WO2020042341A1 - 一种校正方法、校正装置及显示装置 - Google Patents

一种校正方法、校正装置及显示装置 Download PDF

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Publication number
WO2020042341A1
WO2020042341A1 PCT/CN2018/113398 CN2018113398W WO2020042341A1 WO 2020042341 A1 WO2020042341 A1 WO 2020042341A1 CN 2018113398 W CN2018113398 W CN 2018113398W WO 2020042341 A1 WO2020042341 A1 WO 2020042341A1
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current
value
chip
preset threshold
preset
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PCT/CN2018/113398
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English (en)
French (fr)
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王明良
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重庆惠科金渝光电科技有限公司
惠科股份有限公司
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Priority to US16/313,755 priority Critical patent/US10837988B2/en
Publication of WO2020042341A1 publication Critical patent/WO2020042341A1/zh

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/575—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values

Definitions

  • the embodiments of the present application belong to the field of electronic technology, and in particular, to a calibration method, a calibration device, and a display device.
  • the traditional LCD display panel usually integrates a gate drive chip on the display panel.
  • This design method greatly limits the reduction of the display frame.
  • the existing display usually uses a doorless driver ( Gate driverless (GDL) architecture.
  • the GDL circuit divides the gate driver chip into a boost chip and a shift register chip, integrates the boost chip on the driver board, and integrates the shift register chip on the display panel.
  • the high-voltage logic signal is output to the shift register chip to complete the display driving, thereby further reducing the frame length. Due to uncontrollable factors in the production process, the display panel may work abnormally.
  • a protection mechanism is usually set on the boost chip and power management chip. When the current signal output by the boost chip is too large, the current output of the boost chip is turned off, or when the current signal output by the power management chip is too large, the current output of the power management chip is turned off.
  • the existing chip inside the panel usually uses the same current protection value, which may cause the panel with a smaller working current to fail to trigger the current limit protection and cause abnormal display or burned problem.
  • An object of the present application is to provide a calibration method, a calibration device, and a display device, including, but not limited to, solving the current conditions of each panel due to deviations in the panel manufacturing process.
  • the existing chip inside the panel usually adopts the same current protection. Value, it may cause a panel with a small working current to fail to trigger the current limiting protection and cause a technical problem such as abnormal display or burnout.
  • An embodiment of the present application provides a calibration method, including:
  • the A first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold;
  • the preset current conversion relationship includes:
  • the current value of the current signal output by the chip plus a preset value set by a user is set as the second preset threshold.
  • the preset current conversion relationship includes:
  • the preset current conversion relationship includes:
  • the second preset threshold corresponding to the current value of the current signal output by the chip is set in a current lookup table stored in advance.
  • the step of correcting the over-current set value of the chip to a second preset threshold corresponding to the current value according to a preset current conversion relationship includes:
  • the initial overcurrent setting value of the chip is not corrected.
  • the current value of the current signal output by the detection chip includes:
  • the current signal is converted into a digital signal to obtain a current value of the current signal.
  • the step of correcting the over-current set value of the chip to a second preset threshold corresponding to the current value according to a preset current conversion relationship further includes:
  • the maintaining the initial overcurrent setting value of the chip remains unchanged, further comprising:
  • Another object of the present application is to provide a calibration device, including:
  • a current detection module configured to detect a current value of a current signal output by the chip
  • a current comparison module configured to determine whether the current value is less than a first preset threshold
  • An overcurrent setting module is configured to correct the overcurrent setting value of the chip to a value corresponding to the current value of the current signal according to a preset current conversion relationship when the current value is less than a first preset threshold.
  • a second preset threshold the first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold;
  • a control module is configured to maintain the initial overcurrent set value of the chip unchanged when the current value is greater than or equal to the first preset threshold.
  • the overcurrent setting module includes:
  • a comparison unit configured to determine a threshold interval in which the current value is located when the current value is less than a first preset threshold
  • the correction unit is configured to obtain an overcurrent setting value corresponding to the threshold interval, and correct the overcurrent setting value of the chip to an overcurrent setting value corresponding to the threshold interval.
  • the current detection module is further configured to convert the current signal into a digital signal to obtain a current value of the current signal.
  • the overcurrent setting module is further configured to:
  • control module is further configured to:
  • Another object of the present application is to provide a display device, wherein the display device includes:
  • the driving circuit includes a boost chip for outputting a current signal.
  • the display panel is provided with a shift register, and the shift register is configured to receive a current output signal output from the boost chip to the display panel.
  • the correction device is connected to the driving circuit
  • the correction device includes:
  • a current detection module for detecting a current value of a current signal output by the chip
  • a current comparison module configured to determine whether the current value is less than a first preset threshold
  • An overcurrent setting module is configured to correct the overcurrent setting value of the chip to a value corresponding to the current value of the current signal according to a preset current conversion relationship when the current value is less than a first preset threshold.
  • a second preset threshold wherein the first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold;
  • a control module is configured to maintain the initial overcurrent set value of the chip unchanged when the current value is greater than or equal to the first preset threshold.
  • the calibration method, the calibration device and the display device provided in the embodiments of the present application detect a current value of a current signal output by the chip, and when the current value is less than a first preset threshold value, a conversion relationship is preset according to a preset current. Correcting the overcurrent setting value of the chip to a second preset threshold value corresponding to the current value of the current signal, wherein the first preset threshold value is an initial overcurrent setting value of the chip, so The second preset threshold value is not greater than the first preset threshold value, so that the overcurrent setting value in the chip can be modulated according to the current value of the current signal output by the chip, and the current signal output by the chip can be realized during overcurrent.
  • the purpose of timely shutdown is to solve the current conditions of each panel due to deviations in the manufacturing process of the panel.
  • the existing chip inside the panel usually uses the same current protection value, which may cause the panel with a smaller working current to fail to trigger the current limit. Protection caused display problems or burnout.
  • FIG. 1 is a schematic flowchart of a calibration method according to an embodiment of the present application
  • FIG. 2 is a schematic flowchart of a calibration method according to another embodiment of the present application.
  • FIG. 3 is a schematic flowchart of a calibration method according to another embodiment of the present application.
  • FIG. 5 is a schematic structural diagram of a correction device according to an embodiment of the present application.
  • FIG. 6 is a schematic structural diagram of a calibration apparatus according to another embodiment of the present application.
  • the gateless driver circuit consists of a gate driver IC (gate IC) divided into a boost chip (level shifter IC) and a shift register (shift register) chip, of which
  • the boost chip is integrated on the driver board, and the shift register chip is integrated on the display panel.
  • the boost chip outputs a clock signal to the shift register chip to complete the display drive, thereby further reducing the length of the bezel, so that the effective display area can be continuously increased.
  • an overcurrent protection mechanism is usually provided inside the chip.
  • a power management chip is used to convert a voltage input from a power supply into various types of voltage signals for output.
  • the voltage signals output by the power management chip include: the turn-on voltage signal VGH for turning on the thin film transistor (TFT), the turn-off voltage signal VGL for turning off the thin film transistor, etc.
  • TFT thin film transistor
  • VGL turn-off voltage signal
  • An overcurrent protection mechanism is set inside the power management signal.
  • the boost chip is used for boosting the input low-voltage logic signal and outputting the high-voltage logic signal.
  • an overvoltage is usually provided at the output of the boost chip. Protection mechanism, shut off the output signal in time when the output high-voltage logic signal is over-voltage.
  • FIG. 1 is a schematic flowchart of a calibration method according to an embodiment of the present application.
  • the correction method in this embodiment includes:
  • the current value of the current signal output by the chip is detected, and the detection process includes a collection and conversion process, that is, the collected current signal is converted to obtain a voltage value.
  • the first preset threshold value is an initial overcurrent setting value of the chip
  • the second preset threshold value is not greater than the first preset threshold value; if not, the initial overcurrent setting value of the chip is maintained. constant.
  • the correction method in this embodiment is used to correct an over-current set value of the chip. Specifically, a magnitude relationship between the detected current value and a first preset threshold is compared. The threshold can be set according to the user's needs. If the current value is less than the first preset threshold, the overcurrent set value of the chip is corrected to a second preset value corresponding to the current value according to a preset current conversion relationship. Set a threshold; the first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold.
  • the overcurrent setting value of the chip is corrected to the second preset threshold value corresponding to the current value according to the preset current conversion relationship.
  • the first A preset threshold is the initial overcurrent setting value of the chip. Due to manufacturing process deviations, the actual overcurrent value of the chip may be different, but the chip is set with a uniform initial overcurrent setting value when it leaves the factory. The current setting value is generally too large. Therefore, the second preset threshold value after correction is not greater than the first preset threshold value. When the current signal output by the chip is too small, the actual overcurrent value of the chip may be too small. The value is the over-current value where the chip output current is higher than this value which will cause damage.
  • the overcurrent setting value of the chip is corrected to a second preset threshold corresponding to the current value according to a preset current conversion relationship.
  • the preset current conversion relationship can be set according to user needs.
  • the preset current conversion relationship may be: adding a preset value of a current value of a current signal output by the chip as a second preset threshold value. For example, if the first preset threshold value is 100 mA, The current value of the current signal is 10 mA, and the preset value set by the user is 20 mA. According to the preset current conversion relationship, the second preset threshold is 30 mA.
  • the preset current conversion relationship may also be a linear relationship.
  • the second preset threshold value is 1.1 times the current value or 1.2 times.
  • the preset current conversion relationship may also be set as a preset algorithm for calculation according to user needs, or a pre-stored current look-up table may set a second preset threshold corresponding to the current value of the current signal output by the chip. .
  • the initial overcurrent setting value of the chip is maintained.
  • the initial overcurrent set value of the chip is maintained unchanged.
  • FIG. 2 is a schematic flowchart of a calibration method according to another embodiment of the present application.
  • the step of correcting the over-current set value of the chip to a second preset threshold corresponding to the current value according to a preset current conversion relationship includes:
  • the threshold interval in which the overcurrent value is located is determined.
  • the first preset threshold is 100 mA
  • every 10 mA interval is used as a threshold interval.
  • the interval contains 10 threshold intervals.
  • These 10 threshold intervals can correspond to 10 identical or different second preset thresholds, for example, 70mA to 80mA, 80mA to 90mA, and 90mA to 100mA.
  • the preset thresholds can be 100 mA
  • the second preset thresholds corresponding to 50 mA to 60 mA can be 80 mA, and so on.
  • the threshold range in which the current value is located is determined. For example, if it is detected that the current of the current signal is 55 mA, the over-current set value of the chip is corrected to 80 mA according to a second preset threshold value of 80 mA corresponding to 50 mA to 60 mA.
  • the threshold interval of the current value of the current signal is a preset safety threshold interval
  • the initial overcurrent setting value of the chip is not corrected.
  • the preset safety threshold interval is 60 mA to 100 mA.
  • the detected current signal is 70mA
  • the initial overcurrent setting value of the chip is not corrected.
  • the current value of the current signal output by the detection chip includes:
  • the current signal is converted into a digital signal to obtain a current value of the current signal.
  • detecting the current value of the current signal output by the chip may include a collection and conversion process.
  • the current value of the current signal is obtained by converting the current signal into a digital signal.
  • the magnitude relationship is compared with the first current threshold value stored in advance.
  • FIG. 3 is a schematic flowchart of a calibration method according to another embodiment of the present application.
  • correcting the over-current set value of the chip to a second preset threshold corresponding to the current value according to a preset current conversion relationship further includes:
  • FIG. 4 is a correspondence table between a pre-stored current value and an overcurrent setting value provided by an embodiment of the present application.
  • FIG. 4 is a preset current conversion relationship in this embodiment, that is, a current lookup table set by a user in advance. Specifically, the user presets the current values below the first preset threshold to correspond to each other.
  • Current setting value when the current value of the current signal output by the chip is detected, the overcurrent setting value corresponding to the current value is obtained according to the current value and the correspondence table between the current value of the current signal and the overcurrent setting value,
  • the correspondence table between the current value of the current signal and the overcurrent setting value may be stored in a storage medium, and the corresponding acquisition process may be reading the overcurrent setting value corresponding to the current value in the storage medium.
  • the obtained overcurrent setting value is set as the chip's overcurrent setting value, that is, the initial overcurrent setting value of the chip is corrected to The obtained overcurrent setting value corresponding to the current value.
  • the maintaining the initial overcurrent setting value of the chip remains unchanged, further comprising:
  • the control chip stops outputting the current signal if it is detected that the current value of the current signal is greater than the initial overcurrent set value.
  • FIG. 5 is a schematic structural diagram of a calibration apparatus according to an embodiment of the present application.
  • the correction apparatus in this embodiment includes:
  • the current detection module 20 is configured to detect the current value of the current signal output by the chip 10; the current comparison module 30 is configured to determine whether the current value is less than a first preset threshold;
  • the overcurrent setting module 40 is configured to correct the overcurrent setting value of the chip to correspond to the current value of the current signal according to a preset current conversion relationship when the current value is less than a first preset threshold.
  • a second preset threshold the first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold;
  • the control module 50 is configured to maintain the initial overcurrent set value of the chip unchanged when the current value is greater than or equal to the first preset threshold.
  • the correction device in this embodiment is used to correct the over-current set value of the chip.
  • the current detection module 20 detects the current value of the current signal output by the chip 10, and the detection process Including the acquisition and conversion process, that is, the collected current signal is converted to obtain a voltage value.
  • the current comparison module 30 compares the detected current value with the first preset threshold to determine whether the current value is smaller than the first preset threshold.
  • the over-current setting module 40 is configured to correct the over-current setting value of the chip to a second preset threshold value corresponding to the current value when the detected current value is less than the first preset threshold value, Specifically, the first preset threshold is the initial overcurrent setting value of the chip.
  • the actual overcurrent value of the chip may be different, but the chip is set with a uniform initial overcurrent setting value when it leaves the factory.
  • the initial overcurrent set value is generally too large. Therefore, the corrected second preset threshold is not greater than the first preset threshold.
  • the actual overcurrent value of the chip may be too small.
  • the actual overcurrent value is an overcurrent value that causes damage to the chip when the output current is higher than this value.
  • the overcurrent setting value of the chip is corrected to a second preset threshold corresponding to the current value according to a preset current conversion relationship.
  • the preset current conversion relationship can be set according to user needs.
  • the preset current conversion relationship may be: adding a preset value of a current value of a current signal output by the chip as a second preset threshold value. For example, if the first preset threshold value is 100 mA, The current value of the current signal is 10 mA, and the preset value set by the user is 20 mA. According to the preset current conversion relationship, the second preset threshold is 30 mA.
  • the preset current conversion relationship may also be a linear relationship.
  • the second preset threshold value is 1.1 times the current value or 1.2 times.
  • the preset current conversion relationship may also be set as a preset algorithm for calculation according to user needs, or a pre-stored current look-up table may set a second preset threshold corresponding to the current value of the current signal output by the chip. .
  • FIG. 6 is a schematic structural diagram of a calibration apparatus according to another embodiment of the present application.
  • the overcurrent setting module 40 includes:
  • a comparison unit 401 configured to determine a threshold interval in which the current value is located when the current value is less than a first preset threshold
  • the correction unit 402 is configured to obtain an overcurrent setting value corresponding to the threshold interval, and correct the overcurrent setting value of the chip to an overcurrent setting value corresponding to the threshold interval.
  • the comparison unit 401 determines a threshold interval in which the overcurrent value is located.
  • the first preset threshold is 100 mA
  • the interval is 10 mA.
  • a threshold interval interval there are 10 threshold intervals from 0 to 100 mA.
  • These 10 threshold intervals can correspond to 10 same or different second preset thresholds, for example, 70 mA to 80 mA, 80 mA to 90 mA, and 90 mA to 100 mA.
  • the corresponding second preset threshold can be 100 mA
  • the second preset threshold corresponding to 50 mA to 60 mA can be 80 mA, and so on.
  • the current value is determined. For example, if it is detected that the current of the current signal is 55 mA, according to a second preset threshold value of 80 mA corresponding to 50 mA to 60 mA, the correction unit 402 corrects the chip's overcurrent setting value to 80 mA.
  • the correction unit 402 is further configured to: when the threshold interval of the current value of the current signal output by the chip 10 is a preset safety threshold interval, the initial overcurrent set value of the chip is not corrected.
  • the threshold interval of the current value of the current signal is a preset safety threshold interval
  • the initial overcurrent setting value of the chip 10 is not corrected.
  • the preset safety threshold interval is 60 mA to 100 mA.
  • the detected current signal is 70mA
  • the initial overcurrent setting value of the chip is not corrected.
  • the current detection module 20 is further configured to convert the current signal into a digital signal to obtain a current value of the current signal.
  • detecting the current value of the current signal output by the chip 10 may include a collection and conversion process. When the current signal output by the chip is collected, the current value of the current signal is obtained by converting the current signal into a digital signal. The magnitude relationship is compared with a pre-stored first current threshold.
  • the overcurrent setting module 40 is further configured to:
  • FIG. 4 is a correspondence table between a pre-stored current value and an overcurrent setting value provided by an embodiment of the present application, that is, a current lookup table preset by a user. Specifically, the user sets the first preset threshold value below The current value is preset with a corresponding overcurrent setting value. When the current value of the current signal output by the chip is detected, the current value is obtained according to the correspondence table between the current value and the current value of the current signal and the overcurrent setting value. Corresponding overcurrent setting value, the correspondence table between the current value of the current signal and the overcurrent setting value may be stored in the storage medium, and the corresponding acquisition process may be reading the overcurrent corresponding to the current value in the storage medium Set value.
  • the obtained overcurrent setting value is set as the chip's overcurrent setting value, that is, the initial overcurrent setting value of the chip is corrected to The obtained overcurrent setting value corresponding to the current value.
  • control module 50 is further configured to: when the current value of the current signal is greater than or equal to the first preset threshold, control the chip to stop outputting the current signal.
  • the control chip stops outputting the current signal if it is detected that the current value of the current signal is greater than the initial overcurrent set value.
  • An embodiment of the present application further provides a display device, where the display device includes:
  • the driving circuit includes a boost chip for outputting a current signal.
  • the display panel is provided with a shift register, and the shift register is configured to receive a current output signal output from the boost chip to the display panel.
  • the correction device is connected to the driving circuit
  • the correction device includes:
  • the current detection module 20 is configured to detect the current value of the current signal output by the chip 10; the current comparison module 30 is configured to determine whether the current value is less than a first preset threshold;
  • the overcurrent setting module 40 is configured to correct the overcurrent setting value of the chip to correspond to the current value of the current signal according to a preset current conversion relationship when the current value is less than a first preset threshold.
  • a second preset threshold the first preset threshold is an initial overcurrent set value of the chip, and the second preset threshold is not greater than the first preset threshold;
  • the control module 50 is configured to maintain the initial overcurrent set value of the chip unchanged when the current value is greater than or equal to the first preset threshold.
  • the chip 10 is a boost chip.
  • the display device may be any type of display device provided with the above-mentioned correction device, such as a liquid crystal display device (Liquid Crystal Display, LCD), an organic electric laser display (Organic Electroluminesence Display, OLED) display device, a quantum dot Light-emitting diode (Quantum, Light, Emitting, Diodes, QLED) display devices or curved display devices.
  • a liquid crystal display device Liquid Crystal Display, LCD
  • OLED Organic Electroluminesence Display
  • QLED quantum dot Light-emitting diode
  • the display panel includes a pixel array composed of a plurality of rows of pixels and a plurality of columns of pixels.
  • the correction device in this embodiment is used to correct the over-current set value of the chip.
  • the current detection module 20 detects the current value of the current signal output by the chip 10, and the detection process Including the acquisition and conversion process, that is, the collected current signal is converted to obtain a voltage value.
  • the current comparison module 30 compares the detected current value with the first preset threshold to determine whether the current value is smaller than the first preset threshold.
  • the overcurrent setting module 40 is configured to correct the overcurrent setting value of the chip to a second preset threshold value corresponding to the current value when the detected current value is less than the first preset threshold value.
  • the first preset threshold is the initial overcurrent setting value of the chip.
  • the actual overcurrent value of the chip may be different, but the chip is set with a uniform initial overcurrent setting value when it leaves the factory.
  • the initial overcurrent set value is generally too large. Therefore, the corrected second preset threshold is not greater than the first preset threshold.
  • the actual overcurrent value of the chip may be too small.
  • the actual overcurrent value is an overcurrent value that causes damage to the chip when the output current is higher than this value.
  • the overcurrent setting value of the chip is corrected to a second preset threshold corresponding to the current value according to a preset current conversion relationship.
  • the preset current conversion relationship can be set according to user needs.
  • the preset current conversion relationship may be: adding a preset value of a current value of a current signal output by the chip as a second preset threshold value. For example, if the first preset threshold value is 100 mA, The current value of the current signal is 10 mA, and the preset value set by the user is 20 mA. According to the preset current conversion relationship, the second preset threshold is 30 mA.
  • the preset current conversion relationship may also be a linear relationship.
  • the second preset threshold value is 1.1 times the current value or 1.2 times.
  • the preset current conversion relationship may also be set as a preset algorithm for calculation according to user needs, or a pre-stored current look-up table may set a second preset threshold corresponding to the current value of the current signal output by the chip. .
  • FIG. 6 is a schematic structural diagram of a calibration apparatus according to another embodiment of the present application.
  • the overcurrent setting module 40 includes:
  • a comparison unit 401 configured to determine a threshold interval in which the current value is located when the current value is less than a first preset threshold
  • the correction unit 402 is configured to obtain an overcurrent setting value corresponding to the threshold interval, and correct the overcurrent setting value of the chip to an overcurrent setting value corresponding to the threshold interval.
  • the comparison unit 401 determines a threshold interval in which the overcurrent value is located.
  • the first preset threshold is 100 mA
  • the interval is 10 mA.
  • a threshold interval interval there are 10 threshold intervals from 0 to 100 mA.
  • These 10 threshold intervals can correspond to 10 same or different second preset thresholds, for example, 70 mA to 80 mA, 80 mA to 90 mA, and 90 mA to 100 mA.
  • the corresponding second preset threshold can be 100 mA
  • the second preset threshold corresponding to 50 mA to 60 mA can be 80 mA, and so on.
  • the current value is determined. For example, if it is detected that the current of the current signal is 55 mA, according to a second preset threshold value of 80 mA corresponding to 50 mA to 60 mA, the correction unit 402 corrects the chip's overcurrent setting value to 80 mA.
  • the correction unit 402 is further configured to: when the threshold interval of the current value of the current signal output by the chip 10 is a preset safety threshold interval, the initial overcurrent set value of the chip is not corrected.
  • the threshold interval of the current value of the current signal is a preset safety threshold interval
  • the initial overcurrent setting value of the chip 10 is not corrected.
  • the preset safety threshold interval is 60 mA to 100 mA.
  • the detected current signal is 70mA
  • the initial overcurrent setting value of the chip is not corrected.

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Abstract

一种校正方法、校正装置及显示装置，通过对芯片（10）输出的电流信号的电流值进行检测，在电流值小于芯片（10）的初始过流设定值时，对芯片（10）的过流设定值进行校正，使得芯片（10）内的过流设定值可以根据芯片（10）输出的电流信号的电流值进行调制，避免了工作电流较小的面板无法触发限流保护而造成显示异常或者烧毁的问题。

Description

一种校正方法、校正装置及显示装置 技术领域
本申请实施例属于电子技术领域，尤其涉及一种校正方法、校正装置及显示装置。
背景技术
传统的液晶显示面板通常将门驱动芯片集成在显示面板上，这种设计方式极大的限制了显示器边框的减小，为了能够减小显示器的边框，现有的显示器通常采用一种无门驱动器(Gate driver less，GDL)架构，GDL电路是将门驱动芯片拆分为升压芯片和移位寄存器芯片，将升压芯片集成在驱动板上，移位寄存器芯片集成在显示面板上，通过升压芯片输出高压逻辑信号给移位寄存器芯片以完成显示器驱动，从而进一步压缩边框长度。由于生产工艺中的不可控因素可能会造成显示器面板的工作异常，为了避免升压芯片和电源管理芯片的输出电流过大而烧毁显示面板，通常对升压芯片和电源管理芯片设置保护机制，以使得升压芯片输出的电流信号过大时关闭升压芯片的电流输出，或者在电源管理芯片输出的电流信号过大时关闭电源管理芯片的电流输出。
由于面板制造工艺中的偏差，每片面板的电流状况不同，现有的面板内部芯片通常采用相同的电流保护值，可能导致工作电流较小的面板无法触发限流保护而造成显示异常或者烧毁的问题。
申请内容
本申请一目的在于提供一种校正方法、校正装置及显示装置，包括但不限于解决由于面板制造工艺中的偏差，每片面板的电流状况不同，现有的面板内部芯片通常采用相同的电流保护值，可能导致工作电流较小的面板无法触发限流保护而造成显示异常或者烧毁的技术问题。
为了解决上述技术问题，本申请实施例采用的技术方案是：
本申请实施例提供了一种校正方法，包括：
检测所述芯片输出的电流信号的电流值；
判断所述电流值是否小于第一预设阈值,若是，则根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值；所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
若否，则维持所述芯片的初始过流设定值不变。
在一个实施例中，所述预设的电流转换关系包括：
将所述芯片输出的电流信号的电流值加上用户设置的预设值设置为所述第二预设阈值。
在一个实施例中，所述预设的电流转换关系包括：
将所述芯片输出的电流信号的电流值的1.1倍设置为所述第二预设阈值。
在一个实施例中，所述预设的电流转换关系包括：
在预先存储的电流查找表中设置与所述芯片输出的电流信号的电流值对应的所述第二预设阈值。
在一个实施例中，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值，包括：
确定所述电流值所处的阈值区间；
获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
在一个实施例中，若所述电流值所处的阈值区间为预设的安全阈值区间，则不对所述芯片的初始过流设定值进行校正。
在一个实施例中，所述检测芯片输出的电流信号的电流值，包括：
将所述电流信号转换为数字信号，得到所述电流信号的电流值。
在一个实施例中，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值，还包括：
查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值；
将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
在一个实施例中，所述维持所述芯片的初始过流设定值不变，还包括：
控制所述芯片停止输出所述电流信号。
本申请的另一目的在于提供一种校正装置，包括：
电流侦测模块，用于检测所述芯片输出的电流信号的电流值；
电流比较模块，用于判断所述电流值是否小于第一预设阈值；
过流设定模块，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
控制模块，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
在一个实施例中，所述过流设定模块包括：
比较单元，用于在所述电流值小于第一预设阈值时，确定所述电流值所处的阈值区间；
校正单元，用于获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值 校正为与所述阈值区间对应的过流设定值。
在一个实施例中，所述电流侦测模块还用于：将所述电流信号转换为数字信号，得到所述电流信号的电流值。
在一个实施例中，所述过流设定模块还用于：
在所述电流值小于第一预设阈值时，查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值，并将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
在一个实施例中，所述控制模块还用于：
在所述电流信号的电流值大于或等于所述第一预设阈值时，则控制所述芯片停止输出所述电流信号。
本申请的再一目的在于提供一种显示装置，其中，所述显示装置包括：
显示面板；
驱动电路；以及
校正装置；
所述驱动驱动电路包括用于输出电流信号的升压芯片，所述显示面板上设有移位寄存器，所述移位寄存器设置为接收所述升压芯片输出的电流输出信号对所述显示面板进行驱动；
所述校正装置与所述驱动电路连接；
所述校正装置包括：
电流侦测模块，用于检测芯片输出的电流信号的电流值；
电流比较模块，用于判断所述电流值是否小于第一预设阈值；
过流设定模块，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，其中，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
控制模块，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
本申请实施例提供的校正方法、校正装置及显示装置，通过对所述芯片输出的电流信号的电流值进行检测，在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，其中，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值，使得芯片内的过流设定值可以根据芯片输出的电流信号的电流值进行调制，实现了芯片输 出的电流信号在过流时能够及时关断的目的，解决了由于面板制造工艺中的偏差，每片面板的电流状况不同，现有的面板内部芯片通常采用相同的电流保护值，可能导致工作电流较小的面板无法触发限流保护而造成显示异常或者烧毁的问题。
附图说明
为了更清楚地说明本申请实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本申请的一个实施例提供的校正方法的流程示意图；
图2为本申请的另一个实施例提供的校正方法的流程示意图；
图3为本申请的另一个实施例提供的校正方法的流程示意图；
图4为本申请中的一个实施例提供的预先存储的电流值与过流设定值的对应关系表；
图5为本申请的一个实施例提供的校正装置的结构示意图；
图6为本申请的另一个实施例提供的校正装置的结构示意图。
本申请的实施方式
为了使本技术领域的人员更好地理解本申请方案，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚地描述，显然，所描述的实施例是本申请一部分的实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本申请保护的范围。
本申请的说明书和权利要求书及上述附图中的术语“包括”以及它们任何变形，意图在于覆盖不排他的包含。例如包含一系列步骤或单元的过程、方法或系统、产品或设备没有限定于已列出的步骤或单元，而是可选地还包括没有列出的步骤或单元，或可选地还包括对于这些过程、方法、产品或设备固有的其它步骤或单元。此外，术语“第一”、“第二”和“第三”等是用于区别不同对象，而非用于描述特定顺序。
在无门驱动器(Gate driver less，GDL)架构中，无门驱动器电路是将门驱动芯片(gate IC)拆分为升压芯片(level shifter IC)和移位寄存器(shift register)芯片两部分，其中，升压芯片集成在驱动板上，移位寄存器芯片集成在显示面板上，通过升压芯片输出时钟信号给移位寄存器芯片以完成显示器驱动，从而进一步压缩边框长度，使得有效显示区能够不断增加。为了保护避免芯片因为输出信号过流而烧毁，芯片内部通常均设置有过流保护机制，例如，电源管理芯片用于将电源输入的电压转换为各种类型的电压信号进行输出，在显示装置中，电源管理芯片输出的电压信号包括：用于导通薄膜晶体管(Thin Film Transistor，TFT)的开启电压信号VGH、用于关断薄膜晶体管的关断电压信号VGL等， 为了避免烧毁显示面板，通常电源管理信号内部设置有过流保护机制。升压芯片用于对输入的低压逻辑信号进行升压处理，并输出高压逻辑信号，为了避免升压处理产生的高压逻辑信号的电压值过高，通常在升压芯片的输出端设置有过压保护机制，在输出的高压逻辑信号过压时及时关断输出信号。
图1为本申请的一个实施例提供的校正方法的流程示意图。
如图1所示，本实施例中的校正方法包括：
检测所述芯片输出的电流信号的电流值。
在一个实施例中，对芯片输出的电流信号的电流值进行检测，该检测过程包括采集和转换过程，即将采集的电流信号进行转换得到电压值。
判断所述电流值是否小于第一预设阈值,若是，则则根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值；所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；若否，则维持所述芯片的初始过流设定值不变。
在一个实施例中，本实施例中的校正方法用于对芯片的过流设定值进行校正，具体的，将检测得到的电流值与第一预设阈值进行大小关系比较，该第一预设阈值可以根据用户需要进行设置，若该电流值小于第一预设阈值，则根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值；所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值。
在一个实施例中，检测得到电流值小于第一预设阈值，则根据预设的电流转换关系将芯片的过流设定值校正为该电流值对应的第二预设阈值，具体的，第一预设阈值为芯片的初始过流设定值，由于制造工艺的偏差，芯片的实际过流值可能各不相同，但是出厂时芯片各设置了统一的初始过流设定值，该初始过流设定值一般偏大，因此，校正后的第二预设阈值不大于第一预设阈值，当芯片输出的电流信号偏小时，可能芯片的实际过流值也偏小，该实际过流值为芯片输出电流高于该值就导致损坏的过流值。
在一个实施例中，芯片输出的电流信号的电流值小于第一预设阈值，则根据预设的电流转换关系将芯片的过流设定值校正为与该电流值对应的第二预设阈值，具体的，该预设的电流转换关系可以根据用户需要设置。
在一个实施例中，该预设的电流转换关系可以为：将芯片输出的电流信号的电流值加上预设值作为第二预设阈值，例如，若第一预设阈值为100mA，检测到的电流信号的电流值为10mA，用户设置的预设值为20mA，则根据该预设的电流转换关系，第二预设阈值为30mA。
在一个实施例中，该预设的电流转换关系还可以为某种线性关系，例如，电流信号的电流值低于第一预设阈值时，第二预设阈值为该电流值的1.1倍或者1.2倍。
在一个实施例中，该预设的电流转换关系还可以根据用户需要设置成预设的算法进行计算，或者预先存储的电流查找表设置芯片输出的电流信号的电流值对应的第二预设阈值。
若该电流值大于或者等于第一预设阈值，则维持所述芯片的初始过流设定值不变。
在一个实施例中，若芯片输出的电流信号的电流值大于或者等于第一预设阈值，则维持芯片的初始过流设定值不变。
图2为本申请的另一个实施例提供的校正方法的流程示意图。
如图2所示，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值，包括：
确定所述电流值所处的阈值区间；
获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
在一个实施例中，芯片输出的电流信号的电流值小于第一预设阈值时，确定该过流值所处的阈值区间，例如，第一预设阈值为100mA，每间隔10mA作为一个阈值间隔区间，从0到100mA包含10个阈值区间，这10个阈值区间可以对应10个相同的或者不同的第二预设阈值，例如，70mA至80mA，80mA至90mA，90mA至100mA所对应的第二预设阈值均可以为100mA，50mA至60mA所对应的第二预设阈值可以为80mA，依次类推，当检测到电流信号的电流小于第一预设阈值时，判断该电流值所处的阈值区间，例如，若检测到电流信号的电流为55mA时，则根据50mA至60mA所对应的第二预设阈值为80mA，将芯片的过流设定值校正为80mA。
在一个实施例中，若电流信号的电流值所处的阈值区间为预设安全阈值区间，则不对芯片的初始过流设定值进行校正，例如，该预设的安全阈值区间为60mA至100mA，则检测到的电流信号为70mA时，则不对芯片的初始过流设定值进行校正。
在一个实施例中，所述检测芯片输出的电流信号的电流值，包括：
将所述电流信号转换为数字信号，得到所述电流信号的电流值。
在一个实施例中，检测芯片输出的电流信号的电流值可以包括采集和转换过程，当采集到芯片输出的电流信号时，通过将该电流信号转换为数字信号得到该电流信号的电流值，以与预先存储的第一电流阈值进行大小关系的比较。
图3为本申请的另一个实施例提供的校正方法的流程示意图。
如图3所示，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电 流值对应的第二预设阈值，还包括：
查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值；
图4为本申请中的一个实施例提供的预先存储的电流值与过流设定值的对应关系表。
在本实施中，图4为本实施例中的预设的电流转换关系，即为用户预先设置的电流查找表，具体的，用户将第一预设阈值一下的电流值均预先设置对应的过流设定值，在检测到芯片输出的电流信号的电流值时，根据该电流值和电流信号的电流值与过流设定值的对应关系表获取与电流值对应的过流设定值，该电流信号的电流值与过流设定值的对应关系表可以存储于存储介质中，对应的获取过程可以为读取该存储介质中与电流值对应的过流设定值。
将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
在一个实施例中，获取到与电流值对应的过流设定值后，将该获取的过流设定值设置为芯片的过流设定值，即将芯片的初始过流设定值校正为获取到的与电流值对应的过流设定值。
在一个实施例中，所述维持所述芯片的初始过流设定值不变，还包括：
控制所述芯片停止输出所述电流信号。
在一个实施例中，若检测到电流信号的电流值大于初始过流设定值，则控制芯片停止输出电流信号。
图5为本申请的一个实施例提供的校正装置的结构示意图。
如图5所示，本实施例中的校正装置包括：
电流侦测模块20，用于检测芯片10输出的电流信号的电流值；电流比较模块30，用于判断电流值是否小于第一预设阈值；
过流设定模块40，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
控制模块50，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
在一个实施例中，本实施例中的校正装置用于对芯片的过流设定值进行校正，具体的，电流侦测模块20对芯片10输出的电流信号的电流值进行检测，该检测过程包括采集和转换过程，即将采集的电流信号进行转换得到电压值。电流比较模块30将检测得到的电流值与第一预设阈值进行大小关系比较，判断电流值是否小于第一预设阈值。过流设定模块40 用于在检测得到电流值小于第一预设阈值时，则根据预设的电流转换关系将芯片的过流设定值校正为该电流值对应的第二预设阈值，具体的，第一预设阈值为芯片的初始过流设定值，由于制造工艺的偏差，芯片的实际过流值可能各不相同，但是出厂时芯片各设置了统一的初始过流设定值，该初始过流设定值一般偏大，因此，校正后的第二预设阈值不大于第一预设阈值，当芯片输出的电流信号偏小时，可能芯片的实际过流值也偏小，该实际过流值为芯片输出电流高于该值就导致损坏的过流值。
在一个实施例中，芯片输出的电流信号的电流值小于第一预设阈值，则根据预设的电流转换关系将芯片的过流设定值校正为与该电流值对应的第二预设阈值，具体的，该预设的电流转换关系可以根据用户需要设置。
在一个实施例中，该预设的电流转换关系可以为：将芯片输出的电流信号的电流值加上预设值作为第二预设阈值，例如，若第一预设阈值为100mA，检测到的电流信号的电流值为10mA，用户设置的预设值为20mA，则根据该预设的电流转换关系，第二预设阈值为30mA。
在一个实施例中，该预设的电流转换关系还可以为某种线性关系，例如，电流信号的电流值低于第一预设阈值时，第二预设阈值为该电流值的1.1倍或者1.2倍。
在一个实施例中，该预设的电流转换关系还可以根据用户需要设置成预设的算法进行计算，或者预先存储的电流查找表设置芯片输出的电流信号的电流值对应的第二预设阈值。
图6为本申请的另一个实施例提供的校正装置的结构示意图。
如图6所示，过流设定模块40包括：
比较单元401，用于在所述电流值小于第一预设阈值时，确定所述电流值所处的阈值区间；
校正单元402，用于获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
在一个实施例中，芯片10输出的电流信号的电流值小于第一预设阈值时，比较单元401确定该过流值所处的阈值区间，例如，第一预设阈值为100mA，每间隔10mA作为一个阈值间隔区间，从0到100mA包含10个阈值区间，这10个阈值区间可以对应10个相同的或者不同的第二预设阈值，例如，70mA至80mA，80mA至90mA，90mA至100mA所对应的第二预设阈值均可以为100mA，50mA至60mA所对应的第二预设阈值可以为80mA，依次类推，当检测到电流信号的电流小于第一预设阈值时，判断该电流值所处的阈值区间，例如，若检测到电流信号的电流为55mA时，则根据50mA至60mA所对应的第二预设阈值为80mA，校正单元402将芯片的过流设定值校正为80mA。
在一个实施例中，校正单元402还用于，当芯片10输出的电流信号的电流值所处的阈值区间为预设的安全阈值区间时，则不对芯片的初始过流设定值进行校正。
在一个实施例中，若电流信号的电流值所处的阈值区间为预设安全阈值区间，则不对芯片10的初始过流设定值进行校正，例如，该预设安全阈值区间为60mA至100mA，则检测到的电流信号为70mA时，则不对芯片的初始过流设定值进行校正。
在一个实施例中，所述电流侦测模块20还用于：将所述电流信号转换为数字信号，得到所述电流信号的电流值。
在一个实施例中，检测芯片10输出的电流信号的电流值可以包括采集和转换过程，当采集到芯片输出的电流信号时，通过将该电流信号转换为数字信号得到该电流信号的电流值，以与预先存储的第一电流阈值进行大小关系的比较。
在一个实施例中，所述过流设定模块40还用于：
在所述电流值小于第一预设阈值时，查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值，并将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
图4为本申请中的一个实施例提供的预先存储的电流值与过流设定值的对应关系表，即为用户预先设置的电流查找表，具体的，用户将第一预设阈值一下的电流值均预先设置对应的过流设定值，在检测到芯片输出的电流信号的电流值时，根据该电流值和电流信号的电流值与过流设定值的对应关系表获取与电流值对应的过流设定值，该电流信号的电流值与过流设定值的对应关系表可以存储于存储介质中，对应的获取过程可以为读取该存储介质中与电流值对应的过流设定值。
在一个实施例中，获取到与电流值对应的过流设定值后，将该获取的过流设定值设置为芯片的过流设定值，即将芯片的初始过流设定值校正为获取到的与电流值对应的过流设定值。
在一个实施例中，所述控制模块50还用于：在所述电流信号的电流值大于或等于所述第一预设阈值时，则控制所述芯片停止输出所述电流信号。
在一个实施例中，若检测到电流信号的电流值大于初始过流设定值，则控制芯片停止输出电流信号。
本申请的一个实施例还提出了一种显示装置，其中，所述显示装置包括：
显示面板；
驱动电路；以及
校正装置；
所述驱动驱动电路包括用于输出电流信号的升压芯片，所述显示面板上设有移位寄存器，所述移位寄存器设置为接收所述升压芯片输出的电流输出信号对所述显示面板进行驱动；
所述校正装置与所述驱动电路连接；
所述校正装置包括：
电流侦测模块20，用于检测芯片10输出的电流信号的电流值；电流比较模块30，用于判断电流值是否小于第一预设阈值；
过流设定模块40，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
控制模块50，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
在一个实施例中，芯片10为升压芯片。
在一个实施例中，显示装置可以为设置有上述校正装置的任意类型的显示装置，例如液晶显示装置(Liquid Crystal Display，LCD)、有机电激光显示(Organic Electroluminesence Display，OLED)显示装置、量子点发光二极管(Quantum Dot Light Emitting Diodes，QLED)显示装置或曲面显示装置等。
在一个实施例中，显示面板包括由多行像素和多列像素组成的像素阵列。
在一个实施例中，本实施例中的校正装置用于对芯片的过流设定值进行校正，具体的，电流侦测模块20对芯片10输出的电流信号的电流值进行检测，该检测过程包括采集和转换过程，即将采集的电流信号进行转换得到电压值。电流比较模块30将检测得到的电流值与第一预设阈值进行大小关系比较，判断电流值是否小于第一预设阈值。过流设定模块40用于在检测得到电流值小于第一预设阈值时，则根据预设的电流转换关系将芯片的过流设定值校正为该电流值对应的第二预设阈值，具体的，第一预设阈值为芯片的初始过流设定值，由于制造工艺的偏差，芯片的实际过流值可能各不相同，但是出厂时芯片各设置了统一的初始过流设定值，该初始过流设定值一般偏大，因此，校正后的第二预设阈值不大于第一预设阈值，当芯片输出的电流信号偏小时，可能芯片的实际过流值也偏小，该实际过流值为芯片输出电流高于该值就导致损坏的过流值。
在一个实施例中，芯片输出的电流信号的电流值小于第一预设阈值，则根据预设的电流转换关系将芯片的过流设定值校正为与该电流值对应的第二预设阈值，具体的，该预设的电流转换关系可以根据用户需要设置。
在一个实施例中，该预设的电流转换关系可以为：将芯片输出的电流信号的电流值加上预设值作为第二预设阈值，例如，若第一预设阈值为100mA，检测到的电流信号的电流值为10mA，用户设置的预设值为20mA，则根据该预设的电流转换关系，第二预设阈值为30mA。
在一个实施例中，该预设的电流转换关系还可以为某种线性关系，例如，电流信号的电流值低于第一预设阈值时，第二预设阈值为该电流值的1.1倍或者1.2倍。
在一个实施例中，该预设的电流转换关系还可以根据用户需要设置成预设的算法进行计算，或者预先存储的电流查找表设置芯片输出的电流信号的电流值对应的第二预设阈值。
图6为本申请的另一个实施例提供的校正装置的结构示意图。
如图6所示，过流设定模块40包括：
比较单元401，用于在所述电流值小于第一预设阈值时，确定所述电流值所处的阈值区间；
校正单元402，用于获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
在一个实施例中，芯片10输出的电流信号的电流值小于第一预设阈值时，比较单元401确定该过流值所处的阈值区间，例如，第一预设阈值为100mA，每间隔10mA作为一个阈值间隔区间，从0到100mA包含10个阈值区间，这10个阈值区间可以对应10个相同的或者不同的第二预设阈值，例如，70mA至80mA，80mA至90mA，90mA至100mA所对应的第二预设阈值均可以为100mA，50mA至60mA所对应的第二预设阈值可以为80mA，依次类推，当检测到电流信号的电流小于第一预设阈值时，判断该电流值所处的阈值区间，例如，若检测到电流信号的电流为55mA时，则根据50mA至60mA所对应的第二预设阈值为80mA，校正单元402将芯片的过流设定值校正为80mA。
在一个实施例中，校正单元402还用于，当芯片10输出的电流信号的电流值所处的阈值区间为预设的安全阈值区间时，则不对芯片的初始过流设定值进行校正。
在一个实施例中，若电流信号的电流值所处的阈值区间为预设安全阈值区间，则不对芯片10的初始过流设定值进行校正，例如，该预设安全阈值区间为60mA至100mA，则检测到的电流信号为70mA时，则不对芯片的初始过流设定值进行校正。
以上所述仅为本申请的可选实施例而已，并不用以限制本申请，凡在本申请的精神和原则之内所作的任何修改、等同替换和改进等，均应包含在本申请的保护范围之内。

Claims (20)

  1. 一种校正方法，包括：
    检测芯片输出的电流信号的电流值；
    判断所述电流值是否小于第一预设阈值；
    若是，则根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值；所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
    若否，则维持所述芯片的初始过流设定值不变。
  2. 如权利要求1所述的校正方法，所述预设的电流转换关系包括：
    将所述芯片输出的电流信号的电流值加上用户设置的预设值设置为所述第二预设阈值。
  3. 如权利要求1所述的校正方法，所述预设的电流转换关系包括：
    将所述芯片输出的电流信号的电流值的1.1倍设置为所述第二预设阈值。
  4. 如权利要求1所述的校正方法，所述预设的电流转换关系包括：
    在预先存储的电流查找表中设置与所述芯片输出的电流信号的电流值对应的所述第二预设阈值。
  5. 如权利要求1所述的校正方法，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值，包括：
    确定所述电流值所处的阈值区间；
    获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
  6. 如权利要求5所述的校正方法，若所述电流值所处的阈值区间为预设的安全阈值区间，则不对所述芯片的初始过流设定值进行校正。
  7. 如权利要求1所述的校正方法，所述检测芯片输出的电流信号的电流值，包括：
    将所述电流信号转换为数字信号，得到所述电流信号的电流值。
  8. 如权利要求1所述的校正方法，所述根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流值对应的第二预设阈值，还包括：
    查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值；
    将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
  9. 如权利要求1所述的校正方法，所述维持所述芯片的初始过流设定值不变，还包括：
    控制所述芯片停止输出所述电流信号。
  10. 一种校正装置，包括：
    电流侦测模块，用于检测芯片输出的电流信号的电流值；
    电流比较模块，用于判断所述电流值是否小于第一预设阈值；
    过流设定模块，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，其中，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
    控制模块，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
  11. 如权利要求10所述的校正装置，所述预设的电流转换关系包括：
    将所述芯片输出的电流信号的电流值加上用户设置的预设值设置为所述第二预设阈值。
  12. 如权利要求10所述的校正装置，所述预设的电流转换关系包括：
    将所述芯片输出的电流信号的电流值的1.1倍设置为所述第二预设阈值。
  13. 如权利要求10所述的校正装置，所述预设的电流转换关系包括：
    在预先存储的电流查找表中设置与所述芯片输出的电流信号的电流值对应的所述第二预设阈值。
  14. 如权利要求10所述的校正装置，所述过流设定模块包括：
    比较单元，用于在所述电流值小于第一预设阈值时，确定所述电流值所处的阈值区间；
    校正单元，用于获取与所述阈值区间对应的过流设定值，并将所述芯片的过流设定值校正为与所述阈值区间对应的过流设定值。
  15. 如权利要求14所述的校正装置，所述校正单元还用于，当所述电流值所处的阈值区间为预设的安全阈值区间时，则不对所述芯片的初始过流设定值进行校正。
  16. 如权利要求10所述的校正装置，所述电流侦测模块还用于：将所述电流信号转换为数字信号，得到所述电流信号的电流值。
  17. 如权利要求10所述的校正装置，所述过流设定模块还用于：
    在所述电流值小于第一预设阈值时，查找预先存储的电流值与过流设定值的对应关系表，获取与所述电流信号的电流值对应的过流设定值，并将所述芯片的过流设定值校正为与所述电流信号的电流值对应的过流设定值。
  18. 如权利要求10所述的校正装置，所述控制模块还用于：
    在所述电流信号的电流值大于或等于所述第一预设阈值时，则控制所述芯片停止输出 所述电流信号。
  19. 如权利要求10所述的校正装置，所述控制模块还用于：
    在所述电流信号的电流值大于或等于所述初始过流设定值时，则控制所述芯片停止输出所述电流信号。
  20. 一种显示装置，其中，所述显示装置包括：
    显示面板；
    驱动电路；以及
    校正装置；
    所述驱动驱动电路包括用于输出电流信号的升压芯片，所述显示面板上设有移位寄存器，所述移位寄存器设置为接收所述升压芯片输出的电流输出信号对所述显示面板进行驱动；
    所述校正装置与所述驱动电路连接；
    所述校正装置包括：
    电流侦测模块，用于检测芯片输出的电流信号的电流值；
    电流比较模块，用于判断所述电流值是否小于第一预设阈值；
    过流设定模块，用于在所述电流值小于第一预设阈值时，根据预设的电流转换关系将所述芯片的过流设定值校正为与所述电流信号的电流值对应的第二预设阈值，其中，所述第一预设阈值为所述芯片的初始过流设定值，所述第二预设阈值不大于所述第一预设阈值；
    控制模块，用于在所述电流值大于或等于所述第一预设阈值时，维持所述芯片的初始过流设定值不变。
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