WO2021068686A1 - 设备测试方法、系统、网络设备和可读存储介质 - Google Patents
设备测试方法、系统、网络设备和可读存储介质 Download PDFInfo
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- WO2021068686A1 WO2021068686A1 PCT/CN2020/112692 CN2020112692W WO2021068686A1 WO 2021068686 A1 WO2021068686 A1 WO 2021068686A1 CN 2020112692 W CN2020112692 W CN 2020112692W WO 2021068686 A1 WO2021068686 A1 WO 2021068686A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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- the embodiments of the present invention relate to but not limited to the field of communication equipment, and specifically relate to but not limited to equipment testing methods, systems, network equipment, and readable storage media.
- the device testing method, system, network device, and readable storage medium provided by the embodiments of the present invention mainly solve the technical problem that in some cases, the device testing method takes a long time and is inefficient.
- an embodiment of the present invention provides a device testing method, including: detecting current working environment information; when the working environment information is qualified, various test items of the equipment to be tested are performed in parallel For testing.
- the embodiment of the present invention also provides a device testing system, including: a first testing module, used to detect current working environment information; a second testing module, when the working environment information is qualified, each of the equipment to be tested Class test items are tested in parallel.
- the embodiment of the present invention also provides a network device, the network device includes a processor, a memory, and a communication bus; the communication bus is used to implement connection and communication between the processor and the memory; the processor is used to execute one or more computers stored in the memory Program to implement the steps of the above-mentioned equipment testing method.
- the embodiment of the present invention also provides a computer storage medium, and the computer-readable storage medium stores one or more programs, and the one or more programs can be executed by one or more processors to implement the steps of the above-mentioned device testing method.
- FIG. 1 is a flowchart of a device testing method provided by Embodiment 1 of the present invention.
- Embodiment 2 is a flowchart of a device testing method provided by Embodiment 2 of the present invention.
- Embodiment 3 is a schematic diagram of the composition of a device testing system provided by Embodiment 3 of the present invention.
- FIG. 4 is a schematic structural diagram of a network device according to Embodiment 4 of the present invention.
- Routers are used as communication products.
- routers of model ZXR10T8000 are used as high-end core routers. It is a very important link to conduct equipment self-inspection before products.
- ZXR10T8000 as a core router, has the characteristics of large capacity and high performance, with 18 line card slots. In the case of full configuration, it takes a long time for all boards to complete a round of self-test. For example, it takes 3 hours to test a 5Z line card. The total number of test items is 176, and the test exchange takes 1 hour. The total number of test items is 75 A. It takes 4 hours to test the IZ line card, and the total number of test items is 187, and it takes 4 hours to test the 6Z line card, and the total number of test items is 208.
- This embodiment provides a device testing method. Please refer to FIG. 1.
- the method includes:
- the current working environment information includes basic information of the equipment to be tested and information related to the test environment.
- detecting the current working environment information includes environment information of the device under test, and the environment information includes:
- detecting the current working environment information may further include in sequence:
- the various test items of the device under test may further include:
- test items of the equipment to be tested are classified, and the test items of different types do not conflict with each other.
- Non-conflict refers to the fact that during the test, it can be divided into different threads to run without affecting the normal working logic of the device.
- classifying the test items of the device under test, wherein the test items of different types do not conflict with each other may include:
- test items are divided into the following five categories: high-speed serial computer expansion bus standard PCIE test, SA (synchronous/asynchronous, synchronous/asynchronous serial port) test, NP (Network Processor) test, forwarding test, and control plane test.
- PCIE test high-speed serial computer expansion bus standard PCIE test
- SA synchronous/asynchronous, synchronous/asynchronous serial port
- NP Network Processor
- the test items of the single board are split according to the functional modules realized by the single board. In other words, it may have at least one, and at most five types of test items as described above, that is, for a single board, its test items are correspondingly classified according to the test items of the device to be tested. These tests do not interfere with each other, and can be classified and then tested in parallel, which can greatly reduce the time required for testing compared to the serial pipeline test scheme.
- parallel testing of various test items of the device under test also includes:
- test PCIE test start PCIE test, start SA test, start NP test, start forwarding test, start control plane test, trigger the test process of the corresponding test item.
- start PCIE test start SA test
- start NP test start forwarding test
- start control plane test trigger the test process of the corresponding test item.
- the specific format of the test command may be: start slot ⁇ slot number>, which corresponds to testing the slot corresponding to the slot number.
- Test commands can be classified and executed according to test items, and specific slots can also be tested according to requirements; the slot number in the test command start slot ⁇ slot number> corresponds to the relevant slot.
- the device testing method provided in this embodiment, current working environment information is detected; when the working environment information is qualified, various test items of the equipment to be tested are tested in parallel. In this way, various test items of the equipment under test are tested in a parallel manner, which greatly reduces the time required for testing and improves efficiency.
- Figure 2 is a flow chart of the device test method provided in the second embodiment of the present invention.
- the device test method is applied to router equipment.
- a router with model ZXR10T8000 is used as a high-end core router. It is very important to conduct a self-check before the product As a core router, ZXR10T8000 has the characteristics of large capacity and high performance, with 18 line card slots.
- the device testing method in this embodiment includes:
- This embodiment provides a device testing system. Please refer to FIG. 3.
- the system includes:
- the first testing module 31 is used to detect current working environment information
- the second test module 32 is used to test various test items of the equipment under test in parallel when the work environment information is qualified.
- the current working environment information includes basic information of the equipment to be tested and information related to the test environment.
- detecting the current working environment information includes environment information of the device under test, and the environment information includes:
- detecting the current working environment information may further include:
- the tooling version starts the test. After the tooling version starts the test, it can also include:
- the various test items of the device under test may further include:
- test items of the equipment under test are divided into at least two categories in a manner that does not conflict with each other.
- Non-conflict refers to the fact that during the test, it can be divided into different threads to run without affecting the normal working logic of the device.
- dividing the test items of the device under test into at least two types in a non-conflicting manner may include:
- test items are divided into the following five categories: high-speed serial computer expansion bus standard PCIE test, SA test, NP test, forwarding test, control plane test. These tests do not interfere with each other, and can be classified and then tested in parallel, which can greatly reduce the time required for testing compared to the serial pipeline test scheme.
- parallel testing of various test items of the device under test also includes:
- test PCIE test start PCIE test, start SA test, start NP test, start forwarding test, start control plane test, trigger the test process of the corresponding test item.
- start PCIE test start SA test
- start NP test start forwarding test
- start control plane test trigger the test process of the corresponding test item.
- the specific format of the test command may be: start slot ⁇ slot number>, which corresponds to testing the slot corresponding to the slot number.
- Test commands can be classified and executed according to test items, and specific slots can also be tested according to requirements; the slot number in the test command start slot ⁇ slot number> corresponds to the relevant slot.
- the first testing module is used to detect current working environment information; the second testing module is used to perform various test items of the equipment under test in parallel when the working environment information is qualified. test.
- various test items of the equipment to be tested are tested in a parallel manner, which greatly reduces the time required for testing and improves efficiency.
- This embodiment also provides a network device, as shown in FIG. 4, which includes a processor 41, a memory 42, and a communication bus 43, where:
- the communication bus 43 is used to implement connection and communication between the processor 41 and the memory 42;
- the processor 41 is configured to execute one or more computer programs stored in the memory 42 to implement the steps of the device testing method in the foregoing embodiments, which will not be repeated here.
- This embodiment also provides a computer-readable storage medium, which is included in any method or technology for storing information (such as computer-readable instructions, data structures, computer program modules, or other data). Volatile or non-volatile, removable or non-removable media.
- Computer-readable storage media include but are not limited to RAM (Random Access Memory), ROM (Read-Only Memory, read-only memory), EEPROM (Electrically Erasable Programmable read only memory, charged Erasable Programmable Read-Only Memory) ), flash memory or other memory technology, CD-ROM (Compact Disc Read-Only Memory), digital versatile disk (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage systems, Or any other medium that can be used to store desired information and that can be accessed by a computer.
- the computer-readable storage medium in this embodiment can be used to store one or more computer programs, and the stored one or more computer programs can be executed by a processor to implement at least one step of the device testing method in the foregoing embodiments .
- This embodiment also provides a computer program (or computer software).
- the computer program can be distributed on a computer-readable medium and executed by a computer system to implement at least one of the device testing methods in the foregoing embodiments. step.
- This embodiment also provides a computer program product, including a computer readable system, on which the computer program as shown above is stored.
- the computer-readable system in this embodiment may include the computer-readable storage medium as shown above.
- the current working environment information is detected; when the working environment information is qualified, various test items of the device to be tested are tested in parallel . In this way, various test items of the equipment under test are tested in a parallel manner, which greatly reduces the time required for testing and improves efficiency.
- communication media usually contain computer-readable instructions, data structures, computer program modules, or other data in a modulated data signal such as carrier waves or other transmission mechanisms, and may include any information delivery medium. Therefore, the present invention is not limited to any specific combination of hardware and software.
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Abstract
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Claims (10)
- 一种设备测试方法,包括:检测当前的工作环境信息;当所述工作环境信息检测合格时,对待测设备的各类测试项目并行的进行测试。
- 如权利要求1所述的设备测试方法,其中,所述检测当前的工作环境信息中,包括待测设备的环境信息,所述环境信息包括:待测设备的变更请求CR环境信息、引导Boot版本信息、可擦除可编辑逻辑器件EPLD版本信息中的至少一种。
- 如权利要求1所述的设备测试方法,其中,所述检测当前的工作环境信息中,还包括:工装版本启动测试。
- 如权利要求3所述的设备测试方法,其中,在所述工装版本启动测试之后,还包括:环境信息的自检。
- 如权利要求1-4任一项所述的设备测试方法,其中,在所述对待测设备的各类测试项目并行的进行测试之前,还包括;对所述待测设备的测试项目进行分类,其中处于不同类型的测试项目互不冲突。
- 如权利要求5所述的设备测试方法,其中,对所述待测设备的测试项目进行分类,其中处于不同类型的测试项目互不冲突包括:将所述测试项目分为如下五类:高速串行计算机扩展总线标准PCIE测试、同/异步串口SA测试、网络处理器NP测试、转发测试、控制面测试。
- 如权利要求5所述的设备测试方法,其中,根据测试命令启动测试项目,其中测试命令中包括对相应的槽位进行测试的槽口号信息。
- 一种设备测试系统,包括:第一测试模块,用于检测当前的工作环境信息;第二测试模块,用于当所述工作环境信息检测合格时,对待测设备的各类测试项目并行的进行测试。
- 一种网络设备,包括处理器、存储器及通信总线;所述通信总线用于实现处理器和存储器之间的连接通信;所述处理器用于执行存储器中存储的一个或者多个计算机程序,以实现如权利要求1-7中任一项所述的设备测试方法的步骤。
- 一种计算机可读存储介质,存储有一个或者多个计算机程序,其中,所述一个或者多个计算机程序可被一个或者多个处理器执行,以实现如权利要求1-7中任一项所述的设备测试方法的步骤。
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CN113886246A (zh) * | 2021-09-30 | 2022-01-04 | 平安普惠企业管理有限公司 | O2o项目流程管理系统测试方法、装置、设备及存储介质 |
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CN1432916A (zh) * | 2002-11-01 | 2003-07-30 | 英业达股份有限公司 | 多线程自动测试方法 |
CN106771961A (zh) * | 2016-11-29 | 2017-05-31 | 广州视源电子科技股份有限公司 | 板卡测试方法及系统 |
CN108334428A (zh) * | 2017-12-13 | 2018-07-27 | 天津津航计算技术研究所 | 一种系统功能的并行测试方法 |
US20180374556A1 (en) * | 2017-06-23 | 2018-12-27 | Texas Instruments Incorporated | Parallel memory self-testing |
CN209264906U (zh) * | 2018-11-12 | 2019-08-16 | 卡斯柯信号有限公司 | Cvc-200t硬件智能测试系统 |
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US20140245264A1 (en) * | 2013-02-28 | 2014-08-28 | International Business Machines Corporation | Identifying Test Cases Based on Changed Test Code |
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CN1432916A (zh) * | 2002-11-01 | 2003-07-30 | 英业达股份有限公司 | 多线程自动测试方法 |
CN106771961A (zh) * | 2016-11-29 | 2017-05-31 | 广州视源电子科技股份有限公司 | 板卡测试方法及系统 |
US20180374556A1 (en) * | 2017-06-23 | 2018-12-27 | Texas Instruments Incorporated | Parallel memory self-testing |
CN108334428A (zh) * | 2017-12-13 | 2018-07-27 | 天津津航计算技术研究所 | 一种系统功能的并行测试方法 |
CN209264906U (zh) * | 2018-11-12 | 2019-08-16 | 卡斯柯信号有限公司 | Cvc-200t硬件智能测试系统 |
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CN113886246A (zh) * | 2021-09-30 | 2022-01-04 | 平安普惠企业管理有限公司 | O2o项目流程管理系统测试方法、装置、设备及存储介质 |
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