WO2019001821A1 - Microscope et procédé d'observation d'un échantillon au microscope en utilisant un paramètre mécanique modifiable - Google Patents

Microscope et procédé d'observation d'un échantillon au microscope en utilisant un paramètre mécanique modifiable Download PDF

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Publication number
WO2019001821A1
WO2019001821A1 PCT/EP2018/062184 EP2018062184W WO2019001821A1 WO 2019001821 A1 WO2019001821 A1 WO 2019001821A1 EP 2018062184 W EP2018062184 W EP 2018062184W WO 2019001821 A1 WO2019001821 A1 WO 2019001821A1
Authority
WO
WIPO (PCT)
Prior art keywords
value
mechanical parameter
sample
microscope
mechanical
Prior art date
Application number
PCT/EP2018/062184
Other languages
German (de)
English (en)
Inventor
Alexander Gaiduk
Detlef Hein
Pavlos ILIOPOULOS
Original Assignee
Carl Zeiss Microscopy Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy Gmbh filed Critical Carl Zeiss Microscopy Gmbh
Priority to CN201880043531.5A priority Critical patent/CN110799879A/zh
Publication of WO2019001821A1 publication Critical patent/WO2019001821A1/fr

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/02—Heads
    • F16M11/04—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand
    • F16M11/06—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand allowing pivoting
    • F16M11/10—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand allowing pivoting around a horizontal axis
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/02—Heads
    • F16M11/18—Heads with mechanism for moving the apparatus relatively to the stand
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Definitions

  • the present invention relates to a microscope and a
  • Microscope a mechanical parameter is changeable.
  • the mechanical parameter is preferably formed by an angle of inclination, which in at least one spatial direction between a
  • Lens of the microscope and a stage of the microscope is changeable.
  • This tilt angle describes an inclination between the lens and the stage, which is also referred to as tilt.
  • JP 2001059599 A2 and JP 2010102344 A2 show
  • Schwenkarmstativ includes a pivotable about a horizontal axis of rotation pivot arm.
  • a Schwenkarmstativ for a digital microscope is known in which a Schwenkarmamba is blocked by a arranged around a rotation axis High Torque magnetic brake.
  • the blocking may be for the duration of a key press
  • the button is arranged on the swivel arm so that it can be comfortably pressed with at least one finger of the same hand.
  • the US 6,642,686 Bl shows a controllable rotary arm, with which supports in particular medical operations can be.
  • the rotary arm can, for example, carry a microscope as an instrument.
  • the object of the present invention starting from the prior art is the application possibilities for a
  • Microscope in which a mechanical parameter, such as a tilt angle between a lens and a stage is changeable to expand.
  • a mechanical parameter such as a tilt angle between a lens and a stage is changeable to expand.
  • the method according to the invention is used for microscopying a sample with a microscope, in particular with a digital microscope
  • Microscope In the digital microscope is preferably an electronic image conversion, wherein the recorded image processed in the form of digital data and brought to display on an electronic image display device.
  • the microscope preferably comprises at least one objective and preferably an image sensor for converting an image imaged directly or indirectly on the image sensor from the objective.
  • a mechanical parameter is changeable.
  • the mechanical parameter is preferably formed by a position, by an angle or by a distance, which on the sample, on a stage, on the image sensor, on the lens, on a lens component, on a filter and / or on a Illumination source of the
  • the mechanical parameter for example, by a height and / or a lateral position of the stage, by a distance from the image sensor or be formed by a zoom setting.
  • the mechanical parameter is alternatively preferably formed by a position, by an angle or by a distance of a setting element, which serves to set a physical size on the microscope.
  • it may be a
  • rotatable adjusting element with which, for example, a wavelength, a brightness on the microscope or a
  • the mechanical parameter is preferred by a
  • Inclination formed which is changeable in at least one spatial direction between the lens of the microscope and the stage of the microscope.
  • the microscope is the
  • Object table serves to arrange the sample.
  • the inclination angle is defined between an optical axis of the objective and a perpendicular on the stage.
  • the inclination angle describes a tilt between the lens and the
  • Inclination axis is formed by a rotation axis of the inclination, which is aligned perpendicular to the optical axis.
  • the angle of inclination is in at least one spatial direction
  • Spherical coordinates can be defined by two values.
  • the method includes a step of selecting a first value of the mechanical parameter to be set.
  • Parameters defines the extent of the mechanical parameters after adjustment.
  • an electrically controllable electromechanical Actuator driven to set the first set value of the mechanical parameter.
  • Preferred embodiments of the method according to the invention further comprise a step, each after the
  • Actuate the electrically controllable actuator is carried out.
  • the sample is focused; in particular a refocusing of the sample, since the change of the mechanical parameter,
  • the sample no longer necessarily be focused through the lens. Alternatively or additionally, this is done again
  • Object table is shifted in height and / or laterally.
  • Parameter is adjustable and adjustable. By energizing the electric motor, the mechanical parameter can be adjusted.
  • the mechanical parameter can be adjusted.
  • the actuating element is formed by an electrically controllable locking device, with which the mechanical parameters can be determined.
  • the locking device is preferably by an electrically controllable mechanical brake or by a high-torque Magnetic brake formed. In this second preferred
  • Partial steps In a sub-step, an initial value 0 start of the inclination angle is measured, for which purpose preferably an angle sensor is used. In a further step, a
  • the mechanical parameter is formed by the angle of inclination
  • the objective is preferably attached to a pivoting arm of the microscope.
  • the swivel arm may be a component of a
  • the swivel arm can also as
  • Tiltarm be called.
  • the swivel arm is pivotable, whereby the angle of inclination between the lens the
  • Object table is changeable.
  • the object table is preferably rotatable.
  • the object table is preferably rotatable in an axis which is arranged parallel to the extension plane of the object table or particularly preferably in the
  • Extension plane of the object table is located. By rotating the object table in this axis, the angle of inclination between the lens of the stage is changeable.
  • Method a further step in which a response is generated to the operator when the value of the mechanical Parameter was changed by a predefined measure and / or if the value of the mechanical
  • Parameters was set. As a result, the operation of the microscope is facilitated because the operator can quickly detect whether the value of the mechanical parameter to be set has already been achieved. In addition, the operator can each receive a feedback when the value of the mechanical
  • the feedback to the operator is particularly haptic perceptible and is preferably generated with the electrically operable locking device.
  • the mechanical parameter is formed by the inclination angle
  • rotatable object table preferably interrupted in their temporal change briefly, what the operator can feel, so that the operator becomes aware that the value of the inclination angle has been changed by a predefined amount.
  • the interruptions of the temporal change of the value of the inclination angle are generated in particular by the fact that the electrically operable locking device in the form of a brake interrupts the pivoting movement of the pivoting arm or the rotation of the rotatable object table for a very short period of time.
  • the feedback to the operator is alternatively or additionally preferred acoustically perceptible and is preferred with a buzzer or a comparable acoustic signal generator generated.
  • a buzzer or a comparable acoustic signal generator generated.
  • the method according to the invention is to be set in each case
  • Value of the mechanical parameter selected from several stored values.
  • the stored values are preferably selected during the performance of the inventive method for a previously microscoped sample and thereafter
  • stored values preferably represent pre-programming or a presetting to which during the
  • Performing the procedure is accessed.
  • the respective value of the mechanical parameter to be set is selected by incrementing the previously selected value of the mechanical parameter by one increment.
  • the sample is characterized in terms of
  • the first value of the mechanical parameter represents a starting value.
  • the method preferably comprises a step in which another one of the other values of the
  • Actuating element to set the further value to be set of the mechanical parameter.
  • Step is taking a further microscopic image of the sample below the set further value of the mechanical parameter.
  • Microscopy of at least two samples formed.
  • magnifications of the image are obtained for taking the first microscopic image of the sample and for taking up the second microscopic image and, if appropriate, for taking the further microscopic images
  • a plurality of the values of the mechanical parameter preferably formed by the tilt angle are selected and adjusted to produce a corresponding plurality of
  • microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of the sample. Since the sample is microscopically examined under different values of the angle of inclination or a sample distance, microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of the sample. Since the sample is microscopically examined under different values of the angle of inclination or a sample distance, microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of the sample. Since the sample is microscopically examined under different values of the angle of inclination or a sample distance, microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of the sample. Since the sample is microscopically examined under different values of the angle of inclination or a sample distance, microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of the sample. Since the sample is microscopically examined under different values of the angle of inclination or a sample distance, microscopic images can also be used to generate the 2, 5-dimensional or 3-dimensional representation of
  • the microscope according to the invention is used for microscopy of a sample. It preferably comprises an objective for the optical
  • the microscope further preferably comprises a stage for placing the sample.
  • a mechanical parameter on the microscope is changeable. As a mechanical parameter, an inclination angle between the
  • the microscope also comprises an electrically controllable actuating element for setting a value of the mechanical parameter and a control unit which is used to execute the
  • Control unit is preferred for execution preferred
  • the microscope preferably also has features which are specified in connection with the method according to the invention.
  • Drawing. 1 shows a first preferred embodiment of a microscope according to the invention; a second preferred embodiment of the microscope according to the invention;
  • FIG. 3 shows the microscope shown in FIG. 1 in two states while carrying out a method according to the invention
  • FIG. and Fig. 4 The microscope shown in Fig. 2 in two states during the implementation of the method according to the invention.
  • Stand 01 can be pivoted, so that it also with respect to the stage 02 and thereon a sample 06 (shown in Fig. 2) tilts.
  • a lens 07 and an optical module 08 are attached on the pivot arm 03.
  • Pivoting the pivot arm 03 can be unlocked via an unlock key 09.
  • FIG. 2 shows a second preferred embodiment of the microscope according to the invention which, like the embodiment shown in FIG. 1, comprises the stage 02, the objective 07 and the optical module 08.
  • the lens 07 and the optical module 08 are not attached to a pivotable pivot arm, but arranged fixed. Instead, that is
  • Object table 02 rotatable.
  • the rotational movement of the object table 02 can be braked with the electrically operable brake 11, so that the object table 02 can be fixed with regard to its rotatability.
  • the embodiment shown in FIG. 2 comprises a further objective 12 and a further optical module 13, which are arranged below the stage 02.
  • Fig. 3 shows the microscope shown in Fig. 1 in two
  • FIG. 3 shows the microscope in an initial situation in which the pivot arm 03 is not inclined, so that an inclination angle ⁇ is equal to zero.
  • Tilt angle ⁇ selected.
  • Inclination angle ⁇ is set according to the method, which is made possible by pressing the unlock key 09.
  • electromotive actuator 04 is continued until the value to be set ⁇ ⁇ ⁇ ⁇ ⁇ of the inclination angle ⁇ is reached.
  • Fig. 4 shows the microscope shown in Fig. 2 in two
  • Fig. 4 shows the microscope in an initial situation in which the stage 02 is not inclined, so that an inclination angle ⁇ is equal to zero. According to the method, a value to be set ⁇ ⁇ ⁇ ⁇ ⁇ des
  • Tilt angle ⁇ selected.
  • Fig. 3 shows the microscope in a
  • Inclination angle ⁇ is set according to the procedure.
  • Object table 02 is rotated manually, wherein the object table 02 has already been rotated to a value 0 a ktueii of the inclination angle ⁇ .
  • the rotational movement of the object table 02 is measured and a time is predicted at which the value to be set ⁇ ⁇ ⁇ ⁇ ⁇ of the inclination angle ⁇ is achieved. At this time, the electric
  • actuated brake 11 is controlled so that another

Abstract

La présente invention concerne un microscope et un procédé d'observation d'un échantillon au microscope, un paramètre mécanique (θ) du microscope pouvant être modifié. Au cours d'une étape du procédé, une première valeur à régler (θZiel) du paramètre mécanique (θ) est sélectionnée. Un élément d'actionnement pouvant être commandé électriquement (04) est commandé de manière à régler la première valeur à régler (θZiel) du paramètre mécanique (θ). Une première image microscopique de l'échantillon est acquise en utilisant la première valeur réglée (θZiel) du paramètre mécanique (θ). Au cours d'une autre étape, une seconde valeur à régler (θZiel) du paramètre mécanique (θ) est sélectionnée. L'élément d'actionnement pouvant être commandé électriquement (04) est commandé de manière à régler la seconde valeur à régler (θZiel) du paramètre mécanique (θ). Une seconde image microscopique de l'échantillon est acquise en utilisant la seconde valeur réglée (θZiel) du paramètre mécanique (θ).
PCT/EP2018/062184 2017-06-29 2018-05-11 Microscope et procédé d'observation d'un échantillon au microscope en utilisant un paramètre mécanique modifiable WO2019001821A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201880043531.5A CN110799879A (zh) 2017-06-29 2018-05-11 显微镜以及在可变机械参数下显微检查样本的方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102017114562.1 2017-06-29
DE102017114562.1A DE102017114562A1 (de) 2017-06-29 2017-06-29 Mikroskop und Verfahren zum Mikroskopieren einer Probe unter einem veränderbaren mechanischen Parameter

Publications (1)

Publication Number Publication Date
WO2019001821A1 true WO2019001821A1 (fr) 2019-01-03

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PCT/EP2018/062184 WO2019001821A1 (fr) 2017-06-29 2018-05-11 Microscope et procédé d'observation d'un échantillon au microscope en utilisant un paramètre mécanique modifiable

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CN (1) CN110799879A (fr)
DE (1) DE102017114562A1 (fr)
WO (1) WO2019001821A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112241066B (zh) * 2020-11-11 2022-06-10 中国矿业大学 多角度成像显微镜和铁谱磨粒三维形貌重建方法

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001059599A (ja) 1999-06-15 2001-03-06 Keyence Corp 拡大観察用のスタンド装置
US6642686B1 (en) 2001-11-09 2003-11-04 Brianlab Ag Swivel arm with passive actuators
US20030223111A1 (en) * 2002-05-31 2003-12-04 Mcnc Sample analysis device having a eucentric goniometer and associated method
US20050237604A1 (en) * 2004-04-07 2005-10-27 Yoshihiro Kawano In-vivo examination apparatus
JP2010102344A (ja) 1999-06-15 2010-05-06 Keyence Corp 拡大観察装置及び拡大観察方法
DE102012215307A1 (de) * 2011-08-31 2013-02-28 Keyence Corporation Vergrößerungsbeobachtungsvorrichtung, Vergrößerungsbeobachtungsverfahren und Vergrößerungsbeobachtungsprogramm
JP2013088490A (ja) * 2011-10-14 2013-05-13 Nikon Corp 顕微鏡、画像取得方法、プログラム、及び記録媒体
DE102013005999A1 (de) 2013-04-09 2014-10-09 Carl Zeiss Microscopy Gmbh Schwenkarmstativ für Digitalmikroskope
DE102013222295A1 (de) 2013-11-04 2015-05-07 Carl Zeiss Microscopy Gmbh Digitalmikroskop, Verfahren zur Kalibrierung und Verfahren zur automatischen Fokus- und Bildmittennachführung für ein solches Digitalmikroskop
EP3006980A1 (fr) * 2014-10-06 2016-04-13 Leica Microsystems (Schweiz) AG Microscope numérique doté d'un système de frein à piston radial

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001059599A (ja) 1999-06-15 2001-03-06 Keyence Corp 拡大観察用のスタンド装置
JP2010102344A (ja) 1999-06-15 2010-05-06 Keyence Corp 拡大観察装置及び拡大観察方法
US6642686B1 (en) 2001-11-09 2003-11-04 Brianlab Ag Swivel arm with passive actuators
US20030223111A1 (en) * 2002-05-31 2003-12-04 Mcnc Sample analysis device having a eucentric goniometer and associated method
US20050237604A1 (en) * 2004-04-07 2005-10-27 Yoshihiro Kawano In-vivo examination apparatus
DE102012215307A1 (de) * 2011-08-31 2013-02-28 Keyence Corporation Vergrößerungsbeobachtungsvorrichtung, Vergrößerungsbeobachtungsverfahren und Vergrößerungsbeobachtungsprogramm
JP2013088490A (ja) * 2011-10-14 2013-05-13 Nikon Corp 顕微鏡、画像取得方法、プログラム、及び記録媒体
DE102013005999A1 (de) 2013-04-09 2014-10-09 Carl Zeiss Microscopy Gmbh Schwenkarmstativ für Digitalmikroskope
DE102013222295A1 (de) 2013-11-04 2015-05-07 Carl Zeiss Microscopy Gmbh Digitalmikroskop, Verfahren zur Kalibrierung und Verfahren zur automatischen Fokus- und Bildmittennachführung für ein solches Digitalmikroskop
EP3006980A1 (fr) * 2014-10-06 2016-04-13 Leica Microsystems (Schweiz) AG Microscope numérique doté d'un système de frein à piston radial

Also Published As

Publication number Publication date
DE102017114562A1 (de) 2019-01-03
CN110799879A (zh) 2020-02-14

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