WO2020152894A1 - Device for measuring degradation of rectifying element and method for measuring degradation of rectifying element - Google Patents

Device for measuring degradation of rectifying element and method for measuring degradation of rectifying element Download PDF

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Publication number
WO2020152894A1
WO2020152894A1 PCT/JP2019/031518 JP2019031518W WO2020152894A1 WO 2020152894 A1 WO2020152894 A1 WO 2020152894A1 JP 2019031518 W JP2019031518 W JP 2019031518W WO 2020152894 A1 WO2020152894 A1 WO 2020152894A1
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Prior art keywords
rectifying element
voltage
deterioration
diodes
current value
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PCT/JP2019/031518
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French (fr)
Japanese (ja)
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吉彦 落合
進一 佐藤
本章 渕脇
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電元社トーア株式会社
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Publication of WO2020152894A1 publication Critical patent/WO2020152894A1/en

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K11/00—Resistance welding; Severing by resistance heating
    • B23K11/24—Electric supply or control circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Definitions

  • the present invention relates to a rectifying element deterioration measuring device and a rectifying element deterioration measuring method capable of measuring deterioration of a rectifying element such as a diode.
  • an inverter-type resistance welding machine as disclosed in Patent Documents 1 to 3, which can set a wide range of welding conditions and can perform high-quality welding. It is being used.
  • the inverter type resistance welding machine has an inverter transformer that supplies a large welding current during spot welding, and a diode stack (a unit in which two or more diodes are combined) provided in this inverter transformer. The diode stack provided in the inverter transformer is easily deteriorated because a large welding current is applied during spot welding.
  • the progress of deterioration of the diode stack varies depending on individual performance, usage environment, usage frequency, welding conditions, etc.
  • a resistance welding machine arranged on a manufacturing line of a factory if the diode stack fails due to unexpected deterioration, it takes time to replace the diode stack, and the manufacturing line must be stopped. Therefore, it is important to know the degree of progress of deterioration of the diode stack before the production line is stopped in order to prevent the production line from stopping and to perform planned maintenance by preventive maintenance.
  • the present invention has been made to solve such a problem, and an object thereof is to provide a rectifying element deterioration measuring device and a rectifying element deterioration measuring method capable of measuring deterioration of a rectifying element such as a diode of a diode stack.
  • a rectifying element deterioration measuring apparatus for achieving the above object detects a power supply for applying a reverse voltage to a rectifying element and a current value of a current flowing through the rectifying element when the reverse voltage is applied. If the current detection unit and the detected current value are larger than the judgment current value for judging deterioration of the rectifying element, it is judged that the rectifying element is deteriorated, and if smaller, it is judged that the rectifying element is not deteriorated. And a judging section.
  • a step of applying a reverse voltage to the rectifying element, detecting the current value of the current flowing in the rectifying element, the detected current value is The step of determining that the rectifying element is deteriorated if the current value is larger than the determination current value for determining the deterioration of the rectifying element, and determining that the rectifying element is not deteriorated if it is smaller.
  • the deterioration of the rectifying element is judged based on the current value of the current flowing when the reverse voltage is applied to the rectifying element. It is easy to measure the degree. By making this measurement regularly, the degree of progress of deterioration of the rectifying element can be known, preventive maintenance of the rectifying element becomes possible, and planned maintenance becomes possible.
  • FIG. 4 is a diagram for explaining the operation flowchart of FIG. 3. It is a flow chart of a processing procedure of a rectifying element deterioration measuring method of this embodiment. It is explanatory drawing when the rectifying element deterioration measuring method of this embodiment is applied to a welding robot.
  • FIG. 1 is a schematic configuration diagram of the rectifying element deterioration measuring device of the present embodiment.
  • the rectifying element deterioration measuring device 100 measures the degree of progress of deterioration of the diodes 172 and 174 of the diode stack 170 provided in the inverter transformer 150.
  • the rectifier deterioration measuring device 100 has a programmable power supply 110, a resistor 115, an insulation amplifier 120, an oscilloscope 130, and a personal computer 140.
  • the inverter transformer 150 has a transformer 160 and a diode stack 170.
  • the diode stack 170 includes two diodes 172 and 174.
  • the inverter transformer 150 is provided in, for example, a resistance welding machine, and supplies a welding current for welding steel plates to each other between electrodes.
  • the transformer 160 generates an AC welding current, and the diodes 172 and 174 of the diode stack 170 convert the AC welding current into a DC welding current.
  • DC welding current is supplied between the electrodes of the resistance welding machine.
  • the programmable power supply 110 is a power supply that applies a reverse voltage Va to the diodes 172 and 174 that are rectifying elements.
  • the programmable power supply 110 applies a constant reverse voltage to the diodes 172 and 174, or increases the reverse voltage applied to the diodes 172 and 174 stepwise, and also increases the reverse voltage stepwise.
  • the ramp is programmed to ramp from the current stage voltage to the next stage voltage over a period of time when ramping to the next stage.
  • the maximum reverse voltage applied to the diodes 172, 174 by the programmable power supply 110 is such that the reverse breakdown voltage of the diodes 172, 174 does not damage the diodes 172, 174 even if applied to the deteriorated diodes 172, 174.
  • the voltage is 60% or less not including 0.
  • the programmable power supply 110 is programmed so that the reverse voltage of 360V or more is not applied to the diodes 172 and 174.
  • the reverse voltage applied to the diodes 172 and 174 is most preferably 60% or less of the reverse breakdown voltage of the diodes 172 and 174 that does not include 0, but may be 90% or less that does not include 0.
  • the resistor 115 converts a current (leakage current: also referred to as IRD) flowing in the diodes 172 and 174 into a voltage by a reverse voltage applied to the diodes 172 and 174 by the programmable power supply 110.
  • a current having a current value obtained by adding the current value of the current of the diode 172 and the current value of the current of the diode 174 flows through the resistor 115. Therefore, the inter-terminal voltage Vb of the resistor 115 is obtained by multiplying the resistance value (R) of the resistor 115 by the current value (i172) of the current of the diode 172 and the current value (i174) of the current of the diode 174. It becomes the combined voltage value (V). That is, the voltage between the terminals of the resistor 115 is represented by the equation Vb R ⁇ (i172+i174).
  • the isolation amplifier 120 is an amplifier that insulates the input side (diode side) from the output side (oscilloscope side), and the reverse voltage Va applied to the diodes 172 and 174 by the programmable power supply 110 and the resistance to the oscilloscope 130.
  • the voltage Vb between the terminals of the device 115 is output.
  • the oscilloscope 130 visualizes and displays a temporal change between the reverse voltage Va applied to the diodes 172 and 174 by the programmable power supply 110 and the terminal voltage Vb of the resistor 115.
  • the oscilloscope 130 is provided so that the measurer can see the degree of deterioration of the diodes 172 and 174 according to the waveform, but the oscilloscope 130 may be omitted. If omitted, the output side of the isolation amplifier 120 is directly connected to the personal computer 140.
  • the resistor 115, the isolation amplifier 120, and the oscilloscope 130 function as a current detection unit that detects the current value of the current flowing in the diodes 172 and 174 when the programmable power supply 110 applies a reverse voltage to the diodes 172 and 174.
  • the current detection unit includes a resistor 115 connected in series with the diodes 172 and 174, and using the terminal voltage Vb of the resistor 115 generated by the current flowing through the resistor 115, the current flowing through the diodes 172 and 174. The current value of is detected.
  • the resistor 115, the isolation amplifier 120, and the oscilloscope 130 form a current detection unit, but the configuration of the current detection unit is not limited to such a configuration.
  • a voltmeter that detects the voltage between the terminals of the resistor 115 and the resistor 115 may be used.
  • the resistor 115 may be omitted and the measurement may be performed directly by an ammeter.
  • a worker in the field may judge the degree of progress of deterioration of the diodes 172 and 174 based on the values of the voltmeter and the ammeter.
  • the personal computer 140 stores a judgment current value for judging deterioration of the diodes 172, 174.
  • the judgment current value is set according to the electrical characteristics of the diodes 172 and 174 immediately before the damage. For example, a large number of reverse-direction resistance values of the diodes 172 and 174 immediately before damage are measured, the resistance values are accumulated, a judgment current value is calculated with reference to the accumulated resistance value, and the calculated judgment current value is calculated.
  • a rectifying element such as the diodes 172 and 174 has a larger current when a reverse voltage is applied as the deterioration progresses.
  • the current value of 1 mA or less may exceed 100 mA due to deterioration of the diodes 172, 174.
  • the determination current value can be obtained by dividing the maximum reverse voltage applied by the programmable power supply 110 by the resistance value Rinv of the diode.
  • the determination current value is set to a value slightly smaller than the value thus obtained in order to increase the reliability of the determination of the degree of progress of deterioration of the diodes 172 and 174.
  • the personal computer 140 also includes a program for comparing the current value of the current flowing through the diodes 172 and 174 with the stored determination current value.
  • the personal computer 140 determines that the diodes 172 and 174 are deteriorated if the current value of the current flowing in the diodes 172 and 174 is larger than the determination current value. If the current value of the current flowing through the diodes 172 and 174 is smaller than the determination current value, it is determined that the diodes 172 and 174 have not deteriorated.
  • the personal computer 140 is illustrated as the determination unit, but the determination unit is not limited to this, and has a function of comparing the current value of the current flowing in the diodes 172 and 174 with the determination current value. Any semiconductor may be used as long as it is available, and it may be configured as one semiconductor chip.
  • the diode stack 170 is formed of a metal body having good conductivity and thermal conductivity, such as copper, and the diodes 172 and 174 are sandwiched by the metal body.
  • the diodes 172 and 174 are connected to the secondary winding 162 of the transformer 160 shown in FIG.
  • the diodes 172 and 174 supply welding current having a large current value to the electrodes of the resistance welding machine, and thus generate heat and become hot. Since the diodes 172, 174 are damaged when the temperature becomes high, a cooling water passage 176 for circulating cooling water is arranged in the diode stack 170 as shown in the drawing.
  • the temperature of the diode stack 170 and the diodes 172, 174 is adjusted to a temperature suitable for operation by circulating the cooling water through the cooling water passage 176 via the manifold 178.
  • FIG. 3 is an operation flowchart of the rectifying element deterioration measuring device of the present embodiment. Further, FIG. 4 is a diagram for explaining the operation flowchart of FIG. The process of this operation flowchart will be described with reference to FIG.
  • the programmable power supply 110 gradually increases the reverse DC voltage and applies it to the diodes 172 and 174 (S100). Note that a small constant voltage of about several V may be applied.
  • the programmable power supply 110 gradually increases the reverse voltage Va applied to the diodes 172 and 174, as shown by the solid line in FIG.
  • the programmable power supply 110 first applies V1 as a reverse voltage, then V2, and finally V3 to the diodes 172 and 174.
  • the voltage is increased by 50V in three steps, but the voltage may be increased by a constant voltage, two steps, or four or more steps.
  • the voltage from the current step to the voltage of the next step is increased over a certain period of time.
  • the programmable power supply 110 first applies V1 as a reverse voltage to the diodes 172 and 174, and then when V2 is applied, rather than suddenly increasing from V1 to V2, as shown in FIG. It has been increasing over time until T3.
  • the voltage is increased linearly from V1 to V2, but it may be curved instead of linear. The same applies to the voltage rise from 0 to V1 and V2 to V3.
  • the rate of increase of the voltage from V1 to V2 may not be the same as the rate of increase of the voltage from 0 to V1 or the rate of increase of the voltage from V2 to V3, for example.
  • the voltage of the present stage is increased to the voltage of the next stage over a certain period of time because the change in the current flowing through the secondary winding 162 of the transformer 160 causes a high voltage in the primary winding of the transformer 160. This is to prevent the occurrence.
  • the time for maintaining the voltage increased stepwise is the same in each step. For example, when the reverse voltage is increased to V1, the voltage is maintained for the time from T1 to T2, and when the reverse voltage is increased to V2, the voltage is maintained for the time from T3 to T4.
  • the voltage is maintained for the time from T4 to T6.
  • the time from T1 to T2, the time from T3 to T4, and the time from T4 to T6 are the same. These times for maintaining the voltage increased stepwise may be different times in each step. For example, as the voltage value of the reverse voltage increases, the maintenance time of the voltage may be shortened.
  • the maximum voltage of the reverse voltage does not include 0 of the reverse breakdown voltage of the diodes 172 and 174 so that the diodes 172 and 174 are not damaged even when applied to the deteriorated diodes 172 and 174.
  • the voltage is less than or equal to %.
  • the voltage lower than the reverse withstand voltage is applied in this way, even if the diodes 172 and 174 are significantly deteriorated, the progress of deterioration of the diodes 172 and 174 can be prevented without damaging the diodes 172 and 174. This is to enable measurement.
  • the maximum reverse voltage is 60% or less of the reverse breakdown voltage of the diodes 172 and 174, which does not include 0, but may be 90% or less that does not include 0.
  • the current detection unit formed by the resistor 115, the isolation amplifier 120, and the oscilloscope 130 detects the current flowing through the diodes 172 and 174 (S101).
  • the current flowing through the diodes 172 and 174 is detected as the terminal voltage Vb of the resistor 115.
  • the current is detected as indicated by I1 in the dotted line in the figure.
  • the personal computer 140 functioning as a determination unit determines whether the current is larger than the determination current value (S102). If the current flowing through the diodes 172 and 174 is larger than the determination current value (S102: YES), the personal computer 140 determines that the diodes 172 and 174 are deteriorated (S103). On the other hand, the personal computer 140 determines that the diodes 172 and 174 are not deteriorated if the current flowing through the diodes 172 and 174 is smaller than the determination current value, as indicated by I1 in the figure (S104: NO) (S104). ).
  • the deterioration of the diodes 172 and 174 is determined based on the current value of the current flowing when the reverse voltage is applied to the diodes 172 and 174. It is easy to measure the deterioration of 172 and 174. By making this measurement regularly, it is possible to know the progress of deterioration of the diodes 172, 174, preventive maintenance of the diodes 172, 174 becomes possible, and planned maintenance becomes possible.
  • the rectifying element deterioration measuring device 100 When the rectifying element deterioration measuring device 100 is used in the production line where the resistance welding machine is arranged, preventive maintenance of the diodes 172 and 174 can be performed, so that the production line can be prevented from being stopped and the production efficiency can be improved and the production cost can be reduced. realizable.
  • FIG. 5 is a flowchart of a processing procedure of the rectifying element deterioration measuring method of the present embodiment. Since the processing procedure of the rectifying element deterioration measuring method is the same as that of the operation flowchart of FIG. 4, it will be briefly described.
  • a reverse DC voltage is gradually increased and applied to the diodes 172 and 174, and the current value of the current flowing through the diodes 172 and 174 is detected. Note that a small constant voltage of about several V may be applied.
  • the detected current value is larger than the judgment current value for judging the deterioration of the diodes 172, 174, it is judged that the diodes 172, 174 are deteriorated, and if it is smaller, the diodes 172, 174 are judged. Is judged not to have deteriorated.
  • FIG. 6 is an explanatory diagram when the rectifying element deterioration measuring method of the present embodiment is applied to a welding robot.
  • the rectifying element deterioration measuring method is applied to the welding robot 200, that is, when the rectifying element deterioration measuring method of the present embodiment is applied to the welding robot 200 arranged in the field, as shown in FIG. Is connected to one electrode 210 and a multimeter 180 (so-called tester), and the multimeter 180 is connected to the other electrode 210.
  • the diodes 172 and 174 of the diode stack 170 are connected to the electrodes 210 at both ends.
  • the multimeter 180 displays the magnitude of the current flowing through the diodes 172 and 174. The operator can judge the degree of progress of deterioration of the diodes 172 and 174 from the magnitude of the current indicated by the multimeter 180.
  • the degree of progress of deterioration of the rectifying element such as a diode can be easily measured on site. Therefore, it is possible to prevent the production machine such as a resistance welding machine from being suddenly stopped due to the deterioration of the diode, and the diode stack is replaced with the transformer, so that the production line must be stopped for a long time. .. In addition, since preventive maintenance is possible, the diode stack can be replaced systematically.
  • Rectifier deterioration measuring device 110 programmable power supply, 115 resistor (current detector), 120 Insulation amplifier (current detector), 130 Oscilloscope (current detector), 140 personal computer (judgment unit), 150 inverter transformer, 160 transformers, 162 secondary winding, 170 diode stack, 172 and 174 diodes, 176 cooling channels, 178 manifold, 180 multimeter, 200 resistance welder, 210 electrodes.

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Abstract

[Problem] To enable degradation of a diode to be measured [Solution] The present invention includes: a programmable power supply 110 which applies a reverse voltage to didoes 172, 174; a resistor 115 which detects a current value of current flowing through the diodes 172, 174 when the reverse voltage is applied; a current detection unit configured from an insulating amplifier 120 and an oscilloscope 130; and a personal computer 140 which determines that the diodes 172, 174 are degraded when the detected current value is greater than a determination current value for determining the degradation of the diodes 172, 174, and which determines that the diodes 172, 174 are not degraded when the detected current value is smaller than the determination current value.

Description

整流素子劣化測定装置および整流素子劣化測定方法Rectifier deterioration measuring device and rectifier deterioration measuring method
　本発明は、ダイオードなどの整流素子の劣化を測定できる整流素子劣化測定装置および整流素子劣化測定方法に関する。 The present invention relates to a rectifying element deterioration measuring device and a rectifying element deterioration measuring method capable of measuring deterioration of a rectifying element such as a diode.
　近年、自動車のボディーには、強度の確保と軽量化の実現に向けて、従来の鋼板よりも引張強度を向上させた高張力鋼板が用いられている。高張力鋼板同士をスポット溶接する場合、従来の鋼板をスポット溶接するときよりも大きな溶接電流を長い時間通電させる必要がある。このため、高張力鋼板同士のスポット溶接には、広範囲な溶接条件が設定できて高品質の溶接をすることができる、特許文献１～３に開示されているようなインバータ式の抵抗溶接機が用いられつつある。インバータ方式の抵抗溶接機は、スポット溶接時に大きな溶接電流を供給するインバータトランスと、このインバータトランスに設けたダイオードスタック（２個以上のダイオードを組み合わせたユニット）とを有している。インバータトランスに設けたダイオードスタックはスポット溶接時に大きな溶接電流を通電させるので劣化しやすい。 In recent years, high-strength steel sheets with higher tensile strength than conventional steel sheets have been used in the body of automobiles to ensure strength and reduce weight. When high-strength steel sheets are spot-welded to each other, it is necessary to apply a larger welding current for a longer time than when spot welding conventional steel sheets. Therefore, in the spot welding of high-tensile steel plates, an inverter-type resistance welding machine as disclosed in Patent Documents 1 to 3, which can set a wide range of welding conditions and can perform high-quality welding. It is being used. The inverter type resistance welding machine has an inverter transformer that supplies a large welding current during spot welding, and a diode stack (a unit in which two or more diodes are combined) provided in this inverter transformer. The diode stack provided in the inverter transformer is easily deteriorated because a large welding current is applied during spot welding.
特開２０１７－０８７２８０号公報JP, 2017-087280, A 特開２０００－４２７５１号公報Japanese Patent Laid-Open No. 2000-42751 実用新案登録第３００８４３３号明細書Utility model registration No. 3008433 specification
　しかし、ダイオードスタックの劣化の進行は、個別のパフォーマンス、使用環境、使用頻度、溶接条件などによって異なる。工場の製造ラインに配置されている抵抗溶接機において、そのダイオードスタックが予期せぬ劣化により故障を起こしてしまうと、その交換には時間がかかるため、製造ラインの停止が余儀なくされる。そのため、製造ラインの停止前にダイオードスタックの劣化の進行度合いを知ることは、製造ラインの停止を防止する上で、また、予防保全により計画的な保守をする上で、重要である。 However, the progress of deterioration of the diode stack varies depending on individual performance, usage environment, usage frequency, welding conditions, etc. In a resistance welding machine arranged on a manufacturing line of a factory, if the diode stack fails due to unexpected deterioration, it takes time to replace the diode stack, and the manufacturing line must be stopped. Therefore, it is important to know the degree of progress of deterioration of the diode stack before the production line is stopped in order to prevent the production line from stopping and to perform planned maintenance by preventive maintenance.
　本発明は、このような問題を解消するためになされたものであり、ダイオードスタックのダイオードなどの整流素子の劣化を測定できる整流素子劣化測定装置および整流素子劣化測定方法の提供を目的とする。 The present invention has been made to solve such a problem, and an object thereof is to provide a rectifying element deterioration measuring device and a rectifying element deterioration measuring method capable of measuring deterioration of a rectifying element such as a diode of a diode stack.
　上記目的を達成するための本発明に係る整流素子劣化測定装置は、逆電圧を整流素子に印加する電源と、逆電圧を印加しているときに整流素子に流れている電流の電流値を検出する電流検出部と、検出した電流値が整流素子の劣化を判定するための判定電流値よりも大きければ整流素子は劣化していると判断し、小さければ整流素子は劣化していないと判断する判断部と、を有する。 A rectifying element deterioration measuring apparatus according to the present invention for achieving the above object detects a power supply for applying a reverse voltage to a rectifying element and a current value of a current flowing through the rectifying element when the reverse voltage is applied. If the current detection unit and the detected current value are larger than the judgment current value for judging deterioration of the rectifying element, it is judged that the rectifying element is deteriorated, and if smaller, it is judged that the rectifying element is not deteriorated. And a judging section.
　また、上記目的を達成するための本発明に係る整流素子劣化測定方法は、逆電圧を整流素子に印加し、整流素子に流れている電流の電流値を検出する段階と、検出した電流値が整流素子の劣化を判定するための判定電流値よりも大きければ整流素子は劣化していると判断し、小さければ整流素子は劣化していないと判断する段階と、を含む。 Further, the rectifying element deterioration measuring method according to the present invention to achieve the above object, a step of applying a reverse voltage to the rectifying element, detecting the current value of the current flowing in the rectifying element, the detected current value is The step of determining that the rectifying element is deteriorated if the current value is larger than the determination current value for determining the deterioration of the rectifying element, and determining that the rectifying element is not deteriorated if it is smaller.
　本発明に係る整流素子劣化測定装置および整流素子劣化測定方法によれば、逆電圧を整流素子に印加したときに流れる電流の電流値により整流素子の劣化を判断するので、整流素子の劣化の進行度合いの測定が容易である。この測定を定期的にすることによって、整流素子の劣化の進行度合いを知ることができ、整流素子の予防保全が可能となり、計画的な保守が可能となる。 According to the rectifying element deterioration measuring device and the rectifying element deterioration measuring method of the present invention, the deterioration of the rectifying element is judged based on the current value of the current flowing when the reverse voltage is applied to the rectifying element. It is easy to measure the degree. By making this measurement regularly, the degree of progress of deterioration of the rectifying element can be known, preventive maintenance of the rectifying element becomes possible, and planned maintenance becomes possible.
本実施形態の整流素子劣化測定装置の概略構成図である。It is a schematic block diagram of the rectifying element deterioration measuring device of this embodiment. 図１に示したダイオードッスタックの構成図である。It is a block diagram of the diode stack shown in FIG. 本実施形態の整流素子劣化測定装置の動作フローチャートである。It is an operation|movement flowchart of the rectifier deterioration measuring device of this embodiment. 図３の動作フローチャートの説明に供する図である。FIG. 4 is a diagram for explaining the operation flowchart of FIG. 3. 本実施形態の整流素子劣化測定方法の処理手順のフローチャートである。It is a flow chart of a processing procedure of a rectifying element deterioration measuring method of this embodiment. 本実施形態の整流素子劣化測定方法を溶接ロボットに適用したときの説明図である。It is explanatory drawing when the rectifying element deterioration measuring method of this embodiment is applied to a welding robot.
　以下に、本発明に係る整流素子劣化測定装置および整流素子劣化測定方法の実施形態を、図面を参照しながら詳細に説明する。 Embodiments of a rectifying element deterioration measuring device and a rectifying element deterioration measuring method according to the present invention will be described below in detail with reference to the drawings.
　＜整流素子劣化測定装置の構成＞
　図１は、本実施形態の整流素子劣化測定装置の概略構成図である。整流素子劣化測定装置１００は、インバータトランス１５０に設けたダイオードスタック１７０のダイオード１７２、１７４の劣化の進行度合いを測定する。 <Structure of rectifying element deterioration measuring device>
FIG. 1 is a schematic configuration diagram of the rectifying element deterioration measuring device of the present embodiment. The rectifying element deterioration measuring device 100 measures the degree of progress of deterioration of the diodes 172 and 174 of the diode stack 170 provided in the inverter transformer 150.
　整流素子劣化測定装置１００は、プログラマブル電源１１０、抵抗器１１５、絶縁アンプ１２０、オシロスコープ１３０、パーソナルコンピュータ１４０を有する。一方、インバータトランス１５０は、トランス１６０とダイオードスタック１７０とを有する。ダイオードスタック１７０は、２つのダイオード１７２、１７４を備える。インバータトランス１５０は、たとえば、抵抗溶接機に備えられており、鋼板同士を溶接するための溶接電流を電極間に供給する。トランス１６０は交流の溶接電流を生成し、ダイオードスタック１７０のダイオード１７２、１７４によって、交流の溶接電流を直流の溶接電流に変換する。直流の溶接電流は抵抗溶接機の電極間に供給する。 The rectifier deterioration measuring device 100 has a programmable power supply 110, a resistor 115, an insulation amplifier 120, an oscilloscope 130, and a personal computer 140. On the other hand, the inverter transformer 150 has a transformer 160 and a diode stack 170. The diode stack 170 includes two diodes 172 and 174. The inverter transformer 150 is provided in, for example, a resistance welding machine, and supplies a welding current for welding steel plates to each other between electrodes. The transformer 160 generates an AC welding current, and the diodes 172 and 174 of the diode stack 170 convert the AC welding current into a DC welding current. DC welding current is supplied between the electrodes of the resistance welding machine.
　プログラマブル電源１１０は、逆電圧Ｖａを整流素子であるダイオード１７２、１７４に印加する電源である。プログラマブル電源１１０は、ダイオード１７２、１７４に一定の電圧の逆電圧を印加するように、またはダイオード１７２、１７４に印加する逆電圧を段階的に上昇させるように、また、その逆電圧の段階的な上昇は、次の段階に上昇させるときに、現段階の電圧から次の段階の電圧まで一定の時間をかけて上昇させるようにプログラムされている。 The programmable power supply 110 is a power supply that applies a reverse voltage Va to the diodes 172 and 174 that are rectifying elements. The programmable power supply 110 applies a constant reverse voltage to the diodes 172 and 174, or increases the reverse voltage applied to the diodes 172 and 174 stepwise, and also increases the reverse voltage stepwise. The ramp is programmed to ramp from the current stage voltage to the next stage voltage over a period of time when ramping to the next stage.
　プログラマブル電源１１０がダイオード１７２、１７４に印加する逆電圧の最大電圧は、劣化が進んでいるダイオード１７２、１７４に印加しても、ダイオード１７２、１７４が破損しないように、ダイオード１７２、１７４の逆耐圧の０を含まない６０％以下の電圧としている。たとえば、ダイオード１７２、１７４の逆耐圧が６００Ｖであるとすると、プログラマブル電源１１０はダイオード１７２、１７４に３６０Ｖ以上の逆電圧は印加しないようにプログラムしてある。なお、ダイオード１７２、１７４に印加する逆電圧は、ダイオード１７２、１７４の逆耐圧の０を含まない６０％以下が最も好ましいが、０を含まない９０％以下であっても良い。 The maximum reverse voltage applied to the diodes 172, 174 by the programmable power supply 110 is such that the reverse breakdown voltage of the diodes 172, 174 does not damage the diodes 172, 174 even if applied to the deteriorated diodes 172, 174. The voltage is 60% or less not including 0. For example, assuming that the reverse breakdown voltage of the diodes 172 and 174 is 600V, the programmable power supply 110 is programmed so that the reverse voltage of 360V or more is not applied to the diodes 172 and 174. The reverse voltage applied to the diodes 172 and 174 is most preferably 60% or less of the reverse breakdown voltage of the diodes 172 and 174 that does not include 0, but may be 90% or less that does not include 0.
　抵抗器１１５は、プログラマブル電源１１０がダイオード１７２、１７４に印加する逆電圧により、ダイオード１７２、１７４に流れる電流（漏れ電流：ＩＲＤとも言う）を電圧に変換する。抵抗器１１５には、ダイオード１７２の電流の電流値とダイオード１７４の電流の電流値を加算した電流値の電流が流れる。したがって、抵抗器１１５の端子間電圧Ｖｂは、抵抗器１１５の抵抗値（Ｒ）にダイオード１７２の電流の電流値（ｉ１７２）とダイオード１７４の電流の電流値（ｉ１７４）を加算した電流値を掛けわせた電圧値（Ｖ）となる。すなわち、抵抗器１１５の端子間電圧は、Ｖｂ＝Ｒ×（ｉ１７２＋ｉ１７４）という式で表される。 The resistor 115 converts a current (leakage current: also referred to as IRD) flowing in the diodes 172 and 174 into a voltage by a reverse voltage applied to the diodes 172 and 174 by the programmable power supply 110. A current having a current value obtained by adding the current value of the current of the diode 172 and the current value of the current of the diode 174 flows through the resistor 115. Therefore, the inter-terminal voltage Vb of the resistor 115 is obtained by multiplying the resistance value (R) of the resistor 115 by the current value (i172) of the current of the diode 172 and the current value (i174) of the current of the diode 174. It becomes the combined voltage value (V). That is, the voltage between the terminals of the resistor 115 is represented by the equation Vb=R×(i172+i174).
　絶縁アンプ１２０は、入力側（ダイオード側）と出力側（オシロスコープ側）とを絶縁しているアンプであり、オシロスコープ１３０に、プログラマブル電源１１０がダイオード１７２、１７４に印加している逆電圧Ｖａと抵抗器１１５の端子間電圧Ｖｂとを出力する。 The isolation amplifier 120 is an amplifier that insulates the input side (diode side) from the output side (oscilloscope side), and the reverse voltage Va applied to the diodes 172 and 174 by the programmable power supply 110 and the resistance to the oscilloscope 130. The voltage Vb between the terminals of the device 115 is output.
　オシロスコープ１３０は、プログラマブル電源１１０がダイオード１７２、１７４に印加している逆電圧Ｖａと抵抗器１１５の端子間電圧Ｖｂとの時間的な変化を可視化して表示する。本実施形態では、測定者が、波形によってダイオード１７２、１７４の劣化の進行度合いを見られるようにするために、オシロスコープ１３０を設けているが、オシロスコープ１３０は省略しても良い。省略した場合、絶縁アンプ１２０の出力側はパーソナルコンピュータ１４０に直接接続される。 The oscilloscope 130 visualizes and displays a temporal change between the reverse voltage Va applied to the diodes 172 and 174 by the programmable power supply 110 and the terminal voltage Vb of the resistor 115. In this embodiment, the oscilloscope 130 is provided so that the measurer can see the degree of deterioration of the diodes 172 and 174 according to the waveform, but the oscilloscope 130 may be omitted. If omitted, the output side of the isolation amplifier 120 is directly connected to the personal computer 140.
　抵抗器１１５、絶縁アンプ１２０、オシロスコープ１３０は、プログラマブル電源１１０がダイオード１７２、１７４に逆電圧を印加しているときにダイオード１７２、１７４に流れている電流の電流値を検出する電流検出部として機能する。電流検出部は、ダイオード１７２、１７４に直列に接続した抵抗器１１５を含み、抵抗器１１５に流れる電流によって生じる、抵抗器１１５の端子間電圧Ｖｂを用いて、ダイオード１７２、１７４に流れている電流の電流値を検出する。本実施形態では、抵抗器１１５、絶縁アンプ１２０、オシロスコープ１３０が電流検出部を構成しているが、電流検出部の構成はこのような構成に限られない。たとえば、抵抗器１１５と抵抗器１１５の端子間電圧を検出する電圧計であっても良い。また、抵抗器１１５を省略し、直接電流計によって測定するようにしても良い。このときには、電圧計や電流計の数値により、現場の作業者がダイオード１７２、１７４の劣化の進行度合いを判断するようにしても良い。 The resistor 115, the isolation amplifier 120, and the oscilloscope 130 function as a current detection unit that detects the current value of the current flowing in the diodes 172 and 174 when the programmable power supply 110 applies a reverse voltage to the diodes 172 and 174. To do. The current detection unit includes a resistor 115 connected in series with the diodes 172 and 174, and using the terminal voltage Vb of the resistor 115 generated by the current flowing through the resistor 115, the current flowing through the diodes 172 and 174. The current value of is detected. In the present embodiment, the resistor 115, the isolation amplifier 120, and the oscilloscope 130 form a current detection unit, but the configuration of the current detection unit is not limited to such a configuration. For example, a voltmeter that detects the voltage between the terminals of the resistor 115 and the resistor 115 may be used. Alternatively, the resistor 115 may be omitted and the measurement may be performed directly by an ammeter. At this time, a worker in the field may judge the degree of progress of deterioration of the diodes 172 and 174 based on the values of the voltmeter and the ammeter.
　パーソナルコンピュータ１４０は、ダイオード１７２、１７４の劣化を判定するための判定電流値を記憶している。判定電流値は、破損する直前のダイオード１７２、１７４の電気的特性により設定する。たとえば、破損する直前のダイオード１７２、１７４の逆方向の抵抗値を多数測定しその抵抗値を累積しておき、その累積した抵抗値を参考に判定電流値を算出し、その算出した判定電流値をパーソナルコンピュータ１４０に記憶させる。ダイオード１７２、１７４のような整流素子は、劣化が進むにつれて、逆電圧印加時の電流が大きくなることが知られている。たとえば、ダイオード１７２、１７４が劣化することにより、１ｍＡ以下の電流値が１００ｍＡを超える電流値になることもある。このように、１００ｍＡを超える電流値になったダイオード１７２、１７４は数日以内に破損してしまう。判定電流値の設定は、ダイオード１７２、１７４の劣化の進行度合いを判断する上で重要であることから、次のようにして求めている。破損する直前のダイオードに逆電圧ＶｉｎｖをかけたときにＩｉｎｖの電流が流れたとすれば、破損する直前のダイオードの抵抗値Ｒｉｎｖは、Ｒｉｎｖ＝Ｖｉｎｖ／Ｉｉｎｖとして求めることができる。判定電流値は、プログラマブル電源１１０が印加する逆電圧の最大電圧をダイオードの抵抗値Ｒｉｎｖで割ることによって求めることができる。判定電流値は、ダイオード１７２、１７４の劣化の進行度合いの判断の信頼性を高めるため、このようにして求めた値よりも若干小さな値に設定する。 The personal computer 140 stores a judgment current value for judging deterioration of the diodes 172, 174. The judgment current value is set according to the electrical characteristics of the diodes 172 and 174 immediately before the damage. For example, a large number of reverse-direction resistance values of the diodes 172 and 174 immediately before damage are measured, the resistance values are accumulated, a judgment current value is calculated with reference to the accumulated resistance value, and the calculated judgment current value is calculated. Are stored in the personal computer 140. It is known that a rectifying element such as the diodes 172 and 174 has a larger current when a reverse voltage is applied as the deterioration progresses. For example, the current value of 1 mA or less may exceed 100 mA due to deterioration of the diodes 172, 174. As described above, the diodes 172 and 174 having a current value exceeding 100 mA are damaged within a few days. Since the setting of the judgment current value is important for judging the degree of progress of deterioration of the diodes 172, 174, it is obtained as follows. If the current Iinv flows when the reverse voltage Vinv is applied to the diode just before the damage, the resistance value Rinv of the diode just before the damage can be obtained as Rinv=Vinv/Iinv. The determination current value can be obtained by dividing the maximum reverse voltage applied by the programmable power supply 110 by the resistance value Rinv of the diode. The determination current value is set to a value slightly smaller than the value thus obtained in order to increase the reliability of the determination of the degree of progress of deterioration of the diodes 172 and 174.
　また、パーソナルコンピュータ１４０は、ダイオード１７２、１７４に流れている電流の電流値と、記憶されている判定電流値とを比較するためのプログラムを備えている。パーソナルコンピュータ１４０は、ダイオード１７２、１７４に流れている電流の電流値が判定電流値よりも大きければ、ダイオード１７２、１７４は劣化していると判断する。また、ダイオード１７２、１７４に流れている電流の電流値が判定電流値よりも小さければ、ダイオード１７２、１７４は劣化していないと判断する。本実施形態では、判断部としてパーソナルコンピュータ１４０を例示しているがこれに限らず、ダイオード１７２、１７４に流れている電流の電流値と判定電流値とを比較できる機能を有しているものであればどのようなものでも良く、１つの半導体チップとして構成しても良い。 The personal computer 140 also includes a program for comparing the current value of the current flowing through the diodes 172 and 174 with the stored determination current value. The personal computer 140 determines that the diodes 172 and 174 are deteriorated if the current value of the current flowing in the diodes 172 and 174 is larger than the determination current value. If the current value of the current flowing through the diodes 172 and 174 is smaller than the determination current value, it is determined that the diodes 172 and 174 have not deteriorated. In the present embodiment, the personal computer 140 is illustrated as the determination unit, but the determination unit is not limited to this, and has a function of comparing the current value of the current flowing in the diodes 172 and 174 with the determination current value. Any semiconductor may be used as long as it is available, and it may be configured as one semiconductor chip.
　図２は、図１に示したダイオードッスタックの構成図である。ダイオードスタック１７０は導電性および熱伝導性の良好なたとえば銅などの金属体で形成され、その金属体によってダイオード１７２、１７４が挟まれている。ダイオード１７２、１７４は、図１に示したトランス１６０の二次巻線１６２に接続される。ダイオード１７２、１７４は、抵抗溶接機の電極に大きな電流値の溶接電流を供給するため、発熱して熱くなる。ダイオード１７２、１７４は、高温になると破損してしまうので、ダイオードスタック１７０には冷却水を流通させる冷却水路１７６が図示するように配置されている。マニホールド１７８を介し冷却水路１７６に冷却水を流通させることによって、ダイオードスタック１７０およびダイオード１７２、１７４の温度を動作に適した温度となるようにしている。 2 is a block diagram of the diode stack shown in FIG. The diode stack 170 is formed of a metal body having good conductivity and thermal conductivity, such as copper, and the diodes 172 and 174 are sandwiched by the metal body. The diodes 172 and 174 are connected to the secondary winding 162 of the transformer 160 shown in FIG. The diodes 172 and 174 supply welding current having a large current value to the electrodes of the resistance welding machine, and thus generate heat and become hot. Since the diodes 172, 174 are damaged when the temperature becomes high, a cooling water passage 176 for circulating cooling water is arranged in the diode stack 170 as shown in the drawing. The temperature of the diode stack 170 and the diodes 172, 174 is adjusted to a temperature suitable for operation by circulating the cooling water through the cooling water passage 176 via the manifold 178.
　＜整流素子劣化測定装置の動作＞
　図３は、本実施形態の整流素子劣化測定装置の動作フローチャートである。また、図４は、図３の動作フローチャートの説明に供する図である。この動作フローチャートの処理を、図４を参照しながら説明する。 <Operation of rectifier deterioration measuring device>
FIG. 3 is an operation flowchart of the rectifying element deterioration measuring device of the present embodiment. Further, FIG. 4 is a diagram for explaining the operation flowchart of FIG. The process of this operation flowchart will be described with reference to FIG.
　まず、本実施形態では、プログラマブル電源１１０は、ダイオード１７２、１７４に直流の逆電圧を段階的に上昇させて印加する（Ｓ１００）。なお、数Ｖ程度の小さな一定電圧を印加しても良い。 First, in the present embodiment, the programmable power supply 110 gradually increases the reverse DC voltage and applies it to the diodes 172 and 174 (S100). Note that a small constant voltage of about several V may be applied.
　プログラマブル電源１１０は、本実施形態では、図４の実線で示したように、ダイオード１７２、１７４に印加する逆電圧Ｖａを段階的に上昇させる。たとえば、プログラマブル電源１１０は、ダイオード１７２、１７４に、まず逆電圧としてＶ１を印加し、次にＶ２を印加し、最後にＶ３を印加する。なお、本実施形態では、５０Ｖずつ、３段階に電圧を上昇させているが、一定電圧、２段階、または４段階以上の段階を経て電圧を上昇させるようにしても良い。このように段階的に上昇させるのは、万が一、ダイオード１７２、１７４の劣化が著しいときでも、ダイオード１７２、１７４を破損させることなく、ダイオード１７２、１７４の劣化の進行度合いを測定できるようにするためである。 In the present embodiment, the programmable power supply 110 gradually increases the reverse voltage Va applied to the diodes 172 and 174, as shown by the solid line in FIG. For example, the programmable power supply 110 first applies V1 as a reverse voltage, then V2, and finally V3 to the diodes 172 and 174. In this embodiment, the voltage is increased by 50V in three steps, but the voltage may be increased by a constant voltage, two steps, or four or more steps. In this way, it is possible to measure the degree of progress of the deterioration of the diodes 172, 174 without damaging the diodes 172, 174 even if the deterioration of the diodes 172, 174 is significant, even if the deterioration of the diodes 172, 174 is significant. Is.
　また、その逆電圧の段階的な上昇は、次の段階に上昇させるときに、現段階の電圧から次の段階の電圧まで一定の時間をかけて上昇させる。たとえば、プログラマブル電源１１０は、ダイオード１７２、１７４に、まず逆電圧としてＶ１を印加し、次にＶ２を印加するときには、Ｖ１からＶ２に突然上昇させるのではなく、図４に示すように、Ｔ２からＴ３までの時間をかけて上昇させている。なお、本実施形態では、Ｖ１からＶ２のへの電圧の上昇を直線的に行っているが、直線的ではなく曲線的に行うようにしても良い。０からＶ１、Ｖ２からＶ３への電圧の上昇についても同様である。また、Ｖ１からＶ２への電圧の上昇速度は、たとえば、０からＶ１への電圧の上昇速度またはＶ２からＶ３への電圧の上昇速度と同一でなくとも良い。このように、現段階の電圧から次の段階の電圧まで一定の時間をかけて上昇させるのは、トランス１６０の二次巻線１６２に流れる電流の変化によってトランス１６０の一次巻線に高電圧が発生することを防止するためである。さらに、段階的に上昇させた電圧を維持する時間は、各段階において同一の時間である。たとえば、逆電圧をＶ１に上昇させたときには、Ｔ１からＴ２までの時間、その電圧を維持し、逆電圧をＶ２に上昇させたときには、Ｔ３からＴ４までの時間、その電圧を維持し、逆電圧をＶ３に上昇させたときには、Ｔ４からＴ６までの時間、その電圧を維持する。なお、Ｔ１からＴ２までの時間、Ｔ３からＴ４までの時間、Ｔ４からＴ６までの時間はそれぞれ同一の時間である。段階的に上昇させた電圧を維持するこれらの時間は、各段階において異なる時間としても良い。たとえば、逆電圧の電圧値が高くなるにしたがって、その電圧の維持時間を短くするようにしても良い。 ▽ In addition, when increasing the reverse voltage stepwise, when increasing to the next step, the voltage from the current step to the voltage of the next step is increased over a certain period of time. For example, the programmable power supply 110 first applies V1 as a reverse voltage to the diodes 172 and 174, and then when V2 is applied, rather than suddenly increasing from V1 to V2, as shown in FIG. It has been increasing over time until T3. In this embodiment, the voltage is increased linearly from V1 to V2, but it may be curved instead of linear. The same applies to the voltage rise from 0 to V1 and V2 to V3. Further, the rate of increase of the voltage from V1 to V2 may not be the same as the rate of increase of the voltage from 0 to V1 or the rate of increase of the voltage from V2 to V3, for example. In this way, the voltage of the present stage is increased to the voltage of the next stage over a certain period of time because the change in the current flowing through the secondary winding 162 of the transformer 160 causes a high voltage in the primary winding of the transformer 160. This is to prevent the occurrence. Further, the time for maintaining the voltage increased stepwise is the same in each step. For example, when the reverse voltage is increased to V1, the voltage is maintained for the time from T1 to T2, and when the reverse voltage is increased to V2, the voltage is maintained for the time from T3 to T4. Is raised to V3, the voltage is maintained for the time from T4 to T6. The time from T1 to T2, the time from T3 to T4, and the time from T4 to T6 are the same. These times for maintaining the voltage increased stepwise may be different times in each step. For example, as the voltage value of the reverse voltage increases, the maintenance time of the voltage may be shortened.
　さらに、逆電圧の最大電圧、すなわちＶ３は、劣化が進んでいるダイオード１７２、１７４に印加しても、ダイオード１７２、１７４が破損しないように、ダイオード１７２、１７４の逆耐圧の０を含まない６０％以下の電圧としている。このように逆耐圧よりも低い電圧を印加しているのは、万が一、ダイオード１７２、１７４の劣化が著しいときでも、ダイオード１７２、１７４を破損させることなく、ダイオード１７２、１７４の劣化の進行度合いを測定できるようにするためである。なお、逆電圧の最大電圧はダイオード１７２、１７４の逆耐圧の０を含まない６０％以下が最も好ましいが、０を含まない９０％以下であっても良い。 Furthermore, the maximum voltage of the reverse voltage, that is, V3, does not include 0 of the reverse breakdown voltage of the diodes 172 and 174 so that the diodes 172 and 174 are not damaged even when applied to the deteriorated diodes 172 and 174. The voltage is less than or equal to %. The voltage lower than the reverse withstand voltage is applied in this way, even if the diodes 172 and 174 are significantly deteriorated, the progress of deterioration of the diodes 172 and 174 can be prevented without damaging the diodes 172 and 174. This is to enable measurement. It is most preferable that the maximum reverse voltage is 60% or less of the reverse breakdown voltage of the diodes 172 and 174, which does not include 0, but may be 90% or less that does not include 0.
　次に、抵抗器１１５、絶縁アンプ１２０、オシロスコープ１３０によって形成される電流検出部は、ダイオード１７２、１７４に流れる電流を検出する（Ｓ１０１）。上記のように、ダイオード１７２、１７４を流れる電流は、抵抗器１１５の端子間電圧Ｖｂとして検出される。たとえば、ダイオード１７２、１７４の劣化が進んでいないとき（ＩＲＤ＝ＯＫ時）には、その電流は、図示点線のＩ１のように検出される。一方、ダイオード１７２、１７４の劣化が進んでいるとき（ＩＲＤ＝ＮＧ時）には、図示点線のＩ２のように検出される。 Next, the current detection unit formed by the resistor 115, the isolation amplifier 120, and the oscilloscope 130 detects the current flowing through the diodes 172 and 174 (S101). As described above, the current flowing through the diodes 172 and 174 is detected as the terminal voltage Vb of the resistor 115. For example, when the diodes 172 and 174 are not deteriorated (when IRD=OK), the current is detected as indicated by I1 in the dotted line in the figure. On the other hand, when the diodes 172 and 174 are deteriorating (when IRD=NG), they are detected as indicated by I2 in the figure.
　次に、判断部として機能するパーソナルコンピュータ１４０は、電流は判定電流値よりも大きいか否かを判断する（Ｓ１０２）。パーソナルコンピュータ１４０は、図示点線のＩ２のように、ダイオード１７２、１７４を流れる電流が判定電流値よりも大きければ（Ｓ１０２：ＹＥＳ）、ダイオード１７２、１７４は劣化していると判断する（Ｓ１０３）。一方、パーソナルコンピュータ１４０は、図示点線のＩ１のように、ダイオード１７２、１７４を流れる電流が判定電流値よりも小さければ（Ｓ１０２：ＮＯ）、ダイオード１７２、１７４は劣化していないと判断する（Ｓ１０４）。 Next, the personal computer 140 functioning as a determination unit determines whether the current is larger than the determination current value (S102). If the current flowing through the diodes 172 and 174 is larger than the determination current value (S102: YES), the personal computer 140 determines that the diodes 172 and 174 are deteriorated (S103). On the other hand, the personal computer 140 determines that the diodes 172 and 174 are not deteriorated if the current flowing through the diodes 172 and 174 is smaller than the determination current value, as indicated by I1 in the figure (S104: NO) (S104). ).
　このように、本実施形態の整流素子劣化測定装置１００によれば、逆電圧をダイオード１７２、１７４に印加したときに流れる電流の電流値によりダイオード１７２、１７４の劣化を判断しているので、ダイオード１７２、１７４の劣化の測定が容易である。この測定を定期的にすることによって、ダイオード１７２、１７４の劣化の進行度合いを知ることができ、ダイオード１７２、１７４の予防保全が可能となり、計画的な保守が可能となる。抵抗溶接機が配置されている製造ラインで整流素子劣化測定装置１００を用いると、ダイオード１７２、１７４の予防保全ができることから、製造ラインの停止を防止でき、製造効率の向上と製造コストを低下が実現できる。 As described above, according to the rectifying element deterioration measuring apparatus 100 of the present embodiment, the deterioration of the diodes 172 and 174 is determined based on the current value of the current flowing when the reverse voltage is applied to the diodes 172 and 174. It is easy to measure the deterioration of 172 and 174. By making this measurement regularly, it is possible to know the progress of deterioration of the diodes 172, 174, preventive maintenance of the diodes 172, 174 becomes possible, and planned maintenance becomes possible. When the rectifying element deterioration measuring device 100 is used in the production line where the resistance welding machine is arranged, preventive maintenance of the diodes 172 and 174 can be performed, so that the production line can be prevented from being stopped and the production efficiency can be improved and the production cost can be reduced. realizable.
　＜整流素子劣化測定方法の手順＞
　図５は、本実施形態の整流素子劣化測定方法の処理手順のフローチャートである。整流素子劣化測定方法の処理手順としては、図４の動作フローチャートと同一であるので、簡単に説明する。 <Procedure of rectifying element deterioration measuring method>
FIG. 5 is a flowchart of a processing procedure of the rectifying element deterioration measuring method of the present embodiment. Since the processing procedure of the rectifying element deterioration measuring method is the same as that of the operation flowchart of FIG. 4, it will be briefly described.
　まず、本実施形態では、第１段階では、ダイオード１７２、１７４に直流の逆電圧を段階的に上昇させて印加し、ダイオード１７２、１７４に流れる電流の電流値を検出する。なお、数Ｖ程度の小さな一定電圧を印加しても良い。次に、第２段階では、検出した電流値がダイオード１７２、１７４の劣化を判定するための判定電流値よりも大きければダイオード１７２、１７４は劣化していると判断し、小さければダイオード１７２、１７４は劣化していないと判断する。 First, in the present embodiment, in the first stage, a reverse DC voltage is gradually increased and applied to the diodes 172 and 174, and the current value of the current flowing through the diodes 172 and 174 is detected. Note that a small constant voltage of about several V may be applied. Next, in the second stage, if the detected current value is larger than the judgment current value for judging the deterioration of the diodes 172, 174, it is judged that the diodes 172, 174 are deteriorated, and if it is smaller, the diodes 172, 174 are judged. Is judged not to have deteriorated.
　このような手順でダイオード１７２、１７４の劣化の進行状態を判断すると、ダイオード１７２、１７４の劣化の測定が容易になる。この測定を定期的にすることによって、ダイオード１７２、１７４の劣化の進行度合いを知ることができ、ダイオード１７２、１７４の予防保全が可能となり、計画的な保守が可能となる。抵抗溶接機が配置されている製造ラインで整流素子劣化測定方法を適用すると、ダイオード１７２、１７４の予防保全ができることから、製造ラインの停止を防止でき、製造効率の向上と製造コストを低下が実現できる。 By determining the progress of deterioration of the diodes 172, 174 by such a procedure, it becomes easy to measure the deterioration of the diodes 172, 174. By making this measurement regularly, it is possible to know the progress of deterioration of the diodes 172, 174, preventive maintenance of the diodes 172, 174 becomes possible, and planned maintenance becomes possible. If the rectifying element deterioration measuring method is applied to the production line where the resistance welding machine is installed, preventive maintenance of the diodes 172 and 174 can be performed, so that the production line can be prevented from being stopped, the production efficiency can be improved and the production cost can be reduced. it can.
　図６は、本実施形態の整流素子劣化測定方法を溶接ロボットに適用したときの説明図である。 FIG. 6 is an explanatory diagram when the rectifying element deterioration measuring method of the present embodiment is applied to a welding robot.
　整流素子劣化測定方法を溶接ロボット２００に適用するとき、すなわち現場に配置されている溶接ロボット２００に、本実施形態の整流素子劣化測定方法を適用するときには、図６に示すように、プログラマブル電源１１０を一方の電極２１０とマルチメーター１８０（いわゆるテスター）に接続し、マルチメーター１８０を他方の電極２１０に接続する。両端の電極２１０にはダイオードスタック１７０のダイオード１７２、１７４が接続されている。 When the rectifying element deterioration measuring method is applied to the welding robot 200, that is, when the rectifying element deterioration measuring method of the present embodiment is applied to the welding robot 200 arranged in the field, as shown in FIG. Is connected to one electrode 210 and a multimeter 180 (so-called tester), and the multimeter 180 is connected to the other electrode 210. The diodes 172 and 174 of the diode stack 170 are connected to the electrodes 210 at both ends.
　マルチメーター１８０は、プログラマブル電源１１０から図４に示すような逆電圧が印加されると、マルチメーター１８０がダイオード１７２、１７４に流れる電流の大きさを表示する。作業者は、マルチメーター１８０が示す電流の大きさにより、ダイオード１７２、１７４の劣化の進行度合いを判断できる。 When the reverse voltage as shown in FIG. 4 is applied from the programmable power source 110, the multimeter 180 displays the magnitude of the current flowing through the diodes 172 and 174. The operator can judge the degree of progress of deterioration of the diodes 172 and 174 from the magnitude of the current indicated by the multimeter 180.
　以上のように、本実施形態の整流素子劣化測定装置および整流素子劣化測定方法によれば、ダイオードなどの整流素子の劣化の進行度合いを、現場で容易に測定できる。このため、ダイオードの劣化が原因で、たとえば抵抗溶接機のような生産機械が突然停止し、ダイオードスタックをトランスごと交換するため、製造ラインの長時間の停止を余儀なくされるようなことを防止できる。また、予防保全が可能となるため、ダイオードスタックの計画的な交換ができる。 As described above, according to the rectifying element deterioration measuring device and the rectifying element deterioration measuring method of the present embodiment, the degree of progress of deterioration of the rectifying element such as a diode can be easily measured on site. Therefore, it is possible to prevent the production machine such as a resistance welding machine from being suddenly stopped due to the deterioration of the diode, and the diode stack is replaced with the transformer, so that the production line must be stopped for a long time. .. In addition, since preventive maintenance is possible, the diode stack can be replaced systematically.
　以上、整流素子劣化測定装置および整流素子劣化測定方法の実施形態を述べたが、本発明の技術的範囲は、この実施形態の記載内容に限定されるものではない。したがって、本実施形態には明確に記載されていなくとも、特許請求の記載の範囲内において当業者によって改変されたものは本発明の技術的範囲に含まれる。 The embodiments of the rectifying element deterioration measuring device and the rectifying element deterioration measuring method have been described above, but the technical scope of the present invention is not limited to the description of this embodiment. Therefore, what is modified by a person skilled in the art within the scope of the claims is included in the technical scope of the present invention even if it is not explicitly described in the present embodiment.
１００　整流素子劣化測定装置、
１１０　プログラマブル電源（電源）、
１１５　抵抗器（電流検出部）、
１２０　絶縁アンプ（電流検出部）、
１３０　オシロスコープ（電流検出部）、
１４０　パーソナルコンピュータ（判断部）、
１５０　インバータトランス、
１６０　トランス、
１６２　二次巻線、
１７０　ダイオードスタック、
１７２、１７４　ダイオード、
１７６　冷却水路、
１７８　マニホールド、
１８０　マルチメーター、
２００　抵抗溶接機、
２１０　電極。 100 Rectifier deterioration measuring device,
110 programmable power supply,
115 resistor (current detector),
120 Insulation amplifier (current detector),
130 Oscilloscope (current detector),
140 personal computer (judgment unit),
150 inverter transformer,
160 transformers,
162 secondary winding,
170 diode stack,
172 and 174 diodes,
176 cooling channels,
178 manifold,
180 multimeter,
200 resistance welder,
210 electrodes.

Claims (11)

  1. 　逆電圧を整流素子に印加する電源と、
    　前記逆電圧を印加しているときに前記整流素子に流れている電流の電流値を検出する電流検出部と、
    　検出した電流値が前記整流素子の劣化を判定するための判定電流値よりも大きければ前記整流素子は劣化していると判断し、小さければ前記整流素子は劣化していないと判断する判断部と、
    　を有する、整流素子劣化測定装置。     A power supply for applying a reverse voltage to the rectifying element,
    A current detector that detects the current value of the current flowing in the rectifying element when applying the reverse voltage,
    If the detected current value is larger than a judgment current value for judging deterioration of the rectifying element, it is judged that the rectifying element is deteriorated, and if it is smaller, a judging section that judges that the rectifying element is not deteriorated. ,
    A device for measuring deterioration of a rectifying element, comprising:
  2. 　前記電源は、前記整流素子に印加する前記逆電圧を段階的に上昇させる、請求項１に記載の整流素子劣化測定装置。 The rectifying element deterioration measuring device according to claim 1, wherein the power source increases the reverse voltage applied to the rectifying element stepwise.
  3. 　前記逆電圧の段階的な上昇は、次の段階に上昇させるときに、現段階の電圧から次の段階の電圧まで一定の時間をかけて上昇させる、請求項２に記載の整流素子劣化測定装置。 The rectifying element deterioration measuring device according to claim 2, wherein the stepwise increase of the reverse voltage increases the voltage of the present step from the voltage of the next step over a certain period of time when increasing to the next step. ..
  4. 　前記整流素子に印加する前記逆電圧の最大電圧は、劣化が進んでいる前記整流素子に印加しても、前記整流素子が破損しないように、前記整流素子の逆耐圧の０を含まない６０％以下の電圧とする、請求項１から３のいずれかに記載の整流素子劣化測定装置。 The maximum voltage of the reverse voltage applied to the rectifying element is 60% that does not include 0 of the reverse withstand voltage of the rectifying element so that the rectifying element is not damaged even when applied to the rectifying element that is deteriorated. The rectifying element deterioration measuring device according to any one of claims 1 to 3, which has the following voltage.
  5. 　前記電流検出部は、前記整流素子に直列に接続した抵抗器を含み、前記抵抗器に流れる電流によって生じる前記抵抗器の端子間電圧を用いて、前記整流素子に流れている電流の電流値を検出する、請求項１から４のいずれかに記載の整流素子劣化測定装置。 The current detection unit includes a resistor connected in series to the rectifying element, and using a terminal voltage of the resistor generated by a current flowing in the resistor, a current value of the current flowing in the rectifying element is calculated. The rectifying element deterioration measuring device according to claim 1, which detects.
  6. 　前記整流素子の劣化を判定するための判定電流値は、破損する前の前記整流素子の電気的特性から設定する、請求項１から５のいずれかに記載の整流素子劣化測定装置。 The rectifying element deterioration measuring device according to any one of claims 1 to 5, wherein a judgment current value for judging deterioration of the rectifying element is set based on electrical characteristics of the rectifying element before being damaged.
  7. 　前記整流素子は、抵抗溶接機が備えるインバータトランスに設けたダイオードスタックのダイオードである、請求項１から６のいずれかに記載の整流素子劣化測定装置。 The rectifying element deterioration measuring device according to any one of claims 1 to 6, wherein the rectifying element is a diode of a diode stack provided in an inverter transformer included in a resistance welding machine.
  8. 　逆電圧を整流素子に印加し、前記整流素子に流れている電流の電流値を検出する段階と、
    　検出した電流値が前記整流素子の劣化を判定するための判定電流値よりも大きければ前記整流素子は劣化していると判断し、小さければ前記整流素子は劣化していないと判断する段階と、
    　を含む、整流素子劣化測定方法。     Applying a reverse voltage to the rectifying element and detecting the current value of the current flowing through the rectifying element;
    If the detected current value is larger than the judgment current value for judging deterioration of the rectifying element, it is judged that the rectifying element is deteriorated, and if it is smaller, it is judged that the rectifying element is not deteriorated.
    A method for measuring deterioration of a rectifying element, including:
  9. 　前記整流素子に印加する前記逆電圧は、段階的に上昇させる、請求項８に記載の整流素子劣化測定方法。 The rectifying element deterioration measuring method according to claim 8, wherein the reverse voltage applied to the rectifying element is increased stepwise.
  10. 　前記逆電圧の段階的な上昇は、次の段階に上昇させるときに、現段階の電圧から次の段階の電圧まで一定の時間をかけて上昇させる、請求項９に記載の整流素子劣化測定方法。 10. The rectifying element deterioration measuring method according to claim 9, wherein the stepwise increase of the reverse voltage is performed by increasing the voltage of the present step from the voltage of the next step over a certain period of time when increasing the voltage to the next step. ..
  11. 　前記整流素子に印加する前記逆電圧の最大電圧は、劣化している前記整流素子に印加しても、前記整流素子が破損しないように、前記整流素子の逆耐圧の０を含まない６０％以下の電圧とする、請求項８から１０のいずれかに記載の整流素子劣化測定方法。 The maximum voltage of the reverse voltage applied to the rectifying element is 60% or less that does not include 0 of the reverse breakdown voltage of the rectifying element so that the rectifying element is not damaged even when applied to the deteriorated rectifying element. The rectifying element deterioration measuring method according to any one of claims 8 to 10, wherein the voltage is set to.
PCT/JP2019/031518 2018-10-31 2019-08-08 Device for measuring degradation of rectifying element and method for measuring degradation of rectifying element WO2020152894A1 (en)

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