触区21的顶面,可以阻挡左右两边的两个导电层接触区21上的固晶胶与锡层的混合物流向隔离部721,避免左右两边的两个导电层接触区21导电性连接,从而避免出现短路故障。As shown in FIGS. 20-21, when the top surface of the isolation portion 721 is not higher than the top surface of the conductive layer contact area 21, the mixture of the bonding glue and the tin layer on the two conductive layer contact areas 21 located on the left and right sides flows to The isolation portion 721 makes the two conductive layer contact areas 21 on the left and right sides conductively connected, resulting in a short circuit of the LED light-emitting device. By setting the top surface of the isolation portion 721 higher than the top surface of the conductive layer contact area 21, the mixture of the bond glue and the tin layer on the two conductive layer contact areas 21 on the left and right sides can be blocked from flowing to the isolation portion 721, avoiding the left and right sides. The two conductive layer contact areas 21 are electrically connected, so as to avoid short-circuit failure.
参照图22-图23所示,基于LED发光装置受到弯折、撞击等外力作用时会发生形变,尤其是LED发光装置作为侧入式背光源时,此时LED发光装置为狭长结构,受到弯折、撞击等外力作用时容易崩裂。因此为了加强LED发光装置抵抗弯折与撞击变形的能力,本实施例在左右两个导电层 接触区21均设置有嵌入到隔离部721中的延伸部22。Referring to Figures 22-23, the LED light-emitting device will be deformed when subjected to external forces such as bending or impact, especially when the LED light-emitting device is used as an edge-type backlight. At this time, the LED light-emitting device has a long and narrow structure and is subjected to bending. It is easy to crack when external forces such as folding and impact are applied. Therefore, in order to enhance the ability of the LED light-emitting device to resist bending and impact deformation, in the present embodiment, the two conductive layer contact areas 21 on the left and the right are provided with extensions 22 embedded in the isolation portion 721.
作为一种可实现的实施方式,参照图24-图25,基底部72设置有位于LED芯片6外围的限位凸起722。通过设置限位凸起722,可以防止回流焊等操作时,由于固晶胶与锡层等受热融合后流动使得LED芯片6位置发生偏移(参照图26-图27),导致LED芯片6的电极61与芯片接触区之间的粘结力(推力)不足,LED发光装置发出的光出现光型扭曲以及LED发光装置电性异常等故障。As an achievable embodiment, referring to FIGS. 24-25, the base 72 is provided with a limiting protrusion 722 located on the periphery of the LED chip 6. By setting the limit protrusion 722, it is possible to prevent the position of the LED chip 6 from shifting due to the heat fusion of the die bond and the tin layer during operations such as reflow soldering (refer to Figure 26-27), resulting in the LED chip 6 The adhesion force (thrust force) between the electrode 61 and the chip contact area is insufficient, and the light emitted by the LED light-emitting device appears light-type distortion, and the LED light-emitting device is electrically abnormal.
需要说明的是,当LED芯片6的位置没有发生偏移时,LED发光装置在特定的出光角度会对应特定的光强。当LED芯片6位置发生偏移时,此时,LED芯片6相对高反射支架7、第一焊接区3等结构的位置发生了变化,LED芯片6发出的光经过高反射支架7、第一焊接区3等结构反射后出射的角度、强度等参数也会发生改变,导致LED发光装置发出的光出现光型扭曲的故障。It should be noted that when the position of the LED chip 6 does not shift, the LED light emitting device will correspond to a specific light intensity at a specific light output angle. When the position of the LED chip 6 shifts, at this time, the position of the LED chip 6 relative to the high-reflective support 7, the first welding area 3 and other structures has changed, and the light emitted by the LED chip 6 passes through the high-reflective support 7, the first welding The parameters such as the angle and intensity of the output of the structure such as zone 3 will also change after reflection, which causes the light-type distortion of the light emitted by the LED light-emitting device.
进一步的,在一种可能的实施例中,如图24-图25所示,LED芯片6的形状为方形,限位凸起722包括至少一个L型凸起,且L型凸起分布在LED芯片的至少一个角旁。在本实施例中,限位凸起722包括四个L型凸起且分布在LED芯片6的四角。这样设置对LED芯片6发出的光的影响较小,且可防止LED芯片6朝图14中的上下左右四个方向偏移。Further, in a possible embodiment, as shown in FIGS. 24-25, the shape of the LED chip 6 is square, the limiting protrusion 722 includes at least one L-shaped protrusion, and the L-shaped protrusions are distributed on the LED At least one corner of the chip. In this embodiment, the limiting protrusion 722 includes four L-shaped protrusions distributed at the four corners of the LED chip 6. This arrangement has less influence on the light emitted by the LED chip 6 and can prevent the LED chip 6 from shifting in the four directions of up, down, left, and right in FIG. 14.
在另一种可能的实施例中,如图28-图29所示,LED芯片6的形状为方形;限位凸起722为方形环状凸起,方形环状凸起包围LED芯片6的四个侧面。In another possible embodiment, as shown in FIGS. 28-29, the shape of the LED chip 6 is square; the limiting protrusion 722 is a square ring-shaped protrusion, and the square ring-shaped protrusion surrounds the four sides of the LED chip 6. Sides.
本发明实施例还提供了一种LED发光装置的制造方法,本发明实施例提供的一种LED发光装置的制造方法首先提供载体,载体包括导电层;The embodiment of the present invention also provides a method for manufacturing an LED light-emitting device. The method for manufacturing an LED light-emitting device provided by the embodiment of the present invention first provides a carrier, and the carrier includes a conductive layer;
其次提供LED芯片,将LED芯片的电极覆晶接合且导电性连接于导电层上;Secondly, an LED chip is provided, and the electrodes of the LED chip are flip-chip bonded and conductively connected to the conductive layer;
其中,导电层包括铜层与设置在铜层上的焊接区,焊接区与电极中的任意一个包括锡层,且不包括金和镍。Wherein, the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
经过上述步骤,可以使LED芯片与导电层导电性连接,从而使得LED发光装置正常工作。并且载体的焊接区与电极中的任意一个包括锡层,且不包括金和镍,即通过锡层替代相关方案中的金层与镍层,且相比金与镍,锡更为便宜,可以节约成本。After the above steps, the LED chip and the conductive layer can be electrically connected, so that the LED light-emitting device can work normally. Moreover, any one of the soldering area and the electrode of the carrier includes a tin layer, and does not include gold and nickel, that is, the gold layer and the nickel layer in the related scheme are replaced by the tin layer, and compared with gold and nickel, tin is cheaper and can be save costs.
并且将LED芯片的电极固定连接于焊接区时,只需使用助焊剂作为固晶胶来帮助和促进焊接过程,无需使用锡膏来提供锡,锡层自身可以提供锡,且助焊剂比锡膏便宜,可以降低成本。由于不使用锡膏,可避免锡膏中锡以外的杂质在焊接后残留于LED芯片的电极与焊接区的接合处,且上述杂质不易清洗的问题,并且锡层较锡膏可向焊接区提供更高比例的锡,提高了LED芯片的电极与焊接区之间的粘结力;且纯锡熔点比锡膏高,进行回流焊时,不会出现二次熔融状况,降低了LED芯片的电极脱离焊接区的风险,提高了LED发光装置的结构稳定性。在一种具体的实施例中,LED芯片的电极与焊接区之间的粘结力为50G-60G,远大于相关方案在载体上设置镍层与金层且采用锡膏进行连接时LED芯片的电极与焊接区之间的粘结力(25G-35G)。And when the electrode of the LED chip is fixedly connected to the soldering area, only the flux is used as a die bond to help and promote the soldering process. There is no need to use solder paste to provide tin. The tin layer itself can provide tin, and the flux is better than solder paste. Cheap, can reduce costs. Since no solder paste is used, impurities other than tin in the solder paste can be avoided at the junction between the electrode of the LED chip and the soldering area after soldering, and the above-mentioned impurities are not easy to clean, and the tin layer can be provided to the soldering area compared to the solder paste. A higher proportion of tin improves the adhesion between the electrode of the LED chip and the soldering area; and the melting point of pure tin is higher than that of solder paste, so there will be no secondary melting during reflow soldering, which reduces the electrode of the LED chip. The risk of leaving the soldering zone improves the structural stability of the LED light-emitting device. In a specific embodiment, the bonding force between the electrode of the LED chip and the soldering area is 50G-60G, which is much greater than that of the LED chip when the nickel layer and the gold layer are arranged on the carrier and the solder paste is used for connection in the related solution. The adhesion between the electrode and the welding area (25G-35G).
需要说明的时,载体的焊接区与电极中的任意一个包括锡层,且不包括金和镍。即焊接区包括锡层,且不包括镍和金;和/或,电极包括锡层,且不包括金和镍。如此设计,可以提高LED发光装置的制造方法的灵活度。It should be noted that any one of the soldering area and the electrode of the carrier includes a tin layer, and does not include gold and nickel. That is, the soldering area includes a tin layer and does not include nickel and gold; and/or, the electrode includes a tin layer and does not include gold and nickel. Such a design can increase the flexibility of the manufacturing method of the LED light-emitting device.
进一步的,为了将LED芯片的至少一个电极固定在焊接区,在一种具体的实施例中,还包括以下步骤:Further, in order to fix at least one electrode of the LED chip in the welding area, in a specific embodiment, the method further includes the following steps:
首先在焊接区上以点胶的方式添加助焊剂;助焊剂不具有锡。First, add flux by dispensing glue on the soldering zone; the flux does not contain tin.
其次将LED芯片的至少一个电极贴在助焊剂上;Secondly, at least one electrode of the LED chip is attached to the flux;
最后对电极与焊接区进行回流焊,使LED芯片的至少一个电极焊接固定在焊接区。Finally, reflow soldering is performed on the electrode and the soldering area, so that at least one electrode of the LED chip is soldered and fixed in the soldering area.
采用点胶机点胶的方式,相比采用刷锡机刷胶的方式,具有高精度且不易刷偏的优点,从而使得对LED芯片进行固晶操作,即将LED芯片的至少一个电极贴在助焊剂上时,LED芯片不会发生偏移,从而使得LED发光装置发出光的光型不会发生偏移。Adopting the glue dispensing method of the glue machine, compared with the brushing method of the tin brushing machine, has the advantages of high precision and not easy to brush, so that the LED chip can be solidified, that is, at least one electrode of the LED chip is attached to the helper. When the flux is applied, the LED chip will not shift, so that the light pattern of the light emitted by the LED light-emitting device will not shift.
且当LED芯片为超小间距发光二极管(mini LED)时,由于超小间距发光二极管的尺寸极小,对应的点胶机的尺寸也极小,而锡膏内的锡颗粒尺寸,无法从点胶机的出口点出,导致采用锡膏作为固晶胶时,无法使用点胶机点胶的方式添加锡膏,只能使用刷锡机刷胶方式添加锡膏。而本实施例使用的助焊剂可以使用点胶机点胶,从而提高了LED芯片固晶时的精度。And when the LED chip is an ultra-fine-pitch light-emitting diode (mini LED), because the size of the ultra-fine-pitch light-emitting diode is extremely small, the size of the corresponding dispenser is also extremely small, and the size of the tin particles in the solder paste cannot be The exit point of the glue machine is out, and when the solder paste is used as the solid crystal glue, the glue can not be added by the glue dispensing method, and the solder paste can only be added by the brushing method of the tin brushing machine. The flux used in this embodiment can be dispensed by a dispenser, thereby improving the accuracy of LED chip bonding.
如图30所示,在一种具体的实施例中,对电极与焊接区进行回流焊, 使LED芯片的至少一个电极焊接固定在焊接区的步骤包括:As shown in FIG. 30, in a specific embodiment, the step of performing reflow soldering on the electrode and the soldering area so that at least one electrode of the LED chip is soldered and fixed in the soldering area includes:
以1-5℃/s的速度将电极与焊接区加热至180℃-200℃。这样设置,使电极与焊接区预热,除去固晶胶中的水分。Heat the electrode and welding zone to 180°C-200°C at a rate of 1-5°C/s. This arrangement preheats the electrode and the welding area and removes the moisture in the bonding glue.
使电极与焊接区保持在180℃-200℃,且持续时间小于或等于120s。这样设置,可以确保固晶胶完全干燥,同时可以清除电极与焊接区的金属氧化物。Keep the electrode and welding area at 180℃-200℃, and the duration is less than or equal to 120s. This arrangement can ensure that the die bond is completely dry, and at the same time can remove the metal oxide in the electrode and the welding area.
以1-5℃/s的速度将电极与焊接区区加热至260℃,其中,电极与焊接区高于220℃的时间小于或等于60s。这样设置,可以使锡层融合,并且使电极与焊接区连接。Heat the electrode and welding zone to 260°C at a rate of 1-5°C/s, where the time for the electrode and welding zone to be higher than 220°C is less than or equal to 60s. With this arrangement, the tin layer can be fused and the electrode can be connected to the soldering area.
逐渐降低电极与焊接区温度,使LED芯片的至少一个电极固定在焊接区。Gradually reduce the temperature of the electrode and the welding area, so that at least one electrode of the LED chip is fixed in the welding area.
进一步的,在一种具体的实施例中,LED发光装置的制造方法还包括:提供高反射支架,高反射支架设置在载体上;高反射支架为凹槽状结构,包括一体成型的围墙部和基底部;焊接区中与LED芯片的电极接触的区域为芯片接触区,基底部覆盖焊接区中除芯片接触区以外的区域。Further, in a specific embodiment, the manufacturing method of the LED light-emitting device further includes: providing a high-reflection support, the high-reflection support is arranged on the carrier; the high-reflection support is a groove-shaped structure, including an integrally formed wall and Base: The area in the soldering area that is in contact with the electrode of the LED chip is the chip contact area, and the base covers the area of the soldering area except the chip contact area.
将LED芯片设置在高反射支架内。Set the LED chip in the high-reflection bracket.
这样设置,可以通过高反射支架将LED芯片发出的光反射,提高LED发光装置出光方向的亮度。With this arrangement, the light emitted by the LED chip can be reflected by the high-reflection bracket, and the brightness of the light-emitting direction of the LED light-emitting device can be improved.
本说明书中各实施例或实施方式采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似部分相互参见即可。The embodiments or implementations in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referred to each other.
本领域技术人员应理解的是,在本发明的揭露中,术语“纵向”、“横向”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系是基于附图所示的方位或位置关系,其仅是为了便于描述本发明和简化描述,而不是指示或暗示所指的系统或组件必须具有特定的方位、以特定的方位构造和操作,因此上述术语不能理解为对本发明的限制。Those skilled in the art should understand that, in the disclosure of the present invention, the terms "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", " The orientation or positional relationship indicated by "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention And to simplify the description, rather than indicating or implying that the system or component referred to must have a specific orientation, be constructed and operated in a specific orientation, so the above terms should not be construed as limiting the present invention.
在本说明书的描述中,参考术“一个实施方式”、“一些实施方式”、“示意性实施方式”、“示例”、“具体示例”、或“一些示例”等的描述意指结合实施方式或示例描述的具体特征、结构、材料或者特点包含于本发明的至少一个实施方式或示例中。在本说明书中,对上述术语的示意 性表述不一定指的是相同的实施方式或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施方式或示例中以合适的方式结合。In the description of this specification, reference to descriptions such as "one embodiment", "some embodiments", "exemplary embodiments", "examples", "specific examples", or "some examples" means to combine the embodiments The specific features, structures, materials, or characteristics described in the examples are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above-mentioned terms do not necessarily refer to the same embodiment or example. Moreover, the described specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.
最后应说明的是:以上各实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述各实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分或者全部技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的范围。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: It is still possible to modify the technical solutions described in the foregoing embodiments, or equivalently replace some or all of the technical features; these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the embodiments of the present invention. range.

Claims (21)

  1. 一种LED发光装置,其特征在于,包括:An LED light emitting device, characterized in that it comprises:
    载体,所述载体包括一导电层;以及A carrier, the carrier including a conductive layer; and
    LED芯片,所述LED芯片设置于所述载体上,所述LED芯片的电极覆晶接合且导电性连接于所述导电层上;LED chip, the LED chip is arranged on the carrier, the electrode of the LED chip is flip chip bonded and conductively connected to the conductive layer;
    其中,所述导电层包括铜层与设置在所述铜层上的焊接区,所述焊接区与所述电极中的任意一个包括锡层,且不包括金和镍。Wherein, the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
  2. 根据权利要求1所述的LED发光装置,其特征在于,所述焊接区包括锡层。The LED light-emitting device according to claim 1, wherein the soldering area comprises a tin layer.
  3. 根据权利要求1所述的LED发光装置,其特征在于,所述焊接区包括锡层,且不包括金和镍;所述电极包括金和镍。The LED light-emitting device according to claim 1, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
  4. 根据权利要求1所述的LED发光装置,其特征在于,所述电极包括锡层,且不包括金和镍;所述焊接区包括金和镍。The LED light-emitting device according to claim 1, wherein the electrode includes a tin layer and does not include gold and nickel; and the welding area includes gold and nickel.
  5. 根据权利要求1所述的LED发光装置,其特征在于,所述焊接区包括锡层,且不包括金和镍;所述电极包括锡层,且不包括金和镍。The LED light-emitting device according to claim 1, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes a tin layer and does not include gold and nickel.
  6. 根据权利要求1所述的LED发光装置,其特征在于,所述LED发光装置还包括设置在所述载体上的高反射支架,所述高反射支架为凹槽状结构,包括一体成型的围墙部和基底部;所述焊接区中与所述LED芯片的电极接触的区域为芯片接触区,所述基底部覆盖所述焊接区中除所述芯片接触区以外的区域;The LED light-emitting device according to claim 1, wherein the LED light-emitting device further comprises a high-reflective bracket arranged on the carrier, the high-reflective bracket is a groove-shaped structure, and includes an integrally formed wall part And a base; the area in the soldering area that is in contact with the electrode of the LED chip is a chip contact area, and the base covers the area of the soldering area excluding the chip contact area;
    所述LED芯片位于所述高反射支架内。The LED chip is located in the high reflection bracket.
  7. 根据权利要求6所述的LED发光装置,其特征在于,所述高反射支架的材料包括树脂与填充剂,所述树脂为聚酯、不饱和聚酯、环氧树脂中的任意一种;The LED light-emitting device according to claim 6, wherein the material of the high-reflective bracket includes resin and filler, and the resin is any one of polyester, unsaturated polyester, and epoxy;
    当所述树脂为所述聚酯时,所述填充剂包括二氧化钛或玻璃纤维中的至少一种;When the resin is the polyester, the filler includes at least one of titanium dioxide or glass fiber;
    当所述树脂为所述不饱和聚酯时,所述填充剂包括所述二氧化钛、二氧化硅、所述玻璃纤维中的至少一种;When the resin is the unsaturated polyester, the filler includes at least one of the titanium dioxide, silicon dioxide, and the glass fiber;
    当所述树脂为所述环氧树脂时,所述填充剂包括所述二氧化钛、所述二氧化硅、氧化铝中的至少一种。When the resin is the epoxy resin, the filler includes at least one of the titanium dioxide, the silicon dioxide, and the aluminum oxide.
  8. 根据权利要求6所述的LED发光装置,其特征在于,所述芯片接触区对应的导电层的区域为导电层接触区,所述导电层接触区的顶面与所述基底部的顶面位于同一平面。The LED light-emitting device according to claim 6, wherein the area of the conductive layer corresponding to the chip contact area is a conductive layer contact area, and the top surface of the conductive layer contact area and the top surface of the base portion are located same plane.
  9. 根据权利要求6所述的LED发光装置,其特征在于,所述LED芯片包括两个电极,所述导电层上包括有与两个所述电极一一对应的两个所述焊接区;7. The LED light-emitting device according to claim 6, wherein the LED chip includes two electrodes, and the conductive layer includes two soldering areas corresponding to the two electrodes one-to-one;
    所述基底部具有位于两个所述焊接区之间的隔离部。The base part has an isolation part located between the two welding areas.
  10. 根据权利要求9所述的LED发光装置,其特征在于,所述隔离部的顶面高于所述导电层接触区的顶面。9. The LED light-emitting device according to claim 9, wherein the top surface of the isolation portion is higher than the top surface of the conductive layer contact area.
  11. 根据权利要求9所述的LED发光装置,其特征在于,两个所述焊接区包括两个所述芯片接触区,两个所述芯片接触区对应两个所述导电层接触区,两个所述导电层接触区均有嵌入到所述隔离部中的延伸部。The LED light-emitting device according to claim 9, wherein the two soldering areas include two chip contact areas, the two chip contact areas correspond to the two conductive layer contact areas, and the two contact areas are The conductive layer contact area has an extension part embedded in the isolation part.
  12. 根据权利要求6-11任一项所述的LED发光装置,其特征在于,所述基底部设置有限位凸起,所述限位凸起位于所述LED芯片的外围。The LED light-emitting device according to any one of claims 6-11, wherein the base is provided with a limiting protrusion, and the limiting protrusion is located on the periphery of the LED chip.
  13. 根据权利要求12所述的LED发光装置,其特征在于,所述LED芯片的形状为方形;所述限位凸起包括至少一个L型凸起,所述L型凸起分布在所述LED芯片的至少一个角旁。The LED light-emitting device according to claim 12, wherein the shape of the LED chip is a square; the limiting protrusion includes at least one L-shaped protrusion, and the L-shaped protrusion is distributed on the LED chip. At least one corner.
  14. 根据权利要求12所述的LED发光装置,其特征在于,所述LED芯片的形状为方形;所述限位凸起为方形环状凸起,所述方形环状凸起包围所述LED芯片的四个侧面。The LED light-emitting device according to claim 12, wherein the shape of the LED chip is a square; the limiting protrusion is a square ring-shaped protrusion, and the square ring-shaped protrusion surrounds the LED chip Four sides.
  15. 一种LED发光装置的制造方法,其特征在于,包括:A method for manufacturing an LED light-emitting device, which is characterized in that it comprises:
    提供载体,所述载体包括导电层;以及Providing a carrier, the carrier including a conductive layer; and
    提供LED芯片,将所述LED芯片的电极覆晶接合且导电性连接于所述导电层上;Provide an LED chip, and connect the electrodes of the LED chip with flip chip and conductively connect to the conductive layer;
    其中,所述导电层包括铜层与设置在所述铜层上的焊接区,所述焊接区与所述电极中的任意一个包括锡层,且不包括金和镍。Wherein, the conductive layer includes a copper layer and a welding area provided on the copper layer, and any one of the welding area and the electrode includes a tin layer, and does not include gold and nickel.
  16. 根据权利要求15所述的LED发光装置的制造方法,其特征在于,所述焊接区包括锡层。The method for manufacturing an LED light emitting device according to claim 15, wherein the soldering area includes a tin layer.
  17. 根据权利要求15所述的LED发光装置的制造方法,其特征在于,所述焊接区包括锡层且不包括金和镍;所述电极包括金和镍。The method for manufacturing an LED light emitting device according to claim 15, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes gold and nickel.
  18. 根据权利要求15所述的LED发光装置的制造方法,其特征在于, 所述电极包括锡层,且不包括金和镍;所述焊接区包括金和镍。15. The method of manufacturing an LED light emitting device according to claim 15, wherein the electrode includes a tin layer and does not include gold and nickel; and the welding area includes gold and nickel.
  19. 根据权利要求15所述的LED发光装置的制造方法,其特征在于,所述焊接区包括锡层,且不包括金和镍;所述电极包括锡层,且不包括金和镍。15. The method for manufacturing an LED light emitting device according to claim 15, wherein the soldering area includes a tin layer and does not include gold and nickel; and the electrode includes a tin layer and does not include gold and nickel.
  20. 根据权利要求15所述的LED发光装置的制造方法,其特征在于,所述制造方法还包括:The method of manufacturing an LED light-emitting device according to claim 15, wherein the manufacturing method further comprises:
    在所述焊接区上以点胶的方式添加助焊剂;Adding flux by dispensing glue on the welding area;
    所述LED芯片的至少一个电极贴在所述助焊剂上;以及At least one electrode of the LED chip is attached to the flux; and
    对所述电极与所述焊接区进行回流焊,使所述LED芯片的至少一个电极焊接固定在所述焊接区;Performing reflow soldering on the electrode and the welding area, so that at least one electrode of the LED chip is welded and fixed in the welding area;
    其中,所述助焊剂不具有锡。Wherein, the soldering flux does not have tin.
  21. 根据权利要求15-20任一项所述的LED发光装置的制造方法,其特征在于,所述制造方法还包括:The method for manufacturing an LED light-emitting device according to any one of claims 15-20, wherein the manufacturing method further comprises:
    提供高反射支架,所述高反射支架设置在所述载体上;以及Providing a high-reflection support, the high-reflection support being arranged on the carrier; and
    将所述LED芯片设置在所述高反射支架内;Arranging the LED chip in the high reflection bracket;
    其中,所述高反射支架为凹槽状结构,包括一体成型的围墙部和基底部;所述焊接区中与所述LED芯片的电极接触的区域为芯片接触区,所述基底部覆盖所述焊接区中除所述芯片接触区以外的区域。Wherein, the high-reflective bracket is a groove-shaped structure, including an integrally formed wall part and a base part; the area in the soldering area that is in contact with the electrode of the LED chip is a chip contact area, and the base part covers the The area of the bonding area excluding the chip contact area.
PCT/CN2020/133281 2019-12-02 2020-12-02 Led light emitting device and manufacturing method therefor WO2021110019A1 (en)

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