WO2021073310A1 - 一种封装模块翘曲变形及缺陷的三维在线监测方法及装置 - Google Patents
一种封装模块翘曲变形及缺陷的三维在线监测方法及装置 Download PDFInfo
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- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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Abstract
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Claims (10)
- 一种封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,包括:投影云纹模块、X射线模块、监测分析模块;所述监测分析模块分别与所述投影云纹模块、所述X射线模块相连;所述投影云纹模块用于获得待测封装模块样品的第一翘曲信息;所述X射线模块用于获得待测封装模块样品的第二翘曲信息;所述监测分析模块用于根据所述第一翘曲信息、所述第二翘曲信息获得监测结果信息。
- 根据权利要求1所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,所述投影云纹模块包括:CCD相机、光栅投影仪;所述光栅投影仪用于投射光栅至待测封装模块样品表面;所述CCD相机用于对所述待测封装模块样品表面的光栅变化进行连续拍摄采集,获得所述第一翘曲信息。
- 根据权利要求2所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,所述投影云纹模块还包括:同步触发器;所述CCD相机为多个CCD相机组成的CCD相机阵列;所述CCD相机阵列与所述同步触发器连接;所述光栅投影仪为多个光栅投影仪组成的光栅投影仪阵列;所述光栅投影仪阵列与所述同步触发器连接。
- 根据权利要求1所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,所述X射线模块包括:X射线管、X射线探测器;所述X射线管用于发射X射线至待测封装模块样品;所述X射线探测器用于接收待测封装模块样品经照射后的X射线强度数据,获得所述第二翘曲信息。
- 根据权利要求4所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,所述X射线模块还包括:X光控制电路;所述X光控制电路用于控制所述X射线管发射的X射线的强度。
- 根据权利要求4或5所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,所述X射线管为多个X射线管组成的X射线管阵列;所述X射线探测器为多个X射线探测器组成的阵列式线性陈列探测器。
- 根据权利要求1所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征 在于,所述监测分析模块包括:数据存储装置、数据分析装置、监测显示装置;所述数据存储装置用于存储来自所述投影云纹模块、所述X射线模块的信息,并传输至所述数据分析装置,所述数据存储装置与所述同步触发器连接;所述数据分析装置用于根据所述第一翘曲信息获得翘曲变形信息,用于根据所述第二翘曲信息获得翘曲缺陷信息,用于根据所述翘曲变形信息和所述翘曲缺陷信息获得所述监测结果信息;所述监测显示装置用于对所述监测结果信息进行显示。
- 根据权利要求2所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,还包括:光学三维测量标定器;所述光学三维测量标定器用于对相机进行内参、外参、高度标定。
- 根据权利要求4所述的封装模块翘曲变形及缺陷的三维在线监测装置,其特征在于,还包括:平面安置台;所述待测封装模块样品放置在所述平面安置台上;所述X射线管设置在所述平面安置台的上方或侧边。
- 一种封装模块翘曲变形及缺陷的三维在线监测方法,其特征在于,采用如权利要求1-9中任一所述的封装模块翘曲变形及缺陷的三维在线监测装置,所述方法包括以下步骤:通过投影云纹模块获得待测封装模块样品的第一翘曲信息;通过X射线模块获得待测封装模块样品的第二翘曲信息;根据所述第一翘曲信息、所述第二翘曲信息获得监测结果信息。
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