WO2019206064A1 - Welding piece, packaging assembly and electronic device - Google Patents
Welding piece, packaging assembly and electronic device Download PDFInfo
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- WO2019206064A1 WO2019206064A1 PCT/CN2019/083627 CN2019083627W WO2019206064A1 WO 2019206064 A1 WO2019206064 A1 WO 2019206064A1 CN 2019083627 W CN2019083627 W CN 2019083627W WO 2019206064 A1 WO2019206064 A1 WO 2019206064A1
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- solder layer
- support
- support body
- soldering
- soldering member
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/03—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- the present disclosure relates to the field of welding technology, and in particular, to a welding member, a package assembly, and an electronic device.
- system-in-package System In a The Package, SIP
- SIP System In a The Package
- a chip is soldered to a substrate by a solder ball to form a package assembly.
- the solder ball, the chip, and the substrate are expanded and squeezed at the high temperature of the reflow soldering to generate stress, and the generated stress cannot be absorbed, which may cause cracking of the interface of the material after cooling and shrinkage. . Since the solder ball is still in a molten state at this time, it penetrates along the gap, eventually causing a short circuit between the solder balls, affecting the normal use of the electronic device.
- the system-level packaging scheme of the related art has the technical problem that the extrusion stress cannot be absorbed, the interface of the material in the package component is cracked, the solder ball is infiltrated, and the internal short circuit of the package component is caused.
- Embodiments of the present disclosure provide a soldering member, a package assembly, and an electronic device to solve the technical problem that the electronic device of the related art has a system-level packaging scheme that causes an internal short circuit of the package component due to the inability to absorb the pressing stress.
- an embodiment of the present disclosure provides a welded component, including:
- a support body wherein the support body is a void structure
- solder layer disposed on an outer surface of the support, the solder layer having a melting point smaller than a melting point of the support.
- an embodiment of the present disclosure provides a package assembly comprising: a substrate, a chip, and at least one soldering member, the soldering member being the soldering member according to any one of the first aspects, each soldering member being disposed Between the substrate and the chip, the substrate and the chip are both soldered to a solder layer of the soldering member, and the substrate and the chip are electrically connected through the solder layer.
- an embodiment of the present disclosure provides an electronic device, comprising the package assembly of any of the second aspects.
- the solder layer of the soldering member is disposed on the outer surface layer of the support body, and the support body has a void structure having a melting point larger than that of the solder layer.
- the support body absorbs the deformation stress of the solder layer through the internal void under the deformation pressure of the solder layer.
- the weldable member capable of absorbing deformation stress is applied to the package assembly, and the support body of the weldment member can absorb the deformation stress of the solder layer by compressive deformation, thereby avoiding cracking of the material interface in the package assembly, thereby causing the package assembly.
- the shortcoming of internal short circuit enhances the reliability of electronic equipment.
- FIG. 1 is a schematic structural view of a welded member according to an embodiment of the present disclosure
- FIG. 2 is a schematic structural view of another welding member according to an embodiment of the present disclosure.
- FIG. 3 is a schematic structural view of another welding member according to an embodiment of the present disclosure.
- FIG. 4 is a schematic structural diagram of a package assembly according to an embodiment of the present disclosure.
- FIG. 5 is a schematic structural diagram of a welded part of a package assembly according to an embodiment of the present disclosure
- FIG. 6 is a schematic structural view of another welding member according to an embodiment of the present disclosure.
- FIG. 1 is a schematic structural diagram of a soldering member according to an embodiment of the present disclosure.
- a weldment 100 includes:
- the support body 110 is a void structure
- solder layer 120 disposed on an outer surface of the support 110, the solder layer 120 having a melting point smaller than a melting point of the support 110.
- the soldering piece 100 provided in this embodiment includes a support body 110 and a solder layer 120.
- the solder layer 120 is disposed on the outer surface of the support body 110 for achieving the basic soldering function of the soldering member 100.
- the soldering member 100 can be disposed within the package assembly 200 for connecting components within the package assembly 200.
- the components to be connected are connected to the solder layer 120 of the soldering member 100, and electrical connections can be made between the components through the solder layer 120.
- the solder layer 120 can be implemented in a variety of ways to achieve a soldering function.
- the solder layer 120 may be wrapped around the entire outer surface of the support 110 such that the components in contact with the outer surface of the support 110 may be soldered through the solder layer 120, and Electrical connections are made between these elements by solder layer 120.
- the solder layer 120 may also only wrap a portion of the outer surface of the support 110.
- the solder layer 120 may also be an integrally connected solder tab distributed on the outer surface of the support body 110, so that components that are in contact with the solder tabs on the outer surface of the support body 110 can be soldered through the solder tab. And the electrical connection of the part of the components can also be achieved by the integrally connected solder tabs.
- the solder layer 120 may be partially disposed on the outer surface of the support 110.
- the solder layer 120 may also be a separate solder tab distributed on the outer surface of the support 110.
- the mutually separated soldering pieces may be electrically connected by wires (not shown) or by a support body 110 having a conductive function.
- the components in contact with the portion of the solder tab can be soldered by the solder tab, and the portions are electrically connected by the separate solder tab.
- Other solutions that can achieve the soldering function of the solder layer 120 can be applied to the embodiment, and are not limited.
- the support body 110 is a support member of the weldment 100, and the support body 110 is provided with a gap therein. Thus, when the solder layer 120 is melted to deform, the support 110 can absorb the deformation pressure generated by the deformation stress of the solder layer 120.
- the support body 110 serves as a support member and has an attribute of absorbing stress.
- a gap is formed in the support body 110, and the compression stress can be absorbed by the internal cavity to absorb the compressive stress, and the void can also be filled with the molten solder to form a compressed state, thereby absorbing the external deformation stress.
- the support body 110 can also be a compressible elastic member such as a cavity housing or a foam sphere. In view of the fact that the support 110 needs to achieve a supporting and stress absorbing function when the solder layer 120 is melted, the melting point of the solder layer 120 is set to be smaller than the melting point of the support 110.
- the difference between the melting point of the solder layer 120 and the melting point of the support 110 may be greater than 10 degrees Celsius, for example, the difference in melting point between the two is set to be between 10 degrees Celsius and 20 degrees Celsius.
- the support body 110 does not melt when the solder layer 120 is melted, but is compressible to serve as a support to ensure an effective spacing of the package assembly 200.
- the solder layer 120 may be made of tin, and the support 110 may be made of copper or silver. In other embodiments, the solder layer 120 may be made of a tin-copper silver alloy, and the support 110 may be made of copper. Other material selection schemes that can achieve the above-described functions of the weldment 100 can be applied to the present embodiment without limitation.
- the welding piece 100 provided by the embodiment of the present disclosure may be used in the following processes:
- the soldering member 100 is disposed between at least two components to be connected such that the at least two components are soldered to the solder layer 120 of the soldering member 100, and the solder layer between the at least two components passing through the soldering member 100 is ensured. 120 achieves electrical connection.
- the soldering member 100 provided by the embodiment of the present disclosure may be applied to a package assembly.
- the package assembly 200 includes a substrate 210 , a chip 220 , and at least one soldering member 100 .
- Each of the soldering members 100 is disposed between the substrate 210 and the chip 220.
- the substrate 210 and the chip 220 are soldered to the solder layer 120 of the soldering member 100.
- the substrate 210 and the chip 220 pass through.
- the solder layer 120 is electrically connected.
- the at least two soldering members 100 are disposed between the substrate 210 and the chip 220 in the package assembly 200 such that both the substrate 210 and the chip 220 are soldered to the solder layer 120 of the soldering member 100, and between the substrate 210 and the chip 220 are ensured. Electrical connection is achieved by solder layer 120.
- the package assembly 200 can also include a mold 230 and a passive member 240 to implement packaging functions and other functions.
- the support body 110 of the soldering member 100 is pressed by the plastic seal 230 under the deformation stress of the solder layer 120, and the support body 110 passes through the gap.
- the structure which compresses and/or deforms under external deformation stress, absorbs the deformation stress of the solder layer 120, and can effectively improve the reliability of the electronic device to which the package assembly is applied.
- the soldering member 100 disposed between the substrate 210 and the chip 220 can still maintain a certain shape.
- the solder layer 120 is melted and deformed, the substrate 210 and the chip 220 press the solder layer 120 of the soldering member 100 and the support 110, and the voids in the support 110 can be absorbed by the substrate 210 by absorbing the melt of the solder layer 120.
- the stress, or the support body 110 can also absorb the stress of the substrate 210 by extrusion deformation, so as to effectively protect the substrate 210 and the chip 220 from cracking, and the molten material of the solder layer 120 cannot flow into the substrate 210. Therefore, the internal short circuit of the package component 200 can be effectively avoided.
- the soldering member provided by the embodiment of the present disclosure provides a solder layer of the soldering member on the outer surface of the supporting body, and the supporting body is a void structure larger than the solder layer.
- the support body is a void structure, so that when the solder layer is melted and deformed, the support body can absorb the deformation stress of the solder layer, thereby avoiding cracking of the material interface in the package component to which the soldering member is applied, solder penetration, and further short circuit inside the package component. Defects enhance the reliability of electronic devices.
- the support body 110 may be a supporting sphere, and at least one gap is opened in the supporting sphere.
- the support body 110 is a supporting sphere with a gap inside.
- the solder layer 120 of the soldering member 100 may be a curved solder layer 120 attached to the compressible sphere, and the entire soldering member 100 is a sphere to realize connection between the components.
- the support body 110 is disposed to support the ball, and the contact position between the weldment 100 and the component can be not particularly limited, which facilitates installation and welding.
- the support body 110 may be a support sphere, and the support body is a hollow spherical shell.
- the support body 110 is provided as a hollow spherical shell, and the support function can be simultaneously compressed and deformed to absorb stress.
- the center of the hollow spherical shell is a cavity, which can absorb the stress in various directions of the outer shell of the spherical shell to improve the stress absorption efficiency of the welded member 100.
- the support body 110 is provided as a hollow spherical shell, and the manufacturing material and processing cost of the support body 110 can also be saved.
- the thickness of the support body 110 in the present embodiment can be flexibly set according to the magnitude of the stress, which is not limited in this embodiment.
- the support body 110 is a support sphere, and the support body is a porous sphere.
- the support body 110 is provided as a porous sphere.
- the support body 110 is provided as a porous sphere or as a metal foam sphere.
- the porous sphere, or having a void in the foam sphere can be filled with molten solder so that the entire support forms a compressed state and can absorb external deformation stress compression.
- the support body 110 is a porous sphere having a plurality of absorbable stress deformation compressions, and at the same time, can provide a large supporting force and a small deformation when absorbing stress.
- the stress absorbing holes of the support body 110 may be arranged in various ways, for example, an opening is provided in a portion in contact with the support body 110 and the component, or a portion in the support body 110. There are openings in the area, etc., and are not limited.
- the stress absorption holes of the support body 110 are disposed inside the support body 110, and do not communicate with the outer surface of the support body 110, that is, the outer surface of the support body 110. The structure is closed to effectively prevent the molten layer 120 from melting and infiltrating to affect the stress absorption.
- the solder layer 120 is a metal spherical shell wrapped around the outer surface of the support body 110.
- the soldering member 100 provided in this embodiment is provided with the solder layer 120 as a metal spherical shell wrapped around the outer surface of the support body 110.
- the components in contact with the soldering member 100 can be soldered through the solder layer 120, and the conductive solder layer 120 wraps the entire outer surface of the support body 110, and the components in contact with the soldering member 100 can be realized by the solder layer 120.
- the solder layer 120 is disposed to cover the outer surface of the support body 110 of the compressible sphere, and the contact position between the soldering member 100 and the contact member may not be specifically limited to facilitate mounting and soldering.
- the support may also be a metal foam.
- the support body 110 is selected as a metal foam.
- the support body 110 made of foam metal can be deformed by the compressive stress applied to the welded member 100 to absorb the compressive stress received by the welded member; and the solder can be partially absorbed. , reduce the volume of the support body and increase the supporting force.
- the support body 110 is a conductor.
- the solder layer 120 is generally used for soldering and electrical connection of components, it is possible to provide separate solder tabs only at the locations in contact with the components. To achieve electrical connection between components, it is necessary to electrically connect the separate solder tabs. Therefore, the support body 110 can be selected as a conductor, so that the soldering piece disposed on the outer surface of the support body 110 can be electrically connected through the support body 110, thereby achieving electrical connection between the soldered components. . The solder is saved while the soldering and electrical connections are made.
- Embodiments of the present disclosure are also directed to a package assembly that can be a package assembly provided in the embodiment illustrated in FIG.
- a package assembly that can be a package assembly provided in the embodiment illustrated in FIG.
- the number of the soldering members 100 may be at least two, and at least two soldering members 100 are spaced apart between the chip 220 and the substrate 210. . In this way, the relative isolation between the various components on the chip 220 can be effectively ensured, and the risk of short circuit is not generated due to the contact of the soldering member 100, thereby further ensuring the user's use.
- Embodiments of the present disclosure are also directed to an electronic device including a package assembly, which may be the package assembly provided by the embodiment illustrated in FIG. 4 above.
- the soldering member capable of absorbing the deformation stress is applied to the package component, and the support body of the soldering member can absorb the deformation stress of the solder layer by compressive deformation, thereby avoiding the package. Cracking of the material interface within the component leads to defects in the internal short circuit of the package component, which enhances the reliability of the electronic device.
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Abstract
The present disclosure provides a welding piece, a packaging assembly and an electronic device, the welding piece comprising: a support, the support being a void structure; and a solder layer provided on the outer surface of the support, the melting point of the solder layer being less than the melting point of the support.
Description
相关申请的交叉引用Cross-reference to related applications
本申请主张在2018年4月24日在中国提交的中国专利申请号No.201810374180.8的优先权,其全部内容通过引用包含于此。The present application claims priority to Chinese Patent Application No. 201101374180.8, filed on Jan. 24, s.
本公开涉及焊接技术领域,尤其涉及一种焊接件、封装组件和电子设备。The present disclosure relates to the field of welding technology, and in particular, to a welding member, a package assembly, and an electronic device.
随着通信技术的发展,电子设备的功能越来越强大,电子设备内器件数量越来越多,器件尺寸也越来越大,影响电子设备的便携性,因此通过系统级封装(System In a Package,SIP)方案压缩电子设备内器件的尺寸。系统级封装方案,即是将多种芯片,例如处理器、存储器等,集成为一个封装组件。通过将器件进行三维堆叠设计,大幅度缩减器件尺寸,以使电子设备整体的尺寸达到便携性要求。With the development of communication technology, the functions of electronic devices are becoming more and more powerful. The number of devices in electronic devices is increasing and the size of devices is increasing, which affects the portability of electronic devices. Therefore, system-in-package (System In a The Package, SIP) scheme compresses the size of the devices within the electronic device. A system-level packaging solution that integrates multiple chips, such as processors, memories, etc., into one package component. By three-dimensionally stacking the device, the device size is greatly reduced, so that the overall size of the electronic device can meet the portability requirements.
相关技术的系统级封装方案中,通过锡球将芯片焊接到基板上形成封装组件。封装组件被贴到电子设备的主板上过回流焊时,锡球、芯片、基板在回流焊高温下膨胀相互挤压产生应力,产生的应力无法吸收,就会导致冷却收缩后材料界面开裂分层。由于此时锡球尚在熔融状态,沿着缝隙渗透,最终导致锡球之间短路,影响电子设备的正常使用。In a related art system level packaging scheme, a chip is soldered to a substrate by a solder ball to form a package assembly. When the package component is attached to the main board of the electronic device for reflow soldering, the solder ball, the chip, and the substrate are expanded and squeezed at the high temperature of the reflow soldering to generate stress, and the generated stress cannot be absorbed, which may cause cracking of the interface of the material after cooling and shrinkage. . Since the solder ball is still in a molten state at this time, it penetrates along the gap, eventually causing a short circuit between the solder balls, affecting the normal use of the electronic device.
可见,相关技术的系统级封装方案存在无法吸收挤压应力,导致封装组件内的材料界面开裂,锡球渗透,进而导致封装组件内部短路的技术问题。It can be seen that the system-level packaging scheme of the related art has the technical problem that the extrusion stress cannot be absorbed, the interface of the material in the package component is cracked, the solder ball is infiltrated, and the internal short circuit of the package component is caused.
发明内容Summary of the invention
本公开实施例提供一种焊接件、封装组件和电子设备,以解决相关技术的电子设备存在系统级封装方案因无法吸收挤压应力而导致封装组件内部短路的技术问题。Embodiments of the present disclosure provide a soldering member, a package assembly, and an electronic device to solve the technical problem that the electronic device of the related art has a system-level packaging scheme that causes an internal short circuit of the package component due to the inability to absorb the pressing stress.
为了解决上述技术问题,本公开是这样实现的:In order to solve the above technical problems, the present disclosure is implemented as follows:
第一方面,本公开实施例提供了一种焊接件,包括:In a first aspect, an embodiment of the present disclosure provides a welded component, including:
支撑体,所述支撑体为空隙结构;a support body, wherein the support body is a void structure;
以及,设置于所述支撑体的外表面的焊料层,所述焊料层的熔点小于所述支撑体的熔点。And a solder layer disposed on an outer surface of the support, the solder layer having a melting point smaller than a melting point of the support.
第二方面,本公开实施例提供了一种封装组件,包括:基板、芯片以及至少一个焊接件,所述焊接件为如第一方面中任一项所述的焊接件,每个焊接件设置于所述基板和所述芯片之间,所述基板和所述芯片均与所述焊接件的焊料层焊接,所述基板与所述芯片通过所述焊料层电连接。In a second aspect, an embodiment of the present disclosure provides a package assembly comprising: a substrate, a chip, and at least one soldering member, the soldering member being the soldering member according to any one of the first aspects, each soldering member being disposed Between the substrate and the chip, the substrate and the chip are both soldered to a solder layer of the soldering member, and the substrate and the chip are electrically connected through the solder layer.
第三方面,本公开实施例提供了一种电子设备,包括如第二方面中任一项所述的封装组件。In a third aspect, an embodiment of the present disclosure provides an electronic device, comprising the package assembly of any of the second aspects.
本公开实施例中,通过将焊接件的焊料层设置于支撑体的外表层,且支撑体为熔点大于焊料层的空隙结构。这样,焊料层熔化形变时,支撑体在焊料层的形变压力下,通过内部的空隙实现吸收焊料层的形变应力。本公开实施例中,将可吸收形变应力的焊接件应用于封装组件,焊接件的支撑体可以通过压缩变形来吸收焊料层的形变应力,也就避免了封装组件内的材料界面开裂导致封装组件内部短路的缺陷,增强了电子设备的可靠性。In the embodiment of the present disclosure, the solder layer of the soldering member is disposed on the outer surface layer of the support body, and the support body has a void structure having a melting point larger than that of the solder layer. Thus, when the solder layer is melted and deformed, the support body absorbs the deformation stress of the solder layer through the internal void under the deformation pressure of the solder layer. In the embodiment of the present disclosure, the weldable member capable of absorbing deformation stress is applied to the package assembly, and the support body of the weldment member can absorb the deformation stress of the solder layer by compressive deformation, thereby avoiding cracking of the material interface in the package assembly, thereby causing the package assembly. The shortcoming of internal short circuit enhances the reliability of electronic equipment.
为了更清楚地说明本公开实施例的技术方案,下面将对本公开实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本公开的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings used in the description of the embodiments of the present disclosure will be briefly described. It is obvious that the drawings in the following description are only some embodiments of the present disclosure. Other drawings may also be obtained from those of ordinary skill in the art in view of the drawings.
图1为本公开实施例提供的一种焊接件的结构示意图;1 is a schematic structural view of a welded member according to an embodiment of the present disclosure;
图2为本公开实施例提供的另一种焊接件的结构示意图;2 is a schematic structural view of another welding member according to an embodiment of the present disclosure;
图3为本公开实施例提供的另一种焊接件的结构示意图;3 is a schematic structural view of another welding member according to an embodiment of the present disclosure;
图4为本公开实施例提供的一种封装组件的结构示意图;4 is a schematic structural diagram of a package assembly according to an embodiment of the present disclosure;
图5为本公开实施例提供的一种封装组件的焊接件形变结构示意图;FIG. 5 is a schematic structural diagram of a welded part of a package assembly according to an embodiment of the present disclosure; FIG.
图6为本公开实施例提供的另一种焊接件的结构示意图。FIG. 6 is a schematic structural view of another welding member according to an embodiment of the present disclosure.
下面将结合本公开实施例中的附图,对本公开实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本公开一部分实施例,而不是全部的实施例。基于本公开中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本公开保护的范围。The technical solutions in the embodiments of the present disclosure are clearly and completely described in the following with reference to the accompanying drawings in the embodiments of the present disclosure. It is obvious that the described embodiments are a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present disclosure without departing from the inventive scope are the scope of the disclosure.
参见图1,图1为本公开实施例提供的一种焊接件的结构示意图。如图1所示,一种焊接件100,包括:Referring to FIG. 1 , FIG. 1 is a schematic structural diagram of a soldering member according to an embodiment of the present disclosure. As shown in FIG. 1, a weldment 100 includes:
支撑体110,所述支撑体110为空隙结构;a support body 110, the support body 110 is a void structure;
以及,设置于所述支撑体110的外表面的焊料层120,所述焊料层120的熔点小于所述支撑体110的熔点。And a solder layer 120 disposed on an outer surface of the support 110, the solder layer 120 having a melting point smaller than a melting point of the support 110.
本实施例提供的焊接件100,包括支撑体110和焊料层120。其中,焊料层120设置于支撑体110的外表面,用于实现焊接件100的基本焊接功能。所述焊接件100可以设置于封装组件200内,用于连接封装组件200内的元件。需要连接的元件与焊接件100的焊料层120均连接,且元件之间可以通过所述焊料层120实现电连接。所述焊料层120实现焊接功能的方案可以有多种。The soldering piece 100 provided in this embodiment includes a support body 110 and a solder layer 120. Wherein, the solder layer 120 is disposed on the outer surface of the support body 110 for achieving the basic soldering function of the soldering member 100. The soldering member 100 can be disposed within the package assembly 200 for connecting components within the package assembly 200. The components to be connected are connected to the solder layer 120 of the soldering member 100, and electrical connections can be made between the components through the solder layer 120. The solder layer 120 can be implemented in a variety of ways to achieve a soldering function.
在一种具体实施方式中,如图1所示,所述焊料层120可以包裹在支撑体110的整个外表面,这样,与支撑体110外表面接触的元件均可以通过焊料层120焊接,且这些元件之间均通过焊料层120实现电连接。In a specific embodiment, as shown in FIG. 1 , the solder layer 120 may be wrapped around the entire outer surface of the support 110 such that the components in contact with the outer surface of the support 110 may be soldered through the solder layer 120, and Electrical connections are made between these elements by solder layer 120.
在另一种实施方式中,如图2所示,所述焊料层120也可以仅包裹支撑体110的部分外表面。本实施例中,所述焊料层120也可以为分布在支撑体110外表面的一体连接的焊片,这样,与支撑体110外表面的焊片接触的元件均可以通过该焊片实现焊接,且该部分元件之间也可以通过该一体连接的焊片实现电连接。In another embodiment, as shown in FIG. 2, the solder layer 120 may also only wrap a portion of the outer surface of the support 110. In this embodiment, the solder layer 120 may also be an integrally connected solder tab distributed on the outer surface of the support body 110, so that components that are in contact with the solder tabs on the outer surface of the support body 110 can be soldered through the solder tab. And the electrical connection of the part of the components can also be achieved by the integrally connected solder tabs.
在其他实施方式中,焊料层120包裹支撑体110的部分外表面的实现方式还可以如图3所示,所述焊料层120也可以为分布在支撑体110外表面的相互分离的焊片,该相互分离的焊片之间可以通过导线(图中未示出)电连接,或者通过具备导电功能的支撑体110电连接。这样,与该部分焊片接触的元件均可以通过焊片实现焊接,且该部分元件之间通过该分离式焊片实现 电连接。其他能实现焊料层120焊接功能的方案均可适用于本实施例,不作限定。In other embodiments, the solder layer 120 may be partially disposed on the outer surface of the support 110. The solder layer 120 may also be a separate solder tab distributed on the outer surface of the support 110. The mutually separated soldering pieces may be electrically connected by wires (not shown) or by a support body 110 having a conductive function. Thus, the components in contact with the portion of the solder tab can be soldered by the solder tab, and the portions are electrically connected by the separate solder tab. Other solutions that can achieve the soldering function of the solder layer 120 can be applied to the embodiment, and are not limited.
所述支撑体110为所述焊接件100的支撑部件,设置所述支撑体110内具有空隙。这样,所述焊料层120熔化产生形变时,所述支撑体110可以吸收所述焊料层120的形变应力而产生的形变压力。The support body 110 is a support member of the weldment 100, and the support body 110 is provided with a gap therein. Thus, when the solder layer 120 is melted to deform, the support 110 can absorb the deformation pressure generated by the deformation stress of the solder layer 120.
所述支撑体110作为支撑部件,同时具备吸收应力的属性。所述支撑体110内开设空隙,可以通过内设空隙吸收挤压应力压缩形变,空隙也可以被熔化的焊料填充,形成压缩态,从而可以吸收外界形变应力。所述支撑体110还可以为可压缩弹性件,例如空腔壳体或者泡沫球体。考虑到支撑体110在焊料层120熔化时需要实现支撑和应力吸收功能,因此设置所述焊料层120的熔点小于所述支撑体110的熔点。在一种实施方式中,所述焊料层120的熔点与所述支撑体110的熔点差值可以大于10摄氏度,例如,设置二者的熔点差值为10摄氏度至20摄氏度之间。这样,支撑体110在焊料层120熔化时不会熔化,但可压缩,以起到支撑作用,保证封装组件200支撑的有效间隔。The support body 110 serves as a support member and has an attribute of absorbing stress. A gap is formed in the support body 110, and the compression stress can be absorbed by the internal cavity to absorb the compressive stress, and the void can also be filled with the molten solder to form a compressed state, thereby absorbing the external deformation stress. The support body 110 can also be a compressible elastic member such as a cavity housing or a foam sphere. In view of the fact that the support 110 needs to achieve a supporting and stress absorbing function when the solder layer 120 is melted, the melting point of the solder layer 120 is set to be smaller than the melting point of the support 110. In one embodiment, the difference between the melting point of the solder layer 120 and the melting point of the support 110 may be greater than 10 degrees Celsius, for example, the difference in melting point between the two is set to be between 10 degrees Celsius and 20 degrees Celsius. Thus, the support body 110 does not melt when the solder layer 120 is melted, but is compressible to serve as a support to ensure an effective spacing of the package assembly 200.
在一种具体的实施方式中,所述焊料层120可以由锡制成,所述支撑体110可以由铜或者银制成。在其他实施方式中,所述焊料层120可以由锡铜银合金制成,所述支撑体110可以由铜制成。其他能实现焊接件100的上述功能的材料选择方案均可适用于本实施例,不作限定。In a specific embodiment, the solder layer 120 may be made of tin, and the support 110 may be made of copper or silver. In other embodiments, the solder layer 120 may be made of a tin-copper silver alloy, and the support 110 may be made of copper. Other material selection schemes that can achieve the above-described functions of the weldment 100 can be applied to the present embodiment without limitation.
本公开实施例提供的焊接件100,其使用过程可以包括:The welding piece 100 provided by the embodiment of the present disclosure may be used in the following processes:
将焊接件100设置于需要连接的至少两个部件之间,使得该至少两个部件均与焊接件100的焊料层120焊接,且保证该至少两个部件之间通过该焊接件100的焊料层120实现电连接。The soldering member 100 is disposed between at least two components to be connected such that the at least two components are soldered to the solder layer 120 of the soldering member 100, and the solder layer between the at least two components passing through the soldering member 100 is ensured. 120 achieves electrical connection.
本公开实施例提供的焊接件100可以应用于封装组件,如图4所示,所述封装组件200包括:基板210、芯片220以及至少一个焊接件100。The soldering member 100 provided by the embodiment of the present disclosure may be applied to a package assembly. As shown in FIG. 4 , the package assembly 200 includes a substrate 210 , a chip 220 , and at least one soldering member 100 .
每个焊接件100均设置于所述基板210和芯片220之间,所述基板210和所述芯片220均与所述焊接件100的焊料层120焊接,所述基板210和所述芯片220通过所述焊料层120电连接。Each of the soldering members 100 is disposed between the substrate 210 and the chip 220. The substrate 210 and the chip 220 are soldered to the solder layer 120 of the soldering member 100. The substrate 210 and the chip 220 pass through. The solder layer 120 is electrically connected.
将至少两个焊接件100设置于封装组件200内的基板210和芯片220之 间,使得基板210和芯片220均与所述焊接件100的焊料层120焊接,且保证基板210与芯片220之间通过焊料层120实现电连接。所述封装组件200还可以包括塑封230和被动件240,实现封装功能和其他功能。The at least two soldering members 100 are disposed between the substrate 210 and the chip 220 in the package assembly 200 such that both the substrate 210 and the chip 220 are soldered to the solder layer 120 of the soldering member 100, and between the substrate 210 and the chip 220 are ensured. Electrical connection is achieved by solder layer 120. The package assembly 200 can also include a mold 230 and a passive member 240 to implement packaging functions and other functions.
这样,焊接件100的焊料层120在熔化产生形变时,如图5所示,焊接件100的支撑体110在焊料层120的形变应力下,受到塑封230的挤压,支撑体110即通过空隙结构,在外部形变应力下压缩和/或变形,吸收所述焊料层120的形变应力,可以有效提升封装组件所应用的电子设备的可靠性。Thus, when the solder layer 120 of the soldering member 100 is deformed by melting, as shown in FIG. 5, the support body 110 of the soldering member 100 is pressed by the plastic seal 230 under the deformation stress of the solder layer 120, and the support body 110 passes through the gap. The structure, which compresses and/or deforms under external deformation stress, absorbs the deformation stress of the solder layer 120, and can effectively improve the reliability of the electronic device to which the package assembly is applied.
具体的,当所述封装组件200过回流焊接时,设置于所述基板210和芯片220之间的焊接件100仍可保持一定的形状。此时,焊料层120熔化形变,基板210和芯片220挤压焊接件100的焊料层120以及支撑体110,支撑体110内的空隙可以通过吸收焊料层120的熔融物来吸收基板210挤压的应力,或者,支撑体110也可以通过挤压变形来吸收基板210挤压的应力,以有效保护基板210和芯片220不会产生裂缝,焊料层120的熔融物也就无法流入到基板210内,也就可以有效避免封装组件200内部短路。Specifically, when the package assembly 200 is over-reflow soldered, the soldering member 100 disposed between the substrate 210 and the chip 220 can still maintain a certain shape. At this time, the solder layer 120 is melted and deformed, the substrate 210 and the chip 220 press the solder layer 120 of the soldering member 100 and the support 110, and the voids in the support 110 can be absorbed by the substrate 210 by absorbing the melt of the solder layer 120. The stress, or the support body 110 can also absorb the stress of the substrate 210 by extrusion deformation, so as to effectively protect the substrate 210 and the chip 220 from cracking, and the molten material of the solder layer 120 cannot flow into the substrate 210. Therefore, the internal short circuit of the package component 200 can be effectively avoided.
上述本公开实施例提供的焊接件,通过将焊接件的焊料层设置于支撑体的外表层,且支撑体为大于焊料层的空隙结构。支撑体为空隙结构,这样,焊料层熔化形变时,支撑体可以吸收焊料层的形变应力,也就避免了应用焊接件的封装组件内的材料界面开裂,焊料渗透,进而导致封装组件内部短路的缺陷,增强了电子设备的可靠性。The soldering member provided by the embodiment of the present disclosure provides a solder layer of the soldering member on the outer surface of the supporting body, and the supporting body is a void structure larger than the solder layer. The support body is a void structure, so that when the solder layer is melted and deformed, the support body can absorb the deformation stress of the solder layer, thereby avoiding cracking of the material interface in the package component to which the soldering member is applied, solder penetration, and further short circuit inside the package component. Defects enhance the reliability of electronic devices.
在上述实施例的基础上,如图1至图5所示,所述支撑体110可以为支撑球体,所述支撑球体内开设有至少一个空隙。On the basis of the above embodiments, as shown in FIG. 1 to FIG. 5, the support body 110 may be a supporting sphere, and at least one gap is opened in the supporting sphere.
本实施例提供的焊接件100,所述支撑体110为内部开设空隙的支撑球体。所述焊接件100的焊料层120可以为贴附于该可压缩的球体上的曲面焊料层120,整个焊接件100为球体,实现元件之间的连接。将所述支撑体110设置为支撑球体,可以不具体限制焊接件100与元件之间的接触位置,方便安装和焊接。In the welding piece 100 provided by this embodiment, the support body 110 is a supporting sphere with a gap inside. The solder layer 120 of the soldering member 100 may be a curved solder layer 120 attached to the compressible sphere, and the entire soldering member 100 is a sphere to realize connection between the components. The support body 110 is disposed to support the ball, and the contact position between the weldment 100 and the component can be not particularly limited, which facilitates installation and welding.
在上述实施例的基础上,如图1至图4所示,所述支撑体110可以为支撑球体,所述支撑体为空心球壳。Based on the above embodiment, as shown in FIG. 1 to FIG. 4, the support body 110 may be a support sphere, and the support body is a hollow spherical shell.
本实施例提供的焊接件100,设置支撑体110为空心球壳,实现支撑功 能的同时可以压缩变形以吸收应力。空心球壳的中心为空腔,可以吸收来之球壳外表各个方向的应力,以提高焊接件100的应力吸收效率。此外,支撑体110设置为空心球壳,也可以节省支撑体110的制作材料和加工成本。In the welding member 100 provided in this embodiment, the support body 110 is provided as a hollow spherical shell, and the support function can be simultaneously compressed and deformed to absorb stress. The center of the hollow spherical shell is a cavity, which can absorb the stress in various directions of the outer shell of the spherical shell to improve the stress absorption efficiency of the welded member 100. In addition, the support body 110 is provided as a hollow spherical shell, and the manufacturing material and processing cost of the support body 110 can also be saved.
考虑到不同材料的形变产生的应力大小各不相同,因此,本实施例中的支撑体110的壁厚可以根据应力大小进行灵活地设置,本实施例对此不作限定。The thickness of the support body 110 in the present embodiment can be flexibly set according to the magnitude of the stress, which is not limited in this embodiment.
在上述实施例的基础上,如图6所示,所述支撑体110为支撑球体,所述支撑体为多孔球体。Based on the above embodiment, as shown in FIG. 6, the support body 110 is a support sphere, and the support body is a porous sphere.
本实施例提供的焊接件100,支撑体110设置为多孔球体。考虑到焊接件100连接的元件之间可能需要较大间隙,这就需要支撑体110能提供较大支撑力,且在吸收应力时形变较小。因此,设置所述支撑体110为多孔球体,或者为泡沫金属球体。多孔球体,或者为泡沫球体中具有空隙,空隙可以被熔化的焊料填充,从而整个支撑体形成压缩态,可以吸收外界形变应力压缩。支撑体110为具有多个可吸收应力形变压缩的多孔球体,同时可以提供较大的支撑力,且吸收应力时的形变较小。In the welding piece 100 provided in this embodiment, the support body 110 is provided as a porous sphere. In view of the fact that a large gap may be required between the components to which the weldment 100 is joined, it is required that the support body 110 can provide a large supporting force and that the deformation is small when the stress is absorbed. Therefore, the support body 110 is provided as a porous sphere or as a metal foam sphere. The porous sphere, or having a void in the foam sphere, can be filled with molten solder so that the entire support forms a compressed state and can absorb external deformation stress compression. The support body 110 is a porous sphere having a plurality of absorbable stress deformation compressions, and at the same time, can provide a large supporting force and a small deformation when absorbing stress.
在上述实施例的基础上,所述支撑体110的应力吸收孔的布局方式还可以有多种,例如,在与支撑体110与元件接触的部分内设开孔,或者在支撑体110的部分区域内设开孔等,不作限定。为了避免外部焊料层120熔化时进入支撑体110影响应力的吸收,支撑体110的应力吸收孔均设置于支撑体110的内部,不与支撑体110的外表连通,即为支撑体110的外表面为封闭结构,以有效避免焊料层120熔化渗入影响应力吸收。On the basis of the above embodiments, the stress absorbing holes of the support body 110 may be arranged in various ways, for example, an opening is provided in a portion in contact with the support body 110 and the component, or a portion in the support body 110. There are openings in the area, etc., and are not limited. In order to prevent the external solder layer 120 from melting into the support body 110 to affect the absorption of stress, the stress absorption holes of the support body 110 are disposed inside the support body 110, and do not communicate with the outer surface of the support body 110, that is, the outer surface of the support body 110. The structure is closed to effectively prevent the molten layer 120 from melting and infiltrating to affect the stress absorption.
在上述实施例的基础上,如图1所示,所述焊料层120为包裹在所述支撑体110外表面的金属球壳。Based on the above embodiment, as shown in FIG. 1, the solder layer 120 is a metal spherical shell wrapped around the outer surface of the support body 110.
本实施例提供的焊接件100,设置所述焊料层120为包裹在所述支撑体110外表面的金属球壳。这样,与焊接件100接触的元件,均可通过焊料层120焊接,导电的焊料层120包裹整个支撑体110外表面,则与焊接件100接触的元件之间即可通过所述焊料层120实现电连接。将所述焊料层120设置为包裹可压缩球体的支撑体110的外表面,可以不具体限制焊接件100与接触元件之间的接触位置,方便安装和焊接。The soldering member 100 provided in this embodiment is provided with the solder layer 120 as a metal spherical shell wrapped around the outer surface of the support body 110. In this way, the components in contact with the soldering member 100 can be soldered through the solder layer 120, and the conductive solder layer 120 wraps the entire outer surface of the support body 110, and the components in contact with the soldering member 100 can be realized by the solder layer 120. Electrical connection. The solder layer 120 is disposed to cover the outer surface of the support body 110 of the compressible sphere, and the contact position between the soldering member 100 and the contact member may not be specifically limited to facilitate mounting and soldering.
在上述实施例的基础上,所述支撑体也可以为泡沫金属。Based on the above embodiments, the support may also be a metal foam.
本实施例提供的焊接件100,支撑体110选为泡沫金属。这样,焊接件100在受挤压时,泡沫金属制成的支撑体110即可承受焊接件100所受的挤压应力而变形,以吸收焊接件所接收的挤压应力;还可以部分吸收焊料,减小支撑体的体积,提高支撑力。In the welding piece 100 provided in this embodiment, the support body 110 is selected as a metal foam. Thus, when the welded member 100 is pressed, the support body 110 made of foam metal can be deformed by the compressive stress applied to the welded member 100 to absorb the compressive stress received by the welded member; and the solder can be partially absorbed. , reduce the volume of the support body and increase the supporting force.
在上述实施例的基础上,所述支撑体110为导体。Based on the above embodiment, the support body 110 is a conductor.
考虑到焊料层120一般用于元件的焊接和电连接,因此,可以仅在与元件接触的位置设置相互分离的焊片。若要实现元件之间的电连接,就需要将相互分离的焊片电连接。因此,可以将所述支撑体110选为导体,这样,设置于所述支撑体110外表面的焊片即可通过支撑体110实现电连接,也就可以实现所焊接的元件之间的电连接。实现焊接和电连接的同时,节省了焊料。In view of the fact that the solder layer 120 is generally used for soldering and electrical connection of components, it is possible to provide separate solder tabs only at the locations in contact with the components. To achieve electrical connection between components, it is necessary to electrically connect the separate solder tabs. Therefore, the support body 110 can be selected as a conductor, so that the soldering piece disposed on the outer surface of the support body 110 can be electrically connected through the support body 110, thereby achieving electrical connection between the soldered components. . The solder is saved while the soldering and electrical connections are made.
本公开实施例还涉及一种封装组件,所述封装组件可以为图4所示的实施例提供的封装组件。焊接件100的焊料层120在熔化产生形变时,焊接件100的支撑体110在焊料层120熔化时,以吸收外界的形变应力,可以有效提升产品的可靠性。Embodiments of the present disclosure are also directed to a package assembly that can be a package assembly provided in the embodiment illustrated in FIG. When the solder layer 120 of the soldering member 100 is deformed by melting, the support body 110 of the soldering member 100 absorbs the deformation stress of the outside when the solder layer 120 is melted, and the reliability of the product can be effectively improved.
在上述实施例的基础上,如图4和图5所示,所述焊接件100的数量可以为至少两个,至少两个焊接件100间隔设置于所述芯片220与所述基板210之间。这样,可以有效保证芯片220上的各个元件之间的相对隔离,不会因为焊接件100接触而产生短路风险,进一步保证了用户使用。On the basis of the above embodiments, as shown in FIG. 4 and FIG. 5, the number of the soldering members 100 may be at least two, and at least two soldering members 100 are spaced apart between the chip 220 and the substrate 210. . In this way, the relative isolation between the various components on the chip 220 can be effectively ensured, and the risk of short circuit is not generated due to the contact of the soldering member 100, thereby further ensuring the user's use.
本公开实施例还涉及一种电子设备,包括封装组件,所述封装组件可以为上述图4所示的实施例提供的封装组件。Embodiments of the present disclosure are also directed to an electronic device including a package assembly, which may be the package assembly provided by the embodiment illustrated in FIG. 4 above.
上述本公开实施例提供的电子设备,封装组件装配时,将可吸收形变应力的焊接件应用于封装组件,焊接件的支撑体可以通过压缩变形来吸收焊料层的形变应力,也就避免了封装组件内的材料界面开裂导致封装组件内部短路的缺陷,增强了电子设备的可靠性。本公开实施例的具体实施过程可以参见上述图4所示的实施例提供的封装组件的具体实施过程,在此不再一一赘述。In the electronic device provided by the embodiment of the present disclosure, when the package component is assembled, the soldering member capable of absorbing the deformation stress is applied to the package component, and the support body of the soldering member can absorb the deformation stress of the solder layer by compressive deformation, thereby avoiding the package. Cracking of the material interface within the component leads to defects in the internal short circuit of the package component, which enhances the reliability of the electronic device. For a specific implementation process of the embodiment of the present disclosure, reference may be made to the specific implementation process of the package component provided by the embodiment shown in FIG. 4 , and details are not described herein again.
以上所述,仅为本公开的具体实施方式,但本公开的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本公开揭露的技术范围内,可轻易 想到变化或替换,都应涵盖在本公开的保护范围之内。因此,本公开的保护范围应以权利要求的保护范围为准。The above is only the specific embodiment of the present disclosure, but the scope of the present disclosure is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope of the disclosure. It should be covered within the scope of protection of the present disclosure. Therefore, the scope of protection of the disclosure should be determined by the scope of the claims.
Claims (11)
- 一种焊接件,包括:A welded part comprising:支撑体,所述支撑体为空隙结构;a support body, wherein the support body is a void structure;以及,设置于所述支撑体的外表面的焊料层,所述焊料层的熔点小于所述支撑体的熔点。And a solder layer disposed on an outer surface of the support, the solder layer having a melting point smaller than a melting point of the support.
- 根据权利要求1所述的焊接件,其中,所述支撑体为支撑球体,所述支撑体为空心球壳。The welded part according to claim 1, wherein the support body is a support sphere, and the support body is a hollow spherical shell.
- 根据权利要求1所述的焊接件,其中,所述支撑体为支撑球体,所述支撑体为多孔球体。The weldment according to claim 1, wherein the support body is a support sphere, and the support body is a porous sphere.
- 根据权利要求3所述的焊接件,其中,所述支撑体为泡沫金属。The weldment according to claim 3, wherein the support is a metal foam.
- 根据权利要求2至3中任一项所述的焊接件,其中,所述焊料层为包裹在所述支撑体外表面的金属球壳。The weldment according to any one of claims 2 to 3, wherein the solder layer is a metal spherical shell wrapped around an outer surface of the support.
- 根据权利要求5所述的焊接件,其中,所述支撑体为导体。The weldment of claim 5 wherein the support is a conductor.
- 根据权利要求1所述的焊接件,其中,所述焊料层的熔点与所述支撑体的熔点差值大于10摄氏度。The soldering member according to claim 1, wherein a difference between a melting point of the solder layer and a melting point of the support is greater than 10 degrees Celsius.
- 根据权利要求1所述的焊接件,其中,所述焊料层熔化时,所述支撑体用于在外界形变应力下压缩变形,以吸收外界的形变应力。The soldering member according to claim 1, wherein the support body is used for compressive deformation under external deformation stress to melt the external deformation stress when the solder layer is melted.
- 一种封装组件,包括:基板、芯片以及至少一个焊接件,所述焊接件为如权利要求1至8中任一项所述的焊接件;A package assembly comprising: a substrate, a chip, and at least one soldering member, the soldering member being the soldering member according to any one of claims 1 to 8;每个焊接件设置于所述基板和所述芯片之间,所述基板和所述芯片均与所述焊接件的焊料层焊接,所述基板与所述芯片通过所述焊料层电连接。Each soldering member is disposed between the substrate and the chip, the substrate and the chip are both soldered to a solder layer of the soldering member, and the substrate and the chip are electrically connected through the solder layer.
- 根据权利要求9所述的封装组件,其中,所述焊接件的数量为至少两个,至少两个焊接件间隔设置于所述芯片与所述基板之间。The package assembly of claim 9, wherein the number of the soldering members is at least two, and at least two soldering members are spaced apart between the chip and the substrate.
- 一种电子设备,包括如权利要求9或者10所述的封装组件。An electronic device comprising the package assembly of claim 9 or 10.
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US11482461B2 (en) * | 2019-12-31 | 2022-10-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor package and method for making the same |
CN112542428A (en) * | 2020-12-01 | 2021-03-23 | 苏州通富超威半导体有限公司 | Chip packaging structure and chip connecting structure |
CN114291783B (en) * | 2021-12-31 | 2024-07-26 | 深圳市信为科技发展有限公司 | Pressure sensor with micro multi-lead wire and preparation method thereof |
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