WO2019127802A1 - 用于液晶配向的供电装置及配向紫外线光学照射机 - Google Patents

用于液晶配向的供电装置及配向紫外线光学照射机 Download PDF

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WO2019127802A1
WO2019127802A1 PCT/CN2018/074194 CN2018074194W WO2019127802A1 WO 2019127802 A1 WO2019127802 A1 WO 2019127802A1 CN 2018074194 W CN2018074194 W CN 2018074194W WO 2019127802 A1 WO2019127802 A1 WO 2019127802A1
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probe
driving
power supply
power
probe set
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PCT/CN2018/074194
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English (en)
French (fr)
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刘小成
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深圳市华星光电技术有限公司
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Publication of WO2019127802A1 publication Critical patent/WO2019127802A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
    • G02F1/133788—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation by light irradiation, e.g. linearly polarised light photo-polymerisation

Definitions

  • the present invention relates to the field of liquid crystal alignment, and more particularly to a power supply device capable of improving liquid crystal alignment abnormality and an alignment ultraviolet optical irradiation machine including the same.
  • TFT-LCDs thin film transistor liquid crystal displays
  • IPS Twisted Nematic
  • STN SuperTwisted Nematic
  • VA Vertical Alignment
  • HVA High Vertical Alignment
  • the HVA technology can make the liquid crystal panel have the advantages of faster response time and high transmittance, and is characterized in that polymer protrusions are formed on the surface of the alignment film, so that the liquid crystal molecules have a pretilt angle.
  • HVA technology is the same as other technologies, and it is also necessary to pre-tilt the liquid crystal molecules. This is the optical alignment technology.
  • a liquid crystal layer between two glass substrates is filled with liquid crystal molecules, and a reactive monomer (Monomer) is mixed with liquid crystal molecules, and a surface of the substrate is coated with polyimide. (polyimide, PI) as an alignment substrate.
  • UVM Ultraviolet Meter
  • UVM Ultraviolet Meter
  • FIG. 1 is a schematic illustration of a prior art alignment ultraviolet optical illumination machine.
  • 2 is a schematic circuit diagram of a power supply device of a prior art alignment ultraviolet optical irradiation machine.
  • the power supply mode of the alignment ultraviolet optical illuminator 100 is performed by electrically contacting seven sets of probes on the probe bar 120 with corresponding electrodes on the glass substrate, and passing through the control device 140.
  • the power supply module 130 is controlled to supply power to the stamping fixture 120 to perform power-on control of the substrate 110.
  • the HVA power supply device is mostly a single drive design, that is, the probe ODD/EVEN of the stamping tool 120 only generates a set of gate line signals as driving signals to control the substrate.
  • the size of the product increases, for example, when the size of the product is 55 ⁇ , 65 ⁇ or more, the number of traces required for the same substrate is gradually increased, and as people demand the sharpness, the product is gradually increased.
  • the resolution of the HVA power supply device is increasing, and the driving signal is gradually weakened, which leads to an increasingly prominent problem of insufficient driving in a remote place. Therefore, some products have adopted a dual-drive design, that is, the probe of the stamping tool generates two sets of driving signals to control the substrate.
  • the driving signals of the two sets of probes are respectively input from both sides of the substrate, so that there are differences in the traces of the driving signals on both sides, thereby causing a difference in driving voltages on both sides, thereby causing a problem of alignment abnormality.
  • the present invention is directed to a power supply device for liquid crystal alignment and an aligning ultraviolet optical illuminator including the power supply device, which can reduce the difference in resistance caused by the difference in the distance between the two sets of driving signals. Improve the problem of alignment abnormalities.
  • a power supply apparatus for liquid crystal alignment comprising: an electroforming tool, including a first driving probe set and a second driving probe set, a first driving probe set and a second driving
  • the probe set has a plurality of probes respectively;
  • the substrate includes a plurality of electrodes electrically contacting the first drive probe set and the second drive probe set, respectively; and the power module is connected to the probe of the imprinting tool, Supplying power thereto; controlling means connected to the power module to control the power module such that the power module issues a predetermined electrical signal to each of the probes; and sliding varistor means between the power module and the first driving probe set, wherein
  • the electrode corresponding to the first driving probe group and the electrode corresponding to the second driving probe group are respectively located on two sides of the substrate, and the length of the first driving probe group to the corresponding electrode is smaller than the second driving probe.
  • the first driving probe set may include a first probe and a second probe
  • the second driving probe set may include a third probe and a fourth probe
  • the first probe The needle can be in close proximity to the second probe and the third probe can be in close proximity to the fourth probe.
  • the electromotive tool may further include: a fifth probe, a sixth probe, a seventh probe, an eighth probe, and a ninth probe.
  • the substrate may further include a plurality of electrodes in electrical contact with the fifth probe, the sixth probe, the seventh probe, the eighth probe, and the ninth probe, respectively.
  • the power module may include a first power source and a second power source, the first power source may be an alternating current power source, and the second power source may be a direct current power source.
  • the first driving probe set and the second driving probe set may be respectively connected to the second power source.
  • the fifth probe and the sixth probe may be connected to the first power source, and the seventh probe, the eighth probe, and the ninth probe may be connected to a ground end of the first power source or the second power source.
  • the sliding varistor may be a sliding varistor that manually controls its resistance value.
  • a sliding varistor device may include a computing device, a controller, and a sliding varistor, wherein the controller automatically adjusts a resistance value of the sliding varistor in response to control of the computing device, thereby balancing the first driving probe Trace resistance values of the needle set and the second drive probe set.
  • an alignment ultraviolet optical irradiation machine comprising: an electrophoresis tool comprising: a first driving probe set and a second driving probe set, a first driving probe set and a second driving probe
  • the needle set has a plurality of probes respectively;
  • the substrate comprises a plurality of electrodes respectively in electrical contact with the first driving probe set and the second driving probe set; and the power module is connected with the probe of the imprinting tool to The power supply;
  • the control device is connected to the power module to control the power module, so that the power module sends a predetermined electrical signal to each probe;
  • the ultraviolet lamp group includes a plurality of ultraviolet light sources to emit ultraviolet light; and a sliding varistor device, Located between the power module and the first driving probe set, wherein the electrode corresponding to the first driving probe group and the electrode corresponding to the second driving probe group are respectively located on two sides of the substrate, and the first driving probe group The trace length to the electrode corresponding thereto is smaller than the trace length of the second drive probe group to the
  • the sliding varistor may be a sliding varistor that manually controls its resistance value.
  • a sliding varistor device may include a computing device, a controller, and a sliding varistor, wherein the controller automatically adjusts a resistance value of the sliding varistor in response to control of the computing device, thereby balancing the first driving probe Trace resistance values of the needle set and the second drive probe set.
  • Figure 1 is a schematic view of a prior art alignment ultraviolet light irradiator
  • FIG. 2 is a schematic circuit diagram of a power supply device of a prior art alignment ultraviolet optical irradiation machine
  • FIG. 3 is a schematic view of a power supply device of an alignment ultraviolet irradiation machine according to an exemplary embodiment of the present invention
  • FIG. 4 is a schematic circuit diagram of a power supply device for an alignment ultraviolet ray irradiator according to an exemplary embodiment of the present invention
  • Figure 5 is a schematic view of a power supply device of an alignment ultraviolet irradiation machine of a comparative example
  • FIG. 6 is a schematic circuit diagram of a power supply device of a aligning ultraviolet ray irradiator of a comparative example
  • FIG. 7 is a schematic diagram of a power supply device for an alignment ultraviolet ray irradiator according to another exemplary embodiment of the present invention.
  • first, second, etc. may be used herein to describe various elements, components, regions, layers and/or portions, and these elements, components, regions, layers and/or portions are not limited by these terms. The terms are used to distinguish one element, component, region, layer, and/or portion from another element, component, region, layer and/or portion.
  • first element, the first component, the first region, the first layer, and/or the first portion discussed below can be termed a second element, a second component, a second, without departing from the teachings of the present invention. Area, second layer and/or second part.
  • FIG. 3 is a schematic diagram of a power supply device for an ultraviolet light illuminating machine according to an exemplary embodiment of the present invention.
  • an alignment ultraviolet optical illuminator 100 may include a power supply device for liquid crystal alignment and an ultraviolet lamp group 150.
  • the power supply device may include a substrate 110, an electroformer 120, a power module 130, and a control device 140.
  • the stamping tool 120 may have a first driving probe set and a second driving probe set, the first driving probe set and the second driving probe set respectively having a plurality of probes.
  • the first driving probe set may include a first probe ODD1 and a second probe EVEN1
  • the second driving probe set may include a third probe ODD2 and a fourth probe EVEN2.
  • the first probe ODD1 and the second probe EVEN1 may be in close proximity to each other.
  • the third probe ODD2 and the fourth probe EVEN2 may be in close proximity to each other.
  • the stamping tool 120 may further include a fifth probe A-com for providing an array common voltage, a sixth probe CF-com for providing a color filter common voltage, A seventh probe R for supplying a red pixel voltage, an eighth probe G for supplying a green pixel voltage, and a plurality of probes for providing a ninth probe B of a blue pixel voltage.
  • the substrate 110 includes a plurality of electrodes that are in electrical contact with the first set of drive probes and the second set of drive probes, respectively.
  • the substrate 110 may have a plurality of electrodes respectively corresponding to the respective probes.
  • the first driving probe groups ODD1 and EVEN1 and the second driving probe groups ODD2 and EVEN2 can be electrically contacted with corresponding ones of the plurality of electrodes on the substrate 110, respectively, and It supplies a gate line signal, wherein the electrode corresponding to the first driving probe group and the electrode corresponding to the second driving probe group are respectively located on both sides of the substrate 110.
  • the fifth probe A-com may be in electrical contact with a corresponding plurality of electrodes on the substrate 110 and supply an array common voltage signal to the substrate 110.
  • the sixth probe CF-com can be in electrical contact with a corresponding plurality of electrodes on the substrate 110 and supply a color filter common voltage signal thereto.
  • the seventh probe R, the eighth probe G, and the ninth probe B may be electrically contacted with a plurality of corresponding electrodes on the substrate 110, respectively, to supply data line signals corresponding to the red, green, and blue pixels thereto.
  • the power module 130 is electrically coupled to the stamping tool 120 to supply power thereto.
  • the power module 130 may include a first power source 131 and a second power source 132.
  • the first power source 131 and the second power source 132 each have a power output and a ground.
  • the first power source 131 may be an alternating current power source whose power output terminal HI outputs alternating current and is connected to the fifth probe A-com and the sixth probe CF-com.
  • the second power source 132 can be a DC power source, and the power output terminal HI outputs DC power and is connected to the two driving probe groups ODD1/EVEN1 and ODD2/EVEN2.
  • the seventh probe R to the ninth probe B may be respectively connected to the ground GND of the second power source 132 to have a ground voltage, but the present invention is not limited thereto.
  • the seventh probe R to the ninth probe B may also be connected to the ground of the first power source 131 to have a ground voltage.
  • the output voltage properties of the first power source and the second power source are interchangeable.
  • the first power source may be a DC power source
  • the second power source may be an AC power source.
  • the fifth probe A-com and the sixth probe CF-com may be connected to the second power source.
  • the power output terminal is connected, and the first driving probe group ODD1/EVEN1 can be connected to the second driving probe group ODD2/EVEN2 and the power output of the first power source.
  • the control device 140 is connected to the power module 130 to control the power module 130 such that the power module 130 emits a predetermined electrical signal to each probe.
  • the control device 140 can be electrically connected to the power module 130 and then power-on the substrate 110.
  • the control device 140 may be implemented by a computer or a single chip microcomputer or the like, but the present invention is not limited thereto.
  • the ultraviolet lamp set 150 of the alignment ultraviolet optical irradiator 100 includes a plurality of ultraviolet light sources to emit ultraviolet light.
  • the ultraviolet light irradiates the monomer added to the liquid crystal under power-on conditions, and forms the recombination body to form a liquid crystal pretilt angle on the surface of the PI alignment film, thereby completing liquid crystal alignment.
  • FIG. 4 is a schematic circuit diagram of a power supply device for an ultraviolet light illuminating machine according to an exemplary embodiment of the present invention.
  • the electrodes corresponding to the first driving probe group and the electrodes corresponding to the second driving probe group are respectively located on both sides of the substrate 110. Therefore, there is a difference in resistance and driving voltage between the two sides of the wiring.
  • a sliding varistor 160 for adjusting the resistance is further disposed between the power supply module 130 and the first driving probe group ODD1/EVEN1.
  • FIG. 5 is a schematic view of a power supply device of a aligning ultraviolet ray irradiator of a comparative example
  • FIG. 6 is a schematic circuit diagram of a power supply device of a aligning ultraviolet ray irradiator of a comparative example.
  • the power supply device in the comparative example is substantially the same as the power supply device described in the foregoing embodiment except that the sliding varistor is not provided, and thus a detailed description thereof will be omitted.
  • the two sets of driving signals emitted from the first driving probe group and the second driving probe group are respectively input through the electrodes at the edge of the pad, and thus the two sets of driving signals are respectively from the two substrates.
  • Side power supply therefore, there is a difference in the traces between the two sets of drive signals, one side (for example, the trace of the drive signal from the first drive probe set ODD1/EVEN1) is shorter, the other side (for example, from The driving signal sent by the second driving probe group ODD2/EVEN2 is longer, and the shorter one has a smaller resistance, and the longer one has a larger resistance.
  • a 55-inch product is used.
  • the difference in resistance between the two sides of the trace length can reach about 500 ohms, the difference is large. Since the two sets of driving signals are powered by the same power source, a large difference in resistance will cause a large difference in driving voltages on both sides, and thus an alignment abnormality occurs.
  • the sliding varistor 160 is connected between the power module 130 and the first driving probe group having a short wiring, by adjusting the sliding varistor 160.
  • the trace resistance of the drive signal of the first drive probe group is increased such that the resistance value after the adjustment is equal to the trace resistance value of the drive signal of the second drive probe group, thereby improving the problem of alignment abnormality.
  • the resistance in the line will increase.
  • the voltage of the power supply can be appropriately increased according to the actual test result to avoid the influence of the increase in resistance.
  • the difference in trace resistance between the two sides of the HVA power supply device of different products will be different, so the resistance value of the sliding resistor can be manually adjusted according to actual needs.
  • the stamping tool 120 is mounted on the substrate 110 and the probes are electrically contacted with the corresponding electrodes.
  • the control device 140 controls the power module 130 to supply power to the stamping tool 120, and the electrical signals (for example, including A-com signals, CF-com signals, gate line signals, and data line signals, etc.) flow through the corresponding probes.
  • Corresponding electrodes are used to electrically load the substrate 110.
  • the ultraviolet lamp group 150 is turned on, and the plurality of ultraviolet light sources of the ultraviolet lamp group 150 emit ultraviolet light, and the ultraviolet light irradiates the monomer added to the liquid crystal under the condition of being charged, and forms the recombination body of the monomer. To form a liquid crystal pretilt angle on the surface of the PI alignment film, thereby completing liquid crystal alignment.
  • FIG. 7 is a schematic diagram of a power supply device for an alignment ultraviolet ray irradiator according to another exemplary embodiment of the present invention.
  • the alignment ultraviolet irradiation machine 300 may include the substrate 310, the stamping tool 320, and the power module 330.
  • the substrate 310, the stamping tool 320, the power module 330, the control device 340, and the ultraviolet lamp set 350 are substantially the same as the substrate 110, the stamping tool 120, the power module 130, the control device 140, and the ultraviolet lamp group 150 described with reference to the foregoing embodiments. Therefore, a detailed description thereof will be omitted.
  • a sliding varistor 360 is located between the power module 330 and the first set of drive probes.
  • the sliding varistor 360 may be a sliding varistor that manually controls its resistance value.
  • the sliding varistor module 360 of the alignment UV illuminator can include a sliding varistor 361, a controller 362, and a computing device 363.
  • the sliding varistor 361 can be connected between the second power source 332 and the first driving probe set to adjust the routing resistance
  • the controller 362 can be connected between the sliding varistor 361 and the computing device 363 to The resistance value of the sliding varistor 361 is automatically adjusted in response to a control signal from the computing device 363 to balance the wire resistance values of the first driving probe set and the second driving probe set.
  • exemplary embodiments of the inventive concept are not limited to the manner in which the resistance value is adjusted as described above.
  • the resistance value of the sliding varistor can be adjusted in various ways.
  • the resistance value of the sliding varistor can be controlled by manual input to facilitate operation and monitoring. Different resistance values can also be preset by product type, when switching products. Automatically change the resistance value of the sliding varistor to avoid accidents caused by manual intervention; or coordinate with the array factory to transmit the difference value of the resistance value of each area measured by the array to the aligning ultraviolet illuminator, and differently according to different regions Change the sliding varistor resistance value.
  • the embodiments of the present invention provide a power supply device for liquid crystal alignment and an alignment ultraviolet optical irradiation machine including the power supply device.
  • the power supply device adopts a double drive signal, and a sliding varistor device is added to a group of driving lines with a short trace to increase the resistance value of the trace to achieve the purpose of substantially equalizing the trace resistance on both sides.
  • the sliding varistor device can adjust the resistance value within a certain range to meet the resistance difference between the two sets of driving signals of different products.

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Abstract

一种用于液晶配向的供电装置以及配向紫外光照射机（100），用于液晶配向的供电装置包括：印加电冶具（120），包括第一驱动探针组以及第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针；基板（110），包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极；电源模块（130），与印加电冶具（120）的探针连接，以向其供电；控制装置（140），与电源模块（130）连接，以控制电源模块（130），使得电源模块（130）发出预定的电信号至各个探针；滑动变阻装置（160），位于电源模块（130）和第一驱动探针组之间，其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板（110）的两侧，并且第一驱动探针组到与其对应的电极的走线长度小于第二驱动探针组到与其对应的电极的走线长度。

Description

用于液晶配向的供电装置及配向紫外线光学照射机 技术领域
本发明涉及液晶配向领域，尤其涉及一种能够改善液晶配向异常的供电装置及包括其的配向紫外线光学照射机。
背景技术
目前，薄膜晶体管液晶显示器(TFT-LCD)由于色彩度高、体积小、功耗低等优势而在平板显示领域中占主流位置。就目前主流市场上的TFT-LCD显示面板而言，可分为三种类型，分别是扭曲向列(TwistedNematic，TN)或超扭曲向列(SuperTwistedNematic，STN)型，面内切换(In-Plane Switching，IPS)型以及垂直配向(VerticalAlignment，VA)型，其中，VA型液晶显示器相对其他种类的液晶显示器具有极高的对比度，在诸如电视等的大尺寸显示方面具有非常广的应用。高垂直配向(HighVerticalAlignment，HVA)技术就是其中比较热门的一种VA技术。HVA技术能够使液晶面板具有较快的响应时间、穿透率高等优点，其特点是在配向膜表面形成聚合物突起，从而使液晶分子具有预倾角。HVA技术和其他技术相同，也需要对液晶分子做预倾角处理，这就是光配向技术。
在应用光配向技术的液晶显示器中，两玻璃基板之间的液晶层内填充有液晶分子，同时掺有反应型单体(Monomer)混合于液晶分子，并且基板的表面涂布有聚酰亚胺(polyimide，PI)作为配向基材。UVM(UltravioletMeter)即配向紫外线光学照射机对以上玻璃基板施加电压并进行紫外光照射，使单体与液晶分子产生相分离(phase separation)现象，并朝基板的PI基材聚集，从而形成聚合物(Polymer)。由于聚合物跟液晶分子之间的相互作用，液晶分子将沿着聚合分子的方向排列而形成预倾角，从而完成液晶配向。
图1是现有技术的配向紫外线光学照射机的示意图。图2是现有技术的配向紫外线光学照射机的供电装置的示意性电路图。如图1所示，配向紫外线光学照射机100的加电方式是通过将印加电冶具(Probe Bar)120上的七组探针 与玻璃基板上相应的电极对位电接触，并且通过控制装置140来控制电源模块130对印加电治具120供电，从而对基板110进行加电控制。
目前，如图2所示，HVA供电装置大多为单驱动设计，即，印加电冶具120的探针ODD/EVEN仅产生一组栅极线信号作为驱动信号对基板进行控制。然而随着产品尺寸的逐渐加大，例如，当产品的尺寸为55吋、65吋或更大时，同一个基板需要的走线逐渐增多，并且随着人们对清晰度的要求逐渐提高，产品的解析度也越来越高，因此HVA供电装置的走线增长、驱动信号逐步衰弱，导致走线较远的地方驱动不足的问题日益突出。因此，已经有部分产品采用双驱动设计，即，印加电冶具的探针产生两组驱动信号对基板进行控制。然而，所述两组探针的驱动信号分别从基板的两侧输入，因此使两侧驱动信号的走线存在差异，进而导致两侧驱动电压存在差异，从而出现配向异常的问题。
发明内容
为了解决上述至少一个技术问题，本发明意图提出一种用于液晶配向的供电装置及包括该供电装置的配向紫外线光学照射机，其能够减少两组驱动信号走线距离不同而导致的电阻差异，改善配向异常的问题。
本发明的一方面，提供了一种用于液晶配向的供电装置，其包括：印加电冶具，包括第一驱动探针组以及第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针；基板，包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极；电源模块，与印加电冶具的探针连接，以向其供电；控制装置，与电源模块连接，以控制电源模块，使得电源模块发出预定的电信号至各个探针；以及滑动变阻装置，位于电源模块和第一驱动探针组之间，其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板的两侧，并且第一驱动探针组到与其对应的电极的走线长度小于第二驱动探针组到与其对应的电极的走线长度。
根据本发明的示例性实施例，第一驱动探针组可以包括第一探针和第二探针，所述第二驱动探针组可以包括第三探针和第四探针，第一探针可以与第二探针紧邻，第三探针可以与第四探针紧邻。
根据本发明的示例性实施例，印加电冶具还可以包括：第五探针、第六探针、第七探针、第八探针及第九探针。基板还可以包括分别与第五探针、第六 探针、第七探针、第八探针及第九探针对位电接触的多个电极。
根据本发明的示例性实施例，电源模块可以包括第一电源和第二电源，第一电源可以为交流电源，第二电源可以为直流电源。
根据本发明的示例性实施例，第一驱动探针组和第二驱动探针组可以分别与第二电源连接。第五探针和第六探针可以与第一电源连接，第七探针、第八探针和第九探针可以与第一电源或第二电源的接地端连接。
根据本发明的示例性实施例，滑动变阻装置可以为通过手动控制其电阻值的滑动变阻器。
根据本发明的示例性实施例，滑动变阻装置可以包括计算装置、控制器和滑动变阻器，其中，控制器响应于计算装置的控制对滑动变阻器的电阻值进行自动调节，从而平衡第一驱动探针组和第二驱动探针组的走线电阻值。
本发明的另一方面，提供了一种配向紫外线光学照射机，其包括：印加电冶具，包括第一驱动探针组以及第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针；基板，包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极；电源模块，与印加电冶具的探针连接，以向其供电；控制装置，与电源模块连接，以控制电源模块，使得电源模块发出预定的电信号至各个探针；紫外灯组，包括多个紫外光源，以发射紫外光；以及滑动变阻装置，位于电源模块和第一驱动探针组之间，其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板的两侧，并且第一驱动探针组到与其对应的电极的走线长度小于第二驱动探针组到与其对应的电极的走线长度。
根据本发明的示例性实施例，滑动变阻装置可以为通过手动控制其电阻值的滑动变阻器。
根据本发明的示例性实施例，滑动变阻装置可以包括计算装置、控制器和滑动变阻器，其中，控制器响应于计算装置的控制对滑动变阻器的电阻值进行自动调节，从而平衡第一驱动探针组和第二驱动探针组的走线电阻值。
附图说明
图1是现有技术的配向紫外线光学照射机的示意图；
图2是现有技术的配向紫外线光学照射机的供电装置的示意性电路图；
图3是根据本发明的示例性实施例的配向紫外线照射机的供电装置的示意图；
图4是根据本发明的示例性实施例的配向紫外线照射机的供电装置的示意性电路图；
图5是对比示例的配向紫外线照射机的供电装置的示意图；
图6是对比示例的配向紫外线照射机的供电装置的示意性电路图；以及
图7是根据本发明的另一示例性实施例的配向紫外线照射机的供电装置的示意图。
具体实施方式
在下面的描述中，出于说明的目的，阐述了许多具体细节以提供对各种示例性实施例的彻底理解。然而，明显的是，可以不用这些具体细节来实践各种示例性实施例，或者可以利用一种或者更多种等同布置来实践各种示例性实施例。在其他情况下，以框图形式示出了公知的结构和装置以避免使各种示例性实施例不必要地模糊。此外，同样的附图标记指示同样的元件。
尽管在这里可使用术语第一、第二等来描述各种元件、组件、区域、层和/或部分，但是这些元件、组件、区域、层和/或部分不应被这些术语限制。这些术语用来将一个元件、组件、区域、层和/或部分与另一元件、组件、区域、层和/或部分区分开。因此，在不脱离本发明的教导的情况下，下面讨论的第一元件、第一组件、第一区域、第一层和/或第一部分可以被命名为第二元件、第二组件、第二区域、第二层和/或第二部分。
除非另外定义，否则这里使用的所有术语(包括技术术语和科学术语)具有与本领域普通技术人员通常理解的含义相同的含义。除非在这里如此明确地定义，否则术语(诸如在通用字典中定义的术语)应被解释为具有与在相关领域的上下文中的它们的含义相一致的含义，而将不以理想化或过于形式化的意思来解释。
以下，将参照附图描述本发明的示例性实施例。
图3是根据本发明的示例性实施例的配向紫外线光学照射机的供电装置的示意图。
参照图1和图3，根据本发明的示例性实施例的配向紫外线光学照射机100可以包括用于液晶配向的供电装置和紫外灯组150。所述供电装置可以包括基板110、印加电冶具120、电源模块130以及控制装置140。
印加电冶具120可以具有第一驱动探针组和第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针。作为示例，如图3所示，第一驱动探针组可以包括第一探针ODD1和第二探针EVEN1，第二驱动探针组可以包括第三探针ODD2和第四探针EVEN2。第一探针ODD1和第二探针EVEN1可以彼此紧邻。第三探针ODD2和第四探针EVEN2可以彼此紧邻。
此外，在本示例性实施例中，印加电冶具120还可以包括用于提供阵列共电压的第五探针A-com、用于提供彩色滤光片共电压的第六探针CF-com、用于提供红色像素电压的第七探针R、用于提供绿色像素电压的第八探针G和用于提供蓝色像素电压的第九探针B等的多个探针。
基板110包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极。在本实施例中，基板110上可以具有分别与各探针对应的多个电极。当印加电冶具120安装到基板110上时，第一驱动探针组ODD1和EVEN1以及第二驱动探针组ODD2和EVEN2可以分别与基板110上的对应的多个电极对位电接触，并向其供应栅极线信号，其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板110的两侧。
在本示例性实施例中，第五探针A-com可以与基板110上对应的多个电极对位电接触，并向基板110供应阵列共电压信号。第六探针CF-com可以与基板110上对应的多个电极对位电接触，并向其供应彩色滤光片共电压信号。第七探针R、第八探针G和第九探针B可以分别与基板110上对应的多个电极对位电接触以向其供应与红色、绿色和蓝色像素对应的数据线信号。
电源模块130与印加电冶具120电连接以向其供电。在本实施例中，如图3所示，电源模块130可以包括第一电源131和第二电源132。第一电源131和第二电源132均具有一个电源输出端和一个接地端。作为示例，第一电源131可以为交流电源，其电源输出端HI输出交流电并且与第五探针A-com和第六 探针CF-com连接。第二电源132可以为直流电源，其电源输出端HI输出直流电并且与两个驱动探针组ODD1/EVEN1以及ODD2/EVEN2连接。
此外，在本实施例中，第七探针R至第九探针B可以分别与第二电源132的接地端GND连接以具有接地电压，但本发明不限于此。在另一示例性实施例中，第七探针R至第九探针B也可与第一电源131的接地端相连以具有接地电压。此外，第一电源和第二电源的输出电压性质可以互换。在另一示例性实施例中，第一电源可以为直流电源，第二电源可以为交流电源，在此情况下，第五探针A-com和第六探针CF-com可以与第二电源的电源输出端连接，第一驱动探针组ODD1/EVEN1可以与第二驱动探针组ODD2/EVEN2与第一电源的电源输出端连接。
控制装置140与电源模块130连接，以控制电源模块130，使得电源模块130发出预定的电信号至各个探针。在本实施例中，控制装置140可以与电源模块130电连接并进而对基板110进行加电控制。作为示例，控制装置140可以由计算机或单片机等来实现，但是本发明不限于此。
另外，配向紫外线光学照射机100的紫外灯组150包括多个紫外光源，以发射紫外光。所述紫外光在加电的条件下照射加入液晶的单体，并使所述单体形成重合体，以在PI配向膜表面形成液晶预倾角，从而完成液晶配向。
图4是根据本发明的示例性实施例的配向紫外线光学照射机的供电装置的示意性电路图。如图4所示，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板110的两侧，因此，两侧走线的电阻及驱动电压均存在差异。为了解决上述问题，在根据本发明的示例性实施例的配向紫外光照射机中，在电源模块130与第一驱动探针组ODD1/EVEN1之间还设置有调节电阻的滑动变阻器160。
下面参照对比示例描述本发明构思。
图5是对比示例的配向紫外线照射机的供电装置的示意图，图6是对比示例的配向紫外线照射机的供电装置的示意性电路图。在图5和图6所示的供电装置中，除了不具有滑动变阻器之外，对比示例中的供电装置与根据前述实施例描述的供电装置基本相同，因此省略对其的详细描述。
从图6的示意性电路图可以看出，从第一驱动探针组和第二驱动探针组发 出的两组驱动信号分别通过焊盘边缘的电极输入，因而两组驱动信号分别从基板的两侧供电，因此，两组驱动信号之间的走线存在差异，一侧(例如，从第一驱动探针组ODD1/EVEN1发出的驱动信号的走线)较短，另一侧(例如，从第二驱动探针组ODD2/EVEN2发出的驱动信号)较长，其中较短的走线，其电阻也较小，而较长的走线其电阻也较大，以55吋的产品为例，两侧走线长度不同导致的电阻差异可以达到约500欧姆，差异较大。由于两组驱动信号由同一个电源供电，较大的电阻差异将导致两侧的驱动电压存在较大的差异，因而出现配向异常的问题。
然而，返回参照图4，在根据本发明的示例性实施例的供电装置中，在电源模块130和走线较短的第一驱动探针组之间接入滑动变阻器160，通过调节滑动变阻器160来增加第一驱动探针组的驱动信号的走线电阻，使得调节之后的电阻值与第二驱动探针组的驱动信号的走线电阻值相等，从而改善了配向异常的问题。
此外，由于新增了滑动变阻器，因此线路中的电阻会有所增加，为此，可根据实际的测试结果来适当地增加电源供电的电压，以避免电阻增大所带来的影响。此外，不同产品的HVA供电装置的两侧走线电阻差异会有所不同，因此可以根据实际需求手动调整滑动电阻器的电阻值大小。
在使用根据本发明的示例性实施例的配向紫外照射机时，将印加电冶具120安装到基板110上，并使得各探针与对应的电极对位电接触。此时，控制装置140控制电源模块130对印加电冶具120进行供电，电信号(例如，包括A-com信号、CF-com信号、栅极线信号及数据线信号等)通过相应的探针流向对应的电极，从而对基板110进行电信号加载。此时，打开紫外灯组150，所述紫外灯组150的多个紫外光源发射紫外光，所述紫外光在加电的条件下照射加入液晶的单体，并使所述单体形成重合体，以在PI配向膜表面形成液晶预倾角，从而完成液晶配向。
图7是根据本发明的另一示例性实施例的配向紫外线照射机的供电装置的示意图。
虽然图7中未示出，但是与前面参照图3至图4描述的配向紫外线照射机相似，根据本示例性实施例的配向紫外照射机300可以包括基板310、印加电冶具320、电源模块330、控制装置340、紫外灯组350和滑动变阻装置360。 基板310、印加电冶具320、电源模块330、控制装置340和紫外灯组350与参照前述实施例描述的基板110、印加电冶具120、电源模块130、控制装置140以及紫外灯组150基本相同，因此省略对其的详细描述。
参照图7，滑动变阻装置360位于电源模块330与第一驱动探针组之间。在一个示例性实施例中，滑动变阻装置360可以是通过手动控制其电阻值的滑动变阻器。
在另一个示例性实施例中，配向紫外照射机的滑动变阻模块360可以包括滑动变阻器361、控制器362和计算装置363。在本示例性实施例中，滑动变阻器361可以连接在第二电源332与第一驱动探针组之间以调节走线电阻，控制器362可以连接在滑动变阻器361和计算装置363之间，以响应于计算装置363的控制信号对滑动变阻器361的电阻值进行自动调节，从而平衡第一驱动探针组和第二驱动探针组的走线电阻值。
然而，发明构思的示例性实施例不限于上述调节电阻值的方式。可以采用多种方式来调节滑动变阻器的电阻值，例如，可以通过手动输入方式来控制滑动变阻器的电阻值以便于操作及监控；也可以通过产品类型预设好不同的电阻值，在切换产品时进行自动变更滑动变阻器电阻值从而避免人员手动介入而出错；还可以与阵列厂实现联动，将阵列量测出来的各区域的电阻值差异值传给配向紫外照射机，并且根据不同的区域不同地变更滑动变阻器电阻值。
综上所述，本发明的实施例提供一种用于液晶配向的供电装置以及包括该供电装置的配向紫外光学照射机。所述供电装置采用双驱信号，并且在走线较短的一组驱动线路中加入滑动变阻装置来增加走线的电阻值，以达到两侧走线电阻基本相等的目的。另外，该滑动变阻装置可以在一定的范围调整电阻值以满足不同产品两组驱动信号之间的电阻差异。
虽然在此已经描述了某些示例性实施例和实施方式，但是通过此说明，其他实施例和修改将是明显的。因此，本发明构思不限于这些实施例，而是限于所提出的权利要求以及各种明显的修改和等同布置的较宽的范围。

Claims (10)

  1. 一种用于液晶配向的供电装置，所述供电装置包括：
    印加电冶具，包括第一驱动探针组以及第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针；
    基板，包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极；
    电源模块，与印加电冶具的探针连接，以向其供电；
    控制装置，与电源模块连接，以控制电源模块，使得电源模块发出预定的电信号至各个探针；以及
    滑动变阻装置，位于电源模块和第一驱动探针组之间，
    其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板的两侧，并且第一驱动探针组到与其对应的电极的走线长度小于第二驱动探针组到与其对应的电极的走线长度。
  2. 根据权利要求1所述的供电装置，其中，所述第一驱动探针组包括第一探针和第二探针，所述第二驱动探针组包括第三探针和第四探针，第一探针与第二探针紧邻，第三探针与第四探针紧邻。
  3. 根据权利要求2所述的供电装置，其中，所述印加电冶具还包括：第五探针、第六探针、第七探针、第八探针及第九探针，
    其中，所述基板还包括分别与第五探针、第六探针、第七探针、第八探针及第九探针对位电接触的多个电极。
  4. 根据权利要求3所述的供电装置，其中，所述电源模块包括第一电源和第二电源，其中，第一电源为交流电源，第二电源为直流电源。
  5. 根据权利要求4所述的供电装置，其中，第一驱动探针组和第二驱动探针组分别与第二电源连接，并且
    其中，第五探针和第六探针与第一电源连接，第七探针、第八探针和第九 探针与第一电源或第二电源的接地端连接。
  6. 根据权利要求1所述的供电装置，其中，所述滑动变阻装置为通过手动控制其电阻值的滑动变阻器。
  7. 根据权利要求1所述的供电装置，其中，所述滑动变阻装置包括计算装置、控制器和滑动变阻器，其中，控制器响应于计算装置的控制对滑动变阻器的电阻值进行自动调节，从而平衡第一驱动探针组和第二驱动探针组的走线电阻值。
  8. 一种配向紫外线光学照射机，所述配向紫外线光学照射机包括：
    印加电冶具，包括第一驱动探针组以及第二驱动探针组，第一驱动探针组和第二驱动探针组分别具有多个探针；
    基板，包括分别与第一驱动探针组和第二驱动探针组对位电接触的多个电极；
    电源模块，与印加电冶具的探针连接，以向其供电；
    控制装置，与电源模块连接，以控制电源模块，使得电源模块发出预定的电信号至各个探针；
    紫外灯组，包括多个紫外光源，以发射紫外光；以及
    滑动变阻装置，位于电源模块和第一驱动探针组之间，
    其中，对应于第一驱动探针组的电极与对应于第二驱动探针组的电极分别位于基板的两侧，并且第一驱动探针组到与其对应的电极的走线长度小于第二驱动探针组到与其对应的电极的走线长度。
  9. 根据权利要求8所述的配向紫外线光学照射机，其中，所述滑动变阻装置为通过手动控制其电阻值的滑动变阻器。
  10. 根据权利要求8所述的配向紫外线光学照射机，其中，所述滑动变阻装置包括计算装置、控制器和滑动变阻器，其中，控制器响应于计算装置的控制对滑动变阻器的电阻值进行自动调节，从而平衡第一驱动探针组和第二驱动探针组的走线电阻值。
PCT/CN2018/074194 2017-12-28 2018-01-25 用于液晶配向的供电装置及配向紫外线光学照射机 WO2019127802A1 (zh)

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