WO2020155314A1 - Optical sampling module having balanced sampling width and precision, and immunofluorescence assay equipment - Google Patents

Optical sampling module having balanced sampling width and precision, and immunofluorescence assay equipment Download PDF

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Publication number
WO2020155314A1
WO2020155314A1 PCT/CN2019/077734 CN2019077734W WO2020155314A1 WO 2020155314 A1 WO2020155314 A1 WO 2020155314A1 CN 2019077734 W CN2019077734 W CN 2019077734W WO 2020155314 A1 WO2020155314 A1 WO 2020155314A1
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WO
WIPO (PCT)
Prior art keywords
card
sampling
test card
slide
resistor
Prior art date
Application number
PCT/CN2019/077734
Other languages
French (fr)
Chinese (zh)
Inventor
招睿雄
蒋庭彦
杜沛深
肖林
卢鹏
冯娅雯
聂浩英
李浩勃
张二盈
章国建
Original Assignee
深圳市金准生物医学工程有限公司
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Filing date
Publication date
Application filed by 深圳市金准生物医学工程有限公司 filed Critical 深圳市金准生物医学工程有限公司
Publication of WO2020155314A1 publication Critical patent/WO2020155314A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/58Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving labelled substances
    • G01N33/582Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving labelled substances with fluorescent label
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00871Communications between instruments or with remote terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00732Identification of carriers, materials or components in automatic analysers
    • G01N2035/00861Identification of carriers, materials or components in automatic analysers printing and sticking of identifiers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/046General conveyor features
    • G01N2035/0465Loading or unloading the conveyor

Definitions

  • the present application relates to the field of detection technology, in particular to an optical sampling module and a photoimmunoanalyzer with both sampling width and accuracy.
  • fluorescence immunoassay analyzers still have the problem of low modularity.
  • all or most of the functions are often integrated on the main control board, and when it is necessary to add or change The function is very inconvenient.
  • many fluorescence immunoassay analyzers integrate the optical module and the code scanning module. The equipment loses the scalability and is difficult to upgrade.
  • the maintenance of the equipment is also very limited. It can be returned to the factory for processing, and the maintenance cost is very high.
  • An optical sampling module with both sampling width and accuracy including a photocell, a signal collector connected to the photocell, a processor, and a sampling resistor; one end of the sampling resistor is connected between the signal collector and the photocell, and the other N compensation resistors are connected in series at one end, and a switch is connected in parallel at both ends of each compensation resistor.
  • the control end of the switch is connected to the processor; when the processor outputs a low level, the switch is turned off, and the compensation resistor is connected to the sampling resistor to Increase the resistance value of the resistor when the signal collector is sampling; when the processor outputs a high level, the switch is turned on to compensate for the short circuit of the resistance to reduce the resistance of the resistor when the signal collector is sampling.
  • the switch is a triode
  • the input and output ends of the triode are connected to both ends of the compensation resistor, and the control end of the triode is connected to the processor.
  • a fluorescence immunoassay analyzer for measuring various blood indicators on the surface of a test card and printing the indicators, including an optical sampling module, a housing, a printer, a display screen, an automatic card ejection mechanism and a main control board; the housing It is provided with a card inlet and a card outlet.
  • the optical sampling module, the automatic card ejection mechanism, the main control board and the printer are respectively arranged in the housing, and the optical sampling module, the display screen, the automatic card ejection mechanism and the printer are respectively connected with the main
  • the control board is electrically connected;
  • the automatic card ejection mechanism includes a bottom plate, a sliding rail, a sliding mechanism, a gear mechanism, and a card pushing mechanism;
  • the bottom plate is provided with a long hollow part, and the card ejection mechanism is fixed under the bottom plate
  • the top of the card ejecting slide is open and corresponding to the hollow part, the card ejecting slide has a first end and a second end opposite to the first end, and the first end is provided with a test card
  • the slideway opening for entry and exit, the slideway opening is butted with the bayonet entrance, and the slideway opening is butted with the bayonet exit;
  • the slide rail is installed on the bottom plate and is arranged close to the hollow part;
  • the sliding mechanism is movably
  • the index parameter is transferred to the main control board, and after receiving the index parameter, the main control board controls the printer to print the index parameter;
  • the gear mechanism is fixed on the bottom plate and is close to the second end of the card ejecting slide, in the sliding mechanism When moving to a position close to the second end of the card ejecting slide, the test card is blocked from continuing to move, so that the test card falls into the card ejecting slide;
  • the card pushing mechanism is installed on the sliding mechanism and partially extends into the card ejecting slide to When the sliding mechanism moves along the second end of the card ejecting chute to the first end, the test card is pushed out of the chute of the card ejecting chute to realize automatic card ejection
  • the housing is further provided with a code scanning module for scanning code test card information, the code scanning module is electrically connected to the main control board, and the code scanning module scans information of the test card information, And transfer the information to the main control board, the main control board hole printer prints the test card information.
  • a preferred solution is that the main control board is provided with a number of slots, and a WIFI module and 4 are inserted in the slots.
  • the sliding mechanism is a card tray slider
  • the card tray slider is formed with a storage slot that can accommodate the test card along the sliding rail direction, and the storage slot is located above the card ejecting slide ,
  • one end of the receiving groove is formed with a discharge opening set at the same end as the chute opening of the card ejecting chute.
  • the stop mechanism is a baffle, a retreat is formed in the middle of the baffle, and a stop block that can abut the test card is provided on the side of the baffle close to the slide rail.
  • the card pushing mechanism is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide
  • the gap is less than or equal to the thickness of the test card.
  • a preferred solution is that one side of the push plate for pushing the test card is provided with a curved pushing portion.
  • the automatic card ejection mechanism further includes a drive mechanism installed on the bottom plate, and the drive mechanism drives the card holder slider to reciprocate in the direction of the slide rail.
  • the drive mechanism includes a motor, a belt, and a positioning wheel
  • the card holder slider is also provided with a connecting piece and is fixedly connected to the belt through the connecting piece, so as to drive the belt and the card when the motor is working.
  • the sliding block moves.
  • the beneficial effects of this application are: to realize dynamic sampling, an optical sampling module with sampling width and accuracy, sampling resistors and N compensation resistors are used for sampling, and the compensation resistors are switched to connect to the sampling In the resistance, the resistance value of the resistance when the signal collector is sampled is increased to ensure that the high signal will not overflow, and at the same time, the application scenario of the low signal can be recognized normally; specifically, when the signal collected by the signal collector is strong , The signal collector is closed by the processor control switch, and the resistance short circuit is compensated to reduce the resistance value of the resistance when the signal collector is sampling to ensure that the signal will not overflow; when the signal collected by the signal collector is very weak, the signal collector is controlled by the processor The switch is turned on, and the compensation resistor is connected to the sampling resistor to increase the resistance value of the resistor when the signal collector is sampling to ensure that weak signals can also be identified and sampled normally.
  • the automatic card ejecting mechanism includes a bottom plate, a sliding rail, a sliding mechanism, a gear mechanism, and a card pushing mechanism.
  • the bottom plate is provided with a card ejecting slide
  • the slide rail is fixedly installed on the bottom plate
  • the slide mechanism is slidably connected to the slide rail, and A test card can be placed on the sliding mechanism, and when the sliding mechanism moves close to the other end of the sliding rail, the shift mechanism can avoid the sliding mechanism and block the test card from continuing to move.
  • test card falls into the card ejecting chute, and when the sliding mechanism moves in the reverse direction, the card pushing mechanism provided on the sliding mechanism can abut the test card and push the test card out of the card ejecting chute with the movement of the sliding mechanism , Realize automatic card withdrawal.
  • This solution can proactively launch the test card without adding additional power.
  • This active card ejection method will ensure that the test card is smoothly sent out of the card ejection chute, ensure smooth card ejection, reduce failure rates, and improve the stability of equipment testing.
  • FIG. 1 is a schematic diagram of the first embodiment of the present application
  • FIG. 2 is a flowchart of the first embodiment of the present application
  • FIG. 3 is a perspective view of a second embodiment of the present application.
  • FIG. 4 is an exploded view of a second embodiment of the present application.
  • FIG. 5 is a perspective view of the sampling module, the automatic card ejection mechanism and the code scanning module of the middle school of this application when connected;
  • FIG. 6 is a perspective view 1 of the automatic card ejection mechanism in this application.
  • FIG. 7 is a second perspective view of the automatic card ejection mechanism in this application.
  • an optical sampling module 2 with both sampling width and accuracy including a photocell 201, a signal collector 202 connected to the photocell 201, a processor 203, and a sampling resistor 204;
  • the sampling resistor 204 is a resistor R1.
  • One end of the sampling resistor 204 is connected between the signal collector 202 and the photocell 201, and the other end is connected in series with N compensation resistors 205.
  • Each compensation resistor 205 is connected in parallel with a switch.
  • the processor 203 is connected; the compensation resistor 205 can be set according to needs, and can be set to one, two or more.
  • two compensation resistors 205 are used for illustration, which are resistor R2 and resistor R3, and resistor R2.
  • a switch 1 is connected in parallel with the resistor R3, and a switch 2 is connected in parallel at both ends of the resistor R3.
  • the control terminals of the switch 1 and switch 2 are respectively electrically connected to the processor 203.
  • the processor 203 individually controls the on and off of the switch 1 and switch 2, when the processor When 203 outputs a low level, the switch is off, that is, switch one or/and switch two are off.
  • the compensation resistor 205 is connected to the sampling resistor 204 to increase the resistance of the signal collector 202 during sampling, that is, the resistor R2 or/and
  • the resistor R3 is connected to the sampling resistor 204; when the processor 203 outputs a high level, the switch is turned on, that is, the switch one or/and the switch two are turned on, and the compensation resistor 205 is short-circuited to reduce the resistance value of the resistor when the signal collector 202 is sampling. That is, the resistance R2 or/and the resistance R3 are bypassed, and the resistance R2 or/and the resistance R3 does not participate in the resistance when the signal collector 202 is sampling.
  • the resistance value of the sampling resistor 204 is greater than the resistance value of the compensation resistor 205, and two different resistors, one large and one small, are used for sampling, and the processor 203 controls the closing of the switch.
  • the compensation resistor 205 is connected or not connected together, it can ensure that the high signal will not overflow, and at the same time, the low signal can be recognized normally.
  • the specific principle is that when the signal collector 202 detects that the signal is strong, the processor 203 switches to make the sampled resistance of the signal collector 202 small to ensure that the signal does not overflow; when the signal collected by the signal collector 202 is very weak, the processor The 203 switching makes the resistance value of the sampling resistance of the signal collector 202 large, ensuring that weak signals can also be identified and sampled normally.
  • the sampling system sets an initial sampling resistance value according to the actual application scenario, and then performs the first sampling.
  • the processor 203 analyzes the data of this sampling. If the data overflows, it represents the resistance of the front end of the signal collector 202 during sampling.
  • the resistance value of the resistor during sampling can be adjusted in real time to obtain the best sampling data.
  • the sampling steps of the optical sampling module 2 are: S1, the optical sampling module 2 sets an initialized sampling resistance value according to the actual application scenario; S2, and then performs the first sampling; S3 ,
  • the signal collector 202 transmits the collected signal to the processor 203, and the processor 203 analyzes and judges the strength of the signal according to the data sampled this time; S4, if the data signal is weak, that is, the signal sampled for the first time is weak, It means that the resistance during sampling at the front end of the signal collector 202 is too small, and the processor 203 controls the switch to turn off to increase the resistance of the resistance during sampling, and then performs sampling until appropriate data is output; S5, if the data signal is strong, that is Data overflow means that the resistance of the front end of the signal collector 202 during sampling is too large. At this time, the processor 203 controls the switch to close to reduce the resistance of the resistance during sampling, and then performs sampling; S6, until appropriate sampling data is output; Therefore, dynamic data sampling can
  • the switch is a triode, the input end and output end of the triode are connected to both ends of the compensation resistor 205, and the control end of the triode is connected to the processor 203.
  • two compensation resistors 205 are used for illustration, which are resistor R2 and resistor R3.
  • the resistor R2 is connected in parallel with switch one, switch one is transistor Q1, and resistor R3 is connected in parallel with switch two, and switch two is transistor Q2.
  • the control ends of the transistor Q1 and the transistor Q2 are electrically connected to the processor 203, and the processor 203 separately controls the on and off of the transistor Q1 and the transistor Q2.
  • a resistor R7 is connected between the transistor Q1 and the processor 203, and the transistor Q1 and The resistor R7 is grounded through a resistor R6; a resistor R5 is connected between the transistor Q2 and the processor 203, and a resistor R4 is connected between the transistor Q2 and the resistor R5.
  • the negative electrode of the photo cell 201 is connected to the signal collector 202, and the positive electrode of the photo cell 201 is connected to the power source.
  • the optical sampling module 2 has a unique design, and has higher sensitivity and a wider signal measurement range than existing products.
  • the optical sampling module 2 adopts a confocal optical structure.
  • the confocal optical structure has a strong optical path focusing ability. After the excitation light source is focused, the energy is concentrated, so it can excite a larger signal, and the confocal optical structure can Collect more light signals, after focusing, the light transmitted to the photoelectric sensor is more concentrated, the signal strength is greater, the stability is better, and the anti-interference ability is stronger.
  • the optical components of the optical sampling module 2 include: ultraviolet LED lamp, plano-convex lens, Narrowband filters, collimating lenses and dichroic mirrors.
  • the processor 203 in the optical sampling module 2 adopts a dynamic gain control scheme.
  • the optical sampling module 2 adopts a high multiple of gain, which can increase the amplitude of weak optical signals and reduce the influence of interference signals.
  • the processor 203 uses a low multiple of gain to prevent the signal from overflowing and resulting in distortion.
  • a fluorescence immunoassay analyzer for measuring various blood indicators on the surface of the test card 70 and printing the indicators, including an optical sampling module 2, a housing 3, Printer 4, display screen 5, automatic card ejection mechanism 1 and main control board 6; shell 3 is provided with bayonet inlet 301 and bayonet outlet 302, optical sampling module 2, automatic card ejection mechanism 1, main control board 6 and printer 4 The optical sampling module 2, the display screen 5, the automatic card ejection mechanism 1 and the printer 4 are respectively arranged in the housing 3 and are electrically connected to the main control board 6.
  • the automatic card ejection mechanism 1 includes a bottom plate 10, a sliding rail 20, and a sliding mechanism 30, The gear mechanism 40 and the card pushing mechanism 50; the bottom plate 10 is provided with a long hollow part 11, the card ejecting slide 12 is fixed under the bottom plate 10, and the top of the card ejecting slide 12 is open and corresponds to the hollow part 11
  • the card ejecting slide 12 has a first end and a second end opposite to the first end. The first end is provided with a slideway opening for the test card 70 to enter and exit.
  • the bottom of the bracket 201 is fixedly connected to the bottom plate 10, and the optical sampling module 2 is fixed on the top; the shift mechanism 40 is fixed on the bottom plate 10 and is close to the second end of the card ejecting slide 12 Position, when the sliding mechanism 30 moves to a position close to the second end of the card ejecting slide 12, the test card 70 is blocked from continuing to move, so that the test card 70 falls into the card ejecting slide 12; the card pushing mechanism 50 is installed on the sliding mechanism 30 and partially extend into the card ejecting slide 12 to push the test card 70 out of the slideway opening of the card ejecting slide 12 when the sliding mechanism 30 moves along the second end of the card ejecting slide 12 to the first end. Realize automatic card refund.
  • the sliding mechanism 30 can reciprocate along the direction of the sliding rail 20 under the driving force, and the sliding mechanism 30 drives the test card 70 into the instrument for testing.
  • Sampling mode Block 2 tests the blood on the surface of the test card 70 and sends the test results to the main control board 6.
  • the main control board 6 controls the printer 4 to print the test results.
  • the sliding mechanism 30 drives The test card 70 continues to move in the direction of the slide rail 20 to other inspection stations. When the test card 70 fails the test, the test card 70 can be automatically withdrawn from the card eject chute 12.
  • the automatic card ejecting mechanism 1 in the technical solution of the present application mainly includes a bottom plate 10, a sliding rail 20, a sliding mechanism 30, a gear mechanism 40, and a card pushing mechanism 50, wherein the bottom plate 10 is provided with a card ejecting slide 12, the slide rail 20 is fixedly installed on the bottom plate 10, the slide mechanism 30 is slidably connected to the slide rail 20, and a test card 70 can be placed on the slide mechanism 30, and the slide mechanism 30 moves close to At the other end of the sliding rail 20, the gear mechanism 40 can avoid the sliding mechanism 30 and block the test card 70 from continuing to move.
  • test card 70 falls into the card eject chute 12, and when the sliding mechanism 30 moves in the reverse direction, the card pushing mechanism 50 provided on the sliding mechanism 30 can abut the test card 70, and follow the movement of the sliding mechanism 30.
  • the test card 70 is pushed out from the card ejecting chute 12 to realize automatic card ejection.
  • the test card 70 can be actively launched without adding additional power. This active card ejection method will ensure that the test card 70 is smoothly sent out of the card ejection chute 12, ensuring smooth card ejection, reducing the failure rate, and improving the stability of equipment testing.
  • the sliding mechanism 30 is a card tray slider 31, and the card tray slider 31 is formed with a storage slot that can accommodate the test card 70 along the direction of the slide rail 20, and the storage slot is located in the card ejecting slide. Above the channel 12, and at one end of the receiving groove, a discharge opening is formed at the same end as the chute opening of the card ejecting chute 12 .
  • a relatively simple card tray slider 31 is used in this solution.
  • the storage slot of the card tray slider 31 can conveniently limit the position of the test card 70, and the discharge port of the storage slot can facilitate the insertion of the test card 70. .
  • the outlet of the receiving slot can be set at a wide angle, so that the test card 70 can slide in smoothly from the discharge port.
  • the gear mechanism 40 is a baffle 41.
  • the baffle 41 forms an escape position in the middle, and the side of the baffle 41 close to the slide rail 20 is provided with a gear that can abut the test card 70.
  • Block 42 In order to simplify the equipment mechanism, the baffle 41 is used as the gear mechanism 40.
  • the baffle 41 straddles the card ejecting slide 12, and the baffle 41 is fixed on the side away from the slide rail 20
  • the middle is an avoidance position, and the other side is provided with a stop block 42 as large as the gear test card 70.
  • the baffle 41 is arranged in a reverse "r" shape.
  • the shorter side of the "r" type is the hook, which is the position of the gear block.
  • the length of the hook can be designed according to actual requirements.
  • the card pushing mechanism 50 is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide 12, and the gap is less than or equal to the thickness of the test card 70.
  • a push plate is used as the card pushing mechanism 50.
  • a gap less than or equal to the thickness of the test card 70 is left at the bottom of the slideway 12, so as to facilitate the end of the push plate to push the test card 70.
  • it can provide the driving force for active card withdrawal.
  • a side of the push plate for pushing the test card 70 is provided with a push portion in a bent shape.
  • a pushing part is provided on one side of the push plate pushing the test card 70, and the pushing part is arranged in a bent shape, so that the test card 70 can be pushed out better.
  • the automatic card ejecting mechanism further includes a driving mechanism 60 installed on the bottom plate 10, and the driving mechanism 60 drives the card holder slider 31 to reciprocate along the direction of the slide rail 20.
  • the driving mechanism 60 drives the card holder slider 31 to reciprocate along the direction of the slide rail 20.
  • the driving mechanism 60 includes a motor 61, a belt 62, and a positioning wheel 63 (or a synchronous wheel).
  • the card holder slider 31 is also provided with a connecting member 32 and connected by The member 32 is fixedly connected with the belt 62 to drive the belt 62 and the carriage slider 31 to move when the motor 61 is working.
  • the belt 62 is sleeved on the synchronization wheel and the positioning wheel 63 of the motor 61.
  • the motor 61 drives the belt 62 to move when the motor 61 works. Since the belt 62 is fixedly connected to the card holder slider 31, it can drive the card holder slider when the belt 62 moves. 31-Exercise.
  • the housing 3 is also provided with a code scanning module 7 for scanning code information of the test card 70, the code scanning module 7 is electrically connected to the main control board 6, and the code scanning module 7 scans the test card 70 information information, and transfer the information to the main control board 6, and the main control board 6-hole printer 4 prints the test card 70 information.
  • the code scanning module 7 is fixed on the top of the bracket 201 and is located in the optical sampling module 2.
  • a number of slots are provided on the main control board 6, and a WIFI module, a Bluetooth module or a 4G module is inserted in the slots.
  • the card pushing mechanism 50 is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide 12, and the gap is less than or equal to the thickness of the test card 70.
  • test card 70 adopts the front-to-front out method, and the test card 70 collection frame is placed under the instrument before the test. When the test is completed, the test card 70 is pushed out from the front of the instrument and drops directly into the test card 70 collection frame , Save the manpower of the operator;
  • test card 70 after the test is allowed to accumulate outside the instrument does not affect the normal card ejection, and the operator does not need to complete a test to collect the test card 70 once, so as to avoid the waste of manpower caused by the frequent operation of the operator;
  • the fluorescence immunoassay analyzer has a variety of wireless function modules, including WIFI, 4G, and Bluetooth.
  • the fluorescence immunoassay analyzer is equipped with a remote communication interface and protocol to connect to the server, which can realize remote monitoring and data sharing. Function, by monitoring the changes of the equipment to give early warning of the health status of the equipment, and take corresponding measures in time; on the other hand, because of the data sharing, the macro operating status of the equipment can be statistically analyzed to find and discover the overall system of the equipment
  • the characteristics of the product including the defects in the design, the defects in the use process, the characteristics of the samples, and the user habits, etc., play a very important role in the big data analysis of the product.

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

An optical sampling module (2) having a balanced sampling width and precision, and immunofluorescence assay equipment. The optical sampling module (2) comprises a photocell (201), a signal acquisition device (202) connected to the photocell (201), a processor (203), and a sampling resistor (204). One end of the sampling resistor (204) is connected between the signal acquisition device (202) and the photocell (201), and the other end is connected to N compensation resistors (205) arranged in series. Each of the compensation resistors (205) is connected to a switch in parallel, and a control end of the switch is connected to the processor (203); the switch is turned off when the processor (203) outputs a low voltage, such that the compensation resistor (205) is connected to the sampling resistor (204) to increase resistance when the signal acquisition device (202) is performing a sampling operation, and the switch is turned on when the processor (203) outputs a high voltage, such that the compensation resistor (205) is short circuited to reduce the resistance when the signal acquisition device (202) is performing a sampling operation. The immunofluorescence assay equipment comprises the optical sampling module (2). The invention realizes dynamic sampling, achieves a balance between sensitivity and signal detection range, and automates information detection and ejection of a test card.

Description

说明书 发明名称:兼具釆样宽度和精度的光学釆样模块及荧光免疫分析仪 Manual Title of the invention: Optical sample module and fluorescence immunoassay analyzer with sample width and precision
[0001] 本申请是以申请号为 201910104165.6, 申请日为 2019年 2月 1日的中国专利申请 为基础, 并主张其优先权, 该申请的全部内容在此作为整体引入本申请中。 [0001] This application is based on a Chinese patent application with an application number of 201910104165.6 and a filing date of February 1, 2019, and claims its priority. The entire content of the application is hereby incorporated into this application as a whole.
[0002] 技术领域 [0002] Technical Field
[0003] 本申请涉及检测技术领域, 尤其是一种兼具采样宽度和精度的光学采样模块及 変光免疫分析仪。 [0003] The present application relates to the field of detection technology, in particular to an optical sampling module and a photoimmunoanalyzer with both sampling width and accuracy.
[0004] 背景技术 [0004] Background Technology
[0005] 目前测量灵敏度和检测信号范围两者之间无法同时兼顾, 一般而言, 如设备灵 敏度越高, 则需要对于微弱光信号进行特殊处理, 例如通过对光电池的信号进 行放大, 如此一来则会导致高值信号溢出, 而如果要兼顾高值信号而选择较低 的信号增益, 则对微弱信号的识别能力就会不足, 两者之间往往无法同时兼顾 。 同时现有技术的光学采样系统都是使用固定值的采样电阻进行采样, 无法动 态调节, 因此仅能采样一个固定小范围内的光信号。 [0005] At present, it is impossible to balance the measurement sensitivity and the detection signal range at the same time. Generally speaking, if the sensitivity of the device is higher, special processing is required for the weak light signal, for example, by amplifying the signal of the photocell. It will cause high-value signals to overflow, and if you want to take high-value signals into consideration and choose a lower signal gain, the ability to recognize weak signals will be insufficient, and it is often impossible to take care of the two at the same time. At the same time, the optical sampling system in the prior art uses a fixed-value sampling resistor for sampling, and cannot be dynamically adjusted, so it can only sample an optical signal within a fixed small range.
[0006] 5见有的荧光免疫分析仪退卡方式有两种, 一种是测试卡进入荧光免疫分析仪完 成测量后, 操作者需要手动从卡槽上将卡取出, 这种取卡方式使用不便; 另一 种退卡方式是测试卡在机器内部通过退卡结构从卡槽上退出后通过测试卡本身 的重力作用从斜坡上自动滑落出来, 但由于滑落是通过自身重力实现, 随着测 试卡在退卡出口处越积越多, 最终会导致堵塞退卡口, 是测试卡再无法正常从 设备内部退出, 导致故障甚至损坏设备。 [0006] There are two ways to withdraw the card from the fluorescence immunoassay analyzer. One is that after the test card enters the fluorescence immunoassay analyzer to complete the measurement, the operator needs to manually remove the card from the card slot. Inconvenience; Another way to withdraw the card is that the test card is automatically slid out from the slope through the gravity action of the test card itself after it exits from the card slot through the card ejection structure inside the machine. The card accumulates at the exit of the card ejection, eventually causing the card ejection port to be blocked, and the test card can no longer be ejected from the device normally, causing malfunction or even damage to the device.
[0007] 同时现有荧光免疫分析仪还存在模块化程度不高的问题, 一般设备在设计硬件 板卡的时候, 往往将所有或者大部分功能都集成在主控板上, 当需要增加或者 更改功能的时候则非常不便, 另外不少荧光免疫分析仪会将光学模块和扫码模 块整合在一起, 设备失去了扩展性且升级困难, 同时设备的维修也非常受限, 一旦出现问题, 往往只能返厂处理, 维护成本非常高。 [0007] At the same time, existing fluorescence immunoassay analyzers still have the problem of low modularity. When designing hardware boards for general equipment, all or most of the functions are often integrated on the main control board, and when it is necessary to add or change The function is very inconvenient. In addition, many fluorescence immunoassay analyzers integrate the optical module and the code scanning module. The equipment loses the scalability and is difficult to upgrade. At the same time, the maintenance of the equipment is also very limited. It can be returned to the factory for processing, and the maintenance cost is very high.
[0008] 申请内容 [0008] Application content
[0009] 本申请的目的是解决现有技术的不足, 提供一种兼具采样宽度和精度的光学采 样模块及変光免疫分析仪。 [0009] The purpose of this application is to solve the shortcomings of the prior art and provide an optical sampling device with both sampling width and accuracy. Sample module and light immunoassay analyzer.
[0010] 本申请的一种技术方案: [0010] A technical solution of the present application:
[0011] 一种兼具采样宽度和精度的光学采样模块, 包括光电池, 与光电池连接的信号 采集器, 处理器和采样电阻; 所述采样电阻的一端连接在信号采集器与光电池 之间, 另一端串联有 N个补偿电阻, 每一补偿电阻两端并联有开关, 所述开关的 控制端与处理器连接; 当处理器输出低电平时, 开关断开, 补偿电阻接入到采 样电阻中以增加信号采集器采样时电阻的阻值; 当处理器输出高电平时, 开关 接通, 补偿电阻短路以减少信号采集器采样时电阻的阻值。 [0011] An optical sampling module with both sampling width and accuracy, including a photocell, a signal collector connected to the photocell, a processor, and a sampling resistor; one end of the sampling resistor is connected between the signal collector and the photocell, and the other N compensation resistors are connected in series at one end, and a switch is connected in parallel at both ends of each compensation resistor. The control end of the switch is connected to the processor; when the processor outputs a low level, the switch is turned off, and the compensation resistor is connected to the sampling resistor to Increase the resistance value of the resistor when the signal collector is sampling; when the processor outputs a high level, the switch is turned on to compensate for the short circuit of the resistance to reduce the resistance of the resistor when the signal collector is sampling.
[0012] 一种优选方案是所述开关为三极管, 所述三极管的输入端和输出端连接在补偿 电阻两端, 所述所述三极管的控制端与处理器连接。 [0012] A preferred solution is that the switch is a triode, the input and output ends of the triode are connected to both ends of the compensation resistor, and the control end of the triode is connected to the processor.
[0013] 本申请另一技术方案: [0013] Another technical solution of this application:
[0014] 一种荧光免疫分析仪, 用于测量测试卡表面的血液各项指标并打印该指标, 包 括光学采样模块, 外壳, 打印机, 显示屏, 自动退卡机构和主控板; 所述外壳 设有进卡口和出卡口, 所述光学采样模块、 自动退卡机构、 主控板和打印机分 别设置在外壳内, 所述光学采样模块, 显示屏, 自动退卡机构和打印机分别与 主控板电连接; 所述自动退卡机构包括底板, 滑轨, 滑动机构, 挡位机构和推 卡机构; 所述底板上开设有呈长条状的镂空部, 所述底板下方固定有退卡滑道 , 退卡滑道的顶部呈开口状且对应镂空部设置, 所述退卡滑道具有第一端及与 第一端相对设置的第二端, 所述第一端设有供测试卡进出的滑道口, 所述滑道 口与进卡口对接, 所述滑道口与出卡口对接; 所述滑轨安装于底板上且靠近镂 空部设置; 所述滑动机构活动安装于滑轨上且可沿滑轨方向移动, 所述滑动机 构上可放置测试卡; 所述光学采样模块通过设有的支架设置在滑轨的正上方, 光学采样模块用于测量测试卡表面血液各项指标参数并将该指标参数传递至主 控板, 主控板接收到该指标参数后控制打印机打印该指标参数; 所述挡位机构 固定于底板上且靠近退卡滑道的第二端的位置, 在滑动机构运动至靠近退卡滑 道的第二端的位置时, 挡住测试卡继续运动, 使测试卡落入退卡滑道中; 所述 推卡机构安装于滑动机构上且部分伸入退卡滑道中, 以在滑动机构沿退卡滑道 的第二端向第一端运动时, 将测试卡从退卡滑道的滑道口推出, 实现自动退卡 [0015] 一种优选方案是所述外壳内还设有用于扫码测试卡信息的扫码模块, 所述扫码 模块与主控板电连接, 所述扫码模块扫描测试卡信息的信息, 并将该信息传递 至主控板, 主控板孔打印机打印测试卡信息。 [0014] A fluorescence immunoassay analyzer for measuring various blood indicators on the surface of a test card and printing the indicators, including an optical sampling module, a housing, a printer, a display screen, an automatic card ejection mechanism and a main control board; the housing It is provided with a card inlet and a card outlet. The optical sampling module, the automatic card ejection mechanism, the main control board and the printer are respectively arranged in the housing, and the optical sampling module, the display screen, the automatic card ejection mechanism and the printer are respectively connected with the main The control board is electrically connected; the automatic card ejection mechanism includes a bottom plate, a sliding rail, a sliding mechanism, a gear mechanism, and a card pushing mechanism; the bottom plate is provided with a long hollow part, and the card ejection mechanism is fixed under the bottom plate The top of the card ejecting slide is open and corresponding to the hollow part, the card ejecting slide has a first end and a second end opposite to the first end, and the first end is provided with a test card The slideway opening for entry and exit, the slideway opening is butted with the bayonet entrance, and the slideway opening is butted with the bayonet exit; the slide rail is installed on the bottom plate and is arranged close to the hollow part; the sliding mechanism is movably mounted on the slide rail and The optical sampling module can be moved in the direction of the sliding rail, and the test card can be placed on the sliding mechanism; the optical sampling module is set directly above the sliding rail through a bracket provided, and the optical sampling module is used to measure various indicators and parameters of blood on the surface of the test card. The index parameter is transferred to the main control board, and after receiving the index parameter, the main control board controls the printer to print the index parameter; the gear mechanism is fixed on the bottom plate and is close to the second end of the card ejecting slide, in the sliding mechanism When moving to a position close to the second end of the card ejecting slide, the test card is blocked from continuing to move, so that the test card falls into the card ejecting slide; the card pushing mechanism is installed on the sliding mechanism and partially extends into the card ejecting slide to When the sliding mechanism moves along the second end of the card ejecting chute to the first end, the test card is pushed out of the chute of the card ejecting chute to realize automatic card ejection [0015] A preferred solution is that the housing is further provided with a code scanning module for scanning code test card information, the code scanning module is electrically connected to the main control board, and the code scanning module scans information of the test card information, And transfer the information to the main control board, the main control board hole printer prints the test card information.
[0016] 一种优选方案是所述主控板上设有若干插槽, 所述插槽内插设有 WIFI模块和 4 [0016] A preferred solution is that the main control board is provided with a number of slots, and a WIFI module and 4 are inserted in the slots.
G模块。 G module.
[0017] 一种优选方案是所述滑动机构为卡托滑块, 所述卡托滑块沿滑轨方向形成有可 容置测试卡的收纳槽, 所述收纳槽位于退卡滑道的上方, 且收纳槽的一端形成 有与退卡滑道的滑道口同端设置的放料口。 [0017] A preferred solution is that the sliding mechanism is a card tray slider, the card tray slider is formed with a storage slot that can accommodate the test card along the sliding rail direction, and the storage slot is located above the card ejecting slide , And one end of the receiving groove is formed with a discharge opening set at the same end as the chute opening of the card ejecting chute.
[0018] 一种优选方案是所述挡位机构为挡板, 所述挡板中间形成避让位且挡板靠近滑 轨的一侧设有可抵接测试卡的挡位块。 [0018] A preferred solution is that the stop mechanism is a baffle, a retreat is formed in the middle of the baffle, and a stop block that can abut the test card is provided on the side of the baffle close to the slide rail.
[0019] 一种优选方案是所述推卡机构为推板, 所述推板与退卡滑道的底部预留有间隙 [0019] A preferred solution is that the card pushing mechanism is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide
, 所述间隙小于或等于测试卡的厚度。 , The gap is less than or equal to the thickness of the test card.
[0020] 一种优选方案是所述推板供推挤测试卡的一侧设置有呈弯折状的推挤部。 [0020] A preferred solution is that one side of the push plate for pushing the test card is provided with a curved pushing portion.
[0021] 一种优选方案是所述自动退卡机构还包括安装于底板上的驱动机构, 所述驱动 机构带动卡托滑块沿滑轨的方向往复运动。 [0021] A preferred solution is that the automatic card ejection mechanism further includes a drive mechanism installed on the bottom plate, and the drive mechanism drives the card holder slider to reciprocate in the direction of the slide rail.
[0022] 一种优选方案是所述驱动机构包括电机、 皮带及定位轮, 所述卡托滑块还设置 有连接件并通过连接件与皮带固定连接, 以在电机工作时, 带动皮带及卡托滑 块运动。 [0022] A preferred solution is that the drive mechanism includes a motor, a belt, and a positioning wheel, and the card holder slider is also provided with a connecting piece and is fixedly connected to the belt through the connecting piece, so as to drive the belt and the card when the motor is working. The sliding block moves.
[0023] 综合上述技术方案, 本申请的有益效果: 实现动态采样, 兼具采样宽度和精度 的光学采样模块, 采用采样电阻和 N个补偿电阻来进行采样, 并通过切换补偿电 阻接入到采样电阻中以增加信号采集器采样时电阻的阻值, 做到既能保证高信 号不会溢出, 同时也能正常地识别到低信号的应用场景; 具体的, 当信号采集 器采集的信号强时, 信号采集器通过处理器控制开关闭合, 补偿电阻短路以减 少信号采集器采样时电阻的阻值, 保证信号不会溢出; 当信号采集器采集的信 号非常微弱时, 信号采集器通过处理器控制开关打开, 补偿电阻接入到采样电 阻中以增加信号采集器采样时电阻的阻值, 保证微弱的信号也能正常地进行识 别和采样。 本申请可以扩大光学采样模块的测量范围, 即增大了信号测量的范 围, 光学采样模块能识别更微弱的信号, 即提高了系统的信噪比, 对于微弱信 号的大电阻采样能提高测量结果的稳定性。 自动退卡机构包括底板、 滑轨、 滑 动机构、 挡位机构及推卡机构, 其中, 底板上设有退卡滑道, 滑轨固定安装于 底板上, 滑动机构滑接于滑轨上, 且滑动机构上可放置测试卡, 在滑动机构运 动至靠近滑轨的另一端时, 挡位机构可避让滑动机构并可挡住测试卡继续运动 。 如此, 测试卡落入退卡滑道中, 在滑动机构反向运动时, 设置在滑动机构上 的推卡机构可抵接测试卡, 并随着滑动机构的运动将测试卡从退卡滑道中推出 , 实现自动退卡。 本方案在不增加额外的动力情况, 可将测试卡主动推出。 这 种主动式的退卡方式将保证测试卡顺利地被送出退卡滑道, 保证顺利出卡, 降 低故障率, 提高设备测试的稳定性。 [0023] Combining the above technical solutions, the beneficial effects of this application are: to realize dynamic sampling, an optical sampling module with sampling width and accuracy, sampling resistors and N compensation resistors are used for sampling, and the compensation resistors are switched to connect to the sampling In the resistance, the resistance value of the resistance when the signal collector is sampled is increased to ensure that the high signal will not overflow, and at the same time, the application scenario of the low signal can be recognized normally; specifically, when the signal collected by the signal collector is strong , The signal collector is closed by the processor control switch, and the resistance short circuit is compensated to reduce the resistance value of the resistance when the signal collector is sampling to ensure that the signal will not overflow; when the signal collected by the signal collector is very weak, the signal collector is controlled by the processor The switch is turned on, and the compensation resistor is connected to the sampling resistor to increase the resistance value of the resistor when the signal collector is sampling to ensure that weak signals can also be identified and sampled normally. This application can expand the measurement range of the optical sampling module, that is, increase the range of signal measurement. Therefore, the optical sampling module can identify weaker signals, that is, improve the signal-to-noise ratio of the system, and large resistance sampling for weak signals can improve the stability of the measurement results. The automatic card ejecting mechanism includes a bottom plate, a sliding rail, a sliding mechanism, a gear mechanism, and a card pushing mechanism. The bottom plate is provided with a card ejecting slide, the slide rail is fixedly installed on the bottom plate, and the slide mechanism is slidably connected to the slide rail, and A test card can be placed on the sliding mechanism, and when the sliding mechanism moves close to the other end of the sliding rail, the shift mechanism can avoid the sliding mechanism and block the test card from continuing to move. In this way, the test card falls into the card ejecting chute, and when the sliding mechanism moves in the reverse direction, the card pushing mechanism provided on the sliding mechanism can abut the test card and push the test card out of the card ejecting chute with the movement of the sliding mechanism , Realize automatic card withdrawal. This solution can proactively launch the test card without adding additional power. This active card ejection method will ensure that the test card is smoothly sent out of the card ejection chute, ensure smooth card ejection, reduce failure rates, and improve the stability of equipment testing.
[0024] 上述说明仅是本申请技术方案的概述, 为了能够更清楚了解本申请的技术手段 , 而可依照说明书的内容予以实施, 并且为了让本申请的上述和其他目的、 特 征和优点能够更明显易懂, 以下特举较佳实施例, 并配合附图, 详细说明如下 [0024] The above description is only an overview of the technical solutions of this application. In order to understand the technical means of this application more clearly, it can be implemented in accordance with the content of the specification, and to make the above and other purposes, features, and advantages of this application better. Obviously and easily understandable, the following is a detailed description of the preferred embodiments with accompanying drawings.
[0025] 附图说明 [0025] Description of the drawings
[0026] 图 1是本申请第一实施例的原理图; [0026] FIG. 1 is a schematic diagram of the first embodiment of the present application;
[0027] 图 2是本申请第一实施例的流程图; [0027] FIG. 2 is a flowchart of the first embodiment of the present application;
[0028] 图 3是本申请第二实施例的立体图; [0028] FIG. 3 is a perspective view of a second embodiment of the present application;
[0029] 图 4是本申请第二实施例的爆炸图; [0029] FIG. 4 is an exploded view of a second embodiment of the present application;
[0030] 图 5是本申请中学采样模块、 自动退卡机构和扫码模块连接时的立体图; [0030] FIG. 5 is a perspective view of the sampling module, the automatic card ejection mechanism and the code scanning module of the middle school of this application when connected;
[0031] 图 6是本申请中自动退卡机构的立体图一; [0031] FIG. 6 is a perspective view 1 of the automatic card ejection mechanism in this application;
[0032] 图 7是本申请中自动退卡机构的立体图二。 [0032] FIG. 7 is a second perspective view of the automatic card ejection mechanism in this application.
[0033] 具体实施方式 [0033] Specific embodiments
[0034] 下面将结合本申请实施例中的附图, 对本申请实施例中的技术方案进行清楚、 完整地描述, 显然, 所描述的实施例仅仅是本申请的一部分实施例, 而不是全 部的实施例。 基于本申请中的实施例, 本领域普通技术人员在没有作出创造性 劳动前提下所获得的所有其他实施例, 都属于本申请保护的范围。 [0034] The following will clearly and completely describe the technical solutions in the embodiments of the present application in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of them. Examples. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of this application.
[0035] 需要说明, 本申请中涉及“第一”、 “第二”等的描述仅用于描述目的, 而不能理 解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。 由此, 限定有“第一”、 “第二”的特征可以明示或者隐含地包括至少一个该特征。 另外 , 各个实施例之间的技术方案可以相互结合, 但是必须是以本领域普通技术人 员能够实现为基础, 当技术方案的结合出现相互矛盾或无法实现时应当认为这 种技术方案的结合不存在, 也不在本申请要求的保护范围之内。 [0035] It should be noted that the descriptions related to "first", "second", etc. in this application are only used for descriptive purposes and cannot be justified. The solution is to indicate or imply its relative importance or implicitly indicate the number of technical features indicated. Therefore, the features defined with “first” and “second” may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on what can be achieved by a person of ordinary skill in the art. When the combination of technical solutions is contradictory or cannot be achieved, it should be considered that such a combination of technical solutions does not exist. , Is not within the scope of protection required by this application.
[0036] 第一实施例, 如图 1所示, 一种兼具采样宽度和精度的光学采样模块 2, 包括光 电池 201, 与光电池 201连接的信号采集器 202, 处理器 203和采样电阻 204; 采样 电阻 204为电阻 R1, 采样电阻 204的一端连接在信号采集器 202与光电池 201之间 , 另一端串联有 N个补偿电阻 205 , 每一补偿电阻 205两端并联有开关, 开关的控 制端与处理器 203连接; 补偿电阻 205可以根据需要来设置, 可以设置为 1个, 2 个或者多个, 本申请中, 补偿电阻 205采用 2个来说明, 分别是电阻 R2和电阻 R3 , 电阻 R2两端并联有开关一, 电阻 R3两端并联有开关二, 开关一和开关二的控 制端分别与处理器 203电连接, 处理器 203分别单独控制开关一和开关二的开和 断, 当处理器 203输出低电平时, 开关断开, 即开关一或 /和开关二断开, 补偿电 阻 205接入到采样电阻 204中以增加信号采集器 202采样时电阻的阻值, 即电阻 R2 或 /和电阻 R3接入采样电阻 204中; 当处理器 203输出高电平时, 开关接通, 即开 关一或 /和开关二接通, 补偿电阻 205短路以减少信号采集器 202采样时电阻的阻 值, 即电阻 R2或 /和电阻 R3被旁路, 电阻 R2或 /和电阻 R3不参与信号采集器 202采 样时的电阻。 [0036] The first embodiment, as shown in FIG. 1, an optical sampling module 2 with both sampling width and accuracy, including a photocell 201, a signal collector 202 connected to the photocell 201, a processor 203, and a sampling resistor 204; The sampling resistor 204 is a resistor R1. One end of the sampling resistor 204 is connected between the signal collector 202 and the photocell 201, and the other end is connected in series with N compensation resistors 205. Each compensation resistor 205 is connected in parallel with a switch. The processor 203 is connected; the compensation resistor 205 can be set according to needs, and can be set to one, two or more. In this application, two compensation resistors 205 are used for illustration, which are resistor R2 and resistor R3, and resistor R2. A switch 1 is connected in parallel with the resistor R3, and a switch 2 is connected in parallel at both ends of the resistor R3. The control terminals of the switch 1 and switch 2 are respectively electrically connected to the processor 203. The processor 203 individually controls the on and off of the switch 1 and switch 2, when the processor When 203 outputs a low level, the switch is off, that is, switch one or/and switch two are off. The compensation resistor 205 is connected to the sampling resistor 204 to increase the resistance of the signal collector 202 during sampling, that is, the resistor R2 or/and The resistor R3 is connected to the sampling resistor 204; when the processor 203 outputs a high level, the switch is turned on, that is, the switch one or/and the switch two are turned on, and the compensation resistor 205 is short-circuited to reduce the resistance value of the resistor when the signal collector 202 is sampling. That is, the resistance R2 or/and the resistance R3 are bypassed, and the resistance R2 or/and the resistance R3 does not participate in the resistance when the signal collector 202 is sampling.
[0037] 如图 1和图 2所示, 采样电阻 204的阻值大于补偿电阻 205的阻值, 一大一小两个 不同的电阻来进行采样, 并通过处理器 203来控制开关的闭或合来切换补偿电阻 205的接入或者不接入, 既能保证高信号不会溢出, 同时也能正常地识别到低信 号。 具体的原理是信号采集器 202检测信号强时, 处理器 203切换使得信号采集 器 202的采样的电阻阻值小, 保证信号不会溢出; 当信号采集器 202采集的信号 非常微弱时, 处理器 203切换使得信号采集器 202的采样的电阻阻值大, 保证微 弱的信号也能正常地进行识别和采样。 采样系统根据实际的应用场景设置一个 初始化的采样电阻值, 然后进行第一次采样, 处理器 203根据此次采样的数据进 行分析, 如果数据溢出, 则代表信号采集器 202前端的采样时的电阻过大, 于是 减小信号采集器 202采样时的电阻, 然后再进行一次采样并输出合适的数据; 如 果发现第一次采样的信号微弱, 则代表信号采集器 202前端的采样电阻过小, 于 是增大采样时的电阻阻值并输出合适的数据。 通过处理器 203的优化, 便可实时 调节采样时的电阻的阻值, 得到最佳的采样数据。 [0037] As shown in FIG. 1 and FIG. 2, the resistance value of the sampling resistor 204 is greater than the resistance value of the compensation resistor 205, and two different resistors, one large and one small, are used for sampling, and the processor 203 controls the closing of the switch. When the compensation resistor 205 is connected or not connected together, it can ensure that the high signal will not overflow, and at the same time, the low signal can be recognized normally. The specific principle is that when the signal collector 202 detects that the signal is strong, the processor 203 switches to make the sampled resistance of the signal collector 202 small to ensure that the signal does not overflow; when the signal collected by the signal collector 202 is very weak, the processor The 203 switching makes the resistance value of the sampling resistance of the signal collector 202 large, ensuring that weak signals can also be identified and sampled normally. The sampling system sets an initial sampling resistance value according to the actual application scenario, and then performs the first sampling. The processor 203 analyzes the data of this sampling. If the data overflows, it represents the resistance of the front end of the signal collector 202 during sampling. Too big, so Reduce the resistance of the signal collector 202 during sampling, and then perform another sampling and output appropriate data; if the first sampled signal is found to be weak, it means that the sampling resistance at the front end of the signal collector 202 is too small, so increase the sampling time The resistance value and output the appropriate data. Through the optimization of the processor 203, the resistance value of the resistor during sampling can be adjusted in real time to obtain the best sampling data.
[0038] 如图 1和图 2所示, 光学采样模块 2采样的步骤为: S1, 光学采样模块 2根据实际 的应用场景设置一个初始化的采样电阻值; S2, 然后进行第一次采样; S3 , 信 号采集器 202将采集的信号传递给处理器 203 , 处理器 203根据此次采样的数据进 行分析并判断信号的强弱; S4, 如果数据信号弱时, 即第一次采样的信号微弱 , 则代表信号采集器 202前端采样时的电阻过小, 处理器 203控制开关断开以增 加采样时电阻的阻值, 然后再进行采样, 直至输出合适的数据; S5 , 如果数据 信号强时, 即数据溢出, 则代表信号采集器 202前端采样时的电阻过大, 此时, 处理器 203控制开关闭合以减小采样时电阻的阻值, 然后再进行采样; S6 , 直至 输出合适的采样数据; 因此可以实现动态数据采样。 [0038] As shown in FIG. 1 and FIG. 2, the sampling steps of the optical sampling module 2 are: S1, the optical sampling module 2 sets an initialized sampling resistance value according to the actual application scenario; S2, and then performs the first sampling; S3 , The signal collector 202 transmits the collected signal to the processor 203, and the processor 203 analyzes and judges the strength of the signal according to the data sampled this time; S4, if the data signal is weak, that is, the signal sampled for the first time is weak, It means that the resistance during sampling at the front end of the signal collector 202 is too small, and the processor 203 controls the switch to turn off to increase the resistance of the resistance during sampling, and then performs sampling until appropriate data is output; S5, if the data signal is strong, that is Data overflow means that the resistance of the front end of the signal collector 202 during sampling is too large. At this time, the processor 203 controls the switch to close to reduce the resistance of the resistance during sampling, and then performs sampling; S6, until appropriate sampling data is output; Therefore, dynamic data sampling can be achieved.
[0039] 优选的, 如图 1所示, 开关为三极管, 三极管的输入端和输出端连接在补偿电 阻 205两端, 三极管的控制端与处理器 203连接。 本申请中, 补偿电阻 205采用 2 个来说明, 分别是电阻 R2和电阻 R3 , 电阻 R2两端并联有开关一, 开关一为三极 管 Q1, 电阻 R3两端并联有开关二, 开关二为三极管 Q2, 三极管 Q1和三极管 Q2 的控制端分别与处理器 203电连接, 处理器 203分别单独控制三极管 Q1和三极管 Q 2的开和断, 三极管 Q1与处理器 203之间连接有电阻 R7, 三极管 Q1与电阻 R7之间 通过电阻 R6接地; 三极管 Q2与处理器 203之间连接有电阻 R5 , 三极管 Q2与电阻 R 5之间通过电阻 R4接地。 其中, 光电池 201的负极与信号采集器 202连接, 光电池 201的正极与电源连接。 [0039] Preferably, as shown in FIG. 1, the switch is a triode, the input end and output end of the triode are connected to both ends of the compensation resistor 205, and the control end of the triode is connected to the processor 203. In this application, two compensation resistors 205 are used for illustration, which are resistor R2 and resistor R3. The resistor R2 is connected in parallel with switch one, switch one is transistor Q1, and resistor R3 is connected in parallel with switch two, and switch two is transistor Q2. , The control ends of the transistor Q1 and the transistor Q2 are electrically connected to the processor 203, and the processor 203 separately controls the on and off of the transistor Q1 and the transistor Q2. A resistor R7 is connected between the transistor Q1 and the processor 203, and the transistor Q1 and The resistor R7 is grounded through a resistor R6; a resistor R5 is connected between the transistor Q2 and the processor 203, and a resistor R4 is connected between the transistor Q2 and the resistor R5. Among them, the negative electrode of the photo cell 201 is connected to the signal collector 202, and the positive electrode of the photo cell 201 is connected to the power source.
[0040] 如图 1和图 2所示, 光学采样模块 2具有独特的设计, 相比现有的产品, 具有更 高的灵敏度和更宽的信号测量范围。 光学采样模块 2采用共聚焦式的光学结构, 共聚焦式的光学结构的光路聚焦能力强, 激发光源经过聚焦后, 能量集中, 因 此能够激发出更大的信号, 同时共聚焦式的光学结构能够采集更多的光信号, 经过聚焦后, 透射到光电传感器上的光更加集中, 信号强度更大, 稳定性更好 , 抗干扰能力更强。 光学采样模块 2的光学元件包括: 紫外 LED灯、 平凸透镜、 窄带滤光片、 准直透镜以及二向色镜。 光学采样模块 2中的处理器 203采用动态 增益的控制方案, 对于微弱信号, 光学采样模块 2采用高倍数的增益, 可以提高 微弱光信号的幅值, 减少干扰信号的影响程度, 而对于强光信号, 处理器 203采 用低倍数的增益, 防止信号溢出而导致结果失真。 通过在光学结构上采取聚焦 性能优良的方案, 结合动态增益的控制方案, 光学采样模块 2既能够具备极高的 检测灵敏度同时又能够具备极宽的检测范围, 相比目前现有的产品有着优异的 性能。 [0040] As shown in FIGS. 1 and 2, the optical sampling module 2 has a unique design, and has higher sensitivity and a wider signal measurement range than existing products. The optical sampling module 2 adopts a confocal optical structure. The confocal optical structure has a strong optical path focusing ability. After the excitation light source is focused, the energy is concentrated, so it can excite a larger signal, and the confocal optical structure can Collect more light signals, after focusing, the light transmitted to the photoelectric sensor is more concentrated, the signal strength is greater, the stability is better, and the anti-interference ability is stronger. The optical components of the optical sampling module 2 include: ultraviolet LED lamp, plano-convex lens, Narrowband filters, collimating lenses and dichroic mirrors. The processor 203 in the optical sampling module 2 adopts a dynamic gain control scheme. For weak signals, the optical sampling module 2 adopts a high multiple of gain, which can increase the amplitude of weak optical signals and reduce the influence of interference signals. For the signal, the processor 203 uses a low multiple of gain to prevent the signal from overflowing and resulting in distortion. By adopting a solution with excellent focusing performance in the optical structure, combined with a dynamic gain control solution, the optical sampling module 2 can not only have extremely high detection sensitivity but also have an extremely wide detection range, which is superior to current existing products. Performance.
[0041] 第二实施例, 如图 3至图 7所示, 一种荧光免疫分析仪, 用于测量测试卡 70表面 的血液各项指标并打印该指标, 包括光学采样模块 2, 外壳 3 , 打印机 4, 显示屏 5, 自动退卡机构 1和主控板 6; 外壳 3设有进卡口 301和出卡口 302, 光学采样模 块 2、 自动退卡机构 1、 主控板 6和打印机 4分别设置在外壳 3内, 光学采样模块 2 , 显示屏 5, 自动退卡机构 1和打印机 4分别与主控板 6电连接; 自动退卡机构 1包 括底板 10, 滑轨 20, 滑动机构 30, 挡位机构 40和推卡机构 50; 底板 10上开设有 呈长条状的镂空部 11, 底板 10下方固定有退卡滑道 12, 退卡滑道 12的顶部呈开 口状且对应镂空部 11设置, 退卡滑道 12具有第一端及与第一端相对设置的第二 端, 第一端设有供测试卡 70进出的滑道口, 滑道口分别与进卡口 301和出卡口 30 2对接; 滑轨 20安装于底板 10上且靠近镂空部 11设置; 滑动机构 30活动安装于滑 轨 20上且可沿滑轨 20方向移动, 滑动机构 30上可放置测试卡 70; 光学采样模块 2 通过设有的支架 201设置在滑轨 20的正上方, 光学采样模块 2用于测量测试卡 70 表面血液各项指标参数并将该指标参数传递至主控板 6 , 主控板 6接收到该指标 参数后控制打印机 4打印该指标参数, 支架 201的底部与底板 10固定连接, 顶部 固定有光学采样模块 2; 挡位机构 40固定于底板 10上且靠近退卡滑道 12的第二端 的位置, 在滑动机构 30运动至靠近退卡滑道 12的第二端的位置时, 挡住测试卡 7 0继续运动, 使测试卡 70落入退卡滑道 12中; 推卡机构 50安装于滑动机构 30上且 部分伸入退卡滑道 12中, 以在滑动机构 30沿退卡滑道 12的第二端向第一端运动 时, 将测试卡 70从退卡滑道 12的滑道口推出, 实现自动退卡。 [0041] The second embodiment, as shown in FIGS. 3 to 7, a fluorescence immunoassay analyzer for measuring various blood indicators on the surface of the test card 70 and printing the indicators, including an optical sampling module 2, a housing 3, Printer 4, display screen 5, automatic card ejection mechanism 1 and main control board 6; shell 3 is provided with bayonet inlet 301 and bayonet outlet 302, optical sampling module 2, automatic card ejection mechanism 1, main control board 6 and printer 4 The optical sampling module 2, the display screen 5, the automatic card ejection mechanism 1 and the printer 4 are respectively arranged in the housing 3 and are electrically connected to the main control board 6. The automatic card ejection mechanism 1 includes a bottom plate 10, a sliding rail 20, and a sliding mechanism 30, The gear mechanism 40 and the card pushing mechanism 50; the bottom plate 10 is provided with a long hollow part 11, the card ejecting slide 12 is fixed under the bottom plate 10, and the top of the card ejecting slide 12 is open and corresponds to the hollow part 11 The card ejecting slide 12 has a first end and a second end opposite to the first end. The first end is provided with a slideway opening for the test card 70 to enter and exit. The slideway openings are respectively connected to the bayonet inlet 301 and the bayonet outlet 30 2 docking; the sliding rail 20 is installed on the bottom plate 10 and located close to the hollow part 11; the sliding mechanism 30 is movably installed on the sliding rail 20 and can move along the sliding rail 20, and the test card 70 can be placed on the sliding mechanism 30; optical sampling module 2 The optical sampling module 2 is used to measure various index parameters of the blood on the surface of the test card 70 and transmit the index parameters to the main control board 6, and the main control board 6 receives After the index parameter, the printer 4 is controlled to print the index parameter. The bottom of the bracket 201 is fixedly connected to the bottom plate 10, and the optical sampling module 2 is fixed on the top; the shift mechanism 40 is fixed on the bottom plate 10 and is close to the second end of the card ejecting slide 12 Position, when the sliding mechanism 30 moves to a position close to the second end of the card ejecting slide 12, the test card 70 is blocked from continuing to move, so that the test card 70 falls into the card ejecting slide 12; the card pushing mechanism 50 is installed on the sliding mechanism 30 and partially extend into the card ejecting slide 12 to push the test card 70 out of the slideway opening of the card ejecting slide 12 when the sliding mechanism 30 moves along the second end of the card ejecting slide 12 to the first end. Realize automatic card refund.
[0042] 如图 3至图 7所示, 具体工作时, 滑动机构 30可在驱动力的驱动下沿滑轨 20的方 向往复运动, 在滑动机构 30带动测试卡 70进入仪器内部进行测试, 光学采样模 块 2对测试卡 70表面的血液进行测试, 并将测试结果发送至主控板 6 , 此时主控 板 6控制打印机 4将测试结果打印出来, 在测试卡 70通过测试后, 滑动机构 30带 动测试卡 70继续沿滑轨 20方向运动至其他的检测工位, 在测试卡 70测试失败时 , 测试卡 70可从退卡滑道 12中自动退出。 具体的, 测试卡 70随滑动机构 30继续 运动一段距离后, 测试卡 70在挡位机构 40的挡位作用下脱离滑动机构 30并落入 退卡滑道 12中; 在滑动机构 30反向运动时, 与滑动机构 30固定连接的推卡机构 5 0可抵接测试卡 70, 并随着继续运动的滑动机构 30将测试卡 70从退卡滑道 12中推 出, 实现自动退卡, 由于存在推卡机构 50, 可提供推力, 即使测试卡 70在退卡 滑道 12中堆积也不会造成仪器卡死。 [0042] As shown in FIGS. 3 to 7, during specific work, the sliding mechanism 30 can reciprocate along the direction of the sliding rail 20 under the driving force, and the sliding mechanism 30 drives the test card 70 into the instrument for testing. Sampling mode Block 2 tests the blood on the surface of the test card 70 and sends the test results to the main control board 6. At this time, the main control board 6 controls the printer 4 to print the test results. After the test card 70 passes the test, the sliding mechanism 30 drives The test card 70 continues to move in the direction of the slide rail 20 to other inspection stations. When the test card 70 fails the test, the test card 70 can be automatically withdrawn from the card eject chute 12. Specifically, after the test card 70 continues to move with the sliding mechanism 30 for a certain distance, the test card 70 is separated from the sliding mechanism 30 under the action of the shift mechanism 40 and falls into the card ejecting slide 12; the sliding mechanism 30 moves in the reverse direction At this time, the card pushing mechanism 50 fixedly connected to the sliding mechanism 30 can abut the test card 70, and with the sliding mechanism 30 that continues to move, push the test card 70 out of the card eject chute 12 to realize automatic card ejection. The card pushing mechanism 50 can provide thrust, and even if the test card 70 accumulates in the card ejecting chute 12, it will not cause the instrument to jam.
[0043] 如图 3至图 7所示, 本申请的技术方案中自动退卡机构 1的主要包括底板 10、 滑 轨 20、 滑动机构 30、 挡位机构 40及推卡机构 50, 其中, 底板 10上设有退卡滑道 1 2, 滑轨 20固定安装于底板 10上, 滑动机构 30滑接于滑轨 20上, 且滑动机构 30上 可放置测试卡 70, 在滑动机构 30运动至靠近滑轨 20的另一端时, 挡位机构 40可 避让滑动机构 30并可挡住测试卡 70继续运动。 如此, 测试卡 70落入退卡滑道 12 中, 在滑动机构 30反向运动时, 设置在滑动机构 30上的推卡机构 50可抵接测试 卡 70, 并随着滑动机构 30的运动将测试卡 70从退卡滑道 12中推出, 实现自动退 卡。 本方案在不增加额外的动力情况, 可将测试卡 70主动推出。 这种主动式的 退卡方式将保证测试卡 70顺利地被送出退卡滑道 12, 保证顺利出卡, 降低故障 率, 提高设备测试的稳定性。 [0043] As shown in FIGS. 3 to 7, the automatic card ejecting mechanism 1 in the technical solution of the present application mainly includes a bottom plate 10, a sliding rail 20, a sliding mechanism 30, a gear mechanism 40, and a card pushing mechanism 50, wherein the bottom plate 10 is provided with a card ejecting slide 12, the slide rail 20 is fixedly installed on the bottom plate 10, the slide mechanism 30 is slidably connected to the slide rail 20, and a test card 70 can be placed on the slide mechanism 30, and the slide mechanism 30 moves close to At the other end of the sliding rail 20, the gear mechanism 40 can avoid the sliding mechanism 30 and block the test card 70 from continuing to move. In this way, the test card 70 falls into the card eject chute 12, and when the sliding mechanism 30 moves in the reverse direction, the card pushing mechanism 50 provided on the sliding mechanism 30 can abut the test card 70, and follow the movement of the sliding mechanism 30. The test card 70 is pushed out from the card ejecting chute 12 to realize automatic card ejection. In this solution, the test card 70 can be actively launched without adding additional power. This active card ejection method will ensure that the test card 70 is smoothly sent out of the card ejection chute 12, ensuring smooth card ejection, reducing the failure rate, and improving the stability of equipment testing.
[0044] 如图 3至图 7所示, 滑动机构 30为卡托滑块 31, 卡托滑块 31沿滑轨 20方向形成有 可容置测试卡 70的收纳槽, 收纳槽位于退卡滑道 12的上方, 且收纳槽的一端形 成有与退卡滑道 12的滑道口同端设置的放料口。 为了简化设备机构, 本方案中 采用较为较简单的卡托滑块 31, 卡托滑块 31的收纳槽可方便对测试卡 70的位置 限定, 收纳槽的放料口可方便测试卡 70的插入。 另外的, 该收纳槽的出口可以 呈广角设置, 以使测试卡 70顺利从放料口滑入。 [0044] As shown in FIGS. 3 to 7, the sliding mechanism 30 is a card tray slider 31, and the card tray slider 31 is formed with a storage slot that can accommodate the test card 70 along the direction of the slide rail 20, and the storage slot is located in the card ejecting slide. Above the channel 12, and at one end of the receiving groove, a discharge opening is formed at the same end as the chute opening of the card ejecting chute 12 . In order to simplify the equipment mechanism, a relatively simple card tray slider 31 is used in this solution. The storage slot of the card tray slider 31 can conveniently limit the position of the test card 70, and the discharge port of the storage slot can facilitate the insertion of the test card 70. . In addition, the outlet of the receiving slot can be set at a wide angle, so that the test card 70 can slide in smoothly from the discharge port.
[0045] 如图 3至图 7所示, 挡位机构 40为挡板 41, 挡板 41中间形成避让位且挡板 41靠近 滑轨 20的一侧设有可抵接测试卡 70的挡位块 42。 为了简化设备机构采用挡板 41 作为挡位机构 40, 挡板 41横跨于退卡滑道 12上, 挡板 41远离滑轨 20的一侧固定 在底板 10上, 中间为避让位, 另一侧设置有挡位测试卡 70大的挡位块 42。 [0045] As shown in FIGS. 3 to 7, the gear mechanism 40 is a baffle 41. The baffle 41 forms an escape position in the middle, and the side of the baffle 41 close to the slide rail 20 is provided with a gear that can abut the test card 70. Block 42. In order to simplify the equipment mechanism, the baffle 41 is used as the gear mechanism 40. The baffle 41 straddles the card ejecting slide 12, and the baffle 41 is fixed on the side away from the slide rail 20 On the bottom plate 10, the middle is an avoidance position, and the other side is provided with a stop block 42 as large as the gear test card 70.
[0046] 如图 3至图 7所示, 进一步的, 挡板 41呈反“r”型设置。 “r”型中较短的一边为勾 部, 该勾部为档位块的位置, 实际的, 该勾部的长度可以根据实际的要求来设 计。 [0046] As shown in FIGS. 3 to 7, further, the baffle 41 is arranged in a reverse "r" shape. The shorter side of the "r" type is the hook, which is the position of the gear block. Actually, the length of the hook can be designed according to actual requirements.
[0047] 具体的, 如图 3至图 7所示, 推卡机构 50为推板, 推板与退卡滑道 12的底部预留 有间隙, 间隙小于或等于测试卡 70的厚度。 为了简化设备机构, 采用推板作为 推卡机构 50, 推板的两侧与退卡滑道 12的两侧内壁留有间隙, 避免推板妨碍卡 托滑块 31移动, 且推板与退卡滑道 12底部留有小于或等于测试卡 70厚度的间隙 , 如此, 以方便推板的端部推挤测试卡 70。 采用同一套驱动机构, 可提供主动 退卡的驱动力。 [0047] Specifically, as shown in FIGS. 3 to 7, the card pushing mechanism 50 is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide 12, and the gap is less than or equal to the thickness of the test card 70. In order to simplify the equipment mechanism, a push plate is used as the card pushing mechanism 50. There are gaps between the two sides of the push plate and the inner walls of both sides of the card ejecting slide 12 to prevent the push plate from obstructing the movement of the card tray slider 31, and the pushing plate and ejecting card A gap less than or equal to the thickness of the test card 70 is left at the bottom of the slideway 12, so as to facilitate the end of the push plate to push the test card 70. Using the same set of driving mechanism, it can provide the driving force for active card withdrawal.
[0048] 进一步的, 如图 3至图 7所示, 推板供推挤测试卡 70的一侧设置有呈弯折状的推 挤部。 为了更方便退卡, 推板推挤测试卡 70的一侧设置有推挤部, 推挤部呈弯 折状设置, 如此, 可以较佳的将测试卡 70推出。 [0048] Further, as shown in FIG. 3 to FIG. 7, a side of the push plate for pushing the test card 70 is provided with a push portion in a bent shape. In order to facilitate the ejection of the card, a pushing part is provided on one side of the push plate pushing the test card 70, and the pushing part is arranged in a bent shape, so that the test card 70 can be pushed out better.
[0049] 请参照图 6和图 7, 具体的, 自动退卡机构还包括安装于底板 10上的驱动机构 60 , 驱动机构 60带动卡托滑块 31沿滑轨 20的方向往复运动。 通过该驱动机构 60, 可实现卡托滑块 31的往复运动, 6 and 7, specifically, the automatic card ejecting mechanism further includes a driving mechanism 60 installed on the bottom plate 10, and the driving mechanism 60 drives the card holder slider 31 to reciprocate along the direction of the slide rail 20. Through the driving mechanism 60, the reciprocating movement of the card holder slider 31 can be realized,
[0050] 进一步的, 如图 3至图 7所示, 驱动机构 60包括电机 61、 皮带 62及定位轮 63(亦 可为同步轮), 卡托滑块 31还设置有连接件 32并通过连接件 32与皮带 62固定连接 , 以在电机 61工作时, 带动皮带 62及卡托滑块 31运动。 皮带 62套设在电机 61的 同步轮及定位轮 63上, 电机 61工作时带动皮带 62运动, 由于皮带 62与卡托滑块 3 1固定连接, 固定在皮带 62运动时可带动卡托滑块 31—起运动。 [0050] Further, as shown in FIGS. 3 to 7, the driving mechanism 60 includes a motor 61, a belt 62, and a positioning wheel 63 (or a synchronous wheel). The card holder slider 31 is also provided with a connecting member 32 and connected by The member 32 is fixedly connected with the belt 62 to drive the belt 62 and the carriage slider 31 to move when the motor 61 is working. The belt 62 is sleeved on the synchronization wheel and the positioning wheel 63 of the motor 61. The motor 61 drives the belt 62 to move when the motor 61 works. Since the belt 62 is fixedly connected to the card holder slider 31, it can drive the card holder slider when the belt 62 moves. 31-Exercise.
[0051] 具体的, 如图 3至图 7所示, 滑轨 20为单轨, 单轨的两侧设有卡槽, 卡托滑块 31 卡接于卡槽中。 卡托滑块 31与单轨卡接配合, 使得卡托滑块 31稳定地沿单轨方 向往复运动。 [0051] Specifically, as shown in FIGS. 3 to 7, the slide rail 20 is a single rail, and two sides of the single rail are provided with a card slot, and the card tray slider 31 is clamped in the card slot. The card holder slider 31 is engaged with the monorail, so that the card holder slider 31 reciprocates stably along the monorail direction.
[0052] 如图 3至图 7所示, 外壳 3内还设有用于扫码测试卡 70信息的扫码模块 7, 扫码模 块 7与主控板 6电连接, 扫码模块 7扫描测试卡 70信息的信息, 并将该信息传递至 主控板 6 , 主控板 6孔打印机 4打印测试卡 70信息。 扫码模块 7固定在支架 201的顶 部, 且位于光学采样模块 2。 [0053] 如图 3至图 7所示, 主控板 6上设有若干插槽, 插槽内插设有 WIFI模块, 蓝牙模 块或 4G模块。 [0052] As shown in FIG. 3 to FIG. 7, the housing 3 is also provided with a code scanning module 7 for scanning code information of the test card 70, the code scanning module 7 is electrically connected to the main control board 6, and the code scanning module 7 scans the test card 70 information information, and transfer the information to the main control board 6, and the main control board 6-hole printer 4 prints the test card 70 information. The code scanning module 7 is fixed on the top of the bracket 201 and is located in the optical sampling module 2. [0053] As shown in FIGS. 3 to 7, a number of slots are provided on the main control board 6, and a WIFI module, a Bluetooth module or a 4G module is inserted in the slots.
[0054] 如图 3至图 7所示, 推卡机构 50为推板, 推板与退卡滑道 12的底部预留有间隙, 间隙小于或等于测试卡 70的厚度。 [0054] As shown in FIGS. 3 to 7, the card pushing mechanism 50 is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide 12, and the gap is less than or equal to the thickness of the test card 70.
[0055] 综上, 本申请至少具有如下优点: [0055] In summary, this application has at least the following advantages:
[0056] 1、 测试卡 70采用前置前出方式, 在测试前将测试卡 70收集框置于仪器下方, 当测试完成后测试卡 70从仪器前方推出直接掉落至测试卡 70收集框中, 节省操 作人员人力; [0056] 1. The test card 70 adopts the front-to-front out method, and the test card 70 collection frame is placed under the instrument before the test. When the test is completed, the test card 70 is pushed out from the front of the instrument and drops directly into the test card 70 collection frame , Save the manpower of the operator;
[0057] 2、 允许测试完成后的测试卡 70在仪器外部堆积不影响正常退卡, 操作人员无 需做完一次测试就要收集一次测试卡 70, 避免操作人员频繁操作带来的人力浪 费; [0057] 2. The test card 70 after the test is allowed to accumulate outside the instrument does not affect the normal card ejection, and the operator does not need to complete a test to collect the test card 70 once, so as to avoid the waste of manpower caused by the frequent operation of the operator;
[0058] 3、 退卡(:测试卡 70)与进卡共用同一套驱动, 简化了结构, 提高了稳定性, 降低 了整机成本; [0058] 3. The card returning (test card 70) shares the same set of drivers with the card entering, which simplifies the structure, improves the stability, and reduces the cost of the whole machine;
[0059] 4、 主动式退卡, 保证测试卡 70顺利滑出仪器。 [0059] 4. Active card ejection ensures that the test card 70 slides out of the instrument smoothly.
[0060] 5、 设计中在底板预留功能接口, 可以方便快速地在设备上增加新的功能, 所 以本设计的荧光免疫分析仪功能齐全, 相比起现有品牌的产品, 不仅具有 WIFI 功能也能够具备 4G、 蓝牙多种方式的无线功能等; [0060] 5. In the design, a functional interface is reserved on the bottom plate, so that new functions can be added to the device conveniently and quickly. Therefore, the fluorescence immunoassay analyzer of this design has complete functions. Compared with existing brand products, it not only has WIFI function It can also have 4G and Bluetooth wireless functions in multiple ways;
[0061] 6、 由于模块之间功能独立, 只需要有固定的控制接口和协议, 因此模块可以 随着市场需求独立升级, 然后快速替换原来的模块, 实现二次设计。 [0061] 6. Since the functions of the modules are independent, only a fixed control interface and protocol are required. Therefore, the modules can be upgraded independently according to market demand, and then the original modules can be quickly replaced to achieve secondary design.
[0062] 7、 荧光免疫分析仪具有多种无线功能模块, 包括 WIFI、 4G以及蓝牙, 同时荧 光免疫分析仪备软件设置了远程通信接口和协议与服务器进行连接, 能够实现 远程监控和数据共享的功能, 通过监控设备的变化以提前对设备的健康状态进 行预警, 并及时采取相应的措施; 另一方面, 由于具备数据共享, 可以对设备 的宏观运行状态进行统计分析, 寻找和发现设备整体系统的特点, 包括设计中 的缺陷、 使用过程中的不良、 样本的特点以及用户的习惯等, 对于进行产品的 大数据分析具有非常重要的作用。 [0062] 7. The fluorescence immunoassay analyzer has a variety of wireless function modules, including WIFI, 4G, and Bluetooth. At the same time, the fluorescence immunoassay analyzer is equipped with a remote communication interface and protocol to connect to the server, which can realize remote monitoring and data sharing. Function, by monitoring the changes of the equipment to give early warning of the health status of the equipment, and take corresponding measures in time; on the other hand, because of the data sharing, the macro operating status of the equipment can be statistically analyzed to find and discover the overall system of the equipment The characteristics of the product, including the defects in the design, the defects in the use process, the characteristics of the samples, and the user habits, etc., play a very important role in the big data analysis of the product.
[0063] 以上仅为本申请的优选实施例, 并非因此限制本申请的专利范围, 凡是在本申 请的申请构思下, 利用本申请说明书及附图内容所作的等效结构变换, 或直接 / 间接运用在其他相关的技术领域均包括在本申请的专利保护范围内。 发明概述 [0063] The above are only the preferred embodiments of the application, and do not limit the scope of the application. Under the application concept of the application, the equivalent structure transformations made by using the content of the specification and drawings of the application, or directly/ Indirect applications in other related technical fields are included in the scope of patent protection of this application. Summary of the invention
技术问题 technical problem
问题的解决方案 The solution to the problem
发明的有益效果 The beneficial effects of the invention

Claims

权利要求书 Claims
[权利要求 1] 一种兼具采样宽度和精度的光学采样模块, 其特征在于, 包括光电池 , 与光电池连接的信号采集器, 处理器和采样电阻; 所述采样电阻的 一端连接在信号采集器与光电池之间, 另一端串联有 N个补偿电阻, 每一补偿电阻两端并联有开关, 所述开关的控制端与处理器连接; 当 处理器输出低电平时, 开关断开, 补偿电阻接入到采样电阻中以增加 信号采集器采样时电阻的阻值; 当处理器输出高电平时, 开关接通, 补偿电阻短路以减少信号采集器采样时电阻的阻值。 [Claim 1] An optical sampling module with both sampling width and accuracy, characterized in that it comprises a photocell, a signal collector connected to the photocell, a processor and a sampling resistor; one end of the sampling resistor is connected to the signal collector There are N compensation resistors connected in series with the photovoltaic cell at the other end, and a switch is connected in parallel at both ends of each compensation resistor, and the control end of the switch is connected to the processor; when the processor outputs a low level, the switch is turned off and the compensation resistor is connected Into the sampling resistor to increase the resistance of the signal collector during sampling; when the processor outputs a high level, the switch is turned on to compensate for the resistance short circuit to reduce the resistance of the signal collector during sampling.
[权利要求 2] 根据权利要求 1所述兼具采样宽度和精度的光学采样模块, 其特征在 于, 所述开关为三极管, 所述三极管的输入端和输出端连接在补偿电 阻两端, 所述所述三极管的控制端与处理器连接。 [Claim 2] The optical sampling module with both sampling width and accuracy according to claim 1, wherein the switch is a triode, the input end and the output end of the triode are connected to both ends of the compensation resistor, and the The control end of the triode is connected with the processor.
[权利要求 3] 一种荧光免疫分析仪, 用于测量测试卡表面的血液各项指标并打印该 指标, 其特征在于, 包括权利要求 1所述的光学采样模块, 外壳, 打 印机, 显示屏, 自动退卡机构和主控板; 所述外壳设有进卡口和出卡 口, 所述光学采样模块、 自动退卡机构、 主控板和打印机分别设置在 外壳内, 所述光学采样模块, 显示屏, 自动退卡机构和打印机分别与 主控板电连接; 所述自动退卡机构包括底板, 滑轨, 滑动机构, 挡位 机构和推卡机构; 所述底板上开设有呈长条状的镂空部, 所述底板下 方固定有退卡滑道, 退卡滑道的顶部呈开口状且对应镂空部设置, 所 述退卡滑道具有第一端及与第一端相对设置的第二端, 所述第一端设 有供测试卡进出的滑道口, 所述滑道口与进卡口对接, 所述滑道口与 出卡口对接; 所述滑轨安装于底板上且靠近镂空部设置; 所述滑动机 构活动安装于滑轨上且可沿滑轨方向移动, 所述滑动机构上可放置测 试卡; 所述光学采样模块通过设有的支架设置在滑轨的正上方, 光学 采样模块用于测量测试卡表面血液各项指标参数并将该指标参数传递 至主控板, 主控板接收到该指标参数后控制打印机打印该指标参数; 所述挡位机构固定于底板上且靠近退卡滑道的第二端的位置, 在滑动 机构运动至靠近退卡滑道的第二端的位置时, 挡住测试卡继续运动, 使测试卡落入退卡滑道中; 所述推卡机构安装于滑动机构上且部分伸 入退卡滑道中, 以在滑动机构沿退卡滑道的第二端向第一端运动时, 将测试卡从退卡滑道的滑道口推出, 实现自动退卡。 [Claim 3] A fluorescence immunoassay analyzer for measuring various blood indicators on the surface of a test card and printing the indicators, characterized by comprising the optical sampling module according to claim 1, a housing, a printer, and a display screen, An automatic card ejection mechanism and a main control board; the housing is provided with a bayonet inlet and a card outlet; the optical sampling module, the automatic card ejection mechanism, the main control board and the printer are respectively arranged in the housing, the optical sampling module, The display screen, the automatic card ejection mechanism and the printer are respectively electrically connected to the main control board; the automatic card ejection mechanism includes a bottom plate, a sliding rail, a sliding mechanism, a stop mechanism and a card pushing mechanism; the bottom plate is provided with a strip shape The card ejecting slide is fixed under the bottom plate, and the top of the card ejecting slide is open and corresponding to the hollow portion. The card ejecting slide has a first end and a second opposite to the first end. The first end is provided with a slideway opening for the test card to enter and exit, the slideway opening is docked with the bayonet inlet, and the slideway opening is docked with the bayonet outlet; the slide rail is installed on the bottom plate and is arranged near the hollow portion The sliding mechanism is movably mounted on the sliding rail and can move in the direction of the sliding rail, and the test card can be placed on the sliding mechanism; the optical sampling module is set directly above the sliding rail through a bracket, and the optical sampling module It is used to measure various index parameters of blood on the surface of the test card and transfer the index parameters to the main control board. After receiving the index parameters, the main control board controls the printer to print the index parameters; the gear mechanism is fixed on the bottom plate and close to the back The position of the second end of the card slide, when the sliding mechanism moves to a position close to the second end of the card ejecting slide, blocks the test card from continuing to move, The test card is dropped into the card ejecting slide; the card pushing mechanism is installed on the sliding mechanism and partially extends into the card ejecting slide, so that when the sliding mechanism moves along the second end of the card ejecting slide to the first end, The test card is pushed out from the exit of the card ejecting slide to realize automatic card eject.
[权利要求 4] 如权利要求 3所述的荧光免疫分析仪, 其特征在于, 所述外壳内还设 有用于扫码测试卡信息的扫码模块, 所述扫码模块与主控板电连接, 所述扫码模块扫描测试卡信息的信息, 并将该信息传递至主控板, 主 控板孔打印机打印测试卡信息。 [Claim 4] The fluorescence immunoassay analyzer according to claim 3, characterized in that, a code scanning module for scanning code test card information is further provided in the housing, and the code scanning module is electrically connected to the main control board The code scanning module scans the information of the test card information, and transmits the information to the main control board, and the main control board hole printer prints the test card information.
[权利要求 5] 如权利要求 3所述的荧光免疫分析仪, 其特征在于, 所述主控板上设 有若干插槽, 所述插槽内插设有 WIFI模块和 4G模块。 [Claim 5] The fluorescence immunoassay analyzer of claim 3, wherein the main control board is provided with a number of slots, and a WIFI module and a 4G module are inserted in the slots.
[权利要求 6] 如权利要求 3所述的荧光免疫分析仪, 其特征在于, 所述滑动机构为 卡托滑块, 所述卡托滑块沿滑轨方向形成有可容置测试卡的收纳槽, 所述收纳槽位于退卡滑道的上方, 且收纳槽的一端形成有与退卡滑道 的滑道口同端设置的放料口。 [Claim 6] The fluorescence immunoassay analyzer of claim 3, wherein the sliding mechanism is a card tray slider, and the card tray slider is formed along the sliding rail with a storage that can accommodate a test card The receiving groove is located above the card ejecting slide, and one end of the receiving groove is formed with a discharge opening provided at the same end as the slide opening of the card ejecting slide.
[权利要求 7] 如权利要求 6所述的荧光免疫分析仪, 其特征在于, 所述挡位机构为 挡板, 所述挡板中间形成避让位且挡板靠近滑轨的一侧设有可抵接测 试卡的挡位块。 [Claim 7] The fluorescence immunoassay analyzer according to claim 6, wherein the gear mechanism is a baffle, a retreat is formed in the middle of the baffle, and a side of the baffle close to the slide rail is provided with a Abutting the stop block of the test card.
[权利要求 8] 如权利要求 7所述的荧光免疫分析仪, 其特征在于, 所述推卡机构为 推板, 所述推板与退卡滑道的底部预留有间隙, 所述间隙小于或等于 测试卡的厚度。 [Claim 8] The fluorescence immunoassay analyzer of claim 7, wherein the card pushing mechanism is a pushing plate, and a gap is reserved between the pushing plate and the bottom of the card ejecting slide, and the gap is smaller than Or equal to the thickness of the test card.
[权利要求 9] 如权利要求 8所述的荧光免疫分析仪, 其特征在于, 所述推板供推挤 测试卡的一侧设置有呈弯折状的推挤部。 [Claim 9] The fluorescence immunoassay analyzer of claim 8, wherein the push plate is provided with a curved push part on one side of the push plate for pushing the test card.
[权利要求 10] 如权利要求 9所述的荧光免疫分析仪, 其特征在于, 所述自动退卡机 构还包括安装于底板上的驱动机构, 所述驱动机构带动卡托滑块沿滑 轨的方向往复运动。 [Claim 10] The fluorescence immunoassay analyzer of claim 9, wherein the automatic card ejection mechanism further comprises a driving mechanism installed on the bottom plate, and the driving mechanism drives the card holder slider to move along the slide rail. Reciprocating direction.
PCT/CN2019/077734 2019-02-01 2019-03-12 Optical sampling module having balanced sampling width and precision, and immunofluorescence assay equipment WO2020155314A1 (en)

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