WO2020250798A1 - Removal system and control device - Google Patents
Removal system and control device Download PDFInfo
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- WO2020250798A1 WO2020250798A1 PCT/JP2020/022116 JP2020022116W WO2020250798A1 WO 2020250798 A1 WO2020250798 A1 WO 2020250798A1 JP 2020022116 W JP2020022116 W JP 2020022116W WO 2020250798 A1 WO2020250798 A1 WO 2020250798A1
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- WIPO (PCT)
- Prior art keywords
- foreign matter
- contact surface
- removal system
- surface state
- storage unit
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J13/00—Controls for manipulators
- B25J13/08—Controls for manipulators by means of sensing devices, e.g. viewing or touching devices
Definitions
- the present invention relates to a removal system and a control device.
- Patent Document 1 a technique for preventing chips from entering a predetermined space (see, for example, Patent Document 1) and a technique for removing attached chips (see, for example, Patent Document 2) have been proposed.
- Patent Document 1 cannot completely prevent chips from entering a predetermined space. For this reason, when this technique is used, there is a possibility that foreign matter may adhere to the surface that becomes the close contact surface to which the members are attached or replaced or the work is gripped. is there.
- the present invention has decided to provide a removal system and a control device capable of removing foreign matter adhering to the contact surface of the jig.
- the removal system for removing foreign matter adhering to a machine tool includes a surface sensor, a foreign matter removing device, and a control device, and the surface sensor is a jig of the machine tool.
- the surface state of the close contact surface is detectable, and the close contact surface is at least a surface between members constituting the jig and a surface in contact with the work gripped by the jig.
- the foreign matter removing device is configured to be able to remove foreign matter from the close contact surface
- the control device includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit, and the surface state storage unit.
- a removal system configured to be able to send operation instructions is provided.
- foreign matter adhering to the contact surface is detected based on the comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. ..
- the surface state storage unit As a result, it is possible to detect foreign matter such as relatively small chips, and it is possible to detect foreign matter even if there are markings or scratches on the contact surface.
- the program for realizing the software appearing in the present embodiment may be provided as a non-temporary recording medium readable by a computer, may be provided as a downloadable form from an external server, or may be provided. It may be provided so that the program is started by an external computer and the function is realized by the client terminal (so-called cloud computing).
- the "part" may include, for example, a combination of hardware resources implemented by a circuit in a broad sense and information processing of software that can be concretely realized by these hardware resources. ..
- various information is handled in this embodiment, and these information are, for example, physical values of signal values representing voltage and current, and signal values as a bit aggregate of a binary number composed of 0 or 1. It is represented by high-low or quantum superposition (so-called qubit), and communication / calculation can be executed on a circuit in a broad sense.
- a circuit in a broad sense is a circuit realized by at least appropriately combining a circuit (Circuit), circuits (Circuitry), a processor (Processor), a memory (Memory), and the like. That is, an integrated circuit for a specific application (Application Special Integrated Circuit: ASIC), a programmable logic device (for example, a simple programmable logic device (Simple Programmable Logical Device: SPLD), a composite programmable logic device (Complex Program), a compound Program It includes a programmable gate array (Field Programmable Gate Array: FPGA) and the like.
- FIG. 1 is a block diagram showing a functional configuration of the removal system 1.
- the removal system 1 is configured to include a control device 2, a robot arm 3, a surface sensor 4, and a foreign matter removing device 5, and is a system for removing foreign matter adhering to the machine tool 6.
- the control device 2 controls the robot arm 3, the surface sensor 4, and the foreign matter removing device 5, and includes a surface state storage unit 21, a foreign matter detecting unit 22, and an operation indicating unit 23.
- the robot arm 3 is a robot capable of performing various operations on the machine tool 6, and an end effector can be attached to and detached from the tip of the robot arm 3, and a surface sensor 4 and foreign matter can be placed on the outer periphery near the tip of the robot arm 3.
- the removal device 5 can be attached.
- the removal system 1 may include a plurality of robot arms 3 and use both the robot arm 3 equipped with the surface sensor 4 and the robot arm 3 equipped with the foreign matter removing device 5.
- the surface sensor 4 and the foreign matter removing device 5 may be attached to and detached from the robot arm 3 as end effectors.
- the surface sensor 4 is configured to be able to detect the surface state of the contact surface of the members constituting the jig of the machine tool 6.
- the surface sensor 4 is realized by a camera, a displacement meter, or the like.
- the displacement meter various types such as optical type, eddy current type, ultrasonic type, and laser type can be used as long as they are non-contact type.
- a two-dimensional laser displacement meter or a three-dimensional displacement meter can be used.
- a laser displacement meter can be used.
- the surface sensor 4 may be arranged at the tip or the outer circumference of the robot arm 3 as long as it can detect the surface state of the contact surface of the member constituting the jig of the machine tool 6, and the processing of the machine tool 6 may be performed. It may be arranged in the area. When arranging the surface sensors 4 in this processing area, a plurality of surface sensors 4 may be used. The jig and its contact surface will be described later.
- the foreign matter removing device 5 removes foreign matter from the close contact surface of the members constituting the jig of the machine tool 6, and has a rotating brush, a brush, a gripper, an air blow, a liquid ejector, an aspirator, and the like. These may be simple substances or a combination thereof as appropriate. It is also possible to use an integrated combination such as an air blow with a built-in gripper.
- the removal system 1 may be provided with a plurality of foreign matter removing devices 5, and may be appropriately used, such as one for removing relatively large foreign matter and one for removing relatively small foreign matter.
- the surface state storage unit 21 stores the surface state of the close contact surface of the members constituting the jig of the machine tool 6 in a state where no foreign matter is attached. Specifically, the result of detecting the surface state of the contact surface by the surface sensor 4 is stored when the jig is newly used or immediately after the inspection is completed. When the surface sensor 4 is a camera, the surface state storage unit 21 stores an image in a state where no foreign matter is attached.
- the surface state storage unit 21 operates the robot arm 3 so that the two-dimensional laser displacement meter can measure the entire contact surface, and measures the foreign matter.
- a contour diagram image of the surface state of the contact surface in the non-adhered state is stored.
- the numerical data measured by the two-dimensional laser displacement meter may be stored.
- the surface state storage unit 21 stores a two-dimensional contour diagram as an image or stores numerical data.
- the foreign matter detecting unit 22 adheres based on the comparison between the surface state of the contact surface of the member constituting the jig of the machine tool 6 detected by the surface sensor 4 and the surface state stored in the surface state storage unit 21. Detects foreign matter adhering to the surface. Specifically, the foreign matter detecting unit 22 uses the surface state image stored in the surface state storage unit 21 as a background image, the surface state image detected by the surface sensor 4 as a foreground image, and removes foreign matter by background subtraction. To detect.
- the foreign matter detecting unit 22 detects foreign matter adhering to the close contact surface based on the difference between the image captured by the camera and the image stored in the surface state storage unit 21. To do. Further, when the surface sensor 4 is a two-dimensional laser displacement meter, the foreign matter detection unit 22 operates the robot arm 3 so that the two-dimensional laser displacement meter can measure the entire contact surface, and measures the measurement result. A foreign substance adhering to the contact surface is detected based on the difference between the contour-figured image and the image stored in the surface state storage unit 21.
- the operation instruction unit 23 sends an operation instruction to the robot arm 3 and the foreign matter removing device 5.
- the operation instruction sent by the operation instruction unit 23 to the robot arm 3 includes position information indicating the position of the foreign matter detected by the foreign matter detection unit 22, and the robot arm 3 causes the foreign matter removing device 5 to use the foreign matter removal device 5 based on the position information. It is a movement instruction to move to the vicinity.
- the operation instruction sent by the operation instruction unit 23 to the foreign matter removing device 5 is a driving instruction for driving the foreign matter removing device 5. For example, if the foreign matter removing device 5 is composed of a rotating brush, its rotation thereof. It is for driving the brush.
- the operation instruction unit 23 may communicate with the machine tool 6 to interlock with the machine tool 6, but at least the machine tool 6 is in an operating state of cutting or is stopped. It is desirable to be able to confirm whether it is in a state.
- the operation instruction to the foreign matter removing device 5 may be notified from the operation instruction unit 23 to the foreign matter removing device 5 via the robot arm 3 on which the foreign matter removing device 5 is mounted.
- the operation instruction unit 23 selects one of the plurality of foreign matter removing devices 5 based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit 22. , Sends a mounting instruction to the robot arm 3 instructing the mounting of the selected foreign matter removing device.
- the selection based on the position of the foreign matter is performed, for example, when serrations are formed on the contact surface, and when a foreign matter suitable for removing the foreign matter from the serrations is used.
- the operation instruction unit 23 sends an operation instruction for detecting the surface state of the contact surface to the robot arm 3.
- the close contact surface is both a surface where the member constituting the jig and the member are in contact with each other and a surface where the member and the work are in contact with each other.
- the jig include a chuck, an NC rotary table, a vise, a stationary chuck, a pallet jig, and the like.
- the contact surface will be described by taking the chuck as an example. Although the description other than the chuck is omitted, jigs other than the chuck are also subject to the removal system 1 for removing foreign matter.
- FIG. 2 is a perspective view showing the appearance of the chuck.
- the chuck 7 includes a body 71, a master jaw 72, and a top jaw 73.
- Each of the body 71, the master jaw 72, and the top jaw 73 corresponds to a member constituting the jig.
- FIG. 3 is a perspective view showing the appearance of the master jaw 72.
- FIG. 4 is a perspective view showing the appearance of the top jaw 73.
- the master jaw 72 has serrations 721 and grooves 722.
- the top jaw 73 has serrations 731.
- both the serration 721 and the serration 731 are in close contact with each other, and when the top jaw 73 is attached to the master jaw 72, the serration 721 has a peak portion and the serration 731 has a valley portion so as to mesh with each other.
- the groove 722 is also a close contact surface.
- the groove 722 is a portion into which a T-nut, which is a member (not shown), can be inserted, and is an inverted T-shaped groove.
- a locator (not shown) is attached to position the work.
- the surface in contact between the locator and the work is also a close contact surface, and the surface in contact with the top jaw 73 and the work is also a close contact surface.
- FIG. 5 is a diagram showing an example of an image of the surface state of the close contact surface in a state where no foreign matter is attached.
- FIG. 6 is a diagram showing an example of an image of the surface state of the contact surface when detecting a foreign substance.
- Both the image shown in FIG. 5 and the image shown in FIG. 6 correspond to images of serrations 721 taken from the front when the surface sensor 4 is a camera. Further, when the surface sensor 4 is a two-dimensional laser displacement meter, it corresponds to a contour diagram when the serration 731 is measured from the front.
- the contour diagram is, for example, created by the foreign matter detection unit 22, and for each resolution measured by the two-dimensional laser displacement meter, pixels showing gradations according to the measured distance are generated, and a set of the pixels is generated. It is an image.
- the foreign matter detecting unit 22 extracts background subtraction using the image shown in FIG. 5 as a background image and the image shown in FIG. 6 as a foreground image. At this time, appropriate image processing and the like are performed on each image, but description of these details will be omitted.
- FIG. 7 is a diagram showing an example of an image showing the difference between the image shown in FIG. 5 and the image shown in FIG.
- the image shown in the figure is a binarization of the difference between the image shown in FIG. 5 and the image shown in FIG. 6 based on a predetermined threshold value, and shows a foreign substance such as chips. It is preferable to appropriately adjust such a threshold value according to the dynamic range and the like of the surface sensor 4 to be used. Further, the threshold value may be adjusted so as not to detect water droplets of cutting water but to detect chips. If necessary, the algorithm may be devised so as to use information on the color and shape of the foreign matter.
- FIG. 8 is an activity diagram showing an operation flow of the removal system 1.
- the surface sensor 4 is mounted on the outer peripheral surface near the tip of the robot arm 3.
- the robot arm 3 When the removal system 1 needs to replace the members constituting the jig, the robot arm 3 first removes the target member (A101).
- the robot arm 3 moves the surface sensor 4 to the vicinity of the contact surface of the member removed in A101, and the surface sensor 4 detects the surface state of the contact surface (A102).
- the foreign matter detection unit 22 extracts background subtraction based on the image stored in the surface state storage unit 21 and the image detected by the surface sensor 4 (A103).
- the robot arm 3 attaches the member to be replaced (A104).
- the robot arm 3 attaches a foreign matter removing device 5 to its tip (A105).
- the robot arm 3 moves the foreign matter removing device 5 to the vicinity of the contact surface of the member removed in A101 to try to remove the foreign matter (A106).
- the robot arm 3 moves the surface sensor 4 to the vicinity of the contact surface of the member removed in A101, and the surface sensor 4 detects the surface state of the contact surface (A107).
- the foreign matter detection unit 22 extracts background subtraction based on the image stored in the surface state storage unit 21 and the image detected by the surface sensor 4 (A108).
- the robot arm 3 removes the foreign matter removing device 5 (A109) and attaches the member to be replaced (A104).
- the foreign matter removing device 5 is moved to the vicinity of the contact surface of the member removed by A101 again. And try to remove the foreign matter (A106).
- the foreign matter of A106 is removed by a predetermined number of trials, and if the foreign matter cannot be removed during that period, the removal system 1 stops the operation and issues a warning or the like.
- the surface sensor is a camera
- the surface state storage unit stores an image of the close contact surface in a state where no foreign matter is attached
- the foreign matter detection unit is an image captured by the camera.
- a removal system that detects foreign matter adhering to the close contact surface based on the difference between the image and the image stored in the surface state storage unit.
- the surface sensor is a displacement meter
- the surface state storage unit stores a contoured image of the surface state of the contact surface in a state where no foreign matter is attached, which is measured by the displacement meter.
- the foreign matter detecting unit detects the foreign matter adhering to the close contact surface based on the difference between the contour diagram of the measurement result by the displacement meter and the image stored in the surface state storage unit.
- Removal system In the removal system, the foreign matter removing device is attached to a robot arm that performs a predetermined operation on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm.
- a removal system configured to be able to send movement instructions based on location information indicating.
- the surface sensor is a removal system mounted on the robot arm.
- the removal system includes a plurality of the foreign matter removing devices, and the operation indicating unit selects one of the foreign matter removing devices based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit.
- a removal system that sends a mounting instruction to the robot arm to instruct mounting of the selected foreign matter removing device.
- a control device for a foreign matter removing device for removing foreign matter adhering to a machine tool which includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit, and the surface state storage unit is a jig of the machine tool.
- the surface state of the contact surface detected by the surface sensor in a state where no foreign matter adheres to the contact surface that is in close contact with at least one of the member constituting the jig and the work gripped by the jig.
- the foreign matter detection unit adheres to the contact surface based on the comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit.
- a control device configured to be able to detect a foreign matter
- the operation indicating unit is configured to be able to send an operation instruction to the foreign matter removing device when the foreign matter detecting unit detects a foreign matter.
- the foreign matter removing device is attached to a robot arm that performs a predetermined work on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm.
- a control device configured to be able to send a movement instruction based on the position information indicating.
- the surface sensor is a control device mounted on the robot arm. Of course, this is not the case.
- Removal system 2 Control device 21: Surface state storage unit 22: Foreign matter detection unit 23: Operation instruction unit 3: Robot arm 4: Surface sensor 5: Foreign matter removal device 6: Machine tool
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- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Human Computer Interaction (AREA)
- Robotics (AREA)
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- Machine Tool Sensing Apparatuses (AREA)
- Auxiliary Devices For Machine Tools (AREA)
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Abstract
[Problem] To provide a removal system and a control device that can remove foreign matter adhering to a close-contact surface of a jig. [Solution] According to one aspect of the present invention, provided is a removal system for removing foreign matter adhering to a machine tool, the removal system comprising a surface sensor, a foreign matter removal device, and a control device. The surface sensor is configured to be able to detect a surface state of a close-contact surface in the surface of a jig of the machine tool. Here, the close-contact surface is at least one of a surface interposed between members constituting the jig and a surface that contacts a workpiece grasped by the jig. The foreign matter removal device is configured to be able to remove foreign matter from the close-contact surface, and the control device is provided with a surface state storage unit, a foreign matter detection unit, and an operation instruction unit. The surface state storage unit stores a surface state of the close-contact surface being in a state in which foreign matter does not adhere. The foreign matter detection unit is configured to be able to detect foreign matter adhering to the close-contact surface on the basis of a comparison between a surface state of the close-contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. The operation instruction unit is configured to be able to send an operation instruction to the foreign matter removal device when the foreign matter detection unit detects foreign matter.
Description
この発明は、除去システム及び制御装置に関する。
The present invention relates to a removal system and a control device.
旋盤やマシニングセンタ等の工作機械においては、ワークを把持する把握面等に切粉が付着していたり、チャックや工具に切粉が絡んでいたりすると、正常な動作ができない場合がある。
In machine tools such as lathes and machining centers, normal operation may not be possible if chips are attached to the gripping surface that grips the work, or if chips are entangled in the chuck or tool.
このため、切粉が所定の空間に入り込むことを防止する技術(例えば、特許文献1参照)や、付着した切粉を除去する技術(例えば、特許文献2参照)が提案されている。
Therefore, a technique for preventing chips from entering a predetermined space (see, for example, Patent Document 1) and a technique for removing attached chips (see, for example, Patent Document 2) have been proposed.
ところで、工作機械の治具、例えば、チャック、NC円テーブル、バイス、ステーショナリチャック、パレット治具等においても、これらを構成する部材間の密着面に切粉等の異物が付着していると、ワークの把持不良が生じる場合もあり、ワークの加工精度が低下する。同様に、ワークを把持する際のワークとの密着面に切粉等の異物が付着している場合にも、ワークの把持不良が生じ、ワークの加工精度が低下する可能性がある。また、異物の付着は、ワーク及び治具自体を損傷させる原因ともなる。
By the way, even in jigs of machine tools, for example, chucks, NC rotary tables, vices, stationary chucks, pallet jigs, etc., if foreign matter such as chips adheres to the contact surface between the members constituting them, Poor gripping of the work may occur, and the machining accuracy of the work is lowered. Similarly, when foreign matter such as chips adheres to the contact surface with the work when gripping the work, the work may be poorly gripped and the machining accuracy of the work may be lowered. In addition, the adhesion of foreign matter may cause damage to the work and the jig itself.
このため、治具の密着面においても異物の除去を行うことは、重要である。
For this reason, it is important to remove foreign matter even on the contact surface of the jig.
しかしながら、特許文献1に記載された技術では、切粉が所定の空間に入り込むことを完全に防止することができない。このため、この技術を利用した場合には、治具を構成する部材を取り付け又は交換する際やワークを把持する際に、これらが密着される密着面となる面に異物が付着する可能性がある。
However, the technique described in Patent Document 1 cannot completely prevent chips from entering a predetermined space. For this reason, when this technique is used, there is a possibility that foreign matter may adhere to the surface that becomes the close contact surface to which the members are attached or replaced or the work is gripped. is there.
また、特許文献2に記載された技術では、切粉を切粉除去ハンドで掴んで取り除くため、小さな異物を取り除くことが困難である。
Further, in the technique described in Patent Document 2, it is difficult to remove small foreign substances because the chips are grasped and removed by the chip removing hand.
さらに、特許文献2に記載された技術では、切粉によるセンサの物理的な押し込みにより、切粉を検出しているため、小さな異物を検出することは困難であり、例えば、治具の密着面にセレーションが形成されている場合等には、その谷部にある異物の検出することは不可能に近い。
Further, in the technique described in Patent Document 2, since chips are detected by physically pushing the sensor with chips, it is difficult to detect small foreign substances. For example, the contact surface of the jig. When serrations are formed in the valley, it is almost impossible to detect foreign matter in the valley.
本発明では上記事情を鑑み、治具の密着面に付着した異物を除去することのできる除去システム及び制御装置を提供することとした。
In view of the above circumstances, the present invention has decided to provide a removal system and a control device capable of removing foreign matter adhering to the contact surface of the jig.
本発明の一態様によれば、工作機械に付着した異物を除去する除去システムであって、表面センサと、異物除去装置と、制御装置とを備え、前記表面センサは、前記工作機械の治具の表面のうち密着面の表面状態を検出可能に構成され、ここで、前記密着面は、前記治具を構成する部材間となる面と、前記治具が把持するワークと接する面との少なくとも一方であり、前記異物除去装置は、前記密着面から異物を除去可能に構成され、前記制御装置は、表面状態記憶部と、異物検出部と、動作指示部とを備え、前記表面状態記憶部は、異物が付着していない状態の前記密着面の表面状態を記憶し、前記異物検出部は、前記表面センサが検出した前記密着面の表面状態と、前記表面状態記憶部に記憶されている表面状態との比較に基づいて、前記密着面に付着している異物を検出可能に構成され、前記動作指示部は、前記異物検出部が異物を検出した場合に、前記異物除去装置に対して動作指示を送出可能に構成される除去システムが提供される。
According to one aspect of the present invention, the removal system for removing foreign matter adhering to a machine tool includes a surface sensor, a foreign matter removing device, and a control device, and the surface sensor is a jig of the machine tool. The surface state of the close contact surface is detectable, and the close contact surface is at least a surface between members constituting the jig and a surface in contact with the work gripped by the jig. On the other hand, the foreign matter removing device is configured to be able to remove foreign matter from the close contact surface, and the control device includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit, and the surface state storage unit. Stores the surface state of the contact surface in a state where no foreign matter is attached, and the foreign matter detection unit stores the surface state of the contact surface detected by the surface sensor and the surface state storage unit. Based on the comparison with the surface state, the foreign matter adhering to the close contact surface can be detected, and the operation instructing unit refers to the foreign matter removing device when the foreign matter detecting unit detects the foreign matter. A removal system configured to be able to send operation instructions is provided.
本発明の一態様によれば、表面センサが検出した密着面の表面状態と、表面状態記憶部に記憶されている表面状態との比較に基づいて、密着面に付着している異物を検出する。これにより、比較的小さな切粉等の異物の検出が可能となるとともに、密着面に刻印や傷があった場合でも、異物の検出が可能となる。
According to one aspect of the present invention, foreign matter adhering to the contact surface is detected based on the comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. .. As a result, it is possible to detect foreign matter such as relatively small chips, and it is possible to detect foreign matter even if there are markings or scratches on the contact surface.
以下、図面を用いて本発明の実施形態について説明する。以下に示す実施形態中で示した各種特徴事項は、互いに組み合わせ可能である。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. The various features shown in the embodiments shown below can be combined with each other.
ところで、本実施形態に登場するソフトウェアを実現するためのプログラムは、コンピュータが読み取り可能な非一時的な記録媒体として提供されてもよいし、外部のサーバからダウンロード可能に提供されてもよいし、外部のコンピュータで当該プログラムを起動させてクライアント端末でその機能を実現(いわゆるクラウドコンピューティング)するように提供されてもよい。
By the way, the program for realizing the software appearing in the present embodiment may be provided as a non-temporary recording medium readable by a computer, may be provided as a downloadable form from an external server, or may be provided. It may be provided so that the program is started by an external computer and the function is realized by the client terminal (so-called cloud computing).
また、本実施形態において「部」とは、例えば、広義の回路によって実施されるハードウェア資源と、これらのハードウェア資源によって具体的に実現されうるソフトウェアの情報処理とを合わせたものも含みうる。また、本実施形態においては様々な情報を取り扱うが、これら情報は、例えば電圧・電流を表す信号値の物理的な値、0又は1で構成される2進数のビット集合体としての信号値の高低、又は量子的な重ね合わせ(いわゆる量子ビット)によって表され、広義の回路上で通信・演算が実行されうる。
Further, in the present embodiment, the "part" may include, for example, a combination of hardware resources implemented by a circuit in a broad sense and information processing of software that can be concretely realized by these hardware resources. .. In addition, various information is handled in this embodiment, and these information are, for example, physical values of signal values representing voltage and current, and signal values as a bit aggregate of a binary number composed of 0 or 1. It is represented by high-low or quantum superposition (so-called qubit), and communication / calculation can be executed on a circuit in a broad sense.
また、広義の回路とは、回路(Circuit)、回路類(Circuitry)、プロセッサ(Processor)、及びメモリ(Memory)等を少なくとも適当に組み合わせることによって実現される回路である。すなわち、特定用途向け集積回路(Application Specific Integrated Circuit:ASIC)、プログラマブル論理デバイス(例えば、単純プログラマブル論理デバイス(Simple Programmable Logic Device:SPLD)、複合プログラマブル論理デバイス(Complex Programmable Logic Device:CPLD)、及びフィールドプログラマブルゲートアレイ(Field Programmable Gate Array:FPGA))等を含むものである。
Further, a circuit in a broad sense is a circuit realized by at least appropriately combining a circuit (Circuit), circuits (Circuitry), a processor (Processor), a memory (Memory), and the like. That is, an integrated circuit for a specific application (Application Special Integrated Circuit: ASIC), a programmable logic device (for example, a simple programmable logic device (Simple Programmable Logical Device: SPLD), a composite programmable logic device (Complex Program), a compound Program It includes a programmable gate array (Field Programmable Gate Array: FPGA) and the like.
1.構成例
まず、除去システムの構成について説明する。図1は、除去システム1の機能的な構成を示すブロック図である。 1. 1. Configuration Example First, the configuration of the removal system will be described. FIG. 1 is a block diagram showing a functional configuration of theremoval system 1.
まず、除去システムの構成について説明する。図1は、除去システム1の機能的な構成を示すブロック図である。 1. 1. Configuration Example First, the configuration of the removal system will be described. FIG. 1 is a block diagram showing a functional configuration of the
同図に示すように、除去システム1は、制御装置2、ロボットアーム3、表面センサ4及び異物除去装置5を含むように構成され、工作機械6に付着した異物を除去するシステムである。
As shown in the figure, the removal system 1 is configured to include a control device 2, a robot arm 3, a surface sensor 4, and a foreign matter removing device 5, and is a system for removing foreign matter adhering to the machine tool 6.
制御装置2は、ロボットアーム3と、表面センサ4と、異物除去装置5とを制御するもので、表面状態記憶部21、異物検出部22及び動作指示部23を備える。
The control device 2 controls the robot arm 3, the surface sensor 4, and the foreign matter removing device 5, and includes a surface state storage unit 21, a foreign matter detecting unit 22, and an operation indicating unit 23.
ロボットアーム3は、工作機械6に対して様々な作業を行うことができるロボットであり、その先端にエンドエフェクタが脱着可能なものであるとともに、その先端近傍の外周等に、表面センサ4や異物除去装置5を装着可能とするものである。また、除去システム1は、ロボットアーム3を複数台備えるようにして、表面センサ4を装着したロボットアーム3と、異物除去装置5を装着したロボットアーム3との両者を用いるようにしてもよい。なお、表面センサ4と異物除去装置5は、エンドエフェクタとしてロボットアーム3に脱着可能にするようにしてもよい。
The robot arm 3 is a robot capable of performing various operations on the machine tool 6, and an end effector can be attached to and detached from the tip of the robot arm 3, and a surface sensor 4 and foreign matter can be placed on the outer periphery near the tip of the robot arm 3. The removal device 5 can be attached. Further, the removal system 1 may include a plurality of robot arms 3 and use both the robot arm 3 equipped with the surface sensor 4 and the robot arm 3 equipped with the foreign matter removing device 5. The surface sensor 4 and the foreign matter removing device 5 may be attached to and detached from the robot arm 3 as end effectors.
表面センサ4は、工作機械6の治具を構成する部材の密着面の表面状態を検出可能に構成される。具体的には、表面センサ4は、カメラ、変位計等により実現される。変位計は、非接触式のものであれば、光学式、渦電流式、超音波式、レーザ式等の様々なものを用いることが可能であるが、例えば、二次元レーザ変位計又は三次元レーザ変位計を用いることができる。また、表面センサ4は、工作機械6の治具を構成する部材の密着面の表面状態を検出可能であれば、ロボットアーム3の先端又は外周に配設されてもよく、工作機械6の加工エリア内に配設されてもよい。この加工エリア内に表面センサ4を配設する場合には、表面センサ4を複数用いてもよい。なお、治具と、その密着面については後述する。
The surface sensor 4 is configured to be able to detect the surface state of the contact surface of the members constituting the jig of the machine tool 6. Specifically, the surface sensor 4 is realized by a camera, a displacement meter, or the like. As the displacement meter, various types such as optical type, eddy current type, ultrasonic type, and laser type can be used as long as they are non-contact type. For example, a two-dimensional laser displacement meter or a three-dimensional displacement meter can be used. A laser displacement meter can be used. Further, the surface sensor 4 may be arranged at the tip or the outer circumference of the robot arm 3 as long as it can detect the surface state of the contact surface of the member constituting the jig of the machine tool 6, and the processing of the machine tool 6 may be performed. It may be arranged in the area. When arranging the surface sensors 4 in this processing area, a plurality of surface sensors 4 may be used. The jig and its contact surface will be described later.
異物除去装置5は、工作機械6の治具を構成する部材の密着面から異物を除去するもので、回転ブラシや刷毛、グリッパ、エアブロー、液体噴出器、吸引器等を有するものである。これらは、単体でも適宜組み合わされたものでもよい。また、グリッパ内蔵エアブロー等、組み合わせを一体化したものを利用することもできる。
The foreign matter removing device 5 removes foreign matter from the close contact surface of the members constituting the jig of the machine tool 6, and has a rotating brush, a brush, a gripper, an air blow, a liquid ejector, an aspirator, and the like. These may be simple substances or a combination thereof as appropriate. It is also possible to use an integrated combination such as an air blow with a built-in gripper.
また、除去システム1は、異物除去装置5を複数備えるようにしてもよく、比較的大きな異物を除去するものと、比較的小さな異物を除去するものなど、適宜使い分けをするようにしてもよい。
Further, the removal system 1 may be provided with a plurality of foreign matter removing devices 5, and may be appropriately used, such as one for removing relatively large foreign matter and one for removing relatively small foreign matter.
表面状態記憶部21は、異物が付着していない状態の工作機械6の治具を構成する部材の密着面の表面状態を記憶する。具体的には、治具を新たに利用する場合や点検を終えた直後等に、その密着面の表面状態を表面センサ4で検出した結果を記憶する。表面センサ4がカメラである場合には、表面状態記憶部21は、異物が付着していない状態の画像を記憶する。
The surface state storage unit 21 stores the surface state of the close contact surface of the members constituting the jig of the machine tool 6 in a state where no foreign matter is attached. Specifically, the result of detecting the surface state of the contact surface by the surface sensor 4 is stored when the jig is newly used or immediately after the inspection is completed. When the surface sensor 4 is a camera, the surface state storage unit 21 stores an image in a state where no foreign matter is attached.
また、表面センサ4が二次元レーザ変位計である場合には、表面状態記憶部21は、二次元レーザ変位計が密着面の全体を計測できるようにロボットアーム3を動作させて計測した異物が付着していない状態の密着面の表面状態をコンター図化した画像を記憶する。なお、コンター図化した画像に代えて、二次元レーザ変位計により計測した数値データを記憶するようにしてもよい。
Further, when the surface sensor 4 is a two-dimensional laser displacement meter, the surface state storage unit 21 operates the robot arm 3 so that the two-dimensional laser displacement meter can measure the entire contact surface, and measures the foreign matter. A contour diagram image of the surface state of the contact surface in the non-adhered state is stored. In addition, instead of the contour diagram image, the numerical data measured by the two-dimensional laser displacement meter may be stored.
表面センサ4が三次元レーザスキャナである場合には、表面状態記憶部21は、二次元化したコンター図を画像として記憶したり、数値データを記憶したりする。
When the surface sensor 4 is a three-dimensional laser scanner, the surface state storage unit 21 stores a two-dimensional contour diagram as an image or stores numerical data.
異物検出部22は、表面センサ4が検出した工作機械6の治具を構成する部材の密着面の表面状態と、表面状態記憶部21に記憶されている表面状態との比較に基づいて、密着面に付着している異物を検出する。具体的には、異物検出部22は、表面状態記憶部21に記憶されている表面状態の画像を背景画像とし、表面センサ4が検出した表面状態の画像を前景画像として、背景差分により異物を検出する。
The foreign matter detecting unit 22 adheres based on the comparison between the surface state of the contact surface of the member constituting the jig of the machine tool 6 detected by the surface sensor 4 and the surface state stored in the surface state storage unit 21. Detects foreign matter adhering to the surface. Specifically, the foreign matter detecting unit 22 uses the surface state image stored in the surface state storage unit 21 as a background image, the surface state image detected by the surface sensor 4 as a foreground image, and removes foreign matter by background subtraction. To detect.
異物検出部22は、表面センサ4がカメラである場合には、カメラが撮像した画像と表面状態記憶部21に記憶されている画像との差分に基づいて密着面に付着している異物を検出する。また、異物検出部22は、表面センサ4が二次元レーザ変位計である場合には、二次元レーザ変位計が密着面の全体を計測できるようにロボットアーム3を動作させて計測した計測結果をコンター図化した画像と表面状態記憶部21に記憶されている画像との差分に基づいて密着面に付着している異物を検出する。
When the surface sensor 4 is a camera, the foreign matter detecting unit 22 detects foreign matter adhering to the close contact surface based on the difference between the image captured by the camera and the image stored in the surface state storage unit 21. To do. Further, when the surface sensor 4 is a two-dimensional laser displacement meter, the foreign matter detection unit 22 operates the robot arm 3 so that the two-dimensional laser displacement meter can measure the entire contact surface, and measures the measurement result. A foreign substance adhering to the contact surface is detected based on the difference between the contour-figured image and the image stored in the surface state storage unit 21.
動作指示部23は、異物検出部22が異物を検出した場合に、ロボットアーム3と異物除去装置5に動作指示を送出する。動作指示部23がロボットアーム3に送出する動作指示は、異物検出部22が検出した異物の位置を示す位置情報を含むもので、ロボットアーム3により異物除去装置5を位置情報に基づいて異物の近傍に移動させるための移動指示である。動作指示部23が異物除去装置5に送出する動作指示は、異物除去装置5を駆動させるための駆動指示であり、例えば、異物除去装置5が回転ブラシで構成されるものであれば、その回転ブラシを駆動させるためのものである。
When the foreign matter detecting unit 22 detects a foreign matter, the operation instruction unit 23 sends an operation instruction to the robot arm 3 and the foreign matter removing device 5. The operation instruction sent by the operation instruction unit 23 to the robot arm 3 includes position information indicating the position of the foreign matter detected by the foreign matter detection unit 22, and the robot arm 3 causes the foreign matter removing device 5 to use the foreign matter removal device 5 based on the position information. It is a movement instruction to move to the vicinity. The operation instruction sent by the operation instruction unit 23 to the foreign matter removing device 5 is a driving instruction for driving the foreign matter removing device 5. For example, if the foreign matter removing device 5 is composed of a rotating brush, its rotation thereof. It is for driving the brush.
なお、動作指示部23は、工作機械6と通信を行って工作機械6と連動するようにしてもよいが、少なくとも、工作機械6が切削等を行っている稼働状態であるか停止している状態かを確認できるようにすることが望ましい。
The operation instruction unit 23 may communicate with the machine tool 6 to interlock with the machine tool 6, but at least the machine tool 6 is in an operating state of cutting or is stopped. It is desirable to be able to confirm whether it is in a state.
なお、異物除去装置5への動作指示は、異物除去装置5が装着されているロボットアーム3を介して、動作指示部23から異物除去装置5へ通達されるようにしてもよい。
The operation instruction to the foreign matter removing device 5 may be notified from the operation instruction unit 23 to the foreign matter removing device 5 via the robot arm 3 on which the foreign matter removing device 5 is mounted.
また、異物除去装置5を複数用いる場合には、動作指示部23は、異物検出部22が検出した異物の位置と大きさとの少なくとも一方に基づいて複数の異物除去装置5のいずれかを選択し、選択した異物除去装置の装着を指示する装着指示をロボットアーム3に送出する。異物の位置による選択は、例えば、密着面にセレーションが形成されている場合に、セレーションからの異物の除去に適したものを利用する場合等に行われる。
When a plurality of foreign matter removing devices 5 are used, the operation instruction unit 23 selects one of the plurality of foreign matter removing devices 5 based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit 22. , Sends a mounting instruction to the robot arm 3 instructing the mounting of the selected foreign matter removing device. The selection based on the position of the foreign matter is performed, for example, when serrations are formed on the contact surface, and when a foreign matter suitable for removing the foreign matter from the serrations is used.
さらに、動作指示部23は、表面センサ4がロボットアーム3に装着されている場合には、ロボットアーム3に対して密着面の表面状態を検出する動作指示を送出する。
Further, when the surface sensor 4 is attached to the robot arm 3, the operation instruction unit 23 sends an operation instruction for detecting the surface state of the contact surface to the robot arm 3.
2.密着面
次に、除去システム1が異物を除去する対象となる密着面について説明する。密着面は、治具を構成する部材と部材とが接する面と、部材とワークとが接する面との両者である。治具としては、例えば、チャック、NC円テーブル、バイス、ステーショナリチャック、パレット治具等があるが、ここでは、チャックを例として密着面について説明する。なお、チャック以外の説明は省略するが、チャック以外の治具も、除去システム1が異物を除去する対象となる。 2. 2. Adhesion surface Next, the adhesion surface to which theremoval system 1 removes foreign matter will be described. The close contact surface is both a surface where the member constituting the jig and the member are in contact with each other and a surface where the member and the work are in contact with each other. Examples of the jig include a chuck, an NC rotary table, a vise, a stationary chuck, a pallet jig, and the like. Here, the contact surface will be described by taking the chuck as an example. Although the description other than the chuck is omitted, jigs other than the chuck are also subject to the removal system 1 for removing foreign matter.
次に、除去システム1が異物を除去する対象となる密着面について説明する。密着面は、治具を構成する部材と部材とが接する面と、部材とワークとが接する面との両者である。治具としては、例えば、チャック、NC円テーブル、バイス、ステーショナリチャック、パレット治具等があるが、ここでは、チャックを例として密着面について説明する。なお、チャック以外の説明は省略するが、チャック以外の治具も、除去システム1が異物を除去する対象となる。 2. 2. Adhesion surface Next, the adhesion surface to which the
図2は、チャックの外観を示す斜視図である。同図に示すように、チャック7は、ボデー71と、マスタージョー72と、トップジョー73とを含んで構成される。これらボデー71、マスタージョー72、トップジョー73のいずれもが治具を構成する部材に相当する。
FIG. 2 is a perspective view showing the appearance of the chuck. As shown in the figure, the chuck 7 includes a body 71, a master jaw 72, and a top jaw 73. Each of the body 71, the master jaw 72, and the top jaw 73 corresponds to a member constituting the jig.
続いて、密着面について説明する。図3は、マスタージョー72の外観を示す斜視図である。また、図4は、トップジョー73の外観を示す斜視図である。図3に示すように、マスタージョー72は、セレーション721と溝722を有している。また、図4に示すように、トップジョー73は、セレーション731を有している。
Next, the contact surface will be explained. FIG. 3 is a perspective view showing the appearance of the master jaw 72. Further, FIG. 4 is a perspective view showing the appearance of the top jaw 73. As shown in FIG. 3, the master jaw 72 has serrations 721 and grooves 722. Further, as shown in FIG. 4, the top jaw 73 has serrations 731.
セレーション721とセレーション731は、いずれも密着面であり、マスタージョー72にトップジョー73を取り付ける際には、セレーション721の山部分とセレーション731の谷部分が互いに噛み合うように、取り付けられる。
Both the serration 721 and the serration 731 are in close contact with each other, and when the top jaw 73 is attached to the master jaw 72, the serration 721 has a peak portion and the serration 731 has a valley portion so as to mesh with each other.
また、溝722も密着面である。溝722は、図示しない部材であるTナットが挿入可能な部位で、逆T字形状の溝である。
The groove 722 is also a close contact surface. The groove 722 is a portion into which a T-nut, which is a member (not shown), can be inserted, and is an inverted T-shaped groove.
また、トップジョー73でワークを把握する場合、ワークの位置決めを行うために、図示しないロケータが取り付けられる。このロケータとワークが接する面も密着面であり、トップジョー73とワークが接する面も密着面である。
Also, when grasping the work with the top jaw 73, a locator (not shown) is attached to position the work. The surface in contact between the locator and the work is also a close contact surface, and the surface in contact with the top jaw 73 and the work is also a close contact surface.
3.画像
次に、表面センサ4が検出する表面状態の画像について説明する。図5は、異物が付着していない状態の密着面の表面状態の画像の例を示した図である。また、図6は、異物の検出を行う際の密着面の表面状態の画像の例を示した図である。 3. 3. Image Next, an image of the surface state detected by the surface sensor 4 will be described. FIG. 5 is a diagram showing an example of an image of the surface state of the close contact surface in a state where no foreign matter is attached. Further, FIG. 6 is a diagram showing an example of an image of the surface state of the contact surface when detecting a foreign substance.
次に、表面センサ4が検出する表面状態の画像について説明する。図5は、異物が付着していない状態の密着面の表面状態の画像の例を示した図である。また、図6は、異物の検出を行う際の密着面の表面状態の画像の例を示した図である。 3. 3. Image Next, an image of the surface state detected by the surface sensor 4 will be described. FIG. 5 is a diagram showing an example of an image of the surface state of the close contact surface in a state where no foreign matter is attached. Further, FIG. 6 is a diagram showing an example of an image of the surface state of the contact surface when detecting a foreign substance.
図5に示した画像と図6に示した画像は、いずれも、表面センサ4がカメラである場合には、セレーション721を正面から撮像したものに相当する。また、表面センサ4が二次元レーザ変位計である場合には、セレーション731を正面から計測した場合のコンター図に相当する。
Both the image shown in FIG. 5 and the image shown in FIG. 6 correspond to images of serrations 721 taken from the front when the surface sensor 4 is a camera. Further, when the surface sensor 4 is a two-dimensional laser displacement meter, it corresponds to a contour diagram when the serration 731 is measured from the front.
コンター図は、例えば、異物検出部22で作成されるもので、二次元レーザ変位計が計測した分解能毎に、その計測した距離に応じた階調を示す画素を生成し、その画素の集合を画像としたものである。
The contour diagram is, for example, created by the foreign matter detection unit 22, and for each resolution measured by the two-dimensional laser displacement meter, pixels showing gradations according to the measured distance are generated, and a set of the pixels is generated. It is an image.
異物検出部22は、図5に示した画像を背景画像とし、図6に示した画像を前景画像として、背景差分を抽出する。このとき、各画像に対して適切な画像処理等を施すが、これらの詳細についての説明は省略する。
The foreign matter detecting unit 22 extracts background subtraction using the image shown in FIG. 5 as a background image and the image shown in FIG. 6 as a foreground image. At this time, appropriate image processing and the like are performed on each image, but description of these details will be omitted.
図7は、図5に示した画像と図6に示した画像の差分を示す画像の例を示した図である。同図に示した画像は、図5に示した画像と図6に示した画像の差分を所定の閾値に基づいて二値化したものであり、切粉等の異物を示すものである。かかる閾値は、使用する表面センサ4のダイナミックレンジ等に合わせて適宜調節することが好ましい。また、かかる閾値を、切削水の水滴は検知しないが切粉は検知するように調節するようにしてもよい。なお、必要に応じて、異物の色や形状の情報を用いるようにアルゴリズムを工夫してもよい。
FIG. 7 is a diagram showing an example of an image showing the difference between the image shown in FIG. 5 and the image shown in FIG. The image shown in the figure is a binarization of the difference between the image shown in FIG. 5 and the image shown in FIG. 6 based on a predetermined threshold value, and shows a foreign substance such as chips. It is preferable to appropriately adjust such a threshold value according to the dynamic range and the like of the surface sensor 4 to be used. Further, the threshold value may be adjusted so as not to detect water droplets of cutting water but to detect chips. If necessary, the algorithm may be devised so as to use information on the color and shape of the foreign matter.
4.動作
次に、除去システム1の動作を説明する。図8は、除去システム1の動作の流れを示すアクティビティ図である。なお、ここでは、表面センサ4は、ロボットアーム3の先端近傍の外周面に装着されているものとする。 4. Operation Next, the operation of theremoval system 1 will be described. FIG. 8 is an activity diagram showing an operation flow of the removal system 1. Here, it is assumed that the surface sensor 4 is mounted on the outer peripheral surface near the tip of the robot arm 3.
次に、除去システム1の動作を説明する。図8は、除去システム1の動作の流れを示すアクティビティ図である。なお、ここでは、表面センサ4は、ロボットアーム3の先端近傍の外周面に装着されているものとする。 4. Operation Next, the operation of the
除去システム1は、治具を構成する部材を交換する必要が生じると、まず、ロボットアーム3が対象となる部材を取り外す(A101)。
When the removal system 1 needs to replace the members constituting the jig, the robot arm 3 first removes the target member (A101).
続いて、ロボットアーム3は、A101で取り外した部材の密着面の近傍に表面センサ4を移動させ、表面センサ4がその密着面の表面状態を検出する(A102)。
Subsequently, the robot arm 3 moves the surface sensor 4 to the vicinity of the contact surface of the member removed in A101, and the surface sensor 4 detects the surface state of the contact surface (A102).
そして、異物検出部22が、表面状態記憶部21に記憶されている画像と表面センサ4が検出した画像とに基づいて背景差分の抽出を行う(A103)。
Then, the foreign matter detection unit 22 extracts background subtraction based on the image stored in the surface state storage unit 21 and the image detected by the surface sensor 4 (A103).
その結果、異物が検出されなければ、ロボットアーム3は、交換対象の部材の取り付けを行う(A104)。
As a result, if no foreign matter is detected, the robot arm 3 attaches the member to be replaced (A104).
一方、異物が検出された場合には、ロボットアーム3は、その先端に異物除去装置5を取り付ける(A105)。
On the other hand, when a foreign matter is detected, the robot arm 3 attaches a foreign matter removing device 5 to its tip (A105).
続いて、ロボットアーム3は、A101で取り外した部材の密着面の近傍に異物除去装置5移動させて異物の除去を試みる(A106)。
Subsequently, the robot arm 3 moves the foreign matter removing device 5 to the vicinity of the contact surface of the member removed in A101 to try to remove the foreign matter (A106).
次に、ロボットアーム3は、A101で取り外した部材の密着面の近傍に表面センサ4を移動させ、表面センサ4がその密着面の表面状態を検出する(A107)。
Next, the robot arm 3 moves the surface sensor 4 to the vicinity of the contact surface of the member removed in A101, and the surface sensor 4 detects the surface state of the contact surface (A107).
そして、異物検出部22が、表面状態記憶部21に記憶されている画像と表面センサ4が検出した画像とに基づいて背景差分の抽出を行う(A108)。
Then, the foreign matter detection unit 22 extracts background subtraction based on the image stored in the surface state storage unit 21 and the image detected by the surface sensor 4 (A108).
その結果、異物が検出されなければ、ロボットアーム3は、異物除去装置5を取り外して(A109)、交換対象の部材の取り付けを行う(A104)。
As a result, if no foreign matter is detected, the robot arm 3 removes the foreign matter removing device 5 (A109) and attaches the member to be replaced (A104).
また、A108の背景差分の抽出の結果、異物が検出された場合には、異物除去の試行が所定回数未満であれば、再度、A101で取り外した部材の密着面の近傍に異物除去装置5移動させて異物の除去を試みる(A106)。
Further, when foreign matter is detected as a result of extracting the background subtraction of A108, if the number of trials for removing foreign matter is less than a predetermined number, the foreign matter removing device 5 is moved to the vicinity of the contact surface of the member removed by A101 again. And try to remove the foreign matter (A106).
A106の異物の除去は、所定回数試行を行い、その間に異物が除去できなければ、除去システム1は、動作を停止して、警告等を発報する。
The foreign matter of A106 is removed by a predetermined number of trials, and if the foreign matter cannot be removed during that period, the removal system 1 stops the operation and issues a warning or the like.
なお、複数の異物除去装置5を用いる場合に、A108の異物除去の試行を複数回繰り返す際には、異物除去の試行毎に異なる異物除去装置5を用いるようにしてもよい。
When using a plurality of foreign matter removing devices 5, when the foreign matter removing trial of A108 is repeated a plurality of times, a different foreign matter removing device 5 may be used for each foreign matter removing trial.
5.その他
最後に、本発明に係る実施形態を説明したが、これらは、例として提示したものであり、発明の範囲を限定することは意図していない。当該新規な実施形態は、その他の様々な形態で実施されることが可能であり、発明の要旨を逸脱しない範囲で、種々の省略、置き換え、変更を行うことができる。当該実施形態やその変形は、発明の範囲や要旨に含まれるとともに、特許請求の範囲に記載された発明とその均等の範囲に含まれるものである。 5. Others Finally, although the embodiments according to the present invention have been described, these are presented as examples and are not intended to limit the scope of the invention. The novel embodiment can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the gist of the invention. The embodiment and its modifications are included in the scope and gist of the invention, and are included in the scope of the invention described in the claims and the equivalent scope thereof.
最後に、本発明に係る実施形態を説明したが、これらは、例として提示したものであり、発明の範囲を限定することは意図していない。当該新規な実施形態は、その他の様々な形態で実施されることが可能であり、発明の要旨を逸脱しない範囲で、種々の省略、置き換え、変更を行うことができる。当該実施形態やその変形は、発明の範囲や要旨に含まれるとともに、特許請求の範囲に記載された発明とその均等の範囲に含まれるものである。 5. Others Finally, although the embodiments according to the present invention have been described, these are presented as examples and are not intended to limit the scope of the invention. The novel embodiment can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the gist of the invention. The embodiment and its modifications are included in the scope and gist of the invention, and are included in the scope of the invention described in the claims and the equivalent scope thereof.
本発明は、次に記載の各態様で提供されてもよい。
前記除去システムにおいて、前記表面センサは、カメラであり、前記表面状態記憶部は、異物が付着していない状態の前記密着面の画像を記憶し、前記異物検出部は、前記カメラが撮像した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する除去システム。
前記除去システムにおいて、前記表面センサは、変位計であり、前記表面状態記憶部は、前記変位計により計測した異物が付着していない状態の前記密着面の表面状態をコンター図化した画像を記憶し、前記異物検出部は、前記変位計による計測結果をコンター図化した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する除去システム。
前記除去システムにおいて、前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される除去システム。
前記除去システムにおいて、前記表面センサは、前記ロボットアームに装着される除去システム。
前記除去システムにおいて、前記異物除去装置を複数備え、前記動作指示部は、前記異物検出部が検出した異物の位置と大きさとの少なくとも一方に基づいて前記異物除去装置のいずれかを選択し、該選択した異物除去装置の装着を指示する装着指示を前記ロボットアームに送出する除去システム。
工作機械に付着した異物を除去する異物除去装置の制御装置であって、表面状態記憶部と、異物検出部と、動作指示部とを備え、前記表面状態記憶部は、前記工作機械の治具の表面のうち、該治具を構成する部材と、該治具が把持するワークとの少なくとも一方と密着する密着面に異物が付着していない状態で表面センサにより検出した前記密着面の表面状態を記憶し、前記異物検出部は、前記表面センサが検出した前記密着面の表面状態と、前記表面状態記憶部に記憶されている表面状態との比較に基づいて、前記密着面に付着している異物を検出可能に構成され、前記動作指示部は、前記異物検出部が異物を検出した場合に、前記異物除去装置に対して動作指示を送出可能に構成される制御装置。
前記制御装置において、前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される制御装置。
前記制御装置において、前記表面センサは、前記ロボットアームに装着される制御装置。
もちろん、この限りではない。 The present invention may be provided in each of the following aspects.
In the removal system, the surface sensor is a camera, the surface state storage unit stores an image of the close contact surface in a state where no foreign matter is attached, and the foreign matter detection unit is an image captured by the camera. A removal system that detects foreign matter adhering to the close contact surface based on the difference between the image and the image stored in the surface state storage unit.
In the removal system, the surface sensor is a displacement meter, and the surface state storage unit stores a contoured image of the surface state of the contact surface in a state where no foreign matter is attached, which is measured by the displacement meter. Then, the foreign matter detecting unit detects the foreign matter adhering to the close contact surface based on the difference between the contour diagram of the measurement result by the displacement meter and the image stored in the surface state storage unit. Removal system.
In the removal system, the foreign matter removing device is attached to a robot arm that performs a predetermined operation on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm. A removal system configured to be able to send movement instructions based on location information indicating.
In the removal system, the surface sensor is a removal system mounted on the robot arm.
The removal system includes a plurality of the foreign matter removing devices, and the operation indicating unit selects one of the foreign matter removing devices based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit. A removal system that sends a mounting instruction to the robot arm to instruct mounting of the selected foreign matter removing device.
A control device for a foreign matter removing device for removing foreign matter adhering to a machine tool, which includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit, and the surface state storage unit is a jig of the machine tool. The surface state of the contact surface detected by the surface sensor in a state where no foreign matter adheres to the contact surface that is in close contact with at least one of the member constituting the jig and the work gripped by the jig. The foreign matter detection unit adheres to the contact surface based on the comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. A control device configured to be able to detect a foreign matter, and the operation indicating unit is configured to be able to send an operation instruction to the foreign matter removing device when the foreign matter detecting unit detects a foreign matter.
In the control device, the foreign matter removing device is attached to a robot arm that performs a predetermined work on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm. A control device configured to be able to send a movement instruction based on the position information indicating.
In the control device, the surface sensor is a control device mounted on the robot arm.
Of course, this is not the case.
前記除去システムにおいて、前記表面センサは、カメラであり、前記表面状態記憶部は、異物が付着していない状態の前記密着面の画像を記憶し、前記異物検出部は、前記カメラが撮像した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する除去システム。
前記除去システムにおいて、前記表面センサは、変位計であり、前記表面状態記憶部は、前記変位計により計測した異物が付着していない状態の前記密着面の表面状態をコンター図化した画像を記憶し、前記異物検出部は、前記変位計による計測結果をコンター図化した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する除去システム。
前記除去システムにおいて、前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される除去システム。
前記除去システムにおいて、前記表面センサは、前記ロボットアームに装着される除去システム。
前記除去システムにおいて、前記異物除去装置を複数備え、前記動作指示部は、前記異物検出部が検出した異物の位置と大きさとの少なくとも一方に基づいて前記異物除去装置のいずれかを選択し、該選択した異物除去装置の装着を指示する装着指示を前記ロボットアームに送出する除去システム。
工作機械に付着した異物を除去する異物除去装置の制御装置であって、表面状態記憶部と、異物検出部と、動作指示部とを備え、前記表面状態記憶部は、前記工作機械の治具の表面のうち、該治具を構成する部材と、該治具が把持するワークとの少なくとも一方と密着する密着面に異物が付着していない状態で表面センサにより検出した前記密着面の表面状態を記憶し、前記異物検出部は、前記表面センサが検出した前記密着面の表面状態と、前記表面状態記憶部に記憶されている表面状態との比較に基づいて、前記密着面に付着している異物を検出可能に構成され、前記動作指示部は、前記異物検出部が異物を検出した場合に、前記異物除去装置に対して動作指示を送出可能に構成される制御装置。
前記制御装置において、前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される制御装置。
前記制御装置において、前記表面センサは、前記ロボットアームに装着される制御装置。
もちろん、この限りではない。 The present invention may be provided in each of the following aspects.
In the removal system, the surface sensor is a camera, the surface state storage unit stores an image of the close contact surface in a state where no foreign matter is attached, and the foreign matter detection unit is an image captured by the camera. A removal system that detects foreign matter adhering to the close contact surface based on the difference between the image and the image stored in the surface state storage unit.
In the removal system, the surface sensor is a displacement meter, and the surface state storage unit stores a contoured image of the surface state of the contact surface in a state where no foreign matter is attached, which is measured by the displacement meter. Then, the foreign matter detecting unit detects the foreign matter adhering to the close contact surface based on the difference between the contour diagram of the measurement result by the displacement meter and the image stored in the surface state storage unit. Removal system.
In the removal system, the foreign matter removing device is attached to a robot arm that performs a predetermined operation on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm. A removal system configured to be able to send movement instructions based on location information indicating.
In the removal system, the surface sensor is a removal system mounted on the robot arm.
The removal system includes a plurality of the foreign matter removing devices, and the operation indicating unit selects one of the foreign matter removing devices based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit. A removal system that sends a mounting instruction to the robot arm to instruct mounting of the selected foreign matter removing device.
A control device for a foreign matter removing device for removing foreign matter adhering to a machine tool, which includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit, and the surface state storage unit is a jig of the machine tool. The surface state of the contact surface detected by the surface sensor in a state where no foreign matter adheres to the contact surface that is in close contact with at least one of the member constituting the jig and the work gripped by the jig. The foreign matter detection unit adheres to the contact surface based on the comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. A control device configured to be able to detect a foreign matter, and the operation indicating unit is configured to be able to send an operation instruction to the foreign matter removing device when the foreign matter detecting unit detects a foreign matter.
In the control device, the foreign matter removing device is attached to a robot arm that performs a predetermined work on the machine tool, and the operation instruction unit is a position of a foreign matter detected by the foreign matter detecting unit with respect to the robot arm. A control device configured to be able to send a movement instruction based on the position information indicating.
In the control device, the surface sensor is a control device mounted on the robot arm.
Of course, this is not the case.
1 :除去システム
2 :制御装置
21 :表面状態記憶部
22 :異物検出部
23 :動作指示部
3 :ロボットアーム
4 :表面センサ
5 :異物除去装置
6 :工作機械 1: Removal system 2: Control device 21: Surface state storage unit 22: Foreign matter detection unit 23: Operation instruction unit 3: Robot arm 4: Surface sensor 5: Foreign matter removal device 6: Machine tool
2 :制御装置
21 :表面状態記憶部
22 :異物検出部
23 :動作指示部
3 :ロボットアーム
4 :表面センサ
5 :異物除去装置
6 :工作機械 1: Removal system 2: Control device 21: Surface state storage unit 22: Foreign matter detection unit 23: Operation instruction unit 3: Robot arm 4: Surface sensor 5: Foreign matter removal device 6: Machine tool
Claims (9)
- 工作機械に付着した異物を除去する除去システムであって、
表面センサと、異物除去装置と、制御装置とを備え、
前記表面センサは、前記工作機械の治具の表面のうち密着面の表面状態を検出可能に構成され、ここで、前記密着面は、前記治具を構成する部材間となる面と、前記治具が把持するワークと接する面との少なくとも一方であり、
前記異物除去装置は、前記密着面から異物を除去可能に構成され、
前記制御装置は、表面状態記憶部と、異物検出部と、動作指示部とを備え、
前記表面状態記憶部は、異物が付着していない状態の前記密着面の表面状態を記憶し、
前記異物検出部は、前記表面センサが検出した前記密着面の表面状態と、前記表面状態記憶部に記憶されている表面状態との比較に基づいて、前記密着面に付着している異物を検出可能に構成され、
前記動作指示部は、前記異物検出部が異物を検出した場合に、前記異物除去装置に対して動作指示を送出可能に構成される
除去システム。 A removal system that removes foreign matter adhering to machine tools.
It is equipped with a surface sensor, a foreign matter removing device, and a control device.
The surface sensor is configured to be able to detect the surface state of the contact surface of the surface of the jig of the machine tool, wherein the contact surface is a surface between members constituting the jig and the surface of the jig. At least one of the workpieces gripped by the tool and the surface in contact with it,
The foreign matter removing device is configured to be able to remove foreign matter from the close contact surface.
The control device includes a surface state storage unit, a foreign matter detection unit, and an operation instruction unit.
The surface state storage unit stores the surface state of the close contact surface in a state where no foreign matter is attached.
The foreign matter detection unit detects foreign matter adhering to the contact surface based on a comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. Configured to be possible
The operation instruction unit is a removal system configured to be able to send an operation instruction to the foreign matter removing device when the foreign matter detecting unit detects a foreign matter. - 請求項1に記載の除去システムにおいて、
前記表面センサは、カメラであり、
前記表面状態記憶部は、異物が付着していない状態の前記密着面の画像を記憶し、
前記異物検出部は、前記カメラが撮像した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する
除去システム。 In the removal system according to claim 1,
The surface sensor is a camera.
The surface state storage unit stores an image of the close contact surface in a state where no foreign matter is attached.
The foreign matter detecting unit is a removal system that detects foreign matter adhering to the close contact surface based on the difference between the image captured by the camera and the image stored in the surface state storage unit. - 請求項1に記載の除去システムにおいて、
前記表面センサは、変位計であり、
前記表面状態記憶部は、前記変位計により計測した異物が付着していない状態の前記密着面の表面状態をコンター図化した画像を記憶し、
前記異物検出部は、前記変位計による計測結果をコンター図化した画像と前記表面状態記憶部に記憶されている画像との差分に基づいて前記密着面に付着している異物を検出する
除去システム。 In the removal system according to claim 1,
The surface sensor is a displacement meter and
The surface state storage unit stores an image obtained by contouring the surface state of the close contact surface in a state where no foreign matter is attached, which is measured by the displacement meter.
The foreign matter detecting unit is a removal system that detects foreign matter adhering to the close contact surface based on the difference between the image obtained by contouring the measurement result by the displacement meter and the image stored in the surface state storage unit. .. - 請求項1乃至請求項3のいずれか1項に記載の除去システムにおいて、
前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、
前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される
除去システム。 In the removal system according to any one of claims 1 to 3.
The foreign matter removing device is attached to a robot arm that performs a predetermined work on the machine tool.
The operation instruction unit is a removal system configured to be able to send a movement instruction based on position information indicating the position of a foreign matter detected by the foreign matter detection unit to the robot arm. - 請求項4に記載の除去システムにおいて、
前記表面センサは、前記ロボットアームに装着される
除去システム。 In the removal system according to claim 4,
The surface sensor is a removal system mounted on the robot arm. - 請求項4又は請求項5に記載の除去システムにおいて、
前記異物除去装置を複数備え、
前記動作指示部は、前記異物検出部が検出した異物の位置と大きさとの少なくとも一方に基づいて前記異物除去装置のいずれかを選択し、該選択した異物除去装置の装着を指示する装着指示を前記ロボットアームに送出する
除去システム。 In the removal system according to claim 4 or 5.
A plurality of the foreign matter removing devices are provided.
The operation instruction unit selects one of the foreign matter removing devices based on at least one of the position and size of the foreign matter detected by the foreign matter detecting unit, and gives a mounting instruction to instruct the mounting of the selected foreign matter removing device. A removal system that delivers to the robot arm. - 工作機械に付着した異物を除去する異物除去装置の制御装置であって、
表面状態記憶部と、異物検出部と、動作指示部とを備え、
前記表面状態記憶部は、前記工作機械の治具の表面のうち、該治具を構成する部材と、該治具が把持するワークとの少なくとも一方と密着する密着面に異物が付着していない状態で表面センサにより検出した前記密着面の表面状態を記憶し、
前記異物検出部は、前記表面センサが検出した前記密着面の表面状態と、前記表面状態記憶部に記憶されている表面状態との比較に基づいて、前記密着面に付着している異物を検出可能に構成され、
前記動作指示部は、前記異物検出部が異物を検出した場合に、前記異物除去装置に対して動作指示を送出可能に構成される
制御装置。 A control device for a foreign matter removing device that removes foreign matter adhering to a machine tool.
It is provided with a surface state storage unit, a foreign matter detection unit, and an operation instruction unit.
In the surface state storage unit, no foreign matter adheres to the surface of the jig of the machine tool, which is in close contact with at least one of the member constituting the jig and the work gripped by the jig. The surface state of the contact surface detected by the surface sensor in the state is memorized and stored.
The foreign matter detection unit detects foreign matter adhering to the contact surface based on a comparison between the surface state of the contact surface detected by the surface sensor and the surface state stored in the surface state storage unit. Configured to be possible
The operation instruction unit is a control device configured to be able to send an operation instruction to the foreign matter removing device when the foreign matter detection unit detects a foreign matter. - 請求項7に記載の制御装置において、
前記異物除去装置は、前記工作機械に対して所定の作業を行うロボットアームに装着され、
前記動作指示部は、前記ロボットアームに対して前記異物検出部が検出した異物の位置を示す位置情報に基づく移動指示を送出可能に構成される
制御装置。 In the control device according to claim 7.
The foreign matter removing device is attached to a robot arm that performs a predetermined work on the machine tool.
The operation instruction unit is a control device configured to be able to send a movement instruction based on position information indicating the position of the foreign matter detected by the foreign matter detection unit to the robot arm. - 請求項7又は請求項8に記載の制御装置において、
前記表面センサは、前記ロボットアームに装着される
制御装置。 In the control device according to claim 7 or 8.
The surface sensor is a control device mounted on the robot arm.
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JPH02106255A (en) * | 1988-10-11 | 1990-04-18 | Matsuura Tekkosho:Kk | Device for detecting workpiece combinedly used for air blow of machine tool |
JPH06297292A (en) * | 1993-04-07 | 1994-10-25 | Mitsubishi Heavy Ind Ltd | Automatic chip removing apparatus |
JP2014193514A (en) * | 2013-03-29 | 2014-10-09 | Nishijima Corp | Light guide plate processing apparatus |
JP2016120580A (en) * | 2014-12-25 | 2016-07-07 | ファナック株式会社 | Working device with work-piece attaching/detaching means provided with visual sensor for confirming presence or absence of foreign matter |
JP2017104943A (en) * | 2015-12-10 | 2017-06-15 | ファナック株式会社 | Removal system having function for removing processed waste and processing system |
JP2018024094A (en) * | 2017-11-14 | 2018-02-15 | ファナック株式会社 | Machine tool washing system |
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