WO2019146461A1

WO2019146461A1 - Electromagnetic wave detection device and information acquisition system

Info

Publication number: WO2019146461A1
Application number: PCT/JP2019/001035
Authority: WO
Inventors: 絵梨竹内
Original assignee: 京セラ株式会社
Priority date: 2018-01-26
Filing date: 2019-01-16
Publication date: 2019-08-01
Also published as: US20200333458A1; CN111527740A; JP7025940B2; JP2019129510A; EP3745708A4; EP3745708A1; CN111527740B; US11573316B2

Abstract

An electromagnetic wave detection device 10 comprises a first image formation unit 15, a travel unit 18, a second image formation unit 19, and a first detection unit 20. In the travel unit 18, a plurality of pixels px are arranged along a reference surface ss. The travel unit 18 causes an electromagnetic wave incident on the reference surface ss from the first image formation unit 15 to travel in a first direction d1. The first detection unit 20 detects the electromagnetic wave incident from the second image formation unit 19. An arrangement in which extension surfaces of the reference surface ss and a detection surface of the first detection unit 20 cross each other, and a principal axis of the second image formation unit 19 crosses the reference surface ss and the detection surface of the first detection unit 20 and/or an arrangement in which extension surfaces of an object surface vp of the first image formation unit 15 having a determined distance from the travel unit 18 and using the reference surface ss as an image surface and the reference surface ss cross each other, and a principal axis of the first image formation unit 15 crosses the reference surface ss is satisfied.

Description

Electromagnetic wave detection device and information acquisition system

Cross-reference to related applications

This application claims priority to Japanese Patent Application No. 2018-11881 filed on Jan. 26, 2018, the entire disclosure of which is incorporated herein by reference.

The present disclosure relates to an electromagnetic wave detection device and an information acquisition system.

There is known an apparatus, such as a DMD, which has an element for switching the traveling direction of an electromagnetic wave incident per pixel. For example, a device is known which temporarily forms an image of an object on a DMD surface once and then forms an image formed on the DMD surface on a CCD surface through a lens (see Patent Document 1).

Patent No. 3507865

In order to solve the various problems described above, the electromagnetic wave detection device according to the first aspect is:
A first imaging unit for imaging an incident electromagnetic wave;
A traveling unit configured to arrange a plurality of pixels along a reference plane, and to cause an electromagnetic wave incident on the reference plane from the first imaging unit to travel in a first direction for each of the pixels;
A second imaging unit that forms an image of the electromagnetic wave that has traveled in the first direction;
A first detection unit that detects an electromagnetic wave incident from the second imaging unit;
An extension surface of each of the reference surface and the detection surface of the first detection unit intersected, and a main axis of the second imaging unit passing through the detection surface of the reference surface and the first detection unit;
The object plane of the first imaging unit whose distance from the advancing unit is determined and whose reference plane is the image plane intersects the reference plane with the respective extension planes, and the main axis of the first imaging unit An arrangement passing through the reference plane,
At least one of the above is satisfied.

Moreover, the electromagnetic wave detection device according to the second aspect is
A first imaging unit for imaging an incident electromagnetic wave;
A traveling unit configured to arrange a plurality of pixels along a reference plane, and to cause an electromagnetic wave incident on the reference plane from the first imaging unit to travel in a first direction for each of the pixels;
A second imaging unit that forms an image of the electromagnetic wave that has traveled in the first direction;
A first detection unit that detects an electromagnetic wave incident from the second imaging unit;
An arrangement in which an image in the vicinity of the main axis by the second imaging unit of the image by the first imaging unit on the reference plane is included in the detection surface of the first detection unit;
An arrangement in which an image in the vicinity of the main axis by the first image forming unit is included in the reference plane, of an object through which the main axis of the first image forming unit passes;
At least one of the above is satisfied.

In addition, the information acquisition system according to the third aspect is
A first imaging unit for forming an incident electromagnetic wave, and a plurality of pixels are arranged along a reference plane, and an electromagnetic wave incident on the reference plane from the first imaging unit is firstly generated for each of the pixels. A traveling unit for advancing in a direction, a second imaging unit for imaging the electromagnetic wave traveling in the first direction, and a first detection unit for detecting an electromagnetic wave incident from the second imaging unit; The extension surfaces of the reference surface and the detection surface of the first detection unit intersect, and the main axis of the second imaging unit passes the detection surface of the reference surface and the first detection unit The object plane of the first imaging unit whose arrangement and spacing with respect to the advancing unit are determined and whose reference plane is the image plane intersects with the reference plane and the respective extension planes, and the first imaging unit An electromagnetic wave detection device in which at least one of the arrangement in which the principal axis of the light source passes through the reference plane is satisfied.
And a control device for acquiring information related to the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the first detection unit.

In addition, the information acquisition system according to the fourth aspect is
A first imaging unit for forming an incident electromagnetic wave, and a plurality of pixels are arranged along a reference plane, and an electromagnetic wave incident on the reference plane from the first imaging unit is firstly generated for each of the pixels. A traveling unit for advancing in a direction, a second imaging unit for imaging the electromagnetic wave traveling in the first direction, and a first detection unit for detecting an electromagnetic wave incident from the second imaging unit; And a third imaging unit configured to image an electromagnetic wave that has traveled in the second direction, and a second detection unit configured to detect an electromagnetic wave incident from the third imaging unit; An extension surface of each of the detection surfaces of the first detection unit intersects, and an arrangement in which the main axis of the second imaging unit passes the detection surface of the reference surface and the first detection unit, and a distance from the advancing unit The object plane of the first imaging unit and the reference plane, and the extension plane of each of the first imaging unit, the image plane having the Insert the arrangement of the first imaging portion of the main shaft passes through said reference plane, at least one has been met, the electromagnetic wave detection device,
And a control device for acquiring information related to the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the second detection unit.

In addition, the information acquisition system according to the fifth aspect is
A first imaging unit for forming an incident electromagnetic wave, and a plurality of pixels are arranged along a reference plane, and an electromagnetic wave incident on the reference plane from the first imaging unit is firstly generated for each of the pixels. A traveling unit for advancing in a direction, a second imaging unit for imaging the electromagnetic wave traveling in the first direction, and a first detection unit for detecting an electromagnetic wave incident from the second imaging unit; And a third detection unit that detects an electromagnetic wave that has traveled in the third direction, wherein the extension surface of each of the reference surface and the detection surface of the first detection unit intersects the second imaging. An arrangement in which the principal axis of the unit passes through the reference plane and the detection plane of the first detection unit, and an object plane of the first imaging unit whose distance from the advancing unit is determined and whose reference plane is the image plane An arrangement in which the reference plane intersects with each of the extension planes, and the main axis of the first imaging unit passes through the reference plane. Kutomo one is satisfied, and the electromagnetic wave detecting device,
And a control device for acquiring information on the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the third detection unit.

In the electromagnetic wave detection device in which the main surface of the primary imaging optical system, the reference surface of the advancing portion, the main surface of the secondary imaging optical system, and the detection surface of the detection portion are parallel, two of the images formed on the detection surface It is a figure which shows the view | field angle range of a next imaging optical system. It is a block diagram which shows schematic structure of the information acquisition system containing the electromagnetic wave detection apparatus which concerns on 1st Embodiment. It is a block diagram which shows schematic structure of the electromagnetic wave detection apparatus of FIG. It is a timing chart which shows the time of radiation of electromagnetic waves, and the time of detection for explaining the principle of distance measurement by the distance measurement sensor which an irradiation part, the 2nd detection part, and a control part constitute. FIG. 3 is a view showing a field angle range of a second imaging unit of an image formed on a first detection surface in the electromagnetic wave detection device of FIG. 2; It is a block diagram which shows schematic structure of the electromagnetic wave detection apparatus which concerns on 2nd Embodiment.

Hereinafter, an embodiment of an electromagnetic wave detection device to which the present invention is applied will be described with reference to the drawings. As shown in FIG. 1, the main surface of the primary imaging optical system 15 'for imaging an electromagnetic wave on the reference surface of the traveling portion 18', the reference surface of the traveling portion 18 ', and the main surface of the secondary imaging optical system 19'. And, in the configuration in which all detection surfaces of the detection unit 20 ′ are arranged in parallel, an angle of view range away from the principal axis among the angle of view range of the secondary imaging optical system 19 ′ may be used for detection. Generally, in the angle of view range away from the main axis of the imaging system, the resolution is lower than near the main axis. Therefore, the electromagnetic wave detection device to which the present invention is applied can improve the resolution of the image of the electromagnetic wave by being configured to be able to use the image of the electromagnetic wave in the vicinity of the main axis of the secondary imaging optical system 19 'for detection. Hereinafter, the vicinity of the main axis means an area within a predetermined range centered on the main axis of the imaging optical system on the imaging surface by the imaging optical system. The predetermined range can be set according to the required resolution.

As shown in FIG. 2, the information acquisition system 11 including the electromagnetic wave detection device 10 according to the first embodiment of the present disclosure includes the electromagnetic wave detection device 10, the irradiation unit 12, the reflection unit 13, and the control device 14. It is done.

In the following figures, broken lines connecting functional blocks indicate flows of control signals or information to be communicated. The communication indicated by the broken line may be wired communication or wireless communication. The solid lines protruding from the functional blocks indicate beam-like electromagnetic waves.

As shown in FIG. 3, the electromagnetic wave detection device 10 includes a first imaging unit 15, a separation unit 16, a traveling unit 18, a second imaging unit 19, a first detection unit 20, and a third imaging unit. A second detection unit 22 and a third detection unit 17 are provided.

The first imaging unit 15 is disposed at a position facing the opening ap formed in the housing of the electromagnetic wave detection device 10 so that the axis of the opening ap is parallel to the main axis. The axis of the opening ap is the axis of the cylinder in the configuration in which the opening ap is defined by a cylinder such as a lens barrel, and in the configuration formed in the housing itself, the housing around the opening ap It is a line perpendicular to the wall and passing through the center of the opening ap.

The first imaging unit 15 includes, for example, at least one of a lens and a mirror. The first imaging unit 15 forms an image of an electromagnetic wave incident from a target ob as a subject. The first imaging unit 15 may be a retrofocus type lens system.

The separation unit 16 is provided between the first imaging unit 15 and a primary imaging position which is an imaging position of the object ob by the first imaging unit 15. The separating unit 16 separates the electromagnetic wave incident from the first imaging unit 15 so as to travel in the traveling direction d a toward the traveling portion 18 and in the third direction d 3 toward the third detection unit 17. The separating unit 16 may separate the electromagnetic waves of the first frequency among the incident electromagnetic waves so as to travel in the traveling direction d a and the electromagnetic waves of the second frequency in the third direction d 3.

The separating unit 16 separates the incident electromagnetic wave so as to travel in the third direction d3 and the traveling direction da by at least one of reflection, separation, and refraction. In the first embodiment, for example, the separation unit 16 reflects a part of the incident electromagnetic wave in the third direction d3 and transmits another part of the electromagnetic wave in the traveling direction da. In addition, for example, the separation unit 16 may transmit a part of the incident electromagnetic wave in the third direction d3 and reflect another part of the electromagnetic wave in the traveling direction da. In addition, for example, the separation unit 16 may refract part of the incident electromagnetic wave in the third direction d3 and transmit another part of the electromagnetic wave in the traveling direction da. In addition, for example, the separation unit 16 may transmit a part of the incident electromagnetic wave in the third direction d3 and may refract another part of the electromagnetic wave in the traveling part direction da. In addition, for example, the separation unit 16 may refract part of the incident electromagnetic wave in the third direction d3 and refract another part of the electromagnetic wave in the traveling direction da.

The separating unit 16 may include, for example, at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflecting element, and a prism.

The advancing portion 18 is provided on the path of the electromagnetic wave advancing from the separating portion 16 in the advancing portion direction da. Furthermore, the advancing unit 18 is provided at or near the primary imaging position of the object ob by the first imaging unit 15 in the advancing unit direction da.

In the first embodiment, the advancing unit 18 is provided at the primary imaging position. The advancing unit 18 has a reference surface ss on which the electromagnetic wave having passed through the first imaging unit 15 and the separation unit 16 is incident. The reference plane ss is constituted by a plurality of pixels px arranged along a two-dimensional shape. The reference surface ss is a surface that causes the electromagnetic wave to have an action such as reflection and transmission in at least one of a first state and a second state described later. The reference plane ss may be perpendicular to the central axis of the electromagnetic wave traveling from the separation unit 16 in the traveling part direction da.

The advancing unit 18 is switchable for each pixel px between a first state in which the electromagnetic wave incident on the reference plane ss is advanced in the first direction d1 and a second state in which the electromagnetic wave incident in the second direction d2 is advanced. is there. In the first embodiment, the first state is a first reflection state in which an electromagnetic wave incident on the reference surface ss is reflected in a first direction d1. The second state is a second reflection state in which the electromagnetic wave incident on the reference surface ss is reflected in the second direction d2.

In the first embodiment, the advancing unit 18 more specifically includes a reflection surface that reflects an electromagnetic wave for each pixel px. The advancing unit 18 switches the first reflection state and the second reflection state for each pixel px by changing the direction of the reflection surface for each pixel px.

In the first embodiment, the advancing unit 18 includes, for example, a DMD (Digital Micro mirror Device). The DMD can switch the reflective surface to any of + 12 ° and -12 ° with respect to the reference surface ss for each pixel px by driving a minute reflective surface that constitutes the reference surface ss. . The reference surface ss is parallel to the surface of the substrate on which the minute reflective surface of the DMD is placed.

The advancing unit 18 switches the first state and the second state for each pixel px based on the control of the control device 14 described later. For example, the advancing unit 18 may simultaneously cause the electromagnetic wave incident on the pixel px to advance in the first direction d1 by switching a part of the pixels px to the first state, and the other part of the pixels px By switching to the state of 2, the electromagnetic wave incident on the pixel px can be advanced in the second direction d2.

The second imaging unit 19 is disposed in the first direction d1 from the advancing unit 18. The second imaging unit 19 includes, for example, at least one of a lens and a mirror. The second imaging unit 19 is disposed such that the main surface is inclined with respect to the reference surface ss of the advancing unit 18. In addition, the second imaging unit 19 may be disposed so that the main axis passes through the range of the reference surface ss of the advancing unit 18. Furthermore, the second imaging unit 19 may be disposed such that the principal axis passes through the center of the reference plane ss, ie, the center pixel px. The second imaging unit 19 forms an image of the object ob as an electromagnetic wave whose traveling direction has been switched by the traveling unit 18.

The first detection unit 20 is disposed on the path of the electromagnetic wave that travels through the second imaging unit 19 after traveling in the first direction d1 by the traveling unit 18. The first detection unit 20 is disposed at or near the secondary imaging position by the second imaging unit 19 of the image of the electromagnetic wave formed on the reference plane ss of the advancing unit 18. The first detection unit 20 is disposed such that the detection surface is inclined with respect to the reference surface ss, that is, the extension surfaces of the detection surface and the reference surface ss intersect. Further, the first detection unit 20 may be disposed to be inclined with respect to the main surface of the second imaging unit 19. Further, the first detection unit 20 is disposed such that the main axis of the second imaging unit 19 passes through the range of the detection surface of the first detection unit 20. Furthermore, the first detection unit 20 may be disposed such that the main axis of the second imaging unit 19 passes through the center of the detection surface of the first detection unit 20.

The first detection unit 20 may be arranged such that the extension surface of the detection surface intersects with the extension surfaces of the reference surface ss and the main surface of the second imaging unit 19 on a single straight line. Therefore, the reference surface ss, the main surface of the second imaging unit 19, and the detection surface of the first detection unit 20 may be arranged so as to satisfy the condition of the principle of shine proof. The first detection unit 20 detects an electromagnetic wave that has passed through the second imaging unit 19, that is, an electromagnetic wave that has traveled in the first direction d1.

In the first embodiment, the first detection unit 20 is a passive sensor. In the first embodiment, the first detection unit 20 more specifically includes an element array. For example, the first detection unit 20 includes an imaging element such as an image sensor or an imaging array, captures an image of an electromagnetic wave formed on the detection surface, and generates image information corresponding to the captured object ob.

In the first embodiment, more specifically, the first detection unit 20 captures an image of visible light. The first detection unit 20 transmits the generated image information as a signal to the control device 14.

The first detection unit 20 may capture an image other than visible light, such as an infrared, ultraviolet, and radio wave image. Also, the first detection unit 20 may include a distance measurement sensor. In this configuration, the electromagnetic wave detection device 10 can acquire distance information in the form of an image by the first detection unit 20. Further, the first detection unit 20 may include a thermo sensor or the like. In this configuration, the electromagnetic wave detection device 10 can acquire image-like temperature information by the first detection unit 20.

The third imaging unit 21 is disposed in the second direction d2 from the advancing unit 18. The third imaging unit 21 includes, for example, at least one of a lens and a mirror. The third imaging unit 21 is disposed such that the main surface is inclined with respect to the reference surface ss of the advancing unit 18. In addition, the third imaging unit 21 may be disposed so that the main axis passes through the range of the reference surface ss of the advancing unit 18. Furthermore, the third imaging unit 21 may be disposed such that the principal axis passes through the center of the reference plane ss, that is, the center pixel px. The third imaging unit 21 forms an image of the object ob as an electromagnetic wave whose traveling direction has been switched by the traveling unit 18.

The second detection unit 22 is disposed on the path of the electromagnetic wave that travels through the third imaging unit 21 after traveling in the second direction d2 by the traveling unit 18. The second detection unit 22 is disposed at or near the secondary imaging position by the third imaging unit 21 of the image of the electromagnetic wave formed on the reference plane ss of the advancing unit 18. The second detection unit 22 is disposed such that the detection surface is inclined with respect to the reference surface ss, that is, the extension surfaces of the detection surface and the reference surface ss intersect with each other. In addition, the second detection unit 22 is disposed to be inclined with respect to the main surface of the third imaging unit 21. In addition, the second detection unit 22 may be disposed so that the main axis of the third imaging unit 21 passes through the range of the detection surface of the second detection unit 22. Furthermore, the second detection unit 22 may be disposed such that the main axis of the third imaging unit 21 passes through the center of the detection surface of the second detection unit 22.

The second detection unit 22 may be arranged such that the extension surface of the detection surface intersects with the extension surfaces of the reference surface ss and the main surface of the third imaging unit 21 on a single straight line. Therefore, the reference surface ss, the main surface of the third imaging unit 21 and the detection surface of the second detection unit 22 may be arranged so as to satisfy the condition of the principle of shine proof. The second detection unit 22 detects an electromagnetic wave that has passed through the third imaging unit 21, that is, an electromagnetic wave that has traveled in the second direction d2.

In the first embodiment, the second detection unit 22 is an active sensor that detects a reflected wave of the electromagnetic wave emitted from the irradiation unit 12 toward the object ob from the object ob. In the first embodiment, the second detection unit 22 is a reflected wave from the object ob of the electromagnetic wave emitted toward the object ob by being emitted from the irradiation unit 12 and reflected by the reflection unit 13. To detect As described later, the electromagnetic wave emitted from the irradiation unit 12 is at least one of infrared light, visible light, ultraviolet light, and radio waves, and the second detection unit 22 is different from or the same as the first detection unit 20. It is a sensor that detects different or the same kind of electromagnetic waves.

In the first embodiment, the second detection unit 22 more specifically includes an element that constitutes a distance measurement sensor. For example, the second detection unit 22 includes a single element such as an APD (Avalanche Photodiode), a PD (PhotoDiode), a SPAD (Single Photo Avalanche Diode), a millimeter wave sensor, a submillimeter wave sensor, and a distance measurement image sensor. . Further, the second detection unit 22 may include an element array such as an APD array, a PD array, a multiphoton pixel counter (MPPC), a ranging imaging array, and a ranging image sensor.

In the first embodiment, the second detection unit 22 transmits detection information indicating that a reflected wave from a subject is detected to the control device 14 as a signal. More specifically, the second detection unit 22 is an infrared sensor that detects electromagnetic waves in the infrared band.

In addition, in the structure which is the single element which comprises the ranging sensor mentioned above, the 2nd detection part 22 just detects electromagnetic waves, and it is not necessary to image-form in a detection surface. Therefore, the second detection unit 22 may not necessarily be provided in the vicinity of the secondary imaging position or the secondary imaging position which is the imaging position by the third imaging unit 21. That is, in this configuration, if the second detection unit 22 is a position where electromagnetic waves from all angles of view can be incident on the detection surface, the third detection is performed after the advancing unit 18 advances in the advancing portion direction da. It may be disposed anywhere on the path of the electromagnetic wave traveling through the image unit 21.

The third detection unit 17 is provided on the path of the electromagnetic wave traveling from the separation unit 16 in the third direction d3. Furthermore, the third detection unit 17 is provided at or near the imaging position of the object ob by the first imaging unit 15 in the third direction d3 from the separation unit 16. The third detection unit 17 detects an electromagnetic wave that has traveled from the separation unit 16 in the third direction d3.

In the first embodiment, the third detection unit 17 is a passive sensor. In the first embodiment, the third detection unit 17 more specifically includes an element array. For example, the third detection unit 17 includes an imaging element such as an image sensor or an imaging array, captures an image of an electromagnetic wave formed on the detection surface, and generates image information corresponding to the captured object ob.

In the first embodiment, the third detection unit 17 more specifically captures an image of visible light. The third detection unit 17 transmits the generated image information as a signal to the control device 14.

The third detection unit 17 may capture an image other than visible light, such as an infrared, ultraviolet, and radio wave image. In addition, the third detection unit 17 may include a distance measurement sensor. In this configuration, the electromagnetic wave detection device 10 can acquire image-like distance information by the third detection unit 17. Further, the third detection unit 17 may include a distance measuring sensor or a thermo sensor. In this configuration, the electromagnetic wave detection device 10 can acquire image-like temperature information by the third detection unit 17.

The irradiation unit 12 emits at least one of infrared light, visible light, ultraviolet light, and radio waves. In the first embodiment, the irradiation unit 12 emits infrared light. The irradiating unit 12 irradiates the electromagnetic waves to be emitted toward the object ob directly or indirectly via the reflecting unit 13. In the first embodiment, the irradiating unit 12 indirectly irradiates the electromagnetic wave to be emitted toward the object ob via the reflecting unit 13.

In the first embodiment, the irradiation unit 12 emits an electromagnetic wave having a narrow width, for example, a 0.5 ° beam. In the first embodiment, the irradiation unit 12 can emit an electromagnetic wave in a pulse shape. For example, the irradiation unit 12 includes a light emitting diode (LED), a laser diode (LD), and the like. The irradiation unit 12 switches between radiation and stop of the electromagnetic wave based on control of the control device 14 described later.

The reflection unit 13 changes the irradiation position of the electromagnetic wave emitted to the object ob by reflecting the electromagnetic wave emitted from the irradiation unit 12 while changing the direction. That is, the reflection unit 13 scans the object ob with the electromagnetic wave emitted from the irradiation unit 12. Therefore, in the first embodiment, the second detection unit 22 cooperates with the reflection unit 13 to configure a scanning distance measuring sensor. The reflecting unit 13 scans the object ob in a one-dimensional direction or a two-dimensional direction. In the first embodiment, the reflection unit 13 scans the object ob in a two-dimensional direction.

The reflection unit 13 is configured such that at least a part of the irradiation area of the electromagnetic wave emitted and reflected by the irradiation unit 12 is included in the detection range of the electromagnetic wave in the electromagnetic wave detection device 10. Therefore, at least a part of the electromagnetic wave emitted to the object ob through the reflection unit 13 can be detected by the electromagnetic wave detection device 10.

In the first embodiment, at least a part of the irradiation area of the electromagnetic wave emitted from the irradiation unit 12 and reflected by the reflection unit 13 is included in the detection range of the second detection unit 22 in the first embodiment. Is configured. Therefore, in the first embodiment, at least a part of the electromagnetic wave irradiated to the object ob via the reflection unit 13 can be detected by the second detection unit 22.

The reflection unit 13 includes, for example, a micro electro mechanical systems (MEMS) mirror, a polygon mirror, a galvano mirror, and the like. In the first embodiment, the reflection unit 13 includes a MEMS mirror.

The reflection unit 13 changes the direction in which the electromagnetic wave is reflected based on the control of the control device 14 described later. The reflection unit 13 may have an angle sensor such as an encoder, for example, and may notify the control device 14 of an angle detected by the angle sensor as direction information for reflecting an electromagnetic wave. In such a configuration, the control device 14 can calculate the irradiation position based on the direction information acquired from the reflection unit 13. In addition, the control device 14 can calculate the irradiation position based on the drive signal input to cause the reflection unit 13 to change the direction in which the electromagnetic wave is reflected.

Controller 14 includes one or more processors and memory. The processor may include a general-purpose processor that loads a specific program to execute a specific function, and / or a dedicated processor specialized for a specific process. The dedicated processor may include an application specific integrated circuit (ASIC). The processor may include a programmable logic device (PLD). The PLD may include an FPGA (Field-Programmable Gate Array). The controller 14 may include at least one of a system-on-a-chip (SoC) with which one or more processors cooperate, and / or a system in package (SiP).

The control device 14 acquires information related to the periphery of the electromagnetic wave detection device 10 based on the electromagnetic waves detected by the first detection unit 20, the second detection unit 22, and the third detection unit 17, respectively. The information on the surroundings is, for example, image information, distance information, and temperature information. In the first embodiment, as described above, the control device 14 acquires, as image information, the electromagnetic wave detected by the first detection unit 20 or the third detection unit 17 as an image. Further, in the first embodiment, the control device 14 performs the irradiation unit 12 by the time-of-flight (ToF) method as described below based on the detection information detected by the second detection unit 22. The distance information of the irradiation position irradiated to

As shown in FIG. 4, the control device 14 causes the irradiation unit 12 to emit a pulse-like electromagnetic wave by inputting an electromagnetic wave emission signal to the irradiation unit 12 (see “Electromagnetic wave emission signal” column). The irradiating unit 12 irradiates an electromagnetic wave based on the input electromagnetic wave radiation signal (see the “irradiating unit radiation amount” column). The electromagnetic wave emitted by the irradiation unit 12 and reflected by the reflection unit 13 and irradiated to an arbitrary irradiation area is reflected in the irradiation area. The control device 14 switches at least a part of the pixels px in the imaging region in the advancing portion 18 by the first imaging portion 15 of the reflected wave of the irradiation region to the first state, and the other pixels px Switch to state 2. Then, when detecting the electromagnetic wave reflected in the irradiation area (see the “electromagnetic wave detection amount” column), the first detection unit 20 notifies the control device 14 of detection information as described above.

The control device 14 has, for example, a time measurement LSI (Large Scale Integrated circuit), and obtains detection information from the time T1 at which the irradiation unit 12 emits an electromagnetic wave (see “Detection information acquisition” column) The time ΔT to T2 is measured. The control device 14 calculates the distance to the irradiation position by multiplying the time ΔT by the speed of light and dividing it by two. As described above, the control device 14 calculates the irradiation position based on the direction information acquired from the reflection unit 13 or the drive signal output to the reflection unit 13 itself. The control device 14 creates the image-like distance information by calculating the distances to the respective irradiation positions while changing the irradiation positions.

In the first embodiment, as described above, the information acquisition system 11 is configured to generate distance information by Direct ToF which directly measures the time until the electromagnetic wave is emitted and returned. However, the information acquisition system 11 is not limited to such a configuration. For example, the information acquisition system 11 irradiates an electromagnetic wave at a constant cycle, and based on the phase difference between the irradiated electromagnetic wave and the returned electromagnetic wave, the distance information is indirectly measured using Flash ToF, which measures the time to return. You may create it. Further, the information acquisition system 11 may create distance information by another ToF method, for example, Phased ToF.

In the electromagnetic wave detection device 10 according to the first embodiment configured as described above, the traveling unit 18, the second imaging unit 19, and the first detection unit 20 include the reference plane ss and the first detection unit 20. The extension planes of the detection planes intersect, and the principal axis of the second imaging unit 19 is disposed to pass through the reference plane ss and the detection plane of the first detection unit 20. With such a configuration, as shown in FIG. 5, the reference plane ss of the advancing unit 18, the main surface of the second imaging unit 19, and the detection surface of the first detection unit 20 are conditions of the principle of shine proof. Can be arranged to meet Therefore, while the electromagnetic wave detection device 10 is arranged with the second imaging unit 19 shifted from the position facing the traveling unit 18, the second result of the image by the first imaging unit 19 on the reference plane ss is obtained. The image of the electromagnetic wave in the vicinity of the main axis of the image unit 19 can be included in the detection surface of the first detection unit 20 to form an image. Thereby, the electromagnetic wave detection device 10 can improve the resolution of the image of the electromagnetic wave detected by the first detection unit 20. In addition, such a structure and effect are the same also about the electromagnetic wave detection apparatus of 2nd Embodiment mentioned later.

Further, the electromagnetic wave detection device 10 according to the first embodiment can switch the electromagnetic wave between the first state and the second state for each pixel px. With such a configuration, the electromagnetic wave detection device 10 sets the principal axis of the first imaging unit 15 to be the principal axis of the second imaging unit 19 in the first direction d1 in which the electromagnetic wave travels in the first state, and In the second state, it is possible to align with the main axis of the third imaging unit 21 in the second direction d2 in which the electromagnetic wave travels. Therefore, the electromagnetic wave detection device 10 switches the displacement of the main axes of the first detection unit 20 and the second detection unit 22 by switching the pixel px of the advancing unit 18 to either the first state or the second state. It can be reduced. Thereby, the electromagnetic wave detection device 10 can reduce the deviation of the coordinate system in the detection result by the first detection unit 20 and the second detection unit 22. In addition, such a structure and effect are the same also about the electromagnetic wave detection apparatus of 2nd Embodiment mentioned later.

Further, the electromagnetic wave detection device 10 of the first embodiment includes a third imaging unit 21 and a second detection unit 22. With such a configuration, the electromagnetic wave detection device 10 can cause the second detection unit 22 to detect information based on the electromagnetic wave for each portion of the target ob that emits the electromagnetic wave incident on each pixel px. In addition, such a structure and effect are the same also about the electromagnetic wave detection apparatus of 2nd Embodiment mentioned later.

Further, in the electromagnetic wave detection device 10 according to the first embodiment, the traveling unit 18, the third imaging unit 21, and the second detection unit 22 include the reference plane ss, the main surface of the third imaging unit 21, The detection surfaces of the second detection unit 22 and their extension surfaces are all arranged to intersect on the same straight line. With such a configuration, the reference plane ss of the advancing unit 18, the main surface of the third imaging unit 21, and the detection surface of the second detection unit 22 can be arranged to satisfy the condition of the principle of shine proof. . Therefore, in the electromagnetic wave detection device 10, while the third imaging unit 21 is disposed offset from the position facing the traveling unit 18, the second detection of the electromagnetic wave image in the vicinity of the main axis of the third imaging unit 21 is performed. The detection surface of the part 22 can be detected. Thereby, the electromagnetic wave detection device 10 can improve the resolution of the image of the electromagnetic wave detected by the second detection unit 22.

The electromagnetic wave detection device 10 according to the first embodiment separates the electromagnetic wave incident from the first imaging unit 15 so as to travel in the traveling direction d a and the third direction d 3. With such a configuration, the electromagnetic wave detection device 10 has the central axis of the electromagnetic wave advancing the main axis of the first imaging unit 15 in the traveling direction d.sub.a and the central axis of the electromagnetic wave advancing the third direction d.sub.3. It is possible to adjust to Therefore, the electromagnetic wave detection device 10 can reduce the deviation of the coordinate system between the first detection unit 20 and the second detection unit 22 and the third detection unit 17. In addition, such a structure and effect are the same also about the electromagnetic wave detection apparatus of 2nd Embodiment mentioned later.

In addition, the electromagnetic wave detection device 10 of the first embodiment includes a third detection unit 17. With such a configuration, the electromagnetic wave detection device 10 can separately detect an electromagnetic wave that is the same image as the image formed on the first detection unit 20. In addition, such a structure and effect are the same also about the electromagnetic wave detection apparatus of 2nd Embodiment mentioned later.

Moreover, in the information acquisition system 11 of the first embodiment, the control device 14 is based on the electromagnetic waves detected by the first detection unit 20, the second detection unit 22, and the third detection unit 17, respectively. Information on the surroundings of the electromagnetic wave detection device 10 is acquired. With such a configuration, the information acquisition system 11 can provide useful information based on the detected electromagnetic wave.

Next, an electromagnetic wave detection device according to a second embodiment of the present disclosure will be described. In the second embodiment, the first embodiment is implemented in the attitude of the advancing unit and the third detecting unit with respect to the first imaging unit, and the position and attitude of the third imaging unit and the second detecting unit with respect to the advancing unit. It is different from the form. The second embodiment will be described below focusing on differences from the first embodiment. In addition, the same code | symbol is attached | subjected to the site | part which has the same structure as 1st Embodiment.

As shown in FIG. 6, the electromagnetic wave detection device 100 according to the second embodiment includes a first imaging unit 150, a separation unit 16, a traveling unit 180, a second imaging unit 19, and a first detection unit 20. , A third imaging unit 210, a second detection unit 220, and a third detection unit 170. The configuration other than the electromagnetic wave detection device 100 in the information acquisition system 11 according to the second embodiment is the same as that in the first embodiment. The configurations and functions of the separation unit 16, the second imaging unit 19, and the first detection unit 20 in the second embodiment are the same as those in the first embodiment.

In the second embodiment, unlike the first embodiment, the first imaging unit 150 is disposed such that the main axis is inclined with respect to the axis of the opening ap, and the main axis passes through the opening ap . The structure and function of the first imaging unit 150 are the same as the first imaging unit 150 of the first embodiment.

In the second embodiment, unlike the first embodiment, the advancing unit 180 is inclined such that the reference surface ss is inclined with respect to an imaginary plane vp through which the principal axis of the first imaging unit 150 passes, ie, a virtual The extension planes of the plane vp and the reference plane ss are arranged to intersect with each other. The virtual plane vp may be a plane which is separated from the first imaging unit 150 by a predetermined distance and which is perpendicular to the axis of the opening ap. The predetermined distance is the distance from the first image forming unit 150 to the object plane where the distance to the advancing unit 180 is determined and the reference plane ss is the image plane.

Further, in the advancing portion 180, the main surface of the first imaging portion 150 and the extension surface of each of the reference surfaces ss of the advancing portion 180 intersect, that is, the reference surface ss is the main surface of the first imaging portion 150. It may be arranged to be inclined with respect to In the second embodiment, when the separation of the reference surface ss with respect to the main surface of the first imaging unit 150 with respect to the main surface of the first imaging unit 150 is refraction, the incident angle The reference plane ss of the advancing portion 180 rotated about the position of the separating portion 16 in the direction opposite to the direction of refraction by the angle of refraction) means the inclined arrangement with respect to the main surface of the first imaging portion 150. Further, in the second embodiment, when the separation of the reference surface ss with respect to the main surface of the first imaging unit 150 with respect to the main surface of the first imaging unit 150 is the separation in the traveling direction d a This means that the reference plane ss is inclined relative to the main surface of the first imaging unit 150 in a plane-symmetrical posture on the reflection surface of

Further, the advancing unit 180 is disposed such that the main axis of the first imaging unit 150 passes through the range of the reference plane ss of the advancing unit 180. Furthermore, the advancing unit 180 may be disposed such that the principal axis of the first imaging unit 150 passes through the center of the reference plane ss of the advancing unit 180.

Further, the advancing portion 180 may be disposed such that the extension surface of the reference surface ss intersects with the main surface of the first imaging portion 150 and the imaginary plane vp on a single straight line. Therefore, the main surface of the first imaging unit 150, the reference surface ss, and the virtual plane vp are arranged so as to satisfy the condition of the principle of the shine proof.

Furthermore, in the second embodiment, the advancing portion 180 may be disposed such that the second direction d2 advanced by the advancing portion 180 is perpendicular to the reference plane ss. The structure and function of the advancing portion 180 other than the above-described posture are the same as the advancing portion 18 of the first embodiment.

In the second embodiment, as in the first embodiment, the main surface of the second imaging unit 19 is inclined to the reference surface ss of the advancing portion 180 in the first direction d1 advanced by the advancing portion 180. It is arranged as. The other arrangement conditions, structure, and function of the second imaging unit 19 in the second embodiment are the same as those of the second imaging unit 19 in the first embodiment.

In the second embodiment, as in the first embodiment, the first detection unit 20 generates a second-order connection of the image of the electromagnetic wave formed on the reference surface ss of the advancing unit 18 by the second imaging unit 19. It is disposed near the image position or the secondary imaging position. In the second embodiment, in the first detection unit 20, as in the first embodiment, the extension surface of the detection surface is an extension surface of each of the reference surface ss and the main surface of the second imaging unit 19, They are arranged to intersect on a single straight line. Therefore, also in the second embodiment, as in the first embodiment, the reference surface ss, the main surface of the second imaging unit 19, and the detection surface of the first detection unit 20 are of the principle of shine proof. It is arranged to meet the conditions. The other arrangement conditions, structure, and function of the first detection unit 20 in the second embodiment are the same as those of the first detection unit 20 in the first embodiment.

In the second embodiment, unlike the first embodiment, the third imaging unit 210 is disposed such that the main surface is parallel to the reference surface ss of the advancing portion 18. The other arrangement conditions, structure, and function of the third imaging unit 210 in the second embodiment are the same as those of the third imaging unit 21 in the first embodiment.

In the second embodiment, unlike the first embodiment, the second detection unit 220 is disposed such that the detection surface is perpendicular to the main axis of the third imaging unit 210. The other arrangement conditions, structure, and function of the second detection unit 220 in the second embodiment are the same as those of the second detection unit 22 in the first embodiment.

In the second embodiment, unlike the first embodiment, in the third detection unit 170, the extension surface of each of the main surface of the first imaging unit 150 and the detection surface of the third detection unit 170 intersect. That is, the detection surface is disposed to be inclined with respect to the main surface of the first imaging unit 150. In the second embodiment, the inclined arrangement of the detection surface with respect to the main surface of the first imaging unit 150 corresponds to the case where the separation in the third direction d3 by the separation unit 16 is refraction (incident angle (Refractive angle) means the inclined arrangement of the detection surface of the third detection unit 170 with respect to the main surface of the first imaging unit 150 rotated in the direction opposite to the refractive direction about the position of the separation unit 16 as the axis. In the second embodiment, the inclined arrangement of the detection surface with respect to the main surface of the first imaging unit 150 is the separation unit 16 when the separation by the separation unit 16 in the third direction d3 is reflection. This means that the detection surface is inclined relative to the main surface of the first imaging unit 150 in a plane-symmetrical posture on the reflection surface of

In the third detection unit 170 and the first imaging unit 150, the extension surfaces of the main surface of the first imaging unit 150 and the detection surface of the third detection unit 170 are on the imaginary plane vp. , Are arranged to intersect. Therefore, the main surface of the first imaging unit 150, the detection surface of the third detection unit 170, and the imaginary plane vp are arranged so as to satisfy the condition of the principle of the shine proof. The other arrangement conditions, structure, and function of the third detection unit 170 in the second embodiment are the same as those of the third detection unit 17 in the first embodiment.

As described above, in the electromagnetic wave detection device 100 of the second embodiment, the first imaging unit 150 and the advancing unit 180 are based on the virtual plane vp through which the main axis of the first imaging unit 150 passes and the reference of the advancing unit 180 The extension planes of the planes ss intersect, and the principal axis of the first imaging unit 150 is disposed to pass through the reference plane ss. With such a configuration, a virtual plane vp away from the first imaging unit 150 by a predetermined distance, the main surface of the first imaging unit 150, and the reference plane ss of the traveling unit 180, and the second imaging The main surface of the portion 19 and the detection surface of the first detection portion 20 can be arranged to satisfy the conditions of the principle of shine proof. Therefore, in the electromagnetic wave detection device 10, even when the first imaging unit 150 is not disposed at the position facing the advancing unit 180, the first imaging unit 150 is the first object on the virtual plane through which the main axis passes. The image of the electromagnetic wave in the vicinity of the main axis by the first imaging unit 150 may be included in the reference plane ss of the advancing unit 180 to form an image. Thus, in the electromagnetic wave detection device 10, the third imaging unit 210 can be disposed at a position facing the traveling unit 180. As a result, the main axis of the third imaging unit 210 passes through the reference plane ss of the advancing unit 180 while the reference plane ss of the advancing unit 180 and the main surface of the third imaging unit 210 are parallel. , And the third imaging unit 210 can be disposed. With such an arrangement, the electromagnetic wave detection device 10 can form an image of a field angle range in the vicinity of the main axis of the third imaging unit 210 on the second detection unit 220, so detection is performed in the second detection unit 220. The resolution of the electromagnetic wave image can be improved.

Although the present invention has been described based on the drawings and examples, it should be noted that those skilled in the art can easily make various changes and modifications based on the present disclosure. Therefore, it should be noted that these variations and modifications are included in the scope of the present invention.

For example, in the first and second embodiments, the irradiation unit 12, the reflection unit 13, and the control device 14 together with the electromagnetic

wave detection devices

10 and 100 constitute the information acquisition system 11, but the electromagnetic

wave detection device

10, 100 may be configured to include at least one of them, for example, the control device 14 as a control unit.

In the first and second embodiments, the traveling

units

18 and 180 can switch the traveling direction of the electromagnetic wave incident on the reference plane ss in two directions, the first direction d1 and the second direction d2. However, it may be switchable to three or more directions instead of switching to any of the two directions.

Furthermore, in the traveling

units

18 and 180 of the first embodiment and the second embodiment, the first state and the second state reflect electromagnetic waves incident on the reference plane ss in the first direction d1. Of the first reflection state and the second reflection state of reflection in the second direction d2, but may be other modes.

For example, the first state may be a passing state in which an electromagnetic wave incident on the reference surface ss is allowed to pass and travel in the first direction d1. More specifically, the advancing

units

18 and 180 may include a shutter having a reflection surface that reflects an electromagnetic wave in the second direction d2 for each pixel px. In the traveling

units

18 and 180 having such a configuration, by switching the shutter for each pixel px, the pass state or the transmission state as the first state and the reflection state as the second state are switched for each pixel px. obtain. As the advancing

parts

18 and 180 of such a configuration, for example, a MEMS shutter in which a plurality of openable and closable shutters are arranged in an array in a plane can be mentioned.

In addition, the advancing portions 18 and 181 may include a liquid crystal shutter capable of switching between the reflection state of reflecting the electromagnetic wave and the transmission state of transmitting the electromagnetic wave according to the liquid crystal alignment. In the traveling

units

18 and 180 having such a configuration, the transmission state as the first state and the reflection state as the second state can be switched for each pixel px by switching the liquid crystal alignment for each pixel px.

Further, in the first embodiment and the second embodiment, the information acquisition system 11 causes the reflection unit 13 to scan a beam of electromagnetic waves emitted from the irradiation unit 12, thereby the

second detection unit

22, 220. And the reflection unit 13 to function as a scanning type active sensor. However, the information acquisition system 11 is not limited to such a configuration. For example, even when the information acquisition system 11 does not include the reflection unit 13 and radiates radial electromagnetic waves from the irradiation unit 12 and acquires information without scanning, an effect similar to that of the first embodiment can be obtained.

In the first and second embodiments, in the information acquisition system 11, the first detection unit 20 and the

third detection units

17 and 170 are passive sensors, and the second detection unit 220 is active. It has a configuration that is a sensor. However, the information acquisition system 11 is not limited to such a configuration. For example, in the information acquisition system 11, even if the first detection unit 20, the

second detection units

22 and 220, and the

third detection units

17 and 170 are all active sensors or passive sensors, Even in the configuration in which any one is a passive sensor, an effect similar to that of the first embodiment and the second embodiment can be obtained.

Here, the system is disclosed as having various modules and / or units for performing specific functions, and these modules and units are schematically shown to briefly describe their functionality. It should be noted that what is shown is not necessarily indicative of a specific hardware and / or software. In that sense, these modules, units, and other components may be hardware and / or software implemented to perform substantially the particular functions described herein. The various functions of different components may be any combination or separation of hardware and / or software, and may be used separately or in any combination. Also, connect input / output or I / O devices or user interfaces, including but not limited to keyboards, displays, touch screens, pointing devices, etc., directly to the system or through intervening I / O controllers Can. As such, various aspects of the disclosure may be embodied in many different aspects, all of which are within the scope of the disclosure.

DESCRIPTION OF

SYMBOLS

10, 100 Electromagnetic wave detection apparatus 11 Information acquisition system 12 Irradiation part 13 Reflection part 14 Control part 15 1st imaging part 15 'Primary imaging optical system 16 Separation part 17

3rd detection part

18, 180 Progress part 18' Progress Part 19 second imaging part 19 'secondary imaging optical system 20 first detection part 20' detection part 21 third imaging part 22 second detection part ap aperture da traveling part direction d1, d2, d3 First direction, second direction, third direction ob target px pixel ss action surface vp virtual plane

Claims

A first imaging unit for imaging an incident electromagnetic wave;
A traveling unit configured to arrange a plurality of pixels along a reference plane, and to cause an electromagnetic wave incident on the reference plane from the first imaging unit to travel in a first direction for each of the pixels;
A second imaging unit that forms an image of the electromagnetic wave that has traveled in the first direction;
A first detection unit that detects an electromagnetic wave incident from the second imaging unit;
An extension surface of each of the reference surface and the detection surface of the first detection unit intersected, and a main axis of the second imaging unit passing through the detection surface of the reference surface and the first detection unit;
The object plane of the first imaging unit whose distance from the advancing unit is determined and whose reference plane is the image plane intersects the reference plane with the respective extension planes, and the main axis of the first imaging unit An arrangement passing through the reference plane,
An electromagnetic wave detection device in which at least one of the two is satisfied.
In the electromagnetic wave detection device according to claim 1,
An arrangement in which the main axis of the second imaging unit passes through the center of the reference surface and the center of the detection surface of the first detection unit;
An arrangement in which the main axis of the first imaging unit passes through the center of the reference plane;
At least one of is satisfied,
Electromagnetic wave detector.
In the electromagnetic wave detection device according to claim 1 or 2,
An arrangement in which the extension surfaces of the reference surface, the main surface of the second imaging unit, and the detection surface of the first detection unit all intersect on the same straight line;
An arrangement in which the extension surfaces of the reference surface and the main surface of the first imaging unit intersect each other;
At least one of is satisfied,
Electromagnetic wave detector.
In the electromagnetic wave detection device according to any one of claims 1 to 3,
An arrangement in which the reference surface, the main surface of the second imaging unit, and the detection surface of the first detection unit satisfy the condition of the principle of shine proof;
An arrangement in which the main surface of the first imaging unit and the reference surface satisfy the condition of the principle of shine proof;
At least one of is satisfied,
Electromagnetic wave detector.
The electromagnetic wave detection device according to any one of claims 1 to 4.
The advancing unit advances, in each of the pixels, a first state in which an electromagnetic wave incident on the reference surface from the first imaging unit is advanced in the first direction and a second state in which the electromagnetic wave is advanced in a second direction. An electromagnetic wave detection device that can be switched to
In the electromagnetic wave detection device according to claim 5,
A third imaging unit for imaging the electromagnetic wave that has traveled in the second direction;
And a second detection unit that detects an electromagnetic wave incident from the third imaging unit.
In the electromagnetic wave detection device according to claim 6,
The extension plane of each of the reference plane and the detection plane of the second detection unit intersects, and the main axis of the third imaging unit passes through the detection plane of the reference plane and the second detection unit. Detection device.
In the electromagnetic wave detection device according to claim 6 or 7,
The main axis of said 3rd image formation part is the arrangement | positioning which passes along the center of said reference plane, and the center of the detection surface of said 2nd detection part. The electromagnetic wave detection apparatus.
In the electromagnetic wave detection device according to any one of claims 6 to 8,
An electromagnetic wave detection device, wherein the reference surface, the main surface of the third imaging unit, and the detection surface of the second detection unit are arranged such that their extension surfaces all intersect on the same straight line.
In the electromagnetic wave detection device according to any one of claims 6 to 9,
The reference plane, the main surface of the third imaging unit, and the detection surface of the second detection unit are arranged to satisfy the condition of the principle of shine proof.
The electromagnetic wave detection device according to any one of claims 7 to 10.
The advancing unit includes a reflective surface for each of the pixels, and the direction of the reflective surface can be changed for each of the pixels.
In the electromagnetic wave detection device according to claim 11,
The advancing unit switches the first state and the second state for each pixel by changing the direction of the reflective surface for each pixel.
In the electromagnetic wave detection device according to claim 12,
The advancing portion includes a digital micro mirror device in which a plurality of mirrors are arranged in a plane, and the first state is changed for each pixel by changing the direction of each mirror of the digital micro mirror device for each pixel. And an electromagnetic wave detection device that switches the second state.
The electromagnetic wave detection device according to any one of claims 7 to 10.
The advancing unit includes a reflection surface for each of the pixels, and the reflection surface can be opened and closed for each of the pixels.
In the electromagnetic wave detection device according to claim 14,
The advancing unit switches the first state and the second state for each pixel by opening and closing the reflective surface for each pixel. An electromagnetic wave detection device.
In the electromagnetic wave detection device according to claim 15,
The advancing unit includes a MEMS shutter in which a plurality of shutters capable of opening and closing the reflective surface for each pixel are arranged in a plane, and opening and closing each shutter of the MEMS shutter allows the first for each pixel. An electromagnetic wave detection device that switches the state of and the second state.
The electromagnetic wave detection device according to any one of claims 7 to 10.
The advancing unit is capable of switching a reflection state of reflecting an electromagnetic wave and a transmission state of transmitting an electromagnetic wave for each pixel according to a liquid crystal alignment.
In the electromagnetic wave detection device according to claim 17,
The advancing unit switches the first state and the second state for each pixel by switching the reflection state and the transmission state for each pixel according to the liquid crystal alignment.
In the electromagnetic wave detection device according to claim 18,
The advancing portion includes a liquid crystal shutter capable of switching between the reflection state and the transmission state according to the liquid crystal alignment, and switching the liquid crystal alignment of the liquid crystal shutter allows the first state and the first state for each pixel. An electromagnetic wave detection device that switches the second state.
In the electromagnetic wave detection device according to any one of claims 1 to 19,
The first detection unit includes at least one of PD, APD, SPAD, MPPC, image sensor, infrared sensor, millimeter wave sensor, submillimeter wave sensor, distance measurement image sensor, distance measurement sensor, or thermo sensor. apparatus.
The electromagnetic wave detection device according to any one of claims 1 to 20,
The first detection unit detects at least one of infrared light, visible light, ultraviolet light, and radio waves.
In the electromagnetic wave detection device according to claim 8,
The second detection unit includes a sensor of the same type or different type as the first detection unit.
The electromagnetic wave detection device according to any one of claims 1 to 22,
An electromagnetic wave detection device, further comprising: a separation unit configured to separate an electromagnetic wave incident from the first imaging unit so as to travel in the traveling direction and a third direction.
In the electromagnetic wave detection device according to claim 23,
The separation unit separates an electromagnetic wave of a first frequency among the electromagnetic waves incident from the first imaging unit to the traveling unit, and an electromagnetic wave of a second frequency to travel in the third direction.
Electromagnetic wave detector.
In the electromagnetic wave detection device according to claim 23 or 24,
The separating unit separates an incident electromagnetic wave so as to travel in the traveling direction and a third direction by at least one of reflection, transmission, and refraction.
The electromagnetic wave detection device according to any one of claims 23 to 25,
The separation unit transmits part of an incident electromagnetic wave to the traveling part, and reflects another part of the electromagnetic wave in the third direction.
The electromagnetic wave detection device according to any one of claims 23 to 25,
The separation unit reflects a part of the incident electromagnetic wave to the traveling part, and transmits another part of the electromagnetic wave in the third direction.
The electromagnetic wave detection device according to any one of claims 23 to 25,
The separation unit transmits a part of the incident electromagnetic wave to the traveling part, and refracts another part of the electromagnetic wave in the third direction.
The electromagnetic wave detection device according to any one of claims 23 to 25,
The separation unit refracts a part of the incident electromagnetic wave to the traveling part, and transmits another part of the electromagnetic wave in the third direction.
The electromagnetic wave detection device according to any one of claims 23 to 25,
The separation unit refracts a part of the incident electromagnetic wave to the traveling part, and refracts another part of the electromagnetic wave in the third direction.
The electromagnetic wave detection device according to any one of claims 23 to 30,
The separation unit includes at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism.
The electromagnetic wave detection device according to any one of claims 23 to 31,
An electromagnetic wave detection device, further comprising: a third detection unit that detects an electromagnetic wave that has traveled in the third direction.
The electromagnetic wave detection device according to any one of claims 1 to 32,
The first imaging unit is a retrofocus type lens system.
The electromagnetic wave detection device according to any one of claims 1 to 33,
An electromagnetic wave detection device, further comprising: a control unit that acquires information on surroundings based on the electromagnetic wave detected by the first detection unit.
In the electromagnetic wave detection device according to claim 8,
An electromagnetic wave detection device, further comprising: a control unit that acquires information on the surroundings based on the electromagnetic wave detected by the second detection unit.
In the electromagnetic wave detection device according to claim 32,
An electromagnetic wave detection device, further comprising: a control unit that acquires information on the surroundings based on the electromagnetic wave detected by the third detection unit.
The electromagnetic wave detection device according to any one of claims 1 to 33,
An information acquisition system comprising: a control device for acquiring information related to the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the first detection unit.
An electromagnetic wave detection device according to claim 6;
An information acquisition system comprising: a control device that acquires information related to the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the second detection unit.
An electromagnetic wave detection device according to claim 32;
An information acquisition system comprising: a control device for acquiring information related to the periphery of the electromagnetic wave detection device based on the electromagnetic wave detected by the third detection unit.
A first imaging unit for imaging an incident electromagnetic wave;
A traveling unit configured to arrange a plurality of pixels along a reference plane, and to cause an electromagnetic wave incident on the reference plane from the first imaging unit to travel in a first direction for each of the pixels;
A second imaging unit that forms an image of the electromagnetic wave that has traveled in the first direction;
A first detection unit that detects an electromagnetic wave incident from the second imaging unit;
An arrangement in which an image in the vicinity of the main axis by the second imaging unit of the image by the first imaging unit on the reference plane is included in the detection surface of the first detection unit;
An arrangement in which an image in the vicinity of the main axis by the first image forming unit is included in the reference plane, of an object through which the main axis of the first image forming unit passes;
At least one of is satisfied,
Electromagnetic wave detector.