WO2020133883A1 - 一种面板检测方法 - Google Patents

一种面板检测方法 Download PDF

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Publication number
WO2020133883A1
WO2020133883A1 PCT/CN2019/086743 CN2019086743W WO2020133883A1 WO 2020133883 A1 WO2020133883 A1 WO 2020133883A1 CN 2019086743 W CN2019086743 W CN 2019086743W WO 2020133883 A1 WO2020133883 A1 WO 2020133883A1
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Prior art keywords
panel
value
flicker value
optimal
common electrode
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PCT/CN2019/086743
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English (en)
French (fr)
Inventor
国春朋
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Wuhan China Star Optoelectronics Technology Co Ltd
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Wuhan China Star Optoelectronics Technology Co Ltd
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Priority to US16/488,586 priority Critical patent/US10867564B2/en
Publication of WO2020133883A1 publication Critical patent/WO2020133883A1/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0247—Flicker reduction other than flicker reduction circuits used for single beam cathode-ray tubes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen

Definitions

  • the invention relates to the field of display technology, in particular to a panel detection method.
  • the driving method of all types of liquid crystal displays is the same, that is, the arrangement of liquid crystal molecules is changed by applying an electric field, so that the phase delay of light in the liquid crystal layer is different to change the transmittance, and then display different gray levels brightness.
  • the polarity inversion method to drive the liquid crystal, that is, use different voltages to drive the liquid crystal at different times, otherwise the liquid crystal will be polarized, thus Affect the display effect, or even damage the display.
  • the applied voltage must not have a DC component. Therefore, when driving a liquid crystal display, it is necessary to make the positive and negative polar voltages symmetrical with respect to VCOM (common electrode voltage). Ideally, the voltages applied across the liquid crystal are symmetrical with respect to VCOM. However, due to the coupling between the circuits, the positive and negative voltages often have a certain deviation, resulting in a flicker.
  • VCOM common electrode voltage
  • VCOM adjustments will be made in the module factory, so that the panel's Flicker achieves the best.
  • Flicker is a numerical variable. The larger the value, the more serious the flicker of the panel.
  • the panel has a VCOM value that can correspond to the minimum point of Flicker, that is, the flicker of the panel at this time is the best.
  • a host is matched with an optical probe to detect the Flicker value of the panel. Because the optical probe itself has a certain error and it needs to be corrected regularly (usually once every 3 to 6 months), and between the optical probe and the host is required The data is transmitted through a USB cable connection. In the normal module production process, the Flicker value transmitted to the host is often inaccurate due to problems with the probe itself or poor connection of the connection cable. VCOM value, the Flicker value returned by it remains unchanged, at this time the host will randomly find a value as the best VCOM for this panel, and burn it into this panel, which leads to the panel that is shipped to the customer is not the best VCOM, which makes the flashing serious, leads to customer complaints or low yield in the factory.
  • the invention provides a panel detection method, which is used to solve the problem that the prior art adopts a host and an optical probe to detect the flicker value of the panel, resulting in an inaccurate flicker value transmitted to the host, resulting in serious product flicker and affecting production yield. technical problem.
  • An embodiment of the present invention provides a panel inspection method.
  • the method includes:
  • the optical probe set includes at least two optical probes.
  • the optical probe is connected to the host through a USB cable and is used to detect the flicker value of the panel;
  • the host sends a lighting instruction and inputs a common electrode voltage to the panel group;
  • the optical probe respectively detects the flicker value of any panel in the panel group and returns it to the host;
  • the host determines whether the flicker value is the best flicker value
  • the host determines that the flicker value is the optimal flicker value, then the host records the common electrode voltage corresponding to the optimal flicker value of the panel as the optimal common electrode voltage of the panel, and records The optimal common electrode voltage is burned in the panel;
  • the host determines that the flicker value is not the optimal flicker value.
  • the host adjusts the input common electrode voltage value and repeats steps S20 to S40 until the host judges that the flicker value is the optimal flicker value. End.
  • step S20 if any panel in the panel group has programmed the optimal common electrode voltage, the next panel is transmitted for the position detection.
  • step S30 the number of the optical probes is equal to the number of panels in the panel group.
  • the method for determining the optimal flicker value in step S40 is to obtain the minimum flicker value by comparison, and the minimum flicker value is the optimal flicker value.
  • step S60 the adjustment range in which the host adjusts the input common electrode voltage value is selected back and forth with the optimal common electrode voltage as the center value.
  • An embodiment of the present invention also provides a panel inspection method, which includes:
  • the host sends a lighting instruction and inputs the center value to any panel
  • the host uses an optical probe set to read back the flicker value and perform subtraction operations with each other;
  • the difference is greater than the difference between the flashing values, and the alarm informs the engineer to calibrate the probe or check the connection;
  • the difference is less than the difference in flicker value, and find the best common electrode voltage and the best flicker value;
  • the optical probe group includes at least two optical probes, and the number of the flicker values is equal to the number of the optical probes.
  • the subtraction operations are performed on all the read flicker values in twos to obtain the largest difference.
  • the method for finding the optimal flicker value in S108 is to obtain the minimum flicker value by comparison, and the minimum flicker value is the optimal flicker value.
  • the beneficial effects of the present invention are: a panel detection method provided by an embodiment of the present invention, by switching the mode of using one host corresponding to one optical probe in the prior art to one host corresponding to two or more optical probes, to avoid the probe itself Abnormality or flickering abnormality caused by poor connection of the connecting wire, to achieve the technical effect of improving the production yield of the module.
  • FIG. 1 is a structural diagram of a jig for detecting panel flicker value provided by an embodiment of the present invention
  • FIG. 2 is a flowchart of a panel detection method provided by a first embodiment of the present invention
  • FIG. 3 is a flowchart of a panel detection method provided by a second embodiment of the present invention.
  • FIG. 1 a structural diagram of a jig for detecting panel flicker value provided by an embodiment of the present invention, from which the components of the present invention and the relative positional relationship between the components can be seen intuitively,
  • the jig for detecting the flicker value of the panel includes a host 101 and an optical probe set.
  • the optical probe set includes at least two optical probes, a first optical probe 102 and a second optical probe 103, and the first optical probe 102 Connected to the host 101 through a first connection line 104, the second optical probe 103 is connected to the host 101 through a second connection line 105, the connection line may be a USB line, the first optical probe 102 corresponds The first panel 106 is detected, and the second optical probe 103 detects the second panel 107 correspondingly.
  • the host 101 is connected to two or more optical probes to detect the flicker value of the panel.
  • the host 101 is connected to two or more optical probes to detect the flicker value of the panel.
  • a flowchart of a panel detection method provided by the first embodiment of the present invention includes:
  • the optical probe set includes at least two optical probes.
  • the optical probe is connected to the host through a USB cable and is used to detect the flicker value of the panel.
  • the host sends a lighting instruction and inputs a common electrode voltage to the panel group;
  • the optical probe respectively detects the flicker value of any panel in the panel group and returns it to the host;
  • the host determines whether the flicker value is the best flicker value
  • the host determines that the flicker value is the best flicker value, then the host records the common electrode voltage corresponding to the best flicker value of the panel as the best common electrode voltage of the panel, and The optimal common electrode voltage is burned in the panel;
  • the host determines that the flicker value is not the optimal flicker value, the host adjusts the input common electrode voltage value, and repeats steps S202 to S205 until the host judges that the flicker value is the optimal flicker value End.
  • step S20 if any panel in the panel group has burned the best common electrode voltage, the next panel is sent to perform the offset detection; in step S30, the number of optical probes and all The number of panels in the panel group is equal; the method of judging the best flicker value in step S40 is to obtain the minimum flicker value through comparison, and the minimum flicker value is the best flicker value; in step S60, the host adjusts the total input The adjustment range of the electrode voltage value is selected back and forth with the best common electrode voltage as the center value.
  • a flowchart of a panel detection method according to a second embodiment of the present invention includes:
  • the host sends a lighting instruction and inputs the center value to any panel
  • the host uses an optical probe set to read back the flicker value and perform subtraction operations with each other;
  • the difference value is greater than the difference of the flicker value, an alarm notifies the engineer to calibrate the probe or check the connection;
  • the difference is less than the difference in flicker value, and find the best common electrode voltage and the best flicker value;
  • the optical probe group includes at least two optical probes, the number of the flicker values is equal to the number of the optical probes, and the subtraction operations are performed on all the read flicker values respectively to obtain the maximum
  • the difference value is the best flicker value in S108.
  • the best common electrode voltage is the one corresponding to the best flicker value.
  • the method to find the best flicker value is to obtain the minimum value by comparison. Flicker value, the minimum flicker value is the best flicker value.
  • the accuracy of the collected data is further tested by setting up a two-step judgment procedure. If the two-step judgment procedure is not passed, that is, an alarm is notified to the engineer to calibrate the probe or check the connection, and the standard is solved after the process problem is solved The best flicker value, and then the best common electrode voltage corresponding to this best flicker value is burned into the panel to optimize the product quality and greatly improve the production yield of the module.
  • a panel detection method provided by an embodiment of the present invention avoids the abnormality of the probe itself by switching the mode of using one host corresponding to one optical probe in the prior art to one host corresponding to two or more optical probes Or the flickering abnormality caused by poor connection of the connecting wire achieves the technical effect of improving the production yield of the module. , Causing serious product flicker and technical problems that affect production yield.

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Abstract

本发明提供一种面板检测方法，包括：S10、提供一主机、至少两个光学探头；S20、主机发送点亮指令以及输入共电极电压给面板组；S30、光学探头分别检测面板组中任一面板的闪烁值并传回给主机；S40、主机判断闪烁值是否为最佳闪烁值。

Description

一种面板检测方法 技术领域
本发明涉及显示技术领域，尤其涉及一种面板检测方法。
 背景技术
随着科技的发展，液晶显示器在人们生活中的应用越来越广泛；随着液晶显示技术的发展，液晶显示器的种类也越来越多。但是，所有种类的液晶显示器的驱动方式都是一致的，即利用施加电场来改变液晶分子的排列方式，而使得光在液晶层中的相位延迟不同来改变透射率，进而来显示不同的灰阶亮度。然而由于液晶的纯度以及配向膜等原因，驱动液晶时必须使用极性反转的方式去驱动，即在不同的时间使用正负号相反的电压驱动液晶，不然就会造成液晶出现极化，从而影响显示效果，甚至损坏显示器。不仅如此，还要使得正负极性的平均值相互抵消，即施加的电压不能有直流的成分。所以驱动液晶显示器时，必须要使得正负极性电压相对于VCOM（共电极电压）对称。理想情况下，我们施加在液晶两端的电压均是相对于VCOM对称的，然而由于电路之间的耦合，常常会使得正负压出现一定偏差，从而导致画面Flicker（闪烁）。
在生产液晶面板时，在模组厂内会进行VCOM调整，从而使得面板的Flicker达到最佳。其中，Flicker是一数值变量，其越大则表示面板的闪烁越严重，一般面板有一个VCOM值可以对应到Flicker最小的点，也就是对应此时的面板闪烁状况最佳。
现有技术为一个主机搭配一个光学探头来检测面板的Flicker值，由于光学探头本身有一定的误差且其需要定时矫正(一般为3~6个月一次)，而且光学探头与主机之间是需要通过一根USB线相连来传输数据，在正常模组生产过程中经常性由于探头本身出现问题或者连接线相接不良导致传输给主机的Flicker值是不准确的，就会出现无论主机端如何调整VCOM值，其反馈回来的Flicker值不变，此时主机就会随机找一个值当做此面板的最佳VCOM，并把它烧录进此面板内，这样导致出货给客户的面板不是最佳VCOM，从而使得闪烁严重，导致客户抱怨或者厂内良率偏低。
综上所述，现有技术的面板检测方法，由于采用一个主机搭配一个光学探头来检测面板的闪烁值，导致传输给主机的闪烁值不准确，造成产品闪烁严重，影响生产良率。故，有必要提供一种新的面板检测方法来改善这一缺陷。
 技术问题
本发明提供一种面板检测方法，用于解决现有技术由于采用一个主机搭配一个光学探头来检测面板的闪烁值，导致传输给主机的闪烁值不准确，造成产品闪烁严重，影响生产良率的技术问题。
 技术解决方案
为解决上述问题，本发明提供的技术方案如下：
本发明实施例提供一种面板检测方法，所述方法包括：
S10、提供一主机、以及光学探头组，所述光学探头组至少包括两个光学探头，所述光学探头通过USB线与所述主机相连，用于检测面板的闪烁值；
S20、所述主机发送点亮指令以及输入共电极电压给面板组；
S30、所述光学探头分别检测所述面板组中任一面板的闪烁值并传回给所述主机；
S40、所述主机判断所述闪烁值是否为最佳闪烁值；
S50、所述主机判断所述闪烁值为最佳闪烁值，则所述主机将所述面板的所述最佳闪烁值对应的共电极电压记录为所述面板的最佳共电极电压，并将所述最佳共电极电压烧录在所述面板内；
S60、所述主机判断所述闪烁值不是最佳闪烁值，所述主机调整输入共电极电压值，并重复所述步骤S20至S40，直至所述主机判断所述闪烁值为最佳闪烁值时结束。
在本申请实施例所提供的面板检测方法中，在步骤S20中若所述面板组中任一面板已烧录最佳共电极电压，则传送下一片面板进行补位检测。
在本申请实施例所提供的面板检测方法中，在步骤S30中所述光学探头的数量与所述面板组内的面板数量相等。
在本申请实施例所提供的面板检测方法中，在步骤S40中判断最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值。
在本申请实施例所提供的面板检测方法中，在步骤S60中所述主机调整输入共电极电压值的调整范围是以最佳共电极电压为中心值来回选取。
本发明实施例还提供一种面板检测方法，所述方法包括：
S101、收集同批次面板的最佳共电极电压的范围，即最大最佳共电极电压值与最小最佳共电极电压值；
S102、提取所述范围内的中心值；
S103、确认在所述同批次面板中所述中心值对应的任一面板的闪烁值之间差异最大的闪烁值差；
S104、主机发送点亮指令，输入所述中心值给任一面板；
S105、所述主机使用光学探头组回读闪烁值并相互之间做减法运算；
S106、将差值与所述闪烁值差作比较；
S107、差值大于所述闪烁值差，报警通知工程师校正探头或者检查连线；
S108、差值小于所述闪烁值差，找最佳共电极电压和最佳闪烁值；
S109、找到最佳共电极电压后确认所述最佳共电极电压是否在所述范围内；
S110、在所述范围内，正常出货；
S111、不在所述范围内，则重复所述步骤S107至S109，直至所述最佳共电极电压是在所述范围内时结束。
在本申请实施例所提供的面板检测方法中，在S105中所述光学探头组至少包括两个光学探头，所述闪烁值的个数与所述光学探头的数量相等。
在本申请实施例所提供的面板检测方法中，在S105中对所有读取的闪烁值分别两两做减法运算，得到其中最大的差值。
在本申请实施例所提供的面板检测方法中，在S108中先找最佳闪烁值，找到最佳闪烁值后，与所述最佳闪烁值对应的即为最佳共电极电压。
在本申请实施例所提供的面板检测方法中，在S108中找最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值。
 有益效果
本发明的有益效果为：本发明实施例提供的一种面板检测方法，通过将现有技术采用一个主机对应一个光学探头的模式切换为一个主机对应两个或者多个光学探头，避免由于探头本身的异常或者连接线接触不良导致的闪烁异常，达到提高模组生产良率的技术效果。
 附图说明
为了更清楚地说明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单介绍，显而易见地，下面描述中的附图仅仅是发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本发明实施例提供的检测面板闪烁值的治具的结构图；
图2为本发明第一实施例提供的面板检测方法流程图；
图3为本发明第二实施例提供的面板检测方法流程图。
 本发明的最佳实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
现有技术的面板检测方法，由于采用一个主机搭配一个光学探头来检测面板的闪烁值，导致传输给主机的闪烁值不准确，造成产品闪烁严重，影响生产良率，本实施例能够解决该缺陷。
如图1所示，本发明实施例提供的检测面板闪烁值的治具的结构图，从图中可以很直观地看到本发明的各组成部分，以及各组成部分之间的相对位置关系，所述检测面板闪烁值的治具包括一主机101、以及光学探头组，所述光学探头组至少包括两个光学探头，第一光学探头102和第二光学探头103，所述第一光学探头102通过第一连接线104与所述主机101相连，所述第二光学探头103通过第二连接线105与所述主机101相连，所述连接线可以为USB线，所述第一光学探头102对应检测第一面板106，所述第二光学探头103对应检测第二面板107。
在此实施例中，所述主机101连接两个或者多个光学探头检测面板的闪烁值，通过比较多个采集的闪烁值，避免当一个主机对应一个光学探头模式时，由于探头本身的异常或者连接线接触不良导致的所检测的闪烁值不准确，还可以提高检测效率。
如图2所示，本发明第一实施例提供的面板检测方法流程图，所述检测方法包括：
S201、提供一主机、以及光学探头组，所述光学探头组至少包括两个光学探头，所述光学探头通过USB线与所述主机相连，用于检测面板的闪烁值；
S202、所述主机发送点亮指令以及输入共电极电压给面板组；
S203、所述光学探头分别检测所述面板组中任一面板的闪烁值并传回给所述主机；
S204、所述主机判断所述闪烁值是否为最佳闪烁值；
S205、所述主机判断所述闪烁值为最佳闪烁值，则所述主机将所述面板的所述最佳闪烁值对应的共电极电压记录为所述面板的最佳共电极电压，并将所述最佳共电极电压烧录在所述面板内；
S206、所述主机判断所述闪烁值不是最佳闪烁值，所述主机调整输入共电极电压值，并重复所述步骤S202至S205，直至所述主机判断所述闪烁值为最佳闪烁值时结束。
在此实施例中，在步骤S20中若所述面板组中任一面板已烧录最佳共电极电压，则传送下一片面板进行补位检测；在步骤S30中所述光学探头的数量与所述面板组内的面板数量相等；在步骤S40中判断最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值；在步骤S60中所述主机调整输入共电极电压值的调整范围是以最佳共电极电压为中心值来回选取。
如图3所示，本发明第二实施例提供的面板检测方法流程图，所述检测方法包括：
S301、收集同批次面板的最佳共电极电压的范围，即最大最佳共电极电压值与最小最佳共电极电压值；
S302、提取所述范围内的中心值；
S303、确认在所述同批次面板中所述中心值对应的任一面板的闪烁值之间差异最大的闪烁值差；
S304、主机发送点亮指令，输入所述中心值给任一面板；
S305、所述主机使用光学探头组回读闪烁值并相互之间做减法运算；
S306、将差值与所述闪烁值差作比较，判断差值是否小于所述闪烁值差；
S307、差值大于所述闪烁值差，报警通知工程师校正探头或者检查连线；
S308、差值小于所述闪烁值差，找最佳共电极电压和最佳闪烁值；
S309、找到最佳共电极电压后确认所述最佳共电极电压是否在所述范围内；
S310、在所述范围内，正常出货；
S311、不在所述范围内，则重复所述步骤S307至S309，直至所述最佳共电极电压是在所述范围内时结束。
其中，在S105中所述光学探头组至少包括两个光学探头，所述闪烁值的个数与所述光学探头的数量相等，对所有读取的闪烁值分别两两做减法运算，得到其中最大的差值，在S108中先找最佳闪烁值，找到最佳闪烁值后，与所述最佳闪烁值对应的即为最佳共电极电压，找最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值。
在此实施例中，通过设置两步判断程序对所采集的数据进行进一步检测准确性，若不能通过这两步判断程序，即报警通知工程师校正探头或者检查连线，将制程问题解决后得到标准最佳闪烁值，然后将此最佳闪烁值对应的最佳共电极电压烧录入面板内，使产品品质达到最佳，大大提高了模组的生产良率。
综上所述，本发明实施例提供的一种面板检测方法，通过将现有技术采用一个主机对应一个光学探头的模式切换为一个主机对应两个或者多个光学探头，避免由于探头本身的异常或者连接线接触不良导致的闪烁异常，达到提高模组生产良率的技术效果，解决了现有技术由于采用一个主机搭配一个光学探头来检测面板的闪烁值，导致传输给主机的闪烁值不准确，造成产品闪烁严重，影响生产良率的技术问题。
以上对本发明实施例所提供的一种面板检测方法进行了详细介绍。应理解，本文所述的示例性实施方式应仅被认为是描述性的，用于帮助理解本发明的方法及其核心思想，而并不用于限制本发明。

Claims (10)

  1. 一种面板检测方法，其包括：
    S10、提供一主机、以及光学探头组，所述光学探头组至少包括两个光学探头，所述光学探头通过USB线与所述主机相连，用于检测面板的闪烁值；
    S20、所述主机发送点亮指令以及输入共电极电压给面板组；
    S30、所述光学探头分别检测所述面板组中任一面板的闪烁值并传回给所述主机；
    S40、所述主机判断所述闪烁值是否为最佳闪烁值；
    S50、所述主机判断所述闪烁值为最佳闪烁值，则所述主机将所述面板的所述最佳闪烁值对应的共电极电压记录为所述面板的最佳共电极电压，并将所述最佳共电极电压烧录在所述面板内；
    S60、所述主机判断所述闪烁值不是最佳闪烁值，所述主机调整输入共电极电压值，并重复所述步骤S20至S40，直至所述主机判断所述闪烁值为最佳闪烁值时结束。
  2. 如权利要求1所述的面板检测方法，其中，在步骤S20中若所述面板组中任一面板已烧录最佳共电极电压，则传送下一片面板进行补位检测。
  3. 如权利要求1所述的面板检测方法，其中，在步骤S30中所述光学探头的数量与所述面板组内的面板数量相等。
  4. 如权利要求1所述的面板检测方法，其中，在步骤S40中判断最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值。
  5. 如权利要求1所述的面板检测方法，其中，在步骤S60中所述主机调整输入共电极电压值的调整范围是以最佳共电极电压为中心值来回选取。
  6. 一种面板检测方法，其包括：
    S101、收集同批次面板的最佳共电极电压的范围，即最大最佳共电极电压值与最小最佳共电极电压值；
    S102、提取所述范围内的中心值；
    S103、确认在所述同批次面板中所述中心值对应的任一面板的闪烁值之间差异最大的闪烁值差；
    S104、主机发送点亮指令，输入所述中心值给任一面板；
    S105、所述主机使用光学探头组回读闪烁值并相互之间做减法运算；
    S106、将差值与所述闪烁值差作比较；
    S107、差值大于所述闪烁值差，报警通知工程师校正探头或者检查连线；
    S108、差值小于所述闪烁值差，找最佳共电极电压和最佳闪烁值；
    S109、找到最佳共电极电压后确认所述最佳共电极电压是否在所述范围内；
    S110、在所述范围内，正常出货；
    S111、不在所述范围内，则重复所述步骤S107至S109，直至所述最佳共电极电压是在所述范围内时结束。
  7. 如权利要求6所述的面板检测方法，其中，在S105中所述光学探头组至少包括两个光学探头，所述闪烁值的个数与所述光学探头的数量相等。
  8. 如权利要求6所述的面板检测方法，其中，在S105中对所有读取的闪烁值分别两两做减法运算，得到其中最大的差值。
  9. 如权利要求6所述的面板检测方法，其中，在S108中先找最佳闪烁值，找到最佳闪烁值后，与所述最佳闪烁值对应的即为最佳共电极电压。
  10. 如权利要求6所述的面板检测方法，其中，在S108中找最佳闪烁值的方法是通过比较得到最小闪烁值，所述最小闪烁值即为最佳闪烁值。
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