JP2001050888A - Environmental testing apparatus - Google Patents

Environmental testing apparatus

Info

Publication number
JP2001050888A
JP2001050888A JP11222135A JP22213599A JP2001050888A JP 2001050888 A JP2001050888 A JP 2001050888A JP 11222135 A JP11222135 A JP 11222135A JP 22213599 A JP22213599 A JP 22213599A JP 2001050888 A JP2001050888 A JP 2001050888A
Authority
JP
Japan
Prior art keywords
circuit board
environmental
equal intervals
circuit boards
environmental test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP11222135A
Other languages
Japanese (ja)
Inventor
Kenji Isobe
健司 磯部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Wiring Systems Ltd
Original Assignee
Sumitomo Wiring Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Wiring Systems Ltd filed Critical Sumitomo Wiring Systems Ltd
Priority to JP11222135A priority Critical patent/JP2001050888A/en
Publication of JP2001050888A publication Critical patent/JP2001050888A/en
Withdrawn legal-status Critical Current

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  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To conduct an environmental test with good efficiency by a method, where a test chamber is set under a prescribed environmental condition, a plurality of circuit boards are installed in an installation part side by side at nearly equal intervals and in the vertical state and a mechanism, which prevents water drops form falling on the boards, is installed. SOLUTION: In an installation part 11, a plurality of grooves 12 which are at nearly equal intervals and in parallel are formed on the surface in a width, corresponding to the thickness of each circuit board 2 and at a prescribed depth, and respective boards 2 are installed side by side in the grooves 12, at nearly equal intervals and in a vertical state. A gable-shaped roof part 41 whose surface and rear surface are tilted for preventing water drops from falling and support parts 42 which are installed vertically for supporting four corners constitute a water drop fall preventing structure. The structure is installed, so as to cover the upper part of the plural circuit boards 2. With this constitution, it is possible to prevent water drops form falling, and an unintentional external factors will not be added. In addition, the plural circuit boards 2 can be installed in the installation part 11 side by side at nearly equal intervals and in the vertical state, respective circuit boards can be held under identifically set testing environment, reproducibility of an environmental testing is enhanced, and high reliability of the testing can be obtained.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、回路基板の環境試
験を行う環境試験装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an environmental test apparatus for performing an environmental test on a circuit board.

【0002】[0002]

【従来の技術】従来の環境試験装置90は、図4に示す
ように、試験槽91に複数の棚93が設けられており、
これらの棚93に、試験を行う各回路基板92にはんだ
付けにより配線94を接続して、各回路基板92を任意
の位置に平面的に載置した状態で、試験槽91を高温高
湿条件や結露条件等の所定の環境条件にして各回路基板
92の環境試験を行っている。
2. Description of the Related Art As shown in FIG. 4, a conventional environmental test apparatus 90 has a test tank 91 provided with a plurality of shelves 93.
On these shelves 93, wiring 94 is connected by soldering to each circuit board 92 to be tested, and the test tank 91 is placed in a high-temperature and high-humidity condition with each circuit board 92 placed flat at an arbitrary position. An environmental test of each circuit board 92 is performed under predetermined environmental conditions such as dew condensation conditions.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、図4に
示す従来の環境試験装置90では、回路基板92を載置
する場所や棚93の位置により、試験環境にばらつきが
生じるという問題があった。
However, the conventional environmental test apparatus 90 shown in FIG. 4 has a problem that the test environment varies depending on the place where the circuit board 92 is mounted and the position of the shelf 93.

【0004】また、試験槽91内で発生する蒸気が結露
して、試験槽91の棚93に平面的に載置した回路基板
92上に水滴が落下するという問題があった。
[0004] Further, there is another problem that steam generated in the test tank 91 is condensed, and water droplets fall on a circuit board 92 placed on a shelf 93 of the test tank 91 in a plane.

【0005】このため、従来の環境試験装置では、各回
路基板を一定の同じ試験環境に保持することが難しく、
意図しない外的要因が付加されたりなどして、試験結果
のデータの信頼性が低くくなり、試験のやり直しを行う
ような場合も生じていた。
For this reason, in the conventional environmental test apparatus, it is difficult to maintain each circuit board in the same constant test environment.
Due to the addition of unintended external factors or the like, the reliability of the test result data is lowered, and the test may be repeated.

【0006】更には、各回路基板にはんだ付けにより配
線を接続して回路基板の環境試験を行っていたので、試
験の中間段階で回路基板を観察したりデータ測定を行う
場合には、はんだ付けによる配線を一度はずす必要があ
り、その後環境試験を続行する場合に、再度各回路基板
にはんだ付けにより配線を接続しなければならないた
め、こうした作業に手間がかかり環境試験を効率よく行
うことができないという問題があった。また、各回路基
板に配線を伝って水滴が付着する問題もあった。加え
て、はんだ付けの際に、はんだのフラックスが飛散して
回路基板に付着し、回路基板を観察する際の障害ともな
っていた。
Furthermore, since the wiring board is connected to each circuit board by soldering to perform an environmental test of the circuit board, when observing the circuit board or performing data measurement in an intermediate stage of the test, the soldering is performed. It is necessary to remove the wiring once, and then to continue the environmental test, the wiring must be connected to each circuit board again by soldering, so such work is troublesome and the environmental test cannot be performed efficiently. There was a problem. In addition, there is a problem that water droplets adhere to each circuit board through wiring. In addition, at the time of soldering, the flux of the solder scatters and adheres to the circuit board, which is an obstacle when observing the circuit board.

【0007】本発明は、こうした従来技術の課題を解決
するものであり、意図しない外的要因が付加されること
がなく、各回路基板を一定の同じ試験環境に保持するこ
とができ、環境試験の再現性が高く、高い信頼性を有す
る環境試験装置を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems of the prior art, and can maintain each circuit board in the same constant test environment without adding unintended external factors. It is an object of the present invention to provide an environmental test apparatus having high reproducibility and high reliability.

【0008】また、本発明の他の目的は、環境試験の中
間段階で回路基板を観察したりデータ測定を行う場合
に、各回路基板を容易に着脱することができ、回路基板
の環境試験を効率よく行うことができる環境試験装置を
提供することにある。
Another object of the present invention is to facilitate the mounting and dismounting of each circuit board when observing the circuit board or performing data measurement at an intermediate stage of the environmental test. An object of the present invention is to provide an environmental test device that can be efficiently performed.

【0009】[0009]

【課題を解決するための手段】本発明の環境試験装置
は、所定の環境条件が設定可能とされた試験室と、該試
験室内で試験対象となる複数の回路基板を垂直状態で略
等間隔に並設する設置部と、該設置部に並設された該回
路基板上に水滴が落下するのを防止する水滴落下防止構
造とを有している。より具体的には、水滴落下防止構造
が、試験対象となる回路基板の並設箇所を覆う屋根状部
材を有する構成にする。
According to the present invention, there is provided an environmental test apparatus comprising: a test chamber in which predetermined environmental conditions can be set; and a plurality of circuit boards to be tested in the test chamber are vertically spaced at substantially equal intervals. And a water-drop prevention structure for preventing water drops from falling on the circuit board provided side-by-side with the installation part. More specifically, the water drop prevention structure is configured to have a roof-like member that covers the juxtaposed portions of the circuit board to be tested.

【0010】上記構成によれば、試験室を所定の環境条
件に設定し、設置部によって複数の回路基板を垂直状態
で略等間隔に並設することが可能となり、各回路基板を
一定の同じ試験環境に保持することができる。更には、
水滴落下防止構造をとることで、設置部に並設された回
路基板上に水滴が落下するのを防止することが可能とな
り、意図しない外的要因が付加されることがなくなる。
従って、環境試験装置における環境試験の再現性が高く
なり、高い信頼性が得られる。
According to the above configuration, it is possible to set the test chamber to a predetermined environmental condition, and to arrange a plurality of circuit boards in a vertical state at substantially equal intervals by the installation section. Can be maintained in a test environment. Furthermore,
By adopting the water drop prevention structure, it is possible to prevent water drops from dropping on the circuit boards juxtaposed to the installation section, and to prevent an unintended external factor from being added.
Therefore, the reproducibility of the environmental test in the environmental test apparatus is improved, and high reliability is obtained.

【0011】この発明において、設置部が、各回路基板
の配線を各回路基板より低い位置にそれぞれ固定する配
線固定部を有する構成にすると、水滴が配線を伝って各
回路基板に付着することを防止でき、配線を含む各回路
基板の試験環境を更に均一化を図ることが可能となる。
In the present invention, when the installation section has a wiring fixing section for fixing the wiring of each circuit board at a position lower than each circuit board, it is possible to prevent water droplets from traveling along the wiring and adhering to each circuit board. This makes it possible to further uniform the test environment of each circuit board including the wiring.

【0012】更には、試験対象となる回路基板の並設箇
所の両側にダミー基板を設ける構成にすると、各回路基
板の試験環境をより一層均一化を図ることが可能とな
る。
Further, if dummy boards are provided on both sides of the juxtaposed portions of the circuit boards to be tested, the test environment of each circuit board can be further uniformed.

【0013】また、設置部が、回路基板の装着により各
回路基板を電気的に外部接続する電気接続部を有する構
成にすると、環境試験の中間段階で回路基板を観察した
りデータ測定を行う場合に、各回路基板を容易に着脱す
ることができ、回路基板の環境試験を効率よく行うこと
が可能となる。
Further, when the installation section has an electric connection section for electrically connecting each circuit board to the outside by mounting the circuit board, when the circuit board is observed or data is measured at an intermediate stage of an environmental test. In addition, each circuit board can be easily attached and detached, and an environmental test of the circuit board can be efficiently performed.

【0014】[0014]

【発明の実施の形態】以下に、本発明の実施の形態を図
面に基づいて具体的に説明する。
Embodiments of the present invention will be specifically described below with reference to the drawings.

【0015】(第1の実施形態)図1に、本発明の第1
の実施形態による環境試験装置10の構成例を示す。
(First Embodiment) FIG. 1 shows a first embodiment of the present invention.
1 shows a configuration example of an environmental test apparatus 10 according to the embodiment.

【0016】この環境試験装置10は、温度、湿度、風
速等の環境条件が設定可能とされた試験室1と、この試
験室1内で複数の回路基板2を垂直状態で略等間隔に並
設する設置部11と、設置部11に並設された回路基板
2上に水滴が落下するのを防止する水滴落下防止構造4
とを有する。
The environmental test apparatus 10 includes a test chamber 1 in which environmental conditions such as temperature, humidity, and wind speed can be set, and a plurality of circuit boards 2 in the test chamber 1 which are vertically arranged at substantially equal intervals. An installation part 11 to be installed, and a water drop prevention structure 4 for preventing water drops from falling on the circuit board 2 arranged in parallel with the installation part 11
And

【0017】より具体的には、設置部11は、例えば、
図1(b)に示すように、上面に略等間隔で並行する複
数の溝12が回路基板2の厚さに対応する幅で所定の深
さで形成されており、これらの溝12に各回路基板2を
垂直状態でほぼ等間隔で並べて設置することができる。
この設置部11は、回路基板2の熱を吸収しないよう
に、プラスチック等の熱伝導率の低い材料を用いること
が好ましい。
More specifically, the installation unit 11 is, for example,
As shown in FIG. 1B, a plurality of grooves 12 which are parallel to each other at substantially equal intervals are formed on the upper surface at a predetermined depth with a width corresponding to the thickness of the circuit board 2. The circuit boards 2 can be arranged vertically at substantially equal intervals.
It is preferable to use a material having a low thermal conductivity, such as plastic, for the installation portion 11 so as not to absorb the heat of the circuit board 2.

【0018】水滴落下防止構造4は、例えば、図1の
(a)及び(c)に示すように、水滴落下を防ぐため、
上面及び下面を傾斜させた切妻状の屋根部41と、この
屋根部41の四隅を支持するために垂設した支柱部42
とからなり、設置部11に並設された複数の回路基板2
の上方を覆うように設置されている。
As shown in FIGS. 1 (a) and 1 (c), for example, the water drop prevention structure 4
A gable-shaped roof portion 41 having an upper surface and a lower surface inclined, and a support portion 42 vertically provided to support four corners of the roof portion 41
And a plurality of circuit boards 2 arranged side by side in the installation section 11.
It is installed so as to cover the upper part of.

【0019】この構造をとると、試験室1の天井等で蒸
気が結露して水滴となって落下してきても、水滴が屋根
部41の上面で受け止められ、屋根部41の傾斜に沿っ
て流れ、屋根部41のいずれかの側端に達し、そこから
水滴が落下する。
With this structure, even if the vapor condenses on the ceiling of the test room 1 and falls as water droplets, the water droplets are received by the upper surface of the roof portion 41 and flow along the slope of the roof portion 41. , Reaches one of the side edges of the roof portion 41, from which water drops drop.

【0020】また、屋根部41の下面で蒸気が結露して
水滴となっても、屋根部41の下面も傾斜しているの
で、水滴が屋根部41の下面の傾斜に沿って流れ、屋根
部41のいずれかの側端に達し、そこから水滴が落下す
る。
Further, even if the vapor condenses on the lower surface of the roof portion 41 to form water droplets, since the lower surface of the roof portion 41 is also inclined, the water droplets flow along the inclination of the lower surface of the roof portion 41, and One of the side edges of 41 is reached, from which water drops fall.

【0021】このため、屋根部41で上方が覆われてい
る設置部11に並設された複数の回路基板2上に水滴が
落下するのを防止することができる。
For this reason, it is possible to prevent water drops from dropping on the plurality of circuit boards 2 arranged in parallel with the installation section 11 whose upper part is covered by the roof section 41.

【0022】尚、屋根部41及び支柱部42は最小限の
面積に抑えることで、全体の試験環境の状態から外れな
いようにする。
The roof 41 and the support 42 are kept to a minimum area so as not to deviate from the state of the entire test environment.

【0023】また、試験室1内で複数の回路基板2を垂
直状態で略等間隔に並設する設置部11において、各回
路基板2の試験環境を均一化するために、設置部11の
両端の溝12には、回路基板2と同じ形状のダミー基板
5を垂設する。
Further, in the installation section 11 in which a plurality of circuit boards 2 are arranged vertically at substantially equal intervals in the test chamber 1, both ends of the installation section 11 are provided in order to make the test environment of each circuit board 2 uniform. A dummy substrate 5 having the same shape as the circuit board 2 is vertically provided in the groove 12.

【0024】この構成によれば、水滴落下防止構造4に
より設置部11に並設された回路基板2上に水滴が落下
するのを防止することができ、意図しない外的要因が付
加されることがなくなる。また、設置部11によって複
数の回路基板2を垂直状態で略等間隔に並設することが
可能となり、各回路基板を一定の同じ試験環境に保持す
ることができる。従って、環境試験装置における環境試
験の再現性が高くなり、高い信頼性が得られる。
According to this configuration, the water droplet falling prevention structure 4 can prevent water droplets from falling onto the circuit board 2 juxtaposed to the installation portion 11, and an unintended external factor is added. Disappears. Further, the installation section 11 allows the plurality of circuit boards 2 to be arranged side by side at substantially equal intervals in a vertical state, so that each circuit board can be maintained in the same constant test environment. Therefore, the reproducibility of the environmental test in the environmental test apparatus is improved, and high reliability is obtained.

【0025】(第2の実施形態)図2に、本発明の第2
の実施形態による環境試験装置の構成例を示す。
(Second Embodiment) FIG. 2 shows a second embodiment of the present invention.
1 shows a configuration example of an environmental test apparatus according to the embodiment.

【0026】この環境試験装置20は、上記した第1の
実施形態に対し、設置部21が、各回路基板2の配線2
7をそれぞれ固定する配線固定部23を有する点で相違
し、その他の構成を第1の実施形態の場合と同様とする
ものである。
In this environmental test apparatus 20, the installation unit 21 differs from the first embodiment in that the wiring 2 of each circuit board 2
7 is different from that of the first embodiment in that it has a wiring fixing portion 23 for fixing each of the fixing members 7.

【0027】より具体的には、配線固定部23は、例え
ば、図2(a)に示すように、設置部21に垂直状態で
並設された各回路基板2に対応させて、ケーブルバンド
24を設け、それにより各配線27を設置部21の側面
に束ねて挟持して配線27を各回路基板2より低い位置
に固定する構成とすることができる。詳しくは、図2
(b)に示すように、設置部21の側面において、ケー
ブルバンド24の一方端を固定部25に固定し、他端を
ロック機構26により所望の位置でロックできるように
して、ケーブルバンド24による配線の保持寸法を調整
可能とする。
More specifically, as shown in FIG. 2A, for example, as shown in FIG. 2A, the cable fixing portion 23 corresponds to each of the circuit boards 2 arranged vertically in the installation portion 21 so as to correspond to the cable band 24. Is provided, whereby the wires 27 are bundled and held on the side surface of the installation portion 21 so that the wires 27 can be fixed at a position lower than the circuit boards 2. See Figure 2 for details.
As shown in (b), one end of the cable band 24 is fixed to the fixing portion 25 on the side surface of the installation portion 21, and the other end can be locked at a desired position by the lock mechanism 26. The wiring holding dimensions can be adjusted.

【0028】この構成によれば、水滴が配線を伝って各
回路基板に付着することを防止でき、配線を含む各回路
基板の試験環境を更に均一化を図ることができる。
According to this configuration, it is possible to prevent water droplets from traveling along the wiring and adhering to each circuit board, and to further uniform the test environment of each circuit board including the wiring.

【0029】(第3の実施形態)図3に、本発明の第3
の実施形態による環境試験装置の構成例を示す。
(Third Embodiment) FIG. 3 shows a third embodiment of the present invention.
1 shows a configuration example of an environmental test apparatus according to the embodiment.

【0030】この環境試験装置は、上記した第1の実施
形態に対し、設置部31が、回路基板2の装着により各
回路基板2を電気的に外部接続する電気接続部30を有
する点で相違し、その他の構成を第1の実施形態の場合
と同様とするものである。
The environmental test apparatus differs from the first embodiment in that the installation section 31 has an electric connection section 30 for electrically connecting each circuit board 2 to the outside when the circuit board 2 is mounted. The other configuration is the same as that of the first embodiment.

【0031】より具体的には、電気接続部30は、例え
ば、図3に示すように、複数の回路基板2を垂直状態で
略等間隔に並設するために設置部31の上面に設けた複
数の溝32において、溝32に差し込まれる回路基板2
の電極3の位置に対応させて、溝32の側壁に電極33
が設けられている。この電極33には配線34が接続さ
れており、配線34の終端にはコネクタ35が設けられ
ている。このコネクタ35を、電源に接続された配線3
7の相手となるコネクタ36に結合することで、回路基
板2に電源が供給される。
More specifically, for example, as shown in FIG. 3, the electric connection portion 30 is provided on the upper surface of the installation portion 31 in order to arrange a plurality of circuit boards 2 in a vertical state at substantially equal intervals. In the plurality of grooves 32, the circuit board 2 inserted into the grooves 32
Corresponding to the position of the electrode 3 on the side wall of the groove 32.
Is provided. A wiring 34 is connected to the electrode 33, and a connector 35 is provided at an end of the wiring 34. This connector 35 is connected to the wiring 3 connected to the power supply.
The power is supplied to the circuit board 2 by being connected to the connector 36 which is the mating member 7.

【0032】この構成によれば、環境試験の中間段階で
回路基板を観察したりデータ測定を行う場合に、従来の
ように、はんだ付けによる配線をはずすといったことが
必要なく、各回路基板を容易に着脱することができ、回
路基板の取付及び配線の作業を容易に短時間で行うこと
ができるので、回路基板の環境試験を効率よく行うこと
ができる。
According to this configuration, when observing the circuit board or performing data measurement at an intermediate stage of the environmental test, it is not necessary to remove the wiring by soldering as in the related art, and each circuit board can be easily mounted. The circuit board can be easily attached and detached, and the work of mounting and wiring the circuit board can be easily performed in a short time, so that an environmental test of the circuit board can be efficiently performed.

【0033】また、各回路基板に直接接続される配線が
ないので、水滴が配線を伝って各回路基板に付着するこ
とがなく、しかも、従来のようにはんだ付けを行う必要
がないので、はんだ付けの際に、はんだのフラックスが
飛散して回路基板に付着し、回路基板を観察する際の障
害となるといった問題も解消することができる。
Further, since there is no wiring directly connected to each circuit board, water droplets do not travel along the wiring and adhere to each circuit board, and there is no need to perform soldering as in the prior art. At the time of attachment, the problem that the flux of the solder is scattered and adheres to the circuit board, thereby obstructing observation of the circuit board can be solved.

【0034】以上、本発明の環境試験装置は、上記した
各実施形態の具体的構成に限定されるものではなく、必
要に応じ適宜構成を変形、追加又は削除した構成として
もよいことは言うまでもない。例えば、上記では設置部
11、21、31を水平に設置する例を示したが、各回
路基板を垂直状態で保持するものであれば、設置部1
1、21、31を垂直に設置するようにしてもよい。ま
た、水滴落下防止構造4を、切妻状の屋根部41と、こ
の屋根部41の四隅を支持するために垂設した支柱部4
2で構成する例を示したが、支柱部42をなくし、屋根
部41を試験室の側壁に設けた支持部材で支持したり、
試験室の天井に設けた吊り下げ部材で屋根部41を吊り
下げるようにしてもよい。
As described above, the environmental test apparatus of the present invention is not limited to the specific configuration of each of the above-described embodiments, and it is needless to say that the configuration may be modified, added, or deleted as needed. . For example, in the above description, an example in which the installation units 11, 21, and 31 are installed horizontally has been described.
1, 21, 31 may be installed vertically. Further, the water drop falling prevention structure 4 is provided with a gable-shaped roof portion 41 and a pillar portion 4 which is vertically provided to support four corners of the roof portion 41.
2, the support portion 42 is eliminated, and the roof portion 41 is supported by a support member provided on the side wall of the test room.
The roof 41 may be suspended by a suspension member provided on the ceiling of the test room.

【0035】[0035]

【発明の効果】以上説明したように、本発明の環境試験
装置によれば、試験室を所定の環境条件に設定し、設置
部によって複数の回路基板を垂直状態で略等間隔に並設
することができるので、各回路基板を一定の同じ試験環
境に保持することができる。更には、水滴落下防止構造
をとることで、設置部に並設された回路基板上に水滴が
落下するのを防止することができ、意図しない外的要因
が付加されることがなくなる。従って、環境試験装置に
おける環境試験の再現性が高くなり、高い信頼性が得ら
れる。
As described above, according to the environmental test apparatus of the present invention, the test chamber is set to a predetermined environmental condition, and a plurality of circuit boards are arranged vertically at substantially equal intervals by the installation section. As a result, each circuit board can be maintained in the same constant test environment. Further, by adopting the water drop prevention structure, it is possible to prevent the water drops from falling on the circuit boards juxtaposed to the installation portion, and to prevent an unintended external factor from being added. Therefore, the reproducibility of the environmental test in the environmental test apparatus is improved, and high reliability is obtained.

【0036】設置部が、各回路基板の配線を各回路基板
より低い位置にそれぞれ固定する配線固定部を有する構
成にすると、水滴が配線を伝って各回路基板に付着する
ことを防止でき、配線を含む各回路基板の試験環境を更
に均一化を図ることができる。
If the installation section has a wiring fixing section for fixing the wiring of each circuit board at a position lower than each circuit board, water droplets can be prevented from traveling along the wiring and adhering to each circuit board, and the wiring can be prevented. The test environment of each circuit board including the above can be further uniformized.

【0037】更には、試験対象となる回路基板の並設箇
所の両側にダミー基板を設ける構成にすると、各回路基
板の試験環境をより一層均一化を図ることができる。
Further, if dummy substrates are provided on both sides of the juxtaposed portions of the circuit boards to be tested, the test environment of each circuit board can be further uniformed.

【0038】設置部が、回路基板の装着により各回路基
板を電気的に外部接続する電気接続部を有する構成とす
る場合には、環境試験の中間段階で回路基板を観察した
りデータ測定を行う場合に、従来のようにはんだ付けに
よる配線をはずすといったことが必要なく、各回路基板
を容易に着脱することができ、回路基板の環境試験を効
率よく行うことができる。また、各回路基板に直接接続
される配線がないので、水滴が配線を伝って各回路基板
に付着することがなく、しかも、従来のようにはんだ付
けを行う必要がないので、はんだ付けの際に、はんだの
フラックスが飛散して回路基板に付着し、回路基板を観
察する際の障害となるといった問題も解消することがで
きる。
When the installation section has an electric connection section for electrically connecting each circuit board to the outside by mounting the circuit board, the circuit board is observed or data is measured at an intermediate stage of the environmental test. In this case, it is not necessary to remove the wiring by soldering as in the related art, and each circuit board can be easily attached and detached, and an environmental test of the circuit board can be efficiently performed. Also, since there is no wiring directly connected to each circuit board, water droplets do not adhere to each circuit board along the wiring, and there is no need to perform soldering as in the past. In addition, the problem that the solder flux is scattered and adheres to the circuit board, which is an obstacle to observing the circuit board, can be solved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施形態による環境試験装置の
構成例を示す図であって、(a)は装置全体を表す斜視
図、(b)は設置部の詳細を表す斜視図、(c)は水滴
落下防止構造の要部を表す(a)におけるP−P断面図
である。
FIG. 1 is a diagram showing a configuration example of an environmental test apparatus according to a first embodiment of the present invention, wherein (a) is a perspective view showing the entire apparatus, (b) is a perspective view showing details of an installation unit, FIG. 3C is a sectional view taken along the line P-P in FIG.

【図2】本発明の第2の実施形態による環境試験装置の
構成例を示す図であって、(a)は装置全体を表す斜視
図、(b)は配線固定部の詳細を表す斜視図である。
2A and 2B are diagrams illustrating a configuration example of an environmental test apparatus according to a second embodiment of the present invention, wherein FIG. 2A is a perspective view illustrating the entire apparatus, and FIG. 2B is a perspective view illustrating details of a wiring fixing unit. It is.

【図3】本発明の第3の実施形態による環境試験装置に
おける電気接続部の構成例を示す図である。
FIG. 3 is a diagram illustrating a configuration example of an electrical connection unit in an environmental test device according to a third embodiment of the present invention.

【図4】従来の環境試験装置の構成例を示す斜視図であ
る。
FIG. 4 is a perspective view showing a configuration example of a conventional environmental test apparatus.

【符号の説明】[Explanation of symbols]

1 試験室 2 回路基板 3、33 電極 4 水滴落下防止構造 5 ダミー基板 10、20 環境試験装置 11、21,31 設置部 12、22、32 溝 23 配線固定部 30 電気接続部 DESCRIPTION OF SYMBOLS 1 Test room 2 Circuit board 3, 33 electrode 4 Drop prevention structure 5 Dummy board 10, 20 Environmental test device 11, 21, 31 Installation part 12, 22, 32 Groove 23 Wiring fixing part 30 Electrical connection part

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 所定の環境条件が設定可能とされた試験
室と、 該試験室内で試験対象となる複数の回路基板を垂直状態
で略等間隔に並設する設置部と、 該設置部に並設された該回路基板上に水滴が落下するの
を防止する水滴落下防止構造とを有する環境試験装置。
1. A test chamber in which predetermined environmental conditions can be set, a mounting section for vertically arranging a plurality of circuit boards to be tested in the test chamber at substantially equal intervals, and An environmental test apparatus comprising: a water droplet drop prevention structure for preventing water droplets from falling on the circuit board arranged in parallel.
【請求項2】 前記設置部が、各回路基板の配線をそれ
ぞれ固定する配線固定部を有する請求項1記載の環境試
験装置。
2. The environmental test apparatus according to claim 1, wherein the installation section has a wiring fixing section for fixing the wiring of each circuit board.
【請求項3】 前記設置部が、回路基板の装着により各
回路基板を電気的に外部接続する電気接続部を有する請
求項1記載の環境試験装置。
3. The environmental test apparatus according to claim 1, wherein the installation section has an electric connection section for electrically connecting each circuit board to the outside by mounting the circuit board.
【請求項4】 前記水滴落下防止構造が、試験対象とな
る回路基板の並設箇所を覆う屋根状部材を有する請求項
1〜請求項3のいずれかに記載の環境試験装置。
4. The environmental test apparatus according to claim 1, wherein the water drop prevention structure has a roof-like member that covers a juxtaposed portion of a circuit board to be tested.
【請求項5】 試験対象となる回路基板の並設箇所の両
側にダミー基板を設けた請求項1〜請求項4のいずれか
に記載の環境試験装置。
5. The environmental test apparatus according to claim 1, wherein dummy substrates are provided on both sides of the juxtaposition of the circuit boards to be tested.
JP11222135A 1999-08-05 1999-08-05 Environmental testing apparatus Withdrawn JP2001050888A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11222135A JP2001050888A (en) 1999-08-05 1999-08-05 Environmental testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11222135A JP2001050888A (en) 1999-08-05 1999-08-05 Environmental testing apparatus

Publications (1)

Publication Number Publication Date
JP2001050888A true JP2001050888A (en) 2001-02-23

Family

ID=16777730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11222135A Withdrawn JP2001050888A (en) 1999-08-05 1999-08-05 Environmental testing apparatus

Country Status (1)

Country Link
JP (1) JP2001050888A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008232975A (en) * 2007-03-23 2008-10-02 Espec Corp Environmental testing device
JP2009068862A (en) * 2007-09-10 2009-04-02 Toshiba Corp Environmental acceleration cracking monitoring test method and environmental acceleration cracking monitoring testing device
JP2009216660A (en) * 2008-03-12 2009-09-24 Espec Corp Environment testing method and environment testing device
JP2012093157A (en) * 2010-10-26 2012-05-17 Tokyo Electric Power Co Inc:The Box type housing holder for exposure test piece, and exposure test piece corrosion state measuring method using box type housing holder for exposure test piece
JPWO2018207270A1 (en) * 2017-05-09 2020-03-19 株式会社ダイチューテクノロジーズ Storage media evaluation test equipment
JP2021139629A (en) * 2020-03-02 2021-09-16 エスペック株式会社 Plate-like sample mounting jig

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008232975A (en) * 2007-03-23 2008-10-02 Espec Corp Environmental testing device
JP2009068862A (en) * 2007-09-10 2009-04-02 Toshiba Corp Environmental acceleration cracking monitoring test method and environmental acceleration cracking monitoring testing device
JP2009216660A (en) * 2008-03-12 2009-09-24 Espec Corp Environment testing method and environment testing device
JP2012093157A (en) * 2010-10-26 2012-05-17 Tokyo Electric Power Co Inc:The Box type housing holder for exposure test piece, and exposure test piece corrosion state measuring method using box type housing holder for exposure test piece
JPWO2018207270A1 (en) * 2017-05-09 2020-03-19 株式会社ダイチューテクノロジーズ Storage media evaluation test equipment
JP2021139629A (en) * 2020-03-02 2021-09-16 エスペック株式会社 Plate-like sample mounting jig
JP7274436B2 (en) 2020-03-02 2023-05-16 エスペック株式会社 Plate-shaped sample mounting jig

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