JP7274436B2 - Plate-shaped sample mounting jig - Google Patents

Plate-shaped sample mounting jig Download PDF

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JP7274436B2
JP7274436B2 JP2020034710A JP2020034710A JP7274436B2 JP 7274436 B2 JP7274436 B2 JP 7274436B2 JP 2020034710 A JP2020034710 A JP 2020034710A JP 2020034710 A JP2020034710 A JP 2020034710A JP 7274436 B2 JP7274436 B2 JP 7274436B2
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plate
sample
shaped sample
mounting jig
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JP2021139629A (en
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靖之 渡辺
秀己 河合
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Espec Corp
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本発明は、試料が配置される内部空間を所定の環境とする環境形成装置において用いられる板状試料載置治具に関する。 TECHNICAL FIELD The present invention relates to a plate-like sample mounting jig used in an environment forming apparatus having an internal space in which a sample is placed as a predetermined environment.

特許文献1には、試料が配置された試験室(内部空間)内の環境を所定の環境に維持する環境試験装置(環境形成装置)として、吸込口を通じて吸い込んだ試験室内の空気を調和した後に、吹出口を通じて試験室内に調和空気を吹き出す空調装置を備えたものが開示されている。特許文献1の装置では、試験室内に配設された棚板に試料が載置され、空調装置によって試験室内が所定の環境に維持される。 In Patent Document 1, as an environmental test device (environment forming device) that maintains the environment in a test room (internal space) in which a sample is placed at a predetermined environment, after conditioning the air in the test room sucked through the suction port , which is equipped with an air conditioner that blows conditioned air into the test chamber through an air outlet. In the apparatus of Patent Document 1, a sample is placed on a shelf provided in the test chamber, and the inside of the test chamber is maintained in a predetermined environment by an air conditioner.

特開2010-107062号公報JP 2010-107062 A

特許文献1の装置の棚板上には、プリント基板などの板状試料が配置されることがある。この場合、例えば、複数の板状試料を棚板上に立てて載置するためのラックが、棚板上に配置される。このラックの上面には等間隔にスリットが形成されており、当該スリットに板状試料を挿入することで、板状試料がラックに保持される。 A plate-shaped sample such as a printed circuit board may be placed on the shelf board of the apparatus of Patent Document 1. In this case, for example, a rack for standing and placing a plurality of plate-shaped samples on the shelf is arranged on the shelf. Slits are formed at regular intervals on the upper surface of the rack, and the plate-shaped sample is held by the rack by inserting the plate-shaped sample into the slits.

しかし、単に、板状試料を保持したラックを棚板上に配置しただけでは、試験室内を流れる調和空気によってラックが動くおそれがあり、板状試料の安定性を十分に確保できない。このため、別途、固定部材を用いてラックを棚板に固定する必要があり、手間となっていた。 However, simply arranging the rack holding the plate-shaped sample on the shelf plate may cause the rack to move due to the conditioned air flowing in the test chamber, and the stability of the plate-shaped sample cannot be sufficiently ensured. For this reason, it is necessary to fix the rack to the shelf using a separate fixing member, which is troublesome.

本発明の目的は、載置する板状試料の安定性を確保しつつ、取り扱いが容易な板状試料載置治具を提供することである。 SUMMARY OF THE INVENTION It is an object of the present invention to provide a plate-shaped sample mounting jig that is easy to handle while ensuring the stability of the plate-shaped sample to be mounted.

第1の発明に係る板状試料載置治具は、試料を載置するために環境形成装置の内部空間に配置される試料載置部材に取り付けられる板状試料載置治具であって、前記試料載置部材は、複数の線状部分を有しており、一方向に向かって開口しており、前記一方向に向かって前記板状試料載置治具を前記試料載置部材に近づけたときに互いに平行な2つの前記線状部分を収容可能な、延在方向が共通した少なくとも2つの取付溝部と、前記少なくとも2つの取付溝部の間に形成され且つ前記一方向とは反対方向に向かって開口しており、板状試料の少なくとも一部を収容可能な少なくとも1つの試料収容凹部と、を備えている。 A plate-shaped sample mounting jig according to a first aspect of the present invention is a plate-shaped sample mounting jig attached to a sample mounting member arranged in an internal space of an environment forming apparatus for mounting a sample, The sample mounting member has a plurality of linear portions and is open in one direction, and the plate-like sample mounting jig is brought closer to the sample mounting member in the one direction. at least two mounting grooves extending in a common direction and capable of accommodating the two linear portions parallel to each other when the mounting grooves are formed between the at least two mounting grooves and in a direction opposite to the one direction; and at least one sample-accommodating recess that opens toward and can accommodate at least a portion of the plate-shaped sample.

本発明によれば、試料載置部材が有する互いに平行な2つの線状部分が2つの取付溝部に収容されることによって、試料載置部材に板状試料載置治具が固定される。したがって、環境形成装置の内部空間に容易に板状試料載置治具を取り付けることができ、さらに、板状試料載置治具に載置する板状試料の安定性を確保することができる。 According to the present invention, the plate-shaped sample mounting jig is fixed to the sample mounting member by accommodating the two parallel linear portions of the sample mounting member in the two mounting grooves. Therefore, the plate-shaped sample mounting jig can be easily attached to the internal space of the environment forming apparatus, and the stability of the plate-shaped sample mounted on the plate-shaped sample mounting jig can be ensured.

第2の発明に係る板状試料載置治具は、第1の発明に係る板状試料載置治具において、3つ以上の前記取付溝部及び2つ以上の前記試料収容凹部を有し、隣接する2つの前記取付溝部の間には、それぞれ1つの前記試料収容凹部が設けられていることを特徴とするものである。本発明によれば、複数の板状試料を並べて設置することができる。 A plate-shaped sample mounting jig according to a second aspect of the invention is the plate-shaped sample mounting jig according to the first aspect of the invention, having three or more of the mounting grooves and two or more of the sample-accommodating recesses, It is characterized in that one sample accommodating recess is provided between two adjacent mounting grooves. According to the present invention, a plurality of plate-shaped samples can be placed side by side.

第3の発明に係る板状試料載置治具は、第1及び第2の発明に係る板状試料載置治具において、前記試料収容凹部の内面の一部には、内側に向かって突出する弾性部が設けられており、前記弾性部は、前記試料収容凹部に収容された前記板状試料に圧力を付与することを特徴とするものである。 A plate-shaped sample mounting jig according to a third aspect of the invention is the plate-shaped sample mounting jig according to the first and second aspects of the invention, wherein a part of the inner surface of the sample-accommodating concave portion protrudes inward. and an elastic portion is provided, and the elastic portion applies pressure to the plate-shaped sample accommodated in the sample accommodation recess.

例えば、板状試料がプリント基板などであって、表面に電子部品が実装されている場合、実装された電子部品と試料収容凹部との接触は避けることが好ましい。本発明によれば、板状試料の電子部品が実装されている側の表面と試料収容凹部との間の距離を確保することができ、実装された電子部品と試料収容凹部とが接触しにくくなる。また、本発明によれば、試料収容凹部に設置した板状試料をより確実に固定することができる。 For example, when the plate-shaped sample is a printed circuit board or the like and electronic components are mounted on the surface, it is preferable to avoid contact between the mounted electronic components and the sample housing recess. According to the present invention, it is possible to secure a distance between the surface of the plate-shaped sample on which the electronic component is mounted and the sample-accommodating recess, thereby making it difficult for the mounted electronic component and the sample-accommodating recess to come into contact with each other. Become. Moreover, according to the present invention, it is possible to more reliably fix the plate-shaped sample placed in the sample-accommodating recess.

第4の発明に係る板状試料載置治具は、第1~第3の発明に係る板状試料載置治具において、前記取付溝部と前記試料収容凹部とが一体形成されていることを特徴とするものである。本発明によれば、取付溝部と試料収容凹部とが別体である場合と比べて、板状試料載置治具の試料載置部への取り付けが容易となる。また、1つの金型から板状試料載置治具を製造することができるため、製造が容易となる。 A plate-shaped sample mounting jig according to a fourth aspect of the present invention is the plate-shaped sample mounting jig according to the first to third aspects of the invention, wherein the mounting groove portion and the sample accommodating concave portion are integrally formed. It is characterized. According to the present invention, it becomes easier to attach the plate-shaped sample mounting jig to the sample mounting portion, compared to the case where the mounting groove portion and the sample accommodating recessed portion are separate members. Moreover, since the plate-shaped sample mounting jig can be manufactured from one mold, manufacturing is facilitated.

第5の発明に係る板状試料載置治具は、第1~第4の発明に係る板状試料載置治具において、前記複数の線状部分が少なくとも1つの貫通孔を画定しており、前記試料載置部材に取り付けられたときに、前記試料収容凹部の下端が、前記試料載置部の下端よりも下側に位置することを特徴とするものである。本発明によれば、試料収容凹部によって、上下方向の広い範囲にわたって、板状試料を支持することができるため、板状試料を安定して設置することができる。 A plate-shaped sample mounting jig according to a fifth invention is the plate-shaped sample mounting jig according to the first to fourth inventions, wherein the plurality of linear portions define at least one through hole. and a lower end of the sample holding recess is located below a lower end of the sample placing portion when attached to the sample placing member. According to the present invention, since the plate-shaped sample can be supported over a wide range in the vertical direction by the sample-accommodating recess, the plate-shaped sample can be placed stably.

第6の発明に係る板状試料載置治具セットは、第1~第5の発明のいずれかに係る板状試料載置治具である第1板状試料載置治具と、第1~第5の発明のいずれかに係る板状試料載置治具である第2板状試料載置治具と、を有している。 A plate-shaped sample mounting jig set according to a sixth aspect of the invention is a first plate-shaped sample mounting jig which is the plate-shaped sample mounting jig according to any one of the first to fifth inventions; and a second plate-shaped sample mounting jig, which is a plate-shaped sample mounting jig according to any one of the to fifth inventions.

本発明によれば、第1板状試料載置治具と第2板状試料載置治具とを対向配置させることで、1つの板状試料を第1板状試料載置治具と第2板状試料載置治具との両方の試料収容凹部に収容させることができる。これにより、板状試料をより安定して設置することができる。また、板状試料の幅に応じて、第1板状試料載置治具と第2板状試料載置治具との間隔を調整することで、様々な大きさの板状試料を設置することができる。 According to the present invention, by arranging the first plate-shaped sample mounting jig and the second plate-shaped sample mounting jig so as to face each other, one plate-shaped sample can be placed between the first plate-shaped sample mounting jig and the second plate-shaped sample mounting jig. It can be accommodated in both the sample accommodation recesses of the 2-plate-shaped sample placement jig. Thereby, the plate-shaped sample can be placed more stably. Further, by adjusting the distance between the first plate-shaped sample mounting jig and the second plate-shaped sample mounting jig according to the width of the plate-shaped sample, plate-shaped samples of various sizes can be placed. be able to.

本発明によれば、載置する板状試料の安定性を確保しつつ、取り扱いが容易な板状試料載置治具を提供することが可能となる。 According to the present invention, it is possible to provide a plate-shaped sample mounting jig that is easy to handle while ensuring the stability of the plate-shaped sample to be mounted.

本発明の一実施形態に係る環境試験装置の概略構成を示す図である。1 is a diagram showing a schematic configuration of an environmental test device according to one embodiment of the present invention; FIG. 棚板に取り付けられた板状試料載置治具セットの斜視図である。FIG. 4 is a perspective view of a plate-shaped sample mounting jig set attached to a shelf; 棚板に取り付けられた第1板状試料載置治具の側面図である。FIG. 4 is a side view of the first plate-shaped sample mounting jig attached to the shelf; 第1変形例に係る板状試料載置治具の側面図である。FIG. 11 is a side view of a plate-shaped sample mounting jig according to a first modified example; 第2変形例に係る板状試料載置治具の側面図である。FIG. 11 is a side view of a plate-shaped sample mounting jig according to a second modified example;

(環境試験装置1の全体構成)
まず、図1及び図2を参照しつつ、本発明の一実施形態に係る環境試験装置(本発明の環境形成装置)1の全体構成を説明する。以下、図1の紙面上下方向を上下方向、紙面左右方向を前後方向と定義する。また、図1の紙面に垂直な方向を左右方向とし、紙面表側を右方とする。
(Overall configuration of environmental test apparatus 1)
First, referring to FIGS. 1 and 2, the overall configuration of an environmental test apparatus (environment forming apparatus of the present invention) 1 according to an embodiment of the present invention will be described. Hereinafter, the up-down direction of FIG. 1 is defined as the up-down direction, and the left-right direction of the paper is defined as the front-rear direction. Further, the direction perpendicular to the paper surface of FIG. 1 is defined as the left-right direction, and the front side of the paper surface is defined as the right side.

環境試験装置1は、例えば、電気電子、自動車、材料工学等の分野において、部品や材料の性能を検査するのに用いられる。環境試験装置1は、図1に示すように、内部空間10aに試料(各種材料、電子部品等)が配置される試験槽10を備え、試験槽10の内部空間10aの環境を予め設定された試験条件にして試料の環境試験を行うように構成されている。本実施形態において、試料は板状試料Mである。 The environmental test apparatus 1 is used, for example, to inspect the performance of parts and materials in the fields of electrical/electronics, automobiles, material engineering, and the like. The environmental test apparatus 1, as shown in FIG. It is configured to conduct an environmental test of the sample under test conditions. In this embodiment, the sample is a plate-shaped sample M. FIG.

試験槽10の内部空間10aは、仕切板12によって2つの空間(試験室10a1及び空調室10a2)に分離されている。試験室10a1と空調室10a2とは、仕切板12の上部開口12a及び下部開口12bを介して、互いに連通している。 An internal space 10a of the test tank 10 is separated by a partition plate 12 into two spaces (a test chamber 10a1 and an air conditioning chamber 10a2). The test chamber 10a1 and the air conditioning chamber 10a2 communicate with each other through the upper opening 12a and the lower opening 12b of the partition plate 12. As shown in FIG.

試験室10a1には、板状試料Mを載置するための棚板(本発明の試料載置部材)11と、試験室10a1の温度及び湿度を測定する温湿度センサ30とが設けられている。また、試験槽10の前部には、開閉可能な扉13が設けられている。そして、扉13を開放した状態において、板状試料Mが外部から試験室10a1に運び込まれる、又は試験室10a1から外部に運び出される。 The test chamber 10a1 is provided with a shelf board (sample mounting member of the present invention) 11 for mounting a plate-shaped sample M, and a temperature and humidity sensor 30 for measuring the temperature and humidity of the test chamber 10a1. . A door 13 that can be opened and closed is provided at the front of the test tank 10 . Then, with the door 13 opened, the plate-shaped sample M is brought into the test chamber 10a1 from the outside, or carried out from the test chamber 10a1 to the outside.

空調室10a2には、送風機21、加熱器22、冷却器23及び加湿器24が設けられている。加熱器22は、空調室10a2の加熱を行うものであり、例えばシーズヒータ等の電熱ヒータからなってよい。冷却器23は、空調室10a2の冷却及び除湿を行うものであり、冷却器23に接続する図示しない冷凍機として、例えば蒸気圧縮冷凍機、スターリング冷凍機が用いられてもよい。また、冷却器23としてペルチェ素子、ヒートパイプ、ヒートレーン等が用いられてよい。加湿器24は、空調室10a2の加湿を行うものであり、容器内の水を内蔵ヒータで加熱して加湿を行うように構成されている。 A blower 21, a heater 22, a cooler 23, and a humidifier 24 are provided in the air-conditioned room 10a2. The heater 22 heats the air-conditioned room 10a2, and may be an electric heater such as a sheathed heater. The cooler 23 cools and dehumidifies the air-conditioned room 10a2, and as a refrigerator (not shown) connected to the cooler 23, for example, a vapor compression refrigerator or a Stirling refrigerator may be used. A Peltier element, a heat pipe, a heat lane, or the like may be used as the cooler 23 . The humidifier 24 humidifies the air-conditioned room 10a2, and is configured to humidify the water in the container by heating it with a built-in heater.

送風機21の駆動により、空調室10a2において加湿器24、冷却器23及び加熱器22によって温度及び湿度が調整された空気は、上部開口12aを介して空調室10a2から試験室10a1に流入する。また、上部開口12aを介して試験室10a1に流入した空気は、試験室10a1において上部から下方に移動し、下部開口12bを介して空調室10a2に流入する。このようにして、試験室10a1と空調室10a2とにおいて空気が循環する。 By driving the air blower 21, the air whose temperature and humidity are adjusted by the humidifier 24, the cooler 23 and the heater 22 in the air-conditioned room 10a2 flows from the air-conditioned room 10a2 into the test room 10a1 through the upper opening 12a. Also, the air that has flowed into the test chamber 10a1 through the upper opening 12a moves downward in the test chamber 10a1 and flows into the air-conditioned room 10a2 through the lower opening 12b. In this manner, air circulates between the test room 10a1 and the air conditioning room 10a2.

棚板11は、試験室10a1内において、水平に配置されており、例えば、複数本の断面円形の線材が格子状に組み合わされて互いの接触部分で溶接されたものである。棚板11は、図2に示すように、複数の貫通孔40を画定する複数の線状部分11a及び11bを有している。各貫通孔40は、線状部分11aの延在方向に細長い矩形形状を有している。本実施形態では、線状部分11aは左右方向に延びており、複数の線状部分11aが前後方向に等間隔に配列されている。また、線状部分11bは前後方向に延びており、複数の線状部分11bが左右方向に等間隔に配列されている。複数の線状部分11bのうち、棚板11の左右方向の両端に位置する2つの線状部分11bは、試験室10a1の内側面に直接的又は棚受けを介して間接的に固定又は接着されている。なお、線状部分11bは、棚板11の左右方向の両端に位置する2つのみであってもよい。また、棚板11は、ステンレス製である。なお、棚板11の表面は、非導電性の絶縁塗料で塗装されていてもよい。本実施形態において、貫通孔40は、左右方向に板状試料Mよりも長い。 The shelf board 11 is arranged horizontally in the test chamber 10a1, and is made by, for example, combining a plurality of wire rods having a circular cross section in a lattice shape and welding them together at their contact portions. The shelf board 11 has a plurality of linear portions 11a and 11b defining a plurality of through holes 40, as shown in FIG. Each through hole 40 has an elongated rectangular shape in the extending direction of the linear portion 11a. In the present embodiment, the linear portions 11a extend in the left-right direction, and a plurality of linear portions 11a are arranged at regular intervals in the front-rear direction. In addition, the linear portions 11b extend in the front-rear direction, and the plurality of linear portions 11b are arranged in the horizontal direction at regular intervals. Of the plurality of linear portions 11b, two linear portions 11b located at both ends in the left-right direction of the shelf board 11 are fixed or adhered to the inner surface of the test chamber 10a1 directly or indirectly via shelf brackets. ing. The linear portions 11b may be only two located at both ends of the shelf plate 11 in the left-right direction. Moreover, the shelf plate 11 is made of stainless steel. The surface of the shelf board 11 may be coated with a non-conductive insulating paint. In this embodiment, the through-hole 40 is longer than the plate-shaped sample M in the left-right direction.

(板状試料載置治具セット)
続いて、図2及び図3を参照しつつ、棚板11に取り付けられる板状試料載置治具セット14について以下に説明する。
(Plate-shaped sample mounting jig set)
Next, the plate-shaped sample mounting jig set 14 attached to the shelf board 11 will be described below with reference to FIGS. 2 and 3. FIG.

板状試料載置治具セット14は、板状試料Mを載置するためのものであり、第1板状試料載置治具14aと第2板状試料載置治具14bとを有している。第1板状試料載置治具14a及び第2板状試料載置治具14bは、それぞれ、1枚の帯状ステンレス部材の曲げ加工によって形成されたものである。第1板状試料載置治具14a及び第2板状試料載置治具14bの表面は絶縁塗装されている。第1板状試料載置治具14aと第2板状試料載置治具14bとは左右方向に沿って対向配置されており、それぞれが棚板11に取り付けられる。第1板状試料載置治具14aは左右方向の右側に配置され、第2板状試料載置治具14bは左右方向の左側に配置されている。そして、第1板状試料載置治具14aと第2板状試料載置治具14bの双方に板状試料Mが載置される。本実施形態において、第1板状試料載置治具14a及び第2板状試料載置治具14bは、左右方向に板状試料Mの1/20から1/5程度の幅を有しているが、貫通孔40の左右方向の長さの半分以下の幅であればどのような幅であってもよい。また、第1板状試料載置治具14a及び第2板状試料載置治具14bは、左右方向に板状試料Mの両端からはみ出ることがないような位置にあるが、それぞれその一部が板状試料Mから左又は右にはみ出していてもよい。 The plate-shaped sample mounting jig set 14 is for mounting the plate-shaped sample M, and has a first plate-shaped sample mounting jig 14a and a second plate-shaped sample mounting jig 14b. ing. The first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are each formed by bending a strip-shaped stainless steel member. The surfaces of the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are coated with insulation. The first plate-shaped sample mounting jig 14 a and the second plate-shaped sample mounting jig 14 b are arranged to face each other along the left-right direction, and are attached to the shelf board 11 . The first plate-shaped sample mounting jig 14a is arranged on the right side in the horizontal direction, and the second plate-shaped sample mounting jig 14b is arranged on the left side in the horizontal direction. Then, the plate-like sample M is mounted on both the first plate-like sample mounting jig 14a and the second plate-like sample mounting jig 14b. In this embodiment, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b have a width of about 1/20 to 1/5 of the plate-shaped sample M in the horizontal direction. However, the width may be any width as long as it is less than half the length of the through hole 40 in the left-right direction. Further, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are positioned so as not to protrude from both ends of the plate-shaped sample M in the left-right direction. may protrude from the plate-shaped sample M to the left or right.

第1板状試料載置治具14a及び第2板状試料載置治具14bは、図2及び図3に示すように、それぞれ、5つの取付溝部15と、4つの試料収容凹部16とを備えている。以下、第1板状試料載置治具14aと第2板状試料載置治具14bとの間の共通構成については、同一の符号を付して説明する。取付溝部15は、第1板状試料載置治具14a及び第2板状試料載置治具14bを棚板11に取り付けるための部分である。取付溝部15は、下方に向かって開口しており、上方から下方に向かって棚板11に近づけたときに線状部分11aを収容可能な方向である左右方向に延在している。取付溝部15は、左右方向から見たとき円弧形状となっており、その内径は、線状部分11aの直径とほぼ同じである(図3を参照)。これにより、取付溝部15を線状部分11aに取り付けたとき、より安定性が確保される。また、5つの取付溝部15は、前後方向に並んで配列されており、隣接する取付溝部15の前後方向の間隔は、隣接する線状部分11aの前後方向の間隔と同じである。このため、取付溝部15を棚板11に取り付けるとき、5つの取付溝部15は、隣接する5つの線状部分11aをそれぞれ収容することとなる。 The first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b, as shown in FIGS. I have. Hereinafter, the common configuration between the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b will be described by attaching the same reference numerals. The attachment groove portion 15 is a portion for attaching the first plate-shaped sample mounting jig 14 a and the second plate-shaped sample mounting jig 14 b to the shelf board 11 . The mounting groove portion 15 is open downward and extends in the left-right direction, which is the direction in which the linear portion 11a can be accommodated when approaching the shelf plate 11 from above downward. The mounting groove portion 15 has an arc shape when viewed from the left and right direction, and its inner diameter is substantially the same as the diameter of the linear portion 11a (see FIG. 3). Thereby, when the attachment groove portion 15 is attached to the linear portion 11a, more stability is ensured. The five mounting grooves 15 are arranged side by side in the front-rear direction, and the distance between adjacent mounting grooves 15 in the front-rear direction is the same as the distance between adjacent linear portions 11a in the front-rear direction. Therefore, when attaching the mounting grooves 15 to the shelf board 11, the five mounting grooves 15 accommodate the five adjacent linear portions 11a.

試料収容凹部16は、板状試料Mの少なくとも一部を収容するための部分である。試料収容凹部16は、上方に向かって開口したV字形状であり、取付溝部15と一体形成されている。4つの試料収容凹部16は、隣接する2つの取付溝部15の間にそれぞれ1つずつ配置されている。隣接する試料収容凹部16の前後方向のピッチは、隣接する線状部分11aの前後方向のピッチに等しい。また、図3に示すように、試料収容凹部16は、第1板状試料載置治具14a及び第2板状試料載置治具14bが棚板11に取り付けられたときに、取付溝部15よりも下側に位置する。これにより、第1板状試料載置治具14a及び第2板状試料載置治具14bが棚板11に取り付けられたときに、試料収容凹部16の下端が棚板11の下端よりも下側に位置するような構成となる。 The sample accommodation recess 16 is a portion for accommodating at least part of the plate-shaped sample M. As shown in FIG. The sample housing recess 16 has a V-shape opening upward and is integrally formed with the mounting groove 15 . Each of the four sample housing recesses 16 is arranged between two adjacent mounting grooves 15 . The pitch in the front-rear direction of the adjacent sample housing recesses 16 is equal to the pitch in the front-rear direction of the adjacent linear portions 11a. Further, as shown in FIG. 3, when the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are mounted on the shelf board 11, the sample holding recess 16 is positioned in the mounting groove portion 15. located below. As a result, when the first plate-shaped sample mounting jig 14 a and the second plate-shaped sample mounting jig 14 b are attached to the shelf board 11 , the lower end of the sample accommodating concave portion 16 is positioned below the lower end of the shelf board 11 . It is configured to be located on the side.

さらに、図3に示すように、それぞれの試料収容凹部16の内面の一部には、内側に向かって突出する弾性部17が2つずつ設けられている。2つの弾性部17は、1つの試料収容凹部16のV字の内面のうちの、前後方向前側の内面の上下方向における中央付近と、前後方向後側の内面の上下方向における中央付近とに設けられている(図3参照)。弾性部17は、試料収容凹部16の内面から内側に向かう方向に弾性変形可能である。本実施形態において、弾性部17は、試料収容凹部16と一体成形されているが、試料収容凹部16とは別体のばね部材又はゴムなどのエラストマー部材等からなるものであってもよい。弾性部17は、試料収容凹部16に収容された板状試料Mに対して、試料収容凹部16の内面から内側に向かう方向に圧力を付与する。これにより、試料収容凹部16に収容された板状試料Mを固定する。 Furthermore, as shown in FIG. 3, two elastic portions 17 protruding inward are provided on a part of the inner surface of each sample accommodating recess 16 . The two elastic portions 17 are provided near the center in the vertical direction of the inner surface on the front side in the front-rear direction and near the center in the vertical direction on the inner surface on the rear side in the front-rear direction of the V-shaped inner surface of one sample housing recess 16 . (See Figure 3). The elastic portion 17 is elastically deformable from the inner surface of the sample housing recess 16 toward the inside. In the present embodiment, the elastic portion 17 is formed integrally with the sample-accommodating recess 16, but it may be made of a spring member or an elastomer member such as rubber that is separate from the sample-accommodating recess 16. FIG. The elastic portion 17 applies pressure to the plate-like sample M accommodated in the sample accommodation recess 16 in the direction from the inner surface of the sample accommodation recess 16 toward the inside. Thereby, the plate-like sample M housed in the sample housing recess 16 is fixed.

弾性部17の左右方向の幅は、試料収容凹部16の左右方向の幅のほぼ半分である。試料収容凹部16に収容された板状試料Mは、試料収容凹部16の前側の内面に設けられた弾性部17と、後側の内面に設けられた弾性部17とによって、挟持されるようにして保持される。これにより、試料収容凹部16に収容された板状試料Mと、試料収容凹部16の内面との間の距離を確保することができ、板状試料Mの表面に実装された電子部品(不図示)が試料収容凹部16の内面に接触しにくくなる。また、板状試料Mをより確実に固定することができる。なお、弾性部17の左右方向の幅は、試料収容凹部16の左右方向の幅の半分未満でもよく、半分より大きくてもよい。 The width of the elastic portion 17 in the left-right direction is approximately half the width of the sample holding recess 16 in the left-right direction. The plate-like sample M accommodated in the sample accommodation recess 16 is sandwiched between the elastic portion 17 provided on the front inner surface of the sample accommodation recess 16 and the elastic portion 17 provided on the rear inner surface. retained. As a result, the distance between the plate-shaped sample M accommodated in the sample-accommodating recess 16 and the inner surface of the sample-accommodating recess 16 can be secured, and the electronic component (not shown) mounted on the surface of the plate-shaped sample M can be secured. ) is less likely to come into contact with the inner surface of the sample housing recess 16 . Also, the plate-shaped sample M can be fixed more reliably. The width of the elastic portion 17 in the left-right direction may be less than half the width of the sample holding recess 16 in the left-right direction, or may be greater than half.

さらに、弾性部17は、図2に示すように、第1板状試料載置治具14aの試料収容凹部16の左右方向の右端に設けられ、第2板状試料載置治具14bの試料収容凹部16の左右方向の左端に設けられている。ここで、一般に、電子部品は板状試料Mの表面の端部には実装されない。本実施形態の構成では、第1板状試料載置治具14a及び第2板状試料載置治具14bの弾性部17によって、板状試料Mのより外側の部分が保持されることになるため、板状試料Mの表面に実装された電子部品(不図示)が、試料収容凹部16の内面により接触しにくくなる。 Furthermore, as shown in FIG. 2, the elastic portion 17 is provided at the right end in the left-right direction of the sample accommodating concave portion 16 of the first plate-shaped sample mounting jig 14a, and the elastic portion 17 is provided at the left-right end of the sample holding recess 16 of the first plate-shaped sample mounting jig 14a. It is provided at the left end of the housing recess 16 in the left-right direction. Here, in general, electronic components are not mounted on the edge of the surface of the plate-shaped sample M. As shown in FIG. In the configuration of this embodiment, the outer portion of the plate-shaped sample M is held by the elastic portions 17 of the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b. Therefore, an electronic component (not shown) mounted on the surface of the plate-like sample M is less likely to come into contact with the inner surface of the sample-accommodating recess 16 .

続いて、棚板11に取り付けられた板状試料載置治具セット14に、板状試料Mを載置する手順について、以下に説明する。まず、第1板状試料載置治具14aと第2板状試料載置治具14bとを左右方向に沿って対向配置する。このとき、第1板状試料載置治具14aと第2板状試料載置治具14bとの互いの間の左右方向の間隔が、板状試料Mの左右方向の幅よりもわずかに小さくなるようにする。次に、板状試料Mを、線状部分11aと線状部分11bとによって画定された貫通孔40を通して、試料収容凹部16の弾性部17を外側(試料収容凹部16の内面側)に広げながら、試料収容凹部16に収容する。このとき、1つの板状試料Mは、第1板状試料載置治具14aの試料収容凹部16と、当該試料収容凹部16と左右方向に対向する第2板状試料載置治具14bの試料収容凹部16とのそれぞれに収容される。これにより、試料収容凹部16に収容された板状試料Mは、面方向が左右方向と平行になるように配置されることとなる。また、複数の板状試料Mは、それぞれの板状試料Mの左右方向における両端部が左右方向において同じ位置となるように、前後方向に配列される。より詳細には、図2に示すように、複数の板状試料Mのほぼ下側半分のうち、右端部近傍が第1板状試料載置治具14aの試料収容凹部16に収容され、左端部近傍が第2板状試料載置治具14bの試料収容凹部16に収容される。 Next, a procedure for placing the plate-shaped sample M on the plate-shaped sample placement jig set 14 attached to the shelf board 11 will be described below. First, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are arranged to face each other along the left-right direction. At this time, the horizontal distance between the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b is slightly smaller than the width of the plate-shaped sample M in the horizontal direction. be. Next, the plate-shaped sample M is passed through the through-hole 40 defined by the linear portions 11a and 11b, while expanding the elastic portion 17 of the sample-receiving recess 16 outward (toward the inner surface of the sample-receiving recess 16). , is stored in the sample storage recess 16 . At this time, one plate-shaped sample M is placed between the sample holding recess 16 of the first plate-shaped sample mounting jig 14a and the second plate-shaped sample holding jig 14b facing the sample holding recess 16 in the left-right direction. It is housed in each of the sample housing recesses 16 . As a result, the plate-shaped sample M accommodated in the sample accommodation recess 16 is arranged so that the surface direction is parallel to the left-right direction. Further, the plurality of plate-shaped samples M are arranged in the front-rear direction so that both ends of each plate-shaped sample M in the left-right direction are at the same positions in the left-right direction. More specifically, as shown in FIG. 2, of the substantially lower halves of the plurality of plate-shaped samples M, the vicinity of the right end portion is accommodated in the sample accommodation recess 16 of the first plate-shaped sample placement jig 14a, and the left end is accommodated. The vicinity of the portion is accommodated in the sample accommodation concave portion 16 of the second plate-like sample placement jig 14b.

(効果)
本実施形態の板状試料載置治具14a及び14bは、複数の線状部分11a及び11bを有する棚板11に取り付けられる板状試料載置治具14a及び14bであって、下方に向かって開口しており、下方に向かって板状試料載置治具14a及び14bを棚板11に近づけたときに互いに平行な2つの線状部分11aを収容可能な、延在方向が共通した5つの取付溝部15と、5つの取付溝部15の間に形成され且つ上方に向かって開口しており、板状試料Mの少なくとも一部を収容可能な4つの試料収容凹部16と、を備える。つまり、隣接する2つの取付溝部15の間に、それぞれ1つの試料収容凹部16が設けられている。本実施形態によれば、棚板11が有する互いに平行な2つの線状部分11aが2つの取付溝部15に収容されることによって、板状試料載置治具14a及び14bが固定される。したがって、環境試験装置1の内部空間10aに容易に板状試料載置治具14aを取り付けることができ、さらに、板状試料載置治具14aに載置する板状試料Mの安定性を確保することができる。
(effect)
The plate-shaped sample mounting jigs 14a and 14b of this embodiment are plate-shaped sample mounting jigs 14a and 14b attached to a shelf board 11 having a plurality of linear portions 11a and 11b. Five openings having a common extending direction can accommodate two linear portions 11a parallel to each other when the plate-shaped sample mounting jigs 14a and 14b are brought closer to the shelf plate 11 downward. It is provided with mounting grooves 15 and four sample housing recesses 16 which are formed between the five mounting grooves 15 and which are open upward and which are capable of housing at least a portion of the plate-shaped sample M. That is, one sample housing recess 16 is provided between two adjacent mounting grooves 15 . According to the present embodiment, the plate-like sample mounting jigs 14a and 14b are fixed by accommodating the two parallel linear portions 11a of the shelf board 11 in the two mounting grooves 15. As shown in FIG. Therefore, the plate-shaped sample mounting jig 14a can be easily attached to the internal space 10a of the environmental test apparatus 1, and the stability of the plate-shaped sample M mounted on the plate-shaped sample mounting jig 14a can be ensured. can do.

また、本実施形態の板状試料載置治具14a及び14bにおいて、試料収容凹部16の内面の一部には、内側に向かって突出する弾性部17が設けられており、弾性部17は、試料収容凹部16に収容された板状試料Mに圧力を付与する。例えば、板状試料Mがプリント基板などであって、表面に電子部品が実装されている場合、実装された電子部品と試料収容凹部16との接触は避けることが好ましい。本実施形態によれば、板状試料Mの電子部品が実装されている側の表面と試料収容凹部16との間の距離を確保することができ、実装された電子部品と試料収容凹部16とが接触しにくくなる。また、試料収容凹部16に設置した板状試料Mをより確実に固定することができる。 In addition, in the plate-shaped sample mounting jigs 14a and 14b of the present embodiment, an elastic portion 17 protruding inward is provided on a part of the inner surface of the sample holding recess 16, and the elastic portion 17 Pressure is applied to the plate-like sample M housed in the sample housing recess 16 . For example, if the plate-shaped sample M is a printed circuit board or the like and electronic components are mounted on the surface thereof, it is preferable to avoid contact between the mounted electronic components and the sample housing recess 16 . According to the present embodiment, the distance between the surface of the plate-shaped sample M on which the electronic component is mounted and the sample housing recess 16 can be secured, and the mounted electronic component and the sample housing recess 16 can be separated from each other. becomes less accessible. In addition, the plate-like sample M placed in the sample housing recess 16 can be fixed more reliably.

また、本実施形態の板状試料載置治具14a及び14bにおいて、取付溝部15と試料収容凹部16とが一体形成されている。本実施形態によれば、取付溝部15と試料収容凹部16とが別体である場合と比べて、板状試料載置治具14a及び14bの棚板11への取り付けが容易となる。また、1つの金型から板状試料載置治具14a及び14bを製造することができるため、製造が容易となる。 Further, in the plate-like sample mounting jigs 14a and 14b of the present embodiment, the mounting groove portion 15 and the sample accommodating concave portion 16 are integrally formed. According to this embodiment, it becomes easier to attach the plate-like sample mounting jigs 14a and 14b to the shelf board 11, compared to the case where the attachment groove portion 15 and the sample accommodation recess portion 16 are separate members. Moreover, since the plate-like sample mounting jigs 14a and 14b can be manufactured from one mold, manufacturing is facilitated.

また、本実施形態の板状試料載置治具14a及び14bは、複数の線状部分11aと11bとが貫通孔40を画定している棚板11に取り付けられたときに、試料収容凹部16の下端が、棚板11の下端よりも下側に位置する。本実施形態によれば、試料収容凹部16によって、上下方向の広い範囲にわたって、板状試料Mを支持することができるため、板状試料Mを安定して設置することができる。 In addition, when the plate-shaped sample mounting jigs 14a and 14b of the present embodiment are attached to the shelf plate 11 in which the plurality of linear portions 11a and 11b define the through-holes 40, the sample storage recesses 16 is positioned below the lower end of the shelf board 11 . According to the present embodiment, the plate-shaped sample M can be stably placed because the plate-shaped sample M can be supported over a wide range in the vertical direction by the sample accommodation recess 16 .

また、本実施形態の板状試料載置治具セット14は、第1板状試料載置治具14aと第2板状試料載置治具14bとを有する。本実施形態によれば、第1板状試料載置治具14aと第2板状試料載置治具14bとを対向配置させることで、1つの板状試料Mを第1板状試料載置治具14aと第2板状試料載置治具14bとの両方の試料収容凹部16に収容させることができる。これにより、板状試料Mをより安定して設置することができる。また、板状試料Mの幅に応じて、第1板状試料載置治具14aと第2板状試料載置治具14bとの間隔を調整することで、様々な大きさの板状試料Mを設置することができる。 Further, the plate-shaped sample mounting jig set 14 of this embodiment has a first plate-shaped sample mounting jig 14a and a second plate-shaped sample mounting jig 14b. According to the present embodiment, by arranging the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b so as to face each other, one plate-shaped sample M is placed on the first plate-shaped sample mounting jig 14a. It can be accommodated in the sample accommodation recesses 16 of both the jig 14a and the second plate-like sample placement jig 14b. Thereby, the plate-shaped sample M can be placed more stably. Further, by adjusting the interval between the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b according to the width of the plate-shaped sample M, plate-shaped samples of various sizes can be obtained. M can be set.

以上、本発明の好適な実施の形態について説明したが、本発明は、これらの例に限られるものではなく、特許請求の範囲に記載した限りにおいて様々な変更が可能である。以下に、前記実施形態に変更を加えた変形例について説明する。但し、前記実施形態と同様の構成を有するものについては、同じ符号を付して適宜その説明を省略する。 Although the preferred embodiments of the present invention have been described above, the present invention is not limited to these examples, and various modifications are possible within the scope of the claims. Modifications obtained by modifying the above embodiment will be described below. However, components having the same configurations as those of the above-described embodiment are denoted by the same reference numerals, and description thereof will be omitted as appropriate.

(第1変形例)
以下、第1変形例について説明する。第1変形例に係る板状試料載置治具セットは、図4に示すように、第1板状試料載置治具50aと第2板状試料載置治具50bとから構成されている。第1板状試料載置治具50a及び第2板状試料載置治具50bの試料収容凹部51は、前後方向前側の面を形成する前面部51aと、前後方向後側の面を形成する後面部51bとに分割されており、前面部51aと後面部51bとは蝶番52によって接続されている。取付溝部15と試料収容凹部51とは、ある程度柔軟性のある部材からなる。これにより、蝶番52を中心に、前面部51aと後面部51bとの間の角度は可変となる。そして、試料収容凹部51の上下方向の深さ、及び、隣接する試料収容凹部51の前後方向のピッチを変更することが可能である(図4(a)及び図4(b)を参照)。さらに別の変形例として、取付溝部15と試料収容凹部51とが、蝶番で接続されていてもよい。
(First modification)
A first modified example will be described below. As shown in FIG. 4, the plate-shaped sample mounting jig set according to the first modified example is composed of a first plate-shaped sample mounting jig 50a and a second plate-shaped sample mounting jig 50b. . The sample housing recesses 51 of the first plate-shaped sample mounting jig 50a and the second plate-shaped sample mounting jig 50b form a front surface portion 51a forming a front surface in the front-rear direction and a rear surface in the front-rear direction. It is divided into a rear surface portion 51b, and the front surface portion 51a and the rear surface portion 51b are connected by a hinge 52. The mounting groove portion 15 and the sample housing recess portion 51 are made of a member having flexibility to some extent. As a result, the angle between the front surface portion 51a and the rear surface portion 51b is variable with the hinge 52 as the center. Then, it is possible to change the vertical depth of the sample storage recesses 51 and the longitudinal pitch of the adjacent sample storage recesses 51 (see FIGS. 4A and 4B). As yet another modified example, the attachment groove portion 15 and the sample accommodation recess portion 51 may be connected by a hinge.

第1変形例に係る第1板状試料載置治具50a及び第2板状試料載置治具50bでは、例えば、辺の長さが大きい板状試料M’を試料収容凹部51に収容させる場合、図4(a)に示すように、蝶番52を中心に前面部51aと後面部51bとの間の角度を小さくする。そして、取付溝部15を、それぞれ隣り合う線状部分11aに取り付ける。すると、試料収容凹部51の上下方向の深さは大きくなる。これにより、深さの大きい試料収容凹部51に板状試料M’を収容することができるため、板状試料M’の安定性が向上する。一方で、厚みが大きく、表面に大型部品mが実装された板状試料M’’を試料収容凹部51に収容させる場合、図4(b)に示すように、蝶番52を中心に前面部51aと後面部51bとの間の角度を大きくする。そして、取付溝部15を、1つ置きに線状部分11aに取り付ける。すると、試料収容凹部51の前後方向のピッチが大きくなる。これにより、板状試料M’’と前面部51aとの間の距離を大きくすることができ、板状試料M’’の表面に実装された大型部品mと試料収容凹部51の内面(前面部51a)とが接触することを回避できる。 In the first plate-shaped sample mounting jig 50a and the second plate-shaped sample mounting jig 50b according to the first modified example, for example, the plate-shaped sample M′ having a long side is accommodated in the sample accommodating concave portion 51. In this case, as shown in FIG. 4(a), the angle between the front surface portion 51a and the rear surface portion 51b is made smaller with the hinge 52 as the center. Then, the attachment grooves 15 are attached to the adjacent linear portions 11a. As a result, the vertical depth of the sample housing recess 51 increases. As a result, the plate-shaped sample M' can be accommodated in the deep sample-accommodating concave portion 51, so that the stability of the plate-shaped sample M' is improved. On the other hand, when a plate-shaped sample M'' having a large thickness and having a large-sized component m mounted on its surface is accommodated in the sample accommodation recess 51, as shown in FIG. and the rear surface portion 51b. Then, every other mounting groove portion 15 is mounted on the linear portion 11a. As a result, the pitch in the front-rear direction of the sample housing recesses 51 increases. As a result, the distance between the plate-shaped sample M'' and the front surface portion 51a can be increased, and the large-sized component m mounted on the surface of the plate-shaped sample M'' and the inner surface of the sample housing recess 51 (the front surface portion) can be separated from each other. 51a) can be avoided.

(第2変形例)
次に、第2変形例について説明する。上記実施形態では、第1板状試料載置治具14a及び第2板状試料載置治具14bは、それぞれ1枚の帯状ステンレス部材の曲げ加工によって形成されている。しかしながら、本変形例では、図5に示すように、第1板状試料載置治具60a及び第2板状試料載置治具60bは、それぞれ1つの板状の部材からなる。板状の第1板状試料載置治具60a及び第2板状試料載置治具60bには、それぞれ、下方に向かって開口する5つの取付溝部65と、上方に向かって開口するスリット(本発明の試料収容凹部)66が形成されている。
(Second modification)
Next, a second modified example will be described. In the above-described embodiment, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are each formed by bending a strip-shaped stainless steel member. However, in this modified example, as shown in FIG. 5, each of the first plate-shaped sample mounting jig 60a and the second plate-shaped sample mounting jig 60b is composed of one plate-shaped member. The plate-shaped first plate-shaped sample mounting jig 60a and the second plate-shaped sample mounting jig 60b are each provided with five downwardly opening mounting grooves 65 and upwardly opening slits ( A sample accommodating recess 66 of the present invention is formed.

取付溝部65は、上方から下方に向かって棚板11に近づけたときに線状部分11aを収容可能である。取付溝部65の形状は、上記実施形態と同様、左右方向から見たとき円弧形状となっており、その内径は、線状部分11aの直径とほぼ同じである。スリット66は、板状試料Mを載置する部分である。スリット66の前後方向の幅は、板状試料Mの厚さとほぼ同じであり、スリット66に挟まれるようにして板状試料Mは保持される。また、スリット66は、板状の第1板状試料載置治具60a及び第2板状試料載置治具60bが棚板11に取り付けられたときに、取付溝部65よりも上側に位置する。さらに、隣接する2つの取付溝部65の間には、取付溝部65の端部から下方に延びた延在部67が形成されている。延在部67によって、取付溝部65が線状部分11aから外れにくくなっている。また、延在部67の自重によって、棚板11に取り付けられた第1板状試料載置治具60a及び第2板状試料載置治具60bの安定性が向上する。 The mounting groove portion 65 can accommodate the linear portion 11a when approaching the shelf plate 11 from above downward. The shape of the mounting groove portion 65 is, as in the above-described embodiment, an arc shape when viewed from the left and right direction, and the inner diameter thereof is substantially the same as the diameter of the linear portion 11a. The slit 66 is a portion where the plate-shaped sample M is placed. The width of the slit 66 in the front-rear direction is substantially the same as the thickness of the plate-like sample M, and the plate-like sample M is held so as to be sandwiched between the slits 66 . Further, the slit 66 is positioned above the mounting groove 65 when the first plate-shaped sample mounting jig 60a and the second plate-shaped sample mounting jig 60b are mounted on the shelf board 11. . Further, an extending portion 67 extending downward from the end portion of the mounting groove portion 65 is formed between two adjacent mounting groove portions 65 . The extension portion 67 prevents the mounting groove portion 65 from coming off the linear portion 11a. Further, the weight of the extension portion 67 improves the stability of the first plate-shaped sample mounting jig 60a and the second plate-shaped sample mounting jig 60b attached to the shelf board 11 .

(その他の変形例)
上記実施形態では、環境形成装置は環境試験装置1である。しかしながら、環境形成装置は、内部空間に配置された試料に熱処理を施すための熱処理装置でもよい。
(Other modifications)
In the above embodiment, the environment forming device is the environmental testing device 1 . However, the environment forming device may be a heat treatment device for heat-treating a sample placed in the internal space.

上記実施形態では、棚板11の線状部分11a及び11bによって、貫通孔40が画定されている。しかしながら、棚板11は、貫通孔40を有していなくてもよい。この場合、例えば、線状部分11a及び線状部分11bは、平板である棚板11から上方に突出したものである。そして、取付溝部15が、上方に突出した線状部分11a又は線状部分11bを収容する。 In the above embodiment, the linear portions 11 a and 11 b of the shelf plate 11 define the through holes 40 . However, the shelf board 11 may not have the through holes 40 . In this case, for example, the linear portions 11a and 11b protrude upward from the shelf plate 11, which is a flat plate. The mounting groove portion 15 accommodates the linear portion 11a or the linear portion 11b projecting upward.

上記実施形態では、試料収容凹部16は、上方に向かって開口したV字形状である。しかしながら、例えば、コの字状でもよく、円弧形状でもよく、その他の凹形状でもよい。 In the above-described embodiment, the sample storage recess 16 is V-shaped and opens upward. However, for example, it may be U-shaped, arc-shaped, or any other concave shape.

上記実施形態では、試料収容凹部16の内面の一部には、前後方向前側の内面から内側に向かって突出する弾性部17と、前後方向後側の内面から内側に向かって突出する弾性部17とが設けられている。しかしながら、試料収容凹部16の前後方向前側の内面と前後方向後側の内面とのうち、いずれか一方のみから内側に突出する弾性部17が設けられていてもよい。この場合、試料収容凹部16に収容される板状試料Mは、試料収容凹部16の前後方向の一方の面から内側に突出する弾性部17と、試料収容凹部16の前後方向の他方の面とによって、挟持されるようにして保持される。また、弾性部17は設けられていなくてもよい。この場合、板状試料Mの電子部品が実装されていない表面が第1板状試料載置治具14a及び第2板状試料載置治具14bの試料収容凹部16に支持されるように、板状試料Mを載置する。 In the above-described embodiment, a part of the inner surface of the sample housing recess 16 includes an elastic portion 17 protruding inward from the inner surface on the front side in the front-rear direction and an elastic portion 17 protruding inward from the inner surface on the rear side in the front-rear direction. and are provided. However, the elastic portion 17 that protrudes inward from only one of the inner surface on the front side in the front-rear direction and the inner surface on the rear side in the front-rear direction of the sample housing recess 16 may be provided. In this case, the plate-shaped sample M accommodated in the sample accommodation recess 16 is composed of an elastic portion 17 protruding inward from one surface of the sample accommodation recess 16 in the front-rear direction and the other surface of the sample accommodation recess 16 in the front-rear direction. is held in a sandwiched manner. Also, the elastic portion 17 may not be provided. In this case, the surface of the plate-shaped sample M on which electronic components are not mounted is supported by the sample accommodating concave portions 16 of the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b. A plate-shaped sample M is placed.

上記実施形態では、板状試料載置治具セット14は、第1板状試料載置治具14aと第2板状試料載置治具14bとを有している。しかしながら、板状試料載置治具セット14は、3つ以上の板状試料載置治具を有していてもよい。また、板状試料載置治具セットではなく、単一の板状試料載置治具でもよい。この場合、例えば、板状試料載置治具の左右方向の幅を広くして、板状試料Mの1/5から1/2程度の幅とすることが好ましい。これにより、単一の板状試料載置治具によって保持される板状試料Mの安定性を担保することができる。また、この場合、板状試料載置治具の試料収容凹部16は、穴開け加工されていることが好ましい。これにより、試験室10a1の上方から下方へと送られる空気が、試料収容凹部16によって阻害されることを抑制し、環境試験への影響を小さくすることができる。 In the above embodiment, the plate-shaped sample mounting jig set 14 has the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b. However, the plate-shaped sample mounting jig set 14 may have three or more plate-shaped sample mounting jigs. A single plate-shaped sample mounting jig may be used instead of the plate-shaped sample mounting jig set. In this case, for example, it is preferable to widen the width of the plate-shaped sample mounting jig in the left-right direction to about 1/5 to 1/2 of the width of the plate-shaped sample M. As a result, the stability of the plate-like sample M held by the single plate-like sample mounting jig can be ensured. Further, in this case, it is preferable that the sample accommodating concave portion 16 of the plate-like sample mounting jig is perforated. As a result, it is possible to suppress the obstruction of the air sent from the upper side to the lower side of the test chamber 10a1 by the sample storage recess 16, thereby reducing the influence on the environmental test.

上記実施形態では、取付溝部15と試料収容凹部16とが一体形成されている。しかしながら、取付溝部15と試料収容凹部16とが別体であってもよい。また、上記実施形態では、取付溝部15と試料収容凹部16とが前後方向において、交互に並んで配置されている。しかしながら、2つの取付溝部15の間に複数の試料収容凹部16が配置されていてもよい。 In the above-described embodiment, the mounting groove portion 15 and the sample housing recess portion 16 are integrally formed. However, the attachment groove portion 15 and the sample accommodation recess portion 16 may be separate bodies. In the above-described embodiment, the mounting grooves 15 and the sample housing recesses 16 are alternately arranged in the front-rear direction. However, a plurality of sample housing recesses 16 may be arranged between two mounting grooves 15 .

上記実施形態では、取付溝部15は、線状部分11aに取り付けられている。しかしながら、取付溝部15は、線状部分11bに取り付けられてもよい。この場合、取付溝部15は、前後方向から見たときに円弧形状となっており、その内径は、線状部分11bの直径とほぼ同じである。また、複数の取付溝部15は、左右方向に沿って配列される。 In the above-described embodiment, the attachment groove portion 15 is attached to the linear portion 11a. However, the attachment groove portion 15 may be attached to the linear portion 11b. In this case, the mounting groove portion 15 has an arc shape when viewed from the front-rear direction, and its inner diameter is substantially the same as the diameter of the linear portion 11b. Moreover, the plurality of mounting grooves 15 are arranged along the left-right direction.

上記実施形態では、第1板状試料載置治具14a及び第2板状試料載置治具14bは、ステンレス部材である。しかしながら、銅やアルミニウムなど、ステンレス以外の金属でもよい。また、金属表面に絶縁塗装が行われていてもよいし、行われていなくてもよい。さらに、第1板状試料載置治具14a及び第2板状試料載置治具14bは、ある程度剛性を有する樹脂製でもよく、その場合は、耐熱樹脂製であることが好ましい。金属表面に絶縁塗装が行われている場合、又は、樹脂製である場合、試験室10a1において、板状試料載置治具セット14に載置した板状試料Mの通電試験を行うことが可能となる。 In the above embodiment, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b are stainless members. However, metals other than stainless steel, such as copper and aluminum, may also be used. Insulating coating may or may not be applied to the metal surface. Further, the first plate-shaped sample mounting jig 14a and the second plate-shaped sample mounting jig 14b may be made of resin having a certain degree of rigidity, and in that case, they are preferably made of heat-resistant resin. If the metal surface is coated with insulation or if it is made of resin, it is possible to conduct an electrical test on the plate-shaped sample M placed on the plate-shaped sample placement jig set 14 in the test chamber 10a1. becomes.

板状試料載置治具セットは、一方向(例えば、前後方向)に配列された試料収容凹部16と、試料収容凹部16に収容された板状試料Mとを、一方向と直交する直交方向(例えば、左右方向)から挟むことで固定する挟持体をさらに有していてもよい。これにより、環境試験装置1の内部空間10aにおいて生じる空気の流れによる板状試料Mの揺れを抑制することができる。 The plate-shaped sample mounting jig set is arranged such that the sample-accommodating recesses 16 arranged in one direction (for example, the front-rear direction) and the plate-shaped samples M accommodated in the sample-accommodating recesses 16 are arranged in an orthogonal direction perpendicular to the one direction. It may further have a sandwiching body that is fixed by sandwiching from (for example, left and right direction). As a result, the vibration of the plate-like sample M caused by the air flow generated in the internal space 10a of the environmental test apparatus 1 can be suppressed.

また、板状試料載置治具セットは、複数の試料収容凹部16に収容された複数の板状試料Mの上方に配置され、それぞれの板状試料Mの外縁の少なくとも一部に接することで板状試料Mの揺れを抑制するための試料上方固定部をさらに有していてもよい。試料上方固定部は、例えば、複数の試料収容凹部16に収容された複数の板状試料Mの外縁に沿った形状である。これにより、板状試料Mをより安定して設置することができる。 Further, the plate-shaped sample mounting jig set is arranged above the plurality of plate-shaped samples M accommodated in the plurality of sample accommodation recesses 16, and is in contact with at least a part of the outer edge of each plate-shaped sample M. A sample upper fixing portion for suppressing shaking of the plate-shaped sample M may be further provided. The sample upper fixing portion has a shape along the outer edges of the plurality of plate-shaped samples M housed in the plurality of sample housing recesses 16, for example. Thereby, the plate-shaped sample M can be placed more stably.

1 環境試験装置
10 試験槽
11 棚板
11a 線状部分
11b 線状部分
14 板状試料載置治具セット
14a 第1板状試料載置治具
14b 第2板状試料載置治具
15 取付溝部
16 試料収容凹部
17 弾性部
40 貫通孔
50a 第1板状試料載置治具
50b 第2板状試料載置治具
51 試料収容凹部
60a 第1板状試料載置治具
60b 第2板状試料載置治具
65 取付溝部
66 スリット
M 板状試料
1 environmental test apparatus 10 test tank 11 shelf plate 11a linear portion 11b linear portion 14 plate-shaped sample mounting jig set 14a first plate-shaped sample mounting jig 14b second plate-shaped sample mounting jig 15 attachment groove 16 Sample storage recess 17 Elastic portion 40 Through hole 50a First plate-shaped sample placement jig 50b Second plate-shaped sample placement jig 51 Sample storage recess 60a First plate-shaped sample placement jig 60b Second plate-shaped sample Mounting jig 65 Mounting groove 66 Slit M Plate-shaped sample

Claims (7)

試料を載置するために環境形成装置の内部空間に配置される試料載置部材に取り付けられる板状試料載置治具であって、
前記試料載置部材は、複数の線状部分を有しており、
一方向に向かって開口し、延在方向が共通し、前記延在方向と直交する直交方向の異なる位置にそれぞれ設けられた少なくとも2つの取付溝部と、
前記少なくとも2つの取付溝部の間に形成され且つ前記一方向とは反対方向に向かって開口しており、板状試料の少なくとも一部を収容可能な少なくとも1つの試料収容凹部と、を備え
前記少なくとも2つの取付溝部は、前記一方向に向かって前記板状試料載置治具を前記試料載置部材に近づけたときに、前記直交方向の異なる位置に設けられ互いに平行な少なくとも2つの前記線状部分を収容することで前記線状部分に取り付け可能に構成された板状試料載置治具。
A plate-shaped sample mounting jig attached to a sample mounting member arranged in an internal space of an environment forming apparatus for mounting a sample,
The sample placement member has a plurality of linear portions,
at least two mounting grooves that are open in one direction , extend in a common direction, and are provided at different positions in an orthogonal direction orthogonal to the extending direction ;
at least one sample containing recess formed between the at least two mounting grooves, opening in a direction opposite to the one direction, and capable of containing at least a portion of a plate-shaped sample ;
The at least two mounting grooves are provided at different positions in the orthogonal direction and parallel to each other when the plate-shaped sample mounting jig is brought closer to the sample mounting member in the one direction. A plate-shaped sample mounting jig configured to be attachable to the linear portion by accommodating the linear portion .
3つ以上の前記取付溝部及び2つ以上の前記試料収容凹部を有し、
隣接する2つの前記取付溝部の間には、それぞれ1つの前記試料収容凹部が設けられていることを特徴とする請求項1に記載の板状試料載置治具。
Having three or more of the mounting grooves and two or more of the sample housing recesses,
2. The plate-shaped sample mounting jig according to claim 1, wherein one sample accommodating concave portion is provided between two adjacent mounting groove portions.
試料を載置するために環境形成装置の内部空間に配置される試料載置部材に取り付けられる板状試料載置治具であって、
前記試料載置部材は、複数の線状部分を有しており、
一方向に向かって開口しており、前記一方向に向かって前記板状試料載置治具を前記試料載置部材に近づけたときに互いに平行な2つの前記線状部分を収容可能な、延在方向が共通した少なくとも3つの取付溝部と、
隣接する前記取付溝部の間にそれぞれ1つ形成され、且つ前記一方向とは反対方向に向かって開口しており、板状試料の少なくとも一部を収容可能な少なくとも2つの試料収容凹部と、を備えた板状試料載置治具
A plate-shaped sample mounting jig attached to a sample mounting member arranged in an internal space of an environment forming apparatus for mounting a sample,
The sample placement member has a plurality of linear portions,
An extension that is open in one direction and can accommodate the two linear portions that are parallel to each other when the plate-shaped sample mounting jig is brought closer to the sample mounting member in the one direction. at least three mounting grooves having a common orientation;
at least two sample-accommodating recesses each formed between adjacent mounting grooves, opening in a direction opposite to the one direction, and capable of accommodating at least a portion of a plate-shaped sample; plate-shaped sample mounting jig .
前記試料収容凹部の内面の一部には、内側に向かって突出する弾性部が設けられており、
前記弾性部は、前記試料収容凹部に収容された前記板状試料に圧力を付与することを特徴とする請求項1~3のいずれか1項に記載の板状試料載置治具。
A part of the inner surface of the sample containing recess is provided with an elastic portion protruding inward,
The plate-shaped sample mounting jig according to any one of claims 1 to 3, wherein the elastic portion applies pressure to the plate-shaped sample accommodated in the sample accommodation recess.
前記取付溝部と前記試料収容凹部とが一体形成されていることを特徴とする請求項1~4のいずれか1項に記載の板状試料載置治具。 5. The plate-shaped sample mounting jig according to claim 1, wherein said mounting groove and said sample holding recess are integrally formed. 前記複数の線状部分が、少なくとも1つの貫通孔を画定しており、
前記試料載置部材に取り付けられたときに、前記試料収容凹部の下端が、前記試料載置部材の下端よりも下側に位置することを特徴とする請求項1~5のいずれか1項に記載の板状試料載置治具。
The plurality of linear portions define at least one through hole,
6. The method according to any one of claims 1 to 5, wherein a lower end of said sample holding recess is positioned below a lower end of said sample placing member when attached to said sample placing member. A plate-shaped sample mounting jig as described.
請求項1~6のいずれか1項に記載の板状試料載置治具である第1板状試料載置治具と、
請求項1~6のいずれか1項に記載の板状試料載置治具である第2板状試料載置治具と、を有する板状試料載置治具セット。
a first plate-shaped sample mounting jig, which is the plate-shaped sample mounting jig according to any one of claims 1 to 6 ;
A plate-shaped sample mounting jig set comprising a second plate-shaped sample mounting jig which is the plate-shaped sample mounting jig according to any one of claims 1 to 6 .
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329819A (en) 1999-05-17 2000-11-30 Advantest Corp Test device and test method of electronic part substrate
JP2001050888A (en) 1999-08-05 2001-02-23 Sumitomo Wiring Syst Ltd Environmental testing apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8612805D0 (en) * 1986-05-27 1986-07-02 Kineticon Ltd Cassette loading heat cycling oven

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329819A (en) 1999-05-17 2000-11-30 Advantest Corp Test device and test method of electronic part substrate
JP2001050888A (en) 1999-08-05 2001-02-23 Sumitomo Wiring Syst Ltd Environmental testing apparatus

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