WO2018207270A1 - Evaluation test device for recording media - Google Patents

Evaluation test device for recording media Download PDF

Info

Publication number
WO2018207270A1
WO2018207270A1 PCT/JP2017/017607 JP2017017607W WO2018207270A1 WO 2018207270 A1 WO2018207270 A1 WO 2018207270A1 JP 2017017607 W JP2017017607 W JP 2017017607W WO 2018207270 A1 WO2018207270 A1 WO 2018207270A1
Authority
WO
WIPO (PCT)
Prior art keywords
circulation path
storage medium
connection
evaluation test
test apparatus
Prior art date
Application number
PCT/JP2017/017607
Other languages
French (fr)
Japanese (ja)
Inventor
郁夫 馬場
秋山 秀樹
光洋 小泉
政幸 草野
Original Assignee
株式会社ダイチューテクノロジーズ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社ダイチューテクノロジーズ filed Critical 株式会社ダイチューテクノロジーズ
Priority to JP2019516781A priority Critical patent/JP6830295B2/en
Priority to PCT/JP2017/017607 priority patent/WO2018207270A1/en
Publication of WO2018207270A1 publication Critical patent/WO2018207270A1/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices

Definitions

  • the present invention relates to an evaluation test apparatus for storage media such as SSD.
  • HDD hard disk drive
  • SSD solid state drive
  • a hard drive carrier mounted with an HDD is mounted on a carrier pallet, and the carrier pallet is inserted into a plurality of slots provided in the test chamber, so that a plurality of test chambers can be installed in one test chamber.
  • the HDD is being tested.
  • the number of storage media using a semiconductor element memory such as an SSD has increased.
  • the storage medium using a semiconductor element memory consumes more power than a storage medium using a magnetic material such as an HDD. Is getting bigger.
  • a storage medium using a semiconductor element memory such as an SSD generates a large amount of heat during operation and tends to increase in temperature.
  • the temperature around the storage medium has an important influence on the operation of the storage medium. Is an element that gives Therefore, when performing an evaluation test of the storage medium, it is possible to perform the evaluation with higher accuracy if the test is performed with the use environment including the temperature in a state that is in accordance with the actual use environment of the storage medium. This is preferable as an evaluation test.
  • the present invention has been made in view of the above, and an object of the present invention is to provide a storage medium evaluation test apparatus capable of performing a test in a state according to an actual temperature environment in each of a plurality of storage media.
  • a storage medium evaluation test apparatus is a connection unit that connects a storage medium in a freely detachable manner and transmits signals to and from the storage medium. And when the connection portion is viewed in the insertion / removal direction of the storage medium, the longitudinal direction of the connection portion is the vertical direction, and the connection portion is viewed in the insertion / removal direction of the storage medium.
  • a plurality of connection boards that are arranged in the short direction of the connection part, and a circulation in which air is circulated inside and the connection board is arranged in a direction in which air flows in the longitudinal direction of the connection part.
  • a passage a heater disposed in the circulation path to increase the temperature of the air flowing through the circulation path, and a downstream side of the connection board in the flow direction of the air flowing through the circulation path.
  • intake fan In the circulation path, upstream of the connection board in the flow direction of the air flowing through the circulation path, and characterized by comprising a an exhaust fan disposed downstream of the suction fan.
  • connection board is disposed in an orientation in which the insertion / extraction direction of the storage medium inserted into / removed from the connection portion is within a range of 10 ° to 30 ° upward from the horizontal direction. It is preferred that
  • the wind speed of the air flowing through the circulation path can be adjusted by adjusting the operating speeds of the intake fan and the exhaust fan.
  • the circulation path is provided with a plurality of spray ports corresponding to the plurality of connection boards on the upstream side of the connection board in the flow direction of the air flowing through the circulation path.
  • the plurality of spray ports preferably spray air circulating through the circulation path to the corresponding connection board.
  • the circulation path is formed in an annular shape, and the annular inner portion of the circulation path is a non-thermostatic part isolated from the inside of the circulation path, and the connection It is preferable that a board
  • the circulation path may include an exhaust port that discharges air in the circulation path to the outside of the circulation path, and air outside the circulation path into the circulation path.
  • the exhaust port is disposed upstream of the intake port in the flow direction of the air flowing through the circulation path, and the intake port is the flow direction of the air flowing through the circulation path It is preferable to be disposed on the upstream side of the heater.
  • a power control board for controlling power supplied to the storage medium is connected to the connection board, and the power control board discharges the storage medium. It is preferable that a discharge circuit is provided.
  • the storage medium evaluation test apparatus has an effect that each of the plurality of storage media can perform a test in accordance with an actual temperature environment.
  • FIG. 1 is a front view of an evaluation test apparatus according to an embodiment.
  • FIG. 2 is an AA arrow view of FIG. 3 is a view taken along the line CC of FIG.
  • FIG. 4 is a perspective view of the evaluation test apparatus shown in FIG. 5 is a cross-sectional view taken along the line BB in FIG. 6 is a detailed view of a portion E in FIG.
  • FIG. 7 is a detailed view of part F in FIG.
  • FIG. 8 is an explanatory view showing a state in which the main door shown in FIG. 4 is opened.
  • FIG. 11 is a perspective view of the test chamber shown in FIG. FIG.
  • FIG. 12 is a detailed view of the operation panel shown in FIG.
  • FIG. 13 is a schematic plan view of the test control board shown in FIG.
  • FIG. 14 is a block diagram showing the overall configuration of the evaluation test apparatus shown in FIG.
  • FIG. 15 is a perspective view illustrating an example of a storage medium.
  • FIG. 1 is a front view of an evaluation test apparatus 1 according to the embodiment.
  • FIG. 2 is an AA arrow view of FIG. 3 is a view taken along the line CC of FIG. 4 is a perspective view of the evaluation test apparatus 1 shown in FIG.
  • the vertical direction when the evaluation test apparatus 1 is installed at an arbitrary installation location and used in a normal usage pattern will be described as the vertical direction of the evaluation test apparatus 1, and when used in a normal usage pattern.
  • the horizontal direction will be described as the horizontal direction of the evaluation test apparatus 1.
  • the side facing when the user of the evaluation test apparatus 1 operates the evaluation test apparatus 1 will be described as the front of the evaluation test apparatus 1, and the opposite side will be described as the back of the evaluation test apparatus 1.
  • the horizontal direction when the evaluation test apparatus 1 is viewed from the front side or the back side will be described as the width direction of the evaluation test apparatus 1.
  • the direction orthogonal to the width direction of the evaluation test apparatus 1 in the horizontal direction will be described as the front-rear direction of the evaluation test apparatus 1. That is, the front-back direction of the evaluation test apparatus 1 is a direction from the front side to the back side, or a direction from the back side to the front side.
  • the evaluation test apparatus 1 is formed in a substantially rectangular parallelepiped shape whose longitudinal direction is the vertical direction, and a main opening / closing door 3, an operation unit 20, and a maintenance door 5 are provided on the front surface. .
  • the main opening / closing door 3 is positioned on the upper half side in the vertical direction on the front of the evaluation test apparatus 1, and is evaluated when the evaluation test apparatus 1 tests the storage medium 200 (see FIG. 16).
  • An opening / closing portion is opened and closed when the storage medium 200 is taken in and out of the test apparatus 1.
  • the main opening / closing door 3 is provided with a confirmation window 4 for visually recognizing the inside of the evaluation test apparatus 1 without opening the main opening / closing door 3.
  • the casing 2 constituting most of the surface of the evaluation test apparatus 1 is made of an opaque material such as a metal material, while the confirmation window 4 is made of transparent glass, transparent resin material, or the like. Made of transparent material.
  • the maintenance door 5 is located on the lower half side in the vertical direction on the front of the evaluation test apparatus 1, and is an opening / closing part that opens and closes when performing adjustments, maintenance, etc. in the evaluation test apparatus 1. It has become.
  • the operation unit 20 is located near the center in the vertical direction on the front of the evaluation test apparatus 1 and is disposed between the main opening / closing door 3 and the maintenance door 5 in the vertical direction.
  • the operation unit 20 includes an operation panel 21 that can perform an input operation on the evaluation test apparatus 1 during a test in the evaluation test apparatus 1 and check a test state.
  • the evaluation test apparatus 1 is arranged in a direction located on the surface.
  • the maintenance door 5 is also arranged on the back side of the evaluation test apparatus 1. Unlike the maintenance door 5 on the front side, the maintenance door 5 on the back side is provided on almost the entire back surface of the evaluation test apparatus 1.
  • vents 8 for venting the inside of the apparatus and the outside of the apparatus are provided on the side and the back of the evaluation test apparatus 1, and the air inside the apparatus is discharged to the outside of the apparatus on the back of the evaluation test apparatus 1.
  • the exhaust heat fan 9 which exhausts heat by doing so is provided.
  • a caster 6 is attached to the lower part of the evaluation test apparatus 1 to ensure ease when moving the evaluation test apparatus 1.
  • FIG. 5 is a cross-sectional view taken along the line BB in FIG. 6 is a detailed view of a portion E in FIG.
  • FIG. 7 is a detailed view of part F in FIG.
  • the evaluation test apparatus 1 includes a test unit chamber 11 in which the storage medium 200 is disposed when the storage medium 200 is tested, and a control unit chamber 12 in which devices for controlling each part of the evaluation test apparatus 1 are disposed. And a power supply unit chamber 13 in which equipment related to electric power for operating the evaluation test apparatus 1 is arranged.
  • the test unit chamber 11 is located on the upper half side in the vertical direction of the evaluation test apparatus 1, and the thermostatic chamber 30 is disposed therein.
  • the main opening / closing door 3 has an arrangement range in the vertical direction overlapping at least a partial range in the vertical direction of the test unit chamber 11.
  • the control unit chamber 12 is located below the test unit chamber 11, and a test control board 70 that exchanges signals with the storage medium 200 when performing an evaluation test, and power supplied to the storage medium 200 during the evaluation test.
  • a power control board 80 and the like for controlling the above are provided.
  • the power supply unit chamber 13 includes a switching power supply 91 that converts power supplied from a commercial power source into power used by the evaluation test apparatus 1, a breaker box 93 that shuts off power supply when an abnormal overcurrent flows, and the like.
  • a power supply unit 90 is provided.
  • the power supply unit chamber 13 is located below the control unit chamber 12. As for the maintenance door 5 on the front side, the arrangement range in the vertical direction overlaps at least a part of the range in the vertical direction of the control unit chamber 12 and the power supply unit chamber 13.
  • the operation unit 20 is provided so as to be rotatable about a rotation axis that is located near the upper end of the operation unit 20 and extends in the width direction of the evaluation test apparatus 1.
  • the operation panel 21 provided in the operation unit 20 changes its orientation between a state in which the operation unit 20 is turned and a state in which the operation panel 21 is directed in the horizontal direction and a state in which the operation panel 20 is directed obliquely upward from the horizontal direction.
  • FIG. 8 is an explanatory diagram showing a state in which the main door 3 shown in FIG. 4 is opened.
  • the main opening / closing door 3 is provided so as to be rotatable about a rotation axis that is located on the upper end side in a state where the main opening / closing door 3 is closed and extends in the width direction of the test unit chamber 11. Since the main opening / closing door 3 overlaps with the test unit chamber 11 in the vertical direction, the test unit chamber 11 can be opened / closed by opening / closing the main opening / closing door 3.
  • the main open / close door 3 can open and close a test chamber 31 included in a thermostatic chamber 30 disposed in the test unit chamber 11.
  • the test chamber 31 constitutes a part of the thermostatic bath 30 and is a part where the storage medium 200 is arranged during an evaluation test of the storage medium 200.
  • the main opening / closing door 3 that can open and close the test chamber 31 in this way supports the main opening / closing door 3 that is opened so that the main opening / closing door 3 does not close by its own weight when it is opened upward.
  • a supporting damper 7 is connected.
  • the evaluation test apparatus 1 is provided with a lock mechanism 15 for the main door 3.
  • the lock mechanism 15 has a recess 16 located at the lower end of the main door 3 in the closed state and a protrusion 17 disposed at a position facing the recess 16 in the state where the main door 3 is closed.
  • the protrusion 17 is formed in a pin-like shape movable in the vertical direction, and the lock mechanism 15 is configured such that the protrusion 17 rises and enters the recess 16 when the main door 3 is closed.
  • the rotation of the main door 3 can be restricted and the main door 3 can be kept closed.
  • the lock mechanism 15 can freely open and close the main door 3 because the protrusion 17 does not enter the recess 16 when the protrusion 17 is lowered.
  • FIG. 9 is a cross-sectional perspective view of the thermostatic chamber 30 shown in FIG. FIG. 9 shows a state where the storage medium 200 is disposed in the test chamber 31.
  • the thermostat 30 has a circulation path 33 through which air circulates.
  • the circulation path 33 is formed in a substantially annular shape when the thermostat 30 is viewed in the width direction of the evaluation test apparatus 1. Specifically, when viewed in the width direction of the evaluation test apparatus 1, the circulation path 33 is formed in a substantially octagonal shape in which the outer peripheral side is vertically long, and is formed in a substantially rectangular shape in which the inner peripheral side is vertically long. .
  • the constant temperature bath 30 is arranged in a direction in which the longitudinal direction of the circulation path 33, that is, the longitudinal direction of the octagon on the outer circumference side of the circulation path 33 or the rectangular shape of the inner circumference is inclined with respect to the vertical direction of the evaluation test apparatus 1. ing.
  • the thermostatic chamber 30 is configured such that the upper end side of the circulation path 33 is positioned on the back side of the evaluation test apparatus 1 with respect to the lower end side, and the longitudinal direction of the circulation path 33 is about 15 ° with respect to the vertical direction. Inclined at an angle.
  • the test chamber 31 is provided with a region located on the front side of the evaluation test apparatus 1 in the annularly formed circulation path 33 as the test chamber 31.
  • the front side of the test chamber 31 is an opening 32, and the main opening / closing door 3 can open and close the opening 32 by opening and closing.
  • the annular inner portion of the circulation path 33 that is annularly formed is a non-constant temperature portion 37 that is isolated from the inside of the circulation path 33. That is, the non-isothermal part 37 is a region formed in a substantially rectangular shape inside the circulation path 33 when the thermostatic chamber 30 is viewed in the width direction of the evaluation test apparatus 1.
  • the region facing the short side of the upper end side of the non-constant temperature portion 37 formed in a substantially rectangular shape in the circulation path 33 will be described as the upper end portion 34, and the lower end of the non-constant temperature portion 37 will be described.
  • the region facing the short side on the side will be described as the lower end portion 35, and the region facing the long side on the side opposite to the side where the test chamber 31 is located will be described as the back surface portion 36.
  • connection substrate 60 to which a storage medium 200 that performs an evaluation test by the evaluation test apparatus 1 is connected is disposed.
  • the connection substrate 60 is disposed on the opposite side of the test chamber 31 from the side where the opening 32 is located in the front-rear direction of the evaluation test apparatus 1. That is, the connection substrate 60 is attached to the wall portion 38 that separates the inside of the circulation path 33 and the non-constant temperature portion 37 among the wall portions 38 that form the circulation path 33.
  • the circulation path 33 is provided with an intake fan 41, an exhaust fan 42, a heater 50, and a temperature sensor 51. Air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42. Circulation in the path 33 is possible.
  • the circulation direction is from the test chamber 31 toward the upper end 34 in the circulation path 33, from the upper end 34 toward the back surface 36, from the back surface 36 toward the lower end 35, and from the lower end 35 toward the test chamber 31. It has become.
  • the direction of the circulation of the air flowing in the circulation path 33 flows from the lower side to the upper side in the test chamber 31 in the circulation path 33, flows from the front side to the rear side in the upper end portion 34, and from the upper side to the lower side in the back surface portion 36.
  • the lower end 35 is in the direction of flow from the back side to the front side.
  • the heater 50 is disposed on the back surface portion 36 of the circulation path 33, and can increase the temperature of the air flowing through the circulation path 33.
  • the temperature sensor 51 is disposed at the lower end portion 35 of the circulation path 33 and can detect the temperature of the air flowing through the circulation path 33. That is, the temperature sensor 51 can detect the temperature of the air on the upstream side immediately before the test chamber 31 in the flow direction of the air circulating through the circulation path 33.
  • the intake fan 41 is disposed on the downstream side of the connection board 60 in the direction of the air flow through the circulation path 33 in the circulation path 33, and specifically, disposed on the upper end portion 34 of the circulation path 33. Has been. Thus, the intake fan 41 can suck the air on the test chamber 31 side in the circulation path 33 and discharge the sucked air to the back surface portion 36 side. Further, the exhaust fan 42 is disposed on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33 and on the downstream side of the intake fan 41 in the circulation path 33. Specifically, the exhaust fan 42 is disposed on the upstream side of the temperature sensor 51 in the lower end portion 35 of the circulation path 33. Thereby, the exhaust fan 42 can suck the air on the back surface 36 side in the circulation path 33 and discharge the sucked air to the test chamber 31 side.
  • the circulation path 33 is provided with an exhaust port 43 for releasing the air in the circulation path 33 to the outside of the circulation path 33 and an intake port 44 for taking the air outside the circulation path 33 into the circulation path 33.
  • the exhaust port 43 is formed in the wall portion 38 that forms the outer periphery of the circulation path 33 in the region between the upper end portion 34 and the back surface portion 36 of the circulation path 33, and the air flowing through the upper end portion 34 is formed. It is formed on the extension line. For this reason, the exhaust port 43 is easy to discharge the air that has flowed through the upper end portion 34 out of the circulation path 33.
  • the intake port 44 is formed in a wall portion 38 that forms the outer periphery of the circulation path 33 in the back surface portion 36 of the circulation path 33. That is, the exhaust port 43 is disposed on the upstream side of the intake port 44 in the flow direction of the air flowing through the circulation path 33. The intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33.
  • the exhaust port 43 and the intake port 44 are provided with an exhaust port opening / closing door 45 and an intake port opening / closing door 46 for opening and closing them. That is, the exhaust port 43 is provided with an exhaust port opening / closing door 45 that opens and closes the exhaust port 43, and the intake port 44 is provided with an intake port opening / closing door 46 that opens and closes the intake port 44.
  • the intake opening / closing door 46 is moved from the position away from the circulation path 33 to the circulation path 33 from the upstream side to the downstream side in the flow direction of the air flowing through the circulation path 33 when the intake port 44 is opened. It will be in a state inclined in the approaching direction. For this reason, when the intake port opening / closing door 46 is opened, the air flowing through the circulation path 33 is dragged and air outside the circulation path 33 easily enters the circulation path 33 from the intake port 44.
  • FIG. 10 is a GG cross-sectional view of FIG.
  • FIG. 11 is a perspective view of the test chamber 31 shown in FIG.
  • a plurality of connection boards 60 arranged in the test chamber 31 are arranged side by side in the width direction of the evaluation test apparatus 1.
  • 10 connection boards 60 are arranged in the width direction. It is installed.
  • Each connection board 60 has a slot-like connection portion 61 that connects the storage medium 200 in a freely detachable manner and transmits signals to and from the storage medium 200. That is, the connection portion 61 is formed in a rectangular hole shape having a long length in one direction and a narrow width in a direction orthogonal to this direction when viewed in the insertion / extraction direction of the storage medium 200.
  • the storage medium 200 that performs the evaluation test by the evaluation test apparatus 1 is a storage medium 200 that performs input / output by PCI Express, which is a type of I / O (input / output) serial interface. ing.
  • substrate 60 is also a slot-shaped connection part according to PCI Express.
  • the storage medium 200 arranged in the test chamber 31 can be arranged by being inserted into the connection part 61 of the connection substrate 60 and connected to the connection part 61.
  • the insertion / removal direction of the storage medium 200 inserted / removed with respect to the connection part 61 is generally the front-rear direction of the evaluation test apparatus 1. That is, the direction in which the storage medium 200 is inserted into the connection portion 61 is generally from the side of the opening 32 of the test chamber 31, the direction in which the storage medium 200 is brought closer to the connection portion 61, that is, from the front direction of the evaluation test apparatus 1.
  • the storage medium 200 is moved in the rear direction.
  • the direction in which the storage medium 200 is pulled out from the connection portion 61 is generally the direction in which the storage medium 200 is moved from the connection portion 61 to the opening 32 side of the test chamber 31, that is, from the back side to the front side of the evaluation test apparatus 1. The storage medium 200 is moved.
  • connection substrate 60 in which the insertion / extraction direction of the storage medium 200 with respect to the connection part 61 is in these directions is such that the longitudinal direction of the connection part 61 is the vertical direction when the connection part 61 is viewed in the insertion / extraction direction of the storage medium 200. It is arranged.
  • the wall portion 38 that forms the test chamber 31 is provided with a connection board holding portion 39 that holds the connection board 60.
  • the connection board 60 has an upper end side and a lower end side in the arrangement state of the connection board 60. Each is mounted in the test chamber 31 by being attached to the connection substrate holding part 39. Further, the plurality of connection boards 60 arranged in the test chamber 31 are arranged side by side in the short direction of the connection part 61 when the connection part 61 is viewed in the insertion / extraction direction of the storage medium 200.
  • connection substrate 60 has a longitudinal direction of the connection portion 61 in the vertical direction, and at least the connection portion 61 is disposed in the test chamber 31.
  • the test chamber 31 which is a part of the circulation path 33 is connected to the circulation path.
  • the flow direction of the air flowing through 33 is the vertical direction.
  • the connection substrate 60 is disposed in the circulation path 33 in a direction in which air flows in the longitudinal direction of the connection portion 61.
  • connection substrate 60 is arranged in such a direction that the insertion / extraction direction of the storage medium 200 is inclined from the horizontal direction. Specifically, the connection substrate 60 is disposed in an orientation in which the insertion / extraction direction of the storage medium 200 inserted into / removed from the connection portion 61 is in the range of 10 ° to 30 ° upward from the horizontal direction. That is, when inserting the storage medium 200 into the connection unit 61, the connection substrate 60 moves the storage medium 200 from the front to the back while moving the storage medium 200 from the front to the back of the evaluation test apparatus 1.
  • connection substrate 60 is arranged so that the insertion / extraction direction of the storage medium 200 inserted into / removed from the connection unit 61 is an angle of 15 ° upward from the horizontal direction.
  • the circulation path 33 is provided with a blowing port 55 for blowing air circulating in the circulation path 33 against the connection board 60 on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33.
  • a plurality of spray ports 55 are provided corresponding to the plurality of connection boards 60, and the plurality of spray holes 55 spray air circulating through the circulation path 33 to the corresponding connection boards 60. Is possible.
  • a plurality of spray port plates are provided at a position upstream of the connection board 60 in the circulation path 33, that is, a position closer to the lower end portion 35 than a position where the connection board 60 is disposed in the test chamber 31.
  • a member 56 is provided.
  • the spray port plate member 56 is a plate-like shape disposed from the non-constant temperature portion 37 side toward the test chamber 31 side at a position closer to the lower end portion 35 than the position where the connection substrate 60 is disposed in the test chamber 31.
  • the thickness direction of a board is arrange
  • the spray port plate member 56 formed as described above has a position in the direction in which the plurality of connection boards 60 are arranged, that is, a position in the width direction of the evaluation test apparatus 1 between the adjacent connection boards 60. Yes. Further, the spray port plate members 56 are respectively disposed on the outer sides of the connection substrates 60 at both ends located on the outermost side among the plurality of connection substrates 60. A portion between the adjacent spray port plate members 56 of the plurality of spray port plate members 56 arranged side by side in the width direction of the evaluation test apparatus 1 is formed as a spray port 55.
  • each blowing port plate member 56 is positioned on both sides of the connection board 60 because the position in the width direction of the evaluation test apparatus 1 is the portion between the blowing port plate members 56 adjacent to each other.
  • the position in the width direction of the evaluation test apparatus 1 is the same position as the position of the connection board 60.
  • the position in the width direction of the evaluation test apparatus 1 is the same position as the position of the connection board 60 in the spray port 55 which is a portion between the spray port plate members 56 adjacent to each other.
  • the plurality of spray ports 55 are arranged corresponding to the plurality of connection boards 60.
  • connection substrate 60 When the air flowing through the circulation path 33 flows from the lower end portion 35 side toward the connection substrate 60, it flows toward the connection substrate 60 located in the test chamber 31 through the blowing port 55.
  • the blowing port 55 can blow the air circulating through the circulation path 33 against the corresponding connection board 60.
  • a storage medium holding stay 120 that holds the storage medium 200 inserted into the connection substrate 60 is disposed near the lower end of the test chamber 31 and closer to the opening 31 than the blowing port plate member 56. Yes.
  • the storage medium holding stay 120 extends in the width direction of the evaluation test apparatus 1 and is provided so as to be rotatable about a rotation shaft extending in the width direction of the evaluation test apparatus 1.
  • a stay lock member 121 that restricts the rotation of the storage medium holding stay 120 is disposed at both ends of the storage medium holding stay 120, and the stay lock member 121 is in a state where the storage medium holding stay 120 holds the storage medium 200. By restricting the rotation of the storage medium holding stay 120, the storage medium 200 can be held.
  • auxiliary cables 110 are disposed in the test chamber 31.
  • the auxiliary cables 110 are provided corresponding to the plurality of connection boards 60, that is, in the present embodiment, ten auxiliary cables 110 are provided.
  • the auxiliary cable 110 extends through the wall portion 38 forming the test chamber 31 and extends over the test chamber 31 side and the non-thermal constant portion 37 side.
  • the portion of the auxiliary cable 110 disposed on the test chamber 31 side is disposed at the same position in the width direction of the evaluation test apparatus 1 as the position of the corresponding connection board 60, and above the connection board 60. From the vicinity of the connection board 60 in FIG.
  • the wall portion 38 of the test chamber 31 is provided with an auxiliary cable holding portion 112 that holds the auxiliary cable 110 above the connection board holding portion 39, and the auxiliary cable 110 is provided at the end of the auxiliary cable 110.
  • the vicinity of the cable terminal 111 is detachably held by the auxiliary cable holding portion 112.
  • three intake fans 41 and three exhaust fans 42 are arranged side by side in the width direction of the evaluation test apparatus 1 in this embodiment.
  • the intake fan 41 and the exhaust fan 42 can intake and exhaust air over the entire region in the width direction of the circulation path 33 in the width direction of the evaluation test apparatus 1.
  • FIG. 12 is a detailed view of the operation panel 21 shown in FIG.
  • An operation panel 21 included in the operation unit 20 includes a touch panel 22, an indicator 23, an external device connection unit 24, a switch 25, and an auxiliary cable connection terminal 26.
  • the touch panel 22 is provided as a display unit that displays various information when the evaluation test apparatus 1 performs an evaluation test, and the user of the evaluation test apparatus 1 touches the touch panel 22 based on information displayed on the touch panel 22. Therefore, it is also provided as an input unit for performing an input operation.
  • the indicator 23 includes a light source such as an LED (light emitting diode), and displays predetermined information during an evaluation test in the evaluation test apparatus 1 by turning on or off.
  • the external device connection unit 24 is a connection unit with an external device that can exchange information with the evaluation test apparatus 1 such as a personal computer (not shown).
  • the switch 25 is an input unit that is pressed when the evaluation test apparatus 1 performs a predetermined operation.
  • the auxiliary cable connection terminal 26 is connected to a terminal on the opposite side of the auxiliary cable terminal 111 located in the test chamber 31 in the auxiliary cable 110 disposed in the test chamber 31. To a connection terminal for connecting an arbitrary device to the auxiliary cable 110.
  • FIG. 13 is a schematic plan view of the test control board 70 shown in FIG.
  • the test control board 70 is a board having a CPU (Central Processing Unit) that functions as a controller that executes various processes, a RAM (Random Access Memory) that functions as a memory that stores various information, a ROM (Read Only Memory), and the like. It has become. All or a part of each function of the test control board 70 is realized by reading and writing data in the RAM or ROM by loading an application program held in the ROM into the RAM and executing it by the CPU. .
  • CPU Central Processing Unit
  • RAM Random Access Memory
  • ROM Read Only Memory
  • the test control board 70 can perform an evaluation test of the storage medium 200 by exchanging signals with the storage medium 200 via the connection board 60 to which the storage medium 200 is connected. . That is, the test control board 70 stores a program for performing an evaluation test of the storage medium 200 and various data used when performing the evaluation test in the RAM and the ROM. The storage medium 200 can be evaluated by reading and writing various data while exchanging signals between them.
  • the test control board 70 has the board connection portion 71 for exchanging signals with the storage medium 200 during the evaluation test of the storage medium 200 as described above. Since the evaluation test apparatus 1 according to the present embodiment has ten connection boards 60 to which the storage medium 200 is connected, ten board connection parts 71 are also provided. Similarly to the connection part 61 of the connection board 60, the board connection part 71 of the test control board 70 is a slot-like connection part according to PCI Express, and the ten board connection parts 71 of the test control board 70 are included. Are arranged side by side in the short direction of the slot.
  • FIG. 14 is a block diagram showing the overall configuration of the evaluation test apparatus 1 shown in FIG.
  • the evaluation test apparatus 1 includes an operation unit 20, a test control board 70, a power control board 80, a switching power supply 91, and an ATX power supply 92 in addition to the thermostatic chamber 30 in which the storage medium 200 on which the evaluation test is performed is arranged. And a startup drive 95, a thermostatic chamber control board 100, and a fan control board 101.
  • the test control board 70 is arranged outside the circulation path 33 by being arranged at a position different from the thermostatic chamber 30, and the test board side connection board 65 is connected to the connection board 60 in the circulation path 33. It is connected via a cable 66.
  • the cable 66 used for connection between the connection board 60 and the test control board 70 has one end connected to the connection board 60 and the other end connected to the test board side connection board 65.
  • the test board side connection board 65 is a board that can be connected to the board connection portion 71 of the test control board 70.
  • the test control board 70 can transmit a signal to and from the connection board 60 via the test board side connection board 65 and the cable 66 by connecting the test board side connection board 65 to the board connection portion 71. It is possible.
  • connection boards 60 are provided, 10 test board side connection boards 65 connected to the test control board 70 are also provided, and both ends are connected to the connection board 60 and the test board side connection board 65.
  • Ten cables 66 are also provided. The ten cables 66 are all formed with the same length. When the connection substrate 60 is disposed in the constant temperature bath 30, the cable 66 is pulled out from the non-temperature constant portion 37 of the constant temperature bath 30.
  • the switching power supply 91 can convert electric power supplied from a commercial power supply into DC electric power used in the evaluation test apparatus 1.
  • the ATX power supply 92 can further convert the power converted by the switching power supply 91 into power that can be used by the test control board 70 and supply it to the test control board 70.
  • the activation drive 95 is a drive for activation of the test control board 70.
  • the power control board 80 is connected to the connection board 60 and can control the power supplied to the storage medium 200 during the evaluation test of the storage medium 200.
  • the power control board 80 is provided with a discharge circuit 81 that causes the storage medium 200 to discharge.
  • the discharge circuit 81 is composed of a constant current discharge circuit, and can discharge in a short time by extracting the electric charge stored in the capacitor of the storage medium 200 with a constant current.
  • one power control board 80 is connected to two connection boards 60. Since ten connection boards 60 are provided, five power control boards 80 are provided.
  • the thermostatic chamber control substrate 100 is a substrate that controls the temperature of the thermostatic chamber 30.
  • the thermostatic chamber control board 100 includes a heater 50, a temperature sensor 51, an exhaust port motor 47 that opens and closes the exhaust port opening / closing door 45, and an intake port motor 48 that opens and closes the intake port opening / closing door 46.
  • the temperature of the thermostatic bath 30 can be controlled by controlling the heater 50, the exhaust port motor 47, and the intake port motor 48 based on the temperature detected by the temperature sensor 51.
  • the solenoid 18 of the protrusion part 17 which the lock mechanism 15 has is connected to the thermostatic chamber control board 100, and the lock mechanism 15 is operated by operating the solenoid 18 based on the temperature detected by the temperature sensor 51. It is possible to make it.
  • An operation unit 20 and a fan control board 101 are connected to the thermostatic chamber control board 100, and an intake fan 41 and an exhaust fan 42 are connected via the fan control board 101 based on the wind speed input by the operation unit 20. And can be controlled.
  • An intake fan 41 and an exhaust fan 42 are connected to the fan control board 101, and the wind speed of the air flowing through the circulation path 33 is adjusted by adjusting the operating speed of the intake fan 41 and the exhaust fan 42. Is possible.
  • FIG. 15 is a perspective view showing an example of the storage medium 200.
  • the storage medium 200 that performs an evaluation test by the evaluation test apparatus 1 according to the present embodiment is a so-called SSD (solid state drive), and is a storage apparatus that uses a semiconductor element memory.
  • SSD solid state drive
  • As the storage medium 200 for example, a card-type SSD as shown in FIG. 16 is used.
  • the storage medium 200 includes a plate-like connection portion 201 that is inserted into the connection portion 61 included in the connection substrate 60 of the evaluation test apparatus 1.
  • the storage medium 200 can perform input / output with the connection board 60 by PCI Express.
  • the storage medium 200 is formed such that the length in the direction orthogonal to both the insertion / removal direction and the thickness direction of the connection portion 201 is longer than the width in the insertion / removal direction. That is, the storage medium 200 is formed such that the length of the storage medium 200 in the longitudinal direction of the connection portion 61 of the connection substrate 60 is longer than the width in the insertion / extraction direction. For this reason, when the storage medium 200 is connected to the connection portion 61 of the connection substrate 60 and disposed in the circulation path 33, the air flowing through the storage medium 200 in the circulation path 33 extends in the longitudinal direction of the storage medium 200. Flowing. Further, a bracket 202 is provided on one end side in the longitudinal direction of the storage medium 200 to be fixed to the devices when the storage medium 200 is mounted on the devices such as a personal computer.
  • the evaluation test apparatus 1 has the above-described configuration, and the operation thereof will be described below.
  • the main opening / closing door 3 is opened, and the connection portion 61 of the storage medium 200 is connected to the connection portion 61 of the connection substrate 60 disposed in the test chamber 31. Plug in 201 and connect.
  • the bracket 202 of the storage medium 200 is held by the storage medium holding stay 120 and the stay lock member 121, thereby holding the storage medium 200 in a stable state and preventing the storage medium 200 from being accidentally removed. .
  • connection portion 201 of the storage medium 200 is inserted into the connection portion 61 of the connection substrate 60
  • the storage medium 200 is inserted in a direction in which the bracket 202 is positioned on the lower side.
  • the storage medium holding stay 120 is rotated to a state where the movement of the storage medium 200 in the direction of coming out of the connection part 61 can be restricted.
  • the rotation of the storage medium holding stay 120 is restricted. This prevents the storage medium 200 from being disconnected.
  • the stay lock member 121 is operated to release the restriction on the rotation of the storage medium holding stay 120 and then pulled out. Since ten connection boards 60 are provided, the required number of storage media 200 is inserted in the connection portion 61 of the connection board 60 within the range of 1 to 10 in the test chamber 31. Can be arranged.
  • the main door 3 When the storage medium 200 is placed in the test chamber 31, the main door 3 is closed and the evaluation test is started.
  • the user of the evaluation test apparatus 1 When performing an evaluation test, the user of the evaluation test apparatus 1 performs an appropriate test by performing an input operation on the operation panel 21 while visually recognizing the touch panel 22 of the operation panel 21.
  • a test signal is transmitted from the test control board 70 to the storage medium 200.
  • the signal When transmitting a signal from the test control board 70 to the storage medium 200, the signal is transmitted from the test board side connection board 65 inserted into the board connection portion 71 of the test control board 70 to the cable 66, and from the cable 66 to the connection board 60. Is transmitted.
  • the connection board 60 transmits the signal transmitted from the cable 66 to the storage medium 200 from the connection unit 61. Thereby, the signal output from the test control board 70 is transmitted to the storage medium 200.
  • power for operating the storage medium 200 is supplied from the power control board 80 connected to the connection board 60.
  • the power control board 80 supplies power for operating the storage medium 200 to the storage medium 200 via the connection board 60 and supplies power to the storage medium 200 based on a signal from the test control board 70. Change. As a result, a test relating to power during operation of the storage medium 200 is also performed.
  • the storage medium 200 is subjected to a voltage margin test, which is a test for an allowable amount with respect to a change in the voltage during operation of the storage medium 200, and a predetermined load is applied to the storage medium 200.
  • a voltage margin test which is a test for an allowable amount with respect to a change in the voltage during operation of the storage medium 200, and a predetermined load is applied to the storage medium 200.
  • the long run test which is a test of whether or not the storage medium 200 can continue to operate stably even if the storage medium 200 is continuously operated for a certain period of time, in the same manner as the actual usage environment and usage method before shipping the storage medium 200
  • An aging test which is a test for confirming whether the performance and functions are exhibited as specified by operating the system, and appropriately performing recovery when error communication is intentionally performed to the storage medium 200
  • An error injection test which is a test of whether or not the storage medium 200 can transmit / receive data per second A performance measurement or the like is performed.
  • evaluation tests can be performed by connecting a personal computer to the test control board 70 through a LAN (Local Area Network) cable.
  • the personal computer connected to the touch panel 22 and the test control board 70 of the operation panel 21 can appropriately switch and display information on the state of the evaluation test apparatus 1 and the storage medium 200 being tested. For this reason, during the evaluation test, the test can be performed while confirming necessary information of the evaluation test apparatus 1 and the storage medium 200.
  • the touch panel 22 can display the temperature of the evaluation test apparatus 1 and the ON / OFF state of the voltage output to the storage medium 200.
  • the personal computer can display the voltage and current consumption during operation of the storage medium 200 and the temperature of each storage medium 200.
  • Various data at the time of the evaluation test can be stored in a personal computer and can be taken out later.
  • the air in the circulation path 33 is heated by the heater 50 while the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42 during the evaluation test.
  • the operation is performed while opening and closing the exhaust opening / closing door 45 and the intake opening / closing door 46. Heating by the heater 50 and opening / closing control of the exhaust opening / closing door 45 and the intake opening / closing door 46 are performed by the thermostatic chamber control board 100.
  • the thermostatic chamber control board 100 acquires the temperature in the circulation path 33 by acquiring the detection result of the temperature sensor 51 disposed in the circulation path 33, and the acquired temperature and the target temperature. By comparing the above, the heater 50 is heated and the exhaust port motor 47 and the intake port motor 48 are operated.
  • the exhaust opening / closing door 45 and the intake opening / closing door 46 are closed by the exhaust opening motor 47 and the intake opening motor 48. Meanwhile, the heater 50 is heated. Thereby, the air in the circulation path 33 is heated with the circulation path 33 sealed. Since the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42, the entire air flowing in the circulation path 33 is heated by heating the heater 50 and heating the air around the heater 50. Heated, the temperature of the air in the entire circulation path 33 rises.
  • the degree of heating of the heater 50 is reduced or the heating of the heater 50 is stopped. Thereby, the temperature in the circulation path 33 is lowered. Even if the heating of the heater 50 is stopped, if the temperature in the circulation path 33 is higher than the target temperature, the temperature is increased by operating the exhaust port motor 47 and opening the exhaust port opening / closing door 45. The air in the circulation path 33 is discharged from the exhaust port 43, or the intake port motor 48 is operated to open the intake port opening / closing door 46, so that the temperature is lower than that in the circulation path 33. Air is taken into the circulation path 33 from the intake port 44. Thereby, the temperature of the air in the circulation path 33 falls, and it can approach the target temperature.
  • the intake port opening / closing door 46 When the temperature in the circulation path 33 detected by the temperature sensor 51 is higher than the target temperature, when the intake port opening / closing door 46 is opened, air outside the circulation path 33 flows from the intake port 44. Although the temperature of the air in the circulation path 33 decreases by entering the circulation path 33, the intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33. For this reason, the air that has entered through the air inlet 44 does not flow directly into the temperature sensor 51 but flows after the air that has entered through the air inlet 44 is mixed with the air in the circulation path 33.
  • the sensor 51 can appropriately detect the air in the circulation path 33 even when the intake opening / closing door 46 is opened.
  • the thermostatic chamber control board 100 operates the solenoid 18 of the lock mechanism 15 to cause the protrusion 17 to enter the recess 16.
  • the main door 3 is locked, and the main door 3 cannot be opened when the test chamber 31 is at a high temperature.
  • the lock mechanism 15 that locks the main door 3 can be manually unlocked when the temperature detected by the temperature sensor 51 becomes low.
  • a plurality of blowing ports 55 corresponding to the plurality of connection boards 60 are provided on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33. Air is blown to the connection substrate 60 from the blowing port 55 corresponding to 60. For this reason, since air is blown from the corresponding blowing port 55 to the storage medium 200 connected to the connection portion 61 of each connection board 60, the air flowing through the test chamber 31 of the circulation path 33 flows. Flows evenly with respect to the plurality of storage media 200 arranged in the test chamber 31. Thereby, when changing the temperature in the circulation path 33 to arbitrary temperature, the temperature around the several storage medium 200 arrange
  • connection board 60 is disposed in the longitudinal direction of the connection portion 61 in the direction in which air flows, the flow direction of the air flowing through the test chamber 31 is relative to the storage medium 200 connected to the connection portion 61. Also flows along the longitudinal direction of the storage medium 200.
  • a cooling fan is provided in a device such as a personal computer in which the storage medium 200 is used.
  • the flow direction of air by the fan of these devices is normally set to the storage medium 200. It often flows in the longitudinal direction of the storage medium 200. For this reason, when the flow direction of the air flowing through the test chamber 31 flows in a direction along the longitudinal direction of the storage medium 200, the storage medium 200 flows in a state close to a state in which the storage medium 200 is actually used.
  • the evaluation test of the storage medium 200 in the evaluation test apparatus 1 is performed by reproducing an environment close to the environment when the storage medium 200 is actually used.
  • the heater 50, the exhaust motor 47, and the intake motor 48 are in contact with each other. Feedback control. Since the evaluation test apparatus 1 can perform the feedback control in this way, the temperature in the circulation path 33 can be set to an arbitrary target temperature. Therefore, in the evaluation test of the storage medium 200, a high temperature test is also performed. Can do. That is, an arbitrary temperature for performing a high temperature test on the storage medium 200 is set as a target temperature at the time of the evaluation test, and the storage medium 200 is operated with the temperature in the circulation path 33 set to the target temperature. Thereby, the storage medium 200 can be evaluated during operation at a high temperature.
  • a temperature margin test in a high-load access state or a high-load access state can be performed by increasing the temperature or changing the voltage while reading from or writing to the storage medium 200 at a high speed. Perform a voltage margin test.
  • the test control board 70 that transmits the signal for the evaluation test to the storage medium 200 at the time of the evaluation test of the storage medium 200 is disposed at a position different from the thermostat 30, that is, the test control board 70. Is disposed outside the circulation path 33. If the temperature of the test control board 70 becomes too high, thermal runaway occurs, and it may not be possible to appropriately perform operations such as arithmetic processing, and an evaluation test may not be performed. Is arranged outside the circulation path 33, so that even when the temperature of the circulation path 33 is increased, the test control board 70 is not affected by the heat of the circulation path 33. For this reason, even when a high temperature test is performed, the test control board 70 can operate stably, and an appropriate evaluation test can be performed.
  • the air circulating through the circulation path 33 flows evenly to the plurality of storage media 200 through the blowing ports 55, and in the direction along the longitudinal direction of the storage media 200. Since the air flows, an environment close to the actual use environment of the storage medium 200 is reproduced, but the evaluation test apparatus 1 according to the present embodiment further stores the wind speed of the air flowing through the circulation path 33. It is possible to approach the wind speed when the medium 200 is actually used.
  • the operating speed of the intake fan 41 and the exhaust fan 42 is adjusted by performing an input operation on the operation panel 21.
  • values input to the operation panel 21 are transmitted to the fan control board 101 through the thermostatic bath control board 100 and controlled by the fan control board 101.
  • the fan control board 101 changes the operating speed of the intake fan 41 and the exhaust fan 42 by, for example, duty control, and the wind speed at the position of the storage medium 200 is substantially equal to the wind speed in the device in which the storage medium 200 is actually used. Use the same wind speed.
  • the environment at the time of the evaluation test of the storage medium 200 can be brought closer to the environment at the time of actual use of the storage medium 200.
  • by adjusting the operating speeds of the intake fan 41 and the exhaust fan 42 it is possible to make the wind speed uniform while suppressing variations in the wind flowing in the vicinity of the storage medium 200, and the evaluation test is performed in a stable environment. be able to.
  • an evaluation test can be performed when the power supplied to the storage medium 200 is suddenly cut off.
  • the power supplied from the power control board 80 to the storage medium 200 via the connection board 60 is cut off.
  • the power control board 80 includes the discharge circuit 81, the power supplied from the storage medium 200 can be cut off, and the power stored in the storage medium 200 can be discharged by the discharge circuit 81. If the power supplied to the storage medium 200 is simply cut off, the power stored in the storage medium 200 is slowly discharged, so that the evaluation test of the storage medium 200 at the time of power cut takes time. Then, since the discharge is performed in a short time by the discharge circuit 81, the evaluation test of the storage medium 200 when the power is cut off can be performed in a short time.
  • the evaluation test apparatus 1 can perform an evaluation test by arbitrarily generating a pattern for writing to and reading from the storage medium 200 by connecting a personal computer to the test control board 70 via a LAN cable. it can.
  • the auxiliary cable terminal 111 of the auxiliary cable 110 arranged in the test chamber 31 can be connected to the storage medium 200 arranged in the test chamber 31 as necessary. Since the other end side of the auxiliary cable 110 is connected to the auxiliary cable connection terminal 26 of the operation panel 21, when the auxiliary cable terminal 111 is connected to the storage medium 200, the auxiliary door 110 is closed with the main opening / closing door 3 closed. Direct communication can be performed with the storage medium 200 from the outside via the cable connection terminal 26.
  • the connection board 60 having the connection part 61 to which the storage medium 200 is connected is arranged in the circulation path 33 in the direction in which air flows in the longitudinal direction of the connection part 61. It is installed.
  • the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42, the air flowing through the circulation path 33 does not flow in the direction in which the storage media 200 are arranged, but instead of the connection portion 61.
  • the ambient temperature of each storage medium 200 can be uniformly set to an arbitrary temperature.
  • each of the plurality of storage media 200 can be tested in a state along the actual temperature environment.
  • the thermostat 30 can be downsized in the horizontal direction, and the evaluation test apparatus 1 as a whole. Can be slimmed. As a result, the installation area when installing the evaluation test apparatus 1 can be reduced.
  • connection substrate 60 is arranged in such a direction that the insertion / extraction direction of the storage medium 200 inserted / removed into / from the connection portion 61 is in the range of 10 ° to 30 ° upward from the horizontal direction.
  • the connection substrate 60 when inserting / removing the storage medium 200, it can carry out more reliably. That is, when inserting / removing the storage medium 200 in the vertical direction, since the visibility is poor, there is a possibility that the insertion / extraction may fail, but visibility can be ensured by inserting / removing at an angle close to the horizontal direction, Errors during insertion and removal can be avoided. As a result, workability during the evaluation test can be improved, and the evaluation test of the storage medium 200 can be performed more reliably and at high speed.
  • the environment during the evaluation test of the storage medium 200 is the same as when the storage medium 200 is actually used. It can be closer to the environment. As a result, it is possible to reduce an error in the evaluation result due to an erroneous calculation between the environment during actual use of the storage medium 200 and the environment during the evaluation test, and a more accurate evaluation test can be performed.
  • connection board 60 is attached to the wall portion 38 that separates the inside of the circulation path 33 and the non-constant temperature part 37, and the cable 66 connected to the connection board 60 is drawn out from the non-constant temperature part 37. Even when the internal temperature is raised, heat transfer to the cable 66 can be suppressed. Thereby, it can suppress that the cable 66 becomes high temperature, and can suppress that the heat of the cable 66 is transmitted to the test control board 70 and the temperature of the test control board 70 becomes too high. As a result, thermal runaway of the test control board 70 can be suppressed.
  • the circulation path 33 is provided with an exhaust port 43 having an exhaust port opening / closing door 45 and an intake port 44 having an intake port opening / closing door 46, so that the exhaust port opening / closing door 45 and the intake port opening / closing door 46 are opened and closed.
  • the temperature in the circulation path 33 can be more reliably set to a desired temperature.
  • the temperature accuracy during the evaluation test of the storage medium 200 can be increased, and a more accurate evaluation test can be performed.
  • the intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33, when the intake port opening / closing door 46 is opened, the air that has entered from the intake port 44 is circulated. Air in a state of being mixed with the air in the path 33 can be passed through the temperature sensor 51. As a result, when the air inlet opening / closing door 46 is opened, the temperature of the air entering through the air inlet 44 is directly detected by the temperature sensor 51, and the temperature of the circulation path 33 cannot be appropriately controlled. Can be prevented. As a result, the temperature accuracy during the evaluation test of the storage medium 200 can be increased, and a more accurate evaluation test can be performed.
  • the power control board 80 that controls the power supplied to the storage medium 200 is provided with a discharge circuit 81 that discharges the storage medium 200, the power supplied to the storage medium 200 is cut off. In doing so, the storage medium 200 can be shut off stably and in a short time without imposing a burden. As a result, the power on / off test can be performed more reliably at high speed. As a result, a highly accurate evaluation test can be performed at a higher speed.
  • test control board 70 is disposed outside the circulation path 33 and is connected to the connection board 60 via the test board side connection board 65 and the cable 66, the heat of the circulation path 33 is transferred to the test control board.
  • the signal can be transmitted from the test control board 70 to the storage medium 200 with a waveform having an appropriate size while suppressing the transmission to the network 70. Thereby, it is possible to appropriately transmit a signal to the storage medium 200 and perform the evaluation test while suppressing thermal runaway of the test control board 70 during the evaluation test. As a result, a highly accurate evaluation test can be performed more reliably.
  • connection boards 60 Although a plurality of connection boards 60 are provided, the plurality of cables 66 that connect the plurality of connection boards 60 and the test control board 70 have the same length. It can suppress that the quality of the signal transmitted differs between connection boards 60. As a result, it is possible to suppress variations in signals when performing an evaluation test of a plurality of storage media 200, and it is possible to more reliably perform the evaluation test with high accuracy.
  • the lock mechanism 15 locks the opening / closing of the main door 3, so that the main door 3 can be opened while the test chamber 31 is at a high temperature. Can be suppressed. As a result, safety can be improved during the evaluation test.
  • connection boards 60 are provided, and an evaluation test of ten storage media 200 can be performed at one time. Good. If the test control board 70 is disposed outside the circulation path 33 and the test control board 70 and the connection board 60 are connected via the test board side connection board 65, the number of connection boards 60, that is, at a time. The number of storage media 200 that can perform the evaluation test is not limited.
  • a card-type SSD is cited as the storage medium 200 for performing the evaluation test.
  • the storage medium 200 may be other than the card-type SSD.
  • the storage medium 200 performing the evaluation test is, for example, M.M. 2 types and U.I. It may be an SSD of two types, SFF type, HHHL type, FHFL type or the like, or may be a storage medium 200 other than SSD.
  • the storage medium 200 when the storage medium 200 is connected to the connection portion 61 of the connection board 60, the storage medium 200 is directly connected to the connection portion 61.
  • an adapter that is compatible with the storage medium 200 is used.
  • the connection unit 61 may be connected.

Abstract

To test each of a plurality of recording media 200 in a state conforming to an actual temperature environment, this evaluation test device 1 for recording media 200 is provided with: a plurality of connection boards 60 that are arranged in an orientation such that the longitudinal direction of connection parts 61 when the connection parts 61 are viewed from the insertion direction of the storage media 200 corresponds to the vertical direction and that are aligned side by side in the transverse direction of the connection parts 61 when the connection parts 61 are viewed from the insertion direction of the storage media 200, a circulation path 33 within which air circulates and within which the connection boards 60 are provided in an orientation such that the air flows along the longitudinal direction of the connection parts 61, a heater 50 that is provided in the circulation path 33 and increases the temperature of the air flowing in the circulation path 33, an intake fan 41 that is provided in the circulation path 33 on the downstream side of the connection boards 60 in the direction in which the air flows in the circulation path 33, and an exhaust fan 42 that is provided in the circulation path 33 on the upstream side of the connection boards 60 and the downstream side of the intake fan 41 in the direction in which the air flows in the circulation path 33.

Description

記憶媒体の評価試験装置Evaluation test equipment for storage media
 本発明は、SSD等の記憶媒体の評価試験装置に関する。 The present invention relates to an evaluation test apparatus for storage media such as SSD.
 電子機器で用いる情報を記憶する記憶媒体は、磁気ディスクを用いたハードディスクドライブ(HDD)や、半導体素子メモリを用いたソリッドステートドライブ(SSD)等、様々な種類があるが、これらの記憶媒体は、組み立てを行った後、試験装置によって動作試験等を行う。 There are various types of storage media for storing information used in electronic devices, such as a hard disk drive (HDD) using a magnetic disk and a solid state drive (SSD) using a semiconductor element memory. After assembling, an operation test or the like is performed using a test apparatus.
 例えば、特許文献1に記載された環境試験チャンバでは、HDDを装着したハードドライブキャリアをキャリアパレットに装着し、試験チャンバに多数設けられるスロットにキャリアパレットを挿入することにより、1つの試験チャンバで複数のHDDの試験を行っている。また、特許文献1に記載された環境試験チャンバでは、任意の温度に調節された空気を、複数のHDDに対して供給することにより、所望の温度環境で試験を行うことを可能としている。 For example, in the environmental test chamber described in Patent Document 1, a hard drive carrier mounted with an HDD is mounted on a carrier pallet, and the carrier pallet is inserted into a plurality of slots provided in the test chamber, so that a plurality of test chambers can be installed in one test chamber. The HDD is being tested. Further, in the environmental test chamber described in Patent Document 1, it is possible to perform a test in a desired temperature environment by supplying air adjusted to an arbitrary temperature to a plurality of HDDs.
特表2003-506687号公報Special table 2003-506687 gazette
 ここで、近年では記憶媒体として、SSDのような半導体素子メモリを用いるものが増えているが、半導体素子メモリを用いる記憶媒体は、HDDのような磁性体を用いる記憶媒体と比較して消費電力が大きくなっている。このため、SSDのような半導体素子メモリを用いる記憶媒体は、動作時の発熱量が大きく、温度が高くなり易くなっているが、記憶媒体の周囲の温度は、記憶媒体の動作に重要な影響を与える要素になっている。従って、記憶媒体の評価試験を行う際には、温度を含めた使用環境を、記憶媒体の実際の使用環境に即した状態にして試験を行った方が高い精度で評価を行うことができ、評価試験として好ましいものになる。 Here, in recent years, the number of storage media using a semiconductor element memory such as an SSD has increased. However, the storage medium using a semiconductor element memory consumes more power than a storage medium using a magnetic material such as an HDD. Is getting bigger. For this reason, a storage medium using a semiconductor element memory such as an SSD generates a large amount of heat during operation and tends to increase in temperature. However, the temperature around the storage medium has an important influence on the operation of the storage medium. Is an element that gives Therefore, when performing an evaluation test of the storage medium, it is possible to perform the evaluation with higher accuracy if the test is performed with the use environment including the temperature in a state that is in accordance with the actual use environment of the storage medium. This is preferable as an evaluation test.
 しかしながら、複数の記憶媒体を同時に行う試験装置では、1つ1つの記憶媒体を実際の使用環境に即した状態にして試験を行うのは困難なものとなっている。例えば、特許文献1に記載された環境試験チャンバでは、任意の温度に調節された空気を複数のHDDに供給する際に、複数のHDDが並ぶ方向に沿って供給するため、空気の温度を任意の温度に調節したとしても、個々のHDDの位置では温度が変化する可能性がある。このため、複数の記憶媒体の試験を同時に行う試験装置によって評価試験を行う際に、個々の記憶媒体のそれぞれで、実際の温度環境に沿った状態での試験を行うのは、非常に困難なものとなっていた。 However, in a test apparatus that performs a plurality of storage media at the same time, it is difficult to perform a test in a state where each storage medium is in accordance with the actual use environment. For example, in the environmental test chamber described in Patent Document 1, when air adjusted to an arbitrary temperature is supplied to a plurality of HDDs, the temperature of the air is arbitrarily set in order to supply the plurality of HDDs along the direction in which they are arranged. Even if the temperature is adjusted, the temperature may change at the position of each HDD. For this reason, when an evaluation test is performed by a test apparatus that simultaneously tests a plurality of storage media, it is very difficult to perform a test in a state according to an actual temperature environment with each storage medium. It was a thing.
 本発明は、上記に鑑みてなされたものであって、複数の記憶媒体のそれぞれで、実際の温度環境に沿った状態で試験を行うことのできる記憶媒体の評価試験装置を提供することを目的とする。 The present invention has been made in view of the above, and an object of the present invention is to provide a storage medium evaluation test apparatus capable of performing a test in a state according to an actual temperature environment in each of a plurality of storage media. And
 上述した課題を解決し、目的を達成するために、本発明に係る記憶媒体の評価試験装置は、記憶媒体を挿抜自在に接続して前記記憶媒体との間で互いに信号の伝送を行う接続部を有すると共に、前記記憶媒体の挿抜方向に前記接続部を見た場合における前記接続部の長手方向が上下方向となる向きで配設され、且つ、前記記憶媒体の挿抜方向に前記接続部を見た場合における前記接続部の短手方向に複数が並んで設けられる接続基板と、内部で空気が循環すると共に、前記接続部の長手方向に空気が流れる向きで前記接続基板が配設される循環路と、前記循環路に配設され、前記循環路を流れる空気の温度を上昇させるヒータと、前記循環路における、前記循環路を流れる空気の流れ方向の前記接続基板の下流側に配設される吸気ファンと、前記循環路における、前記循環路を流れる空気の流れ方向の前記接続基板の上流側で、且つ、前記吸気ファンの下流側に配設される排気ファンと、を備えることを特徴とする。 In order to solve the above-described problems and achieve the object, a storage medium evaluation test apparatus according to the present invention is a connection unit that connects a storage medium in a freely detachable manner and transmits signals to and from the storage medium. And when the connection portion is viewed in the insertion / removal direction of the storage medium, the longitudinal direction of the connection portion is the vertical direction, and the connection portion is viewed in the insertion / removal direction of the storage medium. A plurality of connection boards that are arranged in the short direction of the connection part, and a circulation in which air is circulated inside and the connection board is arranged in a direction in which air flows in the longitudinal direction of the connection part. A passage, a heater disposed in the circulation path to increase the temperature of the air flowing through the circulation path, and a downstream side of the connection board in the flow direction of the air flowing through the circulation path. With intake fan In the circulation path, upstream of the connection board in the flow direction of the air flowing through the circulation path, and characterized by comprising a an exhaust fan disposed downstream of the suction fan.
 また、上記記憶媒体の評価試験装置において、前記接続基板は、前記接続部に挿抜される前記記憶媒体の挿抜方向が水平方向から上向きに10°以上30°以下の範囲内となる向きで配設されることが好ましい。 In the storage medium evaluation test apparatus, the connection board is disposed in an orientation in which the insertion / extraction direction of the storage medium inserted into / removed from the connection portion is within a range of 10 ° to 30 ° upward from the horizontal direction. It is preferred that
 また、上記記憶媒体の評価試験装置において、前記吸気ファンと前記排気ファンとの動作速度を調節することにより、前記循環路を流れる空気の風速を調節することができることが好ましい。 In the storage medium evaluation test apparatus, it is preferable that the wind speed of the air flowing through the circulation path can be adjusted by adjusting the operating speeds of the intake fan and the exhaust fan.
 また、上記記憶媒体の評価試験装置において、前記循環路には、前記循環路を流れる空気の流れ方向の前記接続基板の上流側に、複数の前記接続基板に対応する複数の吹付け口が設けられ、複数の前記吹付け口は、前記循環路を循環する空気を、対応する前記接続基板に対してそれぞれ吹き付けることが好ましい。 In the storage medium evaluation test apparatus, the circulation path is provided with a plurality of spray ports corresponding to the plurality of connection boards on the upstream side of the connection board in the flow direction of the air flowing through the circulation path. The plurality of spray ports preferably spray air circulating through the circulation path to the corresponding connection board.
 また、上記記憶媒体の評価試験装置において、前記循環路は環状に形成されると共に、前記循環路の環状の内側部分は前記循環路の内部から隔離された非恒温部になっており、前記接続基板は、前記循環路を形成する壁部のうち、前記循環路の内部と前記非恒温部とを隔てる前記壁部に取り付けられることが好ましい。 Further, in the storage medium evaluation test apparatus, the circulation path is formed in an annular shape, and the annular inner portion of the circulation path is a non-thermostatic part isolated from the inside of the circulation path, and the connection It is preferable that a board | substrate is attached to the said wall part which separates the inside of the said circulation path, and the said non-isothermal part among the wall parts which form the said circulation path.
 また、上記記憶媒体の評価試験装置において、前記循環路には、前記循環路内の空気を前記循環路の外部に放出する排気口と、前記循環路の外部の空気を前記循環路内に取り入れる吸気口と、が設けられており、前記排気口は、前記循環路を流れる空気の流れ方向における前記吸気口の上流側に配設され、前記吸気口は、前記循環路を流れる空気の流れ方向における前記ヒータの上流側に配設されることが好ましい。 In the storage medium evaluation test apparatus, the circulation path may include an exhaust port that discharges air in the circulation path to the outside of the circulation path, and air outside the circulation path into the circulation path. And the exhaust port is disposed upstream of the intake port in the flow direction of the air flowing through the circulation path, and the intake port is the flow direction of the air flowing through the circulation path It is preferable to be disposed on the upstream side of the heater.
 また、上記記憶媒体の評価試験装置において、前記接続基板には、前記記憶媒体に対して供給する電力を制御する電力制御基板が接続され、前記電力制御基板には、前記記憶媒体に放電を行わせる放電回路が設けられることが好ましい。 In the storage medium evaluation test apparatus, a power control board for controlling power supplied to the storage medium is connected to the connection board, and the power control board discharges the storage medium. It is preferable that a discharge circuit is provided.
 本発明に係る記憶媒体の評価試験装置は、複数の記憶媒体のそれぞれで、実際の温度環境に沿った状態で試験を行うことができる、という効果を奏する。 The storage medium evaluation test apparatus according to the present invention has an effect that each of the plurality of storage media can perform a test in accordance with an actual temperature environment.
図1は、実施形態に係る評価試験装置の正面図である。FIG. 1 is a front view of an evaluation test apparatus according to an embodiment. 図2は、図1のA-A矢視図である。FIG. 2 is an AA arrow view of FIG. 図3は、図2のC-C矢視図である。3 is a view taken along the line CC of FIG. 図4は、図1に示す評価試験装置の斜視図である。FIG. 4 is a perspective view of the evaluation test apparatus shown in FIG. 図5は、図1のB-B断面図である。5 is a cross-sectional view taken along the line BB in FIG. 図6は、図5のE部詳細図である。6 is a detailed view of a portion E in FIG. 図7は、図5のF部詳細図である。FIG. 7 is a detailed view of part F in FIG. 図8は、図4に示すメイン開閉扉を開いた状態を示す説明図である。FIG. 8 is an explanatory view showing a state in which the main door shown in FIG. 4 is opened. 図9は、図6に示す恒温槽の断面斜視図である。FIG. 9 is a cross-sectional perspective view of the thermostatic chamber shown in FIG. 図10は、図6のG-G断面図である。10 is a cross-sectional view taken along the line GG in FIG. 図11は、図9に示す試験室の斜視図である。FIG. 11 is a perspective view of the test chamber shown in FIG. 図12は、図1に示す操作パネルの詳細図である。FIG. 12 is a detailed view of the operation panel shown in FIG. 図13は、図7に示す試験制御基板の平面模式図である。FIG. 13 is a schematic plan view of the test control board shown in FIG. 図14は、図1に示す評価試験装置の全体構成を示すブロック図である。FIG. 14 is a block diagram showing the overall configuration of the evaluation test apparatus shown in FIG. 図15は、記憶媒体の一例を示す斜視図である。FIG. 15 is a perspective view illustrating an example of a storage medium.
 以下に、本開示に係る記憶媒体の評価試験装置の実施形態を図面に基づいて詳細に説明する。なお、この実施形態によりこの発明が限定されるものではない。また、下記実施形態における構成要素には、当業者が置換可能、且つ、容易なもの、或いは実質的に同一のものが含まれる。 Hereinafter, an embodiment of a storage medium evaluation test apparatus according to the present disclosure will be described in detail based on the drawings. In addition, this invention is not limited by this embodiment. In addition, constituent elements in the following embodiments include those that can be easily replaced by those skilled in the art or those that are substantially the same.
 〔実施形態〕
 図1は、実施形態に係る評価試験装置1の正面図である。図2は、図1のA-A矢視図である。図3は、図2のC-C矢視図である。図4は、図1に示す評価試験装置1の斜視図である。以下の説明では、評価試験装置1を任意の設置場所に設置して通常の使用形態で使用する際における上下方向を評価試験装置1の上下方向として説明し、通常の使用形態で使用する際における水平方向を評価試験装置1の水平方向として説明する。また、評価試験装置1の使用者が評価試験装置1に対して操作をする際に対向する側を評価試験装置1の正面とし、その反対側を評価試験装置1の背面として説明する。また、評価試験装置1を正面側、または背面側から見た場合における左右方向を、評価試験装置1の幅方向として説明する。また、水平方向における評価試験装置1の幅方向に直交する方向を、評価試験装置1の前後方向として説明する。つまり、評価試験装置1の前後方向は、正面側から背面側に向かう方向、或いは背面側から正面側に向かう方向になっている。
Embodiment
FIG. 1 is a front view of an evaluation test apparatus 1 according to the embodiment. FIG. 2 is an AA arrow view of FIG. 3 is a view taken along the line CC of FIG. 4 is a perspective view of the evaluation test apparatus 1 shown in FIG. In the following description, the vertical direction when the evaluation test apparatus 1 is installed at an arbitrary installation location and used in a normal usage pattern will be described as the vertical direction of the evaluation test apparatus 1, and when used in a normal usage pattern. The horizontal direction will be described as the horizontal direction of the evaluation test apparatus 1. Further, the side facing when the user of the evaluation test apparatus 1 operates the evaluation test apparatus 1 will be described as the front of the evaluation test apparatus 1, and the opposite side will be described as the back of the evaluation test apparatus 1. Further, the horizontal direction when the evaluation test apparatus 1 is viewed from the front side or the back side will be described as the width direction of the evaluation test apparatus 1. Moreover, the direction orthogonal to the width direction of the evaluation test apparatus 1 in the horizontal direction will be described as the front-rear direction of the evaluation test apparatus 1. That is, the front-back direction of the evaluation test apparatus 1 is a direction from the front side to the back side, or a direction from the back side to the front side.
 実施形態に係る評価試験装置1は、長手方向が上下方向となる略直方体の形状で形成されており、正面にはメイン開閉扉3と、操作部20と、メンテナンス扉5とが設けられている。このうち、メイン開閉扉3は、評価試験装置1の正面における、上下方向の上半側に位置しており、評価試験装置1によって記憶媒体200(図16参照)の試験を行う際に、評価試験装置1内に対して記憶媒体200を出し入れする際に開閉する開閉部になっている。メイン開閉扉3には、メイン開閉扉3を開けることなく評価試験装置1内を視認するための確認窓4が設けられている。評価試験装置1は、評価試験装置1の表面の大部分を構成する筐体2が、金属材料等の不透明の材料からなるのに対し、確認窓4は、透明のガラスや透明の樹脂材料等の透明の材料によって構成されている。 The evaluation test apparatus 1 according to the embodiment is formed in a substantially rectangular parallelepiped shape whose longitudinal direction is the vertical direction, and a main opening / closing door 3, an operation unit 20, and a maintenance door 5 are provided on the front surface. . Among these, the main opening / closing door 3 is positioned on the upper half side in the vertical direction on the front of the evaluation test apparatus 1, and is evaluated when the evaluation test apparatus 1 tests the storage medium 200 (see FIG. 16). An opening / closing portion is opened and closed when the storage medium 200 is taken in and out of the test apparatus 1. The main opening / closing door 3 is provided with a confirmation window 4 for visually recognizing the inside of the evaluation test apparatus 1 without opening the main opening / closing door 3. In the evaluation test apparatus 1, the casing 2 constituting most of the surface of the evaluation test apparatus 1 is made of an opaque material such as a metal material, while the confirmation window 4 is made of transparent glass, transparent resin material, or the like. Made of transparent material.
 また、メンテナンス扉5は、評価試験装置1の正面における、上下方向の下半側に位置しており、評価試験装置1内の機器類の調整やメンテナンス等の作業を行う際に開閉する開閉部になっている。また、操作部20は、評価試験装置1の正面における、上下方向の中央付近に位置しており、上下方向におけるメイン開閉扉3とメンテナンス扉5との間に配設されている。操作部20は、評価試験装置1での試験時に評価試験装置1に対して入力操作をしたり、試験の状態を確認したりすることのできる操作パネル21を有しており、操作パネル21が評価試験装置1の表面に位置する向きで配設されている。 The maintenance door 5 is located on the lower half side in the vertical direction on the front of the evaluation test apparatus 1, and is an opening / closing part that opens and closes when performing adjustments, maintenance, etc. in the evaluation test apparatus 1. It has become. The operation unit 20 is located near the center in the vertical direction on the front of the evaluation test apparatus 1 and is disposed between the main opening / closing door 3 and the maintenance door 5 in the vertical direction. The operation unit 20 includes an operation panel 21 that can perform an input operation on the evaluation test apparatus 1 during a test in the evaluation test apparatus 1 and check a test state. The evaluation test apparatus 1 is arranged in a direction located on the surface.
 また、メンテナンス扉5は、評価試験装置1の背面側にも配設されている。背面側のメンテナンス扉5は、正面側のメンテナンス扉5とは異なり、評価試験装置1の背面におけるほぼ全面に設けられている。 The maintenance door 5 is also arranged on the back side of the evaluation test apparatus 1. Unlike the maintenance door 5 on the front side, the maintenance door 5 on the back side is provided on almost the entire back surface of the evaluation test apparatus 1.
 また、評価試験装置1の側面や背面には、装置内と装置外との通気を行う通気口8が設けられており、評価試験装置1の背面には、装置内の空気を装置外に排出することにより排熱を行う排熱ファン9が設けられている。さらに、評価試験装置1の下部には、評価試験装置1を移動させる際における容易性を確保するキャスター6が取り付けられている。 In addition, vents 8 for venting the inside of the apparatus and the outside of the apparatus are provided on the side and the back of the evaluation test apparatus 1, and the air inside the apparatus is discharged to the outside of the apparatus on the back of the evaluation test apparatus 1. The exhaust heat fan 9 which exhausts heat by doing so is provided. Furthermore, a caster 6 is attached to the lower part of the evaluation test apparatus 1 to ensure ease when moving the evaluation test apparatus 1.
 図5は、図1のB-B断面図である。図6は、図5のE部詳細図である。図7は、図5のF部詳細図である。評価試験装置1の内部は、記憶媒体200の試験を行う際に記憶媒体200を配置する試験ユニット室11と、評価試験装置1の各部の制御を行う機器が配設される制御ユニット室12と、評価試験装置1を作動させるための電力に関わる機器が配設される電源ユニット室13と、に区分けされている。試験ユニット室11は、評価試験装置1の上下方向における上半側に位置しており、内部に恒温槽30が配設されている。メイン開閉扉3は、上下方向における配設範囲が、試験ユニット室11の上下方向における少なくとも一部の範囲と重なっている。 FIG. 5 is a cross-sectional view taken along the line BB in FIG. 6 is a detailed view of a portion E in FIG. FIG. 7 is a detailed view of part F in FIG. The evaluation test apparatus 1 includes a test unit chamber 11 in which the storage medium 200 is disposed when the storage medium 200 is tested, and a control unit chamber 12 in which devices for controlling each part of the evaluation test apparatus 1 are disposed. And a power supply unit chamber 13 in which equipment related to electric power for operating the evaluation test apparatus 1 is arranged. The test unit chamber 11 is located on the upper half side in the vertical direction of the evaluation test apparatus 1, and the thermostatic chamber 30 is disposed therein. The main opening / closing door 3 has an arrangement range in the vertical direction overlapping at least a partial range in the vertical direction of the test unit chamber 11.
 制御ユニット室12は、試験ユニット室11の下方に位置し、評価試験を行う際に記憶媒体200との間で信号のやり取りを行う試験制御基板70や、評価試験時に記憶媒体200に供給する電力の制御を行う電力制御基板80等が配設されている。電源ユニット室13は、商用電源から供給される電力を評価試験装置1で使用する電力に変換するスイッチング電源91や、異常な過電流が流れたときに電力の供給を遮断するブレーカーボックス93等を備える電源ユニット90が配設されている。電源ユニット室13は、制御ユニット室12の下方に位置している。正面側のメンテナンス扉5は、上下方向における配設範囲が、制御ユニット室12及び電源ユニット室13の上下方向における少なくとも一部の範囲と重なっている。 The control unit chamber 12 is located below the test unit chamber 11, and a test control board 70 that exchanges signals with the storage medium 200 when performing an evaluation test, and power supplied to the storage medium 200 during the evaluation test. A power control board 80 and the like for controlling the above are provided. The power supply unit chamber 13 includes a switching power supply 91 that converts power supplied from a commercial power source into power used by the evaluation test apparatus 1, a breaker box 93 that shuts off power supply when an abnormal overcurrent flows, and the like. A power supply unit 90 is provided. The power supply unit chamber 13 is located below the control unit chamber 12. As for the maintenance door 5 on the front side, the arrangement range in the vertical direction overlaps at least a part of the range in the vertical direction of the control unit chamber 12 and the power supply unit chamber 13.
 また、操作部20は、操作部20の上端付近に位置して評価試験装置1の幅方向に延びる回動軸を中心として回動自在に設けられている。操作部20に設けられる操作パネル21は、操作部20が回動することにより、水平方向を向く状態と、水平方向より斜め上方を向く状態との間で向きが変化する。 The operation unit 20 is provided so as to be rotatable about a rotation axis that is located near the upper end of the operation unit 20 and extends in the width direction of the evaluation test apparatus 1. The operation panel 21 provided in the operation unit 20 changes its orientation between a state in which the operation unit 20 is turned and a state in which the operation panel 21 is directed in the horizontal direction and a state in which the operation panel 20 is directed obliquely upward from the horizontal direction.
 図8は、図4に示すメイン開閉扉3を開いた状態を示す説明図である。メイン開閉扉3は、メイン開閉扉3を閉じた状態における上端側に位置して試験ユニット室11の幅方向に延びる回動軸を中心として、回動自在に設けられている。メイン開閉扉3は、上下方向における位置が試験ユニット室11と重なっているため、メイン開閉扉3を開閉することにより、試験ユニット室11を開閉することが可能になっている。具体的には、メイン開閉扉3は、試験ユニット室11に配設される恒温槽30が有する試験室31を開閉することが可能になっており、上方に向けて開いた際には、試験室31を開放し、下方に向けて閉じた際には、試験室31を閉じることが可能になっている。試験室31は、恒温槽30の一部を構成し、記憶媒体200の評価試験時に記憶媒体200を配置する部位になっている。このように試験室31を開閉可能に設けられるメイン開閉扉3には、上方に向けて開いた際に、メイン開閉扉3が自重で閉じないように開いたメイン開閉扉3を下方側から支持する支持ダンパ7が接続されている。 FIG. 8 is an explanatory diagram showing a state in which the main door 3 shown in FIG. 4 is opened. The main opening / closing door 3 is provided so as to be rotatable about a rotation axis that is located on the upper end side in a state where the main opening / closing door 3 is closed and extends in the width direction of the test unit chamber 11. Since the main opening / closing door 3 overlaps with the test unit chamber 11 in the vertical direction, the test unit chamber 11 can be opened / closed by opening / closing the main opening / closing door 3. Specifically, the main open / close door 3 can open and close a test chamber 31 included in a thermostatic chamber 30 disposed in the test unit chamber 11. When the main open / close door 3 is opened upward, When the chamber 31 is opened and closed downward, the test chamber 31 can be closed. The test chamber 31 constitutes a part of the thermostatic bath 30 and is a part where the storage medium 200 is arranged during an evaluation test of the storage medium 200. The main opening / closing door 3 that can open and close the test chamber 31 in this way supports the main opening / closing door 3 that is opened so that the main opening / closing door 3 does not close by its own weight when it is opened upward. A supporting damper 7 is connected.
 また、評価試験装置1には、メイン開閉扉3のロック機構15が備えられている。ロック機構15は、閉じた状態におけるメイン開閉扉3の下端部に位置する凹部16と、メイン開閉扉3を閉じた状態において凹部16に対向する位置に配設される突出部17とを有している。突出部17は、上下方向に移動可能なピン状の形状で形成されており、ロック機構15は、メイン開閉扉3が閉じている状態において突出部17が上昇して凹部16内に入り込むことにより、メイン開閉扉3の回動を規制し、メイン開閉扉3を閉じた状態に維持することが可能になっている。また、ロック機構15は、突出部17が下降した際には、突出部17は凹部16内に入り込まないため、メイン開閉扉3を自在に開閉させることが可能になる。 Also, the evaluation test apparatus 1 is provided with a lock mechanism 15 for the main door 3. The lock mechanism 15 has a recess 16 located at the lower end of the main door 3 in the closed state and a protrusion 17 disposed at a position facing the recess 16 in the state where the main door 3 is closed. ing. The protrusion 17 is formed in a pin-like shape movable in the vertical direction, and the lock mechanism 15 is configured such that the protrusion 17 rises and enters the recess 16 when the main door 3 is closed. The rotation of the main door 3 can be restricted and the main door 3 can be kept closed. Further, the lock mechanism 15 can freely open and close the main door 3 because the protrusion 17 does not enter the recess 16 when the protrusion 17 is lowered.
 図9は、図6に示す恒温槽30の断面斜視図である。なお、図9は、試験室31に記憶媒体200が配設された状態を示している。恒温槽30は、内部で空気が循環する循環路33を有している。循環路33は、評価試験装置1の幅方向に恒温槽30を見たときに略環状の形状で形成されている。具体的には、循環路33は、評価試験装置1の幅方向に見た場合において、外周側が縦長の略八角形の形状で形成され、内周側が縦長の略長方形の形状で形成されている。恒温槽30は、循環路33の長手方向、即ち、循環路33の外周側の八角形や内周の長方形の長手方向が、評価試験装置1の上下方向に対して傾斜する向きで配設されている。具体的には、恒温槽30は、循環路33の上端側が下端側よりも評価試験装置1の背面側に位置する方向に、循環路33の長手方向が、上下方向に対して約15°の角度で傾斜して配設されている。 FIG. 9 is a cross-sectional perspective view of the thermostatic chamber 30 shown in FIG. FIG. 9 shows a state where the storage medium 200 is disposed in the test chamber 31. The thermostat 30 has a circulation path 33 through which air circulates. The circulation path 33 is formed in a substantially annular shape when the thermostat 30 is viewed in the width direction of the evaluation test apparatus 1. Specifically, when viewed in the width direction of the evaluation test apparatus 1, the circulation path 33 is formed in a substantially octagonal shape in which the outer peripheral side is vertically long, and is formed in a substantially rectangular shape in which the inner peripheral side is vertically long. . The constant temperature bath 30 is arranged in a direction in which the longitudinal direction of the circulation path 33, that is, the longitudinal direction of the octagon on the outer circumference side of the circulation path 33 or the rectangular shape of the inner circumference is inclined with respect to the vertical direction of the evaluation test apparatus 1. ing. Specifically, the thermostatic chamber 30 is configured such that the upper end side of the circulation path 33 is positioned on the back side of the evaluation test apparatus 1 with respect to the lower end side, and the longitudinal direction of the circulation path 33 is about 15 ° with respect to the vertical direction. Inclined at an angle.
 試験室31は、環状形成される循環路33における、評価試験装置1の正面側に位置する領域が、試験室31として設けられている。試験室31における正面側は開口部32になっており、メイン開閉扉3は、開閉することにより開口部32を開閉することが可能になっている。また、環状形成される循環路33の環状の内側部分は、循環路33の内部から隔離された非恒温部37になっている。即ち、非恒温部37は、恒温槽30を評価試験装置1の幅方向に見た場合に、循環路33の内側で略長方形の形状で形成される領域になっている。 The test chamber 31 is provided with a region located on the front side of the evaluation test apparatus 1 in the annularly formed circulation path 33 as the test chamber 31. The front side of the test chamber 31 is an opening 32, and the main opening / closing door 3 can open and close the opening 32 by opening and closing. Further, the annular inner portion of the circulation path 33 that is annularly formed is a non-constant temperature portion 37 that is isolated from the inside of the circulation path 33. That is, the non-isothermal part 37 is a region formed in a substantially rectangular shape inside the circulation path 33 when the thermostatic chamber 30 is viewed in the width direction of the evaluation test apparatus 1.
 なお、以下の説明では、便宜上、循環路33における、略長方形の形状で形成される非恒温部37の上端側の短辺に面する領域は上端部34として説明し、非恒温部37の下端側の短辺に面する領域は下端部35として説明し、試験室31が位置する側の反対側の長辺に面する領域は背面部36として説明する。 In the following description, for the sake of convenience, the region facing the short side of the upper end side of the non-constant temperature portion 37 formed in a substantially rectangular shape in the circulation path 33 will be described as the upper end portion 34, and the lower end of the non-constant temperature portion 37 will be described. The region facing the short side on the side will be described as the lower end portion 35, and the region facing the long side on the side opposite to the side where the test chamber 31 is located will be described as the back surface portion 36.
 循環路33の一部を構成する試験室31には、評価試験装置1によって評価試験を行う記憶媒体200が接続される接続基板60が配設されている。接続基板60は、評価試験装置1の前後方向において、試験室31における開口部32が位置する側の反対側に配設されている。つまり、接続基板60は、循環路33を形成する壁部38のうち、循環路33の内部と非恒温部37とを隔てる壁部38に取り付けられている。 In the test chamber 31 that constitutes a part of the circulation path 33, a connection substrate 60 to which a storage medium 200 that performs an evaluation test by the evaluation test apparatus 1 is connected is disposed. The connection substrate 60 is disposed on the opposite side of the test chamber 31 from the side where the opening 32 is located in the front-rear direction of the evaluation test apparatus 1. That is, the connection substrate 60 is attached to the wall portion 38 that separates the inside of the circulation path 33 and the non-constant temperature portion 37 among the wall portions 38 that form the circulation path 33.
 循環路33には、吸気ファン41と、排気ファン42と、ヒータ50と、温度センサ51とが配設されており、循環路33内の空気は、吸気ファン41と排気ファン42とにより、循環路33内で循環することが可能になっている。循環の方向は、循環路33における試験室31から上端部34に向かい、上端部34から背面部36に向かい、背面部36から下端部35に向かい、下端部35から試験室31に向かう方向になっている。換言すると、循環路33内を流れる空気の循環の方向は、循環路33における試験室31では下方から上方に流れ、上端部34では正面側から背面側に流れ、背面部36では上方から下方に流れ、下端部35では背面側から正面側に流れる方向になっている。 The circulation path 33 is provided with an intake fan 41, an exhaust fan 42, a heater 50, and a temperature sensor 51. Air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42. Circulation in the path 33 is possible. The circulation direction is from the test chamber 31 toward the upper end 34 in the circulation path 33, from the upper end 34 toward the back surface 36, from the back surface 36 toward the lower end 35, and from the lower end 35 toward the test chamber 31. It has become. In other words, the direction of the circulation of the air flowing in the circulation path 33 flows from the lower side to the upper side in the test chamber 31 in the circulation path 33, flows from the front side to the rear side in the upper end portion 34, and from the upper side to the lower side in the back surface portion 36. The lower end 35 is in the direction of flow from the back side to the front side.
 循環路33内に配設される部材のうち、ヒータ50は、循環路33の背面部36に配設されており、循環路33を流れる空気の温度を上昇させることが可能になっている。また、温度センサ51は、循環路33の下端部35に配設されており、循環路33を流れる空気の温度を検知することが可能になっている。即ち、温度センサ51は、循環路33を循環する空気の流れ方向における、試験室31の直前の上流側で空気の温度を検知することが可能になっている。 Among the members disposed in the circulation path 33, the heater 50 is disposed on the back surface portion 36 of the circulation path 33, and can increase the temperature of the air flowing through the circulation path 33. Further, the temperature sensor 51 is disposed at the lower end portion 35 of the circulation path 33 and can detect the temperature of the air flowing through the circulation path 33. That is, the temperature sensor 51 can detect the temperature of the air on the upstream side immediately before the test chamber 31 in the flow direction of the air circulating through the circulation path 33.
 また、吸気ファン41は、循環路33における、循環路33を流れる空気の流れ方向の接続基板60の下流側に配設されており、具体的には、循環路33の上端部34に配設されている。これにより、吸気ファン41は、循環路33における試験室31側の空気を吸引し、吸引した空気を背面部36側に排出することができる。また、排気ファン42は、循環路33における、循環路33を流れる空気の流れ方向の接続基板60の上流側で、且つ、吸気ファン41の下流側に配設されている。具体的には、排気ファン42は、循環路33の下端部35における温度センサ51の上流側に配設されている。これにより、排気ファン42は、循環路33における背面部36側の空気を吸引し、吸引した空気を試験室31側に排出することができる。 The intake fan 41 is disposed on the downstream side of the connection board 60 in the direction of the air flow through the circulation path 33 in the circulation path 33, and specifically, disposed on the upper end portion 34 of the circulation path 33. Has been. Thus, the intake fan 41 can suck the air on the test chamber 31 side in the circulation path 33 and discharge the sucked air to the back surface portion 36 side. Further, the exhaust fan 42 is disposed on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33 and on the downstream side of the intake fan 41 in the circulation path 33. Specifically, the exhaust fan 42 is disposed on the upstream side of the temperature sensor 51 in the lower end portion 35 of the circulation path 33. Thereby, the exhaust fan 42 can suck the air on the back surface 36 side in the circulation path 33 and discharge the sucked air to the test chamber 31 side.
 また、循環路33には、循環路33内の空気を循環路33の外部に放出する排気口43と、循環路33の外部の空気を循環路33内に取り入れる吸気口44と、が設けられている。このうち、排気口43は、循環路33の上端部34と背面部36との間の領域における、循環路33の外周を形成する壁部38に形成されており、上端部34を流れる空気の延長線上に形成されている。このため、排気口43は、上端部34を流れた空気を循環路33の外に排出し易くなっている。また、吸気口44は、循環路33の背面部36における、循環路33の外周を形成する壁部38に形成されている。つまり、排気口43は、循環路33を流れる空気の流れ方向における、吸気口44の上流側に配設されている。また、吸気口44は、循環路33を流れる空気の流れ方向における、ヒータ50の上流側に配設されている。 Further, the circulation path 33 is provided with an exhaust port 43 for releasing the air in the circulation path 33 to the outside of the circulation path 33 and an intake port 44 for taking the air outside the circulation path 33 into the circulation path 33. ing. Among these, the exhaust port 43 is formed in the wall portion 38 that forms the outer periphery of the circulation path 33 in the region between the upper end portion 34 and the back surface portion 36 of the circulation path 33, and the air flowing through the upper end portion 34 is formed. It is formed on the extension line. For this reason, the exhaust port 43 is easy to discharge the air that has flowed through the upper end portion 34 out of the circulation path 33. Further, the intake port 44 is formed in a wall portion 38 that forms the outer periphery of the circulation path 33 in the back surface portion 36 of the circulation path 33. That is, the exhaust port 43 is disposed on the upstream side of the intake port 44 in the flow direction of the air flowing through the circulation path 33. The intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33.
 また、排気口43と吸気口44とには、これらを開閉する排気口開閉扉45と吸気口開閉扉46が設けられている。つまり、排気口43には、排気口43を開閉する排気口開閉扉45が設けられ、吸気口44には、吸気口44を開閉する吸気口開閉扉46が設けられている。このうち、吸気口開閉扉46は、吸気口44を開いた際に、循環路33を流れる空気の流れ方向における上流側から下流側に向かうに従って、循環路33から離れた位置から循環路33に近付く方向に傾斜した状態になる。このため、吸気口開閉扉46を開いた際には、循環路33を流れる空気に引きずられて、循環路33の外の空気が吸気口44から循環路33内に入り込み易くなっている。 Also, the exhaust port 43 and the intake port 44 are provided with an exhaust port opening / closing door 45 and an intake port opening / closing door 46 for opening and closing them. That is, the exhaust port 43 is provided with an exhaust port opening / closing door 45 that opens and closes the exhaust port 43, and the intake port 44 is provided with an intake port opening / closing door 46 that opens and closes the intake port 44. Among these, the intake opening / closing door 46 is moved from the position away from the circulation path 33 to the circulation path 33 from the upstream side to the downstream side in the flow direction of the air flowing through the circulation path 33 when the intake port 44 is opened. It will be in a state inclined in the approaching direction. For this reason, when the intake port opening / closing door 46 is opened, the air flowing through the circulation path 33 is dragged and air outside the circulation path 33 easily enters the circulation path 33 from the intake port 44.
 図10は、図6のG-G断面図である。図11は、図9に示す試験室31の斜視図である。試験室31に配設される接続基板60は、評価試験装置1の幅方向に複数が並んで配設されており、本実施形態では、接続基板60は、10枚が幅方向に並んで配設されている。各接続基板60は、記憶媒体200を挿抜自在に接続して記憶媒体200との間で互いに信号の伝送を行うスロット状の接続部61を有している。つまり、接続部61は、記憶媒体200の挿抜方向に見た場合に、一方向の長さが長く、この方向と直交する方向の幅が狭い矩形の孔状の形状で形成されている。 FIG. 10 is a GG cross-sectional view of FIG. FIG. 11 is a perspective view of the test chamber 31 shown in FIG. A plurality of connection boards 60 arranged in the test chamber 31 are arranged side by side in the width direction of the evaluation test apparatus 1. In this embodiment, 10 connection boards 60 are arranged in the width direction. It is installed. Each connection board 60 has a slot-like connection portion 61 that connects the storage medium 200 in a freely detachable manner and transmits signals to and from the storage medium 200. That is, the connection portion 61 is formed in a rectangular hole shape having a long length in one direction and a narrow width in a direction orthogonal to this direction when viewed in the insertion / extraction direction of the storage medium 200.
 ここで、本実施形態に係る評価試験装置1によって評価試験を行う記憶媒体200は、I/O(input/output)シリアルインターフェースの一種である、PCI Expressによって入出力が行われる記憶媒体200になっている。このため、接続基板60の接続部61も、PCI Expressに準じたスロット状の接続部になっている。 Here, the storage medium 200 that performs the evaluation test by the evaluation test apparatus 1 according to the present embodiment is a storage medium 200 that performs input / output by PCI Express, which is a type of I / O (input / output) serial interface. ing. For this reason, the connection part 61 of the connection board | substrate 60 is also a slot-shaped connection part according to PCI Express.
 試験室31に配置される記憶媒体200は、接続基板60の接続部61に挿し込まれて接続部61に接続されることにより、配置することが可能になっている。接続部61に対して挿抜される記憶媒体200の挿抜方向は、概ね評価試験装置1の前後方向になっている。即ち、接続部61に対して記憶媒体200を差し込む方向は、概ね試験室31の開口部32側から、接続部61に対して記憶媒体200を近付ける方向、即ち、評価試験装置1の正面方向から背面方向に記憶媒体200を移動させる方向になっている。また、接続部61にから記憶媒体200を抜く方向は、概ね記憶媒体200を接続部61から試験室31の開口部32側に移動させる方向、即ち、評価試験装置1の背面方向から正面方向に記憶媒体200を移動させる方向になっている。 The storage medium 200 arranged in the test chamber 31 can be arranged by being inserted into the connection part 61 of the connection substrate 60 and connected to the connection part 61. The insertion / removal direction of the storage medium 200 inserted / removed with respect to the connection part 61 is generally the front-rear direction of the evaluation test apparatus 1. That is, the direction in which the storage medium 200 is inserted into the connection portion 61 is generally from the side of the opening 32 of the test chamber 31, the direction in which the storage medium 200 is brought closer to the connection portion 61, that is, from the front direction of the evaluation test apparatus 1. The storage medium 200 is moved in the rear direction. Further, the direction in which the storage medium 200 is pulled out from the connection portion 61 is generally the direction in which the storage medium 200 is moved from the connection portion 61 to the opening 32 side of the test chamber 31, that is, from the back side to the front side of the evaluation test apparatus 1. The storage medium 200 is moved.
 接続部61に対する記憶媒体200の挿抜方向が、これらの向きになる接続基板60は、記憶媒体200の挿抜方向に接続部61を見た場合における接続部61の長手方向が上下方向となる向きで配設されている。試験室31を形成する壁部38には、接続基板60を保持する接続基板保持部39が設けられており、接続基板60は、接続基板60の配設状態における上端側と下端側とが、それぞれ接続基板保持部39に取り付けられることにより、試験室31に配設されている。また、試験室31に配設される複数の接続基板60は、記憶媒体200の挿抜方向に接続部61を見た場合における接続部61の短手方向に並んで配設されている。 The connection substrate 60 in which the insertion / extraction direction of the storage medium 200 with respect to the connection part 61 is in these directions is such that the longitudinal direction of the connection part 61 is the vertical direction when the connection part 61 is viewed in the insertion / extraction direction of the storage medium 200. It is arranged. The wall portion 38 that forms the test chamber 31 is provided with a connection board holding portion 39 that holds the connection board 60. The connection board 60 has an upper end side and a lower end side in the arrangement state of the connection board 60. Each is mounted in the test chamber 31 by being attached to the connection substrate holding part 39. Further, the plurality of connection boards 60 arranged in the test chamber 31 are arranged side by side in the short direction of the connection part 61 when the connection part 61 is viewed in the insertion / extraction direction of the storage medium 200.
 各接続基板60は、接続部61の長手方向が上下方向となる向きで、少なくとも接続部61が試験室31に配設されるが、循環路33の一部である試験室31は、循環路33を流れる空気の流れ方向が上下方向になっている。このため、接続基板60は、接続部61の長手方向に空気が流れる向きで、循環路33に配設されている。 Each connection substrate 60 has a longitudinal direction of the connection portion 61 in the vertical direction, and at least the connection portion 61 is disposed in the test chamber 31. However, the test chamber 31 which is a part of the circulation path 33 is connected to the circulation path. The flow direction of the air flowing through 33 is the vertical direction. For this reason, the connection substrate 60 is disposed in the circulation path 33 in a direction in which air flows in the longitudinal direction of the connection portion 61.
 また、接続基板60は、記憶媒体200の挿抜方向が水平方向から傾斜する向きで配設されている。具体的には、接続基板60は、接続部61に挿抜される記憶媒体200の挿抜方向が、水平方向から上向きに10°以上30°以下の範囲内となる向きで配設されている。即ち、接続基板60は、接続部61に記憶媒体200を差し込む際には、記憶媒体200を評価試験装置1の正面方向から背面方向に移動させつつ上方から下方に移動させ、接続部61から記憶媒体200を抜く際には、記憶媒体200を評価試験装置1の背面方向から正面方向に移動させつつ下方から上方に移動させる方向に、水平方向に対して10°以上30°以下の範囲内で傾斜して配設されている。本実施形態では、接続基板60は、接続部61に挿抜される記憶媒体200の挿抜方向が、水平方向から上向きに15°の角度になるように配設されている。 In addition, the connection substrate 60 is arranged in such a direction that the insertion / extraction direction of the storage medium 200 is inclined from the horizontal direction. Specifically, the connection substrate 60 is disposed in an orientation in which the insertion / extraction direction of the storage medium 200 inserted into / removed from the connection portion 61 is in the range of 10 ° to 30 ° upward from the horizontal direction. That is, when inserting the storage medium 200 into the connection unit 61, the connection substrate 60 moves the storage medium 200 from the front to the back while moving the storage medium 200 from the front to the back of the evaluation test apparatus 1. When removing the medium 200, the storage medium 200 is moved from the lower side to the front side while moving the storage medium 200 from the lower side to the front side, within a range of 10 ° to 30 ° with respect to the horizontal direction. Inclined. In the present embodiment, the connection substrate 60 is arranged so that the insertion / extraction direction of the storage medium 200 inserted into / removed from the connection unit 61 is an angle of 15 ° upward from the horizontal direction.
 また、循環路33には、循環路33を流れる空気の流れ方向の接続基板60の上流側に、循環路33を循環する空気を接続基板60に対して吹き付ける吹付け口55が設けられている。吹付け口55は、複数の接続基板60に対応して複数が設けられており、複数の吹付け口55は、循環路33を循環する空気を、対応する接続基板60に対してそれぞれ吹き付けることが可能になっている。 The circulation path 33 is provided with a blowing port 55 for blowing air circulating in the circulation path 33 against the connection board 60 on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33. . A plurality of spray ports 55 are provided corresponding to the plurality of connection boards 60, and the plurality of spray holes 55 spray air circulating through the circulation path 33 to the corresponding connection boards 60. Is possible.
 具体的には、循環路33における接続基板60の上流側の位置、即ち、試験室31における接続基板60が配設される位置よりも下端部35寄りの位置には、複数の吹付け口板部材56が配設されている。吹付け口板部材56は、試験室31における接続基板60が配設される位置よりも下端部35寄りの位置で、非恒温部37側から試験室31側に向けて配設される板状の部材になっており、板の厚さ方向が、複数の接続基板60が並ぶ方向になる向きで配設されている。 Specifically, at a position upstream of the connection board 60 in the circulation path 33, that is, a position closer to the lower end portion 35 than a position where the connection board 60 is disposed in the test chamber 31, a plurality of spray port plates are provided. A member 56 is provided. The spray port plate member 56 is a plate-like shape disposed from the non-constant temperature portion 37 side toward the test chamber 31 side at a position closer to the lower end portion 35 than the position where the connection substrate 60 is disposed in the test chamber 31. The thickness direction of a board is arrange | positioned in the direction which becomes the direction in which the some connection board | substrate 60 is located in a line.
 これらのように形成される吹付け口板部材56は、複数の接続基板60が並ぶ方向における位置、即ち、評価試験装置1の幅方向における位置は、隣り合う接続基板60同士の位置になっている。また、複数の接続基板60のうち、最も外側に位置する両端の接続基板60の外側にも、吹付け口板部材56はそれぞれ配設されている。評価試験装置1の幅方向に並んで配設される複数の吹付け口板部材56の、隣り合う吹付け口板部材56同士の間の部分が、吹付け口55として形成されている。 The spray port plate member 56 formed as described above has a position in the direction in which the plurality of connection boards 60 are arranged, that is, a position in the width direction of the evaluation test apparatus 1 between the adjacent connection boards 60. Yes. Further, the spray port plate members 56 are respectively disposed on the outer sides of the connection substrates 60 at both ends located on the outermost side among the plurality of connection substrates 60. A portion between the adjacent spray port plate members 56 of the plurality of spray port plate members 56 arranged side by side in the width direction of the evaluation test apparatus 1 is formed as a spray port 55.
 つまり、各吹付け口板部材56は、評価試験装置1の幅方向における位置が、接続基板60の両側に位置するため、互いに隣り同士となる吹付け口板部材56同士の間の部分の、評価試験装置1の幅方向における位置は、接続基板60の位置と同じ位置になる。このため、互いに隣り同士となる吹付け口板部材56同士の間の部分である吹付け口55は、評価試験装置1の幅方向における位置が、接続基板60の位置と同じ位置になっている。これにより、複数の吹付け口55は、複数の接続基板60に対応して配設されている。循環路33を流れる空気が下端部35側から接続基板60に向けて流れる際には、吹付け口55を通って試験室31内に位置する接続基板60に向かって流れるため、換言すると、各吹付け口55は、循環路33を循環する空気を、対応する接続基板60に対してそれぞれ吹き付けることが可能になっている。 That is, each blowing port plate member 56 is positioned on both sides of the connection board 60 because the position in the width direction of the evaluation test apparatus 1 is the portion between the blowing port plate members 56 adjacent to each other. The position in the width direction of the evaluation test apparatus 1 is the same position as the position of the connection board 60. For this reason, the position in the width direction of the evaluation test apparatus 1 is the same position as the position of the connection board 60 in the spray port 55 which is a portion between the spray port plate members 56 adjacent to each other. . As a result, the plurality of spray ports 55 are arranged corresponding to the plurality of connection boards 60. When the air flowing through the circulation path 33 flows from the lower end portion 35 side toward the connection substrate 60, it flows toward the connection substrate 60 located in the test chamber 31 through the blowing port 55. The blowing port 55 can blow the air circulating through the circulation path 33 against the corresponding connection board 60.
 また、試験室31の下端付近で吹付け口板部材56よりも開口部31寄りの位置には、接続基板60に挿し込まれた記憶媒体200を保持する記憶媒体保持ステー120が配設されている。記憶媒体保持ステー120は、評価試験装置1の幅方向に延びて配設されると共に、評価試験装置1の幅方向に延びる回動軸を中心として回動自在に設けられている。記憶媒体保持ステー120の両端には、記憶媒体保持ステー120の回動を規制するステーロック部材121が配設されており、記憶媒体保持ステー120が記憶媒体200を保持する状態でステーロック部材121によって記憶媒体保持ステー120の回動を規制することにより、記憶媒体200を保持することが可能になっている。 In addition, a storage medium holding stay 120 that holds the storage medium 200 inserted into the connection substrate 60 is disposed near the lower end of the test chamber 31 and closer to the opening 31 than the blowing port plate member 56. Yes. The storage medium holding stay 120 extends in the width direction of the evaluation test apparatus 1 and is provided so as to be rotatable about a rotation shaft extending in the width direction of the evaluation test apparatus 1. A stay lock member 121 that restricts the rotation of the storage medium holding stay 120 is disposed at both ends of the storage medium holding stay 120, and the stay lock member 121 is in a state where the storage medium holding stay 120 holds the storage medium 200. By restricting the rotation of the storage medium holding stay 120, the storage medium 200 can be held.
 また、試験室31には、複数の補助ケーブル110が配設されている。補助ケーブル110は、複数の接続基板60に対応して設けられており、即ち、本実施形態では、補助ケーブル110は10本が設けられている。補助ケーブル110は、試験室31を形成する壁部38を貫通して試験室31側と非恒温部37側とに亘って延びて配設されている。補助ケーブル110における試験室31側に配設される部分は、評価試験装置1の幅方向における位置が、それぞれ対応する接続基板60の位置と同じ位置に配設されており、接続基板60の上方における接続基板60の近傍から、上方に向かって配設されている。試験室31の壁部38には、接続基板保持部39の上方に補助ケーブル110を保持する補助ケーブル保持部112が設けられており、補助ケーブル110は、補助ケーブル110の端部に設けられる補助ケーブル端子111の近傍が、補助ケーブル保持部112に着脱自在に保持されている。 In addition, a plurality of auxiliary cables 110 are disposed in the test chamber 31. The auxiliary cables 110 are provided corresponding to the plurality of connection boards 60, that is, in the present embodiment, ten auxiliary cables 110 are provided. The auxiliary cable 110 extends through the wall portion 38 forming the test chamber 31 and extends over the test chamber 31 side and the non-thermal constant portion 37 side. The portion of the auxiliary cable 110 disposed on the test chamber 31 side is disposed at the same position in the width direction of the evaluation test apparatus 1 as the position of the corresponding connection board 60, and above the connection board 60. From the vicinity of the connection board 60 in FIG. The wall portion 38 of the test chamber 31 is provided with an auxiliary cable holding portion 112 that holds the auxiliary cable 110 above the connection board holding portion 39, and the auxiliary cable 110 is provided at the end of the auxiliary cable 110. The vicinity of the cable terminal 111 is detachably held by the auxiliary cable holding portion 112.
 また、吸気ファン41と排気ファン42とは、図10に示すように、本実施形態では、それぞれ3つずつが評価試験装置1の幅方向に並んで配設されている。これにより、吸気ファン41と排気ファン42は、評価試験装置1の幅方向における循環路33の幅方向における全ての領域に亘って、吸気したり排気したりすることが可能になっている。 Further, as shown in FIG. 10, three intake fans 41 and three exhaust fans 42 are arranged side by side in the width direction of the evaluation test apparatus 1 in this embodiment. Thus, the intake fan 41 and the exhaust fan 42 can intake and exhaust air over the entire region in the width direction of the circulation path 33 in the width direction of the evaluation test apparatus 1.
 図12は、図1に示す操作パネル21の詳細図である。操作部20が有する操作パネル21には、タッチパネル22と、インジケータ23と、外部機器接続部24と、スイッチ25と、補助ケーブル接続端子26とが設けられている。タッチパネル22は、評価試験装置1で評価試験を行う際における各種情報を表示する表示部として設けられると共に、評価試験装置1の使用者が、タッチパネル22に表示される情報に基づいてタッチパネル22に触れることにより入力操作を行う入力部としても設けられている。また、インジケータ23は、LED(light emitting diode)等の光源からなり、点灯したり消灯したりすることにより、評価試験装置1での評価試験時に所定の情報を表示する。 FIG. 12 is a detailed view of the operation panel 21 shown in FIG. An operation panel 21 included in the operation unit 20 includes a touch panel 22, an indicator 23, an external device connection unit 24, a switch 25, and an auxiliary cable connection terminal 26. The touch panel 22 is provided as a display unit that displays various information when the evaluation test apparatus 1 performs an evaluation test, and the user of the evaluation test apparatus 1 touches the touch panel 22 based on information displayed on the touch panel 22. Therefore, it is also provided as an input unit for performing an input operation. The indicator 23 includes a light source such as an LED (light emitting diode), and displays predetermined information during an evaluation test in the evaluation test apparatus 1 by turning on or off.
 また、外部機器接続部24は、パーソナルコンピュータ(図示省略)等の、評価試験装置1との間で情報をやり取りすることのできる外部機器との接続部になっている。また、スイッチ25は、評価試験装置1に対して所定の動作を行わせる際に押下をする入力手段になっている。また、補助ケーブル接続端子26は、試験室31に配設される補助ケーブル110における、試験室31内に位置する補助ケーブル端子111の反対側の端子に接続されており、評価試験装置1の外部から任意の機器を補助ケーブル110に接続するための接続端子になっている。 Also, the external device connection unit 24 is a connection unit with an external device that can exchange information with the evaluation test apparatus 1 such as a personal computer (not shown). The switch 25 is an input unit that is pressed when the evaluation test apparatus 1 performs a predetermined operation. The auxiliary cable connection terminal 26 is connected to a terminal on the opposite side of the auxiliary cable terminal 111 located in the test chamber 31 in the auxiliary cable 110 disposed in the test chamber 31. To a connection terminal for connecting an arbitrary device to the auxiliary cable 110.
 図13は、図7に示す試験制御基板70の平面模式図である。試験制御基板70は、各種処理を実行するコントローラとして機能するCPU(Central Processing Unit)と、各種情報を記憶するメモリとして機能するRAM(Random Access Memory)及びROM(Read Only Memory)などを有する基板になっている。試験制御基板70の各機能の全部または一部は、ROMに保持されるアプリケーションプログラムをRAMにロードしてCPUで実行することによって、RAMやROMにおけるデータの読み出し及び書き込みを行うことで実現される。 FIG. 13 is a schematic plan view of the test control board 70 shown in FIG. The test control board 70 is a board having a CPU (Central Processing Unit) that functions as a controller that executes various processes, a RAM (Random Access Memory) that functions as a memory that stores various information, a ROM (Read Only Memory), and the like. It has become. All or a part of each function of the test control board 70 is realized by reading and writing data in the RAM or ROM by loading an application program held in the ROM into the RAM and executing it by the CPU. .
 この試験制御基板70は、記憶媒体200が接続される接続基板60を介して記憶媒体200との間で信号のやり取りを行うことにより、記憶媒体200の評価試験を行うことが可能になっている。つまり、試験制御基板70は、RAMやROMに、記憶媒体200の評価試験を行うためのプログラムと、評価試験を行う際に使用する各種データが保存されており、プログラムに沿って記憶媒体200との間で信号のやり取りを行いつつ各種データの読み書きを行うことにより、記憶媒体200の評価試験を行うことが可能になっている。 The test control board 70 can perform an evaluation test of the storage medium 200 by exchanging signals with the storage medium 200 via the connection board 60 to which the storage medium 200 is connected. . That is, the test control board 70 stores a program for performing an evaluation test of the storage medium 200 and various data used when performing the evaluation test in the RAM and the ROM. The storage medium 200 can be evaluated by reading and writing various data while exchanging signals between them.
 試験制御基板70は、このように記憶媒体200の評価試験時に記憶媒体200との間で信号のやり取りを行うための基板接続部71を有している。本実施形態に係る評価試験装置1は、記憶媒体200が接続される接続基板60を10枚有しているため、基板接続部71も10個が設けられている。試験制御基板70の基板接続部71は、接続基板60の接続部61と同様に、PCI Expressに準じたスロット状の接続部になっており、試験制御基板70が有する10個の基板接続部71は、スロットの短手方向に並んで配設されている。 The test control board 70 has the board connection portion 71 for exchanging signals with the storage medium 200 during the evaluation test of the storage medium 200 as described above. Since the evaluation test apparatus 1 according to the present embodiment has ten connection boards 60 to which the storage medium 200 is connected, ten board connection parts 71 are also provided. Similarly to the connection part 61 of the connection board 60, the board connection part 71 of the test control board 70 is a slot-like connection part according to PCI Express, and the ten board connection parts 71 of the test control board 70 are included. Are arranged side by side in the short direction of the slot.
 図14は、図1に示す評価試験装置1の全体構成を示すブロック図である。評価試験装置1は、評価試験が行われる記憶媒体200が配置される恒温槽30の他に、操作部20と、試験制御基板70と、電力制御基板80と、スイッチング電源91と、ATX電源92と、起動ドライブ95と、恒温槽制御基板100と、ファン制御基板101とを有している。 FIG. 14 is a block diagram showing the overall configuration of the evaluation test apparatus 1 shown in FIG. The evaluation test apparatus 1 includes an operation unit 20, a test control board 70, a power control board 80, a switching power supply 91, and an ATX power supply 92 in addition to the thermostatic chamber 30 in which the storage medium 200 on which the evaluation test is performed is arranged. And a startup drive 95, a thermostatic chamber control board 100, and a fan control board 101.
 試験制御基板70は、恒温槽30とは異なる位置に配設されることにより、循環路33の外部に配設され、循環路33内の接続基板60に対して、試験基板側接続基板65とケーブル66とを介して接続されている。接続基板60と試験制御基板70との接続に用いるケーブル66は、一端が接続基板60に接続され、他端が試験基板側接続基板65に接続されている。試験基板側接続基板65は、試験制御基板70の基板接続部71に接続することができる基板になっている。試験制御基板70は、基板接続部71に試験基板側接続基板65を接続することにより、試験基板側接続基板65とケーブル66とを介して、接続基板60との間で信号を伝送することが可能になっている。 The test control board 70 is arranged outside the circulation path 33 by being arranged at a position different from the thermostatic chamber 30, and the test board side connection board 65 is connected to the connection board 60 in the circulation path 33. It is connected via a cable 66. The cable 66 used for connection between the connection board 60 and the test control board 70 has one end connected to the connection board 60 and the other end connected to the test board side connection board 65. The test board side connection board 65 is a board that can be connected to the board connection portion 71 of the test control board 70. The test control board 70 can transmit a signal to and from the connection board 60 via the test board side connection board 65 and the cable 66 by connecting the test board side connection board 65 to the board connection portion 71. It is possible.
 接続基板60は10枚が設けられているため、試験制御基板70に接続される試験基板側接続基板65も10枚が設けられ、両端が接続基板60と試験基板側接続基板65とに接続されるケーブル66も10本が設けられている。この10本のケーブル66は、全て同じ長さで形成されている。接続基板60が恒温槽30に配設される際には、ケーブル66は、恒温槽30の非恒温部37から引き出される。 Since 10 connection boards 60 are provided, 10 test board side connection boards 65 connected to the test control board 70 are also provided, and both ends are connected to the connection board 60 and the test board side connection board 65. Ten cables 66 are also provided. The ten cables 66 are all formed with the same length. When the connection substrate 60 is disposed in the constant temperature bath 30, the cable 66 is pulled out from the non-temperature constant portion 37 of the constant temperature bath 30.
 スイッチング電源91は、商用電源から供給される電力を、評価試験装置1で使用する直流の電力に変換することが可能になっている。ATX電源92は、スイッチング電源91で変換した電力を、さらに試験制御基板70で使用することのできる電力に変換して試験制御基板70に供給することが可能になっている。起動ドライブ95は、試験制御基板70の起動用のドライブになっている。 The switching power supply 91 can convert electric power supplied from a commercial power supply into DC electric power used in the evaluation test apparatus 1. The ATX power supply 92 can further convert the power converted by the switching power supply 91 into power that can be used by the test control board 70 and supply it to the test control board 70. The activation drive 95 is a drive for activation of the test control board 70.
 電力制御基板80は、接続基板60に接続されており、記憶媒体200の評価試験時に、記憶媒体200に対して供給する電力を制御することが可能になっている。この電力制御基板80には、記憶媒体200に放電を行わせる放電回路81が設けられている。放電回路81は、定電流放電回路からなり、記憶媒体200が有するキャパシタに蓄電された電荷を一定の電流で抜くことにより、短時間で放電することが可能になっている。この電力制御基板80は、1枚の電力制御基板80が2枚の接続基板60に接続されている。接続基板60は10枚が設けられているため、電力制御基板80は5枚が設けられている。 The power control board 80 is connected to the connection board 60 and can control the power supplied to the storage medium 200 during the evaluation test of the storage medium 200. The power control board 80 is provided with a discharge circuit 81 that causes the storage medium 200 to discharge. The discharge circuit 81 is composed of a constant current discharge circuit, and can discharge in a short time by extracting the electric charge stored in the capacitor of the storage medium 200 with a constant current. In the power control board 80, one power control board 80 is connected to two connection boards 60. Since ten connection boards 60 are provided, five power control boards 80 are provided.
 恒温槽制御基板100は、恒温槽30の温度を制御する基板になっている。具体的には、恒温槽制御基板100には、ヒータ50と、温度センサ51と、排気口開閉扉45を開閉する排気口モータ47と、吸気口開閉扉46を開閉する吸気口モータ48とが接続されており、温度センサ51で検知した温度に基づいて、ヒータ50や排気口モータ47、吸気口モータ48を制御することにより、恒温槽30の温度を制御することが可能になっている。また、恒温槽制御基板100には、ロック機構15が有する突出部17のソレノイド18が接続されており、温度センサ51で検知した温度に基づいてソレノイド18を作動させることにより、ロック機構15を作動させることが可能になっている。 The thermostatic chamber control substrate 100 is a substrate that controls the temperature of the thermostatic chamber 30. Specifically, the thermostatic chamber control board 100 includes a heater 50, a temperature sensor 51, an exhaust port motor 47 that opens and closes the exhaust port opening / closing door 45, and an intake port motor 48 that opens and closes the intake port opening / closing door 46. The temperature of the thermostatic bath 30 can be controlled by controlling the heater 50, the exhaust port motor 47, and the intake port motor 48 based on the temperature detected by the temperature sensor 51. Moreover, the solenoid 18 of the protrusion part 17 which the lock mechanism 15 has is connected to the thermostatic chamber control board 100, and the lock mechanism 15 is operated by operating the solenoid 18 based on the temperature detected by the temperature sensor 51. It is possible to make it.
 また、恒温槽制御基板100には、操作部20とファン制御基板101とが接続されており、操作部20によって入力された風速に基づき、ファン制御基板101を介して吸気ファン41と排気ファン42とを制御することが可能になっている。ファン制御基板101には、吸気ファン41と排気ファン42とが接続されており、吸気ファン41と排気ファン42との動作速度を調節することにより、循環路33を流れる空気の風速を調節することが可能になっている。 An operation unit 20 and a fan control board 101 are connected to the thermostatic chamber control board 100, and an intake fan 41 and an exhaust fan 42 are connected via the fan control board 101 based on the wind speed input by the operation unit 20. And can be controlled. An intake fan 41 and an exhaust fan 42 are connected to the fan control board 101, and the wind speed of the air flowing through the circulation path 33 is adjusted by adjusting the operating speed of the intake fan 41 and the exhaust fan 42. Is possible.
 図15は、記憶媒体200の一例を示す斜視図である。本実施形態に係る評価試験装置1によって評価試験を行う記憶媒体200は、いわゆるSSD(solid state drive)であり、半導体素子メモリを用いた記憶装置になっている。記憶媒体200としては、例えば、図16に示すようなカード型のSSDが用いられる。記憶媒体200は、評価試験装置1の接続基板60が有する接続部61に挿し込まれる板状の接続部201を有している。記憶媒体200は、PCI Expressによって接続基板60との間で入出力を行うことが可能になっている。 FIG. 15 is a perspective view showing an example of the storage medium 200. The storage medium 200 that performs an evaluation test by the evaluation test apparatus 1 according to the present embodiment is a so-called SSD (solid state drive), and is a storage apparatus that uses a semiconductor element memory. As the storage medium 200, for example, a card-type SSD as shown in FIG. 16 is used. The storage medium 200 includes a plate-like connection portion 201 that is inserted into the connection portion 61 included in the connection substrate 60 of the evaluation test apparatus 1. The storage medium 200 can perform input / output with the connection board 60 by PCI Express.
 記憶媒体200は、挿抜方向における幅よりも、挿抜方向と接続部201の厚さ方向との双方に直交する方向の長さが長くなって形成されている。即ち、記憶媒体200は、挿抜方向の幅よりも、接続基板60の接続部61の長手方向における記憶媒体200の長さの方が長くなって形成されている。このため、記憶媒体200が接続基板60の接続部61に接続されて循環路33内に配置された際には、循環路33内で記憶媒体200を流れる空気は、記憶媒体200の長手方向に流れる。また、記憶媒体200の長手方向における一端側には、パーソナルコンピュータ等の機器類に装着する際に、機器類に固定するためのブラケット202が設けられている。 The storage medium 200 is formed such that the length in the direction orthogonal to both the insertion / removal direction and the thickness direction of the connection portion 201 is longer than the width in the insertion / removal direction. That is, the storage medium 200 is formed such that the length of the storage medium 200 in the longitudinal direction of the connection portion 61 of the connection substrate 60 is longer than the width in the insertion / extraction direction. For this reason, when the storage medium 200 is connected to the connection portion 61 of the connection substrate 60 and disposed in the circulation path 33, the air flowing through the storage medium 200 in the circulation path 33 extends in the longitudinal direction of the storage medium 200. Flowing. Further, a bracket 202 is provided on one end side in the longitudinal direction of the storage medium 200 to be fixed to the devices when the storage medium 200 is mounted on the devices such as a personal computer.
 本実施形態に係る評価試験装置1は、以上のような構成からなり、以下、その作用について説明する。評価試験装置1を用いて記憶媒体200の評価試験を行う際には、メイン開閉扉3を開けて、試験室31に配設される接続基板60の接続部61に、記憶媒体200の接続部201を差し込んで接続する。その際に、記憶媒体保持ステー120とステーロック部材121とによって記憶媒体200のブラケット202を保持することにより、記憶媒体200を安定した状態で保持すると共に記憶媒体200が不用意に抜けることを防ぐ。詳しくは、接続基板60の接続部61に記憶媒体200の接続部201を挿し込む際には、記憶媒体200は、ブラケット202が下側に位置する向きで挿し込む。接続部61に記憶媒体200を挿し込んだら、接続部61から抜ける方向の記憶媒体200の移動を規制することができる状態に記憶媒体保持ステー120を回動させ、その状態でステーロック部材121によって記憶媒体保持ステー120の回動を規制する。これにより、記憶媒体200の抜けを防ぐ。なお、記憶媒体200を接続部61から抜く際には、ステーロック部材121を操作し、記憶媒体保持ステー120の回動の規制を解除してから引き抜く。接続基板60は、10枚が設けられているため、記憶媒体200は、1枚から10枚の範囲内で、必要な枚数を適宜接続基板60の接続部61に挿し込み、試験室31内に配置することができる。 The evaluation test apparatus 1 according to the present embodiment has the above-described configuration, and the operation thereof will be described below. When performing the evaluation test of the storage medium 200 using the evaluation test apparatus 1, the main opening / closing door 3 is opened, and the connection portion 61 of the storage medium 200 is connected to the connection portion 61 of the connection substrate 60 disposed in the test chamber 31. Plug in 201 and connect. At that time, the bracket 202 of the storage medium 200 is held by the storage medium holding stay 120 and the stay lock member 121, thereby holding the storage medium 200 in a stable state and preventing the storage medium 200 from being accidentally removed. . Specifically, when the connection portion 201 of the storage medium 200 is inserted into the connection portion 61 of the connection substrate 60, the storage medium 200 is inserted in a direction in which the bracket 202 is positioned on the lower side. When the storage medium 200 is inserted into the connection part 61, the storage medium holding stay 120 is rotated to a state where the movement of the storage medium 200 in the direction of coming out of the connection part 61 can be restricted. The rotation of the storage medium holding stay 120 is restricted. This prevents the storage medium 200 from being disconnected. Note that when the storage medium 200 is pulled out from the connecting portion 61, the stay lock member 121 is operated to release the restriction on the rotation of the storage medium holding stay 120 and then pulled out. Since ten connection boards 60 are provided, the required number of storage media 200 is inserted in the connection portion 61 of the connection board 60 within the range of 1 to 10 in the test chamber 31. Can be arranged.
 試験室31に記憶媒体200を配置したら、メイン開閉扉3を閉じ、評価試験を開始する。評価試験を行う際には、評価試験装置1の使用者が、操作パネル21のタッチパネル22を視認しつつ操作パネル21に対して入力操作を行うことにより、適宜試験を行う。評価試験では、試験用の信号を試験制御基板70から記憶媒体200に対して伝送することにより行う。 When the storage medium 200 is placed in the test chamber 31, the main door 3 is closed and the evaluation test is started. When performing an evaluation test, the user of the evaluation test apparatus 1 performs an appropriate test by performing an input operation on the operation panel 21 while visually recognizing the touch panel 22 of the operation panel 21. In the evaluation test, a test signal is transmitted from the test control board 70 to the storage medium 200.
 試験制御基板70から記憶媒体200に信号を伝送する際には、試験制御基板70の基板接続部71に挿し込まれた試験基板側接続基板65からケーブル66に伝送され、ケーブル66から接続基板60に伝送される。接続基板60は、ケーブル66から伝送された信号を、接続部61から記憶媒体200に伝送する。これにより、試験制御基板70から出力された信号は、記憶媒体200に伝送される。 When transmitting a signal from the test control board 70 to the storage medium 200, the signal is transmitted from the test board side connection board 65 inserted into the board connection portion 71 of the test control board 70 to the cable 66, and from the cable 66 to the connection board 60. Is transmitted. The connection board 60 transmits the signal transmitted from the cable 66 to the storage medium 200 from the connection unit 61. Thereby, the signal output from the test control board 70 is transmitted to the storage medium 200.
 また、記憶媒体200の評価試験時は、記憶媒体200を稼働させるための電力が、接続基板60に接続される電力制御基板80から供給される。電力制御基板80は、記憶媒体200を稼働させるための電力を、接続基板60を介して記憶媒体200に供給すると共に、試験制御基板70からの信号に基づいて、記憶媒体200に供給する電力を変化させる。これにより、記憶媒体200の稼働時における電力に関わる試験も行う。 Further, at the time of the evaluation test of the storage medium 200, power for operating the storage medium 200 is supplied from the power control board 80 connected to the connection board 60. The power control board 80 supplies power for operating the storage medium 200 to the storage medium 200 via the connection board 60 and supplies power to the storage medium 200 based on a signal from the test control board 70. Change. As a result, a test relating to power during operation of the storage medium 200 is also performed.
 評価試験の一例を説明すると、評価試験では、記憶媒体200の稼働時における電圧を変化に対する許容量についての試験である電圧マージン試験や、所定の読み書きを行って一定の負荷が記憶媒体200にかかり続ける状況で、一定時間記憶媒体200を連続稼働させても安定して稼働し続けることができるかの試験であるロングラン試験、記憶媒体200の出荷前に、実際の使用環境や使用方法と同じように稼働させて性能や機能が仕様通りに発揮されるか等を確認するための試験であるエージング試験、記憶媒体200に対して意図的にエラー通信を行った際に、適切にリカバリを行うことができるかの試験であるエラーインジェクションテスト、記憶媒体200が1秒間にどれくらいのデータの送受信を行うことができるかの試験であるパフォーマンス測定等が行われる。 An example of the evaluation test will be described. In the evaluation test, the storage medium 200 is subjected to a voltage margin test, which is a test for an allowable amount with respect to a change in the voltage during operation of the storage medium 200, and a predetermined load is applied to the storage medium 200. The long run test, which is a test of whether or not the storage medium 200 can continue to operate stably even if the storage medium 200 is continuously operated for a certain period of time, in the same manner as the actual usage environment and usage method before shipping the storage medium 200 An aging test, which is a test for confirming whether the performance and functions are exhibited as specified by operating the system, and appropriately performing recovery when error communication is intentionally performed to the storage medium 200 An error injection test, which is a test of whether or not the storage medium 200 can transmit / receive data per second A performance measurement or the like is performed.
 これらの評価試験は、LAN(Local Area Network)ケーブルによって試験制御基板70にパーソナルコンピュータを接続することにより、任意の試験を行うことができる。また、操作パネル21のタッチパネル22及び試験制御基板70に接続されたパーソナルコンピュータは、試験中の評価試験装置1や記憶媒体200の状態の情報を、適宜切り替えて表示することができる。このため、評価試験中は、評価試験装置1や記憶媒体200の必要な情報を確認しながら試験を行うことができる。例えば、タッチパネル22には、評価試験装置1の温度や記憶媒体200への電圧出力のON/OFFの状態を表示することができる。また、パーソナルコンピュータには、記憶媒体200の稼働中における電圧や消費電流、個々の記憶媒体200の温度を表示することができる。また、評価試験時の各種データは、パーソナルコンピュータに記憶することができ、後から取り出すことができる。 These evaluation tests can be performed by connecting a personal computer to the test control board 70 through a LAN (Local Area Network) cable. In addition, the personal computer connected to the touch panel 22 and the test control board 70 of the operation panel 21 can appropriately switch and display information on the state of the evaluation test apparatus 1 and the storage medium 200 being tested. For this reason, during the evaluation test, the test can be performed while confirming necessary information of the evaluation test apparatus 1 and the storage medium 200. For example, the touch panel 22 can display the temperature of the evaluation test apparatus 1 and the ON / OFF state of the voltage output to the storage medium 200. Further, the personal computer can display the voltage and current consumption during operation of the storage medium 200 and the temperature of each storage medium 200. Various data at the time of the evaluation test can be stored in a personal computer and can be taken out later.
 また、記憶媒体200の稼働時には熱を発するため、評価試験時には、吸気ファン41と排気ファン42とによって循環路33内の空気を循環させつつ、ヒータ50によって循環路33内の空気を加熱したり、排気口開閉扉45や吸気口開閉扉46を開閉させたりしながら行う。ヒータ50での加熱や、排気口開閉扉45及び吸気口開閉扉46の開閉制御は、恒温槽制御基板100によって行う。 Further, since heat is generated when the storage medium 200 is in operation, the air in the circulation path 33 is heated by the heater 50 while the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42 during the evaluation test. The operation is performed while opening and closing the exhaust opening / closing door 45 and the intake opening / closing door 46. Heating by the heater 50 and opening / closing control of the exhaust opening / closing door 45 and the intake opening / closing door 46 are performed by the thermostatic chamber control board 100.
 詳しくは、恒温槽制御基板100は、循環路33内に配設される温度センサ51での検出結果を取得することによって循環路33内の温度を取得し、取得した温度と、目標とする温度を比較することにより、ヒータ50を加熱させたり、排気口モータ47や吸気口モータ48を作動させたりする。 Specifically, the thermostatic chamber control board 100 acquires the temperature in the circulation path 33 by acquiring the detection result of the temperature sensor 51 disposed in the circulation path 33, and the acquired temperature and the target temperature. By comparing the above, the heater 50 is heated and the exhaust port motor 47 and the intake port motor 48 are operated.
 例えば、温度センサ51で検知した循環路33内の温度が、目標とする温度よりも低い場合には、排気口モータ47及び吸気口モータ48によって排気口開閉扉45及び吸気口開閉扉46を閉じつつ、ヒータ50を加熱させる。これにより、循環路33を密閉した状態で、循環路33内の空気を加熱する。循環路33内の空気は、吸気ファン41と排気ファン42とによって循環しているため、ヒータ50を加熱させてヒータ50の周囲の空気を加熱することにより、循環路33内を流れる空気全体が加熱され、循環路33内全体の空気の温度が上昇する。 For example, when the temperature in the circulation path 33 detected by the temperature sensor 51 is lower than the target temperature, the exhaust opening / closing door 45 and the intake opening / closing door 46 are closed by the exhaust opening motor 47 and the intake opening motor 48. Meanwhile, the heater 50 is heated. Thereby, the air in the circulation path 33 is heated with the circulation path 33 sealed. Since the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42, the entire air flowing in the circulation path 33 is heated by heating the heater 50 and heating the air around the heater 50. Heated, the temperature of the air in the entire circulation path 33 rises.
 反対に、温度センサ51で検知した循環路33内の温度が、目標とする温度よりも高い場合には、ヒータ50の加熱の度合いを低減させたり、ヒータ50の加熱を停止したりする。これにより、循環路33内の温度を低くする。ヒータ50の加熱を停止しても、循環路33内の温度が目標とする温度よりも高い場合には、排気口モータ47を作動させて排気口開閉扉45を開くことにより、温度が高くなった循環路33内の空気を排気口43から排出したり、吸気口モータ48を作動させて吸気口開閉扉46を開くことにより、循環路33内よりも温度が低い、循環路33の外の空気を吸気口44から循環路33内に取り入れたりする。これにより、循環路33内の空気の温度は低下し、目標とする温度に近付けることができる。 Conversely, when the temperature in the circulation path 33 detected by the temperature sensor 51 is higher than the target temperature, the degree of heating of the heater 50 is reduced or the heating of the heater 50 is stopped. Thereby, the temperature in the circulation path 33 is lowered. Even if the heating of the heater 50 is stopped, if the temperature in the circulation path 33 is higher than the target temperature, the temperature is increased by operating the exhaust port motor 47 and opening the exhaust port opening / closing door 45. The air in the circulation path 33 is discharged from the exhaust port 43, or the intake port motor 48 is operated to open the intake port opening / closing door 46, so that the temperature is lower than that in the circulation path 33. Air is taken into the circulation path 33 from the intake port 44. Thereby, the temperature of the air in the circulation path 33 falls, and it can approach the target temperature.
 なお、温度センサ51で検知した循環路33内の温度が、目標とする温度よりも高い場合に、吸気口開閉扉46を開いた際には、循環路33の外の空気が吸気口44から循環路33内に入り込むことにより、循環路33内の空気の温度が低下するが、吸気口44は、循環路33を流れる空気の流れ方向におけるヒータ50の上流側に配設されている。このため、温度センサ51には、吸気口44から入り込んだ空気が直接流れずに、吸気口44から入り込んだ空気と循環路33内の空気とが混ざり込んだ状態になってから流れるため、温度センサ51は、吸気口開閉扉46を開いた場合でも、循環路33内の空気を適切に検知することができる。 When the temperature in the circulation path 33 detected by the temperature sensor 51 is higher than the target temperature, when the intake port opening / closing door 46 is opened, air outside the circulation path 33 flows from the intake port 44. Although the temperature of the air in the circulation path 33 decreases by entering the circulation path 33, the intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33. For this reason, the air that has entered through the air inlet 44 does not flow directly into the temperature sensor 51 but flows after the air that has entered through the air inlet 44 is mixed with the air in the circulation path 33. The sensor 51 can appropriately detect the air in the circulation path 33 even when the intake opening / closing door 46 is opened.
 また、温度センサ51で検知した温度が、所定の閾値よりも高くなると、恒温槽制御基板100は、ロック機構15のソレノイド18を作動させ、突出部17を凹部16に入り込ませる。これにより、メイン開閉扉3はロックされ、試験室31が高温の状態ではメイン開閉扉3を開けることができないようになる。メイン開閉扉3をロックしたロック機構15は、温度センサ51で検知する温度が低くなったら、手動にてロックを解除することができる。 Further, when the temperature detected by the temperature sensor 51 becomes higher than a predetermined threshold value, the thermostatic chamber control board 100 operates the solenoid 18 of the lock mechanism 15 to cause the protrusion 17 to enter the recess 16. As a result, the main door 3 is locked, and the main door 3 cannot be opened when the test chamber 31 is at a high temperature. The lock mechanism 15 that locks the main door 3 can be manually unlocked when the temperature detected by the temperature sensor 51 becomes low.
 また、循環路33を流れる空気の流れ方向の接続基板60の上流側には、複数の接続基板60に対応する複数の吹付け口55が設けられ、循環路33を流れる空気は、各接続基板60に対応する吹付け口55から接続基板60に対して空気が吹き付けられる。このため、各接続基板60の接続部61に接続された記憶媒体200に対しても、それぞれ対応する吹付け口55から空気が吹き付けられるため、循環路33の試験室31を流れる空気は、流れが偏ることなく、試験室31に配置される複数の記憶媒体200に対して均等に流れる。これにより、循環路33内の温度を任意の温度に変化させる場合には、試験室31に配置される複数の記憶媒体200の周囲の温度を、均等に変化させることができる。 A plurality of blowing ports 55 corresponding to the plurality of connection boards 60 are provided on the upstream side of the connection board 60 in the flow direction of the air flowing through the circulation path 33. Air is blown to the connection substrate 60 from the blowing port 55 corresponding to 60. For this reason, since air is blown from the corresponding blowing port 55 to the storage medium 200 connected to the connection portion 61 of each connection board 60, the air flowing through the test chamber 31 of the circulation path 33 flows. Flows evenly with respect to the plurality of storage media 200 arranged in the test chamber 31. Thereby, when changing the temperature in the circulation path 33 to arbitrary temperature, the temperature around the several storage medium 200 arrange | positioned in the test chamber 31 can be changed equally.
 さらに、接続基板60は、接続部61の長手方向に空気が流れる向きで配設されているため、試験室31を流れる空気の流れ方向は、接続部61に接続された記憶媒体200に対しても、記憶媒体200の長手方向に沿って流れる。ここで、記憶媒体200が使用されるパーソナルコンピュータ等の機器では、冷却用のファンが備えられているが、これらの機器のファンによる空気の流れ方向は、記憶媒体200に対しては、通常は記憶媒体200の長手方向に流れることが多くなっている。このため、試験室31内を流れる空気の流れ方向が、記憶媒体200の長手方向に沿った方向に流れることにより、記憶媒体200が実際に使用される状態に近い状態で流れることになる。換言すると、評価試験装置1での記憶媒体200の評価試験は、記憶媒体200の実際の使用時の環境に近い環境が再現されて行われる。 Furthermore, since the connection board 60 is disposed in the longitudinal direction of the connection portion 61 in the direction in which air flows, the flow direction of the air flowing through the test chamber 31 is relative to the storage medium 200 connected to the connection portion 61. Also flows along the longitudinal direction of the storage medium 200. Here, in a device such as a personal computer in which the storage medium 200 is used, a cooling fan is provided. However, the flow direction of air by the fan of these devices is normally set to the storage medium 200. It often flows in the longitudinal direction of the storage medium 200. For this reason, when the flow direction of the air flowing through the test chamber 31 flows in a direction along the longitudinal direction of the storage medium 200, the storage medium 200 flows in a state close to a state in which the storage medium 200 is actually used. In other words, the evaluation test of the storage medium 200 in the evaluation test apparatus 1 is performed by reproducing an environment close to the environment when the storage medium 200 is actually used.
 循環路33内の温度は、これらのように温度センサ51によって循環路33内の温度を検知しながら、目標とする温度に近付くように、ヒータ50や排気口モータ47、吸気口モータ48に対して、フィードバック制御を行う。評価試験装置1は、このようにフィードバック制御を行うことにより、循環路33内の温度を、任意の目標とする温度にすることができるため、記憶媒体200の評価試験では、高温試験も行うことができる。即ち、記憶媒体200に対して高温試験を行うための任意の温度を、評価試験時の目標温度として設定し、循環路33内の温度を目標温度にした状態で記憶媒体200を稼働させる。これにより、高温での稼働時における記憶媒体200の評価を行うことができる。 While the temperature in the circulation path 33 is close to the target temperature while the temperature sensor 51 detects the temperature in the circulation path 33 as described above, the heater 50, the exhaust motor 47, and the intake motor 48 are in contact with each other. Feedback control. Since the evaluation test apparatus 1 can perform the feedback control in this way, the temperature in the circulation path 33 can be set to an arbitrary target temperature. Therefore, in the evaluation test of the storage medium 200, a high temperature test is also performed. Can do. That is, an arbitrary temperature for performing a high temperature test on the storage medium 200 is set as a target temperature at the time of the evaluation test, and the storage medium 200 is operated with the temperature in the circulation path 33 set to the target temperature. Thereby, the storage medium 200 can be evaluated during operation at a high temperature.
 さらに、記憶媒体200に対して高速で読み書きを行った状態で、温度を高くしたり、電圧を変化させたりすることにより、高負荷アクセス状態での温度のマージン試験や、高負荷アクセス状態での電圧マージン試験を行う。 Furthermore, a temperature margin test in a high-load access state or a high-load access state can be performed by increasing the temperature or changing the voltage while reading from or writing to the storage medium 200 at a high speed. Perform a voltage margin test.
 ここで、記憶媒体200の評価試験時に記憶媒体200に対して評価試験用の信号を伝送する試験制御基板70は、恒温槽30とは異なる位置に配設されており、即ち、試験制御基板70は、循環路33の外に配設されている。試験制御基板70は、温度が高くなり過ぎると熱暴走が発生して、演算処理等の動作を適切に行うことが出来なくなり、評価試験を行うことが出来なくなる虞があるが、試験制御基板70は、循環路33の外に配設されているため、循環路33の温度を高くする場合でも、試験制御基板70は循環路33の熱の影響を受けないようになっている。このため、高温試験を行う場合でも、試験制御基板70は安定して作動することができ、適切な評価試験を行うことが可能になっている。 Here, the test control board 70 that transmits the signal for the evaluation test to the storage medium 200 at the time of the evaluation test of the storage medium 200 is disposed at a position different from the thermostat 30, that is, the test control board 70. Is disposed outside the circulation path 33. If the temperature of the test control board 70 becomes too high, thermal runaway occurs, and it may not be possible to appropriately perform operations such as arithmetic processing, and an evaluation test may not be performed. Is arranged outside the circulation path 33, so that even when the temperature of the circulation path 33 is increased, the test control board 70 is not affected by the heat of the circulation path 33. For this reason, even when a high temperature test is performed, the test control board 70 can operate stably, and an appropriate evaluation test can be performed.
 また、評価試験装置1での評価試験は、循環路33を循環する空気が吹付け口55によって複数の記憶媒体200に対して均等に流れ、また、記憶媒体200の長手方向に沿った方向に空気が流れるため、記憶媒体200の実際の使用時の環境に近い環境が再現されて行われるが、本実施形態に係る評価試験装置1は、さらに、循環路33を流れる空気の風速を、記憶媒体200の実際の使用時の風速に近付けることができる。 In the evaluation test by the evaluation test apparatus 1, the air circulating through the circulation path 33 flows evenly to the plurality of storage media 200 through the blowing ports 55, and in the direction along the longitudinal direction of the storage media 200. Since the air flows, an environment close to the actual use environment of the storage medium 200 is reproduced, but the evaluation test apparatus 1 according to the present embodiment further stores the wind speed of the air flowing through the circulation path 33. It is possible to approach the wind speed when the medium 200 is actually used.
 具体的には、操作パネル21に対して入力操作を行うことにより、吸気ファン41と排気ファン42との動作速度を調節する。吸気ファン41と排気ファン42とは、操作パネル21に入力された値が、恒温槽制御基板100を介してファン制御基板101に伝達され、ファン制御基板101によって制御される。ファン制御基板101は、例えばデューティ制御によって、吸気ファン41と排気ファン42との動作速度を変化させ、記憶媒体200の位置での風速を、記憶媒体200が実際に使用される機器における風速とほぼ同じ風速にする。これにより、記憶媒体200の評価試験時の環境を、記憶媒体200の実際の使用時の環境により近づけることができる。また、吸気ファン41と排気ファン42との動作速度を調節することにより、記憶媒体200の近傍を流れる風のバラつきを抑えつつ、風速を均一にすることができ、安定した環境で評価試験を行うことができる。 Specifically, the operating speed of the intake fan 41 and the exhaust fan 42 is adjusted by performing an input operation on the operation panel 21. With respect to the intake fan 41 and the exhaust fan 42, values input to the operation panel 21 are transmitted to the fan control board 101 through the thermostatic bath control board 100 and controlled by the fan control board 101. The fan control board 101 changes the operating speed of the intake fan 41 and the exhaust fan 42 by, for example, duty control, and the wind speed at the position of the storage medium 200 is substantially equal to the wind speed in the device in which the storage medium 200 is actually used. Use the same wind speed. Thereby, the environment at the time of the evaluation test of the storage medium 200 can be brought closer to the environment at the time of actual use of the storage medium 200. Further, by adjusting the operating speeds of the intake fan 41 and the exhaust fan 42, it is possible to make the wind speed uniform while suppressing variations in the wind flowing in the vicinity of the storage medium 200, and the evaluation test is performed in a stable environment. be able to.
 また、評価試験としては、記憶媒体200に供給される電力が突然遮断された際における評価試験も行うことができる。電力が遮断された際における評価試験では、電力制御基板80から接続基板60を介して記憶媒体200に供給する電力を遮断することにより行う。その際に、電力制御基板80は、放電回路81を有しているため、記憶媒体200の供給する電力を遮断すると共に、記憶媒体200が蓄電する電力を放電回路81によって放電させることができる。記憶媒体200に供給する電力を単に遮断するのみだと、記憶媒体200が蓄電する電力が緩やかに放電されるため、電力の遮断時における記憶媒体200の評価試験は時間がかかるが、本実施形態では、放電回路81によって短時間で放電するので、電力の遮断時における記憶媒体200の評価試験を短時間で行うことができる。 Also, as the evaluation test, an evaluation test can be performed when the power supplied to the storage medium 200 is suddenly cut off. In the evaluation test when the power is cut off, the power supplied from the power control board 80 to the storage medium 200 via the connection board 60 is cut off. At this time, since the power control board 80 includes the discharge circuit 81, the power supplied from the storage medium 200 can be cut off, and the power stored in the storage medium 200 can be discharged by the discharge circuit 81. If the power supplied to the storage medium 200 is simply cut off, the power stored in the storage medium 200 is slowly discharged, so that the evaluation test of the storage medium 200 at the time of power cut takes time. Then, since the discharge is performed in a short time by the discharge circuit 81, the evaluation test of the storage medium 200 when the power is cut off can be performed in a short time.
 また、本実施形態に係る評価試験装置1は、LANケーブルによって試験制御基板70にパーソナルコンピュータを接続することにより、記憶媒体200に対する書き込みや読み出しのパターンを任意で生成して評価試験を行うことができる。 Further, the evaluation test apparatus 1 according to the present embodiment can perform an evaluation test by arbitrarily generating a pattern for writing to and reading from the storage medium 200 by connecting a personal computer to the test control board 70 via a LAN cable. it can.
 また、試験室31に配設される補助ケーブル110の補助ケーブル端子111は、試験室31に配置される記憶媒体200に対して必要に応じて接続することができる。補助ケーブル110の他端側は、操作パネル21の補助ケーブル接続端子26に接続されているため、補助ケーブル端子111を記憶媒体200に接続した場合は、メイン開閉扉3を閉じた状態で、補助ケーブル接続端子26を介して外部から記憶媒体200との間で直接通信を行うことができる。 Further, the auxiliary cable terminal 111 of the auxiliary cable 110 arranged in the test chamber 31 can be connected to the storage medium 200 arranged in the test chamber 31 as necessary. Since the other end side of the auxiliary cable 110 is connected to the auxiliary cable connection terminal 26 of the operation panel 21, when the auxiliary cable terminal 111 is connected to the storage medium 200, the auxiliary door 110 is closed with the main opening / closing door 3 closed. Direct communication can be performed with the storage medium 200 from the outside via the cable connection terminal 26.
 以上の実施形態に係る記憶媒体200の評価試験装置1は、記憶媒体200が接続される接続部61を有する接続基板60が、接続部61の長手方向に空気が流れる向きで循環路33に配設されている。これにより、循環路33内の空気を、吸気ファン41と排気ファン42とによって循環させた場合には、循環路33を流れる空気は、記憶媒体200が並ぶ方向に流れるのではなく、接続部61に接続される記憶媒体200の長手方向に沿って、個々の記憶媒体200の周囲を流れることができる。このため、例えばヒータ50によって循環路33を流れる空気の温度を上昇させた場合に、それぞれの記憶媒体200の周囲の温度を均一に任意の温度にすることができる。この結果、複数の記憶媒体200のそれぞれで、実際の温度環境に沿った状態で試験を行うことができる。 In the evaluation test apparatus 1 for the storage medium 200 according to the above embodiment, the connection board 60 having the connection part 61 to which the storage medium 200 is connected is arranged in the circulation path 33 in the direction in which air flows in the longitudinal direction of the connection part 61. It is installed. Thereby, when the air in the circulation path 33 is circulated by the intake fan 41 and the exhaust fan 42, the air flowing through the circulation path 33 does not flow in the direction in which the storage media 200 are arranged, but instead of the connection portion 61. Can flow around the individual storage media 200 along the longitudinal direction of the storage media 200 connected to the. For this reason, for example, when the temperature of the air flowing through the circulation path 33 is increased by the heater 50, the ambient temperature of each storage medium 200 can be uniformly set to an arbitrary temperature. As a result, each of the plurality of storage media 200 can be tested in a state along the actual temperature environment.
 また、吸気ファン41は試験室31の上方に配置し、排気ファン42は試験室31の下方に配置することにより、水平方向に対する恒温槽30の小型化を図ることができ、評価試験装置1全体のスリム化を図ることができる。この結果、評価試験装置1を設置する際における設置面積を小さくすることができる。 Further, by arranging the intake fan 41 above the test chamber 31 and the exhaust fan 42 below the test chamber 31, the thermostat 30 can be downsized in the horizontal direction, and the evaluation test apparatus 1 as a whole. Can be slimmed. As a result, the installation area when installing the evaluation test apparatus 1 can be reduced.
 また、接続基板60は、接続部61に挿抜される記憶媒体200の挿抜方向が水平方向から上向きに10°以上30°以下の範囲内となる向きで配設されているため、接続部61に対して記憶媒体200を挿抜する際に、より確実に行うことができる。つまり、記憶媒体200を垂直方向に挿抜する際には、視認性が悪いため、挿抜が失敗する虞があるが、水平方向に近い角度で挿抜することにより、視認性を確保することができ、挿抜時のエラーを回避することができる。この結果、評価試験時の作業性を向上させることができ、記憶媒体200の評価試験をより確実に、且つ、高速に行うことができる。 In addition, since the connection substrate 60 is arranged in such a direction that the insertion / extraction direction of the storage medium 200 inserted / removed into / from the connection portion 61 is in the range of 10 ° to 30 ° upward from the horizontal direction, On the other hand, when inserting / removing the storage medium 200, it can carry out more reliably. That is, when inserting / removing the storage medium 200 in the vertical direction, since the visibility is poor, there is a possibility that the insertion / extraction may fail, but visibility can be ensured by inserting / removing at an angle close to the horizontal direction, Errors during insertion and removal can be avoided. As a result, workability during the evaluation test can be improved, and the evaluation test of the storage medium 200 can be performed more reliably and at high speed.
 また、吸気ファン41と排気ファン42との動作速度を調節して、循環路33を流れる空気の風速を調節するため、記憶媒体200の評価試験時の環境を、記憶媒体200の実際の使用時の環境により近づけることができる。この結果、記憶媒体200の実際の使用時の環境と評価試験時の環境との誤算に起因する評価結果の誤差を低減することができ、より精度の高い評価試験を行うことができる。 Further, in order to adjust the operating speed of the intake fan 41 and the exhaust fan 42 to adjust the wind speed of the air flowing through the circulation path 33, the environment during the evaluation test of the storage medium 200 is the same as when the storage medium 200 is actually used. It can be closer to the environment. As a result, it is possible to reduce an error in the evaluation result due to an erroneous calculation between the environment during actual use of the storage medium 200 and the environment during the evaluation test, and a more accurate evaluation test can be performed.
 また、複数の接続基板60に接続される複数の記憶媒体200には、それぞれ接続基板60に対応する吹付け口55から空気が吹き付けられるため、空気の流れが偏ることを抑制することができ、記憶媒体200ごとの温度環境のバラつきを抑制することができる。この結果、試験室31内における記憶媒体200の位置ごとの温度のバラつきに起因する評価結果の誤差を低減することができ、より精度の高い評価試験を行うことができる。 Further, since air is blown from the blowing ports 55 corresponding to the connection substrates 60 to the plurality of storage media 200 connected to the plurality of connection substrates 60, it is possible to suppress the deviation of the air flow, Variations in the temperature environment for each storage medium 200 can be suppressed. As a result, it is possible to reduce the error of the evaluation result due to the temperature variation for each position of the storage medium 200 in the test chamber 31, and to perform a more accurate evaluation test.
 また、接続基板60は、循環路33の内部と非恒温部37とを隔てる壁部38に取り付けられ、接続基板60に接続されるケーブル66は、非恒温部37から引き出されるため、循環路33内の温度を上昇させた場合でも、ケーブル66に熱が伝達されることを抑制することができる。これにより、ケーブル66が高温になることを抑制することができ、ケーブル66の熱が試験制御基板70に伝わって試験制御基板70の温度が高くなり過ぎることを抑制することができる。この結果、試験制御基板70の熱暴走を抑制することができる。 Further, the connection board 60 is attached to the wall portion 38 that separates the inside of the circulation path 33 and the non-constant temperature part 37, and the cable 66 connected to the connection board 60 is drawn out from the non-constant temperature part 37. Even when the internal temperature is raised, heat transfer to the cable 66 can be suppressed. Thereby, it can suppress that the cable 66 becomes high temperature, and can suppress that the heat of the cable 66 is transmitted to the test control board 70 and the temperature of the test control board 70 becomes too high. As a result, thermal runaway of the test control board 70 can be suppressed.
 また、循環路33には、排気口開閉扉45を有する排気口43と、吸気口開閉扉46を有する吸気口44とが設けられるため、排気口開閉扉45や吸気口開閉扉46を開閉することにより、循環路33内の温度を、より確実に所望の温度にすることができる。この結果、記憶媒体200の評価試験時の温度の精度を高めることができ、より精度の高い評価試験を行うことができる。 The circulation path 33 is provided with an exhaust port 43 having an exhaust port opening / closing door 45 and an intake port 44 having an intake port opening / closing door 46, so that the exhaust port opening / closing door 45 and the intake port opening / closing door 46 are opened and closed. Thus, the temperature in the circulation path 33 can be more reliably set to a desired temperature. As a result, the temperature accuracy during the evaluation test of the storage medium 200 can be increased, and a more accurate evaluation test can be performed.
 また、吸気口44は、循環路33を流れる空気の流れ方向におけるヒータ50の上流側に配設されるため、吸気口開閉扉46を開いた際には、吸気口44から入り込んだ空気と循環路33内の空気とが混ざり込んだ状態の空気を、温度センサ51に流すことができる。これにより、吸気口開閉扉46を開いた際に、吸気口44から入り込んだ空気の温度を温度センサ51で直接検知してしまい、循環路33の温度の制御を適切に行うことができなくなることを防ぐことができる。この結果、記憶媒体200の評価試験時の温度の精度を高めることができ、より精度の高い評価試験を行うことができる。 In addition, since the intake port 44 is disposed on the upstream side of the heater 50 in the flow direction of the air flowing through the circulation path 33, when the intake port opening / closing door 46 is opened, the air that has entered from the intake port 44 is circulated. Air in a state of being mixed with the air in the path 33 can be passed through the temperature sensor 51. As a result, when the air inlet opening / closing door 46 is opened, the temperature of the air entering through the air inlet 44 is directly detected by the temperature sensor 51, and the temperature of the circulation path 33 cannot be appropriately controlled. Can be prevented. As a result, the temperature accuracy during the evaluation test of the storage medium 200 can be increased, and a more accurate evaluation test can be performed.
 また、記憶媒体200に対して供給する電力を制御する電力制御基板80には、記憶媒体200に放電を行わせる放電回路81が設けられているため、記憶媒体200に対して供給する電力を遮断する際に、記憶媒体200に負担をかけることなく、安定して短時間で遮断することができる。これにより、電源のオンオフ試験を、より確実に高速で行うことができる。この結果、精度の高い評価試験を、より高速で行うことができる。 In addition, since the power control board 80 that controls the power supplied to the storage medium 200 is provided with a discharge circuit 81 that discharges the storage medium 200, the power supplied to the storage medium 200 is cut off. In doing so, the storage medium 200 can be shut off stably and in a short time without imposing a burden. As a result, the power on / off test can be performed more reliably at high speed. As a result, a highly accurate evaluation test can be performed at a higher speed.
 また、試験制御基板70は、循環路33の外部に配設されると共に、試験基板側接続基板65とケーブル66を介して接続基板60に接続されるため、循環路33の熱が試験制御基板70に伝わることを抑制しつつ、試験制御基板70から記憶媒体200に対して、適切な大きさの波形で信号を伝送することができる。これにより、評価試験時の試験制御基板70の熱暴走を抑制しつつ、記憶媒体200に対して適切に信号を伝送し、評価試験を行うことができる。この結果、より確実に、精度の高い評価試験を行うことができる。 Further, since the test control board 70 is disposed outside the circulation path 33 and is connected to the connection board 60 via the test board side connection board 65 and the cable 66, the heat of the circulation path 33 is transferred to the test control board. The signal can be transmitted from the test control board 70 to the storage medium 200 with a waveform having an appropriate size while suppressing the transmission to the network 70. Thereby, it is possible to appropriately transmit a signal to the storage medium 200 and perform the evaluation test while suppressing thermal runaway of the test control board 70 during the evaluation test. As a result, a highly accurate evaluation test can be performed more reliably.
 また、接続基板60は複数が設けられているが、複数の接続基板60と試験制御基板70とを接続する複数のケーブル66は、長さが全て同じ長さであるため、試験制御基板70から伝送される信号の品質が、接続基板60同士で異なることを抑制することができる。この結果、複数の記憶媒体200の評価試験を行う際における信号のバラつきを抑制することができ、より確実に高い精度で評価試験を行うことができる。 Further, although a plurality of connection boards 60 are provided, the plurality of cables 66 that connect the plurality of connection boards 60 and the test control board 70 have the same length. It can suppress that the quality of the signal transmitted differs between connection boards 60. As a result, it is possible to suppress variations in signals when performing an evaluation test of a plurality of storage media 200, and it is possible to more reliably perform the evaluation test with high accuracy.
 また、温度センサ51で検知した温度が所定の閾値よりも高くなると、ロック機構15はメイン開閉扉3の開閉をロックするため、試験室31が高温の状態でメイン開閉扉3が開けられることを抑制することができる。この結果、評価試験時に安全性を向上させることができる。 In addition, when the temperature detected by the temperature sensor 51 becomes higher than a predetermined threshold, the lock mechanism 15 locks the opening / closing of the main door 3, so that the main door 3 can be opened while the test chamber 31 is at a high temperature. Can be suppressed. As a result, safety can be improved during the evaluation test.
 〔変形例〕
 なお、上述した実施形態に係る評価試験装置1では、接続基板60は10枚が設けられ、一度に10個の記憶媒体200の評価試験を行うことができるが、接続基板60は10枚以外でもよい。試験制御基板70が循環路33の外に配設され、試験制御基板70と接続基板60とが試験基板側接続基板65を介して接続されていれば、接続基板60の数、即ち、一度に評価試験を行うことのできる記憶媒体200の数は問わない。
[Modification]
In the evaluation test apparatus 1 according to the above-described embodiment, ten connection boards 60 are provided, and an evaluation test of ten storage media 200 can be performed at one time. Good. If the test control board 70 is disposed outside the circulation path 33 and the test control board 70 and the connection board 60 are connected via the test board side connection board 65, the number of connection boards 60, that is, at a time. The number of storage media 200 that can perform the evaluation test is not limited.
 また、上述した実施形態に係る評価試験装置1では、評価試験を行う記憶媒体200として、カード型のSSDが挙げられているが、記憶媒体200は、カード型のSSD以外であってもよい。評価試験を行う記憶媒体200は、例えば、M.2タイプやU.2タイプ、SFFタイプ、HHHLタイプ、FHFLタイプ等のSSDであってもよく、また、SSD以外の記憶媒体200であってもよい。また、上述した実施形態では、記憶媒体200を接続基板60の接続部61に接続する際には、記憶媒体200を直接接続部61に接続しているが、記憶媒体200に適合するアダプタを用いて接続部61に接続してもよい。 In the evaluation test apparatus 1 according to the above-described embodiment, a card-type SSD is cited as the storage medium 200 for performing the evaluation test. However, the storage medium 200 may be other than the card-type SSD. The storage medium 200 performing the evaluation test is, for example, M.M. 2 types and U.I. It may be an SSD of two types, SFF type, HHHL type, FHFL type or the like, or may be a storage medium 200 other than SSD. In the above-described embodiment, when the storage medium 200 is connected to the connection portion 61 of the connection board 60, the storage medium 200 is directly connected to the connection portion 61. However, an adapter that is compatible with the storage medium 200 is used. The connection unit 61 may be connected.
 1 評価試験装置
 3 メイン開閉扉
 11 試験ユニット室
 12 制御ユニット室
 13 電源ユニット室
 15 ロック機構
 20 操作部
 21 操作パネル
 30 恒温槽
 31 試験室
 32 開口部
 33 循環路
 37 非恒温部
 38 壁部
 39 接続基板保持部
 41 吸気ファン
 42 排気ファン
 43 排気口
 44 吸気口
 45 排気口開閉扉
 46 吸気口開閉扉
 50 ヒータ
 51 温度センサ
 55 吹付け口
 56 吹付け口板部材
 60 接続基板
 61 接続部
 65 試験基板側接続基板
 66 ケーブル
 70 試験制御基板
 71 基板接続部
 80 電力制御基板
 81 放電回路
 90 電源ユニット
 91 スイッチング電源
 100 恒温槽制御基板
 101 ファン制御基板
 110 補助ケーブル
 200 記憶媒体
DESCRIPTION OF SYMBOLS 1 Evaluation test apparatus 3 Main opening / closing door 11 Test unit room 12 Control unit room 13 Power supply unit room 15 Lock mechanism 20 Operation part 21 Operation panel 30 Thermostatic bath 31 Test room 32 Opening part 33 Circulation path 37 Non-temperature control part 38 Wall part 39 Connection Substrate holder 41 Intake fan 42 Exhaust fan 43 Exhaust port 44 Inlet port 45 Exhaust port opening / closing door 46 Inlet port opening / closing door 50 Heater 51 Temperature sensor 55 Blowing port 56 Blowing port plate member 60 Connection board 61 Connection unit 65 Test board side Connection board 66 Cable 70 Test control board 71 Board connection part 80 Power control board 81 Discharge circuit 90 Power supply unit 91 Switching power supply 100 Thermostatic bath control board 101 Fan control board 110 Auxiliary cable 200 Storage medium

Claims (7)

  1.  記憶媒体を挿抜自在に接続して前記記憶媒体との間で互いに信号の伝送を行う接続部を有すると共に、前記記憶媒体の挿抜方向に前記接続部を見た場合における前記接続部の長手方向が上下方向となる向きで配設され、且つ、前記記憶媒体の挿抜方向に前記接続部を見た場合における前記接続部の短手方向に複数が並んで設けられる接続基板と、
     内部で空気が循環すると共に、前記接続部の長手方向に空気が流れる向きで前記接続基板が配設される循環路と、
     前記循環路に配設され、前記循環路を流れる空気の温度を上昇させるヒータと、
     前記循環路における、前記循環路を流れる空気の流れ方向の前記接続基板の下流側に配設される吸気ファンと、
     前記循環路における、前記循環路を流れる空気の流れ方向の前記接続基板の上流側で、且つ、前記吸気ファンの下流側に配設される排気ファンと、
     を備えることを特徴とする記憶媒体の評価試験装置。
    A connecting portion for connecting and disconnecting a storage medium to transmit signals to and from the storage medium, and a longitudinal direction of the connecting portion when the connection portion is viewed in the insertion / extraction direction of the storage medium; A plurality of connection boards arranged in a vertical direction, and a plurality of connection boards arranged in a short direction of the connection part when the connection part is viewed in the insertion / extraction direction of the storage medium;
    A circulation path in which air is circulated inside, and the connection board is arranged in a direction in which air flows in the longitudinal direction of the connection part,
    A heater that is disposed in the circulation path and raises a temperature of air flowing through the circulation path;
    An intake fan disposed on the downstream side of the connection board in the flow direction of the air flowing through the circulation path in the circulation path;
    An exhaust fan disposed on the upstream side of the connection board in the flow direction of the air flowing through the circulation path and on the downstream side of the intake fan in the circulation path;
    An evaluation test apparatus for a storage medium, comprising:
  2.  前記接続基板は、前記接続部に挿抜される前記記憶媒体の挿抜方向が水平方向から上向きに10°以上30°以下の範囲内となる向きで配設される請求項1に記載の記憶媒体の評価試験装置。 2. The storage medium according to claim 1, wherein the connection board is disposed in an orientation in which the insertion / extraction direction of the storage medium inserted into / removed from the connection portion is within a range of 10 ° to 30 ° upward from the horizontal direction. Evaluation test equipment.
  3.  前記吸気ファンと前記排気ファンとの動作速度を調節することにより、前記循環路を流れる空気の風速を調節することができる請求項1または2に記載の記憶媒体の評価試験装置。 3. The storage medium evaluation test apparatus according to claim 1, wherein the wind speed of the air flowing through the circulation path can be adjusted by adjusting operating speeds of the intake fan and the exhaust fan.
  4.  前記循環路には、前記循環路を流れる空気の流れ方向の前記接続基板の上流側に、複数の前記接続基板に対応する複数の吹付け口が設けられ、
     複数の前記吹付け口は、前記循環路を循環する空気を、対応する前記接続基板に対してそれぞれ吹き付ける請求項1~3のいずれか1項に記載の記憶媒体の評価試験装置。
    In the circulation path, a plurality of spray ports corresponding to the plurality of connection boards are provided on the upstream side of the connection board in the flow direction of the air flowing through the circulation path,
    The storage medium evaluation test apparatus according to any one of claims 1 to 3, wherein the plurality of spray ports spray air circulating through the circulation path to the corresponding connection boards, respectively.
  5.  前記循環路は環状に形成されると共に、前記循環路の環状の内側部分は前記循環路の内部から隔離された非恒温部になっており、
     前記接続基板は、前記循環路を形成する壁部のうち、前記循環路の内部と前記非恒温部とを隔てる前記壁部に取り付けられる請求項1~4のいずれか1項に記載の記憶媒体の評価試験装置。
    The circulation path is formed in an annular shape, and the annular inner portion of the circulation path is a non-isothermal part isolated from the inside of the circulation path,
    The storage medium according to any one of claims 1 to 4, wherein the connection substrate is attached to the wall portion that separates the inside of the circulation path and the non-constant temperature portion among the wall portions forming the circulation path. Evaluation test equipment.
  6.  前記循環路には、
     前記循環路内の空気を前記循環路の外部に放出する排気口と、
     前記循環路の外部の空気を前記循環路内に取り入れる吸気口と、
     が設けられており、
     前記排気口は、前記循環路を流れる空気の流れ方向における前記吸気口の上流側に配設され、
     前記吸気口は、前記循環路を流れる空気の流れ方向における前記ヒータの上流側に配設される請求項1~5のいずれか1項に記載の記憶媒体の評価試験装置。
    In the circuit,
    An exhaust port for releasing the air in the circulation path to the outside of the circulation path;
    An intake port for taking air outside the circulation path into the circulation path;
    Is provided,
    The exhaust port is disposed on the upstream side of the intake port in the flow direction of the air flowing through the circulation path,
    6. The storage medium evaluation test apparatus according to claim 1, wherein the intake port is disposed upstream of the heater in a flow direction of air flowing through the circulation path.
  7.  前記接続基板には、前記記憶媒体に対して供給する電力を制御する電力制御基板が接続され、
     前記電力制御基板には、前記記憶媒体に放電を行わせる放電回路が設けられる請求項1~6のいずれか1項に記載の記憶媒体の評価試験装置。
    A power control board that controls power supplied to the storage medium is connected to the connection board,
    The storage medium evaluation test apparatus according to any one of claims 1 to 6, wherein the power control board is provided with a discharge circuit for discharging the storage medium.
PCT/JP2017/017607 2017-05-09 2017-05-09 Evaluation test device for recording media WO2018207270A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2019516781A JP6830295B2 (en) 2017-05-09 2017-05-09 Evaluation test equipment for storage media
PCT/JP2017/017607 WO2018207270A1 (en) 2017-05-09 2017-05-09 Evaluation test device for recording media

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2017/017607 WO2018207270A1 (en) 2017-05-09 2017-05-09 Evaluation test device for recording media

Publications (1)

Publication Number Publication Date
WO2018207270A1 true WO2018207270A1 (en) 2018-11-15

Family

ID=64104494

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2017/017607 WO2018207270A1 (en) 2017-05-09 2017-05-09 Evaluation test device for recording media

Country Status (2)

Country Link
JP (1) JP6830295B2 (en)
WO (1) WO2018207270A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111144009A (en) * 2019-12-27 2020-05-12 广东电科院能源技术有限责任公司 Running state evaluation method, device, equipment and storage medium of fan

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60152972U (en) * 1984-03-21 1985-10-11 山田電音株式会社 Burn-in equipment
JPS61144580A (en) * 1984-12-18 1986-07-02 Orion Mach Co Ltd Temperature controlling method of burn-in testing device
JPH03137707A (en) * 1989-10-24 1991-06-12 Tabai Espec Corp Temperature control method for thermostat for heating sample treatment
JPH0488650A (en) * 1990-07-31 1992-03-23 Fujitsu Ltd Device and method for testing
JPH09276715A (en) * 1996-04-11 1997-10-28 Tabai Espec Corp Constant temperature device with adjustable temperature distribution
JPH10311865A (en) * 1997-05-09 1998-11-24 Nec Corp Burn-in test equipment
JP2002040081A (en) * 2000-07-28 2002-02-06 Mitsubishi Electric Engineering Co Ltd Inspection device for burn-in board conductor
JP2002343096A (en) * 2001-05-17 2002-11-29 Hitachi Ltd Test system of semiconductor memory module and manufacturing method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6526841B1 (en) * 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
JP2001050888A (en) * 1999-08-05 2001-02-23 Sumitomo Wiring Syst Ltd Environmental testing apparatus
JP3429728B2 (en) * 2000-05-11 2003-07-22 株式会社鵬製作所 Environmental test equipment

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60152972U (en) * 1984-03-21 1985-10-11 山田電音株式会社 Burn-in equipment
JPS61144580A (en) * 1984-12-18 1986-07-02 Orion Mach Co Ltd Temperature controlling method of burn-in testing device
JPH03137707A (en) * 1989-10-24 1991-06-12 Tabai Espec Corp Temperature control method for thermostat for heating sample treatment
JPH0488650A (en) * 1990-07-31 1992-03-23 Fujitsu Ltd Device and method for testing
JPH09276715A (en) * 1996-04-11 1997-10-28 Tabai Espec Corp Constant temperature device with adjustable temperature distribution
JPH10311865A (en) * 1997-05-09 1998-11-24 Nec Corp Burn-in test equipment
JP2002040081A (en) * 2000-07-28 2002-02-06 Mitsubishi Electric Engineering Co Ltd Inspection device for burn-in board conductor
JP2002343096A (en) * 2001-05-17 2002-11-29 Hitachi Ltd Test system of semiconductor memory module and manufacturing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111144009A (en) * 2019-12-27 2020-05-12 广东电科院能源技术有限责任公司 Running state evaluation method, device, equipment and storage medium of fan

Also Published As

Publication number Publication date
JP6830295B2 (en) 2021-02-17
JPWO2018207270A1 (en) 2020-03-19

Similar Documents

Publication Publication Date Title
US7244178B2 (en) Communication device, cooling fan unit, and operation control method for the cooling fan unit
US6462944B1 (en) Computer cabinet cooling system
US8576570B2 (en) Adaptive computing system with modular control, switching, and power supply architecture
US8515589B2 (en) Dynamic cooling system for electronic device with air flow path changes
US20170219239A1 (en) Fan characterization and control system
CN101730871A (en) Temperature sensing system
PH12015000328A1 (en) Gaming machine
CN102654301A (en) Air volume control device and air volume control method
JP2001224199A (en) Thermal control system
JP5707716B2 (en) Air conditioning system and air conditioning method
US20130205151A1 (en) Electronic apparatus and controlling method of protecting electronic apparatus
CN108241116A (en) Circuit board testing device
KR20190107796A (en) Test chamber for memory device, test system for memory device having the same and method of testing memory devices using the same
WO2018207270A1 (en) Evaluation test device for recording media
TW201832042A (en) Sled insertable into server rack and server rack system
US8564248B2 (en) Computer system mounted with battery pack for performing system control based on characteristics of the battery pack and system main body thereof
CN103890691A (en) Airflow block response in a system
KR101939802B1 (en) Method and Apparatus for Controlling Dew Condensation Prevention
JP2006308368A (en) Test chamber for electronic device and testing method
JP2011151332A (en) Fan air speed control configuration and method for device
JP2015220412A (en) Electronic device
JP2012247594A (en) Display device and method of controlling the same
US20110178642A1 (en) Information processing apparatus
JP6127749B2 (en) Electronic equipment
CN109697151A (en) A kind of method and system that the anti-short circuit of server dorsulum is burnt

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17908833

Country of ref document: EP

Kind code of ref document: A1

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
ENP Entry into the national phase

Ref document number: 2019516781

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17908833

Country of ref document: EP

Kind code of ref document: A1