WO2019096751A3 - Procédé et dispositif de détermination de l'indice de réfraction d'un milieu - Google Patents

Procédé et dispositif de détermination de l'indice de réfraction d'un milieu Download PDF

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Publication number
WO2019096751A3
WO2019096751A3 PCT/EP2018/080981 EP2018080981W WO2019096751A3 WO 2019096751 A3 WO2019096751 A3 WO 2019096751A3 EP 2018080981 W EP2018080981 W EP 2018080981W WO 2019096751 A3 WO2019096751 A3 WO 2019096751A3
Authority
WO
WIPO (PCT)
Prior art keywords
medium
optical element
refractive index
interface
determining
Prior art date
Application number
PCT/EP2018/080981
Other languages
German (de)
English (en)
Other versions
WO2019096751A2 (fr
Inventor
Karl Joachim Ebeling
Rainer Michalzik
Original Assignee
Universität Ulm Institut Für Optoelektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universität Ulm Institut Für Optoelektronik filed Critical Universität Ulm Institut Für Optoelektronik
Publication of WO2019096751A2 publication Critical patent/WO2019096751A2/fr
Publication of WO2019096751A3 publication Critical patent/WO2019096751A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/262—Optical details of coupling light into, or out of, or between fibre ends, e.g. special fibre end shapes or associated optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N2021/436—Sensing resonant reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings

Abstract

La présente invention concerne généralement un procédé de mesure d'au moins une caractéristique d'un milieu à étudier, de préférence de détermination de l'indice de réfraction du milieu. L'invention concerne en outre un dispositif approprié à la détermination de l'indice de réfraction d'un milieu, comprenant un élément optique approprié à la mise en œuvre du procédé. L'élément optique comprend une interface, laquelle sert à établir en surface un contact direct avec le milieu à étudier pendant la mesure, cette interface de l'élément optique étant équipée d'un système de vision agissant comme un résonateur, qui permet des réflexions multiples pour le rayonnement électromagnétique incident.
PCT/EP2018/080981 2017-11-14 2018-11-12 Procédé et dispositif de détermination de l'indice de réfraction d'un milieu WO2019096751A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102017126708.5 2017-11-14
DE102017126708.5A DE102017126708A1 (de) 2017-11-14 2017-11-14 Verfahren und Vorrichtung zur Bestimmung des Brechungsindex eines Mediums

Publications (2)

Publication Number Publication Date
WO2019096751A2 WO2019096751A2 (fr) 2019-05-23
WO2019096751A3 true WO2019096751A3 (fr) 2019-10-10

Family

ID=64332282

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2018/080981 WO2019096751A2 (fr) 2017-11-14 2018-11-12 Procédé et dispositif de détermination de l'indice de réfraction d'un milieu

Country Status (2)

Country Link
DE (1) DE102017126708A1 (fr)
WO (1) WO2019096751A2 (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0478137A2 (fr) * 1990-09-26 1992-04-01 Gec-Marconi Limited Senseur optique

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008014335B4 (de) 2008-03-14 2009-12-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Bestimmung einer Brechzahl eines Messobjekts
DE102009055737A1 (de) 2009-11-25 2011-05-26 Friedrich-Schiller-Universität Jena Optische Vorrichtung zur Erzeugung einer störfähigen internen Totalreflexion und deren Verwendung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0478137A2 (fr) * 1990-09-26 1992-04-01 Gec-Marconi Limited Senseur optique

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KIM K S ET AL: "Refractive index sensor for liquids and solids using dielectric multilayer films deposited on optical fiber end surface", QUANTUM ELECTRONICS CONFERENCE&LASERS AND ELECTRO-OPTICS (CLEO/IQEC/PACIFIC RIM), 2011, IEEE, 28 August 2011 (2011-08-28), pages 837 - 839, XP032175354, ISBN: 978-1-4577-1939-4, DOI: 10.1109/IQEC-CLEO.2011.6193851 *
SFEZ B G ET AL: "HIGH CONTRAST MULTIPLE QUANTUM WELL OPTICAL BISTABLE DEVICE WITH INTEGRATED BRAGG REFLECTORS", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 57, no. 4, 23 July 1990 (1990-07-23), pages 324 - 326, XP000150110, ISSN: 0003-6951, DOI: 10.1063/1.103679 *
TOMITA A ET AL: "5:1 ON-OFF CONTRAST INGAAS/INP MULTIPLE QUANTUM WELL FABRY-PEROT ETALON MODULATOR", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 55, no. 18, 30 October 1989 (1989-10-30), pages 1817 - 1819, XP000099968, ISSN: 0003-6951, DOI: 10.1063/1.102175 *

Also Published As

Publication number Publication date
DE102017126708A1 (de) 2019-05-16
WO2019096751A2 (fr) 2019-05-23

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