WO2020174754A1 - Cutting tool - Google Patents

Abstract

The present invention provides a cutting tool comprising a base material and a coating covering the base material, wherein the coating includes an α-Al₂O₃ layer, and in the α-Al₂O₃ layer, the (0 0 12)-plane orientation index TC(0 0 12) is in the range of 4 to 8.5 inclusive, the (0 1 14)-plane orientation index TC(0 1 14) is in the range of 0.5 to 3 inclusive, and the total of the orientation index TC(0 0 12) and the orientation index TC(0 1 14) is no higher than 9.

Description

\¥02020/174754 1 卩 (: 17 2019/043090 Clarification

Title of invention: Cutting tool

Technical field

[0001] The present disclosure relates to a cutting tool. This application claims priority based on Japanese Patent Application No. 201 9-032641, which was filed on February 26, 2009. All contents described in the Japanese patent application are incorporated by reference into this specification.

Background technology

[0002] Conventionally, various studies have been made for the purpose of extending the life of cutting tools. For example, WO 201 3/037997 (Patent Document 1) discloses a cutting tool including a base material and a coating film formed on the surface of the base material.

Prior art documents

Patent literature

[0003] Patent Document 1: International Publication No. 201 3/037997

Summary of the invention

[0004] A cutting tool according to the present disclosure is

A cutting tool comprising a base material and a coating for coating the base material, wherein the coating includes «_ 8 ₂ 0 ₃ layers,

In eight丨₂ 〇 _three layers, - the "

The orientation index of the (0 0 1 2) plane represented by the following equation (1) ⁽ 3 (0 0

1 2) is 4 or more and 8.5 or less,

The orientation index of the (0 1 1 4) plane ⁽ 3 (0 1 1 4)) represented by the following formula (2) is ≧0.5 and is 3 or less,

The above orientation index ⁽ 3 (0 0 1 2) and the above orientation index 0 (0 1 1

The sum of 4) and 9 is 9 or less. \\0 2020/174754 卩(: 171?2019/043090

[Number 1]

In equations (1) and (2), I 1< I) indicates the X-ray diffraction intensity obtained when the X-port measurement is performed on the 1< I) plane,

1. (1< I) is the standard strength on the 《−8 丨₂ 〇 ₃ 1< 丨） plane shown in 0 1 0— 0 1 7 3 of

(11 1< I) planes are (0 1 2) planes, (1 0 4) planes, (1 1

0) plane, (1 1 3) plane, (0 2 4) plane, (1 1 6) plane, (3

Indicates either the (0 0) plane, the (0 0 1 2) plane, or the (0 1 1 4) plane.

Brief description of the drawings

[0005] [Fig. 1] Fig. 1 is a perspective view illustrating one embodiment of a base material of a cutting tool.

[FIG. 2] FIG. 2 is a schematic cross-sectional view of a cutting tool according to an aspect of the present embodiment.

FIG. 3 is Ru schematic sectional view showing the tissue structure of a conventional "_ eight丨₂ 〇 _three layers.

[FIG. 4] FIG.

It is a figure.

[FIG. 5] FIG. 5 is a schematic cross-sectional view of a cutting tool according to another aspect of the present embodiment. MODE FOR CARRYING OUT THE INVENTION

[0006] [Problems to be solved by the present disclosure]

In Patent Document 1, it is possible to improve the performance (for example, abrasion resistance) of a cutting tool by providing a <<_ 8 I 2 0 ₃ layer or the like in which the (○ 0 1) orientation is preferential on the base material. I am letting you. However, the priority of the (0 0 1) orientation is

«_ 8 丨₂ 〇 ₃ Layers with adjacent (0 0 1) oriented << _ _ 8 丨₂ 〇 ₃ bonds 〇 2020/174754 3 卩(: 171?2019/043090

It means that the crystal orientations of crystal grains are close to each other at high frequency. As a result, these crystal grains have a (0 0 1) orientation due to crystal growth in the same direction.

«- eight I ₂ 〇 ₃ crystal grains tend to become coarse. And, in general, eight I ₂ 〇 ₃ grain coarsening is likely to lead to welding of the "_ eight丨₂ 〇 _three layers decrease in wear resistance, or during cutting pressurized et. Under these circumstances, there is a demand for further improvement of cutting tools having a coating on the surface.

[0007] The present disclosure has been made in view of the above circumstances, and an object of the present disclosure is to provide a cutting tool having excellent wear resistance.

[0008] [Effects of the present disclosure]

Based on the above, it becomes possible to provide a cutting tool having excellent wear resistance.

[91 Description of Embodiment of Present Disclosure]

First, the contents of one aspect of the present disclosure will be listed and described.

[1] A cutting tool according to an aspect of the present disclosure,

A cutting tool comprising a base material and a coating for coating the base material, wherein the coating includes «_ 8 ₂ 0 ₃ layers,

In eight丨₂ 〇 _three layers, - the "

The orientation index ⁽ 3 (0 0 1 2)) of the (0 0 1 2) plane represented by the following formula (1) is 4 or more and 8.5 or less,

The orientation index of the (0 1 1 4) plane ⁽ 3 (0 1 1 4)) represented by the following formula (2) is ≧0.5 and is 3 or less,

The above orientation index ⁽ 3 (0 0 1 2) and the above orientation index 0 (0 1 1

The sum of 4) and 9 is 9 or less.

[Number 2]

/(0012) V ¹ /(/I ○

Ding (: (0012)

(0012) ⑴

〇 2020/174754 4 卩 (：171?2019/043090

In equations (1) and (2), I 1< I) indicates the X-ray diffraction intensity obtained when the X-port measurement is performed on the 1< I) plane,

1. (1< I) is the standard strength on the 《―8丨₂ ○ ₃ 1<丨） plane shown in 01 0—01 73

(11 1< I) planes are (0 1 2) planes, (1 0 4) planes, (1 1

0) plane, (1 1 3) plane, (0 2 4) plane, (1 1 6) plane, (3

Indicates either the (0 0) plane, the (0 0 1 2) plane, or the (0 1 1 4) plane.

[0010] The cutting tool has the (0 0 1) orientation by providing the above-described configuration.

As a result, the cutting tool has excellent wear resistance.

[0011] [2] above "_ eight丨₂ 〇 ₃ layer" includes the grain _ eight丨₂ 〇 _3,

The maximum grain size of the above-mentioned _ _ 8 ₂ 0 ₃ crystal grains is 3 or less,

Maximum particle size of the crystal grains is a value determined in a virtual plane parallel to the interface through a point distant丫from the interface of the I ₂ 〇 ₃ layer on the opposite side in the thickness direction to the substrate,

It is preferable that the above-mentioned value is obtained by the following formula (3) or the following formula (4).

丫 = ○ 0.5 X (X-1) / 2 + 0.5, but <3 (3) 丫 = 1, but 3 £ (4)

In formula (3) and formula (4), X is the above

The unit of the above is. However, it is >>.

By providing such a structure, the cutting tool has further excellent wear resistance.

[0012] [3] The orientation index 0 (0 1 1 4) is preferably 1 or more and 2.5 or less. By prescribing in this way, a cutting tool with even better wear resistance can be obtained.

[0013] [4] The thickness of the above-mentioned <<_ 8 丨₂ 0 ₃ layers should be 1 or more and 10 or less. 〇 2020/174754 5 卩 (：171?2019/043090

preferable. By defining in this way, it becomes a cutting tool having excellent wear resistance while maintaining good adhesion between the coating and the substrate.

[0014] [5] the coating further includes an intermediate layer that are provided between the substrate and the eight I ₂ 〇 _three layers,

The intermediate layer preferably contains a carbonate, a carbonitride oxide, or a boron nitride containing titanium as a constituent element. Thus in addition specified in abrasion resistance by, a cutting tool having excellent adhesion between the substrate and the "_ eight丨₂ 〇 _three layers and.

[6] The thickness of the coating film is preferably 1 or more and 30 or less.

By defining in this way, it becomes a cutting tool having excellent wear resistance while maintaining good adhesion between the coating and the substrate.

[0016] [7] above coating preferably comprises the further the outermost surface layer formed on the "_ eight丨₂ 〇 ₃ layer. By defining in this way, in addition to wear resistance, the cutting tool has excellent discriminating properties of the coating.

[Details of Embodiments of the Present Disclosure]

Hereinafter, one embodiment of the present disclosure (hereinafter referred to as “this embodiment”) will be described. However, the present embodiment is not limited to these. Note in the drawings used in the following description of embodiments, the ^_ reference numerals, the ^_ moiety or represents a significant portion. In the present specification, the notation in the form of "8-Mi" means the upper and lower limits of the range (that is, not less than 8 and not more than Min), and when there is no unit description in 8, but only in M The unit is the same as the unit of Mimi. Further, in the present specification, when a compound is represented by a chemical formula in which the ratio of the constituent elements is not limited, such as “Cho 1\1”, the chemical formula is the same as that of any of the conventionally known compositions (elements). Ratio) is included. In this case, the chemical formula shall include not only stoichiometric composition but also non-stoichiometric composition. For example, the chemical formula of "Ding 1\1" is not limited to the stoichiometric composition "Ding ₁ 1X1 _! "

Non-stoichiometric compositions such as " ₈ " are also included. The same applies to the description of compounds other than "Cho 1\1".

[0018] <<Surface coating cutting tool>> 〇 2020/174754 6 卩 (：171?2019/043090

The cutting tool according to the present embodiment,

A cutting tool comprising a base material and a coating for coating the base material, wherein the coating includes «_ 8 ₂ 0 ₃ layers,

In eight丨₂ 〇 _three layers, - the "

The orientation index of the (0 0 1 2) plane (3 (0 0 1 2)) represented by the above formula (1) is 4 or more and 8.5 or less,

The orientation index of the (0 1 1 4) plane (3 (0 1 1 4)) represented by the above formula (2) is not less than 0.5 and not more than 3,

The above orientation index (3 (0 0 1 2)) and the above orientation index 0 (0 1 1

4) and is less than 9.

The surface-coated cutting tool of the present embodiment includes a base material and a coating film that coats the base material (hereinafter, simply referred to as “cutting tool”). The above-mentioned cutting tools are, for example, drills, end mills, exchangeable cutting edges for drills, exchangeable cutting edges for end mills, exchangeable cutting edges for milling, exchangeable cutting edges for turning, metal saws, gear cutting tools. , Reamer, tap, etc.

[0020] <Substrate>

As the base material of the present embodiment, any base material conventionally known as this type of base material can be used. For example, the substrate is a cemented carbide (eg, tungsten carbide).

Base cemented carbide,

In addition to 0, it contains cemented carbide, and in addition to 0,

1\1 Cemented carbide with carbonitride added, etc.),

— Mets (mainly consisting of Ding Teng, Ding Ting 1\1, Ding Ting 1\1, etc.), high speed steel, ceramics (titanium carbide, silicon carbide, silicon nitride, aluminum nitride, aluminum oxide, etc.) ), a cubic boron nitride sintered body (Omi 1\1 sintered body) and a diamond sintered body are preferably contained.

[0021] Among these various base materials,

It is preferable to select base cemented carbide and cermet (particularly I-Ol\1 base cermet). The reason for this is that these base materials have an excellent balance of hardness and strength, especially at high temperatures. 〇 2020/174 754 7 卩 (: 171?2019/043090

This is because it has excellent properties as a base material.

[0022] FIG. 1 is a perspective view illustrating one embodiment of a base material of a cutting tool. A cutting tool with such a shape is used as a cutting edge exchange type cutting tip for turning.

[0023] The substrate 11 shown in Fig. 1 has a surface including an upper surface, a lower surface and four side surfaces, and as a whole, has a rectangular pillar shape that is slightly thin in the vertical direction. Further, a through hole penetrating the upper and lower surfaces is formed in the base material 11, and at the boundary portion of the four side surfaces, the adjacent side surfaces are connected with an arc surface.

[0024] In the above-mentioned base material 11, the upper surface and the lower surface form a rake surface 13, and the four side surfaces (and the arc surfaces connecting these to each other) form a flank surface and a rake surface 1 3 The arc surface connecting the flank and the flank forms the cutting edge portion 10. “Cake face” means the face from which the chips scraped from the work material are raked. The “flank surface” means the surface that is in contact with the work material. The cutting edge part is included in the part that constitutes the cutting edge of the cutting tool.

[0025] When the cutting tool is a cutting edge exchange type cutting tip, the base material 11 includes a shape having a chip breaker and a shape not having a chip breaker. The shape of the cutting edge 10 is a combination of sharp edge (ridge where rake face and flank intersect), honing (shape with sharp edge added), negative land (chamfered shape), and honing and negative land. Among the shapes, any shape is included.

The shape of the base material 11 and the name of each part have been described above with reference to FIG. 1. However, in the cutting tool according to the present embodiment, the shape and the name of each part corresponding to the base material 11 are described. For, the same terms as above will be used. That is, the cutting tool has a rake face, a flank face, and a cutting edge portion that holds the rake face and the flank face.

[0027] <Coating>

Coating according to the present embodiment includes an I ₂ 〇 ₃ layer provided on the substrate. The "coating" is intended to improve various characteristics such as fracture resistance and wear resistance of a cutting tool by coating at least a part of the above-mentioned base material (for example, a part of the above rake face). 〇 2020/174754 8 卩 (：171?2019/043090

It has the effect of increasing. It is preferable that the coating film covers not only a part of the base material but the entire surface of the base material. However, it does not depart from the scope of the present embodiment even if a part of the base material is not covered with the coating or the coating is partially different in structure.

[0028] The coating preferably has a thickness of 1 or more and 30 or less.

Here, the thickness of the coating, which will be described later eight I ₂ 〇 _three layers, the intermediate layer, outermost layer,及beauty other layers (e.g., undercoat layer, hard layer) of each layer constituting the coating, such as thickness Means the sum. The thickness of the coating film can be measured, for example, by measuring the cross section of the cutting tool with an optical microscope at a magnification of 100 times. Specifically, it can be obtained by measuring three arbitrary points on the cross section and taking the average value of the thicknesses of the three measured points. Described later "- eight I ₂ 〇 _three layers, the intermediate layer, the same applies to the case of measuring the outermost layer and other layers respectively thicknesses.

[0029] ((¾ ^_ 8 丨₂ 0 ₃ layers)

The <<_ 8 ₂ 0 ₃ layer of the present embodiment is a crystal grain of <<_ 8 ₂ 0 ₃ (aluminum oxide whose crystal structure is << type) (hereinafter, may be simply referred to as "crystal grain".) including. That is, the "_ eight丨₂ 〇 ₃ layer of polycrystalline" is a layer containing _ eight丨₂ 〇 _3.

[0030] The above "_ eight I ₂ 〇 ₃ layer, within a range not impairing the effects achieved by the cutting tool according to the present embodiment, may be included unavoidable impurities.

[0031] The above "- eight I ₂ 〇 ₃ layer, within a range not impairing the effects achieved by the cutting tool according to the present embodiment, may be provided directly on the substrate (e.g., Fig. 2), It may be provided on the above-mentioned base material via another layer such as a base layer, a hard layer, and an intermediate layer described later (for example, FIG. 5). The "- eight I ₂ 〇 ₃ layer, optionally other layers, such as the outermost surface layer provided thereon (e.g., Fig. 5). Moreover, the «- eight丨₂ 〇 _three layers may be the outermost layer of the coating.

[0032] In the present embodiment, a A ₂ 〇 ₃ layer preferably has a thickness of 1 or more 1 〇 less, more preferable arbitrarily be 3 or more 1 0 less. As a result, it is possible to exert the effect of further excellent wear resistance. 〇 2020/174754 9 卩 (：171?2019/043090

It The thickness can be measured, for example, by measuring the cross section of the cutting tool as described above with an optical microscope at a magnification of 1,000 times.

[0033] The above cutting tool is in the "_ eight丨₂ 〇 _three layers,

The orientation index (3 (0 0 1 2)) of the (0 0 1 2) plane represented by the above formula (1) is 4 or more and 8.5 or less,

The orientation index of the (0 1 1 4) plane (3 (0 1 1 4)) represented by the above formula (2) is not less than 0.5 and not more than 3,

The above orientation index (3 (0 0 1 2)) and the above orientation index 0 (0 1 1

4) and is less than 9.

[0034] In the above formula (1) and the above formula (2), I (

, I) plane shows the X-ray diffraction intensity obtained when measured [0] (X-ray diffraction measurement). Here, the X-ray diffraction intensity means the height of the peak in the diffraction chart obtained by measurement.丨. (

Indicates the standard strength on the (1<I) plane of <¾-8 1 ₂ 0 ₃ which is specified in 01 0- 01 73 of _ 0 0 3 force_. (1< 丨) planes are (0 1 2) planes, (1 0 4) planes, (1 1 0) planes, (1 1 3) planes, (0 2 4) planes,

(1 1 6) plane, (3 0 0) plane, (0 0 1 2) plane and (0 1

1 4) Shows any one of 9 faces.

[0035] Conventionally, "_ eight I ₂ 〇 ₃ layer was considered to be preferable in many cases the content of the crystal grains having the (x x 1) orientation. In other words, the __ 8 ₂ 0 ₃ layer is composed of crystal grains with (0 0 1) orientation as shown in Fig. 3.

It was considered ideal to consist of (columnar crystals 1 2 ₃ ). However, as described above, the priority of the (0 0 1) orientation is that the (_ 0 0 1) oriented <<_ 8 ₂ 0 ₃ crystal grains are adjacent to each other in the <- 8 0 ₂ 0 ₃ layer. This means that the crystal orientations are often close to each other. Therefore, "when you try to form a _ eight I ₂ 〇 _three layers, by these grains grown in the same direction (x x 1) has orientation" consisting of columnar crystals 1 23 as described above _ eight tend丨₂ 〇 ₃ crystal grains are coarse maximization. And, in general, eight I ₂ 〇 ₃ grain coarsening of 〇 2020/174 754 10 卩 (：171?2019/043090

Or it may lead to welding during cutting.

[0036] The present inventors have conducted diligent research in order to solve the above-mentioned problems.

0 1) Crystal grains with orientation

The presence of crystal grains 12 (1 column) having a (0 1 1 4) orientation between (columnar crystals 1 2 ₃ ) in a predetermined ratio (for example, FIG. 4) For the first time, we found that the coarsening of columnar crystals 1 2 ₃ was suppressed. In addition, the inventors of the present invention examined the relationship between the degree of presence of the crystal grains 1 2 ₃ having the (0 0 1) orientation and the crystal grains 1 2 having the (0 1 1 4) orientation and the orientation index. As a result, the orientation index of the crystal grains 1 2 ₃ having the (○ 0 1) orientation and the crystal grains 1 2 having the (0 1 1 4) orientation was 1 2 ₃ And (0 1 1 4) which is an index that reflects the presence ratio (volume ratio) of 12 crystal grains having orientation, and the orientation index of the (0 0 1 2) plane represented by the above formula (1). Ding (3 (0 1 12) is 4 or more and 8.5 or less, and the orientation index (0 1 1 4) of the (0 1 1 4) plane represented by the above formula (2) is 0. It was found that it was not less than 5 and not more than 3. Since the coarsening of the columnar crystals 1 2 3 was suppressed, the cutting tool had excellent wear resistance.

[0037] In the present specification, when discussing the orientation of crystal grains, (0 0

1 2) The orientation corresponding to the plane is expressed as “(0 0 1) orientation”. This is because the orientation corresponding to the (0 0 1 2) plane and the orientation corresponding to the (0 0 1) plane are the same. On the other hand, when discussing the orientation index, “Cho (0 0

1 2)”, etc., and is expressed by the Miller index of the crystal plane corresponding to the orientation index.

[0038] The above-mentioned orientation index (0 0 1 2) can be obtained by, for example, a mouth measurement performed under the following conditions. Specifically, the "- eight for丨₂ 〇 _three layers any one point definitive to perform the X-ray diffraction measurements were obtained based on the equation (1) (0 0 1 2) plane orientation the index and the orientation index Ding 〇 (0 0 1 2) in the eight丨₂ 〇 _three layers. However, the above "any one point" 〇 2020/174754 11 卩 (：171?2019/043090

When selecting, exclude points that show abnormal values at first glance. Te present embodiment smell, the <because of high uniformity _ resistance ¾ ^_ eight丨2_Rei three layers, the <¾- eight丨2_Rei for a plurality of points in the three-layer oriented index Ding 0 (0 0 1 2) The inventors of the present invention believe that no significant difference is found even if The orientation index (0 1 1 4) can also be obtained by the same method as above. Note that the "- if eight丨₂ 〇 ₃ layer on the outermost surface layer or the like is formed, the eight I by polishing the outermost layer or the like, since to expose the 〇 _three layers, the X port measurement I will do it.

[0039] (Conditions for X-ray diffraction measurement)

X-ray output 451 <, 200 0 18

X-ray source, wavelength

1.54 1 862

Detector 〇 / 1 e X

IV a 250

Scan axis 20/0

Longitudinal restriction slit width 2.0 0! 0!

Scan mode 〇 〇 1 \ 1 丨 1 \ 111 〇 113

Scan speed 20°/〇! 1 门

The above-mentioned orientation index (0 1 1 4) is preferably 1 or more and 2.5 or less, and more preferably 1.4 or more and 2.4 or less.

The orientation index (3 (0 0 12)) is preferably 4.5 or more and 7.5 or less, and more preferably 5.9 or more and 7.1 or less.

[0042] The above "_ eight丨₂ 〇 ₃ layer" includes the grain _ eight丨₂ 〇 _3,

The "_ eight丨₂ 〇 ₃ crystal grains, it is favorable Mashiku its maximum particle diameter is 3 or less, more preferably 2 to 3.

Maximum particle size of [0043] the crystal grains obtained in a virtual plane parallel to the interface 3 through a point distant丫in the thickness direction from the interface 3 of the I ₂ 0 ₃ layer in the opposite to the substrate Value (see, for example, Figure 4). Here, if the "_ eight I ₂ 0 ₃ layer is the outermost layer of the coating, the interface 3 may clear picture with the surface of the coating. The drop is calculated by the following equation (3) or the following equation (4). Here, equation (3) and (4), X the "_ eight丨₂ 〇 _three layers thick () 〇 2020/174754 12 卩 (：171?2019/043090

Indicates. That is, the unit of X above is. However, the value of丫, because does not exceed the thickness of the "_ eight I ₂ 〇 _three layers, it is say yes>丫.

From the viewpoint of exhibiting wear resistance, the maximum grain size of the above-mentioned <<_8 I ₂ 0 ₃ crystal grains near the interface of the I ₂ 0 ₃ layer (that is, the depth position that satisfies Equation (4)) the maximum particle size at a point of the丨₂ 〇 ₃ crystal grains) are considered the inventors to be critical. However, the "- eight if丨₂ 〇 _three layers thickness X of less than 3 01, the depth position丫satisfying the above formula (4) (i.e., 1

Point) is, hard to no longer say that the vicinity of the interface between the above-mentioned "_ eight丨₂ 〇 _three layers. for that reason,

If it is less than the above, at the point of the depth position that satisfies the formula (3),

Decided to

丫 = ○ 0.5 X (X-1) / 2 + 0.5, (B <3) (3)

丫 = 1, (3 £ 乂) (4)

[0044] The maximum particle size of the crystal grains is specifically determined from the color map at "_ eight丨₂ 〇 _three layers of the cross-section made by the following procedure. First <¾- eight丨₂ 〇 ₃ layer formed on the substrate based on the production method described below. Then, "a _ eight I ₂ 〇 _three layers, including such substrates" formed - cut to a cross-section perpendicular to obtain the eight I ₂ 〇 _three layers. That is, the cut surface obtained by cutting the eight I ₂ 〇 _three layers a plane including the normal line of the interface 3 is cut to expose. After that, the cut surface is polished with water-resistant abrasive paper (containing 3 <3 abrasive grains as an abrasive).

[0045] The above cleavage, for example, "- eight丨₂ 〇 _three layers 1 2 of surface (" - if eight丨₂ 0 ₃ layer 1 2 outermost layer such as another layer is formed thereon in The surface of the coating) is adhered and fixed on a sufficiently large flat plate using wax or the like, and then cut in a direction perpendicular to the flat plate with a rotary blade cutting machine (the rotary blade and the flat plate are Cut as vertically as possible). This cleavage such as long as performed with respect to the vertical direction, it is "_ eight丨₂ 〇 ₃ layer 1 2 lines at any site of Ukoto.

[0046] Further, the above polishing is performed using the above water-resistant abrasive paper (#400, #800). 〇2020/174754 13 卩(：171?2019/043090

, # 150 0 in order). The number (#) of water-resistant abrasive paper means the difference in particle size of the abrasive, and the larger the number, the smaller the particle size of the abrasive.

Subsequently, the above-mentioned polished surface is further smoothed by “ion milling treatment with ions. The conditions of the ion milling treatment are as follows.

Acceleration voltage

Irradiation angle "_ eight I ₂ 〇 _three layers in the normal direction of the interface 3 (i.e. that put on the cut surface" 0 ^° from _ eight丨₂ 〇 _3-layer linear direction parallel to the thickness direction of)

Irradiation time: 6 hours.

[0048] Next, the smoothed cross section (mirror surface) was subjected to a field emission scanning electron microscope equipped with an electron beam backscattering diffractometer (Mitsumi 30 device) (M__3!!/ 1) (Product name: "311660", manufactured by Hitachi High-Technologies Corporation) is used for observation, and the obtained observation image is analyzed by Mitsumi 300. The position for observing the above-mentioned smoothed cross section is not particularly limited, but in consideration of the relationship with cutting characteristics, it is preferable to observe the vicinity of the cutting edge portion 10. The observation magnification for Min_3_Min 1\/1 shall be 500 times.

[0049] For analysis, data are collected in sequence by individually positioning a focused electron beam on each pixel. Sample surface (smoothed

The normal of is tilted at 70° to the incident beam, and the analysis is performed at 1 5 1 <V. A pressure of 10 3 is applied to avoid charging effects. Use a high current mode in combination with an aperture diameter of 600 or 120. Data collection, on the section, 5 0 ( "-丨₂ 〇 _3-layer direction parallel to the interface 3)

Conduct at 0,005/step for 1 0 0 0 X 6 00 points corresponding to the surface region (observation region) of («- 8 1 ₂ 0 ₃ layer thickness direction). At this time, the number of fields of view to be measured is not particularly limited, and one field may be used. However, when selecting the above-mentioned observation areas, the observation areas that show abnormal values at first glance are excluded. In the present embodiment, since the «_ 8 ₂ 0 ₃ layer has high uniformity, the maximum grain size of the crystal grains for a plurality of observation regions in the «—I ₂ 0 ₃ layer is 〇 2020/174 754 14 卩 (: 171?2019/043090

The inventors of the present invention believe that no significant difference is found even if

[0050] The above EBS D analysis result is analyzed using commercially available software (trade name: "orientation I magingmicroscopy Ver 6.2", manufactured by ED AX) to create the above color map. Specifically, first to identify the crystal orientation of the crystal grains contained in the cross-section of A_A I ₂ 〇 _three layers 1 2. The crystal orientation of each crystal grain specified here is a plan view of each crystal grain appearing in the cross section of the aA I ₂ O ₃ layer 12 from the direction normal to the cross section (direction penetrating the paper in Fig. 4). This is the crystal orientation sometimes observed. Then, based on the crystallographic orientations of the obtained crystal grains, the normal line of the interface S of the aA I ₂ O ₃ layer 12 (that is, the interface S of the AI ₂ O ₃ layer on the opposite side of the base material). The orientation of each crystal grain in the direction is specified. Then, a color map is created based on the specified crystal orientation. In the created color map, the grain boundaries of each crystal grain can be identified. The method of "C rista ID irection MAP" included in the above software can be used to create the color map. The color map is created over the entire area in the thickness direction of the aA ₂ 0 ₃ layer 1 2 observed on the cut surface. In addition, in the present embodiment, the interface S of the a-A 丨₂ 0 ₃ layer 12 is in the base material on the side opposite to the base material in the direction normal to the main surface of the base material in the color map. The center of a straight line passing through the farthest point and parallel to the main surface of the base material and a straight line passing through the closest point to the base material on the opposite side of the base material and parallel to the main surface of the base material It is a straight line that passes through. However, when selecting the “point closest to the base material” and the “point farthest from the base material” mentioned above, points that seem to be abnormal at first glance are excluded.

[0051] Fig. 4 is a schematic cross-sectional view showing the tissue structure in the a_A I ₂ 0 ₃ layer of the present embodiment. It is understood as a color map created based on the cross section of the a-A ₂ 0 ₃ layer. You can also do it. In FIG. 4, crystal grains 12 a (columnar crystals 12 a) show crystal grains having a (0 0 1) orientation, and crystal grains 12 b (columnar crystals 12 b) are (0 1 1 4) A crystal grain having an orientation is shown.

[0052] The grain size of the crystal grains of the present embodiment is 〇2020/174754 15 卩(：171?2019/043090

Virtual plane? Is obtained as the distance between two points where the straight line and the outer circumference (grain boundary) of the crystal grain intersect. By such a method, the grain sizes of all the crystal grains existing in the measurement visual field are determined, and the maximum grain size among these is determined. The maximum particle size it was asked to "maximum particle size of the" _ I ₂ 〇 ₃ of grain ".

[0053] (Intermediate layer)

The coating preferably further comprises an intermediate layer provided between the substrate and the I ₂ 〇 _three layers. The intermediate layer preferably contains a carbonate, a carbonitride oxide, or a boron nitride containing titanium (1) as a constituent element. As a result,

The improvement of wear resistance is effectively obtained. In one aspect of the present embodiment, the intermediate layer is preferably made of one compound selected from the group consisting of carbonates, carbonitride oxides, and boronitrides containing D as a constituent element. That is, it is preferable that the above-mentioned intermediate layer is made of a compound represented by _, _, _, I/\, or 1/\. It is preferable that the intermediate layer is a layer of a layer of 1×10 (a layer made of a compound represented by a layer of 1×10).

[0054] The intermediate layer may contain inevitable impurities as long as the effect of the cutting tool according to the present embodiment is not impaired.

[0055] The thickness of the intermediate layer is preferably 2 or less, and more preferably 0.5 or more and 1.5 or less. The thickness can be measured, for example, by measuring a cross section of the above-described cutting tool with an optical microscope at a magnification of 100 times.

[0056] (Outermost layer)

The coating is

It is preferable. By doing so, in addition to wear resistance, the cutting tool has excellent discriminating properties of the coating. It is preferable that the outermost surface layer is made of a compound represented by TOKYO TEN, TONE 1\1 or TET TEN 1\1. The toughness of the coating is improved when the outermost surface layer is made of the compound represented by the formula (3, T. 1\1 or T. O. 1\1).

The outermost surface layer does not impair the effects of the cutting tool according to this embodiment. 〇2020/174754 16 卩(：171?2019/043090

In the enclosure, inevitable impurities may be contained.

[0058] The outermost surface layer preferably has a thickness of not less than 0.1 and not more than 20!, more preferably not less than 0.30! and not more than 0.6!!. The thickness can be measured, for example, by measuring the cross section of the cutting tool as described above with an optical microscope at a magnification of 100 times.

[0059] (Other layer)

The coating may further contain other layers as long as the effects of the present embodiment are not impaired. Examples of the other layer include a base layer provided directly on the base material, and a hard layer provided between the base layer and the intermediate layer. The hard layer may have a composition different from that of the intermediate layer. By including the underlayer, the film is improved in adhesion to the substrate. As the above-mentioned underlayer, for example, a layer made of Ting 1\! The wear resistance of the coating film is further improved by including the hard layer. The hard layer may be, for example, a layer made of Tengai 0\1.

[0060] <<Method for manufacturing surface-coated cutting tool>>

The manufacturing method of the cutting tool according to the present embodiment,

A method of manufacturing the above cutting tool,

A step of preparing the base material (hereinafter, referred to as “first step”),

Generating a "_ eight丨₂ 〇 ₃ nuclei on the substrate (hereinafter," second-step "gutter U) and,

The "_ eight丨₂ 〇 from ₃ nuclei" _ eight丨₂ 〇 _third step of growing a crystal (hereinafter, referred to as "third step") and a,

The second step is performed by a chemical vapor deposition method comprises feeding a raw material gas containing 1 \ 1 ₂ gas. Hereinafter, each step will be described.

[0061] <Process _>

In the first step, the base material is prepared. As the above-mentioned substrate, any substrate can be used as long as it is a conventionally known substrate of this type as described above. As a method for preparing the above-mentioned base material, a commercially available product may be purchased, or 〇 2020/174 754 17 卩 (：171?2019/043090

It may be manufactured from raw materials. For example, when the above-mentioned base material is made of cemented carbide, raw material powders having the compounding composition (mass %) described in the examples below are uniformly mixed using a commercially available attritor, and then this mixed powder is used. A predetermined shape (for example, model number manufactured by Sumitomo Electric Ehard Metal Co., Ltd.

The after pressure molding, at 1 3 0 0~ 1 5 0 0 ° 〇 less at a given sintering furnace, 1

The above base material made of cemented carbide can be obtained by sintering for 2 hours.

Is the shape of an exchangeable cutting tip for turning (see, for example, Figure 1).

[0062] <Second step>

In the second step, on the above substrate

The second step is performed by a chemical vapor deposition method and includes supplying a source gas containing N ₂ gas.

[0063] Here, "on the substrate

And is on the upper side of the substrate "_ eight丨₂ 〇 ₃ nuclei has only to be generated. In other words, "_ eight丨₂ 〇 ₃ nuclei may be generated just above the base material, the base layer, the hard layer, through other layers such as intermediate layers on said substrate It may be generated.

[0064] On the base material

It is performed by a chemical vapor deposition (〇 necked method), by supplying raw material gas including 1 \ 1 ₂ gas, to produce a "_ eight I ₂ 〇 ₃ nuclei. That is, the second step, more runs in a chemical vapor deposition method comprises feeding a raw material gas containing 1 \ 1 ₂ gas. Here, the "raw material gas" in the second step, the raw material gas to produce a "_ eight I ₂ 〇 ₃ nuclear stations, to taste.

Conventionally, 1 \ 1 ₂ gas was used for the purpose of forming nitrides in "_ eight I ₂ 〇 ₃ except layer a layer of the coating. However, for the purpose of controlling the orientation of the "_ eight I ₂ 〇 _three layers, on to the substrate

This is the first time that the present inventors have done so. 1 \ 1 ₂ gas described above is the production phase

Because it does not give a change in the composition of the eight I ₂ 〇 ₃ nuclei, the present inventors acting as a catalyst is considered. 〇 2020/174 754 18 卩 (: 171?2019/043090

[0065] Specifically, first hundred ₂ as a source gas, 1 \ 1 _2, ^1-1_Rei丨, eight丨〇丨_3, N ₂ 3 and? - 1 ₂ is used. The amount is, for example, a hundred ₂ 〇. 5-2 vol%, a 1 \ 1 ₂ 2-1 5 vol%, 1 ^to 1_Rei I 〇. 5-4 vol%, the eight I 〇 I ₃ 5 to 13% by volume, 1 ^to 1 ₂ 3 are set to 0.1 to 3% by volume, and the balance is

And the like.

[0066] The temperature in the reaction vessel during the reaction in the second step is preferably 970 ^° to 1030 ^° .

[0067] The pressure in the reaction vessel during the reaction in the second step was 80 ₃ to 150 ^ 9

It is preferably 3.

[0068] The total gas flow rate during the reaction in the second step was 301_/○ 1 丨n~ 1 00 !_/○!

It is preferably I.

The reaction time in the second step is preferably 2 minutes to 60 minutes,

It is more preferably 5 minutes to 40 minutes.

[0069] <Third step>

In the third step, the above-mentioned <¾_ eight丨₂ from 〇 ₃ of the nucleus (¾_ eight丨2_Rei 3 of the crystal Ru grown. Above "_ eight丨₂ 〇 from ₃ nuclear" _ eight丨₂ 〇 ₃ The method for growing the crystal of is carried out by the XX method.

[0070] Specifically, first, as a raw material gas, 〇 〇 ₂ , 1 ^to 100 丨, 8 丨 〇 丨₃ ,

Use 2. The amount is, for example, a hundred ₂ 〇. 5-3 vol%, 1 ^to 1_Rei丨a 4-6% by volume, the eight I 〇 I _3. 5 to 1 3 vol%,

1 to 3% by volume, and the balance is !· 1 ₂ .

[0071] The temperature in the reaction container during the reaction in the third step is preferably 950° to 1050°.

The pressure inside the reaction vessel during the reaction in the third step is preferably 10 ₃ to 80 ₃ .

[0073] The total gas flow rate during the reaction in the third step was 301_/〇 1 丨n~ 100 00 _/〇!

It is preferably I.

The reaction time in the third step is film formation

It can be changed as appropriate. 〇 2020/174 754 19 卩 (: 171?2019/043090

[0074] <Other processes>

In the manufacturing method according to the present embodiment, in addition to the above-described steps, other steps may be appropriately performed within a range that does not impair the effects of the present embodiment.

[0075] In the present embodiment, before the second step, a step of forming an underlayer, a hard layer or an intermediate layer on the base material may be included. In the present embodiment, after the third step,

[0076] When the underlayer, the hard layer, the intermediate layer or the outermost surface layer described above is formed, the layers may be formed by a conventional method.

[0077] The above description includes the features described below.

(Appendix 1)

A surface-coated cutting tool comprising a substrate and a coating covering said substrate, said coating comprises a "_ eight丨₂ 〇 _three layers,

In the "_ eight丨₂ 〇 _three layers,

The orientation index of the (0 0 1 2) plane represented by the following equation (1) (3 (0 0

1 2) is 4 or more and 8.5 or less,

The orientation index of the (0 1 1 4) plane (3 (0 1 1 4)) represented by the following formula (2) is ≧0.5 and is 3 or less,

The orientation index (3 (0 0 1 2)) and the orientation index 0 (0 1 1

4) Surface coated cutting tools with a total of 9 and less.

[Number 3]

(In formula (1) and formula (2), I (11

I) Shows the X-ray diffraction intensity obtained when the X-port is measured on the surface, 20/174754 20 卩 (: 171?2019/043090

1. (1<I) is the standard strength on the 《-8 丨₂ 〇 ₃ 1< 丨） plane as shown in 01 0—01 73 of ◯ 03 force,

(11 1 <I) planes are (0 1 2) planes, (1 0 4) planes, (1 1

0) plane, (1 1 3) plane, (0 2 4) plane, (1 1 6) plane, (3

Indicates either the (0 0) plane, the (0 0 1 2) plane, or the (0 1 1 4) plane. )

(Appendix 2)

The "- eight I ₂ 〇 ₃ layer" - includes a grain eight I ₂ 〇 _3,

The "_ eight丨₂ 〇 ₃ crystal grains, the maximum particle diameter of 3 or less, the maximum grain size of the crystal grains, the at side opposite to the substrate

It is a value obtained in an imaginary plane parallel to the interface passing through a point distant from the interface of the I ₂ 0 ₃ layer in the thickness direction,

The surface coating cutting tool described in Appendix 1 is obtained by the following equation (3) or the following equation (4).

丫 = ○ 0.5 X (X-1) / 2 + 0.5 (乂<3) (3)

丫 = 1 (3 £) (4)

(In the formulas (3) and (4), X represents the thickness () of the above-mentioned _ _ 8 ₂ 0 ₃ layer.

(Appendix 3)

The surface-coated cutting tool according to Appendix 1 or 2, wherein the orientation index (3 (0 1 1 4) is 1 or more and 2.5 or less.

(Appendix 4)

The surface-coated cutting tool according to any one of appendices 1 to 3, wherein the thickness of the «_ eight-third layer is 1 or more and 10 or less.

(Appendix 5)

The coating further includes an intermediate layer provided between the substrate and the I ₂ O ₃ layer,

The intermediate layer is composed of a carbonate, a carbonitride oxide, or a nitrous oxide containing gallium as a constituent element. 〇 2020/174754 21 卩 (：171?2019/043090

The surface-coated cutting tool according to any one of appendices 1 to 4, including a compound.

(Appendix 6)

The surface coating cutting tool according to any one of appendices 1 to 5, wherein the coating has a thickness of 1 or more and 30 or less.

(Appendix 7)

The coating is

, The surface-coated cutting tool according to any one of Appendix 1 to Appendix 6.

Example

Hereinafter, the present invention will be described in detail with reference to Examples, but the present invention is not limited thereto.

[0079] <<Preparation of cutting tool>>

<Preparation of substrate>

First, as a first step, a base material to be coated with a coating film was prepared. Specifically, raw material powders having the following composition (mass %) were uniformly mixed using a commercially available attritor to obtain mixed powders.

Composition of raw powder

〇 〇 7 mass%

〇 r ₃ C ₂ 0.5 mass%

1\1 cup ○ 3.5% by mass

Ding ₃ ○ 1.0 mass%

Balance

[0080] Next, this mixed powder was pressure-molded into a predetermined shape (model number 〇 1\/1 〇 1 204081\1_11 manufactured by Sumitomo Electric Hardmetal Co., Ltd.), and the obtained compact was formed. A substrate made of cemented carbide was obtained by placing it in a sintering furnace and sintering it at 1300 to 1500 ^° for 1-2 hours.

"204081\1-11" is the shape of a cutting edge exchange type cutting tip for turning.

<Formation of coating>

On the surface of the base material, the underlayer, the hard layer, the intermediate layer, and 《-VIII I ₂ 〇 ₃ shown in Table 4 were used. 〇 2020/174 754 22 卩 (: 171?2019/043090

A film was formed on the surface of the substrate by forming the layer and the outermost layer in this order. The method for producing each layer constituting the coating film will be described below.

(Formation of Underlayer, Hard Layer, and Intermediate Layer)

Under the film forming conditions shown in Table 1, a reaction gas having the composition shown in Table 1 was jetted onto the surface of the base material to form an underlayer, a hard layer and an intermediate layer in this order.

[0083] [Table 1]

[0084] («_ eight I ₂ 0 ₃ layer formation)

Furnace pressure 100 3, reaction temperature 100 0 ° 〇, gas flow rate

Under the film forming conditions of n, the reaction gas having the composition shown in Table 2 is jetted onto the surface of the intermediate layer at the time shown in Table 2.

(Second step). In addition, in the sample N 0.10, the treatment corresponding to the second step was not performed.

[0085]

〇 2020/174754 23 卩(: 171?2019/043090

[Table 2]

[0086] Next, a reaction gas having the composition shown below was formed under the film forming conditions of a furnace pressure of 353, a reaction temperature of 100 000 °, and a gas flow rate of 7 01 _ / 〇 1 门. , the intermediate layer near Ru said "- and ejected on the eighth丨₂ 〇 ₃ nuclei" - were grown viii丨₂ 〇 ₃ crystals (third step). By the above procedure, to form a "_ eight丨₂ 〇 _three layers.

Reaction gas composition in the third step

〇 〇 ₂ : 2% by volume

1 ^to 10 1 :2 volume%

Eight I (3 I ₃ : 10% by volume

N ₂ 3:. 〇 5 vol%

1 ^~ 1 ₂ :Remaining

(Formation of outermost surface layer)

Under the film forming conditions shown in Table 3, the reaction gas having the composition shown in Table 3 was added. 〇 2020/174754 24 卩 (：171?2019/043090

a- A \ ₂ 0 It spouted on the surface of ₃ layers and formed the outermost layer.

[0088] [Table 3]

[0089] The cutting tools of Samples N 0.1 to 10 were manufactured by the above procedure. Sample 1\!〇.1〜

Six cutting tools correspond to the examples. The cutting tools of sample N 0.7 to 10 correspond to the comparative example.

[0090] <<Evaluation of cutting tool characteristics>>

<Measurement of orientation index>

. Above manner Sample 1 \ 1_Rei produced 1 with 1 0 cutting tool, each cutting tool by X-ray diffraction measurement "-丨₂ 〇 number orientation finger of each orientation plane in the _three-layer It was measured. The measurement was performed under the following conditions. First, the "- polished viii丨₂ 〇 ₃ layer form made is the outermost layer and to expose the eight I ₂ 〇 _three layers. Then "one arbitrary point in _ eight I ₂ 〇 _three layers were measured X-ray diffraction seek orientation index of each orientation plane. Orientation index ⁽ 3 (0 0 1 2) and orientation index ⁽ 3 (0 1

Table 2 shows the results focusing on 14). Note that the "- eight丨₂ 〇 for the points multiple of _three layers orientation index Ding 0 (0 0 1 2) and the alignment index Ding ⁽³ (0

1 1 4) was calculated, but no significant difference was found.

[0091] (Conditions for X-ray diffraction measurement)

X-ray output 451 <, 200 0 18

X-ray source, wavelength

1.54 1 862

Detector 〇 / 1 e X

IV a 250

Skiyan axis 26/6

Longitudinal limit slit width 2.00 101

Scan mode 〇 〇 1 \ 1 丨 1 \ 111 〇 113

Sukiyan speed 20°/〇! 1 门

[Measurement of thickness of coating film, etc.] 〇 2020/174 754 25 卩 (: 171?2019/043090

The thickness of the coating, and the underlying layer, hard layer, intermediate layer, <<_8 I ₂ 03 layer and outermost layer that compose the coating are measured in the direction normal to the surface of the substrate using an optical microscope. It was determined from parallel cross-section samples. The results are shown in Table 4.

[0093] [Table 4]

[0094] <«__Measurement of maximum grain size of crystal grains in I ₂ O ₃ layer>

The following procedure to measure the maximum grain size of crystal grains in "_ eight I ₂ 〇 _three layers. First, and cutting the cutting tool as a cross section perpendicular to obtain the (interface opposite to the substrate) the interface I ₂ 〇 _three layers in the film. Thereafter, the resistance to water abrasive paper cut surfaces (# 4 0 0, # 8 0 0, # 1 5 0 0) carried out polished with "- to prepare a working surface of丨₂ 〇 three layers. Subsequently, the above-mentioned machined surface was further smoothed by ion milling treatment with eight ions. The conditions of the ion milling treatment are as follows.

Acceleration voltage

Irradiation angle: 0 ^° from the normal direction of the interface of the _ 8 I ₂ 0 ₃ layer (that is, the linear direction parallel to the thickness direction of the _ _ 8 _ ₂ 0 ₃ layer at the cut surface)

Irradiation time: 6 hours

[0095] The processed surface thus prepared was processed by using MINAMI 3MI 1\/1 (manufactured by Hitachi High-Technologies Co., Ltd., trade name: "3 11 6600") equipped with MINAMI 30 Watch at 0x magnification 〇 2020/174 754 26 卩 (：171?2019/043090

The observation area of 50 yu, m (a direction parallel to the interface S of AI ₂ 0 ₃ layers) X 30 yu,m (aA thickness direction of ₂ 0 ₃ layers) on the processed surface is described above. Created a color map of. Specifically, to identify the crystal orientation of the free Murrell each crystal grain in the cross-section of the first a- A丨₂ 〇 _three layers. Here crystal orientation position of each crystal grain is identified, the respective crystal grains appearing on the cross section of aA I ₂ 0 ₃ layer, when viewed in plan from a normal direction of the cross section (direction penetrating the paper surface in FIG. 4) This is the observed plane orientation. Then, based on the crystal orientation of the crystal grains obtained in the normal Direction of the interface of aA I ₂ 〇 _three layers (i.e., the interface of the a- AI ₂ 〇 ₃ layer on the opposite side of the substrate) The plane orientation of each crystal grain was specified. Then, a color map was created based on the specified plane orientation. For each color map, a commercially available software (trade name: "Orientation I maging Microscopy Ver 6.2", manufactured by EDAX) was used to determine the grain size of all the crystal grains present in each measurement visual field. Was calculated, and the maximum particle size among these was calculated. The results are shown in Table 5.

[0096] [Table 5]

[0097] <<Cutting test>> 〇 2020/174 754 27 卩 (: 171?2019/043090

The following cutting tests were performed using the cutting tools of Sample 1\0.1 to 10 manufactured as described above.

<Abrasion resistance test>

With respect to the cutting tools of Sample 1\10.10 to 10 under the following cutting conditions, the cutting time until the flank wear amount (V well) was 0.2 was measured to evaluate the tool life. The results are shown in Table 6. It can be evaluated that the longer the cutting time, the better the wear resistance of the cutting tool, and the longer the life of the cutting tool.

[0099] (Cutting conditions for wear resistance test)

Work material = 3 3 4 0 0 Round bar

Cutting fluid: None

[0100] [Table 6]

[0101] From the results of the wear resistance test,

(0

0 1 2) is 4 or more and 8.5 or less, and the orientation index (3 (0 1 1 4) is

It was found that the cutting time for the cutting tools (Sample 1\!○.1 to 6) that are more than 0.5 and less than 3 is 40 minutes or more. On the other hand, "_ eight丨₂ 〇 ₃ orientation in the layer index Ding 〇 2020/174 754 28 卩 (：171?2019/043090

A cutting tool (Sample 1\!○ 0.7 to 10) whose 〇 (0 1 1 4) is less than 0 .5 is

The cutting time was 35 minutes or less. In particular, the orientation index of the _ _ 8 ₂ 0 ₃ layer is 0 (0 0 1 2) is less than 4, and the orientation index of 0 (0 1 1 4) is

The cutting tool with a cutting time of less than 0.5 (Sample N 0.10) had the shortest cutting time of 18 minutes.

From the above results, the orientation index of the 《_8 丨₂ 0 ₃ layer is 0 (0 0 1 2

) Is 4 or more 8.5 or less, the cutting tool orientation index Ding (3 (0 1 1 4) is 〇 5 or more on the 3 below, "-. Eight丨₂ 〇 ₃ orientation in layers index Ding It was found that the wear resistance was superior to that of a cutting tool with a ◯ (0 1 1 4) of less than 0.5.

Although the embodiments and examples of the present invention have been described above, it is also planned from the beginning to appropriately combine the configurations of the above-described embodiments and examples.

The embodiments and examples disclosed this time are to be considered as illustrative in all points and not restrictive. The scope of the present invention is shown not by the above-described embodiments and examples but by the scope of claims, and is intended to include meanings equivalent to the scope of claims and all modifications within the scope. Explanation of symbols

[0104] 1 3 rake face, 1 clearance face,

Cutting edge, 10 cutting tools,

1 1 base material, 1 2 «- 8 丨₂ 0 ₃ layers,

Crystal grains having (0 0 1) orientation, 12 swarts Crystal grains having (0 1 1 4) orientation, 1 3 Intermediate layer, 1 4 Outermost surface layer, Virtual plane, 3 On the side opposite to the substrate (¾ _ 8 丨_{2 3} layer interface

Claims

〇 2020/174754 29 box (: 171?2019/043090) [claim 1] A cutting tool comprising a base material and a coating for coating the base material, wherein the coating is «_ 8 丨 2 〇 Including the three layers, in the __ eight-third layer, the orientation index of the (0 0 1 2) plane represented by the following formula (1) 〇 (0 0 1 2) is 4 or more 8. 5 or less, and the orientation index of the (0 1 1 4) plane represented by the following formula (2) 〇 (0 1 1 4) is ≧0.5 and 3 or less, and the orientation index (3 A cutting tool in which the sum of (0 0 1 2) and the orientation index (3 (01 1 4)) is 9 or less.

[Number 1]

In equations (1) and (2), I (11 1< I) indicates the X-ray diffraction intensity obtained when the X-port measurement is performed on the (11 1< 丨) plane,

I. (1< I) is the standard strength in the (11 1< I) plane of 《_8 丨₂ 〇 ₃ shown in 0 1 0-0 1 7 3 of ◯ 0 3

(11 1< I) planes are (0 1 2) planes, (1 0 4) planes, (1

1 0) plane, (1 1 3) plane, (0 2 4) plane, (1 1 6

) Plane, (300) plane, (0 0 1 2) plane and (0 1 1 4) plane.

[Claim 2] The "- eight I ₂ 〇 ₃ layer" - includes eight I ₂ 〇 ₃ crystal grains,

The maximum grain size of the crystal grains of the << _ 8 ₂ 0 ₃ is 3 or less, and the maximum grain size of the crystal grains is the thickness direction from the interface of the 8 I ₂ 0 ₃ layer on the side opposite to the base material. At the interface that passes through a distant point 〇 2020/174 754 30 卩 (：171?2019/043090

It is a value obtained in parallel virtual planes,

The cutting tool according to claim 1, wherein the slope is obtained by the following formula (3) or the following formula (4).

佫 = ○ 0.5 X (X-1) / 2 + 0.5, where <3 (3) 丫 = 1, but 3 £ 乂 (4)

In formula (3) and formula (4), X is the above

The unit of X is However, the difference is >>.

[Claim 3] The orientation index D (0 1 1 4) is 1 or more and 2.5 or less.

The cutting tool according to claim 1 or 2.

[Claim 4] The cutting tool according to any one of claims 1 to 3, wherein the thickness of the «_ 8 ₂ 0 ₃ layer is 1 or more and 10 or less.

[Claim 5] The coating further comprises an intermediate layer provided between the I ₂ 〇 ₃ layer and the substrate,

The cutting tool according to any one of claims 1 to 4, wherein the intermediate layer contains a carbonate, a carbonitride oxide, or a boron nitride containing titanium as a constituent element.

[Claim 6] The cutting tool according to any one of claims 1 to 5, wherein the coating has a thickness of 1 or more and 30 or less.

[Claim 7] The coating is

The cutting tool according to any one of claims 1 to 6, further comprising: