WO2020215176A1 - 显示面板及显示装置 - Google Patents

显示面板及显示装置 Download PDF

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Publication number
WO2020215176A1
WO2020215176A1 PCT/CN2019/083667 CN2019083667W WO2020215176A1 WO 2020215176 A1 WO2020215176 A1 WO 2020215176A1 CN 2019083667 W CN2019083667 W CN 2019083667W WO 2020215176 A1 WO2020215176 A1 WO 2020215176A1
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WIPO (PCT)
Prior art keywords
detection
unit
light
display
area
Prior art date
Application number
PCT/CN2019/083667
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English (en)
French (fr)
Inventor
张盛鹉
张祖强
Original Assignee
深圳市柔宇科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 深圳市柔宇科技有限公司 filed Critical 深圳市柔宇科技有限公司
Priority to CN201980079843.6A priority Critical patent/CN113348552A/zh
Priority to PCT/CN2019/083667 priority patent/WO2020215176A1/zh
Publication of WO2020215176A1 publication Critical patent/WO2020215176A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/33—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements being semiconductor devices, e.g. diodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps

Definitions

  • This application relates to the field of display technology, and in particular to a display panel and a display device.
  • the present application provides a display panel that can effectively detect cracks in the periphery.
  • a display panel provided by the present application includes: a display area for displaying images; a peripheral area surrounding the display area; and at least one crack detection unit, the at least one crack detection unit is provided with In the peripheral area, the crack detection unit includes a first light-emitting unit and a detection wire, one end of the detection wire is electrically connected to the first light-emitting unit, and the other end of the detection wire is used to receive driving Signal, when the display panel is in the detection mode, the driving signal is used to drive the first light-emitting unit to emit light.
  • the present application also provides a display device, which includes the display panel.
  • the crack detection unit By setting the crack detection unit in the peripheral area of the display panel, the first light-emitting unit of the crack detection unit and the light-emitting pixel unit in the display area are driven independently of each other without interfering with each other. Therefore, the crack detection unit will not affect the display brightness of the display area.
  • FIG. 1 is a schematic structural diagram of a display device provided by an embodiment of the present application.
  • FIG. 2 is a schematic structural diagram of a display panel provided by an embodiment of the present application.
  • FIG. 3 is a schematic structural diagram of a display panel provided by Embodiment 1 of the present application.
  • FIG. 4 is a schematic diagram of a first partial structure of a display panel provided in Embodiment 1 of the present application.
  • FIG. 5 is a schematic diagram of a second partial structure of a display panel provided in Embodiment 1 of the present application.
  • FIG. 6 is a schematic diagram of a third partial structure of a display panel provided by Embodiment 1 of the present application.
  • FIG. 7 is a schematic diagram of a fourth partial structure of a display panel provided in Embodiment 1 of the present application.
  • FIG. 8 is a schematic structural diagram of a display panel provided in the second embodiment of the present application.
  • FIG. 9 is a schematic structural diagram of a display panel provided by Embodiment 3 of the present application.
  • the crack detection (panel crack detection, abbreviated as PCD) of the existing display panel can be mainly divided into wiring resistance detection and screen lighting detection.
  • Wire resistance detection is to set wires and multiple resistors on the edge of the display panel, and conduct resistance tests on different detection points of the display panel through a multimeter, and determine whether there is a crack based on the resistance. For example, if the resistance is infinite, it means that there is an open circuit and a crack between the two detection points.
  • the disadvantage of this method is that it requires multiple detections, the detection efficiency is low, and the resistance size may change due to the manufacturing process, which is prone to misjudgment.
  • the screen electric brightness detection uses the light-emitting pixel unit of the display area of the display panel and the detection wiring integrated detection circuit, and when the screen is on, it is judged whether there is a crack according to whether a dark line appears in the display screen.
  • this detection method also has the following disadvantages: 1. If the display panel is due to other reasons, such as signal delay on the data line, the A dark line appears near the light-emitting pixel unit. At this time, it is difficult to distinguish whether the dark line is caused by a crack in the area through which the detection trace of the electrical connection A column passes, which may easily cause misjudgment. 2.
  • the access resistance of column A is different from the access resistance of other light-emitting pixel units because the electrical connection path of the light-emitting pixel unit in column A is longer, and it should be larger. There are many, so the light-emitting pixel unit of column A may display dark, visually close to the dark line, which may be misjudged as a dark line of the light-emitting pixel unit of column A, and also affect the normal display of the panel. 3.
  • the prior art can only detect whether a crack occurs, but cannot detect the exact position of the crack.
  • the present application provides a display device 100.
  • the display device 100 can be various display devices such as mobile phones, tablets, e-readers, computers, and electronic display screens.
  • the display device 100 may be a flexible and foldable display device.
  • the display device 100 includes a display panel 10.
  • the display panel 10 may be a flexible display panel.
  • the length direction of the display panel 10 is defined as the Y axis direction
  • the width direction of the display panel 10 is defined as the X axis direction
  • the thickness direction of the display panel 10 is defined as the Z axis direction.
  • a display panel 10 provided by the present application includes a display area 1, a peripheral area 2 and at least one crack detection unit 4.
  • Display area 1 is used to display images.
  • the peripheral area 2 surrounds the display area 1, and the peripheral area 2 is used for setting circuits and the like.
  • a frame is generally provided in the peripheral area 2 or a light-shielding ink is provided in the peripheral area 2, and the like.
  • the at least one crack detection unit 4 is provided in the peripheral area 2 and is used to detect whether cracks appear on the edge of the display panel 10 to improve the reliability of the display panel 10.
  • the crack detection unit 4 includes a first light-emitting unit 41 and a detection wiring 42.
  • One end of the detection wire 42 is electrically connected to the first light-emitting unit 41.
  • the other end of the detection wire 42 is used to receive a driving signal.
  • the driving signal is used to drive the first light-emitting unit 41 to emit light.
  • the display panel 10 is in the detection mode, the display panel 10 is in the crack detection mode.
  • the detection wiring 42 is arranged around the display area 1 to indicate whether there is a crack in the peripheral area 2.
  • the specific characterization method is as follows: the detection wire 42 is a conductive wire that is easily broken under the tensile force generated by a crack. When the crack passes through the detection wire 42, the detection wire 42 is disconnected under the tension of the crack, which causes the crack detection unit 4 to be disconnected, and the first light-emitting unit 41 does not emit light. Therefore, the inspector can determine whether there is a crack invaded by the area where the inspection wiring 42 is arranged on the display panel 10 according to the light emission of the first light emitting unit 41.
  • the first light-emitting unit 41 When the first light-emitting unit 41 emits light under the action of the driving signal, it indicates that there is no crack attack in the area passed by the detection wiring 42 connected to it. When the first light-emitting unit 41 does not emit light under the action of the driving signal, it indicates that the area passed by the detection trace 42 connected to it has a crack invaded.
  • each crack detection unit 4 detects whether there is a crack in one area, and then It is determined whether there is a crack in the area by whether the first light-emitting unit 41 in the area emits light under the driving signal, so as to realize the accurate position detection of the crack. Therefore, the display panel 10 of this embodiment can detect whether there is a crack and the exact location of the crack, and the efficiency and accuracy of crack detection of the display panel 10 are improved.
  • the crack detection unit 4 By setting the crack detection unit 4 in the peripheral area 2 of the display panel 10, and the crack detection unit 4 is not electrically connected to the light-emitting pixel unit in the display area 1, the crack detection unit 4 will not affect the light emission in the display area 1.
  • the brightness of the pixel unit effectively avoids the dark lines generated by the light-emitting pixel unit of the display area 1 in the prior art due to the large resistance, which is easy to cause misjudgment and affect the display; the first light-emitting unit 41 of the crack detection unit 4 will not be displayed.
  • the signal delay of zone 1 and other influences result in low luminous brightness, leading to misjudgment of cracks there, and improving the accuracy of crack detection of the display panel 10; by setting the detection trace 42 of the crack detection unit 4 in the display area 1 can detect whether there are cracks on the edge of the display panel 10, and improve the coverage of crack detection of the display panel 10.
  • different crack detection units 4 can detect different areas
  • the cracks of the first light-emitting unit 41 of different crack detection units 4 are used to characterize the precise location of the cracks, so that the crack detection of the display panel 10 has the advantages of large coverage, accurate location, accurate detection results, etc.
  • the reliability and yield of the display device 100 is used to characterize the precise location of the cracks, so that the crack detection of the display panel 10 has the advantages of large coverage, accurate location, accurate detection results, etc. The reliability and yield of the display device 100.
  • the display area 1 is provided with a second light-emitting unit 52.
  • the second light-emitting unit 52 is a light-emitting device in a light-emitting pixel unit.
  • the first light-emitting unit 41 of the crack detection unit 4 is independent of the second light-emitting unit 52 of the display area 1.
  • the second light-emitting unit 52 has dark lines due to other factors, such as signal delay on the data line, which causes misjudgment.
  • the crack detection unit 4 further includes a detection chip 43 and a display chip 55.
  • the detection wire 42 is electrically connected between the detection chip 43 and the first light-emitting unit 41.
  • the detection chip 43 is used to emit a driving signal
  • the detection wiring 42 is used to transmit the driving signal to the first light-emitting unit 41 to drive the first light-emitting unit 41 to emit light.
  • the display chip 55 is electrically connected to the second light-emitting unit 52 to drive the second light-emitting unit 52 to work.
  • the detection chip 43 and the display chip 55 are separately provided, so that the first light-emitting unit 41 and the second light-emitting unit 52 are driven independently of each other without interfering with each other.
  • the display chip 55 controls the second light-emitting unit 52 to emit light
  • the detection chip 43 controls the first light-emitting unit 41 not to emit light, so that the crack detection unit 4 does not emit light. This will affect the screen display of the display area 1, and improve the stability of the display device 100.
  • the detection chip 43 does not generate a driving signal and a data signal to the first light-emitting unit 41, and the first light-emitting unit 41 does not emit light.
  • the detection chip 43 controls the first light-emitting unit 41 to emit light
  • the display chip 55 controls the second light-emitting unit 52 to not emit light. Since the second light-emitting unit 52 does not emit light, the display area 1 is black.
  • the first light-emitting unit 41 emits light, its brightness can be clearly seen under a black background, so that the inspector can quickly and accurately identify which locations The first light-emitting unit 41 is lit, which effectively avoids misjudgment and improves the efficiency of crack detection.
  • the detection chip 43 is independent of the display chip 55. Specifically, the display chip 55 and the detection chip 43 may be arranged in the peripheral area 2.
  • the detection chip 43 is electrically connected to the display chip 55.
  • the detection chip 43 is integrated in the display chip 55 to reduce the number of chips on the display panel 10 and save the space occupied by the chips.
  • the number of the second light emitting unit 52 is multiple.
  • the plurality of second light emitting units 52 are arranged in an array.
  • the number of the crack detection unit 4 is multiple.
  • the first light-emitting unit 41 of each crack detection unit 4 corresponds to a row of the second light-emitting units 52.
  • the plurality of first light-emitting units 41 and the plurality of second light-emitting units 52 are manufactured in the same manufacturing process, so as to simplify the manufacturing process of the first light-emitting unit and the second light-emitting unit 52.
  • the first light emitting unit 41 and the second light emitting unit 52 can be LED lights, miniLED lights, microLED lights, or OLED lights.
  • the specific structure of the crack detection unit 4 includes but is not limited to the following embodiments. It should be noted that this embodiment describes the specific structure of a crack detection unit 4, but it does not mean that this embodiment only includes one crack detection unit 4.
  • the crack detection unit 4 further includes a first switch unit 44.
  • Each of the first switch units 44 is electrically connected to one of the first light emitting units 41, and a plurality of the first light emitting units 41 and a plurality of the first switch units 44 are in a direction perpendicular to the display panel 10 They are stacked and the first light emitting unit 41 is close to the light emitting surface of the display panel 10.
  • the first switch unit 44 is used to control the on-off of the path through which the driving signal is transmitted to the first light-emitting unit 41.
  • the first switch unit 44 is a thin film transistor.
  • the first switch unit 44 includes a gate g11, a first terminal p11, and a second terminal p12. Wherein, the first terminal p11 is a source and the second terminal p12 is a drain, or the first terminal p11 is a drain and the second terminal p12 is a source.
  • the detection wire 42 is electrically connected to the first terminal p11 of the first switch unit 44.
  • the detection wiring 42 is a data line electrically connected to the first switch unit 44, and the driving signal is a data voltage.
  • the second terminal p12 of the first switch unit 44 is electrically connected to the first light-emitting unit 41.
  • the first switch unit 44 and the first light emitting unit 41 are superimposed and arranged in the Z axis direction.
  • the crack detection unit 4 further includes a detection control line 45.
  • the detection control line 45, the first switch unit 44 and the detection wiring 42 are arranged on the same substrate.
  • the detection control line 45 is electrically connected to the gate g11 of the first switch unit 44, the detection control line 45 is used to receive a control signal, and the control signal is used to control the first end of the first switch unit 44 The connection between p11 and the second terminal p12 of the first switch unit 44.
  • the first switch unit 44 As an N-type transistor as an example for description.
  • the voltage difference between the control signal and the drain of the first switch unit 44 is greater than the threshold voltage of the first switch unit 44, That is, when a high-level control signal is applied to the gate g11 of the first switch unit 44, the first terminal p11 and the second terminal p12 of the first switch unit 44 are electrically conducted.
  • the detection wiring 42 When there is no crack on the path passed by the detection wiring 42, there is a conduction path between the detection chip 43 and the first switch unit 44, and the detection wiring 42 can transmit the driving signal to the The first switch unit 44 transmits the driving signal to the first light-emitting unit 41 via the first terminal p11 and the second terminal p12 of the first switch unit 44 to drive the first light-emitting unit 41 to emit light.
  • the path between the detection chip 43 and the first switch unit 44 is disconnected, and the drive signal cannot be transmitted to the first light-emitting unit 41, so The first light-emitting unit 41 does not emit light.
  • the first switch unit 44 may be a p-type transistor.
  • the first switch unit 44 When the voltage difference between the control signal and the drain of the first switch unit 44 is less than the threshold voltage of the first switch unit 44, the first switch unit 44 The first terminal p11 and the second terminal p12 of the switch unit 44 are electrically conductive; when the voltage difference between the control signal and the drain of the first switch unit 44 is greater than the threshold voltage of the first switch unit 44, then the first The first terminal p11 and the second terminal p12 of a switch unit 44 are electrically disconnected.
  • the display panel 10 of this embodiment is an organic light-emitting diode display panel 10 (Organic Light-Emitting Diode, OLED).
  • the material of the first light-emitting unit 41 is an organic light-emitting material.
  • the crack detection unit 4 does not include the first switch unit 44.
  • the detection wire 42 is directly electrically connected to the first light-emitting unit 41.
  • the detection wire 42 is arranged at the edge of the display panel 10 and around the display area 1 to detect cracks on the edge of the display panel 10. It is determined whether there is a crack in the display panel 10 by detecting whether the first light emitting unit 41 emits light on the driving signal.
  • the first light emitting unit 41 may be an LED lamp, a miniLED lamp, a microLED lamp, or an OLED lamp.
  • the crack detection unit 4 is multiple.
  • the plurality of first light emitting units 41 are arranged along the edge of the display area 1. Specifically, the plurality of first light emitting units 41 and the plurality of first switch units 44 are stacked in the Z-axis direction.
  • the detection control line 45 is electrically connected to the gates of a plurality of the first switch units 44.
  • the plurality of detection wires 42 are respectively electrically connected between the first terminals p11 of the plurality of first switch units 44 and the detection chip 43.
  • the plurality of detection wires 42 are arranged close to the edge of the display panel 10 and around the display area 1 of the display panel 10.
  • the detection wiring 42 can detect the crack at the edge of the display panel 10, and the first switch unit 44 and the first light-emitting unit 41 are arranged close to the display area 1, so that The first switch unit 44 and the first light-emitting unit 41 are not easily attacked by cracks at the edge of the display panel 10, so as to promote the crack detection unit 4 to realize the crack detection; moreover, by setting the detection wiring 42 around the display of the display panel 10 Zone 1 is provided to increase the coverage of the detection trace 42, thereby increasing the coverage of the crack detection of the crack detection unit 4, reducing cracks in the display panel 10, and improving the yield of the display device 100.
  • the display area 1 is provided with a plurality of second switch units 51 and a plurality of second light-emitting units 52 all arranged in an array.
  • the plurality of second light emitting units 52 and the plurality of second switch units 51 are stacked in the Z-axis direction.
  • Each of the second switch units 51 is electrically connected to a second light-emitting unit 52, and the second switch unit 51 is used to control the on and off of a path for the second light-emitting unit 52 to receive a driving signal.
  • the first switch unit 44 and the second switch unit 51 are located on the same layer, and each first switch unit 44 corresponds to a row of the second switch unit 51.
  • the data signal and control signal received by the first switch unit 44 come from the detection chip 43, and the data signal and control signal received by the second switch unit 51 come from the display chip 55, so that the first light-emitting unit 41 and the second The light-emitting unit 52 is separated, so the crack detection unit 4 does not affect the normal display of the display panel 10.
  • the first switch unit 44 and the second switch unit 51 are manufactured in the same manufacturing process.
  • the second switch unit 51 is arranged in N rows*M columns. Among them, N and M are positive integers. In the Y-axis direction, the second switch units 51 are arranged in N rows.
  • the N first switch units 44 are arranged in a row along the Y-axis direction. Wherein, each of the first switch units 44 corresponds to the second switch unit 51 of each row. And each first switch unit 44 is connected to the second switch unit 51 of each row in position.
  • N rows*(M+1) columns of switch units are formed on the substrate, wherein the first column of switch units is the first switch unit 44, and the second column to the (M+1)th column
  • the switch unit is the second switch unit 51.
  • the first switch unit 44 and the second switch unit 51 are manufactured in the same manufacturing process to simplify the manufacturing process of the display panel 10 and save the manufacturing time of the display panel 10.
  • the first light-emitting unit 41 and the first switch unit 44 are stacked in the Z-axis direction, and the first light-emitting unit 41 is closer to the light-emitting surface of the display panel 10.
  • the arrangement of the first light emitting unit 41 and the first switch unit 44 is the same.
  • the second light-emitting unit 52 and the second switch unit 51 are stacked in the Z-axis direction, and the arrangement of the second light-emitting unit 52 and the second switch unit 51 is the same.
  • the first light-emitting unit 41 and the second light-emitting unit 52 are made of the same material and are made of organic light-emitting materials.
  • the first light-emitting unit 41 and the second light-emitting unit 52 are manufactured in the same manufacturing process to simplify the manufacturing process of the display panel 10. The manufacturing process time of the display panel 10 is saved.
  • a first switch unit 44 is provided on opposite sides of each row of the second switch unit 51 respectively.
  • N rows*(M+2) columns of switch units are formed on the substrate, where the switch units in the first column and the last column are the first switch units 44, and the second column
  • the switch unit to the (M+1)th column is the second switch unit 51.
  • the first light-emitting unit 41 and the second light-emitting unit 52 are arranged correspondingly. Those skilled in the art can deduce the positional correspondence between the first light-emitting unit 41 and the second light-emitting unit 52 according to the positional correspondence between the first switch unit 44 and the second switch unit 51.
  • the details of the first light-emitting unit 41 and the second light-emitting unit 52 are omitted here.
  • the arrangement of the second light-emitting unit 52 is provided on opposite sides of each row of the second switch unit 51 respectively.
  • the first light-emitting units 41 are in two rows, which are respectively arranged on opposite sides of the display area 1. Among them, the first light-emitting unit 41 in the first row is controlled by one detection chip 43, and the first light-emitting unit 41 in the second row is controlled by another detection chip 43.
  • the detection wires 42 electrically connected to the first light-emitting unit 41 of the first column and the detection wires 42 electrically connected to the first light-emitting unit 41 of the second column are independent of each other and are arranged around the display area 1 together to form a surrounding display area
  • the crack detection line of 1 improves the crack detection coverage of the display panel 10.
  • the number of the first switch unit 44 corresponding to one side of the second switch unit 51 in each row may be multiple.
  • N rows*(M+m) columns of switch units are formed on the substrate, where the switch units from the first column to the mth column are the first switch units 44, The switch units in the +1)th column to the (M+m)th column are the second switch units 51.
  • m is a positive integer greater than 1.
  • the first switch unit 44 may be provided on one or both sides of the second switch unit 51 in each column of the M column.
  • (N+1) rows*M columns of switch units are formed on the substrate, wherein the first row of switch units is the first switch unit 44, and the second row to the (Nth) The switch unit in row +1) is the second switch unit 51.
  • (N+2) rows*M columns of switch units are formed on the substrate, where the switch units in the first row and the last row are the first switch unit 44, and the second row The switch unit to the (N+1)th row is the second switch unit 51.
  • the second switch unit 51 is a thin film transistor.
  • the second switch unit 51 includes a first terminal p21, a second terminal p22, and a gate g21.
  • the first terminal p21 is a source and the second terminal p22 is a drain, or the first terminal p21 is a drain and the second terminal p22 is a source.
  • the display area 1 is also provided with a display data line 53 and a display control line 54 electrically connected to the second switch unit 51.
  • the display control line 54 is electrically connected to the gate g21 of the second switch unit 51.
  • the display data line 53 is electrically connected to the first terminal p21 of the second switch unit 51.
  • the display chip 55 is electrically connected to the display data line 53 and the display control line 54 to scan the second switch unit 51 in the display area 1 to drive the second light-emitting unit 52 to work.
  • the detection chip 43 is electrically connected to the display chip.
  • the second switch unit 51 as an N-type transistor as an example
  • the first switch unit 51 when the display control line 54 transmits a high level to the gate g21 of the second switch unit 51, the first switch unit 51
  • the terminal p21 and the second terminal p22 are turned on, so that the data voltage of the display data line 53 is written into the second switch unit 51 to control the operation of the second light-emitting unit 52.
  • the detection wiring 42 and the display data line 53 are independent of each other and are manufactured in the same manufacturing process.
  • the detection control line 45 and the display control line 54 are independent of each other and are manufactured in the same manufacturing process.
  • the detection wiring 42 and the display data line 53 are independent of each other means that the detection wiring 42 and the display data line 53 are not directly connected, and the detection wiring 42 and the display data line 53 are not directly connected.
  • the transmitted signals will not interfere with each other.
  • the detection control line 45 and the display control line 54 are not directly connected, and the signals transmitted by the detection wiring 42 and the display data line 53 will not interfere with each other.
  • the display data line 53 and the detection wiring 42 By setting the display data line 53 and the detection wiring 42 to be independent of each other, and the display control line 54 and the detection control line 45 are independent of each other, so that the first light-emitting unit 41 of the crack detection unit 4 and the second display area 1 of the display panel 10
  • the light-emitting units 52 do not affect each other, which not only ensures the display quality of the display panel 10, but also improves the detection accuracy of the crack detection unit 4.
  • the layout of the crack detection unit 4 on the display panel 10 includes but is not limited to the following embodiments.
  • the peripheral area 2 includes a first area 21 and a second area 22 disposed on opposite sides of the display area 1.
  • the first area 21 is provided with a first detection circuit 23.
  • the second area 22 is provided with a second detection circuit 24.
  • Both the first detection circuit 23 and the second detection circuit 24 include a plurality of the crack detection units 4.
  • the first detection circuit 23 and the second detection circuit 24 are symmetrically arranged with respect to the center axis of the display area 1 so that the widths of the opposite sides of the display panel 10 are the same, thereby promoting the display panel 10 to have symmetry.
  • the first detection circuit 23 includes a plurality of crack detection units 4.
  • a plurality of crack detection units 4 are electrically connected to one detection chip 43 in common.
  • each crack detection unit 4 includes a first switch unit 44, a first light-emitting unit 41, and a detection wire 42 electrically connecting the detection chip 43 and the first switch unit 44.
  • the first detection circuit 23 also includes a detection control line 45.
  • the plurality of crack detection units 4 share a detection control line 45.
  • the detection control line 45 can be arranged in parallel with the display control line 54 in the display area 1 and prepared in the same manufacturing process, which simplifies the manufacturing process of the display panel 10.
  • the number of the first switch unit 44 and the first light-emitting unit 41 in each crack detection unit 4 can be adjusted according to actual conditions, and is not limited to one.
  • the detection circuit on each side can include a plurality of crack detection units 4, and the detection trace 42 of each crack detection unit 4 detects and displays Cracks in different areas on the panel 10.
  • the structure of the first detection circuit 23 and the second detection circuit 24 are different, for example, the number of crack detection units 4 included in the first detection circuit 23 and the second detection circuit 24 is different; or, the first detection circuit The circuit 23 and the second detection circuit 24 include the same number of crack detection units 4 but the layout of the detection wiring 42 is different.
  • the peripheral area 2 is provided with a first detection chip 46 and a second detection chip 47.
  • the first detection circuit 23 is electrically connected to the first detection chip 46, and the first detection chip 46 is used to control the operation of the multiple first light-emitting units 41 of the first detection circuit 23.
  • the second detection circuit 24 is electrically connected to the second detection chip 47.
  • the second detection chip 47 is used to control the operation of the multiple first light-emitting units 41 of the second detection circuit 24.
  • the multiple first light-emitting units 41 of the first detection circuit 23 are arranged along the boundary line between the first area 21 and the display area 1.
  • the multiple detection traces 42 of the first detection circuit 23 are close to the first edge 211 of the first area 21 and extend along the first edge 211 of the first area 21.
  • the first edge 211 is opposite to the boundary line between the first area 21 and the display area 1.
  • the plurality of first light emitting units 41 of the first detection circuit 23 are arranged in sequence along the boundary line between the first area 21 and the display area 1. According to the foregoing, the first light-emitting unit 41 and the first switch unit 44 are superimposed and arranged in the Z-axis direction. Those skilled in the art can deduce the layout of the first switch unit 44 according to the layout of the first light-emitting unit 41.
  • the multiple detection traces 42 of the first detection circuit 23 are close to the first edge 211 of the first area 21 and extend along the first edge 211 of the first area 21.
  • the multiple detection traces 42 of the first detection circuit 23 are arranged close to the edge of the display panel 10 to facilitate the detection of cracks at the edge of the display panel 10. It is understandable that the multiple detection traces 42 of the first detection circuit 23 are opposite to the first edge 211, so that the multiple detection traces 42 of the first detection circuit 23 can detect as accurately as possible whether the first edge 211 is Affected by cracks, minimize crack omissions.
  • the plurality of first light-emitting units 41 of the first detection circuit 23 includes a first unit 411 and a second unit 412 arranged.
  • the first unit 411 is close to the first detection chip 46.
  • the detection trace 42 electrically connected to the first unit 411 includes a first longitudinal section 421 and a first transverse section 422 connected to each other.
  • One end of the first longitudinal section 421 is used to electrically connect to the first detection chip 46.
  • the other end of the first longitudinal section 421 extends along the first edge 211 to a position corresponding to the first unit 411.
  • the first horizontal section 422 is connected between the first longitudinal section 421 and the first unit 411.
  • the first unit 411 is the first light-emitting unit 41 closest to the first detection chip 46.
  • the first longitudinal section 421 extends along the Y axis and extends close to the first edge 211 to detect cracks on the first edge 211.
  • the extension of the first longitudinal section 421 to a position corresponding to the first unit 411 means that the orthographic projection of the other end of the first longitudinal section 421 in the X-axis direction is located between the first unit 411 and the first unit 411. Within the range where the connecting end of the unit 411 is located.
  • the distance between the first unit 411 and the first detection chip 46 in the Y-axis direction is 10 mm, and the size of the first unit 411 in the Y-axis direction is 1 mm, which can be regarded as the other end of the first longitudinal section 421
  • the distance from the first detection chip 46 in the Y-axis direction is 9.5 mm to 11.5 mm, and it can be considered that the first longitudinal section 421 extends to a position corresponding to the first unit 411.
  • the first transverse section 422 extends along the X axis to be electrically connected to the first longitudinal section 421 and the first unit 411. It can be understood that the first lateral section 422 can be used to detect the crack between the first edge 211 and the display area 1 to improve the crack detection coverage of the crack detection circuit.
  • the detection trace 42 electrically connected to the second unit 412 includes a second longitudinal section 423 and a second horizontal section 424 that are connected.
  • One end of the second longitudinal section 423 is used to electrically connect to the first detection chip 46.
  • the other end of the second longitudinal section 423 extends along the first edge 211 to a position corresponding to the second unit 412.
  • the extension of the second longitudinal section 423 to a position corresponding to the second unit 412 means that the orthographic projection of the other end of the second longitudinal section 423 in the X-axis direction is located between the second unit 412 and the second unit 412. Within the range where the connection end of the unit 412 is located. The definition can be explained with reference to the example in the previous paragraph, and will not be repeated here.
  • the second transverse section 424 extends along the X axis, and the second transverse section 424 is connected between the second longitudinal section 423 and the second unit 412. Similarly, the combination of the second lateral section 424 and the first lateral section 422 can detect cracks between the first edge 211 and the display area 1 and improve the crack detection coverage of the crack detection circuit.
  • the second longitudinal section 423 and the first longitudinal section 421 are at least partially collinear.
  • the second longitudinal section 423 is multiplexed with the first longitudinal section 421 to reduce the number of detection traces 42 and thereby reduce the position of the first area 21 occupied by the first detection circuit 23, so that the The area of a region 21 reduces the size of the non-display area 1 of the display panel 10 and realizes the narrow frame design of the display panel 10.
  • the first longitudinal section 421 and the second longitudinal section 423 of the multiple detection traces 42 of the first detection circuit 23 form a general detection line, which is close to and arranged along the first edge 211 to detect Crack at 211 on the first edge.
  • the inspector can determine that the part of the total inspection line corresponding to the first longitudinal section 421 has a crack.
  • the inspector can determine that there is a crack in the part of the total inspection line corresponding to the second longitudinal section 423 by PCT190040RY.
  • the inspector can judge that there is no crack.
  • the first longitudinal section 421 is located between the second longitudinal section 423 and the first unit 411 to avoid the second longitudinal section 423 and the first transverse Segment 422 crosses.
  • the first longitudinal section 421 and the second longitudinal section 423 are arranged side by side.
  • the first longitudinal section 421 when the second longitudinal section 423 is fractured due to crack stress, since the first longitudinal section 421 and the second longitudinal section 423 are arranged side by side, the first longitudinal section 421 may not be affected by the crack , And can detect the location of the crack more accurately.
  • the inspector can judge that it corresponds to the first longitudinal section 421 and The second longitudinal section 423 is partially cracked.
  • the inspector can determine that the second longitudinal section 423 except for the part corresponding to the first longitudinal section 421 has a crack.
  • the inspector can determine that the first longitudinal section 421 has a crack.
  • the inspector can judge that there is no crack.
  • the second longitudinal section 423 includes a first section 425 and a second section 426 that are staggered.
  • the first section 425 and the second section 426 both extend along the Y-axis direction, but the first section 425 and the second section 426 are staggered in the X-axis direction.
  • the first segment 425 is close to the display area 1.
  • the first section 425 extends from the first detection chip 46 to a position corresponding to the first unit 411. For the description corresponding to the position of the first unit 411, reference may be made to the aforementioned explanation.
  • the second section 426 is connected to the first section 425.
  • the second section 426 is connected to the first section 425 by a connecting line extending along the X axis.
  • the second section 426 is close to and extends along the first edge 211.
  • the second section 426 extends from a position corresponding to the first unit 411 to a position corresponding to the second unit 412.
  • the second transverse section 424 is connected between the second section 426 and the second unit 412.
  • the first longitudinal section 421 and the first section 425 are arranged side by side.
  • the first section 425 may not be invaded, thereby enabling more accurate detection.
  • the first longitudinal section 421 and the second section 426 may extend along the Y-axis direction, so that the first longitudinal section 421 and the second section 426 form a crack detection line for detecting the first edge 211.
  • the areas detected by the detection wires 42 of each crack detection unit 4 do not overlap, and the position and number of cracks can be accurately detected.
  • the inspector can determine the first longitudinal section 421 and the second section There are cracks in 426.
  • the inspector can determine that the second section 426 has a crack.
  • the inspector can determine that the first longitudinal section 421 has a crack.
  • the inspector can judge that there is no crack.
  • the multiple first light-emitting units 41 of the first detection circuit 23 further include other first light-emitting units 41 in addition to the first unit 411 and the second unit 412.
  • the layout of the detection wiring 42 of the other first light-emitting unit 41 may be the same as the layout of the detection wiring 42 of the second unit 412.
  • Those skilled in the art can infer the layout of the detection wiring 42 when there are more than two first light-emitting units 41 based on the layout of the detection wiring 42 of the first unit 411 and the second unit 412.
  • the peripheral area 2 further includes a third area 25 and a chip area 26 connected to the first area 21 and the second area 22.
  • the third area 25 and the chip area 26 are respectively provided on opposite sides of the display area 1.
  • the plurality of first light emitting units 41 of the first detection circuit 23 includes a third unit 413 close to the third area 25.
  • the detection trace 428 electrically connected to the third unit 413 extends into the third area 25 so that the detection trace 428 of the third unit 413 can detect cracks in the third area 25.
  • the chip area 26 is used to set a display chip 55, a first detection chip 46 and a second detection chip 47 that drive the display of the display panel 10.
  • the third unit 413 is the first light-emitting unit 41 in a crack detection unit 4.
  • One or more first light emitting units 41 may be provided between the third unit 413 and the second unit 412 in the foregoing embodiment, or the first light emitting unit 41 may not be provided.
  • the third area 25 has a second edge 251.
  • the second edge 251 is opposite to the dividing line between the third area 25 and the display area 1.
  • the detection trace 428 electrically connected to the third unit 413 is close to the second edge 251 and extends along the second edge 251 until it is close to the midpoint of the second edge 251.
  • first detection circuit 23 and the second detection circuit 24 are symmetrical about the central axis of the display area 1 layout.
  • the detection trace 428 in the first detection circuit 23 and the detection trace 429 in the second detection circuit 24 can both be relatively in the first detection circuit.
  • the third area 25 extends until the detection trace 428 in the first detection circuit 23 and the detection trace 429 in the second detection circuit 24 are close to the midpoint of the second edge 251. At this time, the detection trace in the first detection circuit 23
  • the line 428 and the detection trace 429 in the second detection circuit 24 are spaced apart in the third area 25 with a small distance, so that the detection trace 428 in the first detection circuit 23 and the detection trace 429 in the second detection circuit 24
  • the line 429 can detect as many cracks on the second edge 251 as possible.
  • the display chip 55 is arranged at a position opposite to the display area 1, and the first detection chip 46 and the second detection chip 47 are arranged on opposite sides of the display chip 55.
  • the first detection circuit 23 and the second detection circuit 24 are electrically connected to the first detection chip 46 and the second detection chip 47 respectively.
  • the first detection chip 46 and the second detection chip 47 are used for electrically connecting to the display chip 55.
  • the detection trace 428 in the first detection circuit 23 and the detection trace 429 in the second detection circuit 24 are electrically connected in the third region 25. In this way, the first detection circuit 23 and the second detection circuit 24 can share one detection chip to reduce the number of detection chips.
  • the detection traces 428 in the first detection circuit 23 and the detection traces 429 in the second detection circuit 24 are spaced apart but interlaced in the third region 25, and the detection traces in the first detection circuit 23
  • the line 428 and the detection trace 429 in the second detection circuit 24 at least partially overlap in the Y axis direction to increase the interception length of the detection trace 42 to the crack of the second edge 251 and avoid missed detection.
  • the number of the detection circuits may be three, and the third area 25 may be provided with a third detection circuit.
  • the first light-emitting unit 41 and the detection wiring 42 of the third detection circuit may be the same as the first detection circuit 23 in the above-mentioned embodiment.

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Abstract

一种显示面板（10）及显示装置（100），显示面板（10）包括：显示区（1），显示区（1）用于显示图像；外围区（2），包围显示区（1）；及至少一个裂纹检测单元（4），至少一个裂纹检测单元（4）设于外围区（2），裂纹检测单元（4）包括第一发光单元（41）及检测走线（42），检测走线（42）的一端电连接于第一发光单元（41），检测走线（42）的另一端用于接收驱动信号，当显示面板（10）处于检测模式时，驱动信号用于驱动第一发光单元（41）发光。显示面板（10）周边的裂纹能够被有效地检测。

Description

显示面板及显示装置 技术领域
本申请涉及显示技术领域，尤其涉及一种显示面板及显示装置。
背景技术
柔性显示面板在切割完成的后端工艺中，柔性显示面板的边缘非常容易发生微小的裂纹。由于柔性显示面板一般使用的是有机发光二极管技术，有机发光二极管对封装工艺的要求很高，一旦柔性显示面板的边缘出现微小的裂纹，水汽很容易渗透进入柔性显示面板内部从而造成有机发光材料的失效和寿命减少。因此，如何监控柔性显示面板周边的微小裂纹成为非常重要课题。
发明内容
本申请提供了一种能够有效地检测周边的裂纹的显示面板。
一方面，本申请提供的一种显示面板，包括：显示区，所述显示区用于显示图像；外围区，包围所述显示区；及至少一个裂纹检测单元，所述至少一个裂纹检测单元设于所述外围区，所述裂纹检测单元包括第一发光单元及检测走线，所述检测走线的一端电连接于所述第一发光单元，所述检测走线的另一端用于接收驱动信号，当所述显示面板处于检测模式时，所述驱动信号用于驱动所述第一发光单元发光。
另一方面，本申请还提供的一种显示装置，所述显示装置包括所述的显示面板。
通过在显示面板的外围区设置裂纹检测单元，该裂纹检测单元的第一发光单元与显示区内的发光像素单元相互独立驱动，互不干扰，所以，裂纹检测单元不会对显示区的显示亮度产生干扰，且裂纹检测单元的第一发光单元不会受到显示区的信号延迟等影响而造成发光亮度低，导致该处有裂纹的误判，提高显示面板的裂纹检测的准确性；通过在外围区设置多个裂纹检测单元，不同的裂纹检测单元检测不同区域的裂纹，并通过不同的裂纹检测单元的第一发光单元的亮暗来表征裂纹存在的精确位置，使得显示面板的裂纹检测具有覆盖率大、位置精确、检测结果准确等优点，提高显示装置的可靠性和良率。
附图说明
为了更清楚地说明本申请的技术方案，下面将对实施方式中所需要使用的 附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施方式，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以如这些附图获得其他的附图。
图1是本申请实施例提供的一种显示装置的结构示意图。
图2是本申请实施例提供的一种显示面板的结构示意图。
图3是本申请实施例一提供的一种显示面板的结构示意图。
图4是本申请实施例一提供的一种显示面板的第一种局部结构示意图。
图5是本申请实施例一提供的一种显示面板的第二种局部结构示意图。
图6是本申请实施例一提供的一种显示面板的第三种局部结构示意图。
图7是本申请实施例一提供的一种显示面板的第四种局部结构示意图。
图8是本申请实施例二提供的一种显示面板的结构示意图。
图9是本申请实施例三提供的一种显示面板的结构示意图。
具体实施方式
下面将结合本申请实施方式中的附图，对本申请实施方式中的技术方案进行清楚、完整地描述，显然，所描述的实施方式仅仅是本申请一部分实施方式，而不是全部的实施方式。基于本申请中的实施方式，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施方式，都属于本申请保护的范围。
现有显示面板的裂纹检测(panel crack detection，缩写PCD)主要可分为走线电阻检测和屏幕点亮检测。
走线电阻检测是在显示面板的边缘设置走线和多个电阻，通过万用表对显示面板的不同的检测点进行电阻测试，依据电阻大小来判断是否出现裂纹。例如，电阻为无穷大，说明该两个检测点之间断路且具有裂纹。该方法缺点是需要多次检测，检测效率低，且电阻大小会因制造工艺发生变化，容易出现误判。
屏幕电亮检测是利用显示面板的显示区的发光像素单元与检测走线集成检测电路，在屏幕点亮时根据显示画面是否出现的暗线来判断是否出现裂纹。当将显示区中A列的发光像素单元作为裂纹检测电路的发光单元时，这种检测方法也存在以下缺点：1.如果显示面板因为其他原因，例如，数据线上信号延迟，在A列的发光像素单元附近出现暗线，此时仅凭肉眼难以分辨出现暗线的原因是否是因为电连接A列的检测走线所经过的区域出现裂纹，因而容易造成误判。2.进行显示面板的裂纹检测时，由于A列的发光像素单元电连接路径较长的检测走线，所以A列的接入电阻与其他发光像素单元的接入电阻是不一样 的，要大很多，所以A列的发光像素单元可能显示偏暗，视觉上接近暗线，有可能造成误判成A列的发光像素单元出现暗线，同时还会影响面板正常显示。3.现有技术只能检测是否发生裂纹，而不能检测出裂纹的准确位置。
请参阅图1，本申请提供一种显示装置100，所述显示装置100可以为手机、平板、电子阅读器、电脑、电子展示屏等各种显示设备。本实施例中，所述显示装置100可以为柔性且可折叠显示装置。所述显示装置100包括显示面板10。显示面板10可以为柔性显示面板。为了便于描述，将显示面板10的长度方向定义为Y轴方向，将显示面板10的宽度方向定义为X轴方向，将显示面板10的厚度方向定义为Z轴方向。
请参阅图2，本申请提供的一种显示面板10，包括显示区1、外围区2及至少一个裂纹检测单元4。显示区1用于显示图像。外围区2包围所述显示区1，外围区2用于设置电路等。在显示装置100中，一般在外围区2设置边框或在外围区2设置遮光油墨等。所述至少一个裂纹检测单元4设于所述外围区2，用于检测显示面板10的边缘是否出现裂纹，以提高显示面板10的可靠性。请参阅图3，所述裂纹检测单元4包括第一发光单元41及检测走线42。检测走线42的一端电连接于所述第一发光单元41。所述检测走线42的另一端用于接收驱动信号。当所述显示面板10处于检测模式时，即显示面板10在检测裂纹时，所述驱动信号用于驱动所述第一发光单元41发光。具体的，显示面板10处于检测模式为显示面板10处于裂纹检测模式。
具体的，所述检测走线42环绕于所述显示区1设置，以表征外围区2是否存在裂纹。具体的表征方式为：所述检测走线42为在裂纹产生的拉力下易断裂的导电线。当裂纹经过检测走线42时，检测走线42在裂纹的拉力下断开，导致裂纹检测单元4断路，第一发光单元41不发光。所以，检测者可以根据第一发光单元41的发光情况，判断显示面板10上布局检测走线42的区域是否有裂纹侵袭。当第一发光单元41在驱动信号的作用下发光时，表明与其相连接的检测走线42所经过的区域没有裂纹侵袭。当第一发光单元41在驱动信号的作用下不发光时，表明与其相连接的检测走线42所经过的区域有裂纹侵袭。
进一步地，请参阅图3，本实施例的外围区2设置多个裂纹检测单元4。每个裂纹检测单元4的检测走线42分别经过不同的区域，从而多个裂纹检测单元4将外围区2划分成多个不同的区域，每个裂纹检测单元4检测一个区域是否有裂纹，进而通过该区域的第一发光单元41在驱动信号下是否发光来判断该区域是否存在着裂纹，以实现裂纹的精确位置检测。因此，本实施例的显 示面板10可以检测是否存在裂纹和裂纹存在的准确位置，提高显示面板10的裂纹检测效率和准确性。
通过将裂纹检测单元4设于显示面板10的外围区2，且裂纹检测单元4未与显示区1内的发光像素单元电连接，所以，裂纹检测单元4不会影响到显示区1内的发光像素单元亮度，有效地避免现有技术中显示区1的发光像素单元因接入大电阻而产生暗线，容易造成误判和影响显示；裂纹检测单元4的第一发光单元41也不会受到显示区1的信号延迟等影响而造成发光亮度低，导致该处有裂纹的误判，提高显示面板10的裂纹检测的准确性；通过将裂纹检测单元4的检测走线42设于所述显示区1的周侧即可检测到显示面板10的边缘是否存在裂纹，提高显示面板10裂纹检测的覆盖率，且通过在外围区2设置多个裂纹检测单元4，不同的裂纹检测单元4检测不同区域的裂纹，并通过不同的裂纹检测单元4的第一发光单元41的亮暗来表征裂纹存在的精确位置，使得显示面板10的裂纹检测具有覆盖率大、位置精确、检测结果准确等优点，提高显示装置100的可靠性和良率。
在一实施例中，请一并参阅图2及图3，所述显示区1设有第二发光单元52。所述第二发光单元52为发光像素单元内的发光器件。裂纹检测单元4的第一发光单元41与显示区1的第二发光单元52相独立，无需将显示区1的第二发光单元52作为裂纹检测的发光指示，有效地避免了显示区1的第二发光单元52因其他因素，例如数据线上信号延迟而出现暗线，而造成误判的问题。
具体的，请参阅图3及图4，所述裂纹检测单元4还包括检测芯片43和显示芯片55。所述检测走线42电连接于所述检测芯片43与所述第一发光单元41之间。检测芯片43用于发射驱动信号，所述检测走线42用于将所述驱动信号传输至所述第一发光单元41，以驱动所述第一发光单元41发光。所述显示芯片55电连接所述第二发光单元52，以驱动所述第二发光单元52工作。通过分别设置检测芯片43和显示芯片55，以使第一发光单元41与第二发光单元52相互独立驱动，互不干扰。
当所述显示面板10处于显示模式时，所述显示芯片55控制所述第二发光单元52发光，且所述检测芯片43控制所述第一发光单元41不发光，以使裂纹检测单元4不会影响到显示区1的画面显示，提高显示装置100的稳定性。换而言之，当显示面板10进行正常显示时，检测芯片43不产生驱动信号和数据信号至第一发光单元41，第一发光单元41不会发光。
当所述显示面板10处于所述检测模式时，所述检测芯片43控制所述第一发光单元41发光，且所述显示芯片55控制所述第二发光单元52不发光。由 于第二发光单元52不发光，所以所述显示区1呈黑色，当第一发光单元41发光时，其亮度在黑色背景下可被明显地看到，便于检测者快速地准确地识别哪些位置的第一发光单元41被点亮，有效地避免误判，提高裂纹检测效率。
在一实施例中，请参阅图4，所述检测芯片43独立于所述显示芯片55。具体的，所述显示芯片55和检测芯片43可以设于外围区2。
在一实施例中，请参阅图4，检测芯片43电连接显示芯片55。
在另一实施例中，所述检测芯片43集成在所述显示芯片55内，以减少显示面板10上芯片的数量，节省芯片占据的空间。
在一实施例中，所述第二发光单元52的数量为多个。多个所述第二发光单元52呈阵列排布。所述裂纹检测单元4的数量为多个。每个所述裂纹检测单元4的第一发光单元41对应一行所述第二发光单元52。多个所述第一发光单元41与多个所述第二发光单元52在同一制程中制得，以简化所述第一发光单元与所述第二发光单元52的制程。所述第一发光单元41和所述第二发光单元52可以为LED灯、miniLED灯、microLED灯、OLED灯。
裂纹检测单元4的具体结构包括但不限于以下的实施例。需要说明的是，本实施例描述一个裂纹检测单元4的具体结构，但是不表示本实施例只包括一个裂纹检测单元4。
在一实施例中，请一并参阅图4及图5，所述裂纹检测单元4还包括第一开关单元44。每个所述第一开关单元44电连接一个所述第一发光单元41，且多个所述第一发光单元41与多个所述第一开关单元44在垂直于所述显示面板10方向上层叠设置，且第一发光单元41靠近于所述显示面板10的出光面。所述第一开关单元44用于控制所述驱动信号传输至所述第一发光单元41的路径的通断。
具体的，请一并参阅图4与图5，第一开关单元44为薄膜晶体管。所述第一开关单元44包括栅极g11、第一端p11及第二端p12。其中，所述第一端p11为源极且所述第二端p12为漏极，或者，所述第一端p11为漏极且所述第二端p12为源极。所述检测走线42电连接所述第一开关单元44的第一端p11。具体的，所述检测走线42为电连接所述第一开关单元44的数据线，所述驱动信号为数据电压。请参阅图5，所述第一开关单元44的第二端p12电连接所述第一发光单元41。所述第一开关单元44与所述第一发光单元41在Z轴方向上叠加设置。请参阅图4，所述裂纹检测单元4还包括检测控制线45。检测控制线45与第一开关单元44、所述检测走线42设于同一基板上。所述检测控制线45电连接所述第一开关单元44的栅极g11，所述检测控制线45用于 接收控制信号，所述控制信号用于控制所述第一开关单元44的第一端p11与所述第一开关单元44的第二端p12之间的通断。
请参阅图4，以所述第一开关单元44为N型晶体管为例进行说明，当控制信号与第一开关单元44的漏极之间的压差大于第一开关单元44的阈值电压时，即在第一开关单元44的栅极g11施加为高电平的控制信号时，则第一开关单元44的第一端p11和第二端p12之间电性导通。当所述检测走线42所经过的路径上没有裂纹时，所述检测芯片43与所述第一开关单元44之间为导通路径，所述检测走线42能够将驱动信号传输至所述第一开关单元44，以使所述驱动信号经所述第一开关单元44的第一端p11和第二端p12传输至第一发光单元41，以驱动所述第一发光单元41发光。当检测走线42所经过的路径上具有裂纹时，所述检测芯片43与所述第一开关单元44之间为断开的路径，所述驱动信号无法传输至第一发光单元41，故所述第一发光单元41不发光。
可以理解的，当控制信号与第一开关单元44的漏极之间的压差小于第一开关单元44的阈值电压时，即在第一开关单元44的栅极g11施加为低电平的控制信号时，则第一开关单元44的第一端p11和第二端p12之间断开。当然，在其他实施方式中，第一开关单元44可以为p型晶体管，当控制信号与第一开关单元44的漏极之间的压差小于第一开关单元44的阈值电压时，则第一开关单元44的第一端p11和第二端p12之间电性导通；当控制信号与第一开关单元44的漏极之间的压差大于第一开关单元44的阈值电压时，则第一开关单元44的第一端p11和第二端p12之间电性断开。
可以理解的，本实施例的显示面板10为有机发光二极管显示面板10(Organic Light-Emitting Diode,OLED)。其中，第一发光单元41的材质为有机发光材料。
在其他实施例中，所述裂纹检测单元4不包括第一开关单元44。检测走线42直接电连接于所述第一发光单元41。检测走线42设于显示面板10的边缘且绕所述显示区1设置，以检测显示面板10的边缘的裂纹。通过检测第一发光单元41在驱动信号是否发光来判断显示面板10是否存在裂纹。其中，所述第一发光单元41可以为LED灯、miniLED灯、microLED灯、OLED灯。
以下以裂纹检测单元4包括第一开关单元44为例进行说明。
在一实施例中，请一并参阅图3及图4，所述裂纹检测单元4为多个。多个所述第一发光单元41沿所述显示区1的边缘排列。具体的，所述多个所述第一发光单元41与多个所述第一开关单元44在Z轴方向上层叠设置。所述检测控制线45电连接多个所述第一开关单元44的栅极。多个所述检测走线42 分别电连接于多个所述第一开关单元44的第一端p11与所述检测芯片43之间。多个所述检测走线42靠近于所述显示面板10的边缘且绕所述显示面板10的显示区1设置。
通过设置检测走线42靠近于显示面板10的边缘，以使检测走线42能够检测到显示面板10边缘的裂纹，及设置第一开关单元44与第一发光单元41靠近显示区1，以使第一开关单元44和第一发光单元41不容易受到显示面板10边缘处裂纹的侵袭，以促使裂纹检测单元4能够实现裂纹检测；而且，通过设置检测走线42绕所述显示面板10的显示区1设置，以使检测走线42的覆盖率较大，故而提高裂纹检测单元4的裂纹检测的覆盖率，减少显示面板10内的裂纹，提高显示装置100的良率。
在一种实施方式中，请一并参阅图3及图4，所述显示区1设有皆呈阵列排布的多个第二开关单元51和多个第二发光单元52。所述多个第二发光单元52与多个第二开关单元51在Z轴方向上层叠设置。每个所述第二开关单元51均电连接一个第二发光单元52，所述第二开关单元51用于控制所述第二发光单元52接收驱动信号的路径通断。第一开关单元44与所述第二开关单元51位于同一层，每一个所述第一开关单元44对应一行所述第二开关单元51。第一开关单元44所接收到的数据信号和控制信号来自于检测芯片43，而第二开关单元51所接收的数据信号和控制信号来自于显示芯片55，以使第一发光单元41与第二发光单元52分离，故而裂纹检测单元4不影响显示面板10的正常显示。
本实施例中，所述第一开关单元44与所述第二开关单元51在同一制程中制得。
举例而言，第二开关单元51按照N行*M列排列。其中，N、M为正整数。在Y轴方向上，第二开关单元51按照N行排列。N个所述第一开关单元44沿Y轴方向排成一列。其中，每一个所述第一开关单元44分别对应每一行的第二开关单元51。且每一个第一开关单元44在位置上连接于每一行的第二开关单元51设置。在制备显示面板10时，在基板上形成N行*(M+1)列的开关单元，其中，第一列的开关单元为第一开关单元44，第2列至第(M+1)列的开关单元为第二开关单元51。其中，所述第一开关单元44和第二开关单元51在同一制程中制得，以简化显示面板10的制程工序，节省显示面板10的制程时长。
相对应的，所述第一发光单元41与第一开关单元44在Z轴方向上层叠设置，其中，第一发光单元41更靠近显示面板10的出光面。第一发光单元41 与第一开关单元44的排列方式相同。类似地，第二发光单元52与第二开关单元51在Z轴方向上层叠设置，第二发光单元52与第二开关单元51的排列方式相同。本领域技术人员可以根据第一开关单元44与第二开关单元51的位置对应关系，推出第一发光单元41与第二发光单元52的位置对应关系。第一发光单元41与第二发光单元52的材质相同，皆为有机发光材料，通过将第一发光单元41与第二发光单元52在同一制程中制得，以简化显示面板10的制程工序，节省显示面板10的制程时长。
进一步地，每一行第二开关单元51的相对两侧分别设有一个第一开关单元44。换而言之，在制备显示面板10时，在基板上形成N行*(M+2)列的开关单元，其中，第一列和最后一列的开关单元为第一开关单元44，第2列至第(M+1)列的开关单元为第二开关单元51。其中，第一发光单元41与第二发光单元52对应地排布。本领域技术人员可以根据第一开关单元44与第二开关单元51的位置对应关系，推出第一发光单元41与第二发光单元52的位置对应关系，在此不再赘述第一发光单元41与第二发光单元52的排列方式。
本实施例中，第一发光单元41为两列，分别设于显示区1的相对两侧。其中，第一列第一发光单元41受控于一个检测芯片43，第二列第一发光单元41受控于另一个检测芯片43。电连接于第一列第一发光单元41的检测走线42和电连接于第二列第一发光单元41的检测走线42相互独立且一起绕显示区1设置，以形成围绕所述显示区1的裂纹检测线，提高显示面板10的裂纹检测覆盖率。
在其他实施方式中，每一行第二开关单元51的一侧所对应的第一开关单元44的数量可以为多个。举例而言，在制备显示面板10时，在基板上形成N行*(M+m)列的开关单元，其中，第一列至第m列的开关单元为第一开关单元44，第(M+1)列至第(M+m)列的开关单元为第二开关单元51。其中，m为大于1的正整数。
在其他实施方式中，在M列中每一列第二开关单元51的一侧或两侧可以设有第一开关单元44。举例而言，在制备显示面板10时，在基板上形成(N+1)行*M列的开关单元，其中，第一行的开关单元为第一开关单元44，第2行至第(N+1)行的开关单元为第二开关单元51。另一种举例，在制备显示面板10时，在基板上形成(N+2)行*M列的开关单元，其中，第一行和最后一行的开关单元为第一开关单元44，第2行至第(N+1)行的开关单元为第二开关单元51。
可以理解的，以上的多种实施方式既可以独立存在，又可以相互结合。
在一实施例中，请一并参阅图4及图6，所述第二开关单元51为薄膜晶体管。所述第二开关单元51包括第一端p21、第二端p22及栅极g21。其中，所述第一端p21为源极且所述第二端p22为漏极，或者，所述第一端p21为漏极且所述第二端p22为源极。所述显示区1还设有电连接所述第二开关单元51的显示数据线53和显示控制线54。所述显示控制线54电连接于所述第二开关单元51的栅极g21。显示数据线53电连接于所述第二开关单元51的第一端p21。所述显示芯片55电连接于所述显示数据线53和所述显示控制线54，以对显示区1内的第二开关单元51进行扫描，以驱动第二发光单元52工作。所述检测芯片43电连接所述显示芯片。
以所述第二开关单元51为N型晶体管为例进行说明，当显示控制线54传输高电平至所述第二开关单元51的栅极g21时，所述第二开关单元51的第一端p21与第二端p22导通，以便于所述显示数据线53的数据电压写入所述第二开关单元51，进而控制第二发光单元52工作。所述检测走线42与所述显示数据线53相互独立且在同一制程中制得。所述检测控制线45与所述显示控制线54相互独立且在同一制程中制得。其中，所述检测走线42与所述显示数据线53相互独立是指所述检测走线42与所述显示数据线53没有直接连接，且所述检测走线42与所述显示数据线53所传输的信号不会相互干扰。同样地，所述检测控制线45与所述显示控制线54没有直接连接，且所述检测走线42与所述显示数据线53所传输的信号不会相互干扰。
通过设置显示数据线53与检测走线42相互独立，及显示控制线54与检测控制线45相互独立，以使裂纹检测单元4的第一发光单元41与显示面板10的显示区1的第二发光单元52互不影响，既确保显示面板10的显示品质，还提高了裂纹检测单元4的检测准确率。
本申请中，裂纹检测单元4在显示面板10上的布局方式包括但不限于以下的实施例。
在一实施例中，请参阅图3，所述外围区2包括设于所述显示区1相对两侧的第一区域21和第二区域22。所述第一区域21设有第一检测电路23。所述第二区域22设有第二检测电路24。所述第一检测电路23和所述第二检测电路24皆包括多个所述裂纹检测单元4。所述第一检测电路23和所述第二检测电路24关于所述显示区1的中心轴线对称设置，以使得显示面板10的相对两侧的宽度相同，从而促使显示面板10具有对称性。
具体的，请一并参阅图3及图4，第一检测电路23包括多个裂纹检测单元4。多个裂纹检测单元4共同电连接至一个检测芯片43。在一实施例中，每 个裂纹检测单元4包括一个第一开关单元44、一个第一发光单元41及电连接检测芯片43与第一开关单元44的检测走线42。第一检测电路23还包括检测控制线45。所述多个裂纹检测单元4共用检测控制线45。当第一检测电路23的多个第一开关单元44沿Y轴排成一列时，第一检测电路23的多个第一开关单元44可以共用一条检测控制线45，此时，该检测控制线45可以与显示区1内的显示控制线54相平行设置，且在同一制程中制备，简化显示面板10的制程。当然，在其他实施方式中，每个裂纹检测单元4内的第一开关单元44和第一发光单元41的数量可以根据实际情况调节，并不限于一个。
通过设置第一检测电路23和第二检测电路24分别位于显示区1的相对两侧，每侧的检测电路可包括多个裂纹检测单元4，每个裂纹检测单元4的检测走线42检测显示面板10上不同区域的裂纹。
在其他实施例中，第一检测电路23与第二检测电路24的结构不同，例如，第一检测电路23和第二检测电路24所包含的裂纹检测单元4的数量不同；或者，第一检测电路23与第二检测电路24所包含的裂纹检测单元4的数量相同但检测走线42的布局方式不同。
在一实施例中，请参阅图7，所述外围区2设有第一检测芯片46和第二检测芯片47。第一检测电路23电连接所述第一检测芯片46，第一检测芯片46用于控制所述第一检测电路23的多个第一发光单元41工作。所述第二检测电路24电连接与第二检测芯片47。第二检测芯片47用于控制所述第二检测电路24的多个第一发光单元41工作。
在一实施例中，请参阅图3，所述第一检测电路23的多个第一发光单元41沿所述第一区域21与所述显示区1的分界线排列。所述第一检测电路23的多条检测走线42靠近于所述第一区域21的第一边沿211且沿所述第一区域21的第一边沿211延伸。所述第一边沿211与所述第一区域21和所述显示区1的分界线相对。
本实施例中，请参阅图3，所述第一检测电路23的多个第一发光单元41沿所述第一区域21与所述显示区1的分界线依次排列。根据前述内容，第一发光单元41与第一开关单元44在Z轴方向上叠加设置。本领域技术人员可以根据所述第一发光单元41的布局推出第一开关单元44的布局。
其中，请参阅图3，所述第一检测电路23的多条检测走线42靠近于所述第一区域21的第一边沿211且沿所述第一区域21的第一边沿211延伸。换而言之，所述第一检测电路23的多条检测走线42靠近于显示面板10的边缘设置，以便于检测显示面板10边缘处的裂纹。可以理解的，所述第一检测电路 23的多条检测走线42与第一边沿211相对，以使第一检测电路23的多条检测走线42能够尽可能准确地检测第一边沿211是否受到裂纹的侵袭，尽可能减少裂纹遗漏。
在一实施例中，请参阅图7，所述第一检测电路23的多个第一发光单元41包括排列的第一单元411及第二单元412。所述第一单元411靠近于所述第一检测芯片46。电连接所述第一单元411的检测走线42包括相连接的第一纵向段421和第一横向段422。所述第一纵向段421的一端用于电连接至第一检测芯片46。所述第一纵向段421的另一端沿着所述第一边沿211延伸，直至对应于所述第一单元411的位置。所述第一横向段422连接于所述第一纵向段421与所述第一单元411之间。
具体的，第一单元411为最靠近所述第一检测芯片46的第一发光单元41。第一纵向段421沿Y轴延伸且靠近所述第一边沿211延伸，以检测第一边沿211的裂纹。所述第一纵向段421延伸至对应于所述第一单元411的位置是指，所述第一纵向段421的另一端在X轴方向上的正投影位于所述第一单元411及第一单元411的连接端所在的范围内。举例而言，第一单元411在Y轴方向上与第一检测芯片46的距离为10mm，第一单元411在Y轴方向上的尺寸为1mm，可以认为所述第一纵向段421的另一端在Y轴方向上与第一检测芯片46的距离为9.5mm～11.5mm，皆可以认为第一纵向段421延伸至对应于所述第一单元411的位置。第一横向段422沿X轴延伸，以电连接于所述第一纵向段421与第一单元411。可以理解的，第一横向段422可以用于检测第一边沿211与显示区1之间的裂纹，提高裂纹检测电路的裂纹检测覆盖率。
在一实施例中，请参阅图7，电连接所述第二单元412的检测走线42包括相连接的第二纵向段423和第二横向段424。所述第二纵向段423的一端用于电连接至第一检测芯片46。所述第二纵向段423的另一端沿着所述第一边沿211延伸，直至对应于所述第二单元412的位置。所述第二纵向段423延伸至对应于所述第二单元412的位置是指，所述第二纵向段423的另一端在X轴方向上的正投影位于所述第二单元412及第二单元412的连接端所在的范围内。该定义可以参考上一段的举例解释，在此不再赘述。第二横向段424沿X轴延伸，所述第二横向段424连接于所述第二纵向段423与所述第二单元412之间。同样地，第二横向段424与第一横向段422相搭配可以检测第一边沿211与显示区1之间的裂纹，提高裂纹检测电路的裂纹检测覆盖率。
在一实施例中，请参阅图7，所述第二纵向段423与所述第一纵向段421至少部分共线。换言之，所述第二纵向段423与所述第一纵向段421相复用， 以减少检测走线42的数量，进而减少第一检测电路23所占据第一区域21的位置，故而可以减少第一区域21的面积，减小显示面板10的非显示区1的尺寸，实现显示面板10的窄边框设计。
本实施例中，第一检测电路23的多个检测走线42的第一纵向段421和第二纵向段423合成一条总检测线，该总检测线靠近且沿第一边沿211设置，以检测第一边沿211处的裂纹。当所述第一单元411和第二单元412在驱动信号下不发光时，从而检测者可以判断出总检测线上对应于第一纵向段421的部分有裂纹。当所述第一单元411在驱动信号下发光及第二单元412在驱动信号下不发光时，从而检测者可PCT190040RY以判断出总检测线上对应于第二纵向段423的部分有裂纹。当所述第一单元411和第二单元412在驱动信号下都发光时，检测者可以判断没有裂纹。
在另一实施例中，请参阅图8，所述第一纵向段421位于所述第二纵向段423与所述第一单元411之间，以避免第二纵向段423与所述第一横向段422发生交叉。所述第一纵向段421与所述第二纵向段423并列设置。
本实施例中，当所述第二纵向段423受到裂纹应力而断裂时，由于第一纵向段421与所述第二纵向段423相并列设置，第一纵向段421可能不会受到裂纹的影响，进而能够更加准确地检测到裂纹的位置。
当所述第一单元411和第二单元412在驱动信号下都不发光时，说明裂纹侵袭了第一纵向段421和第二纵向段423，检测者可以判断出对应于第一纵向段421和第二纵向段423部分有裂纹。当所述第一单元411在驱动信号下发光，第二单元412在驱动信号下不发光时，检测者可以判断出第二纵向段423上除去与第一纵向段421相对应的部分有裂纹。当所述第一单元411在驱动信号下不发光，第二单元412在驱动信号下发光时，检测者可以判断出第一纵向段421有裂纹。当所述第一单元411和第二单元412在驱动信号下都发光时，检测者可以判断没有裂纹。
在再一实施例中，请参阅图9，所述第二纵向段423包括相错开的第一段425和第二段426。第一段425和第二段426皆沿Y轴方向延伸，但第一段425和第二段426在X轴方向上相错开。其中，所述第一段425靠近于所述显示区1。所述第一段425从所述第一检测芯片46延伸至对应于所述第一单元411的位置。对应于所述第一单元411的位置这一描述可以参考前述的解释。所述第二段426连接所述第一段425。具体的，所述第二段426通过沿X轴延伸的连接线连接所述第一段425。所述第二段426靠近且沿所述第一边沿211延伸。所述第二段426从对应于所述第一单元411的位置延伸至对应于所述第二单元 412的位置。所述第二横向段424连接于所述第二段426与所述第二单元412之间。
本实施例中，请参阅图9，第一纵向段421与第一段425相并列设置，当裂纹侵袭第一纵向段421时，第一段425可能不会受到侵袭，从而能够更加准确地检测到裂纹的位置。第一纵向段421与第二段426可以沿Y轴方向延伸，以使第一纵向段421与第二段426形成检测第一边沿211的裂纹检测线。每个裂纹检测单元4的检测走线42所检测的区域是没有重叠的，可准确地检测出裂纹的位置和数目。
当所述第一单元411和第二单元412在驱动信号下都不发光时，说明裂纹侵袭了第一纵向段421和第二段426，检测者可以判断出第一纵向段421和第二段426的部分有裂纹。当所述第一单元411在驱动信号下发光，第二单元412在驱动信号下不发光时，检测者可以判断出第二段426的部分有裂纹。当所述第一单元411在驱动信号下不发光，第二单元412在驱动信号下发光时，检测者可以判断出第一纵向段421有裂纹。当所述第一单元411和第二单元412在驱动信号下都发光，检测者可以判断没有裂纹。
当然，在其他实施例中，所述第一检测电路23的多个第一发光单元41还包括除了第一单元411和第二单元412之外的其他第一发光单元41。其他第一发光单元41的检测走线42的布局可以与第二单元412的检测走线42的布局方式相同。本领域技术人员可以根据第一单元411和第二单元412的检测走线42的布局，推测出两个以上的第一发光单元41时检测走线42的布局方式。
在一实施例中，请参阅图7，所述外围区2还包括连接于所述第一区域21与所述第二区域22的第三区域25和芯片区域26。所述第三区域25与所述芯片区域26分别设于所述显示区1的相对两侧。所述第一检测电路23的多个第一发光单元41包括靠近所述第三区域25的第三单元413。电连接所述第三单元413的检测走线428延伸至所述第三区域25内，以使所述第三单元413的检测走线428能够检测第三区域25的裂纹。所述芯片区域26用于设置驱动所述显示面板10显示的显示芯片55、第一检测芯片46及第二检测芯片47。
具体的，第三单元413为一个裂纹检测单元4中的第一发光单元41。第三单元413与上述实施例中的第二单元412之间可以设有一个或多个第一发光单元41，也可以不设有第一发光单元41。
在一实施例中，请参阅图7，所述第三区域25具有第二边沿251。所述第二边沿251与所述第三区域25和所述显示区1之间的分界线相对。电连接所 述第三单元413的检测走线428靠近于所述第二边沿251且沿所述第二边沿251延伸直至靠近所述第二边沿251的中点。
上述的实施例仅仅描述了第一检测电路23的布局，但是本领域技术人员根据第一检测电路23与第二检测电路24关于显示区1的中心轴线对称，可以推测出第二检测电路24的布局。
由于第一检测电路23与第二检测电路24关于显示区1的中心轴线对称，第一检测电路23中的检测走线428和第二检测电路24中的检测走线429皆可以相对地在第三区域25延伸，直至第一检测电路23中的检测走线428和第二检测电路24中的检测走线429靠近第二边沿251的中点，此时，第一检测电路23中的检测走线428和第二检测电路24中的检测走线429于第三区域25内相间隔且间距较小，以使第一检测电路23中的检测走线428和第二检测电路24中的检测走线429能够尽可能多地检测第二边沿251的裂纹。
具体的，显示芯片55设于与显示区1相对的位置，第一检测芯片46和第二检测芯片47设于显示芯片55的相对两侧。所述第一检测电路23和所述第二检测电路24分别电连接所述第一检测芯片46和所述第二检测芯片47。所述第一检测芯片46和所述第二检测芯片47用于电连接至所述显示芯片55。
在其他实施方式中，第一检测电路23中的检测走线428和第二检测电路24中的检测走线429在第三区域25内电连接。这样第一检测电路23和第二检测电路24可以共用一个检测芯片，以减少检测芯片的数量。
在其他实施方式中，第一检测电路23中的检测走线428和第二检测电路24中的检测走线429在第三区域25内相间隔但相交错，第一检测电路23中的检测走线428和第二检测电路24中的检测走线429在Y轴方向上至少部分重叠，以增加检测走线42对第二边沿251的裂纹的拦截长度，避免漏检。
在其他实施方式中，所述检测电路的数量可以为三个，所述第三区域25可以设有第三检测电路。第三检测电路的第一发光单元41及检测走线42可以与上述的实施例中第一检测电路23相同。
以上对本申请实施方式进行了详细介绍，本文中应用了具体个例对本申请的原理及实施方式进行了阐述，以上实施方式的说明只是用于帮助理解本申请的方法及其核心思想；同时，对于本领域的一般技术人员，依据本申请的思想，在具体实施方式及应用范围上均会有改变之处，综上所述，本说明书内容不应理解为对本申请的限制。

Claims (20)

  1. 一种显示面板，其特征在于，包括：
    显示区，所述显示区用于显示图像；
    外围区，包围所述显示区；及
    至少一个裂纹检测单元，所述至少一个裂纹检测单元设于所述外围区，所述裂纹检测单元包括第一发光单元及检测走线，所述检测走线的一端电连接于所述第一发光单元，所述检测走线的另一端用于接收驱动信号，当所述显示面板处于检测模式时，所述驱动信号用于驱动所述第一发光单元发光。
  2. 如权利要求1所述的显示面板，其特征在于，所述显示区设有第二发光单元，所述裂纹检测单元的第一发光单元与所述显示区的第二发光单元相互独立驱动。
  3. 如权利要求2所述的显示面板，其特征在于，所述显示面板还包括检测芯片和显示芯片，所述检测芯片电连接用于产生所述驱动信号，所述显示芯片电连接所述第二发光单元，以驱动所述第二发光单元工作；
    当所述显示面板处于显示模式时，所述显示芯片控制所述第二发光单元发光，且所述检测芯片控制所述第一发光单元不发光；当所述显示面板处于所述检测模式时，所述检测芯片控制所述第一发光单元发光，且所述显示芯片控制所述第二发光单元不发光。
  4. 如权利要求3所述的显示面板，其特征在于，所述检测芯片独立于所述显示芯片，或者，所述检测芯片集成在所述显示芯片内。
  5. 如权利要求2所述的显示面板，其特征在于，所述第二发光单元的数量为多个，多个所述第二发光单元呈阵列排布，所述裂纹检测单元的数量为多个，每个所述裂纹检测单元的第一发光单元对应一行所述第二发光单元，多个所述第一发光单元与多个所述第二发光单元在同一制程中制得。
  6. 如权利要求5所述的显示面板，其特征在于，所述裂纹检测单元还包括第一开关单元，每个所述第一开关单元电连接一个所述第一发光单元，且多个所述第一发光单元与多个所述第一开关单元在垂直于所述显示面板方向上层叠设置，所述第一开关单元用于控制所述驱动信号传输至所述第一发光单元的路径的通断。
  7. 如权利要求6所述的显示面板，其特征在于，所述第一开关单元为薄膜 晶体管，所述第一开关单元包括栅极、第一端及第二端，所述检测走线电连接所述第一端，所述第二端电连接所述第一发光单元；所述裂纹检测单元还包括检测控制线，所述检测控制线电连接所述栅极，所述检测控制线用于接收控制信号，所述控制信号用于控制所述第一端与所述第二端之间的通断，其中，所述第一端为源极且所述第二端为漏极，或者，所述第一端为漏极且所述第二端为源极。
  8. 如权利要求7所述的显示面板，其特征在于，所述显示区还设有阵列排布的多个第二开关单元，每个所述第二开关单元电连接一个所述第二发光单元，且所述第二发光单元与所述第二开关单元在垂直于所述显示面板方向上层叠设置，每个所述第一开关单元对应一行所述第二开关单元，所述第一开关单元与所述第二开关单元在同一制程中制得。
  9. 如权利要求8所述的显示面板，其特征在于，所述第二开关单元为薄膜晶体管，所述显示区还设有电连接所述第二开关单元的显示数据线和显示控制线，所述检测走线与所述显示数据线相互独立且在同一制程中制得，所述检测控制线与所述显示控制线相互独立且在同一制程中制得。
  10. 如权利要求1所述的显示面板，其特征在于，所述至少一个裂纹检测单元的检测走线靠近于所述显示面板的边缘且绕所述显示面板的显示区设置。
  11. 如权利要求1～10任意一项所述的显示面板，其特征在于，所述外围区包括设于所述显示区相对两侧的第一区域和第二区域，所述第一区域设有第一检测电路，所述第二区域设有第二检测电路，所述第一检测电路和所述第二检测电路皆包括多个所述裂纹检测单元，且所述第一检测电路和所述第二检测电路关于所述显示区的中心轴线对称设置。
  12. 如权利要求11所述的显示面板，其特征在于，所述第一检测电路的多个第一发光单元沿所述第一区域与所述显示区的分界线排列，所述第一检测电路的多条检测走线靠近于所述第一区域的第一边沿且沿所述第一区域的第一边沿延伸，所述第一边沿与所述第一区域和所述显示区的分界线相对。
  13. 如权利要求12所述的显示面板，其特征在于，所述第一检测电路的多个第一发光单元包括排列的第一单元及第二单元，所述第一单元靠近于用于产生所述驱动信号的检测芯片，电连接所述第一单元的检测走线包括相连接的第一纵向段和第一横向段，所述第一纵向段的一端电连接至所述检测芯片，所述第一纵向段的另一端沿着所述第一边沿延伸，直至对应于所述第一单元的位 置，所述第一横向段连接于所述第一纵向段与所述第一单元之间。
  14. 如权利要求13所述的显示面板，其特征在于，电连接所述第二单元的检测走线包括相连接的第二纵向段和第二横向段，所述第二纵向段的一端用于电连接至检测芯片，所述第二纵向段的另一端沿着所述第一边沿延伸，直至对应于所述第二单元的位置，所述第二横向段连接于所述第二纵向段与所述第二单元之间。
  15. 如权利要求14所述的显示面板，其特征在于，所述第二纵向段与所述第一纵向段至少部分共线；或者，所述第一纵向段位于所述第二纵向段与所述第一单元之间且与所述第二纵向段并列设置。
  16. 如权利要求14所述的显示面板，其特征在于，所述第二纵向段包括相错开的第一段和第二段，所述第一段靠近于所述显示区，所述第一段从所述检测芯片延伸至对应于所述第一单元的位置，所述第二段连接所述第一段，且所述第二段靠近且沿所述第一边沿延伸，所述第二段从对应于所述第一单元的位置延伸至对应于所述第二单元的位置，所述第二横向段连接于所述第二段与所述第二单元之间。
  17. 如权利要求11所述的显示面板，其特征在于，所述外围区还包括连接于所述第一区域与所述第二区域的第三区域和芯片区域，所述第三区域与所述芯片区域分别设于所述显示区的相对两侧，所述第一检测电路的多个第一发光单元包括靠近所述第三区域的第三单元，电连接所述第三单元的检测走线延伸至所述第三区域内；所述芯片区域用于设置驱动所述显示面板显示的显示芯片和驱动所述第一发光单元工作的检测芯片。
  18. 如权利要求17所述的显示面板，其特征在于，所述第三区域具有第二边沿，所述第二边沿与所述第三区域和所述显示区之间的分界线相对，电连接所述第三单元的检测走线靠近于所述第二边沿且沿所述第二边沿延伸直至靠近所述第二边沿的中点。
  19. 如权利要求17所述的显示面板，其特征在于，所述芯片区域设有第一检测芯片和第二检测芯片，所述第一检测电路和所述第二检测电路分别电连接所述第一检测芯片和所述第二检测芯片，所述第一检测芯片和所述第二检测芯片用于电连接至所述显示芯片。
  20. 一种显示装置，其特征在于，包括如权利要求1～19任意一项所述的显示面板。
PCT/CN2019/083667 2019-04-22 2019-04-22 显示面板及显示装置 WO2020215176A1 (zh)

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