WO2020065334A1 - Method of processing substrate for an energy storage device - Google Patents
Method of processing substrate for an energy storage device Download PDFInfo
- Publication number
- WO2020065334A1 WO2020065334A1 PCT/GB2019/052730 GB2019052730W WO2020065334A1 WO 2020065334 A1 WO2020065334 A1 WO 2020065334A1 GB 2019052730 W GB2019052730 W GB 2019052730W WO 2020065334 A1 WO2020065334 A1 WO 2020065334A1
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- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- precursor
- groove
- energy storage
- face
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 136
- 238000000034 method Methods 0.000 title claims abstract description 63
- 238000004146 energy storage Methods 0.000 title claims abstract description 47
- 238000012545 processing Methods 0.000 title claims abstract description 22
- 239000000463 material Substances 0.000 claims abstract description 136
- 239000002243 precursor Substances 0.000 claims abstract description 133
- 238000000151 deposition Methods 0.000 claims abstract description 20
- 238000000576 coating method Methods 0.000 claims description 48
- 239000004020 conductor Substances 0.000 claims description 40
- 239000003990 capacitor Substances 0.000 claims description 34
- 239000011248 coating agent Substances 0.000 claims description 31
- 239000003989 dielectric material Substances 0.000 claims description 25
- 239000011810 insulating material Substances 0.000 claims description 22
- 229910052751 metal Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 6
- JMXKSZRRTHPKDL-UHFFFAOYSA-N titanium ethoxide Chemical compound [Ti+4].CC[O-].CC[O-].CC[O-].CC[O-] JMXKSZRRTHPKDL-UHFFFAOYSA-N 0.000 claims description 5
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 claims description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 4
- 229910052788 barium Inorganic materials 0.000 claims description 4
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 4
- 239000002861 polymer material Substances 0.000 claims description 4
- OWIVCTKPNJKHDN-UHFFFAOYSA-N 2-[2-[2-[2-(2-hexan-3-yloxyethoxy)ethoxy]ethoxy]ethoxy]ethanol Chemical compound C(C)C(CCC)OCCOCCOCCOCCOCCO OWIVCTKPNJKHDN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052454 barium strontium titanate Inorganic materials 0.000 claims description 3
- 229910002113 barium titanate Inorganic materials 0.000 claims description 3
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims description 3
- WUXISMDFUAVWSS-PAMPIZDHSA-L barium(2+);(z)-1,1,1,5,5,5-hexafluoro-4-oxopent-2-en-2-olate Chemical compound [Ba+2].FC(F)(F)C(/[O-])=C/C(=O)C(F)(F)F.FC(F)(F)C(/[O-])=C/C(=O)C(F)(F)F WUXISMDFUAVWSS-PAMPIZDHSA-L 0.000 claims description 3
- HAUBPZADNMBYMB-UHFFFAOYSA-N calcium copper Chemical compound [Ca].[Cu] HAUBPZADNMBYMB-UHFFFAOYSA-N 0.000 claims description 3
- 230000001419 dependent effect Effects 0.000 claims description 3
- 229910000484 niobium oxide Inorganic materials 0.000 claims description 3
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 claims description 3
- ZTILUDNICMILKJ-UHFFFAOYSA-N niobium(v) ethoxide Chemical compound CCO[Nb](OCC)(OCC)(OCC)OCC ZTILUDNICMILKJ-UHFFFAOYSA-N 0.000 claims description 3
- YHBDIEWMOMLKOO-UHFFFAOYSA-I pentachloroniobium Chemical compound Cl[Nb](Cl)(Cl)(Cl)Cl YHBDIEWMOMLKOO-UHFFFAOYSA-I 0.000 claims description 3
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 claims description 3
- OEIMLTQPLAGXMX-UHFFFAOYSA-I tantalum(v) chloride Chemical compound Cl[Ta](Cl)(Cl)(Cl)Cl OEIMLTQPLAGXMX-UHFFFAOYSA-I 0.000 claims description 3
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 claims description 3
- -1 T antalum oxide Chemical compound 0.000 claims description 2
- 239000011230 binding agent Substances 0.000 claims description 2
- 239000002826 coolant Substances 0.000 claims description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N endo-cyclopentadiene Natural products C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 claims description 2
- HSXKFDGTKKAEHL-UHFFFAOYSA-N tantalum(v) ethoxide Chemical compound [Ta+5].CC[O-].CC[O-].CC[O-].CC[O-].CC[O-] HSXKFDGTKKAEHL-UHFFFAOYSA-N 0.000 claims description 2
- QBNKFXYJSJOGEL-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical compound [O-2].[O-2].[O-2].[Ti+4].[Ti+4] QBNKFXYJSJOGEL-UHFFFAOYSA-N 0.000 claims 1
- 239000010410 layer Substances 0.000 description 94
- 239000007789 gas Substances 0.000 description 27
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 22
- 238000010586 diagram Methods 0.000 description 12
- 239000004408 titanium dioxide Substances 0.000 description 10
- 230000008021 deposition Effects 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000005334 plasma enhanced chemical vapour deposition Methods 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000011247 coating layer Substances 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000000994 depressogenic effect Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910052756 noble gas Inorganic materials 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229910001936 tantalum oxide Inorganic materials 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- 241000270295 Serpentes Species 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000000231 atomic layer deposition Methods 0.000 description 1
- VCALGUJWYYNHDY-ZJCTYWPYSA-L barium(2+);(z)-2,2,6,6-tetramethyl-5-oxohept-3-en-3-olate;hydrate Chemical compound O.[Ba+2].CC(C)(C)C(\[O-])=C\C(=O)C(C)(C)C.CC(C)(C)C(\[O-])=C\C(=O)C(C)(C)C VCALGUJWYYNHDY-ZJCTYWPYSA-L 0.000 description 1
- SAAKEQOBORNMJM-UHFFFAOYSA-N barium;1,2,3,4-tetramethyl-5-propylcyclopentane Chemical compound [Ba].CCC[C]1[C](C)[C](C)[C](C)[C]1C.CCC[C]1[C](C)[C](C)[C](C)[C]1C SAAKEQOBORNMJM-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- JITPFBSJZPOLGT-UHFFFAOYSA-N cerium(3+);propan-2-olate Chemical compound [Ce+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] JITPFBSJZPOLGT-UHFFFAOYSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- KTWOOEGAPBSYNW-UHFFFAOYSA-N ferrocene Chemical compound [Fe+2].C=1C=C[CH-]C=1.C=1C=C[CH-]C=1 KTWOOEGAPBSYNW-UHFFFAOYSA-N 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- QCQJPUZAVFHPMN-UHFFFAOYSA-N iron(2+);propan-2-olate Chemical compound [Fe+2].CC(C)[O-].CC(C)[O-] QCQJPUZAVFHPMN-UHFFFAOYSA-N 0.000 description 1
- KYMNSBSWJPFUJH-UHFFFAOYSA-N iron;5-methylcyclopenta-1,3-diene;methylcyclopentane Chemical compound [Fe].C[C-]1C=CC=C1.C[C-]1[CH-][CH-][CH-][CH-]1 KYMNSBSWJPFUJH-UHFFFAOYSA-N 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- NFHFRUOZVGFOOS-UHFFFAOYSA-N palladium;triphenylphosphane Chemical compound [Pd].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 NFHFRUOZVGFOOS-UHFFFAOYSA-N 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 239000000126 substance Chemical group 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/503—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using dc or ac discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/351—Sputtering by application of a magnetic field, e.g. magnetron sputtering using a magnetic field in close vicinity to the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/562—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
- H01G13/04—Drying; Impregnating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/145—Organic dielectrics vapour deposited
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32752—Means for moving the material to be treated for moving the material across the discharge
- H01J37/32761—Continuous moving
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
- H01G13/02—Machines for winding capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/085—Vapour deposited
Definitions
- This present invention relates to a substrate for an energy storage device and a method of processing same.
- Ceramic-based and film-based capacitors are useful for a number of applications including control measurement and power applications.
- Film capacitors are often produced in a roll-to-roll process where the polymer or flexible substrate becomes the dielectric material sandwiched between conductors that are often vacuum coated onto the film.
- Ceramic capacitor coatings can be applied to any suitable substrate and applications to flexible substrates using roll-to-roll processing lowers the cost and increases the production speed.
- Other materials can also be used to generate capacitors for commercial applications and the application of these to flexible substrates can generate capacitor structures that can be easily transformed into wound or layered commercial products.
- a number of methods for producing suitable capacitor coatings are known, for example, High Speed Physical Vapour Deposition (PVD).
- PVD Physical Vapour Deposition
- This method is relatively high speed and low cost, but can produce relatively thin and sometimes porous or defective coatings, where pin holes that when sandwiched between conductors may promote short circuiting.
- Improved coating properties can be achieved through a number of known techniques including but not limited to reactive sputtering, Chemical Vapour Deposition and Atomic Layer Deposition. However, all of these techniques are low speed and therefore high cost, particularly when used in roll-to-roll processing.
- PECVD Plasma Enhanced Chemical Vapour Deposition
- the deposition rate is limited as the coating will only be deposited in a generated plasma zone.
- Increasing the amount of precursor materials applied has an effect of quenching the plasma (due to increasing process pressure and thus makes maintaining a plasma require increased voltages) which stops the deposition of the coating. Therefore, although high quality coatings can be produced with this technique, it is a low speed technique, which results in low line speed when the technique is used in roll-to-roll processing.
- the speed of coating can be increased in principle by using many coating areas and using the same PECVD process at each stage. Such an approach would result in longer web paths so that each station can be passed and thus coat the substrate.
- the deposition rate at each station in order to get the required coating quality is related to the material flow, applied power and the local vacuum level, etc. As such, this would require a large and complex control system with several instabilities when the kinetics of stabilisation in a vacuum are considered, such as vacuum pumping speed variations, gas conductance variations and local area history adding to uncontrolled gas load, etc.
- a method of processing a substrate for an energy storage device comprising:
- each curing station performs the steps of:
- the plasma preferably comprises a reactive gas.
- the plasma dissociates the precursor and the reactive gas reacts with the dissociated precursor to form the material layer.
- the reaction between a precursor and plasma can occur at multiple sites simultaneously to form material layers, improving the speed and uniformity of the process.
- the substrate can be processed without raising the temperature substantially and damaging the substrate.
- the substrate temperature can be maintained at less than 100°C. In this way, the method is suitable for producing an energy storage device in a low temperature, roll-to-roll process. Further still, material layers free from pin holes can be produced at low temperature and high speed.
- each curing station performing the steps of:
- vapourised precursor mixing the vapourised precursor with the plasma such that the precursor is dissociated by the plasma and the dissociated precursor is reacted with the reactive gas to form a material coating which is deposited on the substrate as a material layer without substantially raising the temperature of the substrate.
- the method includes the step of providing a vacuum chamber in which the drum, plurality of curing stations and substrate are provided.
- power is supplied to the drum by a high voltage supply of either alternating current (AC) or direct current (DC).
- AC alternating current
- DC direct current
- the material layer comprises a dielectric material.
- the dielectric material may be titanium dioxide.
- the material layer comprises a dielectric material selected from one or more of the following: Titanium oxide, Tantalum oxide, Niobium oxide, Barium titanate, Strontium titanate and Calcium copper titanate.
- the dielectric material is doped with one or more of iron, cerium, manganese and calcium.
- the plasma contains a reactive gas. More specifically, the plasma contains a reactive gas or a reactive gas mixture.
- “reactive gas” means a gas other than a noble gas and“reactive gas mixture” means a mixture of gases including a portion of a noble gas.
- the reactive gas or reactive gas mixture is or contains one or more of: oxygen, nitrogen or the like.
- the substrate to be moved comprises a plurality of grooves each groove having a first face and a second face, the first face and the second face each having a coat of non-insulating material.
- the face and/or the second face of the groove may be partially or substantially wholly coated with the non-insulating material.
- the method comprises providing a plurality of curing stations located around the circumference of the drum. Each curing station performs the steps of:
- the process can be used to provide multi-layered material within the grooves on a substrate.
- the method comprises providing a plurality of curing stations located around the circumference of the drum. Each curing station performs the steps of:
- the process can be used to provide multi-layered material within the grooves on a substrate.
- the dissociated precursor is capable of reacting with the reactive gas in order to provide a material coating which forms a material layer when deposited in the groove.
- the plurality of curing stations are configured to deposit or generate the same precursor.
- the thickness of material can be increased by forming multiple thin layers at the plurality of curing stations.
- the plurality of curing stations are configured to deposit or generate at least two different precursors.
- the material chosen for the precursor can be varied. Different precursors can be used at different stations depending on the material properties desired. For example, materials can be selected based on the electrical properties desired, or on the mechanical properties desired.
- the plurality of curing stations are provided such that the at least two different precursors or, in alternative embodiments the material coatings formed from the at least two different precursors are deposited in the at least one groove in an alternating sequence. More specifically, the at least two different precursors or, in alternative embodiments the material coatings formed from the at least two different precursors are deposited in the at least one groove in such a way that the at least two precursors or, in alternative embodiments the material coatings formed from the at least two different precursors are stacked on top of one another in a repeated pattern.
- the arrangement of the precursors can be customised based on the desired electrical characteristics. More specifically, the arrangement can be customised to increase the amount of energy storable in the device. In this way, if voltage potential difference causes electrical breakdown the breakdown voltage of the capacitor formed in the groove or on the surface of the substrate will not depend on the thickness of the capacitor material between any two adjacent electrodes (with adjacent electrodes only having capacitor material between them).
- the two different precursors are precursors of a dielectric material and an electrically conductive material. More specifically, the dielectric material and the electrically conductive material are deposited in an alternating sequence.
- the final curing station deposits or generates a precursor of either dielectric material or conductive material.
- the final curing station deposits or generates an electrically conductive material in the groove. In this way, no capacitor comprising air as the dielectric is formed in the gap which would otherwise dominate the capacitance characteristics of the groove.
- the non-insulating material is a conductor material.
- the precursor is vaporised before it is deposited on the surface of the moving substrate. Alternatively, the precursor is vapourised before mixing with the plasma causing dissociation of the vapourised precursor.
- each material layer is continuous between the first face and the second face of each groove. More specifically, each dielectric material layer is continuous between the first face and the second face of each groove.
- the electrically conductive layer is discontinuous in the groove. More specifically, the electrically conductive material layer comprises first and second portions which are electrically separated from one another. In this way, electrical shorting across the groove is avoided.
- the precursor may be a precursor of one of: titanium, tantalum, niobium, barium, strontium or copper.
- the method comprises the step of applying a non-insulating (e.g. electrically conductive) material layer onto the surface of the moving substrate using a coating process.
- the coating process may be an off-axis coating process for example when the non-insulating (e.g. electrically conductive) material layer is deposited in a groove in the substrate.
- the non-insulating (e.g. electrically conductive) material layer is applied sequentially onto a dielectric material layer. In this way, alternating dielectric and non-insulating material layers are deposited on the surface of the moving substrate or, in certain embodiments, into the groove in the moving substrate.
- the non-insulating material on the first face and the non insulating material on the second face are electrically separated from each other.
- the drum is cooled by a coolant.
- the precursor is a metal organic precursor.
- the metal organic precursor is one or more of: Titanium(IV) isopropoxide, Titanium(IV) ethoxide, Titanium(IV) chloride, Tantalum(V) ethoxide, Tantalum(V) chloride, Niobium(V) ethoxide, Niobium(V) chloride, q5-cyclopentadienyl)- tetracarbonylniobium, Bisdipivaloylmethanate barium and Barium hexafluoroacetylacetonate pentaethyleneglycol ethyl butyl ether.
- the precursor is or comprises: Titanium isopropoxide, Titanium ethoxide, Iron isopropoxide, Ferrocene, Dimethylferrocene, Tris(2,2,6,6-tetramethyl-3,5-heptanedionato) iron(lll), Cerium isopropoxide, Tetrakis(2,2,6,6-tetramethyl-3,5-heptanedionato)cerium(IV), Bis(n- propyltetramethylcyclopentadienyl) barium, Bis(2,2,6,6-tetramethyl-3,5- heptanedionato)barium hydrate, Barium titanium(IV) 2-ethylhexanoate pentaisopropoxide, Titanium(IV) chloride, Tantalum(V) chloride, Niobium(V) ethoxide, Niobium(V) chloride, h5- cyclopentadienyl)-tetracarbonylni
- the precursor comprises a precursor of titanium dioxide.
- the precursor comprises a precursor of one or more of the following: Titanium oxide, Tantalum oxide, Niobium oxide, Barium titanate, Strontium titanate and Calcium copper titanate.
- a substrate for an energy storage device processed by the method according to the first aspect of the present invention.
- a substrate for an energy storage device processed by the method of the further aspect of the present invention.
- the substrate for an energy storage device comprises: a plurality of grooves, each groove having a first face and a second face, the first face and the second face each having a coat of non-insulating material; and
- each material layer formed by depositing a precursor into each groove and reacting the precursor with a plasma.
- the substrate has an increased surface area for receiving the deposited precursor and a greater surface area for reacting the precursor with a plasma.
- the substrate for an energy storage device comprises: a plurality of grooves, each groove having a first face and a second face, the first face and the second face each having a coat of non-insulating material; and
- each material layer formed by generating a vapourised precursor
- the plurality of material layers comprise a dielectric material layer.
- the dielectric material may be titanium dioxide.
- each of the plurality of material layers comprise the same material.
- the plurality of material layers comprise at least two layers of different materials.
- the arrangement of the material layers can be customised based on the desired electrical characteristics. More specifically, the arrangement can be customised to increase the amount of energy storable in the device.
- At least one layer comprises a dielectric material and at least one layer comprises a conductor material.
- the at least two different material layers are arranged in an alternating sequence. More specifically, the at least two different material layers are arranged in such a way that the at least two material layers are stacked on top of one another in a repeated pattern.
- At least one material layer comprises a capacitor material with a dielectric constant of above 10.
- At least one material layer comprises a polymer material.
- the polymer material is conjugated.
- At least one layer comprises a conductive material.
- At least one material layer comprises a radio-curable binder.
- each material layer has a thickness of between 5nm and 300nm. Preferably, each material layer has a thickness of about 100nm.
- the substrate for an energy storage device comprises at least two dielectric material layers in each groove.
- the substrate for an energy storage device comprises at least two dielectric layers and a conductive layer positioned in between the dielectric layers.
- an energy storage substrate comprising a plurality of grooves, each groove having a first face and a second face. The first face and the second face each have a coat of non-insulating material. Each groove has a plurality of material layers each formed by depositing a precursor of the material layer into each groove and reacting the precursor with a plasma. [0061] According to a further aspect of the present invention, there is provided an energy storage substrate comprising a plurality of grooves, each groove having a first face and a second face. The first face and the second face each have a coat of non-insulating material. Each groove has a plurality of material layers each formed by depositing a material coating, formed by reacting a vapourised precursor and a plasma comprising and reactive gas, as a material layer into each groove.
- the face and/or the second face of the groove may be partially or substantially wholly coated with the non-insulating material.
- a planar energy storage substrate comprising a plurality of material layers. Each material layer is formed by depositing a precursor of the material layer and reacting the precursor with a plasma.
- each material layer is formed by depositing a material coating, formed by reacting a vapourised precursor of the material layer and a plasma comprising and reactive gas, as a material layer.
- Figure 1 is a schematic diagram of an apparatus for curing or processing a substrate according to the prior art
- Figure 2 is a schematic diagram of a drum for use in a method according to embodiments of the invention having a serpentine racetrack;
- Figure 3 is a schematic diagram of a magnet array for producing a racetrack as shown in Figure 2;
- Figure 4 is a schematic representation of a method of providing multiple material layers in a groove-based capacitor according to an embodiment of the invention
- Figure 5 is a schematic diagram of a flat substrate according to an embodiment of the invention with multiple coated material layers and intermediate conductors
- Figure 6 is a schematic diagram of a substrate according to an embodiment o the invention comprising a groove-based capacitor when filled during separate coating steps with intermediate conductor coatings so as to create an energy storage device
- Figure 7a is a schematic diagram of a substrate for an energy storage device comprising a filled groove with dielectric material layers and intermediate conductor layers;
- Figure 7b is a resultant equivalent circuit diagram of the substrate of Figure 7a;
- Figure 8 is a three-dimensional schematic representation of a portion of a grooved substrate showing the features required for external coating and defining the region of substrate that can be coated/filled so as to produce a capacitive structure with a single fill or multiple conductor capacitor alternating layers;
- Figure 9 is a three-dimensional schematic diagram showing how a substrate for a groove-based energy storage device can be filled and then over coated with capacitor material and a top floating electrode included for increased capacitance also includes the effective capacitance circuit with indication of what conductor forms which connection within said circuit;
- Figure 10 is a schematic diagram of an apparatus for curing or processing a substrate
- Figure 11 is a schematic diagram of an apparatus for curing or processing a substrate.
- Figure 12 is schematic diagram of an apparatus for curing or processing a substrate.
- Figure 1 shows an apparatus 100 according to the prior art for processing or curing a substrate comprising a rotating drum 102, transporting a moving web substrate 104 over the surface of the drum 102.
- a precursor inlet 106 Located adjacent to the drum 102 there is provided a precursor inlet 106 arranged to apply a precursor 108 to the substrate as it passes underneath the precursor inlet 106.
- a plasma generator 110 Adjacent to the drum 102 and subsequent to the precursor inlet 106 along the processing line is located a plasma generator 110 arranged to generate a plasma 112.
- a magnet array 1 14 arranged to spatially define the plasma 1 12.
- the apparatus is located inside a vacuum chamber (not shown).
- the web substrate is a polymeric film, for example PET. However, any suitable web-based substrate could be used.
- the magnet array 114 is arranged to generate a serpentine shaped racetrack 202 around the surface of the drum 102.
- the racetrack 202 comprises a number of straight magnetic flux portions 204 linked together at alternate ends by curved end portions 206 to form a serpentine race track 202.
- Figure 3 shows the magnet array 1 14 of Figure 2.
- the magnet array comprises a first elongate magnet 304 having a polarity such that the north pole of the magnet 304 faces in a direction pointing radially out of the drum 102 and the south pole of the magnet 304 faces in a direction pointing towards the centre of the drum 102.
- a second elongate magnet 306 is located adjacent to the first elongate magnet 304.
- the second elongate magnet 306 is spaced from the first elongate magnet 304 and the longitudinal axis of the second elongate magnet 306 is aligned parallel to the longitudinal axis of the first elongate magnet 304.
- the second elongate magnet 306 has an opposite polarity to the first elongate magnet 304 such that the south pole of the second elongate magnet 306 faces in a direction pointing radially out of the drum 102 and the north pole of the magnet 306 faces in a direction pointing towards the centre of the drum 102.
- a third elongate magnet 308 is located adjacent to the second elongate magnet 306.
- the third elongate magnet is spaced from the second elongate magnet 304 and the longitudinal axis of the third elongate magnet 308 is aligned parallel to the longitudinal axis of the first elongate magnet 304 and the second elongate magnet 306.
- the third elongate magnet has the same polarity as the first elongate magnet 304.
- a fourth elongate magnet 310 is located adjacent to the third elongate magnet 308.
- the fourth elongate magnet is spaced from the third elongate magnet 304 and the longitudinal axis of the fourth elongate magnet 310 is aligned parallel to the longitudinal axis of the other elongate magnets 304, 306 and 308.
- the fourth elongate magnet has the same polarity as the second elongate magnet 304.
- the transverse centres of the first and third elongate magnets (304 and 308 respectively) are aligned with each other.
- the transverse centres of the second and fourth elongate magnets (306 and 310 respectively) are also aligned with each other, but the transverse centres second and fourth magnets 306, 310 are offset with respect to the transverse centres of the first and third elongate magnets 304, 308.
- each elongate magnet defines a passage region, where its first end terminates prematurely in comparison to flanking ends of adjacent elongate magnets to encourage flux flow around the first end, and a blocking region, where its second end projects beyond terminating magnet ends of the adjacent magnets to inhibit flux flow around the second end of the magnet.
- Figure 4 shows a groove-based capacitor that is filled through multiple coatings to generate a filled capacitor volume.
- the section of the substrate 402 depicted in Figure 4 has three grooves 404 each having a first face 404a and a second face 404b.
- the first face 404a is coated with a conductor material 406a and the second face 404b is coated with a conductor material 406b.
- the conductor material 406a on the first face 404a and the conductor material 406b on the second face 406b are electrically separated from each other.
- Figure 10 which illustrates a method for curing or processing the substrate, the substrate is processed by a plurality of curing stations located around the circumference of the drum 1002.
- Each curing station has a precursor depositing station 1008 that is arranged to deposit a precursor of titanium dioxide into the grooves 404 of the substrate 402 and directing a generated plasma 1010 onto the grooves 404.
- the precursor may first be vaporised before it is deposited.
- directing the generated plasma onto the groove 404 reacts the precursor within the grooves 404 to form a material layertherein. This process is repeated so that a plurality of layers of titanium dioxide dielectric material are formed within the grooves 404 to fill the volume of the groove 404.
- the material layers are continuous between the first face 404a and the second face 404b of each groove 404b.
- the plurality of curing stations are configured to deposit the same precursor, i.e. precursor of titanium dioxide.
- the plurality of curing stations can be configured to deposit a different precursor such as a conductor material and a metal organic precursor or a non-metal organic polymer precursor, or at least two different types of precursors arranged in a number of possible variations. For example, in an alternating sequence where the precursors are stacked (i.e. layered) on top of one another in a repeated pattern.
- the vapourised precursor of titanium dioxide is delivered into the vacuum chamber (not shown) alongside plasma containing reactive, oxygen gas generated by the curing station.
- the plasma acts to dissociate the precursor and the dissociated precursor reacts with the oxygen in the plasma to form titanium dioxide material coating which is then deposited in the groove 404.
- the plasma is spatially defined by the magnetic array such that the material coating is deposited in the current position on the substrate.
- Figure 5 shows a flat substrate for an energy storage device with multiple coated layers.
- the substrate has a base layer 501 , or PET or similar and a number of material layers 503.
- the dielectric layers 503 are separated from one another by intermediate conductor layers 502 such that an alternating sequence of dielectric layers 503 and conductors 502 is formed. This alternating sequence of dielectric layers 503 and conductors increases the operating voltage of the substrate.
- Figure 6 shows a portion of a substrate for an energy storage device comprising a groove-based capacitor.
- the groove-based capacitor 602 is filled with multiple continuous dielectric layers 604 with intermediate discontinuous conductor layers 606.
- the discontinuous conductor layers 606 comprise two portions electrically separated from one another in the region of the bottom of the groove. In this way, electrical short circuits are avoided within the groove.
- the capacitor 602 has a conductor layer 608 arranged on top of the multiple dielectric layers 604.
- the capacitor 602 has conductor layers 606, however, it will be appreciated that the capacitor 602 can be formed only of dielectric layers 604 such that the groove 610 is filled with dielectric material and the conductive coatings 612 on the first face 614a and second face 614b of the groove 610 are electrically connected through the dielectric material. By having multiple alternating dielectric 604 and conductor 606 layers arranged on top of one another, the voltage of the device is increased.
- Figure 7a shows a part of a substrate for an energy storage device comprising a filled groove 702 with multiple dielectric layers 704 with intermediate conductor layers 710.
- the groove 702 has a final dielectric layer 708 which overfills the groove 702.
- the multiple coating layers 704, 710, 708 thereby forming capacitors in series across the grove between the conductive coatings 712 on the first face 714a and second face 714b of the groove 702.
- Figure 7b shows the resultant equivalent circuit of the filled groove of Figure 7a. Arranging the multiple coating material layers 704, 710, 708 of alternating dielectric material and conductor material on top of each other forms a series circuit 750 of capacitors 752, which increases the voltage of the device.
- Figure 8 shows a three-dimensional schematic representation for a substrate for an energy storage device comprising a grooved substrate for a capacitor construction. It shows the groove in a structured substrate 803, which comprises: 803a a non-conducting portion of the groove; 803c the portion of the groove where conductors have been coated onto the walls and associated flat portions of the structured substrate and 803b a non-conductor coated section of groove at the end.
- the charge extraction portions comprising a conductive coating 806a and 806b are provided at a depressed edge feature where the conductor can be contacted by an electrical load to form a circuit.
- FIG. 805a and 805b are indicated profiles allowing the coating 806 to be presented for contact even if multiple layers of capacitor substrate are rolled, laminated or otherwise stacked.
- 801 denotes a limiting line for the application of the capacitor coating, wherein the capacitor material coating does not cover the whole of the substrate as edges need to be provided for external connection.
- the depressed edge profile features 805a and 805b mean that the capacitor material coating can reach the edge of the flat section of the substrate. But for engineering reasons having a lower width limit indicated by 801 is preferred.
- Figure 9a shows a partially cut away section of a substrate comprising a single layer of capacitor dielectric material 902 derived from multiple coating stages of sufficient thickness to fill and overfill the groove 903.
- the groove is coated upon first and second vertical walls with conductors that are connected in turn to the flat portions 906a and 906b of the substrate adjacent each vertical wall.
- the top of the capacitor material is further coated with a conductor 904.
- the total electrical interconnections are shown in the circuit diagram in Figure 9b.
- Conductors 906a, 906b and 904 are the conducting elements that make the relevant electrical connections to the groove and the flat portions of the structured substrate generating the compound capacitor indicated in the electrical circuit. Edge exposure through restriction of capacitor coating or edge profiling as shown in Figure 8 are omitted for clarity purposes.
- FIG. 10 shows an apparatus for undertaking the process according to a further embodiment of the invention generally at 1000.
- the apparatus 1000 is arranged to deposit a titanium dioxide dielectric layer precursor onto a substrate.
- a moving web 1004 is transported around a water-cooled drum 1002 that is itself charged either positively or preferably negatively with respect to earth by an AC or pulsed DC power source (not shown).
- the web 1004 is guided on and off the drum 1002 by guide rollers 1006. These 1006 rollers may be driven or idle.
- the web 1004 Whilst it is transported around the drum the web 1004 is alternatingly dosed with precursor metal organic Titanium(IV) isopropoxide, from one of a plurality of precursor inlet points 1008 then plasma reacted to form the coating layer (titanium dioxide) and cured polymer systems dependent upon the type of monomer or precursor used for example by that element station) by discrete plasma race track portions 1010.
- the race track is formed by a permanent magnet array (not shown) that can be either external to the drum or held entirely within the drum, such as the magnet arrays shown in Figures 2 or 3, or a combination of the two.
- the reactive gas such as 0 2 , N2O, NH3 etc.
- the reactive gas can be delivered into the chamber generically in which case the reaction primarily occurs within the plasma race track portions 1010, or where these interact with the surface of the web.
- the reactive gas can be delivered at the same position as the precursor is dosed 1008. In this case the reactive gas can either be controlled and dosed independently or mixed and dosed with the precursor material.
- Figure 10 also indicates a method for curing or processing a substrate using the apparatus, the method including the steps of, firstly, at step 1003, the substrate is transported underneath a first precursor inlet 1008, which applies precursor to the surface of the moving substrate 1004. Secondly, a generated plasma 1010 is directed onto the surface of the substrate 1004 such that the precursor on the surface of the substrate 1004 is reacted to form a first layer at 1010. The substrate 1004 is then transported under a second precursor inlet 1018 which applies a second dose of precursor. In this embodiment, the second dose deposits the same precursor as the first dose. In alternative embodiments the first dose deposits a precursor of a dielectric material and the second dose deposits a precursor of an electrically conductive material.
- the substrate is then transported into a second plasma racetrack zone such that the second layer of precursor is reacted to form a second layer on top of the first layer.
- the substrate may pass through additional element stations arranged to repeat the steps of dosing with precursor and plasma processing so that eventually a layer of required thickness (typically between 30 and 300 nm and more preferably between 100 and 300 nm) is built up.
- the magnet array is housed within the deposition roller as displayed in Figure 12, rather than outside as shown in Figure 1 1 , as this allows more space for the precursor deposition equipment around the drum and enables the shape and position of the race track portions to be more easily controlled.
- the discrete race track portions 1010 can be generated as a number of individual parallel racetracks on the deposition roller. Alternatively, they may be generated by a magnet array designed to produce a single racetrack which snakes around the drum with a number of discrete parallel or largely parallel ( ⁇ 5° off parallel) race track portions where the reaction of the precursor occurs.
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Abstract
Description
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GB2103274.3A GB2591378B (en) | 2018-09-28 | 2019-09-27 | Method of processing substrate for an energy storage device |
JP2021517043A JP2022502853A (en) | 2018-09-28 | 2019-09-27 | How to process a substrate for an energy storage device |
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GBGB1815842.8A GB201815842D0 (en) | 2018-09-28 | 2018-09-28 | Method of processing substrate for an energy storage device |
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US20040018307A1 (en) * | 2002-07-26 | 2004-01-29 | Park In-Sung | Methods of forming atomic layers of a material on a substrate by sequentially introducing precursors of the material |
US20120269988A1 (en) * | 2009-10-30 | 2012-10-25 | Sumitomo Chemical Company, Limited | Method of manufacture of multilayer film |
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DE3484793D1 (en) * | 1983-12-19 | 1991-08-14 | Spectrum Control Inc | MINIATURIZED MONOLITHIC MULTILAYER CAPACITOR AND DEVICE AND METHOD FOR PRODUCING THE SAME. |
JPH075310B2 (en) * | 1988-12-08 | 1995-01-25 | 松下電器産業株式会社 | Method for producing barium titanate thin film |
JPH11116124A (en) * | 1997-10-14 | 1999-04-27 | Minolta Co Ltd | Curl holding device and paper sheet accommodating device with it |
KR100716655B1 (en) * | 2006-06-29 | 2007-05-09 | 주식회사 하이닉스반도체 | Method for forming capacitor dielectric with zrconium oxide and tantalum oxide stack and method of manufacturing capacitor using the same |
US8722505B2 (en) * | 2010-11-02 | 2014-05-13 | National Semiconductor Corporation | Semiconductor capacitor with large area plates and a small footprint that is formed with shadow masks and only two lithography steps |
US9847326B2 (en) * | 2013-09-26 | 2017-12-19 | Infineon Technologies Ag | Electronic structure, a battery structure, and a method for manufacturing an electronic structure |
GB201617276D0 (en) * | 2016-10-11 | 2016-11-23 | Big Solar Limited | Energy storage |
GB2567029B (en) * | 2017-09-29 | 2020-08-05 | Camvac Ltd | Apparatus and method for processing, coating or curing a substrate |
GB2562128B (en) * | 2017-09-29 | 2020-08-05 | Camvac Ltd | Apparatus and Method for Processing, Coating or Curing a Substrate |
-
2018
- 2018-09-28 GB GBGB1815842.8A patent/GB201815842D0/en not_active Ceased
-
2019
- 2019-09-27 JP JP2021517043A patent/JP2022502853A/en active Pending
- 2019-09-27 WO PCT/GB2019/052730 patent/WO2020065334A1/en active Application Filing
- 2019-09-27 GB GB2103274.3A patent/GB2591378B/en active Active
Patent Citations (6)
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US5224441A (en) * | 1991-09-27 | 1993-07-06 | The Boc Group, Inc. | Apparatus for rapid plasma treatments and method |
US20040018307A1 (en) * | 2002-07-26 | 2004-01-29 | Park In-Sung | Methods of forming atomic layers of a material on a substrate by sequentially introducing precursors of the material |
US8592004B2 (en) * | 2009-09-11 | 2013-11-26 | Fujifilm Corporation | Film deposition method |
US20120269988A1 (en) * | 2009-10-30 | 2012-10-25 | Sumitomo Chemical Company, Limited | Method of manufacture of multilayer film |
US20150371834A1 (en) * | 2013-02-01 | 2015-12-24 | Camvac Limited | Apparatus and Methods for Defining a Plasma |
KR20150033858A (en) * | 2013-09-25 | 2015-04-02 | (주)화인솔루션 | Apparatus for Coating Flexible Sheet |
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GB2591378A (en) | 2021-07-28 |
GB201815842D0 (en) | 2018-11-14 |
JP2022502853A (en) | 2022-01-11 |
GB202103274D0 (en) | 2021-04-21 |
GB2591378B (en) | 2023-02-01 |
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