WO2018195795A1

WO2018195795A1 - Test method, test server, and system

Info

Publication number: WO2018195795A1
Application number: PCT/CN2017/081974
Authority: WO
Inventors: 陈燚; 唐小龙
Original assignee: 深圳市汇顶科技股份有限公司
Priority date: 2017-04-26
Filing date: 2017-04-26
Publication date: 2018-11-01
Also published as: CN107223257A; CN107223257B

Abstract

The embodiments of the present invention provide a test method, a test server, and a system. By first determining whether the current test failure event matches a pre-stored historical test failure event, and when there is a matching pre-stored historical test failure event, using the solution used previously for solving the historical test failure event to retest the current test item, the invention can greatly reduce or avoid the need for manual analysis, thereby realizing the purpose of improving testing efficiency. Further, when it is determined that no historical test failure event matches the current test failure event, the invention can also acquire a manual analysis solution to ensure a test pass rate.

Description

Test method, test server and system

Technical field

The invention belongs to the technical field of testing, and in particular relates to a testing method, a testing server and a system.

Background technique

Electronic products, such as fingerprint devices, require mass production testing of functional indicators before mass production, screening products through testing, and strictly ensuring product quality to ensure market mass production requirements.

At present, the mass production test usually adopts the following steps to perform the test: the production line platform performs the relevant test item test after the test tool is included, and after all the test items are passed, the function test can be considered as passed.

However, in the existing mass production test process, once any test item has a problem in the functional test, the test tool will withdraw from the test, temporarily treat it as a defective product, wait for the technical analysis of the technician and conduct a test technical solution. Modifications, however, that the analysis and modification of the technical solution depend on the progress of the manual analysis, which in turn leads to problems of inefficient testing.

Summary of the invention

An object of the present invention is to provide a test method, a test server, and a system for solving the above technical problems in the prior art.

A first aspect of the embodiments of the present invention provides a test method, including: matching a current test failure event generated when a current test item fails to test according to a current test plan, and a pre-stored historical test failure event;

When there is a historical test failure event that matches the current test failure event, a solution corresponding to the historical test failure event is determined to retest the current test item according to the solution.

Optionally, the current test loss generated when the test item fails to test according to the current test scheme The match event is matched with the pre-stored historical test failure event, including: matching the current test log information corresponding to the current test failure event with the historical test log information corresponding to the historical test failure event stored in advance.

Optionally, the current test log information includes current test input data and current test output data of performing a current test scenario on the current test item, where the historical test log information includes performing a historical test plan on the historical test item. Historical test input data and historical test output data;

The current test log information corresponding to the current test failure event is matched with the historical test log information corresponding to the historical test failure event stored in advance, including:

The current test input data according to the current test failure event and the current test output data are respectively matched with the pre-stored historical test input data and the historical test output data.

Optionally, the method further includes: analyzing the current test log information according to the set data communication protocol to extract key feature data therefrom;

The matching between the current test input data of the current test failure event and the current test output data and the pre-stored historical test input data and the historical test output data respectively includes:

The current test key process data according to the current test failure event is matched with the historical test key process data of the pre-stored historical test failure event.

Optionally, analyzing the current log information according to the set data communication protocol to extract key feature data from the method includes:

Decoding and extracting the current log information according to the set data communication protocol to obtain a mark part and a data part therein; wherein the mark part is used to identify different current test items, and the data part is used It records current test input data, current test output data, and current test key process data.

Optionally, the determining, by the solution to the historical test failure event, to retest the current test item according to the solution includes:

Determining a solution to the historical test failure event according to a correspondence between the pre-stored historical test failure event and the adapted solution to re-test the current test item according to the solution.

Optionally, the method according to the pre-stored historical test failure event is matched with the solution The corresponding relationship of the case, the solution to determine the failure of the historical test failure includes:

Determining, by the pre-stored historical test failure event and the mapping information table of the solution, the solution to the historical test failure event, where the mapping information table is used to indicate the historical test failure event and the The corresponding relationship of the solution.

Optionally, the mapping information table maps one or more cases, the case being associated with an event type attribute and/or a data feature value of the historical test failure event and a corresponding solution.

Optionally, it also includes:

The current test test failure event is used as a new historical test failure event to update the correspondence between the historical test failure event and the adapted solution.

Optionally, it also includes:

When there is no historical test failure event matching the current test failure event, a solution to the current test failure event is obtained according to the manual analysis of the current test failure event to retest the test item.

Optionally, it also includes:

The current test failure event is flagged when there is no historical test failure event that matches the current test failure event.

Optionally, obtaining a solution to the current test failure event according to the manual analysis of the current test failure event to retest the test item includes:

Manual analysis of multiple current test failure events of the same type in multiple projects to obtain a solution to the current test failure event.

Optionally, it also includes:

Using the current test test failure event as a new historical test failure event, the solution to the current test failure event obtained by the manual analysis is used as a new solution to update the historical test failure event and the appropriate Correspondence of the solution.

Optionally, it also includes:

Obtaining a frequency of occurrence of the historical test failure event, determining, according to the frequency of occurrence, whether a manual analysis failure event needs to be manually analyzed, and when determining that a historical test failure event needs to be manually analyzed, the manual analysis is obtained. The solution to the historical test failure event should be used as a new solution to update the correspondence between the historical test failure event and the adapted solution.

A second aspect of the embodiments of the present invention provides a test server, including:

The matching module is configured to match the current test failure event generated when the current test item fails the test according to the current test plan with the pre-stored historical test failure event, and trigger when there is a historical test failure event that matches the current test failure event. Determining module

The determining module is configured to determine a solution corresponding to the historical test failure event, to retest the current test item according to the solution.

Optionally, the matching module is further configured to: match the current test log information corresponding to the current test failure event with the historical test log information corresponding to the historical test failure event stored in advance.

Optionally, the test server further includes: a storage module, configured to store a historical test failure event and a corresponding relationship of the solution;

Optionally, the determining module is further configured to: determine, according to a correspondence between the historical test failure event pre-stored in the storage module and the adapted solution, to determine a solution to the historical test failure event To retest the current test item according to the solution.

Optionally, the test server further includes: an update module, configured to use the current test test failure event as a new historical test failure event, to match a historical test failure event in the storage module. The correspondence of the solutions is updated.

Optionally, when there is no historical test failure event matching the current test failure event in the matching module, the acquiring module is triggered; the obtaining module is configured to obtain a response according to the manual analysis of the current test failure event. A solution to the current test failure event to retest the test item.

A third aspect of the embodiments of the present invention provides a test system, including: a test tool and a test server;

The testing tool is configured to retest the current test item according to the solution;

The test server is configured to match a current test failure event generated when the current test item fails the test according to the current test plan with a pre-stored historical test failure event, and a historical test failure event that matches the current test failure event exists. A solution corresponding to the historical test failure event is determined to cause the test tool to retest the current test item according to the solution.

Optionally, the testing system further includes: a technical support end, configured to obtain, according to a manual analysis of the current test failure event, when the test server does not have a historical test failure event that matches the current test failure event The solution to the current test failure event to retest the test item.

The test method, the test server and the system provided by the embodiment of the present invention first determine whether the current test failure event can be matched to the pre-stored historical test failure event, and when the match to the pre-stored historical test failure event, the previous period is used to solve the history. The solution used to test the failure event retests the current test item, which can greatly reduce or avoid manual analysis, thereby achieving the purpose of improving test efficiency. In addition, in determining that there is no historical test failure event that matches the current test failure event, a manual analysis solution can be obtained to further ensure the test pass rate.

DRAWINGS

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described below. Obviously, the drawings in the following description are only It is a certain embodiment of the present invention, and those skilled in the art can obtain other drawings according to the drawings without any inventive labor.

FIG. 1 is a flowchart of a testing method according to an embodiment of the present invention.

FIG. 2 is a flowchart of a testing method according to another embodiment of the present invention.

FIG. 3 is a flowchart of a testing method according to another embodiment of the present invention.

FIG. 4 is a flowchart of a testing method according to still another embodiment of the present invention.

FIG. 5 is a schematic structural diagram of a test server according to an embodiment of the present invention.

FIG. 6 is a schematic structural diagram of a test system according to an embodiment of the present invention.

FIG. 7 is a diagram showing a data structure of an exemplary data communication protocol according to an exemplary embodiment of the present invention.

detailed description

In order to make the object, the features and the advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention are clear and complete in the following with reference to the accompanying drawings in the embodiments of the present invention. It is apparent that the described embodiments are only a part of the embodiments of the invention, and not all of the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention.

The execution body of the test method provided by the following embodiments of the present invention may be the test server 1, and the test server 1 performs data interaction with the test tool 2 at the production line end, so that the test tool 2 of the production line end has the current occurrence of the current test failure event. The test item is retested. The test server 1 can also perform data interaction with the technical support terminal 3 to enable the test tool 2 on the production line to retest the current test item in which the current test failure event has occurred.

For example, the test plan implemented by the test tool 2 on the test object is stored in the test server 1. After the test plan 1 injects the test plan into the test tool 2, the test tool 2 performs test work on the test object. In addition, the technical support terminal 3 can upload a new test solution to the test server 1 to update the stored test plan, so as to meet the requirement that the test plan in actual production needs to be adjusted according to the production situation, thereby achieving better test results.

Specifically, the test process for performing a test item is: in the test system including the test server 1, the test tool 2 on the production line side verifies the performance or function of the test object by implementing a test plan on the test object (such as a fingerprint type device). Etc., wherein the test plan specifies the test standard of each test item. In the test process of a test item, if the test result does not meet the test standard in the test plan, the test item test fails, and otherwise, the test item test success. For example, the test solution is first injected into the test tool 2, and then the test object is tested one by one according to the test standard in the test plan. If the test is not tested, the test fails. Failure, at this time test tool 2 will suspend the test work until a new test plan is injected into test tool 2, and then test tool 2 retests the test object according to the new test plan.

When the test server 1 has a test plan that responds to the current test failure event, the test plan for the current test failure event is directly obtained from the test server 1. When the test server 1 does not have a test solution for the current test failure event and if the test is to continue, the test server 1 will package the current test failure event to the technical support terminal 3, and the technical support personnel of the technical support terminal 3 fail the current test. The event is manually analyzed and the corresponding solution is provided and returned to the test server 1. Then the test server 1 generates a new test plan according to the new solution and injects it into the test tool 2, and then the test tool 2 fails according to the new test plan. Test items are retested.

FIG. 1 is a flowchart of a testing method according to an embodiment of the present invention. As shown in Figure 1, this implementation The test methods provided in the examples include:

Step S101: The current test failure event generated when the current test item fails to test is matched with the pre-stored historical test failure event according to the current test plan.

In this embodiment, during the testing process of the mass production stage of the test object, a plurality of test objects may have diverse test failure events. In the case of diverse test failure events, some may be historical test failure events that have occurred. Others may be the first test failure event. To this end, in the present embodiment, the test failure event encountered during the test is stored by the test server 1 to form a historical test failure event, and if the same test failure event occurs again, if the historical test failure event can be matched. The test server 1 has a solution capable of handling the current test failure event, and the solution can be directly obtained from the test server 1, thereby achieving the purpose of improving test efficiency.

In a possible implementation manner, the test log information is used to record any one or more of the test input data, the test output data, and the test process data during the test. The specific implementation manner of the step S101 may be: matching the current test log information corresponding to the current test failure event with the historical test log information corresponding to the historical test failure event stored in advance to determine the test server 1 Is there a solution to the current test failure event? When the current test log information includes the test input data and the test output data, in a further possible implementation manner, the specific implementation manner of step S101 may be specifically: the current test input data according to the current test failure event and the current test output. The data is matched with the pre-stored historical test input data and the historical test output data, respectively.

Specifically, the current test log information includes current test input data and current test output data of the current test plan for the current test item, and the historical test log information includes historical test input data and historical test output data of the historical test item execution history test plan. . By comparing the current test input data and the current test output data in the current test log information with the historical test input data and the historical test output data in the historical test log information, it is determined whether there is a solution to the current test failure event on the test server 1. Program. For example, when performing data comparison, the following is: first, determining an event type attribute according to the data, and determining, by the event type attribute, a test item corresponding to the current test failure event, such as a fingerprint image acquisition time test item, a false alarm rate test item, and a rejection. A test failure event occurs in one of the test items such as the true test item, and then determines whether there is a solution to the current test failure event based on the data feature value. Multiple measurements on the production line The test object takes the fingerprint image acquisition time test item as an example. Although the test plan is the same, there is a possibility that the test failure event due to diversification may exist in the actual test process. For example, there are not enough time for fingerprint contact, or improper fingerprinting, or the number of times the fingerprint image is not collected is not enough to cause a test failure event. There may be many reasons for these test failure events, such as The test plan itself is unreasonable, the test object itself has problems, and so on. It should be noted that the event type attribute in this embodiment is a fingerprint image acquisition time test item, and the data feature value refers to the time of the fingerprint contact, the fingerprint pressing form, the number of times the fingerprint image is collected, and the like. Therefore, in this embodiment, whether the current test failure event and the historical test failure event match are determined by the current test input data and the historical test input data, and the current test failure event and the historical test failure event are also determined by the current test output data and the historical test output data. Whether it matches, improves the accuracy of matching the current test failure event with the historical test failure event.

In this embodiment, the matching of the test failure events of the fingerprinting device test items in the fingerprint device is specifically described as an example.

False Accept Rate (FAR), also known as false positive rate, refers to the probability of error in which different fingerprints are mistaken for the same fingerprint, and is defined as: FAR = number of fingerprints misjudged / investigated The total number of fingerprints × 100%.

The specific test scheme of the falsification rate is: firstly import the image of the part in the image library into the fingerprint type device, and then compare the remaining other images in the image library with the images of the pre-imported part in turn, if The number of comparisons is N times (equivalent to the total number of fingerprints examined), and the number of successful comparisons is M times (equivalent to the number of fingerprints that are wrongly judged), then FAR=M/N×100%. If the tested false rate meets the test standard of the current test plan, it indicates that the test of the false rate test is successful, otherwise the test fails.

Specifically, for the current test failure event of the falsification rate test item, the current test item log information records the name of the current test item, such as the falsification rate test item, all images of the image library, partial images, total comparison times, and ratio For the number of successes, FAR, test results (refer to test failure), etc., the test input data of the current test item is, for example, all images of the image library, part of the image, and the test output data of the current test item is, for example, FAR, test result (refer to The test fails. The test process data of the current test item is the total number of comparisons and the number of successful comparisons.

Correspondingly, for the historical test failure event of the falsification rate test item, the historical test item log information includes the name of the test item such as the falsification rate test item, all the images of the image library, part of the image, total number of comparisons, and comparison Number of successes, FAR, test results (referring to test failures), etc. The test input data of the history test item is, for example, all the images of the image library, part of the image, and the test output data of the historical test item is, for example, FAR, test result (refer to test failure), and the test process data of the historical test item is the total number of comparisons. Compare the number of successes.

Therefore, the test input data of the current test item, the output process data of the current test item, and the test input data of the historical test item are compared one by one, and further, the test process data of the current test item and the test process data of the historical test item are one. The comparison is performed to complete the above matching, thereby quickly and accurately determining whether there is a historical test failure event that matches the current test failure event.

It should be noted that the present embodiment is not limited to the matching of the test failure event of the false alarm rate test item, for example, the matching of the test failure event of the rejection rate test item may be included, and details are not described herein again.

Step S102: When there is a historical test failure event that matches the current test failure event, determine a solution corresponding to the historical test failure event, to retest the current test item according to the solution.

For example, after the current test failure event matches the historical test failure event, the current test failure event can be processed using the solution previously adopted to resolve the historical test failure event.

Specifically, the current test plan is updated according to the solution adopted in the previous period to solve the historical test failure event to form a new test plan, and the new test plan is injected into the test tool 2, and then the test tool 2 is based on the new test plan. The new solution retests the failed test items.

It should be noted that the stored historical test failure event and the corresponding solution may be stored on the test server 1. For this reason, the embodiment may further include: continuously obtaining a solution according to the obtained current test failure event. Update the solution implemented on the test object to improve the usability of the test plan.

The test method provided by the embodiment first determines whether the current test failure event can be matched to the pre-stored historical test failure event, and when it matches the pre-stored historical test failure event, the previous period is used to solve the historical test failure event. The solution retests the current test items, which greatly reduces or avoids manual analysis, which in turn can improve test efficiency.

FIG. 2 is a flowchart of a method for testing a method according to another embodiment of the present invention. as shown in picture 2, The test methods provided in this embodiment include:

Step S201: Analyze the current test log information according to the set data communication protocol to extract key feature data therefrom.

In a possible implementation manner, the specific implementation manner of step S201 is: splitting and extracting the current log information according to a set data communication protocol to obtain a mark portion and a data portion therein, wherein the mark The portion is used to identify different current test items, and the data portion is used to record current test input data, current test output data, and current test key process data.

For example, the data communication protocol for testing the log information can be set by itself, and different key feature data is obtained by identifying different parts in the test log information, where the key feature data includes test input data, test output data, and test process data. Any one or more of them.

FIG. 7 is a diagram showing a data structure of an exemplary data communication protocol according to an exemplary embodiment of the present invention. Referring to FIG. 7, when an item of the test object is tested, the information of the Header part is a basic part of the transmission, for example, the Header part is used as a mark part for identifying different current test items, and is marked in begin when starting the test. The test item is marked in the end when the test is completed, the test input data and/or the test output data are marked in the data part of the source, the test process data is marked in the info part of the source, and the source part is used as the data part of the test item. Therefore, by identifying the Header part of the test log information, it can be determined what type of test item the current test item is; by identifying the begin part of the test test log information, a test item start time node can be obtained; and the test test log information is obtained by the identification test. The end part can obtain a test item end time node; by identifying the data part, it can obtain test input data or test output data for a certain test item, by identifying the info part mark of a certain test item, You can get test process data for a test item.

Step S202: Perform matching on the current test key feature data of the current test failure event and the historical test key feature data of the pre-stored historical test failure event.

In this embodiment, the key feature data may include the test input data, the test output data, and the test process data. For the matching of the feature data, refer to the description in the foregoing embodiment, and details are not described herein again.

Step S203: When there is a historical test failure event that matches the current test failure event, determine according to the correspondence between the pre-stored historical test failure event and the adapted solution. A solution to the historical test failure event should be addressed to retest the current test item according to the solution.

For example, in this embodiment, when the historical test failure event matching the current test failure event is determined by the corresponding relationship between the historical test failure event and the corresponding solution, the query may be performed by using an index or the like. Correspondence, and then quickly retrieve new solutions.

In a possible implementation manner, the specific implementation manner of step S203 is: determining, according to the pre-stored historical test failure event and the mapping information table of the solution that is adapted, the solution to the historical test failure event. The mapping information table is used to indicate a correspondence between the historical test failure event and the solution. Specifically, the present embodiment simply and conveniently reflects the correspondence between the historical test failure event and the adapted solution by establishing a mapping information table.

Further, the mapping information table maps one or more cases, the case being associated with an event type attribute and/or a data feature value of the historical test failure event and a corresponding solution. For example, the test failure events of multiple fingerprint image acquisition time test items may be caused by insufficient fingerprint contact time, but the time of fingerprint contact of multiple test failure test items may be different. the same. The case in this embodiment correlates the event type attribute and/or the data feature value of the failed event with the corresponding solution, so that more historical test failure events can be stored in the mapping information table as much as possible, and the test can be performed according to the test. The event type attribute and/or data feature value in the failure event quickly determines the solution. On the basis of ensuring that the mapping information table has a large number of historical test failure events, the solution can be quickly determined, thereby improving the testing efficiency. Of course, the specific case of the case in this embodiment is set according to actual needs.

Step S204: The current test test failure event is used as a new historical test failure event to update the correspondence between the historical test failure event and the adapted solution.

Specifically, the current test failure event is used as a new historical test failure event to make the stored historical test failure event more and more, so as to improve the probability that the current test failure event and the historical test failure event are successfully matched. . More and more historical test events can also reflect the ability to provide a large number of solutions to different test failure events. When encountering test failure events in the future, they can quickly extract corresponding solutions from a large number of solutions, further reducing the number of solutions. The reliance on manual analysis saves a lot of human resources. In addition, by updating the correspondence between the historical test failure event and the adapted solution, it is equivalent to increasing the sample size and being able to enter Accurately extract the right solution from a massive solution in one step.

In the test method provided by this embodiment, the present embodiment can quickly and accurately determine whether to store a historical test failure event that matches the current test failure event by extracting the test key feature data in the test log information; Corresponding relationship of the solution, when it is determined that there is a historical test failure event that matches the current test failure event, the corresponding relationship may be queried by indexing, etc., thereby quickly retrieving the new solution, further implementing The purpose of improving the efficiency of the test; in addition, by using the current test test failure event as a new historical test failure event to make the stored historical test failure event more and more, to improve the current test failure event and the historical test failure event successfully matched The probability.

FIG. 3 is a flowchart of a method for testing a method according to another embodiment of the present invention. This embodiment is a further supplement to the test method provided in the foregoing embodiment. In this embodiment, for the foregoing embodiment of FIG. 1 and FIG. 2, the current test item failure event occurs, and the test server 1 does not have a corresponding solution. Solution, but need to continue testing the current test items. As shown in FIG. 3, the testing method provided in this embodiment includes:

Step S301: The current test failure event generated when the current test item fails to test according to the current test plan is matched with the pre-stored historical test failure event.

It should be noted that the implementation manner of step S301 in this embodiment is the same as the implementation manner of step S101 in the foregoing embodiment, and details are not described herein.

Step S302: When there is no historical test failure event matching the current test failure event, obtain a solution to the current test failure event according to the manual analysis of the current test failure event to retest the test item. .

Specifically, when the test server 1 does not have a historical test failure event that matches the current test failure event, the test server 1 packages the test log information corresponding to the current test failure event to the technical support terminal 3 through the set interface, and the technical support is provided. The technician of the end 3 manually analyzes the current test failure event and provides a corresponding solution to the test server 1 through the set interface, and then the test server 1 generates a new test plan according to the new solution and injects it into the test tool 2 Then, Test Tool 2 will retest the failed test items according to the new solution in the new test plan.

In this embodiment, it is determined that there is no historical test failure event that matches the current test failure event. It is also possible to obtain a solution for manual analysis to further ensure test pass rate and reliability.

In a possible implementation manner, the specific implementation manner of step S302 is: marking the current test failure event when there is no historical test failure event matching the current test failure event. It should be noted that, after performing step S302, it is possible to implement a solution for responding to the current test failure event according to the manual analysis of the current test failure event of the mark to retest the test item.

Specifically, by marking the current test failure event as an unresolved test failure event, the technician of the technical support terminal 3 can be intuitively notified that the technical analysis of the current test failure event needs to be provided, which can greatly shorten the solution obtained by the manual analysis. The timing of the program further improves the efficiency of the test.

In a further possible implementation manner, the specific implementation manner of step S302 is: performing manual analysis on multiple current test failure events of the same type in multiple projects to obtain a solution to the current test failure event.

For example, multiple production lines of different production addresses, that is, multiple items, are performing mass production tests on multiple test objects. If multiple current test failure events of the same type occur, multiple current tests of the same type are first tested. The failure event is marked as a certain type of test failure event, and the technical support terminal 3 determines that the plurality of current test failure events are the same type of test failure event according to the flag, so that the technical support terminal 3 can perform only one manual analysis to obtain the current response. Test the failure event solution without manual analysis of each of the same types of current test failure events, thereby increasing the speed of obtaining solutions to the current test failure events, while also saving labor costs. Of course, the items in this embodiment are not limited to the examples.

The test method provided in this embodiment can also obtain a solution of manual analysis in determining that there is no historical test failure event matching the current test failure event, so as to further ensure test pass rate and reliability. In addition, by marking the current test failure events, the time of the solution obtained by manual analysis can be greatly shortened, and the test efficiency can be further improved.

FIG. 4 is a flowchart of a method for testing a method according to still another embodiment of the present invention. As shown in FIG. 4, the testing method provided in this embodiment includes:

In step S401, the current test failure event generated when the current test item fails to test is matched with the pre-stored historical test failure event according to the current test plan.

Step S402: When there is no historical test failure event matching the current test failure event, obtain a solution to the current test failure event according to the manual analysis of the current test failure event to retest the test item. .

It should be noted that the implementation manners of step S401 and step S402 in this embodiment are the same as the implementation manners of step S301 and step S302 in the foregoing embodiment, and are not described herein.

Step S403: The current test failure event is used as a new historical test failure event, and the solution for the current test failure event obtained by the manual analysis is used as a new solution to update the historical test failure event. Correspondence with the adapted solution.

Specifically, regardless of whether there is a historical test failure event that matches the current test failure event, the embodiment also uses the current test test failure event as a new historical test failure event and stores it so that the stored history test failure event comes. The more you increase the probability that the current test failure event matches the historical test failure event.

On the one hand, the embodiment continuously updates the pre-stored historical test failure event, and on the other hand, continuously updates the correspondence between the historical test failure event and the adapted solution, such as a mapping table, to improve the solution for acquiring the current test failure event. The probability.

In this embodiment, the solution of the historical test failure event may be optimized or a new solution may be provided in step S403, and the corresponding relationship between the historical test failure event and the adapted solution may be further updated; The method may include: obtaining an occurrence frequency of the historical test failure event; determining, according to the frequency of occurrence, whether a manual test failure event needs to be manually analyzed; if it is determined that a historical test failure event needs to be manually analyzed, A solution to the historical test failure event obtained by manual analysis is described as a new solution.

For example, in the actual test process, the test failure event may be caused by a critical misjudgment caused by setting an inappropriate test item threshold in the test plan, thereby causing the test failure event to occur frequently, and then it is required. Correct the various test item thresholds in the test plan to avoid the occurrence of critical failures in the test failure event. In this embodiment, the frequency of occurrence of the historical test failure event is obtained from the key feature data corresponding to the current test item. If it is determined that the frequency of occurrence is high, it is determined that the historical test failure event is manually analyzed to obtain a new response to the historical test failure event. The solution updates both the historical test failure event and the corresponding solution. The new solution can be an optimization of existing solutions on Test Server 1, or a completely new solution after manual analysis.

FIG. 5 is a schematic structural diagram of a test server according to an embodiment of the present invention. The server can be implemented in hardware, software, or a combination of hardware and software. As shown in FIG. 5, the test server 1 provided in this embodiment includes: a matching module 11 and a determining module 12.

The matching module 11 is configured to match the current test failure event generated when the current test item fails the test according to the current test plan, and the pre-stored historical test failure event, when there is a historical test failure event that matches the current test failure event. , the determination module 12 is triggered.

In a possible implementation, the matching module 11 is further configured to: match the current test log information corresponding to the current test failure event with the historical test log information corresponding to the historical test failure event stored in advance. .

The determining module 12 is configured to determine a solution corresponding to the historical test failure event, to retest the current test item according to the solution.

Further, the test server further includes: a storage module, configured to store a historical test failure event and a corresponding relationship of the solution;

In a possible implementation manner, the determining module 12 is further configured to: determine, according to a correspondence between a historical test failure event pre-stored in the storage module and the adapted solution, to determine the history A solution to test the failure event to retest the current test item according to the solution.

Further, the test server further includes: an update module, configured to use the current test test failure event as a new historical test failure event to match the historical test failure event in the storage module The correspondence of the solution is updated.

Further, when there is no historical test failure event matching the current test failure event in the matching module 11, the acquisition module 13 is triggered; the obtaining module 13 is configured to obtain according to the manual analysis of the current test failure event. A solution to the current test failure event should be addressed to retest the test item.

It should be noted that the test server 1 of this embodiment may be used to implement the technical solution of the foregoing method embodiment, and the implementation principle and technical effects are similar, and details are not described herein again.

The test server provided in this embodiment first determines whether the current test failure event can be matched to the pre-stored historical test failure event, and when it matches the pre-stored historical test failure event, it uses the previous period to solve the historical test failure event. Solution retest the current test item Try to greatly reduce or avoid manual analysis, which can improve the efficiency of testing.

FIG. 6 is a schematic structural diagram of a test system according to an embodiment of the present invention. As shown in FIG. 6, the test system provided by the embodiment of the present invention includes the test server 1 and the test tool 2 according to any one of the above embodiments.

The test server 1 is configured to match a current test failure event generated when the current test item fails the test according to the current test plan with a pre-stored historical test failure event, and fail in the history test that matches the current test failure event. At the time of the event, a solution corresponding to the historical test failure event is determined to cause the test tool 2 to retest the current test item according to the solution.

The testing tool 2 is configured to retest the current test item according to the solution. For example, the test tool 2 is used to implement a test plan for the test object at the production line end. The test solution of test tool 2 is injected by test server 1. If a test failure event is encountered, test tool 2 uploads the current test failure event to test tool 2, and test tool 2 performs according to the current test failure event and the pre-stored historical test failure event. Matching, when the matching is successful, obtain a solution corresponding to the historical test failure event, and then update the current test plan according to the obtained new solution to form a new solution test plan, and inject the new test plan into the test tool 2 Next, Test Tool 2 will retest the failed test items against the new solution in the new test plan.

Further, the test system further includes: a technical support end 3, configured to perform manual analysis on the current test failure event when the test server 1 does not have a historical test failure event matching the current test failure event A solution to the current test failure event is obtained to retest the test item. For example, when there is no historical test failure event matching the current test failure event in the test server 1, the test server 1 packages the current test failure event to the technical support terminal 3, and the technical support personnel of the technical support terminal 3 The current test failure event is manually analyzed and the corresponding solution is provided and returned to the test server 1. Then the test server 1 generates a new test plan according to the new solution and injects it into the test tool 2, and then the test tool 2 is based on the new test. The new solution in the scenario retests the failed test.

The test system provided in this embodiment first determines whether the current test failure event can be matched. To pre-store the historical test failure event, when matching the pre-stored historical test failure event, re-test the current test item with the solution adopted in the previous period to solve the historical test failure event, which can greatly reduce or avoid manual analysis. In turn, the purpose of improving test efficiency can be achieved. In addition, in determining that there is no historical test failure event that matches the current test failure event, a manual analysis solution can be obtained to further ensure the test pass rate.

Finally, it should be noted that the above embodiments are only used to explain the technical solutions of the embodiments of the present application, and are not limited thereto; although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that The technical solutions described in the foregoing embodiments may be modified, or some of the technical features may be equivalently replaced; and the modifications or substitutions do not deviate from the spirit of the technical solutions of the embodiments of the present application. range. In the case of that, it can be understood and implemented.

Through the description of the above embodiments, those skilled in the art can clearly understand that the various embodiments can be implemented by means of software plus a necessary general hardware platform, and of course, by hardware. Based on such an understanding, portions of the above technical solutions that contribute substantially or to the prior art may be embodied in the form of a software product that may be stored in a computer readable storage medium, the computer readable record The medium includes information for storing or transmitting information in a form readable by a computer (eg, a computer).

Those skilled in the art will appreciate that embodiments of the embodiments of the invention may be provided as a method, apparatus (device), or computer program product. Thus, embodiments of the invention may be in the form of an entirely hardware embodiment, an entirely software embodiment, or a combination of software and hardware. Moreover, embodiments of the invention may take the form of a computer program product embodied on one or more computer usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) including computer usable program code.

Embodiments of the invention are described with reference to flowchart illustrations and/or block diagrams of methods, apparatus, and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or FIG. These computer program instructions can be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing device to produce a machine for the execution of instructions for execution by a processor of a computer or other programmable data processing device. Compilation of functions specified in one or more blocks of a flow or a flow and/or block diagram of a flow chart Set.

The computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture comprising the instruction device. The apparatus implements the functions specified in one or more blocks of a flow or a flow and/or block diagram of the flowchart.

These computer program instructions can also be loaded onto a computer or other programmable data processing device such that a series of operational steps are performed on a computer or other programmable device to produce computer-implemented processing for execution on a computer or other programmable device. The instructions provide steps for implementing the functions specified in one or more of the flow or in a block or blocks of a flow diagram.

While the preferred embodiment of the present invention has been described, it will be apparent that those skilled in the art can make various changes and modifications to the embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and the modifications and It is apparent that those skilled in the art can make various modifications and variations to the embodiments of the invention without departing from the spirit and scope of the embodiments of the invention. Therefore, it is intended that the present invention cover the modifications and variations of the embodiments of the present invention.

Claims

A test method, comprising:

The current test failure event generated when the current test item fails to test is matched with the pre-stored historical test failure event according to the current test plan;

When there is a historical test failure event that matches the current test failure event, a solution corresponding to the historical test failure event is determined to retest the current test item according to the solution.
The method according to claim 1, wherein the matching the current test failure event generated when the test item fails to test according to the current test plan matches the pre-stored historical test failure event, including: failing according to the current test The current test log information corresponding to the event is matched with the historical test log information corresponding to the historical test failure event stored in advance.
The method according to claim 2, wherein the current test log information comprises current test input data and current test output data of a current test scenario for the current test item, and the historical test log information includes Historical test input data and historical test output data of a history test item execution history test plan;

The current test log information corresponding to the current test failure event is matched with the historical test log information corresponding to the historical test failure event stored in advance, including:

The current test input data according to the current test failure event and the current test output data are respectively matched with the pre-stored historical test input data and the historical test output data.
The method according to claim 3, further comprising: analyzing the current test log information according to the set data communication protocol to extract key feature data therefrom;

The matching between the current test input data of the current test failure event and the current test output data and the pre-stored historical test input data and the historical test output data respectively includes:

The current test key process data according to the current test failure event is matched with the historical test key process data of the pre-stored historical test failure event.
The method according to claim 4, wherein analyzing the current log information according to the set data communication protocol to extract key feature data therefrom comprises:

Decoding and extracting the current log information according to a set data communication protocol to obtain a mark portion and a data portion; wherein the mark portion is used to identify different current test items, and the data portion is used to record current test input data, current test output data, and current test key process data.
The method of claim 1, wherein the determining a solution to the historical test failure event to retest the current test item according to the solution comprises:

Determining a solution to the historical test failure event according to a correspondence between the pre-stored historical test failure event and the adapted solution to re-test the current test item according to the solution.
The method according to claim 6, wherein the determining, according to the correspondence between the pre-stored historical test failure event and the adapted solution, the solution to the historical test failure event comprises:

Determining, by the pre-stored historical test failure event and the mapping information table of the solution, the solution to the historical test failure event, where the mapping information table is used to indicate the historical test failure event and the The corresponding relationship of the solution.
The method according to claim 7, wherein the mapping information table maps one or more cases, the case is associated with an event type attribute and/or a data feature value of the historical test failure event and a corresponding solution .
The method of claim 6 further comprising:

The current test test failure event is used as a new historical test failure event to update the correspondence between the historical test failure event and the adapted solution.
The method according to any one of claims 1 to 9, further comprising:

When there is no historical test failure event matching the current test failure event, a solution to the current test failure event is obtained according to the manual analysis of the current test failure event to retest the test item.
The method of claim 10, further comprising:

The current test failure event is flagged when there is no historical test failure event that matches the current test failure event.
The method according to claim 10, wherein a solution to the current test failure event is obtained according to a manual analysis of the current test failure event to the test item Retesting includes:

Manual analysis of multiple current test failure events of the same type in multiple projects to obtain a solution to the current test failure event.
The method of claim 10, further comprising:

Using the current test test failure event as a new historical test failure event, the solution to the current test failure event obtained by the manual analysis is used as a new solution to update the historical test failure event and the appropriate Correspondence of the solution.
The method of claim 10, further comprising:

Obtaining a frequency of occurrence of the historical test failure event, determining, according to the frequency of occurrence, whether a manual analysis failure event needs to be manually analyzed, and when determining that a historical test failure event needs to be manually analyzed, the manual analysis is obtained. The solution to the historical test failure event should be used as a new solution to update the correspondence between the historical test failure event and the adapted solution.
A test server, comprising:

The matching module is configured to match the current test failure event generated when the current test item fails the test according to the current test plan with the pre-stored historical test failure event, and trigger when there is a historical test failure event that matches the current test failure event. Determining module

The determining module is configured to determine a solution corresponding to the historical test failure event, to retest the current test item according to the solution.
The test server according to claim 15, wherein the matching module is further configured to: perform a historical test corresponding to the pre-stored historical test failure event according to the current test log information corresponding to the current test failure event The log information is matched.
The test server according to claim 15, further comprising: a storage module, configured to store a correspondence between a historical test failure event and the adapted solution;

The determining module is further configured to: determine, according to a correspondence between the historical test failure event pre-stored in the storage module and the adapted solution, a solution to the historical test failure event, according to the solution The solution retests the current test item.
The test server according to claim 17, further comprising: an update module, configured to use the current test test failure event as a new historical test failure event to record a historical test failure event in the storage module. The correspondence with the adapted solution is updated.
The test server according to any one of claims 15 to 18, wherein when there is no historical test failure event matching the current test failure event in the matching module, the acquisition module is triggered;

The obtaining module is configured to obtain a solution to the current test failure event according to a manual analysis of the current test failure event to retest the test item.
A test system, comprising: a test tool and a test server;

The testing tool is configured to retest the current test item according to the solution;

The test server is configured to match a current test failure event generated when the current test item fails the test according to the current test plan with a pre-stored historical test failure event, and a historical test failure event that matches the current test failure event exists. A solution corresponding to the historical test failure event is determined to cause the test tool to retest the current test item according to the solution.
The system according to claim 20, further comprising: a technical support end, configured to: when the test server does not have a historical test failure event matching the current test failure event, according to the current test failure event The manual analysis obtains a solution to the current test failure event to retest the test item.